Dynamic scheduling automatic test system and control method thereof

Abstract

The invention discloses a dynamic scheduling automatic test system and a control method thereof. The method comprises the following steps: inputting a control parameter sequence; a voltage source, a source measurement unit and a current source are controlled according to the control parameter sequence, the voltage source applies grid voltage to a sample, under the current grid voltage, the system applies bias current to the sample through the source measurement unit and measures Hall voltage of the sample, and meanwhile, the current source applies circulating current according to a set step length; the driving electromagnet generates a scanning magnetic field; and the user side constructs a hysteresis loop according to the data points of the plurality of Hall voltages, and saves a control parameter sequence and a test result. The invention provides a complete, efficient and accurate automatic experiment solution aiming at VCMA and AHE measurement, so that the user operation is obviously simplified, the test efficiency is improved, and the data management is optimized.

Description

TECHNICAL FIELD

[0001] The present application belongs to the technical field of automation testing and material physics testing, and particularly relates to a dynamically scheduled automation testing system and a control method thereof. BACKGROUND

[0002] Voltage-controlled magnetic and anomalous Hall effect are current research hotspots in the field of condensed matter physics and materials science. Accurate and efficient characterization of the magnetic response and electrical transport properties of materials under the action of an electric field is crucial for the development of new spintronic devices. Traditional testing methods often require manual control of multiple instruments, which is time-consuming and difficult to ensure consistency of experimental conditions and repeatability of data. Therefore, it is of great significance to develop an automated testing system to improve experimental efficiency and data quality.

[0003] Currently, there are some commercial or self-built systems for magnetic or electrical transport measurements, but these systems may have deficiencies in integration, automation, and specific optimization for voltage-controlled magnetic and anomalous Hall effect measurements. For example, different software may be required to control the electric field application, magnetic field scanning, and signal acquisition, making it difficult to achieve automated testing and real-time data analysis of complex sequences.

[0004] Therefore, it is urgent to develop a turn-key, specially optimized integrated testing system for the integration of various voltage-controlled magnetic VCMA and anomalous Hall effect AHE parameter automation testing methods, and for the performance of VCMA and AHE specific complex tests. SUMMARY

[0005] The main purpose of the present application is to overcome the shortcomings and deficiencies of the prior art, and to provide a dynamically scheduled automation testing system and a control method thereof, which is a complete, efficient, and accurate automation testing solution for VCMA and AHE measurements, thereby significantly simplifying user operations, improving testing efficiency, and optimizing data management.

[0006] To achieve the above purpose, the present application adopts the following technical solutions: In a first aspect, the present application provides a dynamically scheduled automation testing method, comprising the following steps: inputting a control parameter sequence; controlling a voltage source, a source measurement unit, and a current source according to the control parameter sequence, the voltage source applying a gate voltage to the sample, under the current gate voltage, the system applying a bias current to the sample through the source measurement unit and measuring the Hall voltage of the sample, and simultaneously applying a cyclic current through the current source to drive the electromagnet to generate a scanning magnetic field with a set step size; The user end constructs a magnetic hysteresis loop according to data points of the plurality of Hall voltages, saves the control parameter sequence and the test result.

[0007] As a preferred technical solution, the voltage source applies a gate voltage to the sample, including at least one of the following modes: fixed voltage dwell mode, ramp scan mode, step scan mode and pulse mode.

[0008] As a preferred technical solution, in the fixed voltage dwell mode, the control voltage source generates an electric field in the sample under the action of a fixed voltage amplitude, the electric field intensity, polarity and dwell time are fixed values, under the electric field condition, the magnetic field source is automatically controlled to scan in a preset range and mode, and the source measurement unit is instructed to apply a bias current and collect Hall voltage data synchronously.

[0009] As a preferred technical solution, in the fixed voltage dwell mode, the control parameter sequence includes a plurality of fixed voltage amplitudes; when the test task under one fixed voltage amplitude is completed, the next fixed voltage amplitude under the magnetic hysteresis loop is tested according to the given control parameter sequence, until all fixed voltage amplitudes are tested.

[0010] As a preferred technical solution, in the ramp scan mode or step scan mode, the control voltage source is under the action of a continuously changing voltage amplitude, the electric field intensity and polarity are continuously changing, and the dwell time is a fixed value, under the electric field condition, the magnetic field source is automatically controlled to scan in a preset range and mode, and the source measurement unit is instructed to apply a bias current and collect Hall voltage data synchronously.

[0011] As a preferred technical solution, in the pulse mode, the control voltage source is under the action of a sudden change in voltage amplitude, the electric field intensity and polarity are sudden changes, and the dwell time is a fixed value, under the electric field condition, the magnetic field source is automatically controlled to scan in a preset range and mode, and the source measurement unit is instructed to apply a bias current and collect Hall voltage data synchronously.

