A detection device and method for automatically batch detecting microplastics

Abstract

The application discloses a kind of detection device and detection method of automatic batch detection microplastic, belong to microplastic detection technical field;Including: microscopic raman module, objective table, automatic sample feeder, sample rack and processor;Wherein microscopic raman module includes microscopic objective, CMOS camera module and spatial raman module;Multiple glass slides are placed on sample rack;Automatic sample feeder includes sampling hand, rotating table and moving assembly;Processor controls automatic sample feeder and places glass slide on objective table on sample rack, CMOS camera module shoots the sample image of sample to be measured, and sample image is transmitted to processor;Spatial raman module detects the raman spectrum of sample to be measured, and raman spectrum is transmitted to processor;Processor compares the raman spectrum of sample to be measured with internal database, and obtains plastic class by neural network algorithm;Processor gathers into detection report with each glass slide corresponding sample image and raman spectrum and identification classification result.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of microplastic detection equipment, in particular to a detection device and method for automatically batch detecting microplastics. BACKGROUND

[0002] Microplastics refer to plastic particles with a particle size of less than 5 millimeters, which are derived from the decomposition of large plastics, the washing of synthetic fibers, and microbeads in personal care products. Microplastics have the characteristics of high stability, small particle size, and strong migration, and can exist in the environment for a long time. They can be transmitted through the food chain by animal feeding and plant enrichment, and can reach the human body, causing harm to the human body. Therefore, it is of great significance to detect microplastics in groundwater.

[0003] At present, the detection equipment for microplastics in groundwater generally has a large volume and needs to be detected in a laboratory. In addition, the existing detection method needs to be manually performed throughout the process, that is, the prepared sample needs to be placed on a microscopic Raman device by manual operation, and then manual focusing and particle identification are performed. The detection efficiency is extremely low, and the detection is not accurate. If there are many samples, they need to be detected one by one manually, which may take several days to complete, thus requiring high labor and time costs. SUMMARY

[0004] One of the main purposes of the present application is to provide a detection device for automatically batch detecting microplastics to solve the problems of large volume, inconvenience, and the need for manual detection of existing detection equipment, low detection efficiency, and inaccuracy.

[0005] The second main purpose of the present application is to provide a detection device and method for automatically batch detecting microplastics to solve the problems of manual detection, low detection efficiency, and inaccuracy in the prior art.

[0006] To solve the above technical problems, the present application is implemented as follows: a detection device for automatically batch detecting microplastics, comprising:

[0007] A microscopic Raman module, the microscopic Raman module comprising a microscopic objective lens, a CMOS camera module, and a spatial Raman module;

[0008] A stage located below the microscopic Raman module, the stage being provided with a slide placing portion below the stage, the slide placing portion being provided with a transmission light source below the slide placing portion, and the bottom of the stage being provided with an adjusting portion for adjusting the position of the stage;

[0009] A sample holder located on one side of the microscopic Raman module, the sample holder being provided with a plurality of glass slides for carrying the samples to be detected;

[0010] The automatic sample feeding device is located on one side of the microscopic Raman module, and comprises a sampling hand, a rotating table and a moving assembly; the rotating table controls the sampling hand to rotate by 360 degrees; the moving assembly controls the sampling hand to move horizontally and vertically; the sampling hand places the glass slide on the sample holder on the object table or places the glass slide on the object table back on the sample holder;

[0011] A processor is electrically connected with the CMOS camera module, the automatic sample feeding device, the spatial Raman module and the adjusting part; the processor controls the automatic sample feeding device to place the sample to be tested on the sample holder on the object table; the CMOS camera module takes a picture of the sample to be tested and transmits the sample image to the processor; the spatial Raman module emits a laser beam and focuses the laser beam on the sample to be tested; the sample to be tested excites a Raman spectrum signal and conducts the signal to the spatial Raman module; the spatial Raman module transmits the Raman spectrum of the sample to be tested to the processor; and the processor compiles the sample image and the Raman spectrum corresponding to each glass slide into a detection report.

[0012] As a further technical solution, the CMOS camera module comprises a dichroic mirror two arranged above the microscopic objective lens, a focusing lens three arranged on one side of the dichroic mirror two, and a CMOS camera arranged on one side of the focusing lens three; the optical center lines of the dichroic mirror two, the focusing lens three and the CMOS camera coincide; and the optical center line of the microscopic objective lens coincides with that of the dichroic mirror two.

[0013] As a further technical solution, the spatial Raman module comprises a dichroic mirror one arranged above the dichroic mirror two, and a band-pass filter, a focusing lens one and a laser arranged in sequence on one side of the dichroic mirror one; the optical center lines of the dichroic mirror one, the band-pass filter, the focusing lens one and the laser coincide; a reflecting mirror is arranged above the dichroic mirror one; a long-wave pass filter, a focusing lens two, an entrance slit and a spectrometer are arranged in sequence on one side of the reflecting mirror; the optical center lines of the reflecting mirror, the long-wave pass filter, the focusing lens two, the entrance slit and the spectrometer coincide; and the optical center lines of the dichroic mirror two, the dichroic mirror one and the reflecting mirror coincide.

