Sesame baking oven operation control system based on operation data acquisition

Through particle size testing and image processing technology of sesame baking ovens, combined with data cleaning and autonomous control, precise control of particle size during sesame baking is achieved, solving the problem of temperature and time mismatch in existing technologies and improving baking efficiency and uniformity.

CN120669779APending Publication Date: 2025-09-19WULI FENGXIANGYUAN SESAME FOOD
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Patent Information

Application Number
CN202510649033.7
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2025-05-20
Publication Date
2025-09-19

AI Technical Summary

Technical Problem

The existing technology is unable to subdivide the particle size of sesame seeds into different levels and assign the most suitable baking temperature to each level, resulting in a mismatch between temperature and time due to differences in sesame particle size during the baking process.

Method used

The sesame baking oven is tested through the initial baking test module and the re-baking test module. Combined with the data cleaning module and the autonomous control module, the gear subdivision of sesame particle size and precise control of temperature are achieved. Image processing technology is used to determine the termination time of re-baking, and automatic control is performed according to the efficiency priority or effect priority mode.

Benefits of technology

It achieves precise control of sesame particle size during the roasting process, improves roasting efficiency and uniformity, meets the optimal roasting requirements of sesame seeds of different particle sizes, and ensures that the roasting effect meets user needs.

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Abstract

The invention belongs to the field of sesame processing, relates to a data analysis technology, and in particular relates to a sesame baking oven operation control system based on operation data acquisition, which is used for solving the problems that in the prior art, gear subdivision cannot be carried out on the particle size of sesame and the corresponding most suitable baking temperature cannot be allocated to each gear. Comprising a primary baking test module, a re-baking test module, a data cleaning module, an autonomous control module and a control execution module. The primary baking test module is used for performing primary baking test treatment on the sesame baking furnace; sending the initial baking duration of all the test components to a data cleaning module; the sesame baking oven can be subjected to primary baking test treatment, sesame samples with the same weight can be subjected to primary baking test, the primary baking time is recorded, and the optimal re-baking temperature is set for the sesame samples on the premise of not increasing additional procedures by utilizing the difference of water vapor evaporation efficiency of sesame with different particle sizes during primary baking; and the re-baking efficiency and the baking uniformity are ensured.
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Description

Technical Field

[0001] The invention belongs to the field of sesame processing and relates to data analysis technology, in particular to a sesame roasting furnace operation control system based on operation data collection. Background Art

[0002] Sesame roasting oven is a special equipment used for roasting sesame and other nuts. It has a variety of models, including electric heating, coal heating and natural gas heating. It has the characteristics of simple operation, easy use, uniform roasting and no pollution. The invention patent with publication number CN112835299A discloses an intelligent baking control system based on deep learning. This control system solves the problem in the prior art that after baking, the surface of the food is cooked but the inside is not. However, during the sesame baking process, there are certain differences in the baking temperature and time suitable for sesame seeds of different particle sizes. For example, thick slices with a particle size greater than 0.3 cm are generally slowly baked at 120°C for 30 minutes to keep the inside crispy; while thin slices with a particle size less than 0.3 cm can be increased to 130-150°C to improve baking efficiency. However, in the actual baking process, the particle size measurement process of sesame seeds before baking is relatively cumbersome, and it is impossible to subdivide the particle size of sesame seeds into gears and assign the corresponding most suitable baking temperature to each gear. Therefore, the existing technology is difficult to control and optimize according to the sesame size parameters.

[0003] In response to the above technical problems, this application proposes a solution. Summary of the Invention

[0004] The purpose of the present invention is to provide a sesame roasting oven operation control system based on operation data collection, which is used to solve the problem that the existing technology cannot subdivide the particle size of sesame seeds into gears and assign the most suitable roasting temperature to each gear; The technical problem to be solved by the present invention is: how to provide a sesame baking oven operation control system based on operation data collection that can subdivide the particle size of sesame into gears and assign the corresponding most suitable baking temperature to each gear.

