Measurement and control experiment result processing method and device and quantum computer

Abstract

The invention discloses a processing method and device of a measurement and control experiment result and a quantum computer, and by utilizing the scheme of the invention, the analysis efficiency of the experiment result of an energy spectrum experiment can be effectively improved, so that the execution efficiency of the quantum computer is improved. Besides, according to the scheme, the modulation spectrum with high accuracy can be obtained in the quantum chip rough test stage by directly utilizing the result of the energy spectrum experiment, the modulation spectrum can be used as a reference in the subsequent quantum chip fine test stage, and the modulation spectrum obtaining process in the scheme is simple and high in efficiency.

Description

Technical Field

[0001] The present invention relates to the field of quantum computing technology, and in particular to a method and device for processing measurement and control experiment results, as well as a quantum computer. Background Art

[0002] Quantum computing and quantum information are interdisciplinary fields that use the principles of quantum mechanics to achieve computational and information processing tasks. They are closely connected to disciplines such as quantum physics, computer science, and informatics. They have experienced rapid development over the past two decades. Quantum algorithms based on quantum computers, for tasks such as factorization and unstructured search, have demonstrated performance far exceeding that of existing algorithms based on classical computers, leading to expectations that this field will surpass current computing capabilities. Quantum computing has the potential to significantly surpass the performance of classical computers in solving specific problems. To realize a quantum computer, it is necessary to obtain a quantum chip containing a sufficient number and quality of quantum bits (qubits), capable of performing and reading quantum logic gates with extremely high fidelity.

[0003] Quantum chips are to quantum computers what CPUs are to traditional computers; they are the core components of quantum computers. With the continuous advancement of quantum computing-related technologies, the number of qubits on quantum chips is increasing year by year. It is foreseeable that larger-scale quantum chips will emerge in the future, containing even more qubits, and quantum computers will also be equipped with even larger-scale quantum chips. When testing or applying quantum chips, we need to perform measurement and control experiments on them, such as energy spectrum experiments, Ramsey experiments, and Rabi experiments. Existing technologies require R&D personnel to process the experimental results data for each measurement and control experiment, which is inefficient.

[0004] Therefore, it is necessary to propose a solution that can improve the execution efficiency of quantum computers.

[0005] It should be noted that the information disclosed in the background technology of this application is only intended to deepen the understanding of the general background technology of this application, and should not be regarded as an admission or any form of implication that the information constitutes prior art already known to those skilled in the art. Summary of the Invention

[0006] The purpose of the present invention is to provide a method and device for processing measurement and control experimental results, as well as a quantum computer, to solve the problem of low execution efficiency of quantum computers in the prior art.

[0007] In order to solve the above technical problems, the present invention proposes a method for processing measurement and control experiment results, comprising:

[0008] Obtaining a preset number of initial operating data points from an operating data point set, wherein the operating data point set is obtained by using extreme points in experimental results of multiple sets of energy spectrum experiments, each set of experimental results of the energy spectrum experiments having at least one extreme point, and the operating data point set includes a plurality of operating data points consisting of operating voltages corresponding to different energy spectrum experimental results and operating frequencies corresponding to the extreme points;

[0009] Traversing the working data point set from each initial data point as a starting point to both sides of the initial data point to obtain the preset number of data point sets, wherein the data points in the data point set are target extreme value points corresponding to each working voltage with the minimum distance from the initial data point;

[0010] The modulation spectrum of the quantum bit to be measured is determined according to the result with the best fitting effect in all the data point sets, and the modulation spectrum is used to obtain the corresponding relationship between the operating voltage and the operating frequency of the quantum bit.

[0011] Optionally, before obtaining a preset number of initial working data points from the working data point set, the method further includes:

[0012] Performing image processing on a result graph containing experimental results of several groups of energy spectrum experiments to output a first grayscale image;

[0013] A plurality of working data points are obtained according to the first grayscale image, and a set consisting of the obtained plurality of working data points is used as the working data point set.

[0014] Optionally, before obtaining a preset number of initial working data points from the working data point set, the method further includes:

[0015] Corresponding working data points are obtained according to the experimental results of each group of energy spectrum experiments, and a set consisting of several of the obtained working data points is used as the working data point set.