[0014] As a further technical solution, the spectrometer is internally provided with a grating, a concave mirror, a collimating mirror and a CCD.

[0015] As a further technical solution, the glass slide placing part is an open slot arranged on one side of the object table close to the automatic sample feeding device; an opening is arranged at one end of the open slot close to the automatic sample feeding device; placing tables for loading glass slides are symmetrically arranged on both sides of the open slot; and the transmission light source is arranged below the open slot.

[0016] As a further technical scheme, two groups of limiting parts are symmetrically arranged on the two sides of the opening groove, the limiting part comprises a limiting rod, a spring and a fixed pin, the limiting rod is arranged along the opening direction of the opening groove, the fixed pin is arranged at the end of the opening groove away from the opening, the end of the limiting rod away from the opening is in sliding connection with the fixed pin, the spring is sleeved outside the fixed pin, and the upper and lower ends of the spring are respectively in abutment with the limiting rod and the object table; an upwardly raised free end is arranged at the end of the limiting rod away from the fixed pin, and a V-shaped pressing part is arranged at a position close to the free end on the limiting rod; when the slide glass is placed on the slide glass placing part, the pressing part is in abutment with the surface of the slide glass.

[0017] As a further technical scheme, the adjusting part comprises a first screw rod slider and a second screw rod slider arranged horizontally, the sliding directions of the first slider on the first screw rod slider and the second slider on the second screw rod slider are perpendicular to each other; the object table is fixed on the first slider of the first screw rod slider, the first screw rod slider is fixed on the second slider of the second screw rod slider, and a fixed bottom plate is arranged below the second screw rod slider.

[0018] As a further technical scheme, two vertical plates are vertically and symmetrically arranged on the two sides of the sample holder, a plurality of object tables are sequentially arranged on each vertical plate along the vertical direction of the vertical plate, and the slide glass is placed on the opposite object tables between the two vertical plates.

[0019] As a further technical scheme, the rotating table comprises a rotating disc and a motor driving the rotating disc to rotate by 360 degrees; the moving assembly comprises a third screw rod slider and a fourth screw rod slider, the third screw rod slider is horizontally and fixedly arranged on the rotating disc, and the fourth screw rod slider is vertically and fixedly arranged on the third slider of the third screw rod slider; the sampling hand is fixedly arranged on the fourth slider of the fourth screw rod slider, the sampling hand is horizontally arranged, and a clamping groove for placing the slide glass is arranged at the end of the sampling hand away from the fourth screw rod slider.

[0020] A detection device method for automatically detecting microplastics in batches, which adopts the detection device for automatically detecting microplastics in batches, and comprises the following steps:

[0021] S1, sequentially placing slide glasses carrying to-be-detected samples on the sample holder and numbering;

[0022] S2, starting the equipment and starting automatic detection;

[0023] S3, the processor controls the automatic sample feeding device to place one of the glass slides on the sample holder on the stage, the processor controls the transmission light source to be turned on, the illumination beam is irradiated on the sample to be measured on the glass slide, the sample particles of the sample to be measured emit scattered light, the scattered light is imaged through the microscope objective, and then reflected to the focusing lens three through the dichroic mirror two, the focusing lens three converges the light beam and focuses the image on the CMOS camera, and the CMOS camera transmits the collected sample image to the processor;

[0024] S4, the processor controls the adjusting part to automatically move the stage according to the preset displacement parameters, so that the microscope objective fully scans the glass slide, and the CMOS camera transmits all sample pictures taken in the scanning process to the processor, and the processor automatically completes picture splicing to form complete sample picture information;

[0025] S5, the processor identifies the sample particles on the picture information, edits the serial number, position coordinates and size of each sample particle, and summarizes the serial number, position coordinates and size of all sample particles on the sample to be measured;

[0026] S6, the processor controls the laser to be turned on, the laser emits a laser beam, the laser beam is shaped through the focusing lens one, a single wavelength laser beam is obtained through the band-pass filter, is reflected through the dichroic mirror one, enters the microscope objective after passing through the dichroic mirror two, and irradiates on the sample to be measured in the glass slide to form a light spot detection area;

[0027] S7, the processor moves the sample particles to the light spot detection area for detection one by one according to the position coordinates of the sample particles and through the control of the adjusting part, the sample particles generate Raman light signals after being excited, the Raman light signals are coupled into the optical fiber through the microscope objective, the dichroic mirror two, the dichroic mirror one, the mirror, the long-wave pass filter and the focusing lens two, the Raman light signals enter the entrance slit to reach the spectrometer, form Raman spectrum after being detected by the spectrometer, and the processor compares the Raman spectrum of the sample to be measured with an internal database to obtain the plastic category through a neural network algorithm;

[0028] S8, after all sample particles on the glass slide are collected, the processor automatically summarizes the sample particle information to form a detection report of the glass slide;

[0029] S9, the processor controls the automatic sample feeding device to take away the glass slide after detection and place it back to the original position, and places the next glass slide on the stage, and starts the next round of scanning detection, and reciprocates in this way.

