Aging test device and method

Abstract

The invention discloses an aging test device and method, and the device comprises a main control module and a drive control module. The driving control module is used for being connected with at least one test device; the main control module is used for outputting a test control signal in an aging test mode corresponding to the test equipment according to an external control instruction; and the driving control module is also used for driving the test equipment to enter a corresponding aging test mode according to the test control signal. When the aging test is carried out on the test equipment, hardware matched with different test equipment does not need to be replaced based on the different test equipment, so that the test process is simplified, the difficulty of production line conversion is reduced, and the aging cost is reduced.

Description

Technical Field

[0001] The present application relates to the field of electronic technology, and in particular to an aging test device and method. Background Art

[0002] Currently, backlight panels incorporate driver chips and LEDs on a single aluminum substrate, using a multi-stage dimming method for the backlight driver to achieve LED dimming. Aging testing for panels involves subjecting them to long-term exposure to extreme conditions for quality screening and reliability testing.

[0003] It is known that the current aging test of light panels uses the original TV driver board combined with a power supply to allow the light panels to light up with the default white field current for a long time. The disadvantage of this aging method is that the aging test requires the use of the original TV driver board, so the corresponding driver board needs to be frequently replaced according to different light panels, which makes production line conversion difficult and the testing cost high. Summary of the Invention

[0004] The present application provides an aging test device and method that can alleviate the difficulties in converting production lines and the high testing costs during the current aging test process.

[0005] The present application provides an aging test device, which includes:

[0006] Main control module and drive control module;

[0007] The main control module is connected to the drive control module, and the drive control module is also used to connect to at least one test device;

[0008] The main control module is used to output the test control signal under the aging test mode corresponding to the test equipment according to the external control instruction; the drive control module is used to drive the test equipment to enter the corresponding aging test mode according to the test control signal.

[0009] In some embodiments, the aging test device includes a light board, which includes multiple backlight partitions; the test control signal in the aging test mode includes at least two different test brightness data, the number of partitions corresponding to the light board, and the aging control timing;

[0010] The drive control module is specifically used to provide test dimming signals for corresponding backlight partitions according to the number of partitions and test brightness data, and to switch different test brightness data based on the aging control timing to output different test dimming signals.

[0011] In the aging test device of some embodiments, the number of test dimming signals output by the driving control module is not less than the number of backlight partitions.

[0012] In the aging test device of some embodiments, the drive control module is further configured to drive the test device to perform the default aging mode according to a preset control signal corresponding to the default aging mode when no test control signal is received within a preset time after startup.

[0013] In some embodiments of the aging test device, the main control module includes a mode switching unit, a main controller, and a signal output unit connected in sequence, and the signal output unit is connected to the drive control module;

[0014] The mode switching unit is used to output a trigger signal to the main controller according to the external control instruction. The main controller is used to switch the aging test mode according to the trigger signal and output the test control signal under the aging test mode to the drive control module through the signal output unit.

[0015] In some embodiments of the aging test device, the main control module further includes a display unit connected to the main controller;

[0016] The main controller is used to control the display unit to display mode information of the corresponding aging test mode under different aging test modes.

[0017] In some embodiments of the aging test device, the main control module further includes a communication unit connected to the main controller;

[0018] The communication unit is used to communicate with the host computer and to obtain data information of different test devices and output it to the main controller, so that the main controller sets the test control signal of the aging test mode of the corresponding test device according to the data information.

[0019] In some embodiments, the aging test device further includes a switching module connected to the drive control module;

[0020] The adapter module is used to connect to at least one test device, and the adapter module is used to output the test dimming signal output by the drive control module to one or more test devices.

[0021] In some embodiments, the aging test device further includes a first circuit board, a second circuit board, and a third circuit board;

[0022] The first circuit board is used to set the main control module; the second circuit board is used to set the drive control module; and the third circuit board is used to set the adapter module.

[0023] The present invention also provides an aging test method, which includes the following steps:

[0024] Obtaining a test control signal in an aging test mode corresponding to the test device according to an external control instruction;

[0025] The test equipment is controlled to enter a corresponding aging test mode according to the test control signal.

