Full-range power module dynamic test platform and design method thereof

Abstract

The invention provides a full-range power module dynamic test platform and a design method thereof. The method comprises the steps of obtaining a minimum inductance value of a maximum current building inductor based on minimum currents of different modules under the same voltage level, maximum voltages of different modules under the same current level and a minimum value of tested time of a tested power device; based on the maximum current of different modules under the same voltage level, the minimum voltage of different modules under the same current level and the maximum value of the measured time of the measured power device, the maximum inductance value of the minimum current building inductor is obtained; determining an inductance value range of the current building inductor based on the minimum inductance value of the maximum current building inductor and the maximum inductance value of the minimum current building inductor; any value is selected in the inductance value range of the current building inductor, and the capacitance value range of the supporting capacitor unit is obtained based on the inductance value of the selected current building inductor, the current of the current building inductor, the ratio of the capacitance voltage drop value to the capacitance voltage after the supporting capacitor unit charges the current building inductor and the voltage of the adjustable direct-current power supply; obtaining the resistance value of the bleeder resistor based on the voltage of the adjustable DC power supply and the rated current of the bleeder resistor in the bleeder circuit; obtaining the average power of the bleeder resistor based on the resistance value of the bleeder resistor and the voltage of the adjustable DC power supply; and the test platform is designed based on the inductance value range of the current building inductor, the capacitance value range of the support capacitor unit, the resistance value of the bleeder resistor and the average power.

Description

Technical Field

[0001] This invention relates to the field of semiconductor device testing technology, and in particular to a dynamic testing platform for a full-range power module and its design method. Background Technology

[0002] Power electronics technology is based on power electronic devices, which determine the development and application level of power electronic devices. Currently, power devices such as SiC MOSEFETs and IGBTs hold a dominant position in the medium- and high-voltage power conversion fields and are widely used in rail transportation, industrial frequency converters, electric vehicles, and power transmission and distribution. Dynamic testing platforms for power devices play a crucial role in studying device characteristics, driver and converter design and optimization, and fault analysis.

[0003] The power device test platform consists of a charging circuit, an inductor, a capacitor, power devices, and a discharging circuit.

[0004] However, existing testing platforms have the following drawbacks:

[0005] 1. It is difficult to test modules with all power levels currently on the market; it can only test one or a few modules.

[0006] 2. There is no systematic parameter calculation, and the coupling relationship between parameters is difficult to set, resulting in low parameter accuracy;

[0007] 3. It is difficult to meet the parallel testing requirements of high-power modules, and can only meet the parallel testing requirements of medium and low-power modules;

[0008] 4. The cost is relatively high. Summary of the Invention

[0009] This invention provides a dynamic testing platform for full-range power modules and its design method, which can solve the above-mentioned technical problems.

[0010] This invention provides a design method for a dynamic test platform for a full-range power module, the method comprising:

[0011] The minimum inductance value of the maximum current-building inductance is obtained based on the minimum current of different modules under the same voltage level, the maximum voltage of different modules under the same current level, and the minimum test time of the power device under test.

[0012] The maximum inductance value of the minimum build-up current inductance is obtained based on the maximum current of different modules under the same voltage level, the minimum voltage of different modules under the same current level, and the maximum test time of the power device under test.

[0013] The range of values ​​for the building current inductance is determined based on the minimum inductance value of the maximum building current inductance and the maximum inductance value of the minimum building current inductance.

[0014] Select any value within the range of inductance values ​​for the current-building inductor, and obtain the capacitance value range of the supporting capacitor unit based on the selected inductance value, the current of the current-building inductor, the ratio of the voltage drop of the capacitor after the supporting capacitor unit charges the current-building inductor to the capacitor voltage, and the voltage of the adjustable DC power supply.

[0015] The resistance value of the bleeder resistor is obtained based on the voltage of the adjustable DC power supply and the rated current of the bleeder resistor in the bleeder circuit.

[0016] The average power of the bleed resistor is obtained based on the resistance value of the bleed resistor and the voltage of the adjustable DC power supply.

[0017] The test platform is designed based on the inductance range of the building current inductor, the capacitance range of the supporting capacitor unit, the resistance value of the bleeder resistor, and the average power.

[0018] Preferably, the minimum inductance value of the maximum current-building inductance is obtained by the following formula:

[0019]

[0020] In the formula, L max For maximum current-carrying inductance, I min V represents the minimum current for different modules at the same voltage level. max t represents the maximum voltage of different modules at the same current rating. min This represents the minimum test time for the power device under test.

