Portable burn-in board fault intelligent inspection system and method

Through the portable intelligent inspection system for aging plate faults, the upper and lower support parts with rotating connections are used to realize automatic inspection of aging plates, which solves the problem of low inspection efficiency, improves inspection efficiency and extends the service life of gold fingers.

CN120594890APending Publication Date: 2025-09-05CASIC DEFENSE TECH RES & TEST CENT
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Patent Information

Application Number
CN202510709486.4
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2025-05-29
Publication Date
2025-09-05

AI Technical Summary

Technical Problem

The existing aging plate detection method is inefficient and wastes manpower, and an efficient and automated detection method is needed.

Method used

A portable intelligent inspection system for burn-in board faults is designed, which includes a rotating upper support part and a lower support part. The connection terminals on the detection board are connected to the gold fingers of the burn-in board. Combined with the support area and the buffer layer, automatic detection is achieved and interaction is achieved through a touch display screen.

Benefits of technology

It improves the detection efficiency, reduces manpower waste, and extends the service life of the gold finger. The system is small in size and easy to operate.

✦ Generated by Eureka AI based on patent content.

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Abstract

The invention provides a portable burn-in board fault intelligent inspection system, and the system comprises an upper supporting part which comprises a detection board, the detection board is provided with a connection terminal, the connection terminal is used for being connected with a golden finger of a to-be-detected burn-in board, and the detection board is used for detecting the to-be-detected burn-in board; the lower supporting part and the upper supporting part are arranged in an up-down stacked mode and rotationally connected, a supporting area is arranged on the face, close to the upper supporting part, of the lower supporting part, and the supporting area and the connecting terminal are oppositely arranged; the upper supporting part rotates towards a direction far away from the lower supporting part until an opening is formed between the connecting terminal and the supporting area, so that a golden finger of the to-be-detected aging plate is attached to the supporting area through the opening; or, the upper supporting part rotates towards the direction close to the lower supporting part until the connecting terminal abuts against the golden finger of the aging plate to be detected. According to the invention, the fault detection efficiency of the aging board can be greatly improved.
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Description

Technical Field

[0001] The present invention relates to the field of detection technology, and in particular to a portable intelligent inspection system and method for aging plate faults. Background Art

[0002] The current testing method for burn-in boards involves using a multimeter in continuity mode to sequentially swipe across all the gold fingers on the board. Inspectors, familiar with the board's circuitry, manually determine whether shorts or opens are present, then manually record the results in a regular inspection report. This method is inefficient and wastes manpower. Summary of the Invention

[0003] In view of this, the object of the present invention is to provide a portable intelligent inspection system and method for aging plate faults to solve the problem of low efficiency in aging plate inspection.

[0004] Based on the above objectives, the present invention provides a portable intelligent inspection system for burn-in plate faults, comprising:

[0005] The upper support portion includes a detection board, the detection board is provided with a connection terminal, the connection terminal is used to connect with the gold finger of the to-be-detected aged board, and the detection board is used to detect the to-be-detected aged board;

[0006] A lower support portion is stacked up and down with the upper support portion and is rotatably connected thereto, wherein a support area is provided on a side of the lower support portion close to the upper support portion, and the support area is arranged opposite to the connecting terminal;

[0007] The upper support portion is rotated in a direction away from the lower support portion until an opening is formed between the connection terminal and the support area, so that the gold finger of the to-be-tested aged board fits into the support area through the opening; or

[0008] The upper supporting portion is rotated in a direction close to the lower supporting portion until the connecting terminal contacts the gold finger of the aged board to be detected.

[0009] Furthermore, a supporting protrusion extending toward the connecting terminal is provided in the supporting area, and the supporting protrusion is used to support at least a portion of the gold fingers of the aged board to be tested.

[0010] Furthermore, a buffer layer is provided on a side of the supporting protrusion close to the upper supporting portion.

[0011] Furthermore, a positioning protrusion is provided on one side of the lower supporting portion close to the upper supporting portion, and the positioning protrusion is connected to the supporting area to position the gold finger located on the supporting area.

[0012] Furthermore, the support area includes a first area and a second area with a gap setting, and the positioning protrusion includes a first protrusion, a second protrusion and a third protrusion, the first protrusion is connected to the side of the first area away from the second area, the second protrusion is located between the first area and the second area, and is connected to the first area and the second area, and the third protrusion is connected to the side of the second area away from the first area.

[0013] Furthermore, the detection board is provided with a first connection area and a second connection area, and there are multiple connection terminals, which are located on the first connection area and the second connection area. The first connection area is arranged opposite to the first area, and the second connection area is arranged opposite to the second area.

[0014] Furthermore, a connecting ear is provided on one side of the upper support part close to the lower support part, and a supporting ear is provided on one side of the lower support part close to the upper support part. A connecting rod passes through the connecting ear and the supporting ear to enable the lower support part to be rotatably connected to the upper support part.

