Tunnel type high-temperature aging equipment for testing electronic products

Abstract

The invention discloses tunnel type high-temperature aging equipment for testing electronic products, and relates to the technical field of aging testing, the equipment comprises an aging assembly, and a heating assembly, a shunting assembly, a moving assembly and a material loading assembly are arranged in a tunnel bin of the equipment. The material carrying assembly comprises a bearing plate, a clamping assembly and a shielding assembly, and fixing and local protection of the electronic product can be achieved. Through the synergistic effect of the indicating block, the clamping assembly and the interval adjusting assembly, the moving assembly drives the electronic product to reciprocate in the tunnel bin and can be paused in a designated area, and the heating assembly continuously heats the area. Differential temperature control of different areas of the same electronic product is achieved, the method is particularly suitable for precise aging testing of high-heat-demand areas such as chips and sensitive areas such as light sensing components, the testing accuracy, the equipment universality and the heat energy utilization efficiency are remarkably improved, and the method has good application prospects.

Description

Technical Field

[0001] This invention relates to the field of aging testing technology, specifically a tunnel-type high-temperature aging device for testing electronic products. Background Technology

[0002] With the rapid development of electronic product manufacturing technology, electronic products must undergo rigorous aging tests before leaving the factory to ensure their long-term stability and reliability. High-temperature aging testing is a crucial part of this process, accelerating the aging of electronic components by simulating high-temperature environments and exposing potential defects in advance.

[0003] Currently, most common high-temperature aging equipment is a box-type structure that uses a uniform temperature heating method to heat electronic products for a uniform duration. However, in reality, the maximum temperature for aging tests varies in different areas of the same electronic product (such as chips and photosensitive components). Such equipment cannot flexibly adjust the heating time according to the different temperature requirements of different areas of the electronic product during the heating aging test. Using a uniform test temperature and duration leads to insufficient test accuracy and unreliable test results.

[0004] Therefore, there is an urgent need for a high-temperature aging device that can achieve zoned temperature control, precise aging, and flexible operation to meet the diverse and high-precision testing needs of modern electronic products. Summary of the Invention

[0005] This invention provides a tunnel-type high-temperature aging device for testing electronic products, which solves the problem that traditional aging test equipment in the prior art cannot flexibly adjust the heating time according to the different test temperature requirements of different areas of electronic products, resulting in insufficient test accuracy and unconvincing test results.

[0006] To achieve the above objectives, the present invention provides the following technical solution: A tunnel-type high-temperature aging device for testing electronic products includes an aging component. The aging component includes a tunnel chamber, a heating component mounted on the tunnel chamber, and a flow-diverting component at the outlet of the heating component. A moving component is located inside the tunnel chamber, and a material-carrying component is mounted on the moving component. The material-carrying component and the flow-diverting component are correspondingly arranged. The material-carrying component includes a support plate, clamping components on both sides of the support plate, and a shielding component movably mounted on the clamping components. Side beams are fixedly connected to both sides of the support plate, and indicator blocks are movably mounted on the side beams. A drive rod slides through the indicator block and is connected to the moving component. A positioning component is mounted on the indicator block, and interval adjustment components are located on both sides of the positioning component. The moving component moves the electronic product via the indicator block on the drive rod, and adjusts the heating time of different areas of the electronic product by the heating component in conjunction with the positioning component. The device achieves differentiated temperature control for different areas of the same electronic product, and is particularly suitable for precise aging testing of high-heat-demand areas such as chips and sensitive areas such as photosensitive components, significantly improving testing accuracy, equipment versatility, and thermal energy utilization efficiency.

[0007] As a preferred embodiment of the present invention, the heating assembly includes a heating box fixedly installed on the tunnel chamber, a diversion cylinder fixedly connected to one side of the inner wall of the tunnel chamber, and an air outlet pipe provided at the air outlet end of the diversion cylinder.

[0008] As a preferred embodiment of the present invention, the diversion assembly includes a mounting rod, an induced draft fan is fixedly connected to the mounting rod, a fixing column is fixedly connected to the bottom of the mounting rod on both sides of the induced draft fan, a transmission block is fixedly connected to the bottom of the fixing column, and the air inlet end of the induced draft fan is connected to the air outlet pipe of the diversion cylinder.

