Component bidirectional aging tool based on aging equipment and test method

Abstract

The invention discloses a component bidirectional aging tool based on aging equipment and a testing method. The component bidirectional aging tool comprises an aging plate; station needles are arranged on the aging plate and used for aging different types of devices and installing aging sockets, golden fingers are arranged at the two ends of the aging plate, polarity conversion slots are formed in the positions close to the golden fingers, and the polarity conversion slots are connected with the golden fingers; an electrode connecting line is arranged on the aging plate, one end of the electrode connecting line is connected with an aging test device electrode, and the other end of the electrode connecting line is correspondingly connected with the polarity conversion slot; and a polarity conversion plate is arranged on the polarity conversion slot. By applying the technical scheme of the invention, the problems of device appearance damage and low production efficiency caused by manual reversing operation in the aging process of a non-polar capacitor and a bidirectional TVS (Transient Voltage Suppressor) in the prior art can be effectively solved, and the problem of high cost during aging of devices such as transistors with different polarities, JFETs (Junction Field Effect Transistor) and the like can be effectively solved, and an aging tool does not need to be manufactured again.

Description

Technical Field

[0001] The invention belongs to the field of reliability screening of electronic components, and in particular to a component bidirectional aging tool and a testing method based on aging equipment. Background Art

[0002] In electronic equipment, components such as capacitors, bidirectional transient suppression diodes (TVS tubes), transistors (NPN, PNP), JFETs, and MOS tubes are widely used. To ensure the long-term quality and reliability of these components, they usually need to undergo electrical aging or reverse bias testing before being put into use to eliminate early failure products and ensure the quality and reliability of the components.

[0003] The existing technical requirements for electrical burn-in or reverse bias testing of these components are as follows:

[0004] 1) Non-polarized capacitors and bidirectional TVS diodes require power-on aging for 1 / 2 test cycle in both directions; 2) NPN and PNP transistors in the same package require the positive and negative poles to be powered in opposite directions; 3) N-channel and P-channel JFETs and MOS transistors in the same package require the gate bias and drain-source reverse bias to be powered in opposite directions;

[0005] At present, the burn-in and reverse bias of this type of devices are all based on dedicated burn-in equipment to produce burn-in tooling for batch production testing. The designed burn-in tooling all has a one-way gold finger plug design, the positive pole of the power supply V+ is the common electrode, and the negative pole of the power supply V- is separately isolated according to the equipment sampling circuit.

[0006] In the existing technology, when 1 / 2 of the aging cycle is completed, it is usually necessary to manually change the polarity direction of the components to achieve polarity conversion. This is not only cumbersome and inefficient, but also manually reversing the direction can easily cause problems such as scratches on the device appearance. When gate biasing or reverse biasing transistors and MOS tubes with different polarities in the same package, once the reverse bias tooling for NPN or N-channel devices is made, it is impossible to reverse bias PNP or P-channel devices in the same package. Reverse bias tooling for PNP or P-channel devices needs to be remade, which greatly wastes tooling manufacturing costs. Summary of the Invention

[0007] The purpose of the present invention is to provide a bidirectional aging tool and testing method for components based on aging equipment, so as to solve the problems in the prior art of damage to the appearance of components and low production efficiency caused by manual reversing operation during the aging process of non-polar capacitors, bidirectional transient suppression diodes, transistor reverse bias and MOSFET reverse bias.

[0008] In order to achieve the above object, the present invention adopts the following technical solutions:

[0009] The present invention proposes a bidirectional burn-in tool for components based on burn-in equipment, comprising an burn-in board; station needles are provided on the burn-in board for installing burn-in sockets for burn-in of different types of devices; gold fingers are provided at both ends of the burn-in board, and polarity conversion slots are provided near the gold fingers, and the polarity conversion slots are connected to the gold fingers; electrode connecting wires are provided on the burn-in board, one end of the electrode connecting wires is connected to the electrode of the burn-in test device, and the other end of the electrode connecting wires is connected to the polarity conversion slots accordingly; a polarity conversion plate is provided on the polarity conversion slots.

[0010] Preferably, the aging plate body is provided with a plurality of component stations for accommodating components to be aging.

