High-voltage interlocking fault positioning method and device, medium, equipment and product
By obtaining the failure probability and factor probability of similar vehicle models and using the Bayesian algorithm to calculate the predicted probability value of high-voltage interlock failure, the problem of untimely fault location in existing technologies is solved, rapid fault location and efficient troubleshooting are achieved, and maintenance and R&D efficiency is improved.
Patent Information
- Application Number
- CN202510794272.1
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-06-13
- Publication Date
- 2025-09-26
AI Technical Summary
In the prior art, the high-voltage interlock fault detection system is unable to store the message information when the fault occurs in real time, which makes it difficult for maintenance personnel to quickly locate the cause of the fault and the detection timeliness is poor.
By obtaining the failure probability and failure factor probability of similar vehicle models, and using statistical algorithms (such as the Bayesian algorithm) to calculate the predicted probability value of the failure cause, the cause of the high-voltage interlock failure can be located.
It improves the detection efficiency of high-voltage interlock fault location, helps maintenance personnel quickly locate problems, shortens troubleshooting time, and improves R&D and production efficiency.
Smart Images
Figure CN120697562A_ABST
Abstract
Description
Technical Field
[0001] The present application relates to the field of fault detection technology, and in particular to a method, device, medium, equipment and product for locating a high-voltage interlock fault. Background Art
[0002] High-voltage interlock is a safety feature in new energy vehicles. It mainly uses low-voltage signals to check the integrity and continuity of the entire high-voltage system circuit, identify abnormal disconnections in the circuit, and promptly disconnect the control electrical components at the high-voltage input end.
[0003] Currently, high-voltage interlock fault detection systems generally use hard-wired loop detection methods to detect the cause of high-voltage interlock faults. Specifically, the feedback signals of the connectors of each high-voltage component are connected in series using hard wires to form an interlock loop. When a high-voltage component interlock in the loop fails, the interlock monitoring device immediately reports the message information to the VCU (Vehicle Control Unit), which then executes the corresponding power-off strategy. However, if the vehicle fails to store the message when the fault occurs in real time, maintenance personnel will be unable to detect and locate the fault, resulting in poor timeliness.
[0004] Therefore, how to provide a technical solution for an efficient high-voltage interlock fault locating method has become a technical problem that needs to be solved urgently. Summary of the Invention
[0005] The purpose of some embodiments of the present application is to provide a method, device, medium, equipment and product for high-voltage interlock fault location. The technical solutions of the embodiments of the present application can improve the detection efficiency of high-voltage interlock fault location, help maintenance personnel quickly locate problems, and quickly check for loopholes.
[0006] In a first aspect, some embodiments of the present application provide a method for locating a high-voltage interlock fault, comprising: upon confirming that a high-voltage interlock fault occurs on a current vehicle model, obtaining a fault probability and a fault factor probability of a similar vehicle model corresponding to the current vehicle model generating the high-voltage interlock fault; wherein the fault factor probability represents a probability value of the existence of any fault cause under preset conditions; the fault causes include: vehicle heater failure, DC converter failure, motor control unit failure, battery management system failure, high-voltage wiring harness failure or low-voltage maintenance switch failure; using a statistical algorithm, calculating the fault probability and the fault factor probability to obtain various predicted probability values of various fault causes among the fault causes; based on the various predicted probability values, locating the fault cause of the high-voltage interlock fault caused by the current vehicle model.
[0007] Some embodiments of this application, when a high-voltage interlock fault occurs in a vehicle, obtain the failure probability and failure factor probability of similar vehicle models, then use statistical algorithms to calculate various predicted probability values for different fault causes. Finally, the cause of the fault is located from these various predicted probability values. Some embodiments of this application can improve the detection efficiency of high-voltage interlock fault location, helping maintenance personnel quickly locate problems, quickly identify vulnerabilities, and improve research and development efficiency.
[0008] In some embodiments, before confirming that a high-voltage interlock fault occurs in the current vehicle model, the method further includes: performing statistics and calculations on events that cause the high-voltage interlock fault in multiple vehicles of the same vehicle model to obtain the fault probability and the fault factor probability.
[0009] Some embodiments of the present application obtain the failure probability and failure factor probability by statistically analyzing and calculating the high-voltage interlock failure events of similar vehicles, thereby providing a basis for locating the high-voltage interlock failure of subsequent similar vehicles.
[0010] In some embodiments, the preset condition is: the high-voltage interlock fault exists or the high-voltage interlock fault does not exist.