[0015] Furthermore, a buffer zone is provided on one side of the lower support portion close to the upper support portion, a plurality of buffer members are provided on the buffer zone, the buffer members are arranged toward the upper support portion, and the connecting rod is located between the buffer zone and the support zone;

[0016] When the upper supporting portion rotates relative to the lower supporting portion to be close to the buffer member, the buffer member is used to buffer the acting force between the upper supporting portion and the lower supporting portion.

[0017] Furthermore, the buffer member includes an elastic member and a guide column that are sleeved and connected, one end of the elastic member is connected to the lower support part, and the other end is connected to the upper support part, and the guide column is located on the lower support part.

[0018] Furthermore, the upper support part also includes a touch screen, which is located on the side of the upper support part away from the lower support part and is electrically connected to the detection board for issuing detection instructions to the detection board and displaying the detection results of the detection board on the aged board to be detected.

[0019] Based on the same inventive concept, the present application also provides a method for applying the above-mentioned portable intelligent inspection system for burn-in plate faults, comprising:

[0020] Rotating the upper support portion so that the connecting terminal is away from the lower support portion;

[0021] Placing the gold finger of the aged board to be tested on the support area, and rotating the upper support portion so that the connecting terminal abuts against the gold finger of the aged board to be tested;

[0022] The detection board is started to detect the aged board to be detected.

[0023] Furthermore, the starting of the detection board to detect the aged board to be detected includes:

[0024] Sending a detection instruction to the detection board via the touch display screen;

[0025] The detection board receives the detection instruction and determines the type of the aged board to be detected;

[0026] The detection board detects the aged board to be detected based on the type of the aged board to be detected, obtains the detection result, and sends it to the touch display screen;

[0027] The touch screen receives and displays the detection result.

[0028] From the above description, it can be seen that the present invention provides a portable intelligent inspection system for aging board faults, comprising an upper support part and a lower support part that are rotatably connected. The upper support part is provided with a detection board, and the connecting terminals of the detection board are used to connect with the gold fingers of the aging board to be detected so that the detection board can detect the aging board to be detected. The lower support part is provided with a support area to carry the gold fingers of the aging board to be detected, so that the gold fingers are stably abutted with the connecting terminals under the joint action of the connecting terminals and the support area of ​​the upper support part, thereby facilitating the inspection of the aging board to be detected by the detection board, which is beneficial to improving the detection stability and practicality of the intelligent inspection system; in addition, the upper support part and the lower support part are rotatably connected, so that the spacing between the connecting terminals and the support area is adjustable, thereby facilitating the abutment and release of the gold fingers of the aging board to be detected from the connecting terminals, and will not cause wear on the gold fingers, thereby helping to extend the service life of the gold fingers of the aging board to be detected and improve the practicality of the intelligent inspection system; finally, the intelligent inspection system can realize automatic detection of the connected aging board to be detected, and has a small size and simple operation, which can significantly improve the detection efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0029] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the following briefly introduces the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0030] Figure 1 This is a schematic diagram of the main structure of a portable intelligent inspection system for burn-in plate faults according to an embodiment of the present invention;

[0031] Figure 2This is a rear structural diagram of a portable intelligent inspection system for burn-in plate faults according to an embodiment of the present invention;

[0032] Figure 3 This is a schematic diagram of the three-dimensional structure of a portable intelligent inspection system for burn-in plate faults according to an embodiment of the present invention;

[0033] Figure 4 The present invention provides a schematic diagram of the process structure of the portable intelligent inspection system for aging plate faults according to the embodiment of the present invention.

[0034] In the figure: 100, upper support part; 110, connecting terminal; 120, connecting ear; 130, touch screen; 200, lower support part; 210, support area; 211, first area; 212, second area; 220, support protrusion; 230, positioning protrusion; 231, first protrusion; 232, second protrusion; 233, third protrusion; 240, supporting ear; 250, buffer zone; 251, buffer member; 251-1, elastic member; 251-2, guide column; 300, connecting rod. DETAILED DESCRIPTION

[0035] In order to make the objectives, technical solutions and advantages of the present invention more clearly understood, the present invention is further described in detail below in conjunction with specific embodiments and with reference to the accompanying drawings.

[0036] It should be noted that, unless otherwise defined, the technical terms or scientific terms used in the embodiments of the present invention should have the usual meanings understood by people with ordinary skills in the field to which this application belongs. The "first", "second" and similar words used in this application do not indicate any order, quantity or importance, but are only used to distinguish different components. "Include" or "comprise" and similar words mean that the elements or objects appearing before the word include the elements or objects listed after the word and their equivalents, without excluding other elements or objects. "Connect" or "connected" and similar words are not limited to physical or mechanical connections, but may include electrical connections, whether direct or indirect. "Up", "down", "left", "right" and the like are only used to indicate relative positional relationships. When the absolute position of the described object changes, the relative positional relationship may also change accordingly.

