Electron microscope grid and sample adding clamp for electron microscope grid

Abstract

The electron microscope grid comprises a grid body, a separation part is arranged on the surface of a sample adding area of the grid body, and the sample adding area of the grid body is divided into at least two mutually independent sample adding subareas through the separation part. The separation parts are arranged at the sample adding area of the carrier network body to divide the sample adding area into a plurality of sample adding subareas, so that the electron microscope carrier network can load a plurality of samples into an electron microscope for characterization at one time, and the sample adding area of the electron microscope carrier network is divided into a plurality of sample adding subareas, so that the sample adding efficiency is improved. And the space utilization rate of the electron microscope grid is effectively improved, so that the electron microscope sample characterization efficiency is improved, and the cost is saved.

Description

Technical Field

[0001] The invention relates to the technical field of transmission electron microscopes, and in particular to an electron microscope grid and an electron microscope grid sample loading fixture. Background Art

[0002] Conventional electron microscopes currently used in materials research primarily characterize and analyze samples by inserting a sample holder, carrying a sample-loaded grid, into the microscope. Powder samples are typically dispersed in a suitable solvent and then dripped onto a grid for sample loading. However, for powder material systems, a conventional grid can only support a single sample. During electron microscopy characterization, analysis of the sample's morphology, composition, and microstructure typically requires only a few micrometers to provide a good understanding of the sample's fundamental characteristics. However, with a grid diameter of 3 mm, most of the remaining sample area remains unused, and the 3 mm of space is not fully utilized. When testing multiple samples, each grid has significant unused area. Subsequent testing of each sample requires a series of steps: removing the sample holder, replacing the grid, reinserting the holder, and evacuating the microscope. These sample replacement steps waste valuable electron microscopy time, significantly reducing the efficiency of electron microscopy characterization. Summary of the Invention

[0003] In view of the shortcomings of the existing technology, the present invention provides an electron microscope grid and an electron microscope grid sample loading fixture, which mainly solves the technical problem that the existing conventional electron microscope grid can only load one sample into the electron microscope.

[0004] To achieve the above object, the present invention is achieved through the following technical solutions: The invention discloses an electron microscope grid, which is used in a transmission electron microscope and comprises a grid body. A separator is provided on the surface of a sample loading area of ​​the grid body, and the separator separates the sample loading area of ​​the grid body into at least two independent sample loading partitions.

[0005] Furthermore, the separator is a rubber strip attached to the surface of the sample loading area of ​​the grid body.

[0006] Furthermore, the partition is a cross-shaped rubber strip structure, and the sample loading area of ​​the grid body is evenly divided by the partition to form four sample loading partitions of equal size.

[0007] Based on the same inventive concept, the present invention also provides an electron microscope grid loading fixture, comprising a base and a clamping mechanism, the clamping mechanism comprising an upper clamp and a lower clamp, the above-mentioned electron microscope grid is clamped and fixed between the upper clamp and the lower clamp, the base is provided with an inclined surface for placing the clamping mechanism and a positioning portion adapted to the clamping mechanism, the clamping mechanism that clamps the electron microscope grid is placed as a whole on the inclined surface of the base and the placement direction is positioned by the positioning portion, and a number of sample loading hollow grooves corresponding to each sample loading partition are opened in the upper clamp.

[0008] Furthermore, the lower fixture is provided with a plurality of inner recesses corresponding to the sample adding zones, and a liquid absorbing structure for absorbing excess dispersion liquid is embedded in the inner recesses.

[0009] Furthermore, a pressing portion corresponding to the partition portion is provided on the upper fixture, and the electron microscope grid is pressed tightly against the lower fixture through the pressing portion.

[0010] Furthermore, a positioning protrusion for positioning the electron microscope grid is provided on the lower fixture, and the positioning protrusion is configured to avoid the pressing portion of the upper fixture.

