Column oven control method and temperature control system
By acquiring and determining temperature thresholds in real time and dynamically adjusting the temperature control mode, the problem of temperature fluctuation in column ovens under complex environments in existing technologies is solved. This achieves rapid response and stable temperature control, adapts to scenarios with frequent adjustments to target temperature, and improves analytical accuracy.
Patent Information
- Application Number
- CN202511614005.8
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2025-11-06
- Publication Date
- 2026-02-13
- Estimated Expiration
- 2045-11-06
AI Technical Summary
In the existing technology, single-heating column ovens cannot cope with complex temperature environments, and temperature fluctuations in cold and hot column ovens at room temperature affect the accuracy of analysis. PID algorithm adjustment has lag and cannot adapt to scenarios where the target temperature needs to be adjusted frequently.
By acquiring the current temperature, target temperature, and ambient temperature of the column temperature chamber in real time, a first threshold and a second threshold are determined. Based on these values, the current temperature control mode is determined, and a proportional-integral-derivative (PID) algorithm is used to control the temperature control module and the heating and cooling module. The reference in the temperature control process is dynamically adjusted to adapt to environmental changes.
It achieves rapid response and stable control of column oven temperature, avoids mode switching lag, adapts to scenarios with frequent adjustment of target temperature, and ensures analytical accuracy.
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Figure CN121068826B_ABST
Abstract
Description
TECHNICAL FIELD
[0001] The present application relates to the technical field of column oven temperature control, in particular to a column oven control method and a temperature control system. BACKGROUND
[0002] In a liquid chromatography system, the temperature stability of a chromatographic column directly affects the separation efficiency and detection accuracy, so the column oven is a key unit for maintaining the temperature of the chromatographic column and ensuring reliable analysis results. Different use scenarios have different requirements for the temperature coverage and stability of the column oven, and an accurate column oven temperature control method is urgently needed to meet different requirements.
[0003] In the prior art, a single-heating type column oven is only used to maintain a working condition higher than the ambient temperature, and a single proportional-integral-derivative (PID) algorithm is used for temperature control, which adjusts the heating power to achieve temperature stability. The cold and hot type column oven uses a single mode PID algorithm as the core to switch between heating and refrigeration modes, which can cover a wide temperature range.
[0004] However, the single-heating type column oven in the prior art cannot cope with complex temperature environments, and when the temperature range of the cold and hot type column oven covers room temperature, fluctuations in room temperature can affect the temperature in the oven, resulting in temperature fluctuations and affecting analysis accuracy. SUMMARY
[0005] The present application aims to solve the problem of low analysis accuracy in the prior art by providing a column oven control method and a temperature control system.
[0006] To achieve the above-mentioned purpose, the technical solution adopted by the present application is as follows:
[0007] In a first aspect, the present application provides a column oven control method, which is applied to a control module in a column oven temperature control system, the temperature control system comprising: the control module, a temperature control module, a heating and refrigeration module, an in-oven temperature detection assembly, and an ambient temperature detection assembly, the method comprising:
[0008] real-time acquisition of the current temperature of the column oven collected by the in-oven temperature detection assembly, the current target temperature of the column oven, and the current ambient temperature collected by the ambient temperature detection assembly;
[0009] determining a current first threshold value and a current second threshold value, the current first threshold value being a temperature difference threshold value between the current temperature and the current target temperature, and the current second threshold value being a temperature difference threshold value between the current target temperature and the current ambient temperature;
[0010] determining a current temperature control mode according to the current temperature, the current target temperature, the current ambient temperature, the current first threshold value and the current second threshold value, the current temperature control mode comprising: a heating mode or a cooling mode;
[0011] controlling the temperature control module and the heating and cooling module to perform temperature control of the column oven using a proportional-integral-derivative (PID) algorithm corresponding to the current temperature control mode.
[0012] Optionally, the determining of the current first threshold value comprises:
[0013] determining the current first threshold value according to the current temperature, a preset first temperature control coefficient and a preset first boundary coefficient.
[0014] Optionally, the determining method of the first temperature control coefficient comprises:
[0015] in a test environment, taking an ambient test temperature of the test environment as an initial temperature and a first target temperature of the column oven;
[0016] setting a second target temperature, a difference between the second target temperature and the initial temperature being greater than a preset third threshold value;
[0017] controlling the heating and cooling module to perform temperature control of the column oven according to the second target temperature, and collecting a current test temperature in real time;
[0018] determining an ambient temperature noise according to the ambient test temperature, taking a time when the current test temperature is greater than a preset multiple of the ambient temperature noise as a lag time, and determining a control lag duration according to the lag time, the control lag duration being a duration from a time of starting temperature control to the lag time;
[0019] determining a maximum temperature rising rate and an overshoot temperature according to a plurality of the current test temperatures and the second target temperature;
[0020] determining the first temperature control coefficient according to the control lag duration, the maximum temperature rising rate, the overshoot temperature and the third threshold value.
[0021] Optionally, the determining of the first temperature control coefficient according to the control lag duration, the maximum temperature rising rate, the overshoot temperature and the third threshold value comprises:
[0022] taking a product of the maximum temperature rising rate and the control lag duration as a first product, and taking a quotient of the first product and the third threshold value as a first quotient;
[0023] taking a quotient of the overshoot temperature and the first quotient as the first temperature control coefficient.
[0024] Optionally, the determining the current first threshold value according to the current temperature, the preset first temperature control coefficient and the preset first boundary coefficient comprises:
[0025] determining a current maximum temperature rising rate and a current control lag time according to the current temperature;
[0026] multiplying the current maximum temperature rising rate and the current control lag time to obtain a second product, and taking a quotient of the second product and the third threshold value as a second quotient;
[0027] multiplying the second quotient, the first temperature control coefficient and the first boundary coefficient to obtain the current first threshold value.
[0028] Optionally, the determining the current second threshold value comprises:
[0029] if the difference between the current target temperature and the current temperature is less than a historical second threshold value before the current second threshold value in a preset time, determining a first temperature fluctuation difference according to the current temperature, the historical second threshold value comprising an initial second threshold value or a non-initial second threshold value;
[0030] multiplying the first temperature fluctuation difference and a preset second boundary coefficient to obtain the current second threshold value.
[0031] Optionally, the determining method of the initial second threshold value comprises:
[0032] in a test environment and without starting the column temperature box control, if the difference between a current test temperature and an environment test temperature is less than a preset difference threshold value in a preset time, determining a second temperature fluctuation difference according to the current test temperature;
[0033] multiplying the first temperature fluctuation difference and the second boundary coefficient to obtain the initial second threshold value.