[0030] The beneficial effects of the application are:

[0031] 1、The application is controlled by the processor to perform all detection steps one by one and automatically, and the detection process does not need real-time participation of manual work, wherein the steps of automatic focusing of the microscopic objective, automatic shooting and uploading of the sample image by the CMOS camera, automatic identification of the sample particle by the processor, and automatic detection of the Raman spectrum of the sample particle can be automatically performed in sequence; and the sample to be detected on each slide will finally form a corresponding detection report and be stored in the processor for later manual checking and tracing. Meanwhile, the application can automatically perform batch sample detection, the detection process does not need real-time participation of manual work, and is automatically performed, which is intelligent, convenient, greatly reduces the labor, improves the detection efficiency, and has high detection accuracy without manual error.

[0032] 2、The microscopic light path and the Raman light path of the CMOS camera are coaxially integrated by the dichroic mirror in the application, and the microscopic light path and the Raman light path are both horizontally arranged, which can shorten the height in the vertical direction, and compared with the traditional microscopic Raman equipment, the overall height is too large. In addition, the structure of the microscopic light path and the Raman light path in the application is simple, thereby further reducing the overall volume. In addition, the microscopic Raman module, the objective table, the automatic sample feeding device, the sample holder, the processor and the like are integrated together in the embodiment, and an external casing can be installed, thereby forming a complete automatic detection equipment, which can realize portability, can perform laboratory detection, and can also be taken to the scene for on-site rapid detection, and has wide application scenarios. Meanwhile, self-checking can be realized after starting, and the operation is simple, thereby eliminating the use threshold. BRIEF DESCRIPTION OF DRAWINGS

[0033] The application will be further described in detail below in combination with the drawings and specific embodiments.

[0034] Figure 1 is a schematic diagram of the three-dimensional structure of the application;

[0035] Figure 2 is a schematic diagram of the three-dimensional structure of another angle in the application;

[0036] Figure 3 is a schematic diagram of the light path inside the microscopic Raman module in the application;

[0037] Figure 4 is Figure 1 is a partial enlarged view of A in the application.

[0038] EXPLANATION OF REFERENCE NUMERALS

[0039] 1, spatial raman module; 10, dichroic mirror one; 11, band-pass filter; 12, focusing lens one; 13, laser; 14, mirror; 15, long-wave pass filter; 16, focusing lens two; 17, entrance slit; 18, spectrometer; 180, grating; 181, concave mirror; 182, collimator; 183, CCD; 19, fifth screw sliding block; 190, fifth sliding block; 2, microscope objective; 20, processor; 3, CMOS camera module; 30, CMOS camera; 31, focusing lens three; 32, dichroic mirror two; 4, stage; 40, open slot; 41, placing table; 410, radian; 5, limiting part; 50, limiting rod; 51, spring; 52, fixing pin; 53, free end; 54, pressing part; 6, adjusting part; 60, first screw sliding block; 61, second screw sliding block; 62, fixed bottom plate; 63, first sliding block; 64, second sliding block; 7, transmission light source; 8, sample holder; 80, vertical plate; 81, placing table; 82, glass slide; 9, automatic sample feeding device; 90, rotating table; 900, turntable; 901, motor; 91, third screw sliding block; 92, third sliding block; 93, fourth screw sliding block; 94, fourth sliding block; 95, sampling hand; 96, clamping groove. DETAILED DESCRIPTION

[0040] The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application. In the following description, many specific details are set forth in order to provide a thorough understanding of the present application, but the present application can also be implemented in other ways different from those described herein, and those skilled in the art can make similar extensions without departing from the concept of the present application, so the present application is not limited to the specific embodiments disclosed below. EMBODIMENT

[0041] As shown in the drawings, Figures 1-4 The present application proposes a detection device for automatically detecting microplastics, comprising a microscopic Raman module and a stage 4 arranged below the microscopic Raman module, wherein the stage 4 is provided with a glass slide placing part for placing a glass slide 82 carrying a sample to be measured. A transmission light source 7 is further arranged below the glass slide placing part to provide an illumination beam. In addition, the microscopic Raman module comprises a microscope objective 2 for scanning the sample to be measured, a CMOS camera module 3 for taking an image of the sample, and a spatial Raman module 1; the spatial Raman module 1 emits a laser beam and focuses the laser beam on the sample to be measured, the sample to be measured excites a Raman spectrum signal, and the Raman spectrum signal is conducted to the spatial Raman module 1.

