Transportation device and assembly line system

Abstract

The invention discloses a transportation device and an assembly line system, in the transportation device, a buffer area is arranged between a second sample analyzer and a third sample analyzer, and buffer is provided for unloading of test tube racks of a first sample analyzer and the second sample analyzer; the influence of the detection speed difference of the first sample analyzer, the second sample analyzer and the third sample analyzer on the detection efficiency of each sample analyzer is made up, and the efficiency of transporting the test tube rack between the sample analyzers by the transporting device is improved. Meanwhile, in the conveying device, a first optocoupler assembly detects the unloading state of the test tube rack in the buffer area, a callback assembly adjusts the position of the test tube rack in the buffer area, the detection function of the first optocoupler assembly is maintained, the response efficiency of the conveying device to conveying of the test tube rack is improved, and the conveying smoothness of the test tube rack in the conveying device is improved; the practicability of the transportation device is improved.

Description

Technical Field

[0001] This application relates to the field of test tube rack transportation technology, and in particular to a transportation device and assembly line system. Background Technology

[0002] Currently, there are two main types of products on the market for transferring test tube racks from a dual-machine instrument to a single-machine instrument: one is a cabinet-style assembly line product (cabinet-style assembly line), which features a very distinct cabinet structure and two external tracks (used for transporting test tube racks between different instruments). Its advantages include a wide range of product combinations and rich functionality. However, its disadvantages include excessive space requirements, high price, and difficulty in maintenance.

[0003] Another type is the desktop assembly line product that can transport test tube racks across machines on a desktop. This product only requires a small connecting rail to transfer test tube racks from a dual-machine instrument to a single-machine instrument. It features a small footprint, lower price, and easier assembly and maintenance. However, in a desktop assembly line, each machine simply transfers the test tube rack from one instrument to another, failing to consider the issue of test tube rack congestion caused by the difference in testing speed between the two instruments. This can lead to the unloading area of ​​the faster-measuring instrument being overloaded, while the slower-measuring instrument, in the middle of its measurement, cannot promptly handle the cross-rail movement of the test tube rack from the first instrument, forcing the faster-measuring instrument to stop measuring and affecting the measurement efficiency of some instruments in the desktop assembly line. Summary of the Invention

[0004] This application provides a transport device to solve the above-mentioned technical problems. The transport device is used to transport a test tube rack between multiple sample analyzers, wherein the multiple sample analyzers include a first sample analyzer, a second sample analyzer, and a third sample analyzer, the first sample analyzer and the second sample analyzer being arranged adjacent to each other. The transport device includes:

[0005] A buffer is provided between the second sample analyzer and the third sample analyzer;

[0006] A transport component, spaced apart from the first sample analyzer, the second sample analyzer, the buffer, and the third sample analyzer, is used to transport the test tube racks after being tested by the first sample analyzer and / or the second sample analyzer to the buffer, and to transport the test tube racks loaded in the buffer to the third sample analyzer;

[0007] The first optical coupler component is spaced apart from the buffer and located on the side of the buffer away from the transport component;

[0008] The callback mechanism is spaced apart from the first optocoupler component;

[0009] The transport device further includes a control unit, which is connected to the transport component, the first optical coupler component, and the return mechanism. The control unit controls the transport component to transport the test tube rack to the buffer zone and controls the first optical coupler component to detect the unloading status of the test tube rack. Before the transport component transports another test tube rack to the buffer zone, the control unit also controls the return mechanism to adjust the position of the test tube rack loaded in the buffer zone to avoid the test tube rack loaded in the buffer zone blocking the light generated by the first optical coupler component.

[0010] The transport device further includes a first pusher plate and a second optical coupler assembly.

[0011] The first pusher plate is spaced apart from the buffer zone and the transport component.

[0012] The second optical coupler is spaced apart from the transport assembly and is located on the side of the buffer away from the second sample analyzer;

[0013] The control unit is connected to the first pusher plate and the second optocoupler assembly. The control unit is also used to control the first pusher plate to push the test tube rack into the buffer zone in response to the second optocoupler assembly conveying the test tube rack to the area corresponding to the buffer zone.

[0014] The control unit is further configured to, after the first optocoupler assembly responds to the test tube rack being pushed into the buffer, control the first push plate to stop pushing the test tube rack and return to the initial position, and simultaneously control the return mechanism to adjust the position of the test tube rack loaded in the buffer.

[0015] The initial position is the position of the test tube rack before the first pusher plate pushes it.

[0016] The callback mechanism includes:

[0017] support;

[0018] A rotating shaft and a lever, wherein the rotating shaft is mounted on the bracket and the lever is mounted on the rotating shaft;

[0019] The motor is located on the side of the bracket away from the rotating shaft and is connected to the rotating shaft;

[0020] The control unit is also used to control the motor to start, drive the rotating shaft to rotate, so as to drive the lever to swing and adjust the position of the test tube rack loaded on the buffer.

[0021] The transport device further includes a third optical coupler assembly disposed at one end of the buffer zone near the transport assembly.

[0022] The control unit is connected to the third optocoupler assembly, and the control unit is also used to control the first pusher to stop pushing the test tube rack on the transport assembly to the buffer when the third optocoupler assembly is in response to the test tube rack on the buffer being fully loaded.

[0023] The transport device further includes a first loading area, a second loading area, and an unloading area.

[0024] The first loading area is located on the side of the first sample analyzer away from the second sample analyzer, the buffer is located on the side of the second sample analyzer away from the first sample analyzer, the second loading area is located on the side of the buffer away from the second sample analyzer, the third sample analyzer is spaced apart from the second loading area, and the unloading area is located on the side of the third sample analyzer away from the second loading area.

[0025] The transport component includes a first transport track and a second transport track;

[0026] The first transport track is spaced apart from the first loading area, the first sample analyzer, the second sample analyzer, and the buffer zone. The control unit is used to control the first transport track to transport the test tube rack loaded in the first loading area to the first sample analyzer and / or the second sample analyzer, and to transport the test tube rack after being detected by the first sample analyzer and / or the second sample analyzer to the buffer zone.

[0027] The second transport track is spaced apart from the second loading area, the third sample analyzer, and the unloading area. After the control unit controls the test tube rack loaded in the buffer to be pushed onto the second loading area, the control unit is further configured to control the second transport track to transport the test tube rack loaded on the second loading area to the third sample analyzer, and to transport the test tube rack detected by the third sample analyzer to the unloading area.