[0011] Furthermore, the upper fixture is provided with a plurality of positioning holes, and the lower fixture is provided with a plurality of positioning posts corresponding to the positioning holes respectively. The positioning holes and the positioning posts cooperate to guide the clamping cooperation between the upper fixture and the lower fixture.

[0012] Furthermore, the sample adding hollow groove of the upper clamp is provided with a pipette tip positioning slot corresponding to the sample adding partition.

[0013] Furthermore, the lower fixture is a square structure, and partition marks are provided at the corners of the lower fixture.

[0014] The above technical solution has the following advantages or beneficial effects:

[0015] In the electron microscope grid and the electron microscope grid loading fixture described in the present invention, a partition is provided at the loading area of ​​the grid body to divide the loading area into a plurality of loading partitions. In this way, the electron microscope grid can load a plurality of samples into the electron microscope for characterization at one time. Moreover, by dividing the loading area of ​​the electron microscope grid into a plurality of loading partitions, the space utilization rate of the electron microscope grid is also effectively improved, thereby improving the efficiency of electron microscope characterization of samples and saving costs. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] Figure 1 It is a schematic diagram of the three-dimensional structure of the electron microscope grid according to an embodiment of the present invention.

[0017] Figure 2 2. It is a diagram showing the use status of the electron microscope grid loading fixture according to an embodiment of the present invention.

[0018] Figure 3The figure is a schematic diagram of the exploded structure of the electron microscope grid loading fixture according to an embodiment of the present invention.

[0019] Figure 4 This is a schematic diagram of the exploded structure of the electron microscope grid loading fixture according to an embodiment of the present invention from another angle.

[0020] Description of labels:

[0021] 1. Grid body, 2. Partition, 3. Base, 4. Clamping mechanism, 5. Liquid aspiration structure, 11. Sample loading partition, 31. Inclined surface, 32. Positioning portion, 41. Upper clamp, 42. Lower clamp, 411. Sample loading hollow groove, 412. Pressing portion, 413. Positioning hole, 414. Pipette tip positioning slot, 421. Positioning protrusion, 422. Positioning column, 423. Partition identification. DETAILED DESCRIPTION

[0022] The present invention will be further described below with reference to the accompanying drawings and embodiments.

[0023] In the description of the present invention, it should be understood that the terms "upper", "lower", "front", "back", "left", "right", "top", "bottom", "inside", "outside", etc., indicating directions or positional relationships, are based on the directions or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific direction, be constructed and operated in a specific direction, and therefore should not be understood as limiting the present invention.

[0024] Please refer to the attached Figure 1 One embodiment of the present invention provides an electron microscope grid (the electron microscope grid is a high-throughput electron microscope grid), which is used in a transmission electron microscope, and includes a grid body 1. A partition 2 is provided on the surface of the sample loading area of ​​the grid body 1, and the sample loading area of ​​the grid body 1 is separated by the partition 2 to form at least two independent sample loading partitions 11. It can be understood that in this embodiment, the partition 2 is provided at the sample loading area of ​​the grid body 1 to further separate the sample loading area into a plurality of sample loading partitions 11. In this way, the electron microscope grid can load multiple samples into the electron microscope for characterization at one time, and by dividing the sample loading area of ​​the electron microscope grid into a plurality of sample loading partitions 11, the space utilization rate of the electron microscope grid is also effectively improved, which is conducive to improving the efficiency of electron microscope characterization of samples and saving costs.

[0025] Please refer to the attached Figure 1In one preferred embodiment, the separator 2 is a rubber strip attached to the surface of the sample loading area of ​​the grid body 1. Furthermore, the separator 2 is a cross-shaped rubber strip structure, which evenly divides the sample loading area of ​​the grid body 1 into four equally sized sample loading partitions 11. However, those skilled in the art will appreciate that in other embodiments, the separator 2 may also be a strip-shaped rib structure made of other materials, which may be affixed to the surface of the sample loading area of ​​the grid body 1 using, for example, adhesive bonding. The embodiment is not limited to the specific implementation method disclosed in this embodiment, as long as the separator 2 can be fixed to the surface of the sample loading area of ​​the grid body 1 and divide the sample loading area into multiple sample loading partitions 11.

