Data storage reliability testing method and system based on solid state drive

Abstract

The present application provides a data storage reliability testing method and system based on a solid-state drive. The method includes: performing a data storage reliability test on a target solid-state drive and extracting reliability index data; processing the reliability index data to obtain a reliability compliance coefficient; obtaining environmental characteristic data of the test area and processing the data to obtain an environmental interference coefficient; processing the reliability compliance coefficient in combination with the environmental interference coefficient to obtain a corrected reliability compliance coefficient, and determining whether the data storage reliability meets the standard; if the data storage reliability of the target solid-state drive does not meet the standard, performing optimization measures on the target solid-state drive, thereby realizing a data storage reliability testing technology based on a solid-state drive.

Description

Technical Field

[0001] The present application relates to the technical field of solid-state hard disks, and in particular to a data storage reliability testing method and system based on solid-state hard disks. Background Art

[0002] With the rapid development of information technology, solid-state drives (SSDs) have been widely used in the data storage field due to their advantages such as high-speed reading and writing, low power consumption, and strong shock resistance. However, the data storage reliability of SSDs is affected by many factors, including hardware performance and working environment. At present, traditional SSD data storage reliability testing methods often only test the performance indicators of the SSD itself, ignoring the impact of the test environment on its reliability, resulting in a deviation between the test results and the reliability in actual usage scenarios. At the same time, when evaluating the reliability of SSDs, existing technologies lack a comprehensive quantitative evaluation of reliability indicators and effective prediction and processing of potential risks. Therefore, they cannot provide users with comprehensive and accurate reliability evaluation results and are difficult to meet actual application needs.

[0003] In response to the above problems, effective technical solutions are urgently needed. Summary of the Invention

[0004] The purpose of the present application is to provide a data storage reliability testing method and system based on a solid-state hard drive, which can perform a data storage reliability test on a target solid-state hard drive and extract reliability index data; process the reliability index data to obtain a reliability calibration coefficient; obtain environmental characteristic data of the test area and process it to obtain an environmental interference coefficient; process the reliability calibration coefficient in combination with the environmental interference coefficient to obtain a corrected reliability calibration coefficient, and judge whether the data storage reliability meets the standard; if the data storage reliability of the target solid-state hard drive does not meet the standard, perform optimization measures on the target solid-state hard drive, thereby realizing a technology for data storage reliability testing based on a solid-state hard drive.

[0005] The present application also provides a method for testing the reliability of data storage based on a solid-state drive, comprising the following steps:

[0006] Perform data storage reliability testing on the target solid-state drive and extract reliability index data;

[0007] Processing the reliability index data to obtain a reliability compliance coefficient;

[0008] Obtain environmental characteristic data of the test area and process it to obtain the environmental interference coefficient;

[0009] Processing the reliability scale coefficient in combination with the environmental interference coefficient to obtain a revised reliability scale coefficient, and determining whether the data storage reliability meets the standards;

[0010] If the data storage reliability of the target solid state drive does not meet the requirements, optimization measures are performed on the target solid state drive.

[0011] Optionally, in the solid-state drive-based data storage reliability testing method described in the present application, performing a data storage reliability test on a target solid-state drive and extracting reliability index data includes:

[0012] Perform data storage reliability test on the target solid-state drive and record the test result data;

[0013] The reliability test includes abnormal power failure test, mixed load stress test and instruction response time test;

[0014] Reliability index data is extracted based on the test result data, including data loss rate, file system error rate, capacitor power supply time compliance rate, and firmware response time compliance rate.

[0015] Optionally, in the solid-state hard drive-based data storage reliability testing method described in the present application, the processing according to the reliability index data to obtain the reliability scale coefficient includes:

[0016] A reliability compliance coefficient is obtained by performing weighted processing according to the data loss rate, the file system error rate, the capacitor power supply time compliance rate, and the firmware response time compliance rate.

[0017] Optionally, in the solid-state hard drive-based data storage reliability testing method described in the present application, the step of obtaining environmental characteristic data of the test area and processing the data to obtain the environmental interference coefficient includes:

[0018] Obtain environmental characteristic data of the test area, including temperature, humidity, electromagnetic interference, and vibration amplitude;

[0019] The temperature, humidity, electromagnetic interference and vibration amplitude are processed by a preset environmental factor interference evaluation model to obtain an environmental interference coefficient.

[0020] Optionally, in the solid-state drive-based data storage reliability testing method described in the present application, processing the reliability scale-up coefficient in combination with the environmental interference coefficient to obtain a corrected reliability scale-up coefficient, and determining whether the data storage reliability meets the standard includes:

[0021] Correcting the reliability coefficient according to the environmental interference coefficient to obtain a corrected reliability coefficient;

[0022] Performing a threshold comparison based on the revised reliability attainment coefficient and a preset revised reliability attainment threshold;

[0023] Determine whether data storage reliability meets the standards based on the threshold comparison results;

[0024] If the revised reliability compliance coefficient is greater than or equal to a preset revised reliability compliance threshold, the data storage reliability meets the standard;

[0025] If the corrected reliability compliance coefficient is less than a preset corrected reliability compliance threshold, the data storage reliability does not meet the standards.

