Processing module for acquiring resistance value of resistor to be measured and related measuring system

Abstract

The invention relates to a processing module for obtaining the resistance value of a to-be-measured resistor and a related measuring system, and the processing module is configured to obtain the resistance value of the to-be-measured resistor based on a first change curve, a second change curve, a current flowing through the to-be-measured resistor, and a digital voltage at two ends of the to-be-measured resistor measured by an analog-to-digital converter unit, the first change curve is the change relation between the current flowing through the standard resistor and the digital voltage at the two ends of the standard resistor measured by the analog-to-digital converter unit, and the second change curve is the change relation between the voltage and the resistance obtained based on the first change curve when the current is a preset value; the preset value is a current value in a linear interval of the first change curve, and the voltage range of the second change curve is a segment corresponding to the voltage range of the linear interval in the first change curve. Therefore, the high-accuracy resistance value of the to-be-measured resistor can be obtained.

Description

[0001] This application is a divisional application of the patent application filed on June 2, 2021, with application number 2021106164062 and invention title "Measuring System for Measuring Resistance Under Test". Technical Field

[0002] This disclosure specifically relates to a processing module and a related measurement system for obtaining the resistance value of a resistor under test. Background Technology

[0003] The traditional method for obtaining resistance values ​​using an analog-to-digital converter (ADC) is to directly connect the measurement system to the resistor under test. In this method, a current source unit in the measurement system is connected in series with the resistor under test and applies a known constant current to it. The ADC unit measures the analog voltage across the resistor under test, converts the measured analog voltage into a digital voltage output, and then calculates the resistance value using R = U / I.

[0004] However, the accuracy of the resistance value obtained directly from the formula R = U / I often depends on the precision of the measured voltage and current. The precision of the measured voltage and current largely depends on the accuracy of the analog-to-digital converter (ADC) and the current source unit. However, high-precision ADCs and current source units are very expensive. Therefore, operators often choose lower-precision ADCs and current source units for resistance and voltage measurements, which results in lower accuracy of the measured voltage and current, making it difficult to obtain a relatively accurate resistance value. Summary of the Invention

[0005] This disclosure is made in view of the above-mentioned situation, and its purpose is to provide a measurement system for measuring the resistance under test that can effectively reduce costs and has high accuracy.

[0006] Therefore, this disclosure provides a measurement system for measuring a resistor under test, comprising: a measurement module including a current source unit, an analog-to-digital converter unit, and a selection switch, wherein the current source unit and the analog-to-digital converter unit are connected to a standard resistor or the resistor under test to form a measurement loop by adjusting the selection switch; the current source unit is used to adjust the current flowing through the standard resistor or the resistor under test; and the analog-to-digital converter unit is used to measure the voltage across the standard resistor or the resistor under test and convert it into a digital voltage; a recording module recording a first change curve and a second change curve; and a processing module, which processes the data based on the first change curve and the second change curve, the current flowing through the resistor under test, and the voltage across the resistor under test. The resistance value of the resistor under test is obtained by measuring the digital voltage across the resistor. The first variation curve represents the relationship between the current flowing through the standard resistor and the voltage across the standard resistor when the current source unit, the analog-to-digital converter unit, and a standard resistor with a preset resistance value are connected and the current source is adjusted. The second variation curve represents the relationship between voltage and resistance when the current is a preset value, obtained based on the first variation curve. When the current through the resistor under test is the preset value, if the voltage across the resistor under test is within the linear range of the second variation curve, the processing module obtains the resistance value of the resistor under test based on the voltage across the resistor under test and the second variation curve.

[0007] In this disclosure, a measurement module acquires the voltage and current variation relationship corresponding to a standard resistor to obtain a first variation curve, and a second variation curve is obtained based on the first variation curve. The measurement module also acquires the voltage across the resistor under test when the current flowing through the resistor is a preset value, and then the processing module obtains the resistance value of the resistor under test. This allows for the acquisition of a resistance value with high accuracy.

[0008] In the measurement system disclosed herein for measuring resistance under test, optionally, the measurement system includes multiple resistances under test, and the measurement module is sequentially connected to one of the multiple resistances under test to form a measurement circuit. This allows the resistance values ​​of the multiple resistances under test to be obtained sequentially.

[0009] In the measurement system disclosed herein for measuring the resistance under test, the analog-to-digital converter unit optionally includes a resistor, an operational amplifier, and an analog-to-digital converter. This enables the measurement of the voltage across a standard resistor or the resistor under test.