[0037] Inherent defects in electronic components are the primary cause of premature failure during early use. Burn-in screening tests ensure that inherent defects are eliminated early in the life cycle of electronic components, ensuring product quality and characteristics meet user quality requirements. Burn-in involves subjecting electronic components to excessive operating conditions under high temperature and high pressure, thereby quickly exposing inherent defects and improving the effectiveness of product quality control. During the screening test, numerous burn-in boards are designed and manufactured according to the specific technical requirements of the electronic components. Custom driver boards are then connected to the burn-in boards using gold finger connections, achieving high frequency, low overshoot, and real-time monitoring, significantly improving the quality and reliability of the circuits during burn-in.

[0038] The gold finger connection method of the burn-in board is the basis of the more mature component burn-in system in the industry. By designing a custom gold finger driver board, the voltage and complex signals are transmitted to the burn-in board through the gold finger plug-in. At the same time, the output signal of the circuit on the burn-in board can also be fed back to the gold finger driver board through the gold finger connection plug-in. In order to ensure the efficiency and reliability of the burn-in test of large quantities of devices, it is necessary to regularly conduct gold finger fault inspections on newly processed and in-service burn-in boards. The existing detection technology is to use a multimeter in the on-off mode to measure all the gold fingers on the burn-in board in turn. The inspector manually judges whether the burn-in board circuit has a short circuit or an open circuit based on his familiarity with the burn-in board circuit, and then manually records the test results to form a regular inspection report.

[0039] Based on this, it is necessary to provide a portable intelligent inspection system and method for burn-in board faults to realize fully automatic and rapid detection and identification of different types of burn-in board gold finger on-off faults, and form an automatic detection report to improve the detection efficiency of burn-in boards.

[0040] The following describes the details through one or more specific embodiments.

[0041] In some embodiments, a portable intelligent inspection system for burn-in plate faults, such as Figure 1 Shown, including:

[0042] The upper support portion 100 includes a detection board, on which a connection terminal 110 is provided. The connection terminal 110 is used to connect to the gold finger of the aging board to be detected. The detection board is used to detect the aging board to be detected.

[0043] The lower support portion 200 is stacked on top of the upper support portion 100 and is rotatably connected. A support area 210 is provided on a side of the lower support portion 200 close to the upper support portion 100. The support area 210 is arranged opposite to the connecting terminal 110.

[0044] The upper support portion 100 is rotated in a direction away from the lower support portion 200 until an opening is formed between the connection terminal 110 and the support area 210, so that the gold finger of the annealed board to be tested fits into the support area 210 through the opening; or,

[0045] The upper support portion 100 is rotated toward the lower support portion 200 until the connecting terminal 110 contacts the gold finger of the burn-in board to be tested.

[0046] Specifically, the detection board is located on the upper support part 100 to move with the upper support part 100, thereby driving the connecting terminal 110 away from or close to the lower support part 200, so that the gold finger of the aged board to be detected is located between the connecting terminal 110 and the support area 210, and is connected to the connecting terminal 110, thereby avoiding the gold finger of the aged board to be detected being connected to the connecting terminal 110 by plugging, causing the gold finger to wear, affecting the connection effect between it and the connecting terminal 110 and the service life of the gold finger.

[0047] The connecting terminal 110 is protruded relative to the detection board and is also protruded relative to the upper support portion 100 to shorten the distance between it and the gold finger of the aging board to be detected, so as to achieve close contact between the two, which is beneficial to improving the connection stability between the connecting terminal 110 and the gold finger.

[0048] It should be noted that the detection board includes a single-chip microcomputer, which can automatically detect the aged board to be detected based on preset software. The detection board can realize intelligent inspection of the aged board to be detected, which can greatly improve the detection efficiency.

[0049] In addition, in the arrangement direction of the gold fingers of the aged board to be detected, a plurality of connecting terminals 110 are provided, and the gap between two adjacent connecting terminals 110 is the same as the gap between two adjacent gold fingers, so as to ensure that each of the gold fingers is connected to a connecting terminal 110, and ensure that each of the gold fingers can be detected, which is beneficial to improving the detection accuracy and practicality of the intelligent inspection system.

[0050] Exemplarily, in the arrangement direction of the gold fingers of the aged board to be detected, the connecting terminals 110 are provided with 100, and the gold fingers of the aged board to be detected are provided with 100, which are in one-to-one contact with the connecting terminals 110, so that the detection board can detect each gold finger of the aged board to be detected.

[0051] Furthermore, in the extension direction of the gold finger of the aged board to be tested, two or more connecting terminals 110 are provided, and the two or more connecting terminals 110 are connected to ensure that the test board can be connected to the gold finger through the connecting terminal 110, so as to avoid the length of the gold finger affecting the connection between the connecting terminal 110 and the gold finger, thereby affecting the detection of the aged board to be tested by the test board.

[0052] Exemplarily, the connecting terminals 110 are provided in two rows in the extension direction of the gold finger, and 100 are provided in the step direction of the gold finger. The two connecting terminals 110 opposite to each other in the extension direction of the gold finger are connected to each other to form 100 pairs of the connecting terminals 110, and each pair of the connecting terminals 110 is connected to one gold finger.