[0009] As a preferred embodiment of the present invention, the moving component includes a mounting plate, a dual-axis motor is fixedly connected to the bottom of the mounting plate, a moving wheel is fixedly connected to the end of the output shaft of the dual-axis motor, a bearing rod is fixedly connected to one side of the mounting plate, a mounting beam is fixedly connected to the side wall of the bearing rod, and the mounting beam is fixedly connected to the drive rod.

[0010] As a preferred embodiment of the present invention, the clamping assembly includes a clamping column fixedly disposed on a positioning rod, a clamping column slidably disposed on the positioning rod, a fixing beam fixedly connected to the end of the clamping column, a clamping plate fixedly connected to one side of the fixing beam, and an elastic telescopic member sleeved on the clamping column between the clamping plate and the positioning rod.

[0011] As a preferred embodiment of the present invention, the shielding component includes a movable rod slidably disposed on a fixed beam, a movable sleeve slidably sleeved on the movable rod, mounting ears fixedly connected to both sides of the movable sleeve, a movable column slidably passing through the mounting ears, a shielding cover fixedly connected to the bottom of the movable column, a lifting rod fixedly connected to the top of the movable column, a threaded column threaded through the lifting rod, and the bottom of the threaded column rotatably connected to the movable sleeve.

[0012] As a preferred embodiment of the present invention, the positioning assembly includes a fixed cylinder fixedly disposed on the indicator block, a piston column slidably passing through the top wall of the fixed cylinder, a reset member sleeved on the piston column, a lifting column slidably passing through the bottom wall of the fixed cylinder, the lifting column extending into the indicator block and having a clamping block fixedly connected to its bottom, the clamping block corresponding to the drive rod.

[0013] As a preferred embodiment of the present invention, a rotating rod is rotatably connected inside the fixed cylinder, and transmission rods are rotatably connected to both ends of the rotating rod. The transmission rods on both sides of the rotating rod are hinged to the lifting column and the piston column, respectively. Fixed seats are fixedly connected to both sides of the bottom of the bearing plate, and an adjusting rod is rotatably connected between the fixed seats. An adjusting beam is threaded onto the adjusting rod, and both ends of the adjusting beam pass through the side beam and are fixedly connected to the bottom of the indicator block.

[0014] As a preferred embodiment of the present invention, the interval adjustment component includes limiting blocks slidably disposed on both sides of the drive rod, with a lead screw threaded through the limiting blocks, and the two ends of the lead screw being fixedly connected to the mounting beam.

[0015] As a preferred embodiment of the present invention, the tunnel chamber is rotatably connected to shielding plates at both ends, the tunnel chamber is rotatably connected to hydraulic telescopic columns on its sidewalls, the telescopic ends of the hydraulic telescopic columns are hinged to the shielding plates, and the bottom of the tunnel chamber is fixedly connected to a track rod.

[0016] The present invention has the following advantages: by setting up an aging component including a tunnel chamber, a heating component, a diversion component, a moving component, a material loading component, a clamping component, a shielding component, a positioning component, and a range adjustment component, the function of differential high-temperature aging of different areas of electronic products is realized; through the synergistic effect of the indicator block and the positioning component, differential heating control of different areas of electronic products (such as chips and photosensitive components) is realized, solving the problems of poor temperature uniformity and low testing accuracy of traditional equipment.

[0017] Performance Enhancement: The shielding component provides localized protection for sensitive areas such as light sensors, preventing high-temperature damage, while ensuring sufficient heating for heat-demanding areas like chips, significantly improving the accuracy of aging tests and product reliability. High Operational Flexibility and Automation: The adjustable levers and beams allow for flexible adjustment of the indicator block position, adapting to electronic products of different sizes and structures, enhancing the equipment's versatility and automation level.

[0018] High thermal energy utilization efficiency: By using zoned temperature control and directional air supply, ineffective heating areas are reduced, energy consumption is lowered, and this aligns with the development trend of green manufacturing. Attached Figure Description

[0019] Figure 1 A schematic diagram of the structure of a tunnel-type high-temperature aging device for testing electronic products. Figure 1 .

