System-level hirf radiation and conduction susceptibility synthesis test device and method

Abstract

The application relates to the technical field of electromagnetic test, and discloses a system-level HIRF radiation and conduction sensitivity comprehensive test device and method.The device comprises an electric wave darkroom and a test equipment, the electric wave darkroom is located beside a control room, a transmitting antenna and an optical fiber line are arranged in the electric wave darkroom; the transmitting antenna is used for radiating signals, the optical fiber line connects the inside of the electric wave darkroom and the control room, the control room is located in an external independent area, a signal generator, a power amplifier, a directional coupler, a power meter, a measurement receiver, an optical-electricity converter and a comprehensive test control system are arranged in the control room.The application realizes high-precision sensitivity evaluation of an airplane system in a real HIRF coupling scene by constructing a comprehensive test environment with synchronous radiation and conduction, combining with accurate calibration of test levels based on normalized transfer functions of full-machine test data, and adopting a standardized probe layout and an anti-interference measurement link.

Description

Technical Field

[0001] The present invention relates to the field of electromagnetic testing, and more particularly to a system-level HIRF radiation and conduction sensitivity comprehensive test device and method. Background Art

[0002] High-intensity radiated field (HIRF) refers to the electromagnetic environment generated by radiation from various emission sources. It has the characteristics of long action time, wide bandwidth, and strong interference field. It may cause serious harm to aircraft electronic and electrical equipment and systems, affecting its flight safety. It is a mandatory requirement for the airworthiness of civil aircraft.

[0003] Aircraft HIRF testing mainly includes two test methods: high-level testing and low-level equivalent testing. Due to the greater risks of high-level testing, low-level equivalent testing is currently widely used in aircraft HIRF airworthiness testing at home and abroad. Aircraft-level HIRF low-level coupling testing is mainly divided into the following two categories:

[0004] 1) Below 400MHz, HIRF energy mainly interferes with airborne equipment through conductive coupling of interconnecting cables, and the low-level sweep current (LLSC) test method is used;

[0005] 2) In the 100MHz-18GHz range, HIRF energy primarily interferes with airborne equipment through radiation from cabin coupling fields. Low-level swept field (LLSF) testing is employed. The full-aircraft LLSC test irradiates the entire aircraft in a low-level HIRF environment, measures the induced currents in the aircraft's internal cables, and obtains a normalized transfer function. This is then linearly extrapolated to obtain the HIRF test level for airborne system equipment under a realistic external HIRF environment, providing a basis for system-level HIRF conducted susceptibility testing and assessment. Similarly, the full-aircraft LLSF test obtains the aircraft cabin's normalized attenuation function through local irradiation, which, through linear extrapolation, provides a basis for system-level HIRF radiated susceptibility testing and assessment.

[0006] Currently, system-level HIRF susceptibility testing is primarily divided into conducted HIRF susceptibility testing and radiated HIRF susceptibility testing. The airworthiness certification assessment of airborne equipment / systems for conducted and radiated HIRF susceptibility is conducted independently. Conducted HIRF susceptibility testing is conducted via direct coupled injection (DCI) into the interconnecting cables of airborne equipment / systems, with a test frequency range below 400 MHz. Radiated HIRF susceptibility testing is conducted via direct irradiation of airborne equipment / systems in an anechoic chamber / reverberation chamber, with a test frequency range above 100 MHz. In reality, in the 100 MHz-400 MHz frequency range, HIRF environments present both conducted and radiated interference to airborne equipment / systems, with each type of interference predominating. Therefore, simply conducting separate HIRF conducted and radiated susceptibility tests in the 100 MHz-400 MHz frequency range will result in discrepancies between the actual HIRF coupling interference effects and the combined interference effects of HIRF conducted and radiated coupling on airborne equipment / systems. This poses a potential risk to aircraft flight safety in HIRF environments.