[0053] In this embodiment, the intelligent inspection system includes an upper support part 100 and a lower support part 200 that are rotatably connected. The upper support part 100 is provided with a detection board. The connection terminal 110 of the detection board is used to connect with the gold finger of the to-be-detected aged board so that the detection board can detect the to-be-detected aged board. The lower support part 200 is provided with a support area 210 to carry the gold finger of the to-be-detected aged board, so that the gold finger can stably contact the connection terminal 110 under the joint action of the connection terminal 110 of the upper support part 100 and the support area 210, thereby facilitating the detection board to detect the to-be-detected aged board, which is beneficial to improve the inspection performance. Improve the detection stability and practicality of the intelligent inspection system; in addition, the upper support part 100 and the lower support part 200 are rotatably connected, so that the distance between the connecting terminal 110 and the supporting area 210 is adjustable, thereby facilitating the abutment and release of the gold finger of the aged board to be inspected and the connecting terminal 110, and will not cause wear on the gold finger, thereby helping to extend the service life of the gold finger of the aged board to be inspected and improve the practicality of the intelligent inspection system; finally, the intelligent inspection system can realize automatic detection of the connected aged board to be inspected, and has a small size and simple operation, which can significantly improve the detection efficiency.

[0054] In some embodiments, as Figure 1 As shown, a support protrusion 220 extending toward the connecting terminal 110 is provided in the support area 210 , and the support protrusion 220 is used to support at least a portion of the gold fingers of the burn-in board to be tested.

[0055] Specifically, the support protrusion 220 is used to shorten the distance between the support area 210 and the connecting terminal 110, so that the abutment between the gold finger and the connecting terminal 110 is enhanced, which is beneficial to improving the connection stability between the connecting terminal 110 and the gold finger of the aging board to be detected, thereby improving the connection stability between the intelligent inspection system and the aging board to be detected. On this basis, the detection efficiency of the intelligent inspection system can be further improved, thereby improving the practicality of the intelligent inspection system.

[0056] The gold finger and the aged board to be detected are an integral connection structure and are a plate-like structure (PCB board) with a certain strength. The supporting protrusion 220 is arranged in the supporting area 210, and the area of ​​the supporting protrusion 220 on the supporting area 210 is smaller than that of the supporting area 210. Some of the gold fingers are located on the supporting protrusion 220, and the other gold fingers are suspended. Under the support and driving action of the supporting protrusion and some of the gold fingers, they abut against the connecting terminal and can remain flat. This can prevent all the gold fingers of the aged board to be detected from being located on the surface of the supporting area 210, because the uneven surface of the supporting area 210 affects the abutment between the connecting terminal 110 and the gold fingers of the aged board to be detected, thereby affecting the detection of the aged board to be detected by the intelligent inspection system; and such an arrangement can also reduce the requirements for the surface flatness of the supporting area, which is beneficial to reducing production costs and does not affect the abutment between the aged board to be detected and the connecting terminal 110.

[0057] The support protrusions 220 are arranged on the support protrusions 220 to contact the connection terminals 110. The support protrusions 220 are arranged on the support protrusions 220 to contact the connection terminals 110. The support protrusions 220 do not have to correspond to all the connection terminals, so as to drive all the gold fingers to contact the connection terminals 110. In addition, some of the gold fingers are suspended in the air and contact the connection terminals 110, which can disperse the contact force applied by the connection terminals 110 to the gold fingers, thereby preventing the gold fingers of the aged board to be detected from cracking under the contact force of multiple connection terminals and affecting the normal use of the aged board to be detected, thereby preventing the intelligent inspection system from damaging the aged board to be detected, which is beneficial to improving the practicality of the intelligent inspection system.

[0058] In some embodiments, a buffer layer is provided on a side of the support protrusion 220 close to the upper support portion 100 .

[0059] Specifically, the side of the support protrusion 220 close to the upper support part 100 is the side used to support the gold finger of the aged plate to be detected. The buffer layer is provided on it, which can buffer the abutment between the connecting terminal 110 and the gold finger, thereby reducing the force of the connecting terminal 110 on the gold finger, avoiding deformation or wear of the gold finger under the abutment of the connecting terminal 110, thereby improving the service life of the gold finger and helping to improve the practicality of the intelligent inspection system.

[0060] Exemplarily, the connecting terminal 110 is a spring pin, and the buffer layer is provided so that the spring pin abuts against the buffer layer, or the gold finger abuts against the buffer layer, which can buffer the elastic force of the spring pin, thereby preventing the elastic failure or elastic force drop of the spring pin, which affects the abutment effect between the spring pin and the gold finger. The buffer layer is beneficial to improving the service life of the spring pin.

[0061] In some embodiments, as Figure 1 As shown, a positioning protrusion 230 is provided on one side of the lower support portion 200 close to the upper support portion 100 . The positioning protrusion 230 is connected to the support area 210 to position the gold finger on the support area 210 .