[0020] Figure 2 A schematic diagram of the structure of a tunnel-type high-temperature aging device for testing electronic products. Figure 2 .

[0021] Figure 3 This is a side view of a tunnel-type high-temperature aging device for testing electronic products.

[0022] Figure 4 This is a partial structural diagram of a tunnel-type high-temperature aging device for testing electronic products.

[0023] Figure 5 This is a schematic diagram of the heating chamber in a tunnel-type high-temperature aging device for testing electronic products.

[0024] Figure 6 This is a schematic diagram of the structure of a moving component in a tunnel-type high-temperature aging device for testing electronic products.

[0025] Figure 7 This is a schematic diagram of the material-carrying component in a tunnel-type high-temperature aging device for testing electronic products.

[0026] Figure 8 This is a partial structural diagram of the material-carrying component in a tunnel-type high-temperature aging device for testing electronic products.

[0027] Figure 9 This is a schematic diagram of the shielding component in a tunnel-type high-temperature aging device for testing electronic products.

[0028] Figure 10 This is a bottom view of the material-carrying component in a tunnel-type high-temperature aging device for testing electronic products.

[0029] Figure 11 This is a schematic diagram of the internal structure of the fixed cylinder in a tunnel-type high-temperature aging device for testing electronic products.

[0030] In the diagram: 1. Aging component; 101. Tunnel chamber; 102. Hydraulic telescopic column; 103. Baffle plate; 104. Heating box; 105. Track rod; 106. Diverter cylinder; 107. Transmission block; 108. Exhaust fan; 109. Mounting rod; 110. Fixed column; 2. Moving component; 201. Mounting plate; 202. Dual-axis motor; 203. Moving wheel; 204. Bearing rod; 205. Mounting beam; 3. Loading component; 301. Bearing plate; 302. Side beam; 303. Drive rod; 304. Screw; 305. Limiting block; 306. Bearing sleeve; 307. Indicator block; 308. Clamping plate; 309. Positioning rod; 310. Fixed beam; 311. Elastic telescopic component; 312. Clamping column; 313. Fixed cylinder; 314. Adjusting beam; 315. Adjusting rod; 316. Fixed seat; 317. Piston column; 318. Reset component; 319. Rotating rod; 320. Transmission rod; 321. Lifting column; 322. Clamping block; 4. Covering assembly; 401. Moving rod; 402. Movable sleeve; 403. Threaded column; 404. Lifting rod; 405. Movable column; 406. Cover; 407. Mounting ear. Detailed Implementation

[0031] The preferred embodiments of the present invention will be described below with reference to the accompanying drawings. It should be understood that the preferred embodiments described herein are for illustration and explanation only and are not intended to limit the present invention.

[0032] Please see Figures 1-11 As an embodiment of the present invention, a tunnel-type high-temperature aging device for testing electronic products includes an aging component 1. The aging component 1 includes a tunnel chamber 101, a heating component is disposed on the tunnel chamber 101, and a flow-diverting component is disposed at the outlet end of the heating component. A moving component 2 is disposed inside the tunnel chamber 101, and a material-carrying component 3 is disposed on the moving component 2. The material-carrying component 3 is disposed correspondingly to the flow-diverting component. The material-carrying component 3 includes a support plate 301, clamping components are disposed on both sides of the support plate 301, and a shielding component 4 is movably disposed on the clamping components. Side beams 302 are fixedly connected to both sides of the support plate 301, and the side walls of the side beams 302 are fixedly connected to... The carrier sleeve 306 has an indicator block 307 movably mounted on the side beam 302. A drive rod 303 is slidably inserted through the indicator block 307, and both ends of the drive rod 303 are slidably connected to the carrier sleeve 306. The drive block is connected to the moving component 2. A positioning component is mounted on the indicator block 307, and interval adjustment components are mounted on both sides of the positioning component. The moving component 2 moves the electronic product through the indicator block 307 on the drive rod 303, and adjusts the heating time of different areas of the electronic product by the heating component in conjunction with the positioning component. The material loading component 3 includes a carrier plate 301, a clamping component, and a shielding component 4, which can realize the fixation and partial protection of the electronic product.

