A flicker meter model calibration method, device and medium

Abstract

The application discloses a flicker meter model calibration method and device and medium; it relates to the field of wind turbine, and is used for solving the problem that there is currently a lack of verification and calibration scheme for the flicker meter model. The application sets parameters according to the voltage and frequency conditions of the actual application grid environment of the flicker meter, generates input voltage signals corresponding to different test items, and judges whether the test conditions are met according to the output signals. This enables the flicker meter to operate stably under various actual working conditions and adapt to different grid environments and application scenarios. When the current gain K value does not meet the test conditions, the gain K value is adjusted within the preset gain range, and it must be ensured that the output signals corresponding to each test item meet the test conditions, thereby realizing the calibration of the flicker meter model and ensuring the consistency of the models of different building platforms and hardware selection in the measurement results, so as to guarantee the working precision requirements of the generated flicker meter.

Description

Technical Field

[0001] This application relates to the field of wind turbines, and in particular to a flicker meter model calibration method, apparatus and medium. Background Technology

[0002] A flicker meter is an instrument specifically designed to measure voltage fluctuations and flicker. It is primarily used to assess the impact of voltage variations in a power supply system on light flicker, ensuring that power quality meets standards. The measurement results of a flicker meter directly affect the operational safety of the power system and the user's electricity experience. Therefore, the accuracy and reliability of flicker meters are of paramount importance.

[0003] Currently, before flicker meter production, a model needs to be built to verify whether its performance meets design requirements. However, due to differences in the selection of the building platform, demodulator, and filters, the built models may vary. Therefore, calibration is required to ensure the accuracy and reliability of the measurement results. However, there is currently a lack of standardized procedures for verifying and calibrating flicker meter models, which may lead to differences in the built models.

[0004] Therefore, providing a solution for calibrating flicker meter models is a technical problem that urgently needs to be solved by those in the field. Summary of the Invention

[0005] The purpose of this application is to provide a flicker meter model calibration method, apparatus, and medium to address the current lack of a verification and calibration scheme for flicker meter models.

[0006] To address the aforementioned technical problems, this application provides a flicker meter model calibration method, comprising:

[0007] Obtain the initial gain K value, test power frequency, and test voltage of the flicker meter model;

[0008] Based on the test power frequency and the test voltage, input voltage signals corresponding to different test items are generated;

[0009] Different input voltage signals are input to the flicker model;

[0010] Determine whether the test conditions corresponding to the current test item are met based on the different output signals of the flicker meter model.

[0011] If not, adjust the gain K value within the preset gain range until the output signal corresponding to each test item meets the corresponding test conditions;

[0012] The model corresponding to the final gain K value is taken as the flicker meter model result.

[0013] As an optional solution, the above flicker meter model calibration method includes obtaining the test power frequency and test voltage, including:

[0014] Acquire multiple test frequencies and multiple test voltages;

[0015] Multiple test combination conditions are obtained based on multiple test power frequencies and multiple test voltages;

[0016] Correspondingly, generating input voltage signals corresponding to different test items based on the test power frequency and the test voltage includes:

[0017] Based on the test combination conditions, generate multiple input voltage signals corresponding to each test item.

[0018] As an optional solution, in the above flicker meter model calibration method, the test items are sinusoidal and rectangular voltage change tests;

[0019] Correspondingly, generating multiple input voltage signals corresponding to each test item under the test combination conditions includes:

[0020] Generate corresponding sinusoidal voltage signals and rectangular voltage signals based on the test combination conditions described in each group;

[0021] Correspondingly, based on the different output signals of the flicker meter model, it is determined whether the test conditions corresponding to the current test item are met, including:

[0022] The flicker model receives multiple sets of flicker instantaneous values ​​output by the model when the sinusoidal voltage signal or the rectangular voltage signal corresponding to each test combination condition is used as the input voltage signal;

[0023] Determine whether the maximum value of the instantaneous flicker value in each group is within 1 ± 8%;

[0024] If so, then the test conditions corresponding to the current test item are met;

[0025] If not, then the test conditions corresponding to the current test item are not met.

[0026] As an optional approach, in the above flicker meter model calibration method, the test items are rectangular voltage change and performance testing;

[0027] Correspondingly, generating multiple input voltage signals corresponding to each test item under the test combination conditions includes:

[0028] Based on each set of test combination conditions and multiple preset short-time flicker values, generate multiple corresponding rectangular voltage test signals;

[0029] Correspondingly, based on the different output signals of the flicker meter model, it is determined whether the test conditions corresponding to the current test item are met, including:

[0030] Receive multiple short-time flicker output values ​​output by the flicker meter model when each rectangular voltage test signal is used as an input voltage signal;

[0031] Determine whether the deviation between each short-time flicker output value and the corresponding preset short-time flicker value is within 5%;

[0032] If so, then the test conditions corresponding to the current test item are met;

[0033] If not, then the test conditions corresponding to the current test item are not met.

[0034] As an optional solution, in the above flicker meter model calibration method, the test item is a combination test of frequency and voltage change;

[0035] Correspondingly, generating multiple input voltage signals corresponding to each test item under the test combination conditions includes:

[0036] Based on the test combination conditions described in each group, as well as the preset fluctuation frequency and preset fluctuation voltage, multiple corresponding fluctuation voltage signals are generated.

[0037] Correspondingly, based on the different output signals of the flicker meter model, it is determined whether the test conditions corresponding to the current test item are met, including:

[0038] Receive multiple sets of instantaneous flicker values ​​output by the flicker meter model when each of the fluctuating voltage signals is used as input voltage signals;

[0039] Determine whether the maximum value of the instantaneous flicker value in each group is within 1 ± 8%;

[0040] If so, then the test conditions corresponding to the current test item are met;

[0041] If not, then the test conditions corresponding to the current test item are not met.

[0042] As an optional solution, in the above flicker meter model calibration method, the test item is voltage distortion multiple zero-crossing test;

[0043] Correspondingly, generating multiple input voltage signals corresponding to each test item under the test combination conditions includes:

[0044] Based on the test combination conditions described in each group, as well as the preset voltage fluctuation value, preset voltage amplitude, and preset harmonic order, multiple cross-distortion voltage signals are generated accordingly.

[0045] Correspondingly, based on the different output signals of the flicker meter model, it is determined whether the test conditions corresponding to the current test item are met, including:

[0046] Receive multiple sets of flicker instantaneous values ​​output by the flicker model when each cross-distortion voltage signal is used as an input voltage signal;

[0047] Determine whether the maximum value of the instantaneous flicker value in each group is within 1 ± 8%;

[0048] If so, then the test conditions corresponding to the current test item are met;

[0049] If not, then the test conditions corresponding to the current test item are not met.

