Equipment testing method, testing equipment and storage medium

Abstract

The invention discloses an equipment testing method, testing equipment and a storage medium, and relates to the technical field of testing equipment. A test device is connected with a Type-C interface of a tested device through a cable, and the method comprises the following steps: when impedance between a CC wire and a ground wire is reduced, determining whether the voltage of a power line is less than a first voltage value and whether the impedance is in a first impedance range; if not, determining that water does not enter the Type-C interface; if yes, a water inflow detection process is triggered, output of the overturning signal to the CC line is stopped, and a voltage detection value on the CC line is obtained; when the voltage detection value does not meet the preset voltage range, determining that water enters the Type-C interface; otherwise, determining that water does not enter the Type-C interface and quitting the water inlet detection process. By using the method, when the water inlet fault detection of the detected equipment is triggered by mistake, misjudgment of water inlet of the Type-C interface can be avoided, the detection equipment is enabled to quit the water inlet fault detection process in time, and the influence on the normal test process is reduced.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of test equipment, in particular to a device test method, a test equipment and a storage medium. BACKGROUND

[0002] Electronic devices such as mobile phones and tablets can be provided with a universal serial bus (USB) Type-C interface. The Type-C interface has two configuration channel (CC) lines, which are used to exchange data information between two devices when the electronic device is connected to an external device through the Type-C interface.

[0003] A USB power delivery (USB Power Delivery, PD) test equipment, hereinafter referred to as a test equipment, can detect the communication protocol data, charging voltage, charging current, charging power, safety protection mechanism, and whether the functions and performance of the Type-C interface meet the specifications when the electronic device supporting the PD protocol is charging. Currently, when the test equipment is in a detection state after being connected to the device under test, the CC line of the test equipment is in a disable state, and according to the PD specification, the impedance between the CC line and the ground at this time should be greater than 126K ohms. However, this impedance range overlaps with the impedance range for determining water ingress failure, which triggers the test equipment to detect water ingress failure of the device under test and misjudges that the device under test has water ingress, affecting the normal test process. SUMMARY

[0004] To solve the above problems, the present application provides a device test method, a test equipment and a storage medium, which can exit the water ingress failure detection process in time after the test equipment misfires the water ingress failure detection of the device under test, avoid misjudging that the device under test has water ingress, and reduce the impact on the normal test process.

[0005] In a first aspect, the present application provides a device test method applied to a test equipment, the test equipment being connected to a Type-C interface of a device under test through a cable, and the method comprising: when the impedance between a configuration channel (CC) line and a ground line decreases, determining whether the voltage of a power line is less than a first voltage value and whether the impedance is in a first impedance range; if not, determining that the Type-C interface has not entered water; if so, triggering a water detection process, stopping outputting a flip signal to the CC line, and obtaining a voltage detection value on the CC line; when the voltage detection value does not meet a preset voltage range, determining that the Type-C interface has entered water; otherwise, determining that the Type-C interface has not entered water and exiting the water detection process.

[0006] The test equipment outputs a direct current state detection level on the CC line to detect the state of the access equipment. When the tested equipment is waterlogged, the CC line is short-circuited, and the voltage on the CC line is significantly reduced. When the tested equipment is not waterlogged, the voltage on the CC line is within the preset voltage range. Therefore, the scheme uses the state detection level output by the test equipment on the CC line to assist in determining whether the Type-C interface is waterlogged, rather than only determining whether the Type-C interface is waterlogged according to the voltage of the power line and the impedance of the CC line to the ground. Therefore, the waterlogging detection process is optimized. When the test equipment mistakenly triggers the waterlogging fault detection of the tested equipment, the determination condition of the voltage of the CC line is added, so that the test equipment can avoid mistakenly determining that the tested equipment is waterlogged. The test equipment can exit the waterlogging fault detection process in time, and the level of the CC line is not forced to be pulled to the ground, thereby reducing the influence on the normal test process. Moreover, the scheme can be completely realized based on the existing hardware circuit of the test equipment, without increasing the hardware cost.