[0042] Wherein as Figure 3As shown, the CMOS camera module 3 comprises a dichroic mirror two 32 arranged above the microscope objective 2, a focusing lens three 31 arranged on one side of the dichroic mirror two 32, and a CMOS camera 30 arranged on the side of the focusing lens three 31 away from the dichroic mirror two 32. The dichroic mirror two 32 is arranged at an angle of 45 degrees, the optical center lines of the dichroic mirror two 32, the focusing lens three 31 and the CMOS camera 30 coincide, and the optical center line of the microscope objective 2 coincides with that of the dichroic mirror two 32. As shown in the figure, Figure 3 As shown, the spatial Raman module 1 comprises a dichroic mirror one 10 arranged above the dichroic mirror two 32, and a band-pass filter 11, a focusing lens one 12 and a laser 13 arranged in sequence on one side of the dichroic mirror one 10. The dichroic mirror one 10 is arranged at an angle of 45 degrees, the focusing lens one 12 is arranged on the side of the band-pass filter 11 away from the dichroic mirror one 10, and the laser 13 is arranged on the side of the focusing lens one 12 away from the band-pass filter 11. The optical center lines of the dichroic mirror one 10, the band-pass filter 11, the focusing lens one 12 and the laser 13 coincide. In addition, a mirror 14 is arranged above the dichroic mirror one 10, and a long-wave pass filter 15, a focusing lens two 16, an entrance slit 17 and a spectrometer 18 are arranged in sequence on one side of the mirror 14. The mirror 14 is arranged at an angle of 45 degrees, the focusing lens two 16 is arranged on the side of the long-wave pass filter 15 away from the mirror 14, the entrance slit 17 is arranged on the side of the focusing lens two 16 away from the long-wave pass filter 15, and the spectrometer 18 is arranged on the side of the entrance slit 17 away from the focusing lens two 16. The optical center lines of the mirror 14, the long-wave pass filter 15, the focusing lens two 16, the entrance slit 17 and the spectrometer 18 coincide, and the optical center lines of the dichroic mirror two 32, the dichroic mirror one 10 and the mirror coincide. In this embodiment, the laser beam is generated by the laser 13, wherein the laser 13 emits a 785 nm laser beam, the laser beam passes through the focusing lens one 12 and the band-pass filter 11 in sequence, the laser beam is shaped when passing through the focusing lens one 12, a single-wavelength laser beam is obtained after passing through the band-pass filter 11, then the laser beam passes through the dichroic mirror one 10, is reflected by the dichroic mirror one 10 to the dichroic mirror two 32, enters the microscope objective 2, and is focused by the microscope objective 2 to irradiate the sample to be measured (i.e. irradiate the glass slide 82 carrying the sample to be measured). After the sample to be measured is excited, a Raman light signal is generated, the Raman light signal passes through the microscope objective 2, the dichroic mirror two 32, the dichroic mirror one 10, the mirror 14, the long-wave pass filter 15 and the focusing lens two 16 in sequence, is coupled into an optical fiber, and then enters the entrance slit 17 to reach the spectrometer 18. As shown in the figure, Figure 3As shown, the spectrometer 18 is internally provided with a grating 180, a concave mirror 181, a collimating mirror 182 and a CCD 183. The Raman light signal enters the entrance slit 17, is irradiated onto the grating 180 after passing through the collimating mirror 182, is converged onto the CCD (Charge-Coupled Device) 183 after being split by the grating 180, and the information after splitting is detected by the CCD 183 to obtain the Raman spectrum.

[0043] In the embodiment, after the laser beam irradiates the surface of the sample to be measured, the sample to be measured reflects, Rayleigh scatters and Raman scatters. When passing through the long-wave pass filter 15, the long-wave pass filter 15 filters out the reflected light and Rayleigh scattered light signal of the sample to be measured, and passes the Raman scattered light signal. In addition, the spectrometer 18 in the present application is a refrigeration type Raman spectrometer 18. The Raman scattered light enters the refrigeration type Raman spectrometer 18 after passing through the entrance slit 17, so as to obtain the Raman spectrum of the sample. In addition, the dichroic mirror two 32 in the embodiment can integrate the microscopic light path of the CMOS camera 30 and the Raman light path in the system into coaxial light paths, and selectively pass the Raman waveband and reflect the illumination beam generated by the transmission light source 7.

[0044] In addition, the transmission light source 7 in the embodiment selects a transmission type Kohler illumination in the visible light waveband 400-700 nm. The illumination beam irradiates the sample to be measured, wherein there can be multiple sample particles on the sample to be measured. The illumination beam irradiates the sample particles, the sample particles emit scattered light, and the scattered light is imaged by the objective lens. After passing through the 45-degree placed dichroic mirror two 32, the scattered light is reflected and focused on the photosensitive chip of the CMOS camera 30 by the focusing lens three 31. The CMOS camera 30 collects the information and presents the sample particle image. The sample particle image can reflect the morphology and size of the sample particle.

[0045] In the embodiment, the microscopic light path and the Raman light path of the CMOS camera 30 are coaxially integrated through the dichroic mirror two 32, and both the microscopic light path and the Raman light path are horizontally arranged, so as to shorten the height in the vertical direction. Compared with the traditional microscopic Raman equipment, the height is greatly reduced. In addition, the microscopic light path and the Raman light path in the present application have a simple structure, so that the overall volume is reduced. In addition, the microscopic Raman module in the embodiment is integrated with the following objective table 4, automatic sample feeding device 9, sample holder 8, processor 20, etc. An external housing (not shown in the figure) can be installed, so as to form a complete automatic detection equipment. The equipment can be portable, can be used for laboratory detection, and can also be taken to the scene for on-site detection.