[0062] Specifically, the positioning protrusion 230 is used to distinguish the support area 210, so that the gold finger of the aging board to be inspected can be timely confirmed in the area where the gold finger is located under the action of the positioning protrusion 230, which facilitates the rapid installation of the aging board to be inspected on the intelligent inspection system.

[0063] In addition, the positioning protrusion 230 can also limit the gold finger of the aged board to be detected, preventing it from moving on the lower support part 200 under the action of external force, resulting in unstable connection between the aged board to be detected and the connecting terminal 110, which is beneficial to improving the connection stability between the detection terminal and the gold finger, thereby improving the detection reliability and practicality of the intelligent inspection system.

[0064] In some embodiments, as Figure 1 As shown, the support area 210 includes a first area 211 and a second area 212 with a gap, and the positioning protrusion 230 includes a first protrusion 231, a second protrusion 232 and a third protrusion 233. The first protrusion 231 is connected to the side of the first area 211 away from the second area 212, the second protrusion 232 is located between the first area 211 and the second area 212, and is connected to the first area 211 and the second area 212. The third protrusion 233 is connected to the side of the second area 212 away from the first area 211.

[0065] Specifically, some of the gold fingers of the aged boards to be tested are not arranged at equal intervals, but include two areas, each area includes a plurality of gold fingers set in gaps. Based on this, the support area 210 is set to a first area 211 and a second area 212 set in gaps. The first area 211 is adapted to the width of the gold fingers in one area of ​​the aged boards to be tested, and the second area 212 is adapted to the width of the gold fingers in another area of ​​the aged boards to be tested, so as to support all the gold fingers of the aged boards to be tested. Accordingly, the connecting terminal 110 is also located in two areas, and is respectively arranged corresponding to the first area 211 and the second area 212 to ensure the connection between the connecting terminal 110 and the gold fingers.

[0066] Based on this, the positioning protrusion 230 includes a first protrusion 231, a second protrusion 232 and a third protrusion 233 to clearly distinguish the first area 211 and the second area 212 of the support area 210, so as to facilitate the rapid setting of the gold finger of the aging board to be tested on the support area 210, and also ensure the connection between the gold finger and the connecting terminal 110, thereby achieving the technical effect of rapid positioning and rapid installation.

[0067] In some embodiments, as Figure 1 As shown, the detection board is provided with a first connection area and a second connection area, and a plurality of connection terminals 110 are provided and located on the first connection area and the second connection area. The first connection area is arranged opposite to the first area 211, and the second connection area is arranged opposite to the second area 212.

[0068] Specifically, the first connection area and the second connection area are both provided with a plurality of the connection terminals 110. The connection terminals 110 on the first connection area are used to abut against the gold fingers located on the first area 211, and the connection terminals 110 on the second connection area are used to abut against the gold fingers located on the second area 212.

[0069] Exemplarily, the first connection area and the second connection area are of the same size, and each is provided with 50 connection terminals 110 for contacting with 50 gold fingers.

[0070] In addition, 50 pairs of connection terminals 110 can be set on the first connection area and the second connection area, that is, two connection terminals 110 are set in the extension direction of one gold finger, and the two connection terminals 110 in this direction are used to abut against one gold finger to enhance the connection performance between the connection terminal 110 and the gold finger.

[0071] In some embodiments, as Figure 2As shown, a connecting ear 120 is provided on the side of the upper support part 100 close to the lower support part 200, and a supporting ear 240 is provided on the side of the lower support part 200 close to the upper support part 100. A connecting rod 300 is provided through the connecting ear 120 and the supporting ear 240 to enable the lower support part 200 to be rotatably connected to the upper support part 100.

[0072] Specifically, the upper support part 100 and the lower support part 200 are rotatably connected through the connecting ear 120 and the supporting ear 240 under the penetrating connection of the connecting rod 300. The relative arrangement of the connecting ear 120 and the supporting ear 240 can not only ensure the stacking and relative arrangement of the upper support part 100 and the lower support part 200, so that the connecting terminal 110 abuts against the gold finger, but also enable the upper support part 100 to rotate relative to the lower support part 200, so that the gold finger of the aging plate to be detected enters the support area 210, thereby improving the practicality of the intelligent inspection system.

[0073] It should be noted that the upper support portion 100 and the lower support portion 200 are spaced apart under the action of the connecting ear 120 and the supporting ear 240 , which is beneficial to the stability of the arrangement of the upper support portion 100 and the lower support portion 200 .

[0074] In addition, a plurality of the supporting ears 240 and the connecting ears 120 are provided to further enhance the connection stability between the upper supporting portion 100 and the lower supporting portion 200 .

