Closed-loop control method, storage medium and device based on weak measurement

Abstract

The present invention provides a closed-loop control method, storage medium, and device based on weak measurement, which can be applied to the field of weak measurement technology. The method includes: determining a target working area corresponding to the measured object in the n-1th period according to multiple n-1th light intensity contrasts obtained by weakly measuring the measured object in the n-1th period, and calling a corresponding target mapping relationship set according to the target working area, wherein the target mapping relationship set characterizes the mapping relationship between the target estimated phase and the target light intensity contrast, so that the n-1th estimated phase corresponding to the measured object can be determined from the target mapping relationship set, and the n-th bias phase of the n-th measurement period can be determined based on the n-1th estimated phase, thereby compensating for changes in the measured object by regulating the n-th bias phase, so that the n-th estimated phase obtained by the weak measurement of the n-th period can promptly follow the changes in the measured object.

Description

Technical Field

[0001] The present invention relates to the field of weak measurement technology, and more specifically, to a closed-loop control method, storage medium, and device based on weak measurement. Background Art

[0002] Weak measurement is a quantum measurement technology that uses tiny interaction strengths combined with forward and backward selection to amplify weak signals. It can extract partial information without significantly disturbing the system, thereby achieving a measurement effect with high sensitivity and a small measurement linear range.

[0003] In the process of realizing the concept of the present invention, it was found through research that when the measured quantity undergoes a rapid mutation beyond the linear working area, the weak measurement system in the related art is difficult to follow the changes of the measured quantity in real time, resulting in a certain lag or divergence in the measurement. Summary of the Invention

[0004] In view of this, the present invention provides a closed-loop control method, storage medium, and device based on weak measurement.

[0005] One aspect of the present invention provides a closed-loop control method based on weak measurement, including: obtaining an nth bias phase corresponding to an nth measurement cycle, wherein the nth bias phase is determined based on an n-1th estimated phase, the n-1th estimated phase is determined based on an n-1th measurement result from a mapping relationship set corresponding to a target working area to which a value to be measured belongs in the n-1th cycle, the target working area is determined based on the n-1th measurement result, the mapping relationship set characterizes a mapping relationship between light intensity contrast and the estimated phase, the n-1th measurement result includes multiple n-1th light intensity contrasts; and in the nth measurement cycle, based on compensation for the nth bias phase, performing a weak measurement on the value to be measured to obtain an nth estimated phase corresponding to the nth measurement result, where n is an integer greater than 1.

[0006] According to an embodiment of the present invention, obtaining an nth bias phase corresponding to an nth measurement cycle includes: performing multiple weak measurements on a target to be measured in an n-1th measurement cycle to obtain an n-1th measurement result; determining a target mapping relationship set from multiple mapping relationship sets based on the n-1th measurement result, wherein the target mapping relationship set corresponds to a target working area to which the target to be measured belongs in the n-1th cycle; determining an n-1th estimated phase from the target mapping relationship set using the n-1th measurement result; and superimposing the inverse of the n-1th estimated phase and the initial bias phase to obtain the nth bias phase.

[0007] According to an embodiment of the present invention, based on the n-1th measurement result, a target mapping relationship set is determined from multiple mapping relationship sets, including: dividing multiple n-1th light intensity contrasts into a judgment set and a measurement set according to the stable period and the transition period in the n-1th measurement cycle, wherein the transition period is the period when the initial bias phase is at the rising edge and at the falling edge, and the stable period is the period other than the transition period in the n-1th measurement cycle; determining the target working area to be measured in the n-1th measurement cycle according to the average value of the multiple n-1th light intensity contrasts in the judgment set and a predetermined threshold; and determining the target mapping relationship set from the multiple mapping relationship sets according to the target working area.

[0008] According to an embodiment of the present invention, a target working area to which the to-be-measured value in the n-1th measurement cycle belongs is determined based on an average value of multiple n-1th light intensity contrasts in a judgment set and a predetermined threshold value, including: determining that the target working area is a linear working area when the absolute value of the average value of multiple n-1th light intensity contrasts in the judgment set is greater than the predetermined threshold value; and determining that the target working area is a nonlinear working area when the absolute value of the average value of multiple n-1th light intensity contrasts in the judgment set is less than or equal to the predetermined threshold value.

[0009] According to an embodiment of the present invention, multiple n-1th light intensity contrasts are divided into a judgment set and a measurement set based on the stable period and the transition period in the n-1th measurement cycle, including: taking the n-1th light intensity contrast corresponding to the transition period of the n-1th measurement cycle in the n-1 measurement result as the judgment set; taking the n-1th light intensity contrast corresponding to the stable period of the n-1th measurement cycle in the n-1 measurement result as the measurement set.

[0010] According to an embodiment of the present invention, the nonlinear working area includes a positive nonlinear working area and a negative nonlinear working area; when the absolute value of the mean of multiple (n-1)th light intensity contrasts in the judgment set is less than or equal to a predetermined threshold, determining the target working area as the nonlinear working area includes: when the mean of multiple (n-1)th light intensity contrasts in the judgment set is positive and the absolute value of the mean is less than or equal to the predetermined threshold, determining the target working area as the positive nonlinear working area; when the mean of multiple (n-1)th light intensity contrasts in the judgment set is negative and the absolute value of the mean is less than or equal to the predetermined threshold, determining the target working area as the negative nonlinear working area.

