Sample analysis system and normal temperature cache module

Abstract

The invention discloses a sample analysis system and a normal-temperature cache module. The sample analysis system comprises a sample analysis module, a sample transmission module, the normal-temperature cache module, a low-temperature storage module and a controller, the normal temperature cache module comprises a first bearing mechanism and a first scheduling mechanism, and the first bearing mechanism is provided with a bearing surface capable of storing a plurality of sample bearing parts; the controller is configured to control the first scheduling mechanism to drive the sample bearing component on the bearing surface to move upwards so as to enable the sample bearing component to be separated from the bearing surface, and then drive the sample bearing component to be transferred to the low-temperature storage module; and controlling the first scheduling mechanism to drive the sample bearing component from the low-temperature storage module to be transferred to a position above the bearing surface, and then driving the sample bearing component to be placed on the bearing surface. Scheduling of the sample bearing parts is not influenced by the distribution condition of the sample bearing parts on the bearing surface, so that the scheduling efficiency is improved, and the scheduling logic is simplified.

Description

Technical Field

[0001] The present invention relates to the technical field of medical equipment, and in particular to a sample analysis system and a normal temperature buffer module. Background Art

[0002] In current testing departments or research laboratories, samples with test results on the assembly line need to be stored in a low-temperature storage module for long-term storage to ensure sample quality when they are called out for re-inspection or in-depth research. Before being transferred to the low-temperature storage module, for samples that have completed testing but have not yet produced results, in order to reduce the pressure on the assembly line to carry and transmit samples, a sample normal temperature cache module needs to be set up between the assembly line and the low-temperature storage module. When batch samples are exchanged between the normal temperature cache module and the low-temperature storage module, sample racks are usually used as carriers for batch exchange, thereby improving scheduling efficiency. In the related art, the interaction between the sample racks in the normal temperature cache module and the low temperature storage module is based on a plane scheduling mechanism. On the one hand, in order to ensure that all sample racks on the normal temperature cache module can be scheduled, the plane scheduling mechanism needs to cover all sample rack positions for placement in the normal temperature cache module, and a corresponding positioning mechanism must be designed for each sample rack placement position so that the sample rack can be fixed before scheduling. This has the disadvantages of complex mechanism and high cost. On the other hand, since the sample racks move along the plane, the layout of the sample racks in the normal temperature cache module will also affect the scheduling scheme. For example, the scheduling of the outer sample rack may be hindered by the inner sample rack. Therefore, the scheduling of the inner sample rack needs to be completed in advance. The scheduling logic is cumbersome, and the inner sample rack is very likely not fully loaded with samples. Therefore, it will also cause a waste of the sample rack loading capacity on the normal temperature cache module, increase the number of interactions between the sample racks in the normal temperature cache module and the low temperature storage module, and frequent interactions increase the power consumption of the low temperature storage module and reduce the sample interaction speed. Summary of the Invention

[0003] The present invention aims to solve at least one of the technical problems existing in the prior art. To this end, the present invention proposes a sample analysis system that can improve scheduling efficiency and simplify scheduling logic.

[0004] The present invention also proposes a normal temperature cache module.

[0005] According to the sample analysis system in the first embodiment of the present invention, the sample analysis system includes a sample analysis module, a sample transmission module, a normal temperature buffer module, a low temperature storage module and a controller;

[0006] The sample analysis module is used to analyze the sample contained in the sample container;

[0007] The sample transmission module is used to transmit the sample container between the sample analysis module and the normal temperature buffer module;

[0008] The room temperature cache module includes a first carrying mechanism and a first scheduling mechanism. The first carrying mechanism has a carrying surface capable of storing a plurality of sample carrying components. The sample carrying components are used to carry the sample containers. The first scheduling mechanism is used to transfer the sample carrying components stored on the carrying surface to the low temperature storage module, and to transfer the sample carrying components from the low temperature storage module to the carrying surface.

[0009] The low-temperature storage module includes a storage mechanism for low-temperature storage of sample containers from the normal-temperature cache module;

[0010] The controller is configured to: control the first dispatching mechanism to drive the sample carrying component located on the carrying surface to first move upward so that the sample carrying component is separated from the carrying surface, and then drive the sample carrying component to move toward the low-temperature storage module;

[0011] The controller is further configured to: control the first scheduling mechanism to drive the sample carrying component from the low-temperature storage module to be transferred to above the carrying surface, and then drive the sample carrying component to be placed on the carrying surface.

[0012] The sample analysis system according to the embodiment of the present invention has at least the following beneficial effects:

[0013] The first scheduling mechanism can lift the sample carrying component, and the lifted sample carrying component is not affected or hindered by other sample carrying components on the carrying surface. In this way, the scheduling of the sample carrying component is not affected by the distribution of the sample carrying components on the carrying surface, thereby improving the scheduling efficiency and simplifying the scheduling logic.

[0014] In other embodiments of the present invention, the first scheduling mechanism is further used to transfer the sample container transferred from the sample transfer module to the normal temperature buffer module to the sample carrying component stored on the carrying surface;

[0015] The controller is further configured to control the first scheduling mechanism to transfer the sample container from the sample transfer module to a sample carrying component stored on the carrying surface.

[0016] In other embodiments of the present invention, the first scheduling mechanism includes a first manipulator, wherein controlling the first scheduling mechanism to transfer the sample container from the sample transmission module to the sample carrying component stored on the carrying surface includes: controlling the first manipulator to transfer the sample container from the sample transmission module to the sample carrying component stored on the carrying surface;

[0017] The controlling the first dispatching mechanism to drive the sample carrying component located on the carrying surface to move upward first so that the sample carrying component is separated from the carrying surface, and then driving the sample carrying component to transfer to the low-temperature storage module includes: controlling the first manipulator to grab the sample carrying component located on the carrying surface and move upward first so that the sample carrying component is separated from the carrying surface, and then transferring the sample carrying component to the low-temperature storage module;

[0018] Furthermore, controlling the first dispatching mechanism to drive the sample carrying component from the low-temperature storage module to be transferred to above the carrying surface, and then driving the sample carrying component to be placed on the carrying surface, includes: controlling the first manipulator to grab the sample carrying component from the low-temperature storage module and transfer it to above the carrying surface, and then moving the sample carrying component downward and placing it on the carrying surface;

[0019] Alternatively, the first scheduling mechanism includes a first manipulator and a second manipulator, wherein controlling the first scheduling mechanism to transfer the sample container from the sample transmission module to the sample carrying component stored on the carrying surface includes: controlling the second manipulator to transfer the sample container from the sample transmission module to the sample carrying component stored on the carrying surface;

[0020] The controlling the first dispatching mechanism to drive the sample carrying component located on the carrying surface to move upward first so that the sample carrying component is separated from the carrying surface, and then driving the sample carrying component to transfer to the low-temperature storage module includes: controlling the first manipulator to grab the sample carrying component located on the carrying surface and move upward first so that the sample carrying component is separated from the carrying surface, and then transferring the sample carrying component to the low-temperature storage module;

[0021] In addition, the control of the first scheduling mechanism drives the sample carrying component from the low-temperature storage module to be transferred to the top of the carrying surface, and then drives the sample carrying component to be placed on the carrying surface, including: controlling the first manipulator to grab the sample carrying component from the low-temperature storage module and transfer it to the top of the carrying surface, and then moving the sample carrying component downward and placing it on the carrying surface.

[0022] In other embodiments of the present invention, the sample holding member comprises a main body and a grabbing rod connected to the main body, the main body having a plurality of placement holes for placing the sample container, the main body being centrally symmetrically arranged about the axis of the grabbing rod, and the placement holes being centrally symmetrically distributed about the axis of the grabbing rod;

[0023] The controller is also used to obtain placement information of whether a sample container is placed in each placement hole in the sample carrying part before the first scheduling mechanism performs a transfer operation of transferring the sample container from the sample transfer module to the sample carrying part of the carrying surface each time. The control of the first scheduling mechanism to transfer the sample container from the sample transfer module to the sample carrying part of the carrying surface includes: controlling the first scheduling mechanism to transfer the sample container from the sample transfer module to the sample carrying part of the carrying surface based on the placement information, wherein the sample containers transferred to the sample carrying part by the first scheduling mechanism when performing a single transfer operation are centrally symmetrically distributed with respect to the axis of the grabbing rod with respect to the sample containers transferred to the sample carrying part by the first scheduling mechanism when performing the previous transfer operation, or the sample containers transferred to the sample carrying part by the first scheduling mechanism when performing a single transfer operation are centrally symmetrically distributed with respect to the axis of the grabbing rod with respect to the sample containers transferred to the sample carrying part by the first scheduling mechanism when performing the next transfer operation.

[0024] In other embodiments of the present invention, the sample analysis system further includes a transfer module, the transfer module being configured to: transfer the sample carrying component during the process of transferring the sample carrying component from the normal temperature cache module to the low temperature storage module and / or during the process of transferring the sample carrying component from the low temperature storage module to the normal temperature cache module;

[0025] The controlling of the first dispatching mechanism to drive the sample carrying component on the carrying surface to move upward first so that the sample carrying component is separated from the carrying surface, and then driving the sample carrying component to transfer to the low-temperature storage module comprises: controlling the first dispatching mechanism to drive the sample carrying component on the carrying surface to move upward first so that the sample carrying component is separated from the carrying surface, and then transferring the sample carrying component to the transfer module;

[0026] Furthermore, the control of the first scheduling mechanism drives the sample carrying component from the low-temperature storage module to be transferred to above the carrying surface, and then drives the sample carrying component to be placed on the carrying surface, including: controlling the first scheduling mechanism to transfer the sample carrying component first transferred from the low-temperature storage module to the transfer module to above the carrying surface, and then placing the sample carrying component on the carrying surface.

[0027] In other embodiments of the present invention, the first dispatching mechanism includes a first manipulator;

[0028] The controlling of the first dispatching mechanism to drive the sample carrying component on the carrying surface to move upward first so that the sample carrying component is separated from the carrying surface, and then transferring the sample carrying component to the transfer module comprises: controlling the first manipulator to grab the sample carrying component on the carrying surface and move upward first so that the sample carrying component is separated from the carrying surface, and then releasing the sample carrying component to the transfer module;

[0029] In addition, the control of the first scheduling mechanism to transfer the sample carrying component transferred from the low-temperature storage module to the transfer module to above the carrying surface, and then drive the sample carrying component to be placed on the carrying surface, including: controlling the first manipulator to grab the sample carrying component located in the transfer module and transfer it to above the carrying surface, and then releasing the sample carrying component to the carrying surface.

[0030] In other embodiments of the present invention, the first manipulator has a first state for grabbing the sample-carrying component, a second state for releasing the sample-carrying component, and a third state for pre-grabbing and / or pre-releasing the sample-carrying component. When the first manipulator is in the third state, the first manipulator can hold the sample-carrying component, and the first manipulator and the sample-carrying component can move relative to each other.

[0031] Wherein, before the first manipulator grabs the sample carrying component, the controller is further configured to control the first manipulator to be in the third state to pre-grab the sample carrying component, perform a preset action after the pre-grab, and switch from the third state to the first state to grab the sample carrying component after performing the preset action;

[0032] Alternatively, before the first manipulator releases the sample-carrying component, the controller is also configured to control the first manipulator to be in the third state to pre-release the sample-carrying component, perform a preset action after the pre-release, and switch from the third state to the second state to release the sample-carrying component after performing the preset action.

[0033] In other embodiments of the present invention, the first carrying mechanism is provided with a plurality of storage slots, any of the storage slots is used to place a single sample carrying component, the carrying surface includes the bottom surface of each storage slot, and when the sample carrying component is placed in the storage slot, controlling the first manipulator to be in the third state to pre-grab the sample carrying component includes: controlling the first manipulator to move to above the storage slot and be in the third state to pre-grab the sample carrying component in the storage slot; performing a preset action after the pre-grabbing includes: moving upward a first preset distance after the pre-grabbing to make the sample carrying component at least partially detach from the storage slot; switching from the third state to the first state to grab the sample carrying component after performing the preset action includes: switching from the third state to the first state to grab the sample carrying component after moving upward the first preset distance;

[0034] Alternatively, the transfer module includes a second carrying mechanism, which is provided with at least one storage slot, any of which is used to place a single sample carrying component, and when the sample carrying component is placed in the storage slot, controlling the first manipulator to be in the third state to pre-grab the sample carrying component includes: controlling the first manipulator to move to above the storage slot and to be in the third state to pre-grab the sample carrying component in the storage slot; performing a preset action after the pre-grabbing, including: moving upward a first preset distance after the pre-grabbing to make the sample carrying component at least partially detach from the storage slot; switching from the third state to the first state to grab the sample carrying component after performing the preset action, including: switching from the third state to the first state to grab the sample carrying component after moving upward the first preset distance;

[0035] Alternatively, the first carrying mechanism is provided with a plurality of storage slots, any of the storage slots being used to place a single sample carrying component, the carrying surface including the bottom surface of each storage slot, and when the storage slot of the first carrying mechanism is empty, controlling the first manipulator to be in the third state to pre-release the sample carrying component comprises: controlling the first manipulator in the first state and holding the sample carrying component to move to above the storage slot, and moving downward a second preset distance so that the sample carrying component at least partially enters the storage slot, and then controlling the first manipulator to switch from the first state to the third state to pre-release the sample carrying component; performing a preset action after the pre-release comprises: moving downward a third preset distance after the pre-release; switching from the third state to the second state after performing the preset action to release the sample carrying component comprises: switching from the third state to the second state after moving downward the third preset distance to release the sample carrying component, and placing the sample carrying component on the bottom surface of the storage slot;

[0036] Alternatively, the transfer module includes a second carrying mechanism, which has at least one storage slot, any of which is used to place a single sample carrying component. When the storage slot of the second carrying mechanism is empty, controlling the first manipulator to be in the third state to pre-release the sample carrying component includes: controlling the first manipulator in the first state and clamping the sample carrying component to move to the top of the storage slot, and moving downward a second preset distance so that the sample carrying component at least partially enters the storage slot, and then controlling the first manipulator to switch from the first state to the third state to pre-release the sample carrying component; performing a preset action after the pre-release includes: moving downward a third preset distance after the pre-release; switching from the third state to the second state to release the sample carrying component after performing the preset action includes: switching from the third state to the second state to release the sample carrying component after moving downward the third preset distance, and placing the sample carrying component on the bottom surface of the storage slot.

[0037] In other embodiments of the present invention, the storage slot of the first carrying mechanism and / or the second carrying mechanism includes a storage section and a guide section, wherein the guide section is connected to the upper end of the storage section and is used to guide the sample carrying component;

[0038] Wherein, when the controller controls the first manipulator to switch from the third state to the first state to grab the sample carrying component in the storage slot of the first carrying mechanism and / or the second carrying mechanism, the bottom of the sample carrying component is located in the guide section;

[0039] Alternatively, when the controller controls the first manipulator to switch from the first state to the third state to pre-release the sample carrying component, the bottom of the sample carrying component at least partially contacts the guide section;

[0040] Alternatively, when the controller controls the first manipulator to switch from the third state to the second state to release the sample carrying component, the bottom of the sample carrying component is located in the storage section;

[0041] Alternatively, when the controller controls the first manipulator to be in the third state to pre-grab the sample-carrying component, the bottom of the sample-carrying component is located in the storage section.

[0042] In other embodiments of the present invention, the carrying surface includes a plurality of placement areas, any of the placement areas is used to place a single sample carrying component, one of the placement area and the sample carrying component is provided with a positioning protrusion, and the other is provided with a positioning recess, when the sample carrying component is placed in the placement area and the positioning protrusion is inserted into the positioning recess, controlling the first manipulator to be in the third state to pre-grab the sample carrying component, including: controlling the first manipulator to move to above the placement area, and being in the third state to pre-grab the sample carrying component in the placement area; performing a preset action after the pre-grabbing, including: moving upward a first preset distance after the pre-grabbing to make the positioning protrusion at least partially disengage from the positioning recess; switching from the third state to the first state to grab the sample carrying component after performing the preset action, including: switching from the third state to the first state to grab the sample carrying component after moving upward the first preset distance;

[0043] Alternatively, the transfer module includes a second carrying mechanism, the second carrying mechanism includes at least one placement area, any of the placement area is used to place a single sample carrying component, one of the placement area and the sample carrying component is provided with a positioning protrusion, and the other is provided with a positioning recess, when the sample carrying component is placed in the placement area and the positioning protrusion is inserted into the positioning recess, the controlling the first manipulator to be in the third state to pre-grab the sample carrying component includes: controlling the first manipulator to move to above the placement area and to be in the third state to pre-grab the sample carrying component in the placement area; the performing of a preset action after the pre-grabbing includes: moving upward by the first preset distance after the pre-grabbing to make the positioning protrusion at least partially disengage from the positioning recess; the switching from the third state to the first state to grab the sample carrying component after performing the preset action includes: switching from the third state to the first state to grab the sample carrying component after moving upward by the first preset distance;

[0044] Alternatively, the carrying surface includes a plurality of placement areas, any of which is used to place a single sample carrying component, and one of the placement area and the sample carrying component is provided with a positioning protrusion, and the other is provided with a positioning recess. When the placement area of ​​the carrying surface is vacant, controlling the first manipulator to be in the third state to pre-release the sample carrying component comprises: controlling the first manipulator in the first state and holding the sample carrying component to move to above the placement area, and moving downward a second preset distance so that the positioning protrusion partially enters the positioning recess, and then controlling the first manipulator to switch from the first state to the third state to pre-release the sample carrying component; performing a preset action after the pre-release comprises: moving downward a third preset distance after the pre-release; switching from the third state to the second state after performing the preset action to release the sample carrying component comprises: switching from the third state to the second state after moving downward the third preset distance to release the sample carrying component, and placing the sample carrying component in the placement area;

[0045] Alternatively, the transfer module includes a second carrying mechanism, which includes at least one placement area, any of which is used to place a single sample carrying component, and one of the placement area and the sample carrying component is provided with a positioning protrusion, and the other is provided with a positioning recess. When the placement area of ​​the second carrying mechanism is empty, controlling the first manipulator to be in the third state to pre-release the sample carrying component includes: controlling the first manipulator in the first state and clamping the sample carrying component to move to the top of the placement area, and moving downward a second preset distance so that the positioning protrusion partially enters the positioning recess, and then controlling the first manipulator to switch from the first state to the third state to pre-release the sample carrying component; performing a preset action after the pre-release includes: moving downward a third preset distance after the pre-release; switching from the third state to the second state to release the sample carrying component after performing the preset action includes: switching from the third state to the second state after moving downward the third preset distance to release the sample carrying component, and placing the sample carrying component in the placement area.

