Method for electrical system

Abstract

The present disclosure relates to a method for an electrical system, comprising: obtaining measurement data indicative of a measured temperature profile at a location of an electrical component of the electrical system, where the measured temperature profile is based on at least: a first temperature of the electrical component over time in relation to self-heating due to a resistance loss of the electrical component, and at least one second temperature over time associated with heating due to resistance of a peripheral portion of the electrical system, the peripheral portion at least partially surrounding the electrical component; acquiring characteristic data of the electrical component, including at least one characteristic temperature profile of the temperature of the electrical component over time due to self-heating of the electrical component or of the temperature of the electrical component over time due to heating of the peripheral portion; and determining a first temperature of the electrical component over time based on the measurement data and the characteristic data.

Description

Technical Field

[0001] The invention relates to a method for an electrical system, a data processing system, an electrical system comprising an electrical component, a computer program and a computer-readable storage medium. Background Art

[0002] Thermal issues are common in electrical systems, such as the increase in electrical component resistance over their lifetime, but not exclusively. Overheating can occur due to aging processes, such as loosening and degradation of electrical contacts or deterioration of insulation materials. Detecting these thermal issues, which could be associated with potential faults, is difficult due to the variable currents and, therefore, the variable heating power in such systems. Furthermore, the thermal response is often quite slow.

[0003] In common electrical systems, various sensors are used to predict thermal issues in electrical components. Simple approaches utilizing fixed temperature thresholds offer limited or no benefit. Temperature variability due to various heat sources limits the applicability of these simple approaches based on fixed temperature thresholds. However, due to the variable heating conditions of the electrical system during operation, excessive overheating temperatures may be reached, and it may be too late to maintain or replace the electrical components.

[0004] In summary, threshold-based models may allow for detection of faults but not identification of fault or fault conditions and tracking of degradation or aging of electrical components within an electrical system, particularly not based on increased contact resistance or dielectric losses of the electrical components due to their operation during their lifetime. Summary of the Invention

[0005] The above-mentioned problems or needs are at least partially solved or alleviated by the technical solutions of the independent claims of the present disclosure, with additional examples incorporated in the dependent claims.

[0006] According to a first aspect, there is provided a method for an electrical system, the method comprising:

[0007] Acquiring measurement data indicative of a measured temperature distribution at a location of an electrical component of the electrical system, wherein the measured temperature distribution is based at least on:

[0008] a first temperature of the electrical component over time related to self-heating due to resistive losses in the electrical component, and

[0009] at least a second temperature over time associated with heating due to resistive losses in a peripheral portion of the electrical system, the peripheral portion at least partially surrounding the electrical component;

[0010] acquiring characteristic data of the electrical component, the characteristic data including at least one characteristic temperature distribution of the temperature of the electrical component over time due to self-heating of the electrical component or the temperature of the electrical component over time due to heating of a surrounding portion; and

[0011] A first temperature of the electrical component over time is determined based on the measurement data and the characteristic data.

[0012] The method of the first aspect may specifically be a method that is at least partially or completely computer-implemented. This means that at least one, multiple or all steps in the method may be performed by a data processing system, which may include one or more computers or computing units, and the computer or computing unit may be part of the electrical system or not, for example, integrated with the electrical system or connected to the electrical system. Different steps may be performed by the same or different computers. A computer is understood herein as a data processing device or apparatus that can perform some, multiple or all steps defined by the method. Specifically, the acquisition of measurement data, characteristic data and / or the determination of health status may be performed by a data processing system. Additionally or optionally, the acquisition of measurement data may be performed by a measuring device or system, which may optionally forward the measurement data to a data processing system so that it can acquire the measurement data.

[0013] The method of the first aspect of the present disclosure allows accurate determination of self-heating of an electrical component or dielectric losses due to resistive losses based on measurement data indicative of a temperature distribution measured at a location of the electrical component of the electrical system.

[0014] The first temperature over time refers to the temperature increase of the electrical component itself over time, and is therefore called self-heating. This self-heating may be generated, for example, due to internal resistance losses of the electrical component during operation. For example, when current flows through the electrical component, heat is generated due to the resistance of the material constituting the electrical component. This heating effect is due to Joule's law (P = I 2 The first temperature may also refer to, for example, an overtemperature. The second temperature over time refers to the temperature of a surrounding portion of the electrical system that also experiences heating due to the resistive losses. This surrounding portion may include various components or materials adjacent to the electrical component being measured, such as other electrical components, adjacent components, or other components of the electrical system that are affected by the resistive losses.