[0016] Optionally, before determining the modulation spectrum of the subbit to be measured according to the result with the best fitting effect in all the data point sets, the method further includes:

[0017] The data point set is fitted using a physical model, where the physical model is a parameter-containing model for reflecting an expected result of the modulation spectrum of the sub-bit to be measured.

[0018] Optionally, the physical model is:

[0019]

[0020] Wherein, Φ=πM(x-offset), y represents the operating frequency, x represents the operating voltage, α represents the anharmonicity of the sub-bit to be measured, and f qmax , M, and offset are all parameters of the physical model.

[0021] Optionally, the fitting effect of the set of data points is determined using goodness of fit;

[0022] Alternatively, the fitting effect of the set of data points is determined using a correction coefficient of determination;

[0023] Alternatively, the mean square error is used to determine the fitting effect of the data point set;

[0024] Alternatively, the root mean square error is used to determine the fitting effect of the data point set;

[0025] Alternatively, the sum of squared errors is used to determine the fitting effect of the data point set;

[0026] Alternatively, the mean absolute error is used to determine the fitting effect of the data point set;

[0027] Alternatively, the mean absolute percentage error is used to determine the fitting effect of the data point set.

[0028] Based on the same inventive concept, the present invention also proposes a processing device for measuring and controlling experimental results, comprising:

[0029] an initial operating data point acquisition unit, configured to acquire a preset number of initial operating data points from a set of operating data points, wherein the set of operating data points is acquired by using extreme points from experimental results of multiple sets of energy spectrum experiments, each set of experimental results of the energy spectrum experiments having at least one extreme point, and the set of operating data points comprising a plurality of operating data points consisting of operating voltages corresponding to different energy spectrum experimental results and operating frequencies corresponding to the extreme points;

[0030] a data point set acquisition unit, configured to traverse the working data point set from each initial data point as a starting point to both sides of the initial data point to obtain the preset number of data point sets, wherein the data points in the data point set are target extreme value points corresponding to each working voltage with the minimum distance from the initial data point;

[0031] A modulation spectrum acquisition unit is used to determine the modulation spectrum of the quantum bit to be measured based on the result with the best fitting effect in all the data point sets, and the modulation spectrum is used to obtain the corresponding relationship between the operating voltage and the operating frequency of the quantum bit.

[0032] Based on the same inventive concept, the present invention also proposes a quantum computing measurement and control system, which utilizes the method for processing the measurement and control experiment results described in any one of the above-mentioned characteristic descriptions, or includes a processing device for the measurement and control experiment result data described in the above-mentioned characteristic descriptions.

[0033] Based on the same inventive concept, the present invention also proposes a quantum computer, including the quantum computing measurement and control system described in the above feature description.

[0034] Based on the same inventive concept, the present invention also proposes a readable storage medium having a computer program stored thereon. When the computer program is executed by a processor, it can implement the method for processing the measurement and control experiment results described in any one of the above-mentioned feature descriptions.

[0035] Compared with the prior art, the present invention has the following beneficial effects:

[0036] The present invention proposes a method for processing measurement and control experiment results. The method obtains experimental results from several sets of energy spectrum experiments on a quantum bit to be measured, wherein the operating voltage of the quantum bit to be measured in each set of energy spectrum experiments is different. Based on the experimental results, several operating data points are obtained, wherein each operating data point includes the operating voltage of the quantum bit to be measured and the corresponding operating frequency. A preset number of initial data points are obtained from the several operating data points. Starting from each initial data point, the method traverses both sides of the initial data point to obtain the data points closest to the initial data point, thereby obtaining a data point set. Fitting is then performed on each of the data point sets, and the set of data points with the best fitting effect is obtained as the target data point set. The fitting results of the target data point set are used to obtain the modulation spectrum of the quantum bit to be measured. The modulation spectrum is used to obtain the corresponding relationship between the operating voltage and operating frequency of the quantum bit. The solution of the present application can effectively improve the efficiency of analyzing the experimental results of energy spectrum experiments, thereby improving the execution efficiency of quantum computers. In addition, the solution of the present application directly utilizes the results of the energy spectrum experiment, and can obtain a modulation spectrum with high accuracy in the rough measurement stage of the quantum chip, and the modulation spectrum can be used as a reference for the subsequent fine testing stage of the quantum chip. The modulation spectrum acquisition process in the solution of the present application is simple and efficient. BRIEF DESCRIPTION OF THE DRAWINGS

