Ceramic chip defect detection jig

Abstract

The invention discloses a ceramic chip defect detection jig. The ceramic chip defect detection jig comprises an upper jig and a lower jig, the lower jig comprises a lower jig bearing substrate made of an insulating material, and the upper surface of the lower jig bearing substrate is provided with a plurality of placing areas which are regular in shape and are used for placing ceramic chips to be detected; the upper jig comprises an upper jig bearing substrate made of an insulating material, and a plurality of test areas with regular shapes are arranged on the lower surface of the upper jig bearing substrate; a plurality of electrical connection points are distributed in each placement area and each test area, and the ceramic chip defect detection jig is provided with conductive interfaces connected with the electrical connection points, so that external detection equipment can be connected with the electrical connection points through the conductive interfaces, and signal transmission is realized; through the electrical connection points, external detection equipment can obtain related electrical signal data of the ceramic chip in a detection process in real time, so that an accurate data basis is provided for judging whether the ceramic chip has defects or not. The ceramic chip is protected and the detection precision is high.

Description

Technical Field

[0001] This invention relates to the technical field of DCB substrate ceramic tile production and testing equipment, specifically to a ceramic tile defect detection fixture. Background Technology

[0002] During the manufacturing process of ceramic tiles, defects such as cracks, bubbles, and embedded impurities may appear on the surface and inside the tiles. These defects can seriously affect the quality and performance of the tiles. Currently available ceramic tile inspection fixtures are either too complex and costly, or lack sufficient accuracy, failing to meet the needs of manufacturers for efficient and accurate defect detection. Therefore, developing a ceramic tile defect inspection fixture that is simple in structure, low in cost, and highly accurate is of significant practical importance. Summary of the Invention

[0003] To address the problems existing in the prior art, this invention provides a ceramic tile defect detection fixture that is simple in structure, low in cost, highly efficient in detection, protects the ceramic tile, and has high detection accuracy.

[0004] The technical solution of the present invention is: a ceramic tile defect detection fixture, comprising an upper fixture and a lower fixture;

[0005] The lower fixture includes a lower fixture support substrate made of insulating material. The upper surface of the lower fixture support substrate is provided with a plurality of regularly shaped placement areas for placing ceramic pieces to be tested. Each placement area is provided with a detachable lower fixture base plate made of conductive material. The upper surface of the detachable lower fixture base plate is provided with a lower fixture buffer conductive pad made of conductive material.

[0006] The upper fixture includes an upper fixture support base made of insulating material. The lower surface of the upper fixture support base has multiple regularly shaped test areas, the size and position of which correspond one-to-one with multiple placement areas on the lower fixture support base. Each test area has a detachable upper fixture base plate made of conductive material, and the lower surface of the detachable upper fixture base plate has a conductive upper fixture buffer pad made of conductive material. The upper surface of the detachable upper fixture base plate is fixed to the lower surface of a spring base plate. The upper surface of the spring base plate and the inner surface of the test area are connected by a spring. The spring base plate can float within a certain range to further prevent damage to the ceramic piece when the upper and lower fixtures are pressed together, and also to ensure full contact between the upper and lower fixtures and the ceramic piece during pressing.

[0007] Multiple electrical connection points are distributed in each placement area and each test area. The ceramic tile defect detection fixture is equipped with conductive interfaces to connect to the electrical connection points, ensuring that external testing equipment can connect to the electrical connection points through the conductive interfaces to realize signal transmission. Through the electrical connection points, the external testing equipment can acquire relevant electrical signal data of the ceramic tile in real time during the testing process, such as changes in parameters such as resistance and capacitance, thereby providing accurate data basis for judging whether there are defects in the ceramic tile.

[0008] Furthermore, the placement areas are arranged in a predetermined layout on the lower fixture support plate, and each placement area is marked with a number, such as "U1", "U2", "U3", "U4", etc., to facilitate operators in accurately placing and identifying ceramic pieces and achieving precise positioning of the ceramic pieces.

[0009] Furthermore, a positioning pin is provided at the center of the upper surface of the spring base plate, and the top of the positioning pin is inserted into the center of the surface within the test area. This allows the spring base plate to be radially positioned and axially movable.

[0010] Furthermore, the upper and lower fixtures are green; the lower fixture's buffer conductive pad and the upper fixture's buffer conductive pad are gray.

[0011] The beneficial effects of this invention are: it provides a ceramic tile defect detection fixture.

[0012] 1. Simple structure and low cost

[0013] The ceramic tile defect detection fixture of the present invention has a simple overall structure design, and the manufacturing and assembly processes of each component are relatively simple. It does not require complex processing technology and expensive raw materials, which effectively reduces the manufacturing cost of the fixture and is suitable for use by ceramic tile production enterprises of various sizes.

