Detector full scale range determination method, apparatus, device, and storage medium

Abstract

The method, device, equipment and medium provided by the embodiment of the present disclosure include: acquiring scanning data corresponding to a first group of test scanning parameters of a detector under a parameter value corresponding to a preset full scale range, wherein the test scanning parameters include a test scanning frequency and a test CT tube KV value; determining a maximum scanning value in the scanning data received by the detector; when the maximum scanning value in the scanning data does not satisfy a preset scanning value range, sequentially increasing a division interval of the preset full scale range according to a division interval of a full scale range of an AD chip until the maximum scanning value in the scanning data collected by the detector satisfies the preset scanning value range. The full scale range of the AD chip under different scanning parameters is determined according to the scanning data collected by the detector, so that the CT scanning equipment has the best signal-to-noise ratio in actual application.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of CT scanning and related technical fields, in particular, to a detector full scale range determination method, device, equipment and storage medium. BACKGROUND

[0002] A computed tomography (CT) is a device that uses X-ray rotation to irradiate an object to be measured, and then obtains a tomographic image of the object by a computer. After the X-ray photons pass through the irradiated object, they are collected by the detector, and after a series of conversions, the photon signal is converted into an electronic signal that is received. The electronic signal received by the detector contains noise, which is mainly composed of electronic noise and photon noise (Poisson noise). The higher the attenuation of X-ray penetration, the fewer X-ray photons that reach the detector, the lower the electronic signal received by the detector, the more significant the noise of the signal, the lower the signal-to-noise ratio, the poorer the image contrast, and the lower the resolution. Research to improve the signal-to-noise ratio of the electronic signal is of great significance to improve the clarity and contrast of the image, especially in pediatric CT examinations that require a reduction in radiation dose, where the input signal is low, and the signal-to-noise ratio of the electronic signal is more important. Reducing electronic noise design has always been one of the focuses and difficulties of CT detector design, and the AD chip is the focus of the electronic circuit design of the detector. The full scale range (FSR) of the CT detector AD chip is closely related to the signal-to-noise ratio of the electronic signal. If the input signal is close to or exceeds the FSR of the AD chip, the signal may be saturated, the noise inside the chip may be amplified, and the signal may be distorted. If the input signal is too small relative to the FSR, the noise relative to the signal will increase, the signal-to-noise ratio will decrease, and reasonable setting of the FSR of the AD chip is of great significance to improve the signal-to-noise ratio of the electronic signal.

[0003] In the prior art, the FSR of the CT detector AD chip is set to a fixed value based on the principle of not being saturated under the maximum input signal, and there is a lack of FSR determination method for different input signals and mechanism for FSR self-adjustment for different input signals, which cannot effectively utilize the positive effect of reasonable FSR on the signal-to-noise ratio of the electronic signal. SUMMARY

[0004] The embodiments described herein provide a detector full scale range determination method, device, equipment and storage medium to solve the problems existing in the prior art.

[0005] In a first aspect, according to the content of the present disclosure, a detector full scale range determination method is provided, comprising:

[0006] acquire scanning data corresponding to the first set of test scanning parameters under a parameter value corresponding to a preset full range, wherein the test scanning parameters include a test scanning frequency and a test CT tube KV value, and the parameter value corresponding to the preset full range is a parameter value corresponding to a full range of a first interval divided by the AD chip;

[0007] determine a maximum scanning value in the scanning data received by the detector;

[0008] when the maximum scanning value in the scanning data does not satisfy a preset scanning value range, sequentially increase the division intervals of the preset full range according to the division intervals of the full range of the AD chip until the maximum scanning value in the scanning data acquired by the detector satisfies the preset scanning value range;

[0009] wherein the preset scanning value range is determined based on a maximum full range value of the full range.

[0010] In some embodiments of the present disclosure, the method further comprises:

[0011] when the maximum scanning value in the scanning data satisfies the preset scanning value range, determine that the parameter value of the full range corresponding to the test scanning parameters is the parameter value corresponding to the preset full range.

[0012] In some embodiments of the present disclosure, the determination of the maximum scanning value in the scanning data received by the detector comprises:

[0013] acquire a plurality of groups of scanning data received by each pixel unit in the detector within a unit scanning time;

[0014] select a maximum scanning value from the plurality of groups of scanning data received by each pixel unit to form target scanning data;

[0015] select a maximum scanning value from the target scanning data as the maximum scanning value in the scanning data received by the detector.

