Sample stage system for microscope and microscope

Abstract

The invention relates to a sample stage system for a microscope and a microscope, comprising a sample stage and a holding frame, the holding frame being designed to be arranged on the sample stage, and an axial spatial direction being defined by a normal direction. According to the invention, the sample stage system is characterized in that the holding frame is designed to be arranged on the sample stage either only together with a mechanical adapter part or together with a mechanical functional part for mechanically operating the holding frame, the axial height of the holding frame is the same at least for the starting position of the mechanical functional component, regardless of whether the holding frame is arranged on the sample stage together with the mechanical adapter component or together with the mechanical functional component. Alternatively, the holding frame is designed to be arranged on the sample stage either individually or together with mechanical functional components for mechanically operating the holding frame.

Description

Technical Field

[0001] The invention relates to a sample stage system for a microscope according to the preamble of claim 1. In a further aspect, the invention relates to a microscope having a sample stage system. Background Art

[0002] A generic sample stage system for a microscope comprises the following components: a sample stage, a holding frame for accommodating a sample, wherein the holding frame is designed to be arranged on the sample stage, and wherein the axial spatial direction is determined by the direction of the normal to the plane of extension of the holding frame. These sample stage systems are known in a variety of variants.

[0003] Modern, modular, flexible microscopes typically feature an xy stage that can be operated electrically or manually, allowing the sample to be moved laterally to bring the desired area of ​​the sample into the imaging area. Because sample stages are relatively expensive and the samples examined with these microscopes vary widely, a widely adopted concept is to insert a retaining frame into the sample stage to match the sample stage. The retaining frame provides suitable support or accommodation for the respective sample and sample carrier. A key advantage of these retaining frames is that, for different samples, only the retaining frame needs to be replaced, eliminating the need for replacing the sample stage. A mechanical interface exists between the sample stage and the inserted or mounted retaining frame.

[0004] However, microscope systems often also incorporate add-on modules that extend the functionality of the actuators by attaching them, for example, screwing them onto the sample stage. Examples of these add-on modules include a z-lift, which typically uses piezoelectric actuators to move the xy stage in the z-direction, and / or a leveling sight, which can provide, for example, two additional tilt axes for the holding frame. In these cases, the holding frame containing the sample must dock with the new add-on module and, in order not to impair the mechanical functionality of the add-on module, must no longer be in contact with the xy stage itself. Summary of the Invention

[0005] The following solutions are known for the task of applying a sample on the one hand to a sample stage and on the other hand to an actuator module or an additional module.

[0006] In a first known solution, the add-on modules have a mechanical interface separate from the sample stage. These additional interfaces are then accompanied by dedicated holding frames, which are used to insert the sample when the add-on modules are used. Separate holding frames must be developed and provided for each add-on module.

[0007] The second approach is characterized by the addition module having the same mechanical interface as the sample stage. This allows the use of the same holding frame as when the holding frame is mounted directly in or on the sample stage. However, this approach does not achieve the same sample support platform. If the addition module is screwed onto the sample stage and has the same interfaces, these interfaces must also be located upwards. This also results in the sample being higher and less accessible from below using the objective (or, in upright microscopes, the condenser). This difference can be as much as several millimeters in currently known approaches.

[0008] It can be seen as an object of the present invention to create a sample stage system which is particularly convenient for the user to operate and requires less setup effort than the prior art.

[0009] This object is achieved by a sample stage system having the features of claim 1. Furthermore, protection is claimed for a microscope having a sample stage system according to the invention.

[0010] Advantageous embodiments of the sample stage system according to the invention are explained below, in particular in conjunction with the dependent claims and the drawings.

[0011] The sample stage system of the above type is designed in an expanded manner according to the present invention, that is, the holding frame is set up to be arranged on the sample stage either together with a mechanical adapter part or together with a mechanical functional part for mechanically operating the holding frame, wherein the axial height of the holding frame relative to the sample stage is independent of whether the holding frame is arranged on the sample stage together with the mechanical adapter part or together with the mechanical functional part, at least with respect to the starting position of the mechanical functional part, or the holding frame is set up to be arranged on the sample stage either alone or together with a mechanical functional part for mechanically operating the holding frame, wherein the axial height of the holding frame relative to the sample stage is independent of whether the holding frame is arranged on the sample stage alone or together with the mechanical functional part, at least with respect to the starting position of the mechanical functional part.

