A hardware break device powered by a smart device

Abstract

The application discloses a kind of hardware breakdown equipment powered by intelligent device, including high voltage test host, fixture assembly and test module;Fixture assembly includes the energy storage test interface that is connected with the interface of the intelligent device to be measured, the energy storage test interface is used to communicate with the intelligent device to be measured and obtain electric energy from it;Test module includes electromagnetic radiator, high voltage pulse is converted into directional strong electromagnetic radiation and is emitted to corresponding mainboard position;Directly from the intelligent device to be measured through energy storage test interface, without additional deployment external power supply or rely on built-in battery, electromagnetic interference path can be cut off from source, to improve the accuracy of test and destruction result;In addition, the emission end of electromagnetic radiator and the mainboard position of the device to be measured accurately correspond, the strong electromagnetic radiation converted by high voltage pulse can be directional focused in target area, the utilization rate of energy is provided, not only accurate detection resistance breakdown capacity when testing, and when destroying, can improve destruction time.

Description

Technical Field

[0001] This invention relates to the field of voltage breakdown technology, and more particularly to a hardware breakdown device powered by a smart device. Background Technology

[0002] In the fields of consumer electronics and data security, the hardware reliability and data security of smart devices (including smartphones, tablets, etc.) are receiving increasing attention. Hardware breakdown testing, as a crucial step in ensuring device reliability, requires simulating extreme electromagnetic environments or high-voltage pulse impacts to test the breakdown capabilities of the motherboard and core components (chips, capacitors, resistors, interface modules, etc.), identifying design flaws and manufacturing issues in advance. Simultaneously, in the field of data security, for obsolete smart devices storing sensitive data, physical-level destruction methods are necessary to completely destroy the storage units and prevent data leakage. However, current testing and destruction equipment suffers from significant technical limitations in power supply modes and functional coordination, making it difficult to meet the industry's development needs.

[0003] Existing hardware breakdown testing equipment generally relies on external independent power supplies (such as AC mains power or dedicated DC power modules). However, the power supply lines between the external power supply and the equipment are prone to introducing electromagnetic noise. Hardware breakdown testing has extremely high requirements for the stability of the electromagnetic environment. Interference signals can cause deviations in key parameters such as the amplitude and frequency of high-voltage pulses, leading to "false acceptance" or "false failure," increasing enterprise R&D costs and quality control risks. In data destruction scenarios, parameter deviations may result in storage units not being completely broken down, leaving potential data leakage risks. In addition, some devices attempt to use built-in batteries for power, but the battery capacity is limited, and a single charge can only support a small number of tests or destruction operations, which cannot meet the needs of large-scale continuous operation. Furthermore, the capacity decay of the battery after long-term use will shorten the battery life and increase equipment maintenance costs. At the same time, the voltage stability of battery power is poor, making it difficult to continuously provide stable power to the high-voltage test host, further affecting the testing and destruction results. Summary of the Invention

[0004] The technical problem solved by this invention is to provide a hardware breakdown device powered by a smart device.

[0005] This application provides a hardware breakdown device powered by a smart device, comprising:

[0006] High-voltage test host, used to provide the high-voltage pulse required for testing;

[0007] The fixture assembly is installed in the test chamber on the high voltage test host and is used to clamp and position the intelligent device under test. The fixture assembly includes an energy storage test interface that is plugged into the interface of the intelligent device under test. The energy storage test interface is electrically connected to the high voltage test host and is used to communicate with the intelligent device under test and obtain electrical energy from it.

[0008] The test module is mounted on the fixture assembly and electrically connected to the high-voltage test host. The test module includes an electromagnetic radiator, the emitting end of which is opposite to the motherboard position of the smart device under test, and is used to convert the high-voltage pulse into directional strong electromagnetic radiation and emit it to the corresponding motherboard position.

[0009] Furthermore, the high-voltage test host integrates an energy storage and charging module, which is electrically connected to the charging pin of the energy storage and charging interface. The energy storage and charging module is a charging array composed of multiple medium-voltage capacitors connected in parallel through a high-voltage semiconductor switch.