[0021] Preferably, the maximum inductance value of the minimum current-building inductance is obtained by the following formula:

[0022]

[0023] In the formula, L min For minimum build-up inductance, I max V represents the maximum current of different modules at the same voltage level. min t represents the minimum voltage of different modules at the same current rating. max This represents the maximum test time for the power device under test.

[0024] Preferably, the capacitance range of the supporting capacitor unit is obtained by the following formula:

[0025]

[0026] In the formula, C is the capacitance value of the supporting capacitor unit, L is the inductance value of the selected current-building inductor, and I... L To build up the current in the inductor, k DC U is the ratio of the voltage drop across the capacitor after the supporting capacitor cell charges the current-carrying inductor to the total capacitor voltage.DC The voltage of the adjustable DC power supply.

[0027] Preferably, the resistance value of the bleeder resistor is obtained by the following formula:

[0028]

[0029] In the formula, R is the resistance of the bleeder resistor, and U DC For the voltage of the adjustable DC power supply, I R This is the rated current of the bleed resistor.

[0030] Preferably, the average power of the bleeder resistor is obtained by the following formula:

[0031]

[0032] In the formula, P is the average power of the discharge resistor, ΔE is the energy change difference of the supporting capacitor unit before and after discharge, Δt is the capacitance value of the supporting capacitor unit, and U is the capacitance value of the supporting capacitor unit. DC The voltage of the adjustable DC power supply is denoted by n, the discharge time coefficient of the supporting capacitor unit is denoted by R, and the resistance value of the discharge resistor is denoted by R.

[0033] According to another aspect of the present invention, a full-range power module dynamic test platform is provided, the platform comprising an adjustable DC power supply, a DC charging switch, a support capacitor unit, a discharge circuit, a decoupling circuit, a freewheeling diode unit, and a current-building inductor;

[0034] The adjustable DC power supply is connected in series with the DC charging switch and then connected in parallel with the supporting capacitor unit, the bleeder circuit, and the decoupling circuit in sequence; the freewheeling diode unit and the current-building inductor are connected in parallel, one end of which is connected to one end of the decoupling circuit, and the other end serves as the first connection terminal of the power device under test; the other end of the decoupling circuit serves as the second connection terminal of the power device under test, and the first connection terminal and the second connection segment are used to connect several power devices under test connected in parallel;

[0035] The parameters of each component in the test platform are designed using any of the methods described above.

[0036] Preferably, the supporting capacitor unit includes several supporting capacitors connected in parallel; the freewheeling diode unit includes several freewheeling diodes connected in parallel, with the negative terminals of each freewheeling diode connected in parallel and then connected to one end of the decoupling circuit, and the positive terminals of each freewheeling diode connected in parallel serving as the first connection terminal of the power device under test; the bleeder circuit includes a bleeder switch and a bleeder resistor, with one end of the bleeder switch connected to one end of the decoupling circuit and the other end connected to one end of the bleeder resistor, and the other end of the bleeder resistor connected to the other end of the decoupling circuit; the current-building inductor is an air-core inductor; and the decoupling circuit uses a decoupling capacitor.

[0037] Preferably, the maximum voltage output by the adjustable DC power supply is greater than the voltage of the power device under test.

[0038] Preferably, the rated voltage of the DC charging switch is greater than the maximum test voltage, and the rated current of the DC charging switch is greater than the output current of the adjustable DC power supply.

[0039] Preferably, the rated voltage of the discharge switch is greater than the maximum test voltage, and the rated current of the discharge switch is greater than the discharge output current.

[0040] Preferably, the rated current of the discharge resistor is less than the ripple current of the supporting capacitor unit and the rated current of the DC charging switch and the discharge switch.

[0041] Compared with the prior art, the present invention has the following advantages when applying its technical solution:

[0042] 1. It can perform functional testing on all power modules on the market and can design power modules for specific targets;

[0043] 2. It has a systematic parameter calculation method, and there is no coupling relationship between parameters, making the parameter calculation simple and accurate;

[0044] 3. Meets the requirements for parallel testing of high-power modules, not just low- and medium-power modules;

[0045] 4. Lower cost. Attached Figure Description

[0046] The accompanying drawings, which form part of this specification, are provided to further illustrate embodiments of the invention and, together with the textual description, explain the principles of the invention. It is obvious that the drawings described below are merely some embodiments of the invention, and those skilled in the art can obtain other drawings based on these drawings without any creative effort.