[0016] In some embodiments of the present disclosure, before the acquisition of the scanning data corresponding to the first set of test scanning parameters under the parameter value corresponding to the preset full range, the method further comprises:

[0017] acquire a scanning frequency and a CT tube KV value that can be set by the CT scanning device;

[0018] combine the scanning frequency and the CT tube KV value that can be set by the CT scanning device in pairs to form a plurality of groups of test scanning parameters.

[0019] In some embodiments of the present disclosure, when the maximum scan value in the scan data does not satisfy the preset scan value range, the division interval of the full scale range of the AD chip is sequentially increased until the maximum scan value in the scan data collected by the detector satisfies the preset scan value range, comprising:

[0020] When the maximum scan value in the scan data does not satisfy the preset scan value range, the full scale range of the AD chip is increased from the full scale range of the first interval to the full scale range of the second interval according to the division interval of the full scale range of the AD chip;

[0021] Obtaining scan data corresponding to the first group of test scan parameters under a parameter value corresponding to the full scale range of the second interval of the detector;

[0022] Determining the maximum scan value in the scan data received by the detector;

[0023] When the maximum scan value in the scan data satisfies the preset scan value range, determining that the parameter value of the full scale range corresponding to the test scan parameter is the parameter value of the full scale range of the second interval.

[0024] In some embodiments of the present disclosure, the method further comprises:

[0025] After determining the full scale range corresponding to the first group of test scan parameters, the first group of test scan parameters and the parameter value of the corresponding full scale range are associated and stored;

[0026] Obtaining scan data corresponding to the second group of test scan parameters under a parameter value corresponding to a preset full scale range of the detector.

[0027] In some embodiments of the present disclosure, the method further comprises:

[0028] In response to receiving target scan parameters submitted by a target object, obtaining a target full scale range corresponding to the target scan parameters, and configuring the AD chip based on the target full scale range.

[0029] In a second aspect, according to the content of the present disclosure, a detector full scale range determination device is provided, comprising:

[0030] A scan data acquisition module is configured to obtain scan data corresponding to a first group of test scan parameters under a parameter value corresponding to a preset full scale range of a detector, wherein the test scan parameters include test scan frequency and test CT ball tube KV value, and the parameter value of the preset full scale range is a parameter value corresponding to a full scale range of a first interval divided by the AD chip;

[0031] a maximum scan value determination module configured to determine a maximum scan value in the scan data received by the detector;

[0032] a full-scale range determination module configured to, when the maximum scan value in the scan data does not satisfy a preset scan value range, sequentially increase a partition interval of the preset full-scale range according to a partition interval of a full-scale range of an AD chip until the maximum scan value in the scan data collected by the detector satisfies the preset scan value range;

[0033] The preset scan value range is determined based on a maximum full-scale value of the full-scale range.

[0034] In a third aspect, a computer device is provided according to the content of the present disclosure, and the computer device comprises:

[0035] one or more processors;

[0036] a storage device configured to store one or more programs,

[0037] When the one or more programs are executed by the one or more processors, the one or more processors implement the method according to any one of the first aspect.

[0038] In a fourth aspect, a computer readable storage medium is provided according to the content of the present disclosure, and the computer readable storage medium stores a computer program, which, when executed by a processor, implements the method according to any one of the first aspect.

[0039] The detector full-scale range determination method, device, equipment and medium provided by the embodiments of the present disclosure first acquire scan data corresponding to a first group of test scan parameters of a detector at a parameter value corresponding to a preset full-scale range; then determine a maximum scan value in the scan data received by the detector; and finally, when the maximum scan value in the scan data does not satisfy a preset scan value range, sequentially increase a partition interval of the preset full-scale range according to a partition interval of a full-scale range of an AD chip until the maximum scan value in the scan data collected by the detector satisfies the preset scan value range. The full-scale range of the AD chip under different scan parameters is determined according to the scan data collected by the detector, so that the CT scanning equipment has the best signal-to-noise ratio in actual application, and the problems of low contrast and low resolution of low-dose images caused by electronic noise are improved, and the imaging quality of the CT scanning equipment is effectively improved.

[0040] The above description is only a summary of the technical solutions of the embodiments of the present application. In order to more clearly understand the technical means of the embodiments of the present application, the embodiments of the present application can be implemented according to the content of the description, and in order to make the above and other purposes, characteristics and advantages of the embodiments of the present application more obvious and easy to understand, the specific embodiments of the present application are described below. BRIEF DESCRIPTION OF DRAWINGS

[0041] In order to more clearly illustrate the technical solutions of the embodiments of the present disclosure, the drawings of the embodiments will be briefly described below, and it should be known that the drawings described below only relate to some of the embodiments of the present disclosure, rather than limit the present disclosure, wherein:

[0042] Figure 1 is a flow diagram of a full-scale range determination method of a detector provided by an embodiment of the present disclosure;

[0043] Figure 2 is a flow diagram of another full-scale range determination method of a detector provided by an embodiment of the present disclosure;

[0044] Figure 3 is a structural diagram of a full-scale range determination device of a detector provided by an embodiment of the present disclosure;

[0045] Figure 4 is a structural diagram of a computer device provided by an embodiment of the present disclosure.