[0028] The transport device further includes a second pusher plate and a fourth optical coupler assembly.

[0029] The second pusher plate is disposed on the side of the buffer zone away from the second loading area, and is located at the end of the buffer zone away from the first transport track;

[0030] The fourth optical coupler assembly is located on the side of the second loading area away from the buffer zone, and at the end of the second loading area away from the second transport track;

[0031] The control unit is connected to the second pusher plate and the fourth optocoupler assembly. The control unit is also used to control the second pusher plate to push the test tube rack loaded in the buffer to the second loading area, and after the fourth optocoupler assembly responds to the test tube rack being pushed to the second loading area, it controls the second pusher plate to stop pushing and return to the initial position, wherein the initial position is the position of the second pusher plate before pushing the test tube rack.

[0032] The transport device further includes a third pusher plate and a fifth optical coupler assembly.

[0033] The third pusher plate is disposed on the side of the second loading area away from the second transport track, and the fifth optocoupler assembly is disposed at a distance from the second transport track;

[0034] The control unit is connected to the third pusher plate and the fifth optocoupler assembly. The control unit is also used to control the third pusher plate to push the test tube rack loaded in the second loading area onto the second transport track. After the fifth optocoupler assembly responds to the test tube rack being pushed onto the second transport track, it controls the third pusher plate to stop pushing and return to the initial position, wherein the initial position is the position of the third pusher plate before pushing the test tube rack.

[0035] The transport device further includes a blocking mechanism and a fourth pusher plate. The blocking mechanism is located at one end of the first loading area near the first transport track; the fourth pusher plate is located on the side of the first loading area away from the first transport track.

[0036] The control unit is connected to the blocking mechanism and the fourth push plate. The control unit is also used to control the fourth push plate to push the test tube rack loaded on the first loading area onto the first transport track; and when there is a test tube rack on the track area corresponding to the first loading area on the first transport track, control the blocking mechanism to block the fourth push plate from pushing the test tube rack onto the first transport track.

[0037] To address the aforementioned technical problems, this application also provides a production line system, including multiple sample analyzers and a transport device as described above, wherein the transport device is spaced apart from the multiple sample analyzers to transport test tube racks to the multiple sample analyzers.

[0038] The beneficial effects of this application are as follows: Unlike existing technologies, the transport device of this application includes a buffer zone between the second and third sample analyzers. This buffer provides a buffer for unloading the test tube racks from the first and second sample analyzers, compensating for the impact of the difference in detection speed between the first and second sample analyzers and the third sample analyzer on the detection efficiency of each analyzer, and improving the transport efficiency of the transport device in transporting the test tube racks between the analyzers. Simultaneously, in the transport device, the first optocoupler component detects the unloading status of the test tube racks in the buffer zone, and the return component adjusts the position of the test tube racks in the buffer zone to maintain the detection function of the first optocoupler component. This improves the response efficiency of the transport device to the transport of the test tube racks, enhances the smoothness of the transport of the test tube racks within the transport device, and improves the practicality of the transport device. Attached Figure Description

[0039] To more clearly illustrate the technical solutions in the embodiments of this application, the accompanying drawings used in the description of the embodiments will be briefly introduced below. Obviously, the accompanying drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0040] in:

[0041] Figure 1 This is a schematic diagram of the structure of the first embodiment of the production line system of this application;

[0042] Figure 2 This is a schematic diagram of the structure of the first embodiment of the transportation device of this application;

[0043] Figure 3 yes Figure 2 A partial structural schematic diagram of the first embodiment of the medium transport device;

[0044] Figure 4 This is a schematic diagram of the structure of the first embodiment of the callback mechanism of this application;

[0045] Figure 5 This is a schematic diagram of the structure of the second embodiment of the transportation device of this application;

[0046] Figure 6 This is a schematic diagram of the structure of the third embodiment of the transportation device of this application;

[0047] Figure 7 This is a schematic diagram of the structure of the fourth embodiment of the transportation device of this application;

[0048] Figure 8 This is a structural schematic diagram of the fifth embodiment of the transportation device of this application;

[0049] Figure 9 This is a schematic diagram of the structure of the sixth embodiment of the transportation device of this application;

[0050] Figure 10 yes Figure 2 A partial structural schematic diagram of the second embodiment of the transport device;

[0051] Figure 11 yes Figure 2 A partial structural schematic diagram of the third embodiment of the transport device;

[0052] Figure 12 This is a structural schematic diagram of the seventh embodiment of the transportation device of this application;

[0053] Figure 13 This is a schematic diagram of the structure of the eighth embodiment of the transportation device of this application;

[0054] Figure 14 yes Figure 2 A partial structural schematic diagram of the fourth embodiment of the medium transport device;

[0055] Figure 15 This is a schematic diagram of the structure of the first embodiment of the blocking mechanism of this application.

[0056] Reference numerals: Assembly line system A; Transport device 1; First loading area 11; Second loading area 12; Buffer zone 13; Unloading area 14; Transport component 15; First transport track 151; Second transport track 152; Third transport track 153; First push plate 18; First optocoupler assembly 16; Second optocoupler assembly 19; Reverse mechanism 17; Bracket 171; Rotating shaft 172; Pulley 173; Motor 174; Optocoupler baffle 175; Initial position optocoupler 176; Third optocoupler assembly 20; Second push plate 21; Fourth optocoupler assembly 22; Fifth optocoupler assembly 23; Blocking mechanism 24; Connecting shaft 241; Pulley 242; Pulley 243; Synchronous belt 244; Sample analyzer 2; First sample analyzer 201; Second sample analyzer 202; Third sample analyzer 203; Test tube rack 3; First test tube rack 31; Second test tube rack 32. Detailed Implementation

[0057] The embodiments of this application will now be described in detail with reference to the accompanying drawings.

[0058] In the following description, specific details such as particular system architectures, interfaces, and technologies are presented for illustrative purposes rather than for limiting purposes, in order to provide a thorough understanding of this application.

[0059] In this application, the reference to "embodiment" means that a specific feature, structure, or characteristic described in connection with an embodiment may be included in at least one embodiment of this application. The appearance of this phrase in various places throughout the specification does not necessarily refer to the same embodiment, nor is it a separate or alternative embodiment mutually exclusive with other embodiments. It will be explicitly and implicitly understood by those skilled in the art that the embodiments described herein can be combined with other embodiments.