[0011] Preferably, the number of pins of the polarity conversion slot is selected as follows: number of slot pins ≥ number of workstations × 2.

[0012] Preferably, gold finger structures are provided on both sides of the polarity conversion plate, and the gold fingers provided on both sides are short-circuited one by one in the form of vias.

[0013] Preferably, the number of the gold finger pointers is consistent with the number of the polarity conversion slot solder points.

[0014] Preferably, both ends of the polarity conversion plate are provided with extension plates, and the extension plates and the polarity conversion plate are an integrated structure.

[0015] Preferably, an anti-error column is provided on the polarity conversion plate.

[0016] Preferably, the electrode connection lines include a first electrode connection line, a second electrode connection line, a third electrode connection line and a fourth electrode connection line;

[0017] When performing an aging test on a single device, the connection relationship between the electrode connection line, the polarity conversion slot and the gold finger is as follows: the first electrode connection line and the second electrode connection line are both connected to the first electrode of the device under test, the first electrode connection line is connected to one side of the first solder point unit of the polarity conversion slot, and the second electrode connection line is connected to one side of the second solder point unit of the polarity conversion slot; the third electrode connection line and the fourth electrode connection line are both connected to the second electrode of the device under test, the third electrode connection line is connected to the other side of the second solder point unit of the polarity conversion slot, and the fourth electrode connection line is connected to the other side of the first solder point unit of the polarity conversion slot; the number of short-circuit solder points of the third solder point unit and the fourth solder point unit of the polarity conversion slot are selected according to the number of workstations designed for the PCB, and the short-circuit solder points of the third solder point unit and the fourth solder point unit are all connected to the common positive pole of the gold finger through a fuse; the remaining solder points in the third solder point unit and the fourth solder point unit that are not short-circuited are connected to the negative pole of the gold finger.

[0018] The present invention proposes a testing method for a component bidirectional aging tool based on an aging device, comprising the following steps:

[0019] The aging board integrates bidirectional gold fingers and polarity conversion slots. The polarity conversion board fits into the polarity conversion slots and achieves polarity conversion by plugging and unplugging.

[0020] Install the components to be tested to the designated position of the burn-in board, select a polarity conversion slot and insert the polarity conversion board, connect the gold fingers in the corresponding direction to the burn-in equipment for power-on testing;

[0021] When the 1 / 2 test cycle is reached, remove the polarity conversion board and reinsert it into another polarity conversion slot, adjust the direction of the burn-in board, connect the new gold fingers to the device, and complete the remaining tests.

[0022] Preferably, when performing a burn-in test on a single device, the circuit design method is as follows: the two polarities of the component to be tested are respectively connected to four on-state switches. During the first 1 / 2 cycle burn-in, the first N-pole switch K11, the second N-pole switch K21, and the third N-pole switch KN1 of the first bidirectional device C1 to the nth bidirectional device Cn are simultaneously turned on and short-circuited to V+, the first P-pole switch K12, the second P-pole switch K22, and the third P-pole switch KN2 are simultaneously turned on and connected to power supplies V1-, V2-, and VN-, respectively, and the fourth N-pole switch K13, the fourth P-pole switch K14, the fifth N-pole switch K23, the fifth P-pole switch K24, the sixth N-pole switch KN3, and the sixth P-pole switch KN4 are turned off. During the second 1 / 2 cycle burn-in, the first bidirectional device C1 to the nth bidirectional device Cn are turned on and short-circuited to V+. The fourth P-pole switch K14, the fifth P-pole switch K24, and the sixth P-pole switch KN4 of the device Cn are simultaneously turned on and short-circuited to V+", and the fourth N-pole switch K13, the fifth N-pole switch K23, and the sixth N-pole switch KN3 of the first bidirectional device C1 to the nth bidirectional device Cn are simultaneously turned on and connected to the power supplies V1-", V2-", and VN-", respectively. The first N-pole switch K11, the second N-pole switch K21, the third N-pole switch KN1, the first P-pole switch K12, the second P-pole switch K22, and the third P-pole switch KN2 are disconnected; during aging, the power supplies V+ and V+" are connected to the positive power supply terminal of the aging equipment, and the power supplies V1-, V2-, VN-, V1-", V2-", and VN-" are independent of each other and are respectively connected to the negative power supply terminal of the equipment through current sampling circuits.