[0005] The purpose of the present invention can be achieved through the following technical solutions: A sesame roasting oven operation control system based on operation data collection, including a primary roasting test module, a secondary roasting test module, a data cleaning module, an autonomous control module and a control execution module; The initial roasting test module is used to perform an initial roasting test on the sesame roasting oven: the sesame sample to be tested is screened into several test components, and the weight of the sesame samples in each test component is equal; the initial roasting test is performed on the sesame samples in each test component in turn and the initial roasting time is recorded; the initial roasting time of all test components is sent to the data cleaning module; The re-roasting test module is used to perform a re-roasting test on the sesame baking oven: randomly select a temperature value from the re-roasting temperature range as the re-roasting temperature value of the test component, set the heating temperature of the sesame baking oven to the re-roasting temperature value, and determine the termination of the re-roasting test process every L1 seconds. When the re-roasting test process is terminated, the re-roasting test data is obtained and sent to the data cleaning module; The data cleaning module is used to perform data cleaning processing on the initial roasting test process and the re-roasting test process of the sesame roasting oven; The autonomous control module is used to autonomously control the sesame baking oven: the manager autonomously selects the re-baking control mode to control the sesame baking oven, and the re-baking control mode includes an efficiency priority mode and an effect priority mode; The control execution module automatically controls the sesame baking oven according to the re-baking control mode.

[0006] Furthermore, the process of obtaining the initial roasting time includes: setting the heating temperature of the sesame roasting oven to K1, pouring the cleaned sesame sample of the test component into the sesame roasting oven, and obtaining the water vapor content above the sesame sample in real time through the dew point meter. When the water vapor content is lower than the initial roasting threshold, the initial roasting time of the test component is recorded.

[0007] Furthermore, the specific process of determining the termination of the re-roasting test process includes: capturing an image of the sesame sample on the baking tray and marking the captured image as an analysis image, enlarging the analysis image into a pixel grid image and performing grayscale conversion, segmenting the sesame outline in the analysis image by a binary method to obtain a number of sample areas, marking the sample areas as state transition areas or state continuity areas; marking the ratio of the number of state transition areas to the number of sample areas as a state transition coefficient, and determining whether the re-roasting test process is terminated by the state transition coefficient.

[0008] Furthermore, the specific process of marking the sample area as a state transition area or a state continuity area includes: obtaining the re-baked grayscale threshold through the database, and comparing the grayscale value of the pixel grid in the sample area with the re-baked grayscale threshold: if the grayscale value is less than or equal to the re-baked grayscale threshold, the corresponding pixel grid is marked as a completed grid; if the grayscale value is greater than the re-baked grayscale threshold, the corresponding pixel grid is marked as a progress grid; the ratio of the number of completed grids to the total number of pixel grids in the sample area is marked as the completion coefficient of the sample area, obtaining the completion threshold through the database, and comparing the completion coefficient with the completion threshold: if the completion coefficient is less than the completion threshold, the corresponding sample area is marked as a state continuity area; if the completion coefficient is greater than or equal to the completion threshold, the corresponding sample area is marked as a state transition area.

[0009] Furthermore, the specific process of determining whether the re-baking test process is terminated through the state transition coefficient includes: obtaining the state transition threshold through the database, and comparing the state transition coefficient with the state transition threshold: if the state transition coefficient is greater than or equal to the state transition threshold, then the re-baking test process of the test component is terminated; if the state transition coefficient is less than the state transition threshold, then the re-baking test process of the test component is continued until the state transition coefficient is not less than the state transition threshold.

[0010] Furthermore, the re-baking test data includes the execution time and re-baking uniformity of the re-baking test process. The process of obtaining the re-baking uniformity includes: when the re-baking test process terminates, calculating the grayscale values ​​of all pixels in the sample area and marking them as the color display values ​​of the sample area, and performing variance calculation on the color display values ​​of all sample areas to obtain the re-baking uniformity.

[0011] Furthermore, the specific process of the data cleaning module performing data cleaning processing on the initial roasting test process and the re-roasting test process of the sesame roasting oven includes: the initial roasting time of all test components constitutes the initial roasting range, the initial roasting range is divided into several initial roasting intervals, and the test components whose initial roasting time is within the initial roasting interval are marked as matching components of the initial roasting interval, and the duration threshold and uniformity threshold are obtained through the database, and the execution time and re-roasting uniformity of the matching component are compared with the duration threshold and uniformity threshold respectively: if the execution time is less than the duration threshold and the re-roasting uniformity is less than the uniform threshold, the matching component is retained; otherwise, the matching component is deleted.

[0012] Furthermore, the autonomous control module is used to autonomously control the sesame baking oven: the sesame seeds to be baked are screened into several execution components, the weight of each execution component is equal to the weight of the test component, the heating temperature of the sesame baking oven is set to K1, the cleaned sesame seeds of the execution components are poured into the sesame baking oven for initial baking and the initial baking time of the execution components is recorded.