[0010] In the measurement system disclosed herein for measuring a resistor under test, optionally, the resistance value of the resistor under test satisfies: R2 = ADC2 / ADC m ×R0, where R2 is the resistance value of the resistor under test, and ADC2 is the voltage across the resistor under test when the current through the resistor under test is the preset value.m The voltage across the standard resistor is measured when the current through the standard resistor is equal to the preset value, where R0 is the standard resistance value. This allows for a more accurate determination of the resistance value of the resistor under test.

[0011] In the measurement system disclosed herein for measuring the resistance under test, optionally, the preset value is a first threshold. When the current through the resistance under test is the first threshold, and the voltage across the resistance under test is not within the linear range of the second variation curve corresponding to the first threshold, the preset value is adjusted by adjusting the current source unit until the voltage across the resistance under test corresponding to the preset value is within the linear range of the corresponding second variation curve. In this case, it is easier to obtain a more accurate resistance value of the resistance under test subsequently.

[0012] In the measurement system disclosed herein for measuring the resistance under test, optionally, the first threshold is the current magnitude corresponding to the voltage measured by the analog-to-digital converter unit being the median of the range of the analog-to-digital converter unit. In this case, it is convenient to subsequently obtain the resistance value of the resistance under test.

[0013] In the measurement system disclosed herein for measuring a resistor under test, optionally, when the current through the resistor under test is the first threshold, the voltage across the resistor under test is not within the linear range of the second variation curve corresponding to the first threshold, and the voltage across the resistor under test is greater than the maximum voltage value corresponding to the linear range of the second variation curve, then the preset value is adjusted, and the adjusted preset value is less than the first threshold. This facilitates obtaining a more accurate resistance value for the resistor under test subsequently.

[0014] In the measurement system disclosed herein for measuring a resistor under test, optionally, when the current through the resistor under test is the first threshold, the voltage across the resistor under test is not within the linear range of the second variation curve corresponding to the first threshold, and the voltage across the resistor under test is less than the minimum voltage value corresponding to the linear range of the second variation curve, then the preset value is adjusted, and the adjusted preset value is greater than the first threshold. This facilitates obtaining a more accurate resistance value for the resistor under test subsequently.

[0015] In the measurement system disclosed herein for measuring the resistance under test, optionally, if the current source unit and the analog-to-digital converter unit form a measurement circuit with the standard resistor, then the current source unit is connected in series with the standard resistor, and the analog-to-digital converter unit is connected in parallel with the standard resistor. Thus, the current flowing through the standard resistor can be adjusted, and the voltage across the corresponding standard resistor can be obtained.

[0016] In the measurement system disclosed herein for measuring the resistance under test, optionally, if the current source unit and the analog-to-digital converter unit form a measurement circuit with the resistance under test, then the current source unit is connected in series with the resistance under test, and the analog-to-digital converter unit is connected in parallel with the resistance under test. Thus, the current flowing through the resistance under test can be adjusted, and the corresponding voltage across the resistance under test can be obtained.

[0017] The measurement system for measuring the resistance under test according to this disclosure can effectively reduce costs and has high accuracy. Attached Figure Description

[0018] Figure 1 This is a block diagram illustrating the structure of the measurement system involved in the example of this disclosure.

[0019] Figure 2A This is a block diagram illustrating the structure of the measurement module involved in the example of this disclosure.

[0020] Figure 2B This is a schematic diagram illustrating the structure of the measurement system involved in the example of this disclosure.

[0021] Figure 3 This is a schematic diagram of the measurement loop involved in the example of this disclosure.

[0022] Figure 4 This is a block diagram illustrating the structure of a measurement system involved in another example of this disclosure.

[0023] Figure 5 This is a schematic diagram illustrating the first variation curve involved in the example of this disclosure.

[0024] Figure 6 This is a schematic diagram illustrating the second variation curve involved in the example of this disclosure. Detailed Implementation

[0025] Hereinafter, preferred embodiments of the present disclosure will be described in detail with reference to the accompanying drawings. In the following description, the same reference numerals are used for the same components, and repeated descriptions are omitted. Furthermore, the drawings are merely schematic diagrams, and the proportions of the components or the shapes of the components may differ from actual figures.

[0026] Furthermore, the subheadings and similar terms used in the following description of this disclosure are not intended to limit the content or scope of this disclosure; they are merely intended to serve as reading prompts. Such subheadings should not be construed as dividing the content of the article, nor should the content under a subheading be limited to the scope of that subheading.