[0023] Compared with the prior art, the present invention has the following beneficial effects:

[0024] The present invention proposes a tooling that includes a multi-station bidirectional burn-in circuit. By designing bidirectional gold fingers and polarity conversion slots at both ends of the burn-in board, the burn-in board can be flexibly connected to the positive and negative poles of the power supply of the burn-in equipment. At the same time, the polarity conversion board is inserted into different polarity conversion slots to realize rapid conversion of the polarity of the components. There is no need to manually change the direction of the device, which improves the efficiency and accuracy of the burn-in test. By controlling the insertion direction and position of the polarity conversion board, the connection method between the components and the power supply can be changed, thereby realizing burn-in testing of components of different polarities on the same burn-in board. This technical solution significantly improves the degree of automation of the burn-in test, reduces the errors and damage caused by manual operation, and at the same time reduces the cost of tooling production, improves the flexibility and production capacity of the production line, and broadens its application range in the field of reliability screening of electronic components.

[0025] Furthermore, during the first 1 / 2 cycle of burn-in, the N poles of all bidirectional devices are connected to the positive power supply V+ through switches, while the P poles are connected to independent negative power supply poles V1-, V2-...VN- through switches; during the second 1 / 2 cycle, the polarity is quickly switched through reconfiguration of the switches, with the P pole connected to the positive power supply V+", and the N pole connected to independent negative power supply poles V1-", V2-"...VN-", without the need to manually change the direction of the device, thereby greatly improving the efficiency of the burn-in test, avoiding possible damage to the device appearance caused by manual operation, and reducing the complexity and error rate of the operation. BRIEF DESCRIPTION OF THE DRAWINGS

[0026] In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the following briefly introduces the drawings required for use in the embodiments. It should be understood that the following drawings only illustrate certain embodiments of the present invention and therefore should not be regarded as limiting the scope. For ordinary technicians in this field, other relevant drawings can be obtained based on these drawings without paying any creative work.

[0027] Figure 1 This is a structural diagram of the bidirectional aging tooling for components based on the aging equipment of the present invention.

[0028] Figure 2 The present invention provides a multi-station bidirectional device aging circuit design method.

[0029] Figure 3 Schematic diagram of the polarity conversion slot of the present invention.

[0030] Figure 4 Schematic diagram of the polarity conversion plate of the present invention.

[0031] Figure 5 This is a structural diagram of the reverse-biased PCB board design for NPN and PNP transistors in the same package according to the present invention.

[0032] Figure 6 Schematic diagram of the axial aging PCB board of the non-polar capacitor and bidirectional TVS tube of the present invention.

[0033] Among them, 1-aging board; 2-polarity conversion board, 3-polarity conversion slot; 109-aging socket; 105-first polarity conversion slot; 110-second polarity conversion slot; 104-first fuse; 113-second fuse; 114-first limiting hole; 106-second limiting hole; 107-first electrode connecting line; 108-second electrode connecting line; 103-third electrode connecting line; 115-fourth electrode connecting line; 1051-first soldering point unit; 1101-second soldering point unit; 1052-third soldering point unit; 1102-fourth soldering point unit; 201-error prevention column; 202-via form; 203-gold finger structure; 102-first gold finger negative pole; 101-first gold finger common positive pole; 111--second gold finger negative pole; 112-second gold finger common positive pole. DETAILED DESCRIPTION

[0034] Hereinafter, only certain exemplary embodiments are briefly described. As will be appreciated by those skilled in the art, the described embodiments may be modified in various ways without departing from the spirit or scope of the present invention. Therefore, the drawings and description are to be considered as illustrative in nature and not restrictive.

[0035] In the description of the present invention, it should be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", "clockwise", "counterclockwise", "axial", "radial", "circumferential" and the like to indicate orientations or positional relationships based on the orientations or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be understood as limiting the present invention.

[0036] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of the technical features being referred to. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of such features. In the description of the present invention, "plurality" means two or more, unless otherwise specifically defined.

