Response drift correction device and correction method for large thermal inertia infrared system

Abstract

The present invention relates to the field of infrared radiation measurement, and in particular to a response drift correction device and correction method for a large thermal inertia infrared system. The method comprises: providing temperature sensors on each optical structure within the large thermal inertia infrared system; placing the large thermal inertia infrared system in different ambient temperatures and performing radiation calibration measurements on the system using a calibration blackbody; constructing temperature vectors from the temperature values ​​measured by the temperature sensors at different ambient temperatures; calculating the variance expansion factor of each temperature vector, and selecting temperature vectors that meet the conditions as characteristic temperature subsets representing stray radiation within the infrared system; constructing an infrared system response model based on the characteristic temperature subsets, and performing multivariate linear fitting on the infrared system response model based on radiation calibration measurement data to obtain model coefficients; and using the corrected infrared system response model to correct the response drift of the large thermal inertia infrared system. The present invention can correct the response drift of a large thermal inertia infrared system over a wide temperature range.

Description

Technical Field

[0001] The present invention belongs to the technical field of infrared radiation measurement, and in particular relates to a response drift correction device and correction method for a large thermal inertia infrared system. Background Art

[0002] Infrared radiation measurement technology uses an infrared system to non-contactly detect and receive infrared radiation emitted by a target. It then inverts the grayscale characteristics of the output infrared image to obtain information such as the target's radiant brightness and temperature distribution. Absolute radiometric calibration establishes a correspondence between the incident radiation and the grayscale values ​​of the output image of an infrared radiation measurement system and is the foundation of infrared radiation measurement.

[0003] All objects with temperatures above absolute zero (0K) emit infrared radiation, and the optical structures within the infrared channel of an infrared system are no exception. Therefore, the infrared detector in an infrared system not only receives infrared radiation from the target but also infrared radiation emitted by the optical components themselves, namely internal stray radiation. Due to the high emissivity of optical components, the internal stray radiation they generate has a significant impact on the radiation signal received by the infrared detector.

[0004] With the development of infrared systems, their operating temperature ranges are expanding, their optical structures are becoming increasingly compact, and their internal thermal environments are becoming more complex. Traditional internal stray radiation compensation methods based on the thermal equilibrium assumption have significant limitations: these methods eliminate internal stray radiation interference by fitting and correcting the infrared system's response drift, but they are only applicable to infrared systems with low thermal inertia and have a limited temperature range and temperature gradient that can be compensated. For infrared systems with high thermal inertia, especially over wide temperature ranges and under non-thermal equilibrium conditions, the internal stray radiation model based on the thermal equilibrium assumption is no longer able to accurately characterize the dynamic changes in internal stray radiation within the infrared system. Therefore, existing technologies urgently need to be further improved to meet the needs of infrared systems with high thermal inertia. Summary of the Invention

[0005] In view of this, the present invention aims to provide a response drift correction method for a large thermal inertia infrared system to solve the technical problem of how to effectively eliminate the internal stray radiation interference of the large thermal inertia infrared system.

[0006] To achieve the above object, the technical solution created by the present invention is implemented as follows:

[0007] A method for correcting response drift of a large thermal inertia infrared system comprises the following steps:

[0008] S1: Temperature sensors are set on each optical structure in the infrared channel of the large thermal inertia infrared system;

[0009] S2: Place the large thermal inertia infrared system and the calibration blackbody in different ambient temperatures, use the calibration blackbody to perform radiation calibration measurement on the large thermal inertia infrared system, and record the temperature value of the blackbody, the response grayscale value of the large thermal inertia infrared system, and the temperature value of each temperature sensor at different ambient temperatures;

[0010] S3: The temperature values ​​measured by each temperature sensor at different ambient temperatures are used to form a temperature vector, and the total number of temperature vectors is the same as the number of temperature sensors.

[0011] S4: Calculate the variance expansion factor of each temperature vector, select the variance expansion factor that meets the conditions according to the screening conditions, and use the corresponding temperature vector as the characteristic temperature subset representing the internal stray radiation of the large thermal inertia infrared system;

[0012] S5: Based on the characteristic temperature subset, an infrared system response model is constructed. Based on the recorded different ambient temperatures, the temperature values ​​of the black body at different ambient temperatures, the temperature values ​​of each temperature sensor, and the response grayscale value of the large thermal inertia infrared system, a multivariate linear fit is performed on the infrared system response model to obtain the gain coefficient, internal stray radiation gain coefficient, and bias coefficient of the infrared system response model, thus completing the correction of the infrared system response model.

[0013] S6: Use the revised infrared system response model to correct the response drift of the large thermal inertia infrared system.