[0027] This disclosure provides a measurement system for measuring a resistor under test. This system enables the measurement of a resistor with an unknown resistance value (the resistor under test) and provides a resistance value with high accuracy.

[0028] In some examples, the resistor under test can be a conventional resistor, and the measurement system of this embodiment can be applied to the measurement of conventional resistors. For example, the resistor under test can be a carbon film resistor, a cement resistor, a metal film resistor, and a wire-wound resistor, etc. However, the examples in this disclosure are not limited to these; the resistor under test can be other devices, and the measurement system of this embodiment can measure the resistance value of such devices, thereby verifying whether the devices are properly connected or functioning normally.

[0029] In some examples, the measurement system can be applied in the medical field, such as in deep brain stimulators, cochlear implants, and retinal electrical stimulators. Taking a retinal electrical stimulator as an example, it can include an implanted portion and an external portion. The implanted portion of the retinal electrical stimulator can include an array of stimulating electrodes. When the retinal electrical stimulator is implanted into the patient's eye, multiple stimulating electrodes in the array must be properly implanted (e.g., the stimulating electrodes can be closely attached to the ganglion cells or bipolar cells of the retina) to ensure the retinal electrical stimulator functions normally. The measurement system described in this embodiment can be applied to a retinal electrical stimulator and sequentially measure the resistance of the implanted stimulating electrodes to determine the implantation status of each electrode based on its resistance value (described in detail later).

[0030] Figure 1 This is a block diagram illustrating the structure of the measurement system 1 involved in the example of this disclosure. Figure 2A This is a block diagram illustrating the structure of the measurement module 20 involved in the example of this disclosure. Figure 2B This is a schematic diagram illustrating the structure of the measurement system 1 involved in the example of this disclosure.

[0031] See in some examples Figure 1 The measurement system 1 can measure the resistance to be measured in the resistance region 10. In some examples, the resistance region 10 may include a standard resistor 110 with a preset resistance value. In some examples, the resistance region 10 may include several resistors to be measured with unknown resistance values ​​(e.g., see...). Figure 2B (e.g., resistors 120 and 121 to be measured). In this embodiment, the measurement system 1 can be used to measure and obtain the resistance value of the resistors to be measured.

[0032] See in some examples Figure 1The measurement system 1 may include a measurement module 20. In some examples, when using the measurement system 1 to measure the resistance of a resistor under test (e.g., resistor 120), the measurement module 20 may form a measurement circuit S with the standard resistor 110 and the resistor under test (see [reference]). Figure 3 In this process, the resistor to be measured or the standard resistor 110 constituting the measurement circuit S can be used as the target resistor R*. This facilitates the subsequent acquisition of the resistance value of the resistor to be measured. In some examples, if the resistance region 10 contains multiple resistors to be measured (e.g., resistors to be measured 120, 121, 122, etc.), the measurement module 20 can be sequentially connected to one of the multiple resistors to be measured to form the measurement circuit S. This allows the resistance values ​​of each resistor to be measured to be obtained sequentially.

[0033] See in some examples Figure 2A and Figure 2B The measurement module 20 may include a current source unit 210. In some examples, the current source unit 210 may include a current source. However, the examples in this disclosure are not limited to this, and the current source unit 210 may be other devices capable of adjusting the magnitude of the current flowing through the target resistor R*. For example, if an external power source or other device provides current in the measurement circuit S, the current source unit 210 may include a device for feedback of the current magnitude (e.g., an ammeter) and an adjustable resistor, etc.

[0034] In some examples, measurement module 20 may include analog-to-digital converter (ADC) unit 220. In some examples, ADC unit 220 may include an analog-to-digital converter (ADC). In some examples, ADC unit 220 may include other components, such as internal resistors and operational amplifiers. In this case, ADC unit 220 is capable of measuring the voltage across a target resistor R* and converting it to a digital voltage via the ADC. In some examples, ADC unit 220 may be formed by connecting various components containing ADCs, and the ADCs may be integrated together.

[0035] In some examples, measurement module 20 may include a selection switch 230. In some examples, selection switch 230 may be a common switching device. In some examples, selection switch 230 may also be other devices capable of selecting a target resistor R* from resistor region 10 to form measurement loop S. In some examples, selection switch 230 may exist alone. However, the examples of this disclosure are not limited thereto; selection switch 230 may also be integrated with analog-to-digital converter unit 220. For example, selection switch 230 may be multiple gate circuits or multiple MOSFETs acting as switches, and multiple gate circuits or multiple MOSFETs acting as switches may be directly integrated with analog-to-digital converter unit 220.