[0011] In some embodiments, locating the cause of the high-voltage interlock fault caused by the current vehicle model based on the various predicted probability values includes: taking the cause of the fault corresponding to the maximum value among the various predicted probability values as the cause of the fault.
[0012] Some embodiments of the present application can improve the detection efficiency of high-voltage interlock fault location by locating the cause of the fault from the maximum value of various predicted probability values, helping maintenance personnel to quickly locate the problem.
[0013] On the second aspect, some embodiments of the present application provide a device for locating a high-voltage interlock fault, including: a probability acquisition module, for obtaining the fault probability and fault factor probability of a similar vehicle model corresponding to the current vehicle model generating the high-voltage interlock fault when confirming that the current vehicle model has a high-voltage interlock fault; wherein the fault factor probability represents the probability value of the existence of any fault cause under preset conditions; the fault causes include: vehicle heater failure, DC converter failure, motor control unit failure, battery management system failure, high-voltage wiring harness failure or low-voltage maintenance switch failure; a prediction module, for calculating the fault probability and the fault factor probability using a Bayesian algorithm, and obtaining various predicted probability values of various fault causes among the fault causes; a fault locating module, for locating the fault cause of the high-voltage interlock fault caused by the current vehicle model based on the various predicted probability values.
[0014] In some embodiments, before the probability acquisition module, the device further includes: a statistical module; the statistical module is used to: perform statistics and calculations on events that cause the high-voltage interlock fault in multiple vehicles of the same type to obtain the fault probability and the fault factor probability.
[0015] In some embodiments, the fault location module is configured to: use the fault cause corresponding to the maximum value among the various predicted probability values as the fault cause.
[0016] In a third aspect, some embodiments of the present application provide a computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, can implement the method described in any embodiment of the first aspect.
[0017] In a fourth aspect, some embodiments of the present application provide an electronic device comprising a memory, a processor, and a computer program stored on the memory and executable on the processor, wherein when the processor executes the program, the method described in any embodiment of the first aspect can be implemented.
[0018] In a fifth aspect, some embodiments of the present application provide a computer program product, comprising a computer program, wherein the computer program, when executed by a processor, can implement the method described in any embodiment of the first aspect. BRIEF DESCRIPTION OF THE DRAWINGS
[0019] In order to more clearly illustrate the technical solutions of some embodiments of the present application, the following is a brief introduction to the drawings required for use in some embodiments of the present application. It should be understood that the following drawings only show certain embodiments of the present application and therefore should not be regarded as limiting the scope. For ordinary technicians in this field, other relevant drawings can be obtained based on these drawings without paying any creative work.
[0020] Figure 1 A system diagram for high-voltage interlock fault location provided for some embodiments of the present application;
[0021] Figure 2 One of the flow charts of the method for locating a high-voltage interlock fault provided in some embodiments of the present application;
[0022] Figure 3 Interlock fault cause association diagram provided for some embodiments of the present application;
[0023] Figure 4 A second flow chart of a method for locating a high-voltage interlock fault provided in some embodiments of the present application;
[0024] Figure 5A block diagram of a device for locating a high-voltage interlock fault provided in some embodiments of the present application;
[0025] Figure 6 A schematic diagram of an electronic device is provided for some embodiments of the present application. DETAILED DESCRIPTION
[0026] The technical solutions in some embodiments of the present application will be described below in conjunction with the drawings in some embodiments of the present application.
[0027] It should be noted that similar reference numerals and letters represent similar items in the following drawings. Therefore, once an item is defined in one drawing, it does not need to be further defined or explained in subsequent drawings. At the same time, in the description of this application, the terms "first", "second", etc. are only used to distinguish the description and should not be understood as indicating or implying relative importance.
[0028] In the related art, the main causes of high-voltage interlock failures are as follows: failure of the high-voltage interlock switch, poor contact between the low-voltage wiring harness terminals and the wiring harness terminals in the high-voltage interlock circuit, power battery failure, PTC (Positive-Temperature-Coefficient, positive temperature coefficient of the vehicle heater) self-test failure, etc. At present, in vehicle research and development, the cause of high-voltage interlock failure is mainly obtained by collecting and analyzing the CAN message information recorded by the vehicle. If the vehicle fails to store the message information when the fault occurs in real time, or the message information collected when the fault occurs cannot reflect the interlock fault, the maintenance personnel will not be able to effectively locate the cause and location of the fault, and can only wait until the vehicle is in good condition before re-collecting the message for analysis. As a result, the vehicle research and development and production process are greatly hindered. Therefore, reasoning about the cause of the vehicle high-voltage interlock failure without relying on message information is a direction that needs to be considered in the vehicle research and development process.