[0046] In other embodiments of the present invention, the positioning protrusion has a first positioning portion and a second positioning portion, and the positioning protrusion is configured such that: when the first manipulator releases the sample supporting component to the placement area, the second positioning portion is inserted into the positioning recess before the first positioning portion, and when the first manipulator lifts the sample supporting component from the placement area, the first positioning portion is separated from the positioning recess before the second positioning portion, wherein the cross-sectional area of ​​the second positioning portion along a direction perpendicular to its own axis is smaller than the cross-sectional area of ​​the first positioning portion along a direction perpendicular to its own axis;

[0047] Wherein, when the controller controls the first manipulator to switch from the third state to the first state to grab the sample carrying component in the placement area, the second positioning portion is located in the positioning recess;

[0048] Alternatively, when the controller controls the first manipulator to switch from the first state to the third state to pre-release the sample carrying component, the second positioning portion at least partially contacts the inner wall of the positioning recess;

[0049] Alternatively, when the controller controls the first manipulator to switch from the third state to the second state to release the sample carrying member, the second positioning portion and at least a portion of the first positioning portion are both located in the positioning recess;

[0050] Alternatively, when the controller controls the first manipulator to be in the third state to pre-grab the sample-carrying component, the second positioning portion and at least part of the first positioning portion are both located in the positioning recess.

[0051] In other embodiments of the present invention, when the first manipulator moves downward by the third preset distance, the sample carrier is placed in the storage slot or the placement area, and the controller is further configured to control the first manipulator to perform an in-place recognition action of moving downward after moving downward by the third preset distance, and to determine whether the sample carrier is placed in place after the first manipulator performs the in-place recognition action;

[0052] The switching from the third state to the second state to release the sample carrying component after moving downward the third preset distance includes: when the controller determines that the sample carrying component has been placed in place, controlling the first manipulator to switch from the third state to the second state.

[0053] In other embodiments of the present invention, the sample analysis system also includes a calibration mechanism. When the controller determines that the sample carrying component is not placed in place, the controller is also configured to control the first manipulator to move upward in the third state to lift the sample carrying component, and after lifting, transfer the sample carrying component to the calibration mechanism and calibrate it, and transfer the calibrated sample carrying component to the storage tank or the placement area again.

[0054] In other embodiments of the present invention, the sample carrying component includes a main body and a grabbing rod, the main body is used to carry the sample container, the grabbing rod is connected to the main body and extends from the top of the main body, the grabbing rod includes a first grabbing section and a second grabbing section arranged in sequence along its own axial direction, the second grabbing section is located between the first grabbing section and the main body, and the cross-sectional area of ​​the first grabbing section along the direction perpendicular to its own axial direction is larger than the cross-sectional area of ​​the second grabbing section along the direction perpendicular to its own axial direction, so as to form a grabbing surface at the connection between the first grabbing section and the second grabbing section, and the first manipulator includes a plurality of grippers;

[0055] Wherein, in a reference plane perpendicular to the axial direction of the grabbing rod, when the orthographic projection of the clamping claw in the reference plane partially coincides with the orthographic projection of the grabbing surface in the reference plane, and the clamping claw abuts against the outer circumference of the first grabbing section, and / or the clamping claw abuts against the outer circumference of the second grabbing section, the first manipulator is in the first state;

[0056] Alternatively, in a reference plane perpendicular to the axial direction of the grabbing rod, when the orthographic projection of the clamping claw in the reference plane partially coincides with the orthographic projection of the grabbing surface in the reference plane, and the clamping claw is spaced apart from the outer circumferences of the first grabbing section and the second grabbing section, respectively, the first manipulator is in the third state;

[0057] Alternatively, in a reference plane perpendicular to the axial direction of the grabbing rod, when the orthographic projection of the clamping claw in the reference plane does not coincide with the orthographic projection of the grabbing surface in the reference plane, the first manipulator is in the second state.

[0058] In other embodiments of the present invention, the transfer module includes a second carrying mechanism and a driving mechanism, wherein the driving mechanism is configured to drive the second carrying mechanism to move between a first position and a second position, wherein the first position is outside the low-temperature storage module and the second position is inside the low-temperature storage module. Preferably, the first position is located between the normal-temperature cache module and the low-temperature storage module.

[0059] The step of transferring the sample carrying component to the transfer module comprises: transferring the sample carrying component to the second carrying mechanism located at the first position;

[0060] And, controlling the first scheduling mechanism to transfer the sample carrying component that is first transferred from the low-temperature storage module to the transfer module to above the carrying surface includes: controlling the first scheduling mechanism to transfer the sample carrying component that is first transferred from the low-temperature storage module to the transfer module to above the carrying surface from the second carrying mechanism that is in the first position.

[0061] In other embodiments of the present invention, the cryogenic storage module further comprises a second scheduling mechanism;

[0062] The controller is further configured to control the driving mechanism to drive the second carrying mechanism on which the sample carrying component is placed to move from the first position to the second position, and to control the second scheduling mechanism to transfer the sample carrying component from the transfer module at the second position to the storage mechanism;

[0063] Furthermore, the controller is also configured to control the second scheduling mechanism to move the sample carrying component in the storage mechanism out and transfer it to the second carrying mechanism in the second position, and to control the driving mechanism to drive the second carrying mechanism on which the sample carrying component is placed to move from the second position to the first position.

[0064] In other embodiments of the present invention, the sample analysis system also includes a detection device. After the controller controls the first scheduling mechanism to transfer the sample carrying component to the carrying surface or the transfer module, the controller is also configured to control the detection device to perform detection, and determine whether the sample carrying component is placed in place based on the detection results of the detection device.

[0065] In other embodiments of the present invention, the first dispatching mechanism includes a first manipulator; controlling the first dispatching mechanism to drive the sample carrying component located on the carrying surface to first move upward to separate the sample carrying component from the carrying surface, and then transferring the sample carrying component to the transfer module includes: controlling the first manipulator to grab the sample carrying component located on the carrying surface and first move upward to separate the sample carrying component from the carrying surface, and then releasing the sample carrying component to the transfer module;

[0066] Furthermore, controlling the first dispatching mechanism to transfer the sample carrying component first transferred from the low-temperature storage module to the transfer module to above the carrying surface, and then driving the sample carrying component to be placed on the carrying surface, includes: controlling the first manipulator to grab the sample carrying component located in the transfer module and transfer it to above the carrying surface, and then releasing the sample carrying component onto the carrying surface;

[0067] Wherein, the controller is further configured to: control the first manipulator to perform an in-place recognition action after the first manipulator transfers the sample carrying component to the carrying surface or the transfer module; and control the detection device to perform detection, including: controlling the detection device to perform detection during or after the first manipulator performs the in-place recognition action.

[0068] In other embodiments of the present invention, controlling the first manipulator to perform the position recognition action includes: controlling the first manipulator to move downward;

[0069] Wherein, controlling the detection device to perform detection and judging whether the sample supporting component is placed in place according to the detection result of the detection device includes: controlling the detection device to detect the distance the first manipulator moves downward, and judging whether the sample supporting component is placed in place according to the distance;

[0070] Alternatively, controlling the detection device to perform detection and judging whether the sample supporting component is placed in place according to the detection result of the detection device includes: controlling the detection device to detect the position of the first manipulator after moving downward, and judging whether the sample supporting component is placed in place according to the position;

[0071] Alternatively, the detection device is controlled to perform detection, and whether the sample carrying component is placed in place is determined based on the detection result of the detection device, including: controlling the detection device to detect the force exerted on the first manipulator from the sample carrying component during or after the downward movement, and determining whether the sample carrying component is placed in place based on the force.

[0072] In other embodiments of the present invention, the sample analysis system also includes a calibration mechanism. When the controller determines that the sample carrying component is not placed in place based on the detection results of the detection device, the controller is also configured to control the first scheduling mechanism to transfer the sample carrying component to the calibration mechanism for calibration, and transfer the calibrated sample carrying component to the carrying surface or the transfer module again.

[0073] In other embodiments of the present invention, the calibration mechanism includes a calibration surface, and controlling the first scheduling mechanism to transfer the sample carrying component to the calibration mechanism and perform calibration includes: controlling the first scheduling mechanism to drive the side surface of the sample carrying component to abut against the calibration surface.

[0074] In other embodiments of the present invention, the normal temperature cache module also includes a sample recovery mechanism. When the sample contained in the sample container in the storage mechanism needs to be recovered, the controller is also configured to control the first scheduling mechanism to transfer the sample carrying component carrying the sample container from the low-temperature storage module to the carrying surface, and transfer the sample container from the sample carrying component to the sample recovery mechanism.

[0075] In other embodiments of the present invention, the controller is further configured to obtain the number of sample containers placed in any of the sample carrying components stored on the carrying surface, and when the controller determines that the sample carrying component is full of sample containers or the number of sample containers placed in the sample carrying component exceeds a preset value, and the samples contained in each sample container in the sample carrying component are all samples that do not need to be retested, control the first scheduling mechanism to transfer the sample carrying component from the carrying surface to the low-temperature storage module;

[0076] Alternatively, the controller is further configured to obtain the placement time of the sample container in any of the sample carrying components on the carrying surface. When the controller determines that the placement time of the sample container that was first moved into the sample carrying component in the sample carrying component exceeds a preset time, the controller controls the first scheduling mechanism to transfer the sample carrying component from the carrying surface to the low-temperature storage module.

[0077] According to the second embodiment of the present invention, the sample analysis system includes a sample analysis module, a sample transmission module, a normal temperature buffer module, a low temperature storage module and a controller.

[0078] The sample analysis module is used to analyze the sample contained in the sample container;

[0079] The sample transmission module is used to transmit the sample container between the sample analysis module and the normal temperature buffer module;

[0080] The room temperature cache module includes a first carrying mechanism and a first scheduling mechanism, the first carrying mechanism is used to store a plurality of sample carrying components, the sample carrying components are used to carry the sample containers, and the first scheduling mechanism is used to transfer the sample carrying components stored on the first carrying mechanism to the low temperature storage module, and transfer the sample carrying components from the low temperature storage module to the first carrying mechanism;

[0081] The low-temperature storage module includes a storage mechanism for low-temperature storage of sample containers from the normal-temperature cache module;

[0082] The controller is configured to: control the first scheduling mechanism to at least drive the sample carrying component on the first carrying mechanism to move upward or downward first, and then transfer the sample carrying component to the low-temperature storage module;

[0083] And / or, the controller is configured to: control the first scheduling mechanism to at least drive the sample carrying component from the low-temperature storage module to move upward or downward to place the sample carrying component on the first carrying mechanism.

[0084] In other embodiments of the present invention, the first scheduling mechanism is further used to transfer the sample container transferred from the sample transfer module to the normal temperature buffer module to the sample carrying component stored on the first carrying mechanism;

[0085] The controller is further configured to control the first scheduling mechanism to transfer the sample container from the sample transfer module to a sample carrying component stored on the first carrying mechanism.

[0086] In other embodiments of the present invention, the sample analysis system further includes a transfer module, the transfer module being configured to: transfer the sample carrying component during the process of transferring the sample carrying component from the normal temperature cache module to the low temperature storage module and / or during the process of transferring the sample carrying component from the low temperature storage module to the normal temperature cache module;

[0087] The controlling of the first dispatching mechanism to at least drive the sample carrying component on the first carrying mechanism to move upward or downward first, and then transferring the sample carrying component to the low-temperature storage module comprises: controlling the first dispatching mechanism to at least drive the sample carrying component on the first carrying mechanism to move upward or downward first, and then transferring the sample carrying component to the transfer module first;

[0088] Furthermore, the control of the first scheduling mechanism to at least drive the sample carrying component from the low-temperature storage module to move upward or downward to transfer the sample carrying component to the carrying surface includes: controlling the first scheduling mechanism to remove the sample carrying component from the transfer module, and driving the sample carrying component to move upward or downward to transfer the sample carrying component to the carrying surface.

[0089] According to a third embodiment of the present invention, a room temperature buffer module includes a first carrying mechanism and a first dispatching mechanism. The first carrying mechanism has a carrying surface capable of storing a plurality of sample carrying members, the sample carrying members being used to carry sample containers. The first dispatching mechanism is used to move the sample carrying members into the first carrying mechanism or to move the sample carrying members out of the first carrying mechanism.

[0090] The first scheduling mechanism is configured to: when the first scheduling mechanism moves out of the sample carrying component, drive the sample carrying component located on the carrying surface to first move upward to separate the sample carrying component from the carrying surface, and then drive the sample carrying component to move out of the normal temperature buffer module;

[0091] The first scheduling mechanism is further configured to: when the first scheduling mechanism moves into the sample carrying component, drive the sample carrying component to be transferred to above the carrying surface, and then drive the sample carrying component to be placed on the carrying surface.

[0092] According to a fourth embodiment of the present invention, a room temperature cache module comprises a first carrying mechanism and a first dispatching mechanism, wherein the first carrying mechanism is used to store a plurality of sample carrying members, the sample carrying members being used to carry sample containers, and the first dispatching mechanism is used to move the sample carrying members into the first carrying mechanism or to move the sample carrying members out of the first carrying mechanism;

[0093] The first scheduling mechanism is configured to: when the first scheduling mechanism moves out of the sample carrying component, drive the sample carrying component on the first carrying mechanism to move upward or downward first, and then drive the sample carrying component to move out of the normal temperature buffer module;

[0094] And / or, the first scheduling mechanism is configured to: when the first scheduling mechanism moves into the sample carrying component, drive the sample carrying component to move upward or downward so that the sample carrying component is placed on the first carrying mechanism.

[0095] Additional aspects and advantages of the present invention will be set forth in part in the description which follows and, in part, will be obvious from the description which follows, or may be learned by practice of the present invention. BRIEF DESCRIPTION OF THE DRAWINGS

[0096] The present invention will be further described below with reference to the accompanying drawings and embodiments, in which:

[0097] Figure 1 Schematic diagram of the modules of the sample analysis system of the present invention;

[0098] Figure 2 To display Figure 1 Schematic diagram of the connection between the normal temperature cache module and the low temperature storage module;

[0099] Figure 3 for Figure 2 Side view of the medium-normal temperature cache module;

[0100] Figure 4 A top view of a sample supporting member applicable to the present invention;

[0101] Figure 5 middle Figure 4 a side view of the sample holding component;

[0102] Figure 6 A schematic diagram of placing different sample containers in a sample holding component;

[0103] Figure 7 Schematic diagram of the first manipulator in a first state according to an embodiment of the present invention;

[0104] Figure 8 Schematic diagram of the first manipulator in the third state according to an embodiment of the present invention;

[0105] Figure 9 Schematic diagram of the first manipulator in the second state according to an embodiment of the present invention;

[0106] Figure 10 A schematic diagram of positioning the sample carrier using the storage slot and the outer contour of the sample carrier;

[0107] Figure 11 A schematic diagram of positioning a sample supporting component using a positioning protrusion and a positioning recess;

[0108] Figure 12 A schematic diagram of the steps of placing a sample supporting component in one embodiment of the present invention;

[0109] Figure 13 A schematic diagram of the steps of removing a sample-carrying component according to an embodiment of the present invention;

[0110] Figure 14 A schematic diagram of the steps of placing a sample holding component in another embodiment of the present invention;

[0111] Figure 15 Schematic diagram of the steps for removing the sample-carrying component in another embodiment of the present invention.

[0112] Reference numerals:

[0113] Sample analysis module 100;

[0114] Sample transmission module 200;

[0115] Normal temperature cache module 300, first carrying mechanism 310, carrying surface 311, positioning protrusion 312, first positioning portion 3121, second positioning portion 3122, first dispatching mechanism 320, first manipulator 321;

[0116] Low temperature storage module 400, second scheduling mechanism 410, storage mechanism 420;

[0117] Transfer module 500, second carrying mechanism 510, second storage slot 511, guide section 5111, storage section 5112;

[0118] calibration mechanism 600;

[0119] Sample management module 700;

[0120] Pre-processing module 800;

[0121] The sample carrying component 900 , the main body 910 , the placement hole 911 , the first placement hole 911 a , the second placement hole 911 b , the positioning recess 912 , the grabbing rod 920 , the first grabbing section 921 , the second grabbing section 922 , and the grabbing surface 923 . DETAILED DESCRIPTION

[0122] The following describes embodiments of the present invention in detail. Examples of the embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals throughout represent the same or similar elements or elements having the same or similar functions. The embodiments described below with reference to the accompanying drawings are exemplary and are intended only to explain the present invention and are not to be construed as limiting the present invention.

[0123] In the description of the present invention, it should be understood that descriptions involving orientations, such as up, down, front, back, left, right, etc., indicating orientations or positional relationships, are based on the orientations or positional relationships shown in the accompanying drawings. They are only for the convenience of describing the present invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation. Therefore, they cannot be understood as limitations on the present invention.

[0124] In the description of the present invention, "several" means more than one, "plurality" means more than two, "greater than," "less than," and "exceed" are understood to exclude the number itself, while "above," "below," and "within" are understood to include the number itself. The use of "first" and "second" in the description is solely for the purpose of distinguishing technical features and should not be construed as indicating or implying relative importance, implicitly specifying the number of the indicated technical features, or implicitly specifying the order of the indicated technical features.

[0125] In the description of the present invention, unless otherwise clearly defined, terms such as setting, installing, and connecting should be understood in a broad sense, and technicians in the relevant technical field can reasonably determine the specific meanings of the above terms in the present invention based on the specific content of the technical solution.