[0013] Furthermore, the specific process of controlling the sesame baking oven using the efficiency priority mode includes: marking the re-baking temperature value of the matching component with the shortest execution time in the initial baking interval corresponding to the initial baking time during the re-baking process as the efficiency priority value, and setting the re-baking temperature of the execution component of the sesame baking oven to the efficiency priority value.

[0014] Furthermore, the effect priority mode is adopted for the sesame baking oven; the specific process of controlling the sesame baking oven using the effect priority mode includes: marking the re-baking temperature value with the smallest re-baking uniformity in the initial baking interval corresponding to the initial baking time as the effect priority value, and setting the re-baking temperature of the execution component of the sesame baking oven to the effect priority value.

[0015] The present invention has the following beneficial effects: 1. The initial roasting test module allows you to perform initial roasting tests on sesame roasters. Sesame samples of the same weight are tested, and the initial roasting time is recorded. By utilizing the differences in water vapor evaporation efficiency of sesame seeds of different particle sizes during initial roasting, the module converts the re-roasting temperature requirements based on the water vapor evaporation efficiency during initial roasting into a re-roasting temperature that matches the re-roasting temperature. Without adding additional steps, the module sets the optimal re-roasting temperature for the sesame sample, ensuring re-roasting efficiency and roasting uniformity. 2. The re-roasting test module can perform re-roasting tests on sesame roasters. Image processing technology is used to determine the re-roasting termination time, ensuring that most of the sesame seeds have completed the skin transition from white to slightly yellow by the end of re-roasting. The re-roasting test data is also recorded to provide data support for data cleaning and automatic control processes. 3. The data cleaning module can be used to clean the data of the initial roasting test process and the re-roasting test process of the sesame roasting oven, eliminate the data that does not meet the requirements in the re-roasting test process, and then mark the re-roasting control mode in an autonomously selected manner, so that the operation mode of the sesame roasting oven is more in line with the user's production needs; 4. The control execution module can automatically control the sesame baking oven according to the re-roasting control mode. Different control modes use different re-roasting temperature values ​​for baking control and produce different baking effects. The efficiency priority mode can increase the baking temperature to the highest while ensuring baking uniformity. The effect priority mode can increase the baking uniformity to the highest while ensuring baking efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the following briefly introduces the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0017] Figure 1 is a block diagram of the overall system of the present invention; Figure 2 This is a system block diagram of Embodiment 1 of the present invention; Figure 3 This is a system block diagram of Embodiment 2 of the present invention; Figure 4 This is a flow chart of the method of embodiment 3 of the present invention. DETAILED DESCRIPTION

[0018] The technical solutions of the present invention will be clearly and completely described below with reference to the embodiments. Obviously, the embodiments described are only some embodiments of the present invention, not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making any creative efforts shall fall within the scope of protection of the present invention.

[0019] like Figure 1 As shown, a sesame baking oven operation control system based on operation data collection includes a test subsystem, a control subsystem and a database, the test subsystem includes an initial baking test module, a re-baking test module and a data cleaning module, and the control subsystem includes an autonomous control module and a control execution module.

[0020] Example 1: Figure 2 As shown, the initial baking test module and the repeated baking test module are both connected to the data cleaning module for communication.

[0021] The initial baking test module is used to perform initial baking test processing on the sesame baking oven: the sesame samples to be tested are screened into several test components, and the weight of the sesame samples of each test component is equal; the initial baking test is performed on the sesame samples of each test component in turn, the heating temperature of the sesame baking oven is set to K1, and the sesame samples of the cleaned test components are poured into the sesame baking oven, and the water vapor content above the sesame samples is obtained in real time through the dew point meter. When the water vapor content is lower than the initial baking threshold, the initial baking time of the test component is recorded; the initial baking time of all test components is sent to the data cleaning module; the initial baking test processing is performed on the sesame baking oven, and the initial baking test is performed on sesame samples of the same weight, and the initial baking time is recorded. The difference in water vapor evaporation efficiency of sesame seeds of different particle sizes during initial baking is used to convert the particle size requirement for re-baking temperature into a re-baking temperature matching the water vapor evaporation efficiency during initial baking. Without adding additional processes, the optimal re-baking temperature is set for the sesame sample, thereby ensuring the efficiency of re-baking and baking uniformity.

