Method and system for controlling high-voltage board by internal main control board of multi-channel tester

Abstract

The invention belongs to the field of lithium battery core testing, and discloses a method and a system for controlling a high-voltage board by an internal main control board of a multi-channel tester, and the method comprises the steps: carrying out the power-on initialization of the multi-channel tester; the main control board is connected with the high-voltage board in a mode of combining cross connection and direct connection; the high-voltage board is coded based on the independent coding bus; the main control board inquires the coding information of the high-voltage boards through the communication line so as to identify each high-voltage board; the main control board outputs parameter setting information and a test command to the pulse test units of the plurality of high-voltage boards, and starts to test the tested product; after the test is finished, the data acquisition unit of the high-voltage board transmits test data and test results back to the main control board through the communication line. According to the invention, the interface is simple, the hardware cost is low, and a plurality of high-voltage boards are controlled by the main control board with a sensitive control mode.

Description

Technical Field

[0001] This invention relates to the field of lithium battery cell testing, and in particular to a method and system for controlling a high-voltage board on the main control board inside a multi-channel tester. Background Technology

[0002] Currently, battery production lines are increasingly using multi-channel testers to test products at multiple stations simultaneously, thereby improving the testing efficiency of the battery production line.

[0003] However, current multi-channel testers consist of a main control board and multiple high-voltage boards. The high-voltage boards output pulses to test the device under test (DUT) and collect test data. The main control board simultaneously controls multiple high-voltage boards, sending test parameters to them before testing and receiving test data after testing. The interface between the main control board and each high-voltage board requires multiple I / O control pins (input / output pins). Controlling multiple high-voltage boards simultaneously occupies even more I / O control pins on the main control board. This control method consumes significant I / O resources on the main control board, has complex interfaces with each high-voltage board, high hardware costs, and limits the number of high-voltage boards that can be controlled.

[0004] Therefore, how to provide a method and system for controlling the high-voltage board from the internal main control board of a multi-channel tester is an urgent problem to be solved. Summary of the Invention

[0005] This invention provides a method and system for controlling high-voltage boards on the internal main control board of a multi-channel tester, in order to solve the problems of existing technologies that require a large amount of I / O resources on the main control board, have complex interfaces, high hardware costs, and a limited number of controllable high-voltage boards.

[0006] According to a first aspect of the present invention, a method for controlling a high-voltage board on the internal main control board of a multi-channel tester is provided.

[0007] In one embodiment, the method for controlling the high-voltage board by the main control board inside the multi-channel tester includes:

[0008] Power on and initialize the multi-channel tester; connect the main control board to the high-voltage board using a combination of cross-connection and direct connection.

[0009] The high-voltage boards are encoded based on an independent encoding bus; the main control board queries the encoding information of the high-voltage boards through the communication line to identify each high-voltage board.

[0010] The main control board outputs parameter setting information and test commands to the pulse test units of multiple high-voltage boards, and begins the test of the test object;

[0011] After the test is completed, the high-voltage board's data acquisition unit will transmit the test data and results back to the main control board via the communication line.

[0012] In one embodiment, connecting the main control board and the high-voltage board through a combination of cross-connection and direct connection includes:

[0013] Several ports are set on the main control board and the high voltage board, including several encoding bits, a first communication pin and a second communication pin;

[0014] The first and second communication pins on the main control board are cross-connected with the first and second communication pins on the high voltage board;

[0015] Several encoding bits on the main control board are directly connected to several IO pins on the high voltage board.

[0016] In one embodiment, the main control board includes an encoding unit, and the encoding unit includes several independent encoding buses, which are connected to the power supply voltage and ground via pull-up resistors and pull-down resistors.

[0017] In one embodiment, encoding the high-voltage board based on an independent encoding bus includes:

[0018] After the main control board is connected to the high voltage board, the IO pins of the high voltage board are connected to the independent encoding bus on the encoding unit.

[0019] Pull-up and pull-down resistors are used to encode the I / O pin states of the high-voltage board, including high-level and low-level states.

[0020] In one embodiment, when encoding the high-voltage board, the encoding unit of the main control board automatically encodes the high-voltage board, and the high-voltage board is assigned codes sequentially.

