Performance test method, terminal, first equipment, system and storage medium

Abstract

The invention provides a performance test method, a terminal, first equipment, a system and a storage medium, and the method comprises the steps: receiving first indication information transmitted by the first equipment, and a first reference signal corresponding to each beam in a beam subset; predicting a first measurement value corresponding to each beam in the beam set through an AI model; sending the first information to the first device; receiving second indication information sent by the first device based on the changed mapping relationship, and a second reference signal corresponding to each beam in the beam set; and sending the second information to the first equipment. According to the beam management method and device, the terminal needs to faithfully report the relevant information of the predicted first beam and the actual measurement result, so that the reliability of beam management based on the AI is improved, and the availability is high.

Description

Technical Field

[0001] The present disclosure relates to the field of communications, and in particular to a performance testing method, a terminal, a first device, a system, and a storage medium. Background Art

[0002] Artificial Intelligence (AI)-based beam management refers to the process of effectively controlling and optimizing beam transmission and reception in wireless communication systems. Summary of the Invention

[0003] In order to improve the reliability of AI-based beam management, the embodiments of the present disclosure provide a performance testing method, a terminal, a first device, a system, and a storage medium.

[0004] According to a first aspect of an embodiment of the present disclosure, a performance testing method is provided, the method being executed by a terminal, the method comprising:

[0005] receiving first indication information sent by a first device and a first reference signal corresponding to each beam in a beam subset, wherein the first indication information is used to indicate a mapping relationship, where the mapping relationship is a mapping relationship between each beam in the beam set and the first reference signal;

[0006] measuring the first reference signal corresponding to each beam in the beam subset, and predicting, based on the obtained first measurement value, the first measurement value corresponding to each beam in the beam set by using an artificial intelligence (AI) model;

[0007] Sending first information to the first device; wherein the first information is information related to a first beam; wherein the first beam is a beam selected in descending order of the first measurement values predicted by the AI model within the beam set;

[0008] receiving second indication information sent by the first device based on the changed mapping relationship, and a second reference signal corresponding to each beam in the beam set; wherein the second indication information is used to indicate an index of each second reference signal;

[0009] Measure each of the second reference signals and send second information to the first device based on the obtained second measurement value; wherein the second information is information related to a third reference signal, and the third reference signal is the second reference signal selected in descending order of the second measurement value.

[0010] According to a second aspect of an embodiment of the present disclosure, a performance testing method is provided. The method is performed by a first device, and the method includes:

[0011] Sending first indication information and a first reference signal corresponding to each beam in the beam subset; wherein the first indication information is used to indicate a mapping relationship, and the mapping relationship is a mapping relationship between each beam in the beam set and the first reference signal;

[0012] receiving first information; wherein the first information is information related to a first beam; wherein the first beam is a beam selected by the terminal in the beam set according to the first measurement value predicted by the artificial intelligence (AI) model in descending order;

[0013] Based on the changed mapping relationship, sending second indication information and a second reference signal corresponding to each beam in the beam set; wherein the second indication information is used to indicate an index of each second reference signal;

[0014] receiving second information; wherein the second information is information related to a third reference signal, the third reference signal being a second measurement value obtained by the terminal measuring each second reference signal, and the second reference signals being selected in descending order;

[0015] Based on the first information and the second information, a performance test is performed on the AI model on the terminal.

[0016] According to a third aspect of an embodiment of the present disclosure, a terminal is provided, including:

[0017] a transceiver module configured to receive first indication information sent by a first device and a first reference signal corresponding to each beam in a beam subset; wherein the first indication information is used to indicate a mapping relationship between each beam in the beam set and the first reference signal;

[0018] a processing module configured to measure the first reference signal corresponding to each beam in the beam subset, and predict the first measurement value corresponding to each beam in the beam set by using an artificial intelligence (AI) model based on the obtained first measurement value;

[0019] The transceiver module is further configured to send first information to the first device; wherein the first information is information related to the first beam; wherein the first beam is a beam selected in the beam set in descending order of the first measurement values predicted by the AI model;

[0020] The transceiver module is further configured to receive second indication information sent by the first device based on the changed mapping relationship, and a second reference signal corresponding to each beam in the beam set; wherein the second indication information is used to indicate an index of each second reference signal;

[0021] The transceiver module is further configured to measure each second reference signal and send second information to the first device based on the obtained second measurement value; wherein the second information is information related to a third reference signal, and the third reference signal is the second reference signal selected in descending order of the second measurement value.

[0022] According to a fourth aspect of an embodiment of the present disclosure, a first device is provided, including:

[0023] a transceiver module configured to send first indication information and a first reference signal corresponding to each beam in the beam subset; wherein the first indication information is used to indicate a mapping relationship, and the mapping relationship is a mapping relationship between each beam in the beam set and the first reference signal;

[0024] The transceiver module is further configured to receive first information; wherein the first information is information related to a first beam; wherein the first beam is a beam selected by the terminal in the beam set according to the first measurement value predicted by the artificial intelligence (AI) model in descending order;

[0025] The transceiver module is further configured to send second indication information and a second reference signal corresponding to each beam in the beam set based on the changed mapping relationship; wherein the second indication information is used to indicate an index of each second reference signal;

[0026] The transceiver module is further configured to receive second information; wherein the second information is information related to a third reference signal, and the third reference signal is a second measurement value obtained by the terminal measuring each second reference signal, and the second reference signals are selected in descending order;

[0027] A processing module is configured to perform a performance test on the AI model on the terminal based on the first information and the second information.

[0028] According to a fifth aspect of an embodiment of the present disclosure, a terminal is provided, including:

[0029] one or more processors;

[0030] The processor is configured to execute the performance testing method described in any one of the first aspects.

[0031] According to a sixth aspect of an embodiment of the present disclosure, there is provided a first device, including:

[0032] one or more processors;

[0033] The processor is used to execute the performance testing method described in any one of the second aspects.

[0034] According to a seventh aspect of an embodiment of the present disclosure, there is provided a communication system, including:

[0035] A terminal, configured to implement the performance testing method described in any one of the first aspects;

[0036] A first device, wherein the first device is configured to implement the performance testing method described in any one of the second aspects.

[0037] According to an eighth aspect of an embodiment of the present disclosure, a storage medium is provided, which stores instructions. When the instructions are executed on an electronic device, the electronic device executes the performance testing method as described in any one of the first aspect or the second aspect.

[0038] According to a ninth aspect of an embodiment of the present disclosure, a computer program product is provided, comprising a computer program, which, when executed by a processor, is used to implement the performance testing method described in any one of the first aspect or the second aspect.

[0039] In an embodiment of the present disclosure, the first device changes the mapping relationship when sending the second reference signal corresponding to the beam set, and the terminal cannot obtain the changed mapping relationship, so that the terminal needs to truthfully report the relevant information of the predicted first beam and the actual measurement results, thereby improving the reliability of AI-based beam management and high availability.

[0040] It is to be understood that the foregoing general description and the following detailed description are exemplary and explanatory only and are not restrictive of the disclosure. BRIEF DESCRIPTION OF THE DRAWINGS

[0041] The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the invention and, together with the description, serve to explain the principles of the invention.

[0042] Figure 1A It is an exemplary schematic diagram of the architecture of a communication system provided according to an embodiment of the present disclosure.

[0043] Figure 1B It is a schematic diagram of an exemplary scenario of duration provided according to an embodiment of the present disclosure.

[0044] Figure 2 It is an exemplary interactive diagram of the performance testing method provided according to an embodiment of the present disclosure.

[0045] Figure 3A This is one of the exemplary flow charts of the performance testing method provided according to an embodiment of the present disclosure.

[0046] Figure 3B This is a second exemplary flow chart of a performance testing method provided according to an embodiment of the present disclosure.

[0047] Figure 3C This is a third exemplary flow chart of a performance testing method provided according to an embodiment of the present disclosure.

[0048] Figure 3D This is a fourth exemplary flow chart of a performance testing method provided according to an embodiment of the present disclosure.

[0049] Figure 4A This is an exemplary flowchart of the AI model performance test provided according to an embodiment of the present disclosure.

[0050] Figure 4B This is one of the exemplary scenario diagrams of the mapping relationship provided according to an embodiment of the present disclosure.

[0051] Figure 4C This is the second exemplary scenario diagram of the mapping relationship provided according to an embodiment of the present disclosure.

[0052] Figure 4D This is a schematic diagram of an exemplary scenario of a changed mapping relationship provided according to an embodiment of the present disclosure.

[0053] Figure 5A It is an exemplary block diagram of a terminal provided according to an embodiment of the present disclosure.

[0054] Figure 5B is an exemplary block diagram of a first device provided according to an embodiment of the present disclosure.

[0055] Figure 6A This is an exemplary interaction diagram of a communication device provided according to an embodiment of the present disclosure.

[0056] Figure 6B It is an exemplary interaction diagram of a chip provided according to an embodiment of the present disclosure. DETAILED DESCRIPTION

[0057] Exemplary embodiments will be described in detail herein, examples of which are illustrated in the accompanying drawings. In the following description, when referring to the drawings, like numbers in different figures represent like or similar elements unless otherwise indicated. The embodiments described in the following exemplary embodiments are not intended to represent all possible embodiments consistent with the present invention. Rather, they are merely examples of apparatus and methods consistent with certain aspects of the present invention, as detailed in the appended claims.

[0058] The embodiments of the present disclosure provide a performance testing method, a terminal, a first device, a system, and a storage medium.

[0059] In a first aspect, an embodiment of the present disclosure proposes a performance testing method, which is executed by a terminal, and the method includes: receiving first indication information sent by a first device, and a first reference signal corresponding to each beam in a beam subset; wherein the first indication information is used to indicate a mapping relationship, and the mapping relationship is a mapping relationship between each beam in the beam set and the first reference signal; measuring the first reference signal corresponding to each beam in the beam subset, and based on the obtained first measurement value, predicting the first measurement value corresponding to each beam in the beam set through an artificial intelligence AI model; sending first information to the first device; wherein the first information is a first reference signal corresponding to the first beam Related information; wherein, the first beam is a beam selected in descending order according to the first measurement values predicted by the AI model within the beam set; receiving the second indication information sent by the first device based on the changed mapping relationship, and the second reference signal corresponding to each beam in the beam set; wherein, the second indication information is used to indicate the index of each second reference signal; measuring each second reference signal, and sending second information to the first device based on the obtained second measurement value; wherein, the second information is information related to the third reference signal, and the third reference signal is the second reference signal selected in descending order according to the second measurement value.

[0060] In combination with some embodiments of the first aspect, in some embodiments, the first indication information is used to indicate at least one of the following: an index of each beam in the beam set, and an index of the first reference signal corresponding to each beam in the beam set; an index of each first reference signal; and an index of the mapping relationship.

[0061] In combination with some embodiments of the first aspect, in some embodiments, the method further includes any one of the following: determining the mapping relationship based on an index of the mapping relationship; determining the mapping relationship based on a predefined method and an index of each first reference signal.

[0062] In combination with some embodiments of the first aspect, in some embodiments, the first information includes at least one of the following: an index of each of the first beams; an index of the first reference signal corresponding to each of the first beams; and the first measurement value corresponding to each of the first beams.

[0063] In combination with some embodiments of the first aspect, in some embodiments, the second information includes at least one of the following: an index of each of the third reference signals; and the second measurement value corresponding to each of the third reference signals.

