PCB design rule analysis method and system and storage medium

Abstract

The invention provides a PCB design rule analysis method and system and a storage medium, and the method comprises the steps: obtaining a PCB design drawing, and extracting key process index data based on the PCB design drawing; analyzing the key process index data based on a preset design rule to obtain a key process index analysis report, and storing the key process index analysis report to a database; and displaying the key process index analysis report. According to the method, centralized storage of the data is realized, time and energy are greatly saved, and the working efficiency is improved; an analysis report is stored in a database, and different functional groups can share the data, so that the manpower and time cost is effectively reduced; and meanwhile, by displaying the key process index analysis report, the analysis result can be presented to related personnel in a visual mode, and the design cooperation efficiency is remarkably improved.

Description

Technical Field

[0001] The present application relates to the field of computer-aided design, and in particular to a PCB design rule analysis method, system, and storage medium. Background Art

[0002] In the field of electronic equipment manufacturing, printed circuit boards (PCBs) are an indispensable and key component of electronic products. Their design quality directly affects the performance, stability, and reliability of electronic products. With the rapid development of electronic technology, electronic products are increasingly moving towards miniaturization, high performance, and multi-functionality, and the design requirements for PCBs are also becoming increasingly higher.

[0003] PCB design requires adherence to a series of strict design rules. Reasonable design rules ensure smooth PCB manufacturing, reduce manufacturing defects, and improve production efficiency, while also guaranteeing the electrical performance and stability of the PCB in practical applications. Currently, data storage for PCB design rule analysis is fragmented and lacks data sharing capabilities, resulting in low collaboration efficiency, extended design cycles, and a lack of rapid response time. Summary of the Invention

[0004] In order to solve the above technical problems, this application provides a PCB design rule analysis method, system and storage medium.

[0005] Specifically, the present application provides a PCB design rule analysis method, including: Obtain a PCB design drawing and extract key process indicator data based on the PCB design drawing; analyze the key process indicator data based on preset design rules to obtain a key process indicator analysis report, and store the key process indicator analysis report in a database; and display the key process indicator analysis report.

[0006] In the above technical solution, by obtaining the PCB design drawings and storing the key process indicator analysis reports in the database, centralized storage of data is achieved. There is no need to perform repeated file import operations, and only the required information needs to be obtained from the database, which greatly saves time and energy and improves work efficiency. In addition, by storing the analysis reports in the database, different functional groups can share these data, effectively reducing manpower and time costs. At the same time, by displaying the key process indicator analysis reports, the analysis results can be presented to relevant personnel in an intuitive manner, significantly improving the efficiency of design collaboration.

[0007] Furthermore, before obtaining the PCB design drawing, it also includes: pre-configuring preset design rules for the analysis function of the EDA software.

[0008] In the above technical solution, different PCB design projects may have different design requirements and industry standards. Pre-configuring design rules enables the EDA software's analysis function to check specific rules, improving the pertinence and accuracy of the analysis. Furthermore, rule configuration is completed before obtaining the PCB design drawing. Subsequent analysis can be carried out directly according to the preset rules, eliminating the need to reset the rules for each analysis. This saves time and improves analysis efficiency.

[0009] Furthermore, the key process indicator data at least includes line width, line spacing, pad size and aperture tolerance; before analyzing the key process indicator data, it also includes: converting the key process indicator data into a structured format.

[0010] In the above technical solution, data in a structured format has a unified structure and specifications, which facilitates processing and analysis by computer systems. After converting key process indicator data into this format, it can be more efficiently compared with preset design rules, thereby improving the speed and accuracy of analysis. Structured data is easier to integrate with database systems and other analytical tools, facilitating data storage, management, and further mining.

[0011] Furthermore, obtaining the key process indicator analysis report includes: comparing each key process indicator data converted into a structured format with the corresponding preset design rules one by one to determine whether each key process indicator data complies with the corresponding preset design rules; if there is a key process indicator data that does not comply with the preset design rules, then the key process indicator data is marked as abnormal data in the key process indicator analysis report, and the abnormal position of the abnormal data is recorded synchronously; otherwise, the key process indicator data is marked as normal data in the key process indicator analysis report.