[0046] In the drawings, the same reference signs correspond to the same elements. It should be noted that the elements in the drawings are schematic and not drawn to scale. DETAILED DESCRIPTION

[0047] In order to make the purposes, technical solutions and advantages of the embodiments of the present disclosure clearer, the technical solutions of the embodiments of the present disclosure will be described clearly and completely below with reference to the drawings. Obviously, the described embodiments are part of the embodiments of the present disclosure, rather than all the embodiments. Based on the described embodiments of the present disclosure, all other embodiments obtained by those skilled in the art without creative work also belong to the scope of protection of the present disclosure.

[0048] Unless otherwise defined, all terms (including technical and scientific terms) used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this present subject matter belongs. It will be further understood that terms, such as those defined in commonly used dictionaries, should be interpreted as having a meaning that is consistent with their meaning in the context of the specification and relevant art and will not be interpreted in an idealized or overly formal sense unless expressly so defined herein. As used herein, the statement that two or more parts are "connected" or "coupled" together will mean that the parts are joined directly or through one or more intermediate parts.

[0049] Reference to“an embodiment” herein means that a particular feature, structure, or characteristic described in connection with the embodiment can be included in at least one embodiment of the application. The appearances of the phrase“in an embodiment” in various places in the specification are not necessarily all referring to the same embodiment, nor are they necessarily all directed to the same embodiment, alternative embodiments, or alternative implementations.

[0050] The term“and / or” herein is merely descriptive of the associated objects, and means that three relationships can exist, for example, A and / or B can mean that A exists, A and B exist, and B exists.

[0051] In addition, in all embodiments of the present disclosure, terms such as“first” and“second” are only used to distinguish one component (or part of a component) from another component (or another part of a component).

[0052] In the description of the present application, unless otherwise specified, the meaning of“a plurality of” is two or more (including two), and similarly,“a plurality of groups” means two or more groups (including two groups).

[0053] In order for those skilled in the art to better understand the present application, the technical solutions in the embodiments of the present application will be described clearly and completely in conjunction with the accompanying drawings.

[0054] Based on the problems existing in the prior art, the present disclosure provides a detector full scale range determination method, Figure 1 is a flowchart of a detector full scale range determination method provided by the present disclosure, as shown in Figure 1 The specific process of the detector full scale range determination method includes:

[0055] S110, acquiring scanning data corresponding to the first group of test scanning parameters under the parameter value corresponding to the preset full scale range of the detector.

[0056] The test scanning parameters include test scanning frequency and test CT tube KV value, and the parameter value of the preset full scale range is the parameter value corresponding to the full scale range of the first interval divided by the AD chip.

[0057] The full scale range of an AD chip refers to the maximum range of input voltage that an analog-to-digital converter (ADC) can handle, usually expressed as a positive and negative voltage value. For example, the full scale range of an ADC may be ±10V, meaning that its input voltage can vary between -10V and +10V, and for another example, the full scale range of an ADC may be ±10C, meaning that its input charge can vary between -10C and +10C. Different AD chips have different full scale ranges.

[0058] The full scale range (FSR) of the AD chip of the detector in the CT scanning device is closely related to the electronic signal signal-to-noise ratio, and reasonable setting of the FSR of the AD chip can improve the electronic signal signal-to-noise ratio of the detector, which is of great significance to improve the low dose image contrast and low resolution caused by electronic noise, and can effectively improve the imaging quality of the CT scanning device.

[0059] The method for determining the full scale range of the detector provided in the embodiments of the present disclosure first acquires scanning data corresponding to a first set of test scanning parameters under a parameter value corresponding to a preset full scale range of the detector, wherein the test scanning parameters are determined based on a settable scanning frequency and a CT tube KV value of the CT scanning device.

[0060] Specifically, by acquiring all scanning frequencies and CT tube KV values expected to be used by the CT scanning device under the clinical expected use conditions, the settable scanning frequencies and CT tube KV values of the CT scanning device are then combined in pairs to form a plurality of test scanning parameters.

[0061] For an example, if the scanning frequencies expected to be used by the CT scanning device under the clinical expected use conditions are X, and the KV values of the CT tube expected to be used by the CT scanning device under the clinical expected use conditions are Y, then the test scanning parameters include X Y groups.