[0033] Through the coordinated action of the indicator block 307, the positioning component, and the interval adjustment component, the moving component 2 drives the electronic product to move back and forth within the tunnel chamber 101, and can pause in a designated area to allow the heating component to continuously heat that area; this achieves differentiated temperature control for different areas of the same electronic product, and is especially suitable for precise aging tests of high-heat-demand areas such as chips and sensitive areas such as photosensitive components, significantly improving test accuracy, equipment versatility, and thermal energy utilization efficiency.

[0034] Please see Figures 1-4 In another embodiment of the present invention, the heating assembly includes a heating box 104 fixedly mounted on the tunnel chamber 101. A diversion cylinder 106 is fixedly connected to one side of the inner wall of the tunnel chamber 101, and an outlet pipe is provided at the outlet end of the diversion cylinder 106. Centralized heating ensures stable temperature: the independent heating box 104 design ensures concentrated heat source and stable temperature. The structure is reasonable and easy to arrange: the diversion cylinder 106 is fixed to the inner wall of the tunnel chamber 101, resulting in a compact layout that does not occupy product transportation space, making the internal structure of the equipment more reasonable and the airflow organization more orderly.

[0035] See Figures 1-5 The diversion assembly includes a mounting rod 109, on which an exhaust fan 108 is fixedly connected. Fixing columns 110 are fixedly connected to the bottom of the mounting rods 109 on both sides of the exhaust fan 108. A transmission block 107 is fixedly connected to the bottom of the fixing columns 110. The air inlet of the exhaust fan 108 is connected to the air outlet pipe of the diversion cylinder 106. The exhaust fan 108 forces airflow, breaking the speed limitation of natural heat convection, and can quickly deliver hot air to the product surface, improving heat exchange efficiency and shortening the testing cycle. Integrated triggering function: The transmission block 107 supporting the exhaust fan 108 cleverly doubles as a triggering mechanism, eliminating the need for additional sensors, simplifying the structure, ensuring reliable triggering, and reducing cost and failure rate.

[0036] See Figure 6 The moving component 2 (see Figure 2 The system includes a mounting plate 201, with a dual-axis motor 202 fixedly connected to the bottom of the mounting plate 201. A moving wheel 203 is fixedly connected to the end of the output shaft of the dual-axis motor 202. A bearing rod 204 is fixedly connected to one side of the mounting plate 201, and a mounting beam 205 is fixedly connected to the side wall of the bearing rod 204. The mounting beam 205 is fixedly connected to the drive rod 303. In actual use, the intermittent forward and reverse rotation of the dual-axis motor 202 can drive the moving wheel 203 to move, thereby driving the material loading assembly 3 above the mounting plate 201 to move back and forth.

[0037] See Figure 7The clamping assembly includes a clamping post 312 slidably passing through a positioning rod 309, a fixing beam 310 fixedly connected to the end of the clamping post 312, and a clamping plate 308 fixedly connected to one side of the fixing beam 310. An elastic telescopic member 311 is sleeved on the clamping post 312 between the clamping plate 308 and the positioning rod 309. It features quick clamping and high versatility: the elastic clamping adapts to electronic products of different sizes and shapes, eliminating the need for cumbersome adjustments and improving operational efficiency. It also protects the product: the flexible clamping force avoids physical damage to the product before testing, making it particularly suitable for consumer electronics products with high appearance requirements.

[0038] See Figures 7-9 The shielding assembly 4 includes a movable rod 401 slidably mounted on a fixed beam 310, a movable sleeve 402 slidably fitted on the movable rod 401, mounting ears 407 fixedly connected to both sides of the movable sleeve 402, a movable column 405 slidably passing through the mounting ears 407, a shielding cover 406 fixedly connected to the bottom of the movable column 405, a lifting rod 404 fixedly connected to the top of the movable column 405, a threaded column 403 threadedly passing through the lifting rod 404, and a rotatable connection between the bottom of the threaded column 403 and the movable sleeve 402. This achieves independent protection for specific small areas on the product, which is one of the key prerequisites for achieving differentiated heating. Flexible adjustment: The two-dimensional horizontal movement and height adjustment functions enable it to adapt to components in different positions on various products, providing extremely high flexibility.