[0034] Optionally, the determining the current temperature control mode according to the current temperature, the current target temperature, the current environment temperature, the current first threshold value and the current second threshold value comprises:
[0035] if the difference between the current temperature and the current target temperature is less than a negative value of the current first threshold value, determining the current temperature control mode as a heating mode;
[0036] if the difference between the current temperature and the current target temperature is greater than the current first threshold value, determining the current temperature control mode as a cooling mode;
[0037] If the difference between the current temperature and the current target temperature is greater than or equal to a negative value of the current first threshold value and less than or equal to the current first threshold value, a current temperature control mode is determined according to the current temperature, the current target temperature, the current ambient temperature and the current second threshold value.
[0038] Optionally, the determining the current temperature control mode according to the current temperature, the current target temperature, the current ambient temperature and the current second threshold value comprises:
[0039] If the difference between the current ambient temperature and the current target temperature is less than a negative value of the current second threshold value and the difference between the current temperature and the current target temperature is greater than a preset value, the current temperature control mode is kept unchanged;
[0040] If the difference between the current ambient temperature and the current target temperature is less than a negative value of the current second threshold value and the difference between the current temperature and the current target temperature is less than or equal to a preset value, the current temperature control mode is determined as a heating mode;
[0041] If the difference between the current ambient temperature and the current target temperature is greater than the current second threshold value and the difference between the current temperature and the current target temperature is greater than a preset value, the current temperature control mode is determined as a cooling mode;
[0042] If the difference between the current ambient temperature and the current target temperature is greater than the current second threshold value and the difference between the current temperature and the current target temperature is less than or equal to a preset value, the current temperature control mode is kept unchanged;
[0043] If the difference between the current ambient temperature and the current target temperature is greater than or equal to a negative value of the current second threshold value and less than or equal to the current second threshold value, the current temperature control mode is kept unchanged.
[0044] In a second aspect, the present application provides a temperature control system, which comprises a control module, a temperature control module, a heating and cooling module, an in-chamber temperature detection assembly and an ambient temperature detection assembly, and further comprises a heat conduction assembly.
[0045] The control module is connected with the temperature control module, the heating and cooling module, the in-chamber temperature detection assembly and the ambient temperature detection assembly respectively.
[0046] The temperature control module is further connected with the in-chamber temperature detection assembly, the ambient temperature detection assembly and the heating and cooling module.
[0047] The heating and cooling module is in close contact with the heat conduction assembly.
[0048] The control module is configured to perform the steps of the column oven control method according to the first aspect.
[0049] The application has the beneficial effect that the current temperature of the column oven collected by the in-box temperature detection assembly, the current target temperature of the column oven, and the current environment temperature collected by the environment temperature detection assembly are acquired, a current first threshold value is determined, the current first threshold value is a temperature difference threshold value of the current temperature and the current target temperature, a current second threshold value is determined, the current second threshold value is a temperature difference threshold value of the current target temperature and the current environment temperature, a current temperature control mode is determined according to the current temperature, the current target temperature, the current environment temperature, the current first threshold value, and the current second threshold value, the current temperature control mode includes a heating mode or a refrigeration mode, and the proportional-integral-derivative (PID) algorithm corresponding to the current temperature control mode is used to control the temperature control module and the heating and refrigeration module to control the temperature of the column oven. In this embodiment, the current first threshold value and the current second threshold value are determined in real time, so that the temperature difference threshold value is updated according to the current temperature of the column oven, so that the temperature control mode is more accurate, and the current temperature control mode is determined according to the current temperature, the current target temperature, the current environment temperature, the current first threshold value, and the current second threshold value, so that the temperature control is quickly responsive, and the frequent switching of the mode when the environment temperature interference is weak is avoided, the working condition that the environment temperature change is sufficient to affect the switching of the heating and refrigeration modes is adapted, and stable and efficient temperature control of the column oven in a wide temperature range is achieved. BRIEF DESCRIPTION OF DRAWINGS
[0050] In order to more clearly illustrate the technical solutions of the embodiments of the application, the following will briefly introduce the drawings needed to be used in the embodiments. It should be understood that the following drawings only show some embodiments of the application, and therefore should not be regarded as a limitation on the scope. For those skilled in the art, other related drawings can also be obtained without creative labor.
[0051] Figure 1 is a structural schematic diagram of a temperature control system provided by an embodiment of the application;
[0052] Figure 2 is a structural schematic diagram of a semiconductor refrigeration sheet provided by an embodiment of the application;
[0053] Figure 3 is a flowchart of a column oven control method provided by an embodiment of the application;
[0054] Figure 4 is a flowchart of determining a current temperature control mode provided by an embodiment of the application;
[0055] Figure 5 is another flowchart of determining a current temperature control mode provided by an embodiment of the application;
[0056] Figure 6 is another flow diagram for determining a current temperature control mode provided by an embodiment of the present application;
[0057] Figure 7 is another flow diagram for determining a current temperature control mode provided by an embodiment of the present application;
[0058] Figure 8 is a flow diagram for determining a first temperature system provided by an embodiment of the present application;
[0059] Figure 9 is another flow diagram for determining a current first threshold provided by an embodiment of the present application;
[0060] Figure 10 is a diagram of first working condition data provided by an embodiment of the present application;
[0061] Figure 11 is a diagram of second working condition data provided by an embodiment of the present application;
[0062] Figure 12 is a diagram of third working condition data provided by an embodiment of the present application. DETAILED DESCRIPTION
[0063] In order to make the objectives, technical solutions and advantages of the embodiments of the present application clearer, the technical solutions in the embodiments of the present application will be described clearly and completely below with reference to the drawings in the embodiments of the present application. It should be understood that the drawings in the present application only serve the purpose of description and illustration, and are not used to limit the scope of protection of the present application. In addition, it should be understood that the schematic drawings are not drawn according to the actual proportions. The flowchart shows the operations implemented according to some embodiments of the present application. It should be understood that the operations of the flowchart can not be implemented in sequence, and the steps without logical context relationship can be reversed in sequence or implemented simultaneously. In addition, one or more other operations can be added to the flowchart or removed from the flowchart by those skilled in the art under the guidance of the content of the present application.
[0064] In addition, the described embodiments are only some of the embodiments of the present application, not all the embodiments. The components of the embodiments of the present application described and shown in the drawings herein can be arranged and designed in various different configurations. Therefore, the following detailed description of the embodiments of the present application provided in the drawings is not intended to limit the scope of the claimed present application, but only represents selected embodiments of the present application. Based on the embodiments of the present application, all other embodiments obtained by those skilled in the art without creative labor are within the scope of protection of the present application.
