Substance identification index test tool of radiation inspection equipment

Abstract

The invention provides a substance identification index test tool of radiation inspection equipment. The substance identification index test tool comprises a test plate mounting rack and a plurality of test plates which are arranged corresponding to the test plate mounting rack and are made of the same material, the test plate mounting rack comprises a movable plate mounting part; the plurality of test plates comprise more than one movable plate, the more than one movable plate is movably mounted on the movable plate mounting part, the movable plate is provided with a first working position and a second working position, and the movable plate is configured to be capable of receiving scanning inspection of radiation inspection equipment at at least one of the first working position and the second working position. The substance identification index testing tool can save manpower, equipment and working time, improves operation safety, and is beneficial to improving the substance identification index testing efficiency.

Description

Technical Field

[0001] The present application relates to the field of radiation inspection technology, and in particular to a material identification index testing tool for radiation inspection equipment. Background Art

[0002] The main performance indicators of radiation inspection equipment include material identification indicators. Material identification indicators refer to indicators of the ability of radiation inspection equipment to identify different substances. When the radiation source of the radiation inspection equipment emits rays that pass through test objects of different mass thicknesses, the imaging device of the radiation inspection equipment can obtain an image of the test object through the information of the rays after passing through the test object detected by the detector. The images formed by the radiation inspection equipment that meets the requirements of material identification indicators must have different colors for different test objects. For example, for a radiation inspection equipment whose ray source is a high-energy electron linear accelerator, it can correctly identify the colors corresponding to four test objects, such as orange, green, blue and purple corresponding to organic matter, mixtures, inorganic matter and heavy metals, respectively. The greater the mass thickness of the test object, the darker the color, and the smaller the mass thickness of the test object, the lighter the color.

[0003] like Figure 1 As shown, in the related art, when performing a material identification index test on a radiation inspection device 10', the required test materials are typically fabricated into test plates. A material identification index test fixture 20' is secured to a vehicle 30', and the required number of test plates are assembled onto the material identification index test fixture 20' to form a test plate assembly 40'. The driver then drives the vehicle 30' through the scanning path of the radiation inspection device 10'. The radiation source 11' of the radiation inspection device 10' emits a beam B' that scans the test plate assembly 40'. The detector 12' detects the radiation information obtained after it penetrates the test plate assembly 40'. The image converted from the radiation information is then used to test the material identification index of the radiation inspection device 10'.

[0004] The material identification index test of radiation inspection equipment usually requires four test materials. For example, the four test materials can be graphite as an organic test material, aluminum as a mixture test material, iron as an inorganic test material, and lead as a heavy metal test material. Each test material must be scanned in various thicknesses according to the test specifications. For example, the requirement to scan 20g / cm 2 , 40g / cm 2 、60g / cm 2 、80g / cm 2 Four test material thickness requirements, the thickness of each test plate is 20g / cm 2For example, each test panel weighs approximately 30 kilograms, and completing a single material identification index test requires multiple assembly and disassembly of the test panels. This process requires the collaboration of three people and often requires the use of supporting mechanical equipment, such as a forklift. However, if the material identification index of the radiation inspection equipment is not ideal, the algorithm of the imaging device of the radiation inspection equipment must be fine-tuned and retested after fine-tuning until the material identification index of the radiation inspection equipment is qualified. Each retest requires repeated assembly and disassembly of the test panels, making the testing process very cumbersome.

[0005] When performing material identification index tests on radiation inspection equipment, the disassembly and assembly of the test board requires the use of equipment such as forklifts to transport, replace or temporarily store the test board. During the transportation and replacement process, if the test board tilts, it may fall, posing a potential risk of causing property damage and personal injury.

[0006] When performing material identification index tests on radiation inspection equipment, the best imaging results are achieved when the test plate is perpendicular to the radiation. However, after installing the test plate in related material identification index testing tooling, the test plate is often not perpendicular to the radiation, which can lead to unsatisfactory imaging results and even misjudgment of whether the material identification index meets the requirements.

[0007] Since the test plates for substance identification indicators are of many types and in large quantities, and the test plates need to be replaced, more space is required to store these test plates, and more production space is required.

[0008] The above statements are only used to provide background technical information related to the present application and do not necessarily constitute prior art. Summary of the Invention

[0009] The purpose of this application is to provide a material identification index testing tool for radiation inspection equipment, aiming to solve or alleviate the problem of the cumbersome material identification index testing process of radiation inspection equipment.

[0010] The present application provides a material identification index testing tool for radiation inspection equipment, including a test plate mounting frame and multiple test plates of the same material arranged corresponding to the test plate mounting frame; the test plate mounting frame includes a movable plate mounting portion; the multiple test plates include one or more movable plates, and the one or more movable plates are movably mounted on the movable plate mounting portion, and the movable plate has a first working position and a second working position. In at least one of the first working position and the second working position, the movable plate is configured to be able to accept scanning inspection by the radiation inspection equipment.

[0011] In the material identification index testing fixture of the radiation inspection equipment described in some embodiments, the movable plate is translatable and / or rotatable relative to the test plate mounting frame to switch between the first working position and the second working position.

[0012] In the material identification index testing tool of the radiation inspection equipment described in some embodiments, the movable plate mounting part includes: a movable plate limiting part, configured to limit the movable path and / or movable limit position of the movable plate; and / or a movable plate locking part, configured to lock the movable plate in the first working position and / or the second working position.

[0013] In the material identification index testing tooling of the radiation inspection equipment described in some embodiments, the movable plate limiting part includes a movable plate limiting frame, and the movable plate moves within the movable plate mounting area defined by the movable plate limiting frame to switch between the first working position and the second working position; and / or the movable plate limiting part includes a first guide rail and a movable plate mounting frame, the movable plate is mounted on the movable plate mounting frame, and the movable plate mounting frame is configured to move along the first guide rail; and / or the movable plate locking part includes a pin, and the pin is configured to lock the movable plate in the first working position and / or the second working position.

[0014] In the material identification index testing tooling of the radiation inspection equipment described in some embodiments, the multiple test plates include more than two movable plates, wherein at least two of the movable plates have different mass thicknesses; and / or at least two of the movable plates have the same mass thickness; and / or at least one of the movable plates switches between the first working position and the second working position independently of the other movable plates; and / or at least two of the movable plates switch between the first working position and the second working position synchronously.

[0015] In the material identification index testing tool of the radiation inspection equipment described in some embodiments, the movable plate mounting portion includes more than two movable plate mounting areas, the multiple test plates include more than two groups of movable plates, and the more than two groups of movable plates are installed one-to-one in the more than two movable plate mounting areas and move in the corresponding movable plate mounting areas to switch between the first working position and the second working position.

[0016] In the material identification index test fixture of the radiation inspection equipment described in some embodiments, the multiple test plates include more than one fixed plate, wherein the test plate mounting frame further includes a first fixed plate mounting portion, at least one fixed plate is fixedly mounted on the first fixed plate mounting portion, the movable plate in the first working position is parallel to the fixed plate in the first fixed plate mounting portion and overlaps in a direction perpendicular to the fixed plate in the first fixed plate mounting portion, and the movable plate in the second working position is staggered from the fixed plate in the first fixed plate mounting portion in a direction perpendicular to the fixed plate in the first fixed plate mounting portion; and / or the test plate mounting frame further includes a second fixed plate mounting portion, at least one fixed plate is fixedly mounted on the second fixed plate mounting portion, the movable plate in the first working position is staggered from the fixed plate in the second fixed plate mounting portion in a direction perpendicular to the fixed plate in the second fixed plate mounting portion, and the movable plate in the second working position is parallel to the fixed plate in the second fixed plate mounting portion and overlaps in a direction perpendicular to the fixed plate in the second fixed plate mounting portion.

[0017] In the material identification index test fixture of the radiation inspection equipment described in some embodiments, the multiple test plates include multiple fixed plates arranged in parallel and overlapping on the first fixed plate mounting part, wherein the mass thickness of at least two of the fixed plates in the first fixed plate mounting part is different or the same; and / or the multiple test plates include multiple fixed plates arranged in parallel and overlapping on the second fixed plate mounting part, wherein the mass thickness of at least two of the fixed plates in the second fixed plate mounting part is different or the same; and / or the multiple test plates include the fixed plates arranged on the first fixed plate mounting part and the fixed plates arranged on the second fixed plate mounting part, wherein the mass thickness of at least one of the fixed plates in the first fixed plate mounting part is different or the same as that of at least one of the fixed plates in the second fixed plate mounting part.

[0018] In the material identification index testing tool of the radiation inspection equipment described in some embodiments, the fixing plate located at the first fixing plate mounting portion and the fixing plate located at the second fixing plate mounting portion are arranged side by side.

[0019] In the material identification index testing tool of the radiation inspection equipment described in some embodiments, the number of the fixing plates in the first fixing plate mounting portion can be set selectively; and / or the number of the fixing plates in the second fixing plate mounting portion can be set selectively.

[0020] In the material identification index testing tool of the radiation inspection equipment described in some embodiments, the material identification index testing tool also includes a spare placement portion, which is used to place the fixing plate that is not installed on the first fixing plate mounting portion and the second fixing plate mounting portion.

[0021] In the material identification index test jig of the radiation inspection equipment described in some embodiments, the material identification index test jig also includes: a base, the test plate mounting bracket is movably arranged on the base relative to the base; and a mounting bracket driving device, which is drivingly connected to the test plate mounting bracket and is configured to drive the test plate mounting bracket to move relative to the base.

