A high-precision ripple test method for a high-voltage power supply, a high-voltage power supply and a system

Abstract

The application relates to the technical field of power supply ripple testing, in particular to a high-precision ripple testing method of a high-voltage power supply, a high-voltage power supply and a system, which comprises the following steps: collecting a ripple signal and a voltage sequence of the high-voltage power supply; performing unstable analysis, feature point detection and difference characteristics before and after curve fitting on the voltage sequence to obtain unstable characteristic values of the voltage sequence; combining energy distribution and frequency distribution of the ripple signal in the frequency domain to obtain a voltage fluctuation noise factor of the ripple signal; combining the voltage fluctuation noise factor to obtain a final passband bandwidth according to the difference between the maximum value of the ripple signal frequency and the center frequency of the ripple signal; and obtaining a ripple test result of the high-voltage power supply after filtering the ripple signal by designing a band-pass filter. The application aims to remove noise caused by unstable voltage fluctuation in the ripple signal and improve the accuracy of high-voltage power supply ripple testing.

Description

TECHNICAL FIELD

[0001] The application relates to the technical field of power supply ripple testing, in particular to a high-precision ripple testing method for a high-voltage power supply, a high-voltage power supply and a system. BACKGROUND

[0002] A high-voltage power supply plays a vital role in high-tech fields such as medical equipment, scientific research instruments and military equipment. Ripple, i.e. fluctuation of the output voltage of the power supply, is a key indicator of the stability of the power supply. The existence of ripple directly affects the operation accuracy and reliability of the equipment, especially in applications with extremely high requirements for voltage stability. Therefore, high-precision testing of ripple is particularly important.

[0003] When detecting the ripple of a high-voltage power supply, the fluctuation of the output voltage of the power supply is inevitable. Switching operations inside the power supply, changes in current and parasitic parameters of the power supply circuit will all cause the output voltage of the power supply to fluctuate slightly around the ideal DC level, thereby introducing additional noise during power supply ripple detection. The ripple noise caused by voltage fluctuation affects the test results of the high-voltage power supply ripple, which cannot reflect the ripple level of the power supply itself, thereby leading to inaccurate test results. SUMMARY

[0004] In view of the above, it is necessary to provide a high-precision ripple testing method for a high-voltage power supply, a high-voltage power supply and a system to solve the above problems.

[0005] According to an aspect of the application, a high-precision ripple testing method for a high-voltage power supply is provided, which comprises:

[0006] Collecting a ripple signal and a voltage sequence of the high-voltage power supply in a preset time period;

[0007] Performing instability analysis and feature point detection on the voltage sequence, and obtaining an unstable feature value of the voltage sequence by combining the difference characteristics before and after fitting the voltage sequence;

[0008] According to the energy distribution and frequency distribution of the ripple signal in the frequency domain, and combining the unstable feature value, a voltage fluctuation noise factor of the ripple signal is obtained;

[0009] According to the difference between the maximum value of the ripple signal frequency and the center frequency of the ripple signal, an initial passband bandwidth is obtained; and the initial passband bandwidth is corrected according to the voltage fluctuation noise factor to obtain a final passband bandwidth;

[0010] A bandpass filter is designed based on the final passband bandwidth, the ripple signal is filtered, and the filtered ripple signal is compared with the maximum allowable value of the high-voltage power supply ripple to obtain the ripple test result of the high-voltage power supply.

[0011] The unstable characteristic value of the voltage sequence is obtained, and specifically includes:

[0012] The unstable index of the voltage sequence is obtained by using unit root detection on the voltage sequence.

[0013] The LOF value of each time point in the voltage sequence is obtained by using the LOF anomaly detection algorithm on the voltage sequence.

[0014] The data difference of the voltage sequence before and after fitting at the corresponding time point is taken as the voltage deviation value at each time point.

[0015] The average level of the LOF value and the voltage deviation value of all time points in the preset time period after fusion is taken as the average deviation degree of the voltage sequence.

[0016] The average deviation degree and the unstable index of the voltage sequence are fused to obtain the unstable characteristic value of the voltage sequence.

[0017] The voltage fluctuation noise factor of the ripple signal is obtained, and specifically includes:

[0018] The ripple signal in the preset time period is converted into a frequency domain signal.