[0014] Furthermore, the calculation formula of the variance expansion factor of each temperature vector is:

[0015]

[0016]

[0017] in, represents the variance expansion factor of the nth temperature vector, N represents the number of temperature vectors, Indicates the temperature value of the nth temperature sensor at different ambient temperatures, express The fitted value of express The average value of Indicates the fitting determination coefficient between the temperature value of the nth temperature sensor and the temperature fitting value.

[0018] Furthermore, a variance inflation factor threshold is set as a screening condition, and a temperature vector smaller than the variance inflation factor threshold is selected, and a temperature vector greater than or equal to the variance inflation factor threshold is selected. The temperature vector with the lowest value takes all the screened temperature thresholds as the characteristic temperature subset that characterizes the stray radiation inside the infrared system.

[0019] Furthermore, the variance inflation factor threshold is set to 10, and the The temperature vector of Select from the temperature vector The temperature vector with the lowest value.

[0020] Furthermore, the infrared system response model is:

[0021]

[0022]

[0023] in, Indicates the thermal inertia of the infrared system to the temperature The response grayscale value of blackbody radiation, Indicates the temperature The radiance of a black body, represents the gain coefficient of the large thermal inertia infrared system, represents the internal stray radiation gain coefficient of the large thermal inertia infrared system in thermal equilibrium state, represents the internal stray radiation gain coefficient of the large thermal inertia infrared system in the non-thermal equilibrium state, Indicates ambient temperature The corresponding equivalent blackbody radiance, Indicates the surface temperature of the optical structure where the nth temperature sensor is located The corresponding equivalent blackbody radiance, represents the bias coefficient of the large thermal inertia infrared system, and M represents the number of temperature vectors that meet the screening conditions.

[0024] Furthermore, before performing radiation calibration measurement on the large thermal inertial infrared system, a calibration blackbody is placed within the field of view of the large thermal inertial infrared system so that the target surface radiation of the calibration blackbody fills the entire field of view; when performing radiation calibration measurement on the large thermal inertial infrared system, the close-range extended source method is used to perform absolute radiation calibration measurement on the large thermal inertial infrared system.

[0025] Furthermore, before performing absolute radiation calibration measurement on the large thermal inertia infrared system, it is turned off and fully heat-exchanged with the ambient temperature, and then the large thermal inertia infrared system is turned on and absolute radiation calibration measurement is performed on it.

[0026] A response drift correction device for a large thermal inertia infrared system, comprising:

[0027] The radiation calibration measurement unit is used to perform radiation calibration measurements on the large thermal inertia infrared system placed in different ambient temperatures, recording the temperature value of the black body, the response grayscale value of the large thermal inertia infrared system, and the temperature value of each temperature sensor at different ambient temperatures; wherein each temperature sensor is respectively set on each optical structure in the infrared channel of the large thermal inertia infrared system;

[0028] A temperature vector forming unit, configured to form a temperature vector from the temperature values ​​measured by each temperature sensor at different ambient temperatures, so as to form a total of temperature vectors equal to the number of temperature sensors;

[0029] A characteristic temperature subset construction unit is used to calculate the variance expansion factor of each temperature vector, select the variance expansion factor that meets the conditions according to the screening conditions, and use the corresponding temperature vector as the characteristic temperature subset that characterizes the stray radiation inside the infrared system;

[0030] The infrared system response model construction unit is used to construct the infrared system response model based on the characteristic temperature subset, and perform multivariate linear fitting on the infrared system response model based on the recorded different ambient temperatures and the temperature values ​​of the black body at different ambient temperatures, the temperature value of each temperature sensor and the response grayscale value of the large thermal inertia infrared system, to obtain the gain coefficient, internal stray radiation gain coefficient and bias coefficient of the infrared system response model, and complete the correction of the infrared system response model;

[0031] The response drift correction unit is used to perform response drift correction on the large thermal inertia infrared system using the corrected infrared system response model.

[0032] A computer device comprises: at least one processor; and a memory communicatively connected to the at least one processor; wherein the memory stores instructions executable by the at least one processor, and the instructions are executed by the at least one processor to enable the at least one processor to perform the above-mentioned response drift correction method for a large thermal inertia infrared system.

[0033] A non-transitory computer-readable storage medium storing computer instructions, wherein the computer instructions are used to cause the computer to execute the above-mentioned large thermal inertia infrared system response drift correction method.

[0034] Compared with the prior art, the present invention can achieve the following beneficial effects:

[0035] 1. The present invention uses multiple temperature sensors to measure the surface temperature of the optical structure within a large thermal inertia infrared system at different ambient temperatures. This allows the infrared system response model to take into account the unsteady-state heat transfer of the large thermal inertia optical system in a non-thermal equilibrium state. This effectively corrects the response drift of the large thermal inertia optical system over a wide temperature range and improves the accuracy of absolute radiometric calibration. This approach is particularly suitable for applications such as aviation infrared systems, where the external ambient temperature varies widely.