[0021] In one embodiment, the control method of the main control board of the multi-channel tester on the high-voltage board further includes: when the control unit of the main control board sends test parameters to the high-voltage board, the high-voltage board sends test results to the control unit of the main control board;

[0022] Obtain the total number of tests and the types of nonconformities from the test results, and calculate the nonconformity rate for each type of nonconformity;

[0023] When the failure rate exceeds the unreasonable rate threshold, the test parameter information of the high voltage board with different codes will be changed to reduce the failure rate of the high voltage board failure type.

[0024] In one embodiment, the main control board includes a main control board communication unit, and the main control board encoding unit includes several independent communication buses. The communication pins of the high voltage board are aligned with the independent communication buses of the main control board encoding unit.

[0025] In one embodiment, the main control board queries the coding information of the high-voltage boards via a communication line to identify each high-voltage board, including:

[0026] The main control board communicates with each high-voltage board via a communication line and reads the level of the IO pins of each high-voltage board to identify the corresponding code of each high-voltage board.

[0027] In one embodiment, after the test is completed, the high-voltage board's data acquisition unit transmits the test data and results back to the main control board via a communication line, and then further includes:

[0028] The main control board transmits the test data and results back to the host computer, or displays the test data and results on the screen.

[0029] According to a second aspect of the present invention, a control system for a high-voltage board on the internal main control board of a multi-channel tester is provided.

[0030] In one embodiment, the control system for the high-voltage board on the internal main control board of the multi-channel tester includes:

[0031] The initialization module is used to perform power-on initialization of the multi-channel tester.

[0032] The connection module is used to connect the main control board and the high voltage board through a combination of cross-connection and direct connection.

[0033] The high-voltage board identification module is used to encode the high-voltage board based on an independent encoding bus; the main control board queries the encoding information of the high-voltage board through the communication line to identify each high-voltage board.

[0034] The test control module is used by the main control board to output parameter setting information and test commands to the pulse test units of multiple high-voltage boards, and to start the test of the test object;

[0035] The test data acquisition module is used to transmit the test data and results back to the main control board via a communication line after the test is completed.

[0036] According to a third aspect of the present invention, a computer device is provided.

[0037] In some embodiments, the computer device includes a memory and a processor, the memory storing a computer program, and the processor executing the computer program to implement the steps of the method described above.

[0038] According to a fourth aspect of the present invention, a computer-readable storage medium is provided.

[0039] In one embodiment, a computer program is stored on the computer-readable storage medium, which, when executed by a processor, implements the steps of the above method.

[0040] The technical solutions provided by the embodiments of the present invention may include the following beneficial effects:

[0041] (1) The high-voltage board of this invention only needs to be connected to the main control board for automatic encoding. The main control board identifies multiple high-voltage boards through communication and sends test commands and transmits test results back via communication. Only two communication lines and n*2 are needed between multiple high-voltage boards and the main control board. n With one independent encoding bit, the main control board can achieve 2 n The control of a high-voltage board enables the normal operation and testing of the multi-channel tester.

[0042] (2) This invention has strong scalability, and the number of high-voltage boards can be increased or decreased according to customer needs. The circuit structure of the high-voltage boards is exactly the same, which ensures the consistency of testing and improves manufacturability. It occupies less I / O resources on the main control board, the interface between the main control board and the high-voltage boards is simple, and the hardware cost is greatly reduced.

[0043] (3) Customers can set different test parameters for each high-voltage board according to their needs, and automatically change the test parameters between high-voltage boards based on the statistical analysis of the measurement results, so as to improve the production qualification rate.

[0044] It should be understood that the above general description and the following detailed description are exemplary and explanatory only, and are not intended to limit the invention. Attached Figure Description

[0045] The accompanying drawings, which are incorporated in and form part of this specification, illustrate embodiments consistent with the invention and, together with the description, serve to explain the principles of the invention.

[0046] Figure 1 This is a flowchart illustrating a method for controlling a high-voltage board on the internal main control board of a multi-channel tester, according to an exemplary embodiment.