[0126] In the description of the present invention, reference to terms such as "one embodiment," "some embodiments," "illustrative embodiments," "examples," "specific examples," or "some examples" means that the specific features, structures, materials, or characteristics described in conjunction with the embodiment or example are included in at least one embodiment or example of the present invention. In this specification, the exemplary expressions of the above terms do not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples.

[0127] As mentioned above, the interaction between the sample rack in the normal temperature cache module and the low temperature storage module is based on a planar scheduling mechanism. The common planar scheduling mechanism is a push rod, which can push the sample rack to move to the set destination within the plane, thereby realizing the transfer of the sample rack. The normal temperature cache module usually has multiple placement areas, which can accommodate multiple sample racks. In order to meet the pushing requirements of the sample racks in each cache area, the planar scheduling mechanism needs to set multiple push rods corresponding to each placement area, which has the disadvantages of complex structure and high cost. On the other hand, since the heights of the sample racks are the same, the layout of the sample racks in the normal temperature cache module will also affect the scheduling plan. For example, the scheduling of the outer sample rack may be hindered by the inner sample rack, so the scheduling of the inner sample rack needs to be completed in advance. The scheduling logic is cumbersome, and the inner sample rack is very likely to be not fully loaded with samples. Therefore, it will also cause a waste of the sample rack loading capacity on the normal temperature cache module, increase the number of interactions between the sample racks between the normal temperature cache module and the low temperature storage module, and the frequent interactions increase the power consumption of the low temperature storage module, which will also reduce the sample interaction speed. Based on this, the present invention proposes a sample analysis system that can simplify the structure of the normal temperature cache module and improve scheduling efficiency. The following is an explanation with reference to the accompanying drawings and specific embodiments.

[0128] Reference Figure 1 The first embodiment of the present invention provides a sample analysis system, comprising a sample analysis module 100, a sample transmission module 200, a normal temperature buffer module 300, a low temperature storage module 400, and a controller. The sample analysis module 100 is configured to analyze samples contained in sample containers, the normal temperature buffer module 300 is configured to buffer samples at normal temperature, the low temperature storage module 400 is configured to store samples at low temperatures, and the sample transmission module 200 is configured to transfer sample containers between the sample analysis module 100 and the normal temperature buffer module 300. The controller is communicatively connected to each of the aforementioned modules and is capable of controlling each of the aforementioned modules to perform corresponding operations. In some embodiments, the sample analysis system further comprises a sample management module 700 and a pre-processing module 800. The sample management module 700 is configured to input or export samples, and the pre-processing module 800 is configured to perform pre-processing operations on samples or sample containers.

[0129] For ease of understanding, each template is first explained:

[0130] The sample analysis module 100 is used to test samples. Specifically, the analysis module's aspirator aspirates samples from sample containers on the track of the sample transport module 200, and then performs analysis operations. It should be noted that the samples analyzed by the sample analysis module 100 include both unanalyzed common cases from the sample management module 700, common cases requiring retesting from the cryogenic storage module 400, and quality control samples or calibration samples from either the sample management module 700 or the cryogenic storage module 400.

[0131] The sample transfer module 200 is used for transferring the sample container. In some embodiments, the sample transfer module 200 is Figure 1 The track module shown in the figure specifically includes a main rail and multiple front rails connected to the main rail. Taking the figure as an example, the vertical part of the track module is the main rail, and the horizontal part of the track module is the front rail. The front rail is connected to modules such as the sample analysis module 100, the normal temperature cache module 300, the sample management module 700, and the pre-processing module 800.

[0132] Reference Figure 2 The normal temperature cache module 300 is used to cache sample containers. For example, the analyzed sample containers are first transferred to the normal temperature cache module 300 for cache. During the cache period, the controller determines whether the sample container needs to be retested based on the detection results, system operation status and other information. When the analyzed sample container on the normal temperature cache module 300 is determined to be a sample container that does not need to be retested, the controller controls the transfer module to transfer the sample container that does not need to be retested from the normal temperature cache module 300 to the low temperature storage module 400. It should be noted that the "analyzed sample container" referred to in this embodiment is mainly a case sample container containing case samples. Specifically, the normal temperature cache module 300 includes a first carrying mechanism 310, and the first carrying mechanism 310 has a carrying surface 311. The carrying surface 311 is used to store multiple sample containers. It should be noted that in some specific embodiments, the carrying surface 311 in this embodiment can be a continuous whole surface, and in other specific embodiments, it can also be composed of multiple phase-separated small surfaces. It should also be noted that in some specific embodiments, the carrying surface 311 is the upper surface of the first carrying mechanism 310, and in other specific embodiments, the carrying surface 311 is the bottom surface of a groove or the top surface of a protrusion on the first carrying mechanism 310. It should also be noted that the normal temperature in the normal temperature buffer module 300 refers to the ambient temperature, that is, the normal temperature buffer module generally does not need to be provided with a temperature adjustment mechanism to adjust the storage temperature of the sample container.

[0133] Reference Figure 2The low-temperature storage module 400 is used to store samples at low temperatures. The samples stored therein include not only case samples that have been analyzed, but also quality control samples, calibration samples, and samples that need to be stored for a short period of time. Specifically, the low-temperature storage module 400 includes a storage mechanism 420, which is capable of storing multiple sample carriers 900. It should be noted that the low temperature in the low-temperature storage module 400 is relative to the normal temperature of the normal temperature cache module 300, and its storage temperature is lower than the storage temperature of the normal temperature cache module 300. For example, the storage temperature of the low-temperature storage module 400 is 2°C to 8°C, thereby achieving refrigerated storage. Since the storage temperature of the low-temperature storage module 400 is relatively low, a shell needs to be provided to form a relatively closed space, and the storage mechanism 420 is provided in the space. In addition, a temperature regulating mechanism needs to be provided to regulate the temperature in the closed space. In other words, the normal temperature cache module 300 and the low-temperature storage module 400 are two independent modules.

[0134] The sample management module 700 is used to place sample containers carrying samples, wherein the samples in the sample containers may be samples to be processed. In other embodiments, the samples in the sample containers may also be samples to be recovered. Figure 1 As shown in the example, the sample management module 700 includes a drawer for placing sample carriers. The drawer is movable between an open position and a closed position. In the closed position, the drawer is located inside the housing. In the open position, the drawer extends from the housing to facilitate the operator to remove and place sample containers. In addition, the sample module also includes a sample module manipulator that can transfer sample containers between the sample management module 700 and the sample transfer module 200.

[0135] The pre-processing module 800 may include a centrifugation module and a first decapping module. The uncentrifuged sample may be centrifuged in the centrifugation module to achieve stratification of the blood sample. Figure 1 As shown in the example, the centrifuge module includes a housing and a centrifuge device, which is located within the housing and in which the sample container is centrifuged. Furthermore, the centrifuge module includes a centrifuge module manipulator that can transfer the sample container between the centrifuge module and the track. The first decapping module is used to decap the centrifuged sample container, thereby facilitating the subsequent insertion of the aspiration needle of the sample analysis module 100 into the sample container for aspiration.

[0136] The sample carrying component 900 carrying the sample containers (to simplify the description, the following description will be made of the sample carrying component 900) can be transferred from the normal temperature cache module 300 to the low temperature storage module 400. Specifically, the first scheduling mechanism 320 is used to transfer the sample carrying component 900 stored on the carrying surface 311 to the low temperature storage module 400. In this scenario, the sample containers in the sample carrying component 900 may include sample containers storing analyzed case samples. In addition, when the sample analysis module 100 fails, the sample containers in the sample carrying component 900 may also include case samples that have not been analyzed and need to be stored temporarily. In this embodiment, the operation of the first scheduling mechanism 320 to transfer the sample carrying component 900 includes a lifting operation. Specifically, the controller can control the first scheduling mechanism 320 to drive the sample carrying component 900 located on the carrying surface 311 to move upward first so that the sample carrying component 900 is separated from the carrying surface 311, and then drive the sample carrying component 900 to transfer to the low temperature storage module 400.

[0137] The sample carrier 900 can also be transferred from the low-temperature storage module 400 to the normal temperature cache module 300. Specifically, the first scheduling mechanism 320 is used to transfer the sample carrier 900 from the low-temperature storage module 400 to the carrying surface 311. In this scenario, the sample containers in the sample carrier 900 may include sample containers storing samples to be retested. In addition, the sample containers in the sample carrier 900 may also include sample containers storing calibration samples or quality control samples, and may also include sample containers storing unanalyzed case samples. In this embodiment, the operation of the first scheduling mechanism 320 to transfer the sample carrier 900 includes a lifting operation. Specifically, the controller can control the first scheduling mechanism 320 to drive the sample carrier 900 from the low-temperature storage module 400 to transfer to the top of the carrying surface 311, and then drive the sample carrier 900 to be placed on the carrying surface 311.

[0138] In this embodiment, the sample carrying component 900 can be lifted by the first scheduling mechanism 320. The lifted sample carrying component 900 is not affected or obstructed by other sample carrying components 900 on the carrying surface 311. In this way, the scheduling of the sample carrying component 900 is not affected by the distribution of the sample carrying components 900 on the carrying surface 311, thereby improving the scheduling efficiency and simplifying the scheduling logic. For example, the front placement area (close to the low-temperature storage module 400) and the rear placement area (far away from the low-temperature storage module 400) of the first carrying mechanism 310 are If there are sample carriers 900 on both sides of the first carrier mechanism 310, and if the sample carrier 900 on the rear side is full, the sample carrier 900 on the rear side can be lifted up and then transferred to the low-temperature storage module 400 without moving the front sample carrier 900. For another example, if there are sample carriers 900 on the front placement area of ​​the first carrier mechanism 310 and the rear placement area is empty, the sample carrier 900 from the low-temperature storage module 400 can be transferred to the rear placement area without moving the front sample carrier 900. Based on the above, the lifting height of the first scheduling mechanism 320 is at least higher than the total height of the sample carrier 900.

[0139] In addition, the first scheduling mechanism 320 in this embodiment can drive the sample carrying component 900 to the normal temperature cache module 300 or the low temperature storage module 400. Therefore, in addition to including an acquisition device for acquiring the sample carrying component 900, the first scheduling mechanism 320 also includes a driving device for driving the acquisition device to move in the horizontal direction. Based on this, the first scheduling mechanism 320 can also transfer the sample carrying component 900 from different positions of the carrying surface 311 through horizontal movement, or transfer the sample carrying component 900 to different positions of the carrying surface 311, so that there is no need to set up multiple pushing devices corresponding to each placement area, which helps to simplify the structure.

[0140] It should be noted that the first dispatching mechanism 320 in this embodiment can rely on a single mechanism (a single mechanism includes an acquisition device and a driving device) to achieve the aforementioned transfer operation, or can complete the aforementioned transfer operation through the cooperation of multiple mechanisms.

[0141] It should also be noted that the so-called “transfer to the low-temperature storage module 400” in the present invention means that the end point of the sample carrying component 900 is the low-temperature storage module 400, which is mainly used to express the direction in which the sample carrying component 900 is to be transferred. Specifically, the first scheduling mechanism 320 can transfer the sample carrying component 900 directly to the low-temperature storage module 400, or the first scheduling mechanism 320 can first transfer the sample carrying component 900 to other modules, such as the subsequent transfer module 500, and then transfer the sample carrying component 900 from the transfer module 500 to the low-temperature storage module 400 through other scheduling mechanisms. For other modules, when it comes to “transfer to a certain module”, this understanding can be referred to.

[0142] It should also be noted that the “sample-carrying component from the low-temperature storage module 400” referred to in the present invention means that the starting point of the sample-carrying component 900 is the low-temperature storage module 400, which is mainly used to express the source of the sample-carrying component 900. Specifically, the first scheduling mechanism 320 can directly transfer the sample-carrying component 900 from the low-temperature storage module 400, or first transfer the sample-carrying component 900 from the low-temperature storage module 400 to other modules through other scheduling mechanisms, such as the subsequent transfer module 500, and then the first scheduling mechanism 320 transfers the sample-carrying component 900 from the transfer module 500. For other modules, when it comes to “sample-carrying components from a certain module”, this understanding can be referred to.

[0143] Based on the first embodiment, in some embodiments of the present invention, the first scheduling mechanism 320 is further configured to transfer the sample container transferred from the sample transmission module 200 to the normal temperature buffer module 300 to the sample carrying component 900 stored on the carrying surface 311, and the controller is further configured to control the first scheduling mechanism 320 to transfer the sample container from the sample transmission module 200 to the sample carrying component 900 stored on the carrying surface 311. In other embodiments, the controller is further configured to control the first scheduling mechanism 320 to transfer the sample container from the sample carrying component 900 stored on the carrying surface 311 to the sample transmission module 200.

[0144] Reference Figure 2 The sample transfer module 200 has an in-position and an out-position. The first scheduling mechanism 320 can transfer the sample container stopped at the in-position to the sample carrying component 900 on the carrying surface 311, or transfer the sample container in the sample carrying component 900 to the out-position, wherein the in-position and the out-position can be different positions or the same position.

[0145] It should be noted that the first scheduling mechanism 320 in this embodiment may include a single device, through which both the transfer of the sample carrying component 900 and the transfer of the sample container are realized. The first scheduling mechanism 320 may also include multiple devices, one or some devices are used for the transfer of the sample carrying component 900, and another or other devices are used for the transfer of the sample container.

[0146] When the first scheduling mechanism 320 is also used to transfer the sample container transferred from the sample transfer module 200 to the normal temperature buffer module 300 to the sample carrying component 900 stored on the carrying surface 311, in some embodiments of the present invention, Figure 3 The first scheduling mechanism 320 includes a first manipulator 321. The first manipulator 321 can clamp the sample carrying component 900 and can also clamp the sample container. For example, the first manipulator 321 includes a first clamping part and a second clamping part. The first clamping part has a corresponding structure that is adapted to the grabbing rod on the sample carrying component 900, and the second clamping part has a corresponding structure that is adapted to the sample container. The first manipulator 321 clamps the grabbing rod through the first clamping part, and the first manipulator 321 clamps the sample container through the second clamping part. It should be noted that the structure of the first manipulator 321 is not limited to this.

[0147] Based on this, the aforementioned "controlling the first scheduling mechanism 320 to transfer the sample container from the sample transmission module 200 to the sample carrying component 900 stored on the carrying surface 311" specifically refers to: controlling the first manipulator 321 to transfer the sample container from the sample transmission module 200 to the sample carrying component 900 stored on the carrying surface 311.

[0148] The aforementioned “controlling the first scheduling mechanism 320 to drive the sample carrying component 900 located on the carrying surface 311 to first move upward so that the sample carrying component 900 is separated from the carrying surface 311, and then driving the sample carrying component 900 to transfer to the low-temperature storage module 400” specifically means: controlling the first manipulator 321 to grab the sample carrying component 900 located on the carrying surface 311 and first move it upward so that the sample carrying component 900 is separated from the carrying surface 311, and then transfer the sample carrying component 900 to the low-temperature storage module 400. That is, the transfer of the sample carrying component 900 from the normal temperature cache module 300 to the low-temperature storage module 400 is achieved by the first manipulator 321.

[0149] The aforementioned “controlling the first scheduling mechanism 320 to drive the sample carrying component 900 from the low-temperature storage module 400 to transfer to above the carrying surface 311, and then driving the sample carrying component 900 to be placed on the carrying surface 311” specifically refers to: controlling the first manipulator 321 to grab the sample carrying component 900 from the low-temperature storage module 400 and transfer it to above the carrying surface 311, and then moving the sample carrying component 900 downward and placing it on the carrying surface 311. That is, the transfer of the sample carrying component 900 from the low-temperature storage module 400 to the normal temperature cache module 300 is achieved by the first manipulator 321.

[0150] In this embodiment, a single first manipulator 321 can realize the transfer of sample containers between the sample transmission module 200 and the normal temperature cache module 300, the transfer of sample carrying components 900 from the normal temperature cache module 300 to the low temperature storage module 400, and the transfer of sample carrying components 900 from the low temperature storage module 400 to the normal temperature cache module 300, so that a single first manipulator 321 can integrate more functions, help reduce the number of manipulators, and simplify the structure of the first scheduling mechanism 320.

[0151] Different from the above embodiments, in other embodiments of the present invention, the first scheduling mechanism 320 includes a first manipulator 321 and a second manipulator (not shown), the first manipulator 321 is used to transfer the sample carrying component 900, and the second manipulator is used to transfer the sample container.

[0152] Based on this, the aforementioned "controlling the first dispatching mechanism 320 to transfer the sample container from the sample transfer module 200 to the sample carrying component 900 stored on the carrying surface 311" specifically refers to: controlling the second manipulator to transfer the sample container from the sample transfer module 200 to the sample carrying component 900 stored on the carrying surface 311. In other words, the transfer of the sample container is achieved by the second manipulator.

[0153] The aforementioned “controlling the first scheduling mechanism 320 to drive the sample carrying component 900 located on the carrying surface 311 to first move upward so that the sample carrying component 900 is separated from the carrying surface 311, and then driving the sample carrying component 900 to transfer to the low-temperature storage module 400” specifically means: controlling the first manipulator 321 to grab the sample carrying component 900 located on the carrying surface 311 and first move it upward so that the sample carrying component 900 is separated from the carrying surface 311, and then transfer the sample carrying component 900 to the low-temperature storage module 400. That is, the transfer of the sample carrying component 900 from the normal temperature cache module 300 to the low-temperature storage module 400 is achieved by the first manipulator 321.

[0154] The aforementioned “controlling the first scheduling mechanism 320 to drive the sample carrying component 900 from the low-temperature storage module 400 to transfer to above the carrying surface 311, and then driving the sample carrying component 900 to be placed on the carrying surface 311” specifically refers to: controlling the first manipulator 321 to grab the sample carrying component 900 from the low-temperature storage module 400 and transfer it to above the carrying surface 311, and then moving the sample carrying component 900 downward and placing it on the carrying surface 311. That is, the transfer of the sample carrying component 900 from the low-temperature storage module 400 to the normal temperature cache module 300 is achieved by the first manipulator 321.