[0046] As shown in FIG. 4, the sample holder 8 is provided with a plurality of sample chambers 81, and each sample chamber 81 is provided with a sample chamber cover 82. The sample chamber cover 82 is provided with a sample chamber cover opening 821. The sample chamber cover opening 821 is provided with a sample chamber cover opening cover 822. The sample chamber cover opening cover 822 is provided with a sample chamber cover opening cover opening 8221. The sample chamber cover opening cover opening 8221 is provided with a sample chamber cover opening cover opening cover 8222. The sample chamber cover opening cover opening cover 8222 is provided with a sample chamber cover opening cover opening cover opening cover opening cover 8223. Figure 1As shown, the embodiment also includes a sample rack 8 located at one side of the micro-Raman module; a plurality of glass slides 82 for carrying samples to be tested are placed on the sample rack 8. Two vertical plates 80 are vertically and symmetrically arranged on both sides of the sample rack 8, and a plurality of holders 81 are sequentially arranged on each vertical plate 80 in the vertical direction of the vertical plate 80, and the glass slides 82 are placed on the opposite holders 81 between the two vertical plates 80.

[0047] As shown in Figure 1 , Figure 2 and the embodiment also includes an automatic sample feeding device 9 located at one side of the micro-Raman module, the automatic sample feeding device 9 includes a sampling hand 95, a rotating table 90 and a moving assembly, the rotating table 90 controls the sampling hand 95 to rotate 360 degrees, and the moving assembly controls the sampling hand 95 to move horizontally and vertically; the sampling hand 95 places the glass slide 82 on the sample rack 8 onto the object table 4, or places the glass slide 82 on the object table 4 back onto the sample rack 8. The rotating table 90 includes a rotating disc 900 and a motor 901 driving the rotating disc 900 to rotate 360 degrees (the structure of the motor 901 driving the rotating disc 900 to rotate is prior art, and is not described in detail). The moving assembly includes a third lead screw and nut 91 and a fourth lead screw and nut 93, the third lead screw and nut 91 is horizontally and fixedly arranged on the rotating disc 900, and the fourth lead screw and nut 93 is vertically and fixedly arranged on a third nut 92 of the third lead screw and nut 91. The sampling hand 95 is fixedly arranged on a fourth nut 94 of the fourth lead screw and nut 93, the sampling hand 95 is horizontally arranged, and a clamping groove 96 for placing the glass slide 82 is arranged at an end of the sampling hand 95 away from the fourth lead screw and nut 93. In the embodiment, the rotating table 90 and the moving assembly drive the sampling hand 95 to move to below the corresponding glass slide 82 on the sample rack 8, and the glass slide 82 is correspondingly located at the clamping groove 96 of the sampling hand 95, then the sampling hand 95 moves upward to make the glass slide 82 inside the clamping groove 96, and then the sampling hand 95 moves the glass slide 82 out of the sample rack 8 and onto the object table 4.

[0048] Figure 1 , Figure 2 and Figure 4 ​As shown, the slide placing part on the stage 4 in the present application is an open slot 40 arranged on the side of the stage 4 close to the automatic sample feeding device 9, and the end of the open slot 40 close to the automatic sample feeding device 9 is provided with an opening. The two sides of the open slot 40 are symmetrically provided with placing tables 41 for bearing the slides 82, and the transmission light source 7 is located below the open slot 40. In the present embodiment, the open slot 40 is arranged in the shape of a Chinese character “ ”, wherein the opening of the Chinese character “ ” faces the automatic sample feeding device 9. In the present embodiment, the transmission light source 7 and the stage 4 are in a split structure. In addition, the two sides of the open slot 40 are symmetrically provided with limiting parts 5 for pressing the slides 82, and the limiting part 5 comprises a limiting rod 50, a spring 51 and a fixed pin 52. The limiting rod 50 is arranged along the opening direction of the open slot 40, the fixed pin 52 is arranged at the end of the open slot 40 far from the opening, and the end of the limiting rod 50 far from the opening is in sliding connection with the fixed pin 52, i.e. the fixed pin 52 is arranged through the corresponding end of the limiting rod 50. The spring 51 is arranged outside the fixed pin 52, and the upper end of the spring 51 abuts against the limiting rod 50, and the lower end of the spring 51 abuts against the stage 4. The end of the limiting rod 50 far from the fixed pin 52 is provided with a free end 53 which is upwardly curved, and the position of the limiting rod 50 close to the free end 53 is provided with a V-shaped pressing part 54 which is downwardly bent. When the slide 82 is placed on the slide placing part, the pressing part 54 abuts against the surface of the slide 82. As shown in Figure 1 and Figure 4 As shown, in the present embodiment, the placing table 41 close to the opening end of the open slot 40 is provided with an outwardly expanding arc 410, so that the slide 82 can be conveniently pushed into the placing table 41 (the two sides of the slide 82 are respectively located on the placing table 41). In addition, in the present embodiment, the width of the sampling hand 95 is smaller than the width of the open slot 40. When the slide 82 is placed, the sampling hand 95 first extends into the open slot 40, and gradually pushes the slide 82 from the opening of the open slot 40 to the inside, until the whole slide 82 is pushed onto the placing table 41. The free end 53 of the limiting rod 50 is upwardly curved, so as to widen the distance between the limiting rod 50 and the placing table 41, thereby facilitating the pushing of the slide 82. After the slide 82 is placed in the open slot 40, under the elastic force of the spring 51, the pressing part 54 abuts against the surface of the slide 82, so as to limit the slide 82. The sampling hand 95 first moves downwardly and away from the slide 82, and then moves away from the stage 4 in the direction away from the stage 4.

