A device and method for determining changes in thickness of marine sediments

Abstract

The application discloses a marine sediment thickness change measuring device and method, which comprises a base, a substrate and a flexible panel arranged from bottom to top in sequence, the flexible panel comprises a plurality of measuring areas, the substrate is etched with interdigital electrodes at positions corresponding to each measuring area, and the measuring area is provided with a protrusion abutting on the positive and negative electrodes of the interdigital electrodes respectively, the other side of the base is provided with a pin group connected with the positive and negative electrodes of the interdigital electrodes respectively, and the inside of the base is provided with a plurality of resistance measuring devices connected with the pin groups to form a sediment thickness change measuring circuit. The application utilizes the characteristics that the weight of the sediment in a unit area increases with the increase of the thickness, and through the cooperation of the measuring area, the protrusion, the interdigital electrodes and the resistance measuring device, the weight measurement of the sediment is converted into resistance measurement, so that the thickness of the sediment can be calculated according to the specific resistance value to realize the real-time measurement of the sediment thickness, and the measurement efficiency is high.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of sediment thickness determination, in particular to a marine sediment thickness change determination device and method. BACKGROUND

[0002] Marine sediments refer to the general term of seabed sediments formed by various marine sedimentation. It is an important part of natural waters and one of the important monitoring objects of current ecological geochemistry and environmental investigation. Most of the organic carbon in the marine ecosystem is fixed and buried in sediments, and 50% to 90% of the total carbon in the system is stored in underground sediments and can be stored for a long time. The accumulation rate of marine sediments represents the strength of the "sink" in the carbon cycle, and the thickness change of marine sediments is an important indicator of carbon sink capacity. In addition to the direct effect in the carbon cycle, marine sediments also change the depth of the sea by reducing the roughness of the seabed, thereby affecting the temperature, chemical process and circulation of the ocean. Therefore, determining the thickness change of marine sediments can provide scientific basis for the application of marine sediment dynamics in seabed geomorphology evolution, maintenance and reconstruction of ecological system, assessment of human activity on the environment, marine resource development and sustainable development, etc.

[0003] At present, when determining the thickness change of marine sediments, basically, the marine sediment is sampled multiple times through the offshore drilling platform, the thickness of the sediment is determined after sampling, and the thickness change of the sediment is obtained by comparing the multiple determination results. The determination process is relatively troublesome, and the determination efficiency is relatively low. SUMMARY

[0004] The present application provides a marine sediment thickness change determination device and method to solve the above technical problems.

[0005] To achieve the above purpose, the technical scheme adopted by the present application is as follows:

[0006] A marine sediment thickness change determination device, comprising a base, a substrate and a flexible panel arranged in turn from bottom to top, the flexible panel comprising a plurality of determination zones, the substrate being etched with interdigital electrodes corresponding to the position of each determination zone, and the determination zone having a protrusion abutting on the positive and negative electrodes of the interdigital electrode respectively, the other side of the base having a pin group connected with the positive and negative electrodes of the interdigital electrode respectively, the inside of the base having a plurality of resistance measuring devices connected with the pin groups to form a sediment thickness change determination circuit, the signal output ends of the plurality of resistance measuring devices being connected with a processor to realize the determination of the marine sediment thickness change, and the processor being connected with an upper computer through a signal transmission module to feed back the determined marine sediment thickness change data to the user.

[0007] Specifically, the determination method of the marine sediment thickness change determination device comprises the following steps:

[0008] S1: Select the measurement area for sediment thickness variation measurement, and collect sediment samples from the measurement area to obtain a standard resistance-to-thickness ratio through the variation measurement circuit;

[0009] S2: After arranging the measuring device horizontally in the measuring area, return the reading of the resistance measuring device to zero after it stabilizes.

[0010] S3: During the measurement process, the processor acquires the measured values ​​of multiple resistance measuring devices in real time, and obtains the real-time average resistance value after data filtering;

[0011] S4: Input the real-time average resistance into the standard resistance-to-thickness ratio to obtain the real-time deposit thickness.