[0012] As a preferred technical solution, the cycle current is applied by the current source according to the set step length, and the electromagnet generates a scanning magnetic field, including: The current source applies a cycle current according to a fixed value step length, and the electromagnet generates a scanning changing magnetic field.

[0013] As a preferred technical solution, the user end constructs a magnetic hysteresis loop according to data points of the plurality of Hall voltages, including: measuring the corresponding Hall voltage synchronously through the scanning magnetic field, drawing a graph line of the Hall voltage data points in a specified area of a graphical user interface in real time and displaying, and drawing an abnormal magnetic hysteresis loop through continuous measurement.

[0014] In a second aspect, the present application also provides a dynamic scheduling automated testing system, which is applied to the dynamic scheduling automated testing method, and comprises a user terminal, a voltage source, a source measurement unit, an excitation unit and an electric meter. The user terminal is connected to the interfaces of the voltage source, the source measurement unit and the excitation unit through data lines, the source measurement unit is connected to the two ends of the sample projection through wires, the voltage source is connected to the gate and the source measurement unit of the sample through wires, and the two ends of the sample projection are connected in parallel, the current source provides excitation to the electromagnet through the energized winding and applies a magnetic field to the sample, and the internal magnetic field direction of the electromagnet is parallel to the vertical direction of the sample projection. The visualized measurement data comprises IV characteristic curves, Hall voltage-magnetic field characteristic curves and Hall voltage-current characteristic curves.

[0015] As a preferred technical solution, if the sample projection is a regular shape, when the sample is connected, the two ends of the projection are directed to the edge ends of the sample, the source measurement unit is provided with two pairs of contact ends with opposite polarities, two contact ends with the same polarity are connected to one end of the sample and are arranged at the two edges of the end respectively, and two contact ends with opposite polarities are connected to the opposite end, and two contact ends with opposite polarities are also arranged at the two edges of the opposite end. If the sample projection is an irregular shape, the length of the center extending to the edge has no continuous mutation value, when the sample is connected, two contact ends with one polarity of the source measurement unit are connected to one end of the sample and are arranged at the two edges of the end respectively, two contact ends with opposite polarities are connected to the opposite end, and two contact ends with opposite polarities are also arranged at the two edges of the opposite end, and the edge of the connection of the contact ends is the far end of the center extending to the edge.

[0016] Compared with the prior art, the present application has the following advantages and beneficial effects: (1) The automated voltage control magnetic and abnormal Hall effect testing system provides a complete, efficient and accurate automated experimental solution for VCMA and AHE measurement, thereby significantly simplifying user operation, improving testing efficiency and optimizing data management.

[0017] (2) The application has a self-scientific measurement basis library, which is a ready-to-use special solution, and users can quickly build and automatically run complex VCMA / AHE tests without complex underlying programming, greatly shortening the experimental period.

[0018] (3) The application has a special GUI and highly integrated sequencer for the automatic voltage control magnetic and abnormal Hall effect test system software, which is deeply optimized for the multi-parameter scanning requirements of VCMA / AHE, making the experimental design and execution more convenient and intuitive.

[0019] (4) The application has a preset real-time data visualization window (IV curve and AHE magnetic hysteresis loop) and a customized double-file data output format, which directly serves the data analysis needs of VCMA / AHE and improves the efficiency of scientific research output. BRIEF DESCRIPTION OF DRAWINGS

[0020] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the following will briefly introduce the drawings needed in the embodiment description. Obviously, the drawings in the following description are only some embodiments of the present application, and other drawings can be obtained by those skilled in the art without creative labor.

[0021] Figure 1 The flow chart of the dynamic scheduling automatic test method of the embodiment of the present application; Figure 2 The circuit principle diagram of the dynamic scheduling automatic test system of the embodiment of the present application; Figure 3 The line connection diagram of the dynamic scheduling automatic test system of the embodiment of the present application; Figure 4 The structure diagram of the user end of the embodiment of the present application. DETAILED DESCRIPTION

[0022] In order to make the person skilled in the art better understand the present application, the technical solutions in the embodiments of the present application will be described clearly and completely in the following with reference to the drawings in the embodiments of the present application. Obviously, the described embodiments are only some embodiments of the present application, not all. Based on the embodiments in the present application, all other embodiments obtained by those skilled in the art without creative labor are within the scope of protection of the present application.