[0037] In the present invention, unless otherwise expressly specified or limited, terms such as "mounted," "connected," "connect," and "fixed" should be understood broadly. For example, they may refer to fixed connection, detachable connection, or integration; mechanical connection, electrical connection, or communication; direct connection or indirect connection through an intermediate medium; and internal communication between two components or interaction between two components. Those skilled in the art will understand the specific meanings of the above terms in the present invention based on specific circumstances.

[0038] In the present invention, unless otherwise expressly specified or limited, a first feature being "above" or "below" a second feature may include the first and second features being in direct contact, or may include the first and second features being in contact not directly but through another feature between them. Furthermore, a first feature being "above," "above," and "above" a second feature may include the first feature being directly above or obliquely above the second feature, or may simply mean that the first feature is higher in level than the second feature. A first feature being "below," "below," and "below" a second feature may include the first feature being directly above or obliquely above the second feature, or may simply mean that the first feature is lower in level than the second feature.

[0039] The present invention is described in further detail below with reference to the accompanying drawings:

[0040] The present invention proposes a bidirectional aging tool for components based on aging equipment, such as Figures 1 to 4As shown, the burn-in board 1 includes a workstation pin for installing burn-in sockets 109 for burn-in of different device types. Gold fingers are located at both ends of the burn-in board 1, and polarity conversion slots are located near the gold fingers, connecting the gold fingers to the polarity conversion slots. Electrode connection wires are provided on the burn-in board 1, one end of which connects to the electrodes of the burn-in test device, and the other end of which connects to the corresponding polarity conversion slots. Polarity conversion plates 2 are located on the polarity conversion slots. By designing bidirectional gold fingers and polarity conversion slots at both ends of the burn-in board, the burn-in board can be flexibly connected to the positive and negative power supply terminals of the burn-in equipment. The polarity conversion plates can be inserted into different polarity conversion slots to quickly change the polarity of components, eliminating the need for manual device orientation adjustments and improving the efficiency and accuracy of burn-in testing. In principle, by controlling the insertion direction and position of the polarity conversion plates, the connection method between the component and the power supply can be changed, enabling burn-in testing of components of different polarities on the same burn-in board. This technical solution significantly improves the automation level of burn-in testing, reduces errors and damage caused by manual operation, reduces tooling costs, and improves the flexibility and productivity of the production line. The gold finger includes a first gold finger and a second gold finger. The first gold finger includes a first gold finger cathode 102 and a first gold finger common anode 101; the second gold finger includes a second gold finger cathode 111 and a second gold finger common anode 112; and the polarity conversion slot includes a first polarity conversion slot 105 and a second polarity conversion slot 110.

[0041] The burn-in board 1 is equipped with several component stations for accommodating devices to be burned in. By arranging multiple stations on the burn-in board, multiple devices can be burned in simultaneously, significantly improving test efficiency. Each station is equipped with corresponding electrode connection wires and polarity conversion slots, ensuring that each device can be independently burned in both forward and reverse directions. This design not only saves time but also reduces damage that can be caused by frequent component replacement, ensuring the accuracy of test results.

[0042] The number of pins in the polarity conversion slot is selected as follows: Number of slot pins ≥ Number of workstations × 2. This ensures accurate polarity conversion even when multiple workstations are performing burn-in simultaneously, avoiding conversion failures or circuit interference caused by insufficient pins, and improving overall testing capabilities and production efficiency.

[0043] Gold finger structures 203 are provided on both sides of the polarity conversion plate 2. These gold fingers are short-circuited one by one vias 202. This via short-circuit connection ensures electrical continuity between the gold finger sides A and B, ensuring correct polarity conversion when inserted in different orientations. This simplifies the operating process, increases the automation level of burn-in testing, and reduces operational difficulty and error rates.

[0044] The number of gold finger indicators matches the number of solder points in the polarity conversion slot. This consistent design ensures a stable connection between the burn-in board and the burn-in equipment. It also simplifies the production standards of the polarity conversion board, allowing it to precisely match the polarity conversion slot. In principle, when the polarity conversion board is inserted into the polarity conversion slot, the consistency between the number of gold finger indicators and the number of solder points ensures that all solder points correctly contact the gold finger indicators, forming a complete circuit path.