[0036] 2. The present invention utilizes variance inflation factor screening to reduce the complexity of the infrared system response model and improve the versatility of the infrared system response model. BRIEF DESCRIPTION OF THE DRAWINGS

[0037] The accompanying drawings, which constitute part of the present invention, are intended to provide a further understanding of the present invention. The exemplary embodiments of the present invention and their descriptions are intended to explain the present invention and do not constitute an undue limitation of the present invention. In the accompanying drawings:

[0038] Figure 1 A flow chart of a method for correcting the response drift of a large thermal inertia infrared system according to an embodiment of the present invention;

[0039] Figure 2 This is a schematic diagram of the distribution of the temperature sensors described in Example 1 of the present invention within the infrared channel;

[0040] Figure 3 A schematic diagram showing the positional relationship between the calibration blackbody and the large thermal inertia infrared system described in Example 1 of the present invention;

[0041] Figure 4 A schematic diagram comparing the radiation calibration accuracy of the existing method described in Example 1 of the present invention and the present method within the range of -30°C to 15°C;

[0042] Figure 5 A schematic diagram of the structure of a computer device according to an embodiment of the present invention.

[0043] Explanation of the reference numerals: large thermal inertial infrared system 1, primary mirror 101, secondary mirror 102, correction blackbody 103, optical rear group 104, calibration blackbody 2, environmental test box 3. DETAILED DESCRIPTION

[0044] In order to make the purpose, technical solutions and advantages of the present invention more clearly understood, the present invention is further described in detail below with reference to the accompanying drawings and specific embodiments. It should be understood that the specific embodiments described herein are only used to explain the present invention and do not constitute a limitation of the present invention.

[0045] It should be noted that, in the absence of conflict, the embodiments of the present invention and the features in the embodiments can be combined with each other.

[0046] In the description of the present invention, it should be understood that the terms "center", "longitudinal", "lateral", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside" and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation on the present invention. In addition, the terms "first", "second" and the like are only used for descriptive purposes and cannot be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Thus, features defined as "first", "second" and the like may explicitly or implicitly include one or more of the features. In the description of the present invention, unless otherwise specified, "multiple" means two or more.

[0047] In the description of the present invention, it should be noted that, unless otherwise expressly specified or limited, the terms "assemble," "connect," and "connect" should be understood in a broad sense. For example, they can refer to fixed connections, detachable connections, or integral connections; they can refer to mechanical connections or electrical connections; they can refer to direct connections or indirect connections through an intermediate medium; and they can refer to internal connections between two components. Those skilled in the art can understand the specific meanings of the above terms in the present invention based on specific circumstances.

[0048] The present invention will be described in detail below with reference to the accompanying drawings and in combination with embodiments.

[0049] In a first aspect, the present invention provides a method for correcting the response drift of a large thermal inertia infrared system, such as Figure 1 As shown, the following steps are included:

[0050] S1: Temperature sensors are set on each optical structure in the infrared channel of the large thermal inertia infrared system.

[0051] The temperature sensors are evenly distributed on each optical structure in the infrared channel, that is, one temperature sensor is set on each optical structure, and the temperature sensors are used to measure the surface temperature of each optical structure.

[0052] S2: Place the large thermal inertia infrared system and the calibration blackbody in different ambient temperatures, use the calibration blackbody to perform radiation calibration measurement on the large thermal inertia infrared system, and record the temperature value of the blackbody, the response grayscale value of the large thermal inertia infrared system, and the temperature value of each temperature sensor at different ambient temperatures.

[0053] Before performing radiation calibration measurement on the large thermal inertial infrared system, a calibration blackbody is placed within the field of view of the large thermal inertial infrared system so that the target surface radiation of the calibration blackbody fills the entire field of view; when performing radiation calibration measurement on the large thermal inertial infrared system, the close-range extended source method is used to perform absolute radiation calibration measurement on the large thermal inertial infrared system.

[0054] Before performing absolute radiation calibration measurement on the large thermal inertia infrared system, it should be turned off and fully heat-exchanged with the ambient temperature, and then the large thermal inertia infrared system should be turned on and absolute radiation calibration measurement should be performed on it.

[0055] According to different large thermal inertia infrared systems, the temperature range of the calibration blackbody is reasonably selected to make the grayscale value of the large thermal inertia infrared system fall within the linear region of the infrared detector. When responding to the grayscale value, the temperature of the calibration blackbody and the temperature values ​​of each temperature sensor are collected simultaneously.