[0012] The sample stage can typically be an xy stage or an xyz stage. This means that the sample stage can be independently moved in the x and y coordinate directions, or in the x, y, and z coordinate directions, for example, via a precise threaded mechanism, a servo motor, or manually. The direction of the optical axis of the microscope objective is typically referred to as the z-direction. From the perspective of a user sitting in front of the microscope, the left-right direction is typically defined as the x-direction. From this user's perspective, the y-direction is the front-to-back direction.

[0013] The term "holding frame" refers to a mechanical device that can accommodate typical sample carriers, such as slides or culture dishes, and is suitable for connection to a sample stage in a defined manner. Both the sample stage and the holding frame typically have a substantially rectangular shape, with their sides arranged substantially parallel in the intended operating state. However, this is not mandatory. For example, it is also possible for the holding frame to have a circular ring shape, which is accommodated in a similarly circular recess in the sample stage.

[0014] An important idea of ​​the present invention is that the same mechanical interface is provided at the sample stage and at the mechanical functional component, which can also be called an additional module, aimer component, additional component, actuator additional module or actuator module, so that the same holding frame can be used regardless of whether a mechanical additional component is used.

[0015] Another important concept of the present invention is to achieve the same installation height for the holding frame regardless of whether mechanical attachments are used. Sample carriers, such as culture dishes or slides, arranged on the holding frame are therefore at the same height, regardless of whether mechanical attachments are used.

[0016] A first important advantage of the present invention is that the user can use the same holding frame for the functional components of the machine as when using the sample stage directly. This means that fewer components are required for working with the microscope, and cost advantages are possible. This can be particularly important because more complex and expensive modules, such as tabletop incubators, are also installed at the interface of the machine.

[0017] A further advantage of a holding frame that can be used with or without functional components is that the number of components to be developed and provided can be reduced.

[0018] Finally, an important advantage of the present invention is also that the number of components is reduced while at the same time achieving very good sample accessibility.

[0019] Mechanical functional components and mechanical adapter components are usually arranged between the holding frame and the sample stage.

[0020] There is design freedom with regard to the specific additional functions provided by the mechanical functional component. In a first particularly preferred embodiment of the sample stage system according to the invention, the mechanical functional component has a z-drive for adjusting the axial height of the holding frame above the sample stage. The z-drive can, for example, have one or more piezoelectric actuators. Alternatively or additionally, it can also be provided that the mechanical functional component has a device for changing the orientation of the holding frame relative to the sample stage, such as a leveling screw. The leveling screw can be adjusted manually and / or by a servo motor. At least two of the leveling screws can be adjusted expediently so that the holding frame can be tilted relative to the sample stage about two independent axes in the case of three-point support.

[0021] Another preferred embodiment of the sample stage system according to the present invention is characterized in that a mechanical adapter component is formed by an adapter frame, which is designed to be inserted between the sample stage and the holding frame in order to adjust the axial height of the holding frame relative to the sample stage. The mechanical adapter component can, in particular, perform a dummy function or a spacer function, so as to achieve the same mechanical interface for the holding frame relative to the sample stage as when using, for example, a mechanical functional component (which provides a z-displacement function and / or a leveling function). The adapter component can be simple. For example, the adapter component can have multiple parts or be formed from multiple parts, such as thin rods or support bars. These thin rods can be separate, individual thin rods. Therefore, the adapter component does not need to have a solid frame shape. For example, the adapter component can be formed from two thin rods or support bars, which can be inserted into the sample stage, and the holding frame can then be placed on the thin rods or support bars.

[0022] The mechanical functional component is preferably designed in such a way that it can be firmly connected, for example screwed, to the sample stage.

[0023] The holding frame can be placed on the functional component of the machine or on the adapter part of the machine and held there by gravity. A magnetic connection can alternatively or additionally exist between the holding frame and the functional component of the machine or the adapter part of the machine.

[0024] The holding frame can be placed, for example, on a sample stage or a functional component of a machine via a three-point support. The three-point support can consist of a conical recess, a groove, and a surface, or three grooves, on the side of the sample stage or the functional component of the machine. The contact surfaces on the holding frame, which engage in the conical recess, the groove, or the grooves, can have at least partially spherical shapes. These balls can, for example, be located at the ends of leveling screws, particularly adjustable leveling screws. All three leveling screws, but at least two of the leveling screws, can be designed to be adjustable in height, for example as ball screws, to allow leveling of the holding frame, i.e., tilting about two axes.