[0045] Extension plates are provided at both ends of the polarity conversion plate 2, and the extension plates and the polarity conversion plate 2 are an integrated structure. The integrated extension plate design increases the length of the polarity conversion plate, which is convenient for the operator to have sufficient grip space when inserting or removing it, and also enhances the overall structural stability of the polarity conversion plate. The presence of the extension plate makes it easier for the operator to position and operate the polarity conversion plate when performing polarity conversion, avoiding the inconvenience of operation caused by the small space. This design significantly improves the convenience and safety of operation and reduces the damage or errors that may occur during operation. The shape and material of the extension plate can also be adjusted, such as adding anti-slip grooves or using insulating materials, to further optimize the operating experience and solve the problem of difficult operation or safety hazards in special environments.

[0046] Polarity conversion plate 2 is equipped with anti-error posts 201. These posts serve as a physical stopper, restricting the insertion direction of the polarity conversion plate and ensuring that it is correctly aligned with the polarity conversion slot every time it is inserted. In principle, if the polarity conversion plate is attempted to be inserted in the incorrect direction, the anti-error posts interfere with the edge of the socket, preventing incorrect insertion and thus preventing incorrect circuit connection. This design effectively prevents operator errors and improves the accuracy and efficiency of burn-in testing.

[0047] The electrode connection line includes a first electrode connection line 107, a second electrode connection line 108, a third electrode connection line 103 and a fourth electrode connection line 115; when performing an aging test on a single device, the connection relationship between the electrode connection line, the polarity conversion slot and the gold finger is as follows: the first electrode connection line 107 and the second electrode connection line 108 are both connected to the first electrode of the device under test, the first electrode connection line 107 is connected to one side of the first solder joint unit 1051 of the polarity conversion slot, and the second electrode connection line 108 is connected to one side of the second solder joint unit 1101 of the polarity conversion slot; the third electrode connection line 103 and the fourth electrode connection line 115 are both connected to the first electrode of the device under test. The third electrode connection line 103 is connected to the second electrode of the device under test, connected to the other side of the second solder joint unit 1101 of the polarity conversion slot, and the fourth electrode connection line 115 is connected to the other side of the first solder joint unit 1051 of the polarity conversion slot. The number of short-circuited solder joints in the third and fourth solder joint units 1052 and 1102 of the polarity conversion slot is selected based on the number of workstations in the PCB design. The short-circuited solder joints in the third and fourth solder joint units 1052 and 1102 are connected to the common positive electrode of the gold finger through a fuse. The remaining solder joints in the third and fourth solder joint units 1052 and 1102 that are not short-circuited are connected to the negative electrode of the gold finger. The fuses include a first fuse 104 and a second fuse 113; the stop holes include a first stop hole 114 and a second stop hole 106. This complex connection design ensures that no matter which polarity conversion slot the polarity conversion plate is inserted into, the polarity of the component can be automatically switched, without manual intervention. By controlling the short-circuit state of the solder joint unit and the connection of the fuse, the positive and negative polarity can be automatically switched at different test stages, meeting the requirements of bidirectional burn-in. This greatly improves the automation level of burn-in testing, reduces the time and risk of manual operation, and protects the circuit from overload damage through the fuse, improving test safety.

[0048] The present invention proposes a testing method for a component bidirectional aging tool based on an aging device, which uses the component bidirectional aging tool based on the aging device, and includes the following steps:

[0049] The burn-in board integrates bidirectional gold fingers and polarity conversion slots. The polarity conversion board is adapted to the polarity conversion slots and realizes polarity conversion by plugging and unplugging. Install the components to be tested to the specified position of the burn-in board, select a polarity conversion slot and insert the polarity conversion board, connect the gold fingers in the corresponding direction to the burn-in equipment for power-on testing. When the 1 / 2 test cycle is reached, remove the polarity conversion board and reinsert it into another polarity conversion slot, adjust the direction of the burn-in board, connect the new gold fingers to the equipment, and complete the remaining tests.

[0050] This method leverages the bidirectional design of the burn-in tooling, enabling polarity reversal with a simple plug-in / plug-out operation, significantly simplifying the testing process. In principle, inserting and removing the polarity reversal board changes the polarity of the component and power supply connections, while rotating the burn-in board ensures that the gold fingers properly connect to the burn-in equipment. This significantly improves the efficiency and convenience of burn-in testing, reduces the complexity and potential errors of manual operations, and reduces overall tooling costs by reusing the same burn-in board.