[0019] The discrete significant degree of the ripple signal is obtained according to the relationship between the frequency and the energy of the frequency domain signal, and the discrete degree of the frequency distribution.

[0020] The voltage fluctuation noise factor of the ripple signal is obtained by fusing the unstable characteristic value of the voltage sequence and the discrete significant degree of the ripple signal.

[0021] The discrete significant degree of the ripple signal is obtained, and specifically includes:

[0022] All power spectral densities of the frequency domain signal are obtained; the frequency domain signal is uniformly divided into several segments, and the spectral kurtosis of each segment of the frequency domain signal is obtained by using a spectral kurtosis analysis algorithm; the discrete significant degree of the ripple signal is obtained based on the discrete degree of the power spectral density of the frequency domain signal and the discrete degree of the spectral kurtosis of all segments of the frequency domain signal.

[0023] The center frequency of the ripple signal is specifically the frequency with the most concentrated signal energy in the frequency domain of the ripple signal.

[0024] The initial passband bandwidth is obtained, including:

[0025] The maximum value and the minimum value of the ripple signal frequency are obtained; the first difference is obtained based on the difference between the center frequency and the maximum value; the second difference is obtained based on the difference between the center frequency and the minimum value; the minimum value of the first difference and the second difference is taken as the initial passband bandwidth.

[0026] wherein the formula of the final passband bandwidth is specifically: wherein is the final passband bandwidth, is the initial passband bandwidth, is the scaling factor, is a sigmoid function, and B is a voltage fluctuation noise factor of the ripple signal.

[0027] wherein the ripple test result of the high-voltage power supply is specifically:

[0028] The peak-to-peak value of the filtered ripple signal is obtained. When the peak-to-peak value is less than the maximum allowable value of the high-voltage power supply ripple, the ripple test result of the high-voltage power supply is normal. Otherwise, the ripple test result of the high-voltage power supply is abnormal.

[0029] According to another aspect of the present application, a high-precision ripple test system for a high-voltage power supply is provided, which comprises a memory, a processor, and a computer program stored in the memory and running on the processor, and the processor implements the steps of any one of the above-mentioned methods when executing the computer program.

[0030] According to still another aspect of the present application, a high-voltage power supply is provided, and the ripple test of the high-voltage power supply can implement the corresponding operation of the above-mentioned high-precision ripple test method for a high-voltage power supply.

[0031] In the above scheme, the ripple signal and the voltage sequence of the high-voltage power supply are collected, providing an analysis basis for the influence of the ripple noise generated by the subsequent voltage fluctuation; the voltage sequence is subjected to non-stationary detection and feature point detection, which has the beneficial effect of reflecting the non-stationarity and fluctuation of the voltage sequence; further combining the difference characteristics before and after fitting the voltage sequence, the non-stationary feature is obtained, which aims to solve the problem of long-term trend change of the voltage output to quantify the instability of the voltage output; according to the energy distribution and frequency distribution of the ripple signal in the frequency domain, the voltage fluctuation noise factor of the ripple signal is obtained, which has the beneficial effect of excluding the influence of external interference and internal noise to quantify the noise significance in the ripple signal; according to the difference between the extreme value of the ripple signal frequency and the center frequency of the ripple signal, the initial passband bandwidth is obtained, which has the beneficial effect of realizing the selection of the target frequency and the suppression of the unnecessary frequency components; the initial passband bandwidth is corrected to design a band-pass filter, which has the beneficial effect of removing the noise generated by the voltage non-stationary fluctuation in the ripple signal, more clearly reflecting the characteristics of the ripple signal, and improving the accuracy of the high-voltage power supply ripple test. BRIEF DESCRIPTION OF DRAWINGS

[0032] Figure 1 A step flowchart of a high-precision ripple test method for a high-voltage power supply provided by the present application;

[0033] Figure 2 The acquisition flowchart of the final passband bandwidth provided in the present application. DETAILED DESCRIPTION

[0034] In the description of the embodiments of the present application, the words "exemplary", "or", "for example" are used to mean serving as an example, instance, or illustration, any implementation or design solution described as "exemplary" or "for example" in the embodiments of the present application should not be construed as being preferred or superior over other implementations or design solutions. In fact, the use of "exemplary", "or", "for example" is intended to present relevant concepts in a specific manner.