[0065] It should be noted that the term "comprising" will be used in the embodiments of the present application to specify the presence of stated features, but does not exclude the presence of other features.
[0066] In the prior art, a single heating type column oven or a cold and hot type column oven is usually used to realize column oven temperature control. However, the single heating type column oven cannot cope with complex temperature environments. When the temperature range of the cold and hot type column oven covers room temperature, the fluctuation of the room temperature can affect the temperature in the oven, thereby causing temperature fluctuation and affecting analysis accuracy. Moreover, when the cold and hot type column oven is working, if the target temperature is adjusted to be lower than the current temperature when heating or the target temperature is adjusted to be higher than the current temperature when cooling, due to the inertia of the PID algorithm adjustment, the mode will be switched only when the temperature deviation direction is reversed, which leads to switching lag, and the temperature is easy to deviate from the target value during the period, and the cold and hot type column oven cannot adapt to the scene of frequent adjustment of the target temperature.
[0067] Therefore, the present application provides a column oven control method. The method first acquires the current temperature, the current target temperature and the current environment temperature of the column oven, and determines the current first threshold value and the current second threshold value. Then, the current temperature control mode is determined according to the current temperature, the current target temperature, the current environment temperature, the current first threshold value and the current second threshold value, so as to control the temperature control module and the heating and cooling module thereof using the PID algorithm corresponding to the current temperature control mode to control the temperature of the column oven. During the control process, the temperature control mode is adjusted in real time according to the current temperature, the current target temperature and the current environment temperature, so as to avoid mode switching lag, ensure that the temperature of the column oven is stably at the target temperature, and dynamically adjust the reference in the temperature control process, so as to adapt to the current working environment and adapt to the scene of frequent adjustment of the target temperature.
[0068] Figure 1 is a structural schematic diagram of a temperature control system provided by an embodiment of the present application. As shown in Figure 1 The temperature control system includes a control module, a temperature control module, a heating and cooling module, an in-oven temperature detection assembly and an environment temperature detection assembly. The control module is connected with the temperature control module, the heating and cooling module, the in-oven temperature detection assembly and the environment temperature detection assembly. The temperature control module is further connected with the in-oven temperature detection assembly, the environment temperature detection assembly and the heating and cooling module. The heating and cooling module is in close contact with a heat conduction assembly. The heating and cooling module includes a semiconductor cooling sheet and a heat dissipation sheet. Optionally, the temperature control system further includes a power module connected with the control module and the temperature control module and supplying power to the control module and the temperature control module. The control module is used for the steps of the column oven control method.
[0069] The column oven is used to hold the chromatographic column. It includes a front door located on one side, allowing operators to access and place the column. A heat-conducting assembly is installed on the side of the column oven opposite the front door, facilitating heat transfer between the thermoelectric cooler and the interior of the oven. The thermoelectric cooler serves as the heat source for both heating and cooling. One side of the cooler is in contact with the heat-conducting assembly, and the other side is in contact with a heat sink. When the heating / cooling module heats one side of the column oven, the heat sink dissipates heat; conversely, when the module cools one side, the heat sink dissipates heat.
[0070] The ambient temperature detection component is located at a preset distance outside the column oven, while the internal temperature detection component is located close to the column holder.
[0071] Optionally, the drive control circuit for the thermoelectric cooler includes a first MOSFET Q1, a second MOSFET Q2, a third MOSFET Q3, a fourth MOSFET Q4, and a thermoelectric cooler (TEC). The drain of the first MOSFET Q1 is connected to a power supply, and its gate is connected to a control module. The source of the first MOSFET Q1 is connected to the drain of the second MOSFET Q2 and one end of the thermoelectric cooler (TEC). The source of the second MOSFET Q2 is grounded, and its gate is connected to the control module. The drain of the third MOSFET Q3 is connected to a power supply, and its gate is connected to the control module. The source of the third MOSFET Q3 is connected to the drain of the fourth MOSFET Q4 and the other end of the thermoelectric cooler (TEC). The source of the fourth MOSFET Q4 is grounded, and its gate is connected to the control module. The control module controls the switching of the first MOSFET Q1, second MOSFET Q2, third MOSFET Q3, and fourth MOSFET Q4 to control the thermoelectric cooler (TEC) for heating or cooling.
[0072] Figure 2 This is a schematic diagram of a semiconductor refrigeration chip provided in an embodiment of this application. The semiconductor refrigeration chip is of the current-driven type, such as... Figure 2 As shown, when the first MOSFET Q1 and the fourth MOSFET Q4 are turned on, and the second MOSFET Q2 and the third MOSFET Q3 are turned off, the current flows from left to right. Figure 2 The circuit structure shown is located on the left side near the cylindrical temperature chamber, indicating it is in heating mode and cooled by heat sinks. When the second MOSFET Q2 and the third MOSFET Q3 are turned on, and the first MOSFET Q1 and the fourth MOSFET Q4 are turned off, current flows from right to left, indicating cooling mode, and cooling is achieved through heat sinks. It is evident that the control module controls the heating and cooling modes by controlling the on / off states of each transistor, and the temperature control module uses a PID algorithm corresponding to the temperature control mode to control the power adjustment of the semiconductor cooler (TEC).
[0073] Next, refer to Figure 3 The column oven control method provided in the application is introduced. Among them, Figure 3 is a flowchart of a column oven control method provided by an embodiment of the application.
[0074] S301, the current temperature of the column oven collected by the in-box temperature detection component, the current target temperature of the column oven, and the current environment temperature collected by the environment temperature detection component are acquired in real time.
[0075] The current target temperature of the column oven can be dynamically regulated according to actual needs. For example, when gradient heating is required, the current target temperature needs to be dynamically updated.
[0076] Optionally, the in-box temperature detection component and the environment temperature detection component can collect temperatures in real time according to a preset time period.
[0077] Optionally, if the current target temperature jumps, such as a fluctuation amplitude exceeding a preset temperature threshold, the system determines whether the current target temperature is reasonable, if yes, the subsequent control method is continued to be executed, and if no, a warning signal is generated to avoid damage to the column due to sudden temperature change.
[0078] S302, a current first threshold value and a current second threshold value are determined, the current first threshold value is a temperature difference threshold value of the current temperature and the current target temperature, and the current second threshold value is a temperature difference threshold value of the current target temperature and the current environment temperature.
[0079] As an optional embodiment, the current first threshold value and the current second threshold value can be preset, and the current first threshold value and the current second threshold value can be adjusted according to actual needs during the column oven temperature control process.