[0025] The support points of the three-point support can be adjusted in height, for example, by means of a servo motor, ie, a servo motor can be provided on the holding frame for adjusting the contact surface, which servo motor can be controlled by a control device.

[0026] The support on the sample stage can, in particular, have a recessed structure or even a groove or hole in mirror-symmetrical relation to the bearing of the three-point support, which prevents the balls from being supported and thus prevents mechanical short-circuiting of the mechanical functional components when the holding frame is rotated 180° out of the initial position. An exemplary embodiment for this purpose is described in more detail below.

[0027] The holding frame can be secured to the sample stage or the functional component of the machine using magnetic forces, but it can also be secured using the sheer weight of the holding frame. The holding frame can be arranged in such a way that its weight acts downward and presses it onto the sample stage or the functional component of the machine. Magnets can be attached to both sides of the holding frame interface or only to one side. It is also possible to attach a magnet to only one side and to provide only magnetizable material on the other side.

[0028] The magnets can preferably be mounted in the holding frame and not on or in the sample stage or on or in the functional components of the machine. Thus, a holding frame without magnets can also be arranged on the same sample stage or the same functional component of the machine. The magnets can be designed symmetrically so that the same magnets always have an effect when the holding frame is rotated.

[0029] The magnets or magnetizable materials in the holding frame can be formed on the contact surface itself. This makes it possible to ensure that the magnetic holding force remains constant during leveling.

[0030] The shape of the holding frame and / or the opening in the holding frame and / or the sample stage offers design freedom. Preferred variants of the sample stage system according to the invention are characterized in that the holding frame and / or the opening in the holding frame, the sample stage, the mechanical adapter component, and / or the mechanical functional component are disk-shaped, rectangular, in particular square, or have a polygonal, in particular regular, polygonal shape. This allows the use of all common sample holders and sample carriers.

[0031] An important idea of ​​the present invention is, as explained above, to use one and the same holding frame, regardless of whether an actuator module is used or not. In an advantageous embodiment of the sample stage system according to the invention, it is additionally utilized that the holding frame can be inserted in different positions relative to the sample stage and any functional components of the machine. For this purpose, it may be preferred that at least three, in particular outwardly projecting, holding areas are formed on the holding frame on opposite sides, the holding areas being designed to engage either exclusively with a support surface formed on the sample stage or exclusively with a support surface formed on the functional components of the machine. The holding areas can, for example, extend outwards in the extension plane of the holding frame. The holding areas can, in particular, be holding tongues.

[0032] It is also advantageous if the holding frame is rectangular and has a different number of holding areas on opposite sides. This asymmetrical arrangement of the holding areas allows the holding frame to be positioned in different positions on the sample stage. One or more holding areas, in particular two holding areas, on one side of the holding frame can be offset relative to multiple, in particular two, or one holding area on opposite sides of the holding frame. An offset arrangement here refers to an arrangement that is offset in the direction of extension of the relevant sides.

[0033] In a preferred embodiment, a three-point support is realized in each case, ie, there is one holding region on each of two adjacent sides of the holding frame and two holding regions on each of the opposite sides of the holding frame.

[0034] The supporting surface on the sample stage and the supporting surface on the functional component of the machine can advantageously exhibit at least twofold rotational symmetry relative to a rotation axis parallel to the axial direction. This allows the holding frame to be arranged in different rotational positions on the sample stage or on the functional component of the machine, as will be explained in more detail below. Specifically, the holding frame can be arranged such that, in the second position, it is rotated, in particular, by 180° about the rotation axis parallel to the axial spatial direction, compared to the first position.

[0035] At the functional component of the machine mounted on the sample stage, the holding frame can advantageously be placed with its holding area only on the support surface of the sample stage in the first position, and the holding frame can be placed with its holding area only on the support surface of the functional component of the machine in the second position, wherein the axial height of the holding frame relative to the sample stage is the same in the first position and the second position, at least in the starting position of the functional component of the machine.