[0022] In the material identification index testing tooling of the radiation inspection equipment described in some embodiments, the mounting frame driving device includes a pitch angle adjustment device, which is driven and connected to the test plate mounting frame and is configured to drive the test plate mounting frame to rotate around a horizontal axis relative to the base to change the pitch angle of the test plate mounted on the test plate mounting frame; and / or the mounting frame driving device includes a rotation angle adjustment device, which is driven and connected to the test plate mounting frame and is configured to drive the test plate mounting frame to rotate around a vertical axis relative to the base; and / or the mounting frame driving device includes a height adjustment device, which is driven and connected to the test plate mounting frame and is configured to drive the test plate mounting frame to move up and down relative to the base.

[0023] In the material identification index testing fixture of the radiation inspection equipment described in some embodiments, the pitch angle adjustment device includes: a driving mechanism; and a supporting structure, the supporting structure includes a hinged connection part hinged to the test board mounting frame and a driving connection part driven by the driving mechanism, and the driving mechanism is configured to drive the driving connection part to move and change the angle between the supporting structure and the test board mounting frame, so as to change the angle between the test board mounting frame and the base.

[0024] In the material identification index testing tool of the radiation inspection equipment described in some embodiments, the pitch angle adjustment device also includes a support structure limiter, and the support structure limiter is configured to limit the movement path and / or movement limit position of the drive connection part.

[0025] In the material identification index testing fixture of the radiation inspection equipment described in some embodiments, the support structure limiting part includes: a second guide rail, which is configured to limit the moving path of the drive connection part; and / or a stop member, which is arranged on the moving path of the drive connection part and is configured to limit the moving limit position of the drive connection part.

[0026] In the material identification index test fixture of the radiation inspection equipment described in some embodiments, the material identification index test fixture further includes a position locking mechanism, and the position locking mechanism is configured to lock the relative position between the test board mounting bracket and the base.

[0027] In the material identification index testing tool of the radiation inspection equipment described in some embodiments, the position locking mechanism includes: a locking rod, which is hingedly connected to the test plate mounting frame and includes a mounting groove extending along the length direction of the locking rod; and a locking screw, which is rotatably provided on the base and located in the mounting groove, and is configured to fix the locking rod to the base.

[0028] In the material identification index test jig of the radiation inspection equipment described in some embodiments, the material identification index test jig includes a plurality of the test plate mounting racks, wherein the materials of the plurality of test plates installed in each of the plurality of test plate mounting racks are different from those of the plurality of test plates installed in the remaining test plate mounting racks; and / or at least two of the plurality of test plate mounting racks are installed in layers; and / or at least two of the plurality of test plate mounting racks are installed side by side.

[0029] In the material identification index testing tool of the radiation inspection equipment described in some embodiments, at least two of the test plate mounting frames are installed in layers, and the test plate mounting frame located on the upper layer can be rotatably mounted on the test plate mounting frame located on the lower layer.

[0030] The material identification index testing tool for the radiation inspection equipment provided by the present application includes a test plate mounting frame and multiple test plates of the same material arranged corresponding to the test plate mounting frame, the test plate mounting frame includes a movable plate mounting portion, the multiple test plates include one or more movable plates, and the one or more movable plates are movably mounted on the movable plate mounting portion, the movable plate has a first working position and a second working position, and in at least one of the first working position and the second working position, the movable plate is configured to be able to accept scanning inspection by the radiation inspection equipment, so that by changing the working position of one or more movable plates on the test plate mounting frame, the number and / or specifications of the test plates that can accept scanning inspection by the radiation inspection equipment can be changed, without the need to change the number and / or specifications of the test plates that accept scanning inspection by installation and disassembly. The operation is simple and labor-saving, which is conducive to solving or alleviating the problem of the cumbersome material identification index testing process of the radiation inspection equipment, can save manpower, equipment and working time, improve operational safety, and help improve the efficiency of material identification index testing.

[0031] Other features and advantages of the present application will become apparent from the following detailed description of exemplary embodiments of the present application with reference to the accompanying drawings. BRIEF DESCRIPTION OF THE DRAWINGS

[0032] The drawings described herein are used to provide a further understanding of the present application and constitute a part of the present application. The illustrative embodiments of the present application and their descriptions are used to explain the present application and do not constitute an improper limitation on the present application. In the drawings:

[0033] Figure 1 This is a schematic diagram of the structure of the material identification index test tool of the radiation inspection equipment in the prior art cooperating with the vehicle and the radiation source of the radiation inspection equipment when performing a material identification test.

[0034] Figure 2 This is a structural schematic diagram of one direction of a material identification index testing tool for radiation inspection equipment according to an embodiment of the present application.

[0035] Figure 3 for Figure 2 A schematic structural diagram of the substance identification index testing tool in another direction of the embodiment shown.

[0036] Figure 4 for Figure 2 A schematic structural diagram of the substance identification index testing tool in another direction of the embodiment shown.

[0037] Figure 5 for Figure 2 The schematic structural diagram of the substance identification index testing tool in another direction of the embodiment shown in FIG, wherein a schematic structural diagram near a pin of the movable plate locking part is shown in detail.

[0038] Figure 6 for Figure 2 The structure diagram of a movable plate mounting frame of the substance identification index testing tool of the embodiment shown is shown.

[0039] Figure 7 for Figure 2 The schematic diagram of the structure of the substance identification index testing tool in another direction of the embodiment shown is shown.

[0040] Figure 8 for Figure 2 A schematic structural diagram of another movable plate mounting frame of the substance identification index testing tool of the embodiment shown.

[0041] Figure 9 for Figure 2 A schematic structural diagram of a driving mechanism in a pitch angle adjustment device of a mounting frame driving device of a material identification index testing tool according to the illustrated embodiment.

[0042] Figure 10 for Figure 2 A schematic structural diagram of a test plate mounting frame and a test plate therein in a first assembly method of a fixing plate of a substance identification index testing tool according to the illustrated embodiment.

[0043] Figures 11 to 14 for Figure 10 The diagram shows a structure in which the movable plate in the movable plate mounting frame is at different positions in the first assembly mode of the fixed plate.

[0044] Figures 15 and 16 for Figure 2 A schematic structural diagram of a test plate mounting frame and a test plate therein in a second assembly method of a fixing plate of a substance identification index testing tool according to the illustrated embodiment.

[0045] Figures 17 and 18 for Figure 2 A schematic structural diagram of a test plate mounting frame and a test plate therein in a third assembly method of a fixing plate of a substance identification index testing tool according to the illustrated embodiment.

[0046] Figures 19 to 20 for Figure 2 A schematic structural diagram of a test plate mounting frame and a test plate therein in a fourth assembly method of a fixing plate of a substance identification index testing tool according to the illustrated embodiment.

[0047] Figures 2 to 20 In the figure, each reference numeral represents:

[0048] 10. Test plate mounting frame; 11. Movable plate mounting portion; 111. Movable plate limiting frame; 111A. Movable plate mounting area; 112. First guide rail; 113. Movable plate mounting frame; 1131. Square frame body; 11311. Mounting hole; 1132. Locking plate; 11321. Pin hole; 114. Pin; 12. First fixed plate mounting portion; 13. Second fixed plate mounting portion;

[0049] 20. Test plate; 21. Movable plate; 22. Fixed plate;

[0050] 30. Base; 31. Spare placement part;

[0051] 40. Pitch angle adjustment device; 41. Drive mechanism; 411. Hand crank device; 412. Reducer; 4121. Reducer input shaft; 4122. Reducer output shaft; 413. Coupling; 414. Screw; 415. Moving platform; 416. Second guide rail; 417. Stopper; 42. Support structure; 421. Articulated connection; 422. Drive connection; 43. Articulated seat;

[0052] 50. Locking mechanism; 51. Locking lever; 51A. Mounting slot; 52. Locking screw. DETAILED DESCRIPTION

[0053] The following will be combined with the drawings in the embodiments of the present application to clearly and completely describe the technical solutions in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, not all of the embodiments. The following description of at least one exemplary embodiment is actually only illustrative and is in no way intended to limit the present application and its application or use. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without making creative work are within the scope of protection of this application.

[0054] Unless otherwise specified, the relative arrangement of the parts and steps, numerical expressions and numerical values set forth in these embodiments do not limit the scope of the present application. Meanwhile, it should be understood that, for ease of description, the sizes of the various parts shown in the accompanying drawings are not drawn according to actual proportional relationships. Technology, methods and equipment known to those of ordinary skill in the relevant art may not be discussed in detail, but in appropriate cases, the technology, methods and equipment should be considered as a part of the specification. In all examples shown and discussed here, any specific value should be interpreted as being merely exemplary, rather than as a limitation. Therefore, other examples of exemplary embodiments can have different values. It should be noted that similar numbers and letters represent similar items in the following drawings, and therefore, once an item is defined in an accompanying drawing, it does not need to be further discussed in subsequent drawings.

[0055] In the description of this application, it should be understood that the use of words such as "first" and "second" to limit components is only for the convenience of distinguishing the corresponding components. Unless otherwise stated, the above words have no special meaning and therefore cannot be understood as limiting the scope of protection of this application.