[0060] In this application, the term "and / or" is merely a description of the relationship between related objects, indicating that three relationships can exist. For example, A and / or B can represent three cases: A alone, A and B simultaneously, and B alone. Additionally, the character " / " generally indicates that the preceding and following related objects are in an "or" relationship. Furthermore, "many" in this application means two or more. Moreover, the term "at least one" in this application means any combination of at least two of any one or more of a plurality of objects. For example, including at least one of A, B, and C can mean including any one or more elements selected from the set consisting of A, B, and C. Furthermore, the terms "first," "second," and "third" in this application are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of indicated technical features.

[0061] Please see Figure 1 , Figure 1 This is a schematic diagram of the structure of the first embodiment of the automated system of this application. This application provides an automated system A, including multiple sample analyzers 2 and a transport device 1. The transport device 1 is spaced apart from the multiple sample analyzers 2 to transport test tube racks to the multiple sample analyzers 2. The automated system A can be a desktop automated system product.

[0062] Specifically, the transport device 1 is used to transport the test tube rack between multiple sample analyzers 2, wherein the multiple sample analyzers 2 include a first sample analyzer 201, a second sample analyzer 202 and a third sample analyzer 203, and the first sample analyzer 201, the second sample analyzer 202 and the third sample analyzer 203 can perform different types of sample testing on the samples loaded on the test tube rack.

[0063] Specifically, the first sample analyzer 201 and the second sample analyzer 202 are arranged adjacent to each other, and the transport device 1 includes a first loading area 11, a second loading area 12, a buffer zone 13, an unloading area 14 and a transport component 15.

[0064] The buffer zone 13 is located between the second sample analyzer 202 and the third sample analyzer 203. The transport component 15 is spaced apart from the first sample analyzer 201, the second sample analyzer 202, the buffer zone 13 and the third sample analyzer 203. It is used to transport the test tube rack after being tested by the first sample analyzer 201 and / or the second sample analyzer 202 to the buffer zone 13, and to transport the test tube rack loaded in the buffer zone 13 to the third sample analyzer 203.

[0065] Understandably, when the sample on the test tube rack only needs to be tested by the first sample analyzer 201, the transport component 15 can transport the test tube rack to the first sample analyzer 201 for testing and then directly transport the test tube rack to the buffer zone 13. When the sample on the test tube rack only needs to be tested by the second sample analyzer 202, the transport component 15 can directly transport the test tube rack to the second sample analyzer 202 for testing and then transport the test tube rack to the buffer zone 13. Only when the sample on the test tube rack needs to be tested by both the first sample analyzer 201 and the second sample analyzer 202 will the transport component 15 transport the test tube rack sequentially to both analyzers, thus improving the transport efficiency of the test tube rack.

[0066] In this embodiment, by additionally setting a buffer zone 13 between the second sample analyzer 202 and the third sample analyzer 203, the test tube racks unloaded from the first sample analyzer 201 and the second sample analyzer 202 are buffered, compensating for the impact of the difference in detection speed between the first sample analyzer 201 and the second sample analyzer 202 and the third sample analyzer 203 on the transport device 1. The transport device 1 can smoothly load and unload the test tube racks at the first sample analyzer 201 and the second sample analyzer 202, while not affecting the loading and unloading of the test tube racks at the third sample analyzer 203, thereby improving the transport efficiency of the transport device 1 for the test tube racks and ensuring the practicality of the transport device 1.

[0067] Optionally, please refer to Figure 2 and Figure 3 , Figure 2 This is a schematic diagram of the structure of the first embodiment of the transportation device of this application; Figure 3 yes Figure 2 A partial structural schematic diagram of the first embodiment of the transport device.

[0068] The transportation device 1 provided in this application embodiment further includes a first optical coupler assembly 16, a return mechanism 17, and a control unit, the control unit being connected to the transportation assembly 15, the first optical coupler assembly 16, and the return mechanism 17.

[0069] The first optical coupler assembly 16 is spaced apart from the buffer 13 and is located on the side of the buffer 13 away from the transport assembly 15. The return mechanism 17 is spaced apart from the first optical coupler assembly 16.

[0070] Specifically, the control unit controls the transport assembly 15 to deliver the test tube rack to the buffer zone 13, and controls the first optical coupler assembly 16 to detect the unloading status of the test tube rack, that is, the first optical coupler assembly 16 is used to detect whether the test tube rack has been unloaded into place in the buffer zone 13. Before the transport assembly 15 delivers another test tube rack to the buffer zone 13, the control unit also controls the return mechanism 17 to adjust the position of the test tube rack loaded in the buffer zone 13, so as to prevent the test tube rack loaded in the buffer zone 13 from blocking the light generated by the first optical coupler assembly 16.

[0071] In one embodiment, the first optical coupler assembly 16 can be a position-to-position through-beam optical coupler, including a light emitter and a light receiver. The light emitter can be disposed on a first side of the buffer 13 away from the transport assembly 15, and the light receiver can be disposed on a second side of the buffer 13 adjacent to the first side. The light emitted by the light emitter passes through one corner of the buffer 13 away from the transport assembly 15 to reach the light receiver. After the test tube rack is pushed into the buffer 13 and unloaded, that is, a portion of the test tube rack exists in the area through which the light emitted by the light emitter passes, blocking the light. Consequently, the light receiver cannot receive the light emitted by the light emitter. The control unit then receives a signal that the test tube rack has been pushed into the buffer 13 and unloaded. This prevents the test tube rack from being over-pushed and unloaded, thus preventing it from falling into the buffer 13 and improving the safety of unloading the test tube rack.

[0072] For further details, please refer to Figure 4 , Figure 4 This is a schematic diagram of the structure of the first embodiment of the callback mechanism of this application. The callback mechanism 17 provided in this application embodiment includes a bracket 171, a rotating shaft 172, a toggle block 173, a motor 174, an optocoupler baffle 175, and an initial position optocoupler 176.

[0073] The rotating shaft 172 and the toggle block 173 are mounted on the bracket 171, and the toggle block 173 is mounted on the rotating shaft 172. The motor 174 is mounted on the end of the bracket 171 away from the rotating shaft 172 and is connected to the rotating shaft 172. The optocoupler baffle 175 is also mounted on the rotating shaft 172, and the extension direction of the optocoupler baffle 175 is parallel to the extension direction of the toggle block 173. The initial position optocoupler 176 is mounted on the bracket 171 and is spaced apart from the rotating shaft 172.