[0029] In view of this, some embodiments of the present application provide a method for locating a high-voltage interlock fault. This method analyzes the occurrence of high-voltage interlock faults in similar vehicle models to determine the probability of failure and the probability of failure factors. It then uses a statistical algorithm to perform correlation analysis to determine the cause of the high-voltage interlock fault in the current vehicle model. Some embodiments of the present application can infer the cause of a vehicle high-voltage interlock fault without relying on message information, narrowing the scope of the fault cause and roughly locating the fault location, helping maintenance personnel quickly locate the problem, quickly troubleshoot vulnerabilities, and effectively ensure user driving safety.
[0030] The following is combined with Figure 1 The overall composition structure of the high-voltage interlock fault location system provided by some embodiments of the present application is exemplified.
[0031] like Figure 1 As shown, some embodiments of the present application provide a system diagram for high-voltage interlock fault location. The high-voltage interlock fault location system may include: a vehicle 100 and a high-voltage interlock fault location terminal 110. The high-voltage interlock fault location terminal 110 may be deployed inside the vehicle 100. When a high-voltage interlock fault occurs, the high-voltage interlock fault location terminal 110 locates the cause of the fault and can inform R&D personnel through information transmission, thereby assisting them in locating the fault point and improving R&D production efficiency.
[0032] The following is combined with Figure 2 The implementation process of high-voltage interlock fault locating performed by the high-voltage interlock fault locating terminal 110 provided in some embodiments of the present application is exemplarily described.
[0033] Please see the attached Figure 2 , Figure 2 A flow chart of a method for locating a high-voltage interlock fault is provided for some embodiments of the present application. The method for locating a high-voltage interlock fault may include:
[0034] S210: Upon confirming that a high-voltage interlock fault has occurred in the current vehicle model, obtaining a fault probability and a fault factor probability for a vehicle model of the same type as the current vehicle model that will cause the high-voltage interlock fault; wherein the fault factor probability represents the probability of any fault cause occurring under preset conditions; the fault causes include vehicle heater failure, DC converter failure, motor control unit failure, battery management system failure, high-voltage wiring harness failure, or low-voltage service switch failure. The preset conditions are: the presence or absence of the high-voltage interlock fault.
[0035] For example, in the specific example of this application, when the R&D personnel generate a new model of a car (as a specific example of the current model), when a high-voltage interlocking failure (referred to as interlocking failure) occurs in the new model, it is necessary to obtain the failure probability and failure factor probability of the interlocking failure of the previously produced model (as a specific example of the same model).
[0036] Based on analysis of the vehicle development process, events that can cause a high-voltage interlock failure include PTC failure, DCDC (Direct Current-Direct Current Converter) failure, MCU (Motor Control Unit) failure, BMS (Battery Management System) failure, high-voltage wiring harness failure, and low-voltage maintenance switch failure. This is not specifically limited in the present embodiment.
[0037] In some embodiments of the present application, before executing S210, the method for locating a high-voltage interlock fault may further include: performing statistics and calculations on events that cause the high-voltage interlock fault in multiple vehicles of the same type to obtain the fault probability and the fault factor probability.
[0038] For example, in the specific example of this application, the probability of interlock failures in past production models is summarized based on historical interlock failure cases. The event probability includes: failure probability and failure factor probability. Specifically, taking any model as an example, Figure 3 As shown, event F represents an interlock fault event, and events E1 through E6 represent the cause of the interlock fault. Arrows indicate the consequences of the fault caused by the cause. E1 represents a PTC fault, E2 represents a DC-DC fault, E3 represents an MCU fault, E4 represents a BMS fault, E5 represents a high-voltage wiring harness fault, and E6 represents a low-voltage maintenance switch fault. Each fault cause has a corresponding probability, which is determined by summarizing past cases.