[0010] Furthermore, the fixture assembly includes:

[0011] A clamping platform is fixedly attached to the high-voltage test host, and the energy storage test interface is connected to the clamping platform;

[0012] A clamping arm is fixedly connected to the clamping platform. The clamping arm includes a fixed clamping plate fixedly connected to the clamping platform, a movable clamping plate slidably connected to one side of the fixed clamping plate, and a limiting plate connected to and perpendicular to the fixed clamping plate. The limiting plate is provided with multiple triggers along its length direction. After the movable clamping plate moves to a preset position, the corresponding trigger is triggered.

[0013] A pushing component is located on one side of the clamping arm. When the trigger is activated, the pushing component pushes the test module to the corresponding electromagnetic radiation emission position.

[0014] Furthermore, the limiting plate is provided with a plurality of locking holes, and each of the triggering elements is respectively provided in each locking hole. The movable clamping plate slides along the limiting plate and is provided with a locking pin corresponding to the locking hole. The locking pin is triggered in correspondence with the triggering element.

[0015] Furthermore, the clamping arm is provided with a first linear slide rail, the movable clamping plate is connected to the first linear slide rail via a first slider, and the end of the first linear slide rail opposite to the fixed clamping plate is provided with a signal unit. The pushing assembly includes:

[0016] A second linear slide rail is located on one side of and parallel to the first linear slide rail. A second slider is slidably connected to the second linear slide rail. The test module is located on the second slider. The end faces of the second slider and the first slider are connected by a first electromagnet.

[0017] A drive bracket is fixed to one end of the second linear slide rail and located on the side where the fixed clamp is located;

[0018] A telescopic drive rod is fixed to the drive bracket. The end of the telescopic drive rod is connected to the second slider, and the drive part of the telescopic drive rod, the trigger element, and the signal unit are all electrically connected to the control system.

[0019] Furthermore, two first linear slide rails are arranged in parallel, each connected to a first slider. The two movable clamps are connected by a second electromagnet, and a signal unit is provided at the end of each first linear slide rail, and a pushing component is provided on one side of each first linear slide rail. Each signal unit controls the first electromagnet, the second electromagnet, and the two second linear slide rails respectively.

[0020] Furthermore, the testing module also includes:

[0021] Mounting bracket, fixed on the second slider;

[0022] The micro-motion platform is fixed to the top of the mounting bracket and consists of two vertically arranged micro linear modules, one of which is parallel to the second linear slide rail.

[0023] A micro actuator is slidably connected to a micro linear module located above it, and the electromagnetic radiator is connected to the top of the micro actuator;

[0024] A visual recognition unit, mounted on the mounting bracket, is used to identify the position of the motherboard of the smart device under test and to control the operation of the micro-motion platform and micro-driver.

[0025] Furthermore, the test module also includes an arc-shaped groove on one side of the second linear slide rail. The arc-shaped groove is used to hold the connection between the electromagnetic radiator and the high-voltage test host. One end of the connection away from the electromagnetic radiator is fixed in the arc-shaped groove, and the remaining part slides along the arc-shaped groove.

[0026] Furthermore, the fixture assembly also includes an interface compartment inside the test chamber that is rotatably connected to the high-voltage test host. The interface compartment is cylindrical, and multiple energy storage test interfaces are provided, each corresponding to a different type of equipment interface, and are respectively installed on the outer wall of the interface compartment and spaced apart along its circumference.

[0027] Furthermore, a turntable is connected to the bottom of the interface compartment, and a detection sensor is installed on the outer wall opposite to the energy storage test interface. The upper end of the outer wall of the turntable is connected to the mounting groove of the test compartment through a bearing, and a limiting block is installed at the lower end. A limiting ring is provided on the inner wall of the mounting groove, and multiple limiting grooves corresponding to the limiting block are provided in the circumferential direction of the limiting ring. Multiple limiting slots are provided on the upper end face of the inner ring of the bearing in the circumferential direction. An electric telescopic rod is fixed to the inner wall of the mounting groove. The electric telescopic rod is locked relative to the limiting slots. The detection sensor and the electric telescopic rod are both electrically connected to the control system.

[0028] Compared with existing technologies, this invention draws power directly from the smart device under test through an energy storage test interface, eliminating the need for additional external power supplies or reliance on built-in batteries. This cuts off the electromagnetic interference path at the source, thereby improving the accuracy of test and destruction results. In addition, the electromagnetic radiator emitter is precisely aligned with the motherboard of the device under test, allowing the strong electromagnetic radiation converted from high-voltage pulses to be focused on the target area, improving energy utilization. This not only enables accurate detection of breakdown capability during testing but also improves destruction time during destruction. Attached Figure Description

[0029] To more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the accompanying drawings used in the description of the embodiments will be briefly introduced below. Obviously, the accompanying drawings described below are only some embodiments of the present invention.