[0050] As an optional solution, in the above flicker meter model calibration method, the test item is the harmonic and interharmonic modulation bandwidth test;

[0051] Correspondingly, generating multiple input voltage signals corresponding to each test item under the test combination conditions includes:

[0052] Multiple modulation frequency pairs are determined based on the test combination conditions and preset frequency step size for each group;

[0053] Based on each of the modulation frequency pairs, a plurality of modulation signals consisting of two sine waves with a frequency difference of 10 Hz are determined;

[0054] Multiple modulation voltage signals are obtained based on each modulation signal and its corresponding fundamental signal;

[0055] Correspondingly, based on the different output signals of the flicker meter model, it is determined whether the test conditions corresponding to the current test item are met, including:

[0056] Receive multiple sets of flicker instantaneous values ​​output by the flicker meter model when each modulated voltage signal is used as an input voltage signal;

[0057] Determine whether the maximum value of the instantaneous flicker value in each group is within 1 ± 8%;

[0058] If so, then the test conditions corresponding to the current test item are met;

[0059] If not, then the test conditions corresponding to the current test item are not met.

[0060] As an optional solution, in the above flicker meter model calibration method, the test item is the phase angle jump test;

[0061] Correspondingly, generating multiple input voltage signals corresponding to each test item under the test combination conditions includes:

[0062] Multiple phase angle jump voltage signals are generated based on the test combination conditions, preset phase jump angle, preset phase jump time, and preset short-time flicker value for each group.

[0063] Correspondingly, based on the different output signals of the flicker meter model, it is determined whether the test conditions corresponding to the current test item are met, including:

[0064] Receive the short-time flicker output value and multiple sets of flicker instantaneous values ​​output by the flicker meter model when each phase angle jump voltage signal is used as the input voltage signal;

[0065] Determine whether the difference between the short-time flicker output value and the preset short-time flicker value is within 5%, and whether the maximum value of each group of flicker instantaneous values ​​is within 1 ± 8%.

[0066] If so, then the test conditions corresponding to the current test item are met;

[0067] If not, then the test conditions corresponding to the current test item are not met.

[0068] As an optional solution, in the above flicker meter model calibration method, the test item is a rectangular voltage change test with a duty cycle of 20%;

[0069] Correspondingly, generating multiple input voltage signals corresponding to each test item under the test combination conditions includes:

[0070] A rectangular modulation signal is generated based on a preset frequency, a preset short-time flicker value, and a duty cycle of 20%.

[0071] Based on each set of test combination conditions, multiple modulation fundamental signals are generated from the rectangular modulation signal;

[0072] Correspondingly, based on the different output signals of the flicker meter model, it is determined whether the test conditions corresponding to the current test item are met, including:

[0073] Receive multiple short-time flicker output values ​​output by the flicker model when each of the modulated fundamental signals is used as the input voltage signal;

[0074] Determine whether the deviation between each short-time flicker output value and the corresponding preset short-time flicker value is within 5%;

[0075] If so, then the test conditions corresponding to the current test item are met;

[0076] If not, then the test conditions corresponding to the current test item are not met.

[0077] As an optional solution, in the above flicker meter model calibration method, adjusting the gain K value within a preset gain range includes:

[0078] Obtain the preset gain range;

[0079] The gain K value is updated to the median value of the gain range using a binary search method.

[0080] When a test item fails, the direction of gain adjustment is determined based on the error direction of the output signal;

[0081] The updated gain range is determined based on the gain adjustment direction and the updated gain K value.

[0082] If the updated gain K value does not meet the test conditions, then based on the updated gain range, return to the step of updating the median value of the gain range to the gain K value using the binary search method; until the updated gain K value satisfies the corresponding test conditions for the output signal of each test item.

[0083] To address the aforementioned technical problems, this application also provides a flicker meter model calibration device, comprising:

[0084] The acquisition module is used to acquire the pre-built flicker model and its initial gain K value, test power frequency, and test voltage.

[0085] The input signal determination module is used to generate input voltage signals corresponding to different test items based on the test power frequency and the test voltage.

[0086] The input module is used to input different input voltage signals to the flicker model;

[0087] The judgment module is used to determine whether the test conditions corresponding to the current test item are met based on the different output signals of the flicker meter model; if not, the adjustment module is triggered.

[0088] An adjustment module is used to adjust the gain K value within a preset gain range until the output signal corresponding to each test item meets the corresponding test conditions.

[0089] The output module is used to output the final gain K value.

[0090] To address the aforementioned technical problems, this application also provides a flicker meter model calibration device, comprising:

[0091] Memory, used to store computer programs;

[0092] A processor is used to implement the steps of the above-described flicker model calibration method when executing the computer program.

[0093] To address the aforementioned technical problems, this application also provides a computer-readable storage medium storing a computer program, which, when executed by a processor, implements the steps of the aforementioned flicker meter model calibration method.

[0094] The flicker model calibration method provided in this application sets parameters based on the voltage and frequency conditions of the power grid environment in which the flicker is actually applied, to generate input voltage signals corresponding to different test items, and determines whether the test conditions are met based on the output signal. This enables the flicker to operate stably under various actual operating conditions, adapting to different power grid environments and application scenarios. Furthermore, when the current gain K value does not meet the test conditions, the gain K value is adjusted within a preset gain range. It is essential to ensure that the output signal corresponding to each test item meets the test conditions, thereby achieving flicker model calibration and ensuring consistency in measurement results across models with different construction platforms and hardware selections, thus guaranteeing the required working accuracy of the generated flicker.

[0095] In addition, this application also provides an apparatus and medium that correspond to the above-mentioned flicker meter model calibration method and have the same effect. Attached Figure Description

[0096] To more clearly illustrate the embodiments of this application, the accompanying drawings used in the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0097] Figure 1 This is a schematic diagram of a flicker meter model;

[0098] Figure 2 This application provides a flowchart of a flicker meter model calibration method for this embodiment;

[0099] Figure 3 A structural diagram of a flicker meter model calibration device provided in an embodiment of this application;

[0100] Figure 4 This is a structural diagram of another flicker meter model calibration device provided in an embodiment of this application. Detailed Implementation

[0101] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, and not all embodiments. Based on the embodiments of this application, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of this application.

[0102] The core of this application is to provide a method, apparatus, and medium for calibrating a flicker meter model.

[0103] To enable those skilled in the art to better understand the present application, the present application will be further described in detail below with reference to the accompanying drawings and specific embodiments.

[0104] The purpose of this application is to calibrate a flicker meter model and perform power quality analysis. Figure 1 This is a schematic diagram of a flicker meter model, such as... Figure 1 As shown, the circuit is built according to the International Electrotechnical Commission (IEC) standard IEC61000-4-15. Module 1 is a voltage input circuit that implements input adaptation and self-test signals. It should be able to accept a wide range of nominal mains voltage inputs and consists of a voltage adapter and a self-test signal generator. The voltage adapter adjusts the acquired signal to the voltage value of the instrument's internal reference level. This automatic gain control function can modulate the voltage level at a constant reference value at the input of Module 2 without modifying the relative fluctuations in modulation.

[0105] Module 2 is used to simulate the function of a lamp. It demodulates the power frequency signal through a square demodulator to display an amplitude-modulated wave containing voltage fluctuation signals. The collected fluctuating voltage is separated by the square demodulator to obtain a voltage fluctuation component that is proportional to the amplitude of the amplitude-modulated wave. This component reflects the relationship between changes in lamp illuminance and voltage fluctuations.