[0056] S3: The temperature values ​​measured by each temperature sensor at different ambient temperatures are used to form a temperature vector, and the total number of temperature vectors is the same as the number of temperature sensors.

[0057] S4: Calculate the variance expansion factor of each temperature vector, select the variance expansion factor that meets the conditions according to the screening conditions, and use the corresponding temperature vector as the characteristic temperature subset that characterizes the internal stray radiation of the large thermal inertia infrared system.

[0058] The variance inflation factor for each temperature vector is calculated as:

[0059]

[0060]

[0061] in, represents the variance expansion factor of the nth temperature vector, N represents the number of temperature vectors, Indicates the temperature value measured by the nth temperature sensor at different ambient temperatures. express The fitting value of (that is, multiple temperature values ​​are fitted to obtain the temperature fitting value), express The average value of (that is, the average temperature value after averaging multiple temperature values), Represents the fitting determination coefficient between the temperature value of the nth temperature sensor and the temperature fitting value, It represents the residual sum of squares, which represents the difference between the temperature value measured by the temperature sensor and the temperature fitting value. is the total sum of squares, representing the difference between the temperature measurements and the average temperature. , which can evaluate the quality of the temperature fitting model and then calculate the variance inflation factor Provide basis.

[0062] To detect multicollinearity, The closer it is to 1, The larger the value, the higher the collinearity between the temperature vectors. The temperature vector with a larger value satisfies the following relationship:

[0063]

[0064] in, , represents two different regression coefficients, and represents two different temperature vectors, Represents random error.

[0065] The above formula shows that one temperature vector can be selected from (j+1) temperature vectors It is used as a characteristic temperature vector to characterize the internal stray radiation of the large thermal inertia infrared system.

[0066] It is generally believed that:

[0067] , indicating that collinearity is not serious;

[0068] , indicating that there is a certain degree of collinearity;

[0069] , indicating that collinearity is serious and the temperature variable needs to be merged.

[0070] Therefore, the present invention sets the variance inflation factor threshold to 10. The temperature vectors are all retained, for The temperature vector has collinearity and can be selected from The temperature vector with the lowest value, The temperature vectors together constitute the characteristic temperature subset of the stray radiation inside the large thermal inertial infrared system.

[0071] S5: Based on the characteristic temperature subset, an infrared system response model is constructed, and based on the recorded different ambient temperatures and the temperature values ​​of the black body at different ambient temperatures, the temperature value of each temperature sensor and the response grayscale value of the large thermal inertia infrared system, the infrared system response model is subjected to multivariate linear fitting to obtain the gain coefficient, internal stray radiation gain coefficient and bias coefficient of the infrared system response model, thereby completing the correction of the infrared system response model.

[0072] Taking each optical structure in the infrared channel of the large thermal inertia infrared system as a stray radiation element, the radiation flux of a stray radiation element received by the infrared detector can be expressed as:

[0073]

[0074] in, represents the surface temperature of the stray radiation element, Indicates that the stray radiation element is Directional emissivity, represents the average reflectivity of the radiation transmission path, represents the average transmittance of the radiation transmission path, It represents the solid angle opened by the infrared detector focal plane receiving stray radiation microelement, It represents the area of ​​the infrared detector focal plane receiving stray radiation microelement, Indicates The equivalent blackbody radiance at a certain temperature can be calculated according to Planck's formula.

[0075] Since heat is continuously conducted within the optomechanical structure, the total stray radiation can be approximately expressed by the surface temperature of each optical structure:

[0076]

[0077] in, represents the total internal stray radiation of the large thermal inertia infrared system, n represents the number of temperature sensors, is the response gain coefficient of n optical structures, Indicates the surface temperature of the optical structure where the nth temperature sensor is located The corresponding equivalent blackbody radiance.

[0078] According to the above two formulas, the infrared system response model can be derived:

[0079]

[0080] in, Indicates the thermal inertia of the infrared system to the temperature The response grayscale value of blackbody radiation, represents the gain coefficient of the large thermal inertia infrared system, Indicates the temperature The radiance of a black body, Represents the bias coefficient of the large thermal inertia infrared system.

[0081] The total internal stray radiation of the large thermal inertia infrared system can be characterized by separating the thermal equilibrium state and the non-thermal equilibrium state, and the infrared system response model can be expressed as:

[0082]

[0083] in, , Indicates ambient temperature The corresponding equivalent blackbody radiance, Indicates the surface temperature of the optical structure where the nth temperature sensor is located The corresponding equivalent blackbody radiance.

[0084] After screening the characteristic temperature vector, the infrared system response model becomes:

[0085]

[0086] in, represents the internal stray radiation gain coefficient of the large thermal inertia infrared system in thermal equilibrium state, represents the internal stray radiation gain coefficient of the large thermal inertia infrared system in the non-thermal equilibrium state, and M represents the number of temperature vectors that meet the screening conditions.