[0026] Please refer to the attached Figure 1 To the attached Figure 4 One embodiment of the present invention also provides an electron microscope grid loading fixture, including a base 3 and a clamping mechanism 4, the clamping mechanism 4 includes an upper clamp 41 and a lower clamp 42, the electron microscope grid clamped and fixed between the upper clamp 41 and the lower clamp 42, the base 3 is provided with an inclined surface 31 for placing the clamping mechanism 4 and a positioning portion 32 adapted to the clamping mechanism 4, the clamping mechanism 4 holding the electron microscope grid is placed as a whole on the inclined surface 31 of the base 3 and the placement direction is positioned by the positioning portion 32, and a plurality of sample loading hollow grooves 411 corresponding to each sample loading partition 11 are opened in the upper clamp 41. In this embodiment, after the electron microscope grid is clamped and fixed between the upper clamp 41 and the lower clamp 42, the clamping mechanism 4 holding the electron microscope grid can be placed on the inclined surface 31 of the base 3, so that the electron microscope grid is placed in an inclined state. In this embodiment, preferably, the inclination angle of the inclined surface 31 is 30°~60°. Then, after the pipette tip absorbs the corresponding sample liquid, it can be aligned with the corresponding sample addition hollow groove 411 on the upper clamp 41 to drop the sample liquid onto the corresponding sample addition partition 11. The specific sample addition method is: the pipette tip is aligned with the lowest sample addition hollow groove 411 to drop the sample liquid into the corresponding sample addition partition 11, and the sample liquid will automatically diffuse downwardly away from the center of the grid body 1 under the action of gravity, avoiding the sample liquid from entering other sample addition partitions 11. In addition, the partition 2 can also effectively prevent the sample liquid added to the corresponding sample addition partition 11 from diffusing to other sample addition partitions. When it is necessary to add the next sample liquid, the clamping mechanism 4 on which the electron microscope grid is fixed is rotated 90° so that the other corner corresponds to the positioning portion 32 on the base 3, and then the other sample liquid is added to another sample adding partition 11. The above steps are repeated until all the sample adding partitions 11 on the electron microscope grid are loaded with samples. Then, the upper clamp 41 and the lower clamp 42 are opened, and the electron microscope grid loaded with the sample is taken out and placed under an infrared baking lamp for baking. After baking, it can be placed in a transmission electron microscope for characterization.

[0027] Please refer to the attached Figure 1 To the attached Figure 4 In one preferred embodiment, the lower clamp 42 is provided with a plurality of recessed portions corresponding to the sample adding partitions 11 , and a liquid absorbing structure 5 for absorbing excess dispersion liquid is embedded in the recessed portions.

[0028] Please refer to the attached Figure 1 To the attached Figure 4 In one preferred embodiment, a pressing portion 412 corresponding to the partition 2 is provided on the upper fixture 41, and the electron microscope grid is pressed against the lower fixture 42 by the pressing portion 412. A positioning protrusion 421 for positioning the electron microscope grid is provided on the lower fixture 42, and the positioning protrusion 421 is configured to avoid the pressing portion 412 of the upper fixture 41.

[0029] Please refer to the attached Figure 1 To the attached Figure 4 In one preferred embodiment, a plurality of positioning holes 413 are provided on the upper clamp 41, and a plurality of positioning posts 422 corresponding to the positioning holes 413 are provided on the lower clamp 42. The positioning holes 413 and the positioning posts 422 are positioned to guide the clamping cooperation between the upper clamp 41 and the lower clamp 42.

[0030] Please refer to the attached Figure 1 To the attached Figure 4 In one preferred embodiment, the sample addition hollow groove 411 of the upper fixture 41 is provided with a pipette tip positioning slot 414 corresponding to the sample addition partition 11. The pipette tip positioning slot 414 allows the pipette tip to more accurately add the sample droplet to the corresponding sample addition partition 11, avoiding the problem of misaligned sample addition positions due to a skewed pipette tip.

