Self-adjusting point contact type testing device and method for MOSFET (Metal Oxide Semiconductor Field Effect Transistor)
By designing a self-adjusting point-contact test device for MOSFET transistors and using a turntable and a follower clamping mechanism to realize automatic clamping, transportation and detection of transistors, the problem of automatic classification in the existing technology is solved, and efficient automatic testing and classification are achieved.
Patent Information
- Application Number
- CN202510831151.X
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-06-20
- Publication Date
- 2025-09-05
AI Technical Summary
In the existing transistor testing process, transistors cannot be automatically classified according to their quality after inspection, resulting in the mixing of transistors of different qualities, which increases the difficulty of subsequent classification and testing costs.
A self-adjusting point-contact testing device for MOSFET transistors was designed, which included a turntable, a follower clamping mechanism, a detection and control component, and a pushing mechanism. The rotation of the turntable enabled automatic clamping, transportation, and detection of transistors. A cylinder was used to control the detection head for point-contact testing, and good and defective products were automatically classified according to the test results.
It realizes automatic clamping and transportation before and after transistor testing, and can automatically classify according to the test results, which simplifies subsequent operations and reduces testing costs.
Smart Images
Figure CN120595071A_ABST
Abstract
Description
Technical Field
[0001] The present invention relates to the technical field of transistor testing, in particular to a self-regulating point-contact testing device and method for a MOSFET transistor. Background Art
[0002] The operating principle of a transistor is based on the transport of charge carriers and the field effect in semiconductor materials. Controlling the gate voltage changes the electric field distribution on the semiconductor surface, thereby modulating the current between the source and drain.
[0003] By controlling the gate voltage, the electric field distribution on the semiconductor surface is altered, thereby modulating the current between the source and drain. Specifically, when a voltage is applied between the gate and source, an electric field is generated on the semiconductor surface beneath the gate. This electric field changes the charge distribution on the semiconductor surface, thereby affecting the current between the source and drain.
[0004] During transistor production, they often need to be tested. Existing tests typically involve clamping the transistor first and then transferring it to the desired inspection location for testing. However, after testing is complete, an ejection device is required to assist the transistor in detaching from the clamping device, and the ejection location is typically fixed. If the transistor is defective, it cannot be sorted based on quality, potentially leading to the mixing of transistors of varying qualities. Summary of the Invention
[0005] The object of the present invention is to provide a MOSFET transistor self-regulating point contact test device and method to solve the problems raised in the above background technology.
[0006] To achieve the above-mentioned objectives, the present invention provides the following technical solutions: a self-adjusting point-contact testing device for a MOSFET transistor, comprising: a workbench, and a protective box fixedly mounted on the workbench, a cylinder fixed in the protective box, a detection head fixed to the telescopic end of the cylinder; further comprising: a turntable rotatably mounted on the workbench, a plurality of fixed clamping plates equidistantly distributed around a circumference fixedly mounted on the turntable; a follower clamping mechanism disposed on the workbench and connected to the turntable, a movable clamping plate connected to the follower clamping mechanism, the follower clamping mechanism being capable of actuating when the turntable moves to drive the movable clamping plate to move toward or away from the fixed clamping plate; a detection and control component disposed on the follower clamping mechanism, for controlling the coordination state of the movable clamping plate and the fixed clamping plate through the follower clamping mechanism; a pushing mechanism disposed on the turntable and connected to the follower clamping mechanism, a synchronous adjustment component connected to the pushing mechanism being disposed on the follower clamping mechanism, the pushing mechanism being capable of ejecting the transistor through the synchronous adjustment component when the turntable moves.
[0007] As a further solution of the present invention: the follower clamping mechanism includes a plurality of support plates fixedly mounted on the turntable and equidistantly distributed around the circumference, a slide groove is provided on the support plate, a guide column is fixed in the slide groove, and a sliding assembly connected to the slide groove is provided on the guide column.
[0008] As a further solution of the present invention: the sliding assembly includes a sliding block slidably mounted on the guide column and slidably connected to the slide groove, the sliding block is fixedly connected to the movable clamping plate, the guide column is provided with a spring abutting against the sliding block, a limiting column is fixed on the sliding block, and a driven structure connected to the limiting column is provided on the workbench.