[0015] The method of the first aspect is also based on characteristic data of the electrical component, which includes at least one characteristic temperature distribution. This temperature distribution can indicate the temperature increase of the electrical component over time due to its own heating or heating of surrounding components. This characteristic data can reflect how the temperature distribution of the electrical component increases over time when the electrical component self-heats, primarily due to its own resistive losses during operation of the electrical system. This distribution can be predetermined through experiments or simulations. Specifically, it can be beneficial to collect this characteristic data of the electrical component under various operating conditions to generate characteristic data for each operating condition of the electrical system. For example, characteristic temperature distributions can be measured or simulated under different load conditions or ambient temperatures. The characteristic temperature distribution of the electrical component due to heating of the surrounding components of the electrical component can describe how the temperature of the electrical component increases over time when the electrical component is heated by the surrounding components. This heating may occur, for example, due to resistive losses in surrounding components or ambient temperature. Similar to the temperature distribution due to self-heating, these distributions can be determined through previous experiments or simulations that study the heat transfer behavior between the electrical component and its surrounding environment.

[0016] The method of the first aspect also includes determining a first temperature of the electrical component over time based on the measurement data and the characteristic data. The measurement data, which can be acquired from the temperature measurement device, can provide a measured temperature distribution of the electrical component or multiple components of the electrical component. This measurement data can capture the actual temperature changes experienced by the electrical component during operation. The characteristic data can include, for example, a temperature distribution predetermined through experiments or simulations. This temperature distribution can represent the expected temperature development of the electrical component, including self-heating or heating from surrounding components under various conditions. By comparing the measured temperature distribution with the characteristic temperature distribution, the contribution of the electrical component's self-heating to the overall temperature increase of the electrical component can be determined. Using only a single characteristic temperature distribution to determine self-heating is sufficient. By using a single characteristic temperature distribution, the complexity of the analysis can be reduced, and the determination of self-heating can be simplified. Determining the self-heating of the electrical component can be crucial for understanding the thermal behavior of the electrical component, for example, to enable predictions regarding degradation or health. For example, this can be used to make informed decisions regarding maintenance, performance optimization, or potential problem detection, or to determine the health of the electrical component.

[0017] To determine self-heating, only a single temperature measuring device, such as a temperature sensor, may be required. By placing the temperature sensor at an appropriate location within the electrical system, such as on or near an electrical component, temperature changes due to self-heating of the electrical component and surrounding areas can be determined. The temperature sensor can, for example, continuously measure the temperature at that location over a defined period of time. Characteristic data can be predetermined through experimental or simulation methods, comprising a temperature distribution over time of the electrical component due to self-heating or heating of surrounding areas. This characteristic data serves as a reference distribution for comparison with the measured temperature data. The measured data can then be compared with a predetermined characteristic temperature distribution, comprising at least one characteristic temperature distribution of the electrical component over time due to self-heating or heating of surrounding areas, to determine self-heating of the electrical component.

[0018] In one example, a first temperature of an electrical component over time can be determined based on a fit of measured data to characteristic data. For example, one or more equations can be used, as further described below in the detailed description of the present invention. A method can be used to determine the most appropriate parameters that minimize the difference between the measured data and the characteristic data of the electrical component. For example, a mathematical model can be selected to provide a characteristic temperature increase of the electrical component over time. Due to the suitability of exponential functions for capturing dynamic thermal behavior, the model can include an exponential function. Parameter estimation techniques can then be used to determine the parameters within the selected model that best align the model with the measured temperature data. These parameters can represent inherent characteristics of the system, such as time constants or amplitudes. An objective function can then be defined to quantify the deviation between the actual temperature measurement and the model prediction. This objective function can measure a residual error, such as the sum of the squared differences between the measured and predicted temperatures at each time point. In a next step, an optimization algorithm, for example, can be employed to adjust the model parameters to minimize the difference between the measured and characteristic data. This process can accurately simulate the characteristic temperature increase within the component, effectively distinguishing "self-heating" from other effects of heating of surrounding components of the electrical system. In summary, a first temperature representing the self-heating of an electrical component can be determined through fitting by aligning the measured temperature data with the component's characteristic temperature distribution. By adjusting the parameters of the mathematical model to minimize the difference between the measured and predicted temperature data, an optimization algorithm can facilitate accurate modeling of temperature variations within the component. This process enables precise quantification of the self-heating of the electrical component, which can be beneficial when determining the health status of the electrical component.