[0056] In the description of this application, it should be understood that the directions or positional relationships indicated by directional words such as "front, back, up, down, left, right", "horizontal, vertical, vertical, horizontal" and "top, bottom" are usually based on the directions or positional relationships shown in the accompanying drawings. They are only for the convenience of describing this application and simplifying the description. Unless otherwise specified, these directional words do not indicate or imply that the device or element referred to must have a specific direction or be constructed and operated in a specific direction. Therefore, they cannot be understood as limiting the scope of protection of this application; the directional words "inside and outside" refer to the inside and outside relative to the outline of each component itself.

[0057] In addition, the technical features involved in different embodiments of the present invention described below can be combined with each other as long as they do not conflict with each other.

[0058] The present application provides a material identification index test fixture for radiation inspection equipment. The material identification index test fixture includes a test plate mounting frame 10 and multiple test plates 20 of the same material arranged corresponding to the test plate mounting frame 10. The test plate mounting frame 10 includes a movable plate mounting portion 11. The multiple test plates 20 include one or more movable plates 21. The one or more movable plates 21 are movably mounted on the movable plate mounting portion 11. The movable plate 21 has a first working position and a second working position. In at least one of the first working position and the second working position, the movable plate 21 is configured to be able to receive a scanning inspection by the radiation inspection equipment.

[0059] Based on the material identification index testing tooling for radiation inspection equipment provided in the present application, the number and / or specifications of the test plates 20 that can be scanned and inspected by the radiation inspection equipment can be changed by changing the working position of one or more movable plates 21 on the test plate mounting frame 10, without the need to change the number and / or specifications of the test plates 20 that are scanned and inspected by installation and disassembly. The operation is simple and labor-saving, which helps to solve or alleviate the problem of the cumbersome material identification index testing process of the radiation inspection equipment, saves manpower, equipment (such as forklifts) and working time, improves operational safety, and helps to improve the efficiency of material identification index testing.

[0060] In some embodiments, the movable plate 21 is translatable and / or rotatable relative to the test plate mounting frame 10 to switch between the first working position and the second working position.

[0061] In the embodiment of the present application, the movable panel 21 can be switched between the first working position and the second working position in a variety of ways. For example, in some embodiments, the movable panel 21 can be switched between different working positions by horizontally translating the movable panel 21. In embodiments not shown, the working position of the movable panel 21 can be switched by other means, such as vertical translation, rotation, a combination of translations in different directions, or a combination of translation and rotation.

[0062] In some embodiments, the movable panel mounting portion 11 includes: a movable panel limiting portion configured to limit the movable path and / or movable limit position of the movable panel 21; and / or a movable panel locking portion configured to lock the movable panel 21 in the first working position and / or the second working position.

[0063] The movable plate limiting portion is provided to facilitate the movable plate 21 to quickly and accurately reach the desired working position, thereby improving test efficiency and safety during the test. The movable plate locking portion is provided to facilitate the movable plate 21 to stably maintain the desired working position, thereby obtaining reliable test results and safety during the test.

[0064] In some embodiments, the movable panel limiting portion includes a movable panel limiting frame 111, and the movable panel 21 moves within the movable panel mounting area 111A defined by the movable panel limiting frame 111 to switch between the first working position and the second working position; and / or the movable panel limiting portion includes a first guide rail 112 and a movable panel mounting frame 113, and the movable panel 21 is mounted on the movable panel mounting frame 113, and the movable panel mounting frame 113 is configured to move along the first guide rail 112; and / or the movable panel locking portion includes a pin 114, and the pin 114 is configured to lock the movable panel 21 in the first working position and / or the second working position.

[0065] The movable panel installation area 111A is defined by the movable panel limit frame 111, and the movable panel 21 moves within the movable panel installation area 111A to switch between the first working position and the second working position, so that the movable panel 21 is completely confined within the movable panel installation area 111A when switching the working position and is in a controlled state, which is beneficial to improving the working efficiency, operational safety and accuracy of the working position after switching of the movable panel 21.

[0066] The movable plate 21 is installed on the movable plate mounting frame 113 and can move along the first guide rail 112 with the movable plate mounting frame 113, which saves time and effort when the movable plate 21 switches the working position, improves the position switching speed and accuracy, and thus improves the efficiency of the material identification index test.

[0067] The pin 114 is used to lock the movable plate 21 in the first working position and / or the second working position, which is conducive to quickly locking and unlocking the movable plate 21 by simple means. On the basis of enabling the movable plate 21 to maintain its working position, it is conducive to improving the switching speed of the working position of the movable plate 21.

[0068] In some embodiments, the multiple test plates 20 include more than two movable plates 21, wherein at least two movable plates 21 have different mass thicknesses; and / or at least two movable plates 21 have the same mass thicknesses; and / or at least one movable plate 21 switches between the first working position and the second working position independently of the other movable plates 21; and / or at least two movable plates 21 switch between the first working position and the second working position synchronously.

[0069] Among the two or more movable plates 21, at least two movable plates 21 have different mass thicknesses, which is conducive to switching the movable plate 21 with a mass thickness that better meets the test requirements to a suitable working position according to the test requirements, thereby helping to reduce the operation links and improve the test efficiency.

[0070] Among more than two movable plates 21, at least two movable plates 21 have the same mass and thickness. The required number and thickness of test plates 20 can be obtained by combining different numbers of movable plates 21 with the same mass and thickness, which is conducive to the unified configuration of these movable plates 21 and the movable plate mounting portion 11.

[0071] At least one movable plate 21 switches between the first working position and the second working position independently of the other movable plates 21 and / or at least two movable plates 21 switch between the first working position and the second working position synchronously. An appropriate number of movable plates 21 can be selected to obtain a test plate 20 with a mass thickness that meets the requirements and switch to the required working position. When at least two movable plates 21 switch between the first working position and the second working position synchronously, it is beneficial to reduce the operation of switching the required number of movable plates 21 when the mass thickness of the movable plate 21 to be switched is greater than that of a single movable plate 21, thereby facilitating the rapid achievement of the required mass thickness of the test plate 20 to be tested.

[0072] In some embodiments, the movable panel mounting portion 11 includes two or more movable panel mounting areas 111A, and the plurality of test panels 20 include two or more sets of movable panels 21. The two or more sets of movable panels 21 are mounted in a one-to-one correspondence within the two or more movable panel mounting areas 111A and move within the corresponding movable panel mounting areas 111A to switch between a first working position and a second working position. Each set of movable panels 21 may include one or more movable panels 21.

[0073] The movable panel mounting portion 11 includes more than two movable panel mounting areas 111A, and more than two groups of movable panels 21 are installed in the more than two movable panel mounting areas 111A in a one-to-one correspondence, which is beneficial to the stability of the position switching process of each group of movable panels 21, and is beneficial to improving the work efficiency, operational safety and accuracy of the working position after switching of the movable panels 21.

[0074] In some embodiments, the plurality of test boards 20 include more than one fixed plate 22, wherein the test board mounting frame 10 further includes a first fixed plate mounting portion 12, at least one fixed plate 22 is fixedly mounted on the first fixed plate mounting portion 12, the movable plate 21 in the first working position is parallel to the fixed plate 22 in the first fixed plate mounting portion 12 and overlaps in a direction perpendicular to the fixed plate 22 in the first fixed plate mounting portion 12, and the movable plate 21 in the second working position is parallel to the fixed plate 22 in the first fixed plate mounting portion 12 and overlaps in a direction perpendicular to the fixed plate 22 in the first fixed plate mounting portion 12. 2; and / or the test plate mounting frame 10 further includes a second fixed plate mounting portion 13, at least one fixed plate 22 is fixedly mounted on the second fixed plate mounting portion 13, the movable plate 21 in the first working position is staggered with the fixed plate 22 in the second fixed plate mounting portion 13 in a direction perpendicular to the fixed plate 22 in the second fixed plate mounting portion 13, and the movable plate 21 in the second working position is parallel to the fixed plate 22 in the second fixed plate mounting portion 13 and overlaps in a direction perpendicular to the fixed plate 22 in the second fixed plate mounting portion 13.

[0075] By having the test plate mounting frame 10 include a first fixed plate mounting portion 12 and / or a second fixed plate mounting portion 13, the multiple test plates 20 include more than one fixed plate 22, and the movable test plate 21 is set in the first working position and the second working position with respect to the fixed plate 22 on the first fixed plate mounting portion 12 and / or the second fixed plate mounting portion 13, it is advantageous to reduce the number of movable plate mounting portions 11 and movable plates 21 while ensuring the number and combination requirements of the test plates 20 for the material identification index test, thereby reducing the structural complexity of the test plate mounting frame 10 and reducing the number of position switching operations of the movable plate 21. In particular, when the test plate mounting frame 10 includes both the first fixed plate mounting portion 12 and the second fixed plate mounting portion 13, the number and / or mass thickness of the fixed plates 22 arranged in the first fixed plate mounting portion 12 and the second fixed plate mounting portion 13 are different, so that the movable plate 21 can be moved once and the number of movable plates 21 overlapping with the fixed plates 22 arranged in the first fixed plate mounting portion 12 and the second fixed plate mounting portion 13 can be changed. When the movable plate 21 is adjusted once, two groups of test plates 20 with different total mass thicknesses can be obtained before and after the position of the movable plate 21 is adjusted, which can further reduce the number of position switching operations of the movable plate 21, thereby improving the efficiency of material identification index testing.