[0074] After the test tube rack is unloaded into place, it blocks the light generated by the first optical coupler assembly 16. At the same time, due to the limitation of the test tube rack, the extension direction of the toggle block 173 is parallel to the side of the buffer zone 13 away from the transport assembly 15, and the extension direction of the optical coupler baffle 175 is also parallel to the side of the buffer zone 13 away from the transport assembly 15. The optical coupler baffle 175 is partially disposed in the initial position optical coupler 176, blocking the light generated by the initial position optical coupler 176. At this time, the return mechanism 17 is in the initial state.

[0075] As the transport component 15 is about to deliver the next test tube rack to the buffer zone 13, the original test tube rack blocks the light emitted by the first optocoupler component 16, preventing the first optocoupler component 16 from detecting whether the next test tube rack has been unloaded in place. At this time, the control unit starts the motor 174, driving the rotating shaft 172 to rotate, which in turn causes the lever 173 to swing. The lever 173 pushes the test tube rack near the return mechanism 17, adjusting the position of the test tube rack loaded on the buffer zone 13 to prevent the test tube rack from blocking the light emitted by the first optocoupler component 16. At this time, the optocoupler baffle 175 swings with the rotating shaft 172, moving away from the initial position optocoupler 176. The light emitted by the initial position optocoupler 176 is no longer blocked, and the return mechanism 17 disengages from its initial state.

[0076] Then, after the next test tube rack is pushed into the buffer zone 13, the next test tube rack will push the test tube rack originally loaded on the buffer zone 13 and push the test tube rack close to the return mechanism 17 and the first optical coupler component 16 back into place (at this time, the next test tube rack is also pushed into place). At this time, the test tube rack blocks the light generated by the first optical coupler component 16 again, and pushes the extension direction of the toggle block 173 back to be parallel to the side of the buffer zone 13 away from the transport component 15. The optical coupler baffle 175 blocks the light generated by the initial position optical coupler 176 again. The return mechanism 17 returns to the initial state, and the control unit obtains the information that the test tube rack has been pushed into place.

[0077] Alternatively, please continue reading Figure 3 The transport device 1 provided in this application embodiment also includes a first push plate 18 and a second optical coupler assembly 19, and the control unit is connected to the first push plate 18 and the second optical coupler assembly 19.

[0078] The first push plate 18 is spaced apart from the buffer 13 and the transport component 15, and the second optical coupler component 19 is spaced apart from the transport component 15 and is located on the side of the buffer 13 away from the second sample analyzer 202.

[0079] After the second optocoupler assembly 19 responds to the transport assembly 15 by delivering the test tube rack to the corresponding area of ​​the buffer zone 13, the control unit is also used to control the first pusher plate 18 to push the test tube rack into the buffer zone 13.

[0080] In one embodiment, as described above, the transport component 15 can transport the test tube rack to the first sample analyzer 201, or to the second sample analyzer 202, or to both the first and second sample analyzers 201. That is, it is uncertain when the transport component 15 will transport the test tube rack to the corresponding area of ​​the buffer zone 13. If the transport component 15 does not detect whether the test tube rack has been transported to the corresponding area of ​​the buffer zone 13, it may result in the test tube rack being transported to the corresponding area but the first pusher plate 18 not pushing it in time, leading to a buildup of test tube racks on the transport component 15, or the test tube rack not being transported to the corresponding area, resulting in the first pusher plate 18 consuming energy to push it without reaching the correct area. Therefore, this embodiment of the application includes a second optocoupler component 19 to detect whether the test tube rack has been transported to the corresponding area of ​​the transport component 15 and the buffer zone 13.

[0081] The second optocoupler component 19 can also be a through-beam positioning optocoupler. When the test tube rack is transported to the corresponding area of ​​the buffer zone 13, the test tube rack blocks the light emitted by the second optocoupler component 19. The second optocoupler component 19 then responds to the test tube rack being transported to the corresponding area, and the control unit subsequently controls the first pusher plate 18 to push the test tube rack onto the buffer zone 13. This improves the responsiveness and pushing efficiency of the first pusher plate 18 towards the test tube rack, enhancing the practicality of the transport device 1.

[0082] In one embodiment, after the transport component 15 delivers the test tube rack to the corresponding area between the transport component 15 and the buffer zone 13, the second optocoupler component 19 responds to the test tube rack being delivered to the designated position. The control unit controls the first pusher plate 18 to push the test tube rack onto the buffer zone 13. After the first optocoupler component 16 detects that the test tube rack has been pushed to the designated position, the control unit further controls the first pusher plate 18 to stop pushing and return to its initial position. The initial position of the first pusher plate 18 is the position it was in before pushing the test tube rack, which is the area separated from the transport component 15, in order to prepare for the next push of the test tube rack, avoid the first pusher plate 18 over-pushing the test tube rack and pushing the test tube rack off the buffer zone 13, and improve the safety of the first pusher plate 18 pushing the test tube rack.

[0083] Optionally, the transport device 1 further includes a third optical coupler 20, which is disposed at one end of the buffer 13 near the transport component 15.

[0084] The control unit is also connected to the third optocoupler assembly 20. When the third optocoupler assembly 20 responds to the fact that the test tube rack on the buffer 13 is full, it controls the first push plate 18 to stop pushing the test tube rack on the transport assembly 15 to the buffer 13.

[0085] In one embodiment, the third optical coupler component 20 can also be a through-beam optical coupler. The light emitter of the third optical coupler component 20 can be disposed on the buffer zone 13 and close to the first transport track 151. The light receiver of the third optical coupler component 20 can be disposed on two opposite sides of the buffer zone 13. Thus, when the test tube rack blocks the light generated by the third optical coupler component 20, it can be determined that there is a test tube rack in the area of ​​the buffer zone 13 corresponding to the third optical coupler component 20, indicating that the test tube rack in the buffer zone 13 is full. If the first pusher plate 18 continues to push the test tube rack at this time, it may push the test tube rack that was originally in the buffer zone 13 off the buffer zone 13, causing the test tube rack to fall. Therefore, when the control unit obtains that the test tube rack in the buffer zone 13 is full, it controls the first pusher plate 18 to stop pushing the test tube rack.

[0086] It is understandable that when the test tube rack in buffer 13 is not fully loaded, the first push plate 18 will briefly block the light generated by the third optical coupler component 20 when pushing the test tube rack. Therefore, in this embodiment, a preset time can be set. When the time when the light generated by the third optical coupler component 20 is blocked is greater than or equal to the preset time, the third optical coupler component 20 will respond that the test tube rack in buffer 13 is fully loaded. When the time when the time when the light generated by the third optical coupler component 20 is blocked is less than the preset time, it is considered that the first push plate 18 is pushing the test tube rack normally, and the third optical coupler component 20 will not react to this, thereby improving the accuracy of the response of the third optical coupler component 20.