[0075] Exemplarily, there are three connecting ears 120, and two adjacent connecting ears 120 are equidistantly arranged. There are six supporting ears 240, which are grouped in pairs to form three support groups. Each support group corresponds to one connecting ear 120. The connecting ear 120 is located between two supporting ears 240 of a support group, and the spacing between the two supporting ears 240 is adapted to the width of the connecting ear 120 to limit the connecting ear 120 and prevent the connecting ear 120 from sliding on the connecting rod 300, which is beneficial to further enhance the connection stability of the upper support part 100 and the lower support part 200. In addition, two supporting ears 240 correspond to one connecting ear 120, which can enhance the supporting strength of the supporting ear 240 on the connecting ear 120, ensure the service life of the supporting ear 240, and thus ensure the service life of the intelligent inspection system.

[0076] In some embodiments, as Figure 2As shown, a buffer zone 250 is provided on one side of the lower support portion 200 close to the upper support portion 100 , and a plurality of buffer members 251 are provided on the buffer zone 250 . The buffer members 251 are arranged toward the upper support portion 100 , and the connecting rod 300 is located between the buffer zone 250 and the support area 210 ;

[0077] When the upper support portion 100 rotates relative to the lower support portion 200 to be close to the buffer member 251 , the buffer member 251 is used to buffer the force between the upper support portion 100 and the lower support portion 200 .

[0078] Specifically, the upper support part 100 rotates around the connecting rod 300, and the support area 210 and the buffer zone 250 are respectively located on both sides of the connecting rod 300. When the upper support part 100 rotates until the connecting terminal 110 thereon is away from the support area 210, the upper support part 100 approaches the buffer zone 250. The multiple buffer members 251 provided on the buffer zone 250 are used to buffer the force applied when the upper support part 100 approaches the buffer zone 250, thereby avoiding the upper support part 100 applying an impact force to the buffer zone 250 when it approaches the buffer zone 250, causing damage to both the upper support part 100 and the buffer zone 250, thereby affecting the service life of the intelligent patrol system. The provision of the buffer member 251 is conducive to enhancing the service life of the intelligent patrol system.

[0079] It should be noted that the buffer member 251 is evenly arranged in the length direction of the connecting rod 300, so that the buffer member 251 can apply a uniform buffering force to the upper support part 100, thereby avoiding affecting the service life of the intelligent inspection system due to uneven buffering.

[0080] In some embodiments, as Figure 2 As shown, the buffer member 251 includes an elastic member 251-1 and a guide column 251-2 that are sleeved and connected. One end of the elastic member 251-1 is connected to the lower support part 200, and the other end is connected to the upper support part 100. The guide column 251-2 is located on the lower support part 200.

[0081] Specifically, the guide column 251-2 is located on the buffer zone 250 and is arranged toward the upper support portion 100. The elastic member 251-1 is sleeved on the periphery of the guide column 251-2 to achieve elastic expansion and contraction under the action of the guide column 251-2, thereby preventing the elastic member 251-1 from being deformed and unable to perform a buffering function under the action of external force.

[0082] In addition, the upper support portion 100 can maintain a stacked relative setting state with the lower support portion 200 under the rebound action of the elastic member 251-1, which is beneficial to the stable contact between the connecting terminal 110 and the gold finger of the aging board to be tested. Under the action of external force, the upper support portion 100 applies a compressive force to the elastic member 251-1 to approach the buffer zone 250, so that an opening appears between the connecting terminal 110 and the support area 210, which facilitates the gold finger to enter the support area 210 or move away from the support area 210.

[0083] In some embodiments, as Figure 3 As shown, the upper support part 100 also includes a touch screen display 130, which is located on the side of the upper support part 100 away from the lower support part 200 and is electrically connected to the detection board for issuing detection instructions to the detection board and displaying the detection results of the detection board on the aged board to be detected.

[0084] Specifically, the touch screen 130 is a user interaction device. The user sends a detection instruction to the detection board through the touch screen 130, and the detection board sends its detection results to the touch screen 130 for display so that the user can view the detection results. The touch screen 130 is arranged on the side of the upper support part 100 away from the lower support part 200, which can facilitate interaction with the user and improve the practicality of the intelligent inspection system.

[0085] Exemplarily, the touch display screen 130 is a 3.7-inch smart electronic touch screen with a resolution of 960x240, high screen contrast, low power consumption, large viewing angle, and support for Chinese display.

[0086] Based on the same inventive concept, the present application also provides a method for applying the above-mentioned portable intelligent inspection system for aging plate faults, such as Figure 4 Shown, including:

[0087] Step S100 , rotating the upper support portion 100 so that the connecting terminal 110 is away from the lower support portion 200 ;

[0088] Specifically, when the user uses the intelligent inspection system to inspect the aged board to be inspected, the user first places the gold finger of the aged board to be inspected on the support area 210 of the lower support part 200. In order to avoid relative displacement between the connecting terminal 110 and the gold finger and damage to the gold finger, the upper support part 100 is rotated so that the connecting terminal 110 is away from the lower support part 200, that is, an opening is generated between the connecting terminal 110 and the support area 210 to allow the gold finger of the aged board to be inspected to enter the support area 210.