[0076] In some embodiments, the multiple test boards 20 include multiple fixed plates 22 arranged in parallel and overlapping in the first fixed plate mounting portion 12, wherein the mass thickness of at least two fixed plates 22 in the first fixed plate mounting portion 12 is different or the same; and / or the multiple test boards 20 include multiple fixed plates 22 arranged in parallel and overlapping in the second fixed plate mounting portion 13, wherein the mass thickness of at least two fixed plates 22 in the second fixed plate mounting portion 13 is different or the same; and / or the multiple test boards 20 include fixed plates 22 arranged in the first fixed plate mounting portion 12 and fixed plates 22 arranged in the second fixed plate mounting portion 13, wherein the mass thickness of at least one fixed plate 22 in the first fixed plate mounting portion 12 is different or the same as that of at least one fixed plate 22 in the second fixed plate mounting portion 13.

[0077] By limiting the mass thickness of the fixed plate 22 within the first fixed plate mounting portion 12 and the second fixed plate mounting portion 13, the fixed plate 22 can be flexibly arranged according to the material identification index test requirements of the radiation inspection equipment, so as to minimize the number of position switching times of the movable plate 21 while meeting the mass thickness of each required test plate 20, thereby improving the efficiency of the material identification index test.

[0078] In some embodiments, the fixing plate 22 in the first fixing plate mounting portion 12 is arranged side by side with the fixing plate 22 in the second fixing plate mounting portion 13. This facilitates testing of the two test plates by relative movement of the material identification index test fixture and the radiation inspection equipment, thereby improving the efficiency of material identification index testing.

[0079] In some embodiments, the number of fixing plates 22 in the first fixing plate mounting portion 12 can be set selectively, and / or the number of fixing plates 22 in the second fixing plate mounting portion 13 can be set selectively. This facilitates meeting the material identification index test requirements of different radiation inspection equipment by changing the number of fixing plates 22 in the first fixing plate mounting portion 12 and / or the second fixing plate mounting portion 13. It also helps reduce the position switching operations of the movable plate 21 during testing, thereby improving the efficiency of material identification index testing.

[0080] In some embodiments, the material identification index testing tool further includes a spare placement portion 31 , which is used to place the fixing plate 22 that is not installed on the first fixing plate installation portion 12 and the second fixing plate installation portion 13 .

[0081] By providing the standby placement portion 31 , the fixing plate 22 that is not yet installed on the first fixing plate installation portion 12 and / or the second fixing plate installation portion 13 is placed in the standby placement portion 31 , thereby eliminating the need to provide a dedicated storage location for the standby fixing plate 22 .

[0082] In some embodiments, the material identification index testing tool further includes: a base 30 on which the test plate mounting frame 10 is movably disposed relative to the base 30; and a mounting frame driving device, drivingly connected to the test plate mounting frame 10 and configured to drive the test plate mounting frame 10 to move relative to the base 30. This facilitates adjusting the relative position of the test plate 20 and the radiation inspection device by changing the position of the test plate mounting frame 10 relative to the base 30, so that the test plate 20 and the beam emitted by the radiation source of the radiation inspection device meet a desired positional relationship, such as being perpendicular to each other, thereby facilitating more accurate material identification index test results.

[0083] In some embodiments, the mounting frame driving device includes a pitch angle adjustment device 40, which is driven and connected to the test board mounting frame 10 and is configured to drive the test board mounting frame 10 to rotate around a horizontal axis relative to the base 30 to change the pitch angle of the test board 20 mounted on the test board mounting frame 10; and / or the mounting frame driving device includes a rotation angle adjustment device (not shown), which is driven and connected to the test board mounting frame 10 and is configured to drive the test board mounting frame 10 to rotate around a vertical axis relative to the base 30; and / or the mounting frame driving device includes a height adjustment device (not shown), which is driven and connected to the test board mounting frame 10 and is configured to drive the test board mounting frame 10 to move up and down relative to the base 30.

[0084] The pitch angle of the test plate 20 mounted on the test plate mounting frame 10 can be changed by the pitch angle adjustment device 40, the rotation angle of the test plate 20 mounted on the test plate mounting frame 10 can be changed by the rotation angle adjustment device, and / or the height of the test plate 20 mounted on the test plate mounting frame 10 can be changed by the height adjustment device. This facilitates adjusting the pitch angle, rotation angle, and / or height of the test plate 20 to achieve a desired positional relationship between the test plate 20 and the beam emitted by the radiation source of the radiation inspection equipment, thereby facilitating more accurate material identification index test results. The pitch angle of the test plate 20 refers to the angle between the test plate 20 and the horizontal plane.

[0085] In some embodiments, the pitch angle adjustment device 40 includes: a driving mechanism 41; and a support structure 42, the support structure 42 includes a hinged connection portion 421 hinged to the test board mounting bracket 10 and a drive connection portion 422 drivenly connected to the driving mechanism 41, and the driving mechanism 41 is configured to drive the drive connection portion 422 to move and change the angle between the support structure 42 and the test board mounting bracket 10, so as to change the angle between the test board mounting bracket 10 and the base 30.

[0086] The pitch angle adjustment device 40 provided above can accurately correspond to the angle of the test plate mounting frame 10 relative to the base 30 by driving the moving distance of the connecting portion 422, that is, accurately correspond to the pitch angle of the test plate 20 mounted on the test plate mounting frame 10, thereby facilitating rapid and accurate adjustment of the pitch angle of the test plate 20, so as to facilitate the test plate 20 and the beam emitted by the radiation source of the radiation inspection equipment to accurately achieve the required positional relationship, thereby facilitating more accurate test results of material identification indicators.

[0087] In some embodiments, the pitch angle adjustment device 40 further includes a support structure limiting portion, which is configured to limit the movement path and / or movement limit position of the drive connection portion 422 .

[0088] The pitch angle adjustment device 40 is provided with a support structure limiter, which is beneficial to limit the pitch angle of the test board mounting frame 10 and the test board 20 thereon, and prevent the pitch angle from being too large and causing structural instability.

[0089] In some embodiments, the support structure limiting portion includes: a second guide rail 416, which is configured to limit the movement path of the drive connection portion 422; and / or a stop member 417, which is arranged on the movement path of the drive connection portion 422 and is configured to limit the movement limit position of the drive connection portion 422.

[0090] The second guide rail 416 defines the movement path of the drive connection portion 422, which facilitates stable movement of the test board mounting frame 10 during pitch angle adjustment. The stopper 417 defines the movement limit position of the drive connection portion 422, providing accurate positioning and a simple structure.

[0091] In some embodiments, the substance identification index testing tool further includes a position locking mechanism 50 , which is configured to lock the relative position between the test plate mounting bracket 10 and the base 30 .

[0092] The position locking mechanism 50 helps maintain the test plate mounting frame 10 in its adjusted position, improving the stability of the substance identification index test process and the accuracy of the test results. Furthermore, it helps reduce the reaction force of the test plate mounting frame 10 on the mounting frame drive device, thereby increasing the service life of the mounting frame drive device.

[0093] In some embodiments, the position locking mechanism 50 includes a locking rod 51 and a locking screw 52. The locking rod 51 is hingedly connected to the test plate mounting frame 10 and includes a mounting slot 51A extending along the length direction of the locking rod 51. The locking screw 52 is rotatably provided on the base 30 and is located in the mounting slot 51A. When the test plate mounting frame 10 rotates relative to the base 30 around the horizontal rotation axis, the test plate mounting frame 10 drives the locking rod 51 to move, specifically, the mounting slot 51A moves along the locking screw 52. When the test plate mounting frame 10 is adjusted to the desired position, the locking rod 51 can be fixedly connected to the base 30 by, for example, screwing the locking screw 52 into the base 30.

[0094] The combination of the locking rod 51 and the locking screw 52 has a simple structure and convenient locking operation, and can achieve stepless position locking, and the locking is firm and reliable.

[0095] In some embodiments, the material identification index testing tooling includes a plurality of test plate mounting racks 10, wherein the materials of the plurality of test plates 20 mounted in each of the plurality of test plate mounting racks 10 are different from the materials of the plurality of test plates 20 in the remaining test plate mounting racks 10; and / or at least two of the plurality of test plate mounting racks 10 are installed in layers; and / or at least two of the plurality of test plate mounting racks 10 are installed side by side.

[0096] A plurality of test plate mounting racks 10 for placing test plates 20 of different test materials are provided in the same substance identification index test tooling, which is beneficial to reducing the number of material identification index test tooling during the same material identification index test, thereby reducing the installation and debugging work of the material identification index test tooling, and is beneficial to improving the efficiency of the material identification index test.

[0097] At least two of the multiple test board mounting racks 10 are installed in layers, which is beneficial for utilizing the height direction space to arrange the multiple test board mounting racks 10 and reducing the occupied area of the test board mounting device 10.

[0098] At least two of the multiple test plate mounting racks 10 are installed side by side, which is beneficial to the stability of the material identification index testing tooling and improves the convenience of operation during installation, debugging and position switching.

[0099] In some embodiments, at least two test plate mounting racks 10 are installed in layers, with the upper test plate mounting rack 10 being rotatably mounted on the lower test plate mounting rack 10. This simplifies the installation structure of the upper test plate mounting rack 10. In particular, when a mounting rack drive device is provided, the position of the upper test plate mounting rack 10 can be preliminarily adjusted by adjusting the position of the lower test plate mounting rack 10. Furthermore, by finely adjusting the position of the upper test plate mounting rack 10 relative to the lower test plate mounting rack 10, the upper test plate mounting rack 10 can be adjusted into position. This facilitates quick adjustment of each test plate mounting rack 10 to a desired position, thereby improving the efficiency of substance identification index testing.