[0007] To comprehensively explore the HIRF sensitivity of airborne equipment / systems, especially in the 100MHz-400MHz overlapping frequency band for HIRF conduction and HIRF radiation sensitivity tests, a system-level HIRF radiation and conduction comprehensive effect test device was constructed based on the anechoic chamber test environment. A system-level HIRF radiation and conduction comprehensive sensitivity test method was proposed. This will provide a test device and test method for the accurate evaluation of HIRF conduction and radiation sensitivity of airborne equipment / systems, and address potential safety hazards in the aircraft HIRF environment. Summary of the Invention

[0008] The present invention provides a system-level HIRF radiation and conduction sensitivity comprehensive test device and method, which solves the technical problems in related technologies of simply conducting independent test evaluations of HIRF conduction and radiation sensitivity in the 100MHz-400MHz frequency band, which lead to errors in the actual HIRF coupling interference effect, and the unknown comprehensive interference effect of HIRF conduction and radiation coupling on airborne equipment / systems, resulting in potential safety hazards to aircraft flight in HIRF environments.

[0009] The present invention provides a system-level HIRF radiation and conduction sensitivity comprehensive test device, including an anechoic chamber and a test device;

[0010] The anechoic chamber is located next to the control room and is used to simulate an interference-free test space. Transmitting antennas and optical fiber lines are installed inside the chamber. The transmitting antennas are used to radiate signals, and the optical fiber lines connect the interior of the anechoic chamber and the control room for data transmission.

[0011] The control room is located in an independent external area and is equipped with signal generators, power amplifiers, directional couplers, power meters, measuring receivers, photoelectric converters, and a comprehensive test control system.

[0012] The interior of the anechoic chamber also contains the test equipment, current monitoring probe, field strength probe, current injection probe, interconnecting cables, load and photoelectric converter;

[0013] The device under test is the object under test and is placed in the center of the darkroom. The current monitoring probe is installed on the interconnection cable of the device under test. The field strength probe is located near the device under test to measure the radiated field strength. The current injection probe is coupled to the interconnection cable for signal injection. The interconnection cable is connected to the cable of the device under test. The load serves as the electrical load of the device under test.

[0014] The comprehensive test control system is connected to the control interface of the signal generator. The RF output of the signal generator is connected to the input of the directional coupler through a power amplifier. The output of the directional coupler is connected to the transmitting antenna. The power meter is connected to the monitoring end of the directional coupler. The field strength probe and the measurement receiver are connected using a photoelectric converter.

[0015] Furthermore, the comprehensive test control system is connected to the control interface of the signal generator, the RF output end of the signal generator is connected to the input end of the directional coupler through the power amplifier, the output end of the directional coupler is connected to the input end of the current injection probe, the test cable is arranged in the current injection probe, the test signal is coupled into the cable through the current injection probe, the current monitoring probe is also arranged on the cable under test, and the current monitoring probe and the measuring receiver are connected using a photoelectric converter.

[0016] Furthermore, the cable current monitoring probe is 5 cm away from the device under test, and the current injection probe and the cable current monitoring probe are 5 cm apart.

[0017] Furthermore, the distance between the transmitting antenna and the device under test is typically 1 meter.

[0018] Furthermore, the photoelectric converter is used to bridge the anechoic chamber and the control room, converting the optical fiber signal into an electrical signal for analysis by the measurement receiver.

[0019] Furthermore, the directional coupler and power meter are used to monitor the power stability of the injected / radiated signal in real time. The load serves as the terminal of the device under test to simulate the actual working conditions and together with the interconnecting cables forms a conduction test loop.

[0020] The present invention also proposes a system-level HIRF radiation and conduction sensitivity comprehensive test method, comprising the following steps:

[0021] S1: Build the test platform according to the requirements of the test layout;

[0022] S2: Determine the test frequency band, test frequency points, and level parameters, and prepare for calibration before the test;

[0023] S3: Conduct calibration before system-level HIRF conducted susceptibility testing and HIRF radiated susceptibility testing. Firstly, calibrate the HIRF radiation field strength in different polarizations and radiation directions using the transmitting antenna and field strength probe in a darkroom to obtain calibration data for the HIRF radiated susceptibility test. Secondly, calibrate the current injection probe to obtain calibration data for the HIRF conducted susceptibility test.