[0047] Figure 1A flowchart illustrating a design method for a full-range power module dynamic test platform according to an embodiment of the present invention is shown.

[0048] Figure 2 The diagram shows the current-voltage curves of a full-range power module dynamic test platform provided according to an embodiment of the present invention.

[0049] Figure 3 A circuit diagram of a full-range power module dynamic test platform provided according to an embodiment of the present invention is shown;

[0050] Figure 4 A circuit diagram of a full-range power module dynamic test platform provided according to another embodiment of the present invention is shown; Detailed Implementation

[0051] It should be noted that, unless otherwise specified, the embodiments and features described in this application can be combined with each other. The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only a part of the embodiments of the present invention, and not all of them. The following description of at least one exemplary embodiment is merely illustrative and is in no way intended to limit the present invention or its application or use. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0052] It should be noted that the terminology used herein is for the purpose of describing particular embodiments only and is not intended to limit the exemplary embodiments according to this application. As used herein, the singular form is intended to include the plural form as well, unless the context clearly indicates otherwise. Furthermore, it should be understood that when the terms "comprising" and / or "including" are used in this specification, they indicate the presence of features, steps, operations, devices, components, and / or combinations thereof.

[0053] Unless otherwise specifically stated, the relative arrangement, numerical expressions, and values ​​of the components and steps set forth in these embodiments do not limit the scope of the invention. It should also be understood that, for ease of description, the dimensions of the various parts shown in the drawings are not drawn to actual scale. Techniques, methods, and devices known to those skilled in the art may not be discussed in detail, but where appropriate, such techniques, methods, and devices should be considered part of the specification. In all examples shown and discussed herein, any specific values ​​should be interpreted as merely exemplary and not as limitations. Therefore, other examples of exemplary embodiments may have different values. It should be noted that similar reference numerals and letters in the following figures denote similar items; therefore, once an item is defined in one figure, it need not be further discussed in subsequent figures.

[0054] like Figure 1 As shown, this invention provides a design method for a dynamic test platform for a full-range power module, the method comprising:

[0055] The minimum inductance value of the maximum current-building inductance is obtained based on the minimum current of different modules under the same voltage level, the maximum voltage of different modules under the same current level, and the minimum test time of the power device under test.

[0056] The maximum inductance value of the minimum build-up current inductance is obtained based on the maximum current of different modules under the same voltage level, the minimum voltage of different modules under the same current level, and the maximum test time of the power device under test.

[0057] The range of values ​​for the building current inductance is determined based on the minimum inductance value of the maximum building current inductance and the maximum inductance value of the minimum building current inductance.

[0058] Select any value within the range of inductance values ​​for the current-building inductor, and obtain the capacitance value range of the supporting capacitor unit based on the selected inductance value, the current of the current-building inductor, the ratio of the voltage drop of the capacitor after the supporting capacitor unit charges the current-building inductor to the capacitor voltage, and the voltage of the adjustable DC power supply.

[0059] The resistance value of the bleeder resistor is obtained based on the voltage of the adjustable DC power supply and the rated current of the bleeder resistor in the bleeder circuit.

[0060] The average power of the bleed resistor is obtained based on the resistance value of the bleed resistor and the voltage of the adjustable DC power supply.

[0061] The test platform is designed based on the inductance range of the building current inductor, the capacitance range of the supporting capacitor unit, the resistance value of the bleeder resistor, and the average power.

[0062] Compared with the prior art, the present invention has the following beneficial effects:

[0063] 1. It can perform functional testing on all power modules on the market and can design power modules for specific targets;

[0064] 2. It has a systematic parameter calculation method, and there is no coupling relationship between parameters, making the parameter calculation simple and accurate;

[0065] 3. Meets the requirements for parallel testing of high-power modules, not just low- and medium-power modules;

[0066] 4. Lower cost.

[0067] According to one embodiment of the present invention, the current-building inductor is used during the first pulse t1 to t2 (e.g. Figure 2 (As shown) Establish the required induced current and make this induced current nearly constant during the switching transients that need to be observed. Figure 2 In the diagram, the horizontal axis t represents time, where t1 is the start time of the first pulse, t2 is the stop time of the first pulse, t3 is the start time of the second pulse, and t4 is the stop time of the second pulse; the vertical axis represents the current and voltage values, respectively, where I... c V represents the current of the power device under test. ce V is the voltage of the power device under test. ge This is the gate drive voltage.