[0007] In a possible implementation, the preset voltage range is greater than a second voltage value, the second voltage value is less than the first voltage value, and when the voltage detection value meets the preset voltage range, it is determined that the Type-C interface is waterlogged. The method comprises the following steps: when the voltage detection value is less than or equal to the second voltage value, it is determined that the Type-C interface is waterlogged.

[0008] In this implementation, the second voltage value can be set to a small voltage value close to zero. When the voltage detection value is less than the second voltage value, it indicates that the voltage of the CC line is close to zero at this time, that is, a short circuit occurs between the CC line and the ground line at this time, and the short circuit is caused by waterlogging of the Type-C interface.

[0009] In a possible implementation, the minimum value of the preset voltage range is less than a third voltage value and greater than zero, the maximum value of the preset voltage range is greater than the third voltage value, the third voltage value is the voltage value of the direct current voltage output by the test equipment to the CC line, and when the voltage detection value does not meet the preset voltage range, it is determined that the Type-C interface is waterlogged. The method comprises the following steps: when the voltage detection value is not in the preset voltage range, it is determined that the Type-C interface is waterlogged.

[0010] In this implementation, the preset voltage range covers the range of the state detection level.

[0011] In a possible implementation, the Type-C interface is determined to be not waterlogged and the waterlogging detection process is exited, specifically comprising: determining that the Type-C interface is not waterlogged; and exiting the waterlogging detection process and determining that the test equipment is in a disable state.

[0012] At this time, the test equipment can exit the waterlogging fault detection process in time, and the disable state of the test equipment can also be identified.

[0013] In a possible implementation, after determining that the Type-C interface is waterlogged, the method further includes: maintaining the stop outputting the flip signal to the CC line, and grounding the CC line.

[0014] In a possible implementation, after determining that the Type-C interface is not waterlogged and exiting the waterlogging detection process, the method further includes: when the voltage detection value is greater than the third voltage value, and the difference between the third voltage value and the voltage detection value is greater than a preset threshold, determining that the measured device is an active device; when the voltage detection value is less than the third voltage value, and the difference between the third voltage value and the voltage detection value is greater than the preset threshold, determining that the measured device is a load device; and when the absolute value of the difference between the voltage detection value and the third voltage value is less than the preset threshold, determining that the measured device is an instrument or a high-impedance device.

[0015] In this implementation, after the disable state is identified, the type of the connected measured device can be further determined.

[0016] In a possible implementation, the preset voltage range is 0.8 V to 1.1 V.

[0017] In a possible implementation, the first impedance range is 5.1 kilo-ohms to 500 kilo-ohms.

[0018] In a possible implementation, the second impedance range is 0.1 kilo-ohms to 5 kilo-ohms.

[0019] In a possible implementation, the second impedance range is 0.1 kilo-ohms to 5 kilo-ohms. BRIEF DESCRIPTION OF DRAWINGS

[0020] Figure 1 A schematic of a test scenario provided for an embodiment of the present application Figure 1 ;

[0021] Figure 2 A flowchart of a device testing method provided for an embodiment of the present application

[0022] Figure 3 A schematic of a test scenario provided for an embodiment of the present application Figure 2 ;

[0023] Figure 4 Pin diagram of Type-C interface provided for embodiments of the present application;

[0024] Figure 5 Flowchart of another device testing method provided for embodiments of the present application;

[0025] Figure 6 Schematic diagram of testing device provided for embodiments of the present application. DETAILED DESCRIPTION

[0026] In order to make the person skilled in the art more clearly understand the scheme of the present application, the application scenario of the technical scheme of the present application will be first described below.

[0027] Referring to Figure 1 The figure is a schematic diagram of a testing scenario provided for embodiments of the present application.

[0028] When testing the device under test 20, the Type-C connector 12 of the testing device 10 is connected to the Type-C interface 21 of the device under test 20 through the cable 11.

[0029] When the testing device 10 is connected to the device under test 20 through the cable 11, the CC line of the testing device 10 is connected to the CC line of the device under test 20, and the testing device 10 is in a state of waiting for testing. The testing device 10 can output a toggle signal to the CC line to realize relevant testing functions.

[0030] When the testing device 10 is in a state of waiting for testing, the CC line of the testing device is in a disable state. In a non-disable state, the impedance of the CC line to ground can be regarded as infinite, that is, the CC line can be regarded as open circuit to ground. However, in the disable state, the impedance of the CC line to ground decreases, which triggers the water ingress fault detection of the device under test 20.