[0037] Figure 1 A flow chart of a method for processing measurement and control experiment results proposed in an embodiment of the present invention;

[0038] Figure 2 This is a graph showing the experimental results of the quantum bit to be measured after multiple energy spectrum experiments;

[0039] Figure 3 This is a simplified structural diagram of a device for processing measurement and control experimental results proposed in another embodiment of the present invention. DETAILED DESCRIPTION

[0040] The following describes a specific embodiment of the present invention in more detail with reference to schematic diagrams. The advantages and features of the present invention will become more apparent from the following description and claims. It should be noted that the drawings are greatly simplified and not to exact scale, and are intended solely to facilitate and clearly illustrate the embodiments of the present invention.

[0041] In the description of the present invention, it should be understood that the terms "center", "up", "down", "left", "right", etc., indicating directions or positional relationships, are based on the directions or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific direction, be constructed and operated in a specific direction, and therefore cannot be understood as a limitation on the present invention.

[0042] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of the technical features being referred to. Thus, a feature specified as "first" or "second" may explicitly or implicitly include one or more of the features. In the description of the present invention, "plurality" means at least two, such as two, three, etc., unless otherwise specifically defined.

[0043] Before the quantum chip in a quantum computer is officially put into use, it needs to go through an early testing phase. Generally speaking, the testing phase of a quantum chip can be roughly divided into a coarse testing phase and a fine testing phase. The coarse testing phase is mainly to obtain the approximate parameters of quantum chip-related information, such as whether the quantum bit is adjustable, whether the reading cavity is normal, and the rough values ​​of other quantum bit parameters (such as quantum bit frequency). The fine testing phase is to accurately characterize a quantum chip, for example, to obtain the operating frequency of the quantum bit, characterize the decoherence time of the quantum bit, obtain the accurate parameters of the quantum state control signal (such as the π signal), obtain the modulation spectrum of the quantum bit, etc. The fine testing phase often requires the use of more complex measurement and control experiments such as the Ramsey experiment and the Rabi experiment as a basis, which takes more time than the coarse testing phase.

[0044] From the above analysis, it can be seen that in the test process of the quantum chip, it is necessary to test and characterize the various parameters of each quantum bit in the quantum chip, including the modulation spectrum of the quantum bit. The modulation spectrum of the quantum bit refers to the frequency spectrum of the quantum bit frequency as the working voltage in the magnetic flux modulation line changes. It can be understood by those skilled in the art that two working voltages are applied to the magnetic flux modulation line of the quantum bit, namely DC voltage and AC voltage. Correspondingly, the modulation spectrum of the quantum bit includes AC modulation spectrum and DC modulation spectrum. In the prior art, the modulation spectrum of the quantum bit is generally obtained by the following scheme: when the quantum bit is working, the quantum bit frequency corresponding to the quantum bit within a certain working voltage range, that is, the working frequency, is obtained by using the Ramsey experiment and the modulation spectrum of the quantum bit is obtained. This scheme of obtaining the modulation spectrum using the Ramsey experiment has high accuracy, but it consumes more time.

[0045] In order to improve the efficiency of obtaining the modulation spectrum of quantum bits, the applicant considered using the energy spectrum experiment in the rough measurement stage to obtain the modulation spectrum of quantum bits. Compared with Ramsey, the energy spectrum experiment takes much less time, effectively improving the testing efficiency of quantum chips and, to a certain extent, improving the execution efficiency of quantum computers. For details, please refer to Figure 1 , an embodiment of the present invention proposes a method for processing measurement and control experiment results, including:

[0046] S100: Acquire a preset number of initial operating data points from an operating data point set, wherein the operating data point set is acquired by using extreme points in experimental results of multiple sets of energy spectrum experiments, each set of experimental results of the energy spectrum experiments having at least one extreme point, and the operating data point set includes a plurality of operating data points consisting of operating voltages corresponding to different energy spectrum experimental results and operating frequencies corresponding to the extreme points;

[0047] S200: traversing the working data point set from each initial data point as a starting point to both sides of the initial data point to obtain a preset number of data point sets, wherein the data points in the data point sets are target extreme value points corresponding to each working voltage with the minimum distance from the initial data point;

[0048] S300: Determine a modulation spectrum of the quantum bit to be measured based on a result with the best fitting effect in all the data point sets, wherein the modulation spectrum is used to obtain a corresponding relationship between an operating voltage and an operating frequency of the quantum bit.