[0036] Figure 3This is a schematic diagram of the measurement loop S involved in the example of this disclosure.

[0037] See in some examples Figure 3 When the measurement system 1 is working, the measurement module 20 can use the selection switch 230 to form a measurement loop S with the current source unit 210, the analog-to-digital converter unit 220 and the target resistor R*.

[0038] Specifically, if the target resistance R* forming the measurement loop S is a standard resistor 110, the current source unit 210 can be connected in series with the standard resistor 110, and the analog-to-digital converter unit 220 can be connected in parallel with the standard resistor 110. If the target resistance R* forming the measurement loop S is a resistor to be measured (e.g., resistor 120), then the current source unit 210 can be connected in series with the resistor to be measured, and the analog-to-digital converter unit 220 can be connected in parallel with the resistor to be measured. In this case, the current source unit 210 can adjust the magnitude of the current flowing through the target resistor R*. The analog-to-digital converter unit 220 can measure the voltage across the target resistor R* and convert it into a digital voltage.

[0039] In some examples, the current source unit 210 and the analog-to-digital converter unit 220 may exist separately. In some examples, the current source unit 210 and the analog-to-digital converter unit 220 may be integrated together. In some examples, the standard resistor 110, the selection switch 230, and the analog-to-digital converter unit 220 may be integrated together simultaneously.

[0040] See in some examples Figure 1 The measurement system 1 may include a recording module 30. In some examples, the recording module 30 may be connected to the measurement module 20. In some examples, the recording module 30 may record the magnitude (i.e., current value) of the current flowing through the target resistor R* as adjusted by the current source unit 210. The recording module 30 may also record the digital voltage across the target resistor R* corresponding to each current value. That is, the magnitude of the current flowing through the target resistor R* adjusted by the current source unit 210 can be transmitted to the recording module 30 and recorded, and the digital voltage simultaneously measured by the analog-to-digital converter unit 220 can also be transmitted to the recording module 30 and recorded.

[0041] In some examples, the recording module 30 may transmit a feedback signal. In some examples, the feedback signal may be sent to the control module 50 (described later) and / or the measurement module 20. In this case, the measurement system 1 may be able to control the measurement module 20 or alert relevant personnel (e.g., adjust the current source unit 210, the selector switch 230, etc.).

[0042] Figure 4 This is a block diagram illustrating the structure of a measurement system 1, which is another example of this disclosure.

[0043] In some examples, the magnitude of the current flowing through the target resistor R* can be changed by repeatedly adjusting the current source unit 210. In this case, the recording module 30 can record multiple current values, and digital voltages corresponding to each of the multiple current values. In some examples, the recording module 30 can fit the obtained discrete points into a curve (e.g., a first variation curve) through a pre-set program.

[0044] In some examples, the current source unit 210 may include an adjustment switch. In this case, the current source unit 210 can be adjusted by adjusting the switch, thereby regulating the magnitude of the current flowing through the target resistor R*. In other examples, see [link to other examples]. Figure 4 The measurement system 1 may also include a control module 50. In some examples, the control module 50 may be connected to the measurement module 20. For example, the control module 50 may be connected to the current source unit 210. In some examples, the control module 50 can adjust the current source unit 210, thereby adjusting the magnitude of the current flowing through the target resistor R*.

[0045] In some examples, the control module 50 can be wired to the current source unit 210. In other examples, the control module 50 can be wirelessly connected to the current source unit 210. For example, the wired connection can be a data cable connection, and the wireless connection can be a Bluetooth connection, a WiFi connection, an infrared connection, an NFC connection, or a radio frequency connection, etc.

[0046] In some examples, the control module 50 may exist separately from the recording module 30, and may be connected to the measurement module 20 and / or the recording module 30. In some examples, the recording module 30 may also simultaneously have the functionality of the control module 50.

[0047] Figure 5 This is a schematic diagram illustrating the first variation curve involved in the example of this disclosure.

