Subbeam identification method and apparatus, and electronic device

Abstract

The invention provides a sub-beam identification method and device and electronic equipment, and relates to the technical field of wireless, and the method comprises the steps: determining a service cell to which a sampling point belongs according to wireless resource configuration information obtained in advance, and identifying a service sub-beam corresponding to the sampling point in the service cell; determining a target sub-beam satisfying a preset overlapping coverage condition in the service sub-beams, and obtaining a sampling point set and a neighbor cell set corresponding to the target sub-beam; and identifying a sub-beam used by a first neighbor cell covering the position of a first sampling point, the first neighbor cell being a neighbor cell in the neighbor cell set, and the first sampling point being any sampling point in the sampling point set. According to the embodiment of the invention, the overlapping coverage sub-beams of the service cell to which the sampling points belong and the sub-beams of the adjacent cell causing high overlapping coverage of the sampling points can be identified, so that the overlapping coverage of the sub-beam level can be identified, and the identification accuracy of the overlapping coverage can be improved.

Description

Technical Field

[0001] The present application relates to the field of wireless technology, and in particular to a sub-beam identification method, device and electronic equipment. Background Art

[0002] 5th Generation (5G) antenna Massive Multiple Input Multiple Output (Massive MIMO) technology leverages massive antenna arrays to achieve multi-beam scanning for broadcast / control channels and narrower beam transmission for service channels. Beamforming is performed based on multi-dimensionally adjustable weight parameters, thereby improving coverage and spectral efficiency.

[0003] Massive MIMO antenna equipment in current 5G networks, with its multi-beam characteristics and flexible, multi-dimensional antenna weight parameter configuration, can flexibly adapt to various coverage scenarios based on different scenario requirements. However, this flexibility inevitably introduces some coverage issues, especially overlapping coverage.

[0004] In existing 5G networks, overlapping coverage identification primarily relies on the signal strength of the Reference Signal Received Power (RSRP) of the primary serving cell and adjacent cells, and optimization adjustments are made by identifying the degree of overlapping coverage between cells. However, this approach only considers overlapping coverage at the cell level, resulting in low identification accuracy. Summary of the Invention

[0005] The embodiments of the present application provide a sub-beam identification method, device, and electronic device to solve the problem of only identifying overlapping coverage at the cell level and having low identification accuracy.

[0006] To solve the above technical problems, this application is implemented as follows:

[0007] In a first aspect, an embodiment of the present application provides a method for identifying a sub-beam, the method comprising:

[0008] Determine, based on pre-acquired radio resource configuration information, a serving cell to which the sampling point belongs, and identify a serving sub-beam corresponding to the sampling point in the serving cell;

[0009] Determine a target sub-beam in the serving sub-beam that meets a preset overlapping coverage condition, and obtain a sampling point set and a neighboring area set corresponding to the target sub-beam;

[0010] A sub-beam used by a first neighboring area covering a location where a first sampling point is located is identified, where the first neighboring area is a neighboring area in the neighboring area set, and the first sampling point is any sampling point in the sampling point set.

[0011] Optionally, the overlapping coverage condition includes at least one of the following:

[0012] The number of overlapping coverage neighboring cells corresponding to the second sampling point position covered by the target sub-beam is greater than or equal to a first preset value, wherein the second sampling point is any sampling point in the serving cell, and when a difference between a reference signal received power of the serving cell and a reference signal received power of a neighboring cell corresponding to the second sampling point is greater than or equal to a preset threshold value, the neighboring cell is the overlapping coverage neighboring cell;

[0013] A ratio of the number of third sampling points covered by the target sub-beam to the number of fourth sampling points is greater than a second preset value, wherein the fourth sampling points are all sampling points covered by the target sub-beam, and the third sampling points are sampling points among the fourth sampling points that have the overlapping coverage neighboring area.

[0014] Optionally, the serving cell includes a fifth sampling point; and identifying a serving sub-beam corresponding to the sampling point in the serving cell includes:

[0015] Determining, in the first sub-beam, sub-beam information of the fifth sampling point in the horizontal direction based on a horizontal normal direction of the serving cell, a horizontal angle of arrival of the fifth sampling point, and an actual horizontal direction angle of a first sub-beam of the serving cell in the horizontal direction, where the number of the first sub-beams is at least two;

[0016] Determining, in the second sub-beam, sub-beam information of the fifth sampling point in the vertical direction based on a vertical normal direction of the serving cell, a vertical angle of arrival of the fifth sampling point, and an actual vertical downtilt angle of a second sub-beam of the serving cell in the vertical direction, where the number of the second sub-beams is at least two;

[0017] Based on the sub-beam information in the horizontal direction and the sub-beam information in the vertical direction, a serving sub-beam covering the location of the fifth sampling point is determined.

[0018] Optionally, the sub-beam information of the fifth sampling point in the horizontal direction is information of a sub-beam corresponding to an angle having a minimum difference between a first actual horizontal direction angle and a second actual horizontal direction angle, wherein the first actual horizontal direction angle is at least two actual horizontal direction angles of at least two of the first sub-beams relative to a first target direction, and the second actual horizontal direction angle is an actual horizontal direction angle of a line connecting a location of the fifth sampling point and the serving cell base station relative to the first target direction; and / or,

[0019] The sub-beam information of the fifth sampling point in the vertical direction is information of the sub-beam corresponding to the angle having the smallest difference between the first actual vertical downtilt angle and the second actual vertical downtilt angle, wherein the first actual vertical downtilt angle is at least two actual vertical downtilt angles of at least two of the second sub-beams relative to the second target direction, and the second actual vertical downtilt angle is the actual vertical downtilt angle of a line connecting the position of the fifth sampling point and the serving cell base station relative to the second target direction.

[0020] Optionally, the actual horizontal direction angle of the first sub-beam corresponding to the serving cell is the sum of the direction angle of the serving cell and the direction angle of the first sub-beam;

[0021] The actual vertical downtilt angle of the second sub-beam corresponding to the serving cell is the sum of the electrical downtilt angle of the serving cell, the mechanical downtilt angle of the serving cell and the downtilt angle of the second sub-beam.

[0022] Optionally, identifying a sub-beam used by a first neighboring cell covering a location where the first sampling point is located includes:

[0023] Establishing a spatial position relationship among the first sampling point, the serving cell base station, and the first neighboring cell base station based on an actual direction angle of the first sampling point relative to the serving cell base station, the position of the serving cell base station, and the position of the first neighboring cell base station;

[0024] Based on the spatial position relationship, determine a first actual direction angle of a line connecting the position of the first sampling point and the first neighboring base station relative to a target direction;

[0025] Determining, based on the first actual direction angle and multiple actual direction angles of multiple sub-beams in the first neighboring area relative to the target direction, a sub-beam used by the first neighboring area covering the location of the first sampling point;

[0026] The sub-beam corresponding to the minimum angle difference between the multiple actual direction angles and the first actual direction angle is the sub-beam used by the first neighboring area to cover the first sampling point.

[0027] Optionally, the constructing the spatial position relationship between the first sampling point, the serving cell base station, and the first neighboring cell base station based on the actual direction angle of the first sampling point relative to the serving cell base station, the position of the serving cell base station, and the position of the first neighboring cell base station includes:

[0028] Determine, based on an actual direction angle of the first sampling point relative to the serving base station, the location of the serving base station, and the location of the first neighboring base station, a first distance between the serving base station and the first neighboring base station, a target direction angle corresponding to a line connecting the serving base station and the first neighboring base station, and a second distance between the first sampling point and the serving base station.

[0029] Determine, based on the first distance, the target direction angle, the second distance, and the actual direction angle of the first sampling point relative to the serving cell base station, a first rotation angle of a line connecting the first sampling point and the first neighboring cell base station relative to a line connecting the serving cell base station and the first neighboring cell base station;

[0030] The determining, based on the spatial position relationship, a first actual direction angle of a line connecting the position of the first sampling point and the first neighboring base station relative to a target direction includes:

[0031] Based on the first angle, a first actual direction angle of a line connecting the position of the first sampling point and the first neighboring base station relative to the target direction is determined.

