Fault repair method and device, equipment, storage medium and program product

Abstract

The invention provides a fault repair method and device, equipment, a storage medium and a program product. The method comprises the steps of obtaining target fault information of a target fault; acquiring historical fault information and a historical repair scheme of each historical fault in the at least one historical fault; and determining a target repair scheme of the target fault according to the target fault information and the historical fault information and the historical repair scheme of each historical fault, and performing fault repair on the target fault according to the target repair scheme. And the fault repairing efficiency is improved.

Description

TECHNICAL FIELD

[0001] The present application relates to the computer field, and in particular, to a fault repair method, device, equipment, storage medium and program product. BACKGROUND

[0002] In the process of running the target system, a fault can occur.

[0003] In the related art, after the target system occurs a fault, an alarm is sent. A staff member can determine a target fault of the target system according to the alarm, determine a target repair scheme of the target fault, and then perform fault repair according to the target repair scheme. However, in the above manner, the target repair scheme needs to be determined depending on the personal experience of the staff member, and the fault repair needs to be performed manually according to the target repair scheme, which consumes a long time and leads to low efficiency of performing fault repair. SUMMARY

[0004] Aspects of the present application provide a fault repair method, device, equipment, storage medium and program product to solve the problem of low efficiency of performing fault repair.

[0005] In a first aspect, an embodiment of the present application provides a fault repair method, comprising:

[0006] obtaining target fault information of a target fault;

[0007] obtaining historical fault information and a historical repair scheme of each historical fault in at least one historical fault;

[0008] determining a target repair scheme of the target fault according to the target fault information and the historical fault information and the historical repair scheme of each historical fault, and performing fault repair on the target fault according to the target repair scheme.

[0009] In a possible implementation, determining a target repair scheme corresponding to the target fault according to the target fault information and the historical fault information and the historical repair scheme of each historical fault comprises:

[0010] determining at least one target historical fault corresponding to the target fault in the at least one historical fault according to the target fault information and the historical fault information of each historical fault;

[0011] determining the target repair scheme according to the historical repair scheme of the at least one target historical fault.

[0012] In a possible implementation, determining at least one target historical fault corresponding to the target fault in the at least one historical fault according to the target fault information and the historical fault information of each historical fault comprises:

[0013] determine a similarity between the target fault and each historical fault according to the target fault information and the historical fault information of each historical fault, to obtain at least one similarity;

[0014] determine the at least one target historical fault from the at least one historical fault according to the at least one similarity and a preset threshold, wherein the similarity between the target historical fault and the target fault information is greater than or equal to the preset threshold.

[0015] In a possible implementation, the target repair scheme is determined according to a historical repair scheme of the at least one target historical fault, comprising:

[0016] perform deduplication processing on the at least one historical repair scheme of the at least one target historical fault, to obtain at least one candidate repair scheme;

[0017] determine a scheme parameter of each candidate repair scheme, wherein the scheme parameter comprises at least one of a scheme reliability, a use frequency and a repair success rate;

[0018] determine the target repair scheme from the at least one candidate repair scheme according to the scheme parameter of each candidate repair scheme.

[0019] In a possible implementation, the target repair scheme is determined from the at least one candidate repair scheme according to the scheme parameter of each candidate repair scheme, comprising:

[0020] for any one candidate repair scheme, determine a similarity between the target historical fault corresponding to the candidate repair scheme and the target fault, and determine a predicted repair success rate of the candidate repair scheme according to the similarity between the target historical fault corresponding to the candidate repair scheme and the target fault and the scheme parameter of the candidate repair scheme;

[0021] determine the candidate repair scheme with the highest predicted repair success rate from the at least one candidate repair scheme as the target repair scheme.

[0022] In a possible implementation, the scheme parameter comprises a scheme reliability, a use frequency and a repair success rate; the predicted repair success rate of the candidate repair scheme is determined according to the similarity between the target historical fault corresponding to the candidate repair scheme and the target fault and the scheme parameter of the candidate repair scheme, comprising:

[0023] determine a target similarity according to the similarity between the target historical fault corresponding to the candidate repair scheme and the target fault;

[0024] The target similarity, the scheme reliability of the candidate repair scheme, the statistical value of the usage frequency and the repair success rate are determined as a predicted repair success rate.

[0025] In a possible implementation, according to the target repair scheme, the target fault is repaired, including:

[0026] In the target repair scheme, a plurality of repair steps and an execution order of the plurality of repair steps are determined.

[0027] A repair tool corresponding to each repair step is determined.

[0028] According to the execution order, the repair tool is called to execute the corresponding repair step to perform fault repair.

[0029] In a possible implementation, according to the target repair scheme, after the fault repair is performed, the method further includes:

[0030] A fault repair result of the target fault is obtained, and the fault repair result is repair success or repair failure.

[0031] The target fault information, the target repair scheme and the fault repair result are stored in a preset storage space.

[0032] In a possible implementation, the method further includes:

[0033] According to the fault repair result, the usage frequency and the repair success rate of the target repair scheme are updated.

[0034] In a possible implementation, the target fault information of the target fault is obtained, including:

[0035] Initial fault information of the target fault is obtained, and the initial fault information includes a device identifier of a target device to which the target fault belongs.

[0036] According to the device identifier, device-related information of the target device is determined.

[0037] The initial fault information and the device-related information are included in the target fault information.

[0038] In a second aspect, an embodiment of the present application provides a fault repair method, including:

[0039] Target fault information of a target fault is obtained, and the target fault is a fault occurring in a cloud system.

[0040] Historical fault information and a historical repair scheme of each historical fault in at least one historical fault are obtained.

[0041] According to the target fault information, and the historical fault information and the historical repair scheme of each historical fault, a target repair scheme corresponding to the target fault is determined, and the target fault is repaired according to the target repair scheme.

[0042] In a possible implementation, the determining of the target repair scheme corresponding to the target fault according to the target fault information, and the historical fault information and the historical repair scheme of each historical fault comprises:

[0043] According to the target fault information and the historical fault information of each historical fault, at least one target historical fault corresponding to the target fault is determined from the at least one historical fault;

[0044] The target repair scheme is determined according to the historical repair scheme of the at least one target historical fault.

[0045] In a possible implementation, the determining of the target repair scheme according to the historical repair scheme of at least one target historical fault comprises:

[0046] The at least one historical repair scheme of the at least one target historical fault is de-duplicated to obtain at least one candidate repair scheme;

[0047] A scheme parameter of each candidate repair scheme is determined, and the scheme parameter comprises at least one of a scheme reliability, a use frequency and a repair success rate;

[0048] The target repair scheme is determined from the at least one candidate repair scheme according to the scheme parameter of each candidate repair scheme.

[0049] In a third aspect, an embodiment of the present application provides a fault repair device, comprising: a first obtaining module, a second obtaining module, a determining module and a repairing module, wherein,

[0050] The first obtaining module is configured to obtain target fault information of a target fault;

[0051] The second obtaining module is configured to obtain historical fault information and a historical repair scheme of each historical fault in at least one historical fault;

[0052] The determining module is configured to determine a target repair scheme of the target fault according to the target fault information, and the historical fault information and the historical repair scheme of each historical fault;

[0053] The repairing module is configured to repair the target fault according to the target repair scheme.

[0054] In a possible implementation, the determining module is specifically configured to:

[0055] According to the target fault information and the historical fault information of each historical fault, at least one target historical fault corresponding to the target fault is determined from the at least one historical fault;

[0056] According to the historical repair scheme of the at least one target historical fault, the target repair scheme is determined.

[0057] In a possible implementation, the determining module is specifically configured to:

[0058] According to the target fault information and the historical fault information of each historical fault, a similarity between the target fault and each historical fault is determined, to obtain at least one similarity;

[0059] According to the at least one similarity and a preset threshold, the at least one target historical fault is determined from the at least one historical fault, and the similarity between the historical fault information of the target historical fault and the target fault information is greater than or equal to the preset threshold.

[0060] In a possible implementation, the determining module is specifically configured to:

[0061] The at least one historical repair scheme of the at least one target historical fault is de-duplicated to obtain at least one candidate repair scheme;

[0062] A scheme parameter of each candidate repair scheme is determined, and the scheme parameter includes at least one of the following: a scheme reliability, a use frequency, and a repair success rate;

[0063] According to the scheme parameter of each candidate repair scheme, the target repair scheme is determined from the at least one candidate repair scheme.