[0047] Figure 2 This is a schematic block diagram illustrating the control system of the internal main control board of a multi-channel tester to the high-voltage board, according to an exemplary embodiment.

[0048] Figure 3 This is a schematic diagram of the structure of a computer device according to an exemplary embodiment;

[0049] Figure 4 This is an interface diagram of the main control board and each high-voltage board according to an exemplary embodiment;

[0050] Figure 5 This is an internal structure diagram of the main control board according to an exemplary embodiment;

[0051] Figure 6 This is a diagram of the encoding unit of the main control board according to an exemplary embodiment;

[0052] Figure 7 This is a schematic diagram illustrating the generation of test parameters between the control unit of the main control board and the high voltage board according to an exemplary embodiment;

[0053] Figure 8 This is a communication unit diagram of a main control board according to an exemplary embodiment;

[0054] Figure 9 This is an internal structural diagram of a high-voltage plate according to an exemplary embodiment;

[0055] Figure 10 This is a test flowchart illustrating a multi-channel test according to an exemplary embodiment. Detailed Implementation

[0056] Figure 1 An embodiment of the control method of the internal main control board of a multi-channel tester for controlling the high-voltage board is shown.

[0057] In this optional embodiment, the method for controlling the high-voltage board by the main control board inside the multi-channel tester includes:

[0058] S101. Power on and initialize the multi-channel tester; connect the main control board to the high-voltage board using a combination of cross-connection and direct connection.

[0059] S102. The high-voltage board is encoded based on an independent encoding bus; the main control board queries the encoding information of the high-voltage board through the communication line to identify each high-voltage board.

[0060] S103, The main control board outputs parameter setting information and test commands to the pulse test units of multiple high-voltage boards, and starts the test of the test object;

[0061] S104. After the test is completed, the data acquisition unit of the high-voltage board will transmit the test data and test results back to the main control board through the communication line.

[0062] In this optional embodiment, the connection between the main control board and the high-voltage board is achieved through a combination of cross-connection and direct connection, including:

[0063] Several ports are set on the main control board and the high voltage board, including several encoding bits, a first communication pin and a second communication pin; the first communication pin and the second communication pin on the main control board are cross-connected with the first communication pin and the second communication pin on the high voltage board; several encoding bits on the main control board are directly connected with several IO pins on the high voltage board.

[0064] In this optional embodiment, the main control board includes an encoding unit, and the encoding unit includes several independent encoding buses. The encoding buses are connected to the power supply voltage and ground through pull-up resistors and pull-down resistors.

[0065] In this optional embodiment, encoding the high-voltage board based on an independent encoding bus includes:

[0066] After the main control board is connected to the high voltage board, the IO pins of the high voltage board are connected to the independent encoding bus on the encoding unit; using pull-up resistors and pull-down resistors, the IO pin states of the high voltage board are encoded, including high-level and low-level states.

[0067] In this optional embodiment, when encoding the high-voltage board, the encoding unit of the main control board automatically encodes the high-voltage board, and the high-voltage board is assigned codes sequentially.

[0068] In this optional embodiment, the control method of the main control board of the multi-channel tester for controlling the high-voltage board further includes: when the control unit of the main control board sends test parameters to the high-voltage board, the high-voltage board sends test results to the control unit of the main control board; obtaining the total number of tests and the types of non-conformities in the test results, and calculating the non-conformity rate of each type of non-conformity; when the non-conformity rate exceeds the unreasonable rate threshold, the test parameter information of the high-voltage board with different codes is replaced to reduce the non-conformity rate of the non-conformity types of the high-voltage board.

[0069] In this optional embodiment, the main control board includes a main control board communication unit, and the main control board encoding unit includes several independent communication buses. The communication pins of the high voltage board are aligned with the independent communication buses of the main control board encoding unit.

[0070] In this optional embodiment, the main control board queries the coding information of the high-voltage boards via the communication line to identify each high-voltage board, including:

[0071] The main control board communicates with each high-voltage board via a communication line and reads the level of the IO pins of each high-voltage board to identify the corresponding code of each high-voltage board.