[0032] Optionally, determining the serving cell to which the sampling point belongs based on pre-acquired radio resource configuration information includes:

[0033] Acquiring wireless resource configuration information, where the wireless resource configuration information includes cell configuration parameters and sampling point measurement report information;

[0034] identifying a serving cell to which the sampling point belongs according to an association relationship between the target information in the configuration parameters and the target information in the sampling point measurement report information;

[0035] The target information includes at least one of frequency and physical cell identifier (PCI) information.

[0036] In a second aspect, an embodiment of the present application provides a sub-beam identification device, the device comprising:

[0037] A first determining module is configured to determine a serving cell to which the sampling point belongs based on pre-acquired radio resource configuration information, and identify a serving sub-beam corresponding to the sampling point in the serving cell;

[0038] A second determination module is configured to determine a target sub-beam in the serving sub-beam that meets a preset overlapping coverage condition, and obtain a sampling point set and a neighboring area set corresponding to the target sub-beam;

[0039] An identification module is configured to identify a sub-beam used by a first neighboring area covering a location where a first sampling point is located, where the first neighboring area is a neighboring area in the neighboring area set, and the first sampling point is any sampling point in the sampling point set.

[0040] In a third aspect, an embodiment of the present application provides an electronic device, comprising: a processor, a memory, and a program stored on the memory and executable on the processor, wherein the program, when executed by the processor, implements the steps of the sub-beam identification method described in the first aspect.

[0041] In a fourth aspect, an embodiment of the present application provides a computer-readable storage medium having a computer program stored thereon. When the computer program is executed by a processor, the steps of the sub-beam identification method described in the first aspect are implemented.

[0042] In a fifth aspect, a computer program product is provided, comprising computer instructions, which, when executed by a processor, implement the steps of the sub-beam identification method as described in the first aspect.

[0043] In the embodiment of the present application, the overlapping coverage sub-beams of the serving cell to which the sampling point belongs and the sub-beams of the neighboring cell that cause high overlapping coverage of the sampling point can be identified, thereby realizing the identification of overlapping coverage at the sub-beam level and improving the identification accuracy of overlapping coverage. BRIEF DESCRIPTION OF THE DRAWINGS

[0044] In order to more clearly illustrate the technical solutions of the embodiments of the present application, the following briefly introduces the drawings required for use in the description of the embodiments of the present application. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without any creative work.

[0045] Figure 1 This is one of the flow charts of a sub-beam identification method provided in an embodiment of the present application;

[0046] Figure 2 This is one of the cell beam schematic diagrams provided in the embodiment of the present application;

[0047] Figure 3 This is the second schematic diagram of a cell beam provided in an embodiment of the present application;

[0048] Figure 4 This is one of the schematic diagrams of a cell beam in the horizontal direction provided by an embodiment of the present application;

[0049] Figure 5 This is one of the schematic diagrams of a cell beam in the vertical direction provided by an embodiment of the present application;

[0050] Figure 6 This is a second schematic diagram of a cell beam in the horizontal direction provided by an embodiment of the present application;

[0051] Figure 7 This is a second schematic diagram of a cell beam in the vertical direction provided by an embodiment of the present application;

[0052] Figure 8 This is the second flowchart of a sub-beam identification method provided in an embodiment of the present application;

[0053] Figure 9 1 is a schematic structural diagram of a sub-beam identification device provided in an embodiment of the present application;

[0054] Figure 10 This is a schematic diagram of the structure of an electronic device provided in an embodiment of the present application. DETAILED DESCRIPTION

[0055] The following will be combined with the drawings in the embodiments of this application to clearly and completely describe the technical solutions in the embodiments of this application. Obviously, the embodiments described are part of the embodiments of this application, not all of them. Based on the embodiments in this application, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of this application.

[0056] Currently, 5G massive antenna Massive MIMO technology performs beamforming based on weight parameters such as the number of sub-beams, azimuth angle, downtilt angle, horizontal beam width, and vertical beam width to achieve beam coverage. The identification of overlapping coverage in 5G wireless access networks mainly continues the rules of the 4th Generation (4G) Long Term Evolution (LTE), that is, the degree of overlapping coverage is determined by the difference in RSRP signal strength between the primary serving cell and the neighboring cell, as well as the number of neighboring cells that meet the difference threshold. However, this solution can only locate overlapping coverage at the cell level, and cannot effectively identify the overlapping coverage of sub-beams in 5G Massive MIMO multi-beam scenarios.

[0057] For 5G wireless network overlap identification, related technologies use the RSRP signal strengths of the primary cell and neighboring cells reported by overlapping sampling points of adjacent cells in the overlapping coverage cell. The difference in signal strength of the overlapping cell is set to be less than a preset strength, thereby determining the number of overlapping sampling points in the adjacent cell. The problem sub-beam in the sub-beam of the target adjacent cell causing the overlap is then determined based on the overlapping area between the sub-beam of the target adjacent cell and the building layer covered by the overlapping cell.

[0058] In the above solution, there is no accurate and effective way to identify the overlapping coverage of sub-beam level in the multi-beam scenario of the cell under the 5G network.

[0059] The embodiments of the present application provide a sub-beam identification method, device, and electronic device to solve the problem in related arts that overlapping coverage only considers overlapping coverage at the cell level, resulting in low accuracy.

[0060] See also Figure 1 , Figure 1 This is a flow chart of a sub-beam identification method provided by an embodiment of the present application, such as Figure 1 As shown, the method includes the following steps:

[0061] Step 101: Determine the serving cell to which the sampling point belongs based on pre-acquired radio resource configuration information, and identify the serving sub-beam corresponding to the sampling point in the serving cell;

[0062] Step 102: Determine a target sub-beam in the serving sub-beam that meets a preset overlapping coverage condition, and obtain a sampling point set and a neighboring cell set corresponding to the target sub-beam;

[0063] Step 103: Identify a sub-beam used by a first neighboring cell covering a location where a first sampling point is located, where the first neighboring cell is a neighboring cell in the neighboring cell set, and the first sampling point is any sampling point in the sampling point set.

[0064] The radio resource configuration information may include the cell name, cell azimuth, beam azimuth, cell frequency, PCI, serving cell RSRP, neighboring cell RSRP, etc. This information can be obtained from configuration parameters such as the cell's engineering parameters, cell beam parameter configuration information, and sampling point measurement report information.

[0065] The sampling point information can be obtained through the sampling point measurement report, thereby determining the serving cell to which the sampling point belongs, and the serving sub-beams corresponding to all sampling points or at least some of the sampling points in the serving cell.

[0066] Sampling points can be understood as specific locations within the wireless network coverage area used to measure signal strength, quality, or other network performance indicators. These locations can be the actual location of user equipment or the deployment location of network test equipment.

[0067] In a wireless network, the base station cell (Cell) serving a sampling point can be considered the serving cell to which the sampling point belongs. Each base station cell has a unique identifier (such as the Cell Global Identity (CGI)) to distinguish different cells. The coverage of the cell to which the sampling point belongs can be determined using radio resource configuration information.

[0068] Furthermore, the serving sub-beam corresponding to each sampling point in the serving cell is identified. For example, a line is connected between a sampling point in the cell and the base station, and a first angle of the line relative to north is obtained. Simultaneously, the actual azimuth angle of each sub-beam in the cell relative to north is obtained. The first angle is compared with the actual azimuth angle of each sub-beam. When the two angles are closest, the corresponding sub-beam is determined, i.e., the serving sub-beam corresponding to the sampling point.

[0069] Through the above method, the serving sub-beam corresponding to each sampling point can be obtained.

[0070] The target sub-beam is obtained from the obtained serving sub-beams, wherein the overlapping coverage condition is that the sampling points covered by the sub-beams have overlapping coverage neighboring areas, or the number of overlapping coverage neighboring areas is greater than a preset value.

[0071] Obtain all overlapping coverage sub-beams that meet the overlapping coverage conditions in the serving cell, and record them as high overlapping coverage sub-beams And all the overlapping sampling point sets are recorded as The neighboring cells that cause high overlapping coverage are cells B, C, D, ..., etc., which are recorded as the overlapping coverage neighboring cell set

[0072] For sampling point set For each sampling point in the , traverse each sampling point and identify the neighboring area (neighboring area set) covering the location of the sampling point The sub-beam used by the neighboring cells in the .

