A ground test device for simulating microgravity, high-low temperature and vacuum combined conditions of a detection instrument

Abstract

The application provides a device for simulating the ground test of a detection instrument under the combined conditions of microgravity, high and low temperature and vacuum, comprising: a high and low temperature vacuum environment test equipment; a plate-shaped detection device tilt angle simulation assembly simulating the bottom of the detection device; a slow-release device electric simulation assembly fixed in the middle of the detection device tilt angle simulation assembly; an electric simulation assembly slow-release rope fixedly connected to one end of the slow-release device electric simulation assembly; a detection instrument hung below the slow-release device electric simulation assembly by the electric simulation assembly slow-release rope; an umbilical cable fixedly connected to one end of the detection instrument and the other end of the detection instrument; a detection device tilt angle adjustment assembly adjusting the included angle between the detection device tilt angle simulation assembly and the horizontal plane; and a planet surface inclination simulation assembly simulating the surface environment of a planet. The application has the advantages that the temperature and vacuum environment of the device are not affected, and the state of various test modes and various test devices can be adjusted.

Description

Technical Field

[0001] This application belongs to the fields of aerospace technology, lunar deep space exploration, and planetary exploration, and specifically relates to a ground test device for a detection instrument under simulated microgravity, high and low temperature and vacuum combined conditions. Background Technology

[0002] The development of seismometers or planetary exploration instruments requires verification of their adaptability to lunar or planetary environmental conditions through ground-based environmental simulation tests, such as high and low temperature environments, vacuum environments, and microgravity environments. Ground-based tests are typically conducted using high and low temperature vacuum environment testing equipment and gravity balancing equipment. Furthermore, the testing of mechanical components involves multiple retraction and deployment operations. Currently, these tests can only be conducted in two categories: the first is microgravity deployment and release tests, where the equipment uses counterweights or counterweight balloons to conduct deployment and release verification tests under simulated microgravity conditions in an atmospheric environment; the second is high and low temperature vacuum environment simulation tests, which must be conducted within high and low temperature vacuum environment testing equipment. These deployment and release verification tests do not utilize microgravity conditions.

[0003] Meanwhile, current high and low temperature vacuum environment testing equipment requires that after each deployment and release, the equipment must be opened, the seismometer or planetary probe removed, and the settings re-established before the next test. This process necessitates re-establishing the vacuum environment within the equipment, incurring significant time and expense. Therefore, the ability to automatically retract and deploy equipment mechanisms, achieving efficient and low-cost testing, has become an urgent need. This invention provides an economical and efficient testing method and equipment design concept for completing such tests. Summary of the Invention

[0004] The purpose of this application is to overcome the shortcomings of existing technologies that require resetting the test environment when switching between different tests.

[0005] To achieve the above objectives, this application proposes a ground-based test apparatus for simulating combined microgravity, high and low temperature, and vacuum conditions for a detection instrument. The apparatus includes:

[0006] High and low temperature vacuum environment testing equipment is used to control the temperature and vacuum state of the environment in which the device is located;

[0007] The detector tilt angle simulation component is a plate-shaped structure used to simulate the bottom of the detector;

[0008] The slow-release device electrical simulation component is fixed in the middle of the detector tilt angle simulation component;

[0009] One end of the slow-release rope of the electrical simulation component is fixedly connected to the electrical simulation component of the slow-release device;

[0010] The detection instrument is suspended below the electrical simulation component of the slow-release device by the slow-release rope of the electrical simulation component;

[0011] One end of the umbilical cable is fixedly connected to the detection instrument, and the other end is fixedly connected to the detector tilt angle simulation component.

[0012] A detector tilt angle adjustment component is used to adjust the angle between the detector tilt angle simulation component and the horizontal plane; and

[0013] A planetary surface tilt simulation component, located below the detection instrument, is used to simulate the planetary surface environment.

[0014] As an improvement to the above-mentioned device, the detector tilt angle adjustment component is a lead screw, a gear rack, or a linear motor.