[0031] According to the PD specification, the impedance to ground at this time is greater than 126K ohms, and the range of this impedance to ground value overlaps with the impedance range for determining the water ingress fault of the device under test. For example, taking a mobile phone device as the device under test, the corresponding impedance range for water ingress fault is 5.1K ohms to 500K ohms, and the impedance of the CC line to ground in the disable state can generally be within this impedance range, triggering the testing device 10 to misjudge that the device under test 20 has water ingress.

[0032] When the test device 10 misjudges that the measured device 20 is waterlogged, in order to protect the test device 10 and the measured device 20 and avoid safety accidents, the test device 10 will forcibly pull down the CC line level of the measured device 20 to the ground, at this time the test device 10 cannot pull up the CC line level state of the measured device 20, resulting in that the subsequent test cannot be normally completed, and the normal test process is affected.

[0033] To solve the above technical problems, the application provides a device testing method, a test device and a storage medium. When the impedance between the CC line and the ground line decreases, it is determined whether the power line voltage is less than a first voltage value and whether the impedance is in a first impedance range. If not, it is determined that the Type-C interface is not waterlogged; if yes, a waterlogging detection process is triggered, output of a flip signal to the CC line is stopped, and a voltage detection value on the CC line is obtained. When the voltage detection value does not meet a preset voltage range, it is determined that the Type-C interface is waterlogged; otherwise, it is determined that the Type-C interface is not waterlogged and the waterlogging detection process is exited. By using the scheme, the waterlogging detection process is optimized, when the test device misfires the waterlogging fault detection of the measured device, the Type-C interface is avoided from being misjudged as waterlogged, and the waterlogging fault detection process is exited in time, and the CC line level is not forcibly pulled down to the ground, thereby reducing the influence on the normal test process.

[0034] The terms "first", "second", etc. in the description of the present application are only used for descriptive purposes, and cannot be understood as indicating or implying relative importance or implicitly indicating the number of the technical features indicated

[0035] In the present application, unless otherwise explicitly specified and limited, the term "connection" should be understood broadly, for example, "connection" can be fixed connection, or detachable connection, or integral; can be direct connection, or indirect connection through intermediate medium.

[0036] The present application embodiment provides a device testing method, which will be specifically described below with reference to the accompanying drawings.

[0037] Referring to Figure 2 , the figure is a flowchart of a device testing method provided by the present application embodiment.

[0038] The method can be applied to a test device, and the test device connects a Type-C interface of a measured device through a cable, and the method includes the following steps:

[0039] S11: triggering a waterlogging detection process when detecting that the impedance between the CC line and the ground line decreases.

[0040] Referring to Figure 3 , the figure is a schematic diagram of a test scene provided by the present application embodiment Figure 2 .

[0041] The test device 10 is connected to the Type-C interface 21 of the device under test 20 through the cable 11, and the CC line of the test device 10 is connected to the CC line of the device under test 20 through the cable 11. At this time, it can be considered that the impedance of the CC line of the test device 10 to ground is equal to the impedance of the CC line of the device under test to ground. The CC line generally includes two, which are represented by CC1 and CC2.

[0042] The CC control module 13 of the test device 10 can output a signal to the CC line, including a state detection level and a toggle signal.

[0043] The state detection level is a continuous direct current level, and the size is generally 1V. The toggle signal is a continuous pulse waveform. The toggle signal is a detection signal input to the CC line. After the CC control module 13 inputs the toggle signal to the CC line, the voltage sampling result on the CC line can be used to determine whether the working state of the Type-C interface is abnormal.

[0044] In the non-disable state, the impedance of the CC line to ground can be considered as infinite, that is, the CC line is open to ground. When the test device is in the disable state, the impedance of the CC line to ground decreases, and the equivalent impedance of the CC line to ground is generally greater than 126K ohms.