[0026] Optionally, in the solid-state drive-based data storage reliability testing method described in the present application, if the data storage reliability of the target solid-state drive does not meet the standard, performing optimization measures on the target solid-state drive includes:

[0027] If the data storage reliability of the target solid-state drive does not meet the requirements, obtaining the grade of the target solid-state drive;

[0028] The grades include consumer, enterprise and industrial;

[0029] Execute corresponding optimization measures on the target solid-state drive according to the level.

[0030] In a second aspect, the present application provides a data storage reliability testing system based on a solid-state drive, the system comprising: a memory and a processor, the memory comprising a program for a data storage reliability testing method based on a solid-state drive, the program for a data storage reliability testing method based on a solid-state drive, when executed by the processor, implementing the following steps:

[0031] Perform data storage reliability testing on the target solid-state drive and extract reliability index data;

[0032] Processing the reliability index data to obtain a reliability compliance coefficient;

[0033] Obtain environmental characteristic data of the test area and process it to obtain the environmental interference coefficient;

[0034] Processing the reliability scale coefficient in combination with the environmental interference coefficient to obtain a revised reliability scale coefficient, and determining whether the data storage reliability meets the standards;

[0035] If the data storage reliability of the target solid state drive does not meet the requirements, optimization measures are performed on the target solid state drive.

[0036] Optionally, in the solid-state drive-based data storage reliability test system described in the present application, performing a data storage reliability test on a target solid-state drive and extracting reliability index data includes:

[0037] Perform data storage reliability test on the target solid-state drive and record the test result data;

[0038] The reliability test includes abnormal power failure test, mixed load stress test and instruction response time test;

[0039] Reliability index data is extracted based on the test result data, including data loss rate, file system error rate, capacitor power supply time compliance rate, and firmware response time compliance rate.

[0040] Optionally, in the solid-state hard drive-based data storage reliability testing system described in the present application, the processing according to the reliability index data to obtain a reliability compliance coefficient includes:

[0041] A reliability compliance coefficient is obtained by performing weighted processing according to the data loss rate, the file system error rate, the capacitor power supply time compliance rate, and the firmware response time compliance rate.

[0042] Optionally, in the solid-state hard drive-based data storage reliability testing system described in the present application, the step of obtaining environmental characteristic data of the test area and processing the data to obtain the environmental interference coefficient includes:

[0043] Obtain environmental characteristic data of the test area, including temperature, humidity, electromagnetic interference, and vibration amplitude;

[0044] The temperature, humidity, electromagnetic interference and vibration amplitude are processed by a preset environmental factor interference evaluation model to obtain an environmental interference coefficient.

[0045] From the above, it can be seen that the data storage reliability testing method and system based on solid-state hard drives provided in the present application performs a data storage reliability test on the target solid-state hard drive and extracts reliability index data; processes the reliability index data to obtain a reliability scale coefficient; obtains environmental characteristic data of the test area and processes it to obtain an environmental interference coefficient; processes the reliability scale coefficient in combination with the environmental interference coefficient to obtain a corrected reliability scale coefficient, and determines whether the data storage reliability meets the standards; if the data storage reliability of the target solid-state hard drive does not meet the standards, performs optimization measures on the target solid-state hard drive, thereby realizing a technology for data storage reliability testing based on solid-state hard drives.

[0046] Other features and advantages of the present application will be described in the following description, and in part will become apparent from the description, or understood by practicing the embodiments of the present application. The objectives and other advantages of the present application can be achieved and obtained through the structures particularly pointed out in the written description and the accompanying drawings. BRIEF DESCRIPTION OF THE DRAWINGS

[0047] In order to more clearly illustrate the technical solutions of the embodiments of the present application, the following is a brief introduction to the drawings required for use in the embodiments of the present application. It should be understood that the following drawings only show certain embodiments of the present application and therefore should not be regarded as limiting the scope. For ordinary technicians in this field, other relevant drawings can be obtained based on these drawings without paying any creative work.

[0048] Figure 1 A flowchart of a method for testing the reliability of data storage based on a solid-state drive provided in an embodiment of the present application;

[0049] Figure 2 A flowchart of extracting reliability index data for a data storage reliability testing method based on a solid-state drive provided in an embodiment of the present application;

[0050] Figure 3 A flow chart of obtaining an environmental interference coefficient for a method for testing the reliability of data storage on a solid-state drive provided in an embodiment of the present application;

[0051] Figure 4 A flow chart of a method for testing the reliability of data storage based on a solid-state drive provided in an embodiment of the present application for determining whether the data storage reliability meets the requirements. DETAILED DESCRIPTION

[0052] The technical solutions in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are only a part of the embodiments of the present application, rather than all of the embodiments. The components of the embodiments of the present application generally described and shown in the drawings here can be arranged and designed in various different configurations. Therefore, the following detailed description of the embodiments of the present application provided in the drawings is not intended to limit the scope of the application for protection, but merely represents the selected embodiments of the present application. Based on the embodiments of the present application, all other embodiments obtained by those skilled in the art without making creative work fall within the scope of protection of the present application.

[0053] It should be noted that similar reference numerals and letters represent similar items in the following drawings. Therefore, once an item is defined in one drawing, it does not need to be further defined or explained in subsequent drawings. At the same time, in the description of this application, the terms "first", "second", etc. are only used to distinguish the description and should not be understood as indicating or implying relative importance.