[0106] Module 3 simulates the function of the human eye, filtering out amplitude-modulated waves of voltage fluctuations perceived by the eye using a bandpass filter. This module consists of a bandpass filter and a visual sensitivity weighted filter, simulating the frequency selectivity characteristics of human vision. The bandpass filter comprises a first-order high-pass filter with a cutoff frequency of 0.05Hz and a sixth-order Butterworth low-pass filter at 35Hz, suppressing the DC component and carrier harmonics in the voltage signal after square demodulation. The visual sensitivity weighted filter simulates the sensitivity of the human visual system to voltage fluctuations of an incandescent lamp at different frequencies; that is, it assigns different weights to the amplitude-modulated wave signal within the visual frequency range according to the amplitude-frequency characteristics, measuring voltage fluctuations based on the lamp-eye-brain sensitivity.

[0107] The transfer function HP(s) of the first-order high-pass filter with a cutoff frequency of 0.05Hz, with s as the independent variable, is shown in the following equation:

[0108] (1)

[0109] In the formula, ω represents the cutoff frequency. .

[0110] The transfer function H of a sixth-order Butterworth low-pass filter with a cutoff frequency of 35Hz lp (s) is shown in the following formula:

[0111] (2)

[0112] In the formula, ω represents the cutoff frequency. b i Denotes the coefficients of the Butterworth polynomial. .

[0113] The transfer function of the visual perception weighted filter is shown in the following equation:

[0114] (3)

[0115] In the formula, K is a constant used to adjust the gain of the filter. λ is a parameter used to adjust the damping of the filter. , These are the angular frequency parameters of the filter, which determine the filter's frequency response characteristics. , , .

[0116] Module 4 is used to simulate the human brain and consists of a squarer and a moving average filter. The square of the signal after weighted filtering by Module 3 simulates nonlinear eye-brain perception; a first-order low-pass filter with a time constant of 300ms acts as a smoothing agent, simulating the human memory storage effect. The transfer function LP(s) of the first-order low-pass smoothing filter is shown in the following equation:

[0117] (4)

[0118] In the formula, τ represents the time constant. .

[0119] After passing through the above four modules, the instantaneous flicker visual perception, namely the flicker instantaneous value Pinst, is output, which reflects the degree to which human vision perceives the instantaneous flicker of voltage fluctuations.

[0120] The main function of module 5 is statistical analysis. It performs cumulative probability distribution calculations and statistics on the large number of Pinst values ​​output by module 4, and outputs the corresponding 10-minute short-time flicker value Pst.

[0121] IEC61000-4-15 specifies the use of formula (5) to calculate short-time flicker values. During the flicker adaptability test, the instantaneous flicker visual sensitivity output by the flicker meter is processed in an incremental grade. The probability histogram of the ratio of each level of instantaneous flicker visual sensitivity to the total detection time is calculated. Then, the probability distribution level smoothing value of the time ratio exceeding 0.1%, 1%, 3%, 10% and 50% within 10 minutes is obtained using the Cumulative Distribution Function (CDF).

[0122] (5)

[0123] In the formula, 0.0314, 0.0525, 0.0657, 0.28, and 0.08 are fixed weighting coefficients; P 0.1 P 1s P 3s P 10s P 50s These correspond to visual perception levels where Pinst exceeds 0.1%, 1%, 3%, 10%, and 50% of the time ratio within 10 minutes, respectively. IEC specifies that only P... 1s P 3s P 10s P 50s Smoothing is required (the subscript 's' indicates that smoothing has been performed), P 0.1 Take the raw percentile value directly; smoothing is not required. It can be calculated using the following formula.

[0124] ;

[0125] ;

[0126] ;

[0127] ;

[0128] P 0.7 P1, P 1.5 P 2.2 P3, P4, P6, P6, P 10 P 13 P 17 P 30 P 50 P 80 These represent the raw percentile values ​​for the time periods when Pinst exceeded 0.7%, 1%, 1.5%, 2.2%, 3%, 4%, 6%, 8%, 10%, 13%, 17%, 30%, 50%, and 80%, respectively.

[0129] The 0.3s memory time constant in the flicker meter ensures Since it cannot change suddenly, there is no need to smooth this percentile.

[0130] After establishing the flicker meter model through the above steps, this embodiment provides a flicker meter model calibration method in order to calibrate the flicker meter model, such as... Figure 2 As shown, it includes:

[0131] S11: Obtain the initial gain K value, test power frequency, and test voltage of the flicker model;

[0132] S12: Generate input voltage signals corresponding to different test items based on the test power frequency and test voltage;

[0133] S13: Input different input voltage signals to the flicker model;

[0134] S14: Determine whether the test conditions corresponding to the current test item are met based on the different output signals of the flicker meter model;

[0135] S15: If not, adjust the gain K value within the preset gain range until the output signal corresponding to each test item meets the corresponding test conditions.

[0136] S16: Use the model corresponding to the final gain K value as the flicker model result.

[0137] This application is applicable to scenarios such as grid connection testing of wind turbine generator sets, factory / periodic calibration of power quality assessment laboratories or field flicker testers.

[0138] In step S11, the initial gain K value refers to the constant K used to adjust the gain of the visual sensitivity weighted filter. It directly affects the model's sensitivity to voltage fluctuations.

[0139] The test power frequency f_line refers to the fundamental frequency of the power grid, which can be 50Hz or 60Hz, or other selectable frequencies. The test voltage u_line refers to the effective value of the fundamental frequency, which can be 120V or 230V, or other selectable voltage values. The settings are typically configured according to the flicker meter's operating environment. The test power frequency and test voltage can be combined arbitrarily to obtain different test conditions. Testing can be performed under a single condition or under all possible operating conditions.

[0140] The test items mentioned in step S12 refer to test schemes designed under typical disturbance conditions conforming to the standard. These can be one or more items, depending on actual needs. The input voltage signal can be generated by compiling scripts using Matlab (Matrix Labs) or Simulink (a visualization simulation tool), reproducing all disturbance patterns specified in the standard in a digital simulation environment, providing repeatable test stimuli for the flicker meter model.

[0141] Step S13 inputs different input voltage signals into the flicker model, which is then used to create the flicker model. Figure 1 The model structure shown outputs a signal consisting of an instantaneous flicker value (Pinst) and a short-term flicker value (Pst) over 10 minutes. In this step, the test voltage can be fed into the model via a Simulink data stream to achieve online response calculation for the "virtual flicker meter."

[0142] Step S14 determines whether the test conditions corresponding to the current test item are met based on the different output signals of the flicker meter model. The judgment criteria are divided into two categories according to IEC requirements: requirements for Pinst (instantaneous flicker value) and requirements for Pst (short-term flicker value). If any test point is not met, it is marked as a failure, triggering subsequent gain adjustment.

[0143] In step S15, the preset gain range refers to the adjustment range of the gain K value, which is usually derived from engineering experience in order to reduce the adjustment range and reduce the amount of calculation.