[0039] For example, as a specific example, the probability of an interlock fault occurring in a previously produced vehicle model (as a specific example of a fault probability) is 10%, that is, P(F) = 10%. The following describes several scenarios where the probability of a fault factor exists: the probability of an interlock fault and a PTC fault being detected is P(E1|F) = 30%, the probability of a PTC fault being detected but not an interlock fault is The probability of detecting an interlock fault and a DCDC fault is P(E2|F)=10%, and the probability of detecting a DCDC fault but not an interlock fault is The probability of detecting an MCU fault when there is an interlock fault is P(E3|F)=10%, and the probability of detecting an MCU fault when there is no interlock fault is The probability of detecting a BMS fault when there is an interlock fault is P(E4|F)=10%, and the probability of detecting a BMS fault when there is no interlock fault is The probability of detecting a high-voltage wiring harness fault when there is an interlock fault is P(E5|F)=20%, and the probability of detecting a high-voltage wiring harness fault when there is no interlock fault is The probability of an interlock fault and a low-voltage maintenance switch fault is P(E6|F)=20%, and the probability of a non-interlock fault but a low-voltage maintenance switch fault is
[0040]
[0041] Among them, whether there is an interlocking fault is a preset condition in the probability of the fault factor.
[0042] S220 , calculating the fault probability and the fault factor probability using a statistical algorithm to obtain various predicted probability values of various fault causes among the fault causes.
[0043] For example, in the specific examples of this application, the statistical algorithm can be a Bayesian algorithm, or other probability solving algorithms similar to the Bayesian algorithm, which is not specifically limited in this embodiment of the application. By using the Bayesian algorithm to calculate P(F) and other fault factor probabilities, various predicted probability values under various fault causes are obtained. For example, Figure 3 As shown in , all factors E1 to E6 that cause high-voltage interlock faults are used as Bayesian network nodes, F is the central node, and a Bayesian network diagram is established.
[0044] To facilitate understanding, let's first introduce the Bayesian algorithm. The Bayesian algorithm includes conditional probabilities and marginal probabilities. Conditional probabilities (also called posterior probabilities) indicate the probability of event A occurring given that another event B has already occurred. Conditional probabilities are expressed as P(A|B), which translates to "the probability of A given B." Marginal probabilities (also called prior probabilities) are the probability of an event occurring. For example, the marginal probability of A is P(A), and the marginal probability of B is P(B).
[0045] Consider P(A|B), which is the probability of A occurring given B. First, before event B occurs, there is a basic probability judgment about the occurrence of event A, called the prior probability of A, denoted by P(A). Second, after event B occurs, the probability of event A is reassessed, called the posterior probability of A, denoted by P(A|B). Similarly, before event A occurs, there is a basic probability judgment about the occurrence of event B, called the prior probability of B, denoted by P(B). Similarly, after event A occurs, the probability of event B is reassessed, called the posterior probability of B, denoted by P(B|A).
[0046] Bayes' theorem is based on the following Bayesian formula:
[0047]
[0048] As a specific example of this application, the following Bayesian formula is used to calculate the known P(F) and other failure factor probabilities:
[0049]
[0050] The predicted probability values under E1~E6 are: P(F|E1)=0.1, P(F|E2)=0.027, P(F|E3)=0.022, P(F|E4)=0.022, P(F|E5)=0.18, P(F|E6)=0.1.
[0051] S230: Based on the various predicted probability values, locate the cause of the high-voltage interlock fault caused by the current vehicle model.
[0052] For example, in the specific example of the present application, the cause of the interlocking fault is located by calculating P(F|E1), P(F|E2), P(F|E3), P(F|E4), P(F|E5) and P(F|E6).
[0053] In some embodiments of the present application, S230 may include: taking the fault cause corresponding to the maximum value among the various predicted probability values as the fault cause.
[0054] For example, in the specific example of this application, the maximum value, P(F|E5), is selected from P(F|E1), P(F|E2), P(F|E3), P(F|E4), P(F|E5), and P(F|E6). This indicates that the most likely cause of the high-voltage interlock fault is a problem with the high-voltage wiring harness corresponding to E5. This high-voltage wiring harness fault can then be sent to maintenance personnel via a notification message. Maintenance personnel can then check the high-voltage wiring harness terminals for loose pins or damaged wiring harnesses. Without the need for CAN messages, on-site personnel can still be assisted in promptly identifying the cause of the fault, promoting efficient production processes. Alternatively, P(F|E1), P(F|E2), P(F|E3), P(F|E4), P(F|E5), and P(F|E6) can be sorted and sent to maintenance personnel, allowing them to quickly locate the cause of the fault based on the sorting. It should be understood that the method for locating the cause of the fault can be adjusted as the statistical algorithm changes, and the embodiments of this application are not limited to this.
