Non-magnetic metal lift-off compensation method, device and equipment and storage medium

Abstract

The invention relates to the technical field of eddy current conductometers, in particular to a non-magnetic metal lift-off compensation method, device and equipment and a storage medium. The method comprises: acquiring a sensor impedance component; based on the impedance component of the sensor, impedance parameters of different metal sample pieces when the metal sample pieces are not lifted off are obtained, and a first fitting equation is obtained through fitting; based on the sensor impedance component, impedance parameters of the same metal sample wafer under different lift-off distances are obtained, and a second fitting equation and a third fitting equation are obtained through fitting; and determining a lift-off threshold value through a second fitting equation according to a preset precision target, and if it is determined that lift-off compensation needs to be executed through the lift-off threshold value, calculating the current impedance parameter based on all the fitting equations to obtain a compensated equivalent impedance parameter, and correspondingly executing lift-off compensation. On the premise of not additionally adding hardware, the lift-off scene can be judged, lift-off compensation is correspondingly achieved, and the requirement for measurement precision is met.

Description

Technical Field

[0001] This application relates to the technical field of eddy current conductivity meters, and more particularly to a method, apparatus, device, and storage medium for non-magnetic metal lift-off compensation. Background Technology

[0002] Eddy current conductivity meters are non-destructive testing devices based on the principle of electromagnetic induction. They assess the composition, uniformity, and defects of metallic materials by measuring their conductivity, and have wide applications in intelligent manufacturing, aerospace, and energy equipment. The core principle is that when a high-frequency alternating current is passed through a sensor coil, an alternating magnetic field is generated. When a metal conductor approaches the coil, closed eddy currents are induced on its surface. The reverse magnetic field generated by these eddy currents changes the equivalent impedance and quality factor of the coil, thus allowing the material's conductivity to be inferred from the impedance change. However, even slight changes in the lift-off distance between the probe and the material surface can significantly affect the amplitude and phase of the eddy current signal, leading to conductivity measurement errors or misjudgments of defects. Therefore, lift-off compensation is a core technology for upgrading eddy current conductivity meters from laboratory tools to industrial-grade solutions.

[0003] Currently, the equipment on the market is mainly divided into two categories: one is that it does not use any lift-off compensation mechanism, and the other is that it achieves compensation by increasing the number of coils (such as a three-coil structure).

[0004] Products without a compensation mechanism cannot meet the measurement accuracy requirements of industrial scenarios due to the lack of correction for the lift-off effect. While products using multi-coil solutions such as three coils can improve the compensation effect, the additional hardware (such as coils and supporting circuits) not only increases the equipment manufacturing cost but also exacerbates the system complexity, limiting the miniaturization and widespread application of eddy current conductivity meters. Summary of the Invention

[0005] To overcome the shortcomings of the prior art, this application provides a method, apparatus, device and storage medium for non-magnetic metal lift-off compensation, which can determine the lift-off scenario and perform corresponding lift-off compensation without adding additional hardware, thereby meeting the measurement accuracy requirements.

[0006] The technical solution adopted by this application to solve its technical problem is: In a first aspect, this application provides a non-magnetic metal lift-off compensation method, applied to an eddy current conductivity meter, the method comprising: Obtain the sensor impedance components; Based on the sensor impedance components, the impedance parameters of different metal samples before they are lifted are obtained, and the first fitting equation of equivalent impedance and phase is obtained by fitting. Based on the sensor impedance components, the impedance parameters of the same metal sample at different lift-off distances are obtained, and a second fitting equation for the equivalent impedance and lift-off distance and a third fitting equation for the lift-off distance and phase are obtained by fitting. The lift-off threshold is determined by the second fitting equation based on the preset accuracy target. If the non-lift-off value determined by the first fitting equation for the current impedance parameter obtained by the current measurement is not greater than the lift-off threshold, then a lift-off compensation requirement is generated. In response to the lift-off compensation requirement, the current impedance parameters are calculated based on all fitted equations to obtain the compensated equivalent impedance parameters and correspondingly perform lift-off compensation.

[0007] Optionally, the step of obtaining the sensor impedance value and determining the sensor impedance component based on the sensor impedance value includes: The impedance value of the sensor is measured in a reference environment where no metal is being measured. The sensor impedance value is used as the sensor impedance component.