[0100] The following combination Figures 2 to 20 The material identification index test tool of the radiation inspection equipment of the embodiment of the present application is described in more detail. Figure 3 The left side is the front side, the right side is the back side, and Figure 3 The up and down direction in the figure is the up and down direction, and the left and right direction when facing the front side is the left and right direction.

[0101] like Figures 2 to 20 As shown, the material identification index testing tool of the embodiment of the present application includes a base 30, two test plate mounting frames 10, two groups of test plates 20 made of different materials, two pitch angle adjustment devices 40 and a locking mechanism 50.

[0102] Multiple test plates 20 of the same material as the corresponding test plate mounting frame 10 are installed in each test plate mounting frame 10. Each test plate mounting frame 10 is welded from profiles. The two test plate mounting frames 10 are arranged in layers above and below, and test plates 20 of different materials are installed. The test plate mounting frame 10 located on the lower layer is hinged to the front end of the base 30 and can rotate around the rotation axis extending in the left and right directions. The test plate mounting frame 10 located on the upper layer is hinged to the front end of the test plate mounting frame 10 located on the lower layer and can rotate around the rotation axis extending in the left and right directions. Two pitch angle adjustment devices 40 are respectively arranged corresponding to the two test plate mounting frames 10, and are used to adjust the angle of the corresponding test plate mounting frame 10 relative to the base 30.

[0103] The substance identification index test fixture can hold all test plates 20 of two test materials corresponding to the test plate mounting frame 10. When a substance identification index test needs to test four materials, two substance identification index test fixtures can be set to meet the test requirements of various test materials.

[0104] The test plate mounting bracket 10 includes a movable plate mounting portion 11 , a first fixed plate mounting portion 12 , and a second fixed plate mounting portion 13 .

[0105] The plurality of test boards 20 includes a plurality of movable boards 21 and a plurality of fixed boards 22. The movable boards 21 and the fixed boards 22 have the same specifications. At least one spare fixed board 22 may also be included. For example, in some examples, three movable boards 21 and five fixed boards 22 may be installed in the test board mounting frame 10.

[0106] Each movable panel 21 is mounted on the movable panel mounting portion 11 for translational movement in the left-right direction. The movable panels 21 have a first operating position and a second operating position, arranged side by side in the left-right direction. In both the first and second operating positions, the movable panels 21 are capable of receiving scanning inspections by radiation inspection equipment. The movable panels 21 can be switched between the first and second operating positions by translational movement in the left-right direction relative to the test panel mounting frame 10.

[0107] The movable panel mounting portion 11 includes a movable panel limiting portion for limiting the movable path and movable limit position of the movable panel 21 and a movable panel locking portion for locking the movable panel 21 at the first working position and / or the second working position.

[0108] The movable panel retaining portion includes a movable panel retaining frame 111. The movable panel 21 moves within a movable panel mounting area 111A defined by the movable panel retaining frame 111 to switch between the first and second working positions. The movable panel retaining frame 111 can be a rectangular parallelepiped frame welded from profiles. The rectangular parallelepiped frame extends in a horizontal direction, a front-to-back direction, and a vertical direction.

[0109] The movable panel limiting portion includes a first guide rail 112 extending in the left-right direction and a movable panel mounting bracket 113. The movable panel 21 is mounted on the movable panel mounting bracket 113, and the movable panel mounting bracket 113 is configured to move along the first guide rail 112. The first guide rail 112 is located at the bottom of the movable panel limiting frame 111. The movable panel mounting bracket 113 can slide with the first guide rail 112 directly or through a slider, or can roll with the first guide rail 112 through rollers.

[0110] The movable panel locking portion includes a pin 114 , and the pin 114 is configured to lock the movable panel 21 in the first working position and / or the second working position.

[0111] like Figures 5 to 8 As shown, in the embodiment of the present application, the movable panel locking portion locks the position between the movable panel mounting frame 113 and the movable panel limiting frame 111 through the pin 114 to lock the movable panel 21 installed on the movable panel mounting frame 113 .

[0112] like Figure 6 and Figure 8As shown, the movable panel mounting frame 113 includes a square frame body 1131 and a locking plate 1132. The movable panel 21 is mounted in the space in the middle of the square frame body 1131. Figure 6 A movable panel 21 is installed in the space of the square frame body 1131 of the movable panel mounting frame 113 shown. Figure 8 In the illustrated embodiment, two parallel, front-to-back overlapping movable panels 21 are mounted within the space of a square frame body 1131 of the movable panel mounting frame 113. The square frame body 1131 is provided with a plurality of mounting holes 11311 for connecting rollers or sliders that engage the first guide rail 112 to the bottom of the square frame body 1131. A locking plate 1132 extends outward from the top of the square frame body 1131, and a pin hole 11321 is provided on the locking plate 1132. When the movable panel 21 is in the first or second working position, a pin hole 11321 of the movable panel mounting frame 113 aligns with a pin hole at the top of the movable panel retaining frame 111. Inserting a pin 114 into the aligning pin hole 11321 of the movable panel mounting frame 113 and the movable panel retaining frame 111 locks the movable panel mounting frame 113 and the movable panel retaining frame 111, thereby locking the movable panel 21 mounted on the movable panel mounting frame 113.

[0113] In some embodiments, the movable panel mounting portion 11 includes two movable panel mounting areas 111A arranged front and back, and the three movable panels 21 are divided into two groups. The rear group of the two groups of movable panels 21 is a movable panel 21, which is installed on the Figure 6 The movable panel mounting frame 113 is shown as an example, and is movable in the movable panel mounting area 111A at the rear side. The front side of the two sets of movable panels 21 is composed of two movable panels 21, which are installed at the Figure 8 The movable panel mounting frame 113 is shown to be movable within the movable panel mounting area 111A at the front side.

[0114] Figure 6 The movable panel mounting frame 113 shown includes two locking plates 1132, which are respectively located on the left and right sides of the square frame body 1131. A pin hole 11321 is provided on each locking plate 1132. Figure 6 When the working position of the movable plate mounting frame 113 and the movable plate 21 thereon is switched to the right position, the pin hole 11321 on one of the locking plates 1132 is aligned with a pin hole on the movable plate limiting frame 111, and the pin 114 can be used to pass through the pin hole 11321 on the aligned locking plate 1132 and the pin hole on the movable plate limiting frame 111 to lock the position of the movable plate mounting frame 113 and the movable plate limiting frame 111.

[0115] Figure 8The locking plate 1132 of the movable panel mounting frame 113 is located at the front side of the square frame body 1131, and a pin hole 11321 is provided in the middle portion of the locking plate 1132 in the left-right direction. Figure 8 When the working position of the movable plate mounting frame 113 and the movable plate 21 thereon is switched to the right position, the pin hole 11321 on the locking plate 1132 is aligned with a pin hole on the movable plate limiting frame 111, and the pin 114 can be used to pass through the aligned pin hole 11321 on the locking plate 1132 and the pin hole on the movable plate limiting frame 111 to lock the position of the movable plate mounting frame 113 and the movable plate limiting frame 111.

[0116] The plurality of fixed plates 22 are divided into two groups. For example, for a test plate mounting frame 10 including six fixed plates 22, the fixed plates can be divided into two groups, one group consisting of five fixed plates 22 and the other group consisting of one fixed plate 22. The first fixed plate mounting portion 12 and the second fixed plate mounting portion 13 are arranged in the left-right direction and are located on the rear side of the movable plate mounting portion 11. Any two of the movable plate limiting frame 111, the first fixed plate mounting portion 12, and the second fixed plate mounting portion 13 can be separately provided with or share a portion of the profile frame. Five fixed plates 22 are fixedly installed in parallel and overlapping in the front-to-back direction in the first fixed plate mounting portion 12 located on the right side, and one fixed plate 22 is fixedly installed in the second fixed plate mounting portion 13 located on the left side.

[0117] In this embodiment, the movable plate 21 is in the first working position when it is in front of the right first fixed plate mounting portion 12, and is in the second working position when it is in front of the left second fixed plate mounting portion 13, so that: the movable plate 21 in the first working position is parallel to the fixed plate 22 in the first fixed plate mounting portion 12 and overlaps in a direction perpendicular to the fixed plate 22 in the first fixed plate mounting portion 12 (the front-to-back direction in this embodiment), and the movable plate 21 in the second working position is staggered from the fixed plate 22 in the first fixed plate mounting portion 12 in a direction perpendicular to the fixed plate 22 in the first fixed plate mounting portion 12; the movable plate 21 in the first working position is staggered from the fixed plate 22 in the second fixed plate mounting portion 13 in a direction perpendicular to the fixed plate 22 in the second fixed plate mounting portion 13 (the front-to-back direction in this embodiment), and the movable plate 21 in the second working position is parallel to the fixed plate 22 in the second fixed plate mounting portion 13 and overlaps in a direction perpendicular to the fixed plate 22 in the second fixed plate mounting portion 13.

[0118] In the implementation of the present application, the number of the fixing plates 22 in the first fixing plate installation portion 12 can be set selectively, and the number of the fixing plates 22 in the second fixing plate installation portion 13 can be set selectively.