[0011] According to an embodiment of the present invention, the target mapping relationship set includes multiple discretely distributed mapping relationships, where the mapping relationship is a single mapping relationship between light intensity contrast and estimated phase. The n-1th measurement result is used to determine the n-1th estimated phase from the target mapping relationship set, including: for each n-1th light intensity contrast: when there is a target light intensity contrast equal to the n-1th light intensity contrast in the target light intensity contrasts of the multiple target mapping relationships, the target estimated phase corresponding to the target light intensity contrast equal to the n-1th light intensity contrast is used as the first estimated phase; when there is no target light intensity contrast equal to the n-1th light intensity contrast in the target light intensity contrast of the multiple target mapping relationships, the mapping relationship to be interpolated is determined according to the n-1th light intensity contrast and the multiple target mapping relationships, and the second estimated phase is determined according to the light intensity contrast in the mapping relationship to be interpolated; and the multiple first estimated phases and the multiple second estimated phases are integrated to obtain the n-1th estimated phase.

[0012] According to an embodiment of the present invention, in the nth measurement cycle, based on the compensation of the nth bias phase, a weak measurement is performed on the measured value to obtain the nth estimated phase corresponding to the nth measurement result, including: using the nth bias phase to perform compensation processing on the measured value to obtain an adjustment state signal; projecting the adjustment state signal to the system post-selection state to obtain a final state signal; performing spectral splitting on the final state signal according to a predetermined splitting point to obtain a first split light and a second split light; obtaining the nth measurement result according to the ratio of the difference between the light intensity of the first split light and the light intensity of the second split light to the sum of the light intensity of the first split light and the light intensity of the second split light.

[0013] Another aspect of the present invention provides a computer-readable storage medium storing computer-executable instructions, which are used to implement the above method when executed.

[0014] Another aspect of the present invention provides an electronic device, comprising: one or more processors; and a memory for storing one or more programs, wherein when the one or more programs are executed by the one or more processors, the one or more processors implement the method described above.

[0015] Another aspect of the present invention further provides a computer program product, comprising a computer program or instructions, which implement the steps of the above method when executed by a processor.

[0016] According to an embodiment of the present invention, based on multiple light intensity contrasts measured in the previous measurement cycle, the target working area to which the measurement to be measured belongs in the previous measurement cycle is determined, so as to call a pre-built mapping relationship set corresponding to the target working area, so as to determine the estimated phase of the previous cycle that reflects the change of the measurement to be measured in the previous measurement cycle from the corresponding mapping relationship set, and based on the estimated phase of the previous measurement cycle, the bias phase of the current measurement cycle is determined to compensate for the real-time change of the measurement to be measured, thereby realizing an impact-resistant closed-loop weak measurement based on real-time measurement results and adaptively updating the bias phase, which improves the measurement accuracy, stability and anti-interference of the weak measurement to a certain extent. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] The above and other objects, features and advantages of the present invention will become more apparent through the following description of the embodiments of the present invention with reference to the accompanying drawings, in which:

[0018] Figure 1 A flow chart of a closed-loop control method based on weak measurement technology according to an embodiment of the present invention is shown.

[0019] Figure 2 A schematic diagram showing the variation of measurement results with time delay according to an embodiment of the present invention is shown.

[0020] Figure 3 FIG. 4 is a schematic diagram showing the working principle of a weak measurement system according to an embodiment of the present invention.

[0021] Figure 4 A schematic diagram comparing the following performance of the closed-loop control method according to an embodiment of the present invention and the following performance of a control method in related art is shown.

[0022] Figure 5 A block diagram of an electronic device suitable for implementing a closed-loop control method based on weak measurement according to an embodiment of the present invention is shown. DETAILED DESCRIPTION

[0023] Hereinafter, embodiments of the present invention will be described with reference to the accompanying drawings. However, it should be understood that these descriptions are exemplary only and are not intended to limit the scope of the present invention. In the following detailed description, for ease of explanation, many specific details are set forth to provide a comprehensive understanding of embodiments of the present invention. However, it is apparent that one or more embodiments may also be implemented without these specific details. In addition, in the following description, descriptions of known structures and technologies are omitted to avoid unnecessary confusion of the concept of the present invention.

[0024] The terms used herein are only for describing specific embodiments and are not intended to limit the present invention. The terms "comprise", "include", etc. used herein indicate the presence of the features, steps, operations and / or components, but do not exclude the presence or addition of one or more other features, steps, operations or components.

[0025] All terms used herein (including technical and scientific terms) have the meanings commonly understood by those skilled in the art unless otherwise defined. It should be noted that the terms used herein should be interpreted as having a meaning consistent with the context of this specification and should not be interpreted in an idealized or overly rigid manner.

[0026] When expressions such as "at least one of A, B, and C, etc." are used, they should generally be interpreted in accordance with the meaning commonly understood by those skilled in the art (for example, "a system having at least one of A, B, and C" should include but is not limited to a system having A alone, B alone, C alone, A and B, A and C, B and C, and / or A, B, C, etc.).