[0155] In this embodiment, the transfer of the sample container is achieved by the second manipulator, and the transfer of the sample carrying component 900 from the normal temperature cache module 300 to the low temperature storage module 400, as well as the transfer of the sample carrying component 900 from the low temperature storage module 400 to the normal temperature cache module 300, is achieved by the first manipulator 321. This can reduce the waiting time of the sample container or the sample carrying component 900, and help improve the transfer efficiency. At the same time, the first manipulator 321 only needs to transfer the sample carrying component 900, and the second manipulator only needs to transfer the sample container, so the structure of the manipulator can be simplified.

[0156] When the first scheduling mechanism 320 is also used to transfer the sample container transferred from the sample transfer module 200 to the normal temperature buffer module 300 to the sample carrying component 900 stored on the carrying surface 311, in some embodiments of the present invention, Figure 4 、 Figure 5 The sample carrying component 900 has a main body 910 and a grabbing rod 920 connected to the main body 910. The main body 910 has a plurality of placement holes 911 for placing sample containers. The main body 910 is centrally symmetrically arranged with respect to the axis of the grabbing rod 920, and the placement holes 911 are centrally symmetrically distributed with respect to the axis of the grabbing rod 920. For example, the main body 910 is a rectangular structure, the grabbing rod 920 is located at the intersection of the diagonals of the rectangle, and the placement holes 911 are arranged in a rectangular array.

[0157] In this embodiment, the controller is also used to obtain placement information of whether each placement hole 911 in the sample carrying component 900 is placed with a sample container before the first scheduling mechanism 320 performs a transfer operation of transferring a sample container from the sample transmission module 200 to the sample carrying component 900 on the carrying surface 311. For example, after the sample carrying component 900 is placed on the carrying surface 311, the coordinates of each placement hole 911 on the sample carrying component 900 have been determined. When the controller controls the first manipulator 321 to perform the operation of removing a sample container from a certain placement hole 911 or placing a sample container, the placement status of the placement hole 911 at the coordinate position is changed, for example, from having a container to having no container, or from having no container to having a container. The controller can obtain the placement information by reading the placement status of the placement hole 911. For example, the normal temperature cache module 300 is provided with a visual detection device, which is used to obtain image information of the sample carrying component 900 placed on the carrying surface 311, and the controller obtains the placement information based on the image information.

[0158] Based on this, the aforementioned "controlling the first scheduling mechanism 320 to transfer the sample container from the sample transmission module 200 to the sample carrying component 900 on the carrying surface 311" specifically refers to: controlling the first scheduling mechanism 320 to transfer the sample container from the sample transmission module 200 to the sample carrying component 900 on the carrying surface 311 based on the placement information, thereby achieving orderly placement of the sample container and avoiding the center of gravity of the sample carrying component 900 deviating from the grabbing rod 920 and shaking or deflecting during the transfer process.

[0159] The first manipulator 321 generally transfers the sample containers to the sample carrying part 900 according to the principle of central symmetry. Before performing a single transfer operation, if some sample containers on the sample carrying part 900 are not distributed according to central symmetry, the sample containers are preferentially transferred to the placement holes 911 that are centrally symmetric with these sample containers. Specifically, the sample containers transferred to the sample carrying part 900 by the first scheduling mechanism 320 performing a single transfer operation are centrally symmetric with the sample containers transferred to the sample carrying part 900 by the first scheduling mechanism 320 performing the previous transfer operation, with respect to the axis of the grabbing rod 920. For example, referring to Figure 6, select two centrally symmetrical placement holes 911, named as the first placement hole 911a and the second placement hole 911b respectively. If the first placement hole 911a has been placed with a sample container through the previous transfer operation (representing that the sample carrying part 900 is in an unbalanced state at this time), the first scheduling mechanism 320 will transfer the sample container to the second placement hole 911b when performing this transfer operation, so that the sample container transferred this time is centrally symmetrical with the sample container transferred last time. Alternatively, the sample container transferred to the sample carrying part 900 by the first scheduling mechanism 320 performing a single transfer operation and the sample container transferred to the sample carrying part 900 by the first scheduling mechanism 320 performing the next transfer operation are centrally symmetrically distributed with respect to the axis of the grabbing rod 920. For example, the aforementioned first placement hole 911a and the second placement hole 911b are used for explanation. If neither the first placement hole 911a nor the second placement hole 911b has a sample container placed therein (representing that the sample carrying part 900 is in a balanced state at this time, including other placement holes of the sample carrying part 900), In the case where there are no sample containers in any of the holes, or sample containers are placed in some or all of the other placement holes of the sample supporting part 900, and the sample containers are already distributed in a centrally symmetrical manner), the first scheduling mechanism 320 can transfer the sample container to any one of the first placement hole 911a and the second placement hole 911b when performing this transfer operation, and transfer the sample container to the other one of the first placement hole 911a and the second placement hole 911b when performing the next transfer operation, so that the sample container transferred this time and the sample container transferred the next time remain centrally symmetrical.

[0160] In some specific embodiments, the first scheduling mechanism 320 transfers the sample containers according to the placement holes 911 from close to the grabbing rod 920 to away from the grabbing rod 920, that is, the placement holes 911 near the grabbing rod 920 are first filled and then transferred outward again. In this way, when the sample carrying part 900 is transferred before being fully filled, the stability of the transfer can be further increased.

[0161] On the basis of the first embodiment, in some embodiments of the present invention, referring to Figure 1 and Figure 2The sample analysis system also includes a transfer module 500, which is used to: transfer the sample carrying component 900 during the process of transferring the sample carrying component 900 from the normal temperature cache module 300 to the low temperature storage module 400, and / or during the process of transferring the sample carrying component 900 from the low temperature storage module 400 to the normal temperature cache module 300. In some specific embodiments, the transfer module 500 includes a second carrying mechanism 510, which is capable of moving to transfer the sample carrying component 900, which will be explained in subsequent embodiments. It should be noted that when the transfer module 500 is capable of moving, the transfer module 500 can directly obtain the sample carrying component 900 from the storage mechanism 420, for example, the transfer module 500 also includes a third scheduling mechanism arranged on the second carrying mechanism 510, and the third scheduling mechanism can be a robot; in addition, when the transfer module 500 is capable of moving, the transfer module 500 can also be used only to accept and transfer the sample carrying component 900, for example, the low-temperature storage module 400 is provided with a second scheduling mechanism 410, and the second scheduling mechanism 410 transfers the sample carrying component 900 in the storage mechanism 420 to the transfer module 500. In other specific embodiments, the transfer module 500 can also be fixedly set. In this case, the low-temperature storage module 400 is provided with a second scheduling mechanism 410. When the second scheduling mechanism 410 is performing other scheduling, the first scheduling mechanism 320 can first place the sample-carrying component 900 on the transfer module 500, and then perform other scheduling operations. After the second scheduling mechanism 410 completes the current scheduling operation, the sample-carrying component 900 on the transfer module 500 is transferred to the storage mechanism 420.

[0162] Based on this, the aforementioned "controlling the first scheduling mechanism 320 to drive the sample carrying component 900 located on the carrying surface 311 to move upward first so that the sample carrying component 900 is separated from the carrying surface 311, and then driving the sample carrying component 900 to transfer to the low-temperature storage module 400" specifically means: controlling the first scheduling mechanism 320 to drive the sample carrying component 900 located on the carrying surface 311 to move upward first so that the sample carrying component 900 is separated from the carrying surface 311, and then transferring the sample carrying component 900 to the transfer module 500 first, that is, in the process of transferring the sample carrying component 900 from the normal temperature cache module 300 to the low-temperature storage module 400, the first scheduling mechanism 320 will first transfer the sample carrying component 900 from the normal temperature cache module 300 to the transfer module 500.

[0163] The aforementioned “controlling the first scheduling mechanism 320 to drive the sample carrying component 900 from the low-temperature storage module 400 to transfer to the top of the carrying surface 311, and then driving the sample carrying component 900 to be placed on the carrying surface 311” specifically means: controlling the first scheduling mechanism 320 to transfer the sample carrying component 900 first transferred from the low-temperature storage module 400 to the transfer module 500 to the top of the carrying surface 311, and then placing the sample carrying component 900 on the carrying surface 311, that is, in the process of transferring the sample carrying component 900 from the low-temperature storage module 400 to the normal temperature cache module 300, the sample carrying component 900 will first be transferred from the low-temperature storage module 400 to the transfer module 500.

[0164] When the sample analysis system also includes a transfer module 500, in some embodiments of the present invention, the first scheduling mechanism 320 includes a first manipulator 321. The aforementioned "controlling the first scheduling mechanism 320 to drive the sample carrying component 900 located on the carrying surface 311 to move upward first so that the sample carrying component 900 is separated from the carrying surface 311, and then transferring the sample carrying component 900 to the transfer module 500 first" specifically refers to: controlling the first manipulator 321 to grasp the sample carrying component 900 located on the carrying surface 311 and move upward first so that the sample carrying component 900 is separated from the carrying surface 311, and then releasing the sample carrying component 900 to the transfer module 500.

[0165] The aforementioned “controlling the first scheduling mechanism 320 to transfer the sample carrying component 900 from the low-temperature storage module 400 to the transfer module 500 to the top of the carrying surface 311, and then driving the sample carrying component 900 to be placed on the carrying surface 311” specifically means: controlling the first manipulator 321 to grab the sample carrying component 900 located in the transfer module 500 and transfer it to the top of the carrying surface 311, and then releasing the sample carrying component 900 to the carrying surface 311.

[0166] When the first scheduling mechanism 320 includes a first manipulator 321, and the sample-carrying component 900 is transferred by the first manipulator 321 in a grabbing and releasing manner, in some embodiments, in order to achieve precise positioning of the sample-carrying component 900, corresponding positioning structures are provided on the normal temperature cache module 300 and the transfer module 500. However, when the first scheduling mechanism 320 transfers the sample-carrying component 900, it is inevitable that the posture of the sample-carrying component 900 will change, resulting in difficulty for the sample-carrying component 900 to dock with the positioning structure. Alternatively, when the first manipulator 321 lifts the sample-carrying component 900 from the normal temperature cache module 300 or the transfer module 500, if the posture of the sample-carrying component 900 itself is not appropriate, or if the force applied by the first manipulator 321 to the sample-carrying component 900 includes forces in other directions in addition to the upward force, it will cause jamming during lifting. Based on this, the first manipulator 321 of this embodiment performs pre-grabbing or pre-releasing before grabbing or releasing the sample carrying component 900, thereby reducing the restrictions on the sample carrying component 900 during the placement or removal stage, so that the sample carrying component 900 can be placed in or removed smoothly.

[0167] Specifically, the first manipulator 321 has a second state for releasing the sample carrying component 900 (eg Figure 7 ), for grabbing the first state of the sample carrying component 900 (as shown in Figure 9 as shown) and a third state (as shown) between the second state and the first state for pre-grabbing and / or pre-releasing the sample-carrying component 900. Figure 8 As shown), when the first manipulator 321 is in the third state, the first manipulator 321 can hold the sample carrying component 900, so that the first manipulator 321 can drive the sample carrying component 900 to move upward or downward. At the same time, the first manipulator 321 and the sample carrying component 900 can move relative to each other.

[0168] Before the first manipulator 321 grabs the sample carrier 900, the controller is configured to control the first manipulator 321 to be in the third state to pre-grab the sample carrier 900. Since the first manipulator 321 and the sample carrier 900 can move relative to each other in the third state, the first manipulator 321 can perform a preset action after pre-grabbing to adjust the gripping state of the first manipulator 321 so that the sample carrier 900 is in a normal position. After performing the preset action, the first manipulator 321 switches from the third state to the first state to grab the sample carrier 900, facilitating the removal of the sample carrier 900 from the storage tank.

[0169] Alternatively, when the first manipulator 321 releases the sample carrier 900, the controller is configured to control the first manipulator 321 to be in the third state to pre-release the sample carrier 900. Since the first manipulator 321 and the sample carrier 900 can move relative to each other in the third state, the first manipulator 321 can perform a preset action after the pre-release to adjust the gripping state of the first manipulator 321 so that the sample carrier 900 is in a normal position. After performing the pre-release action, the first manipulator 321 switches from the third state to the second state to grip the sample carrier 900, thereby facilitating the sample carrier 900 to be placed into the storage tank.

[0170] The following reference Figure 10 、 Figure 12 and Figure 13 , and describes the solution of positioning the sample carrying component 900 through the storage slot and placing it into the storage slot or taking it out from the storage slot in combination with specific scenarios. The solid arrows in the figure indicate the movement direction of the moving component.

[0171] In the scenario of taking out the sample supporting part 900 from the storage tank, the first supporting mechanism 310 is provided with multiple storage tanks. For the sake of distinction, the storage tanks of the first supporting mechanism 310 are named as first storage tanks. Any first storage tank is used to place a single sample supporting part 900. In this case, the carrying surface 311 includes the bottom surface of each first storage tank. When the sample supporting part 900 is placed in the first storage tank, refer to Figure 12 , the controller controls the first manipulator 321 to move to the top of the first storage tank (such as Figure 12 and is in a third state to pre-grab the sample carrying member 900 in the first storage tank (as shown in a and b). Figure 12 c), after pre-grabbing, the sample carrier 900 is moved upward by a first preset distance so that the sample carrier 900 is at least partially separated from the first storage tank (as shown in FIG. Figure 12 d), after moving upwards by a first preset distance, it switches from the third state to the first state to grab the sample carrying component 900 (as shown in FIG. Figure 12 If the sample carrier 900 has not been completely separated from the first storage tank, the first manipulator 321 moves upward again to make the sample carrier 900 completely separated from the first storage tank (as shown in e). Figure 12 f).

[0172] In the scenario of taking out the sample carrying component 900 from the storage tank, the transfer module 500 includes a second carrying mechanism 510. For the sake of distinction, the storage tank of the second carrying mechanism 510 is named as the second storage tank. The second carrying mechanism 510 is provided with at least one second storage tank, and any second storage tank is used to place a single sample carrying component 900. When the sample carrying component 900 is placed in the second storage tank, refer to Figure 12, the controller controls the first manipulator 321 to move to the top of the second storage tank (such as Figure 12 and is in a third state to pre-grab the sample carrying member 900 in the second storage tank (as shown in a and b). Figure 12 c), after pre-grabbing, the sample carrier 900 is moved upward by a first preset distance to at least partially separate from the second storage tank (as shown in FIG. Figure 12 d), after moving upwards by a first preset distance, it switches from the third state to the first state to grab the sample carrying component 900 (as shown in FIG. Figure 12 If the sample carrier 900 has not completely separated from the second storage tank, the first manipulator 321 moves upward again to make the sample carrier 900 completely separate from the second storage tank (as shown in e). Figure 12 f).

[0173] In the above scenario, the sample-carrying component 900 has at least partially separated from the first storage slot or the second storage slot before the first manipulator 321 is fully clamped, which can reduce the contact area between the sample-carrying component 900 and the slot wall and reduce friction; at the same time, the first manipulator 321 is in the third state during the process of moving upward by the first preset distance, and the sample-carrying component 900 can move relative to the first manipulator 321, thereby reducing or eliminating jamming; in addition, upward movement is used as a preset action after pre-grasping, and the first manipulator 321 can directly drive the sample-carrying component 900 upward to leave the first storage slot or the second storage slot after being fully clamped. The stroke of the first manipulator 321 is the shortest, which helps to improve the transfer efficiency of the first manipulator 321.

[0174] In the scenario where the sample carrier 900 is placed in a storage tank, the first carrier mechanism 310 is provided with a plurality of first storage tanks, any of which is used to place a single sample carrier 900. In this case, the carrier surface 311 includes the bottom surface of each first storage tank. Figure 13 The controller controls the first manipulator 321 which is in the first state and holds the sample carrier 900 to move to the top of the first storage tank (eg Figure 13 and moves downward by a second preset distance so that the sample carrying member 900 at least partially enters the first storage tank (as shown in a of FIG. Figure 13 b), and then control the first manipulator 321 to switch from the first state to the third state to pre-release the sample carrying component 900 (as shown in FIG. Figure 13 c), after pre-release, it moves downward a third preset distance to allow the sample-carrying component 900 to at least partially enter the first storage tank, and after moving downward the preset third distance, it switches from the third state to the second state to release the sample-carrying component 900, and places the sample-carrying component 900 on the bottom surface of the first storage tank.

[0175] In the scenario where the sample carrier 900 is placed in the storage tank, the transfer module 500 includes a second carrier mechanism 510, which is provided with at least one second storage tank, and any second storage tank is used to place a single sample carrier 900. When the second storage tank of the second carrier mechanism 510 is empty, refer to Figure 13 The controller controls the first manipulator 321 which is in the first state and holds the sample carrier 900 to move to the top of the second storage tank (eg Figure 13 and moves downward by a second preset distance so that the sample carrying member 900 at least partially enters the second storage tank (as shown in a of FIG. Figure 13 b), and then control the first manipulator 321 to switch from the first state to the third state to pre-release the sample carrying component 900 (as shown in FIG. Figure 13 c), after pre-release, it moves downward a third preset distance to allow the sample-carrying component 900 to at least partially enter the second storage tank, and after moving downward the preset third distance, it switches from the third state to the second state to release the sample-carrying component 900, and places the sample-carrying component 900 on the bottom surface of the second storage tank.

[0176] In the above scenario, since the sample carrying component 900 enters the first storage slot or the second storage slot when the first manipulator 321 is in the first state, it can be ensured that the sample carrying component 900 can stably enter the first storage slot or the second storage slot; at the same time, the first manipulator 321 is in the third state during the process of moving downward a third preset distance, and the sample carrying component 900 can move relative to the first manipulator 321, thereby reducing or eliminating jamming.

[0177] It should be noted that, in the above-mentioned release scenario, the so-called "the first manipulator 321 switches from the third state to the second state after moving downward a preset third distance to release the sample carrying component 900, and places the sample carrying component 900 on the bottom surface of the first storage slot or the second storage slot", includes the first manipulator 321 first placing the sample carrying component 900 on the bottom surface of the first storage slot or the second storage slot in the third state, and then switching to the second state. It also includes the first manipulator 321 first switching to the second state, so that the sample carrying component 900 falls under the action of gravity and is finally placed on the bottom surface of the first storage slot or the second storage slot.