[0036] The support surface in the sample stage and / or in the functional component of the machine can each be formed by a magnet or comprise a magnet or a magnetic material.The support surface of the sample stage can, for example, be formed as a raised area on the sample stage.

[0037] In a preferred embodiment of the sample stage system according to the invention, when the functional component of the machine is arranged as intended on the sample stage, the support surface on the sample stage and the support surface on the functional component of the machine each have the same axial height relative to the underside of the sample stage. This allows for a relatively simple formation of the retaining region or retaining tongue.

[0038] However, it is also possible that the supporting surface on the sample table and the supporting surface on the functional component of the machine may not have the same axial height. If the supporting surface on the sample table and the supporting surface on the functional component of the machine have different axial heights relative to the underside of the sample table when the functional component of the machine is arranged as intended on the sample table, it is expedient for the holding area to each have two supporting surfaces that are separated in the axial direction by a step. The height difference between the supporting surface on the sample table and the supporting surface on the functional component of the machine is advantageously the same as the height of the step in the holding area. This allows the same installation height to be achieved regardless of whether the holding frame is placed on the functional component of the machine or on the sample table. BRIEF DESCRIPTION OF THE DRAWINGS

[0039] Further advantages and features of the present invention are explained below with reference to the accompanying drawings.

[0040] Figure 1 A microscope according to the prior art is shown;

[0041] Figures 2 to 4 A first embodiment of a system according to the invention is shown;

[0042] Figures 5 to 7 shows an embodiment of a sample stage for a second embodiment of a system according to the invention;

[0043] Figure 8 shows the functional components of a machine for a second embodiment of a system according to the invention;

[0044] Figure 9 and Figure 10 shows a holding frame for a second embodiment of a system according to the invention;

[0045] Figures 11 to 13 shows the arrangement of the holding frame at the sample stage in a second embodiment of the system according to the invention;

[0046] Figure 14 shows the arrangement of the holding frame only at the sample stage in a second embodiment of the system according to the invention;

[0047] Figure 15 The arrangement of the holding frame only at the functional components of the machine is shown in a second embodiment of the system according to the invention;

[0048] Figure 16 shows a cutaway partial view of one embodiment of a retaining tongue having a stepped bearing surface; and

[0049] Figure 17 From another cross-sectional plane, Figure 16 Another cutaway partial view of an embodiment of the present invention.

[0050] Identical parts and parts having the same effect are generally provided with the same reference numerals in the figures. DETAILED DESCRIPTION

[0051] Figure 1 A conventional microscope is schematically shown. This microscope includes a microscope stand 4, a sample stage 5 mounted on the microscope stand 4, a microscope objective 3, and a holding frame 6 placed on the sample stage 5 as essential components. A sample 2, which may be, for example, a glass slide or a culture dish, is placed on the holding frame 6. Reference numeral 7 schematically illustrates an eyepiece.

[0052] The axial direction z is given by the direction of the normal to the extension plane of the holding frame 6. The axial direction extends essentially parallel to the optical axis of the microscope objective 3.

[0053] Finally, there is a control device 9 which can be used, for example, to adjust the sample stage 5 and, if necessary, the holding frame 6 and to read and process, for example, Figure 1 Microscope measurement data from a camera not shown.

[0054] Figure 1 The microscope shown in FIG. 1 is an inverted microscope, ie the microscope objective 3 observes the sample 2 on the holding frame 6 from below.

[0055] The height distance, ie the distance in the z direction between the upper side of the holding frame 6 and the reference surface on the microscope stand 4 , is denoted by h.

[0056] The first embodiment of the sample stage system 100 according to the present invention refers to Figures 2 to 4 Be explained. Figure 2 The arrangement of a holding frame 12 on a sample stage 10 together with mechanical functional components 14 is shown. Figure 3 The arrangement of the same holding frame 12 on the same sample stage 10 is shown, but now using a mechanical adapter part 16 . Figure 4 Shown is a view from above, ie in the negative y direction. Figure 3 The coordinate systems are given in the figure.