[0027] In the process of realizing the inventive concept of the present invention, it was found through research that the weak measurement technology in the related art adopts a fixed bias phase. When the measured value input to the system undergoes sudden changes due to factors such as ambient temperature fluctuations, mechanical vibrations, light source intensity / wavelength drift, and optical component aging, it is easy to deviate from the highly sensitive linear working area, that is, the system no longer responds to changes in the measured value, thereby causing distortion of the measurement results.

[0028] In view of this, an embodiment of the present invention provides a closed-loop control method based on weak measurement, for example, using the regulation of the nth bias phase to compensate for changes in the measured quantity, so that the nth estimated phase obtained by the weak measurement of the nth measurement cycle can promptly follow the changes in the measured quantity. In order to obtain the nth bias phase, a mapping relationship set corresponding to the working area can be pre-constructed, and different types of working areas have different mapping relationship sets. Therefore, when the target mapping relationship set corresponding to the target working area is determined based on the n-1th measurement result, the n-1th estimated phase for reflecting the change of the measured quantity in the n-1th measurement cycle can be determined from the target mapping relationship set.

[0029] Figure 1 A flow chart of a closed-loop control method based on weak measurement according to an embodiment of the present invention is shown.

[0030] like Figure 1 As shown, the method 100 includes operations S110 to S120.

[0031] In operation S110 , an nth offset phase corresponding to an nth measurement period is acquired.

[0032] In operation S120, in an nth measurement cycle, based on the compensation of the nth offset phase, a weak measurement is performed on the object to be measured to obtain an nth estimated phase corresponding to the nth measurement result.

[0033] To more fully understand the closed-loop control method based on weak measurement according to an embodiment of the present invention, the previous measurement cycle will be used to represent the n-1th measurement cycle, and correspondingly, the current measurement cycle will be used to represent the nth measurement cycle.

[0034] According to an embodiment of the present invention, in an optical weak measurement system, when the measured quantity enters the system, it will change the phase difference of the system, causing a phase shift. However, the equivalent phase shift corresponding to the current measured quantity is difficult to be directly observed by the system, and the measurement result that can be obtained based on the observable quantity is the light intensity contrast. Therefore, it is necessary to pre-construct a mapping relationship set between the light intensity contrast and the estimated phase.

[0035] According to an embodiment of the present invention, before the weak measurement begins, multiple preset phases discretely distributed at predetermined intervals can be input into the weak measurement system in sequence without inputting the measurement to be measured (the measurement to be measured is set to 0), so as to obtain the corresponding relationship between the multiple preset phases and their corresponding light intensity contrasts, complete the construction of the mapping relationship set, and ensure that the total loop gain of the final mapping relationship set is approximately 1.

[0036] According to an embodiment of the present invention, each measurement cycle may include multiple weak measurements, and each weak measurement corresponds to a light intensity contrast. Therefore, for the n-1th measurement cycle, the obtained n-1th measurement result includes multiple n-1th light intensity contrasts.

[0037] According to an embodiment of the present invention, the working area and the mapping relationship set are one-to-one corresponding, that is, the target working area to be measured in the n-1 measurement cycle can be determined by the n-1 measurement result, so that the mapping relationship set corresponding to the target working area can be called to determine the n-1 estimated phase corresponding to the n-1 measurement result from the corresponding mapping relationship set. Therefore, there is a single mapping between the light intensity contrast and the estimated phase in the mapping relationship set.

[0038] According to an embodiment of the present invention, based on multiple light intensity contrasts measured in the previous measurement cycle, the target working area to which the measurement to be measured belongs in the previous measurement cycle is determined, so as to call a pre-built mapping relationship set corresponding to the target working area, so as to determine the estimated phase of the previous cycle that reflects the change of the measurement to be measured in the previous measurement cycle from the corresponding mapping relationship set, and based on the estimated phase of the previous measurement cycle, the bias phase of the current measurement cycle is determined to compensate for the real-time change of the measurement to be measured, thereby realizing an impact-resistant closed-loop weak measurement based on real-time measurement results and adaptively updating the bias phase, which improves the measurement accuracy, stability and anti-interference of the weak measurement to a certain extent.

[0039] According to an embodiment of the present invention, in the nth measurement cycle, based on the compensation of the nth bias phase, a weak measurement is performed on the measured value to obtain the nth estimated phase corresponding to the nth measurement result, including: using the nth bias phase to perform compensation processing on the measured value to obtain an adjustment state signal; projecting the adjustment state signal to the system post-selection state to obtain a final state signal; performing spectral splitting on the final state signal according to a predetermined splitting point to obtain a first split light and a second split light; obtaining the nth measurement result according to the ratio of the difference between the light intensity of the first split light and the light intensity of the second split light to the sum of the light intensity of the first split light and the light intensity of the second split light.

[0040] According to an embodiment of the present invention, the weak measurement process is based on the framework of "pre-selection-weak coupling-post-selection". In the current nth measurement cycle, a total of K weak measurements are performed. For the kth measurement, the initial state of the system is It can be expressed as , where k∈K, and both k and K are positive integers, represents the spectral distribution of the pointer light, The center frequency is , the spectral width is .

[0041] According to the embodiment of the present invention, the biased weak measurement delay β is introduced to modulate the initial state of the system to the pre-selection state , at this time, the measurement enters the system and generates a time-varying phase , time-varying phase Weak coupling interaction occurs with the system, weak coupling process It can be expressed as the following formula (1).

[0042] (1)

[0043] in, Represents the observable quantity of the system, the time-varying phase is an unknown quantity corresponding to the estimated phase.