[0087] S6: Use the revised infrared system response model to correct the response drift of the large thermal inertia infrared system.

[0088] The present invention uses multiple temperature sensors to measure the surface temperature of the internal optical structure of a large thermal inertia infrared system under different ambient temperatures. This allows the infrared system response model to take into account the non-steady-state heat transfer of the large thermal inertia optical system under non-thermal equilibrium conditions. This can effectively correct the response drift of the large thermal inertia optical system over a wide temperature range and improve the absolute radiation calibration accuracy. It is particularly suitable for application scenarios such as aviation infrared systems where the external ambient temperature varies over a large range.

[0089] Example 1

[0090] Example 1 is described by taking four temperature sensors and four ambient temperatures as an example.

[0091] like Figure 2 and Figure 3 As shown, the large thermal inertia infrared system 1 includes a primary mirror 101, a secondary mirror 102, a calibration blackbody 103 and an optical rear group 104 arranged in sequence along the infrared channel optical path, and four temperature sensors are respectively arranged on the primary mirror 101, the secondary mirror 102, the calibration blackbody 13 and the optical rear group 104.

[0092] Place the large thermal inertial infrared system 1 and the calibration blackbody 2 in the environmental experimental box 3. The target surface of the calibration blackbody 2 must be parallel to the optical window of the large thermal inertial infrared system 1, and the calibration blackbody 2 must be located near the window of the large thermal inertial infrared system 1 to ensure that the target surface radiation of the calibration blackbody 2 fills the entire field of view of the large thermal inertial infrared system 1.

[0093] Use the calibration blackbody 2 to perform absolute radiation calibration measurement on the large thermal inertia infrared system 1, change the ambient temperature in the environmental experiment box 3, and record the temperature of the calibration blackbody 2, the response grayscale value of the large thermal inertia infrared system 1 (the grayscale value output by the infrared detector), and the temperature values ​​measured by the four temperature sensors.

[0094] In the ambient temperature range of -30℃-15℃, When selecting and .exist When selecting and .

[0095] The temperature values ​​measured by the four temperature sensors at four ambient temperatures of -25°C, -5°C, 5°C, and 10°C constitute the temperature vectors X1, X2, X3, and X4, respectively. The variance expansion factors V1, V2, V3, and V4 calculated based on the temperature vectors X1, X2, X3, and X4 are shown in the following table:

[0096]

[0097] The temperature vector X1 corresponds to the primary mirror 101 , X2 corresponds to the secondary mirror 102 , X3 corresponds to the correction blackbody 103 , and X4 corresponds to the rear optical group 104 .

[0098] Among V1 to V4, since V4 has the lowest value, the temperature vector corresponding to the optical rear group 104 is selected as the characteristic temperature subset representing the internal stray radiation of the large thermal inertia infrared system.

[0099] The infrared system response model constructed based on the characteristic temperature subset is:

[0100]

[0101]

[0102] in, is the equivalent blackbody radiance corresponding to the surface temperature of the rear optical assembly 104 .

[0103] Since only one temperature vector is selected, , .

[0104] Based on the four ambient temperatures and the temperature values ​​of the black body under the four ambient temperatures, the temperature values ​​of the four temperature sensors and the response grayscale value of the large thermal inertia infrared system, the infrared system response model is fitted with multiple linear models to obtain the gain coefficient of the infrared system response model. , internal stray radiation gain coefficient ( and ), bias coefficient , as shown in the following table:

[0105]

[0106] Based on the infrared system response model of Example 1, within the range of -30℃~15℃, seven ambient temperature points, namely -30℃, -25℃, -10℃, -5℃, 5℃, 10℃, and 15℃, were selected to verify the accuracy of radiation calibration. The results of the existing methods were compared. Figure 4 After response drift correction, the proposed method achieves a radiometric calibration accuracy of better than 3.14% within the range of -30°C to 15°C, while the existing method achieves 9.56%. For large thermal inertia infrared systems within a wide ambient temperature range, the proposed method has high accuracy and significant advantages.

[0107] In the second aspect, the present invention provides a response drift correction device for a large thermal inertia infrared system, which is used to implement the method steps described in the above embodiment. The explanation based on the same name meaning is the same as the above embodiment, and has the same technical effect as the above embodiment, and will not be repeated here.