[0062] The full scale range of the AD chip includes a plurality of intervals, and the parameter values of the full scale ranges of different intervals are not the same. For a specific example, if the full scale range of the AD chip is divided into Z intervals, then the parameter value corresponding to the full scale range of the first interval is

X0, X1

X0, X2

X0, Xz

[0063] The preset full scale range of the detector is a full scale range of the first interval, that is, first, the AD chip is set to a parameter value corresponding to the full scale range of the first interval, then a first set of test scanning parameters is selected, the scanning frequency of the CT scanning device is set to a test scanning frequency corresponding to the first set of test scanning parameters, the KV value of the CT tube of the CT scanning device is set to a test KV value of the CT tube corresponding to the first set of test scanning parameters, and then scanning data corresponding to the first set of test scanning parameters under the parameter value corresponding to the preset full scale range of the detector is obtained.

[0064] In S120, a maximum scanning value in the scanning data received by the detector is determined.

[0065] After the scanning data corresponding to the first set of test scanning parameters under the parameter value corresponding to the preset full scale range of the detector is obtained in S110, a maximum scanning value in the scanning data is determined according to the obtained scanning data.

[0066] In a specific implementation, the maximum scanning value in the scanning data received by the detector is determined by: obtaining a plurality of groups of scanning data received by each pixel unit of the detector in a unit scanning time; selecting a maximum scanning value from the plurality of groups of scanning data received by each pixel unit to form target scanning data; and selecting a maximum scanning value from the target scanning data as the maximum scanning value in the scanning data received by the detector.

[0067] The detector includes a plurality of pixel units, and the number of scanning data received by each pixel unit in a unit scanning time is related to the scanning frequency. The scanning data of the detector is related to the scanning data of each pixel unit. Therefore, first, a group of scanning data with the maximum scanning value is selected from the plurality of groups of scanning data received by each pixel unit to form target scanning data, and then a scanning data with the maximum scanning value is selected from the target scanning data as the maximum scanning value received by the detector.

[0068] In an example, if the scanning frequency of the CT scanning data in a unit scanning time is 50 Hz, the number of scanning data received by each pixel unit of the detector in a unit scanning time is 20. Therefore, first, a group of scanning data with the maximum scanning value is selected from the 20 groups of scanning data generated by each pixel unit to form target scanning data, that is, if the pixel unit included in the detector is N M, the target scanning data generated is also N M, one target scanning data corresponds to a scanning data with the maximum scanning value in one pixel unit. After the target scanning data is determined, a scanning value with the maximum scanning value is selected from the N M target scanning data as the maximum scanning value in the scanning data received by the detector.

[0069] S130, when the maximum scanning value in the scanning data does not satisfy the preset scanning value range, according to the division interval of the full-scale range of the AD chip, the division interval of the preset full-scale range is sequentially increased until the maximum scanning value in the scanning data collected by the detector satisfies the preset scanning value range.

[0070] The preset scanning value range is determined based on the maximum full-scale value of the full-scale range.

[0071] Specifically, if the full-scale range of the AD chip is

X0, Xz

[0072] In the specific embodiment, when the maximum scanning value in the scanning data does not satisfy the preset scanning value range, according to the division interval of the full-scale range of the AD chip, the division interval of the preset full-scale range is sequentially increased until the maximum scanning value in the scanning data collected by the detector satisfies the preset scanning value range, including:

[0073] When the maximum scanning value in the scanning data does not satisfy the preset scanning value range, according to the division interval of the full-scale range of the AD chip, the full-scale range of the AD chip is increased from the full-scale range of the first interval to the full-scale range of the second interval; the scanning data corresponding to the first group of test scanning parameters under the parameter value corresponding to the full-scale range of the second interval of the detector is obtained; the maximum scanning value in the scanning data received by the detector is determined; when the maximum scanning value in the scanning data satisfies the preset scanning value range, the parameter value of the full-scale range corresponding to the test scanning parameter is determined as the parameter value of the full-scale range of the second interval.

[0074] After obtaining the maximum scanning value in the scanning data received by the detector, in combination with Figure 2, by comparing whether the maximum scanning value in the scanning data is located in the preset scanning value range interval, if the maximum scanning value in the scanning data is not located in the preset scanning value range interval, the full scale range of the AD chip is increased from the full scale range of the first interval to the full scale range of the second interval according to the interval division of the full scale range of the AD chip, then the scanning data collected by the detector under the parameter value of the full scale range of the second interval of the first group of test scanning parameters is obtained, and the maximum scanning value in the scanning data is determined, if the maximum scanning value in the scanning data meets the preset scanning value range, the parameter value of the full scale range corresponding to the test scanning parameter is the parameter value corresponding to the full scale range of the second interval, otherwise the full scale range of the AD chip is continuously increased from the full scale range of the second interval to the full scale range of the third interval, until the maximum scanning value in the scanning data is located in the preset scanning value range interval, and then the parameter value of the full scale range corresponding to the first group of test scanning parameters is determined.