[0054] Please refer to Figure 1 , Figure 1This is a flow chart of a method for testing the reliability of data storage based on a solid-state drive (SSD) in some embodiments of the present application. This method is used in terminal devices such as computers and mobile phones. This method includes the following steps:

[0055] S11, performing a data storage reliability test on the target solid-state drive and extracting reliability index data;

[0056] S12, processing the reliability index data to obtain a reliability compliance coefficient;

[0057] S13, obtaining environmental characteristic data of the test area, and processing to obtain an environmental interference coefficient;

[0058] S14, processing the reliability scale coefficient in combination with the environmental interference coefficient to obtain a corrected reliability scale coefficient, and determining whether the data storage reliability meets the standard;

[0059] S15: If the data storage reliability of the target solid-state drive does not meet the requirements, perform optimization measures on the target solid-state drive.

[0060] It should be noted that a data storage reliability test is performed on the target solid-state hard drive, including an abnormal power-off test, a mixed load stress test, and an instruction response time test. Reliability index data is then extracted based on the test results, including data loss rate, file system error rate, capacitor power supply time compliance rate, and firmware response time compliance rate. These data are weighted to obtain a reliability compliance coefficient. Simultaneously, environmental characteristic data of the test area are obtained, and the environmental interference coefficient is obtained. The reliability compliance coefficient is then corrected to obtain a corrected reliability compliance coefficient, making the data more accurate. The coefficient is then compared with a preset threshold to determine whether the data storage reliability meets the standard. If the data storage reliability of the target solid-state hard drive does not meet the standard, optimization measures are performed on the target solid-state hard drive, thereby realizing a technology for data storage reliability testing based on solid-state hard drives.

[0061] Please refer to Figure 2 , Figure 2 The flowchart of extracting reliability index data of a data storage reliability test method based on a solid-state drive in some embodiments of the present application is as follows. According to an embodiment of the present invention, performing a data storage reliability test on a target solid-state drive and extracting reliability index data includes:

[0062] S21, performing a data storage reliability test on the target solid-state drive and recording the test result data;

[0063] S22, the reliability test includes abnormal power failure test, mixed load stress test and command response time test;

[0064] S23. The reliability test includes an abnormal power failure test, a mixed load stress test, and a command response time test.

[0065] It should be noted that a data storage reliability test is performed on the target solid-state drive, and the test result data is recorded. In the abnormal power failure test, a professional power control device is used to simulate the scenario of a sudden power failure when the solid-state drive is performing data reading and writing operations. After each power failure, the device is restarted, the integrity of the stored data is checked, and detailed information such as data loss and whether there are errors in the file system is recorded. To ensure the accuracy and reliability of the test results, the test needs to be repeated many times, and each test result is recorded in detail and compared and analyzed; the mixed load stress test continuously applies pressure to the solid-state drive by running multiple different types of read and write tasks at the same time, such as sequential read and write, random read and write, large file transfer, frequent small file operations, etc., with different read and write ratios and rate combinations. During the test, the working status of the solid-state drive is monitored in real time, including temperature, transmission rate, error log and other information, and whether data storage anomalies occur under long-term high-load operation; instruction response time test It sends different types of instructions to the solid-state drive, such as read instructions, write instructions, delete instructions, etc., and uses high-precision time measurement tools to accurately record the time from the issuance of the instruction to the completion of the response by the solid-state drive. The same instruction is sent repeatedly, and the average, maximum and minimum values ​​of the response time are counted to evaluate the performance of the solid-state drive in instruction processing; after completing all the above tests, key reliability indicator data must be extracted based on the detailed test results data. Among them, the data loss rate is obtained by calculating the proportion of the amount of data lost during abnormal power-off tests to the total amount of stored data; the file system error rate is the ratio of the number of file system errors to the total number of operations during the statistical test; the capacitor power supply time compliance rate needs to compare the actual power supply time of the solid-state drive capacitor with the standard power supply time under abnormal power-off conditions, and calculate the proportion of the number of compliance times to the total number of tests; the firmware response time compliance rate is the number of times the firmware response time meets the standard requirements in the instruction response time test divided by the total number of tests.

[0066] According to an embodiment of the present invention, the processing according to the reliability index data to obtain a reliability scale coefficient includes:

[0067] A reliability compliance coefficient is obtained by performing weighted processing according to the data loss rate, the file system error rate, the capacitor power supply time compliance rate, and the firmware response time compliance rate.

[0068] It should be noted that in the data storage reliability evaluation system of solid-state drives, it is difficult to fully reflect the overall reliability level by only analyzing individual indicators such as data loss rate, file system error rate, capacitor power supply time compliance rate, and firmware response time compliance rate. Therefore, these indicators are integrated into a quantitative reliability compliance coefficient through weighted processing, where the weighted processing adopts scientific methods such as the Analytic Hierarchy Process (AHP) and the Delphi method.