[0064] In a possible implementation, the determining module is specifically configured to:

[0065] For any one candidate repair scheme, a similarity between the target historical fault corresponding to the candidate repair scheme and the target fault is determined, and a predicted repair success rate of the candidate repair scheme is determined according to the similarity between the target historical fault corresponding to the candidate repair scheme and the target fault and the scheme parameter of the candidate repair scheme;

[0066] The candidate repair scheme with the highest predicted repair success rate from the at least one candidate repair scheme is determined as the target repair scheme.

[0067] In a possible implementation, the scheme parameter includes the scheme reliability, the use frequency, and the repair success rate; and the determining module is specifically configured to:

[0068] determine a target similarity according to a similarity between the target historical fault corresponding to the candidate repair scheme and the target fault;

[0069] determine the target similarity, a scheme reliability of the candidate repair scheme, a statistical value of a usage frequency and a repair success rate as a predicted repair success rate.

[0070] In a possible implementation, the repair module is specifically configured to:

[0071] determine a plurality of repair steps and an execution order of the plurality of repair steps in the target repair scheme;

[0072] determine a repair tool corresponding to each repair step;

[0073] invoke the repair tool to execute the corresponding repair step according to the execution order, so as to perform fault repair.

[0074] In a possible implementation, the apparatus further includes a third acquisition module and a storage module, wherein,

[0075] the third acquisition module is configured to acquire a fault repair result of the target fault, the fault repair result being repair success or repair failure;

[0076] the storage module is configured to store the target fault information, the target repair scheme and the fault repair result to a preset storage space.

[0077] In a possible implementation, the apparatus further includes an update module,

[0078] the update module is configured to update the usage frequency and the repair success rate of the target repair scheme according to the fault repair result.

[0079] In a possible implementation, the first acquisition module is specifically configured to:

[0080] acquire initial fault information of the target fault, the initial fault information including a device identifier of a target device to which the target fault belongs;

[0081] determine device-related information of the target device according to the device identifier;

[0082] determine that the target fault information includes the initial fault information and the device-related information.

[0083] In a fourth aspect, an embodiment of the present application provides a fault repair apparatus, including a first acquisition module, a second acquisition module, a determination module and a repair module, wherein,

[0084] The first obtaining module is configured to obtain target fault information of a target fault, the target fault being a fault occurring in a cloud system;

[0085] The second obtaining module is configured to obtain historical fault information and a historical repair scheme of each historical fault in at least one historical fault;

[0086] The determining module is configured to determine a target repair scheme of the target fault according to the target fault information and the historical fault information and the historical repair scheme of each historical fault;

[0087] The repairing module is configured to perform fault repair on the target fault according to the target repair scheme.

[0088] In a possible implementation, the determining module is specifically configured to:

[0089] determine at least one target historical fault corresponding to the target fault in the at least one historical fault according to the target fault information and the historical fault information of each historical fault;

[0090] determine the target repair scheme according to a historical repair scheme of the at least one target historical fault.

[0091] In a possible implementation, the determining module is specifically configured to:

[0092] perform deduplication processing on at least one historical repair scheme of the at least one target historical fault to obtain at least one candidate repair scheme;

[0093] determine a scheme parameter of each candidate repair scheme, the scheme parameter including at least one of a scheme reliability, a number of uses, and a repair success rate;

[0094] determine the target repair scheme in the at least one candidate repair scheme according to the scheme parameter of each candidate repair scheme.

[0095] In a fifth aspect, an embodiment of the present application provides an electronic device, including a memory and a processor;

[0096] The memory stores computer execution instructions;

[0097] The processor executes the computer execution instructions stored in the memory, so that the processor executes the method in any one of the first aspect or the second aspect.

[0098] In a sixth aspect, an embodiment of the present application provides a computer readable storage medium, the computer readable storage medium storing computer execution instructions, when the computer execution instructions are executed by a processor, the computer execution instructions are used to implement the method in any one of the first aspect or the second aspect.

[0099] In a seventh aspect, an embodiment of the present application provides a computer program product, comprising a computer program which, when executed by a processor, implements the method shown in any one of the first aspect or the second aspect.

[0100] The embodiments of the present application provide a fault repair method, device, equipment, storage medium and program product. The electronic device can obtain target fault information of a target fault, and obtain historical fault information and a historical repair scheme of each historical fault in at least one historical fault. The electronic device can determine a target repair scheme of the target fault according to the target fault information, and the historical fault information and the historical repair scheme of each historical fault, and perform fault repair on the target fault according to the target repair scheme. Since the electronic device can automatically determine the target repair scheme of the target fault based on the historical fault information and the historical repair scheme of at least one historical fault, and automatically perform fault repair according to the target repair scheme, compared with the prior art, the electronic device does not need to manually determine the target repair scheme and perform fault repair according to the target repair scheme, and therefore the efficiency of performing fault repair is improved. BRIEF DESCRIPTION OF DRAWINGS

[0101] The accompanying drawings, which are included to provide a further understanding of the present application and constitute a part of this application, illustrate certain illustrative embodiments of the present application and together with the description serve to explain the present application. In the drawings:

[0102] Figure 1 A scenario schematic diagram is provided for the illustrative embodiments of the present application;

[0103] Figure 2 A flowchart of a fault repair method is provided for the illustrative embodiments of the present application;

[0104] Figure 3 A flowchart of another fault repair method is provided for the illustrative embodiments of the present application;

[0105] Figure 4 A flowchart of still another fault repair method is provided for the illustrative embodiments of the present application;

[0106] Figure 5 A process schematic diagram of a fault repair method is provided for the illustrative embodiments of the present application;

[0107] Figure 6 A structure schematic diagram of a fault repair device is provided for the illustrative embodiments of the present application;

[0108] Figure 7 A structure schematic diagram of another fault repair device is provided for the illustrative embodiments of the present application;

[0109] Figure 8A structural schematic diagram of an electronic device is provided for an exemplary embodiment of the present application. DETAILED DESCRIPTION

[0110] It should be noted that the user information (including but not limited to user device information, user personal information, etc.) and data (including but not limited to data for analysis, stored data, displayed data, etc.) involved in the present application are all information and data authorized by the user or authorized by all parties, and the collection, use and processing of related data need to comply with relevant laws, regulations and standards, and provide corresponding operation portal for user to choose authorization or refusal.

[0111] In order to make the purpose, technical scheme and advantages of the present application clearer, the technical scheme of the present application will be described clearly and completely below in combination with specific embodiments of the present application and corresponding drawings. Obviously, the described embodiments are only some of the embodiments of the present application, not all. Based on the embodiments in the present application, all other embodiments obtained by those skilled in the art without creative labor fall within the scope of protection of the present application.

[0112] Figure 1 A scene schematic diagram is provided for an exemplary embodiment of the present application. Please refer to Figure 1 The electronic device can include a plurality of historical faults and a historical repair scheme for each historical fault. For example, the plurality of historical faults can be historical fault 1, historical fault 2, …, historical fault n respectively. Among them, historical fault 1 corresponds to historical repair scheme 1, historical fault 2 corresponds to historical repair scheme 2, …, historical fault n corresponds to historical repair scheme m, n and m are integers greater than or equal to 1.

[0113] When the target system has a target fault, the electronic device can determine a target repair scheme for the target fault according to the target fault, the plurality of historical faults and the historical repair scheme for each historical fault, and perform fault repair on the target fault according to the target repair scheme.

[0114] For example, if the target fault is an abnormal start of virtual machine 1 in the target system, and assuming that the electronic device can determine that the target repair scheme for the target fault is target repair scheme 2 according to the target fault, the plurality of historical faults and the historical repair scheme for each historical fault, the electronic device can execute target repair scheme 2 to perform fault repair on the target fault.

[0115] In related technologies, when a target system fails, an alarm is issued. Based on the alarm, staff can determine the target fault that has occurred in the target system, determine a target repair plan for the target fault, and then perform repairs based on the target repair plan. However, this approach relies on staff's personal experience to determine the target repair plan, and the staff must manually perform repairs based on the target repair plan, which is time-consuming and inefficient.

[0116] In an embodiment of the present application, an electronic device obtains target fault information of a target fault, and obtains historical fault information and historical repair solutions for each historical fault. The electronic device can determine a target repair solution for the target fault based on the target fault information, as well as the historical fault information and historical repair solutions for each historical fault, and then perform fault repair on the target fault based on the target repair solution. Because the electronic device can automatically determine a target repair solution for the target fault based on historical fault information and historical repair solutions for at least one historical fault, and automatically perform fault repair according to the target repair solution, compared to the prior art, there is no need for manual determination of the target repair solution and fault repair according to the target repair solution, thereby improving the efficiency of fault repair.

[0117] The technical solutions shown in this application are described in detail below through specific embodiments. It should be noted that the following embodiments can exist independently or in combination with each other, and the same or similar contents will not be repeated in different embodiments.