[0178] When the sample carrying member is positioned through the aforementioned storage slot, in some embodiments of the present invention, the storage slot of the first carrying mechanism 310 and / or the second carrying mechanism 510 includes a storage section 5112 and a guide section 5111. Figure 10Taking the second storage slot 511 of the second supporting mechanism 510 as an example, the shape of the storage section 5112 is adapted to the sample supporting component 900 and is used to position the sample supporting component 900. The guide section 5111 is connected to the upper end of the storage section 5112, and its cross-sectional area decreases in the downward direction and is used to guide the sample supporting component 900. Specifically, the inner wall surface of the guide section 5111 of the second storage slot 511 is set to a slope or an arc surface.

[0179] Based on the above structure, according to Figure 12 In the order of steps a to e, when the controller controls the first manipulator 321 to switch from the third state to the first state to grab the sample carrying component 900 in the second storage tank 511, that is, when it switches from the pre-grabbing state to the fully clamped state, the bottom of the sample carrying component 900 is located in the guide section 5111. In this way, even if the sample carrying component 900 is deflected to a certain extent after the first manipulator 321 is fully clamped, since the cross-sectional area of ​​the guide section 5111 increases upward, in the process of the sample carrying component 900 continuing to move upward until it is completely separated from the second storage tank 511, the distance between the sample carrying component 900 and the groove wall of the second storage tank 511 will gradually increase, and the probability of abutment will be significantly reduced. Therefore, the first manipulator 321 can switch to the first state.

[0180] In other scenarios, Figure 12 In the order of steps a to c, when the controller controls the first manipulator 321 to be in the third state to pre-grab the sample carrying component 900, the bottom of the sample carrying component 900 is located in the storage section 5112. Due to the shape adaptation of the storage section 5112, the sample carrying component 900 is prone to tilt and abut against the storage section 5112. Therefore, the first manipulator 321 is in the third state to pre-grab the sample carrying component 900, which can reduce or eliminate jamming.

[0181] In other scenarios, Figure 13 In the order of step (c) to step (a), when the controller controls the first manipulator 321 to switch from the first state to the third state to pre-release the sample carrying component 900, if the posture of the sample carrying component 900 is skewed, the bottom of the sample carrying component 900 at least partially contacts the guide section 5111, so that the guide section 5111 can guide the sample carrying component 900.

[0182] In other scenarios, when the controller controls the first manipulator 321 to switch from the third state to the second state to release the sample-carrying component 900 into the second storage tank 511, the bottom of the sample-carrying component 900 is located in the storage section 5112. In this way, the vertical wall of the second storage tank 511 can guide the sample-carrying component 900 to continue to move downward and correct the sample-carrying component 900. Therefore, the first manipulator 321 can switch to the second state to completely release the sample-carrying component 900.

[0183] The above describes a solution for achieving precise placement of the sample-carrying component 900 by using the storage groove as a positioning structure and combining it with the outer contour of the sample-carrying component 900. The following will describe another alternative solution, namely, achieving precise placement of the sample-carrying component 900 by cooperating with the positioning protrusion and the positioning groove.

[0184] In the scenario of taking out the sample supporting part 900 from the storage tank, the supporting surface 311 of the first supporting mechanism 310 has multiple placement areas. For the convenience of description, the placement area of ​​the first supporting mechanism 310 is named the first placement area. Any first placement area is used to place a single sample supporting part 900. It should be noted that the first placement area can be understood as a local area within the supporting surface 311. One of the first placement area and the sample supporting part 900 is provided with a positioning protrusion 312, and the other is provided with a positioning recess 912. Figure 11 For example, the first placement area of ​​the first supporting mechanism 310 is provided with a positioning protrusion 312, and the sample supporting component 900 is provided with a positioning recess 912. Specifically, the positioning recess 912 is provided on the bottom surface of the sample supporting component 900. When the sample supporting component 900 is placed on the first placement area and the positioning protrusion 312 is inserted into the positioning recess 912, Figure 14 , the controller controls the first manipulator 321 to move to the top of the first placement area (such as Figure 14 and is in a third state to pre-grab the sample carrying member 900 in the first placement area (as shown in a and b). Figure 14 c), after pre-grasping, the positioning protrusion 312 is moved upward by a first preset distance so that the positioning protrusion 312 is at least partially separated from the positioning concave portion 912 (as shown in FIG. Figure 14 d), after moving upwards by a first preset distance, it switches from the third state to the first state to grab the sample carrying component 900 (as shown in FIG. Figure 14 As shown in FIGe ), if the positioning protrusion 312 has not yet completely separated from the positioning recess 912, the first manipulator 321 moves upward again so that the positioning protrusion 312 is completely separated from the positioning recess 912 (as shown in FIGe ). Figure 14 f).

[0185] In the scenario of taking out the sample carrying component 900 from the storage tank, the second carrying mechanism 510 includes at least one placement area. For the convenience of description, the placement area of ​​the second carrying mechanism 510 is named the second placement area. Any second placement area is used to place a single sample carrying component 900. It should be noted that the second placement area can be the entire upper surface of the second carrying mechanism 510, or it can be a local area of ​​the upper surface of the second carrying mechanism 510. One of the second placement area and the sample carrying component 900 is provided with a positioning protrusion 312, and the other is provided with a positioning recess 912. For example, the second placement area of ​​the second carrying mechanism 510 is provided with a positioning protrusion 312, and the sample carrying component 900 is provided with a positioning recess 912. Specifically, the positioning recess 912 is provided on the bottom surface of the sample carrying component 900. When the sample carrying component 900 is placed in the second placement area, and the positioning protrusion 312 is inserted into the positioning recess 912, refer to Figure 14 , the controller controls the first manipulator 321 to move to the top of the second placement area (such as Figure 14 and is in a third state to pre-grab the sample carrying member 900 in the second placement area (as shown in a and b). Figure 14 c), after pre-grasping, the positioning protrusion 312 is moved upward by a first preset distance so that the positioning protrusion 312 is at least partially separated from the positioning concave portion 912 (as shown in FIG. Figure 14 d), after moving upwards by a second preset distance, it switches from the third state to the first state to grab the sample carrying component 900 (as shown in FIG. Figure 14 As shown in FIGe ), if the positioning protrusion 312 has not yet completely separated from the positioning recess 912, the first manipulator 321 moves upward again so that the positioning protrusion 312 is completely separated from the positioning recess 912 (as shown in FIGe ). Figure 14 f).

[0186] In the above scenario, the positioning protrusion 312 of the first manipulator 321 has at least partially separated from the positioning recess 912 before it is fully clamped, which can reduce the contact area between the positioning protrusion 312 and the positioning recess 912 and reduce friction; at the same time, the first manipulator 321 is in the third state during the process of moving upward by the first preset distance, and the sample carrying component 900 can move relative to the first manipulator 321, thereby reducing or eliminating jamming; in addition, upward movement is used as a preset action after pre-grasping, and the first manipulator 321 can directly drive the sample carrying component 900 upward to leave the first storage slot or the second storage slot after being fully clamped. The stroke of the first manipulator 321 is the shortest, which helps to improve the transfer efficiency of the first manipulator 321.

[0187] In the scenario of placing the sample supporting component 900 into the storage tank, the supporting surface 311 of the first supporting mechanism 310 has a first placement area. Any first placement area is used to place a single sample supporting component 900. It should be noted that the first placement area can be understood as a local area within the supporting surface 311. One of the first placement area and the sample supporting component 900 is provided with a positioning protrusion 312, and the other is provided with a positioning recess 912. When the first placement area of ​​the supporting surface 311 is empty, refer to Figure 15 The controller controls the first manipulator 321 in the first state and holding the sample carrier 900 to move to the top of the first placement area (such as Figure 15 and moves downward by a second preset distance so that the positioning protrusion 312 partially enters the positioning recess 912 (as shown in FIG. Figure 15 b), and then control the first manipulator 321 to switch from the first state to the third state to pre-release the sample carrying component 900 (as shown in FIG. Figure 15 c), after pre-release, it moves downward by a third preset distance to allow the positioning protrusion 312 to further enter the positioning recess 912, and after moving downward by the third preset distance, it switches from the third state to the second state to release the sample carrying component 900, and places the sample carrying component 900 in the first placement area.

[0188] In the scenario where the sample carrying component 900 is placed in the storage tank, the second carrying mechanism 510 includes at least one second placement area, and any second placement area is used to place a single sample carrying component 900. It should be noted that the second placement area can be the entire upper surface of the second carrying mechanism 510, or it can be a local area of ​​the upper surface of the second carrying mechanism 510. One of the second placement area and the sample carrying component 900 is provided with a positioning protrusion 312, and the other is provided with a positioning recess 912. When the first placement area of ​​the carrying surface 311 is empty, refer to Figure 15 The controller controls the first manipulator 321 in the first state and holding the sample carrier 900 to move to the top of the second placement area (such as Figure 15 and moves downward by a second preset distance so that the positioning protrusion 312 partially enters the positioning recess 912 (as shown in FIG. Figure 15 b), and then control the first manipulator 321 to switch from the first state to the third state to pre-release the sample carrying component 900 (as shown in FIG. Figure 15 c), after pre-release, it moves downward by a third preset distance to allow the positioning protrusion 312 to further enter the positioning recess 912, and after moving downward by the third preset distance, it switches from the third state to the second state to release the sample carrying component 900, and places the sample carrying component 900 in the second placement area.

[0189] In the above scenario, since the positioning protrusion 312 partially enters the positioning recess 912 when the first manipulator 321 is in the first state, the stable docking between the positioning protrusion 312 and the positioning recess 912 can be guaranteed; at the same time, the first manipulator 321 is in the third state during the process of moving downward a third preset distance, and the sample carrying component 900 can move relative to the first manipulator 321, thereby reducing or eliminating jamming.

[0190] It should be noted that, in the above-mentioned release scenario, the so-called "the first manipulator 321 switches from the third state to the second state after moving downward a preset third distance to release the sample carrying component 900, and places the sample carrying component 900 in the first placement area or the second placement area", includes the first manipulator 321 first places the sample carrying component 900 in the first placement area or the second placement area in the third state, and then switches to the second state. It also includes the first manipulator 321 first switches to the second state, so that the sample carrying component 900 falls under the action of gravity and is finally placed in the first placement area or the second placement area.

[0191] When the sample carrying member is positioned by the aforementioned positioning protrusion and positioning recess, in some embodiments of the present invention, referring to Figure 11 The positioning protrusion 312 includes a first positioning portion 3121 and a second positioning portion 3122. The positioning protrusion 312 is configured such that when the first manipulator 321 releases the sample supporting component 900 to the placement area, the second positioning portion 3122 is inserted into the positioning recess 912 before the first positioning portion 3121. When the first manipulator 321 lifts the sample supporting component 900 from the placement area, the first positioning portion 3121 is released from the positioning recess 912 before the second positioning portion 3122. For example, the positioning protrusion in the first placement area is described as follows: the lower end of the second first positioning portion 3121 is connected to the first placement area, and the upper end is connected to the second positioning portion 3122. The cross-sectional area of ​​the second positioning portion 3122 along a direction perpendicular to its own axis is smaller than the cross-sectional area of ​​the first positioning portion 3121 along a direction perpendicular to its own axis. For example, the second positioning portion 3122 is a cone or frustum structure, and the first positioning portion 3121 is a cylindrical structure.

[0192] Based on the above structure, according to Figure 14In the order of steps a to e, when the controller controls the first manipulator 321 to switch from the third state to the first state to grab the sample-carrying component 900 in the first placement area or the second placement area, that is, when switching from the pre-grabbing state to the fully clamped state, the second positioning portion 3122 is located in the positioning recess 912. In this way, even if the sample-carrying component 900 is deflected to a certain extent after the first manipulator 321 is fully clamped, since the cross-sectional area of ​​the second positioning portion 3122 increases upward, in the process of the sample-carrying component 900 continuing to move upward until the positioning protrusion 312 is completely separated from the positioning recess 912, the distance between the positioning protrusion 312 and the inner wall of the positioning recess 912 will gradually increase, and the probability of abutment will be significantly reduced. Therefore, the first manipulator 321 can switch to the first state.

[0193] In other scenarios, Figure 14 In the order of steps a to c, when the controller controls the first manipulator 321 to be in the third state to pre-grab the sample-carrying component 900, the second positioning portion 3122 and at least part of the first positioning portion 3121 are both located in the positioning recess 912. Since the shape of the positioning recess 912 is adapted to the shape of the first positioning portion 3121, the sample-carrying component 900 is prone to posture skewness, which causes the first positioning portion 3121 to abut against the positioning recess 912. Therefore, the first manipulator 321 is in the third state to pre-grab the sample-carrying component 900, which can reduce or eliminate jamming.

[0194] In other scenarios, Figure 15 In the order of step (c) to step (a), when the controller controls the first manipulator 321 to switch from the first state to the third state to pre-release the sample supporting component 900, if the posture of the sample supporting component 900 is skewed, the second positioning portion 3122 at least partially contacts the inner wall of the positioning recess 912, so that the positioning recess 912 can guide the sample supporting component 900.

[0195] In other scenarios, when the controller controls the first manipulator 321 to switch from the third state to the second state to release the sample-carrying component 900 into the second storage slot 511, the second positioning portion 3122 and at least part of the first positioning portion 3121 are both located in the positioning recess 912. In this way, the inner wall of the positioning recess 912 can guide the first positioning portion 3121 to continue to move downward and to correct the sample-carrying component 900. Therefore, the first manipulator 321 can switch to the second state to completely release the sample-carrying component 900.

[0196] When the sample carrier 900 is precisely placed based on the aforementioned storage slot and the outer contour matching of the sample carrier 900 or the matching of the positioning protrusion and the positioning recess, some embodiments of the present invention further propose a solution for determining whether the sample carrier 900 is in place. Specifically, in this embodiment, after the first manipulator 321 moves downward by a third preset distance, the sample carrier 900 has been placed in the storage slot or the placement area. At this time, the controller is further configured to control the first manipulator 321 to perform a downward movement recognition action after moving downward by the third preset distance. After the first manipulator 321 performs the in-place recognition action, it is determined whether the sample carrier 900 is in place. Compared with the solution of obtaining an image through a visual detection device and then determining whether it is in place, this embodiment relies on the in-place recognition action of the manipulator 321 for recognition, which is less costly and more efficient.

[0197] In this embodiment, the aforementioned "switching from the third state to the second state to release the sample carrying component 900 after moving downward by a third preset distance" specifically means: when the controller determines that the sample carrying component 900 has been placed in place, the first manipulator 321 is controlled to switch from the third state to the second state. Specifically, refer to Figure 13 and Figure 15 In steps d to g, after the first manipulator 321 moves downward by a third preset distance, the sample-carrying component 900 has been placed in the storage slot or placement area, and then the first manipulator 321 moves downward again in the third state to perform the position recognition action. If the sample-carrying component 900 has been placed in place, the first manipulator 321 will first be lifted upward for a distance and then switch from the third state to the second state, and finally reset upward, or the first manipulator 321 will first switch from the third state to the second state, and then reset upward.

[0198] When the first manipulator 321 is also capable of performing a position recognition action, in some embodiments of the present invention, referring to Figure 2 The sample analysis system further includes a calibration mechanism 600. When the controller determines that the sample carrier 900 is not in place, the controller is further configured to control the first manipulator 321 to move upward in the third state to lift the sample carrier 900. After lifting, the sample carrier 900 is transferred to the calibration mechanism 600 for calibration. Since the first manipulator 321 is in the third state, the sample carrier 900 can move relative to the first manipulator 321. Therefore, the calibration mechanism 600 can adjust the posture of the sample carrier 900 to a posture suitable for placement. After the sample carrier 900 has been calibrated by the calibration mechanism 600, the first manipulator 321 can also transfer the calibrated sample carrier 900 back to the storage tank or placement area.

[0199] by Figure 2As shown in the example, the calibration mechanism 600 can be arranged in the normal temperature cache module 300 and located on the side of the normal temperature cache module 300 adjacent to the transfer module 500, so as to facilitate the first manipulator 321 to transfer the sample carrying component 900 in the placement area or storage tank to the calibration mechanism 600.

[0200] When the first dispatching mechanism 320 grabs or releases the sample carrying component 900 through the first manipulator 321, in some embodiments of the present invention, Figure 5 The sample carrying component 900 includes a main body 910 and a grabbing rod 920. The main body 910 is used to carry the sample container. The grabbing rod 920 is connected to the main body 910 and extends from the top of the main body 910. The grabbing rod 920 includes a first grabbing section 921 and a second grabbing section 922 arranged in sequence along the axial direction. The second grabbing section 922 is located between the first grabbing section 921 and the main body 910, and the cross-sectional area of ​​the first grabbing section 921 along its own axial direction is larger than the cross-sectional area of ​​the second grabbing section 922 along its own axial direction, so as to form a grabbing surface 923 at the connection between the first grabbing section 921 and the second grabbing section 922. The first manipulator 321 includes a plurality of grippers. Specifically, the first manipulator 321 includes two sets of grippers arranged opposite to each other. The two sets of grippers can move toward or in opposite directions to achieve clamping or releasing.

[0201] In the reference plane perpendicular to the first rotation center, when the projection of the clamping claw in the reference plane does not coincide with the projection of the grabbing surface 923 in the reference plane, the first manipulator 321 is in the second state, and the first manipulator 321 can be separated from the grabbing rod 920 in the vertical direction. Figure 7 As shown, at this time, the distance between the two groups of grippers of the first manipulator 321 is the largest.

[0202] Reference Figure 8 When the projection of the clamping claw in the reference plane partially overlaps with the projection of the grabbing surface 923 in the reference plane, and the clamping claw is spaced apart from the outer circumference of the first grabbing section 921 and the second grabbing section 922, the first manipulator 321 is in the third state, and the first manipulator 321 can support the grabbing surface 923, but the grabbing rod 920 is not completely restricted, so that the sample carrying component 900 and the first manipulator 321 can move relative to each other. Figure 8 As shown, the distance between the two groups of grippers of the first manipulator 321 is reduced compared to the second state.