[0064] In a second aspect, an embodiment of the present disclosure proposes a performance testing method, which is executed by a first device, and the method includes: sending first indication information and a first reference signal corresponding to each beam in a beam subset; wherein the first indication information is used to indicate a mapping relationship, and the mapping relationship is a mapping relationship between each beam in the beam set and the first reference signal; receiving first information; wherein the first information is information related to the first beam; wherein the first beam is a beam selected in descending order based on a first measurement value predicted by an artificial intelligence (AI) model in the beam set by the terminal; based on the changed mapping relationship, sending second indication information and a second reference signal corresponding to each beam in the beam set; wherein the second indication information is used to indicate an index of each second reference signal; receiving second information; wherein the second information is information related to a third reference signal, and the third reference signal is a second measurement value obtained by the terminal measuring each second reference signal, and the second reference signal is selected in descending order; based on the first information and the second information, performing a performance test on the AI model on the terminal.

[0065] In combination with some embodiments of the second aspect, in some embodiments, the first indication information is used to indicate at least one of the following: an index of each beam in the beam set, and an index of the first reference signal corresponding to each beam in the beam set; an index of each first reference signal; and an index of the mapping relationship.

[0066] In combination with some embodiments of the second aspect, in some embodiments, the first information includes at least one of the following: an index of each of the first beams; an index of the first reference signal corresponding to each of the first beams; and the first measurement value corresponding to each of the first beams.

[0067] In combination with some embodiments of the second aspect, in some embodiments, the second information includes at least one of the following: an index of each of the third reference signals; and the second measurement value corresponding to each of the third reference signals.

[0068] In combination with some embodiments of the second aspect, in some embodiments, the performance test of the AI model on the terminal based on the first information and the second information includes at least one of the following: the first information includes the index of each of the first beams, the second information includes the index of each of the third reference signals, and based on the changed mapping relationship, the index of each second beam corresponding to the index of each of the third reference signals is determined; based on the index of each first beam and the index of each second beam, the performance test of the AI model on the terminal is performed.

[0069] In combination with some embodiments of the second aspect, in some embodiments, the performance test of the AI model on the terminal based on the first information and the second information includes at least one of the following: the first information includes the index of the first reference signal corresponding to each of the first beam, the second information includes the index of each of the third reference signals, based on the mapping relationship, the index of the first beam corresponding to the index of each of the first reference signals is determined, and based on the changed mapping relationship, the index of each second beam corresponding to the index of each of the third reference signals is determined; based on the index of each first beam and the index of each second beam, the performance test of the AI model on the terminal is performed.

[0070] In combination with some embodiments of the second aspect, in some embodiments, the performance test of the AI model on the terminal based on the index of each first beam and the index of each second beam includes: determining a first ratio of the first number to the total number; wherein the first number is the number of times the index of the second beam is the same as the index of the first beam; if the first ratio is greater than or equal to the first value, it is determined that the performance test result of the AI model is passed; or if the first ratio is less than the first value, it is determined that the performance test result of the AI model is failed.

[0071] In combination with some embodiments of the second aspect, in some embodiments, the performance test of the AI model on the terminal based on the first information and the second information includes at least one of the following: the first information includes the first measurement value corresponding to each of the first beam, and the second information includes the second measurement value corresponding to each of the third reference signals, and the difference between each of the second measurement value and the corresponding first measurement value is determined; the second ratio of the second number to the total number is determined; wherein the second number is the number of times the difference is less than or equal to the second value; the second ratio is greater than or equal to the third value, and the performance test result of the AI model is determined to be passed; or the second ratio is less than the third value, and the performance test result of the AI model is determined to be failed. In a third aspect, an embodiment of the present disclosure proposes a terminal, comprising: a transceiver module, configured to receive first indication information sent by a first device, and a first reference signal corresponding to each beam in a beam subset; wherein the first indication information is used to indicate a mapping relationship, and the mapping relationship is a mapping relationship between each beam in the beam set and the first reference signal; a processing module, configured to measure the first reference signal corresponding to each beam in the beam subset, and based on the obtained first measurement value, predict the first measurement value corresponding to each beam in the beam set through an artificial intelligence AI model; the transceiver module is also configured to send first information to the first device; wherein the first information is information related to the first beam ; wherein, the first beam is a beam selected in the beam set in descending order according to the first measurement values predicted by the AI model; the transceiver module is also configured to receive the second indication information sent by the first device based on the changed mapping relationship, and the second reference signal corresponding to each beam in the beam set; wherein, the second indication information is used to indicate the index of each second reference signal; the transceiver module is also configured to measure each second reference signal and send second information to the first device based on the obtained second measurement value; wherein, the second information is information related to the third reference signal, and the third reference signal is the second reference signal selected in descending order according to the second measurement value.

[0072] In a fourth aspect, an embodiment of the present disclosure proposes a first device, comprising: a transceiver module, configured to send first indication information, and a first reference signal corresponding to each beam in a beam subset; wherein the first indication information is used to indicate a mapping relationship, and the mapping relationship is a mapping relationship between each beam in the beam set and the first reference signal; the transceiver module is further configured to receive first information; wherein the first information is information related to the first beam; wherein the first beam is a beam selected by the terminal in the beam set according to the first measurement value predicted by the artificial intelligence AI model in descending order; the transceiver module also It is configured to send second indication information and a second reference signal corresponding to each beam in the beam set based on the changed mapping relationship; wherein, the second indication information is used to indicate the index of each second reference signal; the transceiver module is also configured to receive second information; wherein, the second information is information related to a third reference signal, and the third reference signal is a second measurement value obtained by the terminal for each second reference signal, and the second reference signal is selected in descending order; the processing module is configured to perform a performance test on the AI model on the terminal based on the first information and the second information.

[0073] In a fifth aspect, an embodiment of the present disclosure proposes a terminal, comprising: one or more processors; wherein the processor is used to execute the performance testing method described in any one of the first aspects.

[0074] In a sixth aspect, an embodiment of the present disclosure proposes a first device, comprising: one or more processors; wherein the processor is used to execute the performance testing method described in any one of the second aspects.

[0075] In the seventh aspect, an embodiment of the present disclosure proposes a communication system, comprising: a terminal, which is configured to implement the performance testing method described in any one of the first aspects; and a first device, which is configured to implement the performance testing method described in any one of the second aspects.

[0076] In an eighth aspect, an embodiment of the present disclosure proposes a storage medium storing instructions. When the instructions are executed on an electronic device, the electronic device executes a performance testing method as described in any one of the first aspect or the second aspect.

[0077] In a ninth aspect, an embodiment of the present disclosure proposes a computer program product, comprising a computer program, which, when executed by a processor, is used to implement the performance testing method described in any one of the first aspect or the second aspect.

[0078] In a tenth aspect, an embodiment of the present disclosure provides a chip or a chip system, wherein the chip or chip system includes a processing circuit configured to execute the method described in the optional implementation of the first or second aspect.

[0079] It is understandable that the above-mentioned terminal, first device, communication system, storage medium, computer program product, chip or chip system are all used to perform the method proposed in the embodiment of the present disclosure. Therefore, the beneficial effects that can be achieved can refer to the beneficial effects of the corresponding method and will not be repeated here.

[0080] The present disclosure provides invention titles. In some embodiments, the terms "performance testing method" and "communication method" and "information transmission method" are interchangeable; the terms "beam measurement device" and "communication device" and "information transmission device" are interchangeable; and the terms "communication system" and "beam measurement system" and "information transmission system" are interchangeable.

[0081] The embodiments of the present disclosure are not exhaustive and are merely illustrative of some embodiments, and are not intended to be a specific limitation on the scope of protection of the present disclosure. In the absence of contradiction, each step in a certain embodiment can be implemented as an independent embodiment, and the steps can be arbitrarily combined. For example, a solution after removing some steps in a certain embodiment can also be implemented as an independent embodiment, and the order of the steps in a certain embodiment can be arbitrarily exchanged. In addition, the optional implementation methods in a certain embodiment can be arbitrarily combined; in addition, the embodiments can be arbitrarily combined. For example, some or all steps of different embodiments can be arbitrarily combined, and a certain embodiment can be arbitrarily combined with the optional implementation methods of other embodiments.

[0082] In each embodiment of the present disclosure, unless otherwise specified or provided for by logic, the terms and / or descriptions between the embodiments are consistent and can be referenced by each other. The technical features in different embodiments can be combined to form a new embodiment based on their inherent logical relationships.

[0083] The terms used in the embodiments of the present disclosure are only for the purpose of describing specific embodiments and are not intended to limit the present disclosure.

[0084] In the embodiments of the present disclosure, unless otherwise specified, elements expressed in the singular, such as "a", "an", "the", "above", "said", "the", "the", etc., may mean "one and only one", or "one or more", "at least one", etc. For example, when using articles such as "a", "an", "the" in English in translation, the noun following the article may be understood as a singular expression or a plural expression.

[0085] In the embodiments of the present disclosure, “plurality” refers to two or more.

[0086] In some embodiments, the terms "at least one," "one or more," "a plurality of," "multiple," etc. may be used interchangeably.

[0087] In some embodiments, descriptions such as "at least one of A and B," "A and / or B," "A in one case, B in another case," or "in response to one case A, in response to another case B" may include the following technical solutions depending on the situation: in some embodiments, A (A is executed independently of B); in some embodiments, B (B is executed independently of A); in some embodiments, execution is selected from A and B (A and B are selectively executed); and in some embodiments, A and B (both A and B are executed). The above is also applicable when there are more branches such as A, B, and C.

[0088] In some embodiments, "A or B" and other descriptions may include the following technical solutions depending on the situation: in some embodiments, A (A is executed independently of B); in some embodiments, B (B is executed independently of A); in some embodiments, execution is selected from A and B (A and B are selectively executed). The above is also applicable when there are more branches such as A, B, C, etc.

[0089] The prefixes such as "first" and "second" in the embodiments of the present disclosure are only used to distinguish different description objects and do not constitute any restriction on the position, order, priority, quantity or content of the description objects. For the statement of the description object, please refer to the description in the context of the claims or embodiments, and no unnecessary restriction should be constituted due to the use of prefixes. For example, if the description object is a "field", the ordinal number before the "field" in the "first field" and the "second field" does not limit the position or order between the "fields". "First" and "second" do not limit whether the "fields" they modify are in the same message, nor do they limit the order of the "first field" and the "second field". For another example, if the description object is a "level", the ordinal number before the "level" in the "first level" and the "second level" does not limit the priority between the "levels". For another example, the number of description objects is not limited by the ordinal number and can be one or more. Taking "first device" as an example, the number of "devices" can be one or more. In addition, the objects modified by different prefixes can be the same or different. For example, if the description object is "device", then the "first device" and the "second device" can be the same device or different devices, and their types can be the same or different; for another example, if the description object is "information", then the "first information" and the "second information" can be the same information or different information, and their contents can be the same or different.

[0090] In some embodiments, “including A,” “comprising A,” “used to indicate A,” and “carrying A” can be interpreted as directly carrying A or indirectly indicating A.

[0091] In some embodiments, terms such as "in response to...", "in response to determining...", "in the case of...", "at the time of...", "when...", "if...", "if...", etc. can be used interchangeably.

[0092] In some embodiments, terms such as "greater than", "greater than or equal to", "not less than", "more than", "more than or equal to", "not less than", "higher than", "higher than or equal to", "not less than", and "above" can be replaced with each other, and terms such as "less than", "less than or equal to", "not greater than", "less than", "less than or equal to", "not more than", "lower than", "lower than or equal to", "not higher than", and "below" can be replaced with each other.

[0093] In some embodiments, devices, etc. can be interpreted as physical or virtual, and their names are not limited to the names recorded in the embodiments. Terms such as "device", "equipment", "device", "circuit", "network element", "node", "function", "unit", "section", "system", "network", "chip", "chip system", "entity", and "subject" can be used interchangeably.