[0068] Specifically, the minimum inductance value of the maximum current-building inductance is obtained using the following formula:

[0069]

[0070] In the formula, L max For maximum current-carrying inductance, I min V represents the minimum current for different modules at the same voltage level. max t represents the maximum voltage of different modules at the same current rating. min This represents the minimum test time for the power device under test.

[0071] In this context, considering the device's turn-on and turn-off delay times, as well as rise and fall times, t is set. min Value, where V max / I min Select the maximum value from the datasheets of each power device manufacturer.

[0072] Specifically, the maximum inductance value of the minimum current-building inductance is obtained using the following formula:

[0073]

[0074] In the formula, L min For minimum build-up inductance, I maxV represents the maximum current of different modules at the same voltage level. min t represents the minimum voltage of different modules at the same current rating. max This represents the maximum test time for the power device under test.

[0075] Among them, t max >t min Considering the characteristics of power devices, the duration should not be too long; it is recommended to be less than 1000 μs. max / V min Select the minimum value from the datasheets of each power device manufacturer.

[0076] According to one embodiment of the present invention, the function of the supporting capacitor unit is to provide energy to establish load current during the first pulse t1~t2 after the programmable power supply is fully charged and disconnected by the DC charging switch K1. Considering the change in capacitor voltage ΔU after the capacitor energy charges the current-establishing inductor after the first pulse t1~t2, the supporting capacitor unit provides energy to establish load current. DC Based on the energy transfer relationship between capacitors and inductors, the range of capacitance values ​​for supporting capacitor units can be obtained as follows:

[0077]

[0078] Where k DC This refers to the ratio of the voltage drop across the capacitor after it charges the inductor to the total capacitor voltage. Ideally, this ratio should be between 1% and 5%, so that the capacitor voltage change after the first pulse is not significant. Because k... DC The value is very small, so the above formula can be simplified to:

[0079]

[0080] In the formula, C is the capacitance value of the supporting capacitor unit, L is the inductance value of the selected current-building inductor, and I... L To build up the current in the inductor, k DC U is the ratio of the voltage drop across the capacitor after the supporting capacitor cell charges the current-carrying inductor to the total capacitor voltage. DC The voltage of the adjustable DC power supply.

[0081] According to one embodiment of the present invention, the average power of the discharge resistor in the discharge circuit depends on the test time interval, i.e., the test frequency, and the magnitude of the initial voltage. The time for the capacitor to discharge energy is set to nτ, where n can be 3 to 5, and τ = R·C. DC The average power of the bleeder resistor during this stage is

[0082]

[0083] In the formula, P is the average power of the discharge resistor, ΔE is the energy change difference of the supporting capacitor unit before and after discharge, Δt is the capacitance value of the supporting capacitor unit, and U is the capacitance value of the supporting capacitor unit. DC The voltage of the adjustable DC power supply is denoted by n, the discharge time coefficient of the supporting capacitor unit is denoted by R, and the resistance value of the discharge resistor is denoted by R.

[0084] The resistance value of the bleeder resistor can be obtained using the following formula:

[0085]

[0086] In the formula, R is the resistance of the bleeder resistor, and U DC For the voltage of the adjustable DC power supply, I R This is the rated current of the bleed resistor.

[0087] like Figure 3 As shown, the present invention also provides a full-range power module dynamic test platform, the platform including an adjustable DC power supply, a DC charging switch, a support capacitor unit, a discharge circuit, a decoupling circuit, a freewheeling diode unit and a current-building inductor;

[0088] The adjustable DC power supply is connected in series with the DC charging switch and then connected in parallel with the supporting capacitor unit, the bleeder circuit, and the decoupling circuit in sequence; the freewheeling diode unit and the current-building inductor are connected in parallel, one end of which is connected to one end of the decoupling circuit, and the other end serves as the first connection terminal of the power device under test; the other end of the decoupling circuit serves as the second connection terminal of the power device under test, and the first connection terminal and the second connection segment are used to connect several power devices under test connected in parallel;

[0089] The parameters of each component in the test platform are designed using any of the methods described above.