[0008] Optionally, the impedance parameters include the square of the equivalent impedance modulus and the phase; the step of obtaining the impedance parameters of different metal samples before removal based on the impedance components, and fitting a first fitting equation for the equivalent impedance and phase, includes: With the probe and sample surface at a reference distance and without being lifted, the total impedance of multiple different non-magnetic metal samples is measured using a sensor. Based on the sensor impedance components, the total impedance of each non-magnetic metal sample is calculated to obtain the square value and phase of the equivalent impedance modulus corresponding to each non-magnetic metal sample. The first fitting equation is obtained by fitting the squares and phases of the equivalent impedance modes corresponding to all the non-magnetic metal samples.

[0009] Optionally, the step of obtaining the impedance parameters of the same metal sample at different lift-off distances based on the sensor impedance components, and fitting a second fitting equation for the equivalent impedance versus lift-off distance and a third fitting equation for the lift-off distance versus phase includes: With the probe positioned at different lift-off distances from the surface of the same non-magnetic metal sample, the total impedance was measured multiple times at different lift-off distances using a sensor. Based on the sensor impedance components, the total impedance corresponding to each lift-off distance is calculated to obtain the square value and phase of the equivalent impedance modulus corresponding to each lift-off distance, and compared with the value when not lifted off, and the percentage of the square value and phase percentage of the equivalent impedance modulus corresponding to each lift-off distance are calculated. Based on the percentage of the squared equivalent impedance modes and the percentage of the phase corresponding to all the said lift-off distances, the second and third fitting equations are obtained.

[0010] Optionally, the step of determining the lift-off threshold based on a preset accuracy target using a second fitting equation, and generating the lift-off compensation requirement if the unlifted value determined by the first fitting equation for the currently measured impedance parameter is not greater than the lift-off threshold, includes: The percentage of the square of the equivalent impedance modulus corresponding to the preset accuracy target is determined by the second fitting equation and used as the lift-off threshold. Measure the total impedance of the metal being tested, determine the square of the equivalent impedance modulus and phase of the metal being tested based on the total impedance of the metal being tested, and calculate the unlifted value of the square of the equivalent impedance modulus of the metal being tested through the first fitting equation. If the ratio of the square of the equivalent impedance modulus of the metal being tested to the corresponding unlifted value is not greater than the lift-off threshold, then a lift-off compensation requirement is generated.

[0011] Optionally, after the steps of measuring the total impedance of the currently measured metal, determining the square of the equivalent impedance modulus and phase of the currently measured metal based on the total impedance of the currently measured metal, and calculating the unadjusted value of the square of the equivalent impedance modulus of the currently measured metal through a first fitting equation, the method further includes: If the ratio of the square of the equivalent impedance modulus of the metal being tested to the corresponding unlifted value is greater than the lift-off threshold, then lift-off compensation is not performed.

[0012] Optionally, the step of calculating the current impedance parameters based on all fitted equations to obtain the compensated equivalent impedance parameters and performing corresponding lift-off compensation in response to the lift-off compensation requirement includes: Based on the second fitting equation, the lift-off distance of the current metal under test is calculated using the current impedance parameters; Substitute the lift-off distance into the third fitting equation to obtain the current lift-off phase percentage of the measured metal. Multiply the lift-off phase percentage by the current phase value to obtain the compensated phase value. Based on the first fitting equation, the square of the equivalent impedance modulus after lift-off compensation is calculated using the compensation phase value, and the square of the equivalent impedance modulus after lift-off compensation and the compensation phase value are used together as the equivalent impedance parameter after compensation.

[0013] Secondly, this application provides a non-magnetic metal lift-off compensation device, comprising: The sensor parameter acquisition module is used to acquire the sensor impedance components; The first equation fitting module is used to obtain the impedance parameters of different metal samples when they are not lifted off the ground based on the impedance components of the sensor, and to fit the first fitting equation of equivalent impedance and phase. The second equation fitting module is used to obtain the impedance parameters of the same metal sample at different lift-off distances based on the impedance components of the sensor, and to fit the second fitting equation of equivalent impedance and lift-off distance and the third fitting equation of lift-off distance and phase. The lift-off compensation judgment module is used to determine the lift-off threshold according to the preset accuracy target through the second fitting equation. If the non-lift-off value determined by the first fitting equation for the current impedance parameter obtained by the current measurement is not greater than the lift-off threshold, then a lift-off compensation requirement is generated. The lift-off compensation execution module is used to calculate the current impedance parameters based on all fitted equations in response to the lift-off compensation requirement, and obtain the compensated equivalent impedance parameters.

[0014] In a third aspect, the present application provides an electronic device, comprising: one or more processors; One or more memory units; And one or more computer programs, wherein the one or more computer programs are stored in the one or more memories, and the one or more computer programs include instructions that, when executed by the one or more processors, cause the electronic device to perform the methods described above.