[0019] In one example, at least one characteristic temperature distribution may include a first characteristic temperature distribution of the temperature of the electrical component over time due to self-heating of the electrical component. The first characteristic temperature distribution may indicate how the temperature of the electrical component evolves due to its internal resistive losses or heating mechanisms. At least one characteristic temperature distribution may also include a second characteristic temperature distribution of the temperature of the electrical component over time due to heating of the surrounding parts. The second characteristic temperature distribution may indicate how the temperature of the electrical component responds to heat generated within its surrounding parts (e.g., adjacent components or electrical components or the electrical system itself, respectively). The second characteristic temperature distribution may characterize the thermal interaction between the electrical component and its surrounding parts, highlighting the impact of external factors on the temperature increase of the electrical component. The first characteristic temperature distribution and the second characteristic temperature distribution may be temperature distributions predetermined, for example, by experiments or simulations. By introducing the first characteristic temperature distribution and the second characteristic temperature distribution, the method can more accurately distinguish between various heat sources, for example, enabling a more accurate assessment of the health status of the electrical component.

[0020] In one example, a first characteristic temperature distribution of the temperature of an electrical component and a second characteristic temperature distribution of the temperature of the electrical component may be acquired under fault-free operation of the electrical system, and the method may further include determining a health state of the electrical component based on the first temperature of the electrical component over time and a threshold temperature of the electrical component over time that indicates faulty operation of the electrical component. These characteristic distributions may be determined based on simulations or experimental measurements conducted under fault-free operating conditions. Using both the measured data and the characteristic data, the health state of the electrical component may be determined. This may be achieved by analyzing the first temperature distribution of the electrical component over time and comparing it to a threshold temperature of the electrical component that indicates faulty operation. The threshold temperature of the electrical component may serve as a reference, for example, indicating a temperature level at which the electrical component is considered to be operating abnormally, potentially indicating a fault condition. By comparing the first temperature distribution to the threshold temperature of the electrical component, the method may identify deviations from the expected temperature behavior of the electrical component. If the temperature distribution of the electrical component exceeds the threshold level over time, this may indicate that the electrical component may be experiencing an abnormal condition that indicates a fault. This information allows, for example, timely intervention or maintenance to prevent further degradation or failure of the electrical system.

[0021] Furthermore, by utilizing physical measurement data as the temperature increase over time of electrical components from the actual operation of the system, a more accurate and reliable assessment of the health state of the electrical components can be achieved. By directly capturing temperature data from the operation of the electrical system, the method can accurately detect deviations or anomalies in the temperature behavior of the electrical components. These deviations may indicate potential problems or degradation that affect the health state of the electrical components. In contrast, purely model-based approaches, for example, may strive to accurately model all relevant influencing factors and dynamics of the system, resulting in less accurate condition assessments. Therefore, by using physical measurement data rather than purely simulated data, the method provides improved reliability and accuracy in determining the condition of electrical components. This enables more effective decisions regarding maintenance, repair, or replacement of components, ultimately improving the reliability and performance of the entire electrical system.

[0022] In one example, the thermal mass of the electrical component can be smaller than the thermal mass of the surrounding parts. In this article, if the thermal mass of the electrical component is smaller than the thermal mass of the surrounding parts, this can mean that the electrical component responds to changes caused by changes in load or heating loss more quickly than, for example, the surrounding parts. This characteristic can, for example, affect the rate of temperature increase in response to changes in operating conditions. For example, in an exponential function that can be used to model the increase in temperature over time, the time constant (τ) represents the characteristic time scale of the system's response to temperature changes. Therefore, a smaller thermal mass can result in a smaller time constant, for example, indicating a faster response to changes in load or heating loss. In practice, this can mean that, for example, when heated, the temperature of the electrical component will increase or decrease more quickly than the surrounding parts. The difference in response rate can be used to distinguish the temperature contribution from the self-heating of the electrical component and the heating of the surrounding parts. By analyzing the temperature change rate with an exponential function, these contributions can be effectively separated and the health status of the electrical component can be determined.