[0023] Reference to an "embodiment" in this application means that a particular feature, structure, or characteristic described in connection with the embodiment can be included in at least one embodiment of the application. The appearances of the phrase in various places in the specification are not necessarily all referring to the same embodiment, nor are separate or alternative embodiments mutually exclusive of other embodiments. As will be apparent to those of ordinary skill in the art, embodiments described in this application can be combined with other embodiments in various ways. Embodiment 1

[0024] Reference is made to Figure 1 The present embodiment provides a dynamic scheduling automated testing method, comprising: A gate voltage V G is applied by a program-controlled voltage source to achieve the electric field regulation of the sample magnetic properties. Subsequently, under the current V G condition, the system applies a bias current I P to the sample through the source measurement unit, while the source measurement unit measures the Hall voltage V H and applies a cyclic current through the program-controlled current source to drive the electromagnet to generate a scanning magnetic field. These synchronous operations enable the system to collect a series of magnetic field-Hall voltage data points, thereby constructing a magnetic hysteresis loop.

[0025] In which the user can input control parameters or control parameter sequences at the user end to control the voltage source, source measurement unit and current source. The user can conveniently set various specific parameters of the VCMA / AHE experiment, such as maximum / minimum voltage, dwell time, voltage step, slope delay time, clamping current for device protection, maximum scanning current for coil, magnetic field scanning step, Hall measurement bias current and data automatic saving path. After inputting the parameters, the parameters enter the sequencer, and the user can intuitively define a complex test sequence containing multiple groups of different experimental parameters (for example, AHE scanning under different electric field strengths or different dwell times), thereby achieving efficient and automated scanning of the material characteristic parameter space. The designed sequence can be saved as a file for subsequent calling or modification.

[0026] The voltage source applies a voltage, and the user end controls the voltage source to apply a gate voltage V G to the gate of the sample, applying a preset voltage V G to the gate of the sample, for the study of the anisotropy effect of the voltage-controlled sample magnetic field, by changing V G to regulate the magnetic properties of the sample.

[0027] Synchronous execution of AHE measurement related operations: under the current set gate voltage V G The automated voltage-controlled magnetic and anomalous Hall effect testing system software synchronously coordinates the following parallel key operations to complete the AHE measurement: The source measurement unit applies a current, the user controls the source measurement unit (SMU) to apply a precise, user-defined bias current I P .

[0028] The source measurement unit measures the voltage while the bias current I P is applied, the automated voltage-controlled magnetic and anomalous Hall effect measurement system software instructs the SMU to precisely measure the Hall voltage V H .

[0029] The current source applies a cyclic current, the user controls the current source to output a cyclically varying current to the electromagnet coil. This causes the electromagnet to produce a scanning varying magnetic field B (for example, from B max to B min back to B max , or vice versa). This step is used to acquire the response of the sample under different magnetic fields.

[0030] Finally, by cyclically scanning the magnetic field B (by controlling the current source of the electromagnet), and synchronously measuring the corresponding Hall voltage V H (at a constant bias current I P and gate voltage V G ), the automated voltage-controlled magnetic and anomalous Hall effect measurement system can collect a series of (B, V H ) data points. These data points constitute the anomalous Hall effect hysteresis loop of the material under the current V G condition, and the hysteresis loop is displayed on the graphical user interface.

[0031] The entire process is fully automatically controlled by the automated voltage-controlled magnetic and anomalous Hall effect measurement system software, realizing the automatic characterization of AHE characteristics under VCMA regulation. All experimental parameters (V G sequence, B field scanning range and rate, I P value, etc.) are input through the graphical user interface of the automated voltage-controlled magnetic and anomalous Hall effect measurement system software, and the measurement data is automatically recorded and saved.

[0032] In actual operation, the following steps will be adopted in the embodiment: S101, the user operates the Block1 interface of the automated voltage-controlled magnetic and anomalous Hall effect measurement system software, and inputs specific parameters required for VCMA / AHE experiments, for example: set the minimum voltage to -1500mV, the dwell time to 15s, and the maximum current for driving the electromagnet coil to 4A.

[0033] S102, the automated voltage-controlled magnetic and anomalous Hall effect testing system software system passes these user-set parameters to its internally encapsulated, custom-made experiment execution script based on the applicant's scientific measurement foundation library's Procedure module.

[0034] S103, the script in turn controls the voltage source to apply a -1500 mV electric field and accurately hold for 15 s and controls the current source to scan from -4 A to +4 A in set steps by calling the instrument control module interface of the foundation library.

[0035] S104, at the same time, the source measurement unit (SMU, also controlled by the corresponding module of the foundation library) is instructed to apply a preset bias current and simultaneously accurately measure the Hall voltage on the sample.

[0036] S105, the real-time data generated during the measurement process is passed to the graphical display area of the automated voltage-controlled magnetic and anomalous Hall effect testing system software through the data flow mechanism of the foundation library, dynamically drawing the IV curve (in Dock1) and the AHE magnetic hysteresis loop (in Dock2), Dock1 and Dock2 are explained in detail in the "Function Block 4: Graphical Display Area" below.