[0087] The following is a brief description of the process of conveying the test tube rack to buffer zone 13:

[0088] When the first sample analyzer 201 is started and the second sample analyzer 202 is started, the control unit controls the transport assembly 15 to push the first loading area 11 onto the test tube rack on the transport assembly 15 and deliver it to the first sample analyzer 201 and / or the second sample analyzer 202 for sampling and testing. After the sampling and testing is completed, the test tube rack is transported to the corresponding area on the transport assembly 15 and the buffer zone 13.

[0089] Please see Figure 5 and Figure 6 , Figure 5 This is a schematic diagram of the structure of the second embodiment of the transportation device of this application; Figure 6 This is a schematic diagram of the structure of the third embodiment of the transport device of this application. When the test tube rack 3 is transported to the corresponding area of ​​the transport component 15 and the buffer zone 13, the test tube rack 3 blocks the light generated by the second optocoupler component 19. In response to the test tube rack 3 being transported to the corresponding area, the control unit controls the first push plate 18 to push the test tube rack 3 onto the buffer zone 13. And when the test tube rack 3 blocks the light generated by the first optocoupler component 16, the control unit, in response to the test tube rack 3 being pushed into place, controls the first push plate 18 to stop pushing and return to the initial position.

[0090] Please continue reading. Figure 7 and Figure 8 , Figure 7 This is a structural schematic diagram of the fourth embodiment of the transportation device of this application. Figure 8 This is a structural schematic diagram of the fifth embodiment of the transport device of this application. After the first pusher plate 18 has pushed the first test tube rack 31 onto the buffer zone 13, the first test tube rack 31 blocks the light generated by the first optical coupler component 16, causing the first optical coupler component 16 to be unable to continue checking whether the test tube rack 31 has been pushed into place. At this time, the control unit controls the return mechanism 17 to start, adjusting the position of the first test tube rack 31 on the buffer zone 13 to clear the area through which the light generated by the first optical coupler component 16 passes, thus preventing the first test tube rack 31 from blocking the light generated by the first optical coupler component 16. When the second optocoupler component 19 responds to the second test tube rack 32 being transported to the corresponding area of ​​the transport component 15 and the buffer zone 13, the control unit controls the first pusher plate 18 to push the second test tube rack 32 onto the buffer zone 13. The second test tube rack 32 will also push the first test tube rack 31, causing the first test tube rack 31 to block the light generated by the first optocoupler component 16 again. At this time, the first optocoupler component 16 responds to the first test tube rack 31 and the second test tube rack 32 being pushed into place. The control unit will receive the information that the first test tube rack 31 and the second test tube rack 32 have been pushed into place, control the first pusher plate 18 to stop pushing, and return to the initial position.

[0091] Furthermore, the control unit will again control the return mechanism 17 to adjust the position of the test tube rack 3 on the buffer 13, and when the second optocoupler assembly 19 responds to the test tube rack 3 being transported to the corresponding track area, it will control the first push plate 18 to push the test tube rack 3 onto the buffer 13.

[0092] Until, as Figure 9 As shown, Figure 9 This is a schematic diagram of the sixth embodiment of the transport device of this application. When the test tube rack 3 on the buffer 13 is fully loaded, the light generated by the third optocoupler component 20 is blocked for a longer than a preset time, and the control unit controls the first push plate 18 to stop pushing the test tube rack 3.

[0093] In summary, this embodiment of the application improves the response efficiency of the control unit to the test tube rack 3 by setting the first optocoupler component 16, the second optocoupler component 19 and the third optocoupler component 20 to detect the transport and unloading status of the test tube rack 3, thereby improving the smoothness of the transport of the test tube rack 3 in the transport device 1 and enhancing the practicality of the transport device 1.

[0094] Optional, please continue reading Figure 1 and Figure 2In the transportation device 1 of this application embodiment, a first loading area 11 is disposed on the side of the first sample analyzer 201 away from the second sample analyzer 202, a buffer zone 13 is disposed on the side of the second sample analyzer 202 away from the first sample analyzer 201, a second loading area 12 is disposed on the side of the buffer zone 13 away from the second sample analyzer 202, a third sample analyzer 203 is disposed at an interval from the second loading area 12, and an unloading area 14 is disposed on the side of the third sample analyzer 203 away from the second loading area 12. The transportation component 15 includes a first transportation track 151 and a second transportation track 152.

[0095] The first transport track 151 is spaced apart from the first loading area 11, the first sample analyzer 201, the second sample analyzer 202, and the buffer zone 13. The control unit is used to control the test tube rack 3 loaded on the first loading area 11 to be pushed to the first transport track 151, and to control the first transport track 151 to transport the test tube rack 3 to the first sample analyzer 201 and / or the second sample analyzer 202 for sampling and testing, and to transport the test tube rack 3 after sampling and testing to the buffer zone 13.

[0096] The second transport track 152 is spaced apart from the second loading area 12, the third sample analyzer 203, and the unloading area 14. After the control unit controls the test tube rack 3 loaded in the buffer zone 13 to be pushed onto the second loading area 12, the control unit further controls the test tube rack 3 on the second loading area 12 to be pushed onto the second transport track 152, and controls the second transport track 152 to transport the test tube rack 3 to the third sample analyzer 203 for sampling and testing, and then transports the test tube rack 3 after sampling and testing to the unloading area 14.

[0097] In one embodiment, please continue to refer to Figure 1 A third transport track 153 can be provided on the side of buffer zone 13 away from the first transport track 151 and the side of second loading area 12 away from the second transport track 152. The control unit can then control the third transport track 153 to transport the test tube rack 3 on buffer zone 13 to the second loading area 12. In other embodiments, a pusher component can be provided on buffer zone 13. The control unit controls the pusher component to push the test tube rack 3 loaded on buffer zone 13 from the side of buffer zone 13 away from the first transport track 151 to the side of second loading area 12 away from the second transport track 152, thus realizing the transport of test tube rack 3 between buffer zone 13 and second loading area 12.