[0023] In one example, characteristic data can be predetermined based on at least one simulation of the electrical system and / or at least one usage condition of the electrical system. This can mean that the characteristic temperature distribution of the electrical component can be determined based on two simulations (such as computer simulations) and / or the actual operating conditions of the electrical system. For example, computer simulations can be used to predict the thermal behavior of the electrical system under various operating conditions. These simulations can take into account parameters such as load changes, ambient temperature, and ventilation conditions to generate the characteristic temperature distribution. In addition, the characteristic data can also be determined based on the operating data of the electrical system. For example, this can include acquiring and analyzing the temperature distribution over a certain period of time or a similar period of time during normal operation of the system. These data can then be used to identify and quantify the characteristic temperature distribution of the electrical component under different operating conditions.

[0024] In one example, measurement data indicating a measured temperature distribution can be acquired during a period of increasing temperature over time. This can mean, for example, that temperature measurements can be taken on or at an electrical component while the electrical system is experiencing an increase in temperature. Periods of increasing temperature can include clear and discernible trends in the temperature data. These temperature trends can include distinct thermal signatures, such as exponential temperature increases, plateaus, or other recognizable patterns that reflect the system's response to changing conditions, making it easier to analyze and interpret the temperature data.

[0025] In one example, the increase in temperature over time may be during a substantially exponential temperature increase. A substantially exponential temperature increase may refer to a situation where the temperature increase follows a pattern that is very similar to an exponential function. A substantially exponential temperature increase may refer to a situation where the temperature increase follows a pattern that is very similar to an exponential function. An exponential temperature increase may mean that the temperature increases at an increasingly faster rate over time. This may involve the temperature doubling at regular intervals or growing exponentially in a similar manner. An exponential temperature increase may, for example, mean that the temperature initially increases slowly, but then accelerates over time, resulting in a very sharp temperature increase at the end of the period. An exponential function describes this behavior well, although the actual temperature increase may not exactly match the mathematical curve. In practice, this may mean that due to factors such as self-heating or other thermal effects, the temperature begins to increase exponentially before slowing down over time, and eventually reaches, for example, an asymptotic value or plateau. The temperature increase may not perfectly conform to the exponential curve, but may be close to 1.

[0026] In one example, the period of time during which the temperature increases over time can be during the startup phase of an electrical system or between steady-state temperatures of electrical components. The startup phase can refer to the initial period when an electrical system is powered on or activated, transitioning from a reset state to full operation. The startup phase is characterized by a rapid change in temperature as the system reaches its operating state. For example, when current flows through an electrical component, the electrical component may experience an increase in temperature, resulting in resistive losses. An exponential temperature increase during the startup phase can provide good comparability and reproducibility of temperature conditions because similar dynamic processes typically occur during this phase. This can, for example, allow consistent assessment of temperature changes and facilitate comparisons between different measurements or tests. In addition, an exponential temperature increase can enable more accurate characterization of the thermal properties of electrical components (such as electrical components and peripheral parts of an electrical system) because it can provide a clear relationship between the applied load and the resulting temperature change. A steady-state temperature can refer to a condition in which the system has reached a stable operating state, such as with a consistent temperature level. During steady-state operation, the electrical components and electrical system may have stabilized, and thermal equilibrium can be maintained over time.

[0027] In one example, the electrical component can be an electrical contact, an electrical part, or an electrical assembly of an electrical system. Furthermore, the electrical system can be formed by the electrical component or assembly (i.e., having only the electrical component so that the health of the electrical system itself is checked), or can have multiple electrical components or assemblies. The electrical system can specifically be an electrical device. For example, the electrical component can be a portion of an electrical assembly, rather than the entire electrical assembly. Furthermore, the electrical component can be a capacitor or a portion of a capacitor, such as a metallized film used in certain types of capacitors.

[0028] For example, the measured temperature distribution can be based on the temperature measured by a temperature sensor of an electrical system (particularly an electrical component). The method includes acquiring measurement data representing the measured temperature distribution at a location of an electrical component of the electrical system. The measured temperature distribution can be based on temperature measurements acquired by a single temperature sensor located within the electrical system. The temperature sensor can be part of the electrical component itself or integrated into a different component of the electrical system. The sensor can be strategically positioned at a location within the electrical system to accurately capture temperature changes of the electrical component.