[0009] As a further solution of the present invention: the driven structure includes a fixed rod fixedly installed on the workbench, a support plate is fixed to the end of the fixed rod, a guide groove is opened on the circumferential outer wall of the support plate, and the guide groove is slidably engaged with the limit column.
[0010] As a further solution of the present invention: the detection and control component includes a first electromagnet fixedly mounted on the support plate, a first fixed block and a second fixed block are fixed on the circumferential outer wall of the support plate, a first guide rod is rotatably mounted on the support plate, and the first guide rod is in contact with the first fixed block and the second fixed block.
[0011] As a further solution of the present invention: the pushing mechanism includes a plurality of supporting sleeves fixedly mounted on the workbench and equidistantly distributed around the circumference, a through groove is provided on the circumferential outer wall of the supporting sleeve, and a supporting assembly is provided inside the supporting sleeve.
[0012] As a further solution of the present invention: the support assembly includes a movable rod slidably installed in the support sleeve, a push ring is fixed to the end of the movable rod, a limiting ring is fixed to the end of the movable rod away from the push ring, the limiting ring is slidably connected to the through groove, and a guide structure connected to the limiting ring is provided on the support plate.
[0013] As a further solution of the present invention: the guiding structure includes a guiding groove provided on the bottom of the supporting plate, a supporting column is fixed on the limiting ring, and the supporting column is slidably engaged with the guiding groove.
[0014] As a further solution of the present invention: the synchronous adjustment component includes a second electromagnet fixedly installed on the bottom of the support plate, a third fixed block and a fourth fixed block are fixed on the support plate, a second guide rod is rotatably installed on the support plate, and the second guide rod is in contact with the third fixed block and the fourth fixed block.
[0015] A self-regulating point-contact testing method for a MOSFET transistor comprises the following steps: Step 1: Place the transistor to be tested on the fixed clamping plate. At this time, the turntable rotates and controls the movable clamping plate to move toward the fixed clamping plate through the follower clamping mechanism to clamp the transistor. Step 2: Under the action of the turntable, the clamped transistor is transported to the position where it cooperates with the detection head, and under the action of the cylinder, the detection head is controlled to perform point contact detection on the transistor; Step 3: After the detection is completed, the movement of the detection and control component and the synchronous adjustment component can be controlled according to the detection results; Step 4: Under the action of the detection and control component and the synchronous adjustment component, the movable clamping plate is controlled to separate from the fixed clamping plate through the follower clamping mechanism, and the detected transistor is pushed out of the fixed clamping plate under the action of the pushing mechanism.
[0016] Compared with the prior art, the beneficial effect of the present invention is that the present application can automatically clamp the transistor before the transistor is tested and transport it to the test position to achieve the effect of continuous automatic testing of the transistor. Specifically, when the turntable rotates, it drives the follower clamping mechanism to move and controls the movable clamping plate to move to a position coordinated with the fixed clamping plate to clamp the transistor. Under the action of the turntable, the clamped transistor is transported to the position to be tested. At this time, the detection head can be controlled by the cylinder to move toward the direction of the transistor to perform point contact testing on the transistor. When the test is completed, the movement of the detection control component and the synchronous adjustment component can be controlled according to the test results to control the release of the transistor by the movable clamping block through the follower clamping mechanism, and under the action of the pushing mechanism, the transistor is pushed to the desired position, thereby achieving the effect of automatic classification.
[0017] The turntable rotates intermittently and the angle of each rotation is the same, which ensures that each time the rotation stops, there is a transistor located under the detection head and stays there for a certain period of time to ensure that the cylinder can control the detection head to move to the contact position with the transistor and perform point contact testing.