[0026] The present application provides an aging test device and method, the aging test device including a main control module and a drive control module; the main control module is used to output a test control signal under an aging test mode corresponding to the test device according to an external control instruction; the drive control module is used to drive the test device to enter a corresponding aging test mode according to the test control signal. Wherein, when performing an aging test on the test device, the aging test device can directly connect the test device to the aging test device, and then the main control module outputs a test control signal under an aging test mode corresponding to the test device according to the external control instruction, thereby controlling the test device to enter a corresponding aging test mode. Therefore, when performing an aging test on the test device, it is not necessary to replace the hardware that matches it based on different test devices, which simplifies the testing process, reduces the difficulty of production line conversion, and thus helps to reduce aging costs. BRIEF DESCRIPTION OF THE DRAWINGS

[0027] The following detailed description of the specific embodiments of the present application in conjunction with the accompanying drawings will make the technical solutions and other beneficial effects of the present application apparent.

[0028] Figure 1 This is a first structural block diagram of the aging test device provided in an embodiment of the present application.

[0029] Figure 2 This is a structural block diagram of the driver chip and light-emitting diode in the lamp board provided in an embodiment of the present application.

[0030] Figure 3 This is a structural block diagram of the drive control module in the aging test device provided in an embodiment of the present application.

[0031] Figure 4 This is a first structural block diagram of the main control module in the aging test device provided in an embodiment of the present application.

[0032] Figure 5 This is a second structural block diagram of the main control module in the aging test device provided in an embodiment of the present application.

[0033] Figure 6 This is a third structural block diagram of the main control module in the aging test device provided in an embodiment of the present application.

[0034] Figure 7 This is a second structural block diagram of the aging test device provided in an embodiment of the present application.

[0035] Figure 8 This is a structural block diagram of the adapter module in the aging test device provided in an embodiment of the present application.

[0036] Figure 9This is a circuit structure diagram of the adapter module in the aging test device provided in an embodiment of the present application.

[0037] Figure 10 This is a third structural block diagram of the aging test device provided in an embodiment of the present application.

[0038] Figure 11 This is a fourth structural block diagram of the aging test device provided in an embodiment of the present application.

[0039] Figure 12 A schematic diagram of the process flow of the aging test method provided in an embodiment of the present application. DETAILED DESCRIPTION

[0040] The following will be combined with the drawings in the embodiments of the present application to clearly and completely describe the technical solutions in the embodiments of the present application. Obviously, the embodiments described are only part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those skilled in the art without making creative efforts are within the scope of protection of this application.

[0041] In addition, the terms "first" and "second" are used for descriptive purposes only and cannot be understood as indicating or suggesting relative importance or implicitly indicating the number of technical features indicated. The features specified as "first" and "second" may explicitly or implicitly include one or more features. In the description of the present invention, the meaning of "multiple" is two or more, unless otherwise clearly and specifically defined.

[0042] See also Figure 1 This embodiment provides an aging test device 10, which includes a main control module 11 and a drive control module 12. The main control module 11 is connected to the drive control module 12, and the drive control module 12 is also used to connect to at least one test device 20.

[0043] Among them, the main control module 11 is used to output the test control signal of the aging test mode corresponding to the test device 20 according to the external control instruction; the drive control module 12 is used to drive the test device 20 to enter the corresponding aging test mode according to the test control signal. In this embodiment, an independent aging test device 10 is set. When performing an aging test on the test device 20, the test device 20 can be directly connected to the aging test device 10. Thereafter, the main control module 11 outputs the test control signal of the aging test mode corresponding to the test device 20 according to the external control instruction, thereby controlling the test device 20 to enter the corresponding aging test mode. Therefore, when performing an aging test on the test device 20, it is not necessary to replace the hardware that matches it based on different test devices 20, which simplifies the testing process, reduces the difficulty of production line conversion, and thus helps to reduce aging costs.

[0044] See also Figure 2 If the aging test device 10 is used to test a backlight panel 21 in a television, the corresponding test device 20 is the panel 21. The panel 21 includes multiple driver chips 211 and multiple light-emitting diodes 212. Each driver chip 211 can drive multiple light-emitting diodes 212. The multiple driver chips 211 and the multiple light-emitting diodes 212 form multiple backlight sub-areas 22. The multiple driver chips 211 in each backlight sub-area 22 are connected in series. During testing, each backlight sub-area 22 needs to obtain a test dimming signal required by that backlight sub-area 22.