[0094] In some embodiments, the terms "terminal", "terminal device", "user equipment (UE)", "user terminal", "mobile station (MS)", "mobile terminal (MT)", subscriber station, mobile unit, subscriber unit, wireless unit, remote unit, mobile device, wireless device, wireless communication device, remote device, mobile subscriber station, access terminal, mobile terminal, wireless terminal, remote terminal, handset, user agent, mobile client, client, etc. can be used interchangeably.

[0095] In some embodiments, the terminal may be replaced by an access network device, a core network device, or a network device. In this case, the access network device, the core network device, or the network device may have a structure that has all or part of the functions of the terminal.

[0096] In some embodiments, obtaining data, information, etc. may comply with the laws and regulations of the country where the data is obtained.

[0097] In some embodiments, data, information, etc. may be obtained with the user's consent.

[0098] In addition, each element, each row, or each column in the table of the embodiment of the present disclosure can be implemented as an independent embodiment, and the combination of any elements, any rows, and any columns can also be implemented as an independent embodiment.

[0099] Figure 1A It is a schematic diagram of the architecture of a communication system according to an embodiment of the present disclosure.

[0100] like Figure 1A As shown, the communication system 100 includes a terminal 101 and a first device 102 .

[0101] In some embodiments, the terminal 101 includes, for example, a mobile phone, a wearable device, an Internet of Things device, a car with communication function, a smart car, a tablet computer, a computer with wireless transceiver function, a virtual reality (VR) terminal device, an augmented reality (AR) terminal device, a wireless terminal device in industrial control, a wireless terminal device in self-driving, a wireless terminal device in remote medical surgery, a wireless terminal device in a smart grid, a wireless terminal device in transportation safety, a wireless terminal device in a smart city, and at least one of a wireless terminal device in a smart home, but is not limited thereto.

[0102] In some embodiments, an AI model is deployed on the terminal 101, and the AI model can be used to predict the optimal beam.

[0103] In some embodiments, the first device 102 may be a test equipment (TE). The TE may be deployed separately and used to test the performance of the AI model on the terminal 101.

[0104] In some embodiments, the first device 102 may be a network device, for example, TE is deployed on the network device, so that the network device tests the performance of the AI model on the terminal 101. The network device may include but is not limited to at least one of an access network device and a core network device.

[0105] In some embodiments, the access network device is, for example, a node or device that accesses a terminal to a wireless network. The access network device may include an evolved NodeB (eNB), a next generation evolved NodeB (ng-eNB), a next generation NodeB (gNB), a node B (NB), a home node B (HNB), a home evolved nodeB (HeNB), a wireless backhaul device, a radio network controller (RNC), a base station controller (BSC), a base transceiver station (BTS), a base band unit (BBU), a mobile switching center, a base station in a 6G communication system, an open base station (Open RAN), a cloud base station (CloudRAN), a base station in other communication systems, and at least one of an access node in a Wi-Fi system, but is not limited thereto.

[0106] In some embodiments, the technical solution of the present disclosure can be applied to the Open RAN architecture. In this case, the interfaces between or within the access network devices involved in the embodiments of the present disclosure can be transformed into internal interfaces of the Open RAN, and the processes and information interactions between these internal interfaces can be implemented through software or programs.

[0107] In some embodiments, the access network device can be composed of a centralized unit (CU) and a distributed unit (DU), where the CU can also be called a control unit (control unit). The CU-DU structure can be used to split the protocol layer of the access network device, with the functions of some protocol layers centrally controlled by the CU, and the functions of the remaining part or all of the protocol layers distributed in the DU, which is centrally controlled by the CU, but is not limited to this.

[0108] In some embodiments, a core network device may be a single device including multiple network elements, or may be multiple devices or device groups, each including all or part of multiple network elements. A network element may be virtual or physical. The core network may include, for example, at least one of an Evolved Packet Core (EPC), a 5G Core Network (5GCN), and a Next Generation Core (NGC).

[0109] In some embodiments, the AI-based beam measurement management process may include:

[0110] First, measurements are performed by the terminal, and then the best beam is predicted by the terminal based on these measurements or measurement results.

[0111] Among them, an AI model can be used to predict the reference signal receiving power (RSRP) of the beam based on the above measurement values or measurement results, and the prediction performance of the AI model needs to be evaluated.

[0112] The RSRP predicted by the AI model will be compared with the reference RSRP, where the reference RSRP can refer to the ideal RSRP or the actual RSRP.

[0113] When determining the reference RSRP, for a multipath channel, the Layer 1 Reference Signal Receiving Power (L1-RSRP) used as a reference depends on many factors. If the first device 102 can know all of these factors, then determining the reference L1-RSRP is feasible. These factors include:

[0114] - Channel spatial domain information, such as angle of arrival (AOA), angle of departure (DOA), zenith angle of arrival (ZOA), zenith angle of departure (ZOD), multipath power, etc.

[0115] -Channel time domain information, such as moving direction, speed, power, multipath delay, etc.

[0116] -Transmit (Tx) beamforming gain

[0117] - Information related to terminal implementation, such as which reference signal (RS) to use and the receive (Rx) beamforming gain.

[0118] In practice, first device 102 is similar to a simulator and can know all channel model-related information and Tx-side implementation except for the terminal implementation. Among the aforementioned factors, first device 102 knows the channel spatial and time domain information and / or Tx beamforming gain. The unknown part is the terminal implementation, such as the Rx beamforming gain.

[0119] Since the first device 102 does not know the Rx beamforming gain of the terminal, it is difficult for the first device 102 to know the ground truth in advance. In this case, one possible way to determine the reference RSRP is for the terminal to measure the RSRP and report the actual measured RSRP value.

[0120] The AI-based beam measurement process is divided into two time durations, for example, time duration 1 and time duration 2, which are subsequently referred to as T1 and T2.

[0121] For example Figure 1B As shown, during time period T1, terminal 101 reports the predicted best beam. During time period T2, terminal 101 measures all beams and reports the best measured beam. First device 102 can use the actually measured best measured beam as a reference and compare it with the predicted best beam, for example, to see if the predicted beam is identical to the reference beam.

[0122] Since both the predicted beam and the reference beam are reported by the terminal, if the terminal 101 does not report truthfully, the first device 102 will not be able to know, so that the performance test result of the AI model on the terminal 101 by the first device 102 is passed.

[0123] For example, assume that during time period T1, terminal 101 reports that the predicted best RS index is 7. And during time period T2, after measuring all RSs, terminal 101 finds that the best beam is in RS #6. At this point, terminal 101 can report to first device 102 that the best measured RS index is 7. Since first device 102 does not know which beam is the best, it compares the two indices reported from terminal 101 at T1 and T2. If the two indices are the same, first device 102 assumes that the predicted best beam is correct.

[0124] Obviously, the reliability of AI-based beam management in the above process is low. Therefore, in order to improve its reliability, the present disclosure provides the following performance testing method, terminal, first device, system and storage medium.

[0125] Figure 2 FIG. 1 is an interactive diagram of a performance testing method according to an embodiment of the present disclosure. Figure 2 As shown, the embodiment of the present disclosure relates to a performance testing method, which includes:

[0126] Step S2101: The first device 102 sends first indication information to the terminal 101.

[0127] In some embodiments, the first device 102 may be a separately deployed device for testing the performance of the AI model on the terminal 101.

[0128] In some embodiments, the first device 102 can be deployed on a network device, and the network device tests the performance of the AI model on the terminal 101 during the beam measurement process.

[0129] In some embodiments, the AI model deployed on terminal 101 can be used to perform optimal beam prediction.

[0130] In some embodiments, the first indication information may be used to indicate a mapping relationship.

[0131] In an example, the mapping relationship may be a mapping relationship between each beam in the beam set and the first reference signal.

[0132] In one example, the beam set includes beams that need to be sent to the terminal 101 when performing beam measurement.

[0133] In one example, there may be a one-to-one correspondence between the beam and the reference signal (RS).

[0134] For example, each beam will be sent through one RS.

[0135] In an example, the mapping relationship can be used to identify a one-to-one mapping relationship between each beam in beam set A and the first reference signal.

[0136] For example, the beam set includes beam #1 to beam #8, and the mapping relationship includes: beam #1 corresponds to RS#1, beam #2 corresponds to RS#2, beam #3 corresponds to RS#3, beam #4 corresponds to RS#4, beam #5 corresponds to RS#5, beam #6 corresponds to RS#6, beam #7 corresponds to RS#7, and beam #8 corresponds to RS#8.

[0137] Exemplarily, the first indication information may clearly indicate the above mapping relationship.

[0138] Specifically, in one embodiment, the first indication information may directly indicate the index of each beam in the beam set, and the index of the first reference signal corresponding to each beam in the beam set.

[0139] For example, the first indication information sent by the first device 102 may indicate: beam #1 corresponds to RS#1, beam #2 corresponds to RS#2, beam #3 corresponds to RS#3, beam #4 corresponds to RS#4, beam #5 corresponds to RS#5, beam #6 corresponds to RS#6, beam #7 corresponds to RS#7, and beam #8 corresponds to RS#8.

[0140] In another implementation, the first indication information may indicate an index of the mapping relationship.

[0141] The terminal 101 may determine the above mapping relationship according to the index of the mapping relationship. The index table of the mapping relationship is shown in Table 1, for example.

[0142] Table 1

[0143]

[0144] For example, assuming that the mapping relationship determined by the first device 102 is beam #1 corresponding to RS#1, beam #2 corresponding to RS#4, beam #3 corresponding to RS#2, beam #4 corresponding to RS#3, beam #5 corresponding to RS#7, beam #6 corresponding to RS#8, beam #7 corresponding to RS#6, and beam #8 corresponding to RS#5, then based on Table 1, the first indication information sent by the first device 102 can indicate the index of the mapping relationship, and the index of the mapping relationship is 2.

[0145] Exemplarily, the first indication information may also only indicate the RS index, that is, indicate the index of each of the first reference signals.

[0146] For example, the first indication information indicates that the index of the first RS signal includes 1, 2, ... 8. After receiving the information, the terminal 101 may determine the above mapping relationship based on a predefined manner.

[0147] In some embodiments, in order to save information resources, the first indication information may also be used to indicate a mapping relationship between an index of each beam in beam subset B and a corresponding first reference signal.

[0148] In one example, beam subset B is a subset of beam set A, and beam subset B includes some or all beams in beam set A. For example, if beam set A is {beam #1, beam #2, ..., beam #8}, beam subset B can be {beam #1, beam #2, beam #5}.

[0149] Exemplarily, the first indication information may clearly indicate the above mapping relationship.

[0150] Specifically, in one embodiment, the first indication information may directly indicate the index of each beam in the beam subset B, and the index of the first reference signal corresponding to each beam in the beam subset B.

[0151] For example, beam subset B may be {beam #1, beam #2, beam #5}, where a mapping relationship exists between beam #1 and RS #1, a mapping relationship exists between beam #2 and RS #2, and a mapping relationship exists between beam #5 and RS #5. That is, beam #1 is transmitted via RS #1, beam #2 is transmitted via RS #2, and beam #5 is transmitted via RS #5. The first indication information may directly indicate the above mapping relationship.

[0152] In another implementation, the first indication information may indicate an index of the mapping relationship.

[0153] The terminal 101 may determine the above mapping relationship according to the index of the mapping relationship. The index table of the mapping relationship is shown in Table 2, for example.