[0015] Fourthly, this application provides a computer-readable storage medium storing a program or instructions that, when executed, implement the above-described method.

[0016] The beneficial effects of this application are as follows: First, based on the eddy current effect and the equivalent circuit model, the relationship between the square value of the equivalent impedance mode and the phase is established under the condition that air and other unmeasured conditions are not measured. Then, by measuring the square value and phase of the equivalent impedance mode of different metal samples, the first fitting equation is obtained.

[0017] Secondly, by measuring the squared value and phase of the equivalent impedance mode of the same metal at different lift-off distances, a second fitting equation is established for the percentage of the squared value of the equivalent impedance mode versus the lift-off distance, and a third fitting equation is established for the percentage of the lift-off distance versus the phase.

[0018] Subsequently, a reasonable lift-off threshold is set according to the lift-off compensation accuracy requirements. During actual measurement, the ratio of the square of the measured equivalent impedance modulus to the calculated value is used to determine whether lift-off has occurred. If the ratio is greater than the lift-off threshold, it is considered that no lift-off has occurred; otherwise, it is considered that lift-off has occurred.

[0019] When a lift-off is detected, the lift-off distance is calculated using the established fitting equation, and phase compensation is performed. Finally, the square of the compensated equivalent impedance modulus is obtained, and corresponding compensation is performed, thereby improving the measurement accuracy.

[0020] By adopting the above technical solution, lift-off judgment and lift-off compensation can be realized based on the algorithm without increasing the additional hardware cost. At the same time, it can quickly judge lift-off and perform compensation, improving measurement accuracy and reliability. Attached Figure Description

[0021] Figure 1 This is a schematic flowchart of the non-magnetic metal lift-off compensation method provided in the embodiments of this application; Figure 2 This is a schematic diagram of the eddy current effect in a typical eddy current conductivity meter; Figure 3 This is a schematic diagram of the equivalent circuit of a typical eddy current conductivity meter; Figure 4 This is a virtual structural diagram of the non-magnetic metal lifting compensation device provided in this application; Figure 5 This is a schematic diagram of the structure of the electronic device provided in the embodiments of this application. Detailed Implementation

[0022] The present application will be further described below with reference to the accompanying drawings and embodiments.

[0023] The following will clearly and completely describe the concept, specific structure, and resulting technical effects of this application in conjunction with embodiments and accompanying drawings, so as to fully understand the purpose, features, and effects of this application. Obviously, the described embodiments are only a part of the embodiments of this application, not all of them. Other embodiments obtained by those skilled in the art based on the embodiments of this application without creative effort are all within the scope of protection of this application. Furthermore, all connections / linkages involved in the patent do not simply refer to direct contact between components, but rather to the ability to form a better connection structure by adding or reducing connecting accessories according to specific implementation conditions. The various technical features in this application can be combined interactively without contradicting each other.

[0024] Reference Figure 1 , Figure 1 This is a flowchart illustrating the non-magnetic metal lift-off compensation method provided in this application embodiment, which involves multiple execution steps designed according to the present invention. These steps are described in detail below: In step S1, the sensor impedance components are obtained.

[0025] Before explaining step S1, please first refer to Figure 2 , Figure 2 This is a schematic diagram of the eddy current effect in a typical eddy current conductivity meter. In an eddy current conductivity meter, the eddy current sensor consists of a sensor coil, a preamplifier, and the metal conductor being measured. Figure 2 It can be seen that when a high-frequency alternating current is passed through the coil... When the coil moves closer to or further away from the coil, a sudden change in magnetic field generates magnetic flux. As the closed metal conductor approaches or moves away from the coil, the magnetic flux generated in the conductor also changes, thus inducing closed eddy currents on the conductor's surface.

[0026] Magnetic flux generated by eddy currents The magnetic flux generated by the sensor coil The opposite directions cancel out part of the coil's magnetic field, thus altering the sensor coil's equivalent impedance Z and quality factor Q. Further reference... Figure 3 , Figure 3 This is a schematic diagram of the equivalent circuit of a typical eddy current conductivity meter, consisting of... , The equivalent circuit constituting an eddy current sensor consists of... , The equivalent circuit constituting the tested metallic conductor shows that the mutual inductance coefficient M increases as the distance between the coil and the conductor decreases. This indicates that even a small change in the lift-off distance can significantly affect the amplitude and phase of the eddy current signal, leading to errors in conductivity measurement, missed defects, or misjudgments.

