Radioactive ray imaging equipment and detector imaging surface area identification method thereof

Abstract

The invention discloses radioactive ray imaging equipment and a detector imaging surface area identification method thereof. The method comprises the steps of judging whether an imaging surface area of a detector and a visible light irradiation field area projected by a projection device meet a preset position relation; if the imaging surface area of the detector and the visible light irradiation field area do not meet the preset position relation, a projection device is controlled to project a prompt pattern used for identifying the imaging surface area of the detector to a plane assembly; as the visible light irradiation field area and the ray radiation field area of the radioactive rays coincide on the plane assembly, a technician can visually observe whether the position relation between the imaging surface area of the detector and the ray radiation field conforms to the preset position relation or not by judging whether the prompt pattern is displayed on the plane assembly or not; therefore, a technician can more quickly and accurately confirm the position relation between the imaging surface area of the detector and the ray radiation field.

Description

Technical Field

[0001] The present invention relates to the field of radioactive ray imaging, and in particular to a radioactive ray imaging device and a detector imaging surface area identification method thereof. Background Art

[0002] Radiographic imaging equipment, a common imaging system in medical digital imaging, is widely used in physical examinations and routine medical imaging diagnostics. Radiographic imaging equipment uses radioactive rays (such as X-rays) to pass through the subject to create an image.

[0003] When a radioactive ray device is operating, the radiation emitted by the handpiece passes through the subject and is received by the detector's imaging surface, forming an image. This radiation forms a radiation field on the subject's body. Generally speaking, to fully image the subject's area of ​​interest (the area to be diagnosed), the detector's imaging surface must be able to receive all radiation within the radiation field. Therefore, confirming the positional relationship between the detector's imaging surface and the radiation field is a crucial step in the technician's examination process.

[0004] In actual situations, the positional relationship between the imaging surface area of ​​the detector and the radiation field area of ​​the ray mainly relies on the technician's own subjective experience for confirmation, and there is a lack of objective evaluation and measurement tools. In addition, in some equipment, the detector is blocked by other objects (such as bed boards, etc.), making it impossible for the technician to directly observe the detector. Therefore, confirming whether the imaging surface area of ​​the detector and the radiation field area of ​​the ray conform to the preset positional relationship has become a problem that troubles technicians. Summary of the Invention

[0005] In view of the above problems, the present invention proposes a radioactive ray imaging device and a method for identifying the imaging surface area of ​​its detector, which are described in detail below.

[0006] According to a first aspect, an embodiment provides a radioactive ray imaging device, comprising:

[0007] An X-ray emitting device, used for emitting radioactive rays toward the person being examined;

[0008] An X-ray receiving device, comprising a detector and a planar component arranged on the transmission path of the radioactive ray, for receiving the radioactive ray transmitted through the subject; the X-ray receiving device has a planar component;

[0009] a projection device, disposed in the X-ray emitting device, for generating visible light to form a visible light irradiation field area on the planar component;

[0010] Processor for:

[0011] Acquiring the imaging surface area of ​​the detector and the visible light irradiation field area;

[0012] Determining whether the imaging surface area of ​​the detector and the visible light irradiation field area satisfy a preset position relationship;

[0013] If the imaging surface area of ​​the detector and the visible light irradiation field area do not satisfy a preset positional relationship, a prompt pattern is obtained and the projection device is controlled to project the prompt pattern onto the plane component; the prompt pattern is used to identify the imaging surface area of ​​the detector.

[0014] In one embodiment, the X-ray emitting device comprises:

[0015] The handpiece, which produces X-rays;

[0016] A beam limiter, wherein the projection device is arranged in the beam limiter, and the beam limiter also includes a ray radiation field control device and a reflection device, wherein:

[0017] The reflecting device is used to reflect the visible light generated by the projecting device so that the visible light irradiation field and the ray radiation field overlap on the plane component.

[0018] In one embodiment, it further includes:

[0019] A position detection device is used to detect the position data of the detector, the position data of the projection device and / or the position data of the planar component.

[0020] In one embodiment, the processor acquiring the imaging surface area of ​​the detector includes:

[0021] Acquiring position data of the detector;

[0022] An imaging surface area of ​​the detector is determined according to the position data of the detector.

[0023] In one embodiment, the processor obtaining the visible light irradiation field area includes:

[0024] Acquiring position data of the projection device and position data of the planar component;

[0025] The visible light irradiation field area is determined according to the position data of the projection device and the position data of the planar component.

[0026] In one embodiment, the processor controlling the projection device to generate a prompt pattern includes:

[0027] Acquiring position data of the detector and position data of the projection device;

[0028] determining a positional relationship between the detector and the projection device according to the position data of the detector and the position data of the projection device;

[0029] Acquiring projection parameters of the projection device;

[0030] A prompt pattern is acquired according to the positional relationship between the detector and the projection device and the projection parameters.

[0031] In one embodiment, the invention further comprises: a camera device for photographing a visible light illumination field area displayed on the planar component; and the processor acquiring the visible light illumination field area comprises:

[0032] Acquiring an image corresponding to the visible light irradiation field area captured by the camera device;

[0033] The visible light irradiation field area is identified according to the image.