[0154] Table 2

[0155]

[0156] The difference between Table 2 and Table 1 is that the mapping relationship in Table 1 is the mapping relationship between each beam in beam set A and the first RS, and the mapping relationship in Table 2 may only include the mapping relationship between each beam in beam subset B and the first RS.

[0157] For example, assuming that the mapping relationship determined by the first device 102 is beam #1 corresponding to RS#1, beam #2 corresponding to RS#2, and beam #5 corresponding to RS#5, then based on Table 2, the first indication information sent by the first device 102 can indicate the index of the mapping relationship, and the index of the mapping relationship is 1.

[0158] In some embodiments, the terminal 101 receives the first indication information.

[0159] Step S2102: Terminal 101 determines the mapping relationship.

[0160] In some embodiments, when the first indication information directly indicates the above-mentioned mapping relationship, step S2102 may not be performed.

[0161] In some embodiments, the first indication information indicates an index of a mapping relationship, and the terminal 101 may determine the mapping relationship based on Table 1 or Table 2.

[0162] In some embodiments, the first indication information indicates the index of each first RS, and the terminal 101 can determine the mapping relationship based on a predefined method.

[0163] In one example, the beam index corresponding to the index of each RS can be agreed upon by the protocol. For example, the index of the first RS includes 1, 2, and 5, then the terminal 101 determines that beam #1 corresponds to RS #1, beam #2 corresponds to RS #2, and beam #5 corresponds to RS #5.

[0164] The above description is merely an exemplary description, and all solutions for determining the mapping relationship by the terminal 101 should fall within the scope of protection of this disclosure.

[0165] Step S2103: The first device 102 sends a first reference signal corresponding to each beam in the beam subset to the terminal 101.

[0166] In some embodiments, the first device 102 sends a first reference signal corresponding to each beam in the beam subset B to the terminal 101.

[0167] For example, beam subset B includes beam #1, beam #2 and beam #5, which correspond to RS#1, RS#2 and RS#5 respectively. The first device 102 sends beam #1 through RS#1, sends beam #2 through RS#2, and sends beam #5 through RS#5.

[0168] In some embodiments, terminal 101 receives a first reference signal corresponding to each beam of beam subset B.

[0169] In step S2104 , the terminal 101 measures each first reference signal to obtain a first measurement value.

[0170] In some embodiments, the first measurement value may be an RSRP value, specifically, an L1-RSRP value.

[0171] It is understandable that the first measurement value may also be a reference signal receiving quality (RSRQ) value, a signal to interference plus noise ratio (SINR) value, etc., which is not limited in the present disclosure.

[0172] In step S2105, the terminal 101 predicts the first measurement value corresponding to each beam in the beam set through the AI model.

[0173] In some embodiments, an AI model may be used for optimal beam prediction.

[0174] In some embodiments, the AI model may predict a first measurement value corresponding to each beam in beam set A. For example, the AI model may predict an RSRP value of each beam in beam set A.

[0175] In one example, the first measurement value corresponding to each beam in the set subset B measured by the terminal 101 can be used as the input value of the AI model to obtain the predicted RSRP value of each beam in the beam set A output by the AI model.

[0176] Step S2106 , the terminal 101 sends the first information to the first device 102 .

[0177] In some embodiments, the first information is information related to the first beam.

[0178] In an example, the first beam is a beam selected in beam set A in descending order of the predicted first measurement values.

[0179] For example, if the number of the first beam is 1, the terminal 101 uses the beam with the largest RSRP value as the first beam based on the RSRP value of each beam in the beam set A output by the AI model.

[0180] For another example, the number of first beams is K, where K is a positive integer greater than 1. The terminal 101 sorts the RSRP values of each beam in the beam set A output by the AI model in descending order, and selects the beams corresponding to the first K RSRP values as the K first beams.

[0181] The above is merely an exemplary description, and the present disclosure does not limit the prediction method of the AI model.

[0182] In some embodiments, the first information may include but is not limited to at least one of the following:

[0183] an index of each of said first beams;

[0184] an index of the first reference signal corresponding to each of the first beams;

[0185] The first measurement value corresponding to each of the first beams.

[0186] In an example, the first information may include indexes of 1 or K first beams, where K is a positive integer greater than 1.

[0187] Exemplarily, the first information may indicate the indexes of the K first beams in descending order of the first measurement values of the first beams.

[0188] For example, the number of first beams is 3, and the first measurement values correspond to first beam indexes 7, 5, and 1 from large to small, respectively. The first information may indicate 7, 5, and 1 in sequence.

[0189] In an example, the first information may include indices of first RSs corresponding to 1 or K first beams, respectively, where K is a positive integer greater than 1.

[0190] For example, the number of the first beam is 1, and the index of the first beam is 7, and the corresponding index of the first RS is 6, then the first information may include the index 6 of the first RS.

[0191] For another example, the number of first beams is 3, the indexes of the first beams are 7, 5, and 1 respectively, and the corresponding indexes of the first RSs are 6, 1, and 4 respectively. The first information may include the indexes 6, 1, and 4 of the first RSs.

[0192] Exemplarily, the first information may indicate the indexes of the K first RSs in descending order of the first measurement values.

[0193] In an example, the first information may be the first measurement value corresponding to each of the first beams.

[0194] For example, if the number of the first beam is 1 and the maximum value of the first measurement value is value #1, the first information may include value #1.

[0195] For another example, the number of first beams is 3, and the first three largest first measurement values are value #1, value #2, and value #3, respectively. Then the first information may include value #1, value #2, and value #3.

[0196] The above description is merely an example, and the present disclosure does not limit the content of the first information.

[0197] In some embodiments, the first device 102 receives the first information.

[0198] In some embodiments, the name of the first information is not limited and can be interchangeable with prediction result information, prediction information, etc.

[0199] Step S2107: the first device 102 changes the mapping relationship.

[0200] In some embodiments, after receiving the first information, the first device 102 may change the mapping relationship between each beam in the beam subset and the first reference signal.

[0201] For example, the previous mapping relationship is beam #1 to RS #1, beam #2 to RS #2, ..., beam #8 to RS #8. The changed mapping relationship can be beam #1 to RS #1, beam #2 to RS #4, beam #3 to RS #2, beam #4 to RS #3, beam #5 to RS #7, beam #6 to RS #8, beam #7 to RS #6, and beam #8 to RS #5.

[0202] Step S2108 : The first device 102 sends second indication information to the terminal 101 .

[0203] In some embodiments, the second indication information may be used to indicate an index of the second reference signal corresponding to each beam in the beam set A after the mapping relationship is changed.

[0204] In some embodiments, the first device 102 sends the second indication information based on the changed mapping relationship.

[0205] The first device 102 does not send the changed mapping relationship to the terminal 101, but only sends the index of the second reference signal to the terminal 101.

[0206] In some embodiments, the terminal 101 receives second indication information.

[0207] Step S2109: The first device 102 sends a second reference signal corresponding to each beam in the beam set to the terminal 101.

[0208] In some embodiments, the first device 102 sends each second reference signal based on the changed mapping relationship.

[0209] In some embodiments, the terminal 101 receives the second reference signal, where one second reference signal corresponds to one beam.

[0210] In some embodiments, the parameters such as transmission power and period of the second reference signal and the first reference signal may be the same or different, which is not limited in the present disclosure.

[0211] In step S2110 , the terminal 101 measures each of the second reference signals to obtain a second measurement value.

[0212] In some embodiments, the terminal needs to measure each second reference signal to obtain a second measurement value, such as an RSRP value.

[0213] For example, the second reference signal includes RS#1 to RS#8. Terminal 101 needs to measure each RS to obtain an RSRP value.

[0214] Step S2111 , the terminal 101 sends second information to the first device 102 .

[0215] In some embodiments, the second information is information related to a third reference signal.

[0216] The third reference signal is the second reference signal selected in descending order of the second measurement values.

[0217] In some embodiments, the second information may include, but is not limited to, at least one of the following:

[0218] an index of each of the third reference signals;

[0219] The second measurement value corresponding to each of the third reference signals.

[0220] Exemplarily, the second information may include indexes of 1 or K third reference signals.

[0221] Exemplarily, the second information may include 1 or K RSRP values corresponding to the third reference signal.

[0222] Exemplarily, the second information may include indexes of one or K third reference signals and RSRP values corresponding to one or K third reference signals.

[0223] In some embodiments, the first device 102 receives the second information.

[0224] In some embodiments, the name of the second information is not limited and can be interchangeable with measurement information, measurement result information, etc.

[0225] In step S2112, the first device 102 performs a performance test on the AI model on the terminal 101 based on the first information and the second information.

[0226] In some embodiments, the first information includes the index of each first beam, and the second information includes the index of each third reference signal. The first device 102 can determine the index of the second beam corresponding to the index of each third reference signal based on the changed mapping relationship.

[0227] Furthermore, if the index of the second beam is the same as the index of the first beam, the first count is increased by 1. The first count is the number of times the index of the second beam is the same as the index of the first beam, and the initial value of the first count is 0.

[0228] Furthermore, the first device 102 counts a first ratio of the first number to the total number.

[0229] When the first ratio is greater than or equal to the first value, it is determined that the performance test result of the AI model is passed.

[0230] When the first ratio is less than the first value, it is determined that the performance test result of the AI model is failed.

[0231] The first value may be agreed upon by a protocol or set by the first device 102 , which is not limited in this disclosure.

[0232] In some embodiments, the first information includes an index of the first reference signal corresponding to each of the first beams, and the second information includes an index of the third reference signal. The first device 102 can determine the index of the first beam corresponding to the index of each of the first reference signals based on the unchanged mapping relationship, and determine the index of the second beam corresponding to the index of each third reference signal based on the changed mapping relationship.

[0233] Furthermore, if the index of the second beam is the same as the index of the first beam, the first count is increased by 1. The first count is the number of times the index of the second beam is the same as the index of the first beam, and the initial value of the first count is 0.

[0234] Furthermore, the first device 102 counts a first ratio of the first number to the total number.

[0235] When the first ratio is greater than or equal to the first value, it is determined that the performance test result of the AI model is passed.

[0236] When the first ratio is less than the first value, it is determined that the performance test result of the AI model is failed.

[0237] The first value may be agreed upon by a protocol or set by the first device 102 , which is not limited in this disclosure.

[0238] In some embodiments, the first information includes the first measurement value corresponding to each of the first beams, and the second information includes the second measurement value corresponding to each of the third reference signals. The first device 102 may calculate the difference between the second measurement value and the corresponding first measurement value. If the difference is greater than or equal to the second value, a second number is incremented by 1. The second number is the number of times the difference is less than or equal to the second value. The initial value of the second number is 0.

[0239] Furthermore, the first device 102 counts a second ratio of the second number to the total number.

[0240] When the second ratio is greater than or equal to the second value, it is determined that the performance test result of the AI model is passed.

[0241] When the second ratio is less than the second value, it is determined that the performance test result of the AI model is failed.

[0242] The second value may be agreed upon by a protocol or set by the first device 102 , which is not limited in this disclosure.

[0243] The above is merely an exemplary description, and the present disclosure does not limit the method for performing AI model performance testing on the first device 102 .

[0244] In some embodiments, the names of information, etc. are not limited to the names described in the embodiments, and terms such as "information", "message", "signal", "signaling", "report", "configuration", "indication", "instruction", "command", "channel", "parameter", "domain", "field", "symbol", "symbol", "codeword", "codebook", "codeword", "codepoint", "bit", "data", "program", and "chip" can be used interchangeably.