[0044] According to an embodiment of the present invention, the bias phase of the current measurement cycle (for example, the nth bias phase) is introduced based on the observable quantity of the previous measurement cycle to regulate the system, and the evolution process shown in the following formula (2) can be obtained: .

[0045] (2)

[0046] in, Indicates the offset phase of the current measurement cycle.

[0047] According to an embodiment of the present invention, the regulated state signal obtained by the above evolution is projected onto the post-selection state of the system for signal modulation. In order to make the system still maintain the quantum superposition characteristics after weak coupling interaction, that is, to avoid the wave function collapse caused by strong measurement while almost not disturbing the quantum state of the system, it is necessary to ensure that the post-selection state It is nearly orthogonal to the previous selection state, that is, it satisfies the constraints of the following formula (3).

[0048] (3)

[0049] in, represents the postselection angle of the postselection state.

[0050] According to an embodiment of the present invention, based on the pre-selection state and the post-selection state, the weak value shown in the following formula (4) can be obtained: .

[0051] (4)

[0052] Among them, when the above formula (4) is satisfied, the inner product ⟨f|i> approaches 0, so even if the eigenvalue of the observable is small, the weak value is still amplified, thus the time-varying phase The slight change of is converted into a significant shift of the pointer light quantum state. On the contrary, when the front and back selection states are not close to orthogonal, the weak value The amplification effect of is limited to the larger eigenvalues ​​of the observable. When the eigenvalues ​​of the observable are small, the weak value The amplification effect will be significantly weakened, making the system sensitive to time-varying phase The response sensitivity is low and it is easily interfered by noise signals.

[0053] According to an embodiment of the present invention, the quantum state of the system after projection It can be expressed as the following formula (5).

[0054] (5)

[0055] According to an embodiment of the present invention, the final state signal The spectral distribution of can be expressed as the following formula (6).

[0056] (6)

[0057] According to an embodiment of the present invention, the center frequency is the predetermined split point, and the final state signal Perform spectrum splitting and obtain the first split light and the second split light The process can be expressed as the following formula (7) and formula (8) respectively.

[0058] (7)

[0059] (8)

[0060] According to an embodiment of the present invention, the light intensity contrast obtained by the kth measurement is It can be expressed as the following formula (9).

[0061] (9)

[0062] According to an embodiment of the present invention, by using nearly orthogonal pre-selection states and post-selection states, combined with post-selection projection and spectral splitting, the response of the system to be measured is converted into light intensity contrast without disturbing the quantum state of the system, effectively eliminating common-mode interference, thereby realizing a high-precision, interference-resistant weak measurement closed-loop control.

[0063] According to an embodiment of the present invention, obtaining an nth bias phase corresponding to an nth measurement cycle includes: in an n-1th measurement cycle, based on compensation for the n-1th bias phase, performing multiple weak measurements on the object to be measured to obtain an n-1th measurement result; based on the n-1th measurement result, determining a target mapping relationship set from multiple mapping relationship sets, wherein the mapping relationship set characterizes a mapping relationship between light intensity contrast and an estimated phase; based on the n-1th measurement result, determining an n-1th estimated phase from the target mapping relationship set; and superimposing the opposite of the n-1th estimated phase and the initial bias phase to obtain the nth bias phase.

[0064] According to an embodiment of the present invention, the initial bias phase can be an ideal square wave source and an inertial time constant T s The result of the cascade of small inertia links.

[0065] For example, the initial bias phase It can be expressed as the following formula (10).

[0066] (10)

[0067] in, It represents the time delay corresponding to the center point of the weak measurement linear working area, and T represents the measurement period.

[0068] According to an embodiment of the present invention, the inverse of the estimated phase obtained in the previous measurement cycle and the initial bias phase are linearly superimposed to obtain the bias phase of the current measurement cycle. The process can be expressed as the following formula (11).

[0069] (11)

[0070] in, Represents the feedback compensation phase, which is the inverse of the estimated phase obtained in the previous measurement cycle.

[0071] For example, the estimated phase obtained in the previous measurement cycle is x, that is, the phase offset caused by the to-be-measured effect on the system is x, and the feedback compensation phase is -x to compensate for the phase offset.

[0072] According to an embodiment of the present invention, the bias phase of the current measurement cycle is reversely corrected by the measurement results of the previous measurement cycle, and the phase deviation of the system caused by environmental fluctuations or quantum state evolution is actively compensated, thereby effectively avoiding the distortion of measurement results caused by the mismatch between the fixed bias phase and actual needs in related technologies.

[0073] According to an embodiment of the present invention, based on the n-1th measurement result, a target mapping relationship set is determined from multiple mapping relationship sets, including: dividing multiple n-1th light intensity contrasts into a judgment set and a measurement set according to the stable period and the transition period in the n-1th measurement cycle, wherein the transition period is the period when the initial bias phase is at the rising edge and at the falling edge, and the stable period is the period other than the transition period in the n-1th measurement cycle; determining the target working area to be measured in the n-1th measurement cycle according to the average value of the multiple n-1th light intensity contrasts in the judgment set and a predetermined threshold; and determining the target mapping relationship set from the multiple mapping relationship sets according to the target working area.