[0057] Figure 2 The mechanical functional component 14 schematically shown in the figure is a z-drive, which can have, for example, a piezoelectric actuator (not shown in the figure) with which the holding frame 12 can be adjusted in the direction of the z-axis, as indicated by the double arrow Δz. Figure 2 In the situation schematically shown in FIG, the z drive 14 should be in the starting position, which can in particular be the middle or the deepest possible position of the z drive 14. The holding frame 12 is placed on the z drive 14, which is itself fixed to the sample stage 10 with screws 15. The axial height between the upper side of the holding frame 12 and the lower side of the sample stage 10 is Figure 2 This is schematically indicated by the double arrow h2.

[0058] exist Figure 3 Instead of the z drive 14, a mechanical adapter part 16 is present, which forms an adapter frame. The holding frame 12 is inserted into this adapter frame 16. The adapter frame 16 is essentially only used to provide an axial height h3 between the upper side of the holding frame 12 and the lower side of the sample stage 10, which is the same as the height h3 in the axial direction. Figure 2 The axial height h2 is the same as that in the installation condition. Figure 3 In the example shown, the adapter frame 16 is fastened to or in the sample stage 10 via a magnetic connection 17. It is also possible to hold the holding frame 12 on or in the z drive 14 and the adapter frame 16 respectively via a magnetic connection in addition to gravity.

[0059] Figure 4 As schematically indicated, the sample stage 10 , the adapter frame 16 and the holding frame 12 each have an opening 11 through which the microscope objective 3 can view a sample arranged on the holding frame 12 , for example a sample in a culture dish or on a slide.

[0060] It is essential for the invention that the receptacles in the mechanical functional part 14 forming the z-drive and the mechanical adapter part 16 forming the adapter frame for holding the frame 12 are respectively identical, so that they can be adapted for the specific application. Figure 2 and Figure 3 The same holding frame 12 is used for both installation situations. Furthermore, the important advantage is that the height of the holding frame 12 relative to the underside of the sample stage 10 is the same, at least for the initial position of the z-drive, i.e., h2 = h3, regardless of whether the z-drive 14 or the adapter frame 16 is used. The receptacles in the mechanical functional component 14 and the mechanical adapter component 16 can also be referred to as mechanical interfaces.

[0061] The second embodiment of the sample stage system 200 according to the present invention refers to Figures 5 to 15 An important aspect of this embodiment is that the holding frame can be positioned in different positions relative to the sample stage and that the holding frame is therefore either placed only on the sample stage or only on only one mechanical functional component. Specifically:

[0062] Figure 5 The sample stage 20 is schematically shown in a top view. Figure 6 and Figure 7 This sample stage 20 is shown along Figure 5 The section line AA drawn in Figure 7 ) and BB ( Figure 6 ). The sample stage 20 has a plurality of supporting surfaces 21 to 26, which are asymmetrically arranged at one side of the through opening 11. These supporting surfaces 21 to 26 are as shown in FIG. Figure 6 and Figure 7 As can be partially seen in the cross-sectional view of FIG, each of the surfaces is formed to be raised above the remaining surface of the sample stage 20.

[0063] Figure 8 The functional part 30 of the machine is shown. The functional part of the machine can be mounted on Figure 5 The sample stage 20 is shown. The mechanical functional component 30 is as shown in Figure 2 As shown in FIG, it can be screwed onto the sample stage 20, for example. The mechanical functional component 30 should again be designed as a z drive in the embodiment shown, although Figure 8 The z-drive 30 has inwardly pointing support surfaces 31 to 36 , ie, in the direction of the through-opening 11 , which are arranged rotated by 180° compared to the support surfaces 21 to 26 of the sample stage 20 .

[0064] Figure 9 and Figure 10 Shown for and Figures 5 to 7 The sample stage 20 and Figure 8The holding frame 40 is used together with the functional component 30 of the machine, namely the z-drive. The holding frame 40 has, in its extension plane, holding areas 41 to 46, which form outwardly protruding holding tongues 41 to 46 and whose arrangement corresponds, on the one hand, to the arrangement of the support surfaces 21 to 26 of the sample stage 20 and, on the other hand, to the arrangement of the support surfaces 31 to 36 of the z-drive 30. Figure 10 Shown and Figure 9 The same holding frame, but in a position rotated by 180° about an axis of rotation parallel to the z-direction.