[0245] In some embodiments, terms such as "moment", "time point", "time", and "time position" can be replaced with each other, and terms such as "duration", "period", "time window", "window", and "time" can be replaced with each other.

[0246] In some embodiments, "obtain", "get", "get", "receive", "transmit", "bidirectional transmission", "send and / or receive" can be interchangeable, and can be interpreted as receiving from other entities, obtaining from protocols, obtaining from higher layers, obtaining by self-processing, autonomous implementation, etc.

[0247] In some embodiments, terms such as "send", "transmit", "report", "download", "transmit", "bidirectional transmission", "send and / or receive" can be used interchangeably.

[0248] The information transmission method involved in the embodiment of the present disclosure may include at least one of steps S2101 to S2112. For example, step S2101 can be implemented as an independent embodiment, step S2102 can be implemented as an independent embodiment, steps S2101+S2102 can be implemented as an independent embodiment, step S2103 can be implemented as an independent embodiment, step S2104 can be implemented as an independent embodiment, steps S2103+S2104 can be implemented as an independent embodiment, steps S2101+S2103+S2104 can be implemented as an independent embodiment, step S2105 can be implemented as an independent embodiment, step S2106 can be implemented as an independent embodiment, and steps S2105+S2106 can be implemented as an independent embodiment. As independent embodiments, step S2107 can be implemented as an independent embodiment, step S2108 can be implemented as an independent embodiment, step S2109 can be implemented as an independent embodiment, steps S2107+S2108+S2109 can be implemented as independent embodiments, step S2110 can be implemented as an independent embodiment, step S2111 can be implemented as an independent embodiment, step S2110+S2111 can be implemented as an independent embodiment, step S2112 can be implemented as an independent embodiment, and steps S2101 to S2112 can be implemented as independent embodiments, but are not limited thereto.

[0249] In some embodiments, step S2102 is optional, and one or more of these steps may be omitted or replaced in different embodiments. For example, if the first indication information directly indicates the above mapping relationship, step S2102 may not be performed.

[0250] In some embodiments, step S2105 is optional, and one or more of these steps may be omitted or replaced in different embodiments. For example, if the AI model is not deployed on the terminal 101, step S2105 may not be performed.

[0251] In some embodiments, step S2112 is optional, and one or more of these steps may be omitted or replaced in different embodiments. For example, if another execution entity performs performance testing on the AI model on the terminal, step S2112 may not be performed.

[0252] In some embodiments, steps S2101 to S2112 are optional, and one or more of these steps may be omitted or replaced in different embodiments.

[0253] In some embodiments, the execution order of steps S2101 to S2112 is not limited.

[0254] In the above embodiment, when the first device sends the second reference signal corresponding to the beam set, the mapping relationship is changed, and the terminal cannot obtain the changed mapping relationship, so that the terminal needs to truthfully report the relevant information of the predicted first beam and the actual measurement results, thereby improving the reliability of AI-based beam management and high availability.

[0255] Figure 3A FIG. 1 is a flow chart of a performance testing method according to an embodiment of the present disclosure. Figure 3A As shown, the embodiment of the present disclosure relates to a performance testing method, which is executed by the terminal 101 and includes:

[0256] Step S3101: Obtain first indication information.

[0257] In some embodiments, the first indication information may be used to indicate a mapping relationship.

[0258] In an example, the mapping relationship may be a mapping relationship between each beam in the beam set and the first reference signal.

[0259] In an example, the mapping relationship may be a mapping relationship between each beam in the beam subset and the first reference signal.

[0260] In some embodiments, the terminal 101 may obtain the first indication information from the first device 102, but is not limited thereto. The terminal 101 may also receive the first indication information sent by other entities.

[0261] In some embodiments, the terminal 101 obtains first indication information specified by the protocol.

[0262] In some embodiments, the terminal 101 obtains the first indication information from an upper layer(s).

[0263] In some embodiments, the terminal 101 performs processing to obtain the first indication information.

[0264] In some embodiments, step S3101 is omitted, the terminal 101 autonomously implements the function indicated by the first indication information, or the terminal 101 obtains the first indication information based on predefined rules or protocol agreements, or the above function is default or default.

[0265] In some embodiments, the optional implementation of step S3101 can be found in Figure 2 Optional implementation of step S2101, and Figure 2 Other related parts in the embodiments involved will not be described in detail here.

[0266] Step S3102: Determine the mapping relationship.

[0267] In some embodiments, the optional implementation of step S3102 can be found in Figure 2 Optional implementation of step S2102, and Figure 2 Other related parts in the embodiments involved will not be described in detail here.

[0268] Step S3103: Acquire a first reference signal.

[0269] In some embodiments, terminal 101 obtains a first reference signal corresponding to each beam in the beam subset.

[0270] In some embodiments, the terminal 101 may obtain the first reference signal from the first device 102, but is not limited thereto. The terminal 101 may also receive a first reference signal sent by other entities.

[0271] In some embodiments, terminal 101 obtains a first reference signal specified by a protocol.

[0272] In some embodiments, terminal 101 obtains the first reference signal from an upper layer(s).

[0273] In some embodiments, terminal 101 performs processing to obtain a first reference signal.

[0274] In some embodiments, step S3103 is omitted, the terminal 101 autonomously implements the function indicated by the first reference signal, or the terminal 101 obtains the first reference signal based on predefined rules or protocol agreements, or the above functions are default or acquiescent.

[0275] In some embodiments, the optional implementation of step S3103 can be found in Figure 2 Optional implementation of step S2103, and Figure 2 Other related parts in the embodiments involved will not be described in detail here.

[0276] Step S3104: determine a first measurement value.

[0277] In some embodiments, the optional implementation of step S3104 can be found in Figure 2 Optional implementation of step S2104, and Figure 2 Other related parts in the embodiments involved will not be described in detail here.

[0278] Step S3105: predict the first measurement value.

[0279] In some embodiments, the optional implementation of step S3105 can be found in Figure 2 Optional implementation of step S2105, and Figure 2 Other related parts in the embodiments involved will not be described in detail here.

[0280] Step S3106, sending the first information.

[0281] In some embodiments, the first information is information related to the first beam.

[0282] In an example, the first beam is a beam selected in beam set A in descending order of the predicted first measurement values.

[0283] In some embodiments, the terminal 101 sends first information to the first device 102 .

[0284] In some embodiments, the first device 102 receives the first information.

[0285] In some embodiments, the optional implementation of step S3106 can be found in Figure 2 Optional implementation of step S2106, and Figure 2 Other related parts in the embodiments involved will not be described in detail here.

[0286] Step S3107: Obtain second indication information.

[0287] In some embodiments, the second indication information may be used to indicate an index of the second reference signal corresponding to each beam in the beam set A after the mapping relationship is changed.

[0288] In some embodiments, the terminal 101 may obtain the second indication information from the first device 102, but is not limited thereto. The terminal 101 may also receive the second indication information sent by other entities.

[0289] In some embodiments, the terminal 101 obtains second indication information specified by the protocol.

[0290] In some embodiments, the terminal 101 obtains the second indication information from an upper layer(s).

[0291] In some embodiments, the terminal 101 performs processing to obtain the second indication information.

[0292] In some embodiments, step S3107 is omitted, the terminal 101 autonomously implements the function indicated by the second indication information, or the terminal 101 obtains the second indication information based on predefined rules or protocol agreements, or the above function is default or default.

[0293] In some embodiments, the optional implementation of step S3107 can be found in Figure 2 Optional implementation of step S2108, and Figure 2 Other related parts in the embodiments involved will not be described in detail here.

[0294] Step S3108: Acquire a second reference signal.

[0295] In some embodiments, terminal 101 obtains a second reference signal corresponding to each beam in the beam set.

[0296] In some embodiments, the terminal 101 may obtain the second reference signal from the first device 102, but is not limited thereto. The terminal 101 may also receive a second reference signal sent by other entities.

[0297] In some embodiments, terminal 101 obtains a second reference signal specified by the protocol.

[0298] In some embodiments, terminal 101 obtains the second reference signal from upper layer(s).

[0299] In some embodiments, terminal 101 performs processing to obtain the second reference signal.

[0300] In some embodiments, step S3108 is omitted, and the terminal 101 autonomously implements the function indicated by the second reference signal, or the terminal 101 obtains the second reference signal based on predefined rules or protocol agreements, or the above functions are default or acquiescent.

[0301] In some embodiments, the optional implementation of step S3108 can be found in Figure 2 Optional implementation of step S2109, and Figure 2 Other related parts in the embodiments involved will not be described in detail here.

[0302] Step S3109: determine the second measurement value.

[0303] In some embodiments, the optional implementation of step S3109 can be found in Figure 2 Optional implementation of step S2110, and Figure 2 Other related parts in the embodiments involved will not be described in detail here.

[0304] Step S3110, sending the second information.

[0305] In some embodiments, the second information is information related to a third reference signal.

[0306] The third reference signal is the second reference signal selected in descending order of the second measurement values.

[0307] In some embodiments, the terminal 101 sends second information to the first device 102 .

[0308] In some embodiments, the first device 102 receives the second information.

[0309] In some embodiments, the optional implementation of step S3110 can be found in Figure 2 Optional implementation of step S2111, and Figure 2 Other related parts in the embodiments involved will not be described in detail here.

[0310] In some embodiments, steps S3101 to S3111 are optional, and one or more of these steps may be omitted or replaced in different embodiments.

[0311] In some embodiments, the execution order of steps S3101 to S3111 is not limited.

[0312] In the above embodiment, the terminal cannot obtain the changed mapping relationship, so the terminal needs to truthfully report the relevant information of the predicted first beam and the actual measurement results, which improves the reliability of AI-based beam management and has high availability.

[0313] Figure 3B FIG. 1 is a flow chart of a performance testing method according to an embodiment of the present disclosure. Figure 3B As shown, the embodiment of the present disclosure relates to a performance testing method, which is executed by the terminal 101 and includes:

[0314] Step S3201: Acquire first indication information and a first reference signal.

[0315] In some embodiments, the optional implementation of step S3201 can be found in Figure 2Optional implementation of step S2101 and step S2103, and Figure 2 Other related parts in the embodiments involved will not be described in detail here.

[0316] Step S3202: predict a first measurement value.

[0317] In some embodiments, the optional implementation of step S3202 can be found in Figure 2 Optional implementations of step S2104 and step S2105, and Figure 2 Other related parts in the embodiments involved will not be described in detail here.

[0318] Step S3203, sending the first information.

[0319] In some embodiments, the optional implementation of step S3203 can be found in Figure 2 Optional implementation of step S2106, and Figure 2 Other related parts in the embodiments involved will not be described in detail here.

[0320] Step S3204: Acquire second indication information and a second reference signal.

[0321] In some embodiments, the optional implementation of step S3204 can be found in Figure 2 Optional implementations of step S2108 and step S2109, and Figure 2 Other related parts in the embodiments involved will not be described in detail here.

[0322] Step S3205, sending the second information.

[0323] In some embodiments, the optional implementation of step S3205 can be found in Figure 2 Optional implementations of step S2110 and step S2111, and Figure 2 Other related parts in the embodiments involved will not be described in detail here.

[0324] In some embodiments, steps S3201 to S3205 are optional, and one or more of these steps may be omitted or replaced in different embodiments.

[0325] In some embodiments, the execution order of steps S3201 to S3205 is not limited.

[0326] In the above embodiment, the terminal cannot obtain the changed mapping relationship, so the terminal needs to truthfully report the relevant information of the predicted first beam and the actual measurement results, which improves the reliability of AI-based beam management and has high availability.