[0015] As an improvement to the above-mentioned device, the device further includes:

[0016] A first rotating shaft is installed at one end of the detector tilt angle simulation component and is movably connected to the detector tilt angle simulation component and the detector tilt angle adjustment component, allowing the detector tilt angle adjustment component to drive one end of the detector tilt angle adjustment component to move up and down.

[0017] A slider is mounted on the end of the detector tilt angle simulation component away from the first rotation axis and is movably connected to the detector tilt angle simulation component, allowing the slider to move in the direction of the first rotation axis or away from the first rotation axis;

[0018] The second rotating axis is movably connected to the slider and the detector tilt angle adjustment assembly, allowing the detector tilt angle adjustment assembly to drive the slider and the end of the detector tilt angle simulation assembly connected to the slider to move up and down.

[0019] As an improvement to the above-mentioned device, the device further includes:

[0020] The first convergence angle control component is movably connected to the detector tilt angle simulation component below the detector tilt angle simulation component;

[0021] The first retraction angle control rope has one end fixed below the first retraction angle control component and the other end fixed to one end of the detection instrument.

[0022] The second convergence angle control component is movably connected to the detector tilt angle simulation component below the detector tilt angle simulation component;

[0023] The second gathering angle control rope has one end fixed below the second gathering angle control component and the other end fixed to the end of the detection instrument that is opposite to the position of the first gathering angle control rope.

[0024] The distance from the first retraction angle control component to the electrical simulation component of the slow-release device is equal to the distance from the second retraction angle control component to the electrical simulation component of the slow-release device.

[0025] The first and second retraction angle control components have a drive system inside, which enables them to move along a circle with the slow-release device electrical simulation component as the center and the distance from the first retraction angle control component to the slow-release device electrical simulation component as the radius at the bottom of the detector tilt angle simulation component.

[0026] As an improvement to the above-mentioned device, the upper part of the planetary surface tilt simulation component is simulated planetary soil;

[0027] The planetary surface tilt simulation component can rotate in both horizontal and vertical directions to adjust the angle and tilt direction between the simulated planetary soil surface and the horizontal plane.

[0028] As an improvement to the above-mentioned device, the device further includes:

[0029] The first and second cameras are located inside the high and low temperature vacuum environment test equipment, on opposite sides of the device, and are used to capture and record the test process.

[0030] As an improvement to the above-mentioned device, the device further includes:

[0031] A counterweight assembly is used to counteract part of the gravity of the detection instrument.

[0032] As an improvement to the above-mentioned device, the counterweight assembly includes:

[0033] Two fixed pulleys are fixed above the device;

[0034] The counterweight has a weight that corresponds to the weight reduction required for the detection instrument.

[0035] The counterweight rope, which passes through two fixed pulleys, is connected at one end to the upper part of the detection instrument and at the other end to the counterweight block.

[0036] As an improvement to the above-mentioned device, the device further includes:

[0037] A vibration signal generator is fixed to the bottom of the planetary surface tilt simulation component to simulate planetary earthquakes;

[0038] The detection instrument has a vibration signal receiving component inside.

[0039] As an improvement to the above-mentioned device, the electro-simulation component of the slow-release device is equipped with a tensile testing device to measure the tensile force borne by the slow-release rope of the electro-simulation component.

[0040] Compared with existing technologies, the advantages of this application are:

[0041] The apparatus described in this application can be adjusted between various test modes and test device states without affecting the temperature and vacuum environment of the apparatus, thereby reducing test steps, speeding up the test, and reducing test costs. Attached Figure Description

[0042] Figure 1 The diagram shown illustrates the landing status of the probe.

[0043] Figure 2 The diagram shows the process of the probe being slowly released from below the probe onto the planet's surface.

[0044] Figure 3 The diagram shows the structure of a ground test device for a detection instrument used to simulate combined microgravity, high and low temperature, and vacuum conditions.

[0045] Figure 4 The diagram shows the rotation of the retraction angle control component when the detection instrument descends slowly.