[0022] The re-roasting test module is used to perform re-roasting test processing on a sesame baking oven: randomly select a temperature value from the re-roasting temperature range as the re-roasting temperature value of the test component, set the heating temperature of the sesame baking oven to the re-roasting temperature value, take an image of the sesame sample on the baking tray every L1 seconds and mark the captured image as an analysis image, enlarge the analysis image into a pixel grid image and perform grayscale transformation, segment the sesame outline in the analysis image by a binary method to obtain several sample areas, obtain the re-roasting grayscale threshold through the database, compare the pixel grid grayscale value in the sample area with the re-roasting grayscale threshold: if the grayscale value is less than or equal to the re-roasting grayscale threshold, the corresponding pixel grid is marked as a completed grid; if the grayscale value is greater than the re-roasting grayscale threshold, the corresponding pixel grid is marked as a progress grid; the ratio of the number of completed grids to the total number of pixel grids in the sample area is marked as the completion coefficient of the sample area, obtain the completion threshold through the database, and compare the completion coefficient with the completion threshold: if the completion coefficient is less than the completion threshold, the corresponding sample area is marked as a state continuous area; if the completion coefficient is greater than or equal to the completion threshold, the corresponding sample area is marked as a state transition area; the ratio of the number of state transition areas to the number of sample areas is marked as a state transition coefficient, the state transition threshold is obtained through the database, and the state transition coefficient is compared with the state transition threshold: if the state transition coefficient is greater than or equal to the state transition threshold, the re-roasting test process of the test component is terminated, and the re-roasting test data of the test component is recorded and sent to the data cleaning module; if the state transition coefficient is less than the state transition threshold, the re-roasting test process of the test component is continued until the state transition coefficient is not less than the state transition threshold; the re-roasting test data includes the execution time and re-roasting uniformity of the re-roasting test process, and the process of obtaining the re-roasting uniformity includes: when the re-roasting test process is terminated, the grayscale value of all pixels in the sample area is calculated and marked as the color display value of the sample area, and the variance of the color display value of all sample areas is calculated to obtain the re-roasting uniformity; the sesame baking oven is subjected to re-roasting test processing, and the image processing technology is used to determine the termination time of re-roasting, so that most of the sesame seeds have completed the state transition from white to slightly yellow on the skin when re-roasting is terminated, and the re-roasting test data is recorded at the same time to provide data support for the data cleaning process and the automatic control process.

[0023] The data cleaning module is used to perform data cleaning processing on the initial roasting test process and the re-roasting test process of the sesame roasting furnace: the initial roasting range is composed of the initial roasting time of all test components, and the initial roasting range is divided into several initial roasting intervals. The test components whose initial roasting time is within the initial roasting interval are marked as matching components of the initial roasting interval. The duration threshold and uniformity threshold are obtained through the database, and the execution duration and re-roasting uniformity of the matching components are compared with the duration threshold and uniformity threshold respectively: if the execution duration is less than the duration threshold and the re-roasting uniformity is less than the uniformity threshold, the matching component is retained; otherwise, the matching component is deleted; data cleaning processing is performed on the initial roasting test process and the re-roasting test process of the sesame roasting furnace, and the data that does not meet the requirements in the re-roasting test project is eliminated, and then the re-roasting control mode is marked in an autonomously selected manner, so that the operation mode of the sesame roasting furnace is more in line with the user's production needs.

[0024] Example 2: Figure 3 As shown, the autonomous control module is used to autonomously control the sesame baking oven: the sesame seeds to be baked are screened into several execution components, the weight of each execution component is equal to the weight of the test component, the heating temperature of the sesame baking oven is set to K1, the cleaned sesame seeds of the execution components are poured into the sesame baking oven for initial baking and the initial baking time of the execution components is recorded; the management personnel independently select the re-baking control mode to control the sesame baking oven, and the re-baking control mode includes efficiency priority mode and effect priority mode.

[0025] The control execution module automatically controls the sesame baking oven according to the re-roasting control mode: the specific process of controlling the sesame baking oven using the efficiency priority mode includes: marking the re-roasting temperature value of the matching component with the shortest execution time in the initial roasting interval corresponding to the initial roasting time during the re-roasting process as the efficiency priority value, and setting the re-roasting temperature of the execution component by the sesame baking oven to the efficiency priority value; the sesame baking oven is controlled using the effect priority mode; the specific process of controlling the sesame baking oven using the effect priority mode includes: marking the re-roasting temperature value with the smallest re-roasting uniformity in the initial roasting interval corresponding to the initial roasting time as the effect priority value, and setting the re-roasting temperature of the execution component by the sesame baking oven to the effect priority value; the sesame baking oven is automatically controlled according to the re-roasting control mode, different control modes use different re-roasting temperature values ​​for baking control, and produce different baking effects. The efficiency priority mode can increase the baking temperature to the highest while ensuring baking uniformity, and the effect priority mode can increase the baking uniformity to the highest while ensuring baking efficiency.