[0039] See Figures 7-11 The positioning assembly includes a fixed cylinder 313 fixedly mounted on the indicator block 307. A piston column 317 is slidably inserted through the top wall of the fixed cylinder 313, and a reset member 318 is sleeved on the piston column 317. A lifting column 321 is slidably inserted through the bottom wall of the fixed cylinder 313. The lifting column 321 extends into the indicator block 307 and is fixedly connected to a clamping block 322 at its bottom. The clamping block 322 corresponds to the drive rod 303. A rotating rod 319 is rotatably connected inside the fixed cylinder 313. Transmission rods 320 are rotatably connected to both ends of the rotating rod 319. The transmission rods 320 on both sides of the rotating rod 319 are hinged to the lifting column 321 and the piston column 317, respectively. Fixed seats 316 are fixedly connected to both sides of the bottom of the bearing plate 301. An adjusting rod 315 is rotatably connected between the fixed seats 316. An adjusting beam 314 is threaded onto the adjusting rod 315. Both ends of the adjusting beam 314 pass through the side beam 302 and are fixedly connected to the bottom of the indicator block 307.

[0040] Utilizing the principle of mechanical levers, the device switches between "clamping" and "releasing" states decisively and responsively, offering greater reliability and durability than electrical controls. A normally closed safety design ensures the device moves normally without external triggering, preventing accidental slippage and guaranteeing high safety. The lever system ensures a strict correspondence between the piston column 317 and the lifting column 321, guaranteeing precise positioning. Fine-tuning positioning allows the operator to precisely adjust the position of the indicator block 307, ensuring the heating area perfectly aligns with the actual chip location, significantly improving testing accuracy.

[0041] See Figures 1-8 The interval adjustment component includes limiting blocks 305 slidably disposed on both sides of the drive rod 303. A lead screw 304 is threaded through the limiting blocks 305, and both ends of the lead screw 304 are fixedly connected to the mounting beam 205. The movement stroke can be flexibly set according to the length of the tunnel chamber 101 and the size of the product to avoid invalid movement and optimize testing efficiency. A reset signal is provided: the limiting blocks 305 serve as mechanical limiting and reset triggering devices, with a simple structure, low cost, and reliable operation. The threads on the two ends of the lead screw 304 are in opposite directions. When the lead screw 304 is rotated, it can drive the limiting blocks 305 on both sides to move closer or further apart, thereby adjusting the duration of fixed-point heating to meet different temperature testing requirements.

[0042] See Figures 1-6 The tunnel chamber 101 is rotatably connected to two end shielding plates 103, and the side wall of the tunnel chamber 101 is rotatably connected to a hydraulic telescopic column 102. The telescopic end of the hydraulic telescopic column 102 is hinged to the shielding plate 103. The bottom of the tunnel chamber 101 is fixedly connected to a track rod 105, which is correspondingly arranged with the moving wheel 203. The hydraulic drive realizes the automatic opening and closing of the chamber door, which is convenient to operate, has good sealing performance, and is conducive to heat preservation and energy saving. Stable operation: The track design ensures the smoothness and straightness of the long-term reciprocating motion of the moving component 2, improving the durability and reliability of the equipment.