[0034] In one embodiment, the preset position relationship includes:

[0035] The imaging surface area of ​​the detector is larger than the visible light irradiation field area;

[0036] The position difference between the visible light illumination field area and the imaging surface area of ​​the detector is within a preset difference range; the position difference includes: the distance between the center point of the visible light illumination field area and the center point of the imaging surface area of ​​the detector, and / or the distance between corresponding boundaries of the visible light illumination field area and the imaging surface area of ​​the detector.

[0037] In one embodiment, the prompt pattern includes: a rectangular frame corresponding to the imaging surface area of ​​the detector and / or a color filling pattern corresponding to the imaging surface area of ​​the detector.

[0038] According to a second aspect, an embodiment provides a method for identifying an imaging surface area of ​​a detector of a radioactive ray imaging device, wherein the radioactive ray imaging device includes an X-ray emitting device and an X-ray receiving device, wherein the X-ray receiving device includes a detector and a planar component disposed on a transmission path of the radioactive ray, and wherein a projection device is disposed within the X-ray emitting device. The method includes:

[0039] Acquiring the imaging surface area of ​​the detector and the visible light irradiation field area;

[0040] Determining whether the imaging surface area of ​​the detector and the visible light irradiation field area satisfy a preset position relationship;

[0041] If the imaging surface area of ​​the detector and the visible light irradiation field area do not satisfy a preset positional relationship, a prompt pattern is obtained and the projection device is controlled to project the prompt pattern onto the plane component; the prompt pattern is used to identify the imaging surface area of ​​the detector.

[0042] In one embodiment, acquiring the imaging surface area of ​​the detector includes:

[0043] Acquiring position data of the detector;

[0044] An imaging surface area of ​​the detector is determined according to the position data of the detector.

[0045] In one embodiment, obtaining the visible light irradiation field area includes:

[0046] Acquiring position data of the projection device and position data of the planar component;

[0047] The visible light irradiation field area is determined according to the position data of the projection device and the position data of the planar component.

[0048] In one embodiment, controlling the projection device to generate a prompt pattern includes:

[0049] Acquiring position data of the detector and position data of the projection device;

[0050] determining a positional relationship between the detector and the projection device according to the position data of the detector and the position data of the projection device;

[0051] Acquiring projection parameters of the projection device;

[0052] A prompt pattern is acquired according to the positional relationship between the detector and the projection device and the projection parameters.

[0053] In one embodiment, obtaining the visible light irradiation field area includes:

[0054] Acquiring a visible light irradiation field area displayed on the planar component captured by a camera device, and obtaining an image corresponding to the visible light irradiation field area;

[0055] The visible light irradiation field area is identified according to the image.

[0056] In one embodiment, the preset position relationship includes:

[0057] The imaging surface area of ​​the detector is larger than the visible light irradiation field area;

[0058] The position difference between the visible light illumination field area and the imaging surface area of ​​the detector is within a preset difference range; the position difference includes: the distance between the center point of the visible light illumination field area and the center point of the imaging surface area of ​​the detector, and / or the distance between corresponding boundaries of the visible light illumination field area and the imaging surface area of ​​the detector.

[0059] In one embodiment, the prompt pattern includes: a rectangular frame corresponding to the imaging surface area of ​​the detector and / or a color filling pattern corresponding to the imaging surface area of ​​the detector.

[0060] According to a third aspect, an embodiment provides a computer-readable storage medium, on which a program is stored. The program can be executed by a processor to implement the method as described in any one of the above embodiments.

[0061] According to the radioactive ray imaging equipment and the detector imaging surface area identification method of the above-mentioned embodiment, it is determined whether the imaging surface area of ​​the detector and the visible light irradiation field area projected by the projection device meet the preset position relationship; if the imaging surface area of ​​the detector and the visible light irradiation field area do not meet the preset position relationship, the prompt pattern used to identify the imaging surface area of ​​the detector is projected onto the plane component; since the visible light irradiation field area and the radiation field area of ​​the radioactive ray overlap on the plane component, the technician can intuitively observe whether the positional relationship between the imaging surface area of ​​the detector and the radiation field meets the preset positional relationship by whether the prompt pattern is displayed on the plane component, so that the technician can confirm the positional relationship between the imaging surface area of ​​the detector and the radiation field more quickly and accurately. BRIEF DESCRIPTION OF THE DRAWINGS

[0062] Figure 1 A schematic structural diagram of a radioactive ray imaging device according to an embodiment;

[0063] Figure 2 Schematic diagram of the structure of an X-ray emitting device according to an embodiment;

[0064] Figure 3 This is a schematic structural diagram of a machine head according to an embodiment;

[0065] Figure 4 Schematic diagram of the structure of an X-ray emitting device according to an embodiment;

[0066] Figure 5 Schematic diagram of the structure of an X-ray emitting device according to an embodiment;

[0067] Figure 6 This is a schematic structural diagram of an X-ray receiving device according to an embodiment;

[0068] Figure 7 A schematic structural diagram of a detector according to an embodiment;