[0045] When the test device 10 detects that the impedance between the CC line and the ground line decreases from infinity, the water detection process is triggered. It can be understood that at this time, the decrease of the impedance to ground may be caused by the real water of the Type-C interface, that is, the water causes the CC line of the Type-C interface to be connected to the ground line, or it may be caused by the test device being in the disable state. The subsequent steps of the present application can distinguish between the above two scenarios, and when it is determined that the Type-C interface is not watered, that is, when it is determined that the decrease of the impedance to ground is caused by the test device being in the disable state, the water detection process is ended (exited) in time.

[0046] S12: Determine whether the power line voltage is less than the first voltage value and whether the impedance is in the first impedance range.

[0047] If yes, perform S13, otherwise, perform S15.

[0048] The test device 10 first acquires the voltage value on the power line VBUS, and determines whether the current CC line impedance to ground is in the first impedance range.

[0049] The test device 10 is provided with an analog to digital converter (ADC), and the ADC 15 is used to convert the collected analog voltage signal on the VBUS into a digital voltage value and send it to the processor 17.

[0050] The processor 17 can compare the digital voltage value with the first voltage value, and then determine whether the power line voltage is less than the first voltage value. Embodiments of the present application do not make specific limitations on the first voltage value, which can be determined according to the actual type of the device under test. Taking the device under test as a mobile phone device as an example, the first voltage value can be set to 1V. The first voltage value is generally set to a small voltage value, which is less than the power line voltage in the non-disable state. Therefore, when the power line voltage is less than the first voltage value, it indicates that the power line voltage abnormally decreases at this time, and the Type-C interface has the possibility of water ingress.

[0051] The test device 10 detects whether the CC line-to-ground impedance is in the first impedance range. Embodiments of the present application do not make specific limitations on the first impedance range, which represents the impedance range of the electronic device in the water ingress fault. The recommended value of the first impedance range given by the present application is 5.1K ohms to 500K ohms.

[0052] In a possible implementation, the scheme of embodiments of the present application can not detect a specific CC line-to-ground impedance value, but only determine whether the impedance range is the first impedance range. This is because the test device 10 needs to detect the state and type of the device under test 20, so the test device 10 generally inputs a direct current state detection level on the CC line when in the disable state. The state detection level is 1V. When the level is pulled high, the test device 10 can determine that the device under test 20 connected is an active device; when the level is pulled low, the test device 10 can determine that the device under test 20 connected is a load device; and when the level is basically maintained, the test device 10 can determine that the device under test 20 connected is a high-impedance device or an instrument.

[0053] The state detection level and the toggle signal superimposed on the CC line will cause the impedance value detected by the test device 10 to be always inaccurate. This also leads to the fact that in the prior art scheme, if the water ingress detection is triggered by mistake, the impedance value cannot be accurately obtained, and the impedance value is always in a fluctuating state. The scheme of the present application does not need to obtain an accurate impedance value, but only needs to determine the approximate range of the impedance value.

[0054] In a possible implementation, to determine whether the impedance is in the first impedance range, the detection results of a first number of continuous impedance values can be obtained, and when the first number of detection results are all in the first impedance range, it is determined that the current CC line-to-ground impedance is in the first impedance range. Compared with the prior art scheme of obtaining an accurate impedance value, the implementation difficulty of the present implementation is low.

[0055] S13: Stop outputting the toggle signal to the CC line, and obtain the voltage detection value on the CC line.

[0056] In the prior art, when it is determined that the power line voltage is less than the first voltage value and the impedance is in the first impedance range, it is determined that the Type-C interface is waterlogged. The scheme of the embodiments of the present application optimizes the waterlogging detection process to avoid misjudgment, and performs auxiliary judgment according to the voltage detection value on the CC line.

[0057] Referring to Figure 4 The figure is a pin diagram of a Type-C interface provided by the embodiments of the present application.

[0058] The inventors found through research on the pin arrangement of the current Type-C interface that the power line VBUS and the CC line (CC1 and CC2) of the Type-C interface are in an adjacent state. When the Type-C interface of the device under test is waterlogged, it will cause the impedance between VBUS and ground GND to decrease. In addition, since the power line VBUS of the Type-C interface is connected to the CC line, when the VBUS pin is affected by waterlogging, the CC line will also generally be affected by waterlogging, causing the impedance between the CC line and the ground to decrease. Taking a mobile phone device as an example, the inventors simulated different daily waterlogging scenarios, such as the mobile phone falling into a basin, a wet hand touching the Type-C interface, liquid splashing into the Type-C interface, etc. The inventors found that due to the movement of the device under test caused by the user, the liquid entering the Type-C interface moves, and is affected by the capillary action of the liquid. If the amount of water reaches a level that causes the impedance between VBUS and ground GND to decrease, the CC pin adjacent to the VBUS pin will be affected by waterlogging in all scenarios, causing the impedance between the CC line and the ground to decrease.