[0018] Under the action of the detection and control component and the synchronization adjustment component, the movement trajectory of the support column is adjusted according to the detection results of the transistor to automatically push the good and defective transistors to the designated positions respectively, which not only simplifies the subsequent classification operations but also reduces the testing cost. BRIEF DESCRIPTION OF THE DRAWINGS
[0019] Figure 1 A schematic structural diagram of an embodiment of a self-regulating point-contact test device for MOSFET transistors; Figure 2 A schematic structural diagram of another angle of an embodiment of a self-regulating point-contact test device for MOSFET transistors; Figure 3 A schematic diagram of the connection relationship among a rotating disk, a supporting disk, and a follower clamping mechanism in one embodiment of a self-adjusting point-contact test device for MOSFET transistors; Figure 4 for Figure 3 A schematic diagram of the structure at point A in the middle; Figure 5 This is a structural diagram of part of the pushing mechanism and detection and control components in one embodiment of a self-regulating point-contact test device for MOSFET transistors; Figure 6 This is a structural diagram of a detection and control component and a synchronous adjustment component in one embodiment of a self-regulating point-contact test device for MOSFET transistors; Figure 7 for Figure 6 A magnified schematic diagram of the structure at B in the middle; Figure 8 A schematic structural diagram of a turntable and a follower clamping mechanism in one embodiment of a self-adjusting point-contact test device for MOSFET transistors; Figure 9 A schematic structural diagram of a follower clamping mechanism in one embodiment of a self-regulating point-contact test device for MOSFET transistors; Figure 10 This is a schematic diagram of the exploded structure of a follower clamping mechanism in one embodiment of a self-regulating point-contact test device for MOSFET transistors; Figure 11 This is a structural diagram of a support plate and a detection and control component in one embodiment of a self-regulating point-contact test device for MOSFET transistors; Figure 12 This is a schematic diagram of the exploded structure of part of the pushing mechanism in one embodiment of a self-regulating point-contact testing device for MOSFET transistors.
[0020] Figure: 1, workbench; 2, protective box; 3, cylinder; 4, detection head; 5, turntable; 6, fixed clamping plate; 7, support plate; 8, slide; 9, guide column; 10, slide block; 11, spring; 12, movable clamping plate; 13, limit column; 14, fixed rod; 15, support plate; 1501, first annular groove; 1502, spiral groove; 1503, second annular groove; 1504, clamping groove; 1505, third annular groove; 1506 , first arc groove; 1507, first oblique groove; 1508, second oblique groove; 1509, second arc groove; 16, first electromagnetic; 17, first fixed block; 18, second fixed block; 19, first guide rod; 20, second electromagnetic; 21, third fixed block; 22, fourth fixed block; 23, second guide rod; 24, support sleeve; 2401, through groove; 25, movable rod; 26, push ring; 27, limit ring; 28, support column. DETAILED DESCRIPTION
[0021] The following will clearly and completely describe the technical solutions in the embodiments of the present invention in conjunction with the accompanying drawings. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of the present invention.
[0022] In addition, when an element in the present invention is referred to as being "fixed to" or "disposed on" another element, it may be directly on the other element or there may be an intermediate element. When an element is referred to as being "connected to" another element, it may be directly connected to the other element or there may be an intermediate element. The terms "vertical," "horizontal," "left," "right," and similar expressions used herein are for illustrative purposes only and do not represent the only implementation method.
[0023] See also Figures 1 to 12 In one embodiment of the present invention, a MOSFET transistor self-adjusting point contact test device includes: a workbench 1; and a protective box 2 fixedly mounted on the workbench 1, wherein a cylinder 3 is fixed in the protective box 2, and a detection head 4 is fixed to the telescopic end of the cylinder 3; and further includes: a turntable 5 rotatably mounted on the workbench 1, and a plurality of fixed clamping plates 6 equidistantly distributed around the circumference are fixedly mounted on the turntable 5; see Figures 1-4 、 Figures 6-11 , a follower clamping mechanism is arranged on the workbench 1 and connected to the turntable 5, and a movable clamping plate 12 is connected to the follower clamping mechanism, and the follower clamping mechanism can be actuated when the turntable 5 moves to drive the movable clamping plate 12 to move toward or away from the fixed clamping plate 6, and the follower clamping mechanism includes a plurality of support plates 7 fixedly mounted on the turntable 5 and equidistantly distributed around the circumference, a slide groove 8 is provided on the support plate 7, a guide column 9 is fixed in the slide groove 8, and a sliding component connected to the slide groove 8 is provided on the guide column 9, wherein the sliding component includes a sliding mounting A sliding block 10 is on the guide column 9 and slidably connected to the slide groove 8. The sliding block 10 is fixedly connected to the movable clamping plate 12. A spring 11 is sleeved on the guide column 9 to abut against the sliding block 10. A limiting column 13 is fixed on the sliding block 10. A driven structure connected to the limiting column 13 is provided on the workbench 1. The driven structure mentioned above includes a fixed rod 14 fixedly mounted on the workbench 1, and a support plate 15 is fixed to the end of the fixed rod 14. A guide groove is opened on the circumferential outer wall of the support plate 15, and the guide groove is slidably engaged with the limiting column 13.