[0029] According to a second aspect of the present disclosure, there is provided a data processing system configured to execute the method according to the first aspect of the present disclosure.

[0030] The data processing system may include one or more computers as described above, and optionally a computer program product according to the second aspect of the present disclosure.

[0031] According to a third aspect of the present invention, there is provided an electrical system including an electrical component, a measuring device configured to measure a temperature distribution of a temperature of the electrical component, and the data processing system according to the second aspect of the present disclosure.

[0032] According to a fourth aspect of the present disclosure, there is provided a computer program product comprising instructions, which, when the program is executed by a computer, cause the computer to perform the method according to the first aspect of the present disclosure.

[0033] A computer program product may be a computer program, meaning a computer program consisting of or comprising a program code executed by a computer.

[0034] Alternatively, the computer program product may be a product such as a data storage, in particular a computer-readable data storage medium, on which the computer program may be temporarily or permanently stored.

[0035] For example, the electrical system may also comprise several electrical components.The measuring device may comprise, for example, one or more temperature sensors.

[0036] According to a fifth aspect of the present disclosure, there is provided a computer-readable storage medium comprising instructions, which, when executed by a computer, cause the computer to perform the method according to any one of claims 1 to 11.

[0037] It should be noted that the above-mentioned aspects, examples and features may be combined with each other irrespective of the aspect in question.

[0038] The above and other aspects of the present disclosure will be apparent from and elucidated with reference to the examples described hereinafter. BRIEF DESCRIPTION OF THE DRAWINGS

[0039] Exemplary embodiments will be further described with reference to the accompanying drawings, in which:

[0040] Figure 1 The electrical system is shown;

[0041] Figure 2 shows a profile with different temperature distributions; and

[0042] Figure 3 Shown for determining Figure 1 A method of determining the health status of electrical components of an electrical system.

[0043] The accompanying drawings are merely schematic and are not drawn to scale. In principle, identical or similar components, elements and / or steps are provided with identical or similar reference numerals in the accompanying drawings. DETAILED DESCRIPTION

[0044] Figure 1 An electrical system 10 is schematically shown, exemplarily including an electrical component 11. As an example, one electrical component 11 is shown, however, the number may be higher, such as two or three electrical components 11, or a greater number. The electrical system 10 may be a power conversion system, such as, but not limited to, an alternating current (AC) system, a busbar system, or an electrical filter system. The electrical component 11 may be any electrical component, such as, but not limited to, an electrical contact, an electrical part, and / or an electrical assembly of the electrical system 10, such as a capacitor or a portion of a capacitor.

[0045] The data processing system 13 may be part of the electrical system 10 or connected to the electrical system 10, for example via wired or wireless connections, and in particular connected to one or more temperature measuring devices 12 or sensors, one of which is exemplarily shown for the electrical component 11 and is exemplarily located at the electrical component 11. Alternatively, the measuring device 12 may be located at a different location within the electrical system 10 or outside of it, but configured to measure the temperature of the electrical component 11. Furthermore, the measuring device 12 may be a combined measuring device 12 for both temperature and current measurement, in particular over time, or a separate device 12.

[0046] The data processing system 13 may comprise a data processing device 14, in particular in the form of a processing or computing unit or a processor and a computer, and / or a computer program product 15, for example in the form of a computer program itself or in the form of a computer-readable storage medium on which the computer program is stored. When the computer program product 15 is executed by the data processing device 14, the execution Figure 3 Method 100 is shown.