[0049] The present invention differs from the prior art in that it proposes a method for processing measurement and control experiment results. The method obtains experimental results from several sets of energy spectrum experiments on a quantum bit to be measured, wherein the operating voltage of the quantum bit to be measured in each set of energy spectrum experiments varies. Based on these experimental results, several operating data points are obtained, each of which includes the operating voltage and corresponding operating frequency of the quantum bit to be measured. A preset number of initial data points are obtained from these several operating data points. Starting from each initial data point, the method traverses both sides of the initial data point to obtain the data points closest to the initial data point, thereby obtaining a preset number of data point sets. Fitting is then performed on each of these data point sets, and the set of data points with the best fitting effect is obtained as the target data point set. The fitting results of the target data point set are used to obtain the modulation spectrum of the quantum bit to be measured. The modulation spectrum is used to determine the corresponding relationship between the operating voltage and operating frequency of the quantum bit. The solution of the present application can effectively improve the efficiency of analyzing the experimental results of energy spectrum experiments, thereby improving the execution efficiency of quantum computers. In addition, the solution of the present application directly utilizes the results of the energy spectrum experiment to obtain a highly accurate modulation spectrum in the rough measurement stage of the quantum chip, and this modulation spectrum can be used as a reference for the subsequent fine measurement stage of the quantum chip. The modulation spectrum acquisition process in the solution of the present application is simple and efficient. It will be understood by those skilled in the art that the number of initial data points obtained in step S300 is a preset value, that is, the preset number. In this embodiment, the preset number is 5. In other embodiments, it can be set to other numbers, for example, it can be set to 4, 6, etc., which will not be repeated here.

[0050] by Figure 2 For example, Figure 2 The figure shows the experimental results of the quantum bit to be measured after multiple energy spectrum experiments. Figure 2 is a three-dimensional graph with depth information, wherein the horizontal axis is the operating voltage of the sub-bit to be measured, and the vertical axis is the operating frequency of the sub-bit to be measured. In the embodiment, Figure 2 The depth information in is the probability of the quantum bit to be measured being in the |1> state obtained in the energy spectrum experiment. Since the probability of the |1> state, the probability of the |0> state, the amplitude, and the phase of the quantum bit can be converted into each other, in other embodiments, the depth information can also be the probability, amplitude, or phase of the |0> state, which is not limited here.

[0051] It will be understood by those skilled in the art that Figure 2 Each column of data corresponding to the horizontal axis corresponds to the experimental results of an energy spectrum experiment. Figure 2 The modulation spectrum profile of the subbit to be measured can be roughly seen in ( Figure 2For the energy spectrum experiment, the maximum point in the result corresponds to the operating frequency of the quantum bit. Figure 2 The physical meaning of the darker points is the maximum point in the energy spectrum experiment. However, in actual applications, due to the presence of some noise interference, these noises will produce some noise points in the results of the energy spectrum experiment. Although these points are also maximum points, they are not the working frequencies of the sub-bits to be measured. If these points are directly taken and fitted directly, the accuracy of the modulation spectrum finally obtained will be very low. In this embodiment, a preset number of initial data points are obtained from the experimental results of multiple energy spectrum experiments, and each of the initial data points is used as a starting point to traverse both sides of the initial data point to obtain the data points closest to the initial data point, and five sets of data points are obtained, and then the five sets of data points are fitted respectively, and the set of data points with the best fitting effect is obtained as the target data point set. The fitting result of the target data point set is used to obtain the modulation spectrum of the sub-bit to be measured. The scheme of the present application can effectively remove the influence of these noise points, so as to Figure 2 For example, Figure 2 The two points in the dotted box are both extreme points, but it is obvious that the extreme point below is a noise point. Due to the distance, the solution of this application can effectively remove the noise point below, and so on, and finally an accurate modulation spectrum can be obtained.

[0052] It should be noted that, in this embodiment, the working data points can be obtained by Figure 2 The result graphs of the experimental results of the multiple energy spectrum experiments shown can be obtained, and the experimental result data of the energy spectrum can also be directly obtained.

[0053] Specifically, the obtaining of several working data points based on the experimental results includes:

[0054] Performing image processing on a result graph containing experimental results of several groups of energy spectrum experiments to output a first grayscale image;

[0055] A plurality of working data points are obtained according to the first grayscale image, and a set consisting of the obtained plurality of working data points is used as the working data point set.