[0090] According to one embodiment of the present invention, the supporting capacitor unit includes a plurality of supporting capacitors connected in parallel; the freewheeling diode unit includes a plurality of freewheeling diodes connected in parallel, wherein the negative terminals of each freewheeling diode are connected in parallel and then connected to one end of the decoupling circuit, and the positive terminals of each freewheeling diode are connected in parallel and then serve as the first connection terminal of the power device under test; the bleeder circuit includes a bleeder switch and a bleeder resistor, wherein one end of the bleeder switch is connected to one end of the decoupling circuit, and the other end is connected to one end of the bleeder resistor, and the other end of the bleeder resistor is connected to the other end of the decoupling circuit; the current-building inductor is an air-core inductor; and the decoupling circuit is a decoupling capacitor.

[0091] According to one embodiment of the present invention, the adjustable DC power supply UDC provides an adjustable power voltage level to support the charging of the capacitor unit. It should have constant current output and constant voltage output modes, and the maximum voltage output by the adjustable DC power supply is greater than the voltage of the power device under test.

[0092] According to one embodiment of the present invention, a DC charging switch K1 is used to switch the charging of an adjustable DC power supply and a supporting capacitor unit. The rated voltage of the DC charging switch is greater than the maximum test voltage and has a certain margin. The rated current of the DC charging switch is greater than the output current of the adjustable DC power supply and has a certain margin.

[0093] According to one embodiment of the present invention, the discharge switch K2 is used to control the on / off of the discharge of the supporting capacitor unit. The rated voltage of the discharge switch is greater than the maximum test voltage and has a certain margin. The rated current of the discharge switch is greater than the discharge output current and has a certain margin.

[0094] According to one embodiment of the present invention, the rated current of the discharge resistor is less than the ripple current of the supporting capacitor unit and the rated current of the DC charging switch and the discharge switch, with a certain margin.

[0095] To gain a further understanding of the present invention, the following description is provided in conjunction with... Figure 4 The present invention provides a detailed description of the full-range power module dynamic test platform and its design method.

[0096] In this embodiment, the test object is designed to be the parallel test of all commercial high-power IGBT / SiC modules below 6.5kV / 7200A.

[0097] 1. Adjustable DC power supply U DC The selected product is the MS-SPH5001 from the domestic company Mingsheng Technology, with an input voltage of 380V, 50 / 60Hz, and an output voltage of 5000V / 1A.

[0098] 2. For the DC charging switch K1 and the discharge switch K2 in the discharge circuit, contactors are selected. The maximum test voltage is 3830V (maximum test module voltage is 6500V, voltage margin is 1.7 times), the maximum DC power supply charging current is 1A, and the maximum discharge resistor current is 31.86A. A Siemens 3TM vacuum contactor (7200V, 450A) is selected.

[0099] 3. Selection of current-carrying inductor:

[0100] (1) Selection of maximum inductance: Considering the turn-on and turn-off delay times, as well as the rise and fall times of the device, t min Not less than 10μs. Based on the module device parameters from Infineon's official website, the minimum current at different voltages is shown in the table below:

[0101] Table 1 Minimum Current of Infieon Modules at Different Voltage Levels

[0102] Voltage level / V Minimum current / A <![CDATA[V max / I min ]]> 6500 250 15.294 4500 400 6.6176 3300 200 9.7059 1700 50 20.000 1200 25A 28.235 650 50 7.6471

[0103] Note: 1.7Vmax is the voltage level of the module being measured.

[0104] Therefore, the minimum inductance value of the maximum hollow inductor should be...

[0105]

[0106] (2) Minimum inductance value selection: Take the t value during the current build-up stage of the device. max The longest duration is 1000μs. Based on the module device parameters from Infineon's official website, the maximum current at different voltages is shown in the table below:

[0107] Table 2 Maximum Current of Infieon Modules at Different Voltage Levels

[0108] Voltage level / V Maximum current / A <![CDATA[Single tube V min / I max > <![CDATA[Double - tube parallel V min / 2I max > 6500 750 5.506 2.529 4500 1800 1.471 7.353 3300 2400 0.809 0.404 1700 3600 0.278 0.139 1200 3600 0.196 0.098 650 600 0.635 0.296

[0109] Note 1.7Vmin is the voltage level of the module being measured.

[0110] Therefore, considering the parallel connection of two tubes, the maximum inductance value of the minimum air-core inductor should be...