[0048] In some examples, when measuring the resistance of the resistor under test (e.g., resistor 120) using measurement system 1, a standard resistor 110 can be connected via selector switch 230 to obtain the first variation curve (see...). Figure 5 (Curve A in the example). In some examples, the first curve of change may have at least a roughly linear range of change (see curve A in the example). Figure 5 In some examples, within interval a, the digital voltage measured by the analog-to-digital converter unit 220 may be approximately the same as the actual voltage across the target resistor R*. For example, within interval a, the digital voltage across the target resistor R* measured by the analog-to-digital converter unit 220 is equal to the actual voltage across the target resistor R*. That is, within interval a, the digital voltage across the target resistor R* measured by the analog-to-digital converter unit 220 is accurate.

[0049] Specifically, when the measurement system 1 is operating, firstly, the current source unit 210 and the analog-to-digital converter unit 220 in the measurement module 20 can be connected to the standard resistor 110 to form a measurement circuit S via the selection switch 230. Secondly, by repeatedly adjusting the current source unit 210, the recording module 30 can obtain multiple current values ​​flowing through the standard resistor 110, and multiple digital voltages corresponding to each current value. In this case, the recording module 30 can obtain the relationship between the current flowing through the standard resistor 110 and the voltage across the standard resistor 110 (i.e., the digital voltage) through the multiple current values ​​and digital voltages corresponding to the standard resistor 110, thus obtaining the first change curve.

[0050] In some examples, the current flowing through the standard resistor 110 can be gradually decreased from its maximum value until the current flowing through the standard resistor 110 is minimized, at which point the adjustment of the current source unit 210 can be stopped or the current source unit 210 can be turned off. In some examples, the current flowing through the standard resistor 110 can be gradually increased from its minimum value until the current flowing through the standard resistor 110 is maximized. However, the examples disclosed herein are not limited to these. The adjustment of the current source unit 210 can also be stopped or turned off when the change in the relationship between the current flowing through the standard resistor 110 and the digital voltage changes from approximately linear to nonlinear. Alternatively, the adjustment of the current source unit 210 can be stopped or turned off after obtaining several sets of data (i.e., current values ​​and corresponding digital voltages) by continuing to increase or decrease the current value. For example, the recording module 30 can simultaneously record the current value and the digital voltage and generate a first change curve (see [reference]) during multiple adjustments of the current source unit 210. Figure 5 In curve A), when the first change curve changes from approximately linear to nonlinear, the recording module 30 can send a feedback signal to stop or turn off the current source unit 210, or the current source unit 210 can continue to measure several sets of data before stopping or turning off.

[0051] In some examples, the current flowing through the standard resistor 110 can be increased or decreased by adjusting the current source unit 210 in an arithmetic progression. In some examples, when the change in the current flowing through the standard resistor 110 and the digital voltage changes from nonlinear to approximately linear, or from approximately linear to nonlinear, the difference in the arithmetic progression can be appropriately reduced to adjust the current flowing through the standard resistor 110. In this case, since the difference between the nonlinear and approximately linear transitions is reduced, the number of points in that region can be increased, thereby improving the accuracy of that region and obtaining a more precise range (working range). For example, the recording module 30 can simultaneously record the current magnitude and the digital voltage and generate a first change curve (see [reference]) while adjusting the current source unit 210 in a certain arithmetic progression. Figure 5 Curve A in the diagram), when the first change curve transforms from nonlinear to approximately linear (see curve A in the diagram), Figure 5 (at point b), or when the transformation changes from approximately linear to nonlinear (see...) Figure 5 At point c), the difference in the arithmetic sequence can be appropriately reduced when adjusting the current magnitude. In this case, it is easier to obtain the operating range (i.e., the linear operating range) of the analog-to-digital converter with higher accuracy in a more specific manner. However, the examples in this disclosure are not limited to this. In this embodiment, other methods can also be used to adjust the current source unit 210 to obtain the first variation curve.

[0052] Figure 6 This is a schematic diagram illustrating the second variation curve involved in the example of this disclosure.

[0053] In some examples, the recording module 30 can obtain a second change curve from the first change curve. The second change curve can be the relationship between voltage (i.e., digital voltage) and resistance when the current is a preset value I'. Specifically, as described above, the recording module 30 can obtain the first change curve corresponding to the standard resistor 110. The recording module 30 can set the current value to the preset value I', and thus, based on the first change curve and Ohm's law R = U / I, it can obtain the second change curve. For example, see... Figure 6 Line B is the second variation curve. When I = I' is specified, the linear interval in the first variation curve can be used to obtain line B according to Ohm's law R = U / I. Line B can be a straight line located within a certain interval (i.e., the linear interval).