[0075] In addition, if the maximum scanning value in the scanning data is located in the preset scanning value range interval, the parameter value of the full scale range corresponding to the test scanning parameter is the parameter value corresponding to the preset full scale range.

[0076] On the basis of the above embodiment, after determining the full scale range corresponding to the first group of test scanning parameters, the first group of test scanning parameters and the parameter value of the corresponding full scale range are associated and stored; then the scanning data corresponding to the second group of test scanning parameters under the parameter value of the preset full scale range is obtained, the maximum scanning value in the scanning data corresponding to the second group of test scanning parameters is determined again based on step S120, and then the full scale range corresponding to the second group of test scanning parameters is determined, and the second group of test scanning parameters and the parameter value of the corresponding full scale range are associated and stored. In this way, the determination of the parameter value of the full scale range under different test scanning parameters is completed.

[0077] Furthermore, in actual scene application, when the target object submits the target scanning parameter, the CT scanning device responds to the target scanning parameter submitted by the target object, finds the target full scale range corresponding to the target scanning parameter according to the target scanning parameter submitted by the target object, and configures the AD chip based on the target full scale range, thereby improving the signal-to-noise ratio of the electronic signal of the detector, which is of great significance to improve the problem of low contrast and poor resolution of low-dose images caused by electronic noise, and can effectively improve the imaging quality of the CT scanning device.

[0078] The method for determining the full scale range of the detector provided by the embodiments of the present disclosure first acquires scanning data corresponding to a first set of test scanning parameters under a parameter value corresponding to a preset full scale range of the detector; then determines a maximum scanning value in the scanning data received by the detector; and finally, when the maximum scanning value in the scanning data does not satisfy a preset scanning value range, sequentially increases the division interval of the preset full scale range according to the division interval of the full scale range of the AD chip until the maximum scanning value in the scanning data collected by the detector satisfies the preset scanning value range. The full scale range of the AD chip under different scanning parameters is determined according to the scanning data collected by the detector, so that the CT scanning device has the best signal-to-noise ratio in actual application, and the problem of low contrast and low resolution of low-dose images caused by electronic noise is improved, and the imaging quality of the CT scanning device is effectively improved.

[0079] On the basis of the above embodiments, Figure 3 is a structural schematic diagram of a detector full scale range determination device provided by the embodiments of the present disclosure, as Figure 3 indicated, the detector full scale range determination device comprises:

[0080] The scanning data acquisition module 310 is configured to acquire scanning data corresponding to a first set of test scanning parameters under a parameter value corresponding to a preset full scale range of the detector, wherein the test scanning parameters include a test scanning frequency and a test CT tube KV value, and the parameter value of the preset full scale range is a parameter value corresponding to a full scale range of a first interval divided by the AD chip.

[0081] The maximum scanning value determination module 320 is configured to determine a maximum scanning value in the scanning data received by the detector.

[0082] The full scale range determination module 330 is configured to, when the maximum scanning value in the scanning data does not satisfy a preset scanning value range, sequentially increase the division interval of the preset full scale range according to the division interval of the full scale range of the AD chip until the maximum scanning value in the scanning data collected by the detector satisfies the preset scanning value range.

[0083] The preset scanning value range is determined based on the maximum full scale value of the full scale range.

[0084] The full-scale range determination apparatus of the detector provided by the embodiments of the present disclosure first acquires scanning data corresponding to a first set of test scanning parameters under a parameter value corresponding to a preset full-scale range of the detector; then determines a maximum scanning value in the scanning data received by the detector; and finally, when the maximum scanning value in the scanning data does not satisfy a preset scanning value range, sequentially increases a division interval of the preset full-scale range according to the division interval of the full-scale range of the AD chip until the maximum scanning value in the scanning data collected by the detector satisfies the preset scanning value range. The full-scale range of the AD chip under different scanning parameters is determined according to the scanning data collected by the detector, so that the CT scanning device has the best signal-to-noise ratio in actual application, and the problem of low contrast and low resolution of a low-dose image caused by electronic noise is improved, and the imaging quality of the CT scanning device is effectively improved.

[0085] In specific embodiments, the method further comprises:

[0086] When the maximum scanning value in the scanning data satisfies the preset scanning value range, the parameter value of the full-scale range corresponding to the test scanning parameter is determined as the parameter value corresponding to the preset full-scale range.