[0024] In detail, a plurality of fixed clamping plates 6 are fixed on the turntable 5, which can be used in conjunction with the feeding equipment when testing the transistor. Each fixed clamping plate 6 is equipped with a movable clamping plate 12. The plurality of fixed clamping plates 6 can be divided into a loading position, a transfer position, a detection position, a defective product discharge position, and a good product discharge position according to the test process. The loading position is located at the end of the stroke away from the detection head 4 and cooperates with the feeding equipment. The detection position is located directly below the detection head 4. The defective product discharge position is located adjacent to the detection position, and the good product discharge position is located adjacent to the defective product discharge position. The guide groove can be divided into multiple sections, namely the first annular groove 1 501, spiral groove 1502, second annular groove 1503, clamping groove 1504, third annular groove 1505, both ends of the second annular groove 1503 are respectively connected with one end of the spiral groove 1502 and the clamping groove 1504, the other ends of the spiral groove 1502 and the clamping groove 1504 are respectively connected with the first annular groove 1501, and the spiral groove 1502, the second annular groove 1503, and the clamping groove 1504 are distributed in three groups in a circumferential staggered manner, and the three groups are respectively located at the loading position, the good product discharge position and the defective product discharge position, and the third annular groove 1505 is used to connect the clamping groove 1504 and the spiral groove 1502 located at the defective product discharge position.
[0025] Specifically, taking one of the fixed clamping plates 6 and the movable clamping plate 12 at the loading position as an example, in the initial state, the limiting post 13 is located at the connection position of the second annular groove 1503 and the spiral groove 1502, so that the sliding block 10 is located at the end of the stroke away from the fixed clamping plate 6, so that the distance between the movable clamping plate 12 and the fixed clamping plate 6 is the largest, the spring 11 is in a compressed state, and the compression amount is the largest. Under the action of the loading equipment, the transistor to be tested is placed on the fixed clamping plate 6. At this time, the turntable 5 rotates and drives the fixed clamping plate 6 and the support plate 7 to move, thereby driving the limiting post 13 to slide along the second annular groove 1503. Due to the second annular groove 150 3 is very small, so the turntable 5 only needs to rotate a small angle, and the limiting post 13 will disengage from the second annular groove 1503. At this time, the spring 11 is elastically released and drives the sliding block 10 to move along the length direction of the guide post 9, so that the limiting post 13 enters the slot 1504. The sliding block 10 also drives the movable clamping plate 12 to move. When the limiting post 13 moves to the connection position between the slot 1504 and the first annular groove 1501, the movable clamping plate 12 moves to a position that fits with the fixed clamping plate 6 and clamps the transistor. At this time, the turntable 5 continues to move until the transistor moves to a position that cooperates with the detection head 4. At this time, the cylinder 3 works and controls the detection head 4 to move to the position that fits with the crystal The position where the body tube fits is used to test the transistor. When the test is completed, the detection head 4 can control the movement of the detection control component and the synchronous adjustment component according to the detection result. If the detection result is a good product, the limit column 13 will pass through the third annular groove 1505 and move into the spiral groove 1502 located at the good product discharge position, so that the sliding block 10 moves in a direction away from the fixed clamping plate 6, so that the movable clamping plate 12 is separated from the fixed clamping plate 6, and the transistor is ejected under the action of the pushing mechanism. If the detection result is a defective product, the limit column 13 cannot pass through the third annular groove 1505 under the action of the detection control component, and enters the spiral groove 1502 located at the defective product discharge position. 2, so that the movable clamping plate 12 is separated from the fixed clamping plate 6 at the defective product discharge position, and the transistor is pushed out under the action of the pushing mechanism. When the limiting column 13 returns to the initial position, the above steps can be repeated to automatically clamp the transistor and transport it to the detection position for detection. According to the test results, the transistor is automatically controlled to be separated from the fixed clamping plate 6 and pushed to the corresponding position to achieve efficient and automatically classified automated testing. Among them, the card slot 1504 is set in a triangular shape. When the turntable 5 rotates, sufficient space can be left for the limiting column 13 to slide toward the first annular groove 1501, thereby preventing the limiting column 13 from interfering with the support disk 15.