[0045] As an embodiment, the test control signal in the aging test mode in the aging test device 10 includes at least two different test brightness data, the number of partitions corresponding to the lamp board 21, and the aging control timing. Since there are different models of actual televisions, there are also different models of corresponding lamp boards 21. Different models of lamp boards 21 have different numbers of light-emitting diodes, and there may be different backlight partitions 22 accordingly. Then the number of dimming signals required based on different models is also different. Therefore, in this embodiment, different aging test modes are set for different models of lamp boards 21. The number of partitions, aging control timing, and types of different test brightness data in the test control signals between different aging test modes may be different. The main control module 11 can pre-store a variety of different aging test modes based on different models of test equipment 20. Then, when the aging test is actually performed, the corresponding aging test mode can be selected according to the type of test equipment 20, thereby improving the versatility of the aging test device 10.

[0046] The test control signal in each aging test mode includes at least two different test brightness data, and each brightness data corresponds to a driving current. If three different driving currents are required during the aging test, the lamp board 21 can be aged at three different brightnesses. For example, if the lamp board 21 requires 30% brightness, the corresponding required driving current is the white field current; if 60% brightness is required, the corresponding required driving current is the L32 current; if 90% brightness is required, an overdrive current is required. The drive control module 12 outputs different test dimming signals according to different test brightness data, that is, different duty cycles are set to control the driver chip 211 in the lamp board 21 to drive the light-emitting diode to light up at the corresponding duty cycle.

[0047] Specifically, the drive control module 12 is specifically used to provide test dimming signals for the corresponding backlight partitions 22 according to the number of partitions and the test brightness data, and to switch different test brightness data based on the aging control timing to output different test dimming signals. The main control module 11 outputs the test control signal of the test device 20 based on different test devices 20; the drive control module 12 divides the test brightness data required by each backlight partition 22 according to the number of partitions, and then sends the corresponding test dimming signal to each backlight partition 22. The driver chip 211 in the lamp board 21 outputs the corresponding drive current according to the acquired dimming signal to drive the corresponding light-emitting diode in the backlight partition 22 to light up. Among them, different test brightness data have corresponding test dimming signals, and then have corresponding drive currents. In the aging test mode, the aging test device 10 provides different test brightness data to the drive control module 12, which is equivalent to providing different drive currents to the lamp board 21, so that the lamp board 21 can be tested at different drive currents, which can improve the reliability of the aging test.

[0048] In the current aging test scheme, the lamp board 21 is connected to a matching driver board, and then the driver board is connected to a universal power supply for aging testing. During the test, only about 30% to 40% of the aging current is used, which is equivalent to the lamp board 21 being lit at 3% to 40% brightness. Aging cannot be performed under extreme high current environments and cannot meet quality screening requirements. The aging test device 10 in this embodiment, by providing a main control module 11 and a drive control module 12, can provide different test brightness data to the drive control module 12 in the aging test mode, which is equivalent to providing different drive currents to the lamp board 21, so that the lamp board 21 can be aged under different drive currents. Compared with a single aging current, the reliability of the aging test can be improved.

[0049] In some embodiments, the number of test dimming signals output by the drive control module 12 is not less than the number of partitions of the backlight partitions 22 of the light board 21. In order to match a variety of different light boards 21, the drive control module 12 is set according to the number of partitions compatible with multiple light boards 21, so that the number of test dimming signals output by the drive control module 12 is not less than the number of partitions in a single light board 21. At the same time, the drive control module 12, according to the communication protocol with the driver chip 211 in the light board 21, can output the test dimming signal in a broadcast manner by default based on the maximum number of test dimming signals it can output when outputting the test dimming signal. Even if the number of test dimming signals output is greater than the number of partitions, the drive control module 12 does not need to obtain feedback signals on the reception status of the light board 21 at this time, so as to be compatible with the testing requirements of multiple different light boards 21.