[0049] In addition, as shown in Figure 1 and Figure 2As shown, the bottom of the object table 4 is provided with an adjusting part 6 for adjusting the position of the object table 4; the adjusting part 6 includes a horizontally arranged first screw rod slider 60 and a second screw rod slider 61, the sliding directions of a first slider 63 on the first screw rod slider 60 and a second slider 64 on the second screw rod slider 61 are perpendicular to each other; the object table 4 is fixed on the first slider 63 of the first screw rod slider 60, the first screw rod slider 60 is fixed on the second slider 64 of the second screw rod slider 61, and a fixed bottom plate 62 is fixedly arranged below the second screw rod slider.

[0050] As shown in Figure 1 and Figure 2 As shown, one side of the microscopic Raman module in the embodiment is provided with a fifth screw rod slider 19 for driving it to move towards or away from the object table 4, the fifth screw rod slider 19 is fixedly arranged, and the microscopic Raman module is fixed on a fifth slider 190 of the fifth screw rod slider 19. The fifth screw rod slider 19 can adjust the position of the microscopic Raman module, so as to adjust the distance between the microscopic objective lens 2 and the glass slide 82, and automatically focus according to the actual situation.

[0051] As shown in Figure 3 As shown, the embodiment further includes a processor 20, wherein the CMOS camera module 3, the automatic sample feeding device 9, the spatial Raman module 1, the adjusting part 6 of the object table 4, and the fifth screw rod slider 19 are electrically connected to the processor 20. The processor 20 controls the automatic sample feeding device 9 to place the glass slide 82 on the sample rack 8 onto the object table 4 for detection. And the processor 20 controls the fifth screw rod slider 19 to drive the microscopic Raman module to move, so as to realize automatic focusing. The CMOS camera module 3 is responsible for transmitting the photographed sample image on each glass slide 82 to the processor 20; the spatial Raman module 1 transmits the Raman spectrum of the sample on each glass slide 82 to the processor 20; the processor 20 compares the Raman spectrum of the sample to be tested with the internal database, obtains the plastic category through the neural network algorithm; and the processor 20 summarizes the sample image, the Raman spectrum and the plastic category information corresponding to each glass slide 82 into a detection report.

[0052] The microplastic detection device in the embodiment can be applied to detect microplastics in underground water, soil or atmosphere and other fields. Embodiment

[0053] As shown in Figures 1-4 A detection device method for automatically batch detecting microplastics, using the above-mentioned detection device for automatically batch detecting microplastics, includes the following steps:

[0054] S1, manually place the prepared glass slide 82 carrying the sample to be tested on the sample rack 8 in sequence and number (the number can be numbered according to the number of layers of the sample rack, and the glass slide on each layer corresponds to the number of layers of the sample rack on that layer, which is input into the processor in advance).

[0055] S2, the device is powered on, and an automatic detection mode is started;

[0056] S3, the processor 20 controls the automatic sample feeding device 9 to place one of the glass slides 82 on the sample holder 8 onto the object table 4; the processor 20 controls the transmission light source 7 to turn on, and the illumination light beam is irradiated onto the sample to be detected on the glass slide 82 (wherein the processor 20 can automatically focus the microscope objective 2 by adjusting the fifth lead screw module 19); the sample particles of the sample to be detected emit scattered light, the scattered light is imaged by the microscope objective 2, and then reflected to the focusing lens three 31 by the dichroic mirror two 32, the focusing lens three 31 collects the light beam and focuses the image on the CMOS camera 30, and the CMOS camera 30 transmits the collected sample image to the processor 20.

[0057] S4, the processor 20 controls the adjusting part 6 to automatically move the object table 4 according to the preset displacement parameters, so that the microscope objective 2 fully scans the glass slide 82, and the CMOS camera 30 transmits all the sample pictures taken during the scanning process to the processor 20, and the processor 20 automatically completes picture stitching to form complete sample picture information; wherein the displacement parameters can be preset according to the actual size of the glass slide 82, so that the microscope objective 2 completely scans the glass slide 82.

[0058] S5, the processor 20 identifies the sample particles on the picture information, and performs serial number editing, position coordinate editing and size measurement on each sample particle, and summarizes the serial numbers, position coordinates and sizes of all sample particles on the sample to be detected.

[0059] S6, the processor 20 controls the laser 13 to turn on, the laser 13 emits a laser beam, the laser is shaped by the focusing lens one 12, a single wavelength laser beam is obtained through the band-pass filter 11, is reflected through the dichroic mirror one 10, enters the microscope objective 2 after passing through the dichroic mirror two 32, and forms a light spot detection area on the glass slide 82.