[0037] S106, after the preset experiment procedure is executed, all relevant experiment parameters and collected data are automatically saved to the user-specified path in the specific format defined by the automated voltage-controlled magnetic and anomalous Hall effect testing system software (for example, a summary file and an independent AHE data file). Embodiment 2

[0038] If the control parameter sequence includes multiple V G values, after completing the magnetic hysteresis loop measurement at the current V G point, the system will automatically adjust to the next V G value and repeat the above measurement process until all preset measurement sequences are completed. The entire process is automatically executed by the automated voltage-controlled magnetic and anomalous Hall effect testing system software.

[0039] In order to achieve automated measurement of multiple magnetic hysteresis loops, this embodiment can implement at least one of the following modes: fixed voltage dwell mode, ramp scan mode, step scan mode, and pulse mode.

[0040] (1) In the fixed voltage dwell mode, the control voltage source generates an electric field in the sample under the action of a fixed voltage amplitude, the electric field strength, polarity and dwell time are fixed values, under the electric field conditions, the magnetic field source is automatically controlled to scan in a preset range and mode, and the source measurement unit is instructed to apply a bias current and collect Hall voltage data simultaneously. The control parameter sequence includes a plurality of fixed voltage amplitudes; when the test task under one fixed voltage amplitude is completed, the next hysteresis loop under the next fixed voltage amplitude is tested according to the given control parameter sequence, until all fixed voltage amplitudes are tested. It can be explained that the plurality of fixed voltage amplitudes of the control parameter sequence are scattered points.

[0041] (2) In the ramp scan mode or step scan mode, the control voltage source is under the action of a continuously changing voltage amplitude, the electric field strength and polarity are continuously changing, and the dwell time is fixed. Under the electric field conditions, the magnetic field source is automatically controlled to scan in a preset range and mode, and the source measurement unit is instructed to apply a bias current and collect Hall voltage data simultaneously.

[0042] In this embodiment, the specific parameters can be set as: the voltage amplitude is not less than -1500mV, and the dwell time is 15s.

[0043] Further, in the ramp scan mode, the control voltage source outputs voltage linearly increases or decays from the starting value to the terminal value at a preset rate, while the monitoring circuit responds. In this embodiment, the control voltage amplitude continuously changes linearly, the function of the change is a linear function, the minimum voltage amplitude is -1500mV, the maximum voltage amplitude is 1500mV, the step is 50mV or -50mV, the dwell time t is set to 15s, the bias current is 0.04mA, then the magnetic field source is automatically controlled to scan in a preset range and mode under the electric field generated by the changing voltage amplitude, and the source measurement unit is instructed to apply a bias current and collect Hall voltage data simultaneously.

[0044] It can be explained that the ramp scan mode defined above refers to a linear progression mode based on preset voltage step and delay time. Specifically, when the target voltage is set to a positive value, the voltage will be gradually increased from the initial voltage (usually 0V) according to the preset voltage step, and each increase of one step will be kept for a delay time (which can be set), until the target voltage is reached; when the target voltage is set to a negative value, it will be gradually decreased according to the same step from the initial voltage, and each decrease of one step will also keep the delay time, until the target voltage is reached. After the voltage reaches the target value, the voltage signal will be kept at the target voltage for a preset dwelling time (which can be set) to complete the necessary electrical or magnetic response process. After the dwelling time ends, the voltage will gradually return to the initial voltage (usually 0V) according to the same step and delay time as before. The path of the voltage ramp scan described in this embodiment is a strict linear step process, and through the precise control of the step and delay time, the controllable arrival, maintenance and return of the target voltage are realized, thereby meeting the experimental requirements in the testing and device regulation process.

[0045] Further, in the step scan mode, the voltage amplitude changes continuously in steps, the change function uses a step function, the minimum voltage amplitude is -1500mV, the maximum voltage amplitude is 1500mV, the step is 50mV or -50mV, the dwelling time is set to 15s, the bias current is 0.04mA, then the magnetic field source is automatically controlled to scan in a preset range and mode under the electric field condition generated by the changing voltage amplitude, and the source measurement unit is instructed to apply a bias current and collect Hall voltage data simultaneously.

[0046] (3) In the pulse mode, the voltage source is controlled to act under the condition of a sudden change in voltage amplitude, the electric field strength and polarity are sudden, and the dwelling time is a fixed value. The magnetic field source is automatically controlled to scan in a preset range and mode under the electric field condition, and the source measurement unit is instructed to apply a bias current and collect Hall voltage data simultaneously; the voltage amplitude is set to be not less than -1500mV, and the dwelling time is 15s.