[0073] This approach allows identification of sub-beams with high overlapping coverage within the serving cell, as well as sub-beams with overlapping coverage between neighboring cells and the serving cell. This allows for improved identification accuracy, especially at the beam level.

[0074] Optionally, in some embodiments, the overlapping coverage condition includes at least one of the following:

[0075] The number of overlapping coverage neighboring cells corresponding to the second sampling point position covered by the target sub-beam is greater than or equal to a first preset value, wherein the second sampling point is any sampling point in the serving cell, and when a difference between a reference signal received power of the serving cell and a reference signal received power of a neighboring cell corresponding to the second sampling point is greater than or equal to a preset threshold value, the neighboring cell is the overlapping coverage neighboring cell;

[0076] A ratio of the number of third sampling points covered by the target sub-beam to the number of fourth sampling points is greater than a second preset value, wherein the fourth sampling points are all sampling points covered by the target sub-beam, and the third sampling points are sampling points among the fourth sampling points that have the overlapping coverage neighboring area.

[0077] In 5G Massive MIMO technology, base stations use multiple sub-beams to cover different areas. The target sub-beam's coverage area includes the second sampling point. Because a sampling point may be covered by sub-beams from multiple cells (base stations) simultaneously, the overlapping coverage area of ​​the second sampling point can be obtained.

[0078] For example, the Reference Signal Received Power (RSRP) of the serving cell and the RSRP of the neighboring cell are obtained from the measurement report to determine whether the following conditions are met:

[0079] Condition 1) If RSRP 服务小区 -RSRP 邻小区 >R th , then the neighboring area is not an overlapping coverage neighboring area;

[0080] Condition 2) If RSRP 服务小区 -RSRP 邻小区 ≤R th , then the neighboring area is recorded as an overlapping coverage neighboring area.

[0081] Among them, R th This is a configurable threshold value and should be configured based on the actual network situation.

[0082] When the second sampling point location has an overlapping neighboring area, or the number of overlapping neighboring areas is greater than or equal to a first preset value, the overlapping condition is satisfied. For example, when the first preset value is 1, it indicates that the second sampling point location has an overlapping neighboring area, thus satisfying the overlapping condition; or when the first preset value is 3, it indicates that the second sampling point location has three or more overlapping neighboring areas, thus satisfying the overlapping condition.

[0083] By traversing all sampling points in the serving cell, the total number of sampling points covered by the sub-beam with sub-beam ID i can be determined, which is recorded as M i , which is the number of the fourth sampling points. Based on this, the relationship between the number of sampling points of each sub-beam in the cell can be obtained as ∑ i M i =M, where M is the total number of sampling points in the cell.

[0084] All sampling points that meet the above condition 2) are counted separately according to the serving cell sub-beam, and recorded as N i, i is the sub-beam ID. That is, obtain the number of sampling points N that have overlapping coverage areas among the sampling points covered by the sub-beam with ID i i , that is, the number of the third sampling points.

[0085] If N i / M i ≥S th , then it means that the overlapping coverage condition is met, where S th It is a configurable high overlap coverage threshold, that is, the threshold that meets the overlap coverage condition.

[0086] The above conditions can be met one by one or simultaneously.

[0087] In some optional embodiments, if N i / M i ≥S th , and the overlapping coverage of neighboring areas is greater than or equal to 3 (3 is a configurable threshold, used as an example here), then sub-beam i is a high overlapping coverage sub-beam in the serving cell, that is, a target sub-beam that meets the overlapping coverage conditions.

[0088] By correlating and matching the frequency and physical cell identifier (PCI) information in the cell engineering parameters with the neighboring cell frequency and PCI information of the overlapping neighboring cell in the sampling point measurement report (MR), the cell information of the overlapping neighboring cell can be determined.

[0089] By the above method, the sub-beams corresponding to the high overlapping coverage neighboring areas that meet the overlapping coverage conditions can be obtained.

[0090] Optionally, in some implementations, the serving cell includes a fifth sampling point; and identifying a serving sub-beam corresponding to the sampling point in the serving cell includes:

[0091] Determining, in the first sub-beam, sub-beam information of the fifth sampling point in the horizontal direction based on a horizontal normal direction of the serving cell, a horizontal angle of arrival of the fifth sampling point, and an actual horizontal direction angle of a first sub-beam of the serving cell in the horizontal direction, where the number of the first sub-beams is at least two;

[0092] Determining, in the second sub-beam, sub-beam information of the fifth sampling point in the vertical direction based on a vertical normal direction of the serving cell, a vertical angle of arrival of the fifth sampling point, and an actual vertical downtilt angle of a second sub-beam of the serving cell in the vertical direction, where the number of the second sub-beams is at least two;

[0093] Based on the sub-beam information in the horizontal direction and the sub-beam information in the vertical direction, a serving sub-beam covering the location of the fifth sampling point is determined.

[0094] like Figure 2 As shown, in general, the direction angle and downtilt angle in the cell engineering parameters are the normal directions of the envelope beam formed by each sub-beam of the cell (both horizontally and vertically).

[0095] like Figure 3 As shown in the figure, the normal direction of the serving cell is shown in the figure. The first sub-beam in the cell includes 4 sub-beams. The parameter configuration information of each sub-beam includes the beam direction angle and downtilt angle, such as α1, α2, α3, and α4, which are the offset angles of the normal direction of the sub-beam relative to the normal direction of the cell. The clockwise angle is a positive angle, and the counterclockwise angle is a negative angle. Based on the angles in the above parameter configuration information, the actual direction of each sub-beam of the serving cell relative to the specified reference direction (such as north) can be determined, that is, the actual direction angle (actual horizontal direction angle or actual vertical downtilt angle) of the first sub-beam.

[0096] The following identifies the sub-beams of the serving cell from the horizontal and vertical directions respectively.

[0097] 1. Horizontal identification of sub-beams

[0098] The horizontal arrival angle of the sampling point hAoA is the angle between the direction of the incoming wave of the sampling point signal received by the base station side and the horizontal normal direction of the cell. Figure 4 As shown, there is an angle between the line between the sampling point (ie, the fifth sampling point) and cell A (ie, the serving cell) and the horizontal normal direction of the cell, ie, the horizontal arrival angle hAoA of the sampling point.

[0099] Among them, the arrival angle hAoA is positive in the counterclockwise direction relative to the horizontal normal of the cell, while θ is positive in the clockwise direction relative to the north; the specific angle relationship is as follows: Figure 4 The calculation method is shown in the following formula:

[0100]

[0101] Based on the horizontal normal direction angle θ of the cell and the horizontal arrival angle hAoA of the sampling point, the actual horizontal direction angle of the sampling point can be determined according to the above formula:

[0102] The actual horizontal direction angle of the sampling point calculated Make an angle with the actual horizontal direction angle of the first sub-beam of the above-mentioned service cell (i.e., obtain the angle difference), define the sub-beam with the smallest angle as the service sub-beam in the horizontal direction of the sampling point, and obtain the beam information of the service sub-beam, such as the beam number.

[0103] For example, Figure 4 The actual horizontal direction angles of the four sub-beams relative to the north are respectively Make the included angle and get the beam corresponding to the minimum included angle, that is, the sub-beam closest to the sampling point is the sub-beam in the horizontal direction of the sampling point.

[0104] 2. Vertical Identification Beamlet

[0105] The vertical arrival angle vAoA of the sampling point is the angle between the direction of the incoming wave of the sampling point signal received by the base station side and the vertical normal direction of the cell. The vertical downtilt angle γ of the cell and the angle are recorded as the actual vertical downtilt angle of the sampling point, recorded as The vertical arrival angle vAoA and the vertical downtilt angle of the cell are both positive when rotating clockwise from the horizontal direction. The specific angle relationship is as follows: Figure 5 The calculation method is shown in the following formula:

[0106]

[0107] Based on the vertical downtilt angle γ of the cell and the vertical angle of arrival vAoA of the sampling point, the actual vertical downtilt angle of the sampling point can be determined according to the above formula.