[0026] Example 3: Figure 4 As shown, a sesame roasting oven operation control method based on operation data collection includes the following steps: Step 1: Perform the initial roasting test on the sesame samples of each test component and record the initial roasting time; Step 2: Randomly select a temperature value from the redrying temperature range as the redrying temperature value of the test component, set the heating temperature of the sesame roasting oven to the redrying temperature value, and record the redrying test data when the redrying process ends; Step 3: The initial baking time of all test components constitutes an initial baking range, which is divided into several initial baking intervals. Test components with initial baking time within the initial baking interval are marked as matching components of the initial baking interval, and matching components that do not meet the baking requirements are eliminated; Step 4: The manager independently selects the re-roasting control mode to control the sesame roasting oven; Step 5: Use efficiency priority mode or effect priority mode to automatically control the sesame roasting oven.

[0027] A sesame baking oven operation control system based on operation data collection, when in operation, performs an initial baking test on the sesame sample of each test component in turn and records the initial baking time; randomly selects a temperature value from the redrying temperature range as the redrying temperature value of the test component, sets the heating temperature of the sesame baking oven to the redrying temperature value, and records the redrying test data when the redrying process ends; the initial baking time of all test components constitutes an initial baking range, the initial baking range is divided into several initial baking intervals, the test components with initial baking time within the initial baking interval are marked as matching components of the initial baking interval, and matching components that do not meet the baking requirements are eliminated; the management personnel independently select the redrying control mode to control the sesame baking oven; the sesame baking oven is automatically controlled using the efficiency priority mode or the effect priority mode.

[0028] The above content is merely an example and explanation of the structure of the present invention. Those skilled in the art may make various modifications or additions to the described specific embodiments or replace them in a similar manner. As long as they do not deviate from the structure of the invention or exceed the scope defined by the claims, they should all fall within the scope of protection of the present invention.

[0029] Throughout this specification, references to terms such as "one embodiment," "example," or "specific example" indicate that the specific features, structures, materials, or characteristics described in conjunction with that embodiment or example are included in at least one embodiment or example of the present invention. In this specification, schematic representations of these terms do not necessarily refer to the same embodiment or example. Furthermore, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples.

[0030] The preferred embodiments of the present invention disclosed above are intended only to help illustrate the present invention. These preferred embodiments do not exhaustively describe all details, nor do they limit the present invention to specific embodiments. Obviously, many modifications and variations are possible based on the contents of this specification. These embodiments are selected and described in detail in this specification to better explain the principles and practical applications of the present invention, thereby enabling those skilled in the art to better understand and utilize the present invention. The present invention is limited only by the claims and their full scope and equivalents.

Claims

1. A sesame roasting oven operation control system based on operation data collection, characterized in that: It includes initial baking test module, re-baking test module, data cleaning module, autonomous control module and control execution module; The initial roasting test module is used to perform an initial roasting test on the sesame roasting oven: the sesame sample to be tested is screened into several test components, and the weight of the sesame samples in each test component is equal; the initial roasting test is performed on the sesame samples in each test component in turn and the initial roasting time is recorded; the initial roasting time of all test components is sent to the data cleaning module; The re-roasting test module is used to perform a re-roasting test on the sesame baking oven: randomly select a temperature value from the re-roasting temperature range as the re-roasting temperature value of the test component, set the heating temperature of the sesame baking oven to the re-roasting temperature value, and determine the termination of the re-roasting test process every L1 seconds. When the re-roasting test process is terminated, the re-roasting test data is obtained and sent to the data cleaning module; The data cleaning module is used to perform data cleaning processing on the initial roasting test process and the re-roasting test process of the sesame roasting oven; The autonomous control module is used to autonomously control the sesame baking oven: the manager autonomously selects the re-baking control mode to control the sesame baking oven, and the re-baking control mode includes an efficiency priority mode and an effect priority mode; The control execution module automatically controls the sesame baking oven according to the re-baking control mode.

2. A sesame roasting oven operation control system based on operation data collection according to claim 1, characterized in that: The process of obtaining the initial roasting time includes: setting the heating temperature of the sesame roasting oven to K1, pouring the cleaned sesame sample of the test component into the sesame roasting oven, obtaining the water vapor content above the sesame sample in real time through the dew point meter, and recording the initial roasting time of the test component when the water vapor content is lower than the initial roasting threshold.