[0059] Therefore, the inventors selected the voltage value on the CC line as a further verification condition for determining the Type-C interface.

[0060] Since the CC control module 13 of the test device 10 outputs a toggle signal toggle to the CC line, the toggle is a pulse signal with high and low levels, which will affect the judgment of whether the voltage on the CC line decreases, so the test device 10 controls the CC control module 13 to stop outputting the toggle signal toggle. Another technical effect of stopping outputting the toggle signal toggle is that in the prior art, the toggle signal toggle is stopped outputting only after it is determined that the Type-C interface is waterlogged. The scheme of the present application can stop outputting the toggle signal toggle earlier, thereby improving the protection effect of the test device 10 and the device under test 20 and reducing the safety hazard.

[0061] At this time, only a direct current state detection level exists on the CC line.

[0062] The ADC 14 of the test device 10 can convert the collected analog voltage signal on the CC line into a digital voltage value and send it to the processor 17, so that the processor 17 obtains the voltage detection value on the CC line.

[0063] S14: Determine whether the voltage detection value meets the preset voltage range.

[0064] If yes, perform S15; otherwise, perform S16.

[0065] The embodiment of the present application does not make specific limitation on the preset voltage range. When the voltage detection value meets the preset voltage range, it is determined that the Type-C interface is not waterlogged and the waterlogging detection process is exited; otherwise, it indicates that the impedance between the CC line and the ground line decreases due to waterlogging, a short circuit or a near-short circuit occurs, that is, it is determined that the Type-C interface is waterlogged.

[0066] S15: Determine that the Type-C interface is not waterlogged and exit the waterlogging detection process.

[0067] At this time, the test device 10 does not pull down the level of the CC line to the ground, and if the test device 10 is used for testing later, the test level can be input to the CC line to pull up the level of the CC line without being affected.

[0068] S16: Determine that the Type-C interface is waterlogged.

[0069] At this time, the test device 10 determines that the impedance between the CC line and the ground line decreases due to waterlogging, and the Type-C interface has a real waterlogging. The test device 10 can forcibly pull down the level of the CC line to the ground to protect the test device 10 and the device under test 20.

[0070] In summary, by using the scheme provided by the embodiment of the present application, the state detection level output by the test device to the CC line is used to assist in determining whether the Type-C interface is waterlogged, instead of only determining whether the power line voltage and the CC line-to-ground impedance are waterlogged, thereby optimizing the waterlogging detection process. When the test device mistakenly triggers the waterlogging fault detection of the device under test, since the CC line voltage judgment condition is added, the test device can avoid mistakenly judging that the device under test is waterlogged, so that the test device can exit the waterlogging fault detection process in time and will not forcibly pull down the level of the CC line to the ground, thereby reducing the impact on the normal test process. Moreover, the scheme can be completely realized based on the existing hardware circuit of the test device, without increasing the hardware cost.

[0071] The specific implementation will be described below.

[0072] Referring to Figure 5 , the figure is a flowchart of another device testing method provided by the embodiment of the present application.

[0073] S21: The test device connects the Type-C interface of the device under test through the cable.

[0074] After the test device connects the Type-C interface of the device under test through the cable, the CC line of the test device is connected with the CC line of the device under test through the cable, and the power line of the test device is also connected with the power line of the device under test through the cable.

[0075] S22: The test device detects that the impedance between the CC line and the ground line decreases.

[0076] S23: The test device triggers the water intrusion detection process.

[0077] S24: The test device determines whether the VBUS voltage is less than a first voltage value and whether the impedance is in a first impedance range.

[0078] If yes, S24 is executed, otherwise, S28 is executed.

[0079] S25: The test device stops outputting the toggle signal to the CC line, and enables the ADC function of the CC line.