[0056] The first grayscale image is output by binarizing the result image of the energy spectrum experiment. The point with the largest grayscale value in the first grayscale image is the working data point. This solution is more efficient in obtaining working data points.

[0057] In some application scenarios where efficiency requirements are not too high, this application also proposes that the experimental results of each set of energy spectrum experiments can be directly used to obtain working data points. Specifically, the several working data points obtained based on the experimental results include:

[0058] Corresponding working data points are obtained according to the experimental results of each group of energy spectrum experiments, and a set consisting of several of the obtained working data points is used as the working data point set.

[0059] Specifically, in this embodiment, a physical model is used to perform fitting processing on the data point set, where the physical model is a parameter-containing model used to reflect the expected result of the modulation spectrum of the sub-bit to be measured.

[0060] Specifically, in this embodiment, the physical model is:

[0061]

[0062] Wherein, Φ=πM(x-offset), y represents the operating frequency, x represents the operating voltage, α represents the anharmonicity of the sub-bit to be measured, and f qmax , M, and offset are all parameters of the physical model.

[0063] Those skilled in the art will appreciate that the physical model proposed in this embodiment is a preferred example, and may be in other forms in other embodiments, which will not be described in detail here.

[0064] Specifically, in this embodiment, the goodness of fit can be used to determine the fitting effect of the data point set;

[0065] Alternatively, the fitting effect of the set of data points is determined using a correction coefficient of determination;

[0066] Alternatively, the mean square error is used to determine the fitting effect of the data point set;

[0067] Alternatively, the root mean square error is used to determine the fitting effect of the data point set;

[0068] Alternatively, the sum of squared errors is used to determine the fitting effect of the data point set;

[0069] Alternatively, the mean absolute error is used to determine the fitting effect of the data point set;

[0070] Alternatively, the mean absolute percentage error is used to determine the fitting effect of the data point set.

[0071] Based on the same invention concept, please refer to Figure 3 The embodiment of the present invention further provides a device for processing measurement and control experiment results, comprising:

[0072] An initial operating data point acquisition unit 100 is configured to acquire a preset number of initial operating data points from an operating data point set, wherein the operating data point set is acquired by using extreme points from experimental results of multiple sets of energy spectrum experiments, each set of experimental results of the energy spectrum experiments having at least one extreme point, and the operating data point set includes a plurality of operating data points consisting of operating voltages corresponding to different energy spectrum experimental results and operating frequencies corresponding to the extreme points;

[0073] a data point set acquisition unit 200 configured to traverse the working data point set from each initial data point as a starting point toward both sides of the initial data point to obtain a preset number of data point sets, wherein the data points in the data point sets are target extreme value points corresponding to each working voltage with the minimum distance from the initial data point;

[0074] The modulation spectrum acquisition unit 300 is used to determine the modulation spectrum of the quantum bit to be measured based on the result with the best fitting effect in all the data point sets, and the modulation spectrum is used to obtain the corresponding relationship between the operating voltage and the operating frequency of the quantum bit.

[0075] It is understood that the initial working data point acquisition unit 100, the data point set acquisition unit 200, and the modulation spectrum acquisition unit 300 can be combined into one device for implementation, or any one of the modules can be split into multiple sub-modules, or at least part of the functions of one or more of the initial working data point acquisition unit 100, the data point set acquisition unit 200, and the modulation spectrum acquisition unit 300 can be combined with at least part of the functions of other modules and implemented in one functional module. According to an embodiment of the present invention, at least one of the initial working data point acquisition unit 100, the data point set acquisition unit 200, and the modulation spectrum acquisition unit 300 can be at least partially implemented as a hardware circuit, such as a field programmable gate array (FPGA), a programmable logic array (PLA), a system on a chip, a system on a substrate, a system on a package, an application-specific integrated circuit (ASIC), or can be implemented in hardware or firmware in any other reasonable way of integrating or packaging circuits, or in an appropriate combination of software, hardware, and firmware. Alternatively, at least one of the initial working data point acquisition unit 100, the data point set acquisition unit 200 and the modulation spectrum acquisition unit 300 can be at least partially implemented as a computer program module, and when the program is run by a computer, the function of the corresponding module can be executed.