[0108] The response drift correction device of the large thermal inertia infrared system includes:

[0109] The radiation calibration measurement unit is used to perform radiation calibration measurements on the large thermal inertia infrared system placed in different ambient temperatures, recording the temperature value of the black body, the response grayscale value of the large thermal inertia infrared system, and the temperature value of each temperature sensor at different ambient temperatures; wherein each temperature sensor is respectively set on each optical structure in the infrared channel of the large thermal inertia infrared system;

[0110] A temperature vector forming unit, configured to form a temperature vector from the temperature values ​​measured by each temperature sensor at different ambient temperatures, so as to form a total of temperature vectors equal to the number of temperature sensors;

[0111] A characteristic temperature subset construction unit is used to calculate the variance expansion factor of each temperature vector, select the variance expansion factor that meets the conditions according to the screening conditions, and use the corresponding temperature vector as the characteristic temperature subset that characterizes the stray radiation inside the infrared system;

[0112] The infrared system response model construction unit is used to construct the infrared system response model based on the characteristic temperature subset, and perform multivariate linear fitting on the infrared system response model based on the recorded different ambient temperatures and the temperature values ​​of the black body at different ambient temperatures, the temperature value of each temperature sensor and the response grayscale value of the large thermal inertia infrared system, to obtain the gain coefficient, internal stray radiation gain coefficient and bias coefficient of the infrared system response model, and complete the correction of the infrared system response model;

[0113] The response drift correction unit is used to perform response drift correction on the large thermal inertia infrared system using the corrected infrared system response model.

[0114] In a third aspect, the present invention further provides a computer device, a readable storage medium, and a computer program product.

[0115] Figure 5 FIG. 1 is a structural diagram of a computer device 12 provided in an embodiment of the present invention. Figure 5 The computer device 12 shown is only an example and should not bring any limitation to the functions and scope of use of the embodiments of the present invention.

[0116] like Figure 5 As shown, computer device 12 is represented in the form of a general-purpose computing device. Computer device 12 is intended to represent various forms of digital computers, such as laptop computers, desktop computers, workstations, personal digital assistants, servers, blade servers, mainframe computers, and other suitable computers. Electronic devices can also represent various forms of mobile devices, such as personal digital assistants, cellular phones, smartphones, wearable devices, and other similar computing devices. The components shown herein, their connections and relationships, and their functions are merely examples and are not intended to limit the implementation of the present invention described and / or claimed herein.

[0117] Components of computer device 12 may include, but are not limited to, one or more processors or processing units 16 , a system memory 28 , and a bus 18 that connects various system components, including system memory 28 and processing unit 16 .

[0118] Bus 18 represents one or more of several types of bus structures, including a memory bus or memory controller, a peripheral bus, an accelerated graphics port, a processor, or a local bus using any of a variety of bus architectures. Examples of these architectures include, but are not limited to, an Industry Standard Architecture (ISA) bus, a Micro Channel Architecture (MAC) bus, an Enhanced ISA bus, a Video Electronics Standards Association (VESA) local bus, and a Peripheral Component Interconnect (PCI) bus.

[0119] The computer device 12 typically includes a variety of computer system readable media. These media can be any available media that can be accessed by the computer device 12, including volatile and non-volatile media, removable and non-removable media.

[0120] The memory 28 may include computer system readable media in the form of volatile memory, such as random access memory (RAM) 30 and / or cache memory 32. The computer device 12 may further include other removable / non-removable, volatile / non-volatile computer system storage media. By way of example only, the storage system 34 may be configured to read and write non-removable, non-volatile magnetic media ( Figure 5 Not shown, often called a "hard drive"). Although Figure 5 Not shown, a magnetic disk drive for reading and writing to a removable non-volatile magnetic disk (e.g., a "floppy disk"), and an optical disk drive for reading and writing to a removable non-volatile optical disk (e.g., a CD-ROM, DVD-ROM, or other optical media) may be provided. In these cases, each drive may be connected to bus 18 via one or more data media interfaces. Memory 28 may include at least one program product having a set (e.g., at least one) of program modules configured to perform the functions of various embodiments of the present invention.

[0121] A program / utility 40 having a set (at least one) of program modules 42 may be stored, for example, in memory 28. Such program modules 42 include, but are not limited to, an operating system, one or more application programs, other program modules, and program data, each of which, or some combination thereof, may include an implementation of a network environment. Program modules 42 generally implement the functions and / or methods of the embodiments described herein.

[0122] The computer device 12 can also communicate with one or more external devices 14 (e.g., a keyboard, pointing device, display 24, etc.), one or more devices that enable a user to interact with the computer device 12, and / or any device that enables the computer device 12 to communicate with one or more other computing devices (e.g., a network card, a modem, etc.). Such communication can occur via an input / output (I / O) interface 22. Furthermore, the computer device 12 can communicate with one or more networks (e.g., a local area network (LAN), a wide area network (WAN), and / or a public network such as the Internet) via a network adapter 20. As shown, the network adapter 20 communicates with the other modules of the computer device 12 via a bus 18. It should be understood that, although not shown, other hardware and / or software modules can be used in conjunction with the computer device 12, including but not limited to microcode, device drivers, redundant processing units, external disk drive arrays, RAID systems, tape drives, and data backup storage systems.