[0080] As another optional embodiment, the current first threshold value can be determined in real time according to the current temperature, the current environment temperature, and a preset first temperature control coefficient, and the current second threshold value can be determined in real time according to the current temperature. Specifically, the current first threshold value is a temperature difference threshold value of the current temperature and the current target temperature, when the difference between the current temperature and the current target temperature is greater than the current first threshold value, it indicates that the temperature deviation has exceeded an acceptable small fluctuation, and forced switching mode is required. The current second threshold value is a temperature difference threshold value of the current target temperature and the current environment temperature, when the difference between the current target temperature and the current environment temperature is greater than the current second threshold value, it indicates that the environment has a large interference on the in-box temperature, and active intervention is required in the small deviation scenario to prevent it from being adjusted by the current control mode.
[0081] Optionally, the range of the current first threshold value and the current second threshold value can be preset according to actual needs, and after the current first threshold value and the current second threshold value are determined, it is judged whether the current first threshold value and the current second threshold value exceed the corresponding range, and if so, the corresponding critical value of the corresponding range is taken as a new current first threshold value or a new current second threshold value. For example, if the preset range of the current first threshold value is 2.5-5℃, the calculated current first threshold value is 3℃, then 3℃ is taken as the current first threshold value. If the calculated current first threshold value is 1℃, 2.5℃ is taken as the new current first threshold value, and if the calculated current first threshold value is 6℃, 5℃ is taken as the new current first threshold value. Optionally, the range of the current first threshold value and the range of the current second threshold value can be adjusted according to actual needs.
[0082] S303, determining a current temperature control mode according to the current temperature, the current target temperature, the current environment temperature, the current first threshold value and the current second threshold value, the current temperature control mode including a heating mode or a cooling mode.
[0083] As an optional embodiment, first, it is determined whether the difference between the current temperature and the current target temperature exceeds a temperature difference critical value according to the current temperature, the current target temperature and the current first threshold value, and if so, the current temperature control mode is immediately adjusted. If not, it is further determined whether the current second threshold value is exceeded according to the current target temperature and the current environment temperature, and if so, it indicates that the environment temperature has a great influence on the temperature in the box, and then the current temperature control mode is determined according to the temperature difference between the current temperature and the current target temperature, and if not, it indicates that the environment temperature has a small influence on the temperature in the box, and then the current control mode is kept unchanged, thereby avoiding invalid switching and equipment loss caused by frequent switching of the control mode.
[0084] Optionally, the heating mode can also be divided into a micro-heating mode and a forced heating mode, and the cooling mode can also be divided into a micro-cooling mode and a forced cooling mode. The corresponding PID parameters are different in different modes to control according to different powers.
[0085] S304, using the proportional-integral-derivative (PID) algorithm corresponding to the current temperature control mode to control the temperature control module and the heating and cooling module for temperature control of the column oven.
[0086] Optionally, due to the significant difference between the heating and cooling characteristics of the liquid chromatography column oven, the PID parameters of the heating mode and the PID parameters of the cooling mode need to be designed specifically, and PID self-tuning can be performed to avoid manual parameter debugging errors.
[0087] Optionally, the temperature control module outputs an adjustment instruction based on a PID algorithm and converts it into an electrical signal recognizable by hardware, such as a pulse width modulation (PWM) pulse signal. After the temperature control module receives the signal, the heating and cooling module performs a heating or cooling action, and finally stabilizes the temperature in the box at the target value.
[0088] In this embodiment, the current temperature of the column oven, the current target temperature of the column oven, and the current ambient temperature collected by the ambient temperature detection assembly are obtained, the current first threshold is determined, and the current second threshold is determined. The current first threshold is a temperature difference threshold between the current temperature and the current target temperature, and the current second threshold is a temperature difference threshold between the current target temperature and the current ambient temperature. According to the current temperature, the current target temperature, the current ambient temperature, the current first threshold, and the current second threshold, the current temperature control mode is determined. The current temperature control mode includes a heating mode or a cooling mode. The proportional integral derivative (PID) algorithm corresponding to the current temperature control mode is used to control the temperature control module and the heating and cooling module for temperature control of the column oven. In this embodiment, the current first threshold and the current second threshold are determined in real time, so that the temperature difference threshold is updated according to the current temperature of the column oven, so that the temperature control mode is more accurate. According to the current temperature, the current target temperature, the current ambient temperature, the current first threshold, and the current second threshold, the current temperature control mode is determined, which not only ensures rapid temperature control response, but also avoids frequent switching of the mode when the ambient temperature interference is weak. The working condition that the ambient temperature change is sufficient to affect the switching of the heating and cooling mode is adapted, and stable and efficient temperature control of the column oven in a wide temperature range is achieved.
[0089] Next, referring to Figure 4 The specific method for determining the current temperature control mode in step S303 is introduced. Among them, Figure 4 is a flowchart for determining the current temperature control mode provided by the present application.
[0090] S401, if the difference between the current temperature and the current target temperature is less than the negative value of the current first threshold, the current temperature control mode is determined as the heating mode.
[0091] The current first threshold is a temperature difference threshold between the current temperature and the current target temperature. If the difference between the current temperature and the current target temperature is less than the negative value of the current first threshold, it means that the current temperature is much lower than the current target temperature, and strong heating must be used to quickly pull back the temperature, otherwise the current temperature may continue to deviate from the target.
[0092] S402, if the difference between the current temperature and the current target temperature is greater than the current first threshold, the current temperature control mode is determined as the cooling mode.
[0093] When the difference between the current temperature and the current target temperature is greater than the current first threshold, it indicates that the current temperature is much greater than the current target temperature, and the temperature must be quickly pulled back by forced refrigeration to avoid continuous over-temperature.
[0094] S403, if the difference between the current temperature and the current target temperature is greater than or equal to the negative value of the current first threshold, and less than or equal to the current first threshold, the current temperature control mode is determined according to the current temperature, the current target temperature, the current environment temperature and the current second threshold.
[0095] Wherein, since the environment temperature will affect the temperature in the oven through heat conduction, that is, when the environment temperature is lower than the current target temperature, the oven is prone to lose temperature; when the environment temperature is higher than the current target temperature, the oven is prone to heat up, therefore, when the current temperature difference is in an acceptable small range, only looking at the current temperature difference is not enough to determine the current temperature control mode. At this time, the current second threshold is introduced to determine whether the environment temperature is strong interference or weak interference, so as to determine whether the mode is switched.