[0089] Step S200, placing the gold finger of the aged board to be tested on the support area 210, and rotating the upper support portion 100 so that the connecting terminal 110 abuts against the gold finger of the aged board to be tested;

[0090] Specifically, after the upper support part 100 is rotated to form a larger opening between the connecting terminal 110 and the supporting area 210, the gold finger of the aged board to be tested can be placed on the supporting area 210 through the opening. Thereafter, the upper support part 100 is rotated so that the upper support part 100 is opposite to the lower support part 200, so that the connecting terminal 110 abuts against the gold finger on the supporting area 210, thereby realizing the connection between the test board and the aged board to be tested.

[0091] Step S300: starting the testing board to test the aged board to be tested.

[0092] Specifically, after the installation of the to-be-detected aged board on the intelligent inspection system is completed, the inspection board is started to inspect the to-be-detected aged board.

[0093] Exemplarily, the detection board is connected to a start button, which is located on the upper support part 100 or the lower support part 200. The user can start the detection board through the start button, so that the detection board can detect the aged board to be detected.

[0094] In this embodiment, the upper support part 100 and the lower support part 200 can support the aged board to be inspected, so that the aged board to be inspected is connected to the connecting terminal 110 of the inspection board, so that the inspection board can inspect the aged board to be inspected. A plurality of components to be inspected are provided on the aged board to be inspected. The inspection of the plurality of components to be inspected is achieved through the inspection board, which is beneficial to improving the inspection efficiency. At the same time, the structure of the intelligent inspection system is small, easy to place and has low redundancy, which is convenient for user operation and is beneficial to the promotion and application of the intelligent inspection system.

[0095] In some embodiments, step S300: starting the test board to test the aged board to be tested includes:

[0096] Step S301, sending a detection instruction to the detection board via the touch screen display 130;

[0097] Specifically, a virtual start button is provided on the touch screen 130 , and the user can send a detection instruction to the detection board by pressing the virtual start button on the touch screen 130 , so that the detection board detects the aged board to be detected.

[0098] Step S302: upon receiving the detection instruction, the detection board determines the type of the aged board to be detected;

[0099] Specifically, after receiving the detection instruction, the detection board first determines the type of the to-be-detected aged board to which it is connected.

[0100] Exemplarily, the detection board determines the type of the burn-in board to be detected by judging the effective number of gold fingers connected to the detection terminals and the positions of the effective gold fingers, that is, the number and positions of the connected gold fingers.

[0101] Exemplarily, the gold finger count and width of the boards to be tested are identical, and the only difference between different types of boards to be tested is the location and number of valid gold fingers. For example, if there are 100 connection terminals 110, the number of gold fingers on the boards to be tested is 100. A power module board to be tested has 100 valid gold fingers, while an integrated circuit board to be tested has 96 valid gold fingers. The two outermost adjacent gold fingers are invalid.

[0102] Step S303 , the testing board tests the aged board to be tested based on the type of the aged board to be tested, obtains a test result, and sends the test result to the touch screen 130 ;

[0103] Specifically, after determining the type of the aged board to be tested, the testing board detects the aged board to be tested according to the testing module corresponding to the type to determine whether there is any abnormality in the circuit of the aged board to be tested.

[0104] Exemplarily, the aged board to be detected has 5 valid gold fingers. The detection board outputs a high-level signal to the connection terminal 110 abutted by the 5 gold fingers, and then outputs a low-level signal to the connection terminal 110 connected to one of the gold fingers, and then sequentially detects the signals of the other connection terminals 110 except the connection terminal 110 that outputs the low-level signal to obtain the electrical signal detection result. If a low-level signal is detected, it is determined that the gold finger abutted by the connection terminal 110 is in the on state, otherwise it is in the off state. According to the type of the aged board to be detected, its corresponding pre-stored on-off rule is determined, and the on-off rule is compared with the detection result. If they are consistent, the aged board to be detected is determined to be normal. If there is an inconsistency, the aged board to be detected is determined to be an abnormal aged board, and the inconsistent connection terminal 110 is recorded and stored to obtain the detection result of the aged board to be detected, which is then stored and sent to the touch display screen 130.

[0105] In step S304 , the touch screen display 130 receives and displays the detection result.

[0106] Specifically, the touch screen display 130 displays the received detection result of the aged board to be detected for the user to view, thereby realizing interaction with the user.

[0107] In this embodiment, the detection board is controlled by the touch screen 130 to perform detection, and the detection results of the detection board are viewed through the touch screen 130, which is conducive to improving the ease of use of the intelligent inspection system and realizing rapid interaction with the user, avoiding connecting the detection board to the host computer, and improving the practicality of the intelligent inspection system.

[0108] In some embodiments, the intelligent inspection system is also provided with a host computer connection interface, which is connected to the detection board. The user can call the detection results stored on the detection board through the host computer connection interface and display them on the host computer for the user to view in batches, which is conducive to batch statistics of the detection results.