[0031] Please refer to the attached Figure 1 To the attached Figure 4 In one preferred embodiment, the lower clamp 42 is a square structure, and partition marks 423 are provided at the corners of the lower clamp 42. The partition marks can be numbers 1, 2, 3 and 4. The partition marks can be used to more intuitively identify each sample addition partition 11 to avoid repeated sample addition.

[0032] The embodiments described above are only used to illustrate the technical solutions of the present invention, rather than to limit them. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or make equivalent replacements for some of the technical features therein. These modifications or replacements do not deviate from the spirit and scope of the technical solutions of the embodiments of the present invention. Therefore, all other embodiments obtained by those skilled in the art without making any creative work shall fall within the scope of protection of the present invention.

Claims

1. An electron microscope grid, used in a transmission electron microscope, comprising a grid body (1), characterized in that: A partition (2) is provided on the surface of the sample loading area of ​​the grid body (1), and the partition (2) separates the sample loading area of ​​the grid body (1) into at least two mutually independent sample loading partitions (11).

2. The electron microscope grid according to claim 1, characterized in that: The partition (2) is a rubber strip attached to the surface of the sample loading area of ​​the grid body (1).

3. The electron microscope grid according to claim 2, characterized in that: The partition (2) is a cross-shaped rubber strip structure, and the sample loading area of ​​the grid body (1) is evenly divided by the partition (2) to form four sample loading partitions (11) of equal size.

4. A grid loading fixture for an electron microscope, characterized by: It comprises a base (3) and a clamping mechanism (4), the clamping mechanism (4) comprises an upper clamp (41) and a lower clamp (42), the electron microscope grid described in any one of claims 1 to 3 is clamped and fixed between the upper clamp (41) and the lower clamp (42), the base (3) is provided with an inclined surface (31) for placing the clamping mechanism (4) and a positioning portion (32) adapted to the clamping mechanism (4), the clamping mechanism (4) holding the electron microscope grid is placed as a whole on the inclined surface (31) of the base (3) and the placement direction is positioned by the positioning portion (32), and a plurality of sample loading hollow grooves (411) corresponding to each sample loading partition (11) are opened in the upper clamp (41).

5. The electron microscope grid loading fixture according to claim 4, characterized in that: The lower clamp (42) is provided with a plurality of inner concave portions corresponding to the sample adding partitions (11), and a liquid absorbing structure (5) for absorbing excess dispersion liquid is embedded in the inner concave portions.

6. The electron microscope grid loading fixture according to claim 4, characterized in that: A pressing portion (412) corresponding to the partition portion (2) is provided on the upper clamp (41), and the electron microscope grid is pressed tightly onto the lower clamp (42) through the pressing portion (412).

7. The electron microscope grid loading fixture according to claim 6, characterized in that: A positioning protrusion (421) for positioning the electron microscope grid is provided on the lower clamp (42), and the positioning protrusion (421) is configured to avoid the pressing portion (412) of the upper clamp (41).

8. The electron microscope grid loading fixture according to claim 4, characterized in that: The upper clamp (41) is provided with a plurality of positioning holes (413), and the lower clamp (42) is provided with a plurality of positioning posts (422) corresponding to the positioning holes (413). The positioning holes (413) and the positioning posts (422) are positioned to guide and position the clamping cooperation between the upper clamp (41) and the lower clamp (42).

9. The electron microscope grid loading fixture according to claim 4, characterized in that: A pipette tip positioning slot (414) corresponding to the sample adding partition (11) is provided in the sample adding hollow groove (411) of the upper clamp (41).

10. The electron microscope grid loading fixture according to claim 4, characterized in that: The lower clamp (42) is a square structure, and partition marks (423) are provided at the corners of the lower clamp (42).

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