[0203] Reference Figure 9When the projection of the clamping jaws in the reference plane partially overlaps with the projection of the grabbing surface 923 in the reference plane, and the clamping jaws are pressed against the outer circumference of the first grabbing section 921, and / or the clamping jaws are pressed against the outer circumference of the second grabbing section 922, the first manipulator 321 is in the first state. On the one hand, the first manipulator 321 can support the grabbing surface 923, and on the other hand, it can completely restrict the grabbing rod 920 by pressing the clamping jaws against the outer circumference of the first grabbing section 921 and / or the clamping jaws against the outer circumference of the second grabbing section 922. Figure 9 As shown, at this time, the distance between the two groups of grippers of the first manipulator 321 is the smallest.

[0204] When the sample analysis system is further provided with a transfer module 500, in some embodiments of the present invention, the transfer module 500 includes a second carrier mechanism 510 and a drive mechanism, and the drive mechanism is configured to drive the second carrier mechanism 510 to move between a first position and a second position, wherein the first position is outside the low-temperature storage module 400 and the second position is inside the low-temperature storage module 400. In other words, the transfer module 500 of this embodiment can accept the sample carrier component 900 from the normal temperature cache module 300 and transport it to the low-temperature storage module 400, or accept the sample carrier component 900 from the low-temperature storage module 400 and transport it to the outside of the low-temperature storage module 400. The drive mechanism can be a drive mechanism including a motor, a synchronous belt, and a synchronous pulley, or a drive mechanism including a motor, a lead screw, and a lead screw seat.

[0205] Based on this, the aforementioned “transferring the sample carrying component 900 to the transfer module 500 first” specifically refers to: transferring the sample carrying component 900 to the second carrying mechanism 510 in the first position first. The aforementioned “controlling the first scheduling mechanism 320 to transfer the sample carrying component 900 that was first transferred from the low-temperature storage module 400 to the transfer module 500 to above the carrying surface 311” specifically refers to: controlling the first scheduling mechanism 320 to transfer the sample carrying component 900 that was first transferred from the low-temperature storage module 400 to the transfer module 500 to above the carrying surface 311 from the second carrying mechanism 510 in the first position.

[0206] In this embodiment, the sample carrying component 900 is transferred and transported by the second carrying mechanism 510 that can move between the first position and the second position, so that the scheduling journey of the first scheduling mechanism 320 can be shortened. On the one hand, it can simplify the structure of the first scheduling mechanism 320, and on the other hand, it can also reduce the occupancy of the first scheduling mechanism 320, so as to improve the overall scheduling efficiency.

[0207] It should be noted that, after the second carrying mechanism 510 on which the sample carrying component 900 is placed moves to the second position, the sample carrying component 900 can be further transferred to the storage mechanism 420 by the third scheduling mechanism arranged on the transfer module 500, or the sample carrying component 900 can be further transferred to the storage mechanism 420 by the second scheduling mechanism 410 of the low-temperature storage module 400; when the second carrying mechanism 510 on which no sample carrying component 900 is placed moves to the second position, the sample carrying component 900 can be transferred from the storage mechanism 420 to the second carrying mechanism 510 by the third scheduling mechanism arranged on the transfer module 500, or the sample carrying component 900 can be transferred from the storage mechanism 420 to the second carrying mechanism 510 by the second scheduling mechanism 410 of the low-temperature storage module 400.

[0208] When the transfer module 500 includes a second carrying mechanism 510 and a driving mechanism, in some embodiments of the present invention, the low-temperature storage module 400 also includes a second scheduling mechanism 410. When the first scheduling mechanism 320 transfers the sample carrying component 900 to the second carrying mechanism 510 in the first position, the controller is also configured to control the driving mechanism to drive the second carrying mechanism 510 on which the sample carrying component 900 is placed to move from the first position to the second position, and to control the second scheduling mechanism 410 to transfer the sample carrying component 900 from the transfer module 500 in the second position to the storage mechanism 420.

[0209] The controller is also configured to control the second scheduling mechanism 410 to move the sample carrying component 900 out of the storage mechanism 420 and transfer it to the second carrying mechanism 510 in the second position, and to control the driving mechanism to drive the second carrying mechanism 510 on which the sample carrying component 900 is placed to move from the second position to the first position, and then the first scheduling mechanism transfers the sample carrying component 900 from the second carrying mechanism 510 in the first position to the first carrying mechanism 310.

[0210] In this embodiment, by setting a second scheduling mechanism 410 in the low-temperature storage module 400, the transfer module 500 does not need to be set with a scheduling mechanism, which can simplify the structure of the transfer module 500 and reduce the volume of the transfer module 500, thereby helping to ensure the stability and speed of the movement of the transfer module 500.

[0211] When the second supporting mechanism 510 is able to move between the first position and the second position, in some embodiments of the present invention, the first position is located between the normal temperature cache module 300 and the low temperature storage module 400, specifically close to the normal temperature cache module 300, so as to facilitate the first scheduling mechanism 320 to perform corresponding scheduling.

[0212] When the sample analysis system is further provided with a transfer module 500, in some embodiments of the present invention, the sample analysis system further comprises a detection device. After the controller controls the first dispatching mechanism 320 to transfer the sample supporting member 900 to the supporting surface 311 or the transfer module 500, the controller is further configured to control the detection device to perform a detection and determine whether the sample supporting member 900 is properly placed based on the detection result of the detection device. In some specific embodiments, the detection device can be a visual detection device that can capture an image of the sample supporting member 900 on the supporting surface 311 or the transfer module 500. The controller determines whether the sample supporting member 900 is properly placed based on the image information.

[0213] When the sample analysis system also includes a detection device, in some embodiments of the present invention, the first scheduling mechanism 320 includes a first manipulator 321. The aforementioned "controlling the first scheduling mechanism 320 to drive the sample carrying component 900 located on the carrying surface 311 to move upward first so that the sample carrying component 900 is separated from the carrying surface 311, and then transferring the sample carrying component 900 to the transfer module 500 first" specifically refers to: controlling the first manipulator 321 to grasp the sample carrying component 900 located on the carrying surface 311 and move upward first so that the sample carrying component 900 is separated from the carrying surface 311, and then releasing the sample carrying component 900 to the transfer module 500. The aforementioned “controlling the first dispatching mechanism 320 to transfer the sample carrying component 900 from the low-temperature storage module 400 to the transfer module 500 to the top of the carrying surface 311, and then driving the sample carrying component 900 to be placed on the carrying surface 311” specifically refers to: controlling the first manipulator 321 to grab the sample carrying component 900 located in the transfer module 500 and transfer it to the top of the carrying surface 311, and then releasing the sample carrying component 900 onto the carrying surface 311. The first manipulator 321 can be understood with reference to the aforementioned embodiments.

[0214] In this embodiment, after the first manipulator 321 transfers the sample support member 900 to the support surface 311 or the transfer module 500, the controller is further configured to control the first manipulator 321 to perform an in-place recognition action. When or after the first manipulator 321 performs the in-place recognition action, the controller controls the detection device to perform a test, and then determines whether the sample support member 900 is in place based on the test results of the detection device. Compared to a solution that uses a visual detection device to obtain an image and then determines whether it is in place, this embodiment relies on the in-place recognition action of the manipulator 321 for recognition, which is less costly and more efficient.

[0215] When the first manipulator 321 is also capable of performing an in-place recognition action, in some embodiments of the present invention, the aforementioned "controlling the first manipulator 321 to perform an in-place recognition action" specifically refers to controlling the first manipulator 321 to move downward. On this basis, the aforementioned "controlling the detection device to perform detection, and judging whether the sample-carrying component 900 is placed in place based on the detection result of the detection device" specifically refers to: controlling the detection device to detect the distance the first manipulator 321 moves downward, and judging whether the sample-carrying component 900 is placed in place based on the distance. For example, the first manipulator 321 is driven by a driving assembly including a power element such as a stepper motor or a servo motor that can accurately control the moving distance. When the first manipulator 321 contacts the sample-carrying component 900, the current or load of the motor will change. Therefore, by detecting the change in current, it can be known whether the first manipulator 321 has contacted the sample-carrying component 900. At this time, the first manipulator 321 is controlled to stop descending. Then, the controller starts to perform the in-position recognition action through the first manipulator 321 and the time between the first manipulator 321 contacting the sample-carrying component 900 can be combined with the number of steps of the motor to obtain the descending distance of the first manipulator 321 during this period. If the descending distance is less than the set range, it means that the sample-carrying component 900 is not in place. If the current of the motor of the first manipulator 321 does not change or does not change significantly after the first manipulator 321 descends the preset distance, it means that the sample-carrying component 900 is in place. At this time, the first manipulator 321 is also controlled to stop descending. In the above scheme, the control board of the motor can be used as a detection device. In this way, there is no need to set up an additional detection device, which helps to simplify the structure and reduce costs. It should be noted that

[0216] In other embodiments, the aforementioned "controlling the detection device to perform detection, and judging whether the sample supporting component 900 is in place based on the detection result of the detection device" specifically refers to: controlling the detection device to detect the position of the first manipulator 321 after it moves downward, and judging whether the sample supporting component 900 is in place based on the position. For example, the sample analysis system also includes a sensor, and the sensor can be triggered by a trigger component that is moved to a set position. The trigger component can be connected to the first manipulator 321, and can also be connected to a driving component that drives the first manipulator 321 to move. The sensor can be a through-beam photoelectric sensor, a reflective photoelectric sensor, a limit switch, a Hall switch, etc. The driving assembly can drive the first manipulator 321 to move downward by a preset distance. During the downward movement of the first manipulator 321, the first manipulator 321 in this embodiment can also determine whether the first manipulator 321 contacts the sample supporting component 900 through the current or load change of the motor. If the sensor is in an untriggered state when the first manipulator 321 contacts the sample supporting component 900, it means that the first manipulator 321 has not moved to the correct position and the sample supporting component 900 is not placed in place. If the sensor is in a triggered state after the first manipulator 321 moves downward by a preset distance, it means that the first manipulator 321 has moved to the correct position and the sample supporting component 900 has been placed in place. Although this embodiment requires the provision of a sensor, the cost of an ordinary sensor is significantly lower than that of a visual detection device, and therefore can also reduce costs.

[0217] In other embodiments, the aforementioned "controlling the detection device to perform detection, and judging whether the sample-carrying component 900 is in place based on the detection result of the detection device" specifically refers to: controlling the detection device to detect the force exerted on the first manipulator 321 by the sample-carrying component 900 during or after the downward movement, and judging whether the sample-carrying component 900 is in place based on the force. For example, the first manipulator 321 is connected to a force sensor, or the connection portion between the first manipulator 321 and the drive assembly is connected to a force sensor, or the transmission mechanism of the drive assembly is connected to a force sensor, and the force sensor is capable of detecting changes in force, and specifically can be a pressure sensor. When the first manipulator 321 contacts the sample-carrying component 900, the force detected by the force sensor will change, for example, the detected force will increase. In this way, in addition to using the aforementioned current or load to determine whether the first manipulator 321 contacts the sample-carrying component 900, this embodiment can also determine whether the first manipulator 321 contacts the sample-carrying component 900 by whether the force detected by the force sensor changes or whether the change is obvious. If the force detected when the first manipulator 321 contacts the sample-carrying component 900 is greater than the set range, it means that the sample-carrying component 900 is not in place. If the force detected is still outside the set range after the first manipulator 321 moves downward by a preset distance, it means that the sample-carrying component 900 is already in place. Although this embodiment requires the provision of a sensor, the cost of an ordinary sensor is significantly lower than that of a visual detection device, and therefore can also reduce costs.

[0218] When the first manipulator 321 is also capable of performing a position recognition action, in some embodiments of the present invention, referring to Figure 2 The sample analysis system further includes a calibration mechanism 600. When the controller determines, based on the detection results of the detection device, that the sample carrier 900 is not in place, the controller is further configured to control the first dispatching mechanism 320 to transfer the sample carrier 900 to the calibration mechanism 600 for calibration. It should be noted that the first dispatching mechanism 320 can perform calibration through the calibration mechanism 600 while still holding the sample carrier 900, or it can release the sample carrier 900 to the calibration mechanism 600, which will then calibrate the sample carrier 900. After the sample carrier 900 has been calibrated by the calibration mechanism 600, the first manipulator 321 can transfer the calibrated sample carrier 900 back to the storage tank or placement area.

[0219] by Figure 2 As shown in the example, the calibration mechanism 600 can be arranged in the normal temperature cache module 300 and located on the side of the normal temperature cache module 300 adjacent to the transfer module 500, so as to facilitate the first manipulator 321 to transfer the sample carrying component 900 in the placement area or storage tank to the calibration mechanism 600.

[0220] When the sample analysis system further includes a calibration mechanism 600, in some embodiments of the present invention, the calibration mechanism 600 includes a calibration surface. The aforementioned "controlling the first scheduling mechanism 320 to transfer the sample carrying component 900 to the calibration mechanism 600 and perform calibration" specifically refers to: controlling the first scheduling mechanism 320 to drive the side of the sample carrying component 900 to abut against the calibration surface, and pushing the sample carrying component 900 into a posture suitable for placement through the abutment between the two. In this embodiment, the first manipulator 321 can be in the aforementioned third state to grab the sample carrying component 900. Since the first manipulator 321 is in the third state, the sample carrying component 900 can move relative to the first manipulator 321, and therefore the posture of the sample carrying component 900 can be adjusted by the calibration mechanism 600.

[0221] Based on the first embodiment, in some embodiments of the present invention, the room temperature cache module 300 further includes a sample recovery mechanism. When a sample contained in a sample container within the storage mechanism 420 needs to be recovered, the controller is further configured to control the first scheduling mechanism 320 to transfer the sample carrier 900 carrying the sample container from the low temperature storage module 400 to the carrier surface 311, and to transfer the sample container from the sample carrier 900 to the sample recovery mechanism. For example, when case samples contained in the sample container within the storage mechanism 420 do not need to be retested, or when the storage time of case samples, quality control samples, calibration samples, etc. exceeds a certain period of time, they will be retrieved from the storage mechanism 420 for recovery. In some specific embodiments, the sample recovery mechanism includes a receiving component and a storage component. The storage component is concealed below the carrier surface 311, and the receiving component is located on the carrier surface 311 or extends upward from the carrier surface 311. The sample container to be recovered can enter the storage component through the receiving component.

[0222] Based on the first embodiment, in some embodiments of the present invention, the controller is further configured to obtain the number of sample containers placed in any sample carrying component 900 stored on the carrying surface 311. For example, after the sample carrying component 900 is placed on the carrying surface 311, the coordinates of each placement hole 911 on the sample carrying component 900 have been determined. When the controller controls the first manipulator 321 to perform an operation of placing a sample container into a certain placement hole 911, the placement status of the placement hole 911 at the coordinate position is changed from no container to a container. The controller can obtain the placement number by reading the placement status of the placement hole 911. For example, when the controller controls the first manipulator 321 to perform an operation of placing a sample container into the placement hole 911, the controller's count is increased by one, and it can also obtain the placement number.

[0223] Based on this, when the controller determines that the sample carrying component 900 is full of sample containers or the number of sample containers placed in the sample carrying component 900 exceeds the preset value, and the samples contained in each sample container in the sample carrying component 900 are all samples that do not need to be retested, the controller controls the first scheduling mechanism 320 to transfer the sample carrying component 900 from the carrying surface 311 to the low-temperature storage module 400. In this way, the sample carrying component 900 that meets the call-out conditions can be avoided from occupying the carrying surface 311 for a long time.

[0224] Based on the first embodiment, in some embodiments of the present invention, the controller is further configured to obtain the placement time of the sample container in any sample carrying component 900 stored on the carrying surface 311. For example, when the controller controls the first manipulator 321 to perform an operation of placing a sample container into the placement hole 911, it starts timing the sample container.

[0225] Based on this, when the controller determines that the sample container that was first moved into the sample carrying component 900 has been placed in the sample carrying component 900 for longer than a preset time, the controller controls the first scheduling mechanism 320 to transfer the sample carrying component 900 from the carrying surface 311 to the low-temperature storage module 400. In this way, the sample can be prevented from deteriorating due to being placed in a room temperature environment for too long.

[0226] The second embodiment of the present invention provides a sample analysis system, which includes a sample analysis module 100, a sample transmission module 200, a normal temperature cache module 300, a low temperature storage module 400 and a controller, wherein the sample analysis module 100 is used to analyze samples contained in a sample container, the normal temperature cache module 300 includes a first carrier mechanism 310, the first carrier mechanism 310 is used to cache samples at normal temperature, the low temperature storage module 400 is used to store samples at low temperatures, the sample transmission module 200 is used to transfer sample containers between the sample analysis module 100 and the normal temperature cache module 300, and the controller is respectively connected to each of the aforementioned modules and can control each of the aforementioned modules to perform corresponding operations. In some embodiments, the sample analysis system also includes a sample management module 700 and a pre-processing module 800, the sample management module 700 is used to input or input samples, and the pre-processing module 800 is used to perform pre-processing operations on samples or sample containers.

[0227] The sample carrying component 900 carrying the sample container can be transferred from the normal temperature cache module 300 to the low temperature storage module 400. Specifically, the controller is configured to control the first scheduling mechanism 320 to at least drive the sample carrying component 900 located on the first carrying mechanism 310 to move upward or downward first, and then transfer the sample carrying component 900 to the low temperature storage module 400.

[0228] The sample carrying component 900 can also be transferred from the low-temperature storage module 400 to the normal temperature cache module 300. Specifically, the controller is configured to control the first scheduling mechanism 320 to at least drive the sample carrying component 900 from the low-temperature storage module 400 to move upward or downward so as to place the sample carrying component 900 on the first carrying mechanism 310.

[0229] In this embodiment, the first scheduling mechanism 320 can drive the sample carrying component 900 located on the first carrying mechanism 310 to move upward or downward first during the process of moving the sample carrying component 900 out of the normal temperature cache module 300 or moving the sample carrying component 900 into the normal temperature cache module 300. In this way, the moved carrying component 900 will be staggered with other sample carrying components 900 in the vertical direction, and will not be affected or hindered by other sample carrying components 900. It can be moved directly above or below the position to be placed, thereby improving scheduling efficiency and simplifying scheduling logic.