[0046] Figure 5 The diagram shows a test device with a function to counteract the gravity of the detection instrument. Detailed Implementation

[0047] The technical solution of this application will be described in detail below with reference to the accompanying drawings.

[0048] Seismometers or other planetary exploration instruments designed to explore the surfaces of landed planets typically accompany various probes to the Moon or other planets. After the probe lands, the seismometer or other planetary exploration instrument needs to be released to the lunar or planetary surface at the designed speed, either slowly to maintain stable contact with the lunar or planetary regolith, or rapidly to penetrate deep into the lunar or planetary regolith. During the equipment development process, environmental simulation tests on the Moon or other planets need to be conducted on Earth, including microgravity, vacuum, and extreme temperature environments.

[0049] Current testing equipment cannot perform comprehensive tests under combined microgravity, vacuum, and high / low temperature conditions. Furthermore, multiple release tests of the detection instrument in vacuum and high / low temperature environments require removing the instrument from the testing equipment after each test. The purpose of this invention is to solve these problems.

[0050] The following examples use a seismometer as the detection instrument and its landing surface on the moon as a simulated test object for illustration. Figure 1 and Figure 2 As shown, Figure 1 This is a diagram illustrating the landing status of probe 001. Figure 2 This diagram illustrates the gradual release of the seismometer 1001 from below the probe 001 onto the lunar surface. After the probe 001 lands on the lunar surface, the first probe support leg 011 and the second probe support leg 012 contact the lunar landing surface 2002. The seismometer 1001 is mounted on the outer side of the bottom surface of the probe 001. The angle α between the lunar landing surface 2002 and the horizontal plane 2001 of the planet is defined as the lunar landing tilt angle 210°. To avoid damage to the seismometer 1001 from excessive impact, the seismometer 1001 is released by a release device 004. The release device 004 releases the seismometer onto the lunar surface 2003 via a release rope 1004. Due to the unevenness of the lunar surface, the area where the seismometer is released on the lunar surface 2003 may still be tilted. The angle β between the seismometer's release area on the lunar surface 2003 and the probe's landing surface 2002 is defined as the seismometer's lunar surface tilt angle 220°. The umbilical cable 1002 directly provides communication and power to the detection instrument 1001 and the detector 001, completing the energy supply, control and data transmission of the detection instrument 1001.

[0051] During the development of the probe instrument 1001, various tests under simulated environmental conditions need to be completed, such as resistance tests of the umbilical cable 1002 under different lunar landing tilt angles 2100°, slow release speed tests of the probe instrument 1001, lunar impact response tests under different slow release speeds, contact status and response transmission tests between the probe instrument 1001 and the simulated planetary soil 3101 under different slow release speeds, different lunar landing tilt angles 2100°, and different angles β between the probe landing surfaces 2002 and the lunar surface, and various combined working condition tests such as slow release speed tests of the separation device 003 and the slow release component 004 under different working conditions under the actual lunar landing separation state.

[0052] Therefore, this application provides a ground test device for a detection instrument to complete verification tests under simulated microgravity, high and low temperature and vacuum combined conditions. The test device has two states: the electrical simulation state of the slow-release component and the real slow-release component state.

[0053] like Figure 3 and Figure 4As shown, this is an electrical simulation of the slow-release component. The experimental device may include a planetary surface tilt simulation component 3100, a first altitude adjustment component 3210 and a second altitude adjustment component 3220, a detector tilt angle simulation component 3300, a slow-release device electrical simulation component 3310, a first retraction angle control component 3320 and a second retraction angle control component 3330, and a first camera 3501 and a second camera 3502.

[0054] The first height adjustment component 3210 and the second height adjustment component 3220 can be devices that can achieve linear motion, such as lead screws, gear racks, or linear motors.