[0027] In this technological context, according to Figure 2 and Figure 3 As shown in the equivalent circuit diagram, the following first equation can be obtained using Kirchhoff's laws: ; Solving the above equations, we can obtain that the total impedance (including the impedance of the metallic conductor and the impedance of the eddy current sensor) Z can be expressed by the following second equation: ; in, and These are the resistance and inductance of the sensor coil, respectively. and These represent the resistance and inductance of the metal conductor being measured, respectively. Let be the mutual inductance coefficient between the sensor coil and the metal conductor being measured. The angular frequency of the coil excitation. To detect the output voltage of the circuit.

[0028] Subsequently, the following third-party process indicates that the tested metal conductors are inducted through mutual inductance. Equivalent impedance referred to the sensor coil : ; Furthermore, Substituting the expression into the second equation above, we can obtain the following expression: and The fourth equation relating them: ; Based on the fourth equation, it can be seen that when the overall equivalent impedance is measured by an eddy current sensor... hour, You need to pass the test to obtain it. For the same eddy current sensor at a fixed frequency, its They are the same, therefore if you need to calculate It needs to be determined first. Therefore, in this embodiment of the application, the step of obtaining the sensor impedance value and determining the impedance component of the sensor based on the sensor impedance value includes: The impedance value of the sensor is measured in a reference environment where no metal is being measured. The sensor impedance value is used as the sensor impedance component.

[0029] Specifically, a reference environment without the tested metal usually refers to directly testing the air with an eddy current conductivity meter (i.e., without the tested metal), so that the second equation... The measured value is 0. The sensor impedance value is the same as the sensor impedance component. .

[0030] In step S2, based on the sensor impedance components, the impedance parameters of different metal samples before they are lifted are obtained, and a first fitting equation for the square of the equivalent impedance modulus and the phase is obtained.

[0031] Specifically, after obtaining the sensor impedance components, the total impedance can be measured using the fourth equation described above. The equivalent impedance was calculated. In this embodiment of the application, the total impedance of different types of non-magnetic metal samples without lift-off is measured under these conditions. Then, the impedance parameters of each metal sample before extraction are calculated using the fourth equation. These impedance parameters include the equivalent impedance. The square value and phase. Then, based on the equivalent impedance corresponding to multiple sets of different metal samples... By considering the relationship between the square value and the phase, we obtain the first fitting equation that expresses the relationship between the square value and the phase of the equivalent impedance mode.

[0032] More specifically, in the embodiments of this application, the step of obtaining the impedance parameters of different metal samples before lift-off based on the impedance components, and fitting a first fitting equation for the square of the equivalent impedance modulus and the phase, includes: With the probe and sample surface at a reference distance and without being lifted, the total impedance of multiple different non-magnetic metal samples is measured using a sensor. Based on the sensor impedance components, the total impedance of each non-magnetic metal sample is calculated to obtain the square value and phase of the equivalent impedance modulus corresponding to each non-magnetic metal sample. The first fitting equation is obtained by fitting the squares and phases of the equivalent impedance modes corresponding to all the non-magnetic metal samples.

[0033] Specifically, the sensor probe is kept at a reference distance (i.e., in an ideal contact state without being lifted) from the surface of different non-magnetic metal samples. The total impedance value corresponding to each metal sample is measured by the sensor. This total impedance includes the sensor's own impedance component and the additional impedance caused by the eddy current effect of the measured metal. Then, using the sensor impedance component obtained in step S1 above and the fourth equation above, the square of the equivalent impedance modulus (equivalent impedance) generated by the eddy current effect of the measured metal is calculated. It is a complex number. The square of the modulus is used to eliminate the imaginary part, turn it into a real number, improve the resolution, and reduce the square root operation. The phase (the phase angle of the impedance, reflecting the phase difference between the eddy current and the excitation magnetic field) and the phase are used. Finally, the square of the equivalent impedance modulus of all metal samples is mathematically fitted with the phase data to obtain the first fitting equation describing the relationship between the square of the equivalent impedance modulus and the phase in the unlifted state, which provides a benchmark model for subsequent lift-off judgment.

[0034] In step S3, based on the sensor impedance components, the impedance parameters of the same metal sample at different lift-off distances are obtained, and a second fitting equation is obtained by fitting the percentage of the square of the equivalent impedance modulus with respect to the lift-off distance, and a third fitting equation is obtained by fitting the lift-off distance with respect to the phase percentage.

[0035] Specifically, using a method similar to step S2 above, the test target is replaced with the parameter changes of the same non-magnetic metal sample at different lift-off distances.