[0087] In specific embodiments, the determination of the maximum scanning value in the scanning data received by the detector comprises:

[0088] Acquiring a plurality of sets of scanning data received by each pixel unit of the detector within a unit scanning time;

[0089] Selecting a maximum scanning value from the plurality of sets of scanning data received by each pixel unit to form target scanning data;

[0090] Selecting a maximum scanning value from the target scanning data as the maximum scanning value in the scanning data received by the detector.

[0091] In specific embodiments, before the acquisition of the scanning data corresponding to the first set of test scanning parameters under the parameter value corresponding to the preset full-scale range of the detector, the method further comprises:

[0092] Acquiring a settable scanning frequency and a CT tube KV value of a CT scanning device;

[0093] Combining the settable scanning frequency and the CT tube KV value of the CT scanning device in pairs to form a plurality of sets of test scanning parameters.

[0094] In specific embodiments, when the maximum scanning value in the scanning data does not satisfy the preset scanning value range, the sequentially increasing of the division interval of the preset full-scale range according to the division interval of the full-scale range of the AD chip until the maximum scanning value in the scanning data collected by the detector satisfies the preset scanning value range comprises:

[0095] when the maximum scanning value in the scanning data does not satisfy the preset scanning value range, according to the division interval of the full-scale range of the AD chip, increasing the full-scale range of the AD chip from the full-scale range of the first interval to the full-scale range of the second interval;

[0096] obtaining scanning data corresponding to the first group of test scanning parameters at a parameter value corresponding to the full-scale range of the second interval of the detector;

[0097] determining a maximum scanning value in the scanning data received by the detector;

[0098] when the maximum scanning value in the scanning data satisfies the preset scanning value range, determining that the parameter value of the full-scale range corresponding to the test scanning parameter is the parameter value of the full-scale range of the second interval.

[0099] In specific embodiments, the method further comprises:

[0100] after determining the full-scale range corresponding to the first group of test scanning parameters, associating and storing the first group of test scanning parameters and the parameter value of the corresponding full-scale range;

[0101] obtaining scanning data corresponding to the second group of test scanning parameters at a parameter value corresponding to a preset full-scale range of the detector.

[0102] In specific embodiments, the method further comprises:

[0103] in response to receiving target scanning parameters submitted by a target object, obtaining a target full-scale range corresponding to the target scanning parameters, and configuring the AD chip based on the target full-scale range.

[0104] The embodiments of the present application also provide a computer device, please refer to Figure 4 , Figure 4 is a basic structure block diagram of the computer device of the present embodiment.

[0105] The computer device includes a memory 510 and a processor 520 which are communicatively connected through a system bus. It is noted that only the computer device with components 510-520 is shown in the figure, but it is understood that not all of the shown components are required to be implemented, and more or less components can be alternatively implemented. Among them, those skilled in the art can understand that the computer device herein is a device capable of automatically performing numerical calculation and / or information processing according to pre-set or stored instructions, and its hardware includes but is not limited to microprocessors, application specific integrated circuits (ASICs), field programmable gate arrays (FPGAs), digital signal processors (DSPs), embedded devices, etc.

[0106] The computer device can be a desktop computer, a notebook computer, a palm computer, a cloud server and the like. The computer device can interact with the user through a keyboard, a mouse, a remote controller, a touchpad or a voice control device and the like.

[0107] The memory 510 includes at least one type of readable storage medium, including non-volatile memory or volatile memory, for example, flash memory, a hard disk, a multimedia card, a card-type memory (e.g., SD or DX memory, etc.), random access memory (RAM), read-only memory (ROM), erasable programmable read-only memory (EPROM), electrically erasable programmable read-only memory (EEPROM), programmable read-only memory (PROM), a magnetic memory, a magnetic disk, an optical disk, etc. The RAM can include static RAM or dynamic RAM. In some embodiments, the memory 510 can be an internal storage unit of the computer device, for example, a hard disk or a memory of the computer device. In other embodiments, the memory 510 can also be an external storage device of the computer device, for example, a plug-in hard disk, a Smart Media Card (SMC), a Secure Digital (SD) card, or a flash card, etc. equipped on the computer device. Of course, the memory 510 can include both an internal storage unit and an external storage device of the computer device. In this embodiment, the memory 510 is generally used to store an operating system and various application software installed on the computer device, for example, program codes of the above-described method, etc. In addition, the memory 510 can also be used to temporarily store various data that has been output or will be output.