[0035] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which the present application belongs. The terminology used in the description of the present application only for the purpose of describing specific embodiments and is not intended to limit the present application.

[0036] In addition, it should be pointed out that the terms "first", "second" in the present application and the drawings are used to distinguish similar objects, and are not used to describe a specific order or sequence. The method disclosed in the embodiments of the present application or the method shown in the flowchart includes one or more steps for implementing the method, and the execution order of the steps can be interchanged with each other without departing from the scope of the present application, and some steps can also be deleted.

[0037] Please refer to Figure 1 which shows a step flowchart of a ripple high-precision test method of a high-voltage power supply provided by an embodiment of the present application, the method includes the following steps:

[0038] Step one: collect the ripple signal and voltage sequence of the high-voltage power supply in a preset time period.

[0039] The ripple test of the high-voltage power supply is a key link to ensure the stability and quality of the power supply. A high-precision oscilloscope can capture tiny voltage fluctuations. Connect the probe of the oscilloscope to the output end of the power supply, ensure good contact to reduce measurement error, and obtain the ripple signal in a preset time period. In order to improve the accuracy of the test, an isolation transformer is used to prevent external interference. Then connect a digital multimeter to the output end of the power supply to measure the voltage of the output end of the power supply.

[0040] In the present embodiment, the bandwidth of the oscilloscope is set to 20MHz, and the sampling rate is 5kHz; the acquisition interval of the multimeter is set to 0.5s; the preset time period is specifically a set consisting of all historical time points whose time interval with the current time is less than or equal to a preset time length, and the preset time length is 10min; the implementer can adjust it according to the actual situation.

[0041] The collected voltage sequence is normalized to eliminate the influence of dimension, and the normalization method used in the embodiment is the maximum and minimum value method. The implementer can select it according to the actual situation, and the application does not limit it.

[0042] Step two: unstable analysis and feature point detection are performed on the voltage sequence, and the difference characteristics before and after fitting of the voltage sequence are combined to obtain the unstable characteristic value of the voltage sequence.

[0043] The stability of the output voltage of the high-voltage power supply has a very significant effect on the ripple. The insufficient stability of the power supply may cause the increase of the ripple voltage, and the increase of the ripple voltage will have an adverse effect on the power supply system and its load. For example, a larger ripple voltage may cause electromagnetic interference (EMI) in the system, reduce the reliability of the system, and components in a high-ripple environment for a long time are also prone to fatigue damage. In addition, the ripple voltage also increases the internal loss of the power supply, reducing the overall conversion efficiency.

[0044] The unit root detection is performed on the voltage sequence to obtain the unstable index of the voltage sequence. The LOF abnormality detection algorithm is used to obtain the LOF value of each time in the voltage sequence. The difference between the data before and after fitting of the voltage sequence is taken as the voltage deviation value of each time. The average level of the LOF value and the voltage deviation value of all times in the preset time period after fusion is taken as the average deviation degree of the voltage sequence. The average deviation degree and the unstable index of the voltage sequence are fused to obtain the unstable characteristic value of the voltage sequence.

[0045] In the embodiment, for the stability of the output voltage of the high-voltage power supply, the voltage sequence of the preset time period is taken as the input, the p-value value of the voltage sequence is output by using the unit root detection algorithm (Augmented Dickey-Fuller, ADF), and the p-value value is taken as the unstable index of the voltage sequence.

[0046] Further, the voltage sequence of the preset time period is taken as the input, the LOF value of each element in the voltage sequence is output by using the local outlier factor (Local Outlier Factor, LOF) detection algorithm, and the LOF value of the i-th element in the voltage sequence is denoted as The least square method is used to fit the curve of the voltage sequence, the absolute value of the difference between the actual measurement value of each time voltage in the voltage sequence and the fitting value of the fitting curve at the time is calculated, and the absolute value is taken as the voltage deviation value of each time. The voltage deviation value corresponding to the i-th voltage in the voltage sequence is denoted as , and the average deviation degree of the voltage sequence is The formula of the average deviation degree of the voltage sequence is: ; wherein, The total number of voltages in the voltage sequence. Among them, the ADF algorithm, the LOF anomaly detection algorithm, and the least squares method are all existing known technologies, which will not be described in detail in this application.