[0327] Figure 3C FIG. 1 is a flow chart of a performance testing method according to an embodiment of the present disclosure. Figure 3C As shown, the embodiment of the present disclosure relates to a performance testing method, which is executed by the first device 102 and includes:

[0328] Step S3301: Send first indication information.

[0329] In some embodiments, the first indication information may be used to indicate a mapping relationship.

[0330] In an example, the mapping relationship may be a mapping relationship between each beam in the beam set and the first reference signal.

[0331] In an example, the mapping relationship may be a mapping relationship between each beam in the beam subset and the first reference signal.

[0332] In some embodiments, the first device 102 sends first indication information to the terminal 101.

[0333] In some embodiments, the terminal 101 receives first indication information.

[0334] In some embodiments, the optional implementation of step S3301 can be found in Figure 2 Optional implementation of step S2101, and Figure 2 Other related parts in the embodiments involved will not be described in detail here.

[0335] Step S3302: Send a first reference signal.

[0336] In some embodiments, the first device 102 transmits a first reference signal corresponding to each beam in the beam subset.

[0337] In some embodiments, the first device 102 sends a first reference signal to the terminal 101 .

[0338] In some embodiments, terminal 101 receives a first reference signal.

[0339] In some embodiments, the optional implementation of step S3302 can be found in Figure 2 Optional implementation of step S2103, and Figure 2 Other related parts in the embodiments involved will not be described in detail here.

[0340] Step S3303, obtain first information.

[0341] In some embodiments, the first information is information related to the first beam.

[0342] In an example, the first beam is a beam selected in beam set A in descending order of the predicted first measurement values.

[0343] In some embodiments, the first device 102 may obtain the first information from the terminal 101, but is not limited thereto. The first device 102 may also receive the first information sent by other entities.

[0344] In some embodiments, the first device 102 obtains first information specified by a protocol.

[0345] In some embodiments, the first device 102 obtains the first information from an upper layer(s).

[0346] In some embodiments, the first device 102 performs processing to obtain the first information.

[0347] In some embodiments, step S3303 is omitted, the first device 102 autonomously implements the function indicated by the first information, or the first device 102 obtains the first information based on predefined rules or protocol agreements, or the above function is default or default.

[0348] In some embodiments, the optional implementation of step S3303 can be found in Figure 2 Optional implementation of step S2106, and Figure 2 Other related parts in the embodiments involved will not be described in detail here.

[0349] Step S3304, change the mapping relationship.

[0350] In some embodiments, the optional implementation of step S3304 can be found in Figure 2 Optional implementation of step S2107, and Figure 2 Other related parts in the embodiments involved will not be described in detail here.

[0351] Step S3305: Send the second indication information.

[0352] In some embodiments, the second indication information may be used to indicate an index of the second reference signal corresponding to each beam in the beam set A after the mapping relationship is changed.

[0353] In some embodiments, the first device 102 sends second indication information to the terminal 101.

[0354] In some embodiments, the terminal 101 receives second indication information.

[0355] In some embodiments, the optional implementation of step S3304 can be found in Figure 2 Optional implementation of step S2108, and Figure 2 Other related parts in the embodiments involved will not be described in detail here.

[0356] Step S3306: Send a second reference signal.

[0357] In some embodiments, the first device 102 transmits a second reference signal corresponding to each beam in the beam set.

[0358] In some embodiments, the first device 102 sends a second reference signal to the terminal 101 .

[0359] In some embodiments, terminal 101 receives a second reference signal.

[0360] In some embodiments, the optional implementation of step S3306 can be found in Figure 2 Optional implementation of step S2109, and Figure 2 Other related parts in the embodiments involved will not be described in detail here.

[0361] Step S3307, obtain the second information.

[0362] In some embodiments, the second information is information related to a third reference signal.

[0363] The third reference signal is the second reference signal selected in descending order of the second measurement values.

[0364] In some embodiments, the first device 102 may obtain the second information from the terminal 101, but is not limited thereto. The first device 102 may also receive the second information sent by other entities.

[0365] In some embodiments, the first device 102 obtains second information specified by the protocol.

[0366] In some embodiments, the first device 102 obtains the second information from an upper layer(s).

[0367] In some embodiments, the first device 102 performs processing to obtain the second information.

[0368] In some embodiments, step S3307 is omitted, the first device 102 autonomously implements the function indicated by the second information, or the first device 102 obtains the second information based on predefined rules or protocol agreements, or the above function is default or default.

[0369] In some embodiments, the optional implementation of step S3307 can be found in Figure 2 Optional implementation of step S2111, and Figure 2 Other related parts in the embodiments involved will not be described in detail here.

[0370] Step S3308, perform performance testing.

[0371] In some embodiments, the optional implementation of step S3308 can be found in Figure 2 Optional implementation of step S2112, and Figure 2 Other related parts in the embodiments involved will not be described in detail here.

[0372] In some embodiments, steps S3301 to S3308 are optional, and one or more of these steps may be omitted or replaced in different embodiments.

[0373] In some embodiments, the execution order of steps S3301 to S3308 is not limited.

[0374] In the above embodiment, the first device will not send the changed mapping relationship to the terminal, so that the terminal needs to truthfully report the relevant information of the predicted first beam and the actual measurement results, thereby improving the reliability of AI-based beam management and high availability.

[0375] Figure 3D FIG. 1 is a flow chart of a performance testing method according to an embodiment of the present disclosure. Figure 3D As shown, the embodiment of the present disclosure relates to a performance testing method, which is executed by the first device 102 and includes:

[0376] Step S3401: Send first indication information and a first reference signal.

[0377] In some embodiments, the first device 102 sends first indication information and a first reference signal to the terminal 101.

[0378] In some embodiments, the terminal 101 receives first indication information and a first reference signal.

[0379] In some embodiments, the optional implementation of step S3401 can be found in Figure 2 Optional implementation of step S2101 and step S2103, and Figure 2 Other related parts in the embodiments involved will not be described in detail here.

[0380] Step S3402, obtaining first information.

[0381] In some embodiments, the optional implementation of step S3402 can be found in Figure 2 Optional implementation of step S2106, and Figure 2 Other related parts in the embodiments involved will not be described in detail here.

[0382] Step S3403: Send second indication information and a second reference signal.

[0383] In some embodiments, the first device 102 sends second indication information and a second reference signal to the terminal 101.

[0384] In some embodiments, the terminal 101 receives the second indication information and the second reference signal.

[0385] In some embodiments, the optional implementation of step S3403 can be found in Figure 2 Optional implementations of step S2108 and step S2109, and Figure 2 Other related parts in the embodiments involved will not be described in detail here.

[0386] Step S3404, obtaining the second information.

[0387] In some embodiments, the optional implementation of step S3404 can be found in Figure 2 Optional implementation of step S2111, and Figure 2 Other related parts in the embodiments involved will not be described in detail here.

[0388] Step S3405: perform performance measurement.

[0389] In some embodiments, the optional implementation of step S3405 can be found in Figure 2 Optional implementation of step S2112, and Figure 2 Other related parts in the embodiments involved will not be described in detail here.

[0390] In some embodiments, steps S3401 to S3405 are optional, and one or more of these steps may be omitted or replaced in different embodiments.

[0391] In some embodiments, the execution order of steps S3401 to S3405 is not limited.

[0392] In the above embodiment, the first device will not send the changed mapping relationship to the terminal, so that the terminal needs to truthfully report the relevant information of the predicted first beam and the actual measurement results, thereby improving the reliability of AI-based beam management and high availability.

[0393] The above process is further illustrated below with examples.

[0394] 1. AI-based T1 and T2 beam management reporting

[0395] During time T1, the TE (the same device as the first device) transmits multiple RSs corresponding to multiple beams in beam set B, where set B is a subset of set A. The terminal measures the L1-RSRP of beam set B and predicts the best beam in set A.

[0396] - Option 1: The terminal reports the RS index corresponding to 1 or K best beams to the TE.

[0397] - Option 2: The terminal reports the L1-RSRP corresponding to one or K best beams to the TE.

[0398] - Option 3: The terminal reports the RS index and L1-RSRP corresponding to 1 or K best beams to the TE.

[0399] During T2, the TE transmits multiple RSs corresponding to multiple beams in beam set A. The terminal measures the L1-RSRP of all beams in set A and uses the measured L1-RSRP as a reference. The terminal then reports. There are several options:

[0400] - Option 1: The terminal reports the RS index corresponding to the largest one or K L1-RSRPs.

[0401] - Option 2: The terminal reports 1 or K best beams based on the RS index and the corresponding L1-RSRP.

[0402] - Option 3: The terminal reports the L1-RSRP of all RS indices.

[0403] 2. Mapping between beam indices in set A and set B

[0404] - Option 1, explicitly provide a set of beam indices for set B.

[0405] For example, assume that there are 8 beams in set A and 3 beams are selected for set B. For example, {beam #1, beam #2, beam #5} or {beam #3, beam #5, beam #8}.

[0406] - Option 2, implicitly providing beam indices for set B by defining a mapping table.

[0407] For example, if there are 8 beams, the mapping table requires a total of 3 bits. It is also possible to define a reduced number of bits by considering only some of the cases.

[0408] 3. Mapping between RS index and beam index.

[0409] Each beam will be transmitted by one RS. This means that the TE will send different RSs through different beams. There is a mapping between beam index and RS index.

[0410] There are two options for beam index and RS index:

[0411] - Option A, the mapping between beam index and RS index is explicit.

[0412] Option A-1: Both the beam index and the RS index are explicitly indicated to the terminal, and there is a one-to-one mapping relationship between the two indexes.

[0413] For example, the beam index is {beam #1, beam #4, beam #8}. The RS index is {RS #1, RS #2, RS #3}. Beam #1 will be transmitted on RS #1, and beam #4 will be transmitted on RS #2.

[0414] Option A-2, explicitly indicating the RS index and beam RS mapping format index to the terminal.

[0415] For example, the RS index is {RS#1, RS#2, RS#3}. The beam RS mapping format is #1. Mapping index #1 means {beam#1, beam#5, beam#8} will be transmitted on {RS#1, RS#2, RS#3}. Mapping index #2 means {beam#2, beam#6, beam#8} will be transmitted on {RS#1, RS#2, RS#3}.

[0416] - Option B, only indicates the RS index to the terminal.

[0417] There is an implicit relationship between the beam index and the RS index.

[0418] For example, the RS index and the beam index are aligned. For example, beam #1 will be transmitted on RS #1, and beam #4 will be transmitted on RS #4.

[0419] 4. Performance testing process, for example Figure 4A As shown, the following steps are included:

[0420] Step S4101: For T1, the TE indicates the RS index and beam index to the terminal. Alternatively, the TE indicates the RS index and beam RS mapping format index to the terminal. The TE also indicates the beam pattern between set B and set A to the terminal.

[0421] Among them, the mapping relationship between the beam index and the RS index is as follows: Figure 4B shown.

[0422] In step S4102, the terminal performs L1-RSRP measurements on RS#1, RS#4, and RS#8 respectively.

[0423] The terminal can know the L1-RSRP of beam #1, beam #4 and beam #8, for example Figure 4C shown.

[0424] Step S4103: The terminal predicts the best beam in set A based on the L1-RSRP of the beam in set B.

[0425] In step S4104, the terminal reports the best beam index or RS index, or L1-RSRP to the TE.

[0426] Step S4105: For T2, the TE retransmits all beams in Set A on all RSs. The TE configures the terminal to measure the L1-RSRP of the indicated RS index and report the best beam RS index. The TE changes the mapping between RS index and beam index.