[0069] Figure 8 A schematic structural diagram of a radioactive ray imaging device according to an embodiment;

[0070] Figure 9 A schematic structural diagram of a radioactive ray imaging device according to an embodiment;

[0071] Figure 10 A schematic structural diagram of a radioactive ray imaging device according to an embodiment;

[0072] Figure 11 A schematic structural diagram of a radioactive ray imaging device according to an embodiment;

[0073] Figure 12 A flowchart of a method for identifying an imaging surface area of ​​a detector of a radioactive ray imaging device according to an embodiment;

[0074] Figure 13 A schematic diagram of the imaging surface area and visible light irradiation field area of ​​a detector according to an embodiment;

[0075] Figure 14 A flowchart of a method for imaging a detector surface area according to an embodiment;

[0076] Figure 15 A flowchart of a method for obtaining a visible light irradiation field area according to an embodiment;

[0077] Figure 16 A flowchart of a method for obtaining a visible light irradiation field area according to an embodiment;

[0078] Figure 17 A schematic diagram of a visible light irradiation field area and a prompt pattern according to an embodiment;

[0079] Figure 18 The present invention is a flowchart of a method for controlling a projection device to generate a prompt pattern according to an embodiment. DETAILED DESCRIPTION

[0080] The present invention will be further described in detail below by means of specific embodiments in conjunction with the accompanying drawings. Similar elements in different embodiments are numbered with associated similar elements. In the following embodiments, many detailed descriptions are provided to enable the present application to be better understood. However, those skilled in the art will readily appreciate that some of the features may be omitted in different circumstances, or may be replaced by other elements, materials, or methods. In some cases, some operations related to the present application are not shown or described in the specification. This is to avoid the core portion of the present application being overwhelmed by excessive descriptions, and for those skilled in the art, it is not necessary to describe these related operations in detail. They will fully understand the related operations based on the description in the specification and the general technical knowledge in the art.

[0081] In addition, the features, operations, or characteristics described in the specification may be combined in any appropriate manner to form various embodiments. Furthermore, the steps or actions in the method description may be reordered or adjusted in a manner readily apparent to those skilled in the art. Therefore, the various sequences in the specification and drawings are provided solely for the purpose of clearly describing a particular embodiment and are not intended to be mandatory, unless otherwise specified.

[0082] The serial numbers assigned to components herein, such as "first," "second," etc., are used solely to distinguish the objects being described and do not convey any sequential or technical meaning. References to "connection" and "coupling" herein, unless otherwise specified, include both direct and indirect connections (couplings).

[0083] Please refer to Figure 1 In some embodiments, a radioactive ray imaging device is provided. The device includes an X-ray emitting device 10, an X-ray receiving device 20, and a processor 30. The X-ray emitting device 10 is configured to emit radioactive rays, such as X-rays, toward a subject. The X-ray receiving device 20 is configured to receive the radioactive rays that have passed through the subject to perform imaging. This is described in detail below.

[0084] In some embodiments, please refer to Figure 2 , the X-ray emitting device 10 may include a head 11 and a beam limiter 12. Figure 3The head 11 further includes a high-voltage generator 101 and a radiation emitter 102. The high-voltage generator 101 is electrically connected to the radiation emitter 102 and is used to provide a high-voltage signal, such as a hundred-volt or kilovolt level, to the radiation emitter 102. The radiation emitter 102 is used to bombard the target surface with electrons under the high-voltage signal to generate radioactive radiation, such as X-rays. The radiation emitter 102 can be, for example, a tube. The X-ray receiving device 20 is used to receive the radioactive radiation for imaging. The beam limiter 12 is used to determine or simulate the projection area of ​​the X-ray emitting device 10 or the radiation emitter 102. The area irradiated by the beam limiter 12 can be referred to as the visible light irradiation field area or the visible light irradiation field area. In addition, the X-ray emitting device 10 is used to emit radioactive radiation, and the X-ray receiving device 20 is used to receive radioactive radiation. During this process, the beam limiter 12 can also be used to limit the radiation field area of ​​the radioactive radiation emitted by the radiation emitter 102. Therefore, in some examples, the beam limiter 12 can also serve to confine the radioactive radiation and shield scattered radioactive radiation. In one embodiment, the beam limiter 12 includes a visible light source and a reflecting device, and the reflecting device reflects the visible light generated by the visible light source to overlap with the X-ray emitted by the ray emitter 102 on the optical path, so that the visible light irradiation field area finally formed and the formed ray radiation field area overlap, wherein the visible light source can be an LED light source.

[0085] In some embodiments, please refer to Figure 4 The radioactive ray imaging device may further include a projection device 13, which is disposed within the beam limiter 12 and is configured to project an image under the control of the processor 30. Furthermore, the projection device 13 may also function as a visible light source, generating visible light to form a visible light irradiation field. The reflection device 14 reflects the visible light generated by the projection device 13 so that it coincides with the X-rays emitted by the ray emitter 102 along the optical path, thereby aligning the resulting visible light irradiation field with the resulting X-ray radiation field.