[0074] According to an embodiment of the present invention, the working area includes a linear working area and a nonlinear working area. The linear working area of ​​weak measurement is narrow and the system response sensitivity is high. Conversely, the nonlinear working area is wide but hardly responds to phase offset. Therefore, when the input measurement value suddenly changes, the system is likely to enter the nonlinear working area, resulting in measurement distortion, so it is necessary to make a timely judgment on the working area to which it belongs.

[0075] In order to better understand the principle of dividing the judgment set and the measurement set in the embodiment of the present invention, the following will be Figure 2 The division of the judgment set and the measurement set is further explained.

[0076] Figure 2 A schematic diagram showing the variation of measurement results with time delay according to an embodiment of the present invention is shown.

[0077] like Figure 2 As shown, the horizontal axis represents the time delay τ, and the vertical axis represents the light intensity contrast. Based on the change curve of light intensity contrast and time delay τ, it can be seen that the steeper intervals on both sides of the curve correspond to the linear working area, and the flatter interval in the middle of the curve corresponds to the nonlinear working area. c The graph shows that m s(t) sweeps across the linear working area during the transition period between the rising edge and the falling edge to trigger the negative peak of the curve of the light intensity contrast and the time delay τ, while m s (t) During the stable period of high or low level, the curve of light intensity contrast and time delay τ changes smoothly, that is, the system response is distorted.

[0078] Therefore, in the linear operating region, the sweep of the square wave carrier causes a characteristic negative peak, while in the nonlinear operating region, no characteristic negative peak is induced. Therefore, the multiple light intensity contrasts can be divided into a judgment set for determining the target operating region and a measurement set for estimating the phase based on the square wave carrier variation of the initial bias phase.

[0079] According to the embodiment of the present invention, combined with the above formula (11), it can be known that m s The establishment process of the rising and falling edges of (t) satisfies the following formula (12).

[0080] (12)

[0081] From this, we can know that the duration of the transition period corresponding to the rising edge or falling edge is It can be expressed as the following formula (13).

[0082] (13)

[0083] Where b represents the total width of the linear working area, Indicates the peak value of the square wave carrier.

[0084] According to an embodiment of the present invention, based on the scanning characteristics of the working area by the initial bias phase, the measurement results are divided into a judgment set and a measurement set. The mean statistics of the light intensity contrast are compared with a predetermined threshold to judge the different target working areas, thereby providing a technical basis for calling the corresponding mapping relationship set, and effectively avoiding the measurement errors caused by the one-to-many mapping of the estimated phase and light intensity contrast in a single mapping relationship set or a mapping relationship table in the related art.

[0085] According to an embodiment of the present invention, multiple n-1th light intensity contrasts are divided into a judgment set and a measurement set based on the stable period and the transition period in the n-1th measurement cycle, including: taking the n-1th light intensity contrast corresponding to the transition period of the n-1th measurement cycle in the n-1 measurement result as the judgment set; taking the n-1th light intensity contrast corresponding to the stable period of the n-1th measurement cycle in the n-1 measurement result as the measurement set.

[0086] According to an embodiment of the present invention, the range corresponding to the number of measurements k1 for determining the concentrated light intensity contrast can be expressed as the following formula (14).

[0087] (14)

[0088] Since the rising edge and the falling edge in a single measurement cycle are symmetrical, d represents the total number of measurements corresponding to the transition periods of the rising edge and the falling edge.

[0089] Accordingly, the number of measurements k2 of the plurality of light intensity contrasts in the measurement set is expressed as K-k1.

[0090] According to an embodiment of the present invention, the light intensity contrast corresponding to the transition period is determined as a judgment set to ensure that the judgment set captures the negative peak response of the linear working area in real time, and the light intensity contrast corresponding to the stable period is determined as a measurement set to avoid fluctuation interference in the transition period and improve the reliability and accuracy of the estimation.

[0091] According to an embodiment of the present invention, a target working area to which the to-be-measured value in the n-1th measurement cycle belongs is determined based on an average value of multiple n-1th light intensity contrasts in a judgment set and a predetermined threshold value, including: determining that the target working area is a linear working area when the absolute value of the average value of multiple n-1th light intensity contrasts in the judgment set is greater than the predetermined threshold value; and determining that the target working area is a nonlinear working area when the absolute value of the average value of multiple n-1th light intensity contrasts in the judgment set is less than or equal to the predetermined threshold value.

[0092] According to an embodiment of the present invention, the setting of the predetermined threshold value must satisfy the constraint condition that at least one light intensity contrast in the judgment set falls below the predetermined threshold value, that is, the measurement interval of a single measurement cycle The time window of the linear working area corresponding to the predetermined threshold satisfy , It can be expressed as the following formula (15).

[0093] (15)

[0094] in, and Respectively represent the predetermined threshold and Figure 2 The intersection of the ∆P→τ curve shown in corresponds to the first delay and the second delay, and τ1<τ2.

[0095] According to an embodiment of the present invention, the average value of the multiple light intensity contrasts in the judgment set satisfy In the case of , the target working area to be measured is the linear working area; otherwise, the mean of multiple light intensity contrasts in the judgment set satisfy In the case of , the target working area to be measured is a nonlinear working area.