[0427] For example Figure 4D As shown in Figure 1, to verify whether the terminal reports the correct best beam index, in T2, the TE will retransmit all beams in set A on all RSs. The terminal will measure the L1-RSRP of all RSs and sort the L1-RSRP. The terminal will then report the best RS index to the TE.

[0428] For T2, only the RS index will be indicated to the terminal, and the TE will change the mapping relationship between the RS index and the beam index. For example, the RS index is {RS#1, RS#2, RS#3, RS#4, RS#5, RS#6, RS#7, RS#8}. The beam index is changed to {beam#5, beam#6, beam#7, beam#8, beam#1, beam#2, beam#3, beam#4}, and the mapping relationship is as follows: Figure 4C shown.

[0429] This means that beam #5 will be transmitted on RS #1, beam #6 will be transmitted on RS #2, beam #7 will be transmitted on RS #3, and so on.

[0430] Therefore, the terminal does not know which beam is transmitted on which RS. The terminal will honestly measure the L1-RSRP of all RS indices. It allows the terminal to report truthfully. If the mapping relationship does not change, the terminal can easily pass the test for the reasons explained before. Suppose that in T1, the best predicted RS index reported by the terminal is 7. And in T2, after measuring all RSs, the terminal finds that the best beam is in RS 6. However, the terminal can only report to the TE that the best measured RS index is 7. Therefore, in T2, the mapping of beam index and RS index will be different from T1.

[0431] Step S4106: The terminal measures all RSs and ranks L1-RSRPs, and reports the best RS index and / or L1-RSRP.

[0432] In step S4107, the TE calculates the corresponding optimal measurement beam index based on the mapping between RS metrics and beam indices. The TE compares the optimal measurement beam index reported in T2 with the optimal predicted beam index reported in T1. If they are equal, the prediction is correct. If the terminal reported L1-RSRP in step S4104, the TE may also compare the L1-RSRP between the two steps in step S4107.

[0433] Step S4108: Repeat the test multiple times. If the prediction result is correct in 90% of cases, or the L1-RSRP increment between two steps is less than the 90% threshold, the AI model on the terminal can pass the test.

[0434] The embodiments of the present disclosure further provide an apparatus for implementing any of the above methods. For example, an apparatus is provided that includes units or modules for implementing each step performed by a terminal in any of the above methods. For another example, another apparatus is provided that includes units or modules for implementing each step performed by a network device in any of the above methods.

[0435] It should be understood that the division of the various units or modules in the above device is only a division of logical functions. In actual implementation, they can be fully or partially integrated into a physical entity, or they can be physically separated. In addition, the units or modules in the device can be implemented in the form of a processor calling software: for example, the device includes a processor, the processor is connected to a memory, and the memory stores instructions. The processor calls the instructions stored in the memory to implement any of the above methods or implement the functions of the various units or modules of the above device, wherein the processor is, for example, a general-purpose processor, such as a central processing unit (CPU) or a microprocessor, and the memory is a memory within the device or a memory outside the device. Alternatively, the units or modules in the device can be implemented in the form of hardware circuits, and the functions of some or all of the units or modules can be realized by designing the hardware circuits. The above-mentioned hardware circuits can be understood as one or more processors; for example, in one implementation, the above-mentioned hardware circuit is an application-specific integrated circuit (ASIC), and the functions of some or all of the above units or modules are realized by designing the logical relationship of the components in the circuit; for example, in another implementation, the above-mentioned hardware circuit can be realized by a programmable logic device (PLD). Taking a field programmable gate array (FPGA) as an example, it can include a large number of logic gate circuits, and the connection relationship between the logic gate circuits is configured by a configuration file, thereby realizing the functions of some or all of the above units or modules. All units or modules of the above devices can be realized in the form of software called by the processor, or in the form of hardware circuits, or in part by software called by the processor, and the rest by hardware circuits.

[0436] In the embodiments of the present disclosure, the processor is a circuit with signal processing capabilities. In one implementation, the processor can be a circuit with instruction reading and execution capabilities, such as a central processing unit (CPU), a microprocessor, a graphics processing unit (GPU) (which can be understood as a microprocessor), or a digital signal processor (DSP). In another implementation, the processor can implement certain functions through the logical relationship of a hardware circuit. The logical relationship of the above-mentioned hardware circuit is fixed or reconfigurable. For example, the processor is a hardware circuit implemented by an application-specific integrated circuit (ASIC) or a programmable logic device (PLD), such as an FPGA. In a reconfigurable hardware circuit, the process of the processor loading a configuration document to implement the hardware circuit configuration can be understood as the process of the processor loading instructions to implement the functions of some or all of the above units or modules. In addition, it can also be a hardware circuit designed for artificial intelligence, which can be understood as ASIC, such as a neural network processing unit (NPU), a tensor processing unit (TPU), a deep learning processing unit (DPU), etc.

[0437] Figure 5A This is a schematic diagram of the structure of the terminal proposed in the embodiment of the present disclosure. Figure 5A As shown, the terminal 5100 may include: a transceiver module 5101 and a processing module 5102.

[0438] In some embodiments, the above-mentioned transceiver module 5101 is configured to receive first indication information sent by a first device, and a first reference signal corresponding to each beam in a beam subset; wherein the first indication information is used to indicate a mapping relationship, and the mapping relationship is a mapping relationship between each beam in the beam set and the first reference signal.

[0439] In some embodiments, the processing module 5102 is configured to measure the first reference signal corresponding to each beam in the beam subset, and based on the obtained first measurement value, predict the first measurement value corresponding to each beam in the beam set through an artificial intelligence AI model.

[0440] In some embodiments, the above-mentioned transceiver module 5101 is also configured to send first information to the first device; wherein, the first information is information related to the first beam; wherein, the first beam is a beam selected in the beam set in descending order according to the first measurement values predicted by the AI model; receive the second indication information sent by the first device based on the changed mapping relationship, and the second reference signal corresponding to each beam in the beam set; wherein, the second indication information is used to indicate the index of each second reference signal; measure each second reference signal, and send second information to the first device based on the obtained second measurement value; wherein, the second information is information related to the third reference signal, and the third reference signal is the second reference signal selected in descending order according to the second measurement value.

[0441] Optionally, the above-mentioned transceiver module 5101 is used to execute at least one of the communication steps such as sending and / or receiving performed by the terminal 5100 in any of the above methods (for example, step S2101, step S2103, step S2106, step S2108, step S2109, step S2111, but not limited to these), which will not be repeated here.

[0442] Optionally, the above-mentioned processing module 5102 is used to execute at least one of the other communication steps (such as step S2102, step S2104, step S2105, step S2110, but not limited to these) performed by the terminal 5100 in any of the above methods, which will not be repeated here.

[0443] Figure 5B Schematic diagram of the structure of the first device proposed in the embodiment of the present disclosure. Figure 5B As shown, the first device 5200 may include: a transceiver module 5201 and a processing module 5202.

[0444] In some embodiments, the above-mentioned transceiver module 5201 is configured to send first indication information and a first reference signal corresponding to each beam in the beam subset; wherein the first indication information is used to indicate a mapping relationship, and the mapping relationship is a mapping relationship between each beam in the beam set and the first reference signal.

[0445] In some embodiments, the above-mentioned transceiver module 5201 is also configured to receive first information; wherein, the first information is information related to the first beam; wherein, the first beam is the beam selected in descending order by the first measurement value predicted by the artificial intelligence AI model in the beam set by the terminal; based on the changed mapping relationship, send second indication information and a second reference signal corresponding to each beam in the beam set; wherein, the second indication information is used to indicate the index of each second reference signal; receive second information; wherein, the second information is information related to the third reference signal, and the third reference signal is the second measurement value obtained by the terminal measuring each second reference signal, and the second reference signal is selected in descending order.

[0446] In some embodiments, the processing module 5202 is configured to perform a performance test on the AI model on the terminal based on the first information and the second information.

[0447] Optionally, the above-mentioned transceiver module 5201 is used to execute at least one of the sending and / or receiving communication steps (for example, step S2101, step S2103, step S2106, step S2108, step S2109, step S2111, but not limited to these) performed by the first device 5200 in any of the above methods, which will not be repeated here.

[0448] Optionally, the processing module 5202 is used to execute at least one of the other steps (such as step S2107 and step S2112, but not limited thereto) performed by the first device 5200 in any of the above methods, which will not be repeated here.

[0449] In some embodiments, the sending module and / or the receiving module may be referred to as a transceiver module, and the sending module and the receiving module may be separate or integrated. Optionally, the transceiver module may be interchangeable with the transceiver.

[0450] In some embodiments, the processing module can be a single module or can include multiple submodules. Optionally, the multiple submodules respectively execute all or part of the steps required to be executed by the processing module. Optionally, the processing module can be interchangeable with the processor.

[0451] Figure 6A6 is a schematic diagram of the structure of a communication device 6100 proposed in an embodiment of the present disclosure. Communication device 6100 can be a terminal (e.g., user equipment, vehicle, IoT device, etc.) or a first device (e.g., test equipment, access network equipment, core network equipment, etc.). It can also be a chip, chip system, or processor that supports a terminal implementing any of the above methods. It can also be a chip, chip system, or processor that supports a network device implementing any of the above methods. Communication device 6100 can be used to implement the methods described in the above method embodiments. For details, please refer to the description of the above method embodiments.

[0452] like Figure 6A As shown, the communication device 6100 includes one or more processors 6101. The processor 6101 can be a general-purpose processor or a dedicated processor, for example, a baseband processor or a central processing unit. The baseband processor can be used to process the communication protocol and communication data, and the central processing unit can be used to control the communication device (such as test equipment, base station, baseband chip, terminal equipment, terminal equipment chip, DU or CU, etc.), execute programs, and process program data. Optionally, the communication device 6100 is used to perform any of the above methods. Optionally, one or more processors 6101 are used to call instructions to enable the communication device 6100 to perform any of the above methods.

[0453] In some embodiments, the communication device 6100 further includes one or more transceivers 6102. When the communication device 6100 includes one or more transceivers 6102, the transceiver 6102 performs at least one of the communication steps (e.g., steps S2101, S2103, S2106, S2108, S2109, and S2111, but not limited thereto) of sending and / or receiving in the above method, and the processor 6101 performs at least one of the other steps (e.g., steps S2102, S2104, S2105, S2107, S2110, and S2112, but not limited thereto). In alternative embodiments, the transceiver may include a receiver and / or a transmitter, and the receiver and transmitter may be separate or integrated. Optionally, terms such as transceiver, transceiver unit, transceiver, transceiver circuit, interface circuit, and interface can be replaced with each other, terms such as transmitter, transmitting unit, transmitter, and transmitting circuit can be replaced with each other, and terms such as receiver, receiving unit, receiver, and receiving circuit can be replaced with each other.

[0454] In some embodiments, the communication device 6100 further includes one or more memories 6103 for storing data. Alternatively, all or part of the memories 6103 may be located outside the communication device 6100. In alternative embodiments, the communication device 6100 may include one or more interface circuits 6104. Optionally, the interface circuits 6104 are connected to the memories 6103 and may be configured to receive data from the memories 6103 or other devices, or to send data to the memories 6103 or other devices. For example, the interface circuits 6104 may read data stored in the memories 6103 and send the data to the processor 6101.