[0076] Based on the same inventive concept, an embodiment of the present invention also proposes a quantum computing measurement and control system, which utilizes the method for processing the measurement and control experiment results described in any one of the above-mentioned feature descriptions, or includes a processing device for the measurement and control experiment result data described in the above-mentioned feature descriptions.

[0077] Based on the same inventive concept, an embodiment of the present invention further proposes a quantum computer, including the quantum computing measurement and control system described in the above feature description.

[0078] Based on the same inventive concept, an embodiment of the present invention further proposes a readable storage medium having a computer program stored thereon. When the computer program is executed by a processor, it can implement the method for processing measurement and control experiment results described in any one of the above-mentioned feature descriptions.

[0079] The readable storage medium can be a tangible device that can keep and store the instruction used by the instruction execution device, such as, but not limited to, an electrical storage device, a magnetic storage device, an optical storage device, an electromagnetic storage device, a semiconductor storage device or any suitable combination thereof. The more specific example (non-exhaustive list) of readable storage medium includes: a portable computer disk, a hard disk, a random access memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), a static random access memory (SRAM), a portable compact disc read-only memory (CD-ROM), a digital versatile disk (DVD), a memory stick, a floppy disk, a mechanical encoding device, such as a punch card or a convex structure in a groove having instructions stored thereon, and any suitable combination thereof. The computer program described herein can be downloaded to each computing / processing device from the readable storage medium, or downloaded to an external computer or external storage device by a network, such as the Internet, a local area network, a wide area network and / or a wireless network. The network can include copper transmission cables, optical fiber transmission, wireless transmission, routers, firewalls, switches, gateway computers and / or edge servers. The network adapter card or network interface in each computing / processing device receives the computer program from the network and forwards the computer program for storage in a readable storage medium in each computing / processing device. The computer program for performing the operations of the present invention can be assembly instructions, instruction set architecture (ISA) instructions, machine instructions, machine-dependent instructions, microcode, firmware instructions, state setting data, or source code or object code written in any combination of one or more programming languages, including object-oriented programming languages ​​such as Smalltalk, C++, etc., and conventional procedural programming languages ​​such as "C" or similar programming languages. The computer program can be executed entirely on the user's computer, partially on the user's computer, as a separate software package, partially on the user's computer and partially on a remote computer, or entirely on a remote computer or server. In the case of a remote computer, the remote computer can be connected to the user's computer through any type of network, including a local area network (LAN) or a wide area network (WAN), or can be connected to an external computer (for example, through the Internet using an Internet service provider). In some embodiments, various aspects of the present invention are implemented by utilizing state information of a computer program to personalize an electronic circuit, such as a programmable logic circuit, a field programmable gate array (FPGA), or a programmable logic array (PLA), which can execute computer-readable program instructions.

[0080] Various aspects of the present invention are described herein with reference to the flowcharts and / or block diagrams of the methods, systems, and computer program products according to embodiments of the present invention. It should be understood that each block of the flowcharts and / or block diagrams, as well as the combination of blocks in the flowcharts and / or block diagrams, can be implemented by computer programs. These computer programs can be provided to a processor of a general-purpose computer, a special-purpose computer, or other programmable data processing device, thereby producing a machine such that when these programs are executed by the processor of the computer or other programmable data processing device, a device is generated that implements the functions / actions specified in one or more blocks in the flowcharts and / or block diagrams. These computer programs can also be stored in a readable storage medium, which causes the computer, programmable data processing device, and / or other device to operate in a specific manner, so that the readable storage medium storing the computer program comprises an article of manufacture comprising instructions for implementing various aspects of the functions / actions specified in one or more blocks in the flowcharts and / or block diagrams.

[0081] The computer program may also be loaded onto a computer, other programmable data processing apparatus, or other device so that a series of operational steps are performed on the computer, other programmable data processing apparatus, or other device to produce a computer-implemented process, thereby causing the computer program executed on the computer, other programmable data processing apparatus, or other device to implement the functions / actions specified in one or more blocks in the flowchart and / or block diagram.

[0082] Throughout this specification, reference to terms such as "one embodiment," "some embodiments," "example," or "specific example" means that the specific features, structures, materials, or characteristics described in conjunction with that embodiment or example are included in at least one embodiment or example of the present invention. In this specification, the schematic representations of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in one or more embodiments. Furthermore, those skilled in the art may combine and reconcile different embodiments or examples described in this specification.