[0026] Preferably, storage boxes can be installed at the defective product discharge position and the good product discharge position to receive the corresponding products to achieve the effect of automatic classification. At the same time, the turntable 5 rotates intermittently, and the rotation angle is the same each time, which can ensure that each time the rotation stops, there is a transistor located under the detection head 4 and stays for a certain period of time to ensure that the cylinder 3 can control the detection head 4 to move to the position abutting the transistor and perform a point contact test. Since the fixed clamping plate 6 moves intermittently, each fixed clamping plate 6 that moves to the loading position can be automatically loaded under the action of the loading equipment, thereby achieving the effect of continuous detection of the transistor. The loading equipment is an application of the existing technology, which can be a robot clamping loading or a conveyor belt conveying loading. It can be selected according to actual needs. This is an application of the existing technology and will not be elaborated in this application.
[0027] See also Figure 5-Figure 7 、 Figure 11 , a detection and control component is arranged on the follow-up clamping mechanism, and is used to control the cooperation state of the movable clamping plate 12 and the fixed clamping plate 6 through the follow-up clamping mechanism. The detection and control component includes a first electromagnet 16 fixedly mounted on the support plate 15, and a first fixed block 17 and a second fixed block 18 are fixed on the outer wall of the support plate 15. A first guide rod 19 is rotatably mounted on the support plate 15, and the two sides of the first guide rod 19 are respectively in contact with the first fixed block 17 and the second fixed block 18.
[0028] It should be noted that the detection and control component is located in a position that cooperates with the defective product discharge position. The first guide rod 19 is made of iron material, and a torsion spring is sleeved on its rotating shaft. Under the action of the torsion spring, the first guide rod 19 has a tendency to move toward the second fixed block 18. When the first electromagnetic device 16 works, it can generate a certain magnetic force. Under the action of the magnetic force, the first guide rod 19 overcomes the force provided by the torsion spring and rotates to a position that fits the first fixed block 17. At this time, the first guide rod 19 will rotate the screw that cooperates with it. The spiral groove 1502 is cut off, so that the limiting post 13 can only slide along the third annular groove 1505. When the limiting post 13 is detected, if the detection result is a good product, the detection head 4 controls the first electromagnetic device 16 to be in a working state, so that the first guide rod 19 is always in contact with the first fixed block 17 to ensure that the limiting post 13 passes through the third annular groove 1505 smoothly and moves to the spiral groove 1502 at the good product discharge position to release the transistor at the good product discharge position. If the detection result is a defective product, the detection head 4 controls the first electromagnetic device 16 to be in a working state, so that the first guide rod 19 is always in contact with the first fixed block 17 to ensure that the limiting post 13 passes through the third annular groove 1505 smoothly and moves to the spiral groove 1502 at the good product discharge position to release the transistor at the good product discharge position. The first electromagnetic device 16 is controlled to be closed, so that the magnetic force applied to the first guide rod 19 disappears. Under the action of the torsion spring, the first guide rod 19 moves toward the second fixed block 18. When the first guide rod 19 abuts the second fixed block 18, the first guide rod 19 will block the third annular groove 1505 and make the spiral groove 1502 unobstructed. When the limiting post 13 moves to the defective product discharge position, the limiting post 13 abuts the first guide rod 19, so that the limiting post 13 enters the spiral groove 1502, so that the movable clamping plate 12 is separated from the fixed clamping plate 6 at the defective product discharge position. At this time, under the action of the pushing mechanism, the transistor is ejected. By controlling the switch of the first electromagnetic device 16, different forces can be applied to the first guide rod 19 and the movement trajectory of the limiting post 13 can be adjusted, thereby achieving the effect of automatically adjusting the discharge position of the transistor according to different detection results to automatically perform classification. Among them, the first electromagnetic device 16 is used to generate magnetic force. This is an application of the existing technology and will not be described in detail in this application.