[0096] In this embodiment, the current temperature control mode is determined by judging whether the current temperature is less than the negative value of the current first threshold, whether it is greater than the current first threshold, and whether it is between the negative value of the current first threshold and the current first threshold. Through the above hierarchical logic, it is ensured that the current temperature and the current target temperature can be quickly responded when the temperature difference is too large, and the influence of the environment temperature on the mode determination is avoided when the temperature difference is small, so as to finally realize stable and efficient temperature control.
[0097] Further, Figure 5 is another flowchart for determining the current temperature control mode provided by the embodiment of the application. Refer to Figure 5 The specific steps of determining the current temperature control mode according to the current temperature, the current target temperature, the current environment temperature and the current second threshold in the above step S403 are introduced.
[0098] S501, if the difference between the current environment temperature and the current target temperature is less than the negative value of the current second threshold, and the difference between the current temperature and the current target temperature is greater than a preset value, the current temperature control mode is kept unchanged.
[0099] Wherein, the preset value can be a preset small deviation threshold in the oven, for example, it can be 0.5℃ or 0℃.
[0100] Optionally, if the difference between the current environment temperature and the current target temperature is less than the negative value of the current second threshold, it indicates that the current environment temperature is much lower than the current target temperature, at this time the environment will continuously absorb the heat in the oven, which may cause the temperature in the oven to drop.
[0101] If the difference between the current temperature and the current target temperature is greater than the preset small deviation threshold value in the box, it means that the current temperature is slightly higher than the current target temperature, but the difference is still within the range formed by the negative value of the current first threshold value and the current first threshold value, which means it is a small deviation.
[0102] If the above conditions are met at the same time, the low ambient temperature will naturally lower the current temperature. Even if the existing mode is not switched, the current slightly high current temperature may gradually fall back to the target temperature due to environmental heat absorption. If the mode is forcibly switched, such as from the weak heating mode to the cooling mode, the temperature in the box may drop suddenly, exceeding the allowed fluctuation range, so it is more stable to keep the current mode.
[0103] S502, if the difference between the current ambient temperature and the current target temperature is less than the negative value of the current second threshold value, and the difference between the current temperature and the current target temperature is less than or equal to the preset value, it is determined that the current temperature control mode is the heating mode.
[0104] When the difference between the current temperature and the current target temperature is less than or equal to the preset small deviation threshold value in the box, it means that the current temperature is close to or slightly lower than the current target temperature.
[0105] In this case, the effect of continuous heat absorption by the environment will be more obvious. Even if the current temperature is close to the current target temperature, it may continue to drop below the target temperature. Therefore, actively switching to the heating mode can supplement the heat in the box in advance to prevent the current temperature from further decreasing and avoid larger deviations in the future.
[0106] S503, if the difference between the current ambient temperature and the current target temperature is greater than the current second threshold value, and the difference between the current temperature and the current target temperature is greater than the preset value, it is determined that the current temperature control mode is the cooling mode.
[0107] When the difference between the current ambient temperature and the current target temperature is greater than the current second threshold value, the current ambient temperature is much higher than the current target temperature. At this time, the environment will continuously transfer heat to the box, which may cause the temperature in the box to rise.
[0108] When the difference between the current temperature and the current target temperature is greater than the preset small deviation threshold value in the box, that is, the preset value, it means that the current temperature is slightly higher than the current target temperature. Although the temperature difference is still within the range formed by the negative value of the current first threshold value and the current first threshold value, it has exceeded the preset small enough range.
[0109] In this case, the high temperature of the environment will continuously push up the current temperature. If not timely intervention, the current slightly high temperature may continue to rise, even exceeding the current first threshold value. Actively switching to the cooling mode can remove the excess heat in the box in advance to prevent the deviation from further expanding.
[0110] S504, if the difference between the current ambient temperature and the current target temperature is greater than the current second threshold value, and the difference between the current temperature and the current target temperature is less than or equal to the preset value, the current temperature control mode is kept unchanged.
[0111] When the difference between the current ambient temperature and the current target temperature is greater than the current second threshold value, it means that the current ambient temperature is much higher than the current target temperature. When the difference between the current temperature and the current target temperature is less than or equal to the preset in-box small deviation threshold value, it means that the current temperature is close to the current target temperature, indicating that the deviation is small enough.
[0112] At this time, the PID fine-tuning capability of the existing mode is sufficient to offset the small amount of heat transferred from the environment. For example, the weak cooling mode continuously removes a small amount of heat, which can just balance the heat transferred from the environment, so that the current temperature is stabilized near the target. Keeping the existing mode can avoid temperature fluctuations when switching modes.
[0113] S505, if the difference between the current ambient temperature and the current target temperature is greater than or equal to the negative of the current second threshold value and less than or equal to the current second threshold value, the current temperature control mode is kept unchanged.
[0114] When the difference between the current ambient temperature and the current target temperature is within the range formed by the negative of the current second threshold value and the current second threshold value, it means that the current ambient temperature is close to the current target temperature, and the current ambient temperature has weak and acceptable interference on the current temperature.
[0115] At this time, the difference between the current temperature and the current target temperature is within the range formed by the negative of the current first threshold value and the current first threshold value, and the PID algorithm of the existing mode can be used for accurate correction. For example, if the current mode is the fine-tuning heating mode, the heating power is slightly reduced, and if the current mode is the fine-tuning cooling mode, the cooling power is slightly reduced, without the need to switch modes. Frequent switching may break the existing stable state and cause temperature oscillation.
[0116] For example, if the target temperature changes dynamically, such as increasing from 25℃ to 40℃ at a gradient of 5℃ per 5 minutes, at the 5th minute, the target temperature increases to 30℃, and the current temperature in the box is 28℃. The current first threshold value is 2.5℃, and the current temperature and the current target temperature do not exceed the current first threshold value. The current ambient temperature is 25℃, the current second threshold value is 1℃, and the temperature difference between the current target temperature and the current ambient temperature is 5℃, which exceeds the current second threshold value, so the heating mode is kept.
[0117] In this embodiment, the current temperature control mode is determined according to the difference between the current ambient temperature and the current target temperature, and the difference between the current temperature and the current target temperature, so as to realize accurate and stable control of the temperature of the column oven.
[0118] Figure 6 is another flowchart for determining the current temperature control mode provided by an embodiment of the present application. When the temperature difference between the current temperature and the current target temperature is within the range formed by the negative value of the current first threshold value and the current first threshold value, the current temperature control mode can be determined according to Figure 6 the current temperature control mode.