[0050] In some embodiments, the drive control module 12 is also used to drive the test device 20 to perform the default aging test mode according to the preset control signal corresponding to the default aging mode if the test control signal output by the main control module 11 is not received within the preset time after startup. When the aging test device 10 is started for initialization, if the test control signal is not received after the preset time, the preset control signal corresponding to the default aging mode is obtained to start the aging test. The preset control signal corresponding to the default aging mode also includes a certain number of partitions and brightness data. The brightness data in the preset control signal is divided according to the number of partitions, and the corresponding brightness data is allocated to the test device 20, that is, the corresponding dimming signal is output. The brightness data in the preset control signal can control the light board 21 to light up to 30% to 40% brightness, that is, in the default aging mode, 30% to 40% of the driving current is provided to the light board 21 for aging testing.

[0051] See also Figure 3 As an embodiment, the drive control module 12 includes a drive controller 121 and a memory 122. The memory 122 is connected to the drive controller 121, and the drive controller 121 is connected to the main control module 11. The memory 122 is used to store the preset control signal in the default aging mode, and the drive controller 121 is used to control the test device 20 to perform the aging test according to the test control signal or the preset control signal output by the main control module. It should be noted that the types of the drive controller 121 and the memory 122 in this embodiment can be selected from drive controllers 121 and memories 122 with the same functions, and their types are not specifically limited in this application.

[0052] See also Figure 4 In some embodiments, the main control module 11 includes a switching unit 111, a main controller 112, and a signal output unit 113, which are connected in sequence. The signal output unit 113 is also connected to the drive controller 121. The switching unit 111 is used to output a trigger signal to the main controller 112 according to an external control instruction. The main controller 112 is used to switch to a corresponding aging test mode according to the trigger signal and output a test control signal under the aging test mode to the drive control module 12 through the signal output unit 113.

[0053] As an embodiment, the switching unit 111 can be a switch button, and the main controller 112 switches the corresponding aging test mode by judging the number of times the switch button is pressed. Pressing the switch button once outputs a trigger signal to the main controller 112. For example, pressing the switch button once corresponds to the first aging test mode, pressing the switch button twice corresponds to the second aging test mode, pressing the switch button three times corresponds to the third aging test mode, and so on. In this embodiment, the aging test mode is switched by setting the switch button to meet the aging test requirements. Among them, the signal output unit 113 can be a port set based on the signal format of the test control signal. For example, if the test control signal output by the main controller 112 is SPI data, the corresponding data output port can be set to ensure the stable transmission of the test control signal.

[0054] See also Figure 5 In some embodiments, the main control module 11 further includes a display unit 114, which is connected to the main controller 112. The main controller 112 is used to control the display unit 114 to display mode information under different aging test modes, so as to intuitively understand the current test status of the aging test device 10. For example, the display unit 114 includes multiple digital tubes, and the main controller 112 can control different digital tubes to light up and display different numbers to represent different aging modes. It should be noted that the display unit 114 in this embodiment can also be set to different display units 114 to indicate aging mode information, which is not limited in this application.

[0055] See also Figure 6 In some embodiments, the main control module 11 further includes a communication unit 115, which is connected to the main controller 112. The communication unit 115 is used to communicate with the host computer and to obtain data information from different test devices 20 and output it to the main controller 112, so that the main controller 112 sets the test control signal corresponding to the aging test mode of the test device 20 according to the data information. The test control signals corresponding to the different aging test modes in the main controller 112 can be pre-stored, or the communication unit 115 can be set to establish a communication connection with the host computer to directly obtain the test control signals required by different lamp boards 21, thereby improving the compatibility and reliability of the aging test device 10.

[0056] See also Figure 7In some embodiments, the aging test device 10 further includes a switching module 13, which is connected to the drive control module 12. The switching module 13 is configured to connect to at least one test device 20 and output the test dimming signal output by the drive control module 12 to one or more test devices 20. The aging test device 10 in this embodiment can be connected to the test device 20 via the switching module 13. In this case, the switching module 13 can be connected to one or more test devices 20. When the switching module 13 is connected to multiple test devices 20, the aging test device 10 can perform aging tests on multiple test devices 20 simultaneously, which helps improve the efficiency of the aging test.