[0012] In the above technical solution, by comparing one by one, it is possible to accurately determine whether the data of each key process indicator complies with the preset rules. For data that does not comply with the rules, it can be clearly marked as abnormal data and its abnormal location can be recorded, so that designers can quickly locate the problem and make targeted modifications. The analysis report shows the compliance of various indicators in an intuitive way. Both normal and abnormal data are clear at a glance, which makes it easy for designers and related personnel to quickly understand the overall quality of the design.

[0013] Furthermore, storing the key process indicator analysis report in the database includes: storing the key process indicator analysis report in the database based on the product material number and the current analysis date; wherein the database also stores all historical analysis reports of the previous analysis dates of the product material number.

[0014] In the above technical solution, the database simultaneously stores all historical analysis reports for the previous and subsequent analysis dates of the product material number, facilitating data tracing and comparison. Designers can view analysis reports from different periods to understand the design improvement process and trends, providing a reference for subsequent designs. Storing analysis reports indexed by product material number and analysis date makes data management in the database more organized and facilitates quick search and retrieval of relevant analysis reports for specific products.

[0015] Furthermore, the display of the key process indicator analysis report includes: giving priority to displaying the key process indicator analysis report with the latest analysis date; and obtaining the abnormal design area of ​​the current PCB design drawing based on the key process indicator analysis report, and marking the abnormal design area as an abnormal area, so as to synchronously display the abnormal area mark on the same interface of the key process indicator analysis report.

[0016] In the above technical solution, the latest analysis report reflects the latest status of the PCB design. Prioritizing its display allows designers and related personnel to promptly understand the current quality of the design so that they can take timely measures to adjust and optimize it. Abnormal area marks are displayed synchronously on the same interface of the analysis report, allowing designers to see the abnormal locations directly on the design drawing without having to frequently switch between the design drawing and the analysis report, greatly improving the efficiency of viewing and understanding abnormal situations. This intuitive display method facilitates communication and collaboration among team members. Whether designers are discussing solutions among themselves or communicating design issues with the manufacturing department, information can be conveyed more clearly, improving work efficiency.

[0017] Furthermore, based on the same concept, the present application also provides a PCB design rule analysis system, including: The data acquisition layer is used to obtain PCB design drawings and extract key process indicator data based on the PCB design drawings; the analysis engine layer is used to analyze the key process indicator data based on preset design rules to obtain a key process indicator analysis report and transmit it to the database layer; the database layer is used to store the key process indicator analysis report; and the display layer is used to display the key process indicator analysis report.

[0018] In the above technical solution, data is acquired and extracted in an automated manner, avoiding the tediousness and errors of manual operations, greatly improving the efficiency of data collection, and shortening the entire design rule analysis cycle; based on the preset design rules, the key process indicator data is analyzed, and it can quickly and accurately determine whether each indicator meets the rule requirements and generate a key process indicator analysis report. This intelligent analysis capability can help designers promptly discover potential problems in the design and improve design quality; the analysis reports stored in the database can be shared by different departments and personnel, breaking down information barriers and promoting collaboration and communication between teams; the display layer can clearly and intuitively display the key process indicator analysis report to the user, allowing the user to quickly understand the overall quality of the PCB design.

[0019] Furthermore, the analysis engine layer is also used to obtain abnormal design areas of the current PCB design drawing based on the key process indicator analysis report, and mark the abnormal design areas as abnormal areas.

[0020] In the above technical solution, the analysis engine layer can also obtain abnormal design areas of the current PCB design based on the analysis report and mark the abnormal areas; this enables designers to intuitively understand the specific locations of problems in the design and make targeted modifications, thereby improving the efficiency of problem solving.

[0021] Furthermore, the display layer is also used to synchronously display the abnormal area mark.

[0022] In the above technical solution, abnormal area marks are displayed synchronously, allowing users to directly see the abnormal locations in the design drawings while viewing the analysis report, thereby improving the efficiency and accuracy of information acquisition.