[0118] Figure 2 This is a flowchart of a fault repair method provided by an exemplary embodiment of the present application. Figure 2 , the method may include:

[0119] S201: Obtain target fault information of a target fault.

[0120] The execution subject of the embodiments of the present application may be an electronic device, or a fault recovery device provided in the electronic device. The fault recovery device may be implemented through software, or through a combination of software and hardware. The fault recovery device may be a processor in the electronic device. For ease of understanding, the following description will be based on an example of an electronic device as the execution subject.

[0121] The target fault may be a fault in the target system. The target system may include multiple servers, each of which may have virtual machines running on it. For example, the target fault may be a startup anomaly of virtual machine 1 in the target system.

[0122] The target fault information can include a fault code of the target fault, an identification of a target device to which the target fault belongs, a cabinet in which the target device is located, an application to which the target fault belongs, a system component associated with the target device, a fault level, and a time of occurrence.

[0123] Optionally, after the target system has the target fault, the target system can send target fault information of the target fault to the electronic device, so that the electronic device can obtain the target fault information.

[0124] For example, if the target system is system 1, the target fault is an abnormal start of a virtual machine 1 in system 1, and the target fault information is as shown in Table 1:

[0125] Table 1

[0126]

[0127] The system 1 can send the target fault information of the target fault to the electronic device, so that the electronic device can obtain the target fault information.

[0128] S202, obtaining historical fault information and a historical repair scheme of each historical fault in at least one historical fault.

[0129] The historical fault refers to a fault of the target system occurring at a historical time.

[0130] For any one historical fault, each historical fault has corresponding historical fault information and a historical repair scheme.

[0131] The historical fault information can include a fault code of the historical fault, a device identification of a device to which the historical fault belongs, a cabinet in which the device is located, an application to which the historical fault belongs, a system component associated with the device, a fault level, and a time of occurrence. Optionally, the device can be a server in the target system.

[0132] The historical repair scheme can include a plurality of repair steps. For example, the historical repair scheme 1 can include a repair step 1 and a repair step 2. The repair step 1 can be to restart the server, and the repair step 2 can be to restart the virtual machine.

[0133] For any one historical fault, the historical fault can also have a corresponding fault repair result. The fault repair result can include repair success and repair failure.

[0134] Optionally, there can be at least one historical fault. The historical fault information, the historical repair scheme, and the fault repair result of the at least one historical fault can be stored in a preset storage space in the form of a data table. The preset storage space can be a preset storage space in the electronic device, or can be a preset database.

[0135] For example, the historical failure information, the historical repair scheme, and the failure repair result of the at least one historical failure can be as shown in Table 2:

[0136] Table 2

[0137]

[0138]

[0139] It should be noted that in the at least one historical failure, there can be multiple historical repair schemes of the historical failure. For example, as shown in Table 2, the historical repair scheme of the historical failure 2 and the historical failure 3 can both be the historical repair scheme 2.

[0140] The electronic device can obtain the historical failure information and the historical repair scheme of each historical failure in the at least one historical failure in the preset storage space.

[0141] For example, the electronic device can obtain the historical failure information and the historical repair scheme of each historical failure in the n historical failures as shown in Table 2 in the preset storage space or the preset database.

[0142] S203, determining a target repair scheme of the target failure according to the target failure information and the historical failure information and the historical repair scheme of each historical failure, and performing failure repair on the target failure according to the target repair scheme.

[0143] In an optional embodiment, the target repair scheme corresponding to the target failure can be determined in the following manner: determining at least one target historical failure corresponding to the target failure in the at least one historical failure according to the target failure information and the historical failure information of each historical failure; and determining the target repair scheme according to the historical repair scheme of the at least one target historical failure.

[0144] For example, if the target failure is the abnormal startup of the virtual machine 1 in the system 1, the target failure information is as shown in Table 1, and the electronic device obtains the historical failure information of each historical failure as shown in Table 2, the electronic device can determine at least one target historical failure corresponding to the target failure in the n historical failures according to the target failure information and the historical failure information of each historical failure in Table 2. Assuming that the electronic device can determine the historical failure 1 and the historical failure 2 as the target historical failure, the electronic device can determine the target repair scheme of the target failure according to the historical repair scheme 1 of the historical failure 1 and the historical repair scheme 2 of the historical failure 2, assuming that the determined target repair scheme includes a repair step 1 and a repair step 2, the repair step 1 can be restarting the server, and the repair step 2 can be restarting the virtual machine.

[0145] After the electronic device determines the target repair scheme, the electronic device can determine a plurality of repair steps in the target repair scheme, and determine a repair tool corresponding to each repair step. Then, the electronic device can call the repair tool to execute the corresponding repair step according to the execution order of the plurality of repair steps, so as to perform fault repair on the target fault.

[0146] For example, if the target repair scheme includes repair step 1 and repair step 2, the repair step 1 can be restarting the server, and the repair step 2 can be restarting the virtual machine. The repair step 1 has a corresponding repair tool 1, and the repair step 2 has a corresponding repair tool 2. Then, the electronic device can call the repair tool 1 to execute the repair step 1, i.e., restart the server E01, and then call the repair tool 2 to execute the repair step 2, i.e., restart the virtual machine VM-1, so as to perform fault repair on the target fault.

[0147] In the embodiments of the present application, the electronic device can obtain target fault information of a target fault, and obtain historical fault information and a historical repair scheme of each historical fault in at least one historical fault. The electronic device can determine a target repair scheme of the target fault according to the target fault information and the historical fault information and the historical repair scheme of each historical fault, and perform fault repair on the target fault according to the target repair scheme. Since the electronic device can automatically determine the target repair scheme of the target fault based on the historical fault information and the historical repair scheme of at least one historical fault, and automatically perform fault repair according to the target repair scheme, compared with the prior art, the electronic device does not need to manually determine the target repair scheme and perform fault repair according to the target repair scheme, so that the efficiency of performing fault repair is improved.

[0148] If Figure 2 If the target system in the embodiments is a cloud system, the present application further provides another fault repair method. Figure 3 Another flowchart of another fault repair method provided by an exemplary embodiment of the present application is shown in FIG. 3. As shown in FIG. 3, the method includes the following steps. Figure 3

[0149] S301, obtaining target fault information of a target fault.

[0150] The target fault can be a fault occurring in a cloud system. The cloud system can include a plurality of cloud servers, and the cloud servers can run virtual machines. For example, the target fault can be that a virtual machine 1 in the cloud system starts abnormally.

[0151] The target fault information can include fault codes of the target fault, an identifier of a target device to which the target fault belongs, a rack where the target device is located, an application to which the target fault belongs, a system component associated with the target device, a fault level, and a time when the fault occurs.

[0152] ​Optionally, after the target fault of the cloud system occurs, the cloud system can send target fault information of the target fault to the electronic device, so that the electronic device can obtain the target fault information.

[0153] For example, if the target fault is an abnormal start of a virtual machine 1 in the cloud system, the target fault information can be as shown in Table 1 above.

[0154] S302, obtain the historical fault information and the historical repair scheme of each historical fault in the at least one historical fault.

[0155] The historical fault refers to a fault of the target system occurring at a historical time.

[0156] For any one historical fault, each historical fault has corresponding historical fault information and a historical repair scheme.

[0157] The historical fault information can include fault codes of the historical fault, device identifiers of devices to which the historical fault belongs, cabinets in which the devices are located, applications to which the historical fault belongs, system components associated with the devices, fault levels, and time of occurrence. Fault information. Optionally, the device can be a server in the target system.

[0158] The historical repair scheme can include multiple repair steps. For example, the historical repair scheme 1 can include repair step 1 and repair step 2. Repair step 1 can be to restart the cloud server, and repair step 2 can be to restart the virtual machine.

[0159] For any one historical fault, the historical fault can also have a corresponding fault repair result. The fault repair result can include repair success and repair failure.

[0160] Optionally, there can be at least one historical fault. The historical fault information, the historical repair scheme, and the fault repair result of the at least one historical fault can be stored in a preset storage space in the form of a data table. The preset storage space can be a preset storage space in the electronic device, or a preset database.

[0161] The electronic device can obtain the historical fault information and the historical repair scheme of each historical fault in the at least one historical fault in the preset storage space.

[0162] For example, the electronic device can obtain the historical fault information and the historical repair scheme of each historical fault in n historical faults as shown in Table 2 in the preset storage space or the preset database.

[0163] S303, according to the target fault information, and the historical fault information and the historical repair scheme of each historical fault, determine a target repair scheme corresponding to the target fault, and perform fault repair on the target fault according to the target repair scheme.