[0014] 2. High detection efficiency

[0015] The substrate has multiple placement areas, which can simultaneously place multiple ceramic tiles to be inspected. The defect detection of multiple ceramic tiles can be completed in one inspection, which greatly improves the inspection efficiency and reduces the inspection time and labor costs.

[0016] 3. Protect the ceramic tiles

[0017] The spring structure of the upper fixture and the buffer pads in the placement area can effectively protect the ceramic tiles, preventing damage to the ceramic tiles due to collision or squeezing during the inspection process, thereby improving the yield of ceramic tiles and reducing ceramic tile loss caused by the inspection process.

[0018] 4. High detection accuracy

[0019] By connecting to external testing equipment through electrical connection points, the electrical signal data of ceramic tiles can be collected in real time and accurately. Combined with advanced detection algorithms and standards, it can accurately determine whether there are defects in the ceramic tiles, with high detection accuracy and reliable results. Attached Figure Description

[0020] Figure 1 This is a cross-sectional view of the ceramic tile defect detection fixture after pressing.

[0021] Figure 2 This is a top view of the lower jig;

[0022] Figure 3 The top view of the fixture.

[0023] In the diagram: 1 is the upper fixture, 2 is the lower fixture, 3 is the lower fixture support base plate, 4 is the upper fixture support base plate, 5 is the lower fixture detachable base plate, 6 is the lower fixture buffer conductive pad, 7 is the upper fixture detachable base plate, 8 is the spring base plate, 9 is the spring, 10 is the positioning pin, 11 is the upper fixture buffer conductive pad, and 12 is the electrical connection point. Detailed Implementation

[0024] The present invention will now be further described with reference to the accompanying drawings.

[0025] like Figure 1 As shown, a ceramic tile defect detection fixture is divided into upper and lower parts. During testing, the ceramic tile is placed between the fixtures, and the upper and lower fixtures are pressed together. High voltage is passed through the fixtures, and the presence of defects in the ceramic tile is determined by the electrical signal.

[0026] in:

[0027] Lower jig 2 as Figure 2 As shown: It is green and made of a high-strength material with good insulation properties. The upper surface of the lower fixture support base plate 3 has multiple regularly shaped placement areas for placing the ceramic tiles to be inspected. The placement areas are arranged in a predetermined layout on the support base plate, and each placement area is marked with a number, such as "U1", "U2", "U3", "U4", etc., to facilitate accurate placement and identification of the ceramic tiles by operators, achieving precise positioning of the tiles. A removable base plate 5 of the lower fixture is provided within the placement area for easy inspection and replacement of the lower fixture's buffer conductive pad 6.

[0028] Upper fixture 1 Figure 3As shown: It is green and made of a high-strength material with good insulation properties. The lower surface of the upper fixture support base plate 4 has multiple regularly shaped test areas. The size and position of these test areas correspond one-to-one with the multiple placement areas on the lower fixture support base plate. It also has a detachable upper fixture base plate 7 and an upper fixture buffer conductive pad 11. The detachable upper fixture base plate 7 is fixed to a spring base plate 8. The upper surface of the spring base plate 8 is connected to the inner surface of the test area by a spring 9. The spring base plate 8 can float within a certain range to further prevent damage to the ceramic sheet when the upper and lower fixtures are pressed together, and also to ensure full contact between the upper and lower fixtures and the ceramic sheet during pressing. A positioning pin 10 is provided at the center of the upper surface of the spring base plate 8, and the top of the positioning pin 10 is inserted into the center of the inner surface of the test area.

[0029] The lower fixture buffer conductive pad 6 and the upper fixture buffer conductive pad 11 are installed in each placement area and test area. They are gray in color and made of a soft and wear-resistant material. The function of the buffer pads is to support the ceramic tile during the testing process, reduce the hard contact between the ceramic tile and the substrate, thereby effectively avoiding damage to the ceramic tile during the testing process, ensuring the integrity of the ceramic tile during the testing process, and the buffer pads can also serve as conductive carriers.

[0030] Electrical connection point 12: Multiple electrical connection points, such as gold-colored ones, are distributed on the substrate. These electrical connection points are electrically connected to external testing equipment, enabling signal transmission. Through these connection points, the external testing equipment can acquire relevant electrical signal data of the ceramic tile in real time during the testing process, such as changes in parameters like resistance and capacitance, thus providing accurate data for determining whether the ceramic tile has defects.

[0031] The accompanying drawings of this patent show multiple angle views of the ceramic tile defect detection fixture, clearly illustrating the layout and relative positions of the supporting substrate, placement area, buffer pad, and support structure. Enlarged views detail the structure and distribution of electrical connection points. A schematic diagram showing the fixture placed inside the detection equipment visually reflects its usage during actual detection. These drawings contribute to a more comprehensive and in-depth understanding of the technical solution of this invention.