[0051] When performing a burn-in test on a single device, the circuit design method is as follows: the two polarities of the component under test are respectively connected to four switches. During the first 1 / 2 cycle burn-in, the first N-pole switch K11, the second N-pole switch K21, and the third N-pole switch KN1 of the first bidirectional device C1 to the nth bidirectional device Cn are simultaneously turned on and short-circuited to V+, the first P-pole switch K12, the second P-pole switch K22, and the third P-pole switch KN2 are simultaneously turned on and connected to the power supply V1-, V2-, and VN-, respectively, and the fourth N-pole switch K13, the fourth P-pole switch K14, the fifth N-pole switch K23, the fifth P-pole switch K24, the sixth N-pole switch KN3, and the sixth P-pole switch KN4 are disconnected; during the second 1 / 2 cycle burn-in, the first bidirectional device C1 to the nth bidirectional device Cn are disconnected. The fourth P-pole switch K14, the fifth P-pole switch K24, and the sixth P-pole switch KN4 of the bidirectional device Cn are simultaneously turned on and short-circuited to V+", and the fourth N-pole switch K13, the fifth N-pole switch K23, and the sixth N-pole switch KN3 of the first bidirectional device C1 to the nth bidirectional device Cn are simultaneously turned on and connected to V1-", V2-", and VN-", respectively. The first N-pole switch K11, the second N-pole switch K21, the third N-pole switch KN1, the first P-pole switch K12, the second P-pole switch K22, and the third P-pole switch KN2 are disconnected; during aging, V+ and V+" are connected to the positive power supply terminal of the aging equipment, and V1-, V2-, VN-, V1-", V2-", and VN-" are independent of each other and are respectively connected to the negative power supply terminal of the equipment through the current sampling circuit. This switch-controlled circuit design method achieves precise control of the polarity of components, ensuring that the components can automatically switch polarity for testing during different aging cycles. In principle, by turning on and off specific switch combinations, the connection between components and the power supply can be changed, enabling burn-in testing of components of different polarities on the same burn-in board. Effectively, the technical solution in this embodiment not only simplifies the operational process and improves the automation level of burn-in testing, but also ensures the accuracy and consistency of test results.

[0052] The working process or use process of the present invention is as follows:

[0053] ① Select appropriate aging tooling 1 according to different device types and packaging devices, and install the devices;

[0054] ② When performing burn-in on non-polar capacitors or bidirectional TVS tubes, insert the polarity conversion board 2 into the polarity conversion slot 105, insert the burn-in finger 101 of the burn-in tool corresponding to this direction into the equipment, and power on for testing.

[0055] ③ When the test reaches 1 / 2 of the aging cycle, turn off the power, unplug the polarity conversion board 2, and then insert it into the opposite polarity conversion slot 110. Similarly, insert the gold finger 112 of the aging tooling corresponding to this direction into the device, and power on the test until it ends.

[0056] ④ When reverse biasing transistors, JFETs, and MOS tubes with different polarities in the same package, select a burn-in fixture with the appropriate fixture. If it is an NPN or N-channel device, insert the corresponding polarity conversion plate into the opposite NPN or N polarity conversion slot, insert the gold finger of the burn-in fixture corresponding to this direction into the device, and directly power on the test until the end. If it is a PNP or P-channel device, insert the corresponding polarity conversion plate into the opposite PNP or P-channel polarity conversion slot, insert the gold finger of the burn-in fixture corresponding to this direction into the device, and directly power on the test until the end.