[0144] Step S16 takes the model corresponding to the final gain K value as the flicker meter model result. The final K value can be understood as the optimal gain that uniquely satisfies all tests. This K value is written into the flicker meter model parameter table, thus completing the calibration.

[0145] The flicker model calibration method provided in this embodiment sets parameters based on the voltage and frequency conditions of the power grid environment in which the flicker is actually applied, to generate input voltage signals corresponding to different test items, and determines whether the test conditions are met based on the output signal. This enables the flicker to operate stably under various actual operating conditions, adapting to different power grid environments and application scenarios. When the current gain K value does not meet the test conditions, the gain K value is adjusted within a preset gain range. It is essential to ensure that the output signal corresponding to each test item meets the test conditions, thereby achieving flicker model calibration and ensuring consistency in measurement results across models with different construction platforms and hardware selections, thus guaranteeing the required working accuracy of the generated flicker.

[0146] If the flicker meter model is calibrated for only a single operating condition, its gain K may no longer be applicable under other operating conditions, leading to systematic deviations in field grid-connected testing. Therefore, all possible grid operating conditions must be included in the calibration cycle to ensure the model's consistency across different grid scenarios globally. Specifically, obtaining the test power frequency and test voltage includes:

[0147] Acquire multiple test frequencies and multiple test voltages;

[0148] Multiple test combinations are obtained based on multiple test frequencies and multiple test voltages;

[0149] Correspondingly, input voltage signals for different test items are generated based on the test power frequency and test voltage, including:

[0150] Based on the test combination conditions, generate multiple input voltage signals corresponding to each test item.

[0151] In one alternative approach, multiple test frequencies specifically refer to 50Hz and 60Hz; multiple test voltages specifically refer to 120V and 230V; resulting in four sets of test combination conditions (50Hz / 120V, 50Hz / 230V, 60Hz / 120V, 60Hz / 230V). (This embodiment and the following embodiments use four test combination conditions as examples.) Currently, each test item requires generating corresponding input signals for each of the four operating conditions.

[0152] In this step, a matrix test involving multiple operating conditions and multiple items can be used to simultaneously verify the robustness of gain K to frequency and voltage amplitude. Because IEC61000-4-15 requires the same flicker meter to meet accuracy at both 50Hz / 230V and 60Hz / 120V, all potential field operating conditions are covered during the calibration phase to avoid subsequent repeated calibration or field correction, thereby improving the versatility and reliability of a single calibration.

[0153] It should be noted that the multiple test frequencies are not limited to 400Hz aviation power grid or 16.7Hz railway power grid. As long as the standard provides the corresponding test table, the combination conditions can be added according to the same process. Similarly, the multiple test voltages are not limited to 120V / 230V. If the standard adds industrial voltages such as 277V and 480V in the future, it is only necessary to add the new voltage values ​​to the enumeration list. The overall calibration framework does not need to be changed.

[0154] According to the above embodiments, the specific test items are sinusoidal and rectangular voltage change tests;

[0155] Correspondingly, multiple input voltage signals are generated for each test item based on the test combination conditions, including:

[0156] Generate corresponding sinusoidal voltage signals and rectangular voltage signals based on each set of test combination conditions;

[0157] Correspondingly, the test conditions for the current test item are determined based on the different output signals of the flicker meter model, including:

[0158] The flicker model receives multiple sets of flicker instantaneous values ​​output by the sinusoidal or rectangular voltage signal corresponding to each test combination condition as the input voltage signal;

[0159] Determine whether the maximum value of each group of flicker instantaneous values ​​is within 1 ± 8%;

[0160] If so, then the test conditions corresponding to the current test item are met;

[0161] If not, then the test conditions corresponding to the current test item are not met.

[0162] This embodiment focuses on the specific test item of "sine and rectangular voltage change test", and further refines the generation method and judgment logic of voltage signal under the framework of "multiple test combination conditions".

[0163] For each set of "test combination conditions", generate a "sine voltage signal" and a "rectangular voltage signal" respectively; send all the generated input voltage signals into the flicker model in sequence and record the "flicker instantaneous value Pinst" output by the model; take the maximum value of each Pinst and compare it with the tolerance range of 1±8% to determine whether the current gain K passes this test item.

[0164] For example:

[0165] %sine voltage signal;

[0166] u=u_line.*(1+Vm(i).*sin(2.*pi*fi(i).*t)).*sin(2.*f_line.*pi.*t);

[0167] % Rectangular voltage signal;

[0168] u=u_line.*(1+Vm(i).*sign(sin(2.*pi*fi(i).*t))).*sin(2.*f_line.*pi.*t);

[0169] Where f_line and u_line are filled in according to the test combination conditions, and Vm and fi are the voltage fluctuation values ​​and frequencies of the corresponding f_line and u_line in IEC61000-4-15.

[0170] If the maximum Pinst value of a combination is ∈ [0.92, 1.08], then that combination is considered passed; if all combinations pass, the "Sine and Rectangular Voltage Variation Test" is considered passed overall, and the next test item can be continued; if any combination fails, it is immediately marked as a failure, and the gain K adjustment process is triggered. This ensures that the transient accuracy of the flicker meter's sine / rectangular voltage variation test can stably fall within the ±8% tolerance band specified by IEC, regardless of the nominal power grid it is connected to, thereby improving the first-time pass rate of the overall calibration and its adaptability to the field.

[0171] To ensure that the flicker meter has a sufficiently large dynamic input range to accurately assess the positive and negative deviations of the voltage, the specific test items are rectangular voltage change and performance testing.

[0172] Correspondingly, multiple input voltage signals are generated for each test item based on the test combination conditions, including:

[0173] Based on each set of test combination conditions and multiple preset short-time flicker values, multiple rectangular voltage test signals are generated accordingly.

[0174] Correspondingly, the test conditions for the current test item are determined based on the different output signals of the flicker meter model, including:

[0175] The receive flicker model outputs multiple short-time flicker output values ​​when each rectangular voltage test signal is used as the input voltage signal;

[0176] Determine whether the deviation between each short-time flicker output value and the corresponding preset short-time flicker value is within 5%;

[0177] If so, then the test conditions corresponding to the current test item are met;

[0178] If not, then the test conditions corresponding to the current test item are not met.

[0179] This embodiment superimposes all the preset short-time flicker values ​​Pst_set{0.1,0.5,1.0,2.0,3.0,5.0} specified by IEC onto each set of "test combination conditions" to generate the corresponding rectangular voltage test signal. Each signal is input into the flicker meter model to obtain the "short-time flicker output value Pst_out". The relative deviation |(Pst_out−Pst_set) / Pst_set| is calculated for each signal, and it is determined whether it is ≤5%. Only when all 24 signals meet the ±5% tolerance is the "rectangular voltage change and performance test" considered passed; otherwise, the gain K adjustment process is triggered. This makes the rectangular voltage change and performance test a crucial step that can be passed on the first attempt without on-site recalibration, thereby improving the overall calibration efficiency and reliability of the flicker meter.