[0069] Please refer to Figure 3 , Figure 3 This is a flow chart of obtaining an environmental interference coefficient for a method for testing the reliability of data storage based on a solid-state drive in some embodiments of the present application. According to an embodiment of the present invention, obtaining environmental characteristic data of the test area and processing the obtained environmental interference coefficient include:

[0070] S31. Obtain environmental characteristic data of the test area, including temperature, humidity, electromagnetic interference, and vibration amplitude;

[0071] S32: Process the temperature, humidity, electromagnetic interference, and vibration amplitude using a preset environmental factor interference assessment model to obtain an environmental interference coefficient.

[0072] It should be noted that when conducting data storage reliability tests on solid-state drives, the environmental conditions of the test area will significantly affect the accuracy and reliability of the test results. Therefore, it is critical to obtain environmental characteristic data of the test area. These data include temperature, humidity, electromagnetic interference, and vibration amplitude. They are then processed according to a preset environmental factor interference assessment model to obtain an environmental interference coefficient. The construction of the preset environmental factor interference assessment model is based on a large amount of experimental data and industry standards. The model regards environmental factors such as temperature, humidity, electromagnetic interference, and vibration amplitude as independent variables. Through mathematical methods such as multiple regression analysis, the influence weight of each environmental factor on the data storage reliability of the solid-state drive is determined. The data of different environmental factors are weighted and summed according to their influence weights, and finally an environmental interference coefficient is obtained that can comprehensively reflect the degree of interference of the test area environment on the data storage reliability of the solid-state drive.

[0073] Please refer to Figure 4 , Figure 4 This is a flow chart for determining whether data storage reliability meets standards in a data storage reliability testing method based on a solid-state drive in some embodiments of the present application. According to embodiments of the present invention, processing the reliability scaled coefficient in combination with the environmental interference coefficient to obtain a corrected reliability scaled coefficient and determining whether data storage reliability meets standards includes:

[0074] S41, correcting the reliability scale coefficient according to the environmental interference coefficient to obtain a corrected reliability scale coefficient;

[0075] S42, performing a threshold comparison based on the revised reliability compliance coefficient and a preset revised reliability compliance threshold;

[0076] S43, judging whether the data storage reliability meets the standard based on the threshold comparison result;

[0077] S44: If the revised reliability compliance coefficient is greater than or equal to a preset revised reliability compliance threshold, the data storage reliability meets the standard;

[0078] S45: If the revised reliability compliance coefficient is less than a preset revised reliability compliance threshold, the data storage reliability does not meet the standards.

[0079] It should be noted that since environmental factors have a significant impact on equipment performance, it is necessary to correct the reliability coefficient according to the environmental interference coefficient to obtain a corrected reliability coefficient that is more suitable for the actual use scenario. The correction method can be achieved using the formula R 修正 = R×(1-k×C) for calculation, where R 修正 is the revised reliability scaling coefficient, R is the original reliability scaling coefficient, k is the environmental impact adjustment factor (0 < k < 1), which needs to be determined through a large number of experimental calibrations based on actual conditions), and C is the environmental interference coefficient. A threshold comparison is then performed based on the revised reliability scaling coefficient and the preset revised reliability scaling threshold. Whether the data storage reliability meets the standard is determined based on the threshold comparison result. If the revised reliability scaling coefficient is greater than or equal to the preset revised reliability scaling threshold, for example, the revised reliability scaling coefficient is 0.8 and the preset revised reliability scaling threshold is 0.75, then the data storage reliability meets the standard. If the revised reliability scaling coefficient is less than the preset revised reliability scaling threshold, for example, the revised reliability scaling coefficient is 0.6 and the preset revised reliability scaling threshold is 0.75, then the data storage reliability does not meet the standard.

[0080] According to an embodiment of the present invention, if the data storage reliability of the target solid-state drive does not meet the standard, performing optimization measures on the target solid-state drive includes:

[0081] If the data storage reliability of the target solid-state drive does not meet the requirements, obtaining the grade of the target solid-state drive;

[0082] The grades include consumer, enterprise and industrial;

[0083] Execute corresponding optimization measures on the target solid-state drive according to the level.

[0084] It should be noted that if the data storage reliability of the target SSD does not meet the requirements, it is necessary to determine the grade of the target SSD, whether it is consumer grade, enterprise grade, or industrial grade, and then perform corresponding optimization measures on the target SSD based on the grade;

[0085] It is worth mentioning that if the level is consumer level, the optimization measures include improving capacitor energy storage design, strengthening flash memory particle quality, improving main control chip design, improving power-off protection mechanism, strengthening error checking and recovery mechanism, and optimizing temperature and power consumption management. One or more; if the level is enterprise level, the optimization measures include double power-off protection mechanism, enterprise-level flash memory particles and hardware redundancy, industrial-level environment adaptation design, advanced error checking and data recovery, and enterprise-level scenario-specific optimization. One or more; if the level is industrial level, the optimization measures include upgrading main control chip and storage particles, enhancing power supply and protection circuit, heat dissipation and physical protection design, strengthening data protection algorithm, enhancing firmware reliability, and optimizing abnormal scenario processing.