[0086] In some embodiments, please refer to Figure 5 The beam limiter 12 may further include a control unit 15, which may also control the projection device 13 to project the projection image. In one example, the control unit 15 is further connected to the processor 30 for information exchange.

[0087] The X-ray receiving device 20 is a core component of the radioactive ray imaging device and has an important impact on the imaging quality. In some embodiments, the X-ray receiving device 20 is used to receive radioactive rays such as X-rays and ultimately convert them into electrical signals to complete image information acquisition. Figure 6In one embodiment, the X-ray receiving device 20 includes a detector 21 and a planar component 22 for being arranged on the transmission path of the radioactive ray. Figure 7 The detector 21 further includes a ray conversion layer 201 and a TFT matrix layer 202. The ray conversion layer 201 is used to convert radioactive rays, such as X-rays, into visible light; the ray conversion layer 201 generally includes a scintillating layer or a fluorescent layer for converting the rays into visible light. Taking the scintillating layer as an example, it can generally be made of a scintillating material, typically, such as cesium iodide (CsI) or gadolinium oxysulfide (GOS). The TFT matrix layer 202 is used to sense the visible light converted by the ray conversion layer 201 and convert the visible light into an electrical signal for image information acquisition. In some embodiments, the detector 21 can be a flat-panel detector. In some embodiments, the plane component 22 is used to display the projection screen formed by the projection device 13 projecting the projection image. For radioactive ray imaging devices of different structures, the plane component 22 can be different components. For example, for a vertical device, the plane component 22 is a vertical film cassette that houses the detector 21. The projection device 13 projects the projection image onto the side of the vertical film cassette opposite the X-ray emission device 10 to form the projection screen. For another example, for a horizontal device, the plane component is a bed board used to support the patient. The detector 21 is located on the lower side of the bed board. The projection device 13 projects the projection image onto the side of the bed board opposite the X-ray emission device 10 (i.e., the upper side of the bed board) to form the projection screen. It should be noted that in radioactive ray imaging devices, the detector 21 will track the movement of the head 11 to ensure that the detector 21 can receive the X-rays emitted by the head 11. The projection device 13 will also move with the head 11. Therefore, ideally, the area of ​​the projection screen displayed on the plane component 22 should spatially overlap with the imaging surface area of ​​the detector 21.

[0088] In some embodiments, please refer to Figure 8 The radioactive ray imaging device may further include an imaging device 40, or the radioactive ray imaging device may further be connected to an imaging device 40. The imaging device 40 may be capable of capturing images, such as real-time images. In one example, when the projection device 13 projects an image onto the planar component 22 in the X-ray receiving device 20 to form a projection screen, the imaging device 40 may capture an image corresponding to the projection screen displayed on the planar component 22.

[0089] In some embodiments, please refer to Figure 9The radioactive ray imaging device also includes a position detection device 50, such as a position sensor 51. There can be multiple position sensors 51. In one embodiment, the position sensors 51 are distributed at various components in the radioactive ray imaging device to detect the real-time position of each component in the radioactive ray imaging device. In another embodiment, the position sensors 51 are distributed at different positions of a component in the radioactive ray imaging device to detect the shape and size of the component. For example, four position sensors 51 are respectively set at the four corners of the detector to detect the shape and size of the detector. In other embodiments, the radioactive ray imaging device may also include a distance measuring device 52. The distance measuring device 52 is used to measure the distance between various components in the device. For example, the distance measuring device 52 is set on the beam limiter 12 (projection device 13) to measure the distance between the projection device 13 and the plane component 22 in the X-ray receiving device 20 to obtain the projection distance of the projection device 13.

[0090] Figure 10 This is an example of a horizontal radioactive ray imaging device. In the figure, the support structure of the X-ray emitting device 10 may include a slide rail 111, a telescopic cylinder 112 and a first cross arm 113. The head 11 is connected to one end of the telescopic tube 112 through the first cross arm 113, and the other end of the telescopic tube 112 is connected to the slide rail 111. The head 11 can move in two or three dimensions in space through the slide rail 111 and the telescopic cylinder 112. In one embodiment, the beam limiter 12 is arranged at the position of the radioactive ray outlet of the head 11. The device may also include a bed board 211 and a bed support structure 212 for supporting the bed board 211; the bed board 211 can be used to support the subject, for example, for the subject to lie flat. The detector 21 is arranged in the under-bed film box 213, and the under-bed film box 213 is arranged below the bed board 211; in one embodiment, the bed board 211 is usually placed below the head 11, and the head 11 emits X-rays toward the bed board 211. The emitted X-rays are limited by the beam limiter 12 and then emitted to the detector 21 contained in the under-bed film box 213 below the bed board 211 to receive the X-rays.

[0091] Figure 11This is an example of a vertical radioactive ray imaging device. In the figure, the support structure of the X-ray emitting device 10 is the same as that of the horizontal device and will not be described in detail here. The device may also include a column 214 and a column cassette 215 disposed on the column 214. The column cassette 215 and the column 214 are connected by a second cross arm 216. The column cassette 215 is used to accommodate the detector 21. The column cassette 215 can be raised and lowered along the column 214 via the second cross arm 216. When the device is working, the person being tested stands in front of the column cassette 215, and the head 11 emits X-rays in the direction of the column cassette 215. The emitted X-rays are limited by the beam limiter 12 and then pass through the person being tested to the detector 21 in the column cassette 215 to receive the X-rays.