[0083] The above description is merely a preferred embodiment of the present invention and does not limit the present invention in any way. Any person skilled in the art who, without departing from the scope of the present invention, makes any equivalent substitution, modification, or other changes to the technical solution and technical content disclosed in the present invention shall be deemed to be within the scope of the present invention and still fall within the scope of protection of the present invention.

Claims

1. A method for processing measurement and control experiment results, characterized in that: include: Obtaining a preset number of initial operating data points from an operating data point set, wherein the operating data point set is obtained by using extreme points in experimental results of multiple sets of energy spectrum experiments, each set of experimental results of the energy spectrum experiments having at least one extreme point, and the operating data point set includes a plurality of operating data points consisting of operating voltages corresponding to different energy spectrum experimental results and operating frequencies corresponding to the extreme points; Traversing the working data point set from each initial data point as a starting point to both sides of the initial data point to obtain the preset number of data point sets, wherein the data points in the data point set are target extreme value points corresponding to each working voltage with the minimum distance from the initial data point; The modulation spectrum of the quantum bit to be measured is determined according to the result with the best fitting effect in all the data point sets, and the modulation spectrum is used to obtain the corresponding relationship between the operating voltage and the operating frequency of the quantum bit.

2. The method according to claim 1, wherein Before obtaining a preset number of initial working data points from the working data point set, the method further includes: Performing image processing on a result graph containing experimental results of several groups of energy spectrum experiments to output a first grayscale image; A plurality of working data points are obtained according to the first grayscale image, and a set consisting of the obtained plurality of working data points is used as the working data point set.

3. The method according to claim 1, wherein Before obtaining a preset number of initial working data points from the working data point set, the method further includes: Corresponding working data points are obtained according to the experimental results of each group of energy spectrum experiments, and a set consisting of several of the obtained working data points is used as the working data point set.

4. The method according to claim 1, wherein Before determining the modulation spectrum of the subbit to be measured according to the result with the best fitting effect in all the data point sets, the method further includes: The data point set is fitted using a physical model, where the physical model is a parameter-containing model for reflecting an expected result of the modulation spectrum of the sub-bit to be measured.

5. The method according to claim 4, wherein The physical model is: Wherein, Φ=πM(x-offset), y represents the operating frequency, x represents the operating voltage, α represents the anharmonicity of the sub-bit to be measured, and f qmax , M, and offset are all parameters of the physical model.

6. The method according to claim 1, wherein Using goodness of fit to determine the fitting effect of the data point set; Alternatively, the fitting effect of the set of data points is determined using a correction coefficient of determination; Alternatively, the mean square error is used to determine the fitting effect of the data point set; Alternatively, the root mean square error is used to determine the fitting effect of the data point set; Alternatively, the sum of squared errors is used to determine the fitting effect of the data point set; Alternatively, the mean absolute error is used to determine the fitting effect of the data point set; Alternatively, the mean absolute percentage error is used to determine the fitting effect of the data point set.

7. A device for processing measurement and control experimental results, characterized in that: include: an initial operating data point acquisition unit, configured to acquire a preset number of initial operating data points from a set of operating data points, wherein the set of operating data points is acquired by using extreme points from experimental results of multiple sets of energy spectrum experiments, each set of experimental results of the energy spectrum experiments having at least one extreme point, and the set of operating data points comprising a plurality of operating data points consisting of operating voltages corresponding to different energy spectrum experimental results and operating frequencies corresponding to the extreme points; a data point set acquisition unit, configured to traverse the working data point set from each initial data point as a starting point to both sides of the initial data point to obtain the preset number of data point sets, wherein the data points in the data point set are target extreme value points corresponding to each working voltage with the minimum distance from the initial data point; A modulation spectrum acquisition unit is used to determine the modulation spectrum of the quantum bit to be measured based on the result with the best fitting effect in all the data point sets, and the modulation spectrum is used to obtain the corresponding relationship between the operating voltage and the operating frequency of the quantum bit.

8. A quantum computing measurement and control system, characterized in that: A method for processing measurement and control experiment results according to any one of claims 1 to 6, or a device for processing measurement and control experiment result data according to claim 7.

9. A quantum computer, characterized in that Including the quantum computing measurement and control system as described in claim 8.

10. A readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, it can implement the method for processing the measurement and control experiment results according to any one of claims 1 to 6.

Images