[0108] The calculated actual vertical downtilt angle of the sampling point An angle is made with the actual downtilt angle of each sub-beam in the serving cell, and the sub-beam with the smallest angle is defined as the serving sub-beam in the vertical direction of the sampling point to obtain the information of the serving sub-beam.

[0109] The serving sub-beam numbers of all sampling points in serving cell A can be determined through the information of the sub-beam in the horizontal and vertical directions.

[0110] By identifying the sub-beam information in the horizontal and vertical directions respectively, the service sub-beam corresponding to the sampling point is determined, and the sub-beam information in the service cell can be identified more accurately.

[0111] Optionally, in some embodiments, the sub-beam information of the fifth sampling point in the horizontal direction is information of a sub-beam corresponding to an angle having a minimum difference between a first actual horizontal direction angle and a second actual horizontal direction angle, wherein the first actual horizontal direction angle is at least two actual horizontal direction angles of at least two of the first sub-beams relative to a first target direction, and the second actual horizontal direction angle is an actual horizontal direction angle of a line connecting a location of the fifth sampling point and the serving cell base station relative to the first target direction; and / or,

[0112] The sub-beam information of the fifth sampling point in the vertical direction is information of the sub-beam corresponding to the angle having the smallest difference between the first actual vertical downtilt angle and the second actual vertical downtilt angle, wherein the first actual vertical downtilt angle is at least two actual vertical downtilt angles of at least two of the second sub-beams relative to the second target direction, and the second actual vertical downtilt angle is the actual vertical downtilt angle of a line connecting the position of the fifth sampling point and the serving cell base station relative to the second target direction.

[0113] The first actual horizontal direction angle includes actual horizontal direction angles of at least two first sub-beams, where the first sub-beams are sub-beams in the serving cell.

[0114] like Figure 4 As shown, in the horizontal direction, cell A includes four sub-beams (the first sub-beam), and the angle of each sub-beam relative to the north direction (the first target direction) can be obtained. The figure shows the horizontal direction and north direction of beam 2. The angle between the horizontal direction of beam 2 and the north direction can be obtained. This angle is the actual horizontal direction angle of beam 2. The four beams correspond to four actual horizontal direction angles.

[0115] The actual horizontal direction angle of the line connecting the sampling point (fifth sampling point) and cell A (serving cell base station) relative to the north direction (first target direction) is the actual horizontal direction angle of the sampling point.

[0116] Based on the angle obtained with the same reference direction, the angle difference between each actual horizontal direction angle and the actual horizontal direction angle of the sampling point can be calculated, so that the sub-beam information corresponding to the minimum difference is the sub-beam information of the fifth sampling point in the horizontal direction.

[0117] Likewise, if Figure 5 As shown, in the vertical direction, cell A includes three sub-beams (second sub-beams). The angle of each sub-beam relative to the horizontal direction (second target direction) can be obtained (not shown in the figure). The figure shows the vertical direction of the beam and the horizontal and vertical directions of the coordinate system. The angle of the vertical direction of the beam relative to the horizontal direction of the coordinate system can be obtained. This angle is the actual vertical downtilt angle of the beam. Three beams can correspond to three actual vertical downtilt angles.

[0118] The actual vertical downtilt angle of the line connecting the sampling point (fifth sampling point) and cell A (serving cell base station) relative to the horizontal direction of the coordinate system (second target direction) is the actual vertical downtilt angle of the sampling point.

[0119] Based on the angle obtained with the same reference direction, the angle difference between each actual vertical downtilt angle and the actual vertical downtilt angle of the sampling point can be calculated, so that the sub-beam information corresponding to the minimum difference is the sub-beam information of the fifth sampling point in the vertical direction.

[0120] Optionally, in some implementations, the actual horizontal direction angle of the first sub-beam corresponding to the serving cell is the sum of the direction angle of the serving cell and the direction angle of the first sub-beam;

[0121] The actual vertical downtilt angle of the second sub-beam corresponding to the serving cell is the sum of the electrical downtilt angle of the serving cell, the mechanical downtilt angle of the serving cell and the downtilt angle of the second sub-beam.

[0122] Among them, the direction angle, electrical downtilt angle and mechanical downtilt angle of the service cell can be obtained from the service cell engineering parameters, and the beam direction angle and beam downtilt angle can be obtained from the beam parameter configuration information.

[0123] The cell engineering parameters and beam parameter configuration information are associated to calculate the actual beam direction angle and actual downtilt angle, where:

[0124] Actual sub-beam direction angle = cell direction angle + beam direction angle

[0125] Actual downtilt angle of sub-beam = cell electrical downtilt angle + cell mechanical downtilt angle + beam downtilt angle

[0126] Through the above method, the actual direction angles of the first sub-beam corresponding to the serving cell in the horizontal and vertical directions can be obtained, thereby obtaining the actual direction angle of the beam.

[0127] Optionally, in some implementations, identifying the sub-beam used by the first neighboring cell covering the location of the first sampling point includes:

[0128] Establishing a spatial position relationship among the first sampling point, the serving cell base station, and the first neighboring cell base station based on an actual direction angle of the first sampling point relative to the serving cell base station, the position of the serving cell base station, and the position of the first neighboring cell base station;

[0129] Based on the spatial position relationship, determine a first actual direction angle of a line connecting the position of the first sampling point and the first neighboring base station relative to a target direction;

[0130] Determining, based on the first actual direction angle and multiple actual direction angles of multiple sub-beams in the first neighboring area relative to the target direction, a sub-beam used by the first neighboring area covering the location of the first sampling point;

[0131] The sub-beam corresponding to the minimum angle difference between the multiple actual direction angles and the first actual direction angle is the sub-beam used by the first neighboring area to cover the first sampling point.

[0132] like Figure 6 As shown in the figure, on the horizontal plane, serving cell A, sampling point X (first sampling point) and neighboring cell B (first neighboring cell) form a triangle XAB. Based on the latitude and longitude coordinates of serving cell A and neighboring cell B, the distance ISDh of line segment AB and the direction angle of AB relative to true north can be obtained.

[0133] The actual direction angle of the first sampling point relative to the serving cell base station A can be determined by the actual horizontal direction angle of the sampling point. Determine the angle of the line between the sampling point and the serving cell A relative to the north direction. Based on the actual horizontal direction angle of the sampling point The interior angle θ1 of the triangle can be determined.

[0134] By the above method, the positions of the serving cell base station A, the neighboring cell base station B and the sampling point X can be determined, and the spatial position relationship of the three points can be constructed. According to the position of the serving cell base station A, the position of the neighboring cell base station B, the angle θ1, and the distance TA between the serving cell base station A and the first sampling point in the spatial position relationship h (TA h The distance TA between the sampling point X and the neighboring cell B can be calculated based on the projection of the time advance (TA) in the measurement report on the horizontal plane, that is, by converting time into distance. h_nc and angle XBA, i.e. θ2.

[0135] Based on the angle AB relative to the north and the angle θ2, the angle of the line connecting the first sampling point X and the first neighboring base station B relative to the north (target direction) can be obtained, that is, the first actual direction angle

[0136] In addition, the actual direction angle of each sub-beam in the neighboring cell B relative to the north direction (target direction) can be obtained, and the actual direction angle of each sub-beam can be compared with the first actual direction angle. The angle is calculated to obtain multiple angle differences. Among the multiple angle differences, the sub-beam information corresponding to the minimum difference is obtained, that is, the sub-beam information in the horizontal direction.

[0137] Likewise, in the vertical direction, Figure 7 As shown, the distance TA between the sampling point X and the neighboring cell B can also be calculated according to the above method. v_nc and angle XBA, i.e. θ2.

[0138] Based on θ2, the angle of the line connecting the first sampling point X and the first neighboring base station B relative to the horizontal direction (target direction) can be obtained, that is, the first actual direction angle

[0139] In addition, the actual direction angle of each sub-beam in the neighboring cell B relative to the horizontal direction (target direction) can be obtained, and each actual direction angle can be compared with the first actual direction angle. The angle difference is calculated, and among the multiple angle differences, the sub-beam information corresponding to the minimum difference is obtained, that is, the sub-beam information in the vertical direction.

[0140] Based on the sub-beam information in the horizontal direction and the sub-beam information in the vertical direction, the sub-beam used by the neighboring cell B to cover the sampling point X can be determined.