[0072] In this optional embodiment, after the test is completed, the high-voltage board's data acquisition unit transmits the test data and results back to the main control board via the communication line, and then further includes:

[0073] The main control board transmits the test data and results back to the host computer, or displays the test data and results on the screen.

[0074] Figure 2 An embodiment of the control system for the high-voltage board on the internal main control board of a multi-channel tester according to the present invention is shown.

[0075] In this optional embodiment, the control system for the high-voltage board on the main control board inside the multi-channel tester includes:

[0076] Initialization module 201 is used to perform power-on initialization of the multi-channel tester;

[0077] The connection module 202 is used to connect the main control board and the high voltage board through a combination of cross-connection and direct connection.

[0078] The high-voltage board identification module 203 is used to encode the high-voltage board based on an independent encoding bus; the main control board queries the encoding information of the high-voltage board through the communication line to identify each high-voltage board.

[0079] The test control module 204 is used by the main control board to output parameter setting information and test commands to the pulse test units of multiple high-voltage boards, and to start the test of the test object;

[0080] The test data acquisition module 205 is used to transmit the test data and test results back to the main control board via the communication line after the test is completed.

[0081] To facilitate understanding of the above technical solutions of the present invention, the following further describes the above technical solutions of the present invention from the perspectives of architecture and principle, as follows:

[0082] The interface between the main control board and each high-voltage board is as follows: Figure 4 As shown, the main control board has n+2 ports, namely: encoding bits 1 to n, TX, and RX. The communication pins TX and RX of the main control board are cross-connected with the communication pins TX and RX of the high-voltage board. Encoding bits 1 to n of the main control board are directly connected with the IO pins 1 to n of the high-voltage board. RX and TX are abbreviations for Receive and Transmit in the field of communication.

[0083] The internal structure of the main control board is as follows Figure 5 As shown, it includes a control unit, an encoding unit, and a communication unit. Figure 5 The control unit and communication unit in the text refer to the control unit and communication unit of the main control board.

[0084] The encoding unit of the main control board is as follows Figure 6 As shown, the encoding unit outputs two independent encoding buses, which are connected to VCC and GND respectively through pull-up resistors and pull-down resistors.

[0085] A total of n*2 are designed on the encoding bus n 2 encoded bits, corresponding to 2 n Each high-voltage board uses n IO pins to connect to n encoding bits of the main control board.

[0086] Taking n=2 as an example, n*2 n The coded bits are 00, 01, 10, and 11, and the connection method is as follows: Figure 6 For example, if n = 3, then n * 2 nThe coded bits are: 000, 001, 010, 011, 100, 101, 110, 111;

[0087] After the interfaces of each high-voltage board and the main control board are connected, IO pin 1 and IO pin 2 of high-voltage board 1 are connected to the encoding bus. This encoding bus is pulled low by a pull-down resistor, so IO pin 1 and IO pin 2 of high-voltage board 1 are pulled low, which is equivalent to being assigned the code 00.

[0088] Similarly, high-voltage board 2, high-voltage board 3 and high-voltage board 4 are equivalent to being assigned codes 01, 10 and 11 respectively.

[0089] The hardware circuit of the encoding unit of the main control board encodes all positions as fixed 0 or 1. When all high voltage boards are connected to the main control board, the IO pins of the high voltage boards are connected to these encoding bits, that is, they are set to 0 or 1. Thus, all high voltage boards are sequentially encoded as 00, 01, 10, 11.

[0090] By employing an encoding bus, high-voltage boards can be automatically encoded. This allows for identical circuit structures across all high-voltage boards; once connected to the main control board, the main control board's encoding unit automatically encodes the high-voltage boards, assigning them codes sequentially. In actual production line testing, the main control board's control unit can then control the encoded high-voltage boards.