[0012] The steps for establishing the standard resistance-to-thickness ratio are as follows:

[0013] S1.1: Place the container in the measurement area, and return the measured value of the resistance measuring device to zero after it stabilizes. The container is cylindrical, with the bottom area equal to the area of ​​the measurement area and the surrounding area having a height value.

[0014] S1.2: Place the collected sediment in a container and simultaneously acquire the measured values ​​from the resistivity measuring device and the thickness value of the sediment in the container to establish a standard resistivity-to-thickness ratio.

[0015]

[0016] In the formula, The standard resistance-to-thickness ratio; The measured value is from the resistance measuring device; This represents the thickness of the sediment in the container.

[0017] Preferably, the data filtering method in S3 is as follows:

[0018] In real time, the measured values ​​of each resistance measuring device are compared. If the difference between the measured value of one resistance measuring device and the measured value of another resistance measuring device exceeds a threshold... Then exclude its data:

[0019]

[0020] In the formula: The average value measured by each resistance measuring device. , This refers to the number of resistance measuring devices; For the first i The measured values ​​of the resistance measuring device.

[0021] Preferably, in S3, the real-time average resistance is expressed by the following formula:

[0022]

[0023] In the formula, is the real-time resistance average value, is the measured value measured by the first resistance measuring device, is the number of effective measured values.

[0024] Preferably, the adjacent two measuring areas have an anti-disturbance gap, and the top of the adjacent sides of the adjacent two measuring areas is connected by a cover film, and the length of the cover film is greater than the length of the disturbance gap.

[0025] Preferably, the base is provided with lifting legs at the four corners of the bottom, and is further provided with a level and a controller for controlling the state of the lifting legs, and the level is connected to the controller, thereby improving the measurement accuracy.

[0026] Compared with the prior art, the present application has the following beneficial effects:

[0027] The present application utilizes the characteristics that the thickness of the sediment in a unit area increases the weight, and the weight also increases, and through the cooperation of the measuring area, the protrusion, the interdigital electrode and the resistance measuring device, the weight of the sediment is converted into resistance measurement, and the thickness of the sediment can be calculated according to the specific resistance value to realize real-time measurement of the thickness of the sediment, and the measurement efficiency is high. BRIEF DESCRIPTION OF DRAWINGS

[0028] Figure 1 is a schematic view of the cross-sectional structure of the whole application;

[0029] Figure 2 is an assembly schematic view of the sediment thickness change measurement circuit in the present application;

[0030] Figure 3 is an assembly schematic view of the adjacent two measuring areas in the present application;

[0031] Figure 4 is a signal transmission block diagram of the present application in the process of measuring the thickness change of the sediment;

[0032] Figure 5 is a control block diagram of the present application when the level is adjusted.

[0033] The drawings show that: 1, base, 2, base, 3, flexible panel, 31, measuring area, 4, interdigital electrode, 32, protrusion, 5, pin group, 6, resistance measuring device, 33, cover film, 7, lifting leg, 8, level. DETAILED DESCRIPTION

[0034] To make the objectives, technical solutions, and advantages of the present invention clearer, the present invention will be further described in detail below with reference to the embodiments and accompanying drawings. The illustrative embodiments and descriptions of the present invention are only used to explain the present invention and are not intended to limit the present invention.

[0035] like Figures 1-5 The apparatus shown is for measuring changes in the thickness of marine sediments. It includes a base 1, a substrate 2, and a flexible panel 3 arranged from bottom to top. The flexible panel 3 includes multiple measurement areas 31. Interdigitated electrodes 4 are etched on the substrate 2 corresponding to each measurement area 31. The measurement area 31 has protrusions 32 that abut against the positive and negative electrodes of the interdigitated electrodes 4, respectively. The other side of the base 1 has pin groups 5 that are connected to the positive and negative electrodes of the interdigitated electrodes 4, respectively. The interior of the base 1 has multiple resistance measuring devices 6 that are connected to the multiple pin groups 5 to form a sediment thickness change measurement circuit. The signal output terminals of the multiple resistance measuring devices 6 are all connected to a processor to realize the measurement of changes in the thickness of marine sediments. Specifically, taking advantage of the characteristic that the weight of sediment increases with the thickness per unit area, the measurement areas 31, protrusions 32, interdigitated electrodes 4, and resistance measuring devices 6 work together to convert the weight measurement of sediments into a resistance measurement. The thickness of sediments can then be calculated based on the specific resistance value.