[0080] In a possible implementation, continuing to refer to Figure 3 , the ADC 14 of the CC line can be enabled by the processor 17.

[0081] S26: The voltage detection value on the CC line is acquired.

[0082] The ADC 14 can convert the collected analog voltage signal on the CC line into a digital voltage value and send it to the processor 17.

[0083] S27: The test device determines whether the voltage detection value is in a preset voltage range.

[0084] If yes, S28 is executed, otherwise, S29 is executed.

[0085] When the test device stops outputting the toggle signal to the CC line, the test device only outputs a state detection level to the CC line at this time, and the state detection level is a direct current with a third voltage value. The minimum value of the preset voltage range is less than the third voltage value and greater than zero, and the maximum value of the preset voltage range is greater than the third voltage value. The preset voltage range is not limited in the embodiments of the present application. In a typical implementation, the output state detection level is 1V direct current, that is, the third voltage value is 1V, and the preset voltage range is 0.9V-1.1V.

[0086] When the Type-C interface is waterlogged, the CC pin and the GND pin of the Type-C interface are short-circuited or approximately short-circuited, at this time, the voltage level on the CC line is no longer 1V, but drops to close to 0V. Therefore, when the voltage detection value does not meet the preset voltage range, it can be determined that the Type-C interface is waterlogged.

[0087] S28: The test equipment determines that the Type-C interface is not waterlogged and exits the waterlogging detection process.

[0088] S29: It is determined that the test equipment is in a disable state.

[0089] In this implementation, not only can the waterlogging detection process be determined and exited in time, but also the reason for the false triggering of the waterlogging detection can be determined, that is, the recognition of the disable state is realized.

[0090] S30: The test equipment determines that the Type-C interface is waterlogged.

[0091] S31: The test equipment maintains the stop outputting the flip signal to the CC line and grounds the CC line.

[0092] By grounding the CC line, the CC line level can be forcibly pulled low to the ground to protect the test equipment 10 and the device under test 20. At this time, the subsequent test equipment 10 cannot pull the CC line level high through other test functions, so as to ensure that the user knows that the Type-C interface is waterlogged at this time.

[0093] It can be understood that the division of the above steps is only for convenience of explanation and does not constitute a limitation on the technical solutions of the present application. In actual application, the above steps can be adjusted, or the order of the steps can be combined. For example, S28 and S29 can be combined or the order can be exchanged, and S30 and S31 can be combined or the order can be exchanged.

[0094] Further, in order to determine whether the voltage detection value is within the preset voltage range in S27, in another possible implementation, S27 can be replaced by "determining whether the voltage detection value is less than or equal to a second voltage value". The second voltage value is less than the first voltage value, and the second voltage value is a smaller voltage value close to zero. The specific value of the second voltage value is not limited in the embodiments of the present application, for example, the second voltage value can be 0.1V, 0.3V, etc. When the voltage detection value is less than the second voltage value, it indicates that the CC line voltage is close to zero at this time, that is, a short circuit occurs between the CC line and the ground line at this time, and the short circuit is caused by the waterlogging of the Type-C interface.

[0095] Further, after S28 or S29, the test device determines that the current Type-C interface is not waterlogged, and can further determine the type of the device under test according to the voltage value of the CC line. Details are as follows.

[0096] When the voltage detection value is greater than the third voltage value, and the difference between the voltage detection value and the third voltage value is greater than the preset threshold, the test device determines that the device under test is an active device. At this time, the level on the CC line is the state detection level, and the level is pulled high. The preset threshold is not limited in the embodiments of the present application, and the state detection level is taken as 1V direct current level for example. The preset threshold can be set to 0.05V. That is, when the voltage detection value is greater than 1.05V, it is determined that the level is pulled high, and the active device is connected.

[0097] When the voltage detection value is less than the third voltage value, and the difference between the third voltage value and the voltage detection value is greater than the preset threshold, it is determined that the device under test is a load device. The preset threshold is taken as 0.05V for example, that is, when the voltage detection value is less than 0.95V, it is determined that the level is pulled low, and the load device is connected.