[0060] S7, the processor 20 moves the sample particles one by one to the light spot detection area for detection according to the position coordinates of the sample particles and by controlling the adjusting part 6, the sample particles generate Raman light signals after being excited in the light spot detection area, the Raman light signals are coupled into the optical fiber through the microscope objective 2, the dichroic mirror two 32, the dichroic mirror one 10, the mirror 14, the long-wave pass filter 15 and the focusing lens two 16, the Raman light signals enter the entrance slit 17 to reach the spectrometer 18, and the Raman spectrum is formed after the detection of the spectrometer 18; wherein after the Raman light signals enter the entrance slit 17, they are irradiated onto the grating 180 after passing through the collimating mirror 182, the light is converged onto the CCD 183 after being split by the grating 180, and the Raman spectrum is obtained by the CCD 183 detecting the split information. The processor 20 compares the Raman spectrum of the sample to be tested with the internal database, and obtains the plastic category through the neural network algorithm;

[0061] S8, all sample particles are detected in sequence according to the serial numbers of all sample particles on the slide 82, and the processor 20 automatically summarizes the information of all sample particles on the slide 82 to form a detection report of the slide 82.

[0062] S9, the processor 20 controls the automatic sample feeding device 9 to take away the slide 82 after detection and place it back to the original position, and places the next slide 82 on the stage 4, and starts the next round of scanning detection, and so on. The detection of the slides 82 on the sample holder 8 can be performed in sequence from top to bottom or from bottom to top, or in other sequences.

[0063] In this embodiment, all detection steps are controlled by the processor 20 and performed automatically one by one without human intervention, and the automatic focusing, automatic shooting and uploading of sample images, automatic identification of sample particles, automatic detection of Raman spectrum of sample particles and other steps are automatically performed in sequence; and the samples to be tested on each slide 82 will finally form a corresponding detection report and be stored in the processor 20 for later manual checking. Each slide 82 on the sample holder 8 is numbered, and each detection report corresponds to the number of one slide 8, so as to ensure the clarity of the detection report and the traceability in the later period.

[0064] In addition, all of the lead screws and sliding blocks in the first and second embodiments are prior art, and the working principle of the lead screw and sliding block is not repeated. In addition, the processor 20 controls the automatic sample feeding device 9, the adjusting part 6, the fifth lead screw and sliding block 19, the microscopic Raman module and other work in sequence through a computer program, and the processor automatically performs picture stitching, automatic identification of sample particles, numbering of sample particles, position coordinate marking and size measurement, all of which are performed by a computer control program. The control program is prior art.

[0065] The above description is merely the preferred embodiments of the present application, and obviously, the described embodiments are only a part but not all of the embodiments of the present application. Based on the embodiments in the present application, all the other embodiments obtained by those of ordinary skill in the art without creative work fall within the protection scope of the present application.

Claims

1. A detection device for automatically detecting microplastics in batch, characterized in that, The application relates to a micro-Raman module, a sample stage, an automatic sample feeding device and a processor. The micro-Raman module comprises a microscope objective, a CMOS camera module and a spatial Raman module. The sample stage is arranged below the micro-Raman module and is provided with a slide placing part. The automatic sample feeding device is arranged on one side of the micro-Raman module and comprises a sampling hand, a rotating table and a moving assembly. The rotating table controls the sampling hand to rotate by 360 degrees, and the moving assembly controls the sampling hand to move horizontally and vertically. The sampling hand places the glass slide on the sample stage or places the glass slide on the sample stage back to the sample rack.

2. The detection device for automatically detecting microplastics in batches according to claim 1, characterized in that, The CMOS camera module, the automatic sample feeding device, the spatial Raman module and the adjusting part are electrically connected with the processor. The processor controls the automatic sample feeding device to sequentially place the sample on the sample stage for detection. The CMOS camera module photographs the sample and transmits the photographed sample image to the processor. The processor controls the adjusting part to automatically move the sample stage so that the microscope objective can fully scan the glass slide. The CMOS camera transmits all the sample pictures photographed in the scanning process to the processor. The processor automatically completes picture splicing to form complete sample picture information. The processor controls the spatial Raman module to emit a laser beam and concentrate the laser beam on the sample to form a light spot detection area. The processor moves the sample particle to the light spot detection area for detection according to the position coordinates of the sample particle. The sample particle excites a Raman spectrum signal and conducts the Raman spectrum signal to the spatial Raman module. The spatial Raman module transmits the Raman spectrum of the sample to the processor. The processor compares the Raman spectrum of the sample with an internal database, obtains the plastic category through a neural network algorithm and compiles a detection report of the sample image and the Raman spectrum corresponding to each glass slide. The CMOS camera module comprises a dichroic mirror two arranged above the microscope objective, a focusing lens three arranged on one side of the dichroic mirror two and a CMOS camera arranged on one side of the focusing lens three. The optical center lines of the dichroic mirror two, the focusing lens three and the CMOS camera coincide. The optical center lines of the microscope objective and the dichroic mirror two coincide.

3. The detection device for automatically detecting microplastics in batches according to claim 2, characterized in that, The spatial Raman module comprises dichroic mirror 1 arranged above dichroic mirror 2, and band-pass filter, focusing lens 1 and laser arranged in sequence on one side of dichroic mirror 1; the optical center lines of dichroic mirror 1, band-pass filter, focusing lens 1 and laser coincide; a reflector is arranged above dichroic mirror 1, and long-wave pass filter, focusing lens 2, entrance slit and spectrometer are arranged in sequence on one side of the reflector; the optical center lines of the reflector, long-wave pass filter, focusing lens 2, entrance slit and spectrometer coincide; the optical center lines of dichroic mirror 2, dichroic mirror 1 and the reflector coincide.