[0141] Optionally, in some implementations, constructing the spatial position relationship between the first sampling point, the serving cell base station, and the first neighboring cell base station based on the actual direction angle of the first sampling point relative to the serving cell base station, the position of the serving cell base station, and the position of the first neighboring cell base station includes:

[0142] Determine, based on an actual direction angle of the first sampling point relative to the serving base station, the location of the serving base station, and the location of the first neighboring base station, a first distance between the serving base station and the first neighboring base station, a target direction angle corresponding to a line connecting the serving base station and the first neighboring base station, and a second distance between the first sampling point and the serving base station.

[0143] Determine, based on the first distance, the target direction angle, the second distance, and the actual direction angle of the first sampling point relative to the serving cell base station, a first rotation angle of a line connecting the first sampling point and the first neighboring cell base station relative to a line connecting the serving cell base station and the first neighboring cell base station;

[0144] The determining, based on the spatial position relationship, a first actual direction angle of a line connecting the position of the first sampling point and the first neighboring base station relative to a target direction includes:

[0145] Based on the first angle, a first actual direction angle of a line connecting the position of the first sampling point and the first neighboring base station relative to the target direction is determined.

[0146] like Figure 6 As shown, based on the location of the serving cell base station and the location of the first neighboring cell base station, the target direction angle of the line connecting the serving cell base station and the first neighboring cell base station relative to the north (i.e., the angle of AB relative to the north) can be determined. The angle θ1 can be calculated.

[0147] According to the distance AB obtained in the above manner (ie, the first distance), the distance TA from the serving cell A to the sampling point X h (i.e. the second distance) and angle θ1, thus obtaining the lengths of the two sides of the triangle and the included angle. According to the cosine theorem, the distance TA from the neighboring cell B to the sampling point X can be calculated. h_nc and angle XBA, ie θ2 (ie the first angle).

[0148]

[0149]

[0150] Based on the relationship between the above arrival angle and the actual horizontal direction angle of the sampling point, as well as the actual direction angle of the horizontal direction of the neighboring cell B relative to the north, the above calculation process is reversed to obtain the arrival angle hAoA of the sampling point X relative to the neighboring cell B. nc , and then calculate the actual horizontal direction angle of sampling point X relative to the neighboring cell B

[0151] The actual direction angle of each sub-beam in the neighboring cell B relative to the north (target direction) can be obtained, and each actual direction angle is compared with the first actual direction angle. The angle difference is calculated, and among the multiple angle differences, the sub-beam information corresponding to the minimum difference is obtained, that is, the sub-beam information in the horizontal direction.

[0152] In the vertical direction, determine the vertical coverage sub-beam of neighboring cell B to X.

[0153] like Figure 7 As shown, on the vertical plane, the serving cell A, the sampling point X, and the neighboring cell B form a triangle XAB. Based on the latitude and longitude coordinates of the serving cell A and the neighboring cell B, the distance ISDv (i.e., the first distance) of the line segment AB and the inclination angle of AB relative to the horizontal direction (i.e., the target direction angle) can be obtained. According to the above calculation process, the actual downtilt angle of the sampling point X can be calculated. Based on this, the angle XAB, namely θ1, can be calculated.

[0154] The distance TA from the serving cell A to the sampling point v , which can be obtained based on the projection of TA on the vertical plane in the measurement report.

[0155] By the above method, the lengths of the two sides and the included angle of the triangle can be obtained. According to the cosine theorem, the distance TA from the neighboring cell B to the sampling point X can be calculated. v_nc and angle XBA, ie θ2 (ie the first angle).

[0156]

[0157] Based on the relationship between the above arrival angle and the actual horizontal direction angle of the sampling point, as well as the actual direction angle of the horizontal direction of the neighboring cell B relative to the horizontal direction, the above calculation process is reversely calculated to obtain the arrival angle vAoA of the sampling point X relative to the neighboring cell B. nc , and then calculate the actual vertical tilt angle of the sampling point relative to the neighboring cell B The angle between the angle and the actual tilt angle of each sub-beam of the neighboring cell B is calculated, and the sub-beam with the smallest angle is defined as the sub-beam that overlaps and covers the sampling point in the vertical direction to obtain the information of the sub-beam.

[0158] Through the above process, the sub-beam covered by the neighboring cell B at the location of the sampling point X can be determined.

[0159] Overlapping sampling point set All sampling points and overlapping coverage neighborhood sets in All neighboring cells in the service cell are determined in turn according to the calculation process to determine the sub-beams of each neighboring cell that overlap with the serving cell, and all sub-beam sets of all determined neighboring cells are recorded as the overlapping coverage sub-beam set

[0160] Optionally, determining the serving cell to which the sampling point belongs based on pre-acquired radio resource configuration information includes:

[0161] Acquiring wireless resource configuration information, where the wireless resource configuration information includes cell configuration parameters and sampling point measurement report information;

[0162] identifying a serving cell to which the sampling point belongs according to an association relationship between the target information in the configuration parameters and the target information in the sampling point measurement report information;

[0163] The target information includes at least one of frequency and physical cell identifier (PCI) information.

[0164] Among them, the configuration parameters of the cell may include cell engineering parameters and cell beam parameter configuration information.

[0165] The cell engineering parameters may include but are not limited to the following fields:

[0166]

[0167] The cell beam parameter configuration information includes but is not limited to the following fields:

[0168]

[0169] The sampling point measurement report information includes but is not limited to the following fields:

[0170]

[0171] By associating and matching the frequency and PCI information in the cell engineering parameters with the serving cell frequency and serving cell PCI information in the sampling point measurement report (MR), the serving cell (primary cell) of the sampling point can be uniquely determined.

[0172] If the current cell is a multi-beam cell, according to the specification, the user selects a sub-beam with a stronger signal to access the cell and establish a Radio Resource Control (RRC) connection. By identifying the sub-beam information accessed by the sampling point in the cell, it can be used for subsequent network optimization and adjustment.

[0173] This application parses relevant data from the sampling point measurement report (MR), determines the spatial position relationship between the sampling point and the cell sub-beam through the antenna arrival angle of the sampling point, combined with the cell beam configuration information, identifies the cell sub-beam actually accessed by the sampling point and the affected neighboring sub-beam, defines the cell sub-beam level overlapping coverage identification algorithm, identifies the overlapping coverage situation at the cell beam level, and obtains the neighboring sub-beam information that causes overlapping coverage, which can provide more accurate and effective network coverage performance analysis.

[0174] As a specific embodiment, Figure 8 As shown, the sub-beam identification method of the present application may include the following steps:

[0175] Step 1: Obtain cell engineering parameters, beam parameter configuration information, and sampling point measurement report information.

[0176] Step 2: Associate the cell engineering parameters and the parameters in the beam parameter configuration information to calculate the actual direction angle and downtilt angle of the sub-beam.

[0177] Step 3: Identify the serving cell sub-beam to which the sampling point belongs.

[0178] First, the serving cell reported by the matched sampling point measurement is correlated.

[0179] Secondly, based on the serving cell, the actual horizontal direction angle of the sampling point and the actual horizontal direction angle of each sub-beam of the serving cell are obtained, and based on the angle difference between the actual horizontal direction angle of each sub-beam and the actual horizontal direction angle of the sampling point, the serving sub-beam information of the sampling point in the horizontal direction is determined.

[0180] Based on the serving cell, the actual vertical downtilt angle of the sampling point and the actual vertical downtilt angle of each sub-beam of the serving cell are obtained, and based on the angle difference between the actual vertical downtilt angle of each sub-beam and the actual vertical downtilt angle of the sampling point, the serving sub-beam information of the sampling point in the vertical direction is determined.

[0181] Then, based on the serving sub-beam information in the horizontal and vertical directions, the serving sub-beam covering the sampling point of the serving cell is determined.

[0182] Step 4: Identify sub-beams with high overlapping coverage in the serving cell.

[0183] According to the preset high overlap coverage condition, a high overlap coverage sub-beam set, a high overlap coverage sampling point set and a high overlap coverage neighboring area set are determined.

[0184] Step 5: Identify the overlapping coverage beams of the overlapping neighboring cells on the serving cell.