[0023] Furthermore, based on the same concept, the present application also provides a storage medium storing a computer program, which implements the PCB design rule analysis method when executed by a processor.

[0024] Compared with the prior art, the present invention has the following advantages: In the PCB design workflow, by acquiring PCB design drawings and storing key process indicator analysis reports in a database, centralized data management is achieved, saving a lot of time and energy and greatly improving work efficiency. Different functional groups can easily share data in the database, making human resources more reasonably allocated and effectively reducing manpower and time costs. In addition, by presenting the analysis results to relevant personnel in an intuitive form, they can have a clearer understanding of the various indicators of PCB design, which helps team members communicate and collaborate better and significantly improves design collaboration efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0025] Figure 1 This is a flow chart of the PCB design rule analysis method described in this application.

[0026] Figure 2 This is a framework diagram of the PCB design rule analysis system described in this application.

[0027] Figure 3 A schematic diagram showing the marking of abnormal areas described in this application. DETAILED DESCRIPTION

[0028] The following is a further detailed description of a PCB design rule analysis method, system, and storage medium of the present application in conjunction with specific embodiments and drawings.

[0029] See Figure 1 , the present application provides a PCB design rule analysis method, comprising the following steps S100-S300.

[0030] S100: Obtain a PCB design drawing, and extract key process indicator data based on the PCB design drawing.

[0031] Furthermore, before obtaining the PCB design drawing, it also includes: pre-configuring preset design rules for the analysis function of the EDA software.

[0032] In some embodiments, based on the interfaces and functions of mainstream PCB engineering EDA software such as Genesis and InCAMPro, customized plug-ins or scripts are written to achieve fully automatic analysis and extraction of key process indicators in design files; for different key process indicators, corresponding analysis algorithms are designed in the plug-ins or scripts to ensure that these data can be accurately extracted from the design files.

[0033] In addition, configure the required parameters in the Analysis function of the EDA software in advance, such as setting the minimum thresholds for line width and line spacing; use the Linux system's background scheduled tasks (such as crontab) to regularly call the Analysis function of the EDA software; when calling, ensure that the configured parameters are used for analysis to ensure the accuracy and consistency of the analysis results.

[0034] Furthermore, based on the system's needs and scale, we selected an appropriate database, such as MySQL or MongoDB. We then set up the chosen database in the cloud or locally, performing the necessary configuration to ensure it supports concurrent access by multiple users. We also used the Vue.js framework to implement real-time web-based interaction, and ImageSharp to optimize image processing performance.

[0035] Specifically, designers upload PCB designs in ODB++ format through a web interface. After receiving the file, the system stores it in a designated location and extracts key process indicator data, which includes at least line width, line spacing, pad size, and aperture tolerance.

[0036] It should be noted that this analysis method can also run on Windows systems, adapt to different user environments, and provide corresponding API interfaces for seamless integration with enterprise MES / ERP systems.

[0037] In the above technical solution, different PCB design projects may have different design requirements and industry standards. Pre-configuring design rules enables the EDA software's analysis function to check specific rules, improving the pertinence and accuracy of the analysis. Furthermore, rule configuration is completed before obtaining the PCB design drawing. Subsequent analysis can be carried out directly according to the preset rules, eliminating the need to reset the rules for each analysis. This saves time and improves analysis efficiency.

[0038] S200: Analyzing the key process indicator data based on preset design rules to obtain a key process indicator analysis report, and storing the key process indicator analysis report in a database.

[0039] Furthermore, before analyzing the key process indicator data, the method further includes: converting the key process indicator data into a structured format.

[0040] In some embodiments, data is read from a data source of previously stored key process indicator data. Since this data is obtained from EDA software analysis, the format may be relatively complex and needs to be parsed. According to the characteristics of the data, the data delimiter, field order and other information are determined, and the parsed data is converted into a unified structured format, such as a dictionary or list in Python, or a record format in a database table. A unique identifier and field name are assigned to each key process indicator data to ensure data consistency and queryability.