[0098] In this embodiment, a buffer zone 13 is additionally set between the second sample analyzer 202 and the third sample analyzer 203 to buffer the test tube racks 3 unloaded from the first sample analyzer 201 and the second sample analyzer 202; and a second loading area 12 is set to buffer the loading of the third sample analyzer 203, compensating for the impact of the difference in detection speed between the first sample analyzer 201, the second sample analyzer 202 and the third sample analyzer 203 on the transport device 1. The transport device 1 can smoothly load and unload the test tube racks 3 at the first sample analyzer 201 and the second sample analyzer 202, without affecting the loading and unloading of the test tube racks 3 at the third sample analyzer 203, thereby improving the transport efficiency of the transport device 1 for the test tube racks 3 and ensuring the practicality of the transport device 1.

[0099] In another embodiment, the transport device 1 may further include a re-inspection area (not shown). The re-inspection area may be located between the second sample analyzer 202 and the buffer zone 13, or between the first sample analyzer 201 and the second sample analyzer 202, or between the third sample analyzer 203 and the unloading area 14. When the test tube rack 3 needs to be re-inspected, the first transport track 151 or the second transport track 152 can transport the test tube rack 3 to the re-inspection area. After the first sample analyzer 201, the second sample analyzer 202 or the third sample analyzer 203 completes the current testing work, the test tube rack 3 that needs to be re-inspected is transported back to the sample analyzer 2 for re-inspection, thereby improving the practicality of the transport device 1.

[0100] In other embodiments, the sample analyzer 2 may be equipped with an emergency sampling port. When there is a sample requiring emergency treatment, the user can pause the transport device 1 and send the sample directly into the emergency sampling port. The sample analyzer 2 can then prioritize testing the emergency sample. After the sample analyzer 2 has finished testing the emergency sample, the user can resume the transport device 1, and the transport device 1 will continue transporting the test tube rack 3.

[0101] Alternatively, please continue reading Figure 10 and Figure 11 , Figure 10 yes Figure 2 A partial structural schematic diagram of the second embodiment of the transport device; Figure 11 yes Figure 2 A partial structural schematic diagram of the third embodiment of the transport device. The transport device 1 provided in this application embodiment also includes a second pusher plate 21 and a fourth optocoupler assembly 22.

[0102] The second push plate 21 is located on the side of the buffer zone 13 away from the second loading area 12, and at the end of the buffer zone 13 away from the first transport track 151. The fourth optocoupler assembly 22 is located on the side of the second loading area 12 away from the buffer zone 13, and at the end of the second loading area 12 away from the second transport track 152.

[0103] The control unit is connected to the second push plate 21 and the fourth optocoupler assembly 22. The control unit is also used to control the second push plate 21 to push the test tube rack 3 loaded on the buffer zone 13 to the second loading area 12. After the fourth optocoupler assembly 22 responds to the test tube rack 3 being pushed into the second loading area 12, it controls the second push plate 21 to stop pushing and return to the initial position. The initial position of the second push plate 21 is the position of the second push plate 21 before pushing the test tube rack 3, that is, the area of ​​the buffer zone 13 away from the second loading area 12, waiting for the next push of the test tube rack 3.

[0104] In one embodiment, the fourth optical coupler component 22 can be a position-positioned through-beam optical coupler. When the second pusher plate 21 pushes the test tube rack 3 into position, the test tube rack 3 blocks the light generated by the fourth optical coupler component 22. In response to the test tube rack 3 being pushed into position, the control unit then controls the second pusher plate 21 to stop pushing and return to the initial position.

[0105] Optionally, the transport device 1 provided in this application embodiment further includes a third push plate (not shown) and a fifth optical coupler assembly 23. The third push plate is disposed on the side of the second loading area 12 away from the second transport track 152, and the fifth optical coupler assembly 23 is disposed at a distance from the second transport track 152.

[0106] The control unit is connected to the third push plate and the fifth optocoupler assembly 23. The control unit is also used to control the third push plate to push the test tube rack 3 loaded on the second loading area 12 onto the second transport track 152. After the fifth optocoupler assembly 23 responds to the test tube rack 3 being pushed onto the second transport track 152, it controls the third push plate to stop pushing and return to the initial position. The initial position of the third push plate is the position it was in before pushing the test tube rack 3, which is the area of ​​the second loading area 12 away from the second transport track 152. The return of the third push plate to the initial position prepares for the next push of the test tube rack 3.

[0107] In one embodiment, when the light generated by the fourth optical coupler component 22 is blocked by the test tube rack 3, the control unit controls the second push plate 21 to stop pushing. At the same time, the control unit can control the third push plate to push the test tube rack 3 closer to the second transport track 152, so that the light generated by the fourth optical coupler component 22 is not blocked. Therefore, in this embodiment, there is no need to set an additional return mechanism 17 to adjust the position of the test tube rack 3.

[0108] The following is a brief description of the process by which test tube rack 3 is pushed from buffer zone 13 to second loading zone 12:

[0109] Please see Figure 12 and Figure 13 A schematic diagram of the structure of the seventh embodiment of the transportation device of this application; Figure 13 This is a schematic diagram of the structure of the eighth embodiment of the transport device of this application. The control unit controls the second push plate 21 to push the test tube rack 3 loaded on the buffer zone 13 to the second loading area 12. When the light generated by the fourth optical coupler component 22 is blocked in response to the fourth optical coupler component 22, it is determined that the test tube rack 3 has been pushed into place. Then the control unit controls the second push plate 21 to stop pushing and return to the initial position.

[0110] Then the control unit can control the third pusher plate to push the test tube rack 3 towards the direction of the second transport track 152. When the light generated by the fourth optical coupler component 22 is not blocked, that is, when there is no test tube rack 3 in the area corresponding to the fourth optical coupler component 22, the control unit can continue to control the second pusher plate 21 to push the test tube rack 3 loaded on the buffer zone 13 to the second loading area 12.

[0111] In one embodiment, a return mechanism 17 may also be provided on the side of the second transport track 152 away from the second loading area 12 and close to the fifth optical coupler component 23 to adjust the position of the test tube rack 3 that blocks the light generated by the fifth optical coupler component 23, so that the fifth optical coupler component 23 continuously checks whether the test tube rack 3 has been pushed into place, avoiding the third push plate from pushing the test tube rack 3 too much and pushing the test tube rack 3 off, thereby improving the safety of the transport device 1.

[0112] Furthermore, after the second transport track 152 pushes the test tube rack 3 onto the second transport track 152 to the third sample analyzer 203, the second transport track 152 can transport the test tube rack 3 after sampling and testing to the unloading area 14 for unloading. The unloading area 14 can also be equipped with an optocoupler to detect whether the test tube rack 3 is in place, and a pusher plate can be set to push the test tube rack. This application does not limit this.