[0096] According to an embodiment of the present invention, the nonlinear working area includes a positive nonlinear working area and a negative nonlinear working area; when the absolute value of the average of multiple (n-1)th light intensity contrasts in the judgment set is less than a predetermined threshold, determining the target working area as the nonlinear working area includes: when the average of multiple (n-1)th light intensity contrasts in the judgment set is positive and the absolute value of the average is less than the predetermined threshold, determining the target working area as the positive nonlinear working area; when the average of multiple (n-1)th light intensity contrasts in the judgment set is negative and the absolute value of the average is less than the predetermined threshold, determining the target working area as the negative nonlinear working area.

[0097] According to an embodiment of the present invention, and > 0, the target working area to be measured is the positive nonlinear working area; otherwise, and When <0, the target working area to be measured is the negative nonlinear working area.

[0098] According to an embodiment of the present invention, after determining that the target operating area to which the current measurement cycle belongs is a nonlinear operating area, it is further subdivided into a positive nonlinear operating area and a negative nonlinear operating area based on the sign of the mean light intensity contrast value, so as to select a corresponding target mapping relationship set to obtain a more accurate estimated phase, thereby adjusting the compensation direction and compensation amount of the feedback compensation phase, and ensuring that the bias phase in the next measurement cycle (i.e., the (n+1)th measurement cycle) can adjust the system back to the most responsive operating area.

[0099] According to an embodiment of the present invention, the target mapping relationship set includes multiple target mapping relationships, where the mapping relationship is a single mapping relationship of light intensity contrast and estimated phase. Based on the n-1th measurement result, the n-1th estimated phase is determined from the target mapping relationship set, including: for each n-1th light intensity contrast: when there is a target light intensity contrast equal to the n-1th light intensity contrast in the target light intensity contrasts of the multiple target mapping relationships, the target estimated phase corresponding to the target light intensity contrast equal to the n-1th light intensity contrast is used as the first estimated phase; when there is no target light intensity contrast equal to the n-1th light intensity contrast in the target light intensity contrast of the multiple target mapping relationships, the mapping relationship to be interpolated is determined according to the n-1th light intensity contrast and the multiple target mapping relationships, and the second estimated phase is determined according to the n-1th light intensity contrast in the mapping relationship to be interpolated; and the multiple first estimated phases and the multiple second estimated phases are integrated to obtain the n-1th estimated phase.

[0100] For example, the target mapping relationship set includes the first target mapping relationship C (τ c , △P c ) and the second target mapping relationship D(τd , △P d The light intensity contrast obtained by the second measurement is △P2=△P c , the corresponding first estimated phase τ can be directly read from the first target mapping relationship C c .

[0101] The light intensity contrast obtained by the fourth measurement is △P4≠△P c ≠△P d , and satisfy △P d >△P4>△P c , that is, the first target mapping relationship C (τ c , △P c ) and the second target mapping relationship D(τ d , △P d ) is determined as the mapping relationship to be interpolated, based on △P4, △P c , △P d , using linear interpolation, we can get the second estimated phase corresponding to △P4.

[0102] According to an embodiment of the present invention, the integration processing of multiple first estimated phases and multiple second estimated phases may include segmented integration, that is, integrating the multiple first estimated phases and the multiple second estimated phases separately, or integrating the multiple first estimated phases and the multiple second estimated phases together to obtain the n-1th estimated phase.

[0103] Figure 3 FIG. 4 is a schematic diagram showing the working principle of a weak measurement system according to an embodiment of the present invention.

[0104] like Figure 3 As shown, after the weak measurement begins, the initial state 310 of the weak measurement system is modulated to obtain the pre-selected state 320, which is weakly coupled to the input measured quantity 330 to obtain the regulated state 350, wherein the measured quantity 330 is obtained under the control of the initial bias phase 340, and the regulated state 350 is projected to the post-selected state 360. The measurement result 370 is obtained through spectral splitting, and the measurement result 370 is input to the server 380. The target working area is determined in the server 380, and the corresponding mapping relationship is called according to the target working area. The estimated phase is obtained by using the direct table lookup method or linear interpolation method, and the feedback compensation phase 390 is determined by using the estimated phase to superimpose the initial bias phase 340 in the phase modulator to obtain the bias phase for the next cycle, thereby regulating the measured quantity 330 of the next measurement cycle to compensate for the phase offset. Indicates superposition.

[0105] Figure 4 A schematic diagram comparing the following performance of the closed-loop control method according to an embodiment of the present invention and the following performance of a control method in related art is shown.

[0106] like Figure 4 As shown, the horizontal axis represents time (unit: ms) and the vertical axis represents angle (dimensionless). It can be seen that the graph corresponding to the estimated phase obtained by the closed-loop control method of the embodiment of the present invention is close to the graph of the true phase corresponding to the input measured value, that is, the following performance is better and the measurement sensitivity is higher, while the graph corresponding to the estimated phase obtained by the control method in the related art is close to flat, that is, it hardly responds to the changes in the measured value, and the following performance is poor, resulting in distorted measurement results.

[0107] For example, the gain of the quantum gyroscope system obtained by the closed-loop control method is M, and the gain of the quantum system in the prior art is Y. Figure 4 The following performance corresponding to the control method in the related art can be expressed by the slope. Therefore, the following performance threshold of the related art is the maximum slope Z max It can be expressed as the following formula (16).

[0108] (16)

[0109] in, Indicates the maximum light intensity contrast in the measurement results.