[0047] In this embodiment, the product of the instability index of the voltage sequence and the average deviation degree is taken as the non-stationary characteristic value of the voltage sequence; in other embodiments, the instability index of the voltage sequence is denoted as a, and the formula of the non-stationary characteristic value A of the voltage sequence is: .

[0048] It should be understood that the greater the instability index of the voltage sequence in the preset time period, the more likely it is that the voltage sequence has long-term trend changes, indicating that the voltage sequence is non-stationary. In the calculation of the average deviation degree of the voltage sequence, the LOF value and the voltage deviation value corresponding to all elements are averaged to represent the contribution of the voltage at each time to the overall volatility, thereby obtaining a representative volatility measure. The greater the value, the greater the fluctuation of the voltage at each time in the voltage sequence; the non-stationary characteristic value of the voltage sequence combines the non-stationarity and volatility of the voltage sequence. The non-stationary characteristic value of the voltage sequence can be regarded as a measure of the instability of the voltage output, reflecting the stability of the power supply output voltage in the time sequence.

[0049] Step three: according to the energy distribution and frequency distribution of the ripple signal in the frequency domain, and combining the non-stationary characteristic value, the voltage fluctuation noise factor of the ripple signal is obtained.

[0050] The output voltage fluctuation of the high-voltage power supply may introduce various noises, including low-frequency ripple introduced by the alternating current input power supply, high-frequency ripple generated by the switching type converter, and random ripple caused by factors such as load mutation. These noises will make the current waveform in the circuit no longer completely conform to the shape of a sine wave, thereby increasing power loss.

[0051] The ripple signal in the preset time period is converted into a frequency domain signal, and all power spectral densities of the frequency domain signal are obtained; the frequency domain signal is uniformly divided into several segments, and the spectral kurtosis of each segment of the frequency domain signal is obtained by using a spectral kurtosis analysis algorithm; based on the discrete degree of the power spectral density of the frequency domain signal and the discrete degree of the spectral kurtosis of all segments of the frequency domain signal, the discrete significance degree of the ripple signal is obtained.

[0052] For the high-voltage power supply ripple signal collected by the oscilloscope in the preset time period at the current time, the ripple signal in the preset time period is introduced into the MATLAB analysis software, and the discrete Fourier transform is used to convert it to a frequency domain signal, and the power spectral density (PSD) of the frequency domain signal is calculated. The power spectral density analysis shows the energy distribution of the signal at each frequency by converting the signal to the frequency domain. Since the PSD is represented as a discrete sequence, each element corresponds to the power density value of a specific frequency. The range of the PSD is calculated to measure the dispersion of the power spectral density of the frequency domain signal. Then the frequency domain signal is divided into 10 segments, and the spectral kurtosis analysis algorithm is used to output the spectral kurtosis of each segment of the frequency domain signal, and the standard deviation of all the spectral kurtosis is calculated to measure the dispersion of the spectral kurtosis of the frequency domain signal corresponding to the ripple signal. The product of the range and the standard deviation is used as the dispersion significance of the ripple signal, which measures the noise interference level of the ripple signal. The discrete Fourier transform, power spectral density analysis, and spectral kurtosis analysis algorithm are known in the art, and will not be described in detail.

[0053] It should be noted that the number of frequency domain signals after division in the embodiment is equal to the number of minutes corresponding to the preset time period.

[0054] It should be understood that the dispersion significance of the ripple signal can evaluate the energy distribution and trend of different frequency components in the ripple signal through PSD and spectral kurtosis, and the value reflects the overall level of noise in the ripple signal.

[0055] The voltage fluctuation noise factor of the ripple signal is obtained by fusing the unstable characteristic value of the voltage sequence and the dispersion significance of the ripple signal. In the embodiment, the voltage fluctuation noise factor refers to the product of the unstable characteristic value and the dispersion significance. In other embodiments, the product can be replaced by the sum.