[0086] According to an embodiment of the present invention, the further embodiment includes:

[0087] Monitor the target solid-state drive in real time and extract health indicator data, including wear count data, error correction count data, erase count data, read and write latency data, and throughput attenuation data;

[0088] Obtaining a health status index by processing the wear count data, error correction count data, erase and write count data, collected read and write delay data, and throughput attenuation data through a preset health status prediction model;

[0089] Performing a threshold comparison based on the health status index and a preset health status threshold;

[0090] If the health status index is less than the preset health status threshold, it is determined that the target solid state drive has a failure risk and needs to be inspected and maintained.

[0091] It should be noted that in the process of ensuring the stable operation of the target solid-state drive, real-time monitoring and extraction of its health status indicator data is a key link. For wear count data, the main control chip inside the solid-state drive will record the degree of wear of the NAND flash memory particles. Through a specific command interface, the test equipment can read the data regularly to reflect the use and loss of the flash memory particles; the error correction count data comes from the built-in error correction code (ECC) module of the solid-state drive. This module automatically detects and corrects errors during the data reading and writing process, counts the number of error corrections and gives feedback, thereby reflecting the stability of data transmission; the erase and write count data is counted by the firmware of the solid-state drive. Each time a data erase and write operation is completed, the count will increase accordingly. It is an important basis for measuring the life of the flash memory; when collecting read and write delay data, standard read and write instructions are sent to the solid-state drive, and high-precision time measurement tools are used to record the time interval from the issuance of the instruction to the completion of data transmission. The average value of the measurements is taken to ensure data accuracy; the throughput attenuation data is obtained by regularly measuring the read and write data transfer rates of the solid-state drive under the same test conditions, and comparing them with the initial performance data to calculate the performance attenuation ratio; then the above data is processed through a preset health status prediction model to obtain a health status index; among them, the health status prediction model is a neural network model, which is trained on the basis of a large amount of historical wear count data, error correction count data, erase count data, collected read and write delay data, and throughput attenuation data to obtain a trained health status prediction model; then the health status index is compared with the preset health status threshold. The setting of the preset health status threshold needs to be combined with the type of solid-state drive, usage scenario and industry standards. If the health status index is less than the preset health status threshold, it is predicted that the target solid-state drive is at risk of failure and needs to be inspected and maintained.

[0092] In a second aspect, the present invention further discloses a data storage reliability testing system based on a solid-state drive, comprising a memory and a processor, wherein the memory includes a data storage reliability testing method program based on a solid-state drive, and when the data storage reliability testing method program based on a solid-state drive is executed by the processor, the following steps are implemented:

[0093] Perform data storage reliability testing on the target solid-state drive and extract reliability index data;

[0094] Processing the reliability index data to obtain a reliability compliance coefficient;

[0095] Obtain environmental characteristic data of the test area and process it to obtain the environmental interference coefficient;

[0096] Processing the reliability scale coefficient in combination with the environmental interference coefficient to obtain a revised reliability scale coefficient, and determining whether the data storage reliability meets the standards;

[0097] If the data storage reliability of the target solid state drive does not meet the requirements, optimization measures are performed on the target solid state drive.

[0098] It should be noted that a data storage reliability test is performed on the target solid-state hard drive, including an abnormal power-off test, a mixed load stress test, and an instruction response time test. Reliability index data is then extracted based on the test results, including data loss rate, file system error rate, capacitor power supply time compliance rate, and firmware response time compliance rate. These data are weighted to obtain a reliability compliance coefficient. Simultaneously, environmental characteristic data of the test area are obtained, and the environmental interference coefficient is obtained. The reliability compliance coefficient is then corrected to obtain a corrected reliability compliance coefficient, making the data more accurate. The coefficient is then compared with a preset threshold to determine whether the data storage reliability meets the standard. If the data storage reliability of the target solid-state hard drive does not meet the standard, optimization measures are performed on the target solid-state hard drive, thereby realizing a technology for data storage reliability testing based on solid-state hard drives.

[0099] According to an embodiment of the present invention, performing a data storage reliability test on a target solid-state drive and extracting reliability index data includes:

[0100] Perform data storage reliability test on the target solid-state drive and record the test result data;

[0101] The reliability test includes abnormal power failure test, mixed load stress test and instruction response time test;

[0102] The reliability test includes an abnormal power failure test, a mixed load stress test, and a command response time test.

[0103] It should be noted that a data storage reliability test is performed on the target solid-state drive, and the test result data is recorded. In the abnormal power failure test, a professional power control device is used to simulate the scenario of a sudden power failure when the solid-state drive is performing data reading and writing operations. After each power failure, the device is restarted, the integrity of the stored data is checked, and detailed information such as data loss and whether there are errors in the file system is recorded. To ensure the accuracy and reliability of the test results, the test needs to be repeated many times, and each test result is recorded in detail and compared and analyzed; the mixed load stress test continuously applies pressure to the solid-state drive by running multiple different types of read and write tasks at the same time, such as sequential read and write, random read and write, large file transfer, frequent small file operations, etc., with different read and write ratios and rate combinations. During the test, the working status of the solid-state drive is monitored in real time, including temperature, transmission rate, error log and other information, and whether data storage anomalies occur under long-term high-load operation; instruction response time test It sends different types of instructions to the solid-state drive, such as read instructions, write instructions, delete instructions, etc., and uses high-precision time measurement tools to accurately record the time from the issuance of the instruction to the completion of the response by the solid-state drive. The same instruction is sent repeatedly, and the average, maximum and minimum values ​​of the response time are counted to evaluate the performance of the solid-state drive in instruction processing; after completing all the above tests, key reliability indicator data must be extracted based on the detailed test results data. Among them, the data loss rate is obtained by calculating the proportion of the amount of data lost during abnormal power-off tests to the total amount of stored data; the file system error rate is the ratio of the number of file system errors to the total number of operations during the statistical test; the capacitor power supply time compliance rate needs to compare the actual power supply time of the solid-state drive capacitor with the standard power supply time under abnormal power-off conditions, and calculate the proportion of the number of compliance times to the total number of tests; the firmware response time compliance rate is the number of times the firmware response time meets the standard requirements in the instruction response time test divided by the total number of tests.