[0092] In some embodiments, the radioactive ray imaging device may be a digital X-ray imaging device (Digital Radiography, DR).

[0093] The above are some descriptions of radioactive ray imaging equipment.

[0094] In some embodiments, the processor 30 is capable of executing the method of radiographic imaging disclosed herein or one or more steps thereof.

[0095] Please refer to Figure 12 The method for identifying the imaging surface area of ​​a detector of a radioactive ray imaging device may include the following steps:

[0096] Step S100: Acquire the imaging surface area and visible light irradiation field area of ​​the detector 21 .

[0097] Please refer to Figure 13 , the imaging surface area and visible light irradiation field area of ​​the detector 21 are described below.

[0098] The imaging surface area A of the detector 21 refers to the area where the detector 20 can receive and sense radiation.

[0099] Region B and region C are both light field areas formed by the visible light emitted by the projection device 13, wherein region B is the light field area formed by the visible light on the plane component 22 (bed board), and region C is the light field area formed by the visible light on the detector 20. It can be seen that region C has the same size and shape as region B, and has the same position along the horizontal direction of the plane component 22. Therefore, region B displayed on the plane component 22 can be used to represent region C, that is, the visible light irradiation field area mentioned in this embodiment is region B.

[0100] In addition, since the radiation field area formed by the radioactive rays on the planar component 22 coincides with the visible light irradiation field area (area B), and since the radioactive rays are invisible light, the radiation field area formed on the planar component 22 cannot be directly observed. Therefore, this embodiment confirms the range of the radiation field area by obtaining the visible light irradiation field area (area B).

[0101] In some embodiments, obtaining the imaging surface area of ​​the detector 21 refers to obtaining the shape and size of the imaging surface of the detector 21. In one embodiment, the imaging surface area can be obtained by detecting the position sensor 51 provided on the detector 21. Figure 14 Step S100 of obtaining the imaging surface area of ​​the detector 21 may include:

[0102] Step S111: Acquire the position data of the detector 21. The position data of the detector 21 may be position data of certain predetermined positions on the imaging surface of the detector 21. For example, for a flat-panel detector, since its imaging surface is rectangular, the position data corresponding to the four corners of the imaging surface of the detector 21 may be detected by position sensors 51 at the four corners.

[0103] Step S112: Determine the imaging surface area of ​​the detector 21 based on the position data of the detector 21. Based on the position data of some set positions on the imaging surface of the detector 21, the shape and size of the imaging surface of the detector 21 can be calculated, thereby determining the imaging surface area of ​​the detector 21.

[0104] In other embodiments, the imaging surface area of ​​the detector 21 may also be obtained through empirical data or user input.

[0105] In some embodiments, the visible light irradiation field area can be calculated by the position data of the projection device 13 and the position data of the plane component 22 displaying the visible light irradiation field area. Figure 15 , obtaining the visible light irradiation field area includes the following steps:

[0106] Step S121: Acquire position data of the projection device 13 and position data of the planar assembly 22. The position data of the projection device 13 may be position data of a light source in the projection device 13. In one embodiment, the position data of the projection device 13 and position data of the planar assembly 22 may be acquired by position sensors 51 disposed in the projection device 13 and the planar assembly 22.

[0107] Step S122: Determine the visible light illumination field based on the position data of projection device 13 and the position data of planar assembly 22. Based on the position data of projection device 13 and the position data of planar assembly 22, the positional relationship between projection device 13 and planar assembly 14 can be calculated. Based on this positional relationship and the parameter information of projection device 13, the visible light illumination field can be calculated.

[0108] In other embodiments, the visible light irradiation field area can be identified by capturing an image corresponding to the visible light irradiation field area displayed on the plane component 22 by the camera device 40. Figure 16 , obtaining the visible light irradiation field area includes the following steps:

[0109] Step S131: Acquire an image corresponding to the visible light illumination field area captured by the camera device 40. In some embodiments, the camera device 40 can be located at any position in the device that can capture the visible light illumination field area displayed on the plane component 22. The camera device 40 can be located inside or outside the beam limiter 12. For example, the camera device 40 can be located on the first beam 113 of the device's support structure.

[0110] Step S132: Identify the visible light illumination field area based on the image corresponding to the visible light illumination field area captured by the camera device 40. In the captured image, the grayscale values ​​of pixels in the visible light illumination field area may differ from those of pixels at other locations in the image. In one embodiment, a grayscale threshold method may be used to identify the visible light illumination field area; in other embodiments, other image processing methods may also be used to identify the visible light illumination field area.

[0111] The above is some description of obtaining the imaging surface area and the visible light irradiation field area of ​​the detector 21.

[0112] Step S200: determining whether the imaging surface area of ​​the detector 21 and the visible light irradiation field area satisfy a preset position relationship.