[0054] In some examples, the current value corresponding to the second change curve (i.e., the preset value I') can be set by the relevant personnel. In other examples, the current value corresponding to the second change curve can be selected by the recording module 30.

[0055] In some examples, the preset value I' is variable (e.g., the first threshold, the second threshold, etc., described later). This facilitates obtaining a more accurate resistance value of the resistor under test later.

[0056] In some examples, when measurement system 1 is operating, a preset value I' (e.g., a first threshold) can be initially determined based on the range of analog-to-digital converter unit 220 and a first variation curve. Subsequently, the preset value I' (e.g., the second and third thresholds described later) can be adjusted based on the voltage or resistance value across the resistor under test (e.g., resistor 120). In some examples, the initially determined preset value I' can be the first threshold. The first threshold can be the current magnitude corresponding to the voltage measured by analog-to-digital converter unit 220 at the midpoint of its range. In this case, it facilitates the subsequent acquisition of the resistance value of the resistor under test.

[0057] In some examples, the measurement system 1 may include a processing module 40. In some examples, the processing module 40 may be connected to the recording module 30. In some examples, the processing module 40 may obtain the resistance value of the resistor under test based on a first change curve and a second change curve, as well as the current flowing through the resistor under test (e.g., resistor 120) and the digital voltage across the resistor under test.

[0058] Specifically, as described above, when the measurement system 1 is operating, the recording module 30 can obtain a first change curve and a second change curve. The processing module 40 can be connected to the recording module 30 and can also obtain the first and second change curves. After the recording module 30 obtains the first and second change curves, the measurement system 1 or a relevant person can adjust the selection switch 230 to connect the resistor under test (e.g., resistor 120) into the measurement circuit S, allowing the current source unit 210 to adjust the current flowing through the resistor under test, and the analog-to-digital converter unit 220 to measure the digital voltage across the resistor under test. Then, the measurement system 1 or a relevant person can adjust the current source unit 210 to set the current flowing through the resistor under test to a preset value I', while the analog-to-digital converter unit 220 measures the digital voltage across the resistor under test and transmits it to the processing module 40 via the recording module 30. In this case, the processing module 40 can obtain the resistance value of the resistor under test based on the first and second change curves, the current flowing through the resistor under test, and the digital voltage across the resistor under test.

[0059] In some examples, when the current through the resistor under test is a preset value I', if the voltage across the resistor under test is within the linear range of the second variation curve (i.e., the second variation curve segment corresponding to the voltage range of the linear operating range in the first variation curve, i.e., the second variation curve segment when the analog-to-digital converter unit 220 is in the linear operating range), then the processing module 40 can obtain the resistance value of the resistor under test based on the voltage across the resistor under test, the first variation curve, and the second variation curve. For example, when the preset value I' is determined to be a first threshold, the corresponding second variation curve is obtained, and the selection switch 230 and the current source unit 210 are adjusted so that the current flowing through the resistor under test is the first threshold. At the same time, the analog-to-digital converter unit 220 obtains the digital voltage across the resistor under test. If the processing module 40 determines that the digital voltage is within the linear range of the second variation curve, then the processing module 40 can obtain the resistance value of the resistor under test, which satisfies: R = ADC / ADC m ×R0, where R is the resistance of the resistor under test, and the ADC is the voltage across the resistor under test (which can be obtained by digital voltage conversion) when the current through the resistor under test is at a preset value I' (e.g., the first threshold). m It is the voltage across standard resistor 110 when the current through standard resistor 110 is a preset value I' (e.g., a first threshold), and R0 is the resistance value of standard resistor 110 (i.e., the predetermined resistance value). ADC m The resistance value can be obtained by the processing module 40 through the first variation curve. In this case, a relatively accurate resistance value of the resistor under test can be obtained. However, the examples in this disclosure are not limited to this. If the accuracy of the current source unit 210 is high, the resistance value of the resistor under test can be read directly from the second variation curve.

[0060] In some examples, when the current through the resistor under test is a preset value I', if the voltage across the resistor is not within the linear range of the second variation curve (or not within the range where the second variation curve is located), the preset value I' can be readjusted. This allows the second variation curve corresponding to the preset value I' to be re-obtained until the voltage across the resistor is within the linear range of the second variation curve when the current through the resistor is the preset value I'. For example, when the preset value I' is a first threshold, if the processing module 40 determines that the digital voltage is not within the linear range of the second variation curve, the processing module 40 can send a feedback signal to the recording module 30 or relevant personnel. The recording module 30 or relevant personnel can then redetermine the preset value I' until the voltage across the resistor corresponding to the current at the preset value I' is within the linear range of the corresponding second variation curve. In this case, it is easier to obtain a more accurate resistance value for the resistor under test subsequently.