[0123] The processing unit 16 executes various functional applications and data processing by running programs stored in the system memory 28, such as implementing the response drift correction method of the large thermal inertia infrared system provided by the embodiment of the present invention.

[0124] An embodiment of the present invention also provides a non-transitory computer-readable storage medium storing computer instructions, on which a computer program is stored, wherein when the program is executed by a processor, the response drift correction method of the large thermal inertia infrared system provided in all the inventive embodiments of this application is implemented.

[0125] The computer storage medium of the embodiment of the present invention can adopt any combination of one or more computer-readable media. The computer-readable medium can be a computer-readable signal medium or a computer-readable storage medium. More specific examples (non-exhaustive list) of computer-readable storage media include: an electrical connection with one or more wires, a portable computer disk, a hard disk, a random access memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber, a portable compact disk read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the above. In this document, a computer-readable storage medium can be any tangible medium containing or storing a program that can be used by or in combination with an instruction execution system, apparatus or device.

[0126] A computer-readable signal medium may include a data signal propagated in baseband or as part of a carrier wave, which carries computer-readable program code. Such propagated data signals may take various forms, including but not limited to electromagnetic signals, optical signals, or any suitable combination thereof. A computer-readable signal medium may also be any computer-readable medium other than a computer-readable storage medium that can transmit, propagate, or transport a program for use by or in conjunction with an instruction execution system, apparatus, or device.

[0127] The program code that comprises on the computer-readable medium can be transmitted with any appropriate medium, includes but not limited to wireless, electric wire, optical cable, RF etc., or above-mentioned any suitable combination.Can write the computer program code that is used to carry out the operation of the present invention with one or more programming languages ​​or its combination, described programming language comprises object-oriented programming language such as Java, Smalltalk, C++, also comprises conventional procedural programming language--such as " C " language or similar programming language.Program code can be carried out on user's computer completely, partly on user's computer, carry out as an independent software package, partly on user's computer partly on remote computer, or carry out completely on remote computer or server.In the situation that relates to remote computer, remote computer can comprise local area network (LAN) or wide area network (WAN) to be connected to user's computer by the network of any kind, perhaps, can be connected to external computer (for example, utilize Internet service provider to come to connect by Internet).

[0128] An embodiment of the present invention further provides a computer program product, including a computer program, which, when executed by a processor, implements the response drift correction method for the large thermal inertia infrared system described above.

[0129] It should be understood that the various forms of the processes shown above can be used to reorder, add, or delete steps. For example, the steps described in the present disclosure can be performed in parallel, sequentially, or in a different order, as long as the desired results of the technical solutions disclosed in the present disclosure can be achieved. This is not limited herein.

[0130] The above specific embodiments do not limit the scope of protection of the present invention. Those skilled in the art will appreciate that various modifications, combinations, sub-combinations, and substitutions may be made based on design requirements and other factors. Any modifications, equivalent substitutions, and improvements made within the spirit and principles of the present invention are intended to be included within the scope of protection of the present invention.

Claims

1. A method for correcting the response drift of a large thermal inertia infrared system, characterized in that: The steps include: S1: Temperature sensors are set on each optical structure in the infrared channel of the large thermal inertia infrared system; S2: Place the large thermal inertia infrared system and the calibration blackbody in different ambient temperatures, use the calibration blackbody to perform radiation calibration measurement on the large thermal inertia infrared system, and record the temperature value of the blackbody, the response grayscale value of the large thermal inertia infrared system, and the temperature value of each temperature sensor at different ambient temperatures; S3: The temperature values ​​measured by each temperature sensor at different ambient temperatures are used to form a temperature vector, and the total number of temperature vectors is the same as the number of temperature sensors. S4: Calculate the variance expansion factor of each temperature vector, select the variance expansion factor that meets the conditions according to the screening conditions, and use the corresponding temperature vector as the characteristic temperature subset that characterizes the stray radiation inside the infrared system; S5: Based on the characteristic temperature subset, an infrared system response model is constructed. Based on the recorded different ambient temperatures, the temperature values ​​of the black body at different ambient temperatures, the temperature values ​​of each temperature sensor, and the response grayscale value of the large thermal inertia infrared system, a multivariate linear fit is performed on the infrared system response model to obtain the gain coefficient, internal stray radiation gain coefficient, and bias coefficient of the infrared system response model, thus completing the correction of the infrared system response model. S6: Use the revised infrared system response model to correct the response drift of the large thermal inertia infrared system.