[0091] like Figure 7 As shown, the control unit of the main control board sends test parameters to the high-voltage board, and the high-voltage board sends test results to the control unit of the main control board. For a test system containing multiple high-voltage boards, the user can edit different test parameters for each high-voltage board. For the test results returned by each high-voltage board, the control unit performs statistical analysis. The total number of tests is 'a', and the number of times each of the non-conforming types E01-E10 is 'c1'-'c10'. Then the non-conforming rates of non-conforming types E01-E10 are bn = Cn / a. The user can set the non-conforming rate of non-conforming type En to not exceed 'dn'. If bn > 'dn', the test parameter information of high-voltage boards with different codes can be changed. For example, if the judgment threshold corresponding to E01 is U1, then U1 can be replaced with the smallest judgment threshold Umin or the average value Uavr among the n high-voltage boards to reduce the non-conforming rate of non-conforming type E01 of that high-voltage board, ultimately improving the test pass rate of the production line.

[0092] Communication unit such as Figure 8 There are two independent communication buses, TX and RX. The communication pins TX and RX of each high-voltage board are connected to the communication bus TX and the communication bus RX, respectively.

[0093] When the system is powered on for the first time, the main control board will communicate with each high-voltage board through the communication line and read the level of IO pin 1 and IO pin 2 of each high-voltage board to identify the code corresponding to each high-voltage board.

[0094] The internal structure of the high-voltage board is as follows Figure 9 It includes a control unit, a communication unit, a pulse testing unit, and a data acquisition unit. Figure 9 The control unit and communication unit in the text refer to the control unit and communication unit of the high-voltage board.

[0095] The control unit outputs IO pins, which are connected to the encoding unit of the main control board. The communication unit outputs communication pins TX and RX, which are connected to the communication unit of the main control board.

[0096] The pulse testing unit outputs pulses to test the test object, while the data acquisition unit collects the test data and results.

[0097] The test procedure for multi-channel testing is as follows: Figure 10 Before testing begins, the main control board queries the coding information of the high-voltage boards via the communication line to identify each high-voltage board (coding information identification). It then sends parameter setting information and test commands to the pulse test units of multiple high-voltage boards. Testing then begins. After testing, the data acquisition units of the high-voltage boards transmit the test data and results back to the main control board via the communication line. The main control board then transmits this information back to the host computer or displays it directly on the LCD screen. The main control board uses the test data from multiple high-voltage boards to adjust the judgment thresholds of the test data in real time.

[0098] In one embodiment, a computer device is provided, which may be a server, and its internal structure diagram may be as follows: Figure 3 As shown, the computer device includes a processor, memory, and a network interface connected via a system bus. The processor provides computing and control capabilities. The memory includes a non-volatile storage medium and internal memory. The non-volatile storage medium stores an operating system, computer programs, and a database. The internal memory provides an environment for the operation of the operating system and computer programs in the non-volatile storage medium. The database stores static and dynamic information data. The network interface communicates with external terminals via a network connection. When the computer program is executed by the processor, it implements the steps in the above method embodiments.

[0099] Those skilled in the art will understand that Figure 3The structure shown is merely a block diagram of a portion of the structure related to the present invention and does not constitute a limitation on the computer device to which the present invention is applied. A specific computer device may include more or fewer components than those shown in the figure, or combine certain components, or have different component arrangements.

[0100] In addition, the present invention also provides a computer device, including a memory and a processor, wherein the memory stores a computer program, and the processor executes the computer program to implement the steps in the above method embodiments.

[0101] In addition, the present invention also provides a computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, implements the steps in the above method embodiments.

[0102] Those skilled in the art will understand that all or part of the processes in the methods of the above embodiments can be implemented by a computer program instructing related hardware. The computer program can be stored in a non-volatile computer-readable storage medium, and when executed, it can include the processes of the embodiments of the methods described above. Any references to memory, storage, databases, or other media used in the embodiments provided by this invention can include at least one of non-volatile and volatile memory. Non-volatile memory can include read-only memory (ROM), magnetic tape, floppy disk, flash memory, or optical storage, etc. Volatile memory can include random access memory (RAM) or external cache memory. By way of illustration and not limitation, RAM can be in various forms, such as static random access memory (SRAM) or dynamic random access memory (DRAM), etc.

[0103] This invention is not limited to the structures described above and shown in the accompanying drawings, and various modifications and changes can be made without departing from its scope. The scope of this invention is limited only by the appended claims.