[0047] Then, the current source applies a cyclic current with a constant step, which is set to be -4A to 4A, to drive the electromagnet to generate a scanning varying magnetic field. By scanning the magnetic field, the corresponding Hall voltage is measured synchronously, and the data points of the Hall voltage are plotted in real time in a designated area of the graphical user interface and displayed. After continuous measurements, the anomalous magnetic hysteresis loop is plotted. The system automatically generates a structured data file using the data processing and file saving mechanism of the underlying foundation library. The file content contains complete experimental setup parameters and all raw measurement data (such as resistance, gate voltage, gate leakage current, magnetic field current, Hall voltage, etc.). In particular, the automated voltage-controlled magnetic and anomalous Hall effect test system software organizes the data into two files: one is a summary file containing all data sets of this time or this sequence, and the other is a separate AHE data file for the anomalous Hall effect, so that the user can perform subsequent targeted data analysis.

[0048] It should be noted that for the foregoing method embodiments, in order to facilitate simple description, they are all expressed as a combination of a series of actions, but those skilled in the art should know that the present application is not limited by the order of the described actions, because according to the present application, certain steps can be performed in other order or simultaneously.

[0049] Based on the same idea as the dynamic scheduling automated test method in the above embodiment, the present application also provides a dynamic scheduling automated test system, which can be used to execute the dynamic scheduling automated test method described above. For the convenience of description, in the structural schematic diagram of the dynamic scheduling automated test system embodiment, only the parts related to the embodiment of the present application are shown, and those skilled in the art can understand that the illustrated structure does not constitute a limitation on the device, and can include more or fewer components than the illustrated, or combine certain components, or different component arrangements. Embodiment 3

[0050] Please refer to Figures 2-3 In another embodiment of the present application, a dynamic scheduling automated test system 10 is provided, a user terminal 11, a voltage source 12, a source measurement unit 13, an excitation unit 14 and a meter 15, the user terminal 11 includes a user graphical interface 111 for inputting and sending control parameters, receiving measurement data, saving measurement data and visualizing measurement data, the source measurement unit 13 is used to apply a bias current and collect Hall voltage data, the excitation unit 14 includes a current source 141 and an electromagnet 142, and the meter 15 includes an ammeter 151 and a voltmeter 152; The user terminal 11 is connected with the voltage source 12, the source measurement unit 13 and the excitation unit 14 through data lines respectively, the source measurement unit 13 is connected with the two ends of the sample 16 projected oppositely through wires, the voltage source 12 is connected with the gate of the sample 16 and the source measurement unit 13 through wires respectively, and is connected with the two ends of the sample 16 projected oppositely in parallel, the current source 141 provides excitation to the electromagnet 142 through the energized winding pair and applies a magnetic field to the sample, the internal magnetic field direction of the electromagnet 142 is parallel to the vertical direction of the sample 16 projection, and the visualized measurement data includes drawing IV characteristic curve, Hall voltage-magnetic field characteristic curve and Hall voltage-current characteristic curve.

[0051] It is worth explaining that the sample of the embodiment can adopt regular shape and irregular shape, generally adopt flat shape, be convenient for clamping or fixing, and preferably adopt regular rectangular shape. However, in order to test the characteristics of different materials, the sample with irregular shape is also adopted, the length of the sample extending outward from the center to the edge cannot have continuous mutation value, especially cannot have sharp end, and the sample with sharp end is easy to affect the measurement result. The two ends of the sample projection refer to the two sides of the sample projection, if the sample projection is rectangular, the two sides refer to the two sides of the long side or the two sides of the short side, if the sample projection is other regular shape (such as circular, elliptical and other regular shape), the opposite far end of the length extending outward from the center to the edge is connected, the length between the contact points is the longest, if the sample projection is other irregular shape (such as petal, round rectangular and other irregular, combined pattern, the length extending outward from the center to the edge has fluctuation), the opposite far end of the length extending outward from the center to the edge is uniformly equidistant. When connecting the sample, the projection opposite ends point to the edge end of the sample, the contact ends with the same polarity and the wires thereof have two, the two contact ends with the same polarity are connected with one end of the sample and are arranged at the two edge ends of the end respectively, the two contact ends with opposite polarity and the wires thereof are connected with the opposite end, and the two contact ends are arranged in the same way as described above. If irregular shape is involved, the connection of the contact ends is arranged at the far end of the length extending outward from the center to the edge of the edge, and preferably is arranged at the longest end of the length extending outward from the center to the edge of the edge.

[0052] Then, on the basis of the universal scientific measurement software basic library independently developed, a high-level integrated application software system (automatic voltage control magnetism and abnormal Hall effect test system software) for specific complex physical measurement (VCMA and AHE) is constructed, the system deeply encapsulates complex instrument cooperative control logic and targeted data processing flow. The following is a specific description of each part of the application: For the voltage source 12, Keithley 2400 series or similar programmable voltage source can be used. In this system, the voltage source is mainly used to apply gate voltage V G, for regulating the carrier concentration or built-in electric field of the sample, and thus realizing the voltage control of the material magnetism (VCMA).