[0036] During implementation, when marine sediments are deposited in measurement area 31, their weight generates a downward pressure, causing a change in the contact area between the protrusion 32 and the interdigitated electrode 4. This results in a change in the resistance value of the interdigitated electrode 4. The resistance change of the interdigitated electrode 4 is then measured in real-time using the resistance measuring device 6, reflecting the change in the thickness of the marine sediments and thus enabling the determination of the sediment thickness. In this scheme, the use of multiple measurement areas 31 allows for multiple measurements of the sediment thickness within the same timeframe. The final sediment thickness value is obtained by averaging these measurements, improving accuracy. Compared to the traditional method of multiple sediment sampling by offshore drilling platforms, this method involves fewer steps and significantly improves efficiency.

[0037] The specific measurement method of the above-mentioned marine sediment thickness variation measuring device includes the following steps:

[0038] S1: Select the measurement area for sediment thickness variation measurement, and collect sediment samples from the measurement area to obtain a standard resistance-to-thickness ratio using the variation measurement circuit. The steps for establishing the standard resistance-to-thickness ratio are as follows:

[0039] S1.1: Place the container in the measuring area 31. After the measured value of the resistance measuring device 6 stabilizes, return it to zero. The container is cylindrical, with the bottom area equal to the area of ​​the measuring area 31 and the surrounding area having a height value.

[0040] S1.2: Place the collected sediment in a container, and simultaneously obtain the measured value of the resistance measuring device 6 and the thickness value of the sediment in the container to establish a standard resistance-to-thickness ratio:

[0041]

[0042] In the formula, The standard resistance-to-thickness ratio; The measured value is from the resistance measuring device 6; This represents the thickness of the sediment in the container.

[0043] S2: After arranging the measuring device horizontally in the measuring area, the reading of the resistance measuring device 6 is returned to zero after it stabilizes.

[0044] S3: During the measurement process, the processor acquires the measured values ​​from multiple resistance measuring devices 6 in real time, and obtains the real-time average resistance value after data filtering; the data filtering method is as follows:

[0045] The measured values ​​of each resistance measuring device 6 are compared in real time. If the difference between the measured value of one resistance measuring device 6 and the measured value of another resistance measuring device 6 exceeds a threshold... Then exclude its data:

[0046]

[0047] In the formula: The average value measured by each resistance measuring device 6 is given. , This refers to the number of resistance measuring devices 6; For the first i The measured values ​​of each resistance measuring device 6 are used to remove data with large differences in the measured values ​​in this step, so that the final average resistance value reflects the thickness of the marine sediment more accurately.

[0048] The real-time average resistance is expressed by the following formula:

[0049]

[0050] In the formula, This is the real-time average resistance value. For the first The measured values ​​of the resistance measuring device 6 The number of valid measurements;

[0051] S4: Input the real-time average resistance into the standard resistance-to-thickness ratio to obtain the real-time deposit thickness.

[0052] As a preferred embodiment of the above, the processor is connected to the host computer through a signal transmission module to feed back the measured data on changes in marine sediment thickness to the user.

[0053] As a preferred solution of the above embodiment, the adjacent two measuring areas 31 have an anti-disturbance gap between them, and the top of the adjacent two measuring areas 21 is connected by the cover film 33, and the length of the cover film 33 is greater than the length of the disturbance gap, so that each measuring area 31 does not affect each other during operation, and the measuring value fed back to the processor by the corresponding deposit thickness variation measuring circuit is more accurate.