[0055] The detector tilt angle simulation component 3300 can be a circular, rectangular, or other elongated plate-like structure. The first retraction angle control component 3320 and the second retraction angle control component 3330 can be installed below the detector tilt angle simulation component 3300. Simultaneously, the first and second retraction angle control components 3320 and 3330 can move along the controlled angle control component motion trajectory 3303 at the bottom of the detector tilt angle simulation component 3300. The angle control component motion trajectory 3303 is a circular trajectory with the release device electrical simulation component 3310 as the center and the distance from the release device electrical simulation component 3310 to the first or second retraction angle control component 3320 as the radius. Furthermore, a first retraction angle control rope 3321, controlled by a motor, can be located below the first retraction angle control component 3320, and a second retraction angle control rope 3331, also controlled by a motor, can be located below the second retraction angle control component 3330. The first and second convergence angle control ropes 3321 and 3331 are connected to the two ends of the detection instrument 1001, which can suspend the detection instrument 1001 below the detector tilt angle simulation component 3300.

[0056] The planetary surface tilt simulation component 3100 can contain simulated planetary soil 3101, and a vibration signal generator 005 can be installed at the bottom. At the same time, the tilt angle of the planetary surface tilt simulation component 3100 can be adjusted around the planetary surface tilt angle adjustment axis 3102 at the bottom, which is parallel to the planetary horizontal plane 2001. The planetary surface tilt simulation component 3100 can also rotate around the planetary horizontal plane normal rotation axis 3103.

[0057] When the first height adjustment component 3210 is a lead screw and nut transmission structure, it may include a first nut 3211 and a first lead screw 3212. Rotation of the first nut 3211 causes the first lead screw 3212 to move linearly up and down, thereby adjusting the height of the first height adjustment component 3210. When the second height adjustment component 3220 is a lead screw and nut transmission structure, it may include a second nut 3221 and a second lead screw 3222. Rotation of the second nut 3221 causes the second lead screw 3222 to move linearly up and down, thereby adjusting the height of the second height adjustment component 3220.

[0058] The first lead screw 3212 and the detector tilt angle simulation component 3300 can be movably connected through the first rotating shaft 3301. The second lead screw 3222 and the slider 3304 can be movably connected through the second rotating shaft 3302. The second rotating shaft 3302 and the detector tilt angle simulation component 3300 can be movably connected through the slider 3304. When the heights of the first height adjustment component 3210 and the second height adjustment component 3220 are different, the slider 3304 can slide along the line connecting the first rotating shaft 3301 and the second rotating shaft 3302, thereby adjusting the tilt of the detector tilt angle simulation component 3300.

[0059] like Figure 5 As shown, this represents the actual state of the slow-release component. Unlike the electrical simulation state, the slow-release component 004 is a component capable of ultimately and realistically achieving lunar surface slow-release functionality. The slow-release component 004 is designed for the 1 / 6 microgravity conditions on the lunar surface and cannot withstand the gravity load of the probe instrument 1001 in ground tests. This application provides a counterweight component 3400 including a microgravity counterweight 3401, a counterweight rope 3402, a first pulley 3411, and a second pulley 3412. During the slow descent of the probe instrument 1001, the counterweight rope 3402 can drive the gravity counterweight 3401 to move along the first pulley 3411 and the second pulley 3412 to counteract 5 / 6 of the gravity of the probe instrument 1001. In other embodiments, the counterweight component 3400 can also be other systems that can generate an upward force to counteract gravity on the probe instrument 1001, such as a hydrogen balloon.

[0060] The first camera 3501 and the second camera 3502 can be located on opposite sides of the experimental device to record the entire experimental process.

[0061] The following are several adjustment modes of this experimental setup:

[0062] Mode 1: Slow-release height adjustment mode;

[0063] like Figure 3As shown, the first height adjustment component 3210 and the second height adjustment component 3220 can be adjusted simultaneously by the same amount to achieve the overall height adjustment of the detector tilt angle simulation component 3300.

[0064] Mode 2: Lunar landing tilt angle adjustment mode of 2100 degrees;

[0065] like Figure 3 As shown, the first altitude adjustment component 3210 and the second altitude adjustment component 3220 can be adjusted simultaneously by different amounts, so that the probe tilt angle simulation component 3300 tilts, thereby obtaining the probe landing lunar surface tilt angle 2100 that meets the requirements.