[0047] The context of method 100 is typically monitoring such as Figure 1The thermal behavior of the electrical system 10 shown is important because overheating of the electrical system 10 and / or one or more of its electrical components 11 is one of the primary causes of its failure. For example, due to the varying sizes and, therefore, thermal masses of the various components, the variability of the thermal loads on the various components of the electrical system 10 makes thermal monitoring difficult. An increase in the temperature of the electrical component 11 can be due, for example, to self-heating or resistive losses in the electrical component 11 and / or to heating or resistive losses in a peripheral portion 16 of the electrical system, which at least partially surrounds the electrical component 11. In this example, the thermal mass of the electrical component 11 is smaller than that of the peripheral portion 16 (represented by the different-sized explosion shapes). This means that the electrical component 11 responds more quickly to temperature changes than the peripheral portion 16. In the context of the example provided, if the thermal mass of the electrical component 11 is smaller than that of the peripheral portion 16, this can mean, for example, that when subjected to the same thermal stimulus, the electrical component 11 heats or cools more quickly than the peripheral portion 16. This characteristic can influence the rate at which the temperature increases or decreases in response to changes in operating conditions. For example, during temperature changes under operating conditions within electrical system 10, electrical component 11 may exhibit faster temperature changes than surrounding portion 16. This can affect the response time of electrical component 11 to changes in operating conditions and may affect its thermal characteristics. Therefore, the smaller thermal mass of electrical component 11 relative to surrounding portion 16 may indicate that electrical component 11 may respond more quickly to temperature changes, which is an important factor to consider when analyzing its thermal characteristics and behavior within electrical system 10. To determine the health status of electrical component 11, it is crucial to distinguish between, for example, the contribution of self-heating and heating of surrounding portion 16 to the temperature increase of electrical component 11.

[0048] Figure 2 Different temperature distributions are shown schematically.

[0049] In this example, the measured temperature increase over time or the measured temperature distribution T1+T2 is shown. In this example, the measured temperature distribution is based on two temperature components, namely T1 and T2. The measured temperature distribution can be provided by the measurement device 12. The measured temperature distribution can be fitted to a single exponential form or function and can be formulated as follows:

[0050]

[0051] Where T(t) is the temperature at time t, T ∞is the ambient temperature, t is the time, and τ is the characteristic time constant of the component (in this case, the electrical component 11). After fitting the data to an exponential function, the characteristic time constant is identified. In thermal systems, the characteristic time constant (τ) can be used as a key parameter that can characterize the response of the system to temperature changes. For example, it can represent the time required for the system temperature to reach approximately 63.2% of its final equilibrium value in response to a step change in an input or external condition. This time constant can indicate how quickly the electrical system 10 or its components respond to temperature changes. Smaller values ​​of τ can indicate that the electrical component 11 responds quickly to changes typically associated with short-term dynamic processes, while larger values ​​of τ can indicate slower dynamic processes associated with longer time scales. After fitting the data to an exponential function, key points in the curve can be determined, such as the ambient temperature T ∞ , the initial temperature T(0), and other relevant points important to the analysis. Exponential functions can be used to simulate dynamic processes, such as the change in temperature over time in this example, due to their ability to capture both rapid and gradual changes. In this example, utilizing an exponential function can allow, for example, characterizing the thermal behavior of the electrical system 10, particularly during periods where the temperature increases over time, such as during startup.

[0052] In this example, as previously described, it can be assumed that the measured temperature T1+T2 increasing with time consists of two components or exponential functions, namely T1 and T2, and can therefore be expressed by the following formula:

[0053]

[0054] The exponential function includes two amplitudes and two time constants τ. Because τ can be linked to different time scales for each component in the assembly, such as a shorter time scale τ1 for self-heating of electrical component 11 or a larger time scale τ2 for heating due to heating contributions from surrounding portions 16 of electrical system 10, it is possible to fit a bi-exponential model and determine the temperature increase or amplitude over time for each component. This can allow the self-heating of electrical component 11 to be determined using only one measurement device 12.

[0055] In summary, the measured temperature profile T1+T2 can be analyzed to determine the heating contribution of the electrical component 11 and its surroundings 16. By identifying the magnitude of each exponential temperature increase (T1 and T2) corresponding to the characteristic temperature profile of the electrical component 11, it is possible to distinguish between heat due to self-heating and heat due to the surroundings 16. This analysis can be performed during periods of exponential temperature increase in the electrical system 10, such as during startup or steady-state conditions after a long heating period. These insights enable accurate assessment of thermal behavior and contribute to effective temperature management strategies for the electrical system.

[0056] Figure 3The method 100 for solving the above problem is schematically and exemplarily shown. That is, the method 100 can be used to determine Figure 1 The health status of the electrical components 11 of the electrical system 10.