[0036] In this embodiment of the application, the step of obtaining the impedance parameters of the same metal sample at different lift-off distances based on the sensor impedance components, and fitting a second fitting equation for the percentage of the square of the equivalent impedance modulus with respect to the lift-off distance and a third fitting equation for the percentage of the lift-off distance with respect to the phase includes: With the probe positioned at different lift-off distances from the surface of the same non-magnetic metal sample, the total impedance was measured multiple times at different lift-off distances using a sensor. Based on the sensor impedance components, the total impedance corresponding to each lift-off distance is calculated to obtain the square value and phase of the equivalent impedance modulus corresponding to each lift-off distance, and compared with the value when not lifted off, and the percentage of the square value and phase percentage of the equivalent impedance modulus corresponding to each lift-off distance are calculated. The second and third fitting equations are obtained by fitting the squares of the equivalent impedance modes corresponding to all the lift-off distances and the percentages of the phases.

[0037] Specifically, the same non-magnetic metal sample is selected (ensuring consistent material conductivity to eliminate interference from material differences). The distance between the probe and the sample surface (i.e., the lift-off distance d) is adjusted to cover multiple different d values ​​(e.g., 0 mm, 0.1 mm, 0.2 mm, etc.). At each lift-off distance, the total impedance is measured using a sensor. The square of the equivalent impedance modulus and its corresponding phase, generated solely by the eddy current effect of the measured metal, are then separated from the sensor impedance components.

[0038] Subsequently, the squares of the equivalent impedance modes of the same metal sample at different lift-off distances *d* were fitted to *d* to obtain a second fitting equation describing the percentage change of the squares of the equivalent impedance modes with lift-off distance. Simultaneously, *d* was fitted to the corresponding percentage of the phase values ​​to obtain a third fitting equation describing the relationship between lift-off distance and phase. These two equations together constitute a quantitative model of the lift-off effect, providing a mathematical basis for subsequent lift-off distance determination and compensation.

[0039] In step S4, a lift-off threshold is determined by the second fitting equation based on the preset accuracy target. If the non-lift-off value determined by the first fitting equation for the current impedance parameter obtained by the current measurement is not greater than the lift-off threshold, a lift-off compensation requirement is generated.

[0040] Specifically, the preset accuracy target refers to the accuracy required for actual measurement (e.g., the compensation accuracy requirement is better than 0.01 mm). Based on the accuracy requirement, the adaptive lift-off threshold can be calculated through the second fitting equation. If it is greater than the lift-off threshold, it means that the current measurement result does not need to be lifted off. That is, if the ratio of the square of the equivalent impedance modulus of the current measured metal to the corresponding unlifted value is greater than the lift-off threshold, then lift-off compensation is not performed; otherwise, it means that the current measurement result needs to be lifted off to improve the measurement accuracy.

[0041] More specifically, in this embodiment of the application, the step of determining the lift-off threshold according to the preset accuracy target through the second fitting equation, and generating the lift-off compensation requirement if the unlifted value determined by the first fitting equation for the currently measured impedance parameter is not greater than the lift-off threshold, includes: The percentage of the square of the equivalent impedance modulus corresponding to the preset accuracy target is determined by the second fitting equation and used as the lift-off threshold. Measure the total impedance of the metal being tested, determine the square of the equivalent impedance modulus and phase of the metal being tested based on the total impedance of the metal being tested, and calculate the unlifted value of the square of the equivalent impedance modulus of the metal being tested through the first fitting equation. If the ratio of the square of the equivalent impedance modulus of the metal being tested to the corresponding unlifted value is not greater than the lift-off threshold, then a lift-off compensation requirement is generated.

[0042] Specifically, firstly, based on the accuracy requirements of industrial testing for lift-off compensation (e.g., a preset accuracy target of better than 0.01 mm), the percentage of the squared equivalent impedance modulus that meets the accuracy requirement is derived using the established second fitting equation as the lift-off threshold. In this embodiment, when the preset accuracy target is 0.01 mm, the corresponding lift-off threshold (percentage of the squared equivalent impedance modulus) is 96. Subsequently, the actual measurement of the metal under test is performed: its total impedance is obtained through the sensor, and combined with the determined sensor impedance components (the background impedance when there is no metal under test), the square value and phase of the equivalent impedance modulus of the metal under test are calculated; then, using the first fitting equation (the reference model of the square value and phase of the equivalent impedance modulus in the unlifted state), the square value of the ideal equivalent impedance modulus in the unlifted state corresponding to the current phase is calculated (i.e., the theoretical value when the probe and the surface of the metal under test are kept at a reference distance).