Claims

1. A method for controlling a high-voltage board on the internal main control board of a multi-channel tester, characterized in that, include: Power on and initialize the multi-channel tester; connect the main control board to the high-voltage board using a combination of cross-connection and direct connection. Encode the high-voltage board based on an independent encoding bus; The main control board queries the coding information of the high-voltage boards through the communication line to identify each high-voltage board; The main control board outputs parameter setting information and test commands to the pulse test units of multiple high-voltage boards, and begins the test of the test object; After the test is completed, the high-voltage board's data acquisition unit will transmit the test data and results back to the main control board via the communication line.

2. The method for controlling the high-voltage board of the internal main control board of a multi-channel tester according to claim 1, characterized in that, The method of connecting the main control board and the high-voltage board through a combination of cross-connection and direct connection includes: Several ports are set on the main control board and the high voltage board, including several encoding bits, a first communication pin and a second communication pin; The first and second communication pins on the main control board are cross-connected with the first and second communication pins on the high voltage board; Several encoding bits on the main control board are directly connected to several IO pins on the high voltage board.

3. The method for controlling the high-voltage board of the internal main control board of a multi-channel tester according to claim 1, characterized in that, The main control board includes an encoding unit, and the encoding unit includes several independent encoding buses. The encoding buses are connected to the power supply voltage and ground through pull-up resistors and pull-down resistors.

4. The method for controlling the high-voltage board of the internal main control board of a multi-channel tester according to claim 3, characterized in that, The encoding of the high-voltage board based on an independent encoding bus includes: After the main control board is connected to the high voltage board, the IO pins of the high voltage board are connected to the independent encoding bus on the encoding unit. Pull-up and pull-down resistors are used to encode the I / O pin states of the high-voltage board, including high-level and low-level states.

5. The method for controlling the high-voltage board of the internal main control board of a multi-channel tester according to claim 4, characterized in that, When encoding the high-voltage board, the encoding unit of the main control board automatically encodes the high-voltage board, and the high-voltage board is assigned a code in sequence.

6. The method for controlling the high-voltage board of the internal main control board of a multi-channel tester according to claim 5, characterized in that, Also includes: When the control unit of the main control board sends test parameters to the high voltage board, the high voltage board sends the test results to the control unit of the main control board. Obtain the total number of tests and the types of nonconformities from the test results, and calculate the nonconformity rate for each type of nonconformity; When the failure rate exceeds the unreasonable rate threshold, the test parameter information of the high voltage board with different codes will be changed to reduce the failure rate of the high voltage board failure type.

7. The method for controlling the high-voltage board of the internal main control board of a multi-channel tester according to claim 1, characterized in that, The main control board includes a main control board communication unit, and the main control board encoding unit includes several independent communication buses. The communication pins of the high voltage board are aligned with the independent communication buses of the main control board encoding unit.

8. The method for controlling the high-voltage board of the internal main control board of a multi-channel tester according to claim 1, characterized in that, The main control board queries the coding information of the high-voltage boards via the communication line to identify each high-voltage board, including: The main control board communicates with each high-voltage board via a communication line and reads the level of the IO pins of each high-voltage board to identify the corresponding code of each high-voltage board.

9. The method for controlling the high-voltage board of the internal main control board of a multi-channel tester according to claim 1, characterized in that, After the test is completed, the high-voltage board's data acquisition unit transmits the test data and results back to the main control board via the communication line. This process also includes: The main control board transmits the test data and results back to the host computer, or displays the test data and results on the screen.

10. A control system for a high-voltage board on the internal main control board of a multi-channel tester, characterized in that, include: The initialization module is used to perform power-on initialization of the multi-channel tester. The connection module is used to connect the main control board and the high voltage board through a combination of cross-connection and direct connection. The high-voltage board identification module is used to encode the high-voltage board based on an independent encoding bus. The main control board queries the coding information of the high-voltage boards through the communication line to identify each high-voltage board; The test control module is used by the main control board to output parameter setting information and test commands to the pulse test units of multiple high-voltage boards, and to start the test of the test object; The test data acquisition module is used to transmit the test data and test results back to the main control board via a communication line after the test is completed.

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