[0180] For example, compiling a rectangular voltage test signal:

[0181] % Rectangular voltage test signal;

[0182] u=sin(2*pi*f_line*t).*(1+a_mod*1 / 2*sign(sin(2*pi*f_mod*t)));

[0183] Among them, f_mod is calculated to obtain the frequency group based on the number of voltage changes per minute required by IEC61000-4-15, and a_mod is calculated to obtain the voltage fluctuation value under the corresponding preset short-time flicker value Pst.

[0184] To test the flicker meter model loop, according to the above embodiment, the specific test item is a combination test of frequency and voltage change;

[0185] Correspondingly, multiple input voltage signals are generated for each test item based on the test combination conditions, including:

[0186] Based on each set of test combination conditions, as well as the preset fluctuation frequency and preset fluctuation voltage, multiple corresponding fluctuation voltage signals are generated.

[0187] Correspondingly, the test conditions for the current test item are determined based on the different output signals of the flicker meter model, including:

[0188] The flicker meter model outputs multiple sets of flicker instantaneous values ​​when each fluctuating voltage signal is used as the input voltage signal;

[0189] Determine whether the maximum value of each group of flicker instantaneous values ​​is within 1 ± 8%;

[0190] If so, then the test conditions corresponding to the current test item are met;

[0191] If not, then the test conditions corresponding to the current test item are not met.

[0192] The frequency and voltage variation combination specified in IEC61000-4-15 shall be used as the test input signal parameters. The frequency and voltage amplitude shall change at a time interval of 4 seconds at the voltage zero crossing point. The maximum value of Pinst shall be 1, and the tolerance shall be ±8%.

[0193] For example, compiling fluctuating voltage signals:

[0194] % Fluctuating voltage signal;

[0195] u=u_line.*(1+Vm(i).*sin(2.*pi*fi(i).*t)).*sin(2.*f_line.*pi.*t);

[0196] Based on the parameters in IEC6100-4-15, write f_line and u_line to represent the frequency and amplitude of the test voltage, respectively, changing at 4-second intervals at the zero-crossing point of the voltage. Vm and fi are the corresponding voltage fluctuation values ​​and frequencies in IEC61000-4-15. Fill these parameters into the compiler program for the fluctuating voltage signal. Check if the maximum value of each group's Pinst flicker instantaneous value is within 1±8%. If the result is ≤8%, the group passes; if all four groups pass, the entire project passes; if any group fails, the gain K adjustment process is triggered.

[0197] According to the above embodiment, the specific test item is voltage distortion multiple zero-crossing test;

[0198] Correspondingly, multiple input voltage signals are generated for each test item based on the test combination conditions, including:

[0199] Based on each test combination condition, as well as preset voltage fluctuation value, preset voltage amplitude, and preset harmonic order, multiple cross-distortion voltage signals are generated.

[0200] Correspondingly, the test conditions for the current test item are determined based on the different output signals of the flicker meter model, including:

[0201] The receive flicker model outputs multiple sets of flicker instantaneous values ​​when each cross-distortion voltage signal is used as the input voltage signal;

[0202] Determine whether the maximum value of each group of flicker instantaneous values ​​is within 1 ± 8%;

[0203] If so, then the test conditions corresponding to the current test item are met;

[0204] If not, then the test conditions corresponding to the current test item are not met.

[0205] To test the stability of the flicker control loop, the input signal is a distortion voltage with multiple zero-crossing peaks, consisting of the fundamental voltage U and harmonic order capacity.

[0206] All harmonics exhibit a 180° phase shift relative to the 50Hz and 60Hz fundamental frequencies; that is, as the fundamental frequency transitions from zero to the positive direction, the harmonics also transition from zero to the negative direction. This distortion voltage is then sinusoidally modulated at a frequency of 8.8Hz, with an amplitude conforming to IEC 61000-4-15 requirements, a maximum Pinst value of 1, and a tolerance of ±8%.

[0207] For example, the cross-distortion voltage signal is compiled as:

[0208] %Voltage change signal;

[0209] u=u_line.*(1+Vm.*sin(2.*pi*fi.*t)).*(sin(2.*f_line.*pi.*t)+h_v(i)*sin(2.*pi*h(i)*f_line.*t+phase));

[0210] Where h is the harmonic order, h_v is the voltage amplitude, phase=180°, fi=8.8Hz, and Vm is the voltage fluctuation value at 8.8Hz.

[0211] Each parameter is entered into the voltage signal and input into the voltage distortion multiple zero-crossing test module. Using a flicker meter model module built based on Matlab, the Pinst value is calculated. The maximum value of each Pinst group is selected and it is determined whether it is within 1±8%. This ensures that the transient response of the flicker meter model to multiple zero-crossing distortion disturbances falls within a 1±8% tolerance under full operating conditions of 50Hz / 60Hz and 120V / 230V, avoiding deviations in the field.

[0212] According to the above embodiments, the specific test item is the harmonic and interharmonic modulation bandwidth test;

[0213] Correspondingly, multiple input voltage signals are generated for each test item based on the test combination conditions, including:

[0214] Multiple modulation frequency pairs are determined based on each set of test combination conditions and preset frequency step size;

[0215] Each modulation frequency pair determines multiple modulation signals consisting of two sine waves with a frequency difference of 10 Hz.

[0216] Multiple modulation voltage signals are obtained by combining each modulation signal with its corresponding fundamental signal;

[0217] Correspondingly, the test conditions for the current test item are determined based on the different output signals of the flicker meter model, including:

[0218] The receive flicker model outputs multiple sets of flicker instantaneous values ​​when each modulated voltage signal is used as the input voltage signal;

[0219] Determine whether the maximum value of each group of flicker instantaneous values ​​is within 1 ± 8%;

[0220] If so, then the test conditions corresponding to the current test item are met;

[0221] If not, then the test conditions corresponding to the current test item are not met.

[0222] To test the impact of input bandwidth on the flicker, the system frequency (50Hz / 60Hz) of the power supply voltage U (230V / 120V) is modulated by superimposing two voltages with a frequency difference of 10Hz, as shown in IEC61000-4-15. The relative amplitudes of the two modulated voltages should be equal. The modulation frequencies fv and fi are increased in the frequency pair (fv, fi = fv - 10Hz) to determine the maximum bandwidth of the flicker. The highest frequency fv,max, such that Pinst,max is 1.00 with a tolerance of ±8%, is the input bandwidth of the flicker; fv,max should be at least 450Hz. For this module test, the frequency pair can be increased in 50Hz increments (60Hz for a 60Hz system), starting from the minimum frequency specified in IEC61000-4-15.

[0223] For example, a modulated voltage signal is compiled as:

[0224] %Voltage signal:

[0225] u_mod=sin(2*pi*fi(i).*t)+sin(2*pi*fv(i).*t);# The modulation signal u_mod is composed of two sine waves with equal amplitude and a frequency difference of 10Hz.

[0226] u=u_line*(sin(2*pi*f_line.*t)+Vm.*u_mod); # The modulating voltage signal is superimposed on the fundamental wave;

[0227] The input signal is fed into the harmonic and interharmonic modulation bandwidth test module. The flicker meter model module calculates the Pinst value, selects the maximum value of each Pinst value, and determines whether it is within 1±8%.