[0185] Determine the horizontal coverage sub-beam and vertical coverage sub-beam of the neighboring cell to the sampling point, thereby determining the coverage sub-beam of the neighboring cell to the location of the sampling point, and then complete the coverage sub-beams of all neighboring cells in the high overlapping coverage neighboring cell set and all sampling points in the high overlapping coverage set.

[0186] In this application, the spatial relationship between the cell and the sampling point is calculated based on the horizontal arrival angle hAoA and vertical arrival angle vAoA from the sampling point to the cell. The serving cell subbeam information to which the sampling point belongs is then identified based on the serving cell's subbeam weight configuration data. After the sampling points are classified into corresponding subbeams, rules are defined from the perspective of the serving cell subbeam to identify the overlapping coverage of the cell subbeams.

[0187] This application can identify overlapping coverage at the beam level based on the multi-beam characteristics of 5G, which improves the identification accuracy compared to cell-level overlapping coverage identification. At the same time, based on the spatial position relationship, it can identify the neighboring cell sub-beams that cause overlapping coverage and the affected main service cell sub-beams, and achieve accurate overlapping coverage identification and optimization at the beam level.

[0188] See also Figure 9 , Figure 9 This is a schematic diagram of the structure of a sub-beam identification device provided in an embodiment of the present application. Figure 9 As shown, the sub-beam identification device 900 includes:

[0189] A first determining module 901 is configured to determine a serving cell to which a sampling point belongs based on pre-acquired radio resource configuration information, and identify a serving sub-beam corresponding to the sampling point in the serving cell;

[0190] A second determining module 902 is configured to determine a target sub-beam in the serving sub-beam that meets a preset overlapping coverage condition, and obtain a sampling point set and a neighboring cell set corresponding to the target sub-beam;

[0191] The identification module 903 is configured to identify a sub-beam used by a first neighboring area covering a location where a first sampling point is located, where the first neighboring area is a neighboring area in the neighboring area set, and the first sampling point is any sampling point in the sampling point set.

[0192] Optionally, the overlapping coverage condition includes at least one of the following:

[0193] The number of overlapping coverage neighboring cells corresponding to the second sampling point position covered by the target sub-beam is greater than or equal to a first preset value, wherein the second sampling point is any sampling point in the serving cell, and when a difference between a reference signal received power of the serving cell and a reference signal received power of a neighboring cell corresponding to the second sampling point is greater than or equal to a preset threshold value, the neighboring cell is the overlapping coverage neighboring cell;

[0194] A ratio of the number of third sampling points covered by the target sub-beam to the number of fourth sampling points is greater than a second preset value, wherein the fourth sampling points are all sampling points covered by the target sub-beam, and the third sampling points are sampling points among the fourth sampling points that have the overlapping coverage neighboring area.

[0195] Optionally, the serving cell includes a fifth sampling point; and the identification module includes:

[0196] a first determining submodule, configured to determine, in the first sub-beam, sub-beam information of the fifth sampling point in the horizontal direction based on a horizontal normal direction of the serving cell, a horizontal angle of arrival of the fifth sampling point, and an actual horizontal direction angle of a first sub-beam of the serving cell in the horizontal direction, where the number of the first sub-beams is at least two;

[0197] a second determining submodule, configured to determine, in the second sub-beam, sub-beam information of the fifth sampling point in the vertical direction based on the vertical normal direction of the serving cell, the vertical angle of arrival of the fifth sampling point, and an actual vertical downtilt angle of a second sub-beam of the serving cell in the vertical direction, where the number of the second sub-beams is at least two;

[0198] The third determining submodule is configured to determine a serving sub-beam covering the location of the fifth sampling point based on the sub-beam information in the horizontal direction and the sub-beam information in the vertical direction.

[0199] Optionally, the sub-beam information of the fifth sampling point in the horizontal direction is information of a sub-beam corresponding to an angle having a minimum difference between a first actual horizontal direction angle and a second actual horizontal direction angle, wherein the first actual horizontal direction angle is at least two actual horizontal direction angles of at least two of the first sub-beams relative to a first target direction, and the second actual horizontal direction angle is an actual horizontal direction angle of a line connecting a location of the fifth sampling point and the serving cell base station relative to the first target direction; and / or,

[0200] The sub-beam information of the fifth sampling point in the vertical direction is information of the sub-beam corresponding to the angle having the smallest difference between the first actual vertical downtilt angle and the second actual vertical downtilt angle, wherein the first actual vertical downtilt angle is at least two actual vertical downtilt angles of at least two of the second sub-beams relative to the second target direction, and the second actual vertical downtilt angle is the actual vertical downtilt angle of a line connecting the position of the fifth sampling point and the serving cell base station relative to the second target direction.

[0201] Optionally, the actual horizontal direction angle of the first sub-beam corresponding to the serving cell is the sum of the direction angle of the serving cell and the direction angle of the first sub-beam;

[0202] The actual vertical downtilt angle of the second sub-beam corresponding to the serving cell is the sum of the electrical downtilt angle of the serving cell, the mechanical downtilt angle of the serving cell and the downtilt angle of the second sub-beam.

[0203] Optionally, the identification module includes:

[0204] a construction submodule, configured to construct a spatial position relationship between the first sampling point, the serving cell base station, and the first neighboring cell base station based on an actual direction angle of the first sampling point relative to the serving cell base station, the position of the serving cell base station, and the position of the first neighboring cell base station;

[0205] a fourth determining submodule, configured to determine, based on the spatial position relationship, a first actual direction angle of a line connecting the position of the first sampling point and the first neighboring base station relative to a target direction;

[0206] a fifth determination submodule, configured to determine, based on the first actual direction angle and multiple actual direction angles of multiple sub-beams in the first neighboring area relative to the target direction, a sub-beam used by the first neighboring area covering the location of the first sampling point;

[0207] The sub-beam corresponding to the minimum angle difference between the multiple actual direction angles and the first actual direction angle is the sub-beam used by the first neighboring area to cover the first sampling point.

[0208] Optionally, the construction submodule includes:

[0209] a sixth determination submodule, configured to determine, based on an actual direction angle of a location of the first sampling point relative to the serving cell base station, the location of the serving cell base station, and the location of the first neighboring cell base station, a first distance between the serving cell base station and the first neighboring cell base station, a target direction angle corresponding to a line connecting the serving cell base station and the first neighboring cell base station, and a second distance between the location of the first sampling point and the serving cell base station;

[0210] a seventh determination submodule, configured to determine a first angle by which a line connecting the position of the first sampling point and the first neighboring base station is rotated relative to a line connecting the serving cell base station and the first neighboring base station based on the first distance, the target direction angle, the second distance, and an actual direction angle of the position of the first sampling point relative to the serving cell base station;

[0211] The fourth determining submodule is specifically configured to:

[0212] Based on the first angle, a first actual direction angle of a line connecting the position of the first sampling point and the first neighboring base station relative to the target direction is determined.

[0213] Optionally, the first determining module includes:

[0214] An acquisition submodule, configured to acquire wireless resource configuration information, wherein the wireless resource configuration information includes cell configuration parameters and sampling point measurement report information;

[0215] an identification submodule, configured to identify a serving cell to which a sampling point belongs based on an association between the target information in the configuration parameters and the target information in the sampling point measurement report information;

[0216] The target information includes at least one of frequency and physical cell identifier (PCI) information.

[0217] The sub-beam identification device can realize Figure 1 The various processes implemented in the method embodiment can achieve the same technical effect, and to avoid repetition, they will not be described here.

[0218] It should be noted that the electronic device provided in the embodiments of this application is capable of executing the above-described sub-beam identification device. Therefore, all implementations of the above-described sub-beam identification device and method embodiments are applicable to the electronic device and can achieve the same or similar beneficial effects. To avoid repetition, this embodiment will not be further described.