4. The detection device for automatically detecting microplastics in batches according to claim 3, characterized in that, The spectrometer is internally provided with a grating, a concave mirror, a collimating mirror and a CCD. 5.The detection device of claim 1, wherein The slide placing part is an open groove arranged on the side of the object table close to the automatic sample feeding device, an opening is arranged at the end of the open groove close to the automatic sample feeding device, placing tables for carrying the slides are symmetrically arranged on the two sides of the open groove, and the transmission light source is arranged below the open groove.

6. The detection device for automatically batch detecting microplastics according to claim 5, wherein, Two groups of limiting parts are symmetrically arranged on the two sides of the open groove, the limiting part comprises a limiting rod, a spring and a fixed pin, the limiting rod is arranged along the opening direction of the open groove, the fixed pin is arranged at the end of the open groove away from the opening, the end of the limiting rod away from the opening is in sliding connection with the fixed pin, the spring is sleeved outside the fixed pin, and the upper and lower ends of the spring are in abutment with the limiting rod and the object table respectively, a free end upwardly protruding is arranged at the end of the limiting rod away from the fixed pin, and a V-shaped pressing part is arranged at a position on the limiting rod close to the free end, when the slide is placed on the slide placing part, the pressing part is in abutment with the surface of the slide.

7. The detection device for automatically detecting microplastics in batches according to claim 1, wherein, The adjusting part comprises a first screw rod slider and a second screw rod slider arranged horizontally, the sliding directions of the first slider on the first screw rod slider and the second slider on the second screw rod slider are perpendicular to each other, the object table is fixed on the first slider of the first screw rod slider, the first screw rod slider is fixed on the second slider of the second screw rod slider, and a fixed bottom plate is arranged below the second screw rod slider. 8.The detection device of claim 1, wherein, Two vertical plates are vertically and symmetrically arranged on the two sides of the sample holder, a plurality of placing tables are arranged in sequence on each vertical plate along the vertical direction of the vertical plate, and the slide is placed on the opposite placing tables between the two vertical plates. 9.The detection device of claim 1, wherein, The rotating table comprises a rotating disc and a motor driving the rotating disc to rotate by 360 degrees, the moving assembly comprises a third screw rod slider and a fourth screw rod slider, the third screw rod slider is horizontally and fixedly arranged on the rotating disc, and the fourth screw rod slider is vertically and fixedly arranged on the third slider of the third screw rod slider, the sampling hand is fixedly arranged on the fourth slider of the fourth screw rod slider, the sampling hand is arranged horizontally, and a clamping groove for placing the slide is arranged at the end of the sampling hand away from the fourth screw rod slider.

10. A method for detecting microplastics in an automatic batch detection device, using the automatic batch detection device according to any one of claims 1-9, characterized in that, The method comprises the following steps: S1, placing the slide carrying the sample to be measured on the sample holder in sequence and numbering; S2, starting the equipment and starting the automatic detection; S3, the processor controls the automatic sample feeding device to place one of the slides on the sample holder onto the stage, the processor controls the transmission light source to turn on, the illumination beam is irradiated onto the sample to be measured on the slide, the sample particles of the sample to be measured emit scattered light, the scattered light is imaged through the microscope objective, and then reflected to the focusing lens three through the dichroic mirror two, the focusing lens three converges the light beam and focuses the image on the CMOS camera, and the CMOS camera transmits the collected sample image to the processor; S4, the processor controls the adjusting part to automatically move the stage according to the preset displacement parameters, so that the microscope objective fully scans the slide, and the CMOS camera transmits all the sample pictures taken during the scanning process to the processor, and the processor automatically completes picture splicing to form complete sample picture information; S5, the processor identifies the sample particles on the picture information, edits the serial number, position coordinates and size of each sample particle, and summarizes the serial number, position coordinates and size of all sample particles on the sample to be measured; S6, the processor controls the laser to turn on, the laser emits a laser beam, the laser beam is shaped through the focusing lens one, a single wavelength laser beam is obtained through the band-pass filter, is reflected through the dichroic mirror one, enters the microscope objective through the dichroic mirror two, and irradiates onto the sample to be measured in the slide to form a spot detection area; S7, the processor moves the sample particles to the spot detection area one by one for detection according to the position coordinates of the sample particles and through the control of the adjusting part, the sample particles generate Raman light signals after being excited, the Raman light signals are coupled into the optical fiber through the microscope objective, the dichroic mirror two, the dichroic mirror one, the mirror, the long-wave pass filter and the focusing lens two, the Raman light signals enter the entrance slit to reach the spectrometer, form a Raman spectrum after being detected by the spectrometer, and the processor compares the Raman spectrum of the sample to be measured with an internal database to obtain the plastic category through a neural network algorithm; S8, after all the sample particles on the slide are collected, the processor automatically summarizes the sample particle information to form a detection report of the slide; S9, the processor controls the automatic sample feeding device to take away the slide after detection and place it back to the original position, and places the next slide onto the stage, and starts the next round of scanning detection, and repeats the above steps.

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