[0108] The processor 520 is generally used to perform the overall operation of the computer device. In this embodiment, the memory 510 is used to store program codes or instructions, including computer operation instructions, and the processor 520 is used to execute the program codes or instructions stored in the memory 510 or process data, for example, run the program codes of the above-described method.

[0109] In this document, the bus can be an Industry Standard Architecture (ISA) bus, a Peripheral Component Interconnect (PCI) bus, or an Extended Industry Standard Architecture (EISA) bus, among others. The bus system can be a system of address, data, and control buses, for example. For the sake of presentation, the detailed wiring for bus transactions has been omitted, except for the interconnection of buses themselves. In practice, the bus transactions are often moved along multiple parallel lines using a variety of bus protocols.

[0110] Another embodiment of the present application further provides a computer readable medium, which can be a computer readable signal medium or a computer readable storage medium. A processor in a computer reads the computer readable program code stored in the computer readable medium, so that the processor can perform the function actions specified in each step or combination of steps in the above method; and generates a device implementing the function actions specified in each block or combination of blocks in the block diagram.

[0111] The computer readable medium includes, but is not limited to, electronic, magnetic, optical, electromagnetic, infrared, or semiconductor system, device or apparatus, or any suitable combination of the foregoing, for storing program codes or instructions, and the program codes include computer operation instructions. The processor is used to execute the program codes or instructions of the above method stored in the memory.

[0112] The definition of the memory and the processor can refer to the description of the foregoing computer device embodiment, which will not be repeated here.

[0113] In several embodiments provided in the present application, it should be understood that the disclosed system, device and method can be implemented in other ways. For example, the device embodiment described above is only schematic, for example, the division of the module or unit is only a logical function division, and actual implementation can have another division manner, for example, a plurality of units or components can be combined or integrated into another system, or some features can be ignored or not executed. In addition, the coupling or direct coupling or communication connection between the displayed or discussed each other can be indirect coupling or communication connection through some interface, device or unit, which can be electrical, mechanical or other forms.

[0114] The function units or modules in each embodiment of the present application can be integrated in one processing unit, or each unit can be physically present separately, or two or more units can be integrated in one unit. The integrated unit can be realized in the form of hardware or in the form of software function unit.

[0115] The integrated unit, if implemented in the form of a software function unit and sold or used as an independent product, can be stored in a computer readable storage medium. Based on such understanding, the technical solutions of the present application essentially or the part that contributes to the prior art or the whole or part of the technical solutions can be embodied in the form of a software product. The computer software product is stored in a storage medium and includes a number of instructions for causing a computer device (which can be a personal computer, a server, or a network device, etc.) or a processor (processor) to execute all or part of the steps of the embodiments of the method of the present application. The aforementioned storage medium includes: a U disk, a mobile hard disk, a read-only memory (Read-Only Memory, ROM), a random access memory (Random Access Memory, RAM), a magnetic disk or an optical disk, and various media that can store program codes.

[0116] Unless the context clearly indicates otherwise, as used herein and in the appended claims, the singular form "a," "an," and "the" include plural references unless the context clearly dictates otherwise. Accordingly, the use of "a" or "an" herein and in the following claims is intended to be interpreted to include the plural, unless the context clearly indicates otherwise. Similarly, the words "comprise," "comprises," and "comprising" are to be interpreted inclusively rather than exclusively. Likewise, the terms "include," "including," and "or" should be construed as inclusive, unless otherwise indicated herein. Where the term "example" is used occurring after the term "comprising" or "including" as used herein is intended to be interpreted to include the plural, unless the context clearly indicates otherwise. Similarly, the words "comprise," "comprises," and "comprising" are to be interpreted inclusively rather than exclusively. Likewise, the terms "include," "including," and "or" should be construed as inclusive, unless otherwise indicated herein. Where the term "example" is used occurring after the term "comprising" or "including" as used herein is intended to be interpreted to include the plural, unless the context clearly indicates otherwise.

[0117] Further aspects and ranges of adaptability become apparent from the description provided herein. It should be understood that various aspects of the present application can be implemented alone or in combination with one or more other aspects. It should also be understood that the description and specific examples herein are intended to be illustrative only and are not intended to limit the scope of the present application.

[0118] The above has been described in detail for several embodiments of the present disclosure, but it is obvious that those skilled in the art can make various modifications and variations to the embodiments of the present disclosure without departing from the spirit and scope of the present disclosure. The protection scope of the present disclosure is defined by the appended claims.