[0032] Implementation of the present invention:

[0033] 1. Fixture design and fabrication

[0034] 1) Substrate Fabrication: Select suitable green, high-strength insulating materials and fabricate the substrate according to design dimensions and shape requirements using methods such as injection molding or machining. During fabrication, precisely machine the placement area and the installation positions of electrical connection points to ensure that the dimensional accuracy of each part meets design requirements.

[0035] 2) Electrical installation: Install the electrical connection points accurately on the corresponding positions on the carrier substrate according to the design requirements. The fixture can be equipped with conductive interfaces to connect the electrical connection points, ensuring that external testing equipment can be connected to the electrical connection points through the conductive interfaces.

[0036] 3) Installation of cushioning pads: The prepared gray cushioning pads are accurately fixed to the removable base plate in each placement area according to the shape and size of the placement area by pasting or embedding, ensuring that the cushioning pads fit tightly to the placement area and that the surface is flat.

[0037] 2. Use of fixtures

[0038] 1) Before using this ceramic tile defect detection fixture to inspect ceramic tiles, first perform a visual inspection of the fixture to ensure that all components are undamaged and securely connected. At the same time, calibrate and adjust the external testing equipment to ensure that the testing equipment is operating normally and the parameters are set accurately.

[0039] 2) Place the ceramic pieces to be tested accurately in the corresponding placement areas according to the placement area number, ensuring that the ceramic pieces are in full contact with the buffer pad and that the position is correct.

[0040] 3) Reliably connect the conductive interface on the fixture to the external testing equipment to ensure stable signal transmission.

[0041] 4) Place the fixture in the matching testing equipment and start the testing program according to the operating procedures of the testing equipment to detect defects in the ceramic tiles. During the testing process, the operator should closely monitor the operating status of the testing equipment and changes in the testing data, and handle any abnormalities promptly.

[0042] The above description is only a preferred embodiment of the present invention. It should be noted that for those skilled in the art, several improvements and modifications can be made without departing from the principle of the present invention, and these improvements and modifications should also be considered within the scope of protection of the present invention.

Claims

1. A ceramic tile defect detection fixture, characterized in that: Including upper fixture (1) and lower fixture (2); The lower fixture (2) includes a lower fixture support substrate (3) made of insulating material. The upper surface of the lower fixture support substrate (3) is provided with a plurality of regularly shaped placement areas for placing ceramic pieces to be tested. Each placement area is provided with a lower fixture detachable base plate (5) made of conductive material. The upper surface of the lower fixture detachable base plate (5) is provided with a lower fixture buffer conductive pad (6) made of conductive material. The upper fixture (1) includes an upper fixture support base plate (4) made of insulating material. The lower surface of the upper fixture support base plate (4) is provided with multiple regularly shaped test areas. The size and position of the test areas correspond one-to-one with the multiple placement areas on the lower fixture support base plate (3). Each test area is provided with a detachable upper fixture base plate (7) made of conductive material. The lower surface of the detachable upper fixture base plate (7) is provided with an upper fixture buffer conductive pad (11) made of conductive material. The upper surface of the detachable upper fixture base plate (7) is fixed to the lower surface of the spring base plate (8). The upper surface of the spring base plate (8) is connected to the inner surface of the test area by a spring (9). The spring base plate (8) can float within a certain range to further avoid damage to the ceramic piece when the upper fixture (1) and the lower fixture (2) are pressed together. It also ensures that the upper fixture (1) and the lower fixture (2) are in full contact with the ceramic piece when pressed together. Multiple electrical connection points (12) are distributed in each placement area and each test area. The ceramic tile defect detection fixture is equipped with conductive interfaces to connect to the electrical connection points, ensuring that external detection equipment can connect to the electrical connection points through the conductive interfaces to realize signal transmission. Through the electrical connection points, the external detection equipment can obtain relevant electrical signal data of the ceramic tile in real time during the detection process, thereby providing accurate data basis for judging whether the ceramic tile has defects.

2. The ceramic tile defect detection fixture according to claim 1, characterized in that: The placement areas are arranged in a set layout on the lower fixture support base plate (3), and each placement area is marked with a number.

3. The ceramic tile defect detection fixture according to claim 1, characterized in that: A positioning pin (10) is provided at the center of the upper surface of the spring base plate (8), and the top of the positioning pin (10) is inserted into the center of the surface of the test area.

4. A ceramic tile defect detection fixture according to claim 1, characterized in that: The upper fixture (1) and lower fixture (2) are green; the lower fixture buffer conductive pad (6) and upper fixture buffer conductive pad (11) are gray.

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