[0055] The following is combined with Figure 4 The specific process of high-voltage interlock fault location provided by some embodiments of the present application is exemplified.
[0056] Please see the attached Figure 4 , Figure 4 A flow chart of a method for locating a high-voltage interlock fault is provided for some embodiments of the present application.
[0057] The above process is described below as an example.
[0058] S410: Statistics are collected on high-voltage interlock fault events of previously produced vehicle models to obtain the fault probability and the fault factor probability under different fault causes.
[0059] S420: Confirm that a high voltage interlock fault has occurred in the current vehicle model.
[0060] S430 , using a Bayesian algorithm, calculate the failure probability and the failure factor probability to obtain various predicted probability values of various failure causes.
[0061] S440: The fault cause corresponding to the maximum value among various predicted probability values is taken as the fault cause.
[0062] It can be understood that the specific implementation process of S410 to S440 can refer to the method embodiment provided above. To avoid repetition, detailed description is appropriately omitted here.
[0063] Through some of the above-mentioned embodiments of the present application, it can be seen that the present application can use Bayesian theorem to simply locate the cause of the fault with the help of past cases, narrow the scope of fault investigation, and assist staff in making inferences without relying on messages, thereby improving vehicle production and R&D efficiency.
[0064] Please refer to Figure 5 , Figure 5 A block diagram illustrating the components of a high-voltage interlock fault location apparatus provided in some embodiments of the present application is provided. It should be understood that the high-voltage interlock fault location apparatus corresponds to the aforementioned method embodiment and is capable of executing each of the steps involved in the aforementioned method embodiment. The specific functions of the high-voltage interlock fault location apparatus can be found in the description above, and a detailed description is omitted here to avoid repetition.
[0065] Figure 5 The high-voltage interlock fault locating device includes at least one software function module that can be stored in a memory in the form of software or firmware or solidified in the high-voltage interlock fault locating device, and the high-voltage interlock fault locating device includes: a probability acquisition module 510, which is used to obtain the fault probability and fault factor probability of the same type of vehicle corresponding to the current vehicle model causing the high-voltage interlock fault when confirming that the current vehicle model has a high-voltage interlock fault; wherein the fault factor probability represents the probability value of the existence of any fault cause under preset conditions; the fault causes include: vehicle heater fault, DC converter fault, motor control unit fault, battery management system fault, high-voltage wiring harness fault or low-voltage maintenance switch fault; a prediction module 520, which is used to use a Bayesian algorithm to calculate the fault probability and the fault factor probability to obtain various predicted probability values of various fault causes among the fault causes; a fault locating module 530, which is used to locate the fault cause of the high-voltage interlock fault caused by the current vehicle model based on the various predicted probability values.
[0066] In some embodiments of the present application, before the probability acquisition module, the device also includes: a statistical module; the statistical module is used to: count and calculate the events of the high-voltage interlock failure caused by multiple vehicles of the same type to obtain the fault probability and the fault factor probability.
[0067] In some embodiments of the present application, the fault location module is configured to: take the fault cause corresponding to the maximum value among the various predicted probability values as the fault cause.
[0068] Those skilled in the art will clearly understand that, for the convenience and brevity of description, the specific working process of the device described above can refer to the corresponding process in the aforementioned method, and will not be described in detail here.
[0069] Some embodiments of the present application further provide a computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, can implement the operations corresponding to any of the above methods provided in the above embodiments.
[0070] Some embodiments of the present application further provide a computer program product, which includes a computer program, wherein when the computer program is executed by a processor, it can implement the operations corresponding to any of the above methods provided in the above embodiments.
[0071] like Figure 6 As shown, some embodiments of the present application provide an electronic device 600, which includes: a memory 610, a processor 620, and a computer program stored in the memory 610 and executable on the processor 620, wherein the processor 620 can implement a method as described in any of the above embodiments when reading the program from the memory 610 through the bus 630 and executing the program.
[0072] Processor 620 can process digital signals and can include various computing architectures, such as a complex instruction set computer architecture, a reduced instruction set computer architecture, or an architecture that implements a combination of multiple instruction sets. In some examples, processor 620 can be a microprocessor.
[0073] The memory 610 can be used to store instructions executed by the processor 620 or data related to the execution of instructions. These instructions and / or data may include code for implementing some or all functions of one or more modules described in the embodiments of this application. The processor 620 of the embodiment of the present disclosure can be used to execute the instructions in the memory 610 to implement the method shown above. The memory 610 includes dynamic random access memory, static random access memory, flash memory, optical storage, or other memory known to those skilled in the art.