3. A sesame roasting oven operation control system based on operation data collection according to claim 2, characterized in that: The specific process of determining the termination of the re-roasting test process includes: photographing the sesame sample on the baking tray and marking the photographed image as an analysis image, enlarging the analysis image into a pixel grid image and performing grayscale conversion, segmenting the sesame outline in the analysis image by a binary method to obtain a number of sample areas, marking the sample areas as state transition areas or state continuity areas; marking the ratio of the number of state transition areas to the number of sample areas as a state transition coefficient, and determining whether the re-roasting test process is terminated by using the state transition coefficient.

4. A sesame roasting oven operation control system based on operation data collection according to claim 3, characterized in that: The specific process of marking a sample area as a state transition area or a state continuity area includes: obtaining the re-baked grayscale threshold through the database, and comparing the grayscale value of the pixel grid in the sample area with the re-baked grayscale threshold: if the grayscale value is less than or equal to the re-baked grayscale threshold, the corresponding pixel grid is marked as a completed grid; if the grayscale value is greater than the re-baked grayscale threshold, the corresponding pixel grid is marked as a progress grid; the ratio of the number of completed grids to the total number of pixel grids in the sample area is marked as the completion coefficient of the sample area, the completion threshold is obtained through the database, and the completion coefficient is compared with the completion threshold: if the completion coefficient is less than the completion threshold, the corresponding sample area is marked as a state continuity area; if the completion coefficient is greater than or equal to the completion threshold, the corresponding sample area is marked as a state transition area.

5. The sesame roasting oven operation control system based on operation data collection according to claim 4, characterized in that: The specific process of determining whether the re-baking test process is terminated by the state transition coefficient includes: obtaining the state transition threshold through the database, and comparing the state transition coefficient with the state transition threshold: if the state transition coefficient is greater than or equal to the state transition threshold, then the re-baking test process of the test component is terminated; if the state transition coefficient is less than the state transition threshold, then the re-baking test process of the test component is continued until the state transition coefficient is not less than the state transition threshold.

6. The sesame roasting oven operation control system based on operation data collection according to claim 5, characterized in that: The re-baking test data includes the execution time of the re-baking test process and the re-baking uniformity. The process of obtaining the re-baking uniformity includes: when the re-baking test process ends, calculating the grayscale values ​​of all pixels in the sample area and marking them as the color rendering values ​​of the sample area, and performing variance calculation on the color rendering values ​​of all sample areas to obtain the re-baking uniformity.

7. The sesame roasting oven operation control system based on operation data collection according to claim 6, characterized in that: The specific process of data cleaning module performing data cleaning processing on the initial roasting test process and the re-roasting test process of the sesame roasting oven includes: the initial roasting time of all test components constitutes the initial roasting range, the initial roasting range is divided into several initial roasting intervals, and the test components whose initial roasting time is within the initial roasting interval are marked as matching components of the initial roasting interval. The duration threshold and uniformity threshold are obtained through the database, and the execution duration and re-roasting uniformity of the matching component are compared with the duration threshold and uniformity threshold respectively: if the execution time is less than the duration threshold and the re-roasting uniformity is less than the uniform threshold, the matching component is retained; otherwise, the matching component is deleted.

8. The sesame roasting oven operation control system based on operation data collection according to claim 7, characterized in that: The autonomous control module is used to autonomously control the sesame baking oven: the sesame seeds to be baked are screened into several execution components, the weight of each execution component is equal to the weight of the test component, the heating temperature of the sesame baking oven is set to K1, the cleaned sesame seeds of the execution components are poured into the sesame baking oven for initial baking and the initial baking time of the execution components is recorded.

9. The sesame roasting oven operation control system based on operation data collection according to claim 8, characterized in that: The specific process of controlling the sesame baking oven using the efficiency priority mode includes: marking the re-baking temperature value of the matching component with the shortest execution time in the initial baking interval corresponding to the initial baking time during the re-baking process as the efficiency priority value, and setting the re-baking temperature of the execution component of the sesame baking oven to the efficiency priority value.

10. The sesame roasting oven operation control system based on operation data collection according to claim 8, characterized in that: The sesame baking furnace is controlled in effect priority mode; the specific process of controlling the sesame baking furnace in effect priority mode includes: marking the re-baking temperature value with the smallest re-baking uniformity in the initial baking interval corresponding to the initial baking time as the effect priority value, and setting the re-baking temperature of the execution component of the sesame baking furnace to the effect priority value.

Citation Information

Patent Citations

  • Intelligent baking control system based on deep learning

    CN112835299A