Claims

1. A method for determining the full-scale range of a detector, characterized in that, include: The scanning data corresponding to the first set of test scanning parameters is obtained under the parameter values ​​corresponding to the preset full-scale range of the detector. The test scanning parameters include the test scanning frequency and the test CT tube KV value. The parameter values ​​of the preset full-scale range are the parameter values ​​corresponding to the full-scale range of the first interval divided by the AD chip. Determine the maximum scan value in the scan data received by the detector; When the maximum scan value in the scan data does not meet the preset scan value range, the preset full-scale range is sequentially increased according to the division interval of the full-scale range of the AD chip until the maximum scan value in the scan data collected by the detector meets the preset scan value range. The preset scan value range is determined based on the maximum full-scale value of the full-scale range. The full-scale range of the AD chip refers to the maximum range of input voltage or input charge that the analog-to-digital converter can handle. The preset scan value range is Xz. 75%~Xz 85%, where Xz is the maximum input voltage or input charge received by the analog-to-digital converter.

2. The method according to claim 1, characterized in that, Also includes: When the maximum scan value in the scan data meets the preset scan value range, the parameter value of the full-scale range corresponding to the test scan parameter is determined to be the parameter value corresponding to the preset full-scale range.

3. The method according to claim 1, characterized in that, Determining the maximum scan value in the scan data received by the detector includes: Acquire multiple sets of scan data received by each pixel unit in the detector within a unit scan time; The target scan data is composed of the maximum scan value selected from the multiple sets of scan data received from each pixel unit. The maximum scan value is selected from the target scan data as the maximum scan value in the scan data received by the detector.

4. The method according to claim 1, characterized in that, Before acquiring the scan data corresponding to the first set of test scan parameters under the parameter values ​​corresponding to the detector within the preset full-scale range, the process further includes: Obtain the configurable scanning frequency and CT tube KV value of the CT scanning equipment; Multiple sets of test scanning parameters are formed by combining the CT scanning equipment's settable scanning frequency and the CT tube's KV value in pairs.

5. The method according to claim 1, characterized in that, When the maximum scan value in the scan data does not meet the preset scan value range, the preset full-scale range interval is sequentially increased according to the division interval of the full-scale range of the AD chip, until the maximum scan value in the scan data collected by the detector meets the preset scan value range, including: When the maximum scan value in the scan data does not meet the preset scan value range, the full-scale range of the AD chip is increased from the full-scale range of the first interval to the full-scale range of the second interval according to the division interval of the full-scale range of the AD chip. Obtain the scan data corresponding to the first set of test scan parameters under the parameter values ​​corresponding to the full scale range of the detector in the second interval; Determine the maximum scan value in the scan data received by the detector; When the maximum scan value in the scan data meets the preset scan value range, the parameter value of the full-scale range corresponding to the test scan parameter is determined to be the parameter value of the full-scale range of the second interval.

6. The method according to claim 1, characterized in that, The method further includes: After determining the full-scale range corresponding to the first set of test scan parameters, the first set of test scan parameters are associated with and stored with the parameter values ​​of the corresponding full-scale range. Obtain the scan data corresponding to the second set of test scan parameters under the parameter values ​​corresponding to the preset full-scale range of the detector.

7. The method according to claim 6, characterized in that, The method further includes: In response to receiving target scanning parameters submitted by the target object, the target full-scale range corresponding to the target scanning parameters is obtained, and the AD chip is configured based on the target full-scale range.

8. A device for determining the full-scale range of a detector, characterized in that, include: The scanning data acquisition module is used to acquire the scanning data corresponding to the first set of test scanning parameters under the parameter values ​​corresponding to the preset full-scale range of the detector. The test scanning parameters include the test scanning frequency and the test CT tube KV value. The parameter values ​​of the preset full-scale range are the parameter values ​​corresponding to the full-scale range of the first interval divided by the AD chip. The maximum scan value determination module is used to determine the maximum scan value in the scan data received by the detector; The full-scale range determination module is used to, when the maximum scan value in the scan data does not meet the preset scan value range, sequentially increase the preset full-scale range division interval according to the division interval of the full-scale range of the AD chip, until the maximum scan value in the scan data collected by the detector meets the preset scan value range. The preset scan value range is determined based on the maximum full-scale value of the full-scale range. The full-scale range of the AD chip refers to the maximum range of input voltage or input charge that the analog-to-digital converter can handle. The preset scan value range is Xz. 75%~Xz 85%, where Xz is the maximum input voltage or input charge received by the analog-to-digital converter.

9. A computer device, characterized in that, include: One or more processors; Storage device for storing one or more programs. When the one or more programs are executed by the one or more processors, the one or more processors implement the method as described in any one of claims 1 to 7.

10. A computer-readable storage medium having a computer program stored thereon, characterized in that, When the program is executed by the processor, it implements the method as described in any one of claims 1 to 7.

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