[0024] S4: Select the working mode of the device under test;

[0025] S5: Select the cable bundle to be tested;

[0026] S6: In the 100MHz-400MHz frequency band, set the initial test frequency and conduct the HIRF radiation sensitivity test. During the dwell time at each frequency point of the HIRF radiation sensitivity test, simultaneously conduct the HIRF conducted sensitivity test on the target cable bundle.

[0027] S7: Change the frequency of the HIRF radiation sensitivity test and repeat S6 until the end frequency of the test;

[0028] S8: Change the polarization of the transmitting antenna and repeat S6 and S7 to complete the HIRF radiation sensitivity test and HIRF conducted sensitivity test under horizontal and vertical polarization conditions;

[0029] S9: Replace the new test cable bundle and repeat S5-S8 to complete the test of all cable bundles;

[0030] S10: Change the radiation direction of the transmitting antenna and repeat S5-S9 to complete the HIRF radiation sensitivity test and HIRF conducted sensitivity test under all specified radiation directions;

[0031] S11: Select a new operating mode for the device under test and repeat S4-S10 to complete the HIRF radiation sensitivity test and HIRF conducted sensitivity test in all operating modes;

[0032] S12: Observe the test phenomena and record the data of the HIRF radiation sensitivity test and HIRF conducted sensitivity test of the equipment under test, and complete the test and verification of the HIRF radiation sensitivity test, HIRF conducted sensitivity test and the HIRF protection performance of the aircraft's electronic and electrical systems.

[0033] Furthermore, the operating modes of the device under test include normal flight mode, landing mode, navigation mode, and communication mode.

[0034] Furthermore, the criteria for selecting the cable bundle to be tested include bundle identification, bundle location, bundle characteristics, and injection point.

[0035] Furthermore, the irradiation direction of the transmitting antenna includes 0°, ±30°, ±60° in the front, 90° to the side and 180° to the rear.

[0036] The beneficial effects of the present invention are:

[0037] The present invention constructs a comprehensive test environment in which radiation and conduction are simultaneously applied, combines the normalized transfer function based on the full-aircraft test data to accurately calibrate the test level, and adopts a standardized probe layout and anti-interference measurement link. This achieves high-precision sensitivity assessment of aircraft systems in real HIRF coupling scenarios, effectively quantifies the combined interference effects of radiation fields and conduction currents on airborne equipment, and significantly improves the correlation between test results and the actual flight electromagnetic environment, thereby eliminating potential safety hazards caused by independent tests. BRIEF DESCRIPTION OF THE DRAWINGS

[0038] Figure 1 It is a structural schematic diagram of the system-level HIRF radiation and conduction sensitivity comprehensive test device of the present invention;

[0039] Figure 2 It is a flow chart of the system-level HIRF radiation and conduction sensitivity comprehensive test method of the present invention. DETAILED DESCRIPTION

[0040] The subject matter described herein will now be discussed with reference to exemplary embodiments. It should be understood that these embodiments are discussed solely to enable those skilled in the art to better understand and implement the subject matter described herein, and that the functions and arrangements of the elements discussed may be varied without departing from the scope of this specification. Various examples may omit, substitute, or add various processes or components as needed. In addition, features described with respect to some examples may also be combined in other examples.

[0041] like Figure 1 As shown, the system-level HIRF radiation and conducted sensitivity comprehensive test equipment includes an anechoic chamber, equipment under test (EUT), current monitoring probe, current injection probe, field strength probe, signal generator, power amplifier, directional coupler, power meter, measuring receiver, photoelectric converter and comprehensive test control system;

[0042] The control room is located in an independent external area and contains the following components: signal generator, power amplifier, directional coupler, power meter, measuring receiver, photoelectric converter, and integrated test control system;

[0043] Components within the control room are used for signal generation, amplification, monitoring, and system control, ensuring the safety and isolation of the test environment.

[0044] The anechoic chamber is located next to the control room and is a shielded environment used to simulate an interference-free test space. Transmitting antennas and optical fiber lines are located inside the anechoic chamber.

[0045] The transmitting antenna is used to radiate signals, and the optical fiber line connects the interior of the anechoic chamber and the control room for data transmission.