[0228] Ensure that the transient response of the flicker model to the harmonic-interharmonic modulation bandwidth falls within the tolerance of 1±8% under all operating conditions of 50Hz / 60Hz and 120V / 230V.

[0229] According to the above embodiments, the specific test item is the phase angle jump test;

[0230] Correspondingly, multiple input voltage signals are generated for each test item based on the test combination conditions, including:

[0231] Multiple phase angle jump voltage signals are generated based on each test combination condition, preset phase jump angle, preset phase jump time, and preset short-time flicker value.

[0232] Correspondingly, the test conditions for the current test item are determined based on the different output signals of the flicker meter model, including:

[0233] Receive the short-time flicker output value and multiple sets of flicker instantaneous values ​​output by the flicker meter model when the voltage signal at each phase angle jump is used as the input voltage signal;

[0234] Determine whether the difference between the short-time flicker output value and the preset short-time flicker value is within 5%, and whether the maximum value of each group of flicker instantaneous values ​​is within 1±8%.

[0235] If so, then the test conditions corresponding to the current test item are met;

[0236] If not, then the test conditions corresponding to the current test item are not met.

[0237] To test the stability of the input control flicker model's loop, input bandwidth, and classifier algorithm, a series of phase transitions were used to test the flicker model. Each phase transition was sent at a positive zero crossover point 1 min, 3 min, 5 min, 7 min, and 9 min (±10 s) after preset phase transition times, all after the start of the 10-minute observation period. For the preset phase transition angle... , The test should be repeated.

[0238] Furthermore, the output Pst value for 10 minutes must conform to the preset short-time flicker value in IEC61000-4-15, with a tolerance of ±5% or ±0.05, whichever is greater.

[0239] According to the requirements of the phase angle jump test module, a 10-minute jump input voltage signal is written and input into the test module. After passing through the flicker meter model module, the maximum value of Pinst should be 1, with a tolerance of ±8%. This embodiment ensures that when the flicker meter model is subjected to periodic phase angle jumps, the difference between its 10-minute short-time flicker output value Pst_out and the "preset short-time flicker value Pst_set" is ≤5%, and the maximum transient flicker value Pinst_max simultaneously satisfies 1±8%.

[0240] According to the above embodiment, the specific test item is a rectangular voltage change test with a duty cycle of 20%;

[0241] Correspondingly, multiple input voltage signals are generated for each test item based on the test combination conditions, including:

[0242] A rectangular modulation signal is generated based on a preset frequency, a preset short-time flicker value, and a duty cycle of 20%.

[0243] Multiple modulation fundamental signals are generated based on each set of test combination conditions and rectangular modulation signals;

[0244] Correspondingly, the test conditions for the current test item are determined based on the different output signals of the flicker meter model, including:

[0245] The receive flicker model outputs multiple short-time flicker output values ​​when each modulated fundamental signal is used as the input voltage signal;

[0246] Determine whether the deviation between each short-time flicker output value and the corresponding preset short-time flicker value is within 5%;

[0247] If so, then the test conditions corresponding to the current test item are met;

[0248] If not, then the test conditions corresponding to the current test item are not met.

[0249] To test the classifier and statistical evaluation algorithm, voltage U is rectangularly modulated at a frequency of 28 Hz and a duty cycle of 12 / 60 (20%). This means that within a 60-second time period, the total time of the signal voltage at one level is 12 seconds, and the total time at the other level is 48 seconds. Pst is required to be 1.00, with a tolerance within ±5%.

[0250] For example, compiling a modulated fundamental signal:

[0251] %Rectangular modulation signal;

[0252] u_mod=d(v_idx,f_idx)*1 / 2*sign(sin(2*pi*f_mod.*t)) / 100;

[0253] duty_cycle_1min=[ones(1,60*FS*DUTY_CYCLE)zeros(1,60*FS*(1-DUTY_CYCLE))];

[0254] duty_cycle=repmat(duty_cycle_1min,1,OBSERVATION_INTERVAL / 60);

[0255] u_mod = u_mod.*duty_cycle;

[0256] %Modulation of the fundamental frequency signal;

[0257] u=sin(2*pi*f_line(f_idx)*t).*(1+u_mod);

[0258] After setting the corresponding parameters according to the test combination conditions, input the signal to the flicker meter model. The maximum value of the output Pst should be 1, and the tolerance is ±5%.

[0259] If the test conditions are not met in any of the aforementioned test items, the gain K value needs to be adjusted. Specifically, the gain K value is adjusted within a preset gain range, including:

[0260] Obtain the preset gain range;

[0261] The gain range is updated to the gain K value by using a binary search method;

[0262] When a test item fails, the direction of gain adjustment is determined based on the error direction of the output signal;

[0263] The updated gain range is determined based on the gain adjustment direction and the updated gain K value.

[0264] If the updated gain K value does not meet the test conditions, then return to the step of updating the gain K value to the median value of the gain range using the binary search method based on the updated gain range; until the updated gain K value satisfies the corresponding test conditions for the output signal of each test item.

[0265] The preset gain range is a closed interval [1.90, 2.10], the endpoints of which are derived from engineering experience in IEC61000-4-15.

[0266] First, the midpoint of the gain range is updated to the gain K value using the binary search method. For example, if the current interval is [K_low, K_high], then the midpoint K_mid = (K_low + K_high) / 2.

[0267] Assign K_mid to the "gain K value" variable to complete one update.

[0268] Secondly, when a test fails, the gain adjustment direction needs to be determined based on the error direction of the output signal. If, under the updated K_mid, the current test is judged as "unsatisfied" and is higher than the tolerance limit (pinst maximum value > 1.08 or Pst error > 5%), it indicates that the current gain K value is too large and needs to be reduced. If it is lower than the tolerance limit (pinst maximum value < 0.92 or Pst error < 5%), it indicates that the current gain K value is too small and needs to be increased. A comparison is then used to determine whether the "gain adjustment direction" is "downward" or "upward".

[0269] Finally, based on the adjustment direction from the previous step, update the interval endpoints: if the direction is "downward," set the new interval to [K_low, K_mid]; if the direction is "upward," set the new interval to [K_mid, K_high]. The interval length is halved each time to ensure rapid convergence of the search interval. The interval update can be completed in constant time using only one conditional branch.

[0270] If the updated gain K value (i.e., K_mid) ensures that the output signals of all test items meet their respective test conditions, then the iteration terminates; otherwise, the updated interval [K_low, K_high] is used as input.

[0271] In addition, preferably, if the interval length is less than or equal to a preset accuracy threshold (e.g., 0.001), the iteration stops, the final gain K value is output, and it is used as the calibration result of the flicker model.

[0272] The solution provided in this embodiment locks in a globally unique optimal gain K value with the fewest iterations, avoiding blind manual adjustments; it ensures that the final K value is effective for all power grid combinations and all test items, eliminating the need for on-site secondary calibration; and it significantly improves calibration efficiency, repeatability, and engineering feasibility.