[0113] In another embodiment, when the third sample analyzer 203 has not yet responded to the sampling detection, after the second pusher plate 21 pushes the test tube rack 3 loaded in the buffer zone 13 to the second loading area 12, since the second transport track 152 fails to transport the test tube rack 3 in the second loading area 12 to the third sample analyzer 203, the second loading area 12 may be fully loaded. As mentioned above, the control unit will continuously control the third pusher plate to push the test tube rack 3 that is blocking the fourth optical coupler component 22 towards the second transport track 152. That is, during this process, the test tube rack 3 will briefly block the light generated by the fourth optical coupler component 22.

[0114] Therefore, this embodiment proposes that when the light generated by the fourth optocoupler component 22 is blocked for a period of time exceeding a preset time, it can be considered that the third pusher plate can no longer push the test tube rack 3 towards the second transport track 152. That is, the test tube rack 3 on the second loading area 12 is fully loaded. At this time, the control unit can control the second pusher plate 21 to stop pushing the test tube rack 3 on the buffer zone 13 to the second loading area 12, so as to avoid the test tube rack 3 originally loaded in the second loading area 12 being pushed off, thereby improving the safety of the transport device 1.

[0115] Optionally, please refer to Figure 14 , Figure 14 yes Figure 2 A partial structural schematic diagram of the fourth embodiment of the transport device. The transport device 1 provided in this application embodiment also includes a blocking mechanism 24 and a fourth push plate (not shown).

[0116] The blocking mechanism 24 is located at one end of the first loading area 11 near the first transport track 151, and the fourth push plate is located on the side of the first loading area 11 away from the first transport track 151.

[0117] The control unit is connected to the blocking mechanism 24 and the fourth push plate. The control unit is also used to control the fourth push plate to push the test tube rack 3 loaded on the first loading area onto the first transport track 151. When there is a test tube rack 3 on the track area corresponding to the first loading area 11 on the first transport track 151 or when the test tube rack 3 on the first transport track 151 is fully loaded, the control mechanism 24 is controlled to block the fourth push plate from pushing the test tube rack 3 onto the first transport track 151.

[0118] In one embodiment, please refer to Figure 15 , Figure 15 This is a schematic diagram of the structure of the first embodiment of the blocking mechanism of this application. The blocking mechanism 24 includes a connecting shaft 241, two pawls 242, a pulley 243, and a timing belt 244. The connecting shaft 241 is connected to the pulley 243 via the timing belt 244, and the pawls 242 are disposed on the connecting shaft 241.

[0119] Specifically, the transport device 1 may also include a sixth optical coupler assembly (not shown). The sixth optical coupler assembly is spaced apart from the corresponding track area of ​​the first transport track 151 and the first loading area 11. When the fourth pusher plate pushes the test tube rack 3 to the corresponding track area of ​​the first transport track 151 and the first loading area 11, the test tube rack 3 blocks the light generated by the sixth optical coupler assembly. For example, when the first sample analyzer 201 is in the sampling and detection state, the first transport track 151 cannot immediately transport the test tube rack 3 to the first sample analyzer 201. The test tube rack 3 continuously blocks the light generated by the sixth optical coupler assembly. The control unit can control the pulley 243 to rotate, driving the synchronous belt 244 to rotate. In turn, the synchronous belt 244 drives the connecting shaft 241 to rotate. The pawl 242 swings with the connecting shaft 241 to protrude from the plane of the first loading area 11. The height of the pawl 242 is higher than the plane height of the first loading area 11, thus blocking the movement of the test tube rack 3. Because the claw 242 obstructs the movement of the test tube rack 3, the fourth pusher plate cannot continue to push the test tube rack 3, thus avoiding the situation where the fourth pusher plate pushes too far and pushes the test tube rack 3 located on the first transport track 151 off, thereby improving the safety of the transport device 1.

[0120] Furthermore, when the first transport track 151 transports the test tube rack 3 on the corresponding track area of ​​the first transport track 151 and the first loading area 11 to the first sample analyzer 201, the light generated by the sixth optocoupler component is not blocked. The control unit obtains the information that the corresponding track area is empty and controls the pulley 243 to drive the pawl 242 to swing. The height of the pawl 242 is lower than the plane height of the first loading area 11 and does not obstruct the movement of the test tube rack 3. At this time, the fourth push plate can smoothly push the test tube rack 3 onto the first transport track 151. After the fourth push plate pushes the test tube rack 3 onto the first transport track 151, when the control unit determines that there is a test tube rack 3 on the corresponding track area of ​​the first transport track 151 and the first loading area 11, it can again control the blocking mechanism 24 to block the action of the fourth push plate pushing the test tube rack 3, thereby improving the safety of the transport device 1.

[0121] In another embodiment, a blocking mechanism 24 may also be provided at one end of the second loading area 12 near the second transport track 152 to block the third push plate from pushing the test tube rack 3 to the second transport track 152. This application does not limit this.

[0122] In other embodiments, the return mechanism 17, which is spaced apart from the buffer zone 13, can also be replaced by the blocking mechanism 24. Compared with the single paddle structure of the return mechanism 17 for adjusting the position of the test tube rack 3, the double paddle structure of the blocking mechanism 24 can more stably adjust the position of the test tube rack, further improving the efficiency of the transport device 1 in transporting the test tube rack 3.

[0123] In summary, the transportation device 1 provided in this application includes a first loading area 11, a second loading area 12, a buffer zone 13, and an unloading area 14. By additionally setting up the buffer zone 13 and the second loading area 12, the process of transporting the test tube rack 3 between the second sample analyzer 202 and the third sample analyzer 203 is buffered, which makes up for the impact of the difference in sampling and detection speed between the first sample analyzer 201, the second sample analyzer 202, and the third sample analyzer 203 on the transportation of the test tube rack 3, thereby improving the practicality of the transportation device 1.

[0124] Meanwhile, by setting up various optocoupler components, return mechanism 17, push plates, blocking mechanism 24, etc., the transportation of test tube rack 3 in transportation device 1 is controlled, thereby improving the safety of transporting test tube rack 3 in transportation device 1, improving the response efficiency of transportation device 1 to transport test tube rack 3, and improving the user's experience of transportation device 1.

[0125] The above description is merely an embodiment of this application and does not limit the patent scope of this application. Any equivalent structural or procedural transformations made using the content of this application's specification and drawings, or direct or indirect applications in other related technical fields, are similarly included within the patent protection scope of this application.