[0057] See also Figure 8 As an embodiment, the adapter module 13 includes a first connection interface 131 and at least one second connection interface 132. The first connection interface 131 is used to connect to the drive controller 121, and the second connection interface 132 is used to connect to the test device 20. When multiple second connection interfaces 132 are set, each second connection interface 132 can be connected to a corresponding test setting, so that the aging test device 10 can perform aging tests on multiple test devices 20 at the same time. The first connection interface 131 includes multiple pin pins, such as 41 pin pins; the second connection interface 132 includes multiple pin pins. For example, the second connection interface 132 in this embodiment is provided with 18 pin pins. Each pin pin can transmit a test dimming signal and provide the required brightness data for a backlight partition 22.

[0058] See also Figure 9 In one embodiment, the adapter module 13 further includes a plurality of electrostatic protection diodes, one end of which is grounded, and the other end of which is connected to the second connection interface. In this embodiment, a first connection interface (P1 in this embodiment), 9 electrostatic protection diodes (respectively D1, D2, D3, D4, D5, D6, D7, D8, D9) and 2 second connection interfaces (P21 and P22 in this embodiment) are provided, of which 4 electrostatic protection diodes are connected to one of the second connection interfaces, and another 4 electrostatic protection diodes are connected to another second connection interface, and the remaining electrostatic protection diode is connected to electricity. By providing the electrostatic protection diodes in this embodiment, electrostatic protection can be achieved, thereby improving the stability and reliability of the aging test device 10.

[0059] See also Figure 10, when the aging test device 10 in this embodiment is used for aging testing, it is connected to the power supply module 30, which can be set in the aging cabinet. In order to adapt to the required power supply, the aging test device 10 is also provided with a first power conversion module 14 and a second power conversion module 15; the first power conversion module 14 is connected to the main controller 112, and the first power conversion module 14 is used to convert the direct current input by the power supply module 30 into the voltage required by the main controller 112 to power the main controller 112, thereby ensuring the normal operation of the main control module. For example, the first conversion module is used to convert the input 12V voltage into a 3.3V voltage to power the main controller 112.

[0060] Among them, the second power conversion module 15 is connected to the drive controller 121 and the adapter module 13. The second power conversion module 15 is used to convert the direct current input by the power module 30 into the electrical energy required by the drive controller 121 and the test equipment 20, ensuring the normal aging of the drive controller 121 and the test equipment 20. In this embodiment, the second power conversion module 15 outputs the converted voltage to the test equipment 20 via the adapter module 13 to power the test equipment 20. For example, the second power conversion module 15 can provide a 12V voltage for the drive controller 121, and can also convert the 12V voltage into 1.8V and 3.3V for the test equipment 20. It should be noted that the first power conversion module 14 and the second power conversion module 15 can be implemented by the current power converter, which belongs to the known structural content, so the specific structure and process of the first power conversion module 14 and the second power conversion module 15 are not described in detail.

[0061] During the testing process of the aging test device 10 , the host computer can be connected to the second power conversion module 15 so that the host computer can monitor the voltage and current during the aging test in real time.

[0062] See also Figure 11 In some embodiments, the aging test device 10 further includes a first circuit board 16, a second circuit board 17, and a third circuit board 18. The first circuit board 16 is used to set the main control module 11; the second circuit board 17 is used to set the drive control module 12; and the third circuit board 18 is used to set the adapter module 13. That is, in this embodiment, the main control module 11, the drive control module 12, and the adapter module 13 are independently set in three different circuit boards, and the connection between each module is achieved through electrical connection between the circuit boards. In this embodiment, the main control module 11 and the first circuit board 16 form a common timing control board, the drive control module 12 and the second circuit board 17 form a common drive board, namely, a Dcon board, and the adapter module 13 and the third circuit board 18 can form an adapter board. The independent arrangement of the main control module 11, the drive control module 12, and the adapter module 13 can facilitate the assembly and updating of the aging test device 10.

[0063] The first power conversion module 14 may be correspondingly disposed in the first circuit board 16 to supply power to the main controller 112 , and the second power conversion module 15 may be correspondingly disposed in the second circuit board 17 to supply power to the drive controller 121 .

[0064] See also Figure 12 The embodiment of the present application further provides an aging test method, which is applied to the above-mentioned aging test device and specifically includes the following steps:

[0065] 100. Obtaining a test control signal corresponding to the aging test mode of the test device according to an external control instruction;

[0066] 200. Control the test equipment to enter a corresponding aging test mode according to the test control signal.