[0057] Example 1: Aging of non-polarized capacitors and bidirectional TVS diodes

[0058] For non-polarity and bidirectional TVS tube aging, press Figure 5 Design and manufacture burn-in tooling adapted to the package type. For example, if the burn-in device has 40 workstations, then the solder joints for installing the polarity conversion slots need to be designed as 80 pairs of solder joints. Forty of the positive solder joints on the third solder joint unit 1052 and the fourth solder joint unit 1102, which need to be short-circuited, should be connected to the negative V-connection line of the gold finger as the negative pole. The polarity conversion board is designed with 80 pins corresponding to the polarity conversion slots. During testing, the device is installed on the burn-in board, the polarity conversion board is inserted into one polarity conversion slot, and the gold finger in the corresponding direction is inserted into the device for power-on testing. After the test reaches 1 / 2 of the burn-in cycle, the polarity conversion board is removed and inserted into another polarity conversion slot. The burn-in board is rotated 180° horizontally, and the gold finger in the corresponding direction is inserted into the device for power-on testing until the test is completed.

[0059] The burn-in tooling suitable for the package type is manufactured according to the design method of the present invention. The present invention only provides a schematic diagram of the electrode connection of two devices. The design method of the present invention does not limit the number of devices, and does not provide a device socket diagram because it has no substantial impact on the tooling production.

[0060] like Figure 6The reverse-biased PCB board design for NPN and PNP transistors in the same package, insert the polarity conversion board into the NPN slot, connect the collector C of the two transistors to V+, and the base to V-, insert the gold finger at the bottom of the aging device into the device and power on, to achieve the burn-in of the NPN transistor 2N2222; insert the polarity conversion board into the PNP slot, connect the collector C of the two transistors to V-, and the base to V+, insert the gold finger at the top of the aging device into the device and power on, to achieve the reverse-biased burn-in of the PNP transistor 2N2907.

[0061] Therefore, the tooling proposed by the present invention has the following advantages:

[0062] 1) Solve the problem of manual reversing operation during the aging process of non-polarized capacitors and bidirectional transient suppression diodes (TVS tubes), which causes damage to the device appearance and low production efficiency. There is no need to perform reversing operation on each device one by one;

[0063] 2) Solve the high cost problem of devices such as transistors, JFETs, and MOS tubes with different polarities, without the need to re-make aging tooling, and reduce board manufacturing costs;

[0064] 3) This method can also solve the signal commutation problem during the aging process of other integrated circuits such as bus transceivers and analog switches, and is widely used in the field of semiconductor device aging and screening technology.

[0065] 4) Easy to operate and high reliability.

[0066] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention and not to limit it. Although the present invention has been described in detail with reference to the above embodiments, ordinary technicians in the field should understand that the specific implementation methods of the present invention can still be modified or replaced by equivalents. Any modification or equivalent replacement that does not depart from the spirit and scope of the present invention should be covered by the scope of protection of the claims of the present invention.

Claims

1. A bidirectional aging tool for components based on aging equipment, characterized in that: The invention comprises an aging board (1); a station needle is provided on the aging board (1) for installing an aging socket (109) for aging different types of devices; gold fingers are provided at both ends of the aging board (1); polarity conversion slots are provided near the gold fingers, and the polarity conversion slots are connected to the gold fingers; an electrode connection line is provided on the aging board (1), one end of the electrode connection line is connected to the electrode of the aging test device, and the other end of the electrode connection line is correspondingly connected to the polarity conversion slot; a polarity conversion board (2) is provided on the polarity conversion slot.

2. The bidirectional aging tool for components based on aging equipment according to claim 1, characterized in that: The aging plate (1) is provided with a plurality of component stations for accommodating components to be aging.

3. The bidirectional aging tool for components based on aging equipment according to claim 2, characterized in that: The number of pins of the polarity conversion slot is selected as follows: number of slot pins ≥ number of workstations × 2.

4. The bidirectional aging tool for components based on aging equipment according to claim 1, characterized in that: Gold finger structures (203) are provided on both sides of the polarity conversion plate (2), and the gold fingers provided on the two sides are short-circuited one by one in the form of vias (202).

5. The bidirectional aging tool for components based on aging equipment according to claim 4, characterized in that: The number of gold finger pointers is consistent with the number of polarity conversion slot solder points.

6. The bidirectional aging tool for components based on aging equipment according to claim 4, characterized in that: Both ends of the polarity conversion plate (2) are provided with extension plates, and the extension plates and the polarity conversion plate (2) are an integrated structure.

7. The bidirectional aging tool for components based on aging equipment according to claim 4, characterized in that: An error-proofing column (201) is provided on the polarity conversion plate (2).