[0119] Figure 7 is another flowchart for determining the current temperature control mode provided by an embodiment of the present application. The overall flow of determining the current temperature control mode is introduced. The preset value is set to 0. Figure 7
[0120] S701, obtaining a current temperature TempPv, a current target temperature TempSv and a current environment temperature TempOut;
[0121] S702, determining according to TempPv and TempSv: if TempPv-TempSv<-A, executing S703, if TempPv-TempSv>A, executing S704, if-A≤TempPv-TempSv≤A, executing S705; wherein A is the current first threshold value;
[0122] S703, determining that the current temperature control mode is the heating mode;
[0123] S704, determining that the current temperature control mode is the heating mode;
[0124] S705, determining according to TempOut and TempSv: if TempOut-TempSv<-B, executing S706, if TempOut-TempSv>B, executing S707, if-B≤TempOut-TempSv≤B, executing S708;
[0125] S706, determining according to TempPv and TempSv: if TempPv-TempSv>0, executing S708, if TempPv-TempSv≤0, executing S703;
[0126] S707, determining according to TempPv and TempSv: if TempPv-TempSv>0, executing S704, if TempPv-TempSv≤0, executing S708;
[0127] S708, keeping the current temperature control mode unchanged.
[0128] Next, the method for determining the current first threshold value in the above step S302 is introduced: the current first threshold value is determined according to the current temperature, the preset first temperature control coefficient and the preset first boundary coefficient.
[0129] The first temperature control coefficient can reflect core dynamic characteristics such as temperature control hysteresis, heating rate, and overshoot temperature. Optionally, the first temperature control coefficient can be determined based on pre-conducted temperature control tests.
[0130] The first boundary coefficient is used to balance control accuracy and stability. In high-precision scenarios, it can be set to a smaller value to make the mode control more sensitive. In fast-response scenarios, a larger first boundary coefficient can be set to avoid temperature fluctuations caused by frequent mode switching. For example, the first boundary coefficient can be between 1.1 and 4, typically 1.5.
[0131] Optionally, different first boundary coefficients can be set for different temperature ranges.
[0132] In this embodiment, the current first threshold is determined based on the current temperature, the preset first temperature control coefficient, and the preset first boundary coefficient, so that an appropriate threshold can be determined according to the specific application scenario of the column temperature chamber.
[0133] Next, refer to Figure 8 The method for determining the first temperature control coefficient is introduced. Figure 8 This is a schematic diagram of a process for determining a first temperature system provided in an embodiment of this application.
[0134] S801. Under the test environment, the ambient test temperature of the test environment shall be used as the initial temperature and the first target temperature of the column oven.
[0135] Optionally, steps S801-S606 can be performed in the test environment before starting the column oven control method to adjust the column temperature, in order to determine the first temperature control coefficient.
[0136] Optionally, the initial temperature of the column oven can be set to the same initial state as the ambient test temperature to simulate the actual working condition of the column oven being adjusted from room temperature after being turned on in actual use.
[0137] S802. Set a second target temperature. The difference between the second target temperature and the initial temperature is greater than a preset third threshold.
[0138] Optionally, the third threshold can be the minimum temperature difference that ensures the heating and cooling modules can operate at maximum power; for example, the third threshold is 40 degrees Celsius. If the difference between the second target temperature and the initial temperature is too small, the heating and cooling modules may adjust to low power, failing to reflect the maximum heating rate and maximum overshoot, among other extreme characteristics.
[0139] S803. According to the second target temperature, control the heating and cooling module to control the temperature of the column temperature chamber and collect the current test temperature in real time.
[0140] Optionally, the plurality of current test temperatures in the preset time period are collected in real time.
[0141] Wherein, the column temperature box can be controlled to heat or to cool, which is not limited here.
[0142] S804, determine the ambient temperature noise according to the environmental test temperature, take the time when the current test temperature is greater than the preset multiple of the ambient temperature noise as the lag time, and determine the control lag duration according to the lag time, which is the duration from the start of temperature control to the lag time.
[0143] Wherein, the ambient temperature noise is the temperature fluctuation of the test environment itself, for example, the laboratory environment temperature is 25±0.2℃, and the ambient temperature noise is 0.2℃.
[0144] Optionally, it is judged whether the current test temperature is greater than the preset multiple of the ambient temperature noise, which is used to ensure that the temperature change is the result of active adjustment of the device, rather than caused by environmental noise. As an optional embodiment, the time when all current test temperatures in the preset continuous duration are greater than the preset multiple of the ambient temperature noise can be taken as the lag time.
[0145] The control lag duration can reflect the degree of response sluggishness. The longer the lag, the slower the device response, and the larger the first temperature control coefficient, which avoids frequent switching caused by too strict subsequent threshold setting.
[0146] S805, determine the maximum temperature rising rate and the overshoot temperature according to the plurality of current test temperatures and the second target temperature.
[0147] Wherein, the maximum temperature rising rate is used to reflect the rate of temperature adjustment of the device, which can be determined by the maximum slope of the time-temperature curve. And the maximum temperature rising rate can be updated in real time in a preset time span.
[0148] The overshoot temperature can reflect the stability of the device, and the maximum value of the temperature exceeding the second target temperature can be taken as the overshoot temperature. For example, the second target temperature is 70℃, and the temperature continues to rise according to the heating mode, and the maximum temperature is 72℃, so the overshoot temperature is 2℃. The larger the overshoot temperature, the less stable the device temperature control, and the larger the first temperature control coefficient, which avoids serious over-temperature caused by too loose subsequent threshold setting.
[0149] Optionally, the maximum value of the temperature exceeding the second target temperature for the first time can be taken as the overshoot temperature, or the maximum over-temperature value before the temperature stabilizes can be taken as the overshoot temperature.
[0150] S806, determine the first temperature control coefficient according to the control lag duration, the maximum temperature rising rate, the overshoot temperature, and the third threshold value.
[0151] As an optional implementation, the normalized result can be determined according to the maximum temperature rising rate, the control lag time length, and the third threshold value, and then the first temperature control coefficient can be determined according to the normalized result and the overshoot temperature.
[0152] As an optional implementation, the plurality of first temperature control coefficients can be determined based on the ambient temperature, so that corresponding first temperature control coefficients are selected for control in the temperature control process based on different ambient temperatures.
[0153] In this embodiment, the first temperature control coefficient is determined in advance in a test environment, so that the calculation of the subsequent current first threshold value can accurately match the device capability.
[0154] Next, the step of how to determine the first temperature control coefficient in step S806 is described in detail.
[0155] Optionally, the product of the maximum temperature rising rate and the control lag time length is taken as a first product, and the quotient of the first product and the third threshold value is taken as a first quotient.
[0156] Optionally, the first quotient can be a normalized value for representing the potential adjustment capability.