[0111]

[0112] The final inductance values ​​of the hollow inductor are in the following ranges: 10μH, 20μH, 40μH, 80μH, 100μH, 150μH, 200μH, and 300μH.

[0113] 4. Selection of supporting capacitor unit: based on the derived formula

[0114]

[0115] Taking the voltage drop as 5% of the expected value, I can be obtained from Table 2. L / U DC The maximum value was achieved when the two transistors were connected in parallel (1200V / 1.7) / 3600A, resulting in a parallel current of 7200A. The current-carrying inductance was 10μH, and the minimum capacitance was 10.2mF. Therefore, the capacitance was set to 12mF / 4000V.

[0116] 5. Selection of the bleeder resistor in the bleeder circuit: Set the maximum test voltage to 3830V (maximum test module voltage is 6500V, voltage margin is 1.7 times). When selecting a bleeder resistor of 120Ω, according to the formula... The average power can be calculated to be 2.0373kW. Finally, three 40Ω / 3kW / 2kV resistors were selected and connected in series.

[0117] In summary, this invention provides a dynamic testing platform for full-range power modules and its design method. Compared with the prior art, this invention has the following advantages:

[0118] 1. It can perform functional testing on all power modules on the market and can design power modules for specific targets;

[0119] 2. It has a systematic parameter calculation method, and there is no coupling relationship between parameters, making the parameter calculation simple and accurate;

[0120] 3. Meets the requirements for parallel testing of high-power modules, not just low- and medium-power modules;

[0121] 4. Lower cost.

[0122] The parts of this invention not described in detail are techniques known to those skilled in the art.

[0123] In the description of this invention, it should be understood that the orientation or positional relationship indicated by directional terms such as "front, back, up, down, left, right", "horizontal, vertical, horizontal" and "top, bottom" is generally based on the orientation or positional relationship shown in the accompanying drawings, and is only for the convenience of describing this invention and simplifying the description. Unless otherwise stated, these directional terms do not indicate or imply that the device or element referred to must have a specific orientation or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation on the scope of protection of this invention; the directional terms "inner" and "outer" refer to the inner and outer contours relative to the outline of each component itself.

[0124] For ease of description, spatial relative terms such as "above," "on top of," "on the upper surface of," "above," etc., are used herein to describe the spatial positional relationship of a device or feature as shown in the figures to other devices or features. It should be understood that spatial relative terms are intended to encompass different orientations in use or operation beyond the orientation of the device as described in the figures. For example, if the device in the figures were inverted, a device described as "above" or "on top of" other devices or structures would subsequently be positioned as "below" or "under" other devices or structures. Thus, the exemplary term "above" can include both "above" and "below." The device may also be positioned in other different ways (rotated 90 degrees or in other orientations), and the spatial relative descriptions used herein will be interpreted accordingly.

[0125] Furthermore, it should be noted that the use of terms such as "first" and "second" to define components is merely for the purpose of distinguishing the corresponding components. Unless otherwise stated, the above terms have no special meaning and therefore should not be construed as limiting the scope of protection of this invention.

[0126] The above description is merely a preferred embodiment of the present invention and is not intended to limit the invention. Various modifications and variations can be made to the present invention by those skilled in the art. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the present invention should be included within the scope of protection of the present invention.

Claims

1. A design method of a full range power module dynamic test platform, characterized in that, The method comprises: obtaining the minimum inductance of the maximum current inductor based on the minimum current of different modules under the same voltage level, the maximum voltage of different modules under the same current level and the minimum value of the measured time of the measured power device; obtaining the maximum inductance of the minimum current inductor based on the maximum current of different modules under the same voltage level, the minimum voltage of different modules under the same current level and the maximum value of the measured time of the measured power device; determining the inductance value range of the current inductor based on the minimum inductance of the maximum current inductor and the maximum inductance of the minimum current inductor; selecting any value in the inductance value range of the current inductor, and obtaining the capacitance value range of the support capacitor unit based on the selected inductance value of the current inductor, the current of the current inductor, the ratio of the value of the voltage drop of the capacitor voltage after the support capacitor unit charges the current inductor to the capacitor voltage and the voltage of the adjustable DC power supply; obtaining the resistance value of the discharge resistor based on the voltage of the adjustable DC power supply and the rated current of the discharge resistor in the discharge circuit; obtaining the average power of the discharge resistor based on the resistance value of the discharge resistor and the voltage of the adjustable DC power supply; designing the test platform based on the inductance value range of the current inductor, the capacitance value range of the support capacitor unit, the resistance value and the average power of the discharge resistor.