[0046] The anechoic chamber also has an "equipment area" including: equipment under test (EUT), current monitoring probes, field strength probes, current injection probes, interconnecting cables, loads and photoelectric converters;

[0047] The equipment under test (EUT) is the object to be tested and is placed in the center of the darkroom.

[0048] The current monitoring probe is installed on the interconnecting cable of the EUT.

[0049] The field strength probe is located near the EUT to measure the radiated field strength.

[0050] A current injection probe is coupled to the interconnect cable for signal injection.

[0051] Interconnect cables are cables that connect the EUT.

[0052] The load acts as the electrical load for the EUT.

[0053] The comprehensive test control system is connected to the control interface of the signal generator. The RF output of the signal generator is connected to the input of the directional coupler through a power amplifier. The output of the directional coupler is connected to the transmitting antenna. The distance between the transmitting antenna and the EUT is typically 1m. The power meter is connected to the monitoring end of the directional coupler. The field strength probe and the measurement receiver are connected using a photoelectric converter.

[0054] The comprehensive test control system is connected to the control interface of the signal generator. The RF output of the signal generator is connected to the input of the directional coupler through a power amplifier. The output of the directional coupler is connected to the input of the current injection probe. The test cable is arranged in the current injection probe. The test signal is coupled into the cable through the current injection probe. The current monitoring probe is also arranged on the cable under test. The current monitoring probe and the measurement receiver are connected by a photoelectric converter. The cable current monitoring probe is 5 cm away from the EUT, and the current injection probe and the cable current monitoring probe are 5 cm apart.

[0055] The "Integrated Test Control System" is used for unified control, achieving synchronous testing, directing the signal generator to output test signals, synchronously managing the radiation and conduction test processes, and receiving and analyzing feedback data from the measurement receiver:

[0056] 1. HIRF radiation sensitivity test link

[0057] Signal flow: The signal generator generates a radiation test signal, which is amplified by a power amplifier. The amplified information is split by a directional coupler. At the same time, the power meter monitors the signal power in real time and transmits the signal to the transmitting antenna. The transmitting antenna irradiates the EUT and cables.

[0058] Monitoring closed loop: The field strength probe measures the radiation field intensity, and the measurement data is transmitted to the photoelectric converter via optical fiber, and converted into an electrical signal by the photoelectric converter. The electrical signal is recorded and analyzed by the measurement receiver and finally fed back to the control system.

[0059] 2.HIRF conducted sensitivity test link

[0060] Signal flow: The signal generator generates the conducted test signal, which is amplified by the power amplifier. The amplified signal is split by the directional coupler. At the same time, the power meter monitors the power and transmits the signal to the current injection probe, which is coupled to the EUT interconnect cable.

[0061] Monitoring closed loop: The current monitoring probe captures the cable current in real time. The captured data is transmitted to the photoelectric converter via optical fiber. After conversion by the photoelectric converter, it is processed by the measurement receiver and the processing results are fed back to the control system for reception and analysis.

[0062] 3. Comprehensive test synchronization mechanism

[0063] Parallel execution: The transmitting antenna radiates multi-directional / polarized radiation to the EUT while the current injection probe injects conducted interference into the designated cable;

[0064] Data integration: Data from the field intensity probe and current monitoring probe are transmitted back to the measurement receiver in the control room via optical fiber. The control system then compares and analyzes the superposition effect of radiation and conduction.

[0065] It should be noted that the optoelectronic converter is used to bridge the anechoic chamber and the control room, converting the optical fiber signal into an electrical signal for analysis by the measurement receiver to ensure anti-interference transmission; the directional coupler and power meter are used to monitor the power stability of the injected / radiated signal in real time to ensure test accuracy; the load serves as the terminal of the EUT to simulate the actual working conditions and together with the interconnecting cables constitutes a conduction test loop.