[0043] In the implementation of this invention, the operator places the electronic product to be tested for aging on the support plate 301. Under the action of the elastic telescopic member 311 on one side of the clamping plate 308, the electronic product is clamped and limited. At the same time, the moving rod 401 is adjusted to move the movable sleeve 402 on the moving rod 401 to the position of the light-sensing component of the electronic product, such as a camera or other components that are easily damaged at high temperatures. Then, the threaded column 403 is rotated to drive the shielding cover 406 through the movable column 405 at the bottom of the lifting rod 404 to shield and protect the area corresponding to the light-sensing component. In this way, the light-sensing component can be protected during the heating process of the electronic product for aging test. Then, rotating the adjusting rod 315 moves the adjusting beam 314, which in turn moves the indicator block 307 to the chip position of the electronic product. Since the chip's aging test temperature is higher than that of other components, otherwise a lower temperature would not accurately measure the chip's aging status. Simultaneously, the aging test temperature in other areas is lower than that of the chip position; if higher temperatures are used for testing in other areas, the test results will also be inaccurate. In this device, after the indicator block 307 moves to the chip position of the electronic product, the dual-axis motor 202 is activated, and the moving wheels 203 drive the electronic product positioned above the mounting plate 201 to move laterally back and forth relative to the blower 108. During this movement, the electronic product is heated by the hot air blown by the blower 108, and the aging test begins. When the top of the piston rod 317 contacts the transmission block 107, the piston rod 317 moves downwards and then through the transmission rod 32... The rotating rod 319 rotates, causing the lower lifting column 321 to move upward. The clamping block 322 at the bottom of the lifting column 321 separates from the driving rod 303. At this time, the driving rod 303 loses its clamping force with the indicator block 307. When the driving rod 303 continues to move, the carrier plate 301 will not move due to the blocking effect of the transmission block 107. At this time, the air outlet of the fan 108 between the transmission blocks 107 is exactly matched with the chip area corresponding to the indicator block 307. Since the carrier plate 301 does not move, the electronic product does not move relative to the air outlet of the fan 108. The hot air sprayed by the fan 108 continues to heat the area, so the test temperature of this area will be higher than that of other areas of the electronic product. This achieves the heating test of different areas of the same electronic product at different temperatures, improving the accuracy of the aging test without damaging the electronic product. During the movement of the drive rod 303, the limiting block 305 will move. When the limiting block 305 contacts the indicator block 307, the piston rod 317 on the indicator block 307 will be further pressed down by the driving force of the limiting block 305. The transmission block 107 will separate from the piston rod 317, and at this time the limiting function of the transmission block 107 will be lost. Under the action of the reset member 318, the piston rod 317 will reset and rise. Then, under the action of the rotating rod 319, the lifting column 321 will move down and clamp and contact the drive rod 303 again. At this time, the drive rod 303 can drive the electronic products on the carrier plate 301 to move, and then realize the control of the electronic products under the action of the fan 108. The heating of other areas of the sub-product, and the return motion, follow the same principle as above. Each time the piston rod 317 on the fixed cylinder 313 contacts the transmission block 107, it indicates that the chip part of the electronic product has moved to the air outlet position of the fan 108, which can achieve long-term heating and ensure that the aging test is performed at a higher temperature, thereby improving the accuracy and persuasiveness of the test. In this way, different parts of the same electronic product can be heated at different temperatures. Compared with the traditional uniform temperature heating method, the aging test effect is more accurate and will not damage the electronic product. At the same time, targeted heating results in higher thermal energy utilization.

[0044] Finally, it should be noted that the above descriptions are merely preferred embodiments of the present invention and are not intended to limit the present invention. Although the present invention has been described in detail with reference to the foregoing embodiments, those skilled in the art can still modify the technical solutions described in the foregoing embodiments or make equivalent substitutions for some of the technical features. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the present invention should be included within the protection scope of the present invention.

Claims

1. A tunnel-type high-temperature aging device for testing electronic products, comprising an aging component (1), characterized in that, The aging component (1) includes a tunnel chamber (101), a heating component is provided on the tunnel chamber (101), a diversion component is provided at the outlet of the heating component, a moving component (2) is provided inside the tunnel chamber (101), a material-carrying component (3) is provided on the moving component (2), the material-carrying component (3) is correspondingly provided with the diversion component, the material-carrying component (3) includes a support plate (301), clamping components are provided on both sides of the support plate (301), a shielding component (4) is movably provided on the clamping component, side beams (302) are fixedly connected to both sides of the support plate (301), a driving rod (303) is slidably provided through the indicator block (307), the driving rod (303) is connected to the moving component (2), a positioning component is provided on the indicator block (307), an interval adjustment component is provided on both sides of the positioning component, the moving component (2) drives the electronic product to move through the indicator block (307) on the driving rod (303), and adjusts the heating time of the heating component for different areas of the electronic product in conjunction with the positioning component.

2. The tunnel-type high-temperature aging equipment for testing electronic products according to claim 1, characterized in that, The heating assembly includes a heating box (104) fixedly installed on the tunnel chamber (101), and a diverter cylinder (106) is fixedly connected to one side of the inner wall of the tunnel chamber (101). An air outlet pipe is provided at the air outlet end of the diverter cylinder (106).