[0157] Optionally, the quotient of the overshoot temperature and the first quotient is taken as the first temperature control coefficient.
[0158] Optionally, the overshoot temperature can reflect the stability of the device.
[0159] Optionally, if the first temperature control coefficient is large, it means that the comprehensive temperature control capability of the device is weak, and the subsequent threshold value needs to be set conservatively. If the first temperature control coefficient is small, it means that the comprehensive temperature control capability of the device is strong, and the subsequent threshold value can be set strictly.
[0160] In this embodiment, the product of the maximum temperature rising rate and the control lag time length is taken as a first product, the quotient of the first product and the third threshold value is taken as a first quotient, and the quotient of the overshoot temperature and the first quotient is taken as the first temperature control coefficient, so that the coefficient can be directly related to the real capability of the device.
[0161] Figure 9 is another flowchart for determining the current first threshold value provided by the embodiment of the present application. As shown in Figure 9 The process of determining the current first threshold value according to the current temperature, the preset first temperature control coefficient, and the preset first boundary coefficient in the above step is as follows.
[0162] S901, determining the current maximum temperature rising rate and the current control lag time according to the current temperature.
[0163] In the process of controlling the heating and refrigeration module to adjust the temperature, the current temperature and the current ambient temperature are acquired in real time, and the current maximum temperature rising rate and the current control lag time are determined according to a plurality of current temperatures in a preset time period.
[0164] Specifically, the temperature rising rate value corresponding to the current temperature is determined according to a plurality of current temperatures in a preset time, and the highest temperature rising rate value is taken as the current maximum temperature rising rate.
[0165] The current control lag time is determined according to a plurality of current temperatures in a preset time period and a preset power-temperature mapping table. The power-temperature mapping table includes a plurality of corresponding relationships between power and theoretical temperature.
[0166] S902, the product of the current maximum temperature rising rate and the current control lag time is taken as a second product, and the quotient of the second product and a third threshold value is taken as a second quotient.
[0167] The second product reflects the amount of temperature change that the device may theoretically produce in the lag phase under the current working condition. The second quotient is a normalized result of the potential adjustment capacity.
[0168] S903, the product of the second quotient, the first temperature control coefficient and the first boundary coefficient is taken as the current first threshold value.
[0169] As an optional implementation, the range of the current first threshold value can also be set. If the determined current first threshold value is in the range, the calculated current first threshold value is determined to be applied. If not, one extreme value of the range is taken as the current first threshold value.
[0170] In this embodiment, the calculated current first threshold value not only ensures the response to the real-time working condition, but also binds the device characteristics and user demand.
[0171] Next, the step of determining the current second threshold value in step S302 is introduced.
[0172] Optionally, if the difference between the current target temperature and the current temperature is less than the historical second threshold value before the current second threshold value in the preset time, the first temperature fluctuation difference is determined according to the current temperature. The historical second threshold value includes the initial second threshold value or the non-initial second threshold value.
[0173] Optionally, if the difference between the current target temperature and the current temperature is less than the historical second threshold value before the current second threshold value in the preset time, it indicates that the current temperature is in a stable state, which is the premise of adjusting the current second threshold value. If the difference is greater than the historical second threshold value, it indicates that the system is not stable, and adjusting the threshold value may lead to misjudgment.
[0174] It is worth mentioning that, before starting the column oven temperature adjustment, the initial second threshold value can be determined in advance in the test environment, and then the current second threshold value is adjusted in real time according to the previous second threshold value during the column oven temperature adjustment process.
[0175] The preset time can be 3 minutes in history.
[0176] Optionally, a plurality of current temperatures can be obtained within the preset time, and the plurality of current temperatures are sorted, the front preset proportion of the current temperatures and the rear preset proportion of the current temperatures are removed, and the difference between the maximum value and the minimum value in the remaining current temperatures is taken as the first temperature fluctuation difference value.
[0177] Optionally, the product of the first temperature fluctuation difference value and the preset second boundary coefficient is taken as the current second threshold value.
[0178] The second boundary coefficient can be a sensitivity adjustment parameter set by a user, and is used to balance the environmental interference detection sensitivity and the system stability.
[0179] In the embodiment, the current second threshold value is determined in real time, so that the dynamic optimization of the current second threshold value is realized, and the critical value of the environmental interference judgment is always matched with the current stability level of the system.
[0180] Optionally, the determination method of the initial second threshold value is as follows:
[0181] Optionally, in the test environment and without starting the column oven control, if the difference between the current test temperature and the environmental test temperature is less than the preset difference threshold value within the preset time, the second temperature fluctuation difference value is determined according to the current test temperature.
[0182] Optionally, the column oven control not started can be a working condition of the temperature control being turned off. A plurality of current temperatures can be obtained within the preset time, and the plurality of current temperatures are sorted, the front preset proportion of the current temperatures and the rear preset proportion of the current temperatures are removed, and the difference between the maximum value and the minimum value in the remaining current temperatures is taken as the second temperature fluctuation difference value.
[0183] Optionally, the product of the first temperature fluctuation difference value and the second boundary coefficient is taken as the initial second threshold value.
[0184] In the embodiment, the initial second threshold value is determined in real time, so that the current temperature control mode can be determined based on the initial second threshold value when the column oven control is started.
[0185] Figure 10 is a schematic diagram of first working condition data provided by the embodiment of the application, Figure 11 is a schematic diagram of second working condition data provided by the embodiment of the application, Figure 12is a schematic diagram of the third working condition data provided by the embodiment of the present application. Wherein, Figure 10 It is shown that when the ambient temperature is in [28.9, 30]℃, the target temperature is set to 25℃ from the initial 20℃, and based on the column temperature box control method proposed in the present application, the initial cooling mode is automatically switched to the heating mode, and finally switched to the cooling mode. Figure 11 It is shown that when the ambient temperature is in [23, 25]℃, the target temperature is set to 30℃ from the initial 35℃, and based on the column temperature box control method proposed in the present application, the initial heating mode is automatically switched to the cooling mode, and finally switched to the heating mode. Figure 12 It is shown that when the ambient temperature is in [24.2, 26.5]℃, the target temperature is set to 25℃, and the heating mode and the cooling mode are automatically switched.
[0186] The embodiment also provides a temperature control system, which comprises a control module, a temperature control module, a heating and cooling module, an in-box temperature detection assembly, and an ambient temperature detection assembly, and the column temperature box further comprises a heat conduction assembly.
[0187] The control module is connected with the temperature control module, the heating and cooling module, the in-box temperature detection assembly, and the ambient temperature detection assembly.