[0066] The present invention also provides a system-level HIRF radiation and conduction sensitivity comprehensive test method, the test steps include:

[0067] In the anechoic chamber, the test layout is carried out according to the requirements of HIRF radiation sensitivity test, HIRF conduction sensitivity test and comprehensive test, and the system-level HIRF radiation and conduction sensitivity comprehensive test is carried out through the comprehensive test control system;

[0068] Determine the test frequency band, test level, number of test frequencies, dwell time (scan rate), signal modulation pattern and other parameters for conducting HIRF comprehensive sensitivity tests;

[0069] On the one hand, HIRF radiation field intensity calibration in different polarizations and radiation directions is performed in the darkroom using the transmitting antenna and field intensity probe to obtain radiation sensitivity calibration data. On the other hand, current injection probe calibration is also required to obtain current injection probe calibration data for HIRF conducted sensitivity testing.

[0070] When conducting a combined HIRF radiated sensitivity test and conducted sensitivity test, the HIRF radiated sensitivity test link irradiates the EUT and its interconnecting cables through the transmitting antenna, while the HIRF conducted sensitivity test link conducts injection into the test cable through the current injection probe;

[0071] In addition, during the test, the EUT and its interconnecting cables need to be irradiated in different directions and with different polarizations (vertical or horizontal), and different test cables need to be injected with conduction separately;

[0072] Observe test phenomena and record data of HIRF radiation sensitivity test and HIRF conducted sensitivity test of the equipment under test (EUT), and complete the comprehensive test of HIRF radiation sensitivity and conducted sensitivity;

[0073] Comprehensive test relationship: In the test steps, the HIRF radiated susceptibility test and the HIRF conducted susceptibility test are carried out simultaneously. The transmitting antenna irradiates the EUT, while the current injection probe injects signals into different cables to achieve "comprehensive testing". The control system coordinates the output parameters of the signal generator (such as frequency band, level, modulation mode) to ensure synchronization.

[0074] All measurement data (radiation field intensity, injection current) are transmitted back to the control room via optical fiber lines. After being processed by photoelectric converters, they are recorded and analyzed by the measurement receiver and control system. The photoelectric converters isolate interference and ensure accurate signal transmission.

[0075] In a preferred embodiment, the required level of the HIRF conduction sensitivity test is determined as follows:

[0076] The normalized transfer function of the interconnection cable or power cable is obtained from the full-machine LLSC test:

[0077] ;

[0078] Where k is the normalized transfer function, in m / Ω; I1 is the induced current in the tested cable, in A; and E1 is the radiation field strength of the full-machine LLSC test, in V / m.

[0079] According to the actual external HIRF environment requirements, the level value of the HIRF conducted sensitivity test is obtained by linear extrapolation of the normalized transfer function:

[0080] ;

[0081] Where I2 represents the test level value to be applied, in A; E0 represents the required field strength value in the external environment, in V / m.

[0082] In a preferred embodiment, the method for determining the required level of the HIRF radiation sensitivity test is as follows:

[0083] The normalized attenuation function of the cabin is obtained from the full-aircraft LLSF test:

[0084] ;

[0085] Where S represents the normalized transfer function, E2 represents the field strength value in the tested compartment, in V / m, and E1 represents the radiated field strength value of the whole aircraft LLSF test, in V / m.

[0086] The shielding effectiveness is derived from the attenuation function:

[0087] ;

[0088] Where SE represents the shielding effectiveness of the SUT enclosure in dB, and E represents the required test level in V / m.

[0089] According to the actual external HIRF environment requirements, the level value of the HIRF radiation sensitivity test is obtained through shielding effectiveness:

[0090] ;

[0091] Wherein, E0 represents the external environment requirement value, and the unit is V / m.

[0092] In a preferred embodiment, a photoelectric conversion is added to the measurement link to solve the interference problem. The current injection probe and the field strength probe are connected to the photoelectric converter and the output is sent to the measurement receiver.

[0093] In a preferred embodiment, the cable current monitoring probe is 5 cm away from the EUT, the current injection probe and the cable current monitoring probe are 5 cm apart, and the distance between the transmitting antenna and the EUT is typically 1 m.

[0094] The following is combined with Figure 1 , introduces the specific implementation process of the present invention in detail and further elaborates on it.

[0095] Test layout requirements: Based on the test site of the anechoic chamber, the test equipment (EUT), current monitoring probe, current injection probe, field strength probe, signal generator, power amplifier, directional coupler, power meter, measuring receiver, photoelectric converter, integrated test control system and other required test equipment are arranged in the following order: Figure 1 Arrange as shown.