2. The response drift correction method of a large thermal inertia infrared system according to claim 1, characterized in that: The variance inflation factor for each temperature vector is calculated as: in, represents the variance expansion factor of the nth temperature vector, N represents the number of temperature vectors, Indicates the temperature value of the nth temperature sensor at different ambient temperatures, express The fitted value of express The average value of Indicates the fitting determination coefficient between the temperature value of the nth temperature sensor and the temperature fitting value.

3. The response drift correction method of a large thermal inertia infrared system according to claim 2, characterized in that: Set a variance inflation factor threshold as a screening condition, select a temperature vector that is less than the variance inflation factor threshold, and select a temperature vector that is greater than or equal to the variance inflation factor threshold. The temperature vector with the lowest value is selected, and all the screened temperature thresholds are used as the characteristic temperature subset to characterize the stray radiation inside the large thermal inertial infrared system.

4. The response drift correction method of a large thermal inertia infrared system according to claim 3, characterized in that: The variance inflation factor threshold is set to 10, and the The temperature vector of Select from the temperature vector The temperature vector with the lowest value.

5. The response drift correction method of a large thermal inertia infrared system according to claim 1, characterized in that: The infrared system response model is: in, Indicates the thermal inertia of the infrared system to the temperature The response grayscale value of blackbody radiation, Indicates the temperature The radiance of a black body, represents the gain coefficient of the large thermal inertia infrared system, represents the internal stray radiation gain coefficient of the large thermal inertia infrared system in thermal equilibrium state, represents the internal stray radiation gain coefficient of the large thermal inertia infrared system in the non-thermal equilibrium state, Indicates ambient temperature The corresponding equivalent blackbody radiance, Indicates the surface temperature of the optical structure where the nth temperature sensor is located The corresponding equivalent blackbody radiance, represents the bias coefficient of the large thermal inertia infrared system, and M represents the number of temperature vectors that meet the screening conditions.

6. The response drift correction method of a large thermal inertia infrared system according to claim 5, characterized in that: Before performing radiation calibration measurement on the large thermal inertial infrared system, a calibration blackbody is placed within the field of view of the large thermal inertial infrared system so that the target surface radiation of the calibration blackbody fills the entire field of view; when performing radiation calibration measurement on the large thermal inertial infrared system, the close-range extended source method is used to perform absolute radiation calibration measurement on the large thermal inertial infrared system.

7. The response drift correction method of a large thermal inertia infrared system according to claim 6, characterized in that: Before performing absolute radiation calibration measurement on the large thermal inertia infrared system, it should be turned off and fully heat-exchanged with the ambient temperature, and then the large thermal inertia infrared system should be turned on and absolute radiation calibration measurement should be performed on it.

8. A response drift correction device for a large thermal inertia infrared system, characterized in that: include: The radiation calibration measurement unit is used to perform radiation calibration measurements on the large thermal inertia infrared system placed in different ambient temperatures, recording the temperature value of the black body, the response grayscale value of the large thermal inertia infrared system, and the temperature value of each temperature sensor at different ambient temperatures; wherein each temperature sensor is respectively set on each optical structure in the infrared channel of the large thermal inertia infrared system; A temperature vector forming unit, configured to form a temperature vector from the temperature values ​​measured by each temperature sensor at different ambient temperatures, so as to form a total of temperature vectors equal to the number of temperature sensors; A characteristic temperature subset construction unit is used to calculate the variance expansion factor of each temperature vector, select the variance expansion factor that meets the conditions according to the screening conditions, and use the corresponding temperature vector as the characteristic temperature subset that characterizes the stray radiation inside the infrared system; The infrared system response model construction unit is used to construct the infrared system response model based on the characteristic temperature subset, and perform multivariate linear fitting on the infrared system response model based on the recorded different ambient temperatures and the temperature values ​​of the black body at different ambient temperatures, the temperature value of each temperature sensor and the response grayscale value of the large thermal inertia infrared system, to obtain the gain coefficient, internal stray radiation gain coefficient and bias coefficient of the infrared system response model, and complete the correction of the infrared system response model; The response drift correction unit is used to perform response drift correction on the large thermal inertia infrared system using the corrected infrared system response model.

9. A computer device, characterized in that: include: at least one processor; as well as a memory communicatively connected to the at least one processor; wherein, The memory stores instructions that can be executed by at least one processor, and the instructions are executed by the at least one processor so that the at least one processor executes the response drift correction method of the large thermal inertia infrared system according to any one of claims 1 to 7.

10. A non-transitory computer-readable storage medium storing computer instructions, characterized in that: The computer instructions are used to enable the computer to execute the response drift correction method for a large thermal inertia infrared system according to any one of claims 1 to 7.

Images