[0110] Accordingly, Figure 4 The maximum slope H corresponding to the closed-loop control method of the embodiment of the present invention max It can be expressed as the following formula (17).

[0111] (17)

[0112] in, Indicates the maximum slope H max The corresponding maximum delay.

[0113] Combining the above formula (16) and the above formula (17), the following formula (18) can be obtained.

[0114] (18)

[0115] From this we can see that, combined with the above Figure 4 Substituting the data in into formula (18), it can be seen that the following ability of the closed-loop control method corresponding to the embodiment of the present invention is improved by about 65 times compared with the following ability of the related art.

[0116] Figure 5 A block diagram of an electronic device suitable for implementing a closed-loop control method based on weak measurement according to an embodiment of the present invention is shown. Figure 5 The electronic device shown is only an example and should not limit the functions and scope of use of the embodiments of the present invention.

[0117] like Figure 5 As shown, an electronic device 500 according to an embodiment of the present invention includes a processor 501, which can perform various appropriate actions and processes according to a program stored in a read-only memory (ROM) 502 or a program loaded from a storage unit 508 into a random access memory (RAM) 503. The processor 501 may include, for example, a general-purpose microprocessor (e.g., a CPU), an instruction set processor and / or a related chipset and / or a special-purpose microprocessor (e.g., an application-specific integrated circuit (ASIC)), etc. The processor 501 may also include onboard memory for caching purposes. The processor 501 may include a single processing unit or multiple processing units for performing different actions of the method flow according to an embodiment of the present invention.

[0118] Various programs and data required for the operation of the electronic device 500 are stored in the RAM 503. The processor 501, ROM 502, and RAM 503 are connected to each other via a bus 504. The processor 501 executes the programs in the ROM 502 and / or RAM 503 to perform various operations according to the method flow of the embodiment of the present invention. It should be noted that the programs may also be stored in one or more memories other than the ROM 502 and RAM 503. The processor 501 may also execute the programs stored in the one or more memories to perform various operations according to the method flow of the embodiment of the present invention.

[0119] According to an embodiment of the present invention, electronic device 500 may further include an input / output (I / O) interface 505, which is also connected to bus 504. Electronic device 500 may also include one or more of the following components connected to I / O interface 505: an input section 506 including a keyboard, mouse, etc.; an output section 507 including devices such as a cathode ray tube (CRT), liquid crystal display (LCD), and speakers; a storage section 508 including a hard disk; and a communication section 509 including a network interface card such as a LAN card or modem. Communication section 509 performs communication processing via a network such as the Internet. A drive 510 is also connected to I / O interface 505 as needed. Removable media 511, such as a magnetic disk, optical disk, magneto-optical disk, semiconductor memory, etc., is installed in drive 510 as needed, so that computer programs read from the removable media can be installed into storage section 508 as needed.

[0120] The present invention also provides a computer-readable storage medium, which may be included in the device / system described in the above embodiments, or may exist independently and not incorporated into the device / apparatus / system. The computer-readable storage medium carries one or more programs, which, when executed, implement the method according to the embodiments of the present invention.

[0121] According to embodiments of the present invention, a computer-readable storage medium may be a non-volatile computer-readable storage medium. Examples include, but are not limited to, a portable computer disk, a hard disk, random access memory (RAM), read-only memory (ROM), erasable programmable read-only memory (EPROM or flash memory), a portable compact disk read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination thereof. In the present invention, a computer-readable storage medium may be any tangible medium containing or storing a program that can be used by or in conjunction with an instruction execution system, apparatus, or device.

[0122] For example, according to an embodiment of the present invention, the computer-readable storage medium may include the ROM 502 and / or the RAM 503 described above and / or one or more memories other than the ROM 502 and the RAM 503 .

[0123] The flowcharts and block diagrams in the accompanying drawings illustrate the possible architectures, functions, and operations of the systems, methods, and computer program products according to various embodiments of the present invention. In this regard, each box in the flowchart or block diagram may represent a module, program segment, or portion of code, which contains one or more executable instructions for implementing the specified logical function. It should also be noted that in some alternative implementations, the functions marked in the boxes may occur in an order different from that marked in the accompanying drawings. For example, two boxes shown in succession may actually be executed substantially in parallel, or they may sometimes be executed in the opposite order, depending on the functions involved. It should also be noted that each box in the block diagram or flowchart, as well as the combination of boxes in the block diagram or flowchart, may be implemented using a dedicated hardware-based system that performs the specified function or operation, or may be implemented using a combination of dedicated hardware and computer instructions. It will be understood by those skilled in the art that the features described in the various embodiments of the present invention may be combined and / or coupled in various ways, even if such combinations or couplings are not explicitly described in the present invention. In particular, the features described in the various embodiments of the present invention may be combined and / or coupled in various ways without departing from the spirit and teachings of the present invention. All such combinations and / or combinations fall within the scope of the present invention.

[0124] The above describes embodiments of the present invention. However, these embodiments are for illustrative purposes only and are not intended to limit the scope of the present invention. Although each embodiment has been described separately above, this does not mean that the measures in each embodiment cannot be advantageously used in combination. Without departing from the scope of the present invention, those skilled in the art may make various substitutions and modifications, which should all fall within the scope of the present invention.