[0164] In an optional embodiment, the target repair scheme corresponding to the target fault can be determined by: determining at least one target historical fault corresponding to the target fault from at least one historical fault according to the target fault information and the historical fault information of each historical fault; and determining the target repair scheme according to the historical repair scheme of the at least one target historical fault.

[0165] For example, if the target fault is an abnormal start of a virtual machine 1 in a cloud system, and the target fault information is as shown in Table 1, and the electronic device obtains the historical fault information of each historical fault as shown in Table 2, the electronic device can determine at least one target historical fault corresponding to the target fault from n historical faults according to the target fault information and the historical fault information of each historical fault in Table 2. Assuming that the electronic device can determine historical fault 1, historical fault 2, and historical fault 3 as the target historical faults, the electronic device can determine the target repair scheme of the target fault according to the historical repair schemes of the three target historical faults.

[0166] In a possible implementation, the target repair scheme can be determined according to the historical repair scheme of the at least one target historical fault by: performing deduplication processing on the at least one historical repair scheme of the at least one target historical fault to obtain at least one candidate repair scheme; determining a scheme parameter of each candidate repair scheme; and determining the target repair scheme from the at least one candidate repair scheme according to the scheme parameter of each candidate repair scheme.

[0167] Since there can be the same historical repair scheme in the historical repair schemes of the at least one target historical fault, the deduplication processing can be performed on the at least one historical repair scheme of the at least one target historical fault to obtain at least one candidate repair scheme.

[0168] For example, if there are three target historical faults, namely historical fault 1, historical fault 2, and historical fault 3, and the historical repair schemes of the three historical faults are as shown in Table 2, that is, the historical repair schemes of the three target historical faults are historical repair scheme 1, historical repair scheme 2, and historical repair scheme 2 respectively. Since historical repair scheme 2 is repeated in the three historical repair schemes, the electronic device can perform deduplication processing on the three historical repair schemes to obtain two candidate repair schemes, namely historical repair scheme 1 and historical repair scheme 2.

[0169] For any one candidate repair scheme, the scheme parameter of the candidate repair scheme can include at least one of the following: a scheme reliability, a number of uses, and a repair success rate.

[0170] Optionally, the scheme reliability can be preset.

[0171] The repair success rate refers to a repair success rate of a to-be-selected repair scheme under a target fault type of a target fault.

[0172] For example, if there are two to-be-selected repair schemes, historical repair scheme 1 and historical repair scheme 2, the scheme reliability of historical repair scheme 1 is 90%, the number of uses is 12, and the repair success rate is 92%; the scheme reliability of historical repair scheme 2 is 83%, the number of uses is 20, and the repair success rate is 85%; then the target repair scheme can be determined from the two to-be-selected repair schemes according to the scheme parameters of the two to-be-selected repair schemes. Assuming that historical repair scheme 2 is determined as the target repair scheme according to the scheme parameters of the two to-be-selected repair schemes, the target repair scheme includes repair step 1 and repair step 2, and repair step 1 can be restarting the cloud server, and repair step 2 can be restarting the virtual machine.

[0173] After the electronic device determines the target repair scheme, the target fault can be repaired according to the target repair scheme.

[0174] For example, if the target repair scheme includes repair step 1 and repair step 2, repair step 1 can be restarting the cloud server, and repair step 2 can be restarting the virtual machine. Repair step 1 has a corresponding repair tool 1, and repair step 2 has a corresponding repair tool 2. The electronic device can call repair tool 1 to perform repair step 1, i.e., restart the cloud server E01, and then call repair tool 2 to perform repair step 2, i.e., restart the virtual machine VM-1, to repair the target fault.

[0175] In the embodiments of the present application, the electronic device can obtain target fault information of a target fault, and obtain historical fault information and historical repair schemes of at least one historical fault. The electronic device can determine a target repair scheme of the target fault according to the target fault information and the historical fault information and the historical repair schemes of each historical fault, and repair the target fault according to the target repair scheme. Since the electronic device can automatically determine the target repair scheme of the target fault based on the historical fault information and the historical repair schemes of at least one historical fault, and automatically repair the fault according to the target repair scheme, compared with the prior art, the target repair scheme does not need to be determined manually, and the fault is repaired according to the target repair scheme, so the efficiency of repairing the fault is improved.

[0176] Next, on the basis of the embodiments shown in Figure 2 or Figure 3 in combination with Figure 4 , the above fault repair method is described in detail.

[0177] Figure 4 A flowchart of another fault repair method provided by an exemplary embodiment of the present application is shown. Please refer toFigure 4 The method can comprise:

[0178] S401, obtaining target fault information of a target fault.

[0179] In an optional embodiment, the target fault information of the target fault can be obtained by: obtaining initial fault information of the target fault; determining device-related information of a target device according to a device identifier; and determining that the target fault information comprises the initial fault information and the device-related information.

[0180] The initial fault information can comprise a device identifier of a target device to which the target fault belongs. Optionally, the initial fault information can further comprise time of occurrence of the target fault, a fault code, an application to which the target fault belongs, and fault level, and the like.

[0181] For example, if the target fault is abnormal start of a virtual machine 1, the initial fault information can comprise a fault code of VM-1Start fail, a device identifier of a target device to which the target fault belongs of E01, an application to which the target fault belongs of cloud application A1, a fault level of 3, and time of occurrence of 2024 / 4 / 7 10:03.

[0182] The electronic device can store device metadata of a plurality of devices. Therefore, the electronic device can determine a device identifier of a target device to which the target fault belongs in the initial fault information of the target fault, and determine device-related information of the target device in the plurality of device metadata according to the device identifier, to complete the target fault information of the target fault. The target fault information can comprise the initial fault information and the device-related information.

[0183] Optionally, the device-related information can comprise a system component associated with the target device, and a cabinet in which the target device is located, and the like.

[0184] For example, if the target fault is a virtual machine 1 startup failure, the initial fault information can include a fault code VM-1Start fail, a device identifier of the target device to which the target fault belongs E01, an application to which the target device belongs cloud application A1, a fault level 3, and a time of occurrence 2024 / 4 / 7 10:03. The electronic device can determine the device identifier of the target device as E01 in the initial fault information, and determine the device metadata 1 including the device identifier E01 in the plurality of device metadata according to the device identifier E01. If the device metadata 1 includes the device identifier E01, a cabinet in which the device is located cabinet 1, and a system component to which the device is associated system component M1, the electronic device can determine that the device related information of the target device includes the cabinet in which the device is located cabinet 1 and the system component to which the device is associated system component M1 according to the device metadata 1. The electronic device can determine that the target fault information includes the initial fault information and the device related information, and the target fault information can be as shown in Table 1.

[0185] S402, obtain historical fault information and historical repair scheme of each historical fault in at least one historical fault.

[0186] It should be noted that the execution process of step S402 can refer to step S202, which will not be described here.

[0187] S403, according to the target fault information and the historical fault information of each historical fault, determine the similarity between the target fault and each historical fault, and obtain at least one similarity.

[0188] Optionally, the electronic device can determine the similarity between the target fault and each historical fault according to the target fault information and the historical fault information of each historical fault by a similarity matching algorithm, and obtain at least one similarity.

[0189] For example, if the target fault information is as shown in Table 1, and the historical fault information of each historical fault is as shown in Table 2, the electronic device can perform similarity matching between the target fault information and the historical fault information of the n historical faults by a similarity matching algorithm to determine the similarity between the target fault and each historical fault, and obtain n similarities. Assuming that the n similarities between the target fault and the n historical faults can be determined as shown in Table 3:

[0190] Table 3

[0191] Similarity 1 of target fault and historical fault 1 87％ Similarity 2 of target fault and historical fault 2 85％ Similarity 3 of target fault and historical fault 3 82％ …… …… Similarity n of target fault and historical fault n 10％

[0192] S404, according to at least one similarity and a preset threshold, determine at least one target historical fault in at least one historical fault.

[0193] The similarity between the historical fault information of the target historical fault and the target fault information can be greater than or equal to a preset threshold.

[0194] Optionally, the preset threshold can be artificially preset. For example, the preset threshold can be 80%.

[0195] For example, if there are n similarities as shown in Table 3, the preset threshold is 80%, and the similarity 1 between the target fault and the historical fault 1 is 87%, the similarity 2 between the target fault and the historical fault 2 is 85%, and the similarity 3 between the target fault and the historical fault 3 is 82%, all of which are greater than the preset threshold 80%, the electronic device can determine that the at least one target historical fault includes the historical fault 1, the historical fault 2, and the historical fault 3 among the n historical faults.