2. The method of claim 1, wherein, The minimum inductance of the maximum current inductor is obtained by the following formula: In the formula, L max is the maximum build-up inductance, I min is the minimum current of different modules under the same voltage level, V max is the maximum voltage of different modules under the same current level, t min is the minimum measured time of the measured power device.

3. The method according to claim 1 or 2, characterized in that, The maximum inductance of the minimum current inductor is obtained by the following formula: In the formula, L min is the minimum built-in inductance, I max is the maximum current of different modules under the same voltage level, V min is the minimum voltage of different modules under the same current level, t max is the maximum measured time of the measured power device.

4. The method of claim 1, wherein, The capacitance value range of the support capacitor unit is obtained by the following formula: where C is the capacitance value of the support capacitor unit, L is the inductance value of the selected current building inductor, I L is the current of the current building inductor, k DC is the ratio of the value of the drop in the capacitor voltage after the support capacitor unit charges the current building inductor to the capacitor voltage, U DC is the voltage of the adjustable DC power supply.

5. The method of claim 1, wherein, The resistance value of the discharge resistor is obtained by the following formula: where R is the value of the discharge resistor, U DC is the voltage of the adjustable DC power supply, I R is the rated current of the discharge resistor.

6. The method according to claim 5 or 6, characterized in that, The average power of the discharge resistor is obtained by the following formula: In the formula, P is the average power of the discharge resistor, ΔE is the energy difference before and after the discharge of the support capacitor unit, Δt is the discharge time, C is the capacitance of the support capacitor unit, U is the voltage of the adjustable DC power supply, and n is the discharge time coefficient of the support capacitor unit, and R is the resistance of the discharge resistor. DC In the formula, P is the average power of the discharge resistor, ΔE is the energy difference before and after the discharge of the support capacitor unit, Δt is the discharge time, C is the capacitance of the support capacitor unit, U is the voltage of the adjustable DC power supply, and n is the discharge time coefficient of the support capacitor unit, and R is the resistance of the discharge resistor.

7. A full range power module dynamic test platform, characterized by, The platform comprises an adjustable DC power supply, a DC charging switch, a support capacitor unit, a discharge circuit, a decoupling circuit, a freewheeling diode unit and a current inductor; The adjustable DC power supply and the DC charging switch are connected in series, and then the support capacitor unit, the discharge circuit and the decoupling circuit are connected in parallel; the freewheeling diode unit and the current inductor are connected in parallel, one end of which is connected to one end of the decoupling circuit, and the other end serves as the first connection end of the measured power device; the other end of the decoupling circuit serves as the second connection end of the measured power device, and the first connection end and the second connection end are used to connect a plurality of parallelly connected measured power devices; The parameters of each component in the test platform are designed by any of the above methods.

8. The platform of claim 7, wherein, The support capacitor unit comprises a plurality of support capacitors connected in parallel; the freewheeling diode unit comprises a plurality of freewheeling diodes connected in parallel, the negative poles of each of which are connected in parallel to one end of the decoupling circuit, and the positive poles of each of which are connected in parallel to serve as the first connection end of the measured power device; the discharge circuit comprises a discharge switch and a discharge resistor, one end of the discharge switch being connected to one end of the decoupling circuit, the other end of the discharge switch being connected to one end of the discharge resistor, the other end of the discharge resistor being connected to the other end of the decoupling circuit; the current inductor is a hollow inductor; the decoupling circuit is a decoupling capacitor.

9. The platform according to claim 7 or 8, characterized in that, The maximum voltage output by the adjustable DC power supply is greater than the voltage of the measured power device.

10. The platform of claim 7 or 8, wherein, The rated voltage of the direct current charging switch is greater than the maximum test voltage, and the rated current of the direct current charging switch is greater than the output current of the adjustable direct current power supply.

11. The platform of claim 7 or 8, wherein, The rated voltage of the bleed-off switch is greater than the maximum test voltage, and the rated current of the bleed-off switch is greater than the output current of the bleed-off.

12. The platform of claim 7 or 8, wherein, The rated current of the bleed-off resistor is less than the ripple current of the support capacitor unit and the rated current of the direct current charging switch and the bleed-off switch.

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