[0041] Further clean and preprocess the data to remove invalid data, duplicate data, and handle missing values; for example, if the data of a key process indicator is empty, fill it in or delete it according to business rules.

[0042] In the above technical solution, data in a structured format has a unified structure and specifications, which facilitates processing and analysis by computer systems. After converting key process indicator data into this format, it can be more efficiently compared with preset design rules, thereby improving the speed and accuracy of analysis. Structured data is easier to integrate with database systems and other analytical tools, facilitating data storage, management, and further mining.

[0043] Furthermore, obtaining the key process indicator analysis report includes: comparing each key process indicator data converted into a structured format with the corresponding preset design rules one by one to determine whether each key process indicator data complies with the corresponding preset design rules; if there is a key process indicator data that does not comply with the preset design rules, then the key process indicator data is marked as abnormal data in the key process indicator analysis report, and the abnormal position of the abnormal data is recorded synchronously; otherwise, the key process indicator data is marked as normal data in the key process indicator analysis report.

[0044] In some embodiments, preset design rules are loaded from a database or configuration file, and these rules include at least drilling analysis rules, circuit analysis rules, solder mask analysis rules, text analysis rules, etc.; the loaded rules are converted into a format that is easy to compare, such as a dictionary or object in Python, to facilitate subsequent data comparison.

[0045] Traverse the key process indicator data converted into a structured format and compare them one by one with the corresponding preset design rules. For each key process indicator data, judge according to its type and corresponding rule; for example, for line width data, check whether its value is greater than or equal to the preset line width rule value; for hole spacing data, check whether it meets the hole spacing rule requirements.

[0046] Once it is discovered that key process indicator data does not conform to the preset design rules, it is necessary to clearly mark this data as abnormal data in the key process indicator analysis report. At the same time, the abnormal location of the abnormal data must be recorded in detail. In the PCB design, the abnormal location can be determined by precise coordinate information and specific layer number. The coordinate information can accurately locate the specific location of the abnormal data on the PCB design; the layer number can help distinguish the PCB layer where the abnormal data is located. PCBs are usually composed of multiple layers, and different layers may have different process requirements and design characteristics. By accurately recording the abnormal location, subsequent engineers can quickly locate the problem and conduct targeted analysis and treatment.

[0047] If the key process indicator data meets the preset design rules, it should also be marked as normal data in the key process indicator analysis report. The purpose of doing so is to make the report more comprehensive and clear, not only to highlight abnormal data, but also to let relevant personnel know which process indicators meet the requirements, so as to have an overall grasp of the quality of the entire PCB design.

[0048] Based on the results of data comparison, a key process indicator analysis report is generated; the report contains the marking information of each key process indicator data (normal or abnormal) and detailed information of abnormal data (such as abnormal location, actual value, rule value, etc.); the report can be organized in formats such as JSON or XML to facilitate subsequent storage and transmission.

[0049] In the above technical solution, by comparing one by one, it is possible to accurately determine whether the data of each key process indicator complies with the preset rules. For data that does not comply with the rules, it can be clearly marked as abnormal data and its abnormal location can be recorded, so that designers can quickly locate the problem and make targeted modifications. The analysis report shows the compliance of various indicators in an intuitive way. Both normal and abnormal data are clear at a glance, which makes it easy for designers and related personnel to quickly understand the overall quality of the design.

[0050] Furthermore, storing the key process indicator analysis report in the database includes: storing the key process indicator analysis report in the database based on the product material number and the current analysis date; wherein the database also stores all historical analysis reports of the previous analysis dates of the product material number.

[0051] In some embodiments, when storing reports, a unique identifier is assigned to each report record to facilitate subsequent query and management, and an association is established between the product material number, analysis date and report record to facilitate rapid retrieval and filtering of data.

[0052] In the above technical solution, the database simultaneously stores all historical analysis reports for the previous and subsequent analysis dates of the product material number, facilitating data tracing and comparison. Designers can view analysis reports from different periods to understand the design improvement process and trends, providing a reference for subsequent designs. Storing analysis reports indexed by product material number and analysis date makes data management in the database more organized and facilitates quick search and retrieval of relevant analysis reports for specific products.