[0043] Finally, the ratio of the square of the current equivalent impedance modulus to the unlifted value is compared: if the ratio is not greater than the predetermined lift-off threshold (indicating that the lift-off distance has exceeded the allowable range, causing the equivalent impedance to deviate from the reference value), the lift-off compensation process is triggered, and the measurement data is corrected by subsequent fitting equations.

[0044] In step S5, in response to the lift-off compensation requirement, the current impedance parameters are calculated based on all fitted equations to obtain the compensated equivalent impedance parameters and correspondingly perform lift-off compensation.

[0045] Specifically, when lift-off compensation is required, a lift-off compensation demand arises. In this case, by combining the first fitting equation, the second fitting equation, and the third fitting equation obtained from the above steps, the correction value after lift-off compensation is obtained, thereby eliminating the influence of lift-off distance on impedance parameters.

[0046] More specifically, in the embodiments of this application, the step of calculating the current impedance parameter based on all fitted equations to obtain the compensated equivalent impedance parameter and performing corresponding lift-off compensation in response to the lift-off compensation requirement includes: Based on the second fitting equation, the lift-off distance of the current metal under test is calculated using the current impedance parameters; Substitute the lift-off distance into the third fitting equation to obtain the current lift-off phase percentage of the measured metal. Multiply the lift-off phase percentage by the current phase value to obtain the compensated phase value. Based on the first fitting equation, the square of the equivalent impedance modulus after lift-off compensation is calculated using the compensation phase value, and the square of the equivalent impedance modulus after lift-off compensation and the compensation phase value are used together as the equivalent impedance parameter after compensation.

[0047] Specifically, when lift-off compensation is required, the second fitting equation is first used to substitute the square of the equivalent impedance modulus obtained from the current measurement into the equation to calculate the actual lift-off distance between the probe and the metal surface being measured.

[0048] Subsequently, the calculated lift-off distance is substituted into the third fitting equation to obtain the phase percentage under lift-off conditions; the currently measured phase value is multiplied by this phase percentage to obtain the corrected compensated phase value. The compensated phase value is the ideal phase without lift-off interference.

[0049] Finally, based on the first fitting equation, the compensated phase value is substituted into the equation to calculate the square of the equivalent impedance magnitude corresponding to that phase, which is the square of the equivalent impedance magnitude after lift-off compensation. Ultimately, the square of the equivalent impedance magnitude after lift-off compensation and the compensated phase value are used together as the compensated equivalent impedance parameter to correct for the lift-off effect, making the measurement results closer to the true value without lift-off interference.

[0050] Reference Figure 4 , Figure 4 This is a virtual structural diagram of the non-magnetic metal lift-off compensation device provided in this application. A second aspect of this application provides a non-magnetic metal lift-off compensation device, comprising: Sensor parameter acquisition module 100 is used to acquire sensor impedance components; The first equation fitting module 200 is used to obtain the impedance parameters of different metal samples when they are not lifted off the ground based on the impedance components of the sensor, and to fit the first fitting equation of equivalent impedance and phase. The second equation fitting module 300 is used to obtain the impedance parameters of the same metal sample at different lift-off distances based on the impedance components of the sensor, and to fit the second fitting equation of equivalent impedance and lift-off distance and the third fitting equation of lift-off distance and phase. The lift-off compensation judgment module 400 is used to determine the lift-off threshold according to the preset accuracy target through the second fitting equation. If the non-lift-off value determined by the first fitting equation for the current impedance parameter obtained by the current measurement is not greater than the lift-off threshold, then a lift-off compensation requirement is generated. The lift-off compensation execution module 500 is used to calculate the current impedance parameters based on all fitted equations in response to the lift-off compensation requirement, and obtain the compensated equivalent impedance parameters.

[0051] The non-magnetic metal lifting compensation device described in this application embodiment can execute the non-magnetic metal lifting compensation method provided in the above embodiments. The non-magnetic metal lifting compensation device has the corresponding functional steps and beneficial effects of the non-magnetic metal lifting compensation method described in the above embodiments. For details, please refer to the embodiments of the non-magnetic metal lifting compensation method described above. The embodiments of this application will not be repeated here.