[0196] S405, performing deduplication processing on the at least one historical repair scheme of the at least one target historical fault to obtain at least one candidate repair scheme.

[0197] Since there can be the same historical repair scheme in the historical repair scheme of the at least one target historical fault, the deduplication processing can be performed on the at least one historical repair scheme of the at least one target historical fault to obtain at least one candidate repair scheme.

[0198] For example, if there are three target historical faults, historical fault 1, historical fault 2, and historical fault 3, and the historical repair schemes of the three historical faults are as shown in Table 2, the three historical repair schemes of the three target historical faults are historical repair scheme 1, historical repair scheme 2, and historical repair scheme 2, respectively. Since the historical repair scheme 2 is repeated in the three historical repair schemes, the electronic device can perform deduplication processing on the three historical repair schemes to obtain two candidate repair schemes, historical repair scheme 1 and historical repair scheme 2.

[0199] S406, determining a scheme parameter of each candidate repair scheme.

[0200] The scheme parameter can include at least one of the following: a scheme reliability, a usage frequency, and a repair success rate.

[0201] Optionally, for any one candidate repair scheme, the scheme reliability can be preset. For example, if the candidate repair scheme includes historical repair scheme 1 and historical repair scheme 2, the scheme reliability of the historical repair scheme 1 can be 90%, and the scheme reliability of the historical repair scheme 2 can be 85%.

[0202] The repair success rate refers to the repair success rate of the candidate repair scheme under the target fault type of the target fault.

[0203] For example, if the to-be-selected repair scheme is historical repair scheme 1, historical repair scheme 1 can be used to repair faults corresponding to fault type 1 and fault type 2, and if the target fault corresponds to fault type 1, the repair success rate of historical repair scheme 1 refers to the repair success rate of historical repair scheme under fault type 1.

[0204] For any one to-be-selected repair scheme, the electronic device can determine the scheme parameter of the to-be-selected repair scheme.

[0205] For example, if there are two to-be-selected repair schemes, historical repair scheme 1 and historical repair scheme 2, and the scheme parameters of the two to-be-selected repair schemes are as shown in Table 4:

[0206] Table 4

[0207] Historical repair scheme 1 Historical repair scheme 2 Scheme reliability 90％ 83％ Use times 12 times 20 times Repair success rate 92％ 85％

[0208] S407, according to the scheme parameter of each to-be-selected repair scheme, determining a target repair scheme in at least one to-be-selected repair scheme.

[0209] In an optional embodiment, the target repair scheme can be determined in at least one to-be-selected repair scheme in the following manner: for any one to-be-selected repair scheme, determining the similarity between the target historical fault corresponding to the to-be-selected repair scheme and the target fault, and determining the predicted repair success rate of the to-be-selected repair scheme according to the similarity between the target historical fault corresponding to the to-be-selected repair scheme and the target fault and the scheme parameter of the to-be-selected repair scheme; determining the to-be-selected repair scheme with the highest predicted repair success rate in at least one to-be-selected repair scheme as the target repair scheme.

[0210] Optionally, if the scheme parameter includes the scheme reliability, the number of uses, and the repair success rate, the predicted repair success rate of the to-be-selected repair scheme can be determined according to the similarity between the target historical fault corresponding to the to-be-selected repair scheme and the target fault and the scheme parameter of the to-be-selected repair scheme in the following manner: determining the target similarity according to the similarity between the target historical fault corresponding to the to-be-selected repair scheme and the target fault; and determining the predicted repair success rate as the statistical value of the target similarity, the scheme reliability, the number of uses, and the repair success rate of the to-be-selected repair scheme.

[0211] For any one to-be-selected repair scheme, since the to-be-selected repair scheme can correspond to at least one target historical fault, and there is a similarity between the target fault and each target historical fault, at least one similarity between the at least one target historical fault corresponding to the to-be-selected repair scheme and the target fault can be determined. Optionally, the maximum similarity in the at least one similarity can be determined as the target similarity between the target historical fault corresponding to the to-be-selected repair scheme and the target fault.

[0212] For example, if there are 2 candidate repair solutions, historical repair solution 1 and historical repair solution 2, for historical repair solution 1, if the target historical fault corresponding to historical repair solution 1 is historical fault 1, the similarity 1 between historical fault 1 and the target fault is 87%, and the target similarity 1 between the target historical fault corresponding to historical repair solution 1 and the target fault can be determined as 87%.

[0213] After the electronic device determines the target similarity between the target historical fault corresponding to any one of the candidate repair solutions and the target fault, the target similarity, the solution reliability of the candidate repair solution, the number of uses, and the statistical value of the repair success rate can be determined as the predicted repair success rate of the candidate repair solution.

[0214] Optionally, the statistical value can be a product.

[0215] For example, if there are 2 candidate repair solutions, historical repair solution 1 and historical repair solution 2, the solution parameters of the 2 candidate repair solutions are as shown in Table 4, if the target similarity 1 between the target historical fault corresponding to historical repair solution 1 and the target fault is 87%, for historical repair solution 1, the predicted repair success rate 1 of historical repair solution 1 can be 87%*90%*12*92%=8.64; if the target similarity 2 between the target historical fault corresponding to historical repair solution 2 and the target fault is 85%, for historical repair solution 2, the predicted repair success rate 2 of historical repair solution 2 can be 85%*83%*20*85%=11.99.

[0216] The electronic device can determine the candidate repair solution with the highest predicted repair success rate in the at least one candidate repair solution as the target repair solution. For example, if there are 2 candidate repair solutions, historical repair solution 1 and historical repair solution 2, if the predicted repair success rate 1 of historical repair solution 1 is 8.64, and the predicted repair success rate 2 of historical repair solution 2 is 11.99, historical repair solution 2 can be determined as the target repair solution.

[0217] S408, according to the target repair solution, repairing the target fault.

[0218] In an optional embodiment, the target fault can be repaired according to the target repair scheme in the following manner: in the target repair scheme, a plurality of repair steps and an execution order of the plurality of repair steps are determined; a repair tool corresponding to each repair step is determined; and the repair tool is called to execute the corresponding repair step in the execution order to repair the fault.

[0219] For any repair step, the repair step can have a corresponding repair tool.

[0220] For example, if the target repair scheme is historical repair scheme 2, historical repair scheme 2 includes repair step 1 and repair step 2, repair step 1 can be restarting the cloud server, repair step 2 can be restarting the virtual machine, and the execution order of the two repair steps is: repair step 1, repair step 2, then the electronic device can determine the first step in the target repair scheme as repair step 1, and further determine repair tool 1 corresponding to repair step 1, call repair tool 1 to execute repair step 1 (i.e., restart cloud server E01); the electronic device can determine the second step as repair step 2, and further determine repair tool 2 corresponding to repair step 2, call repair tool 2 to execute repair step 2 (i.e., restart virtual machine VM-1), to repair the target fault.

[0221] S409, obtaining a fault repair result of the target fault.

[0222] After the electronic device repairs the target fault according to the target repair scheme, the electronic device can obtain a fault repair result of the target fault. The fault repair result can be repair success or repair failure.

[0223] For example, if the target fault is that virtual machine 1 in the cloud system starts abnormally, then after the electronic device repairs the target fault according to the target repair scheme, the electronic device can obtain a fault repair result of the target fault. Assuming that the fault repair result is repair success.

[0224] S410, storing the target fault information, the target repair scheme, and the fault repair result to a preset storage space.

[0225] For example, if the target fault information is as shown in Table 1, the target repair scheme is historical repair scheme 2, which includes repair step 1 and repair step 2, and the fault repair result is repair success, then the electronic device can store the target fault information, the target repair scheme, and the fault repair result to the data table as shown in Table 2, to achieve storage to the preset storage space.

[0226] S411, updating the usage frequency and repair success rate of the target repair scheme according to the fault repair result.

[0227] Optionally, the preset storage space can also store the usage times and the repair success rates of each historical repair scheme.

[0228] The electronic device can update the usage times and the repair success rates of the target repair scheme according to the fault repair result, so as to be used directly subsequently.

[0229] For example, if the target repair scheme is the historical repair scheme 2, if the original usage times of the historical repair scheme 2 is 20 times, the usage times of the historical repair scheme 2 can be updated to 21 times. If the original repair success rate of the historical repair scheme 2 is 85%, if the fault repair result of the target fault is repair success, the repair success rate of the historical repair scheme 2 can be updated to 86% according to the fault repair result.