[0053] For the source measurement unit 13, Keithley 2400 series or similar devices can be used. In this system, the source measurement unit is mainly used for: (1) applying a precise bias current I B to the sample; (2) simultaneously accurately measuring the Hall voltage V H generated on the sample; (3) its output / input ports are connected to the corresponding electrodes of the sample through wires.

[0054] For the excitation unit 14, the current source 141 is used to drive the electromagnet to generate the required magnetic field. The current source should have programmable ability and be able to output stable and adjustable current to the electromagnet coil; the electromagnet 142 is used to generate a magnetic field B perpendicular to the sample plane (or parallel to the sample plane, according to experimental requirements). The magnetic field strength is controlled by the output current of the driving current source.

[0055] The graphical user interface 111 is included in the user terminal 11. As Figure 4 shown, the graphical user interface 111 (GUI) optimized for VCMA / AHE optimization: the automated voltage control magnetism and anomalous Hall effect test system is based on the GUI construction ability of the underlying foundation library, and a five-block graphical user interface is designed for the VCMA / AHE test process optimization, which is specifically: (1) Function block 1: input parameter area. Provide a clear and concentrated parameter input interface, users can easily set the specific parameters of the VCMA / AHE experiment, such as maximum / minimum voltage, dwell time, voltage step, ramp delay time, clamping current for device protection, maximum scanning current for coil, magnetic field scanning step, Hall measurement bias current and data automatic saving path.

[0056] (2) Function block 2: sequencer area. Based on the experimental program and queue management function of the foundation library, the automated voltage control magnetism and anomalous Hall effect measurement system provides a high-level sequencer interface. Users can intuitively define complex test sequences containing multiple sets of different experimental parameters (for example, AHE scanning under different electric field strengths or different dwell times), thereby realizing efficient and automated scanning of the material characteristic parameter space. In addition, in this sequencer area, researchers can easily define, modify, save and execute complex scanning experimental sequences for multi-dimensional parameter combinations such as electric field, magnetic field and dwell time.

[0057] (3) Function block 3: Experimental estimation and state display area. Using the queue management mechanism of the underlying library, the current submitted experimental task queue, the execution progress percentage of each task and the current state (such as waiting, running, and completing) are clearly displayed.

[0058] (4) Function block 4: Graphical display area. Using the real-time drawing function of the underlying library, the automatic voltage control magnetic and abnormal Hall effect measurement system provides two real-time drawing windows specially designed for VCMA / AHE data analysis: Dock1 is used to dynamically display the I-V characteristic curve of the sample during the application of the electric field; Dock2 is used to display the magnetic hysteresis loop of the Hall voltage with the electromagnetic field (or coil current) in real time. This block also integrates the experimental log to record key operations and state information.

[0059] (5) Function block 5: Experimental queue and state display area. Using the queue management mechanism of the underlying library, the current submitted experimental task queue, the execution progress percentage of each task and the current state (such as waiting, running, and completing) are clearly displayed.

[0060] The system controls the instrument using a combination or sequence of VCMA parameters and AHE parameters, the VCMA parameters including voltage amplitude, scanning mode and dwell time, and the AHE parameters including magnetic field scanning range, scanning rate and bias current.

[0061] The automatic voltage control magnetic and abnormal Hall effect measurement system uses the instrument abstraction layer and communication interface of the underlying library to achieve precise and synchronous control of key instruments (such as program-controlled power supply for applying electric field, power supply for controlling electromagnetic field, and source measurement unit SMU for current application and Hall voltage measurement) in VCMA / AHE experiments. The system has built-in optimized control sequences and parameter configurations for these commonly used instruments.

[0062] The system controls the instrument using a combination or sequence of VCMA parameters and AHE parameters, the VCMA parameters including voltage amplitude, scanning mode and dwell time, and the AHE parameters including magnetic field scanning range, scanning rate and bias current. (1) Electric field control: The system can accurately control the electric field applied to the sample, supporting various electric field application modes required for VCMA / magnetic-electric coupling effect research, including ramping function, fixed voltage dwelling time and pulser mode.

[0063] (2) Electromagnetic field control: Programmed scanning of electromagnetic field is realized for obtaining the magnetic hysteresis loop of the material.

[0064] (3) Synchronous measurement: While the magnetic field is controlled, the SMU synchronously applies the user-set bias current and accurately measures the Hall voltage.