[0273] The flicker meter model calibration method has been described in detail in the above embodiments. This application also provides embodiments corresponding to the flicker meter model calibration device. It should be noted that this application describes the embodiments of the device part from two perspectives: one is based on the functional modules, and the other is based on the hardware.

[0274] From the perspective of functional modules Figure 3 A structural diagram of a flicker meter model calibration device provided in this application embodiment is shown below. Figure 3 As shown, a flicker meter model calibration device includes:

[0275] The acquisition module 21 is used to acquire the pre-built flicker model and the initial gain K value, test power frequency, and test voltage;

[0276] The input signal determination module 22 is used to generate input voltage signals corresponding to different test items based on the test power frequency and test voltage.

[0277] Input module 23 is used to input different input voltage signals to the flicker model;

[0278] The judgment module 24 is used to determine whether the test conditions corresponding to the current test item are met based on the different output signals of the flicker meter model; if not, the adjustment module is triggered.

[0279] Adjustment module 25 is used to adjust the gain K value within a preset gain range until the output signal corresponding to each test item meets the corresponding test conditions;

[0280] Output module 26 is used to output the final gain K value.

[0281] Since the embodiments of the apparatus and the embodiments of the method correspond to each other, please refer to the description of the embodiments of the method for the embodiments of the apparatus, which will not be repeated here.

[0282] Figure 4 A structural diagram of another flicker meter model calibration device provided in the embodiments of this application is shown below. Figure 4As shown, the flicker meter model calibration device includes: a memory 30 for storing computer programs;

[0283] The processor 31 is used to execute a computer program to implement the steps of the method for obtaining user operation habit information as described in the above embodiment (flicker model calibration method).

[0284] The flicker meter model calibration device provided in this embodiment may include, but is not limited to, mobile terminals, personal computers, workstations, etc.

[0285] The processor 31 may include one or more processing cores, such as a quad-core processor or an octa-core processor. The processor 31 may be implemented using at least one of the following hardware forms: Digital Signal Processor (DSP), Field-Programmable Gate Array (FPGA), or Programmable Logic Array (PLA). The processor 31 may also include a main processor and a coprocessor. The main processor, also known as the Central Processing Unit (CPU), is used to process data in the wake-up state; the coprocessor is a low-power processor used to process data in the standby state. In some embodiments, the processor 31 may integrate a Graphics Processing Unit (GPU), which is responsible for rendering and drawing the content to be displayed on the screen. In some embodiments, the processor 31 may also include an Artificial Intelligence (AI) processor, which handles computational operations related to machine learning.

[0286] The memory 30 may include one or more computer-readable storage media, which may be non-transitory. The memory 30 may also include high-speed random access memory and non-volatile memory, such as one or more disk storage devices or flash memory devices. In this embodiment, the memory 30 is used to store at least the following computer program 301, which, after being loaded and executed by the processor 31, is capable of implementing the relevant steps of the flicker model calibration method disclosed in any of the foregoing embodiments. In addition, the resources stored in the memory 30 may also include an operating system 302 and data 303, and the storage method may be temporary or permanent storage. The operating system 302 may include Windows, Unix, Linux, etc. The data 303 may include, but is not limited to, the data involved in implementing the flicker model calibration method.

[0287] In some embodiments, the flicker model calibration device may further include a display screen 32, an input / output interface 33, a communication interface 34, a power supply 35, and a communication bus 36.

[0288] Those skilled in the art will understand that Figure 4 The structure shown does not constitute a limitation on the flicker meter model calibration device and may include more or fewer components than shown.

[0289] The flicker model calibration device provided in this application includes a memory and a processor. When the processor executes the program stored in the memory, it can implement the following method: flicker model calibration method.

[0290] Finally, this application also provides an embodiment corresponding to a computer-readable storage medium. The computer-readable storage medium stores a computer program, which, when executed by a processor, implements the steps described in the above embodiment of the flicker meter model calibration method.

[0291] It is understood that if the methods in the above embodiments are implemented as software functional units and sold or used as independent products, they can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of this application, in essence, or the part that contributes to the prior art, or all or part of the technical solution, can be embodied in the form of a software product. This computer software product is stored in a storage medium and executes all or part of the steps of the methods described in the various embodiments of this application. The aforementioned storage medium includes various media capable of storing program code, such as USB flash drives, portable hard drives, read-only memory (ROM), random access memory (RAM), magnetic disks, or optical disks.

[0292] The computer-readable storage medium provided in this embodiment stores a computer program. When the processor executes the program, the following method can be implemented: flicker model calibration method.

[0293] The flicker meter model calibration method, apparatus, and medium provided in this application have been described in detail above. The various embodiments in the specification are described in a progressive manner, with each embodiment focusing on its differences from other embodiments. Similar or identical parts between embodiments can be referred to interchangeably. For the apparatus disclosed in the embodiments, since it corresponds to the method disclosed in the embodiments, the description is relatively simple; relevant parts can be referred to in the method section. It should be noted that those skilled in the art can make several improvements and modifications to this application without departing from the principles of this application, and these improvements and modifications also fall within the protection scope of the claims of this application.

[0294] It should also be noted that, in this specification, relational terms such as "first" and "second" are used only to distinguish one entity or operation from another, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Furthermore, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. Without further limitations, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes said element.

Claims

1. A method for calibrating a flicker meter model, characterized in that, include: Obtain the initial gain K value, test power frequency, and test voltage of the flicker meter model; Based on the test power frequency and the test voltage, input voltage signals corresponding to different test items are generated; Different input voltage signals are input to the flicker model; Determine whether the test conditions corresponding to the current test item are met based on the different output signals of the flicker meter model. If not, adjust the gain K value within the preset gain range until the output signal corresponding to each test item meets the corresponding test conditions; The model corresponding to the final gain K value is taken as the flicker meter model result; Adjusting the gain K value within a preset gain range includes: Obtain the preset gain range; The gain K value is updated to the median value of the gain range using a binary search method. When a test item fails, the direction of gain adjustment is determined based on the error direction of the output signal; The updated gain range is determined based on the gain adjustment direction and the updated gain K value. If the updated gain K value does not meet the test conditions, then based on the updated gain range, return to the step of updating the median value of the gain range to the gain K value using the binary search method; until the updated gain K value satisfies the corresponding test conditions for the output signal of each test item.

2. The flicker meter model calibration method according to claim 1, characterized in that, Obtaining the test power frequency and test voltage includes: Acquire multiple test frequencies and multiple test voltages; Multiple test combination conditions are obtained based on multiple test power frequencies and multiple test voltages; Correspondingly, generating input voltage signals corresponding to different test items based on the test power frequency and the test voltage includes: Based on the test combination conditions, generate multiple input voltage signals corresponding to each test item.

3. The flicker meter model calibration method according to claim 2, characterized in that, The test items are sinusoidal and rectangular voltage variation tests; Correspondingly, generating multiple input voltage signals corresponding to each test item under the test combination conditions includes: Generate corresponding sinusoidal voltage signals and rectangular voltage signals based on the test combination conditions described in each group; Correspondingly, based on the different output signals of the flicker meter model, it is determined whether the test conditions corresponding to the current test item are met, including: The flicker model receives multiple sets of flicker instantaneous values ​​output by the model when the sinusoidal voltage signal or the rectangular voltage signal corresponding to each test combination condition is used as the input voltage signal; Determine whether the maximum value of the instantaneous flicker value in each group is within 1 ± 8%; If so, then the test conditions corresponding to the current test item are met; If not, then the test conditions corresponding to the current test item are not met.