[0029] See also Figure 1-Figure 7 、 Figure 12, a pushing mechanism is arranged on the turntable 5 and connected to the follower clamping mechanism, the pushing mechanism includes a plurality of supporting sleeves 24 fixedly mounted on the turntable 5 and equidistantly distributed on the circumference, the distance between the supporting sleeve 24 and the center of the turntable 5 is less than the distance between the fixed clamping plate 6 and the center of the turntable 5, the supporting sleeve 24 is provided with a through groove 2401 on the circumferential outer wall, and a supporting assembly is provided in the supporting sleeve 24, wherein the supporting assembly includes a movable rod 25 slidably mounted in the supporting sleeve 24, a push ring 26 is fixed at the end of the movable rod 25, a limiting ring 27 is fixed at one end of the movable rod 25 away from the push ring 26, and the limiting ring 27 is slidably connected to the through groove 2401, and a guide structure connected to the limiting ring 27 is provided on the support plate 15, and the above-mentioned guide structure includes a guide groove opened at the bottom of the support plate 15, and a support column 28 is fixed on the limiting ring 27, and the support column 28 is slidably engaged with the guide groove.
[0030] Furthermore, the guide groove can be divided into multiple sections, namely the first arc groove 1506, the first inclined groove 1507, the second inclined groove 1508, and the second arc groove 1509. There are two groups of the first inclined groove 1507 and the second inclined groove 1508, and the two groups of the first inclined groove 1507 and the second inclined groove 1508 correspond to the good product discharge position and the defective product discharge position respectively. The second arc groove 1509 is located at the defective product discharge position and is used to connect the corresponding first inclined groove 1507 and the second inclined groove 1508. The first arc groove 1506 corresponds to other test positions of the transistor. In the initial state, the support column 28 is located at the first arc groove. The movable rod 25 is positioned at the end of the stroke toward the support sleeve 24 by controlling the limit ring 27 in the groove 1506. At this time, the push ring 26 is located outside the fixed clamping plate 6. When the transistor detection is completed, if the transistor is good, the support column 28 will slide along the first arc groove 1506. Under the action of the synchronous adjustment component, the first inclined groove 1507 at the defective product discharge position is blocked. Therefore, the support column 28 will enter the first inclined groove 1507 at the good product discharge position through the second arc groove 1509 to control the movement of the limit ring 27 through the support column 28, thereby controlling the movable rod 25 to move toward Move away from the support sleeve 24. Since the limit column 13 is also located in the spiral groove 1502 at this time, the movable clamping plate 12 is separated from the fixed clamping plate 6. Therefore, the transistor is no longer clamped, and the push ring 26 can smoothly enter between the fixed clamping plate 6 and the movable clamping plate 12, thereby pushing the good transistor out of the fixed clamping plate 6. If the detection result is a defective product, the synchronous adjustment component will block the second arc groove 1509 and connect the first inclined groove 1507 at the defective product discharge position. At this time, when the transistor moves to the defective product discharge position, the support column 28 will enter the first inclined groove 1507. At this time, the limiting column 13 also moves to the spiral groove 1502 of the defective product discharge position, so that the movable clamping plate 12 is separated from the fixed clamping plate 6. Under the action of the support column 28, the transistor is pushed out through the push ring 26. When the pushing is completed, the support column 28 will return to the first arc groove 1506 through the second inclined groove 1508, so that the push ring 26 returns to the initial position, and repeats the above steps, thereby adjusting the movement trajectory of the support column 28 according to the detection results of the transistor, so as to automatically push the good and defective transistors to the designated positions respectively, which not only simplifies the subsequent classification operation, but also reduces the testing cost.
[0031] See also Figure 5-Figure 7The follower clamping mechanism is provided with a synchronous adjustment component connected to the pushing mechanism. The pushing mechanism can perform an ejection action on the transistor through the synchronous adjustment component when the turntable 5 moves. The synchronous adjustment component includes a second electromagnetic device 20 fixedly mounted on the bottom of the support disk 15, and a third fixed block 21 and a fourth fixed block 22 are fixed on the support disk 15. A second guide rod 23 is rotatably mounted on the support disk 15, and the two sides of the second guide rod 23 respectively contact and cooperate with the third fixed block 21 and the fourth fixed block 22.