[0455] The communication device 6100 described in the above embodiment may be a network device or a terminal, but the scope of the communication device 6100 described in the present disclosure is not limited thereto, and the structure of the communication device 6100 may not be limited thereto. Figure 6A The communication device may be an independent device or a part of a larger device. For example, the communication device may be: 1) an independent integrated circuit IC, or a chip, or a chip system or subsystem; (2) a collection of one or more ICs, optionally, the above IC collection may also include a storage component for storing data and programs; (3) an ASIC, such as a modem; (4) a module that can be embedded in other devices; (5) a receiver, a terminal device, an intelligent terminal device, a cellular phone, a wireless device, a handheld device, a mobile unit, an in-vehicle device, a network device, a cloud device, an artificial intelligence device, etc.; (6) others, etc.

[0456] Figure 6B 6200 is a schematic diagram of the structure of the chip 6200 proposed in the embodiment of the present disclosure. For the case where the communication device 6100 can be a chip or a chip system, please refer to Figure 6B The structure diagram of the chip 6200 is shown, but is not limited to this.

[0457] The chip 6200 includes one or more processors 6201. The chip 6200 is configured to execute any of the above methods.

[0458] In some embodiments, chip 6200 further includes one or more interface circuits 6202. Terms such as interface circuit, interface, and transceiver pins may be used interchangeably. In some embodiments, chip 6200 further includes one or more memories 6203 for storing data. Alternatively, all or part of memory 6203 may be located external to chip 6200. Optionally, interface circuit 6202 is connected to memory 6203 and may be used to receive data from memory 6203 or other devices, or may be used to send data to memory 6203 or other devices. For example, interface circuit 6202 may read data stored in memory 6203 and send the data to processor 6201.

[0459] In some embodiments, the interface circuit 6202 performs at least one of the communication steps (e.g., steps S2101, S2103, S2106, S2108, S2109, and S2111) of the aforementioned method. The interface circuit 6202 performing the communication steps (e.g., steps S2101, S2103, S2106, S2108, S2109, and S2111) of the aforementioned method, for example, means that the interface circuit 6202 performs data exchange between the processor 6201, the chip 6200, the memory 6203, or the transceiver device. In some embodiments, the processor 6201 performs at least one of the other steps (e.g., steps S2102, S2104, S2105, S2107, S2110, and S2112, but not limited thereto).

[0460] The modules and / or devices described in various embodiments, such as virtual devices, physical devices, and chips, can be arbitrarily combined or separated according to circumstances. Optionally, some or all steps can also be performed collaboratively by multiple modules and / or devices, which is not limited here.

[0461] The present disclosure also proposes a storage medium having instructions stored thereon. When the instructions are executed on the communication device 6100, the communication device 6100 executes any of the above methods. Optionally, the storage medium is an electronic storage medium. Optionally, the storage medium is a computer-readable storage medium, but is not limited thereto and may also be a storage medium readable by other devices. Optionally, the storage medium may be a non-transitory storage medium, but is not limited thereto and may also be a transient storage medium.

[0462] The present disclosure also provides a program product, which, when executed by the communication device 6100, enables the communication device 6100 to perform any of the above methods. Optionally, the program product is a computer program product.

[0463] The present disclosure also proposes a computer program, which, when executed on a computer, causes the computer to perform any one of the above methods.

[0464] Other embodiments of the present disclosure will readily occur to those skilled in the art after considering the specification and practicing the invention disclosed herein. This disclosure is intended to cover any variations, uses, or adaptations of the present disclosure that follow the general principles of the present disclosure and include common knowledge or customary techniques in the art not disclosed herein. The description and examples are to be considered as exemplary only, with the true scope and spirit of the present disclosure being indicated by the following claims.

[0465] It should be understood that the present disclosure is not limited to the exact structures that have been described above and shown in the drawings, and that various modifications and changes can be made without departing from the scope thereof. The scope of the present disclosure is limited only by the appended claims.

Claims

1. A performance testing method, characterized in that: The method is executed by a terminal, and includes: receiving first indication information sent by a first device and a first reference signal corresponding to each beam in a beam subset, wherein the first indication information is used to indicate a mapping relationship, where the mapping relationship is a mapping relationship between each beam in the beam set and the first reference signal; measuring the first reference signal corresponding to each beam in the beam subset, and predicting, based on the obtained first measurement value, the first measurement value corresponding to each beam in the beam set using an artificial intelligence (AI) model; Sending first information to the first device; wherein the first information is information related to a first beam; wherein the first beam is a beam selected in descending order of the first measurement values predicted by the AI model within the beam set; receiving second indication information sent by the first device based on the changed mapping relationship, and a second reference signal corresponding to each beam in the beam set; wherein the second indication information is used to indicate an index of each second reference signal; Measure each of the second reference signals and send second information to the first device based on the obtained second measurement value; wherein the second information is information related to a third reference signal, and the third reference signal is the second reference signal selected in descending order of the second measurement value.

2. The method according to claim 1, characterized in that The first indication information is used to indicate at least one of the following: an index of each beam in the beam set, and an index of the first reference signal corresponding to each beam in the beam set; an index of each of said first reference signals; The index of the mapping relationship.

3. The method according to claim 2, characterized in that The method further comprises any of the following: Determining the mapping relationship based on the index of the mapping relationship; The mapping relationship is determined based on a predefined manner and an index of each first reference signal.

4. The method according to any one of claims 1 to 3, characterized in that The first information includes at least one of the following: an index of each of said first beams; an index of the first reference signal corresponding to each of the first beams; The first measurement value corresponding to each of the first beams.

5. The method according to any one of claims 1 to 4, characterized in that The second information includes at least one of the following: an index of each of the third reference signals; The second measurement value corresponding to each of the third reference signals.

6. A performance testing method, characterized in that: The method is performed by a first device, and includes: Sending first indication information and a first reference signal corresponding to each beam in the beam subset; wherein the first indication information is used to indicate a mapping relationship, and the mapping relationship is a mapping relationship between each beam in the beam set and the first reference signal; Receive first information; wherein the first information is information related to a first beam; wherein the first beam is a beam selected by the terminal in the beam set according to the first measurement value predicted by the artificial intelligence (AI) model in descending order; Based on the changed mapping relationship, sending second indication information and a second reference signal corresponding to each beam in the beam set; wherein the second indication information is used to indicate an index of each second reference signal; receiving second information; wherein the second information is information related to a third reference signal, the third reference signal being a second measurement value obtained by the terminal measuring each second reference signal, and the second reference signals being selected in descending order; Based on the first information and the second information, a performance test is performed on the AI model on the terminal.

7. The method according to claim 6, characterized in that The first indication information is used to indicate at least one of the following: an index of each beam in the beam set, and an index of the first reference signal corresponding to each beam in the beam set; an index of each of said first reference signals; The index of the mapping relationship.

8. The method according to claim 6 or 7, characterized in that The first information includes at least one of the following: an index of each of said first beams; an index of the first reference signal corresponding to each of the first beams; The first measurement value corresponding to each of the first beams.

9. The method according to any one of claims 6 to 8, characterized in that: The second information includes at least one of the following: an index of each of the third reference signals; The second measurement value corresponding to each of the third reference signals.

10. The method according to any one of claims 6 to 9, characterized in that: The performing a performance test on the AI model on the terminal based on the first information and the second information includes at least one of the following: The first information includes an index of each of the first beams, the second information includes an index of each of the third reference signals, and based on the changed mapping relationship, determining an index of each of the second beams corresponding to the index of each of the third reference signals; Based on the index of each of the first beams and the index of each of the second beams, a performance test is performed on the AI model on the terminal.

11. The method according to any one of claims 6 to 9, characterized in that: The performing a performance test on the AI model on the terminal based on the first information and the second information includes at least one of the following: The first information includes an index of the first reference signal corresponding to each of the first beams, and the second information includes an index of each of the third reference signals. Based on the mapping relationship, the index of the first beam corresponding to the index of each of the first reference signals is determined. Based on the changed mapping relationship, the index of each second beam corresponding to the index of each of the third reference signals is determined. Based on the index of each of the first beams and the index of each of the second beams, a performance test is performed on the AI model on the terminal.

12. The method according to claim 10 or 11, characterized in that The performing a performance test on the AI model on the terminal based on the index of each first beam and the index of each second beam includes: Determine a first ratio of a first number to a total number of times; wherein the first number of times is the number of times the index of the second beam is the same as the index of the first beam; The first ratio is greater than or equal to the first value, and the performance test result of the AI model is determined to be passed; or The first ratio is less than the first value, and it is determined that the performance test result of the AI model is failed.

13. The method according to any one of claims 6 to 12, characterized in that: The performing a performance test on the AI model on the terminal based on the first information and the second information includes at least one of the following: The first information includes the first measurement value corresponding to each of the first beams, the second information includes the second measurement value corresponding to each of the third reference signals, and a difference between each of the second measurement values and the corresponding first measurement value is determined; Determine a second ratio of the second number to the total number of times; wherein the second number of times is the number of times the difference is less than or equal to the second value; The second ratio is greater than or equal to the third value, and the performance test result of the AI model is determined to be passed; or The second ratio is less than the third value, and it is determined that the performance test result of the AI model is failed.

14. A terminal, characterized in that: include: a transceiver module configured to receive first indication information sent by a first device and a first reference signal corresponding to each beam in a beam subset; wherein the first indication information is used to indicate a mapping relationship between each beam in the beam set and the first reference signal; a processing module configured to measure the first reference signal corresponding to each beam in the beam subset, and predict the first measurement value corresponding to each beam in the beam set by using an artificial intelligence (AI) model based on the obtained first measurement value; The transceiver module is further configured to send first information to the first device; wherein the first information is information related to the first beam; wherein the first beam is a beam selected in the beam set in descending order of the first measurement values predicted by the AI model; The transceiver module is further configured to receive second indication information sent by the first device based on the changed mapping relationship, and a second reference signal corresponding to each beam in the beam set; wherein the second indication information is used to indicate an index of each second reference signal; The transceiver module is further configured to measure each second reference signal and send second information to the first device based on the obtained second measurement value; wherein the second information is information related to a third reference signal, and the third reference signal is the second reference signal selected in descending order of the second measurement value.

15. A first device, characterized in that: include: a transceiver module configured to send first indication information and a first reference signal corresponding to each beam in the beam subset; wherein the first indication information is used to indicate a mapping relationship, and the mapping relationship is a mapping relationship between each beam in the beam set and the first reference signal; The transceiver module is further configured to receive first information; wherein the first information is information related to the first beam; wherein the first beam is a beam selected by the terminal in the beam set according to the first measurement value predicted by the artificial intelligence (AI) model in descending order; The transceiver module is further configured to send second indication information and a second reference signal corresponding to each beam in the beam set based on the changed mapping relationship; wherein the second indication information is used to indicate an index of each second reference signal; The transceiver module is further configured to receive second information; wherein the second information is information related to a third reference signal, and the third reference signal is a second measurement value obtained by the terminal measuring each second reference signal, and the second reference signals are selected in descending order; A processing module is configured to perform a performance test on the AI model on the terminal based on the first information and the second information.

16. A terminal, characterized in that: include: one or more processors; The processor is configured to execute the performance testing method according to any one of claims 1 to 5.

17. A first device, characterized in that: include: one or more processors; Wherein, the processor is used to execute the performance testing method described in any one of claims 6-13.

18. A communication system, characterized in that: include: A terminal configured to implement the performance testing method according to any one of claims 1 to 5; A first device, wherein the first device is configured to implement the performance testing method according to any one of claims 6 to 13.

19. A storage medium storing instructions, characterized in that: When the instruction is executed on an electronic device, the electronic device executes the performance testing method according to any one of claims 1 to 5 or 6 to 13.

20. A computer program product comprising a computer program, characterized in that When the computer program is executed by a processor, it is used to implement the performance testing method described in any one of claims 1 to 5 or 6 to 13.

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