[0056] It should be understood that the unstable characteristic value of the voltage comprehensively reflects the instability and volatility of the voltage sequence, and reflects the overall instability of the high-voltage power supply output voltage. The greater the unstable state characteristic value, the worse the voltage stability, the more complex the noise, and the greater the influence of the fluctuation noise. The greater the dispersion significance of the ripple signal, the more significant the noise component in the ripple signal. The voltage fluctuation noise factor represents the voltage fluctuation noise factor of the high-voltage power supply ripple signal. The greater the value, the greater the influence of voltage stability on the noise in the power supply ripple signal, which may cause electromagnetic interference, reduced system reliability, and component fatigue damage.

[0057] Step four: according to the difference between the maximum and minimum of the ripple signal frequency and the center frequency of the ripple signal, an initial passband bandwidth is obtained; the initial passband bandwidth is corrected according to the voltage fluctuation noise factor to obtain a final passband bandwidth.

[0058] In a high-voltage power supply, if there is voltage instability, that is, the voltage fluctuates or changes over time, these fluctuations will be directly reflected in the ripple signal. The noise of the ripple signal mainly manifests as high-frequency fluctuations of the voltage. The introduction of noise will lead to a decrease in the quality of the output voltage of the power supply, affecting the power supply quality of the load, and thus possibly causing unstable performance of electronic equipment, and even causing damage to the equipment. For example, ripple noise can interfere with communication signals, causing data transmission errors; in analog signal processing, ripple noise can cause signal distortion, affecting measurement accuracy.

[0059] The frequency with the most concentrated signal energy is taken as the center frequency of the ripple signal; the maximum and minimum values of the ripple signal frequency are obtained; based on the difference between the center frequency and the maximum value, a first difference is obtained; based on the difference between the center frequency and the minimum value, a second difference is obtained; the minimum value of the first difference and the second difference is taken as the initial passband bandwidth.

[0060] In this embodiment, the ripple signal obtained by discrete Fourier transform reveals the amplitude and distribution of different frequency components in the signal, and identifies the frequency point with the most concentrated signal energy as the main frequency component of the signal, that is, the center frequency. According to the analysis result, the absolute value of the difference between the center frequency and the maximum value of the ripple signal frequency is calculated, denoted as the first difference; the absolute value of the difference between the center frequency and the minimum value of the ripple signal frequency is calculated, and twice the minimum value of the two absolute values is taken as the passband bandwidth of the band-pass filter; it should be noted that half of the bandwidth corresponding to the first difference and the second difference needs to be multiplied by 2 to obtain the initial passband bandwidth.

[0061] However, due to the influence of voltage stability, the unstable fluctuations of the voltage introduce noise in the ripple signal, and the existence of these noise components will have a significant negative impact on the normal operation of electronic equipment. Therefore, it is crucial to ensure voltage stability and remove noise in the ripple signal through effective filtering technology to maintain the reliability and stability of electronic systems.

[0062] Therefore, the initial passband bandwidth is corrected according to the voltage fluctuation noise factor to obtain a final passband bandwidth:

[0063] The passband bandwidth of the band-pass filter is scaled according to the voltage fluctuation noise factor of the ripple signal, and the specific scaling formula is wherein is the scaled passband bandwidth, is the set passband bandwidth, K is a scaling coefficient, and in the present application, K is 3, B is a sigmoid function, and B is a voltage fluctuation noise factor of the ripple signal. It should be noted that the scaling coefficient K can be adjusted according to actual factors such as power supply characteristics and tolerance of the output voltage of the power supply, and the value is not unique; the implementer can adjust it according to the actual situation.

[0064] The flowchart for obtaining the final passband bandwidth is shown in Figure 2

[0065] It should be understood that after the passband bandwidth of the scaling band-pass filter is obtained, the noise component introduced into the ripple signal due to the instability of the output voltage of the high-voltage power supply can be removed more accurately. By adjusting the bandwidth, the filter can more effectively suppress signals of non-target frequencies, reduce signal distortion, while retaining important frequency components in the power supply ripple, significantly improving the stability and quality of the output voltage of the power supply, prolonging the service life of the electronic equipment, and improving the reliability and efficiency of the entire system.

[0066] Step five: design a band-pass filter based on the final passband bandwidth, compare the filtered ripple signal with the maximum allowable value of the high-voltage power supply ripple, and obtain the ripple test result of the high-voltage power supply.