[0053] S300: Displaying the key process indicator analysis report.

[0054] Furthermore, the display of the key process indicator analysis report includes: giving priority to displaying the key process indicator analysis report with the latest analysis date; and obtaining the abnormal design area of ​​the current PCB design drawing based on the key process indicator analysis report, and marking the abnormal design area as an abnormal area, so as to synchronously display the abnormal area mark on the same interface of the key process indicator analysis report.

[0055] In some embodiments, the latest report data is displayed on the interface in an intuitive manner, such as in a table format, to facilitate users to view the marking information and abnormal conditions of key process indicator data; a historical report query function is provided, allowing users to select different analysis dates through a drop-down menu or search box to view the corresponding historical analysis reports; according to the analysis date selected by the user, the corresponding report data is retrieved from the database and displayed on the interface.

[0056] In addition, based on the abnormal data information in the key process indicator analysis report, the abnormal design area of ​​the current PCB design drawing is located, and the corresponding area is found on the PCB design drawing according to the abnormal position information of the abnormal data; the abnormal design area is marked using image processing technology or a front-end drawing library (such as ImageSharp or HTML5 Canvas); the marking can use different colors, line styles or icons to highlight the abnormal area.

[0057] Furthermore, abnormal area marks are displayed synchronously on the same interface of the key process indicator analysis report, allowing users to intuitively see the abnormal location and corresponding abnormal data information on the PCB design drawing; by clicking on the marked area, detailed abnormal information of the area can also be displayed.

[0058] In the above technical solution, the latest analysis report reflects the latest status of the PCB design. Prioritizing its display allows designers and related personnel to promptly understand the current quality of the design so that they can take timely measures to adjust and optimize it. Abnormal area marks are displayed synchronously on the same interface of the analysis report, allowing designers to see the abnormal locations directly on the design drawing without having to frequently switch between the design drawing and the analysis report, greatly improving the efficiency of viewing and understanding abnormal situations. This intuitive display method facilitates communication and collaboration among team members. Whether designers are discussing solutions among themselves or communicating design issues with the manufacturing department, information can be conveyed more clearly, improving work efficiency.

[0059] In summary, the PCB design rule analysis method realizes centralized storage of data by acquiring PCB design drawings and storing key process indicator analysis reports in a database. There is no need to perform repeated file import operations, and only the required information needs to be obtained from the database, which greatly saves time and energy and improves work efficiency. Moreover, by storing the analysis reports in the database, different functional groups can share these data, effectively reducing manpower and time costs. At the same time, by displaying the key process indicator analysis reports, the analysis results can be presented to relevant personnel in an intuitive manner, significantly improving design collaboration efficiency.

[0060] Further, based on the same concept, see Figure 2 , this application also provides a PCB design rule analysis system, including: The data acquisition layer is used to obtain PCB design drawings and extract key process indicator data based on the PCB design drawings; the analysis engine layer is used to analyze the key process indicator data based on preset design rules to obtain a key process indicator analysis report and transmit it to the database layer; the database layer is used to store the key process indicator analysis report; and the display layer is used to display the key process indicator analysis report.

[0061] In some embodiments, the data acquisition layer receives PCB design drawings in ODB++ format uploaded by users and parses the acquired PCB design drawings; for example, for the circuit layer, the width, spacing, length and other data of the circuit are extracted; for the drilling layer, the diameter, position and other data of the drilling are extracted; these key process indicator data are organized into a unified format and transmitted to the analysis engine layer for further analysis.

[0062] Users design a series of preset design rules based on actual application requirements. These rules are stored in the system for use by the analysis engine layer. After receiving the key process indicator data, the analysis engine layer compares it one by one with the preset design rules and generates a key process indicator analysis report based on the comparison results. The report lists in detail the actual value of each indicator, the rule requirements, and the judgment results of whether it is normal.