[0065] Please refer toFigure 4 The user terminal 11 can further include a first processor 112, a first memory 113, and a bus, and can further include a computer program stored in the first memory 113 and executable on the first processor 112, such as an automated voltage control magnetic and abnormal Hall effect test program 1131.

[0066] The first memory 113 includes at least one type of readable storage medium, such as a flash memory, a mobile hard disk, a multimedia card, a card-type memory (e.g., an SD or DX memory, etc.), a magnetic memory, a disk, an optical disk, etc. In some embodiments, the first memory 113 can be an internal storage unit of the user terminal 11, such as a mobile hard disk of the user terminal 11. In other embodiments, the first memory 113 can also be an external storage device of the user terminal 11, such as a plug-in mobile hard disk, a smart media card (SMC), a secure digital (SD) card, a flash card, etc. Further, the first memory 113 can include both an internal storage unit and an external storage device of the user terminal 11. The first memory 113 can be used not only to store application software installed on the user terminal 11 and various data, such as the code of the automated voltage control magnetic and abnormal Hall effect test program 1131, but also to temporarily store data that has been output or will be output.

[0067] The first processor 112 can be composed of an integrated circuit in some embodiments, such as a single packaged integrated circuit or a plurality of packaged integrated circuits with the same or different functions, including one or more combinations of a central processing unit (CPU), a microprocessor, a digital processing chip, a graphics processor, and various control chips, etc. The first processor 112 is a control unit of the user terminal, which connects various components of the user terminal through various interfaces and lines, and executes various functions and processes data of the user terminal 11 by running or executing programs or modules stored in the first memory 113 and calling data stored in the first memory 113.

[0068] Figure 4 Only a user terminal with components is shown, and those skilled in the art can understand that, Figure 4 The structure shown does not constitute a limitation on the user terminal 11, and can include fewer or more components than shown, or combine certain components, or different component arrangements.

[0069] The first memory 113 in the user terminal 11 stores an automatic voltage control magnetic and anomalous Hall effect test program 1131, which is a combination of a plurality of instructions, and when executed in the first processor 112, can implement: inputting a control parameter sequence; controlling a voltage source, a source measurement unit and a current source according to the control parameter sequence, the voltage source applying a gate voltage to the sample, under the current gate voltage, the system applying a bias current to the sample through the source measurement unit and measuring the Hall voltage of the sample, while the current source applies a cyclic current with a set step to drive the electromagnet to generate a scanning magnetic field; the user terminal constructs a magnetic hysteresis loop according to a plurality of Hall voltage data points, saves the control parameter sequence and test results.

[0070] Further, the modules / units integrated in the user terminal 11, if implemented in the form of software functional units and sold or used as independent products, can be stored in a non-volatile computer readable storage medium. The computer readable medium can include any entity or device capable of carrying the computer program code, recording medium, U disk, mobile hard disk, magnetic disk, optical disk, computer memory, read-only memory (ROM).

[0071] Those of ordinary skill in the art can understand that all or part of the processes in the above-mentioned embodiments can be completed by a computer program instructing related hardware. The program can be stored in a non-volatile computer readable storage medium, and when executed, can include the processes of the above-mentioned embodiments. In the embodiments provided in the present application, any reference to memory, storage, database or other medium can include non-volatile and / or volatile memory. Non-volatile memory can include read-only memory (ROM), programmable ROM (PROM), electrically programmable ROM (EPROM), electrically erasable programmable ROM (EEPROM) or flash memory. Volatile memory can include random access memory (RAM) or external cache memory. As an illustration but not limitation, RAM is available in various forms, such as static RAM (SRAM), dynamic RAM (DRAM), synchronous DRAM (SDRAM), double data rate SDRAM (DDR SDRAM), enhanced SDRAM (ESDRAM), synchronous link (Synchlink) DRAM (SLDRAM), memory bus (Rambus) direct RAM (RDRAM), direct memory bus dynamic RAM (DRDRAM), and memory bus dynamic RAM (RDRAM), etc.

[0072] Any technical features in the above embodiments can be combined, and for the sake of brevity, not all possible combinations are described above, however, any combination of the technical features is deemed to be within the scope of the present disclosure.

[0073] The above embodiments are preferred embodiments of the present application, but the embodiments of the present application are not limited to the above embodiments, and any changes, modifications, substitutions, combinations, simplifications, etc. made without departing from the spirit and principles of the present application are deemed to be equivalent replacement manners and are included in the protection scope of the present application.

Claims

1. A method of dynamic scheduled automated testing, the method comprising: The method comprises: inputting a control parameter sequence; controlling a voltage source, a source measurement unit, and a current source according to the control parameter sequence, the voltage source applying a gate voltage to a sample, under the current gate voltage, the system applying a bias current to the sample through the source measurement unit and measuring the Hall voltage of the sample, and at the same time, applying a cyclic current through the current source at a set step to drive the electromagnet to generate a scanning magnetic field; a user terminal constructs a magnetic hysteresis loop according to a plurality of Hall voltage data points, saves the control parameter sequence and test results.