[0054] As a preferred solution of the above embodiment, the base 1 is provided with lifting legs 7 at the four corners of the bottom, and is further provided with a level 8 and a controller for controlling the state of the lifting legs 7, and the level 8 is connected to the controller.

[0055] Of course, the present application can have other various embodiments, and those skilled in the art can make various corresponding changes and modifications according to the present application without departing from the spirit and essence of the present application, but these corresponding changes and modifications shall belong to the protection scope of the claims attached to the present application.

Claims

1. An apparatus for determining changes in thickness of marine sediments, characterized by, The marine sediment thickness change measuring device comprises a base (1), a substrate (2) and a flexible panel (3) arranged from bottom to top, the flexible panel (3) comprises a plurality of measuring areas (31), the substrate (2) is etched with interdigital electrodes (4) corresponding to the positions of each measuring area (31), and each measuring area (31) has a protrusion (32) abutting on the positive and negative electrodes of the interdigital electrodes (4) respectively, the other side of the base (1) has a pin group (5) connected with the positive and negative electrodes of the interdigital electrodes (4) respectively, and the inside of the base (1) has a plurality of measuring resistors (6) connected with the plurality of pin groups (5) to form a sediment thickness change measuring circuit.

2. The marine sediment thickness change measuring apparatus according to claim 1, characterized by, The signal output ends of the plurality of measuring resistors (6) are connected with a processor, and the processor is connected with an upper computer through a signal transmission module.

3. The marine sediment thickness change determination device according to claim 2, characterized in that, The adjacent two measuring areas (31) have an anti-disturbance gap, and the top parts of the adjacent sides of the adjacent two measuring areas (31) are connected through a covering film (33), and the length of the covering film (33) is greater than the length of the disturbance gap.

4. A marine sediment thickness variation determination device according to any one of claims 1 to 3, characterised in that, The bottom corners of the base (1) are provided with lifting legs (7), and the inside is further provided with a level (8) and a controller for controlling the state of the lifting legs (7), and the level (8) is connected with the controller.

5. A method of determining changes in thickness of marine sediments, characterized by, The marine sediment thickness change measuring device according to any one of claims 1-4 comprises the following steps: S1: selecting a measuring area for sediment thickness change measurement, and collecting the sediment through the change measuring circuit to obtain a standard resistance thickness ratio; S2: after the measuring device is arranged in the measuring area in the horizontal direction, the reading of the measuring resistor (6) is stabilized and zeroed; S3: during the measurement process, the processor obtains the measurement values of the plurality of measuring resistors (6) in real time, and obtains the real-time resistance average value after data screening; S4: the real-time resistance average value is brought into the standard resistance thickness ratio to obtain the real-time sediment thickness.

6. The method of claim 5, wherein, The establishment steps of the standard resistance thickness ratio are as follows: S1.1: place the container in the measuring area (31), and zero the measuring resistor (6) after the measurement value is stabilized, the container is cylindrical, the area of the bottom is equal to the area of the measuring area (31), and the height value is provided on the side; S1.2: place the collected sediment in the container, and simultaneously obtain the measurement value of the measuring resistor (6) and the thickness value of the sediment in the container to establish the standard resistance thickness ratio: ； wherein is the standard resistance-thickness ratio; is the measured value of the measuring device (6); is the thickness value of the deposit in the container.

7. The method of claim 6, wherein, The data screening method in S3 is as follows: comparing the measured values of the individual resistance measuring devices (6) in real time, and if the difference between the measured value of one of the resistance measuring devices (6) and the measured value of another of the resistance measuring devices (6) exceeds a threshold value then the data of this resistance measuring device (6) is excluded: ； In the formula: The average value measured by each of the aforementioned resistance measuring devices (6) ， The number of resistance measuring devices (6); For the first i The measured value of the resistance measuring device (6).

8. The method of claim 7, wherein, In S3, the real-time resistance average value is expressed by the following formula: ； In the formula, is the real-time resistance average value, is the measured value measured by the mth resistance measuring device (6), is the measured value measured by the mth resistance measuring device (6), is the number of valid measured values.

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