[0063] The database layer uses a relational database (such as MySQL, Oracle, etc.) to store the key process indicator analysis reports generated by the analysis engine layer in the database; the reports are classified and stored according to product material number, analysis date, etc., to facilitate subsequent query and management. The display layer provides a unified visual interface for different departments of the enterprise (such as design department, production department, quality control department, etc.); relevant personnel can log in to the system through this interface, select the corresponding product and design date, and view the key process indicator analysis report; the report is presented in the form of intuitive tables and charts, allowing personnel to quickly understand the overall situation of the design.

[0064] In the above technical solution, data is acquired and extracted in an automated manner, avoiding the tediousness and errors of manual operations, greatly improving the efficiency of data collection, and shortening the entire design rule analysis cycle; based on the preset design rules, the key process indicator data is analyzed, and it can quickly and accurately determine whether each indicator meets the rule requirements and generate a key process indicator analysis report. This intelligent analysis capability can help designers promptly discover potential problems in the design and improve design quality; the analysis reports stored in the database can be shared by different departments and personnel, breaking down information barriers and promoting collaboration and communication between teams; the display layer can clearly and intuitively display the key process indicator analysis report to the user, allowing the user to quickly understand the overall quality of the PCB design.

[0065] Furthermore, the analysis engine layer is also used to obtain abnormal design areas of the current PCB design drawing based on the key process indicator analysis report, and mark the abnormal design areas as abnormal areas.

[0066] In some embodiments, the analysis engine layer further determines the abnormal design area in the PCB design drawing based on the analysis report, for example, accurately locates the specific location of the line width abnormality through coordinate information and layer number, and marks the area as an abnormal area.

[0067] In the above technical solution, the analysis engine layer can also obtain abnormal design areas of the current PCB design based on the analysis report and mark the abnormal areas; this enables designers to intuitively understand the specific locations of problems in the design and make targeted modifications, thereby improving the efficiency of problem solving.

[0068] Furthermore, the display layer is also used to synchronously display the abnormal area mark.

[0069] In some embodiments, the display layer displays the PCB design diagram while simultaneously displaying the abnormal areas marked by the analysis engine layer. Figure 3 The WEB interface when the PTH hole ring is missing is displayed. The missing position is captured and enlarged, and the specific abnormal part is marked.

[0070] In the above technical solution, abnormal area marks are displayed synchronously, allowing users to directly see the abnormal locations in the design drawings while viewing the analysis report, thereby improving the efficiency and accuracy of information acquisition.

[0071] Furthermore, based on the same concept, the present application also provides a storage medium storing a computer program, which implements the PCB design rule analysis method when executed by a processor.

[0072] In some embodiments, the storage medium stores several computer programs for enabling a PCB design rule analysis system to perform all or part of the steps of the methods described in various embodiments of the present application. The medium may include a USB flash drive, a mobile hard drive, a read-only memory, a random access memory, a magnetic disk, or an optical disk, among other media capable of storing program code.

[0073] Although example embodiments have been described herein with reference to the accompanying drawings, it should be understood that the above example embodiments are merely illustrative and are not intended to limit the scope of the present application. Various changes and modifications may be made therein by those skilled in the art without departing from the scope and spirit of the present application. All such changes and modifications are intended to be included within the scope of the present application as required by the appended claims.

[0074] Those skilled in the art will appreciate that the units and algorithm steps of each example described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, or a combination of computer software and electronic hardware. Whether these functions are performed in hardware or software depends on the specific application and design constraints of the technical solution. Professional and technical personnel can use different methods to implement the described functions for each specific application, but such implementation should not be considered beyond the scope of this application.

[0075] In the several embodiments provided in this application, it should be understood that the disclosed devices and methods can be implemented in other ways. For example, the device embodiments described above are merely illustrative. For example, the division of the units described is merely a logical function division. In actual implementation, other division methods may be used, such as combining or integrating multiple units or components into another device, or ignoring or not performing some features.