[0061] In some examples, the preset value I' can be adjusted by the voltage across the resistor under test. For instance, if the preset value I' is a first threshold, and the voltage across the resistor under test is greater than the maximum voltage value corresponding to the linear interval of the second variation curve, then the preset value I' can be adjusted so that the adjusted preset value I' (i.e., the second threshold) is less than the first threshold. If the preset value I' is the first threshold, and the voltage across the resistor under test is less than the maximum voltage value corresponding to the linear interval of the second variation curve, then the preset value I' can be adjusted so that the adjusted preset value I' (i.e., the third threshold) is greater than the first threshold. This facilitates obtaining a more accurate resistance value for the resistor under test.

[0062] In some examples, the preset value I' can be adjusted multiple times until the corresponding voltage across the analog-to-digital converter unit 220 is within the linear range of the second variation curve corresponding to the preset value I'. In this case, the analog-to-digital converter unit 220 can operate within a linear range, where it can achieve higher accuracy, meaning the measured voltage is more accurate. In some examples, the boundary between the nonlinear and linear ranges in the first variation curve can be the first target point and the second target point, respectively. For example, see... Figure 5 In the diagram, point b on the first change curve corresponds to the first target point, and point c on the first change curve corresponds to the second target point. In some examples, the preset value I' can be within the range of the current value corresponding to the first target point to the current value corresponding to the second target point. For example, the current value corresponding to the first target point can be I1, and the current value corresponding to the second target point can be I2. The range of the preset value I' can be [I1, I2].

[0063] In some examples, the processing module 40 and the recording module 30 can exist independently, and the processing module 40 can be connected to the recording module 30. In other examples, the processing module 40 can also simultaneously possess the functions of the recording module 30. In some examples, the multiple modules included in the measurement system 1 can be integrated together.

[0064] As described above, the measurement system 1 involved in this embodiment can obtain the voltage and current change relationship corresponding to the standard resistor 110 through the measurement module 20, obtain a first change curve through the recording module 30, obtain a second change curve based on the first change curve, and obtain the voltage across the resistor under test when the current flowing through the resistor under test is a preset value I' through the measurement module 20. Furthermore, the resistance value of the resistor under test can be obtained through the processing module 40. This allows for the acquisition of a resistance value of the resistor under test with high accuracy.

[0065] In some examples, the measurement system 1 involved in this embodiment can be applied to a retinal electrical stimulator. In some examples, the retinal electrical stimulator may include an implanted portion and an external portion (not shown).

[0066] In some examples, the implanted portion may include an array of stimulating electrodes. The array of stimulating electrodes may include several stimulating electrodes. These electrodes can generate electrical stimulation signals based on visual signals. Specifically, after the implanted portion is inserted into the human body (e.g., inside the eye), it can receive visual signals, and the stimulating electrodes can convert the received visual signals into bidirectional pulsed current signals as electrical stimulation signals, thereby delivering bidirectional pulsed current signals to the ganglion cells or bipolar cells of the retina to generate light perception.

[0067] In some examples, the visual signals received by the implanted part can be acquired and processed by the camera and image processing device of the external part.

[0068] In some examples, the camera device can be used to capture images and convert those images into visual signals. For instance, the camera device can capture images of the patient's environment.

[0069] In some examples, the image processing device can receive visual signals generated by the camera device. The image processing device can process the visual signals and transmit them via a transmitting antenna to a receiving antenna of the implanted part, where they are received by the implanted part.

[0070] In some examples, the measurement system 1 can be located within the retinal electrostimulator, allowing for the sequential measurement of the resistance values ​​corresponding to the implanted stimulation electrodes. For instance, the measurement module 20 and standard resistor 110 in the measurement system 1 can be located within the implanted portion, while the recording module 30 and processing module 40 in the measurement system 1 can be located within the image processing device in the external portion. In some examples, one or more channels corresponding to several stimulation electrodes (e.g., channels controlling the stimulation electrodes to generate stimulation signals) can be used as individual resistors to be measured.