[0219] The embodiment of the present application also provides an electronic device. Since the principle of solving the problem by the electronic device is similar to the sub-beam identification method in the embodiment of the present application, the implementation of the electronic device can refer to the implementation of the method, and the repeated parts will not be repeated. Figure 10 As shown, the electronic device of the embodiment of the present application includes: a processor 500, which is used to read the program in the memory 520 and execute the following process:

[0220] Determine, based on pre-acquired radio resource configuration information, a serving cell to which the sampling point belongs, and identify a serving sub-beam corresponding to the sampling point in the serving cell;

[0221] Determine a target sub-beam in the serving sub-beam that meets a preset overlapping coverage condition, and obtain a sampling point set and a neighboring area set corresponding to the target sub-beam;

[0222] A sub-beam used by a first neighboring area covering a location where a first sampling point is located is identified, where the first neighboring area is a neighboring area in the neighboring area set, and the first sampling point is any sampling point in the sampling point set.

[0223] Among them, Figure 5 In the embodiment, the bus architecture may include any number of interconnected buses and bridges, specifically linking together various circuits of one or more processors represented by processor 500 and memory represented by memory 520. The bus architecture may also link together various other circuits such as peripheral devices, voltage regulators, and power management circuits, which are all well known in the art and therefore will not be described further herein. The bus interface provides an interface. The transceiver 510 may be a plurality of components, i.e., a transmitter and a transceiver, providing a unit for communicating with various other devices on a transmission medium. The processor 500 is responsible for managing the bus architecture and general processing, and the memory 520 may store data used by the processor 500 when performing operations.

[0224] Optionally, the overlapping coverage condition includes at least one of the following:

[0225] The number of overlapping coverage neighboring cells corresponding to the second sampling point position covered by the target sub-beam is greater than or equal to a first preset value, wherein the second sampling point is any sampling point in the serving cell, and when a difference between a reference signal received power of the serving cell and a reference signal received power of a neighboring cell corresponding to the second sampling point is greater than or equal to a preset threshold value, the neighboring cell is the overlapping coverage neighboring cell;

[0226] A ratio of the number of third sampling points covered by the target sub-beam to the number of fourth sampling points is greater than a second preset value, wherein the fourth sampling points are all sampling points covered by the target sub-beam, and the third sampling points are sampling points among the fourth sampling points that have the overlapping coverage neighboring area.

[0227] Optionally, the processor 500 is further configured to read a program in the memory 520 to execute the step of: the serving cell includes a fifth sampling point; and the step of identifying a serving sub-beam corresponding to the sampling point in the serving cell includes:

[0228] Determining, in the first sub-beam, sub-beam information of the fifth sampling point in the horizontal direction based on a horizontal normal direction of the serving cell, a horizontal angle of arrival of the fifth sampling point, and an actual horizontal direction angle of a first sub-beam of the serving cell in the horizontal direction, where the number of the first sub-beams is at least two;

[0229] Determining, in the second sub-beam, sub-beam information of the fifth sampling point in the vertical direction based on a vertical normal direction of the serving cell, a vertical angle of arrival of the fifth sampling point, and an actual vertical downtilt angle of a second sub-beam of the serving cell in the vertical direction, where the number of the second sub-beams is at least two;

[0230] Based on the sub-beam information in the horizontal direction and the sub-beam information in the vertical direction, a serving sub-beam covering the location of the fifth sampling point is determined.

[0231] Optionally, the sub-beam information of the fifth sampling point in the horizontal direction is information of a sub-beam corresponding to an angle having a minimum difference between a first actual horizontal direction angle and a second actual horizontal direction angle, wherein the first actual horizontal direction angle is at least two actual horizontal direction angles of at least two of the first sub-beams relative to a first target direction, and the second actual horizontal direction angle is an actual horizontal direction angle of a line connecting a location of the fifth sampling point and the serving cell base station relative to the first target direction; and / or,

[0232] The sub-beam information of the fifth sampling point in the vertical direction is information of the sub-beam corresponding to the angle having the smallest difference between the first actual vertical downtilt angle and the second actual vertical downtilt angle, wherein the first actual vertical downtilt angle is at least two actual vertical downtilt angles of at least two of the second sub-beams relative to the second target direction, and the second actual vertical downtilt angle is the actual vertical downtilt angle of a line connecting the position of the fifth sampling point and the serving cell base station relative to the second target direction.

[0233] Optionally, the actual horizontal direction angle of the first sub-beam corresponding to the serving cell is the sum of the direction angle of the serving cell and the direction angle of the first sub-beam;

[0234] The actual vertical downtilt angle of the second sub-beam corresponding to the serving cell is the sum of the electrical downtilt angle of the serving cell, the mechanical downtilt angle of the serving cell and the downtilt angle of the second sub-beam.

[0235] Optionally, the processor 500 is further configured to read a program in the memory 520 to execute the process of identifying a sub-beam used by a first neighboring cell covering a location where the first sampling point is located, including:

[0236] Establishing a spatial position relationship among the first sampling point, the serving cell base station, and the first neighboring cell base station based on an actual direction angle of the first sampling point relative to the serving cell base station, the position of the serving cell base station, and the position of the first neighboring cell base station;

[0237] Based on the spatial position relationship, determine a first actual direction angle of a line connecting the position of the first sampling point and the first neighboring base station relative to a target direction;

[0238] Determining, based on the first actual direction angle and multiple actual direction angles of multiple sub-beams in the first neighboring area relative to the target direction, a sub-beam used by the first neighboring area covering the location of the first sampling point;

[0239] The sub-beam corresponding to the minimum angle difference between the multiple actual direction angles and the first actual direction angle is the sub-beam used by the first neighboring area to cover the first sampling point.

[0240] Optionally, the processor 500 is further configured to read a program in the memory 520 and execute the step of constructing a spatial position relationship between the first sampling point, the serving cell base station, and the first neighboring cell base station based on the actual direction angle of the location of the first sampling point relative to the serving cell base station, the location of the serving cell base station, and the location of the first neighboring cell base station, including:

[0241] Determine, based on an actual direction angle of the first sampling point relative to the serving base station, the location of the serving base station, and the location of the first neighboring base station, a first distance between the serving base station and the first neighboring base station, a target direction angle corresponding to a line connecting the serving base station and the first neighboring base station, and a second distance between the first sampling point and the serving base station.

[0242] Determine, based on the first distance, the target direction angle, the second distance, and the actual direction angle of the first sampling point relative to the serving cell base station, a first rotation angle of a line connecting the first sampling point and the first neighboring cell base station relative to a line connecting the serving cell base station and the first neighboring cell base station;

[0243] The determining, based on the spatial position relationship, a first actual direction angle of a line connecting the position of the first sampling point and the first neighboring base station relative to a target direction includes:

[0244] Based on the first angle, a first actual direction angle of a line connecting the position of the first sampling point and the first neighboring base station relative to the target direction is determined.

[0245] Optionally, the processor 500 is further configured to read a program in the memory 520 and execute the process of determining the serving cell to which the sampling point belongs based on the pre-acquired radio resource configuration information, including:

[0246] Acquiring wireless resource configuration information, where the wireless resource configuration information includes cell configuration parameters and sampling point measurement report information;

[0247] identifying a serving cell to which the sampling point belongs according to an association relationship between the target information in the configuration parameters and the target information in the sampling point measurement report information;

[0248] The target information includes at least one of frequency and physical cell identifier (PCI) information.

[0249] The electronic device provided in the embodiment of the present application can execute the above method embodiment, and its implementation principle and technical effects are similar, which will not be repeated in this embodiment.

[0250] The present application also provides a computer-readable storage medium storing a computer program. When executed by a processor, the computer program implements the various processes of the aforementioned embodiment of the sub-beam identification method, achieving the same technical effects. To avoid repetition, the details are omitted here. The computer-readable storage medium may be, for example, a read-only memory (ROM), a random access memory (RAM), a magnetic disk, or an optical disk.

[0251] The present application also provides a computer program product including computer instructions, which, when executed by a processor, implement the above Figure 1 The various processes of the method embodiment shown can achieve the same technical effect, and to avoid repetition, they will not be described here.

[0252] It should be noted that, in this document, the terms "comprises," "includes," or any other variations thereof are intended to encompass non-exclusive inclusion, such that a process, method, article, or apparatus comprising a series of elements includes not only those elements but also other elements not explicitly listed, or elements inherent to such process, method, article, or apparatus. In the absence of further limitations, an element defined by the phrase "comprising a ..." does not exclude the presence of other identical elements in the process, method, article, or apparatus comprising the element.