[0074] The foregoing is merely an embodiment of the present application and is not intended to limit the scope of protection of the present application. Various modifications and variations are possible for those skilled in the art. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the present application shall be included within the scope of protection of the present application. It should be noted that similar reference numerals and letters represent similar items in the following figures. Therefore, once an item is defined in one figure, it does not need to be further defined or explained in subsequent figures.
[0075] The above description is merely a specific embodiment of the present application, but the scope of protection of the present application is not limited thereto. Any changes or substitutions that can be easily conceived by a person skilled in the art within the technical scope disclosed in this application should be included in the scope of protection of this application. Therefore, the scope of protection of this application should be based on the scope of protection of the claims.
[0076] It should be noted that, in this document, relational terms such as first and second, etc., are used only to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply the existence of any such actual relationship or order between these entities or operations. Moreover, the terms "comprises," "comprising," or any other variants thereof are intended to cover non-exclusive inclusion, so that a process, method, article, or device comprising a series of elements includes not only those elements, but also other elements not explicitly listed, or elements inherent to such process, method, article, or device. In the absence of further limitations, an element defined by the phrase "comprising a ..." does not exclude the presence of other identical elements in the process, method, article, or device comprising the element.
Claims
1. A method for locating a high-voltage interlock fault, characterized in that: include: When a high-voltage interlock fault is confirmed for the current vehicle model, the fault probability and fault factor probability of the high-voltage interlock fault occurring in a vehicle model of the same type as the current vehicle model are obtained; wherein the fault factor probability represents the probability value of the presence of any fault cause under preset conditions; the fault causes include: vehicle heater failure, DC converter failure, motor control unit failure, battery management system failure, high-voltage wiring harness failure, or low-voltage service switch failure; Calculating the failure probability and the failure factor probability using a statistical algorithm to obtain various predicted probability values of various failure causes among the failure causes; Based on the various predicted probability values, a fault cause of the high-voltage interlock fault caused by the current vehicle model is located.
2. The method according to claim 1, wherein Before confirming that a high voltage interlock fault occurs in the current vehicle model, the method further includes: Statistics and calculations are performed on events that cause the high-voltage interlock fault in multiple vehicles of the same type to obtain the fault probability and the fault factor probability.
3. The method according to claim 1 or 2, wherein: The preset condition is: the high-voltage interlock fault exists or the high-voltage interlock fault does not exist.
4. The method according to claim 1 or 2, wherein: The locating the cause of the high-voltage interlock fault caused by the current vehicle model based on the various predicted probability values includes: The fault cause corresponding to the maximum value among the various predicted probability values is used as the fault cause.
5. A device for locating a high-voltage interlock fault, characterized in that: include: A probability acquisition module is configured to, upon confirming that a high-voltage interlock fault has occurred in a current vehicle model, acquire a fault probability and a fault factor probability for a vehicle model of the same type as the current vehicle model that will cause the high-voltage interlock fault; wherein the fault factor probability represents a probability value of the presence of any fault cause under preset conditions; and the fault causes include: vehicle heater failure, DC converter failure, motor control unit failure, battery management system failure, high-voltage wiring harness failure, or low-voltage service switch failure; A prediction module, configured to calculate the fault probability and the fault factor probability using a Bayesian algorithm to obtain various predicted probability values of various fault causes among the fault causes; The fault location module is used to locate the cause of the high-voltage interlock fault caused by the current vehicle model based on the various predicted probability values.
6. The device according to claim 5, characterized in that Before the probability acquisition module, the device further includes: a statistical module; the statistical module is used to: Statistics and calculations are performed on events that cause the high-voltage interlock fault in multiple vehicles of the same type to obtain the fault probability and the fault factor probability.
7. The device according to claim 5 or 6, characterized in that The fault location module is used for: The fault cause corresponding to the maximum value among the various predicted probability values is used as the fault cause.
8. A computer-readable storage medium, characterized in that The computer-readable storage medium stores a computer program, wherein the computer program is executed by a processor to perform the method according to any one of claims 1 to 4.
9. An electronic device, characterized in that: The method comprises a memory, a processor, and a computer program stored in the memory and running on the processor, wherein the computer program executes the method according to any one of claims 1 to 4 when run by the processor.
10. A computer program product, characterized in that The computer program product comprises a computer program, wherein the computer program is executed by a processor to perform the method according to any one of claims 1 to 4.