[0104] According to an embodiment of the present invention, the processing according to the reliability index data to obtain a reliability scale coefficient includes:

[0105] A reliability compliance coefficient is obtained by performing weighted processing according to the data loss rate, the file system error rate, the capacitor power supply time compliance rate, and the firmware response time compliance rate.

[0106] It should be noted that in the data storage reliability evaluation system of solid-state drives, it is difficult to fully reflect the overall reliability level by only analyzing individual indicators such as data loss rate, file system error rate, capacitor power supply time compliance rate, and firmware response time compliance rate. Therefore, these indicators are integrated into a quantitative reliability compliance coefficient through weighted processing, where the weighted processing adopts scientific methods such as the Analytic Hierarchy Process (AHP) and the Delphi method.

[0107] According to an embodiment of the present invention, the step of obtaining environmental characteristic data of the test area and processing the data to obtain the environmental interference coefficient includes:

[0108] Obtain environmental characteristic data of the test area, including temperature, humidity, electromagnetic interference, and vibration amplitude;

[0109] The temperature, humidity, electromagnetic interference and vibration amplitude are processed by a preset environmental factor interference evaluation model to obtain an environmental interference coefficient.

[0110] It should be noted that when conducting data storage reliability tests on solid-state drives, the environmental conditions of the test area will significantly affect the accuracy and reliability of the test results. Therefore, it is critical to obtain environmental characteristic data of the test area. These data include temperature, humidity, electromagnetic interference, and vibration amplitude. They are then processed according to a preset environmental factor interference assessment model to obtain an environmental interference coefficient. The construction of the preset environmental factor interference assessment model is based on a large amount of experimental data and industry standards. The model regards environmental factors such as temperature, humidity, electromagnetic interference, and vibration amplitude as independent variables. Through mathematical methods such as multiple regression analysis, the influence weight of each environmental factor on the data storage reliability of the solid-state drive is determined. The data of different environmental factors are weighted and summed according to their influence weights, and finally an environmental interference coefficient is obtained that can comprehensively reflect the degree of interference of the test area environment on the data storage reliability of the solid-state drive.

[0111] According to an embodiment of the present invention, the processing of the reliability scale-up coefficient in combination with the environmental interference coefficient to obtain a corrected reliability scale-up coefficient, and determining whether the data storage reliability meets the standards includes:

[0112] Correcting the reliability coefficient according to the environmental interference coefficient to obtain a corrected reliability coefficient;

[0113] Performing a threshold comparison based on the revised reliability attainment coefficient and a preset revised reliability attainment threshold;

[0114] Determine whether data storage reliability meets the standards based on the threshold comparison results;

[0115] If the revised reliability compliance coefficient is greater than or equal to a preset revised reliability compliance threshold, the data storage reliability meets the standard;

[0116] If the corrected reliability compliance coefficient is less than a preset corrected reliability compliance threshold, the data storage reliability does not meet the standards.

[0117] It should be noted that since environmental factors have a significant impact on equipment performance, it is necessary to correct the reliability coefficient according to the environmental interference coefficient to obtain a corrected reliability coefficient that is more suitable for the actual use scenario. The correction method can be achieved using the formula R 修正 = R×(1-k×C) for calculation, where R 修正 is the revised reliability scaling coefficient, R is the original reliability scaling coefficient, k is the environmental impact adjustment factor (0 < k < 1), which needs to be determined through a large number of experimental calibrations based on actual conditions), and C is the environmental interference coefficient. A threshold comparison is then performed based on the revised reliability scaling coefficient and the preset revised reliability scaling threshold. Whether the data storage reliability meets the standard is determined based on the threshold comparison result. If the revised reliability scaling coefficient is greater than or equal to the preset revised reliability scaling threshold, for example, the revised reliability scaling coefficient is 0.8 and the preset revised reliability scaling threshold is 0.75, then the data storage reliability meets the standard. If the revised reliability scaling coefficient is less than the preset revised reliability scaling threshold, for example, the revised reliability scaling coefficient is 0.6 and the preset revised reliability scaling threshold is 0.75, then the data storage reliability does not meet the standard.

[0118] According to an embodiment of the present invention, if the data storage reliability of the target solid-state drive does not meet the standard, performing optimization measures on the target solid-state drive includes:

[0119] If the data storage reliability of the target solid-state drive does not meet the requirements, obtaining the grade of the target solid-state drive;

[0120] The grades include consumer, enterprise and industrial;

[0121] Execute corresponding optimization measures on the target solid-state drive according to the level.