[0113] Since radioactive rays are invisible light, the ray radiation field area formed on the planar component 22 cannot be directly observed, and the beam limiter 12 can make the visible light irradiation field area formed on the planar component 22 coincide with the ray radiation field area through the reflection device 14 inside it. Therefore, this embodiment can achieve the purpose of confirming whether the imaging surface area of ​​the detector 21 and the ray radiation field area meet the preset position relationship by judging whether the imaging surface area of ​​the detector 21 and the visible light irradiation field area meet the preset position relationship.

[0114] In order for the imaging surface of the detector 21 to receive all rays within the visible light illumination field, the imaging surface area of ​​the detector 21 must completely cover the visible light illumination field. Therefore, the preset positional relationship that needs to be satisfied between the imaging surface area of ​​the detector 21 and the visible light illumination field includes the following two conditions:

[0115] (1) The imaging surface area of ​​the detector 21 is larger than the visible light irradiation field area.

[0116] (2) The position difference between the visible light irradiation field area and the imaging surface area of ​​the detector 21 is within a preset difference range; wherein the position difference includes: the distance between the center point of the visible light irradiation field area and the center point of the imaging surface area of ​​the detector, and / or the distance between the corresponding boundaries of the visible light irradiation field area and the imaging surface area of ​​the detector. That is, when the above condition (1) is met, if the visible light illumination field area and the imaging surface area of ​​the detector 21 are far apart in position, then the imaging surface area of ​​the detector 21 cannot fully cover the visible light illumination field area. Therefore, the visible light illumination field area and the imaging surface area of ​​the detector 21 cannot be too far apart in position. In one embodiment, the distance between the center point of the visible light illumination field area and the center point of the imaging surface area of ​​the detector is within a first preset distance range, and / or the distance between the corresponding boundaries of the visible light illumination field area and the imaging surface area of ​​the detector 21 is within a second preset distance range; and the most ideal position state between the visible light illumination field area and the imaging surface area of ​​the detector 21 is that the center point of the visible light illumination field area and the center point of the imaging surface area of ​​the detector 21 are coaxial, and the corresponding boundaries of the visible light illumination field area and the imaging surface area of ​​the detector 21 are parallel.

[0117] Therefore, the imaging surface area and the visible light irradiation field area of ​​the detector 21 do not satisfy either of the above two conditions, that is, it is determined that the preset position relationship is not satisfied.

[0118] Step S300 : If the imaging surface area of ​​the detector 21 and the visible light irradiation field area do not satisfy the above-mentioned preset positional relationship, obtain a prompt pattern and control the projection device 13 to project the prompt pattern onto the plane component 22 ; the prompt pattern is used to identify the imaging surface area of ​​the detector 21 .

[0119] In some embodiments, the prompt pattern generated by the projection device 21 may include: a rectangular frame corresponding to the imaging surface area of ​​the detector 21 and / or a color filling pattern corresponding to the imaging surface area of ​​the detector 21 .

[0120] Please refer to Figure 17, a visible light irradiation field area B is displayed on the plane component 22. It can be seen that the imaging surface area A of the detector 21 is smaller than the visible light irradiation field area B. Therefore, condition (1) in the above position relationship is not satisfied, that is, the preset position relationship is not satisfied. At this time, a prompt pattern D is displayed on the plane component 22, and the prompt pattern D is a rectangular frame corresponding to the imaging surface area of ​​the detector 21.

[0121] It should be noted that the maximum range of the projection screen formed by the projection device 13 projecting the image onto the plane component 22 is the visible light illumination field area. Under this premise, when the imaging surface area of ​​the detector 21 and the visible light illumination field area do not meet the preset positional relationship, the imaging surface area of ​​the detector 21 and the visible light illumination field area can be divided into the following two types of positional relationships:

[0122] Category 1: The visible light irradiation field area completely covers the imaging surface area of ​​the detector 21, that is, the imaging surface area of ​​the detector 21 can be completely displayed in the visible light irradiation field area. At this time, in the projection image displayed on the plane component 22, the prompt pattern is completely displayed in the visible light irradiation field area. For example, Figure 17 The rectangular frames corresponding to the imaging surface area of ​​the middle detector 21 are all displayed in the visible light irradiation field area.

[0123] The second category: the visible light illumination field area only covers part of the imaging surface area of ​​the detector 21, that is, only part of the imaging surface area of ​​the detector 21 can be displayed in the visible light illumination field area. At this time, in the projection image displayed on the plane component 22, the prompt pattern can only be partially displayed in the visible light illumination field area. For example, only half of the imaging surface area of ​​the detector 21 is covered in the visible light illumination field area. Then, in the rectangular frame corresponding to the imaging surface area of ​​the detector 21 in the projection image, only half can be displayed in the visible light illumination field area.

[0124] It should also be noted that if the imaging surface area of ​​the detector 21 and the visible light irradiation field area have no overlapping parts at all, then the position difference between the two will be very large. At this time, although no prompt pattern is displayed in the projection image displayed on the plane component 22, the technician can still observe the positional relationship between the two with the naked eye.