[0066] Mode 3: Lunar seismometer mode for adjusting lunar tilt angle to 220°.

[0067] The planetary surface tilt simulation component 3100 can be rotated via the bottom planetary surface tilt adjustment axis 3102 to adjust the seismometer's released lunar surface tilt angle 2200. It can also be rotated around the planetary horizontal plane normal rotation axis 3103 to achieve 360-degree circular adjustment. This allows for a combination mode of arbitrary angles between the probe's landing lunar surface tilt angle 2100 and the seismometer's released lunar surface tilt angle 2200.

[0068] The following are some typical test states of this test apparatus:

[0069] State 1: Component thermal vacuum simulation test;

[0070] This experiment is used to verify the deployment resistance of the umbilical cable 1002, the consistency of the deployment shape of the umbilical cable 1002, the satisfaction of the expected rotation angle of the probe instrument 1001 after slow release and landing on the moon, and the contact state and signal transmission characteristics between the probe instrument 1001 and the simulated planetary soil 3101 under high and low temperature and vacuum conditions.

[0071] In this state, without verifying the performance of the slow-release device 004, the controllable speed slow-release of the probe instrument 1001 is achieved using the slow-release device electrical simulation component 3310. Initially, the device can be pre-adjusted to a parameter condition of Mode 1, Mode 2, or Mode 3. Simultaneously, the conditions of the high and low temperature vacuum environment test equipment 002 are set to a lunar surface vacuum state, with the temperature set within the expected temperature range for the probe instrument 1001 when it lands on the moon. This is used to develop the performance of each component of the probe instrument 1001 under various mode conditions.

[0072] Because the umbilical cable 1002 has a thermally controlled coating and is relatively rigid, its rigidity will increase further in the low-temperature environment of the lunar surface. Therefore, the coiled umbilical cable acts as a resistance during the slow release process of the detection instrument 1001, causing the seismometer to rotate. Figure 4As shown, during the slow release, the first retraction angle control component 3320 and the second retraction angle control component 3330 set the first retraction angle control rope 3321 and the second retraction angle control rope 3331 to a slack state. During the descent, the first retraction angle control component 3320 and the second retraction angle control component 3330 automatically follow the rotation of the probe 1001. Therefore, during the slow release, the probe 1001 is released by the slow release device electrical simulation component 3310, and the spin of the probe 1001 during the release process is only affected by the umbilical cable 1002 and the slow release rope 311 of the electrical simulation component, which is consistent with the actual slow release state on the lunar surface.

[0073] During the slow release process, a tensile testing device is installed inside the electrical simulation component 3310 of the slow release device, which can measure the tensile force borne by the slow release rope 311 of the electrical simulation component. Based on this data, the resistance of the umbilical cable 1002 during the slow release process can be tested.

[0074] After the probe 1001 completes one slow release, the bottom of the probe 1001 comes into contact with the simulated planetary soil 3101, and the first camera 3501 and the second camera 3502 take pictures and videos to record the deployment shape of the probe 1001 and its rotation angle after landing on the moon.

[0075] Detection instrument 1001 is a detection device used to measure lunar seismicity. It contains a vibration signal receiving component, and after slow release, the vibration signal generator 005 emits a vibration signal. Detection instrument 1001 collects the response signal, which serves as the basis for subsequent signal transmission characteristic analysis and contact state evaluation. The vibration signal generator 005 simulates vibration signals inside a celestial body, such as lunar seismicity. Ground tests verify the signal transmission characteristics, confirming whether the contact meets the equipment's development expectations, and also serving as a ground calibration method.

[0076] After the test is completed, the umbilical cable 1002 is retracted, which is to re-establish the state of the test device.