[0096] In addition, photoelectric conversion is added to the measurement link to solve the interference problem. The cable current monitoring probe is 5 cm away from the EUT, the current injection probe and the cable current monitoring probe are 5 cm apart, and the distance between the transmitting antenna and the EUT is typically 1 m.

[0097] Based on the above test process requirements: combined with the attached Figure 2 , the specific test steps are as follows:

[0098] S1: Build the test platform according to the requirements of the test layout diagram;

[0099] S2: Determine the test frequency band, test frequency points, level and other parameters for the test, and make calibration preparations before the test;

[0100] S3: Conduct calibration before system-level HIRF conducted susceptibility testing and HIRF radiated susceptibility testing. Firstly, calibrate the HIRF radiation field strength in different polarizations and radiation directions using the transmitting antenna and field strength probe in a darkroom to obtain calibration data for the HIRF radiated susceptibility test. Secondly, calibrate the current injection probe to obtain calibration data for the HIRF conducted susceptibility test.

[0101] Radiated field strength calibration:

[0102] Position: Accurately describe the location (such as typical location on the EUT surface, key locations in the cockpit and equipment rack) and height of the field strength probe. Multiple points are usually required.

[0103] Direction: Clearly define the radiation direction (e.g. facing the most sensitive surface of the EUT).

[0104] Polarization: Horizontal and vertical polarization are calibrated separately.

[0105] Frequency: Covers the entire test frequency band (100MHz-400MHz), using the same frequency step and dwell time as the formal test.

[0106] Level: Calibrate to the target field strength level.

[0107] Process: Record the power or voltage (or receiver reading) required at the input (amplifier input) for each frequency point, each position, and each polarization, and calculate / record the output power of the amplifier.

[0108] Current injection probe calibration:

[0109] Fixture: Use a standard calibration fixture (such as a 50Ω coaxial cable or a fixture with a specific impedance).

[0110] Frequency: Covers the entire test frequency band (100MHz-400MHz).

[0111] Level: Calibrated to target injection current level.

[0112] Procedure: Record the relationship between the power or voltage required at the input (amplifier input) (or receiver reading) and the current injected into the fixture (measured by the current probe and receiver) at each frequency point.

[0113] S4: Select the working mode of the equipment under test (EUT);

[0114] Mode definition: Clearly define and record the specific content of each working mode (such as normal flight mode, landing mode, navigation mode, communication mode, etc.). Each mode should represent a typical and critical operating state.

[0115] S5: Select the cable bundle to be tested;

[0116] Bundle Identification: Clearly identify the cable bundle to be tested (e.g., navigation equipment power bundle 1, radar signal bundle A, primary flight control bundle X). Use unique numbers or labels.

[0117] Bundle location: Record the connector location (source and load ends) of the cable bundle on the EUT.

[0118] Bundle Characteristics: Record basic information about the cable bundle (length, type, shielding, wire gauge, number of conductors included, and function) if known.

[0119] Injection point: Specifies the exact location (distance from the connector) where the current injection probe is clamped on the cable bundle.

[0120] S6: In the 100MHz-400MHz frequency band, set the initial test frequency and conduct the HIRF radiation sensitivity test. During the dwell time at each frequency point of the HIRF radiation sensitivity test, simultaneously conduct the HIRF conducted sensitivity test on the target cable bundle.

[0121] Frequency setting: Accurately set the starting frequency of the signal source (such as 100.0MHz).

[0122] Radiation field setting: Based on the S3 radiation calibration data, set the amplifier input power (or signal source output level) to achieve the target radiation field strength. Record the actual setting value.

[0123] Conduction Injection Setup: Based on the S3 current injection calibration data, set the amplifier input power (or signal source output level) for the conduction test to achieve the target injection current. Record the actual setting.

[0124] Synchronous triggering: Ensure that the radiated and conducted signal sources are triggered synchronously, ensuring that interference is applied simultaneously at the same frequency and dwell time. Record the synchronization method (e.g., sharing a common trigger signal).