[0122] It should be noted that if the data storage reliability of the target SSD does not meet the requirements, it is necessary to determine the grade of the target SSD, whether it is consumer grade, enterprise grade, or industrial grade, and then perform corresponding optimization measures on the target SSD based on the grade;

[0123] It is worth mentioning that if the level is consumer level, the optimization measures include improving capacitor energy storage design, strengthening flash memory particle quality, improving main control chip design, improving power-off protection mechanism, strengthening error checking and recovery mechanism, and optimizing temperature and power consumption management. One or more; if the level is enterprise level, the optimization measures include double power-off protection mechanism, enterprise-level flash memory particles and hardware redundancy, industrial-level environment adaptation design, advanced error checking and data recovery, and enterprise-level scenario-specific optimization. One or more; if the level is industrial level, the optimization measures include upgrading main control chip and storage particles, enhancing power supply and protection circuit, heat dissipation and physical protection design, strengthening data protection algorithm, enhancing firmware reliability, and optimizing abnormal scenario processing.

[0124] According to an embodiment of the present invention, the further embodiment includes:

[0125] Monitor the target solid-state drive in real time and extract health indicator data, including wear count data, error correction count data, erase count data, read and write latency data, and throughput attenuation data;

[0126] Obtaining a health status index by processing the wear count data, error correction count data, erase and write count data, collected read and write delay data, and throughput attenuation data through a preset health status prediction model;

[0127] Performing a threshold comparison based on the health status index and a preset health status threshold;

[0128] If the health status index is less than the preset health status threshold, it is determined that the target solid state drive has a failure risk and needs to be inspected and maintained.

[0129] It should be noted that in the process of ensuring the stable operation of the target solid-state drive, real-time monitoring and extraction of its health status indicator data is a key link. For wear count data, the main control chip inside the solid-state drive will record the degree of wear of the NAND flash memory particles. Through a specific command interface, the test equipment can read the data regularly to reflect the use and loss of the flash memory particles; the error correction count data comes from the built-in error correction code (ECC) module of the solid-state drive. This module automatically detects and corrects errors during the data reading and writing process, counts the number of error corrections and gives feedback, thereby reflecting the stability of data transmission; the erase and write count data is counted by the firmware of the solid-state drive. Each time a data erase and write operation is completed, the count will increase accordingly. It is an important basis for measuring the life of the flash memory; when collecting read and write delay data, standard read and write instructions are sent to the solid-state drive, and high-precision time measurement tools are used to record the time interval from the issuance of the instruction to the completion of data transmission. The average value of the measurements is taken to ensure data accuracy; the throughput attenuation data is obtained by regularly measuring the read and write data transfer rates of the solid-state drive under the same test conditions, and comparing them with the initial performance data to calculate the performance attenuation ratio; then the above data is processed through a preset health status prediction model to obtain a health status index; among them, the health status prediction model is a neural network model, which is trained on the basis of a large amount of historical wear count data, error correction count data, erase count data, collected read and write delay data, and throughput attenuation data to obtain a trained health status prediction model; then the health status index is compared with the preset health status threshold. The setting of the preset health status threshold needs to be combined with the type of solid-state drive, usage scenario and industry standards. If the health status index is less than the preset health status threshold, it is predicted that the target solid-state drive is at risk of failure and needs to be inspected and maintained.

[0130] The present invention discloses a data storage reliability testing method and system based on a solid-state hard drive. The method performs a data storage reliability test on a target solid-state hard drive and extracts reliability index data; processes the reliability index data to obtain a reliability calibration coefficient; obtains environmental characteristic data of the test area and processes the data to obtain an environmental interference coefficient; processes the reliability calibration coefficient in combination with the environmental interference coefficient to obtain a corrected reliability calibration coefficient, and determines whether the data storage reliability meets the standards; if the data storage reliability of the target solid-state hard drive does not meet the standards, performs optimization measures on the target solid-state hard drive, thereby realizing a technology for data storage reliability testing based on a solid-state hard drive.

[0131] In the several embodiments provided in this application, it should be understood that the disclosed devices and methods can be implemented in other ways. The device embodiments described above are merely schematic. For example, the division of the units is merely a logical function division. In actual implementation, there may be other division methods, such as: multiple units or components can be combined, or can be integrated into another system, or some features can be ignored or not executed. In addition, the coupling, direct coupling, or communication connection between the components shown or discussed can be through some interfaces, and the indirect coupling or communication connection of the devices or units can be electrical, mechanical or other forms.

[0132] The units described above as separate components may or may not be physically separated, and the components displayed as units may or may not be physical units; they may be located in one place or distributed across multiple network units; some or all of the units may be selected according to actual needs to achieve the purpose of the scheme of this embodiment.

[0133] In addition, all functional units in the embodiments of the present invention may be integrated into one processing unit, or each unit may be separately used as a unit, or two or more units may be integrated into one unit; the above-mentioned integrated units may be implemented in the form of hardware or in the form of hardware plus software functional units.

[0134] Those skilled in the art will appreciate that all or part of the steps of the above-mentioned method embodiments may be implemented by hardware related to program instructions, and the aforementioned program may be stored in a readable storage medium. When the program is executed, the program executes the steps of the above-mentioned method embodiments. The aforementioned storage medium includes various media that can store program codes, such as mobile storage devices, read-only memories (ROMs), random access memories (RAMs), magnetic disks, or optical disks.