[0077] During the coiling process of the umbilical cable 1002, the slow-release device electrical simulation component 3310, the first coiling angle control component 3320, and the second coiling angle control component 3330 work together to control the electrical simulation component slow-release rope 311, the first coiling angle control rope 3321, and the second coiling angle control rope 3331. First, the detection instrument 1001 is adjusted to a horizontal state. Then, the first coiling angle control component 3320 and the second coiling angle control component 3330 move in opposite directions along the movement trajectory 3303 of the coiling angle control component according to the program control. The slow-release device electrical simulation component 3310, the first coiling angle control component 3321, and the second coiling angle control component 3330 synchronously coil the electrical simulation component slow-release rope 311, the first coiling angle control rope 3321, and the second coiling angle control rope 3331 to coil the umbilical cable 1002 to the initial state.

[0078] At this point, according to the experimental setup, the device can be adjusted to another parameter condition under Mode 1, Mode 2, or Mode 3. Alternatively, conditions such as temperature and vacuum can be adjusted, followed by a second sustained-release experiment. This process can be repeated to complete multiple experimental verifications under different mode conditions.

[0079] During the experiment, the verification test with multiple state settings can be completed without opening the high and low temperature vacuum environment test equipment 002, which improves the test efficiency and greatly reduces the test cost.

[0080] State 2: Separation and sustained-release test of detector 1001 in actual state;

[0081] In this state, the separation device 003 is a real component, which can be a pyrotechnic device or an electrically driven shape memory alloy separation device, and the slow-release component 004 is a real component with a slow-release function.

[0082] Initially, the probe 1001 is pressed against the bottom surface of the probe tilt angle simulation component 3300 by the separation device 003, and the slow-release component 004 tightens the slow-release rope 1004. The high and low temperature vacuum environment test equipment 002 is set to the lunar surface vacuum state, and the temperature is set within the expected temperature range when the probe 1001 lands on the moon.

[0083] When the release begins, the separation device 003, controlled by an electrical signal, performs an action, and the detection instrument 1001 separates from the detector tilt angle simulation component 3300. After separation, the detection instrument 1001 completes the slow release under the combined action of the slow release component 004 and the counterweight component 3400.

[0084] After the slow release is completed, the bottom of the probe 1001 contacts the simulated planetary soil 3101. The first camera 3501 and the second camera 3502 take pictures and videos, recording the deployment state of the probe 1001 and its rotation angle after landing on the moon. Then, the vibration signal generator 005 emits a vibration signal, and the probe 1001 collects the response signal, which serves as the basis for subsequent signal transmission characteristic analysis and contact state evaluation. The separation and slow release test of the probe 1001 in its actual state is completed. In other embodiments, the slow release rope 1004 can also be replaced by the electrical simulation component slow release rope 311 for the test, and the slow release component 004 can also be replaced by the electrical simulation component 3310 of the slow release device for the test.

[0085] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of this application and are not intended to limit it. Although this application has been described in detail with reference to the embodiments, those skilled in the art should understand that modifications or equivalent substitutions to the technical solutions of this application do not depart from the spirit and scope of the technical solutions of this application, and should all be covered within the scope of the claims of this application.

Claims

1. A ground-based test device for a detection instrument under simulated microgravity, high and low temperature, and vacuum combined conditions, characterized in that, The device includes: High and low temperature vacuum environment testing equipment (002) is used to control the temperature and vacuum state of the environment in which the device is located; The detector tilt angle simulation component (3300) is a plate-like structure used to simulate the bottom of the detector; The slow-release device electrical simulation component (3310) is fixed in the middle of the detector tilt angle simulation component (3300); One end of the slow-release rope (311) of the electrical simulation component is fixedly connected to the electrical simulation component (3310) of the slow-release device; The detection instrument (1001) is suspended below the electrical simulation component (3310) of the electrical simulation device by the slow-release rope (311) of the electrical simulation component; The umbilical cable (1002) is fixedly connected at one end to the detection instrument (1001) and at the other end to the detector tilt angle simulation component (3300); The probe tilt angle adjustment component is used to adjust the angle between the probe tilt angle simulation component (3300) and the horizontal plane; and the planetary surface tilt simulation component (3100) is located below the probe instrument (1001) and is used to simulate the planetary surface environment. The device further includes: A counterweight assembly is used to counteract part of the weight of the detection instrument (1001); The counterweight assembly includes: Two fixed pulleys are fixed above the device; The counterweight (3401) has a weight that is the weight that the detection instrument (1001) needs to reduce; The counterweight rope (3402) passes through two fixed pulleys, with one end connected to the upper part of the detection instrument (1001) and the other end connected to the counterweight block (3401).