[0125] S7: Change the frequency of the HIRF radiation sensitivity test and repeat S6 until the end frequency of the test;

[0126] S8: Change the polarization of the transmitting antenna and repeat S6 and S7 to complete the HIRF radiation sensitivity test and HIRF conducted sensitivity test under horizontal and vertical polarization conditions;

[0127] Polarization Change: Precisely rotate the antenna to horizontal polarization (usually with the antenna element horizontal) or vertical polarization (usually with the antenna element vertical). Use a goniometer to confirm. Record the polarization state.

[0128] Calibration data: Confirm to use the radiation field strength calibration data under the corresponding polarization (calibrated separately in S3).

[0129] Repeat the process: Strictly follow the procedures of S6 and S7 to perform scanning and monitoring records.

[0130] S9: Replace the new test cable bundle and repeat S5-S8 to complete the test of all cable bundles;

[0131] S10: Change the radiation direction of the transmitting antenna and repeat S5-S9 to complete the HIRF radiation sensitivity test and HIRF conducted sensitivity test under all specified radiation directions;

[0132] Direction definition: clearly defined radiation direction (e.g., 0° (front), ±30°, ±60°, 90° (side), 180° (back)). Use angle definition or clockwise direction definition.

[0133] Direction change: Adjust the antenna position and direction by rotating the turntable or manually, and record the actual angle value.

[0134] S11: Select a new operating mode for the equipment under test (EUT) and repeat S4-S10 to complete the HIRF radiated sensitivity test and HIRF conducted sensitivity test in all operating modes;

[0135] S12: Observe test phenomena and record data of the equipment under test (EUT) HIRF radiation sensitivity test and HIRF conducted sensitivity test, and complete the test verification of HIRF radiation sensitivity test, HIRF conducted sensitivity test and HIRF protection performance of aircraft electronic and electrical systems.

[0136] Data aggregation and organization: organize the raw data recorded in all steps (frequency, field strength, current, EUT status, phenomenon description).

[0137] Classified and summarized by mode, direction, cable bundle, polarization, and frequency point.

[0138] Phenomenon analysis: Analyze all recorded EUT abnormal phenomena in detail to confirm whether they constitute a failure (based on pre-defined failure criteria) and record the specific conditions at the time of failure (mode, direction, beam, polarization, frequency, field strength / current value).

[0139] The above describes the embodiments of the present invention, but the present invention is not limited to the above specific implementation methods. The above specific implementation methods are merely illustrative and not restrictive. Ordinary technicians in this field can also make many forms under the guidance of the present invention, all of which are protected by the present invention.

Claims

1. System-level HIRF radiation and conduction sensitivity comprehensive test device, characterized by: Including anechoic chamber and test equipment; The anechoic chamber is located next to the control room and is used to simulate an interference-free test space. Transmitting antennas and optical fiber lines are installed inside the chamber. The transmitting antennas are used to radiate signals, and the optical fiber lines connect the interior of the anechoic chamber and the control room for data transmission. The control room is located in an independent external area and is equipped with signal generators, power amplifiers, directional couplers, power meters, measuring receivers, photoelectric converters, and a comprehensive test control system. The interior of the anechoic chamber also contains the test equipment, current monitoring probe, field strength probe, current injection probe, interconnecting cables, load and photoelectric converter; The device under test is the object under test and is placed in the center of the darkroom. The current monitoring probe is installed on the interconnection cable of the device under test. The field strength probe is located near the device under test to measure the radiated field strength. The current injection probe is coupled to the interconnection cable for signal injection. The interconnection cable is connected to the cable of the device under test. The load serves as the electrical load of the device under test. The comprehensive test control system is connected to the control interface of the signal generator. The RF output of the signal generator is connected to the input of the directional coupler through a power amplifier. The output of the directional coupler is connected to the transmitting antenna. The power meter is connected to the monitoring end of the directional coupler. The field strength probe and the measurement receiver are connected using a photoelectric converter.