3. The tunnel-type high-temperature aging equipment for testing electronic products according to claim 2, characterized in that, The diversion assembly includes a mounting rod (109), on which an induced draft fan (108) is fixedly connected. At the bottom of the mounting rod (109) on both sides of the induced draft fan (108), a fixing column (110) is fixedly connected. At the bottom of the fixing column (110), a transmission block (107) is fixedly connected. The air inlet of the induced draft fan (108) is connected to the air outlet pipe of the diversion cylinder (106).

4. The tunnel-type high-temperature aging equipment for testing electronic products according to claim 1, characterized in that, The moving component (2) includes a mounting plate (201), a dual-axis motor (202) is fixedly connected to the bottom of the mounting plate (201), a moving wheel (203) is fixedly connected to the end of the output shaft of the dual-axis motor (202), a bearing rod (204) is fixedly connected to one side of the mounting plate (201), a mounting beam (205) is fixedly connected to the side wall of the bearing rod (204), and the mounting beam (205) is fixedly connected to the drive rod (303).

5. The tunnel-type high-temperature aging equipment for testing electronic products according to claim 4, characterized in that, The clamping assembly includes a clamping column (312) fixedly mounted on a positioning rod (309), which is slidably mounted on the positioning rod (309). A fixing beam (310) is fixedly connected to the end of the clamping column (312), and a clamping plate (308) is fixedly connected to one side of the fixing beam (310). An elastic telescopic member (311) is sleeved on the clamping column (312) between the clamping plate (308) and the positioning rod (309).

6. The tunnel-type high-temperature aging equipment for testing electronic products according to claim 5, characterized in that, The shielding assembly (4) includes a movable rod (401) slidably mounted on a fixed beam (310), a movable sleeve (402) slidably mounted on the movable rod (401), mounting ears (407) fixedly connected to both sides of the movable sleeve (402), a movable column (405) slidably passing through the mounting ears (407), a shield (406) fixedly connected to the bottom of the movable column (405), a lifting rod (404) fixedly connected to the top of the movable column (405), a threaded column (403) threadedly passing through the lifting rod (404), and the bottom of the threaded column (403) rotatably connected to the movable sleeve (402).

7. The tunnel-type high-temperature aging equipment for testing electronic products according to claim 6, characterized in that, The positioning assembly includes a fixed cylinder (313) fixedly mounted on the indicator block (307), a piston column (317) slidably passing through the top wall of the fixed cylinder (313), a reset piece (318) sleeved on the piston column (317), and a lifting column (321) slidably passing through the bottom wall of the fixed cylinder (313). The lifting column (321) extends into the indicator block (307) and is fixedly connected to a clamping block (322) at its bottom. The clamping block (322) corresponds to the drive rod (303).

8. The tunnel-type high-temperature aging equipment for testing electronic products according to claim 7, characterized in that, Rotating rod (319) is rotatably connected inside the fixed cylinder (313). Transmission rod (320) is rotatably connected to both ends of the rotating rod (319). The transmission rod (320) on both sides of the rotating rod (319) is hinged to the lifting column (321) and the piston column (317) respectively. Fixed seats (316) are fixedly connected to both sides of the bottom of the bearing plate (301). Adjusting rod (315) is rotatably connected between the fixed seats (316). Adjusting beam (314) is threaded on the adjusting rod (315). The two ends of the adjusting beam (314) pass through the side beam (302) and are fixedly connected to the bottom of the indicator block (307).

9. A tunnel-type high-temperature aging device for testing electronic products according to claim 8, characterized in that, The interval adjustment component includes a limiting block (305) slidably disposed on both sides of the drive rod (303), and a lead screw (304) threaded through the limiting block (305), with both ends of the lead screw (304) fixedly connected to the mounting beam (205).

10. A tunnel-type high-temperature aging device for testing electronic products according to claim 1, characterized in that, The tunnel chamber (101) is rotatably connected to two shielding plates (103) at both ends, and the tunnel chamber (101) is rotatably connected to a hydraulic telescopic column (102) on the side wall. The telescopic end of the hydraulic telescopic column (102) is hinged to the shielding plate (103), and the bottom of the tunnel chamber (101) is fixedly connected to a track rod (105).

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