[0253] Through the description of the above implementation methods, those skilled in the art can clearly understand that the above-mentioned embodiment methods can be implemented by means of software plus the necessary general hardware platform, and of course can also be implemented by hardware, but in many cases the former is a better implementation method. Based on this understanding, the technical solution of the present application, or the part that contributes to the prior art, can be embodied in the form of a software product, which is stored in a storage medium (such as ROM / RAM, magnetic disk, optical disk), and includes a number of instructions for enabling a terminal (which can be a mobile phone, computer, server, air conditioner, or network device, etc.) to execute the methods described in each embodiment of the present application.

[0254] The embodiments of the present application are described above in conjunction with the accompanying drawings, but the present application is not limited to the above-mentioned specific implementation methods. The above-mentioned specific implementation methods are merely illustrative and not restrictive. Under the guidance of this application, ordinary technicians in this field can also make many forms without departing from the purpose of this application and the scope of protection of the claims, all of which are within the protection of this application.

Claims

1. A method for identifying a sub-beam, characterized in that: include: Determine, based on pre-acquired radio resource configuration information, a serving cell to which the sampling point belongs, and identify a serving sub-beam corresponding to the sampling point in the serving cell; Determine a target sub-beam in the serving sub-beam that meets a preset overlapping coverage condition, and obtain a sampling point set and a neighboring area set corresponding to the target sub-beam; A sub-beam used by a first neighboring area covering a location where a first sampling point is located is identified, where the first neighboring area is a neighboring area in the neighboring area set, and the first sampling point is any sampling point in the sampling point set.

2. The method according to claim 1, characterized in that The overlapping coverage condition includes at least one of the following: The number of overlapping coverage neighboring cells corresponding to the second sampling point position covered by the target sub-beam is greater than or equal to a first preset value, wherein the second sampling point is any sampling point in the serving cell, and when a difference between a reference signal received power of the serving cell and a reference signal received power of a neighboring cell corresponding to the second sampling point is greater than or equal to a preset threshold value, the neighboring cell is the overlapping coverage neighboring cell; A ratio of the number of third sampling points covered by the target sub-beam to the number of fourth sampling points is greater than a second preset value, wherein the fourth sampling points are all sampling points covered by the target sub-beam, and the third sampling points are sampling points among the fourth sampling points that have the overlapping coverage neighboring area.

3. The method according to claim 1, characterized in that The serving cell includes a fifth sampling point; The identifying a serving sub-beam corresponding to a sampling point in the serving cell includes: Determining, in the first sub-beam, sub-beam information of the fifth sampling point in the horizontal direction based on a horizontal normal direction of the serving cell, a horizontal angle of arrival of the fifth sampling point, and an actual horizontal direction angle of a first sub-beam of the serving cell in the horizontal direction, where the number of the first sub-beams is at least two; Determining, in the second sub-beam, sub-beam information of the fifth sampling point in the vertical direction based on a vertical normal direction of the serving cell, a vertical angle of arrival of the fifth sampling point, and an actual vertical downtilt angle of a second sub-beam of the serving cell in the vertical direction, where the number of the second sub-beams is at least two; Based on the sub-beam information in the horizontal direction and the sub-beam information in the vertical direction, a serving sub-beam covering the location of the fifth sampling point is determined.

4. The method according to claim 3, characterized in that The sub-beam information of the fifth sampling point in the horizontal direction is information of the sub-beam corresponding to the angle having the smallest difference between the first actual horizontal direction angle and the second actual horizontal direction angle, wherein the first actual horizontal direction angle is at least two actual horizontal direction angles of at least two of the first sub-beams relative to a first target direction, and the second actual horizontal direction angle is the actual horizontal direction angle of a line connecting the location of the fifth sampling point and the serving cell base station relative to the first target direction; and / or The sub-beam information of the fifth sampling point in the vertical direction is information of the sub-beam corresponding to the angle having the smallest difference between the first actual vertical downtilt angle and the second actual vertical downtilt angle, wherein the first actual vertical downtilt angle is at least two actual vertical downtilt angles of at least two of the second sub-beams relative to the second target direction, and the second actual vertical downtilt angle is the actual vertical downtilt angle of a line connecting the position of the fifth sampling point and the serving cell base station relative to the second target direction.

5. The method according to claim 3, characterized in that The actual horizontal direction angle of the first sub-beam corresponding to the serving cell is the sum of the direction angle of the serving cell and the direction angle of the first sub-beam; The actual vertical downtilt angle of the second sub-beam corresponding to the serving cell is the sum of the electrical downtilt angle of the serving cell, the mechanical downtilt angle of the serving cell and the downtilt angle of the second sub-beam.

6. The method according to claim 1, characterized in that The identifying a sub-beam used by a first neighboring cell covering a location where the first sampling point is located includes: Establishing a spatial position relationship among the first sampling point, the serving cell base station, and the first neighboring cell base station based on an actual direction angle of the first sampling point relative to the serving cell base station, the position of the serving cell base station, and the position of the first neighboring cell base station; Based on the spatial position relationship, determine a first actual direction angle of a line connecting the position of the first sampling point and the first neighboring base station relative to a target direction; Determining, based on the first actual direction angle and multiple actual direction angles of multiple sub-beams in the first neighboring area relative to the target direction, a sub-beam used by the first neighboring area covering the location of the first sampling point; The sub-beam corresponding to the minimum angle difference between the multiple actual direction angles and the first actual direction angle is the sub-beam used by the first neighboring area to cover the first sampling point.

7. The method according to claim 6, characterized in that The establishing of a spatial position relationship between the first sampling point, the serving cell base station, and the first neighboring cell base station based on an actual direction angle of the first sampling point relative to the serving cell base station, the position of the serving cell base station, and the position of the first neighboring cell base station includes: Determine, based on an actual direction angle of the first sampling point relative to the serving base station, the location of the serving base station, and the location of the first neighboring base station, a first distance between the serving base station and the first neighboring base station, a target direction angle corresponding to a line connecting the serving base station and the first neighboring base station, and a second distance between the first sampling point and the serving base station. Determine, based on the first distance, the target direction angle, the second distance, and the actual direction angle of the first sampling point relative to the serving cell base station, a first rotation angle of a line connecting the first sampling point and the first neighboring cell base station relative to a line connecting the serving cell base station and the first neighboring cell base station; The determining, based on the spatial position relationship, a first actual direction angle of a line connecting the position of the first sampling point and the first neighboring base station relative to a target direction includes: Based on the first angle, a first actual direction angle of a line connecting the position of the first sampling point and the first neighboring base station relative to the target direction is determined.

8. The method according to claim 1, characterized in that The determining, based on the pre-acquired radio resource configuration information, of the serving cell to which the sampling point belongs includes: Acquiring wireless resource configuration information, where the wireless resource configuration information includes cell configuration parameters and sampling point measurement report information; identifying a serving cell to which the sampling point belongs according to an association relationship between the target information in the configuration parameters and the target information in the sampling point measurement report information; The target information includes at least one of frequency and physical cell identifier (PCI) information.

9. A sub-beam identification device, characterized in that: include: A first determining module is configured to determine a serving cell to which the sampling point belongs based on pre-acquired radio resource configuration information, and identify a serving sub-beam corresponding to the sampling point in the serving cell; A second determination module is configured to determine a target sub-beam in the serving sub-beam that meets a preset overlapping coverage condition, and obtain a sampling point set and a neighboring area set corresponding to the target sub-beam; An identification module is configured to identify a sub-beam used by a first neighboring area covering a location where a first sampling point is located, where the first neighboring area is a neighboring area in the neighboring area set, and the first sampling point is any sampling point in the sampling point set.

10. An electronic device, characterized in that: include: A processor, a memory, and a program stored in the memory and executable on the processor, wherein when the program is executed by the processor, the steps of the sub-beam identification method according to any one of claims 1 to 8 are implemented.

11. A computer-readable storage medium, characterized in that The computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, the steps of the sub-beam identification method according to any one of claims 1 to 8 are implemented.

12. A computer program product, characterized in that The method comprises computer instructions, which, when executed by a processor, implement the steps of the sub-beam identification method according to any one of claims 1 to 8.

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