[0057] In a first step 101, measurement data based on a temperature distribution measured at the location of an electrical component 11 of an electrical system 10 is acquired. This temperature distribution can be derived from at least two temperature distributions over time: a first temperature of the electrical component 11 associated with self-heating due to resistive losses, and at least a second temperature that varies over time and is associated with heating due to resistive losses in a peripheral portion 16 of the electrical system 10. In a second step 102, characteristic data for the electrical component 11 is acquired. This data may include at least one characteristic temperature distribution of the electrical component 11 over time, which is associated with its self-heating and heating of the peripheral portion 16. This characteristic data may be derived from experimental measurements or simulations and can be used as a reference for comparison with the measured data. In a next step 103, based on the measured data and the characteristic data, a first temperature or self-heating of the electrical component 11 over time is determined. This may include fitting the measured data to the characteristic data, for example, by applying a mathematical model that describes the temperature increase of the electrical component 11. In an optional step 104, the health state of the electrical component 11 can be determined using the determined first temperature of the electrical component 11 over time and, for example, a threshold temperature indicating faulty operation. If the measured temperature is likely to exceed a threshold, a fault condition may be detected and appropriate action may be taken.

[0058] Although the present invention has been described and illustrated in detail in the drawings and the foregoing description, such illustration and description should be considered illustrative or exemplary rather than restrictive. The present invention is not limited to the disclosed embodiments. Other variations of the disclosed embodiments can be understood and effected by one skilled in the art through study of the drawings, the disclosure, and the claims, and by practice of the claimed invention.

[0059] As used herein, the word "comprising" does not exclude other elements or steps, and the indefinite article "a" or "an" does not exclude a plurality. The fact that certain measures are recited in mutually different dependent claims does not indicate that a combination of these measures cannot be used to advantage. Furthermore, as used herein, the phrase "at least one" or similar phrases, such as "one or more", in relation to a list of one or more entities, should be understood to mean at least one selected from any one or more entities in the list of entities, but does not necessarily include at least one of each and every entity specifically listed in the list of entities and does not exclude any combination of entities in the list of entities. This definition also allows that such entities may optionally be present in addition to the entities specifically identified in the list of entities to which the phrase "at least one" or similar phrases refer, whether related or unrelated to those entities specifically identified. Thus, as a non-limiting example, "at least one of A and B" (or equivalently, "at least one of A or B" or equivalently "at least one of A and / or B" or equivalently "one or more of A and B," "one or more of A or B," or "one or more of A and / or B") may refer, in one example, to at least one (optionally including more than one) A without B (and optionally including entities other than B); in another example, to at least one (optionally including more than one) B without A (and optionally including entities other than A); and in yet another example, to at least one (optionally including more than one) A and at least one (optionally including more than one) B (and optionally including other entities). In other words, the phrases "at least one," "one or more," and "and / or" are open-ended expressions that are both conjunctive and disjunctive in operation. For example, each of the expressions "at least one of A, B, and C," "at least one of A, B, or C," "one or more of A, B, and C," "one or more of A, B, or C," and "A, B and / or C" may mean A alone, B alone, C alone, A and B together, A and C together, B and C together, A, B, and C together, and any of the foregoing, optionally in combination with at least one other entity.

[0060] As used herein, the phrase "indicates" may, for example, mean "reflects" and / or "includes". Thus, entities, elements and / or steps referred to herein as "indicates [...]" may be used herein synonymously or interchangeably with one, both or all of the entities, elements and / or steps "include [...]" and the entities, elements and / or steps "reflect [...]". Furthermore, as used herein, phrases such as "based on", "related to", or "related to", "associated with" and similar phrases are not exclusive with respect to the entities, elements and / or steps to which they refer, unless otherwise indicated. Rather, unless otherwise indicated, these phrases should be understood to be inclusive in that, for example, an entity, element or step referenced by any of these phrases or similar phrases, such as "based on" one or another entity, element or step, does not exclude that the corresponding entity, element or step may further or also be "based on" any other entity, element or step that is different from the entity, element or step to which it refers.