[0125] In some embodiments, please refer to Figure 18 The step S300 of obtaining the prompt pattern includes the following steps:

[0126] Step S301 : Acquire the position data of the detector 21 and the position data of the projection device 13 . In one embodiment, the position data of the detector 21 and the position data of the projection device 13 can both be acquired through detection by the position sensor 51 .

[0127] Step S302 : determining the positional relationship between the detector 21 and the projection device 13 according to the position data of the detector 21 and the position data of the projection device 13 .

[0128] Step S303: Acquire projection parameters of the projection device 13 .

[0129] Step S304: Acquire a prompt pattern based on the positional relationship and projection parameters between the detector 21 and the projection device 13. In one embodiment, the processor 30 may generate image data (e.g., HDMI data) corresponding to the prompt pattern based on the positional relationship and projection parameters between the detector 21 and the projection device 13. That is, the processor 30 acquiring the prompt pattern may generate image data corresponding to the prompt pattern for the processor 30.

[0130] In other embodiments, the processor 30 may also first generate image data (such as HDMI data) corresponding to the corresponding prompt pattern based on the positional relationship and projection parameters between the detector 21 and the projection device 13, and then the processor 30 outputs the image data to the projection device 13. After the projection device 13 performs some display processing on the image data, the final prompt pattern can be obtained. That is, the processor 30 obtains the prompt pattern, which can enable the processor 30 to obtain the prompt pattern generated by the projection device 13.

[0131] In some further embodiments, the prompt pattern acquired by the processor 30 may also be image data generated by other control processing components and then directly transmitted, which is not limited in this embodiment.

[0132] The above examples are used to illustrate the present invention, which are only used to help understand the present invention and are not intended to limit the present invention. Those skilled in the art can make several simple deductions, modifications or substitutions based on the concept of the present invention.

[0133] This document is described with reference to various exemplary embodiments. However, those skilled in the art will recognize that changes and modifications may be made to the exemplary embodiments without departing from the scope of this document. For example, the various operational steps and components used to perform the operational steps may be implemented in different ways (e.g., one or more steps may be deleted, modified, or incorporated into other steps) depending on the specific application or considering any number of cost functions associated with the operation of the system.

[0134] In the above embodiments, all or part of the embodiments may be implemented through software, hardware, firmware, or any combination thereof. Furthermore, as will be appreciated by those skilled in the art, the principles herein may be embodied in a computer program product on a computer-readable storage medium pre-installed with computer-readable program code. Any tangible, non-transitory computer-readable storage medium may be used, including magnetic storage devices (hard disks, floppy disks, etc.), optical storage devices (CD-ROMs, DVDs, Blu-ray discs, etc.), flash memory, and / or the like. These computer program instructions may be loaded onto a general-purpose computer, a special-purpose computer, or other programmable data processing device to form a machine, such that the instructions executed on the computer or other programmable data processing device can generate a device that implements a specified function. These computer program instructions may also be stored in a computer-readable memory, which can instruct the computer or other programmable data processing device to operate in a specific manner, such that the instructions stored in the computer-readable memory can form an article of manufacture, including an implementation device that implements a specified function. The computer program instructions may also be loaded onto a computer or other programmable data processing device, thereby causing the computer or other programmable device to execute a series of operational steps to generate a computer-implemented process, such that the instructions executed on the computer or other programmable device can provide the steps for implementing the specified function.

[0135] Although the principles of this invention have been shown in various embodiments, many modifications of structure, arrangement, proportion, elements, materials and components that are particularly suitable for specific environments and operational requirements can be used without departing from the principles and scope of this invention. The above modifications and other changes or amendments are intended to be included within the scope of this invention.

[0136] The foregoing detailed description has been described with reference to various embodiments. However, those skilled in the art will recognize that various modifications and changes can be made without departing from the scope of this disclosure. Therefore, the present disclosure will be considered in an illustrative rather than a restrictive sense, and all such modifications will be included within its scope. Similarly, the advantages, other advantages and solutions to the problems of the various embodiments have been described above. However, the benefits, advantages, solutions to the problems and any elements that can produce these, or make them more specific, should not be interpreted as critical, required or necessary. The term "comprising" and any other variants used in this article are all non-exclusive inclusions, so that a process, method, article or device that includes a list of elements includes not only these elements, but also other elements that are not explicitly listed or do not belong to the process, method, system, article or device. In addition, the term "coupled" and any other variants used in this article refer to physical connections, electrical connections, magnetic connections, optical connections, communication connections, functional connections and / or any other connections.

[0137] Those skilled in the art will recognize that many changes can be made to the details of the above embodiments without departing from the basic principles of the invention. Therefore, the scope of the present invention should be determined solely by the claims.

Claims

1. A radioactive ray imaging device, characterized in that: include: An X-ray emitting device, used for emitting radioactive rays toward the person being examined; An X-ray receiving device includes a detector and a planar component arranged on the transmission path of the radioactive rays, wherein the detector is used to receive the radioactive rays that pass through the subject; a projection device, disposed in the X-ray emitting device, for generating visible light to form a visible light irradiation field area on the planar component; Processor for: Acquiring the imaging surface area of ​​the detector and the visible light irradiation field area; Determining whether the imaging surface area of ​​the detector and the visible light irradiation field area satisfy a preset position relationship; If the imaging surface area of ​​the detector and the visible light irradiation field area do not satisfy a preset positional relationship, a prompt pattern is obtained and the projection device is controlled to project the prompt pattern onto the plane component; the prompt pattern is used to identify the imaging surface area of ​​the detector.