[0109] Those skilled in the art should understand that the discussion of any of the above embodiments is merely illustrative and is not intended to imply that the scope of the present application (including the claims) is limited to these examples. Within the scope of the present invention, the above embodiments or technical features in different embodiments may be combined, the steps may be implemented in any order, and there are many other variations of the different aspects of the present invention as described above, which are not provided in detail for the sake of simplicity.

[0110] The embodiments of the present invention are intended to cover all such substitutions, modifications and variations that fall within the broad scope of the appended claims. Therefore, any omissions, modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the present invention should be included in the scope of protection of the present invention.

Claims

1. A portable intelligent inspection system for burn-in plate faults, characterized in that: include: The upper support portion includes a detection board, the detection board is provided with a connection terminal, the connection terminal is used to connect with the gold finger of the to-be-detected aged board, and the detection board is used to detect the to-be-detected aged board; A lower support portion is stacked up and down with the upper support portion and is rotatably connected thereto, wherein a support area is provided on a side of the lower support portion close to the upper support portion, and the support area is arranged opposite to the connecting terminal; The upper support portion is rotated in a direction away from the lower support portion until an opening is formed between the connection terminal and the support area, so that the gold finger of the tempered board to be tested is attached to the support area through the opening; or, The upper supporting portion is rotated in a direction close to the lower supporting portion until the connecting terminal contacts the gold finger of the aged board to be detected.

2. The portable intelligent inspection system for burn-in plate faults according to claim 1 is characterized in that: A supporting protrusion extending toward the connecting terminal is provided in the supporting area, and the supporting protrusion is used to support at least a portion of the gold fingers of the annealed board to be tested.

3. The portable intelligent inspection system for burn-in plate faults according to claim 2 is characterized in that: A buffer layer is provided on one side of the supporting protrusion close to the upper supporting portion.

4. The portable intelligent inspection system for burn-in plate faults according to claim 1 is characterized in that: A positioning protrusion is provided on one side of the lower supporting portion close to the upper supporting portion, and the positioning protrusion is connected to the supporting area to position the gold finger located on the supporting area.

5. The portable intelligent inspection system for aging plate faults according to claim 4 is characterized in that: The supporting area includes a first area and a second area with a gap, and the positioning protrusion includes a first protrusion, a second protrusion and a third protrusion. The first protrusion is connected to a side of the first area away from the second area, the second protrusion is located between the first area and the second area, and is connected to the first area and the second area. The third protrusion is connected to a side of the second area away from the first area.

6. The portable intelligent inspection system for burn-in plate faults according to claim 5 is characterized in that: The detection board is provided with a first connection area and a second connection area. There are multiple connection terminals, which are located on the first connection area and the second connection area. The first connection area is arranged opposite to the first area, and the second connection area is arranged opposite to the second area.

7. The portable intelligent inspection system for burn-in plate faults according to claim 1 is characterized in that: A connecting ear is provided on one side of the upper support portion close to the lower support portion, and a supporting ear is provided on one side of the lower support portion close to the upper support portion. A connecting rod passes through the connecting ear and the supporting ear to enable the lower support portion to be rotatably connected to the upper support portion.

8. The portable intelligent inspection system for burn-in plate faults according to claim 7 is characterized in that: A buffer zone is provided on one side of the lower support portion close to the upper support portion, a plurality of buffer members are provided on the buffer zone, and the buffer members are arranged toward the upper support portion, and the connecting rod is located between the buffer zone and the support zone; When the upper supporting portion rotates relative to the lower supporting portion to be close to the buffer member, the buffer member is used to buffer the acting force between the upper supporting portion and the lower supporting portion.

9. The portable intelligent inspection system for burn-in plate faults according to claim 8 is characterized in that: The buffer member includes an elastic member and a guide column that are sleeved and connected. One end of the elastic member is connected to the lower support portion, and the other end is connected to the upper support portion. The guide column is located on the lower support portion.

10. The portable intelligent inspection system for burn-in plate faults according to claim 1 is characterized in that: The upper support part also includes a touch screen display, which is located on a side of the upper support part away from the lower support part and is electrically connected to the detection board for issuing detection instructions to the detection board and displaying the detection results of the detection board on the aged board to be detected.

11. A method for applying the portable intelligent inspection system for burn-in plate faults according to any one of claims 1 to 10, characterized in that: include: Rotating the upper support portion so that the connecting terminal is away from the lower support portion; Placing the gold finger of the aged board to be tested on the support area, and rotating the upper support portion so that the connecting terminal abuts against the gold finger of the aged board to be tested; The detection board is started to detect the aged board to be detected.

12. The method according to claim 11, characterized in that The starting of the detection board to detect the aged board to be detected includes: Sending a detection instruction to the detection board via the touch display screen; The detection board receives the detection instruction and determines the type of the aged board to be detected; The detection board detects the aged board to be detected based on the type of the aged board to be detected, obtains the detection result, and sends it to the touch display screen; The touch screen receives and displays the detection result.