[0032] Furthermore, the second electromagnetic device 20 can also generate magnetic force. The second guide rod 23 is made of iron material, and a torsion spring is also provided on the rotating shaft. Under the action of the torsion spring, the second guide rod 23 has a tendency to move toward the fourth fixed block 22. When the second electromagnetic device 20 is working, the magnetic force it provides to the second guide rod 23 is greater than the force of the torsion spring. Therefore, the second guide rod 23 will abut against the third fixed block 21 to block the first inclined groove 1507, so that the second arc groove 1509 is in an unobstructed state. If the transistor is detected as a good product, the support column 28 can be smoothly Enter the second arc groove 1509 and enter the first inclined groove 1507 located at the good product discharge position to withdraw the transistor. If the transistor is detected as a defective product, the second electromagnetic device 20 stops working at this time. Under the action of the torsion spring, the second guide rod 23 moves to the abutment position with the fourth fixed block 22. When the support column 28 moves to the abutment position with the second guide rod 23, the second guide rod 23 restricts the support column 28 from entering the second arc groove 1509, and guides the support column 28 to enter the first inclined groove 1507 located at the defective product discharge position, thereby pushing the defective transistor to the desired position.
[0033] A self-regulating point-contact testing method for a MOSFET transistor comprises the following steps: Step 1: Place the transistor to be tested on the fixed clamping plate 6. At this time, the turntable 5 rotates, and the follower clamping mechanism controls the movable clamping plate 12 to move toward the fixed clamping plate 6 to clamp the transistor. Step 2: Under the action of the turntable 5, the clamped transistor is transported to the position where it cooperates with the detection head 4, and under the action of the cylinder 3, the detection head 4 is controlled to perform point contact detection on the transistor; Step 3: After the detection is completed, the movement of the detection and control component and the synchronous adjustment component can be controlled according to the detection results; Step 4: Under the action of the detection and control component and the synchronous adjustment component, the movable clamping plate 12 is controlled to separate from the fixed clamping plate 6 through the follower clamping mechanism, and the tested transistor is pushed out of the fixed clamping plate 6 under the action of the pushing mechanism.
[0034] It will be apparent to those skilled in the art that the present invention is not limited to the details of the exemplary embodiments described above and that the invention can be embodied in other specific forms without departing from the spirit or essential characteristics of the invention. Therefore, the embodiments should be considered in all respects as illustrative and non-restrictive, and the scope of the invention is defined by the appended claims, not the foregoing description, and all variations within the meaning and range of equivalents of the claims are intended to be included therein. Any reference sign in a claim should not be construed as limiting the claim to which it relates.
[0035] In addition, it should be understood that although this specification is described in terms of implementation methods, not every implementation method contains only one independent technical solution. This narrative method of the specification is only for the sake of clarity. Those skilled in the art should regard the specification as a whole. The technical solutions in each embodiment can also be appropriately combined to form other implementation methods that can be understood by those skilled in the art.
Claims
1. A MOSFET transistor self-regulating point contact test device, comprising: A workbench (1), and a protective box (2) fixedly mounted on the workbench (1), a cylinder (3) fixed in the protective box (2), a detection head (4) fixed to the telescopic end of the cylinder (3); characterized in that it also includes: a turntable (5) rotatably mounted on the workbench (1), a plurality of fixed clamping plates (6) equidistantly distributed in a circumference fixedly mounted on the turntable (5); a follower clamping mechanism, arranged on the workbench (1) and connected to the turntable (5), a movable clamping plate (12) connected to the follower clamping mechanism, the follower clamping mechanism being able to move on the turntable (5) acts during movement to drive the movable clamping plate (12) to move toward or away from the fixed clamping plate (6); a detection and control component is arranged on the follower clamping mechanism, and is used to control the matching state of the movable clamping plate (12) and the fixed clamping plate (6) through the follower clamping mechanism; a pushing mechanism is arranged on the turntable (5) and connected to the follower clamping mechanism, and a synchronous adjustment component connected to the pushing mechanism is arranged on the follower clamping mechanism, and the pushing mechanism can perform a ejection action on the transistor through the synchronous adjustment component when the turntable (5) moves.