2. The ground test device for simulating microgravity, high and low temperature and vacuum combined conditions for detection instruments according to claim 1, characterized in that, The detector tilt angle adjustment assembly is a lead screw, gear rack, or linear motor.

3. The ground test device for simulating microgravity, high and low temperature and vacuum combined conditions for detection instruments according to claim 1, characterized in that, The device further includes: The first rotating shaft (3301) is installed at one end of the detector tilt angle simulation component (3300) and is movably connected to the detector tilt angle simulation component (3300) and the detector tilt angle adjustment component, allowing the detector tilt angle adjustment component to drive one end of the detector tilt angle adjustment component to move up and down. A slider (3304) is installed at one end of the detector tilt angle simulation component (3300) away from the first rotation axis (3301) and is movably connected to the detector tilt angle simulation component (3300), allowing the slider (3304) to move toward or away from the first rotation axis (3301); The second rotating shaft (3302) is movably connected to the slider (3304) and the detector tilt angle adjustment component, allowing the detector tilt angle adjustment component to drive the slider (3304) and the end of the detector tilt angle simulation component (3300) connected to the slider (3304) to move up and down.

4. The ground test device for simulating microgravity, high and low temperature and vacuum combined conditions for detection instruments according to claim 1, characterized in that, The device further includes: The first convergence angle control component (3320) is movably connected to the detector tilt angle simulation component (3300) below the detector tilt angle simulation component (3300); The first gathering angle control rope (3321) has one end fixed below the first gathering angle control component (3320) and the other end fixed to one end of the detection instrument (1001); The second convergence angle control component 3330 is movably connected to the detector tilt angle simulation component (3300) below the detector tilt angle simulation component (3300); The second gathering angle control rope (3331) has one end fixed below the second gathering angle control component 3330, and the other end fixed to the end of the detection instrument (1001) opposite to the position of the first gathering angle control rope (3321); The distance from the first retraction angle control component (3320) to the sustained-release device electrical simulation component (3310) is equal to the distance from the second retraction angle control component 3330 to the sustained-release device electrical simulation component (3310). The first retraction angle control component (3320) and the second retraction angle control component 3330 have a drive system inside, which can move along a circle with the slow-release device electrical simulation component (3310) as the center and the distance from the first retraction angle control component (3320) to the slow-release device electrical simulation component (3310) as the radius at the bottom of the detector tilt angle simulation component (3300).

5. The ground test device for simulating microgravity, high and low temperature and vacuum combined conditions for detection instruments according to claim 1, characterized in that, The upper part of the planetary surface tilt simulation component (3100) is simulated planetary soil (3101). The planetary surface tilt simulation component (3100) can rotate around the horizontal and vertical directions to adjust the angle and tilt direction of the upper surface of the simulated planetary soil (3101) relative to the horizontal plane.

6. The ground test device for simulating microgravity, high and low temperature and vacuum combined conditions for detection instruments according to claim 1, characterized in that, The device further includes: The first camera (3501) and the second camera (3502) are located inside the high and low temperature vacuum environment test equipment (002), on opposite sides of the device, and are used to photograph and record the test process.

7. The ground test device for simulating microgravity, high and low temperature and vacuum combined conditions for detection instruments according to claim 1, characterized in that, The device further includes: A vibration signal generator (005) is fixed to the bottom of the planetary surface tilt simulation component (3100) for simulating planetary earthquakes; The detection instrument (1001) has a vibration signal receiving component inside.

8. The ground test device for simulating microgravity, high and low temperature and vacuum combined conditions for detection instruments according to claim 1, characterized in that, The electro-simulation component (3310) of the slow-release device is equipped with a tensile testing device for measuring the tensile force borne by the slow-release rope (311) of the electro-simulation component.

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