[0188] The temperature control module is further connected with the in-box temperature detection assembly, the ambient temperature detection assembly, and the heating and cooling module.
[0189] The heating and cooling module is in close contact with the heat conduction assembly.
[0190] The control module is used for executing the steps of the column temperature box control method.
[0191] The above is merely specific embodiments of the present application, but the protection scope of the present application is not limited thereto, and any person skilled in the art can easily think of changes or replacements within the technical range disclosed in the present application, which shall be covered in the protection scope of the present application.
Claims
1. A column temperature chamber control method, characterized in that, The method is applied to the control module of a column temperature chamber temperature control system. The temperature control system includes: the control module, a temperature control module, a heating and cooling module, an internal temperature detection component, and an ambient temperature detection component. The method includes: The current temperature of the column temperature chamber, the current target temperature of the column temperature chamber, and the current ambient temperature are acquired in real time by the chamber temperature detection component. Based on the current temperature, a preset first temperature control coefficient, and a preset first boundary coefficient, a current first threshold is determined. The first temperature control coefficient reflects temperature control hysteresis, heating rate, and overshoot temperature. The current first threshold is the critical temperature difference between the current temperature and the current target temperature. If, within a preset time, the difference between the current target temperature and the current temperature is less than a historical second threshold prior to the current second threshold, a first temperature fluctuation difference is determined based on the current temperature. The historical second threshold includes an initial second threshold or a non-initial second threshold. The product of the first temperature fluctuation difference and the preset second boundary coefficient is used as the current second threshold, which is the critical temperature difference between the current target temperature and the current ambient temperature. Based on the current temperature, the current target temperature, the current ambient temperature, the current first threshold, and the current second threshold, a current temperature control mode is determined, which includes either a heating mode or a cooling mode. The temperature of the column oven is controlled by the temperature control module and the heating and cooling module using the proportional-integral-derivative (PID) algorithm corresponding to the current temperature control mode.
2. The column temperature chamber control method according to claim 1, characterized in that, The method for determining the first temperature control coefficient includes: In the test environment, the ambient test temperature of the test environment is used as the initial temperature and the first target temperature of the column oven; A second target temperature is set, and the difference between the second target temperature and the initial temperature is greater than a preset third threshold. According to the second target temperature, the heating and cooling module is controlled to control the temperature of the column temperature chamber and the current test temperature is collected in real time. The ambient temperature noise is determined based on the ambient test temperature. The time when the current test temperature is greater than a preset multiple of the ambient temperature noise is taken as the lag time. The control lag duration is determined based on the lag time. The control lag duration is the time from the start of temperature control to the lag time. The maximum heating rate and overshoot temperature are determined based on the multiple current test temperatures and the second target temperature. The first temperature control coefficient is determined based on the control lag time, the maximum heating rate, the overshoot temperature, and the third threshold.
3. The column temperature chamber control method according to claim 2, characterized in that, The step of determining the first temperature control coefficient based on the control hysteresis duration, the maximum heating rate, the overshoot temperature, and the third threshold includes: The product of the maximum heating rate and the control hysteresis duration is taken as the first product, and the quotient of the first product and the third threshold is taken as the first quotient. The quotient of the overshoot temperature and the first quotient is used as the first temperature control coefficient.
4. The column temperature chamber control method according to claim 1, characterized in that, The step of determining the current first threshold based on the current temperature, a preset first temperature control coefficient, and a preset first boundary coefficient includes: Based on the current temperature, determine the current maximum heating rate and the current control lag time; The product of the current maximum heating rate and the current control lag time is taken as the second product, and the quotient of the second product and the third threshold is taken as the second quotient. The product of the second quotient, the first temperature control coefficient, and the first boundary coefficient is used as the current first threshold.
5. The column temperature chamber control method according to claim 1, characterized in that, The method for determining the initial second threshold is as follows: In the test environment, and without starting column temperature chamber control, if the difference between the current test temperature and the ambient test temperature is less than a preset difference threshold within a preset time, then a second temperature fluctuation difference is determined based on the current test temperature. The product of the first temperature fluctuation difference and the second boundary coefficient is used as the initial second threshold.
6. The column temperature chamber control method according to claim 1, characterized in that, The step of determining the current temperature control mode based on the current temperature, the current target temperature, the current ambient temperature, the current first threshold, and the current second threshold includes: If the difference between the current temperature and the current target temperature is less than the negative value of the current first threshold, then the current temperature control mode is determined to be the heating mode. If the difference between the current temperature and the current target temperature is greater than the current first threshold, then the current temperature control mode is determined to be the cooling mode. If the difference between the current temperature and the current target temperature is greater than or equal to the negative value of the current first threshold, and less than or equal to the current first threshold, then the current temperature control mode is determined based on the current temperature, the current target temperature, the current ambient temperature, and the current second threshold.
7. The column temperature chamber control method according to claim 6, characterized in that, The step of determining the current temperature control mode based on the current temperature, the current target temperature, the current ambient temperature, and the current second threshold includes: If the difference between the current ambient temperature and the current target temperature is less than the negative value of the current second threshold, and the difference between the current temperature and the current target temperature is greater than a preset value, then the current temperature control mode remains unchanged. If the difference between the current ambient temperature and the current target temperature is less than the negative value of the current second threshold, and the difference between the current temperature and the current target temperature is less than or equal to a preset value, then the current temperature control mode is determined to be the heating mode. If the difference between the current ambient temperature and the current target temperature is greater than the current second threshold, and the difference between the current temperature and the current target temperature is greater than a preset value, then the current temperature control mode is determined to be the cooling mode. If the difference between the current ambient temperature and the current target temperature is greater than the current second threshold, and the difference between the current temperature and the current target temperature is less than or equal to a preset value, then the current temperature control mode remains unchanged. If the difference between the current ambient temperature and the current target temperature is greater than or equal to the negative value of the current second threshold, and less than or equal to the current second threshold, then the current temperature control mode remains unchanged.
8. A temperature control system, characterized in that, The temperature control system includes: a control module, a temperature control module, a heating and cooling module, an internal temperature detection component, and an ambient temperature detection component. The column temperature chamber also includes a heat conduction component. The control module is connected to the temperature control module, the heating and cooling module, the internal temperature detection component, and the ambient temperature detection component, respectively. The temperature control module is also connected to the internal temperature detection component, the ambient temperature detection component, and the heating and cooling module. The heating and cooling module is in close proximity to the heat-conducting component; The control module is used to perform the steps of the column temperature chamber control method as described in any one of claims 1-7.
Citation Information
Patent Citations
Temperature control device and method for column oven of liquid chromatograph
CN114280183A