[0119] The test board mounting frame 10 is movably arranged on the base 30 relative to the base 30, and the two test board mounting frames 10 are arranged in upper and lower layers. The test board mounting frame 10 located on the lower layer is hinged to the front end of the base 30 around a hinge axis extending in the left-right direction and being horizontal. The test board mounting frame 10 located on the upper layer is hinged to the front end of the test board mounting frame 10 on the lower layer around a hinge axis extending in the left-right direction and being horizontal. A pitch angle adjustment device 40 is correspondingly provided for each test board mounting frame 10. The pitch angle adjustment device 40 corresponding to the test board mounting frame 10 on the lower layer is installed on the rear side of the base 30. The pitch angle adjustment device 40 corresponding to the test board mounting frame 10 on the upper layer is installed on the rear side of the test board mounting frame 10 on the upper layer.

[0120] The pitch angle adjustment device 40 is drivingly connected to the test board mounting frame 10 and is configured to drive the test board mounting frame 10 to rotate relative to the base 30 around a horizontal rotation axis to change the pitch angle of the test board 20 mounted on the test board mounting frame 10 .

[0121] The pitch angle adjustment device 40 includes a drive mechanism 41, a support structure 42, and an articulated seat 43. The support structure 42 includes an articulated connection portion 421 articulated to the test board mounting frame 10 and a drive connection portion 422 drivingly connected to the drive mechanism 41. The drive mechanism 41 is configured to drive the drive connection portion 422 to move and change the angle between the support structure 42 and the test board mounting frame 10, thereby changing the angle between the test board mounting frame 10 and the base 30. Figures 2 to 4 As shown, the support structure 42 may be in the form of a support rod. In an embodiment not shown, the support structure may be in the form of a support frame.

[0122] In this embodiment, the pitch angle adjustment device 40 includes a support structure limiting portion, which is configured to limit the movement path and movement limit position of the driving connection portion 422 .

[0123] like Figure 9 As shown, in this embodiment, the driving mechanism 41 includes a hand-cranked device 411 , a reducer 412 , a coupling 413 , a screw 414 , a moving platform 415 , a second guide rail 416 and a stopper 417 .

[0124] The reducer 412, for example, may be a worm gear reducer, a gear reducer, or the like, and has a reducer input shaft 4121 and a reducer output shaft 4122. The reducer input shaft 4121 extends in the left-right direction and is drivingly connected to the hand crank 411, which can drive the reducer input shaft 4121 to rotate. In an unillustrated embodiment, the hand crank 411 can be replaced with an electric or hydraulic actuator, such as a rotary motor. The reducer output shaft 4122 is connected to a screw 414 via a coupling 413. The screw 414 extends in the front-to-back direction, thereby converting the rotational motion of the hand crank 411 about its left-to-right axis into the rotational motion of the screw 414 about its front-to-back axis. The mobile platform 415 is threadedly connected to the screw 414, so that the rotation of the screw 414 is converted into translational motion of the mobile platform 415 in the front-to-back direction. Two second guide rails 416 extend in the front-to-back direction and are spaced side by side in the left-to-right direction. The mobile platform 415 and the second guide rail 616 can be slidably or rollingly engaged, allowing for forward and backward movement guided by the second guide rail 416. The hinged seat 43 is mounted on the top plate 4151 of the mobile platform 415. The drive connection portion 422 of the support structure 42 is hingedly connected to the hinged seat 43. The drive connection portion 422 can move as the mobile platform 415 moves forward and backward, thereby changing the angle of the support structure 42 relative to the base 30 and the test board mounting frame 10 and causing the test board mounting frame 10 to rotate about the base 30, thereby changing the pitch angle of the test board mounting frame 10 and each test board 20 mounted thereon.

[0125] The stopper 417 is located at the front end of the second guide rail 416 and is disposed on the moving path of the driving connection portion 422 .

[0126] The support structure limiting portion includes the second guide rail 416 and the stopper 417. The second guide rail 416 can define the movement path of the drive connection portion 422. The stopper 417 can define the limit position of the forward movement of the drive connection portion 422. The stopper 417 can be a baffle, a block, a protrusion, a pin, etc.

[0127] The pitch angle adjustment device 40 corresponding to the lower test board mounting frame 10 allows the angle of the test board mounting frame 10 relative to the base 30 to be adjusted within a range of, for example, 10 to 27 degrees. Specifically, when the movable platform 415 is moved to the frontmost position, the angle between the bottom surface of the test board mounting frame 10, where the test board 20 is placed, and the base 30 is 27 degrees. When the movable platform 415 is moved to the rearmost position, the angle between the bottom surface of the test board mounting frame 10 and the base 30 is 10 degrees.

[0128] The pitch angle adjustment device 40 corresponding to the upper test board mounting frame 10 can adjust the angle of the upper test board mounting frame 10 relative to the lower test board mounting frame 10, for example, within a range of 0 to 10 degrees. Specifically, when the movable platform 415 is moved to the frontmost position, the angle between the movable platform 415 and the bottom surface of the lower test board mounting frame 10, on which the test board 20 is placed, is 10 degrees. When the movable platform 415 is moved to the rearmost position, the angle between the movable platform 415 and the bottom surface of the lower test board mounting frame 10, on which the test board 20 is placed, is 0 degrees.

[0129] A spare placement portion 31 is provided in the base 30 for placing a fixing plate 22 (i.e., a spare fixing plate 22 ) that is not mounted on the first fixing plate mounting portion 12 and the second fixing plate mounting portion 13 . The spare placement portion 31 is located below the test plate mounting frame 10 .

[0130] The position locking mechanism 50 is configured to lock the relative position between the test board mounting frame 10 and the base 30. The position locking mechanism 50 includes a locking rod 51 and a locking screw 52. The locking rod 51 is hingedly connected to the test board mounting frame 10 and includes a mounting groove 51A extending along the length direction of the locking rod 51. The locking screw 52 is rotatably provided on the base 30 and is located in the mounting groove 51A. The locking screw 52 can be screwed into the threaded hole on the base 30 to fix the locking rod 51 to the base 30. Before the pitch angle of the test board mounting frame 10 is adjusted, the locking screw 52 is loosened and the test board mounting frame 10 can be rotated relative to the base 30. After the pitch angle adjustment is completed, the locking screw 52 is tightened and the test board mounting frame 10 and the base 30 can be locked in position. When the material identification index test fixture is in a stationary state for a long time, tightening the locking screw 52 can prevent the entire weight of the lower test plate support frame 10 itself and the test materials on it, as well as the upper test plate support frame 10 and the test materials on it, from being borne entirely by the mobile platform 415 and screw 414 of the pitch angle adjustment device 40 corresponding to the lower test plate support frame 10, thereby preventing the mobile platform 415 and screw 414 from bearing the load for a long time and affecting the stability of the structure.

[0131] like Figures 10 to 20 As shown, the following are examples of test plate combinations of different mass thicknesses that can be obtained when the movable plate 21 on a test plate mounting frame 10 is in different positions.

[0132] By placing test materials of different mass thicknesses on the first fixed plate mounting portion 12 and the second fixed plate mounting portion 13, for example, placing different numbers of fixed plates 22 with the same mass thickness, and combining them with multiple groups of movable plates 21, a variety of mass thickness combinations can be achieved, wherein the number of movable plates 21 in each group of movable plates 21 is different but the mass thickness specifications are the same, which can cover the mass thickness requirements of test materials required for most material identification index tests currently required for the acceptance of radiation inspection equipment.

[0133] Figures 10 to 14 The first combination is shown. In the first combination, the first fixing plate mounting portion 12 is mounted with five pieces of 10g / cm thick 2 The fixing plate 22 is formed into 50g / cm 2 The second fixing plate mounting portion 13 is provided with a mass thickness of 10 g / cm 2 A fixed plate 22 is formed to form 10g / cm 2 A set of movable plates 21 is placed in each of the two movable plate installation areas 111A. Two pieces of 10g / cm thick material are installed on the movable plate installation frame 113 of the movable plate installation area 111A on the front side. 2 The movable plate 21 is formed into 20g / cm 2 A test material that can be moved between the first working position and the second working position in the left-right direction. A piece of material with a mass thickness of 10g / cm is installed on the movable plate mounting frame 113 of the movable plate mounting area 111A at the rear side. 2 The movable plate 21 is formed into 10g / cm 2 The test material can be moved between the first working position and the second working position in the left-right direction. By switching the working positions of the two sets of movable plates 21 in the two movable plate installation areas 111A, 10g / cm 2 , 20g / cm 2 、30g / cm 2 , 40g / cm 2 , 50g / cm 2 、60g / cm 2 , 70g / cm 2 and 80g / cm 2 Free combination of 20 test plates of mass thickness.

[0134] like Figure 11 As shown, after the two sets of movable plates 21 in the two movable plate installation areas 111A are switched to their respective first working positions, the two sets of movable plates 21 can be located in front of the five fixed plates 22 installed on the first fixed plate installation portion 12, forming an 80g / cm 2 Eight test plates 20 (three movable plates 21 and five fixed plates 22) with a mass thickness of 10g / cm 2 A combination of a test plate 20 (a fixing plate 22) of mass thickness.

[0135] like Figure 12As shown, after switching a group of movable plates located at the front side of the two movable plate mounting areas 111A to the first working position and switching a group of movable plates located at the rear side of the two movable plate mounting areas 111A to the second working position, two movable plates 21 in the two groups of movable plates 21 can be located in front of the five fixed plates 22 mounted on the first fixed plate mounting portion 12, and one movable plate 21 in the two groups of movable plates 21 can be located in front of the fixed plate 22 mounted on the second fixed plate mounting portion 13, forming a 70g / cm 2 Seven test plates 20 (two movable plates 21 and five fixed plates 22) with a mass thickness of 20g / cm 2 A combination of two test plates 20 (a movable plate 21 and a fixed plate 22) of mass thickness.