Claims

1. A closed-loop control method based on weak measurement, characterized in that: include: Obtaining the nth offset phase corresponding to the nth measurement cycle, including: In the n-1th measurement cycle, based on the compensation of the n-1th offset phase, a weak measurement is performed on the object to be measured to obtain the n-1th measurement result; Determining a target mapping relationship set from a plurality of mapping relationship sets based on the n-1th measurement result includes: Dividing the multiple (n-1)th light intensity contrasts into a judgment set and a measurement set according to a stable period and a transition period in the (n-1)th measurement cycle, wherein the transition period is a period when the initial bias phase is at a rising edge and a falling edge, and the stable period is a period in the (n-1)th measurement cycle excluding the transition period; Determining the target working area to which the to-be-measured object belongs in the n-1th measurement cycle according to an average of a plurality of n-1th light intensity contrasts in the judgment set and a predetermined threshold; Determining the target mapping relationship set from the multiple mapping relationship sets according to the target working area, wherein the mapping relationship set represents a mapping relationship between light intensity contrast and estimated phase; Determining the n-1th estimated phase from the target mapping relationship set based on the n-1th measurement result includes: For each of the n-1th light intensity contrasts: When there is a target light intensity contrast equal to the n-1th light intensity contrast in the measurement set among the target light intensity contrasts of the plurality of target mapping relationships, taking the target estimated phase corresponding to the target light intensity contrast equal to the n-1th light intensity contrast as the first estimated phase; In a case where the target light intensity contrasts of the multiple target mapping relationships do not have a target light intensity contrast equal to the n-1th light intensity contrast in the measurement set, determining a mapping relationship to be interpolated based on the n-1th light intensity contrast and the multiple target mapping relationships, and determining a second estimated phase based on the n-1th light intensity contrast in the mapping relationship to be interpolated; performing integration processing on a plurality of the first estimated phases and a plurality of the second estimated phases to obtain the n-1th estimated phase; Superimposing the inverse of the n-1th estimated phase and the initial bias phase to obtain the n-th bias phase; wherein the n-th bias phase is determined based on the n-1th estimated phase, the n-1th estimated phase is determined based on the n-1th measurement result from a target mapping relationship set corresponding to a target working area to be measured in the n-1th period, the target working area is determined based on the n-1th measurement result, the target mapping relationship set represents a mapping relationship between a target light intensity contrast and a target estimated phase, the n-1th measurement result includes multiple n-1th light intensity contrasts, and n is an integer greater than 1; and In the nth measurement cycle, based on the compensation of the nth offset phase, weak measurement is performed on the to-be-measured value to obtain an nth estimated phase corresponding to the nth measurement result.

2. The method according to claim 1, characterized in that The step of determining the target working area to which the to-be-measured object belongs in the n-1th measurement cycle according to the average of the plurality of n-1th light intensity contrasts in the judgment set and a predetermined threshold value comprises: When the absolute value of the average of the plurality of (n-1)th light intensity contrasts in the judgment set is greater than the predetermined threshold, determining that the target working area is a linear working area; When the absolute value of the average values ​​of the plurality of (n-1)th light intensity contrasts in the judgment set is less than or equal to the predetermined threshold, the target working area is determined to be a nonlinear working area.

3. The method according to claim 1, characterized in that The dividing the plurality of (n-1)th light intensity contrasts into a judgment set and a measurement set according to the stable period and the transition period in the (n-1)th measurement cycle comprises: taking the n-1th light intensity contrast corresponding to the transition period of the n-1th measurement cycle in the n-1th measurement result as a judgment set; The n-1th light intensity contrast in the n-1th measurement result corresponding to the stable period of the n-1th measurement cycle is taken as a measurement set.

4. The method according to claim 2, characterized in that The nonlinear working area includes a positive nonlinear working area and a negative nonlinear working area; when the absolute value of the average of the plurality of (n-1)th light intensity contrasts in the judgment set is less than or equal to the predetermined threshold, determining that the target working area is a nonlinear working area includes: When the average value of the plurality of (n-1)th light intensity contrasts in the judgment set is positive and the absolute value of the average value is less than or equal to the predetermined threshold, determining that the target working area is a positive nonlinear working area; When the average value of the plurality of (n-1)th light intensity contrasts in the judgment set is negative and the absolute value of the average value is less than or equal to the predetermined threshold, the target working area is determined to be a negative nonlinear working area.

5. The method according to claim 1, wherein The step of performing weak measurement on the measurement to be measured based on the compensation of the nth offset phase in the nth measurement cycle to obtain an nth estimated phase corresponding to the nth measurement result includes: performing compensation processing on the to-be-measured value by utilizing the nth bias phase to obtain a regulation state signal; Projecting the regulated state signal onto the post-selection state of the system to obtain a final state signal; performing spectral splitting on the final-state signal according to a predetermined splitting point to obtain a first split light and a second split light; The nth measurement result is obtained according to the ratio of the difference between the light intensity of the first split light and the light intensity of the second split light to the sum of the light intensity of the first split light and the light intensity of the second split light. 6 . A computer-readable storage medium having executable instructions stored thereon, which, when executed by a processor, causes the processor to implement the method according to claim 1 .

7. An electronic device comprising: one or more processors; a memory for storing one or more programs, When the one or more programs are executed by the one or more processors, the one or more processors are enabled to implement the method according to any one of claims 1 to 5.

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