[0067] In this embodiment, when it is necessary to perform an aging test based on the aging test device, the main control module in the aging test device obtains an external control instruction, for example, by detecting the pressing signal of the switch button to obtain the external control instruction, and obtains the test control signal under the corresponding aging test mode based on the external control instruction, and then controls the test equipment to enter the corresponding aging test mode according to the test control signal to perform the aging test. When performing an aging test based on the aging test device, it is only necessary to provide the test equipment with a corresponding test control signal based on the external control instruction, and there is no need to replace the matching hardware based on different test equipment, which simplifies the testing process, reduces the difficulty of production line conversion, and thus helps to reduce the aging cost. Since the aging test device has been described in detail above, it will not be repeated here.

[0068] In the above embodiments, the description of each embodiment has its own focus. For parts that are not described in detail in a certain embodiment, reference can be made to the relevant descriptions of other embodiments.

[0069] The above is a detailed introduction to the aging test device provided in the embodiments of the present application. Specific examples are used in this article to illustrate the principles and implementation methods of the present application. The description of the above embodiments is only used to help understand the technical solutions and core ideas of the present application. Ordinary technicians in this field should understand that they can still modify the technical solutions recorded in the aforementioned embodiments, or replace some of the technical features therein with equivalents. These modifications or replacements do not cause the essence of the corresponding technical solutions to deviate from the scope of the technical solutions of the embodiments of the present application.

Claims

1. An aging test device, characterized in that: The aging test device comprises: Main control module and drive control module; The main control module is connected to the drive control module, and the drive control module is used to connect to at least one test device; The main control module is used to output a test control signal under the aging test mode corresponding to the test device according to an external control instruction; the drive control module is also used to drive the test device to enter the corresponding aging test mode according to the test control signal.

2. The aging test device according to claim 1, characterized in that: The test device includes a light board, and the light board includes multiple backlight partitions; the test control signal in the aging test mode includes at least two different test brightness data, the number of partitions corresponding to the light board, and the aging control timing; The driving control module is specifically configured to provide test dimming signals for the corresponding backlight partitions according to the number of partitions and the test brightness data, and to switch different test brightness data based on the aging control timing to output different test dimming signals.

3. The aging test device according to claim 2, characterized in that: The number of the test dimming signals output by the driving control module is not less than the number of the backlight partitions.

4. The aging test device according to any one of claims 1 to 3, characterized in that: The driving control module is further configured to drive the test device to perform the default aging mode according to a preset control signal corresponding to the default aging mode when the test control signal is not received within a preset time after startup.

5. The aging test device according to claim 1, characterized in that: The main control module includes a mode switching unit, a main controller and a signal output unit connected in sequence, and the signal output unit is connected to the drive control module; The mode switching unit is used to output a trigger signal to the main controller according to an external control instruction. The main controller is used to switch the aging test mode according to the trigger signal and output the test control signal under the aging test mode to the drive control module through the signal output unit.

6. The aging test device according to claim 5, characterized in that: The main control module further includes a display unit, and the display unit is connected to the main controller; The main controller is used to control the display unit to display mode information corresponding to the aging test mode in different aging test modes.

7. The aging test device according to claim 5, characterized in that: The main control module further includes a communication unit, and the communication unit is connected to the main controller; The communication unit is used to communicate with the host computer and to obtain data information of different test devices and output it to the main controller, so that the main controller sets the test control signal corresponding to the aging test mode of the test device according to the data information.

8. The aging test device according to claim 2, characterized in that: The aging test device further includes a switching module connected to the drive control module; The adapter module is used to connect to at least one of the test devices, and the adapter module is used to output the test dimming signal output by the drive control module to one or more of the test devices.

9. The aging test device according to claim 8, characterized in that: The aging test device further includes a first circuit board, a second circuit board and a third circuit board; The first circuit board is used to set the main control module; the second circuit board is used to set the drive control module; and the third circuit board is used to set the adapter module.

10. An aging test method, characterized in that: The aging test method comprises the following steps: Obtaining a test control signal in an aging test mode corresponding to the test device according to an external control instruction; The test device is controlled to enter the corresponding aging test mode according to the test control signal.

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