[0098] When the absolute value of the difference between the voltage detection value and the third voltage value is less than the preset threshold, it is considered that the level does not change at this time, and it is determined that the device under test is an instrument or a high-impedance device.

[0099] In summary, by using the scheme provided in the embodiments of the present application, the test device can avoid misjudging that the device under test is waterlogged, so that the test device can exit the waterlogging fault detection process in time, and the level of the CC line will not be forced to be pulled low to the ground, thereby reducing the influence on the normal test process. In addition, it can also be used as a recognition scheme of the disable state. When the disable state is recognized, the type of the connected device under test can be further determined. Moreover, the scheme can be completely realized based on the existing hardware circuit of the detection device, without increasing the hardware cost.

[0100] Based on the test method provided in the above embodiments, the present application further provides a test device, which is specifically described below with reference to the accompanying drawings.

[0101] Referring to Figure 6 , the figure is a schematic diagram of a test device provided in the embodiments of the present application.

[0102] The test device 10 at least includes a Type-C connector 12, a CC control module 13, an ADC 14, an ADC 15, a power supply module 16, a processor 17, and a memory 18.

[0103] It can be understood that the interface connection relationship between the modules shown in the embodiments of the present application is only illustrative and does not constitute a structural limitation of the test device 10. In some other embodiments of the present application, the test device 10 can also use different connection modes in the above embodiments, or a combination of multiple interface connection modes. In some other embodiments of the present application, the test device 10 can include more or fewer components than shown, or combine certain components, or split certain components, or different component arrangements. The components shown can be implemented in hardware, software, or a combination of software and hardware.

[0104] The Type-C connector 12 is used to connect the Type-C interface of the device under test through a cable.

[0105] The CC control module 13 is connected to the CC line of the Type-C connector 12, and can output a toggle signal and a state detection level to the CC line.

[0106] The ADC 14 is used to convert the collected analog voltage signal on the CC line into a digital voltage value and send it to the processor 17.

[0107] The ADC 15 is used to convert the collected analog voltage signal on the VBUS into a digital voltage value and send it to the processor 17.

[0108] The power module 16 is used to connect the power line VBUS, and the power module 16 can have an overvoltage protection function and a switching function, and can also be connected to the power input interface of the test device.

[0109] The processor 17 can include one or more processing units, for example: the processor 17 can include a controller, a digital signal processor (digital signal processor, DSP), etc. Different processing units can be independent devices or can be integrated into one or more processors. The controller can generate operation control signals according to instruction operation codes and timing signals to complete the control of fetching instructions and executing instructions. The DSP is used to process the acquired digital signals to realize the corresponding detection function.

[0110] The processor 17 can also be provided with a memory for storing instructions and data. In some embodiments, the memory in the processor 17 is a cache memory. The memory can save instructions or data that the processor 17 has just used or repeatedly uses. If the processor 17 needs to use the instruction or data again, it can be directly called from the memory. Avoid repeated access and reduce the waiting time of the processor 110, thereby improving the efficiency of the system.

[0111] The memory 18 can be used to store computer executable program codes including instructions. The memory 18 can include a program storage area and a data storage area. The program storage area can store an operating system, application programs required by at least one function, and the like. The data storage area can store data (current detection values, voltage detection values, impedance detection values, and the like) created during use of the test device 10. In addition, the memory 18 can include a high-speed random access memory and can also include a non-volatile memory such as at least one magnetic disk storage device, a flash memory device, a universal flash storage (UFS), and the like. The processor 17 executes various test functions implemented by the test device 10 and the device test method provided in the above embodiments of the present application by running instructions stored in the memory 18 and / or instructions stored in a memory provided in the processor.

[0112] The embodiments of the present application also provide a computer readable storage medium for storing a computer program, which, when executed, causes an electronic device to perform the device test method described above. The computer readable storage medium can be a magnetic medium (for example, a floppy disk, a hard disk, a magnetic tape), an optical medium (for example, a DVD), or a semiconductor medium (for example, a solid state disk), and the like.

[0113] The embodiments of the present application also provide a computer program product containing instructions. The computer program product can be software or a program product containing instructions capable of running on an electronic device or stored in any available medium. When the computer program product runs on at least one electronic device, it causes the at least one electronic device to perform the device test method described above. The embodiments of the present application also provide a computer program product containing instructions. When the computer program product runs on at least one electronic device, it causes the at least one electronic device to perform the device test method described above.