[0230] It should be noted that the so-called "driving the sample supporting component 900 to move upward or downward first" can include the situation in the first embodiment, that is, the first supporting mechanism 310 has a supporting surface 311, and the first scheduling mechanism 320 can lift the sample supporting component 900 so that the sample supporting component 900 is separated from the supporting surface 311. In other embodiments, the first scheduling mechanism 320 has a plurality of supporting platforms connected to the first supporting mechanism 310, and any supporting platform has a placement surface for placing the sample supporting component 900. The supporting platform can move in the vertical direction. When the sample supporting component 900 needs to be removed from the first supporting mechanism 310, the supporting platform drives the sample supporting component 900 thereon to move upward or downward first. During this process, the height of the placement surface of the supporting platform will change, and the sample supporting component 900 will not be separated from the placement surface. The first scheduling mechanism 320 also includes a transfer device such as a robot. When the supporting platform moves upward or downward, the transfer device transfers the sample supporting component 900 from the supporting platform. When it is necessary to move the sample carrying component 900 into the first carrying mechanism 310, the empty carrying platform is first moved upward or downward, and the transfer device then transfers the sample carrying component 900 to the empty carrying platform, and finally the carrying platform is moved downward or upward to place the sample carrying component 900 on the first carrying mechanism 310. It should be noted that at this time, "the sample carrying component 900 is placed on the first carrying mechanism 310" should be understood as the carrying platform is in a placing state. For example, the first carrying mechanism 310 has a plane with multiple openings in the plane, and each carrying platform is correspondingly installed in a different opening. Among them, when the placing surface of the carrying platform is flush or approximately flush with the plane, the carrying platform is in a placing state, that is, the sample carrying component 900 has been placed on the first carrying mechanism 310. If the carrying platform moves upward or downward so that the placing surface is significantly lower or higher than the plane (for example, at least lower or higher than the maximum height of a single sample carrying component 900), the carrying platform is in a transfer state, that is, the sample carrying component 900 has left the first carrying mechanism 310.

[0231] On the basis of the second embodiment, in some embodiments of the present invention, the first scheduling mechanism 320 is further used to transfer the sample container transferred from the sample transmission module 200 to the normal temperature cache module 300 to the sample carrying component 900 stored on the first carrying mechanism 310, and the controller is further configured to control the first scheduling mechanism 320 to transfer the sample container from the sample transmission module 200 to the sample carrying component 900 stored on the first carrying mechanism 310. In other embodiments, the controller is further configured to control the first scheduling mechanism 320 to transfer the sample container from the sample carrying component 900 stored on the first carrying mechanism 310 to the sample transmission module 200. It should be noted that the first scheduling mechanism 320 can realize the transfer of the sample container and the sample carrying component 900 by a single manipulator, or can realize the transfer of the sample container and the sample carrying component 900 by different manipulators respectively. For details, please refer to the aforementioned embodiment.

[0232] Based on the second embodiment, in some embodiments of the present invention, the sample analysis system further includes a transfer module 500, which is used to: transfer the sample carrying component 900 during the process of transferring the sample carrying component 900 from the normal temperature cache module 300 to the low temperature storage module 400, and / or during the process of transferring the sample carrying component 900 from the low temperature storage module 400 to the normal temperature cache module 300.

[0233] Based on this, the aforementioned "controlling the first scheduling mechanism 320 to at least drive the sample carrying component 900 located on the first carrying mechanism 310 to move upward or downward first, and then transfer the sample carrying component 900 to the low-temperature storage module 400" specifically means: controlling the first scheduling mechanism 320 to at least drive the sample carrying component 900 located on the first carrying mechanism 310 to move upward or downward first, and then transfer the sample carrying component 900 to the transfer module 500 first. For example, the first carrying mechanism 310 has the carrying surface 311 in the first embodiment, and the first scheduling mechanism 320 lifts the sample carrying component 900 from the carrying surface 311, and then transfers it to the transfer module 500. For another example, the first scheduling mechanism 320 includes the aforementioned carrying platform and transfer device, and the carrying platform first drives the sample carrying component 900 thereon to move upward or downward, and then the transfer device transfers the sample carrying component 900 from the carrying platform that has moved upward or downward to the transfer module 500.

[0234] In addition, the aforementioned “controlling the first scheduling mechanism 320 to at least drive the sample carrying component 900 from the low-temperature storage module 400 to move upward or downward to transfer the sample carrying component 900 to the carrying surface 311” specifically refers to: controlling the first scheduling mechanism 320 to remove the sample carrying component 900 from the transfer module 500, and driving the sample carrying component 900 to move upward or downward to transfer the sample carrying component 900 to the carrying surface 311. For example, the first carrying mechanism 310 has the carrying surface 311 in the first embodiment, and the first scheduling mechanism 320 transfers the sample carrying component 900 from the transfer module 500 to the top of the carrying surface 311, and then moves downward to place the sample carrying component 900 on the carrying surface 311. For another example, the first scheduling mechanism 320 includes the aforementioned carrying platform and transfer device, and the transfer device transfers the sample carrying component 900 from the transfer module 500 to the carrying platform after moving upward or downward, and the carrying platform then moves downward or upward to place the sample carrying component 900 on the carrying surface 311.

[0235] In the aforementioned embodiment, the transfer between the transfer module 500 and the low-temperature storage module 400 can be understood with reference to the first embodiment.

[0236] The third embodiment of the present invention provides a normal temperature buffer module 300, which includes a first carrying mechanism 310 and a first dispatching mechanism 320. The first carrying mechanism 310 has a carrying surface 311 capable of storing a plurality of sample carrying members 900. The sample carrying members 900 are used to carry sample containers. The first dispatching mechanism 320 is used to move the sample carrying members 900 into the first carrying mechanism 310 or out of the first carrying mechanism 310.

[0237] In this embodiment, the first scheduling mechanism 320 is configured to: when the first scheduling mechanism 320 moves out of the sample holding member 900, drive the sample holding member 900 located on the holding surface 311 to first move upward to separate the sample holding member 900 from the holding surface 311, and then drive the sample holding member 900 to move out of the normal temperature buffer module 300;

[0238] In this embodiment, the first scheduling mechanism 320 is further configured to: when the first scheduling mechanism 320 moves into the sample supporting component 900 , drive the sample supporting component 900 to move above the supporting surface 311 , and then drive the sample supporting component 900 to be placed on the supporting surface 311 .

[0239] The scheduling process of the first scheduling mechanism 320 in this embodiment can be understood with reference to the first embodiment.

[0240] A fourth embodiment of the present invention provides a normal temperature buffer module 300, which includes a first carrying mechanism 310 and a first dispatching mechanism 320. The first carrying mechanism 310 is used to store a plurality of sample carrying members 900, each of which is used to carry sample containers. The first dispatching mechanism 320 is used to move the sample carrying members 900 into the first carrying mechanism 310 or out of the first carrying mechanism 310.

[0241] In this embodiment, the first scheduling mechanism 320 is configured to: when the first scheduling mechanism 320 moves out of the sample holding member 900, drive the sample holding member 900 located on the first carrying mechanism 310 to move upward or downward first, and then drive the sample holding member 900 carrying the sample container to move out of the normal temperature buffer module 300;

[0242] In other embodiments, the first scheduling mechanism 320 is configured as follows: when the first scheduling mechanism 320 moves into the sample carrying component 900, it drives the sample carrying component 900 to move upward or downward first, and then drives the sample carrying component 900 to be placed on the first carrying mechanism 310.

[0243] The scheduling process of the first scheduling mechanism 320 in this embodiment can be understood with reference to the second embodiment.

[0244] While the embodiments of the present invention have been described in detail above with reference to the accompanying drawings, the present invention is not limited to the embodiments described above. Various modifications may be made within the scope of knowledge possessed by a person skilled in the art without departing from the spirit of the present invention. Furthermore, the embodiments of the present invention and the features thereof may be combined with one another unless there is a conflict.

Claims

1. A sample analysis system, comprising a sample analysis module, a sample transmission module, a normal temperature buffer module, a low temperature storage module, and a controller, characterized in that: The sample analysis module is used to analyze the sample contained in the sample container; The sample transmission module is used to transmit the sample container between the sample analysis module and the normal temperature buffer module; The room temperature cache module includes a first carrying mechanism and a first scheduling mechanism. The first carrying mechanism has a carrying surface capable of storing a plurality of sample carrying components. The sample carrying components are used to carry the sample containers. The first scheduling mechanism is used to transfer the sample carrying components stored on the carrying surface to the low temperature storage module, and to transfer the sample carrying components from the low temperature storage module to the carrying surface. The low-temperature storage module includes a storage mechanism for low-temperature storage of sample containers from the normal-temperature cache module; The controller is configured to: control the first dispatching mechanism to drive the sample carrying component located on the carrying surface to first move upward so that the sample carrying component is separated from the carrying surface, and then drive the sample carrying component to move toward the low-temperature storage module; The controller is further configured to: control the first scheduling mechanism to drive the sample carrying component from the low-temperature storage module to be transferred to above the carrying surface, and then drive the sample carrying component to be placed on the carrying surface.

2. The sample analysis system according to claim 1, wherein: The first scheduling mechanism is further used to transfer the sample container transmitted from the sample transmission module to the normal temperature buffer module to the sample carrying component stored on the carrying surface; The controller is further configured to control the first scheduling mechanism to transfer the sample container from the sample transfer module to a sample carrying component stored on the carrying surface.

3. The sample analysis system according to claim 2, characterized in that: The first scheduling mechanism includes a first manipulator, wherein controlling the first scheduling mechanism to transfer the sample container from the sample transmission module to the sample carrying component stored on the carrying surface includes: controlling the first manipulator to transfer the sample container from the sample transmission module to the sample carrying component stored on the carrying surface; The controlling the first dispatching mechanism to drive the sample carrying component located on the carrying surface to move upward first so that the sample carrying component is separated from the carrying surface, and then driving the sample carrying component to transfer to the low-temperature storage module includes: controlling the first manipulator to grab the sample carrying component located on the carrying surface and move upward first so that the sample carrying component is separated from the carrying surface, and then transferring the sample carrying component to the low-temperature storage module; Furthermore, controlling the first dispatching mechanism to drive the sample carrying component from the low-temperature storage module to be transferred to above the carrying surface, and then driving the sample carrying component to be placed on the carrying surface, includes: controlling the first manipulator to grab the sample carrying component from the low-temperature storage module and transfer it to above the carrying surface, and then moving the sample carrying component downward and placing it on the carrying surface; Alternatively, the first scheduling mechanism includes a first manipulator and a second manipulator, wherein controlling the first scheduling mechanism to transfer the sample container from the sample transmission module to the sample carrying component stored on the carrying surface includes: controlling the second manipulator to transfer the sample container from the sample transmission module to the sample carrying component stored on the carrying surface; The controlling the first dispatching mechanism to drive the sample carrying component located on the carrying surface to move upward first so that the sample carrying component is separated from the carrying surface, and then driving the sample carrying component to transfer to the low-temperature storage module includes: controlling the first manipulator to grab the sample carrying component located on the carrying surface and move upward first so that the sample carrying component is separated from the carrying surface, and then transferring the sample carrying component to the low-temperature storage module; In addition, the control of the first scheduling mechanism drives the sample carrying component from the low-temperature storage module to be transferred to the top of the carrying surface, and then drives the sample carrying component to be placed on the carrying surface, including: controlling the first manipulator to grab the sample carrying component from the low-temperature storage module and transfer it to the top of the carrying surface, and then moving the sample carrying component downward and placing it on the carrying surface.

4. The sample analysis system according to claim 2, wherein: The sample carrying component comprises a main body and a grabbing rod connected to the main body, the main body having a plurality of placement holes for placing the sample container, the main body being centrally symmetrically arranged about the axis of the grabbing rod, and the placement holes being centrally symmetrically distributed about the axis of the grabbing rod; The controller is also used to obtain placement information of whether a sample container is placed in each placement hole in the sample carrying part before the first scheduling mechanism performs a transfer operation of transferring the sample container from the sample transfer module to the sample carrying part of the carrying surface each time. The control of the first scheduling mechanism to transfer the sample container from the sample transfer module to the sample carrying part of the carrying surface includes: controlling the first scheduling mechanism to transfer the sample container from the sample transfer module to the sample carrying part of the carrying surface based on the placement information, wherein the sample containers transferred to the sample carrying part by the first scheduling mechanism when performing a single transfer operation are centrally symmetrically distributed with respect to the axis of the grabbing rod with respect to the sample containers transferred to the sample carrying part by the first scheduling mechanism when performing the previous transfer operation, or the sample containers transferred to the sample carrying part by the first scheduling mechanism when performing a single transfer operation are centrally symmetrically distributed with respect to the axis of the grabbing rod with respect to the sample containers transferred to the sample carrying part by the first scheduling mechanism when performing the next transfer operation.

5. The sample analysis system according to claim 1, wherein: The sample analysis system further includes a transfer module, which is used to transfer the sample carrying component during the process of transferring the sample carrying component from the normal temperature cache module to the low temperature storage module and / or during the process of transferring the sample carrying component from the low temperature storage module to the normal temperature cache module; The controlling of the first dispatching mechanism to drive the sample carrying component on the carrying surface to move upward first so that the sample carrying component is separated from the carrying surface, and then driving the sample carrying component to transfer to the low-temperature storage module comprises: controlling the first dispatching mechanism to drive the sample carrying component on the carrying surface to move upward first so that the sample carrying component is separated from the carrying surface, and then transferring the sample carrying component to the transfer module; Furthermore, the control of the first scheduling mechanism drives the sample carrying component from the low-temperature storage module to be transferred to above the carrying surface, and then drives the sample carrying component to be placed on the carrying surface, including: controlling the first scheduling mechanism to transfer the sample carrying component first transferred from the low-temperature storage module to the transfer module to above the carrying surface, and then placing the sample carrying component on the carrying surface.

6. The sample analysis system according to claim 5, characterized in that: The first dispatching mechanism includes a first manipulator; The controlling of the first dispatching mechanism to drive the sample carrying component on the carrying surface to move upward first so that the sample carrying component is separated from the carrying surface, and then transferring the sample carrying component to the transfer module comprises: controlling the first manipulator to grab the sample carrying component on the carrying surface and move upward first so that the sample carrying component is separated from the carrying surface, and then releasing the sample carrying component to the transfer module; In addition, the control of the first scheduling mechanism to transfer the sample carrying component transferred from the low-temperature storage module to the transfer module to above the carrying surface, and then drive the sample carrying component to be placed on the carrying surface, including: controlling the first manipulator to grab the sample carrying component located in the transfer module and transfer it to above the carrying surface, and then releasing the sample carrying component to the carrying surface.

7. The sample analysis system according to claim 6, characterized in that: The first manipulator has a first state for grabbing the sample carrying component, a second state for releasing the sample carrying component, and a third state for pre-grabbing and / or pre-releasing the sample carrying component. When the first manipulator is in the third state, the first manipulator can hold the sample carrying component, and the first manipulator and the sample carrying component can move relative to each other; Wherein, before the first manipulator grabs the sample carrying component, the controller is further configured to control the first manipulator to be in the third state to pre-grab the sample carrying component, perform a preset action after the pre-grab, and switch from the third state to the first state to grab the sample carrying component after performing the preset action; Alternatively, before the first manipulator releases the sample-carrying component, the controller is also configured to control the first manipulator to be in the third state to pre-release the sample-carrying component, perform a preset action after the pre-release, and switch from the third state to the second state to release the sample-carrying component after performing the preset action.

8. The sample analysis system according to claim 7, characterized in that: The first carrying mechanism is provided with a plurality of storage slots, any of the storage slots is used to place a single sample carrying component, the carrying surface includes the bottom surface of each storage slot, when the sample carrying component is placed in the storage slot, controlling the first manipulator to be in the third state to pre-grab the sample carrying component, including: controlling the first manipulator to move to above the storage slot, and being in the third state to pre-grab the sample carrying component in the storage slot; performing a preset action after the pre-grabbing, including: moving upwards a first preset distance after the pre-grabbing to make the sample carrying component at least partially detach from the storage slot; switching from the third state to the first state to grab the sample carrying component after performing the preset action, including: switching from the third state to the first state to grab the sample carrying component after moving upwards the first preset distance; Alternatively, the transfer module includes a second carrying mechanism, which is provided with at least one storage slot, any of which is used to place a single sample carrying component, and when the sample carrying component is placed in the storage slot, controlling the first manipulator to be in the third state to pre-grab the sample carrying component includes: controlling the first manipulator to move to above the storage slot and to be in the third state to pre-grab the sample carrying component in the storage slot; performing a preset action after the pre-grabbing, including: moving upward a first preset distance after the pre-grabbing to make the sample carrying component at least partially detach from the storage slot; switching from the third state to the first state to grab the sample carrying component after performing the preset action, including: switching from the third state to the first state to grab the sample carrying component after moving upward the first preset distance; Alternatively, the first carrying mechanism is provided with a plurality of storage slots, any of the storage slots being used to place a single sample carrying component, the carrying surface including the bottom surface of each storage slot, and when the storage slot of the first carrying mechanism is empty, controlling the first manipulator to be in the third state to pre-release the sample carrying component comprises: controlling the first manipulator in the first state and holding the sample carrying component to move to above the storage slot, and moving downward a second preset distance so that the sample carrying component at least partially enters the storage slot, and then controlling the first manipulator to switch from the first state to the third state to pre-release the sample carrying component; performing a preset action after the pre-release comprises: moving downward a third preset distance after the pre-release; switching from the third state to the second state after performing the preset action to release the sample carrying component comprises: switching from the third state to the second state after moving downward the third preset distance to release the sample carrying component, and placing the sample carrying component on the bottom surface of the storage slot; Alternatively, the transfer module includes a second carrying mechanism, which has at least one storage slot, any of which is used to place a single sample carrying component. When the storage slot of the second carrying mechanism is empty, controlling the first manipulator to be in the third state to pre-release the sample carrying component includes: controlling the first manipulator in the first state and clamping the sample carrying component to move to the top of the storage slot, and moving downward a second preset distance so that the sample carrying component at least partially enters the storage slot, and then controlling the first manipulator to switch from the first state to the third state to pre-release the sample carrying component; performing a preset action after the pre-release includes: moving downward a third preset distance after the pre-release; switching from the third state to the second state to release the sample carrying component after performing the preset action includes: switching from the third state to the second state to release the sample carrying component after moving downward the third preset distance, and placing the sample carrying component on the bottom surface of the storage slot.