[0230] It should be noted that, in the above embodiments, Figure 4 The various processing steps (S401-S411) shown in the embodiments do not constitute a specific limitation on the fault repair process. In other embodiments of the present application, the fault repair process can include more or fewer steps than Figure 4 the embodiments. For example, the fault repair process can include some steps in the embodiments, or, Figure 4 some steps in the embodiments can be replaced by steps with the same function, or Figure 4 some steps in the embodiments can be split into multiple steps, etc. Figure 4

[0231] ​In the embodiment of the present application, the electronic device can obtain target fault information of a target fault, and obtain historical fault information and a historical repair scheme of each historical fault in at least one historical fault. The electronic device can determine the similarity between the target fault and each historical fault according to the target fault information and the historical fault information of each historical fault, obtain at least one similarity, and determine at least one target historical fault in the at least one historical fault according to the at least one similarity and a preset threshold. Then, the electronic device can perform deduplication processing on at least one historical repair scheme of the at least one target historical fault, and obtain at least one candidate repair scheme. The electronic device can determine a scheme parameter of each candidate repair scheme, and determine a target repair scheme in the at least one candidate repair scheme according to the scheme parameter of each candidate repair scheme. Then, the electronic device can perform fault repair on the target fault according to the target repair scheme. The electronic device can also obtain a fault repair result of the target fault, and store the target fault information, the target repair scheme, and the fault repair result in a corresponding preset storage space. The electronic device can also update the usage frequency and the repair success rate of the target repair scheme according to the fault repair result. Since the electronic device can automatically determine the target repair scheme of the target fault based on the historical fault information and the historical repair scheme of the at least one historical fault, and automatically perform fault repair according to the target repair scheme, compared with the prior art, the electronic device does not need to manually determine the target repair scheme and perform fault repair according to the target repair scheme, thereby improving the efficiency of fault repair.

[0232] In the following, on the basis of any of the above embodiments, the above fault repair method is further described through specific examples. Figure 5

[0233] Figure 5 A process schematic diagram of a fault repair method provided by an exemplary embodiment of the present application is shown in FIG. 1. Referring to FIG. 1, the electronic device can include a fault repair system, and the fault repair system can include a fault data storage component, a fault repair decision scheduling component, and a fault repair channel component. Figure 5 The fault data storage component is the preset storage space described in the above embodiments. The fault data storage component can store the historical fault information, the historical repair scheme, and the fault repair result of each historical fault in at least one historical fault; and can also store the usage frequency and the repair success rate of each historical repair scheme. The fault data storage component can also store the device metadata of a plurality of devices.

[0234] The fault repair decision scheduling component can include a fault analysis component, a fault decision component, a fault repair scheduling component, and a fault repair feedback component.

[0235]

[0236] ​​The fault analysis component can be configured to analyze the initial fault information of the target fault and complete the target fault information. That is, the electronic device can determine the device identifier of the target device to which the target fault belongs in the initial fault information, and determine the device-related information of the target device in the plurality of device metadata according to the device identifier, and then determine that the target fault information includes the initial fault information and the device-related information. The fault analysis component can also be configured to determine at least one target historical fault corresponding to the target fault in at least one historical fault according to the target fault information and the historical fault information of each historical fault.

[0237] The fault decision component can be configured to determine the historical repair scheme of the at least one target historical fault, and determine the target repair scheme according to the historical repair scheme of the at least one target historical fault.

[0238] The fault repair scheduling component can be configured to perform fault repair on the target fault according to the target repair scheme, and obtain the fault repair result of the target fault.

[0239] The fault repair feedback component can be configured to store the target fault information, the target repair scheme, and the fault repair result in the fault data storage component correspondingly. The fault repair feedback component can also be configured to update the usage frequency and the repair success rate of the target repair scheme according to the fault repair result.

[0240] The fault repair channel component can include a repair tool management component and a system access agent component.

[0241] The repair tool management component can be preconfigured with a plurality of repair tools, so as to be called by the fault repair scheduling component when performing fault repair on the target fault according to the target repair scheme. For example, the repair tool management component can be preconfigured with a server restart tool, a virtual machine restart tool, a network switching tool, and the like.

[0242] The system access agent component can be configured to access the target system. The target system can be a user system.

[0243] Optionally, the electronic device can perform the fault repair method in the present application through the fault repair system, and the specific process can include steps ①, ②, ③, ④, ⑤, ⑥, ⑦, and ⑧.

[0244] In step ①, the electronic device can obtain the initial fault information of the target fault through the fault analysis component. For example, the initial fault information can include a fault code VM-1Start fail, an identifier E01 of a target device to which the target fault belongs, an application cloud application A1 to which the target fault belongs, a fault level 3, and a time of occurrence 2024 / 4 / 7 10:03.

[0245] In step ②, the electronic device can analyze the initial fault information of the target fault through the fault analysis component, and supplement the target fault information. For example, the electronic device can determine that the device identifier of the target device is E01 in the initial fault information 1, and determine the device metadata 1 including the device identifier E01 in the plurality of device metadata according to the device identifier E01. If the device metadata 1 includes the device identifier E01, the cabinet where the device is located is cabinet 1, and the system component associated with the device is system component M1, the electronic device can determine that the device related information of the target device includes that the cabinet where the device is located is cabinet 1, and the system component associated with the device is system component M1 according to the device metadata 1, and then the electronic device can determine that the target fault information is as shown in Table 1.

[0246] In step ③, the electronic device can determine at least one target historical fault corresponding to the target fault in at least one historical fault through the fault analysis component according to the target fault information and the historical fault information of each historical fault.

[0247] Optionally, the electronic device can determine the similarity between the target fault and each historical fault according to the target fault information and the historical fault information of each historical fault through the similarity matching algorithm, obtain at least one similarity, and determine at least one target historical fault in at least one historical fault according to the at least one similarity and the preset threshold. For example, the electronic device can determine that the at least one target historical fault includes historical fault 1, historical fault 2, and historical fault 3.

[0248] In step ④, the electronic device can determine the historical repair scheme of at least one target historical fault through the fault decision component, and determine the target repair scheme according to the historical repair scheme of at least one target historical fault.

[0249] Optionally, the electronic device can determine the historical repair scheme of at least one target historical fault, and perform deduplication processing on the at least one historical repair scheme of at least one target historical fault to obtain at least one candidate repair scheme, and then can determine the scheme parameter of each candidate repair scheme, and determine the target repair scheme in at least one candidate repair scheme according to the scheme parameter of each candidate repair scheme and the similarity between the target historical fault corresponding to the candidate repair scheme and the target fault.

[0250] For example, if there are 3 target historical faults, historical fault 1, historical fault 2, and historical fault 3, and the historical repair solutions of the 3 target historical faults are historical repair solution 1, historical repair solution 2, and historical repair solution 2 respectively, the 3 historical repair solutions can be de-duplicated to obtain 2 candidate repair solutions, historical repair solution 1 and historical repair solution 2. If the scheme parameters of historical repair solution 1 and historical repair solution 2 are as shown in Table 4, and the similarity 1 between historical fault 1 and the target fault is 87%, and the similarity 2 between the target fault and historical fault 2 is 85%, the predicted repair success rate 1 of historical repair solution 1 can be 8.64, and the predicted repair success rate 2 of historical repair solution 2 can be 85%*83%*20*85% = 11.99, and historical repair solution 2 can be determined as the target repair solution.

[0251] In step V, the electronic device can perform fault repair on the target fault according to the target repair solution through the fault repair scheduling component.

[0252] Optionally, the electronic device can determine a plurality of repair steps and an execution order of the plurality of repair steps in the target repair solution through the fault repair scheduling component, and determine a repair tool corresponding to each repair step, and then call the repair tool to execute the corresponding repair step according to the execution order to perform fault repair.

[0253] For example, if the target repair solution is historical repair solution 2, historical repair solution 2 includes repair step 1 and repair step 2, repair step 1 can be restarting the cloud server, and repair step 2 can be restarting the virtual machine, the electronic device can determine the first step in the target repair solution as repair step 1, and determine repair tool 1 corresponding to repair step 1, and call repair tool 1 to restart cloud server E01; the electronic device can determine the second step as repair step 2, and determine repair tool 2 corresponding to repair step 2, and call repair tool 2 to restart virtual machine VM-1 to perform fault repair on the target fault.

[0254] In step VI, the electronic device can obtain the fault repair result of the target fault through the fault repair scheduling component. For example, the electronic device can obtain the fault repair result as repair success through the fault repair scheduling component.

[0255] In step VII, the electronic device can store the target fault information, the target repair solution, and the fault repair result to the fault data storage component through the fault repair feedback component.

[0256] For example, if the target fault information is as shown in Table 1, the target repair scheme is historical repair scheme 2, the fault repair result is repair success, and the electronic device can store the target fault information, the target repair scheme, and the fault repair result into the data table as shown in Table 2 to achieve storage into the fault data storage component.