4. The flicker meter model calibration method according to claim 2, characterized in that, The test items are rectangular voltage variation and performance testing; Correspondingly, generating multiple input voltage signals corresponding to each test item under the test combination conditions includes: Based on each set of test combination conditions and multiple preset short-time flicker values, generate multiple corresponding rectangular voltage test signals; Correspondingly, based on the different output signals of the flicker meter model, it is determined whether the test conditions corresponding to the current test item are met, including: Receive multiple short-time flicker output values ​​output by the flicker meter model when each rectangular voltage test signal is used as an input voltage signal; Determine whether the deviation between each short-time flicker output value and the corresponding preset short-time flicker value is within 5%; If so, then the test conditions corresponding to the current test item are met; If not, then the test conditions corresponding to the current test item are not met.

5. The flicker meter model calibration method according to claim 2, characterized in that, The test item is a combination test of frequency and voltage variation; Correspondingly, generating multiple input voltage signals corresponding to each test item under the test combination conditions includes: Based on the test combination conditions described in each group, as well as the preset fluctuation frequency and preset fluctuation voltage, multiple corresponding fluctuation voltage signals are generated. Correspondingly, based on the different output signals of the flicker meter model, it is determined whether the test conditions corresponding to the current test item are met, including: Receive multiple sets of flicker instantaneous values ​​output by the flicker meter model when each of the fluctuating voltage signals is used as input voltage signals; Determine whether the maximum value of the instantaneous flicker value in each group is within 1 ± 8%; If so, then the test conditions corresponding to the current test item are met; If not, then the test conditions corresponding to the current test item are not met.

6. The flicker meter model calibration method according to claim 2, characterized in that, The test item is the voltage distortion multiple zero-crossing test; Correspondingly, generating multiple input voltage signals corresponding to each test item under the test combination conditions includes: Based on the test combination conditions described in each group, as well as the preset voltage fluctuation value, preset voltage amplitude, and preset harmonic order, multiple cross-distortion voltage signals are generated accordingly. Correspondingly, based on the different output signals of the flicker meter model, it is determined whether the test conditions corresponding to the current test item are met, including: Receive multiple sets of flicker instantaneous values ​​output by the flicker model when each cross-distortion voltage signal is used as an input voltage signal; Determine whether the maximum value of the instantaneous flicker value in each group is within 1 ± 8%; If so, then the test conditions corresponding to the current test item are met; If not, then the test conditions corresponding to the current test item are not met.

7. The flicker meter model calibration method according to claim 2, characterized in that, The test item is the harmonic and interharmonic modulation bandwidth test; Correspondingly, generating multiple input voltage signals corresponding to each test item under the test combination conditions includes: Multiple modulation frequency pairs are determined based on the test combination conditions and preset frequency step size for each group; Based on each of the modulation frequency pairs, a plurality of modulation signals consisting of two sine waves with a frequency difference of 10 Hz are determined; Multiple modulation voltage signals are obtained based on each modulation signal and its corresponding fundamental signal; Correspondingly, based on the different output signals of the flicker meter model, it is determined whether the test conditions corresponding to the current test item are met, including: Receive multiple sets of instantaneous flicker values ​​output by the flicker meter model when each modulated voltage signal is used as an input voltage signal; Determine whether the maximum value of the instantaneous flicker value in each group is within 1 ± 8%; If so, then the test conditions corresponding to the current test item are met; If not, then the test conditions corresponding to the current test item are not met.

8. The flicker meter model calibration method according to claim 2, characterized in that, The test item is the phase angle jump test; Correspondingly, generating multiple input voltage signals corresponding to each test item under the test combination conditions includes: Multiple phase angle jump voltage signals are generated based on the test combination conditions, preset phase jump angle, preset phase jump time, and preset short-time flicker value for each group. Correspondingly, based on the different output signals of the flicker meter model, it is determined whether the test conditions corresponding to the current test item are met, including: Receive the short-time flicker output value and multiple sets of flicker instantaneous values ​​output by the flicker meter model when each phase angle jump voltage signal is used as the input voltage signal; Determine whether the difference between the short-time flicker output value and the preset short-time flicker value is within 5%, and whether the maximum value of each group of flicker instantaneous values ​​is within 1 ± 8%. If so, then the test conditions corresponding to the current test item are met; If not, then the test conditions corresponding to the current test item are not met.

9. The flicker meter model calibration method according to claim 2, characterized in that, The test item is a rectangular voltage change test with a 20% duty cycle. Correspondingly, generating multiple input voltage signals corresponding to each test item under the test combination conditions includes: A rectangular modulation signal is generated based on a preset frequency, a preset short-time flicker value, and a duty cycle of 20%. Based on each set of test combination conditions, multiple modulation fundamental signals are generated from the rectangular modulation signal; Correspondingly, based on the different output signals of the flicker meter model, it is determined whether the test conditions corresponding to the current test item are met, including: Receive multiple short-time flicker output values ​​output by the flicker model when each of the modulated fundamental signals is used as the input voltage signal; Determine whether the deviation between each short-time flicker output value and the corresponding preset short-time flicker value is within 5%; If so, then the test conditions corresponding to the current test item are met; If not, then the test conditions corresponding to the current test item are not met.

10. A flicker meter model calibration device, characterized in that, include: The acquisition module is used to acquire the pre-built flicker model and its initial gain K value, test power frequency, and test voltage. The input signal determination module is used to generate input voltage signals corresponding to different test items based on the test power frequency and the test voltage. The input module is used to input different input voltage signals to the flicker model; The judgment module is used to determine whether the test conditions corresponding to the current test item are met based on the different output signals of the flicker meter model; if not, the adjustment module is triggered. An adjustment module is used to adjust the gain K value within a preset gain range until the output signal corresponding to each test item meets the corresponding test conditions. The output module is used to output the final gain K value; Adjusting the gain K value within a preset gain range includes: Obtain the preset gain range; The gain K value is updated to the median value of the gain range using a binary search method. When a test item fails, the direction of gain adjustment is determined based on the error direction of the output signal; The updated gain range is determined based on the gain adjustment direction and the updated gain K value. If the updated gain K value does not meet the test conditions, then based on the updated gain range, return to the step of updating the median value of the gain range to the gain K value using the binary search method; until the updated gain K value satisfies the corresponding test conditions for the output signal of each test item.

11. A flicker meter model calibration device, characterized in that, include: Memory, used to store computer programs; A processor, configured to implement the steps of the flicker model calibration method as described in any one of claims 1 to 9 when executing the computer program.

12. A computer-readable storage medium, characterized in that, The computer-readable storage medium stores a computer program that, when executed by a processor, implements the steps of the flicker model calibration method as described in any one of claims 1 to 9.

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