[0136] like Figure 13 As shown, after switching a group of movable plates located at the front side of the two movable plate mounting areas 111A to the second working position and switching a group of movable plates located at the rear side of the two movable plate mounting areas 111A to the first working position, one movable plate 21 in the two groups of movable plates 21 can be located in front of the five fixed plates 22 mounted on the first fixed plate mounting portion 12, and at the same time, one movable plate 21 in the two groups of movable plates 21 can be located in front of a fixed plate 22 mounted on the second fixed plate mounting portion 13, forming a 60g / cm 2 Six test plates 20 (one movable plate 21 and five fixed plates 22) with a mass thickness of 30g / cm 2 A combination of three test plates 20 (two movable plates 21 and one fixed plate 22) of mass thickness.

[0137] like Figure 14 As shown, after the two sets of movable plates 21 in the two movable plate installation areas 111A are switched to their respective second working positions, the two sets of movable plates 21 can be located in front of a fixed plate 22 installed on the second fixed plate installation portion 13, forming a 50g / cm 2 Five test plates 20 (five fixing plates 22) with a mass thickness of 40 g / cm 2 A combination of four test plates 20 (three movable plates 21 and one fixed plate 22) of mass thickness.

[0138] Figures 15 and 16 In the second combination mode, the first fixing plate mounting portion 12 is mounted with five pieces of 10g / cm thick 2 The fixing plate 22 is formed into 50g / cm 2The fixed test material. The second fixed plate mounting portion 13 is not equipped with a fixed plate 22, that is, no fixed test material is set. A set of movable plates 21 is placed in each of the two movable plate mounting areas 111A. Two pieces of 10g / cm thick material are installed on the movable plate mounting bracket 113 of the front movable plate mounting area 111A. 2 The movable plate 21 is formed into 20g / cm 2 A test material that can be moved between the first working position and the second working position in the left-right direction. A piece of material with a mass thickness of 10g / cm is installed on the movable plate mounting frame 113 of the movable plate mounting area 111A at the rear side. 2 The movable plate 21 is formed into 10g / cm 2 The test material can be moved between the first working position and the second working position in the left-right direction. By switching the working positions of the two sets of movable plates 21 in the two movable plate installation areas 111A, the test material can be moved from 30g / cm 2 , 50g / cm 2 and 80g / cm 2 Quality thickness combination.

[0139] like Figure 15 As shown, after the two sets of movable plates 21 in the two movable plate installation areas 111A are switched to their respective second working positions, the two sets of movable plates 21 can be located in front of the second fixed plate installation portion 13, forming a 50g / cm 2 Five test plates 20 (five fixing plates 22) with a mass thickness of 30 g / cm 2 A combination of three test plates 20 (three fixing plates 22) of mass thickness.

[0140] like Figure 16 As shown, after the two sets of movable plates 21 in the two movable plate installation areas 111A are switched to their respective first working positions, the two sets of movable plates 21 can be located in front of the five fixed plates 22 of the first fixed plate installation portion 12, forming an 80g / cm 2 A plurality of test plates 20 (three movable plates 21 and five fixed plates 22) of mass thickness.

[0141] Figure 17 and Figure 18 In the third combination mode, the first fixing plate mounting portion 12 is mounted with six pieces of 10g / cm thick 2 The fixing plate 22 is formed into 60g / cm 2 The second fixing plate mounting portion 13 is provided with a mass thickness of 10 g / cm 2 The three fixed plates 22 form a 30g / cm 2A set of movable plates 21 is placed in each of the two movable plate installation areas 111A. Two pieces of 10g / cm thick material are installed on the movable plate installation frame 113 of the movable plate installation area 111A on the front side. 2 The movable plate 21 is formed into 20g / cm 2 A test material that can be moved between the first working position and the second working position in the left-right direction. A piece of material with a mass thickness of 10g / cm is installed on the movable plate mounting frame 113 of the movable plate mounting area 111A at the rear side. 2 The movable plate 21 is formed into 10g / cm 2 The test material can be moved between the first working position and the second working position in the left-right direction. By switching the working positions of the two sets of movable plates 21 in the two movable plate installation areas 111A, a 40g / cm 2 、60g / cm 2 and 80g / cm 2 Free combination of 20 test plates of mass thickness.

[0142] like Figure 17 As shown, after the two sets of movable plates 21 in the two movable plate installation areas 111A are switched to their respective second working positions, the two sets of movable plates 21 can be located in front of the three fixed plates 22 installed on the second fixed plate installation portion 13, forming a 60g / cm 2 Six test plates 20 (six fixing plates 22) with a mass thickness of 60 g / cm 2 A combination of six test plates 20 (three movable plates 21 and three fixed plates 22) of mass thickness.

[0143] like Figure 18 As shown, after switching a group of movable plates located at the front side of the two movable plate mounting areas 111A to the first working position and switching a group of movable plates located at the rear side of the two movable plate mounting areas 111A to the second working position, two movable plates 21 in the two groups of movable plates 21 can be located in front of the six fixed plates 22 mounted on the first fixed plate mounting portion 12, and one movable plate 21 in the two groups of movable plates 21 can be located in front of the three fixed plates 22 mounted on the second fixed plate mounting portion 13, forming an 80g / cm2 plate on the right side. 2 Eight test plates 20 (two movable plates 21 and six fixed plates 22) with a mass thickness of 40g / cm 2 A combination of four test plates 20 (one movable plate 21 and three fixed plates 22) of mass thickness.

[0144] Figure 19 and Figure 20In the fourth combination mode, the first fixing plate mounting portion 12 is mounted with six pieces of 10g / cm thick 2 The fixing plate 22 is formed into 60g / cm 2 The second fixing plate mounting portion 13 is provided with a mass thickness of 10 g / cm 2 A fixed plate 22 is formed to form 10g / cm 2 A set of movable plates 21 is placed in each of the two movable plate installation areas 111A. Two pieces of 10g / cm thick material are installed on the movable plate installation frame 113 of the movable plate installation area 111A on the front side. 2 The movable plate 21 is formed into 20g / cm 2 A test material that can be moved between the first working position and the second working position in the left-right direction. A piece of material with a mass thickness of 10g / cm is installed on the movable plate mounting frame 113 of the movable plate mounting area 111A at the rear side. 2 The movable plate 21 is formed into 10g / cm 2 The test material can be moved between the first working position and the second working position in the left-right direction. By switching the working positions of the two sets of movable plates 21 in the two movable plate installation areas 111A, a 20g / cm 2 , 40g / cm 2 、60g / cm 2 and 80g / cm 2 Quality thickness combination.

[0145] like Figure 19 As shown, after the two sets of movable plates 21 in the two movable plate installation areas 111A are switched to their respective second working positions, the two sets of movable plates 21 can be located in front of a fixed plate 22 installed on the second fixed plate installation portion 13, forming a 60g / cm 2 Six test plates 20 (six fixing plates 22) with a mass thickness of 40 g / cm 2 A combination of four test plates 20 (three movable plates 21 and one fixed plate 22) of mass thickness.

[0146] like Figure 20 As shown, after switching a group of movable plates 21 located at the front side of the two movable plate mounting areas 111A to the first working position and switching a group of movable plates 21 located at the rear side of the two movable plate mounting areas 111A to the second working position, two movable plates 21 in the two groups of movable plates 21 can be located in front of the six fixed plates 22 mounted on the first fixed plate mounting portion 12, and one movable plate 21 in the two groups of movable plates 21 can be located in front of a fixed plate 22 mounted on the second fixed plate mounting portion 13, forming an 80g / cm2 structure located on the right side.2 Eight test plates 20 (two movable plates 21 and six fixed plates 22) with a mass thickness of 20g / cm 2 A combination of two test plates 20 (a movable plate 21 and a fixed plate 22) of mass thickness.

[0147] Those skilled in the art may make various modifications based on the above embodiments. For example, only one test plate mounting frame 10 may be provided, or more may be provided. When there are multiple test plate mounting frames 10, the test plate mounting frames 10 may be arranged in a front row along the left and right directions. For another example, the pitch angle adjustment device 40 is not required, nor does it have to correspond one-to-one with each test plate mounting frame 10. For example, in an alternative embodiment to the above embodiment, only one pitch angle adjustment device 40 may be provided corresponding to the upper test plate mounting frame 10, or only one pitch angle adjustment device 40 may be provided corresponding to the lower test plate mounting frame 10. For another example, the test plate mounting frame may have only one fixed plate mounting portion, or may have three or more fixed plate mounting portions. For another example, in an alternative embodiment to the above embodiment, the hand crank device 411 may be replaced with an electric device, or the combination of the hand crank device and the reducer 412 may be replaced with an electric device. For another example, the substance identification index test fixture of the above embodiment is made of steel profiles. In some variations, it may be made entirely or partially of aluminum to achieve lightweighting.

[0148] The above description of the various embodiments tends to emphasize the differences between the various embodiments. The same or similar aspects can be referenced with each other and will not be repeated herein for the sake of brevity.

[0149] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present application and are not intended to limit them. Although the present application has been described in detail with reference to preferred embodiments, ordinary technicians in the relevant field should understand that the specific implementation methods of the present application can still be modified or some technical features can be replaced by equivalents, which should all be included in the scope of the technical solutions requested for protection in this application.