2. A MOSFET transistor self-regulating point contact test device according to claim 1, characterized in that: The follower clamping mechanism comprises a plurality of support plates (7) fixedly mounted on the turntable (5) and equidistantly distributed around the circumference, wherein a slide groove (8) is provided on the support plate (7), a guide column (9) is fixed in the slide groove (8), and a sliding assembly connected to the slide groove (8) is provided on the guide column (9).
3. A MOSFET transistor self-regulating point contact test device according to claim 2, characterized in that: The sliding assembly includes a sliding block (10) slidably mounted on the guide column (9) and slidably connected to the slide groove (8); the sliding block (10) is fixedly connected to the movable clamping plate (12); a spring (11) is sleeved on the guide column (9) and abuts against the sliding block (10); a limiting column (13) is fixed on the sliding block (10); and a driven structure connected to the limiting column (13) is provided on the workbench (1).
4. A MOSFET transistor self-regulating point contact test device according to claim 3, characterized in that: The driven structure comprises a fixing rod (14) fixedly mounted on the workbench (1), a support plate (15) being fixed to the end of the fixing rod (14), a guide groove being provided on the circumferential outer wall of the support plate (15), and the guide groove being slidably engaged with the limiting column (13).
5. A MOSFET transistor self-regulating point contact test device according to claim 4, characterized in that: The detection and control assembly comprises a first electromagnetic device (16) fixedly mounted on the support plate (15); a first fixed block (17) and a second fixed block (18) are fixed to the circumferential outer wall of the support plate (15); a first guide rod (19) is rotatably mounted on the support plate (15); the first guide rod (19) is in contact with the first fixed block (17) and the second fixed block (18).
6. A MOSFET transistor self-regulating point contact test device according to claim 4, characterized in that: The pushing mechanism comprises a plurality of support sleeves (24) fixedly mounted on the workbench (1) and equidistantly distributed around the circumference, a through groove (2401) being provided on the circumferential outer wall of the support sleeve (24), and a support assembly connected to the support plate (15) being provided inside the support sleeve (24).
7. A MOSFET transistor self-regulating point contact test device according to claim 6, characterized in that: The support assembly includes a movable rod (25) slidably mounted in the support sleeve (24), a push ring (26) being fixed to the end of the movable rod (25), a limiting ring (27) being fixed to the end of the movable rod (25) away from the push ring (26), the limiting ring (27) being slidably connected to the through groove (2401), and a guiding structure connected to the limiting ring (27) being provided on the support plate (15).
8. A MOSFET transistor self-regulating point contact test device according to claim 7, characterized in that: The guide structure comprises a guide groove provided at the bottom of the support plate (15); a support column (28) is fixed on the limiting ring (27); and the support column (28) is slidably engaged with the guide groove.
9. A MOSFET transistor self-regulating point contact test device according to claim 8, characterized in that: The synchronous adjustment assembly comprises a second electromagnetic device (20) fixedly mounted on the bottom of the support plate (15); a third fixed block (21) and a fourth fixed block (22) are fixed on the support plate (15); a second guide rod (23) is rotatably mounted on the support plate (15); and the second guide rod (23) is in contact with the third fixed block (21) and the fourth fixed block (22).
10. A MOSFET transistor self-regulating point contact testing method, using the MOSFET transistor self-regulating point contact testing device according to any one of claims 1 to 9, characterized in that: The following steps are involved: Step 1: Place the transistor to be tested on the fixed clamping plate (6). At this time, the turntable (5) rotates, and the follower clamping mechanism controls the movable clamping plate (12) to move toward the fixed clamping plate (6) to clamp the transistor. Step 2: Under the action of the turntable (5), the clamped transistor is transported to a position where it cooperates with the detection head (4), and under the action of the cylinder (3), the detection head (4) is controlled to perform point contact detection on the transistor; Step 3: After the detection is completed, the movement of the detection and control component and the synchronous adjustment component can be controlled according to the detection results; Step 4: Under the action of the detection and control component and the synchronous adjustment component, the movable clamping plate (12) is controlled to separate from the fixed clamping plate (6) through the follower clamping mechanism, and the transistor after detection is pushed out of the fixed clamping plate (6) under the action of the pushing mechanism.