9. The sample analysis system according to claim 8, characterized in that: The storage slot of the first carrying mechanism and / or the second carrying mechanism includes a storage section and a guide section, wherein the guide section is connected to the upper end of the storage section and is used to guide the sample carrying component; Wherein, when the controller controls the first manipulator to switch from the third state to the first state to grab the sample carrying component in the storage slot of the first carrying mechanism and / or the second carrying mechanism, the bottom of the sample carrying component is located in the guide section; Alternatively, when the controller controls the first manipulator to switch from the first state to the third state to pre-release the sample carrying component, the bottom of the sample carrying component at least partially contacts the guide section; Alternatively, when the controller controls the first manipulator to switch from the third state to the second state to release the sample carrying component, the bottom of the sample carrying component is located in the storage section; Alternatively, when the controller controls the first manipulator to be in the third state to pre-grab the sample-carrying component, the bottom of the sample-carrying component is located in the storage section.

10. The sample analysis system according to claim 7, wherein: The carrying surface includes a plurality of placement areas, any of which is used to place a single sample carrying component, one of the placement area and the sample carrying component is provided with a positioning protrusion, and the other is provided with a positioning recess. When the sample carrying component is placed in the placement area and the positioning protrusion is inserted into the positioning recess, controlling the first manipulator to be in the third state to pre-grab the sample carrying component includes: controlling the first manipulator to move to above the placement area and to be in the third state to pre-grab the sample carrying component in the placement area; performing a preset action after the pre-grabbing, including: moving upward a first preset distance after the pre-grabbing to make the positioning protrusion at least partially disengage from the positioning recess; switching from the third state to the first state to grab the sample carrying component after performing the preset action includes: switching from the third state to the first state to grab the sample carrying component after moving upward the first preset distance; Alternatively, the transfer module includes a second carrying mechanism, the second carrying mechanism includes at least one placement area, any of the placement area is used to place a single sample carrying component, one of the placement area and the sample carrying component is provided with a positioning protrusion, and the other is provided with a positioning recess, when the sample carrying component is placed in the placement area and the positioning protrusion is inserted into the positioning recess, the controlling the first manipulator to be in the third state to pre-grab the sample carrying component includes: controlling the first manipulator to move to above the placement area and to be in the third state to pre-grab the sample carrying component in the placement area; the performing of a preset action after the pre-grabbing includes: moving upward by the first preset distance after the pre-grabbing to make the positioning protrusion at least partially disengage from the positioning recess; the switching from the third state to the first state to grab the sample carrying component after performing the preset action includes: switching from the third state to the first state to grab the sample carrying component after moving upward by the first preset distance; Alternatively, the carrying surface includes a plurality of placement areas, any of which is used to place a single sample carrying component, and one of the placement area and the sample carrying component is provided with a positioning protrusion, and the other is provided with a positioning recess. When the placement area of ​​the carrying surface is vacant, controlling the first manipulator to be in the third state to pre-release the sample carrying component comprises: controlling the first manipulator in the first state and holding the sample carrying component to move to above the placement area, and moving downward a second preset distance so that the positioning protrusion partially enters the positioning recess, and then controlling the first manipulator to switch from the first state to the third state to pre-release the sample carrying component; performing a preset action after the pre-release comprises: moving downward a third preset distance after the pre-release; switching from the third state to the second state after performing the preset action to release the sample carrying component comprises: switching from the third state to the second state after moving downward the third preset distance to release the sample carrying component, and placing the sample carrying component in the placement area; Alternatively, the transfer module includes a second carrying mechanism, which includes at least one placement area, any of which is used to place a single sample carrying component, and one of the placement area and the sample carrying component is provided with a positioning protrusion, and the other is provided with a positioning recess. When the placement area of ​​the second carrying mechanism is empty, controlling the first manipulator to be in the third state to pre-release the sample carrying component includes: controlling the first manipulator in the first state and clamping the sample carrying component to move to the top of the placement area, and moving downward a second preset distance so that the positioning protrusion partially enters the positioning recess, and then controlling the first manipulator to switch from the first state to the third state to pre-release the sample carrying component; performing a preset action after the pre-release includes: moving downward a third preset distance after the pre-release; switching from the third state to the second state to release the sample carrying component after performing the preset action includes: switching from the third state to the second state after moving downward the third preset distance to release the sample carrying component, and placing the sample carrying component in the placement area.

11. The sample analysis system according to claim 10, wherein: The positioning protrusion has a first positioning portion and a second positioning portion, and the positioning protrusion is configured such that: when the first manipulator releases the sample supporting component to the placement area, the second positioning portion is inserted into the positioning recess before the first positioning portion, and when the first manipulator lifts the sample supporting component from the placement area, the first positioning portion is separated from the positioning recess before the second positioning portion, wherein the cross-sectional area of ​​the second positioning portion along a direction perpendicular to its own axis is smaller than the cross-sectional area of ​​the first positioning portion along a direction perpendicular to its own axis; Wherein, when the controller controls the first manipulator to switch from the third state to the first state to grab the sample carrying component in the placement area, the second positioning portion is located in the positioning recess; Alternatively, when the controller controls the first manipulator to switch from the first state to the third state to pre-release the sample carrying component, the second positioning portion at least partially contacts the inner wall of the positioning recess; Alternatively, when the controller controls the first manipulator to switch from the third state to the second state to release the sample carrying member, the second positioning portion and at least a portion of the first positioning portion are both located in the positioning recess; Alternatively, when the controller controls the first manipulator to be in the third state to pre-grab the sample-carrying component, the second positioning portion and at least part of the first positioning portion are both located in the positioning recess.

12. The sample analysis system according to any one of claims 8 to 11, characterized in that: When the first manipulator moves downward by the third preset distance, the sample supporting component is placed in the storage slot or the placement area, and the controller is further configured to control the first manipulator to perform an in-place recognition action of moving downward after moving downward by the third preset distance, and to determine whether the sample supporting component is placed in place after the first manipulator performs the in-place recognition action; The switching from the third state to the second state to release the sample carrying component after moving downward the third preset distance includes: when the controller determines that the sample carrying component has been placed in place, controlling the first manipulator to switch from the third state to the second state.

13. The sample analysis system according to claim 12, wherein: The sample analysis system also includes a calibration mechanism. When the controller determines that the sample carrying component is not placed in place, the controller is also configured to control the first manipulator to move upward in the third state to lift the sample carrying component, and after lifting, transfer the sample carrying component to the calibration mechanism and calibrate it, and transfer the calibrated sample carrying component to the storage tank or the placement area again.

14. The sample analysis system according to claim 6, wherein: The sample carrying component includes a main body and a grabbing rod, the main body is used to carry the sample container, the grabbing rod is connected to the main body and extends from the top of the main body, the grabbing rod includes a first grabbing section and a second grabbing section arranged in sequence along its own axial direction, the second grabbing section is located between the first grabbing section and the main body, and the cross-sectional area of ​​the first grabbing section along the direction perpendicular to its own axial direction is larger than the cross-sectional area of ​​the second grabbing section along the direction perpendicular to its own axial direction, so as to form a grabbing surface at the connection between the first grabbing section and the second grabbing section, and the first manipulator includes a plurality of grippers; Wherein, in a reference plane perpendicular to the axial direction of the grabbing rod, when the orthographic projection of the clamping claw in the reference plane partially coincides with the orthographic projection of the grabbing surface in the reference plane, and the clamping claw abuts against the outer circumference of the first grabbing section, and / or the clamping claw abuts against the outer circumference of the second grabbing section, the first manipulator is in the first state; Alternatively, in a reference plane perpendicular to the axial direction of the grabbing rod, when the orthographic projection of the clamping claw in the reference plane partially coincides with the orthographic projection of the grabbing surface in the reference plane, and the clamping claw is spaced apart from the outer circumferences of the first grabbing section and the second grabbing section, respectively, the first manipulator is in the third state; Alternatively, in a reference plane perpendicular to the axial direction of the grabbing rod, when the orthographic projection of the clamping claw in the reference plane does not coincide with the orthographic projection of the grabbing surface in the reference plane, the first manipulator is in the second state.

15. The sample analysis system according to claim 5, characterized in that: The transfer module includes a second carrying mechanism and a driving mechanism, wherein the driving mechanism is configured to drive the second carrying mechanism to move between a first position and a second position, wherein the first position is outside the low-temperature storage module and the second position is inside the low-temperature storage module. Preferably, the first position is located between the normal-temperature cache module and the low-temperature storage module. The step of transferring the sample carrying component to the transfer module comprises: transferring the sample carrying component to the second carrying mechanism located at the first position; And, controlling the first scheduling mechanism to transfer the sample carrying component that is first transferred from the low-temperature storage module to the transfer module to above the carrying surface includes: controlling the first scheduling mechanism to transfer the sample carrying component that is first transferred from the low-temperature storage module to the transfer module to above the carrying surface from the second carrying mechanism that is in the first position.

16. The sample analysis system according to claim 15, characterized in that: The low-temperature storage module further includes a second scheduling mechanism; The controller is further configured to control the driving mechanism to drive the second carrying mechanism on which the sample carrying component is placed to move from the first position to the second position, and to control the second scheduling mechanism to transfer the sample carrying component from the transfer module at the second position to the storage mechanism; Furthermore, the controller is also configured to control the second scheduling mechanism to move the sample carrying component in the storage mechanism out and transfer it to the second carrying mechanism in the second position, and to control the driving mechanism to drive the second carrying mechanism on which the sample carrying component is placed to move from the second position to the first position.

17. The sample analysis system according to claim 5, characterized in that: The sample analysis system also includes a detection device. When the controller controls the first scheduling mechanism to transfer the sample carrying component to the carrying surface or the transfer module, the controller is also configured to control the detection device to perform detection and determine whether the sample carrying component is placed in place based on the detection results of the detection device.

18. The sample analysis system according to claim 17, wherein: The first dispatching mechanism includes a first manipulator; controlling the first dispatching mechanism to drive the sample carrying component located on the carrying surface to first move upward to separate the sample carrying component from the carrying surface, and then transferring the sample carrying component to the transfer module includes: controlling the first manipulator to grab the sample carrying component located on the carrying surface and first move upward to separate the sample carrying component from the carrying surface, and then releasing the sample carrying component to the transfer module; Furthermore, controlling the first dispatching mechanism to transfer the sample carrying component first transferred from the low-temperature storage module to the transfer module to above the carrying surface, and then driving the sample carrying component to be placed on the carrying surface, includes: controlling the first manipulator to grab the sample carrying component located in the transfer module and transfer it to above the carrying surface, and then releasing the sample carrying component onto the carrying surface; Wherein, the controller is further configured to: control the first manipulator to perform an in-place recognition action after the first manipulator transfers the sample carrying component to the carrying surface or the transfer module; and control the detection device to perform detection, including: controlling the detection device to perform detection during or after the first manipulator performs the in-place recognition action.

19. The sample analysis system according to claim 18, wherein: The controlling the first manipulator to perform the in-position recognition action includes: controlling the first manipulator to move downward; Wherein, controlling the detection device to perform detection and judging whether the sample supporting component is placed in place according to the detection result of the detection device includes: controlling the detection device to detect the distance the first manipulator moves downward, and judging whether the sample supporting component is placed in place according to the distance; Alternatively, controlling the detection device to perform detection and judging whether the sample supporting component is placed in place according to the detection result of the detection device includes: controlling the detection device to detect the position of the first manipulator after moving downward, and judging whether the sample supporting component is placed in place according to the position; Alternatively, the detection device is controlled to perform detection, and whether the sample carrying component is placed in place is determined based on the detection result of the detection device, including: controlling the detection device to detect the force exerted on the first manipulator from the sample carrying component during or after the downward movement, and determining whether the sample carrying component is placed in place based on the force.

20. The sample analysis system according to claim 17, wherein: The sample analysis system also includes a calibration mechanism. When the controller determines that the sample carrying component is not placed in place based on the detection results of the detection device, the controller is also configured to control the first scheduling mechanism to transfer the sample carrying component to the calibration mechanism for calibration, and transfer the calibrated sample carrying component to the carrying surface or the transfer module again.

21. The sample analysis system according to claim 20, wherein: The calibration mechanism includes a calibration surface, and controlling the first scheduling mechanism to transfer the sample carrying component to the calibration mechanism and perform calibration includes: controlling the first scheduling mechanism to drive the side surface of the sample carrying component to abut against the calibration surface.

22. The sample analysis system according to claim 1, wherein: The normal temperature cache module also includes a sample recovery mechanism. When the sample contained in the sample container in the storage mechanism needs to be recovered, the controller is also configured to control the first scheduling mechanism to transfer the sample carrying component carrying the sample container from the low temperature storage module to the carrying surface, and transfer the sample container from the sample carrying component to the sample recovery mechanism.

23. The sample analysis system according to claim 1, wherein: The controller is further configured to obtain the number of sample containers placed in any of the sample carrying components stored on the carrying surface, and when the controller determines that the sample carrying component is full of sample containers or the number of sample containers placed in the sample carrying component exceeds a preset value, and the samples contained in each sample container in the sample carrying component are all samples that do not need to be retested, control the first scheduling mechanism to transfer the sample carrying component from the carrying surface to the low-temperature storage module; Alternatively, the controller is further configured to obtain the placement time of the sample container in any of the sample carrying components on the carrying surface. When the controller determines that the placement time of the sample container that was first moved into the sample carrying component in the sample carrying component exceeds a preset time, the controller controls the first scheduling mechanism to transfer the sample carrying component from the carrying surface to the low-temperature storage module.

24. A sample analysis system comprising a sample analysis module, a sample transmission module, a normal temperature buffer module, a low temperature storage module, and a controller, characterized in that: The sample analysis module is used to analyze the sample contained in the sample container; The sample transmission module is used to transmit the sample container between the sample analysis module and the normal temperature buffer module; The room temperature cache module includes a first carrying mechanism and a first scheduling mechanism, the first carrying mechanism is used to store a plurality of sample carrying components, the sample carrying components are used to carry the sample containers, and the first scheduling mechanism is used to transfer the sample carrying components stored on the first carrying mechanism to the low temperature storage module, and transfer the sample carrying components from the low temperature storage module to the first carrying mechanism; The low-temperature storage module includes a storage mechanism for low-temperature storage of sample containers from the normal-temperature cache module; The controller is configured to: control the first scheduling mechanism to at least drive the sample carrying component on the first carrying mechanism to move upward or downward first, and then transfer the sample carrying component to the low-temperature storage module; And / or, the controller is configured to: control the first scheduling mechanism to at least drive the sample carrying component from the low-temperature storage module to move upward or downward to place the sample carrying component on the first carrying mechanism.

25. The sample analysis system according to claim 24, characterized in that: The first scheduling mechanism is further used to transfer the sample container transferred from the sample transfer module to the normal temperature buffer module to the sample carrying component stored on the first carrying mechanism; The controller is further configured to control the first scheduling mechanism to transfer the sample container from the sample transfer module to a sample carrying component stored on the first carrying mechanism.

26. The sample analysis system according to claim 24, wherein: The sample analysis system further includes a transfer module, which is used to transfer the sample carrying component during the process of transferring the sample carrying component from the normal temperature cache module to the low temperature storage module and / or during the process of transferring the sample carrying component from the low temperature storage module to the normal temperature cache module; The controlling of the first dispatching mechanism to at least drive the sample carrying component on the first carrying mechanism to move upward or downward first, and then transferring the sample carrying component to the low-temperature storage module comprises: controlling the first dispatching mechanism to at least drive the sample carrying component on the first carrying mechanism to move upward or downward first, and then transferring the sample carrying component to the transfer module first; Furthermore, the control of the first scheduling mechanism to at least drive the sample carrying component from the low-temperature storage module to move upward or downward to transfer the sample carrying component to the carrying surface includes: controlling the first scheduling mechanism to remove the sample carrying component from the transfer module, and driving the sample carrying component to move upward or downward to transfer the sample carrying component to the carrying surface.

27. Normal temperature cache module, characterized in that: The first carrying mechanism comprises a first carrying mechanism and a first dispatching mechanism, wherein the first carrying mechanism has a carrying surface capable of storing a plurality of sample carrying members, the sample carrying members being used to carry sample containers, and the first dispatching mechanism being used to move the sample carrying members into the first carrying mechanism or to move the sample carrying members out of the first carrying mechanism; The first scheduling mechanism is configured to: when the first scheduling mechanism moves out of the sample carrying component, drive the sample carrying component located on the carrying surface to first move upward to separate the sample carrying component from the carrying surface, and then drive the sample carrying component to move out of the normal temperature buffer module; The first scheduling mechanism is further configured to: when the first scheduling mechanism moves into the sample carrying component, drive the sample carrying component to be transferred to above the carrying surface, and then drive the sample carrying component to be placed on the carrying surface.

28. Normal temperature cache module, characterized in that: The first carrier mechanism comprises a first carrying mechanism and a first dispatching mechanism, wherein the first carrier mechanism is used to store a plurality of sample carrying members, the sample carrying members are used to carry sample containers, and the first dispatching mechanism is used to move the sample carrying members into the first carrier mechanism or to move the sample carrying members out of the first carrier mechanism; The first scheduling mechanism is configured to: when the first scheduling mechanism moves out of the sample carrying component, drive the sample carrying component on the first carrying mechanism to move upward or downward first, and then drive the sample carrying component to move out of the normal temperature buffer module; And / or, the first scheduling mechanism is configured to: when the first scheduling mechanism moves into the sample carrying component, drive the sample carrying component to move upward or downward so that the sample carrying component is placed on the first carrying mechanism.

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