2. The method of claim 1, wherein, The voltage source applies a gate voltage to the sample, including at least one of the following modes: fixed voltage dwell mode, ramp scan mode, step scan mode, and pulse mode.

3. The method of claim 2, wherein, In the fixed voltage dwell mode, the control voltage source generates an electric field in the sample under the action of a fixed voltage amplitude, the electric field strength, polarity, and dwell time are fixed values, under the electric field condition, the magnetic field source is automatically controlled to scan in a preset range and mode, and the source measurement unit is instructed to apply a bias current and collect Hall voltage data synchronously.

4. The method of claim 3, wherein, In the fixed voltage dwell mode, the control parameter sequence includes a plurality of fixed voltage amplitudes; when the test task under one fixed voltage amplitude is completed, the next magnetic hysteresis loop under the next fixed voltage amplitude is tested according to the given control parameter sequence, until all fixed voltage amplitudes are tested.

5. The method of claim 2, wherein, In the ramp scan mode or step scan mode, the control voltage source is under the action of a continuously changing voltage amplitude, the electric field strength and polarity are continuously changing, and the dwell time is fixed, under the electric field condition, the magnetic field source is automatically controlled to scan in a preset range and mode, and the source measurement unit is instructed to apply a bias current and collect Hall voltage data synchronously.

6. The method of claim 2, wherein, In the pulse mode, the control voltage source is under the action of a sudden voltage amplitude, the electric field strength and polarity are sudden, and the dwell time is fixed, under the electric field condition, the magnetic field source is automatically controlled to scan in a preset range and mode, and the source measurement unit is instructed to apply a bias current and collect Hall voltage data synchronously.

7. The method of claim 1, wherein, The current source applies a cyclic current at a set step to drive the electromagnet to generate a scanning magnetic field, including: controlling the current source to apply a cyclic current at a fixed step to drive the electromagnet to generate a scanning magnetic field.

8. The method of claim 1, wherein, The user terminal constructs a magnetic hysteresis loop according to a plurality of Hall voltage data points, including: synchronously measuring the corresponding Hall voltage through the scanning magnetic field, real-time drawing a graph line of the Hall voltage data points in a specified area of a graphical user interface and displaying, and drawing an abnormal magnetic hysteresis loop through continuous measurement.

9. A dynamically scheduled automated test system, characterized by, The application is applied to the dynamic scheduling automatic test method in any one of claims 1-8, comprising a user terminal, a voltage source, a source measurement unit, an excitation unit and an ammeter, the user terminal comprises a user graphical interface for inputting and sending control parameters, receiving measurement data, saving measurement data and visualizing measurement data, the source measurement unit is used for applying bias current and collecting Hall voltage data, the excitation unit comprises a current source and an electromagnet, and the ammeter comprises an ammeter and a voltmeter; the control parameters comprise VCMA parameters and AHE parameters, the VCMA parameters comprise voltage amplitude, scanning mode and residence time, and the AHE parameters comprise magnetic field scanning range, scanning rate and bias current; The user terminal is connected with the interfaces of the voltage source, the source measurement unit and the excitation unit through data lines, the source measurement unit is connected with two ends opposite to the sample projection through wires, the voltage source is connected with the gate of the sample and the source measurement unit through wires, and is connected with two ends opposite to the sample projection in parallel, the current source provides excitation to the electromagnet through the energized winding and applies a magnetic field to the sample, and the internal magnetic field direction of the electromagnet is parallel to the vertical direction of the sample projection; The visualized measurement data comprises drawing IV characteristic curves, Hall voltage-magnetic field characteristic curves and Hall voltage-current characteristic curves.

10. The dynamically scheduled automated test system of claim 9, wherein, If the sample projection is a regular shape, when the sample is connected, the two ends opposite to the projection point to the sample edge, the source measurement unit sets two pairs of opposite polarity contact ends, two contact ends of the same polarity are connected to one end of the sample and are arranged at the two edges of the end respectively, and two contact ends of opposite polarity are connected to the opposite end, and two contact ends of opposite polarity are also arranged at the two edges of the opposite end. If the sample projection is an irregular shape, the length from the center to the edge has no continuous mutation value, when the sample is connected, two contact ends of one polarity of the source measurement unit are connected to one end of the sample and are arranged at the two edges of the end respectively, two contact ends of opposite polarity are connected to the opposite end, and two contact ends of opposite polarity are also arranged at the two edges of the opposite end, and the edge of the connection of the contact end is the far end of the center extending to the edge.

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