[0257] In step ⑧, the electronic device can update the usage frequency and the repair success rate of the target repair scheme according to the fault repair result through the fault repair feedback component.

[0258] For example, if the target repair scheme is historical repair scheme 2, the electronic device can update the usage frequency of historical repair scheme 2 to 21 times and update the repair success rate of historical repair scheme 2 to 86% through the fault repair feedback component.

[0259] In the embodiments of the present application, the electronic device can obtain initial fault information of a target fault through a fault analysis component in the fault repair system, complete the target fault information, and then determine at least one target historical fault corresponding to the target fault in at least one historical fault according to the target fault information and historical fault information of each historical fault. The electronic device can determine a historical repair scheme of the at least one target historical fault through a fault decision component, and determine a target repair scheme according to the historical repair scheme of the at least one target historical fault. The electronic device can perform fault repair on the target fault according to the target repair scheme through a fault repair scheduling component, and obtain a fault repair result of the target fault; the electronic device can store the target fault information, the target repair scheme, and the fault repair result into the fault data storage component through the fault repair feedback component, and update the usage frequency and the repair success rate of the target repair scheme according to the fault repair result. Since the electronic device can automatically determine the target repair scheme of the target fault based on the historical fault information and the historical repair scheme of the at least one historical fault, and automatically perform fault repair according to the target repair scheme, compared with the prior art, the electronic device does not need to manually determine the target repair scheme and perform fault repair according to the target repair scheme, thereby improving the efficiency of fault repair.

[0260] Figure 6 A structural schematic diagram of a fault repair device provided by an exemplary embodiment of the present application is provided. Please refer to Figure 6 The fault repair device 10 can include a first obtaining module 11, a second obtaining module 12, a determining module 13, and a repairing module 14, wherein,

[0261] The first obtaining module 11 is configured to obtain target fault information of a target fault.

[0262] The second obtaining module 12 is configured to obtain historical fault information and a historical repair scheme of each historical fault in at least one historical fault.

[0263] The determination module 13 is configured to determine a target repair scheme of the target fault according to the target fault information and historical fault information and historical repair schemes of each historical fault.

[0264] The repair module 14 is configured to perform fault repair on the target fault according to the target repair scheme.

[0265] The fault repair device provided by the embodiments of the present application can implement the technical solutions shown in the above method embodiments, and has similar implementation principles and beneficial effects, which will not be described here in detail.

[0266] In a possible implementation, the determination module 13 is specifically configured to:

[0267] According to the target fault information and the historical fault information of each historical fault, at least one target historical fault corresponding to the target fault is determined from the at least one historical fault.

[0268] According to the historical repair scheme of the at least one target historical fault, the target repair scheme is determined.

[0269] In a possible implementation, the determination module 13 is specifically configured to:

[0270] According to the target fault information and the historical fault information of each historical fault, a similarity between the target fault and each historical fault is determined, and at least one similarity is obtained.

[0271] According to the at least one similarity and a preset threshold, the at least one target historical fault is determined from the at least one historical fault, and a similarity between the historical fault information of the target historical fault and the target fault information is greater than or equal to the preset threshold.

[0272] In a possible implementation, the determination module 13 is specifically configured to:

[0273] At least one historical repair scheme of the at least one target historical fault is de-duplicated to obtain at least one candidate repair scheme.

[0274] A scheme parameter of each candidate repair scheme is determined, and the scheme parameter includes at least one of the following: scheme reliability, usage frequency, and repair success rate.

[0275] According to the scheme parameter of each candidate repair scheme, the target repair scheme is determined from the at least one candidate repair scheme.

[0276] In a possible implementation, the determination module 13 is specifically configured to:

[0277] For any one of the candidate repair schemes, similarity between the target historical fault corresponding to the candidate repair scheme and the target fault is determined, and a predicted repair success rate of the candidate repair scheme is determined according to the similarity between the target historical fault corresponding to the candidate repair scheme and the target fault and a scheme parameter of the candidate repair scheme.

[0278] The candidate repair scheme with the highest predicted repair success rate in the at least one candidate repair scheme is determined as the target repair scheme.

[0279] In a possible implementation, the scheme parameter includes a scheme reliability, a use frequency and a repair success rate; and the determining module 13 is specifically configured to:

[0280] According to the similarity between the target historical fault corresponding to the candidate repair scheme and the target fault, a target similarity is determined.

[0281] The target similarity, a statistical value of the scheme reliability, the use frequency and the repair success rate of the candidate repair scheme are determined as the predicted repair success rate.

[0282] In a possible implementation, the repair module 14 is specifically configured to:

[0283] In the target repair scheme, a plurality of repair steps and an execution order of the plurality of repair steps are determined.

[0284] A repair tool corresponding to each repair step is determined.

[0285] According to the execution order, the repair tool is called to execute the corresponding repair step to perform fault repair.

[0286] The fault repair device provided by the embodiments of the present application can execute the technical solutions shown in the method embodiments, and the implementation principles and beneficial effects are similar, which will not be repeated here.

[0287] Figure 7 Another structural schematic diagram of a fault repair device provided by an exemplary embodiment of the present application is provided. Please refer to Figure 7 On the basis of the embodiment shown in Figure 6 The fault repair device 10 can further include a third acquisition module 15 and a storage module 16.

[0288] The third acquisition module 15 is configured to acquire a fault repair result of the target fault, and the fault repair result is repair success or repair failure.

[0289] The storage module 16 is configured to store the target fault information, the target repair scheme and the fault repair result to a preset storage space.

[0290] The fault repair device provided by the embodiments of the present application can execute the technical solutions shown in the method embodiments, and the implementation principles and beneficial effects are similar, which will not be repeated here.

[0291] In a possible implementation, the fault repair device 10 can further include an updating module 17,

[0292] The updating module 17 is configured to update the usage frequency and the repair success rate of the target repair scheme according to the fault repair result.

[0293] In a possible implementation, the first obtaining module 11 is specifically configured to:

[0294] obtain initial fault information of the target fault, wherein the initial fault information includes a device identifier of a target device to which the target fault belongs;

[0295] determine device-related information of the target device according to the device identifier;

[0296] determine that the target fault information includes the initial fault information and the device-related information.

[0297] The fault repair device provided by the embodiments of the present application can execute the technical solutions shown in the method embodiments, and the implementation principles and beneficial effects are similar, which will not be repeated here.

[0298] Figure 8 A structural schematic diagram of an electronic device is provided for the exemplary embodiments of the present application. Please refer to Figure 8 The electronic device 20 can include a processor 21 and a memory 22. Exemplarily, the processor 21, the memory 22, and each part are connected to each other through a bus 23.

[0299] The memory 22 stores computer execution instructions;

[0300] The processor 21 executes the computer execution instructions stored in the memory 22, so that the processor 21 executes the method shown in the above method embodiments.

[0301] Correspondingly, the embodiments of the present application provide a computer readable storage medium, which stores computer execution instructions. When the computer execution instructions are executed by a processor, the computer execution instructions are used to implement the method provided by the above method embodiments.

[0302] Correspondingly, the embodiments of the present application can also provide a computer program product, which includes a computer program. When the computer program is executed by a processor, the computer program can implement the method shown in the above method embodiments.

[0303] Those skilled in the art will appreciate that embodiments of the present application can be readily used as a method, a system or a computer program product. Accordingly, the present application can take the form of an entirely hardware embodiment, an entirely software embodiment or an embodiment combining software and hardware aspects. Furthermore, the present application can take the form of a computer program product on one or more computer readable storage media (including, but not limited to, disk memory, CD-ROMs, optical storage devices, etc.) embodying computer readable program code.

[0304] The present application is described in reference to the flowchart illustrations and / or block diagrams of methods, apparatus (systems) and computer program products according to embodiments of the application. It will be understood that each block of the flowchart illustrations and / or block diagrams, and combinations of blocks in the flowchart illustrations and / or block diagrams, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general purpose computer, special purpose computer, embedded processor or other programmable data processing apparatus to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing apparatus, create means for implementing the functions specified in the flowchart illustrations and / or block diagrams block or blocks. Figure 1 one or more functions specified in one or more of the flowchart illustrations and / or block diagrams. Figure 1 means for performing the functions specified in one or more of the flowchart illustrations and / or block diagrams.