[0067] A linear phase FIR filter is designed using the Parks-McClellan algorithm as a band-pass filter. Specifically, the ripple signal of the high-voltage power supply, the center frequency, and the final passband bandwidth are input into the linear phase FIR filter, which allows signals within the passband bandwidth frequency range to pass through while suppressing signals of other frequencies, thereby removing noise in the ripple signal of the high-voltage power supply and obtaining a filtered ripple signal. The Parks-McClellan algorithm is a known technology, and this application will not be described again.

[0068] Based on the filtered ripple signal, the ripple test result of the high-voltage power supply is obtained:

[0069] The peak-to-peak value of the filtered ripple signal is obtained. If the peak-to-peak value is less than the maximum allowable value of the high-voltage power supply ripple, the ripple test result of the high-voltage power supply is normal; otherwise, the ripple test result of the high-voltage power supply is abnormal.

[0070] Based on the same concept as the method embodiments of the present application, a high-precision ripple test system for a high-voltage power supply is proposed, which includes a memory, a processor, and a computer program stored in the memory and running on the processor. The processor executes the computer program to implement the steps of any one of the above methods.

[0071] ​Based on the same concept as the method embodiment of the present application, a high-voltage power supply is provided, and the ripple test of the high-voltage power supply can realize the operation corresponding to the high-precision ripple test method of the high-voltage power supply.

[0072] In summary, the ripple signal and the voltage sequence of the high-voltage power supply are collected, which provides an analysis basis for the influence of the ripple noise generated by the voltage fluctuation; the non-stationary detection and the feature point detection of the voltage sequence have the beneficial effect of reflecting the non-stationarity and fluctuation of the voltage sequence; further combining the difference characteristics before and after the fitting of the voltage sequence, the non-stationary feature is obtained, which aims to solve the long-term trend change problem of the voltage output to quantify the instability of the voltage output; according to the energy distribution and the frequency distribution of the ripple signal in the frequency domain, the voltage fluctuation noise factor of the ripple signal is obtained, which has the beneficial effect of excluding the influence of external interference and internal noise to quantify the noise significance in the ripple signal; according to the difference between the extreme value of the ripple signal frequency and the center frequency of the ripple signal, the initial passband bandwidth is obtained, which has the beneficial effect of realizing the selection of the target frequency and the suppression of the frequency components that are not needed; the initial passband bandwidth is corrected to design a band-pass filter, which has the beneficial effect of removing the noise generated by the voltage non-stationary fluctuation in the ripple signal, more clearly reflecting the characteristics of the ripple signal, and improving the accuracy of the ripple test of the high-voltage power supply.

[0073] It should be noted that the flowcharts and block diagrams in the drawings show the possible implementation architecture, function and operation of the system, method and computer program product according to the embodiments of the present application. In this regard, each block in the flowchart or block diagram can represent a module, a program segment or a part of code containing one or more executable instructions for implementing a specified logic function. In some alternative implementations, the functions marked in the blocks can also occur in an order different from that marked in the drawings. For example, two consecutive blocks can actually be executed substantially in parallel, and sometimes they can be executed in reverse order, depending on the functions involved. In the description corresponding to the flowcharts and block diagrams in the drawings, the operations or steps corresponding to different blocks can also occur in an order different from that disclosed in the description, and sometimes there is no specific order between different operations or steps. For example, two consecutive operations or steps can actually be executed substantially in parallel, and sometimes they can be executed in reverse order, depending on the functions involved. Each block in the block diagram and / or flowchart, and the combination of blocks in the block diagram and / or flowchart, can be implemented by a dedicated hardware-based system that performs the specified functions or actions, or can be implemented by a combination of dedicated hardware and computer instructions.

[0074] The above examples are only used to illustrate the technical solutions of the present application, and not to limit them; although the present application has been described in detail with reference to the foregoing examples, those skilled in the art should understand that the technical solutions recorded in the foregoing examples can still be modified, or some technical features therein can be replaced by equivalents; and these modifications or replacements do not make the essence of the corresponding technical solutions deviate from the scope of the technical solutions of the embodiments of the present application, and should be included in the protection scope of the present application.