[0065] Then Figures 11 to 13 3 , a sample stage 20 and a mechanical functional component 30 arranged thereon, namely a z-drive 30 , are shown. Figure 11 A top view is shown looking towards the negative z-axis and Figure 12 and Figure 13 Shown are the Figure 11 The section line CC drawn in Figure 13 ) and DD ( Figure 12 As can be seen in detail, the support surfaces 21 to 26 of the sample stage 20 and the support surfaces 31 to 36 of the z-drive each have the same axial height, which is indicated by the double arrow h4.

[0066] Figure 14 The top view then shows the arrangement of the holding frame 40 such that the holding tongues 41 to 46 of the holding frame 40 rest only on the support surfaces 21 to 26 of the sample stage 20. Consequently, in this situation, the holding frame 40 cannot be adjusted in the z direction using the z drive 30.

[0067] Figure 15 Finally, an arrangement is shown in which the holding frame 40 is Figure 14 The situation is twisted 180° around the axis of rotation parallel to the z direction and is now only placed on the support surfaces 31 to 36 of the z drive 30. This means that Figure 15 In the case of , the z drive 30 can be used to adjust the holding frame 40 in the z direction.

[0068] A variation of the second embodiment is shown in FIG. Figure 16 and Figure 17 This variant relates to a situation in which Figure 13 Unlike the example shown in the figure, the support surface at the functional part of the machine and the support surface at the sample stage are not at the same height. To take this into account, Figure 16 and Figure 17 In the embodiment shown in FIG, the retaining tongues of the retaining frame 140 each have a step. Figure 16 and Figure 171 and 2 show such a retaining tongue 141 , which, as can be seen, has a step with a height d4 , so that two supporting surfaces 142 and 143 are formed at different heights on this retaining tongue 41 .

[0069] exist Figure 16 In the situation shown, the functional component 130 of the machine, such as the z-drive, is again arranged, for example screwed, on the sample stage 120. The holding frame 140 rests with the support surface 142 of the holding tongue 141 on the support surface 131 of the functional component 130 of the machine. This results in a height h5 of the holding frame 140 above the underside of the sample stage 120, which in turn is Figure 16 As shown, it consists of components d1, d2 and d3.

[0070] Figure 17 Shows another plane cross-sectional view and retaining frame 140 with Figure 16 Compared with the situation Figure 14 and Figure 15 The holding frame 140 now rests with the support portion 143 of the holding tongue 141 only on the support surface of the sample stage 120 . Figure 17 An example of such a support surface 121 is shown. The height d4 of the step of the retaining tongue is formed in such a way that, by the distances d5 and d6, the retaining frame 140 rests only on the support surface of the functional component 130 of the machine. Figure 16 The same height h5, that is:

[0071] d1 + d2 + d3 = d5 + d6 = h5

[0072] The present invention provides a novel sample stage system that requires fewer components. This is because there is no need to develop separate holding frames for additional modules and, consequently, for each functional component of the machine. The reduction in the number of components also reduces manufacturing costs. Consequently, development effort is reduced, as the uniform sample height that can be achieved eliminates the need for specialized processing chambers.

[0073] It is therefore important that the customer can use the same holding frame both with the sample stage and with the mechanical functional components, ie the additional components, and therefore only has to pay for one holding frame.

[0074] The mechanical interface, ie the sample support surface, can be identical regardless of whether additional modules or mechanical functional components are used.

[0075] When using the additional component, accessibility to the sample is therefore not restricted compared to operation without such additional components.

[0076] Finally, the second embodiment described above also provides a variant in which the user can simply switch between using the holding frame directly on the sample stage or in conjunction with mechanical functional components without modifications or tools.

[0077] Reference Signs List

[0078] 1 microscope

[0079] 2 samples

[0080] 3 microscope objectives

[0081] 4 microscope stands

[0082] 5 sample stages, xy moving stages

[0083] 6. Keep the frame

[0084] 7 eyepieces

[0085] 9Control Unit

[0086] 10 sample stages, xy moving stages

[0087] 11 Openings in the holding frame 12, 40, adapter frame 16, 30, z drive 14, sample stage 10, 20