[0071] In some examples, the implantation status of each stimulating electrode can be determined by the resistance value corresponding to each electrode. Specifically, if the stimulating electrode is implanted correctly (e.g., the electrode should be closely attached to the ganglion cells or bipolar cells of the retina), it will have a relatively high resistance value; if the electrode is not implanted correctly, or even exposed to saline solution, it may cause a short circuit or result in a low resistance value. This allows for the determination of the implantation status of each stimulating electrode. In some examples, a comparison threshold can be preset in the processing module 40 (or the image processing device) to determine the implantation status of each stimulating electrode. The comparison threshold can be determined by the resistance value corresponding to a correctly implanted stimulating electrode.

[0072] While the present disclosure has been specifically described above in conjunction with the accompanying drawings and embodiments, it is to be understood that the above description does not limit the present disclosure in any way. Those skilled in the art can make modifications and variations to the present disclosure as needed without departing from its essential spirit and scope, and all such modifications and variations fall within the scope of the present disclosure.

Claims

1. A processing module for obtaining a resistance value of a resistance to be measured, characterized by, The processing module is configured to obtain the resistance value of the to-be-measured resistor based on the first change curve and the second change curve, and the current flowing through the to-be-measured resistor and the digital voltage across the to-be-measured resistor measured by the analog-to-digital converter unit, wherein the first change curve is a change relationship between the current flowing through the standard resistor and the digital voltage across the standard resistor measured by the analog-to-digital converter unit, the second change curve is a change relationship between the voltage and the resistance when the current is a preset value, the preset value is a current value in a linear interval of the first change curve, and a voltage range of the second change curve is a segment corresponding to a voltage range of the linear interval in the first change curve.

2. The process module of claim 1, wherein, When the current flowing through the to-be-measured resistor is the preset value, if the voltage across the to-be-measured resistor is in the linear interval of the second change curve, the processing module obtains the resistance value of the to-be-measured resistor based on the voltage across the to-be-measured resistor and the second change curve.

3. The process module of claim 2, wherein, When the current flowing through the to-be-measured resistor is the preset value, if the voltage across the to-be-measured resistor is not in the linear interval of the second change curve corresponding to the preset value, the preset value is re-adjusted, and the second change curve corresponding to the preset value is re-obtained until the voltage across the to-be-measured resistor corresponding to the preset value is in the linear interval of the second change curve.

4. The process module of claim 1, wherein, The preset value is variable, and the preset value is adjusted according to the voltage across the to-be-measured resistor or the resistance value after the preset value is initially determined.

5. The process module of claim 1, wherein, The initially determined preset value is a first threshold value, and the first threshold value is a current value corresponding to a median of a range of the analog-to-digital converter unit when the voltage measured by the analog-to-digital converter unit is the median of the range of the analog-to-digital converter unit.

6. The process module of claim 1, wherein, The resistance of the resistance to be measured satisfies: R=ADC / ADC m ×R0, wherein R is the resistance of the resistance to be measured, ADC is the voltage of the resistance to be measured when the current passing through the resistance to be measured is the preset value, ADC m is the voltage of the standard resistance when the current passing through the standard resistance is the preset value, R0 is a standard resistance, and ADC is located in a linear interval of the second change curve.

7. The process module of claim 4, wherein, If the preset value is the first threshold value, when the current flowing through the to-be-measured resistor is the first threshold value, the voltage across the to-be-measured resistor is not in the linear interval of the second change curve corresponding to the first threshold value, and the voltage across the to-be-measured resistor is greater than a maximum voltage corresponding to the linear interval of the second change curve, the preset value is adjusted, and the adjusted preset value is less than the first threshold value.

8. The process module of claim 4, wherein, If the preset value is the first threshold value, when the current flowing through the to-be-measured resistor is the first threshold value, the voltage across the to-be-measured resistor is not in the linear interval of the second change curve corresponding to the first threshold value, and the voltage across the to-be-measured resistor is less than a minimum voltage corresponding to the linear interval of the second change curve, the preset value is adjusted, and the adjusted preset value is greater than the first threshold value.

9. A measuring system for measuring an electrical resistance to be measured, characterized in that The measurement module comprises a current source unit, an analog-to-digital converter unit and a selection switch, the current source unit is used for adjusting the current flowing through the standard resistor or the to-be-measured resistor, and the processing module is further configured to record the first change curve and the second change curve.

10. The measurement system of claim 9, wherein, The current source unit is adjusted in an arithmetic progression to increase or decrease the current flowing through the standard resistor.

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