[0052] This application also provides an electronic device, please refer to... Figure 5 , Figure 5 This is a schematic diagram of the structure of an electronic device provided in an embodiment of this application. The electronic device may include a processor and a memory, which can be connected via a bus or other means. The processor may be a Central Processing Unit (CPU). The processor may also be other general-purpose processors, digital signal processors (DSPs), application-specific integrated circuits (ASICs), field-programmable gate arrays (FPGAs), or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, or combinations of the above types of chips. The memory, as a non-transitory computer-readable storage medium, can be used to store non-transitory software programs, non-transitory computer-executable programs, and modules, such as the program instructions / modules corresponding to the non-magnetic metal lift-off compensation method in the embodiments of this application. The processor executes various functional applications and data processing by running the non-transitory software programs, instructions, and modules stored in the memory, thereby implementing the non-magnetic metal lift-off compensation method in the above method embodiments.

[0053] The memory may include a program storage area and a data storage area. The program storage area may store the operating system and at least one application program required for a function; the data storage area may store data created by the processor, etc. Furthermore, the memory may include high-speed random access memory and non-transitory memory, such as at least one disk storage device, flash memory device, or other non-transitory solid-state storage device. One or more modules are stored in the memory and, when executed by the processor, perform the non-magnetic metal lift-off compensation method as described in the above method embodiments. Specific details of the above electronic device can be understood by referring to the corresponding descriptions and effects in the above method embodiments, and will not be repeated here. Those skilled in the art will understand that all or part of the processes in the above embodiments can be implemented by a computer program instructing related hardware. The program can be stored in a computer-readable storage medium, and when executed, it may include the processes of the embodiments of the above methods. The storage medium may be a read-only memory (ROM), a random access memory (RAM), a flash memory, a hard disk drive (HDD), or a solid-state drive (SSD), etc.; the storage medium may also include a combination of the above types of memory.

[0054] Numerous specific details are set forth in the specification provided herein. However, it will be understood that embodiments of this application may be practiced without these specific details. In some instances, well-known methods, structures, and techniques have not been shown in detail so as not to obscure the understanding of this specification.

[0055] Similarly, it should be understood that, in order to streamline this disclosure and aid in understanding one or more of the various inventive aspects, in the above description of exemplary embodiments of this application, various features of this application are sometimes grouped together in a single embodiment, figure, or description thereof. However, this approach to disclosure should not be construed as reflecting an intention that the claimed application requires more features than expressly recited in each claim. Rather, as reflected in the claims, inventive aspects lie in fewer than all features of a single foregoing disclosed embodiment. Therefore, the claims following the detailed description are hereby expressly incorporated into that detailed description, wherein each claim itself is a separate embodiment of this application.

[0056] It should be noted that the above embodiments are illustrative of this application and not restrictive of this application, and that those skilled in the art can devise alternative embodiments without departing from the scope of the appended claims.

Claims

1. A method for compensating the separation of non-magnetic metals, characterized in that, Applied to eddy current conductivity meters, the method includes: Obtain the sensor impedance components; Based on the sensor impedance components, the impedance parameters of different metal samples before they are lifted are obtained, and the first fitting equation of equivalent impedance and phase is obtained by fitting. Based on the sensor impedance components, the impedance parameters of the same metal sample at different lift-off distances are obtained, and a second fitting equation for the equivalent impedance and lift-off distance and a third fitting equation for the lift-off distance and phase are obtained by fitting. The lift-off threshold is determined by the second fitting equation based on the preset accuracy target. If the non-lift-off value determined by the first fitting equation for the current impedance parameter obtained by the current measurement is not greater than the lift-off threshold, then a lift-off compensation requirement is generated. In response to the lift-off compensation requirement, the current impedance parameters are calculated based on all fitted equations to obtain the compensated equivalent impedance parameters and correspondingly perform lift-off compensation.

2. The non-magnetic metal lift-off compensation method according to claim 1, characterized in that, The steps of obtaining the sensor impedance value and determining the sensor impedance component based on the sensor impedance value include: The impedance value of the sensor is measured in a reference environment where no metal is being measured. The sensor impedance value is used as the sensor impedance component.

3. The non-magnetic metal lift-off compensation method according to claim 1, characterized in that, The impedance parameters include the square of the equivalent impedance modulus and the phase; the step of obtaining the impedance parameters of different metal samples before extraction based on the impedance components, and fitting the first fitting equation of equivalent impedance and phase includes: With the probe and sample surface at a reference distance and without being lifted, the total impedance of multiple different non-magnetic metal samples is measured using a sensor. Based on the sensor impedance components, the total impedance of each non-magnetic metal sample is calculated to obtain the square value and phase of the equivalent impedance modulus corresponding to each non-magnetic metal sample. The first fitting equation is obtained by fitting the squares and phases of the equivalent impedance modes corresponding to all the non-magnetic metal samples.