[0114] It should be understood that, in the present application, "at least one (term)" means one or more, and "multiple" means two or more. "And / or" is used to describe the association relationship of the associated objects, which means that there can be three relationships, for example, "A and / or B" can mean that there are three cases of only A, only B, and A and B at the same time, where A and B can be singular or plural. The character " / " generally represents an "or" relationship between the associated objects before and after it. "At least one of the following" or similar expressions means any combination of these terms, including any combination of single or multiple terms.

[0115] The above-described embodiments are only used to illustrate the technical solutions of the present application, and not to limit them; although the present application has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that they can still modify the technical solutions recorded in the foregoing embodiments, or make equivalent replacements for part of the technical features; and these modifications or replacements do not make the essence of the corresponding technical solutions deviate from the spirit and scope of the technical solutions of the embodiments of the present application.

Claims

1. A device testing method, characterized in that, Applied to a test equipment, wherein the test equipment is connected to the Type-C interface of the device under test via a cable, the method includes: When the impedance between the configuration channel CC line and the ground line decreases, determine whether the power line voltage is less than a first voltage value and whether the impedance is within the first impedance range. If not, confirm that the Type-C interface has not been exposed to water and exit the water ingress detection process; If so, stop outputting the flip signal to the CC line and obtain the voltage detection value on the CC line; If the voltage detection value does not meet the preset voltage range, it is determined that the Type-C interface has been infiltrated by water; otherwise, it is determined that the Type-C interface has not been infiltrated by water and the water ingress detection process is exited.

2. The method according to claim 1, characterized in that, The preset voltage range is greater than a second voltage value, and the second voltage value is less than the first voltage value. When the voltage detection value meets the preset voltage range, it is determined that the Type-C interface has been infiltrated by water, including: When the detected voltage value is less than or equal to the second voltage value, it is determined that the Type-C interface has been infiltrated by water.

3. The method according to claim 1, characterized in that, The minimum value of the preset voltage range is less than the third voltage value and greater than zero, and the maximum value of the preset voltage range is greater than the third voltage value. The third voltage value is the DC voltage output by the test device to the CC line. Determining water ingress into the Type-C interface when the detected voltage value does not meet the preset voltage range includes: When the voltage detection value is not within the preset voltage range, it is determined that the Type-C interface has been flooded.

4. The method according to claim 1, characterized in that, The step of determining that the Type-C interface has not been exposed to water and exiting the water ingress detection process specifically includes: It was confirmed that the Type-C interface was not exposed to water; Exit the water ingress detection process and confirm that the test equipment is in a disabled state.

5. The method according to claim 1, characterized in that, After determining that the Type-C interface has been infiltrated by water, the method further includes: Maintain the stop output of the toggle signal to the CC line and ground the CC line.

6. The method according to claim 3, characterized in that, After determining that the Type-C interface has not been exposed to water and exiting the water ingress detection process, the method further includes: When the detected voltage value is greater than the third voltage value, and the difference between the detected voltage value and the third voltage value is greater than a preset threshold, the device under test is determined to be an active device. When the detected voltage value is less than the third voltage value, and the difference between the third voltage value and the detected voltage value is greater than the preset threshold, the device under test is determined to be a load device. When the absolute value of the difference between the voltage detection value and the third voltage value is less than the preset threshold, the device under test is determined to be an instrument or a high-impedance device.

7. The method according to claim 3, characterized in that, The preset voltage range is 0.8V to 1.1V.

8. The method according to any one of claims 1-7, characterized in that, The first impedance range is from 5.1 kΩ to 500 kΩ.

9. A testing device, characterized in that, include: Type-C connector, processor, and memory; The Type-C connector is connected to the Type-C interface of the electronic device under test via a cable; The processor is coupled to the memory; The memory is used to store instructions; The processor is used to execute computer programs or instructions stored in the memory to implement the device testing method as described in any one of claims 1-8.

10. A computer-readable storage medium, characterized in that, Used to store a computer program, which, when executed, implements the device testing method according to any one of claims 1 to 8.

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