Claims

1. A material identification index testing tool for radiation inspection equipment, comprising a test plate mounting frame (10) and a plurality of test plates (20) of the same material arranged corresponding to the test plate mounting frame (10), characterized in that: The test plate mounting frame (10) comprises a movable plate mounting portion (11); The plurality of test plates (20) include one or more movable plates (21), which are movably mounted on the movable plate mounting portion (11), and the movable plate (21) has a first working position and a second working position. In at least one of the first working position and the second working position, the movable plate (21) is configured to be capable of receiving a scanning inspection by a radiation inspection device.

2. The material identification index testing tool for radiation inspection equipment according to claim 1, characterized in that: The movable plate (21) is translatably movable and / or rotatable relative to the test plate mounting frame (10) to switch between the first working position and the second working position.

3. The material identification index testing tool for radiation inspection equipment according to claim 1 or 2, characterized in that: The movable plate mounting portion (11) comprises: A movable plate limiting portion configured to limit the movable path and / or movable limit position of the movable plate (21); and / or The movable panel locking portion is configured to lock the movable panel (21) at the first working position and / or the second working position.

4. The material identification index testing tool for radiation inspection equipment according to claim 3, characterized in that: The movable panel limiting portion comprises a movable panel limiting frame (111), and the movable panel (21) moves within a movable panel installation area (111A) defined by the movable panel limiting frame (111) to switch between the first working position and the second working position; and / or The movable panel limiting portion comprises a first guide rail (112) and a movable panel mounting frame (113), the movable panel (21) is mounted on the movable panel mounting frame (113), and the movable panel mounting frame (113) is configured to move along the first guide rail (112); and / or The movable panel locking portion comprises a pin (114), and the pin (114) is configured to lock the movable panel (21) in the first working position and / or the second working position.

5. The material identification index testing tool for radiation inspection equipment according to any one of claims 1 to 4, characterized in that: The plurality of test plates (20) include two or more movable plates (21), wherein: At least two of the movable plates (21) have different mass thicknesses; and / or At least two of the movable plates (21) have the same mass thickness; and / or At least one of the movable panels (21) switches between the first working position and the second working position independently of the other movable panels (21); and / or At least two of the movable panels (21) are switched synchronously between the first working position and the second working position.

6. The material identification index testing tool for radiation inspection equipment according to any one of claims 1 to 5, characterized in that: The movable plate mounting portion (11) includes two or more movable plate mounting areas (111A), and the plurality of test plates (20) include two or more groups of movable plates (21). The two or more groups of movable plates (21) are mounted in a one-to-one correspondence within the two or more movable plate mounting areas (111A) and move within the corresponding movable plate mounting areas (111A) to switch between the first working position and the second working position.

7. The material identification index testing tool for radiation inspection equipment according to any one of claims 1 to 6, characterized in that: The plurality of test plates (20) include one or more fixing plates (22), wherein: The test plate mounting frame (10) further comprises a first fixed plate mounting portion (12), at least one fixed plate (22) being fixedly mounted on the first fixed plate mounting portion (12), the movable plate (21) in the first working position being parallel to the fixed plate (22) in the first fixed plate mounting portion (12) and overlapping in a direction perpendicular to the fixed plate (22) in the first fixed plate mounting portion (12), and the movable plate (21) in the second working position being offset from the fixed plate (22) in the first fixed plate mounting portion (12) in a direction perpendicular to the fixed plate (22) in the first fixed plate mounting portion (12); and / or The test plate mounting frame (10) further includes a second fixed plate mounting portion (13), at least one fixed plate (22) is fixedly mounted on the second fixed plate mounting portion (13), the movable plate (21) in the first working position and the fixed plate (22) in the second fixed plate mounting portion (13) are staggered in a direction perpendicular to the fixed plate (22) in the second fixed plate mounting portion (13), and the movable plate (21) in the second working position is parallel to the fixed plate (22) in the second fixed plate mounting portion (13) and overlaps in a direction perpendicular to the fixed plate (22) in the second fixed plate mounting portion (13).

8. The material identification index testing tool for radiation inspection equipment according to claim 7, characterized in that: The plurality of test plates (20) include a plurality of fixing plates (22) arranged in parallel and overlapping on the first fixing plate mounting portion (12), wherein the mass thickness of at least two fixing plates (22) on the first fixing plate mounting portion (12) is different or the same; and / or The plurality of test plates (20) include a plurality of fixing plates (22) arranged in parallel and overlapping on the second fixing plate mounting portion (13), wherein the mass thickness of at least two of the fixing plates (22) on the second fixing plate mounting portion (13) is different or the same; and / or The plurality of test plates (20) include the fixing plates (22) arranged on the first fixing plate mounting portion (12) and the fixing plates (22) arranged on the second fixing plate mounting portion (13), wherein the mass thickness of at least one of the fixing plates (22) located on the first fixing plate mounting portion (12) and at least one of the fixing plates (22) located on the second fixing plate mounting portion (12) is different from or the same as that of the fixing plates (22) located on the second fixing plate mounting portion (12).

9. The material identification index testing tool for radiation inspection equipment according to claim 7 or 8, characterized in that: The fixing plate (22) located at the first fixing plate mounting portion (12) and the fixing plate (22) located at the second fixing plate mounting portion (13) are arranged side by side.

10. The material identification index testing tool for radiation inspection equipment according to any one of claims 7 to 9, characterized in that: The number of the fixing plates (22) located in the first fixing plate mounting portion (12) is selectively set; and / or The number of the fixing plates (22) located in the second fixing plate mounting portion (13) can be set selectively.

11. The material identification index testing tool for radiation inspection equipment according to any one of claims 7 to 10, characterized in that: The substance identification index testing tool further comprises a spare placement portion (31), wherein the spare placement portion (31) is used to place the fixing plate (22) that is not installed on the first fixing plate installation portion (12) and the second fixing plate installation portion (13).

12. The material identification index testing tool for radiation inspection equipment according to any one of claims 1 to 11, characterized in that: Also includes: a base (30), the test plate mounting frame (10) being movably disposed on the base (30) relative to the base (30); and A mounting frame driving device is drivingly connected to the test board mounting frame (10) and is configured to drive the test board mounting frame (10) to move relative to the base (30).

13. The material identification index testing tool for radiation inspection equipment according to claim 12, characterized in that: The mounting frame driving device includes a pitch angle adjustment device (40), the pitch angle adjustment device (40) being drivingly connected to the test board mounting frame (10) and configured to drive the test board mounting frame (10) to rotate around a horizontal axis relative to the base (30) to change the pitch angle of the test board (20) mounted on the test board mounting frame (10); and / or The mounting frame driving device includes a rotation angle adjustment device, the rotation angle adjustment device is drivingly connected to the test plate mounting frame (10) and is configured to drive the test plate mounting frame (10) to rotate around a vertical axis relative to the base (30); and / or The mounting frame driving device comprises a height adjustment device, which is drivingly connected to the test board mounting frame (10) and is configured to drive the test board mounting frame (10) to move up and down relative to the base (30).

14. The material identification index testing tool for radiation inspection equipment according to claim 13, characterized in that: The pitch angle adjustment device (40) comprises: a drive mechanism (41); and A support structure (42), the support structure (42) comprising an articulated connection portion (421) articulated to the test board mounting frame (10) and a drive connection portion (422) drive-connected to the drive mechanism (41), the drive mechanism (41) being configured to drive the drive connection portion (422) to move and change an angle between the support structure (42) and the test board mounting frame (10), so as to change an angle between the test board mounting frame (10) and the base (30).

15. The material identification index testing tool for radiation inspection equipment according to claim 13 or 14, characterized in that: The pitch angle adjustment device (40) further comprises a support structure limiting portion, wherein the support structure limiting portion is configured to limit the movement path and / or movement limit position of the drive connection portion (422).

16. The material identification index testing tool for radiation inspection equipment according to claim 15, characterized in that: The support structure limiting portion includes: a second guide rail (416), the second guide rail (416) being configured to define a movement path of the drive connection portion (422); and / or The stopper (417) is provided on the moving path of the drive connection part (422) and is configured to limit the movement limit position of the drive connection part (422).

17. The material identification index testing tool for radiation inspection equipment according to any one of claims 12 to 16, characterized in that: It also includes a position locking mechanism (50), which is configured to lock the relative position between the test board mounting frame (10) and the base (30).

18. The material identification index testing tool for radiation inspection equipment according to claim 16, characterized in that: The position locking mechanism (50) comprises: a locking rod (51), the locking rod (51) being hingedly connected to the test plate mounting frame (10) and comprising a mounting slot (51A) extending along the length direction of the locking rod (51); and A locking screw (52) is rotatably disposed on the base (30) and located in the mounting groove (51A), and is configured to securely connect the locking rod (51) to the base (30).

19. The material identification index testing tool for radiation inspection equipment according to any one of claims 1 to 18, characterized in that: It comprises a plurality of said test board mounting racks (10), wherein: The plurality of test boards (20) installed in each of the plurality of test board mounting racks (10) are made of a different material from the plurality of test boards (20) in the remaining test board mounting racks (10); and / or At least two of the plurality of test board mounting racks (10) are installed in layers; and / or At least two of the plurality of test board mounting racks (10) are mounted side by side.

20. The material identification index testing tool for radiation inspection equipment according to claim 19, characterized in that: At least two of the test board mounting frames (10) are installed in layers, and the test board mounting frame (10) located at the upper layer is rotatably mounted on the test board mounting frame (10) located at the lower layer.

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