[0305] These computer program instructions can also be stored in a computer readable memory that can direct a computer or other programmable data processing apparatus to function in a particular manner, such that the instructions stored in the computer readable memory produce an article of manufacture including instructions which implement the flowchart illustrations and / or block diagrams block or blocks. Figure 1 one or more functions specified in one or more of the flowchart illustrations and / or block diagrams. Figure 1 means for performing the functions specified in one or more of the flowchart illustrations and / or block diagrams.

[0306] These computer program instructions can also be loaded onto a computer or other programmable data processing apparatus to cause a series of operational steps to be performed on the computer or other programmable apparatus to produce a computer implemented process such that the instructions which execute on the computer or other programmable apparatus provide steps for implementing the flowchart illustrations and / or block diagrams block or blocks. Figure 1 one or more functions specified in one or more of the flowchart illustrations and / or block diagrams. Figure 1 means for performing the functions specified in one or more of the flowchart illustrations and / or block diagrams.

[0307] In a typical configuration, a computing device includes one or more processors (CPUs), input / output interfaces, network interfaces, and memory.

[0308] The memory can include non-persistent memory, random access memory (RAM), and / or non-volatile memory such as read-only memory (ROM) or flash memory, among others. The memory is an example of computer readable media.

[0309] Computer-readable media includes permanent and non-permanent, movable and non-movable media that can be implemented by any method or technology to store information. The information can be computer-readable instructions, data structures, program modules or other data. Examples of computer storage media include, but are not limited to, phase-change memory (PRAM), static random access memory (SRAM), dynamic random access memory (DRAM), other types of random access memory (RAM), read-only memory (ROM), electrically erasable programmable read-only memory (EEPROM), flash memory or other memory technology, compact disc read-only memory (CD-ROM), digital versatile disc (DVD), or other optical storage, magnetic cassette, magnetic tape, magnetic disk storage or other magnetic storage devices, or any other non-transmission medium that can be used to store information accessible to a computing device. According to the definition herein, computer-readable media does not include transitory media such as modulated data signals and carriers.

[0310] It should also be noted that the terms "comprising", "containing", or any other variant thereof are intended to cover non-exclusive inclusions, so that a process, method, article or apparatus that includes a list of elements does not only include those elements, but also includes other elements not explicitly listed, or inherent to such a process, method, article or apparatus. Without more limitations, the element defined by the statement "comprising a" does not exclude the presence of additional identical elements in the process, method, article or apparatus that includes the element.

[0311] The above only describes the embodiments of the present application and is not intended to limit the present application. For those skilled in the art, the present application can have various modifications and changes. Any modification, equivalent replacement, improvement, etc. within the spirit and principle of the present application shall be included in the scope of claims of the present application.

Claims

1. A method of fault repair, characterized by, The method comprises the following steps: obtaining target fault information of a target fault; obtaining historical fault information and a historical repair scheme of each historical fault in at least one historical fault; determining a target repair scheme of the target fault according to the target fault information and the historical fault information and the historical repair scheme of each historical fault, and performing fault repair on the target fault according to the target repair scheme.

2. The method of claim 1, wherein, The method comprises the following steps: determining at least one target historical fault corresponding to the target fault in the at least one historical fault according to the target fault information and the historical fault information of each historical fault; determining the target repair scheme according to the historical repair scheme of the at least one target historical fault.

3. The method of claim 2, wherein, The method comprises the following steps: determining at least one target historical fault corresponding to the target fault in the at least one historical fault according to the target fault information and the historical fault information of each historical fault, comprising: determining a similarity between the target fault and each historical fault according to the target fault information and the historical fault information of each historical fault, to obtain at least one similarity; 4. The method according to claim 2 or 3, characterized in that, determining the at least one target historical fault in the at least one historical fault according to the at least one similarity and a preset threshold value, wherein a similarity between the historical fault information of the target historical fault and the target fault information is greater than or equal to the preset threshold value. The method comprises the following steps: performing deduplication processing on the at least one historical repair scheme of the at least one target historical fault to obtain at least one candidate repair scheme; determining a scheme parameter of each candidate repair scheme, wherein the scheme parameter comprises at least one of the following: a scheme reliability, a use frequency and a repair success rate; 5. The method of claim 4, wherein, determining the target repair scheme in the at least one candidate repair scheme according to the scheme parameter of each candidate repair scheme. The method comprises the following steps: for any one candidate repair scheme, determining a similarity between a target historical fault corresponding to the candidate repair scheme and the target fault, and determining a predicted repair success rate of the candidate repair scheme according to the similarity between the target historical fault corresponding to the candidate repair scheme and the target fault and the scheme parameter of the candidate repair scheme; 6. The method of claim 5, wherein, determining the candidate repair scheme with the highest predicted repair success rate in the at least one candidate repair scheme as the target repair scheme. The scheme parameter comprises a scheme reliability, a use frequency and a repair success rate; the method of determining the predicted repair success rate of the candidate repair scheme according to the similarity between the target historical fault corresponding to the candidate repair scheme and the target fault and the scheme parameter of the candidate repair scheme, comprises: determining a target similarity according to the similarity between the target historical fault corresponding to the candidate repair scheme and the target fault; The target similarity, the scheme reliability of the to-be-selected repair scheme, the statistical value of the use frequency and the repair success rate are determined as a predicted repair success rate.

7. The method according to any one of claims 1 to 6, characterized in that, According to the target repair scheme, performing fault repair on the target fault, comprising: In the target repair scheme, a plurality of repair steps and an execution order of the plurality of repair steps are determined; Determine the repair tool corresponding to each repair step; According to the execution order, the repair tool is called to execute the corresponding repair step to perform fault repair.

8. The method according to any one of claims 1 to 7, characterized in that, According to the target repair scheme, after performing fault repair, further comprising: Obtain the fault repair result of the target fault, and the fault repair result is repair success or repair failure; The target fault information, the target repair scheme, and the fault repair result are stored in a preset storage space.

9. The method according to any one of claims 1 to 8, characterized in that, The method further comprises: According to the fault repair result, updating the use frequency and the repair success rate of the target repair scheme.

10. The method according to any one of claims 1 to 9, characterized in that, Obtaining the target fault information of the target fault, comprising: Obtain the initial fault information of the target fault, wherein the initial fault information includes the device identifier of the target device to which the target fault belongs; According to the device identifier, determine the device related information of the target device; Determine that the target fault information includes the initial fault information and the device related information.

11. A method of fault repair, characterized by, Comprising: Obtain the target fault information of the target fault, and the target fault is a fault occurred in a cloud system; Obtain the historical fault information and the historical repair scheme of each historical fault in at least one historical fault; According to the target fault information and the historical fault information and the historical repair scheme of each historical fault, determine the target repair scheme corresponding to the target fault, and perform fault repair on the target fault according to the target repair scheme.

12. The method of claim 11, wherein, According to the target fault information and the historical fault information and the historical repair scheme of each historical fault, determine the target repair scheme corresponding to the target fault, comprising: According to the target fault information and the historical fault information of each historical fault, determine at least one target historical fault corresponding to the target fault in the at least one historical fault; According to the historical repair scheme of the at least one target historical fault, determine the target repair scheme.

13. The method according to claim 11 or 12, characterized in that, According to the historical repair scheme of at least one target historical fault, determine the target repair scheme, comprising: De-duplicate at least one historical repair scheme of the at least one target historical fault to obtain at least one to-be-selected repair scheme; Determine the scheme parameters of each to-be-selected repair scheme, and the scheme parameters include at least one of the following: scheme reliability, use frequency and repair success rate; According to the scheme parameters of each to-be-selected repair scheme, determine the target repair scheme in the at least one to-be-selected repair scheme.

14. A fault repair apparatus, characterized by, Comprising: The first acquisition module, the second acquisition module, the determination module and the repair module, wherein, The first acquisition module is used to obtain the target fault information of the target fault; The second acquisition module is used to obtain the historical fault information and the historical repair scheme of each historical fault in at least one historical fault; The determining module is configured to determine a target repair scheme of the target fault according to the target fault information and historical fault information and historical repair schemes of each historical fault; The repairing module is configured to perform fault repair on the target fault according to the target repair scheme.

15. An electronic device, comprising: Comprise: At least one processor; And A memory connected with the at least one processor in communication; Wherein the memory stores instructions executable by the at least one processor, and the instructions are executed by the at least one processor to cause the electronic device to perform the method of any one of claims 1-10 or any one of claims 11-13.

16. A computer-readable storage medium, characterized in that, The computer-readable storage medium stores computer-executable instructions, and when the processor executes the computer-executable instructions, the method of any one of claims 1-10 or any one of claims 11-13 is implemented.

17. A computer program product comprising a computer program, characterized in that, The computer program is executed by the processor to implement the method of any one of claims 1-10 or any one of claims 11-13.

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