[0076] The various component embodiments of the present application can be implemented in hardware, or in a software module running on one or more processors, or in a combination thereof. Those skilled in the art will appreciate that a microprocessor or digital signal processor (DSP) can be used in practice to implement some or all of the functions of some modules according to the embodiments of the present application. The application can also be implemented as a part or all of a device program (e.g., a computer program and a computer program product) for performing the method described herein. Such a program implementing the present application can be stored on a computer-readable medium, or can have the form of one or more signals. Such a signal can be downloaded from an Internet website, or provided on a carrier signal, or provided in any other form.

[0077] It should be noted that, in this document, relational terms such as first and second, etc., are used only to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply the existence of any such actual relationship or order between these entities or operations. Moreover, the terms "comprises," "comprising," or any other variants thereof are intended to cover non-exclusive inclusion, so that a process, method, article, or device comprising a series of elements includes not only those elements, but also other elements not explicitly listed, or elements inherent to such process, method, article, or device. In the absence of further limitations, an element defined by the phrase "comprising a ..." does not exclude the presence of other identical elements in the process, method, article, or device comprising the element.

[0078] Although the present application is described in conjunction with the above specific embodiments, it is obvious that those skilled in the art can make many substitutions, modifications and variations based on the above content. Therefore, all such substitutions, improvements and variations are included in the spirit and scope of the appended claims.

Claims

1. A PCB design rule analysis method, characterized in that: include: Obtaining a PCB design drawing, and extracting key process indicator data based on the PCB design drawing; Analyzing the key process indicator data based on preset design rules to obtain a key process indicator analysis report, and storing the key process indicator analysis report in a database; And, display the key process indicator analysis report.

2. The PCB design rule analysis method according to claim 1, characterized in that: Before obtaining the PCB design drawing, it also includes: Configure preset design rules for the analysis function of the EDA software in advance.

3. The PCB design rule analysis method according to claim 2, characterized in that: The key process indicator data at least includes line width, line spacing, pad size and aperture tolerance; before analyzing the key process indicator data, it also includes: The key process indicator data is converted into a structured format.

4. The PCB design rule analysis method according to claim 3, characterized in that: The key process indicator analysis report obtained includes: Each key process indicator data converted into a structured format shall be compared with the corresponding preset design rules one by one to determine whether each key process indicator data complies with the corresponding preset design rules. If any key process indicator data does not comply with the preset design rules, the key process indicator data shall be marked as abnormal data in the key process indicator analysis report, and the abnormal position of the abnormal data shall be recorded simultaneously; otherwise, the key process indicator data shall be marked as normal data in the key process indicator analysis report.

5. The PCB design rule analysis method according to claim 4, characterized in that: The storing of the key process indicator analysis report in the database includes: The key process indicator analysis report is stored in a database based on the product material number and the current analysis date; wherein the database also stores all historical analysis reports of the previous analysis dates of the product material number.

6. The PCB design rule analysis method according to claim 5, characterized in that: The key process indicator analysis report includes: Prioritize the presentation of key process indicator analysis reports with the latest analysis date; Furthermore, based on the key process indicator analysis report, the abnormal design area of ​​the current PCB design drawing is obtained, and the abnormal design area is marked as an abnormal area, so that the abnormal area mark can be synchronously displayed on the same interface of the key process indicator analysis report.

7. A system using the PCB design rule analysis method according to any one of claims 1 to 6, characterized in that: include: The data acquisition layer is used to obtain the PCB design drawings and extract key process indicator data based on the PCB design drawings; The analysis engine layer is used to analyze the key process indicator data based on preset design rules to obtain a key process indicator analysis report and transmit it to the database layer; A database layer, used for storing the key process indicator analysis report; The display layer is used to display the key process indicator analysis report.

8. The system according to claim 7, characterized in that The analysis engine layer is further used to obtain abnormal design areas of the current PCB design drawing based on the key process indicator analysis report, and mark the abnormal design areas as abnormal areas.

9. The system according to claim 8, characterized in that The display layer is also used to synchronously display the abnormal area mark.

10. A storage medium, characterized in that: A computer program is stored, and when the program is executed by a processor, the PCB design rule analysis method according to any one of claims 1 to 6 is implemented.

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