[0088] 12. Keep the frame

[0089] 14 Mechanical functional parts, z drive

[0090] 15 screws

[0091] 16 Mechanical adapter parts, adapter frames

[0092] 17 Magnet connection part

[0093] 20 sample stages

[0094] 21~26 are the supporting surfaces at the sample stage 20

[0095] 30 Mechanical functional parts, z drive

[0096] 31~36 are support surfaces at the z drive 30

[0097] 40 Keep Frame

[0098] 41~46 holding area, holding tongue-shaped member at holding frame 40

[0099] 100 System according to the present invention

[0100] 120 sample table

[0101] 121 Support surface at sample stage 120

[0102] 130 Mechanical functional parts, z drive

[0103] 131 Support surface on the functional component 130 of the machine

[0104] 140 holding frame

[0105] 141 Retaining tongue at retaining frame 140

[0106] 142 First bearing surface at the retaining tongue 141

[0107] 143 Second bearing surface at the retaining tongue 141

[0108] 200 System according to the present invention

[0109] A cutting line

[0110] B cutting line

[0111] C cutting line

[0112] D cutting line

[0113] d1 Thickness of sample stage 120

[0114] d2 Thickness of the functional component 130 of the machine

[0115] d3 Thickness of the holding frame 140 in the region of the support surface 142

[0116] d4 Axial height of the step between the support surfaces 142 and 143

[0117] d5 Axial distance from the lower side of the sample stage 120 to the upper side of the support surface 121 of the sample stage 120

[0118] d6: Thickness of the holding frame 140

[0119] h Axial distance from the reference point on the bracket 4 to the upper edge of the holding frame 6

[0120] h2: Axial distance between the lower side of the sample stage 10 and the upper side of the holding frame 12 when the functional component 14 is used

[0121] h3: Axial distance from the bottom of the sample stage 10 to the top of the holding frame 12 when the adapter part 16 is used

[0122] h4 Axial distance between the bottom side of the sample stage 20 and the top side of the support surface 21 to 26 or 31 to 36

[0123] h5: the axial distance between the upper side of the holding frame 140 and the lower side of the sample stage 120

[0124] x, y, z right-handed coordinate system

[0125] z direction of the optical axis

[0126] Δz can be changed in the z direction by operating the z drive 14

Claims

1. A sample stage system (100; 200) for a microscope, the sample stage system having Sample stage (10; 20), A holding frame (12; 40) for accommodating a sample (2), wherein The holding frame (12; 40) is designed to be arranged on the sample stage (10; 20), wherein the axial spatial direction (z) is given by the normal direction of the extension plane of the holding frame (12; 40), It is characterized in that The holding frame (12) is designed to be arranged on the sample stage (10) either together with a mechanical adapter part (16) or together with a mechanical functional part (14) for mechanically operating the holding frame (12). wherein the axial height (h2, h3) of the holding frame (12) relative to the sample stage (10) is independent of whether the holding frame (12) is arranged on the sample stage (10) together with the adapter part (16) of the machine or together with the functional part (14) of the machine, and is at least the same for the starting position of the functional part (14) of the machine, or The holding frame (40) is designed to be arranged on the sample stage (20) either alone or together with a mechanical functional component (30) for mechanically operating the holding frame (40), The axial height (h2, h3) of the retaining frame (40) relative to the sample stage (20) is independent of whether the retaining frame (40) is arranged on the sample stage (20) alone or together with the functional component (30) of the machine, and is the same at least for the starting position of the functional component (30) of the machine.

2. The sample stage system according to claim 1, It is characterized in that The mechanical adapter component is formed by an adapter frame (16), which is designed to be inserted between the sample stage (10) and the holding frame (12) in order to adjust the axial height (h2, h3) of the holding frame (12) relative to the sample stage (10).

3. The sample stage system according to claim 1 or 2, It is characterized in that The adapter frame has a plurality of parts or is formed from a plurality of parts, for example thin rods.

4. The sample stage system according to any one of claims 1 to 3, It is characterized in that The mechanical functional component (14; 30) has a z-drive for adjusting the axial height (h2, h3) of the holding frame (12; 40) above the sample stage (10; 20).

5. The sample stage system according to any one of claims 1 to 4, It is characterized in that The functional part (14; 30) of the machine has means for changing the orientation of the holding frame (12; 40) relative to the sample stage (10; 20), such as leveling screws.

6. The sample stage system according to any one of claims 1 to 5, It is characterized in that The mechanical functional component (14) can be firmly connected to the sample stage (10; 20), for example screwed.

7. The sample stage system according to any one of claims 1 to 6, It is characterized in that The holding frame (12; 40) is placed on the functional component (14; 30) of the machine or on the adapter component (16) of the machine and is held there by gravity.