Claims

1. A ripple high-precision test method of a high-voltage power supply, characterized in that, The method comprises the following steps: Collecting a ripple signal and a voltage sequence of the high-voltage power supply in a preset time period; Performing instability analysis and feature point detection on the voltage sequence, and combining the difference characteristics before and after fitting of the voltage sequence to obtain an unstable characteristic value of the voltage sequence; According to the energy distribution and frequency distribution of the ripple signal in the frequency domain, and in combination with the unstable characteristic value, a voltage fluctuation noise factor of the ripple signal is obtained; According to the difference between the maximum and minimum values of the ripple signal frequency and the center frequency of the ripple signal, an initial passband bandwidth is obtained; and the initial passband bandwidth is corrected according to the voltage fluctuation noise factor to obtain a final passband bandwidth; Based on the final passband bandwidth, a band-pass filter is designed to filter the ripple signal, and the filtered ripple signal is compared with the maximum allowable value of the high-voltage power supply ripple to obtain a ripple test result of the high-voltage power supply; The voltage fluctuation noise factor of the ripple signal is obtained by: Converting the ripple signal in the preset time period into a frequency domain signal; According to the relationship between the frequency and energy of the frequency domain signal, and the discrete degree of the frequency distribution, a discrete significance degree of the ripple signal is obtained; The unstable characteristic value of the voltage sequence and the discrete significance degree of the ripple signal are fused to obtain the voltage fluctuation noise factor of the ripple signal.

2. The ripple high-precision test method of a high-voltage power supply according to claim 1, characterized in that, The unstable characteristic value of the voltage sequence is obtained by: Unit root detection is performed on the voltage sequence to obtain an instability index of the voltage sequence; An LOF abnormality detection algorithm is used to obtain an LOF value at each time of the voltage sequence; The difference between the data before and after fitting of the voltage sequence is taken as a voltage deviation value at each time; The average level of the LOF value and the voltage deviation value at all times in the preset time period is taken as an average deviation degree of the voltage sequence; The average deviation degree and the instability index of the voltage sequence are fused to obtain the unstable characteristic value of the voltage sequence.

3. The ripple high-precision test method of a high-voltage power supply according to claim 1, characterized in that, The discrete significance degree of the ripple signal is obtained by: All power spectral densities of the frequency domain signal are obtained; the frequency domain signal is uniformly divided into several segments, and the spectral kurtosis of each segment of the frequency domain signal is obtained by using a spectral kurtosis analysis algorithm; based on the discrete degree of the power spectral density of the frequency domain signal and the discrete degree of the spectral kurtosis of all segments of the frequency domain signal, the discrete significance degree of the ripple signal is obtained.

4. The ripple high-precision test method of a high-voltage power supply according to claim 1, characterized in that, The center frequency of the ripple signal is specifically a frequency with the most concentrated signal energy in the frequency domain of the ripple signal.

5. The ripple high-precision test method of a high-voltage power supply according to claim 1, characterized in that, The initial passband bandwidth is obtained by: The maximum and minimum values of the ripple signal frequency are obtained; a first difference is obtained based on the difference between the center frequency and the maximum value; a second difference is obtained based on the difference between the center frequency and the minimum value; and twice the minimum value of the first difference and the second difference is taken as the initial passband bandwidth.

6. The ripple high-precision test method of a high-voltage power supply according to claim 1, characterized in that, The formula of the final passband bandwidth is specifically: wherein is the final passband bandwidth, is the initial passband bandwidth, is the scaling factor, is a sigmoid function, and B is a voltage fluctuation noise factor of the ripple signal.

7. The ripple high-precision test method of a high-voltage power supply according to claim 1, characterized in that, The ripple test result of the high-voltage power supply is obtained by: The peak-to-peak value of the filtered ripple signal is obtained; when the peak-to-peak value is less than the maximum allowable value of the high-voltage power supply ripple, the ripple test result of the high-voltage power supply is normal; otherwise, the ripple test result of the high-voltage power supply is abnormal.

8. A ripple high-precision test system of a high-voltage power supply, comprising a memory, a processor and a computer program stored in the memory and running on the processor, characterized in that, The processor executes the computer program to implement the steps of the method of any one of claims 1-7.

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