[0135] Alternatively, if the integrated units described above are implemented as software functional modules and sold or used as standalone products, they can also be stored on a readable storage medium. Based on this understanding, the technical solutions of the embodiments of the present invention, or the portion that contributes to the prior art, can be embodied in the form of a software product. This software product, stored on a storage medium, includes instructions for enabling a computer device (such as a personal computer, server, or network device) to execute all or part of the methods described in the various embodiments of the present invention. The aforementioned storage media include various media capable of storing program code, such as removable storage devices, ROM, RAM, magnetic disks, or optical disks.

Claims

1. A data storage reliability testing method based on a solid state drive, characterized in that: The following steps are involved: Perform data storage reliability testing on the target solid-state drive and extract reliability index data; Processing the reliability index data to obtain a reliability compliance coefficient; Obtain environmental characteristic data of the test area and process it to obtain the environmental interference coefficient; Processing the reliability scale coefficient in combination with the environmental interference coefficient to obtain a revised reliability scale coefficient, and determining whether the data storage reliability meets the standards; If the data storage reliability of the target solid-state drive does not meet the requirements, performing optimization measures on the target solid-state drive; The performing of a data storage reliability test on the target solid state drive and extracting reliability index data includes: Perform data storage reliability test on the target solid-state drive and record the test result data; The reliability test includes abnormal power failure test, mixed load stress test and instruction response time test; Extracting reliability indicator data based on the test result data, including data loss rate, file system error rate, capacitor power supply time compliance rate, and firmware response time compliance rate; The processing according to the reliability index data to obtain a reliability compliance coefficient includes: Performing weighted processing according to the data loss rate, file system error rate, capacitor power supply time compliance rate, and firmware response time compliance rate to obtain a reliability compliance coefficient; The step of obtaining environmental characteristic data of the test area and processing the data to obtain an environmental interference coefficient includes: Obtain environmental characteristic data of the test area, including temperature, humidity, electromagnetic interference, and vibration amplitude; The temperature, humidity, electromagnetic interference and vibration amplitude are processed by a preset environmental factor interference evaluation model to obtain an environmental interference coefficient.

2. The data storage reliability testing method based on a solid state drive according to claim 1, characterized in that: The processing according to the reliability scale coefficient combined with the environmental interference coefficient to obtain a corrected reliability scale coefficient, and judging whether the data storage reliability meets the standard includes: Correcting the reliability coefficient according to the environmental interference coefficient to obtain a corrected reliability coefficient; Performing a threshold comparison based on the revised reliability attainment coefficient and a preset revised reliability attainment threshold; Determine whether data storage reliability meets the standards based on the threshold comparison results; If the revised reliability compliance coefficient is greater than or equal to a preset revised reliability compliance threshold, the data storage reliability meets the standard; If the corrected reliability compliance coefficient is less than a preset corrected reliability compliance threshold, the data storage reliability does not meet the standards.

3. The data storage reliability testing method based on a solid state drive according to claim 2, characterized in that: If the data storage reliability of the target solid state drive does not meet the requirements, performing optimization measures on the target solid state drive includes: If the data storage reliability of the target solid-state drive does not meet the requirements, obtaining the grade of the target solid-state drive; The grades include consumer, enterprise and industrial; Execute corresponding optimization measures on the target solid-state drive according to the level.

4. A data storage reliability test system based on a solid state drive, characterized in that: The system includes: a memory and a processor, wherein the memory includes a program for a data storage reliability test method based on a solid-state hard disk, and when the program for the data storage reliability test method based on a solid-state hard disk is executed by the processor, the following steps are implemented: Perform data storage reliability testing on the target solid-state drive and extract reliability index data; Processing the reliability index data to obtain a reliability compliance coefficient; Obtain environmental characteristic data of the test area and process it to obtain the environmental interference coefficient; Processing the reliability scale coefficient in combination with the environmental interference coefficient to obtain a revised reliability scale coefficient, and determining whether the data storage reliability meets the standards; If the data storage reliability of the target solid-state drive does not meet the requirements, performing optimization measures on the target solid-state drive; The performing of a data storage reliability test on the target solid state drive and extracting reliability index data includes: Perform data storage reliability test on the target solid-state drive and record the test result data; The reliability test includes abnormal power failure test, mixed load stress test and instruction response time test; Extracting reliability indicator data based on the test result data, including data loss rate, file system error rate, capacitor power supply time compliance rate, and firmware response time compliance rate; The processing according to the reliability index data to obtain a reliability compliance coefficient includes: Performing weighted processing according to the data loss rate, file system error rate, capacitor power supply time compliance rate, and firmware response time compliance rate to obtain a reliability compliance coefficient; The step of obtaining environmental characteristic data of the test area and processing the data to obtain an environmental interference coefficient includes: Obtain environmental characteristic data of the test area, including temperature, humidity, electromagnetic interference, and vibration amplitude; The temperature, humidity, electromagnetic interference and vibration amplitude are processed by a preset environmental factor interference evaluation model to obtain an environmental interference coefficient.

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