[0061] The designation of methods and steps as first, second, etc. provided herein is only intended to make these methods and their steps quotable and distinguishable from each other. The designation of methods and steps does not constitute a limitation on the scope of the present disclosure. For example, when the present disclosure describes the third step of a method, the first or second step of the method does not need to exist alone or be performed before the third step, unless they are explicitly referred to as being necessary or performed before the third step. In addition, presenting methods or steps in a specific order is only intended to promote an example of the present invention and does not constitute a limitation on the scope of the present invention. Generally, unless the required order is not explicitly mentioned, the methods and steps can be performed in any feasible order. Specifically, the terms first, second, third or (a), (b), (c), etc. in the specification and claims are used to distinguish similar elements and are not necessarily used to describe order or chronological order. It should be understood that the terms used in this way are interchangeable where appropriate, and the embodiments of the present invention described herein can operate in other orders different from those described or shown herein.

[0062] In the context of the present invention, any numerical value indicated is generally associated with a precision interval that a person skilled in the art will understand to still ensure the technical effect of the feature in question. As used herein, deviations from the indicated numerical values ​​are within a range of ±10%, preferably ±5%. The above-mentioned deviations from the indicated numerical value interval of ±10%, preferably ±5%, are also indicated by the terms "about" and "approximately" used herein with respect to numerical values.

[0063] Any reference signs in the claims should not be construed as limiting the scope.

Claims

1. A method for an electrical system (10), the method comprising: Acquiring measurement data indicating a measured temperature distribution at a location of an electrical component (11) of the electrical system (10), wherein the measured temperature distribution is based at least on: a first temperature of the electrical component (11) over time, associated with self-heating due to resistive losses in the electrical component (11), and at least one second temperature over time associated with heating due to resistive losses in a peripheral portion (16) of the electrical system (10), the peripheral portion (16) at least partially surrounding the electrical component (11); Acquiring characteristic data of the electrical component (11), the characteristic data comprising at least one characteristic temperature distribution of the electrical component (11) due to self-heating of the electrical component (11) over time or the temperature of the electrical component (11) due to heating of the peripheral portion (16) over time; as well as The first temperature of the electrical component (11) over time is determined based on the measurement data and the characteristic data.

2. The method according to claim 1, wherein the first temperature of the electrical component (11) over time is determined based on a fit of the measurement data to the characteristic data.

3. The method according to claim 1 or 2, wherein the at least one characteristic temperature distribution comprises: a first characteristic temperature distribution of the temperature of the electrical component (11) over time due to self-heating of the electrical component (11), and A second characteristic temperature distribution of the temperature of the electrical component (11) over time due to the heating of the peripheral portion (16).

4. The method according to claim 3, wherein the first characteristic temperature distribution of the temperature of the electrical component (11) and the second characteristic temperature distribution of the temperature of the electrical component (11) are acquired under fault-free operation of the electrical system (10), the method further comprising: A health state of the electrical component (11) is determined based on the first temperature of the electrical component (11) over time and a threshold temperature of the electrical component (11) over time that indicates faulty operation of the electrical component (11).

5. The method according to any of the preceding claims, wherein the thermal mass of the electrical component (11) is smaller than the thermal mass of the peripheral portion (16).

6. The method according to claim 1 , wherein the characteristic data is predetermined based on: at least one simulation of the electrical system (10), and / or At least one usage condition of the electrical system (10).

7. The method according to any of the preceding claims, wherein the measurement data indicative of the measured temperature distribution are acquired during a period of increasing temperature over time.

8. The method of claim 6, wherein the period during which the temperature increases with time is during a substantially exponential temperature increase.

9. The method according to claim 6 or 7, wherein the period of time during which the temperature increases over time is during a start-up phase of the electrical system (10) or between steady-state temperatures of the electrical component (11).

10. The method according to any of the preceding claims, wherein the electrical component (11) is an electrical contact, an electrical part or an electrical assembly of the electrical system (10).

11. The method according to any of the preceding claims, wherein the measured temperature distribution is based on temperatures measured by temperature sensors of the electrical system (10), in particular of the electrical component (11).

12. A data processing system (13) configured to perform the method according to any one of the preceding claims.

13. An electrical system (10) comprising an electrical component (11), a measuring device configured to measure the temperature of the electrical component (11), and a data processing system (13) according to claim 12.

14. A computer program product (15) comprising instructions which, when said program is executed by a computer, cause said computer to carry out the method according to any one of claims 1 to 11.

15. A computer-readable storage medium comprising instructions which, when executed by a computer, cause the computer to perform the method according to any one of claims 1 to 11.

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