2. The system-level HIRF radiation and conduction sensitivity comprehensive test device according to claim 1, characterized in that: The comprehensive test control system is connected to the control interface of the signal generator. The RF output of the signal generator is connected to the input of the directional coupler through a power amplifier. The output of the directional coupler is connected to the input of the current injection probe. The test cable is arranged in the current injection probe. The test signal is coupled into the cable through the current injection probe. The current monitoring probe is also arranged on the cable under test. The current monitoring probe and the measuring receiver are connected using a photoelectric converter.

3. The system-level HIRF radiation and conduction sensitivity comprehensive test device according to claim 2, characterized in that: The cable current monitoring probe is 5 cm away from the device under test, and the current injection probe and the cable current monitoring probe are 5 cm apart.

4. The system-level HIRF radiation and conduction sensitivity comprehensive test device according to claim 3, characterized in that: The distance between the transmitting antenna and the device under test is typically 1m.

5. The system-level HIRF radiation and conduction sensitivity comprehensive test device according to claim 4, characterized in that: The photoelectric converter is used to bridge the anechoic chamber and the control room, converting the optical fiber signal into an electrical signal for analysis by the measurement receiver.

6. The system-level HIRF radiation and conduction sensitivity comprehensive test device according to claim 5, characterized in that: The directional coupler and power meter are used to monitor the power stability of the injected / radiated signal in real time. The load acts as the terminal of the device under test to simulate actual working conditions and together with the interconnecting cables forms a conduction test loop.

7. A system-level HIRF radiation and conduction sensitivity comprehensive test method, wherein the test is performed using the system-level HIRF radiation and conduction sensitivity comprehensive test device as described in any one of claims 1 to 6, characterized in that: The following steps are involved: S1: Build the test platform according to the requirements of the test layout; S2: Determine the test frequency band, test frequency points, and level parameters, and prepare for calibration before the test; S3: Conduct system-level HIRF conducted susceptibility tests and calibration prior to HIRF radiated susceptibility tests. In a darkroom, calibrate the HIRF radiation field strength in different polarizations and radiation directions using the transmitting antenna and field strength probe to obtain HIRF radiated susceptibility test calibration data. Also, perform current injection probe calibration to obtain current injection probe calibration data for the HIRF conducted susceptibility test. S4: Select the working mode of the device under test; S5: Select the cable bundle to be tested; S6: In the 100MHz-400MHz frequency band, set the initial test frequency and conduct the HIRF radiation sensitivity test. During the dwell time at each frequency point of the HIRF radiation sensitivity test, simultaneously conduct the HIRF conducted sensitivity test on the target cable bundle. S7: Change the frequency of the HIRF radiation sensitivity test and repeat S6 until the end frequency of the test; S8: Change the polarization of the transmitting antenna and repeat S6 and S7 to complete the HIRF radiation sensitivity test and HIRF conducted sensitivity test under horizontal and vertical polarization conditions; S9: Replace the new test cable bundle and repeat S5-S8 to complete the test of all cable bundles; S10: Change the radiation direction of the transmitting antenna and repeat S5-S9 to complete the HIRF radiation sensitivity test and HIRF conducted sensitivity test under all specified radiation directions; S11: Select a new operating mode for the device under test and repeat S4-S10 to complete the HIRF radiation sensitivity test and HIRF conducted sensitivity test in all operating modes; S12: Observe the test phenomena and record the data of the HIRF radiation sensitivity test and HIRF conducted sensitivity test of the equipment under test, and complete the test and verification of the HIRF radiation sensitivity test, HIRF conducted sensitivity test and the HIRF protection performance of the aircraft's electronic and electrical systems.

8. The system-level HIRF radiation and conduction sensitivity comprehensive test method according to claim 7, characterized in that: The operating modes of the equipment under test include normal flight mode, landing mode, navigation mode, and communication mode.

9. The system-level HIRF radiation and conduction sensitivity comprehensive test method according to claim 7, characterized in that: The criteria for selecting the cable bundle to be tested include bundle identification, bundle location, bundle characteristics, and injection point.

10. The system-level HIRF radiation and conduction sensitivity comprehensive test method according to claim 7, characterized in that: The radiation directions of the transmitting antenna include 0°, ±30°, ±60° in front, 90° to the side and 180° to the rear.

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