Claims

1. A transport device, characterized in that, An apparatus for transporting test tube racks between multiple sample analyzers, wherein the multiple sample analyzers include a first sample analyzer, a second sample analyzer, and a third sample analyzer, the first sample analyzer and the second sample analyzer being arranged adjacent to each other, and the transport device comprising: A buffer is provided between the second sample analyzer and the third sample analyzer; A transport component, spaced apart from the first sample analyzer, the second sample analyzer, the buffer, and the second sample analyzer, is used to transport the test tube rack after being tested by the first sample analyzer and / or the second sample analyzer to the buffer, and to transport the test tube rack loaded in the buffer to the third sample analyzer; The first optical coupler component is spaced apart from the buffer and located on the side of the buffer away from the transport component; The callback mechanism is spaced apart from the first optocoupler component; The transport device further includes a control unit, which is connected to the transport component, the first optical coupler component, and the return mechanism. The control unit controls the transport component to transport the test tube rack to the buffer zone and controls the first optical coupler component to detect the unloading status of the test tube rack. Before the transport component transports another test tube rack to the buffer zone, the control unit also controls the return mechanism to adjust the position of the test tube rack loaded in the buffer zone to avoid the test tube rack loaded in the buffer zone blocking the light generated by the first optical coupler component.

2. The transport device according to claim 1, characterized in that, The transport device also includes a first pusher plate and a second optical coupler assembly. The first pusher plate is spaced apart from the buffer zone and the transport component. The second optical coupler is spaced apart from the transport assembly and is located on the side of the buffer away from the second sample analyzer; The control unit is connected to the first pusher plate and the second optocoupler assembly. The control unit is also used to control the first pusher plate to push the test tube rack into the buffer zone in response to the second optocoupler assembly conveying the test tube rack to the area corresponding to the buffer zone.

3. The transport device according to claim 2, characterized in that, The control unit is also configured to, after the first optocoupler assembly responds to the test tube rack being pushed into the buffer zone, control the first push plate to stop pushing the test tube rack and return to the initial position, and simultaneously control the return mechanism to adjust the position of the test tube rack loaded in the buffer zone; The initial position is the position of the test tube rack before the first pusher plate pushes it.

4. The transport device according to claim 1, characterized in that, The callback mechanism includes: support; A rotating shaft and a lever, wherein the rotating shaft is mounted on the bracket and the lever is mounted on the rotating shaft; The motor is located on the side of the bracket away from the rotating shaft and is connected to the rotating shaft; The control unit is also used to control the motor to start, drive the rotating shaft to rotate, so as to drive the lever to swing and adjust the position of the test tube rack loaded on the buffer.

5. The transport device according to claim 2, characterized in that, The transport device also includes a third optical coupler assembly disposed at one end of the buffer zone near the transport assembly. The control unit is connected to the third optocoupler assembly, and the control unit is also used to control the first pusher to stop pushing the test tube rack on the transport assembly to the buffer when the third optocoupler assembly is in response to the test tube rack on the buffer being fully loaded.

6. The transport device according to claim 1, characterized in that, The transport device also includes a first loading area, a second loading area, and an unloading area. The first loading area is located on the side of the first sample analyzer away from the second sample analyzer, the buffer is located on the side of the second sample analyzer away from the first sample analyzer, the second loading area is located on the side of the buffer away from the second sample analyzer, the third sample analyzer is spaced apart from the second loading area, and the unloading area is located on the side of the third sample analyzer away from the second loading area. The transport component includes a first transport track and a second transport track; The first transport track is spaced apart from the first loading area, the first sample analyzer, the second sample analyzer, and the buffer zone. The control unit is used to control the first transport track to transport the test tube rack loaded in the first loading area to the first sample analyzer and / or the second sample analyzer, and to transport the test tube rack after being detected by the first sample analyzer and / or the second sample analyzer to the buffer zone. The second transport track is spaced apart from the second loading area, the third sample analyzer, and the unloading area. After the control unit controls the test tube rack loaded in the buffer to be pushed onto the second loading area, the control unit is further configured to control the second transport track to transport the test tube rack loaded on the second loading area to the third sample analyzer, and to transport the test tube rack after being detected by the third sample analyzer to the unloading area.

7. The transport device according to claim 6, characterized in that, The transport device also includes a second pusher plate and a fourth optical coupler assembly. The second pusher plate is disposed on the side of the buffer zone away from the second loading area, and is located at the end of the buffer zone away from the first transport track; The fourth optical coupler assembly is located on the side of the second loading area away from the buffer zone, and at the end of the second loading area away from the second transport track; The control unit is connected to the second pusher plate and the fourth optocoupler assembly. The control unit is also used to control the second pusher plate to push the test tube rack loaded in the buffer to the second loading area, and after the fourth optocoupler assembly responds to the test tube rack being pushed to the second loading area, it controls the second pusher plate to stop pushing and return to the initial position, wherein the initial position is the position of the second pusher plate before pushing the test tube rack.

8. The transport device according to claim 6, characterized in that, The transport device also includes a third pusher plate and a fifth optical coupler assembly. The third pusher plate is disposed on the side of the second loading area away from the second transport track, and the fifth optocoupler assembly is disposed at a distance from the second transport track; The control unit is connected to the third pusher plate and the fifth optocoupler assembly. The control unit is also used to control the third pusher plate to push the test tube rack loaded in the second loading area onto the second transport track. After the fifth optocoupler assembly responds to the test tube rack being pushed onto the second transport track, it controls the third pusher plate to stop pushing and return to the initial position, wherein the initial position is the position of the third pusher plate before pushing the test tube rack.

9. The transport device according to claim 6, characterized in that, The transport device further includes a blocking mechanism and a fourth pusher plate. The blocking mechanism is located at one end of the first loading area near the first transport track; the fourth pusher plate is located on the side of the first loading area away from the first transport track. The control unit is connected to the blocking mechanism and the fourth push plate. The control unit is also used to control the fourth push plate to push the test tube rack loaded on the first loading area onto the first transport track; and when there is a test tube rack on the track area corresponding to the first loading area on the first transport track, control the blocking mechanism to block the fourth push plate from pushing the test tube rack onto the first transport track.

10. A production line system, characterized in that, It includes multiple sample analyzers and a transport device as described in any one of claims 1-9, wherein the transport device is spaced apart from the multiple sample analyzers to transport test tube racks to the multiple sample analyzers.

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