8. The sample stage system according to any one of claims 1 to 7, It is characterized in that A magnetic connection exists between the holding frame (12; 40) and the functional component (14; 30) of the machine or the adapter component (16) of the machine.

9. The sample stage system according to any one of claims 1 to 8, It is characterized in that The holding frame (12; 40) and / or the opening in the holding frame (12; 40), the sample stage (10; 20), the adapter part (16) of the machine and / or the functional part (14; 30) of the machine is disk-shaped, rectangular, in particular square or has a shape that is in particular a regular polygon.

10. The sample stage system according to any one of claims 1 to 9, It is characterized in that At least three, in particular outwardly protruding, retaining areas (41, ..., 46) are formed on opposite sides of the retaining frame (40), and are designed to be engaged either only with a support surface (21, ..., 26) formed on the sample table (20) or only with a support surface (31, ..., 36) formed on a functional component (30) of the machine.

11. The sample stage system according to claim 10, It is characterized in that The holding regions (41, . . . , 46) extend outward in an extension plane of the holding frame (40).

12. The sample stage system according to claim 10 or 11, It is characterized in that The holding frame (40) is rectangular and has a different number of holding areas (41, . . . , 46) on opposite sides.

13. The sample stage system according to any one of claims 10 to 12, It is characterized in that A holding area (46) or a plurality of holding areas (41, 42) on one side of the holding frame (40) are respectively arranged offset relative to a plurality of holding areas (43, 44) or a holding area (45) on respectively opposite sides of the holding frame (40).

14. The sample stage system according to any one of claims 10 to 13, It is characterized in that The supporting surfaces (21, ..., 26) on the sample stage (20) and the supporting surfaces (31, ..., 36) on the functional component (30) of the machine have at least twofold rotational symmetry as a whole about an axis of rotation parallel to the axial direction.

15. The sample stage system according to any one of claims 10 to 14, It is characterized in that In a functional component (30) of a machine mounted on the sample stage (20), the holding frame (40) rests with its holding areas (41, ..., 46) only on the supporting surface (21, ..., 26) of the sample stage (20) in a first position, and In the second position, the holding frame (40) rests with its holding areas (41, ..., 46) only on the support surfaces (31, ..., 36) of the functional component (30) of the machine, Wherein, in the first position and the second position, the axial height of the retaining frame (40) relative to the sample stage (20) is the same at least in the starting position of the functional component (30) of the machine.

16. The sample stage system according to any one of claims 10 to 15, It is characterized in that In the second position, the holding frame (40) is rotated compared to the first position about a rotation axis parallel to the axial spatial direction (z), in particular by an angle of 180°.

17. The sample stage system according to any one of claims 10 to 16, It is characterized in that The support surface (21, . . . , 26) is formed by a magnet or comprises a magnet in the sample stage (10; 20) and / or in the functional component (14, 16; 30) of the machine.

18. The sample stage system according to any one of claims 10 to 17, It is characterized in that The supporting surfaces (21, . . . , 26) of the sample stage (20) form a raised area on the sample stage (20).

19. The sample stage system according to any one of claims 10 to 18, It is characterized in that When the functional component (30) of the machine is arranged as specified on the sample stage, the support surface (21, ..., 26) on the sample stage (20) and the support surface (31, ..., 36) on the functional component (30) of the machine have the same axial height (h4) relative to the bottom side of the sample stage (20).

20. The sample stage system according to any one of claims 10 to 18, It is characterized in that When the mechanical functional component (30) is arranged as specified on the sample stage, the support surface (121) on the sample stage (120) and the support surface (131) on the mechanical functional component (130) have different axial heights relative to the underside of the sample stage (20).

21. The sample stage system according to claim 20, It is characterized in that The retaining regions (141) each have two supporting surfaces (142, 143), which are separated in the axial direction (z) by a step (d4).

22. The sample stage system according to claim 20 or 21, It is characterized in that The height difference between the support surface (121) on the sample stage (120) and the support surface (131) on the functional component (130) of the machine is as great as the height (d) of the step of the holding area (141).

23. Microscope having a sample stage system according to any one of claims 1 to 22.

24. The microscope according to claim 23, The microscope forms an inverted microscope.

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