2. The device according to claim 1, wherein The X-ray emitting device comprises: The handpiece, which produces X-rays; A beam limiter, wherein the projection device is arranged in the beam limiter, and the beam limiter also includes a ray radiation field control device and a reflection device, wherein: The reflecting device is used to reflect the visible light generated by the projecting device so that the visible light irradiation field and the ray radiation field overlap on the plane component.

3. The device according to claim 2, characterized in that Also includes: A position detection device is used to detect the position data of the detector, the position data of the projection device and / or the position data of the planar component.

4. The device according to claim 3, characterized in that The processor acquiring the imaging surface area of ​​the detector includes: Obtaining position data of the detector; An imaging surface area of ​​the detector is determined according to the position data of the detector.

5. The device according to claim 3, characterized in that The processor obtaining the visible light irradiation field area includes: Acquiring position data of the projection device and position data of the planar component; The visible light irradiation field area is determined according to the position data of the projection device and the position data of the planar component.

6. The device according to claim 3, wherein The processor obtaining the prompt pattern includes: Acquiring position data of the detector and position data of the projection device; determining a positional relationship between the detector and the projection device according to the position data of the detector and the position data of the projection device; Acquiring projection parameters of the projection device; The prompt pattern is acquired according to the positional relationship between the detector and the projection device and the projection parameters.

7. The device according to claim 2, characterized in that Also includes: a camera device for photographing the visible light illumination field area displayed on the planar component; The processor obtaining the visible light irradiation field area includes: Acquiring an image corresponding to the visible light irradiation field area captured by the camera device; The visible light irradiation field area is identified according to the image.

8. The device according to any one of claims 1 to 7, characterized in that The preset position relationship includes: The imaging surface area of ​​the detector is larger than the visible light irradiation field area; The position difference between the visible light illumination field area and the imaging surface area of ​​the detector is within a preset difference range; the position difference includes: the distance between the center point of the visible light illumination field area and the center point of the imaging surface area of ​​the detector, and / or the distance between corresponding boundaries of the visible light illumination field area and the imaging surface area of ​​the detector.

9. The device according to any one of claims 1 to 7, characterized in that The prompt pattern includes: a rectangular frame corresponding to the imaging surface area of ​​the detector and / or a color filling pattern corresponding to the imaging surface area of ​​the detector.

10. A method for marking the imaging surface area of ​​a detector of a radioactive ray imaging device, wherein the radioactive ray imaging device comprises an X-ray emitting device and an X-ray receiving device, wherein the X-ray receiving device comprises a detector and a planar component arranged on the transmission path of the radioactive ray, and wherein a projection device is arranged in the X-ray emitting device, wherein: include: Acquiring the imaging surface area and visible light irradiation field area of ​​the detector; Determining whether the imaging surface area of ​​the detector and the visible light irradiation field area satisfy a preset position relationship; If the imaging surface area of ​​the detector and the visible light irradiation field area do not satisfy a preset positional relationship, a prompt pattern is obtained and the projection device is controlled to project the prompt pattern onto the plane component; the prompt pattern is used to identify the imaging surface area of ​​the detector.

11. The method according to claim 10, wherein Acquiring the imaging surface area of ​​the detector includes: Obtaining position data of the detector; An imaging surface area of ​​the detector is determined according to the position data of the detector.

12. The method according to claim 10, wherein Acquiring the visible light irradiation field area includes: Acquiring position data of the projection device and position data of the planar component; The visible light irradiation field area is determined according to the position data of the projection device and the position data of the planar component.

13. The method according to claim 10, wherein The obtaining of the prompt pattern comprises: Acquiring position data of the detector and position data of the projection device; determining a positional relationship between the detector and the projection device according to the position data of the detector and the position data of the projection device; Acquiring projection parameters of the projection device; The prompt pattern is acquired according to the positional relationship between the detector and the projection device and the projection parameters.

14. The method according to claim 10, wherein Acquiring the visible light irradiation field area includes: Acquiring a visible light irradiation field area displayed on the planar component captured by a camera device, and obtaining an image corresponding to the visible light irradiation field area; The visible light irradiation field area is identified according to the image.

15. The method according to any one of claims 10 to 14, characterized in that The preset position relationship includes: The imaging surface area of ​​the detector is larger than the visible light irradiation field area; The position difference between the visible light illumination field area and the imaging surface area of ​​the detector is within a preset difference range; the position difference includes: the distance between the center point of the visible light illumination field area and the center point of the imaging surface area of ​​the detector, and / or the distance between corresponding boundaries of the visible light illumination field area and the imaging surface area of ​​the detector.

16. The method according to any one of claims 10 to 14, characterized in that The prompt pattern includes: a rectangular frame corresponding to the imaging surface area of ​​the detector and / or a color filling pattern corresponding to the imaging surface area of ​​the detector.

Images