4. The non-magnetic metal separation compensation method according to claim 1, characterized in that, The steps of obtaining the impedance parameters of the same metal sample at different lift-off distances based on the sensor impedance components, and fitting the second fitting equation of equivalent impedance versus lift-off distance and the third fitting equation of lift-off distance versus phase include: With the probe positioned at different lift-off distances from the surface of the same non-magnetic metal sample, the total impedance was measured multiple times at different lift-off distances using a sensor. Based on the sensor impedance components, the total impedance corresponding to each lift-off distance is calculated to obtain the square value and phase of the equivalent impedance modulus corresponding to each lift-off distance, and compared with the value when not lifted off, and the percentage of the square value and phase percentage of the equivalent impedance modulus corresponding to each lift-off distance are calculated. The second and third fitting equations are obtained by fitting the squares and phase percentages of the equivalent impedance modes corresponding to all the said lift-off distances.

5. The non-magnetic metal separation compensation method according to claim 1, characterized in that, The step of determining the lift-off threshold based on a preset accuracy target using a second fitting equation, and generating a lift-off compensation requirement if the unlifted value determined by the first fitting equation for the currently measured impedance parameter is not greater than the lift-off threshold, includes: The percentage of the square of the equivalent impedance modulus corresponding to the preset accuracy target is determined by the second fitting equation and used as the lift-off threshold. Measure the total impedance of the metal being tested, determine the square of the equivalent impedance modulus and phase of the metal being tested based on the total impedance of the metal being tested, and calculate the unlifted value of the square of the equivalent impedance modulus of the metal being tested through the first fitting equation. If the ratio of the square of the equivalent impedance modulus of the metal being tested to the corresponding unlifted value is not greater than the lift-off threshold, then a lift-off compensation requirement is generated.

6. The non-magnetic metal lift-off compensation method according to claim 5, characterized in that, After the steps of measuring the total impedance of the currently measured metal, determining the square of the equivalent impedance modulus and phase of the currently measured metal based on the total impedance of the currently measured metal, and calculating the unadjusted value of the square of the equivalent impedance modulus of the currently measured metal through a first fitting equation, the method further includes: If the ratio of the square of the equivalent impedance modulus of the metal being tested to the corresponding unlifted value is greater than the lift-off threshold, then lift-off compensation is not performed.

7. The non-magnetic metal lift-off compensation method according to claim 1, characterized in that, The step of calculating the current impedance parameters based on all fitted equations in response to the lift-off compensation requirement, obtaining the compensated equivalent impedance parameters, and performing corresponding lift-off compensation includes: Based on the second fitting equation, the lift-off distance of the current metal under test is calculated using the current impedance parameters; Substitute the lift-off distance into the third fitting equation to obtain the current lift-off phase percentage of the measured metal. Multiply the lift-off phase percentage by the current phase value to obtain the compensated phase value. Based on the first fitting equation, the square of the equivalent impedance modulus after lift-off compensation is calculated using the compensation phase value, and the square of the equivalent impedance modulus after lift-off compensation and the compensation phase value are used together as the equivalent impedance parameter after compensation.

8. A non-magnetic metal lifting compensation device, characterized in that, include: The sensor parameter acquisition module is used to acquire the sensor impedance components; The first equation fitting module is used to obtain the impedance parameters of different metal samples when they are not lifted off the ground based on the impedance components of the sensor, and to fit the first fitting equation of equivalent impedance and phase. The second equation fitting module is used to obtain the impedance parameters of the same metal sample at different lift-off distances based on the impedance components of the sensor, and to fit the second fitting equation of equivalent impedance and lift-off distance and the third fitting equation of lift-off distance and phase. The lift-off compensation judgment module is used to determine the lift-off threshold according to the preset accuracy target through the second fitting equation. If the non-lift-off value determined by the first fitting equation for the current impedance parameter obtained by the current measurement is not greater than the lift-off threshold, then a lift-off compensation requirement is generated. The lift-off compensation execution module is used to calculate the current impedance parameters based on all fitted equations in response to the lift-off compensation requirement, and obtain the compensated equivalent impedance parameters.

9. An electronic device, characterized in that, include: One or more processors; One or more memory units; And one or more computer programs, wherein the one or more computer programs are stored in the one or more memories, the one or more computer programs including instructions that, when executed by the one or more processors, cause the electronic device to perform the method as described in any one of claims 1 to 7.

10. A computer-readable storage medium, characterized in that, The storage medium stores a program or instructions that, when executed, implement the method as described in any one of claims 1 to 7.

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