8. The bidirectional aging tool for components based on aging equipment according to claim 1, characterized in that: The electrode connection lines include a first electrode connection line (107), a second electrode connection line (108), a third electrode connection line (103) and a fourth electrode connection line (115); When a single device is subjected to an aging test, the connection relationship between the electrode connection line, the polarity conversion slot and the gold finger is as follows: the first electrode connection line (107) and the second electrode connection line (108) are both connected to the first electrode of the device under test, the first electrode connection line (107) is connected to one side of the first solder joint unit (1051) of the polarity conversion slot, and the second electrode connection line (108) is connected to one side of the second solder joint unit (1101) of the polarity conversion slot; the third electrode connection line (103) and the fourth electrode connection line (115) are both connected to the second electrode of the device under test, and the third electrode connection line (103) is connected to the first solder joint unit (1101) of the polarity conversion slot. The fourth electrode connection line (115) is connected to the other side of the second solder point unit (1101) of the polarity conversion slot, and the fourth electrode connection line (115) is connected to the other side of the first solder point unit (1051) of the polarity conversion slot; the number of short-circuit solder points of the third solder point unit (1052) and the fourth solder point unit (1102) of the polarity conversion slot are selected according to the number of workstations designed for the PCB, and the short-circuit solder points of the third solder point unit (1052) and the fourth solder point unit (1102) are connected to the common positive electrode of the gold finger through a fuse; and the remaining solder points in the third solder point unit (1052) and the fourth solder point unit (1102) that are not short-circuited are connected to the negative electrode of the gold finger.

9. A testing method for component bidirectional aging tooling based on aging equipment, characterized in that: The bidirectional aging tool for components based on the aging equipment according to any one of claims 1 to 8 comprises the following steps: The aging board integrates bidirectional gold fingers and polarity conversion slots. The polarity conversion board fits into the polarity conversion slots and achieves polarity conversion by plugging and unplugging. Install the components to be tested to the designated position of the burn-in board, select a polarity conversion slot and insert the polarity conversion board, connect the gold fingers in the corresponding direction to the burn-in equipment for power-on testing; When the 1 / 2 test cycle is reached, remove the polarity conversion board and reinsert it into another polarity conversion slot, adjust the direction of the burn-in board, connect the new gold fingers to the device, and complete the remaining tests.

10. The testing method of component bidirectional aging tool based on aging equipment according to claim 9, characterized in that: When performing a burn-in test on a single device, the circuit design method is as follows: the two polarities of the component under test are connected to four switches respectively. During the first 1 / 2 cycle burn-in, the first N-pole switch K11, the second N-pole switch K21, and the third N-pole switch KN1 of the first bidirectional device C1 to the nth bidirectional device Cn are simultaneously turned on and short-circuited to V+, the first P-pole switch K12, the second P-pole switch K22, and the third P-pole switch KN2 are simultaneously turned on and connected to power supplies V1-, V2-, and VN-, respectively. The fourth N-pole switch K13, the fourth P-pole switch K14, the fifth N-pole switch K23, the fifth P-pole switch K24, the sixth N-pole switch KN3, and the sixth P-pole switch KN4 are disconnected. During the second 1 / 2 cycle burn-in, the first bidirectional device C1 to the nth bidirectional device Cn are disconnected. The fourth P-pole switch K14, the fifth P-pole switch K24, and the sixth P-pole switch KN4 of the Cn device are simultaneously turned on and short-circuited to V+", and the fourth N-pole switch K13, the fifth N-pole switch K23, and the sixth N-pole switch KN3 of the first bidirectional device C1 to the nth bidirectional device Cn device are simultaneously turned on and connected to the power supplies V1-", V2-", and VN-", respectively. The first N-pole switch K11, the second N-pole switch K21, the third N-pole switch KN1, the first P-pole switch K12, the second P-pole switch K22, and the third P-pole switch KN2 are disconnected; during aging, the power supplies V+ and V+" are connected to the positive power supply terminal of the aging equipment, and the power supplies V1-, V2-, VN-, V1-", V2-", and VN-" are independent of each other and are respectively connected to the negative power supply terminal of the equipment through current sampling circuits.

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