[0030] Figure 1 This is an overall schematic diagram of the hardware breakdown device powered by a smart device according to the present invention;

[0031] Figure 2 This is a schematic diagram of the fixture assembly and testing module of the present invention;

[0032] Figure 3 This is a schematic diagram of the interface compartment of the present invention;

[0033] Figure 4 This is a top view of the first slider of the present invention;

[0034] Figure 5 This is a top view of the movable clamp of the present invention;

[0035] Figure 6 This is a schematic diagram of the turntable structure of the present invention;

[0036] Figure 7 This is a top view of the turntable of the present invention;

[0037] Figure 8 This is a cross-sectional view of the arc-shaped groove of the present invention;

[0038] Figure 9This is a side view of the locking hole of the present invention;

[0039] Figure 10 This is a top view of the first linear slide rail of the present invention.

[0040] The reference numerals in the attached figures include:

[0041] 1. High-voltage test host; 11. Mounting slot; 12. Limit ring; 13. Limiting tooth groove; 14. Bearing; 15. Limiting slot; 16. Electric telescopic rod;

[0042] 2. Fixture assembly; 21. Energy storage test interface; 22. Clamping platform; 23. Clamping arm; 232. Fixed clamping plate; 233. Movable clamping plate; 234. Limiting plate; 235. Trigger; 236. Locking hole; 237. Locking pin; 238. First linear slide rail; 239. First slider; 240. Signal unit; 24. Pushing assembly; 241. Second linear slide rail; 242. Second slider; 243. Drive bracket; 244. Telescopic drive rod; 25. First electromagnet; 26. Second electromagnet; 27. Interface compartment; 28. Turntable; 29. ​​Detection sensor; 30. Limiting block;

[0043] 3. Test module; 31. Electromagnetic radiator; 32. Mounting bracket; 33. Miniature linear module; 34. Miniature driver; 35. Visual recognition unit; 36. Arc-shaped wire groove. Detailed Implementation

[0044] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only a part of the embodiments of this application, and not all of the embodiments. Based on the embodiments of this application, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the scope of protection of this application.

[0045] like Figure 1 As shown, the hardware breakdown device powered by a smart device according to the present invention includes a high-voltage test host 1, a fixture assembly 2, and a test module 3. The high-voltage test host 1 is used to provide the high-voltage pulse required for testing. The fixture assembly 2 is installed in the test chamber on the high-voltage test host 1 and is used to clamp and position the smart device under test. It includes an energy storage test interface 21 that is plugged into the interface of the smart device under test. The energy storage test interface 21 is electrically connected to the high-voltage test host 1 and is used to communicate with the smart device under test and obtain power from it. The test module 3 is installed on the fixture assembly 2 and is electrically connected to the high-voltage test host 1. The test module 3 includes an electromagnetic radiator 31. The transmitting end of the electromagnetic radiator 31 is opposite to the motherboard position of the smart device under test and is used to convert the high-voltage pulse into directional strong electromagnetic radiation and emit it to the corresponding motherboard position.

[0046] This embodiment utilizes the adjustable parameters of the high-voltage test host 1 and the directional radiation function of the test module 3 to flexibly switch working modes: in the "breakdown test mode," it outputs low-amplitude, low-frequency high-voltage pulses to simulate the reliability of equipment in a conventional extreme electromagnetic environment; in the "data destruction mode," it outputs high-amplitude, high-frequency high-voltage pulses to quickly break down the storage unit and achieve physical-level destruction; in addition, the energy storage test interface 21 can simultaneously realize the dual functions of "power supply + communication": while completing the acquisition of electrical energy, it can establish data communication with the device under test, automatically read key information such as device model, motherboard layout, and storage unit location, and synchronize it to the high-voltage test host 1; the host automatically matches the high-voltage pulse parameters and adjusts the positioning of the electromagnetic radiator 31 according to the data, without manual intervention.

[0047] In some embodiments, the high-voltage test host 1 integrates an energy storage and charging module. The energy storage and charging module is electrically connected to the charging pin of the energy storage and charging interface. The energy storage and charging module is a charging array composed of multiple medium-voltage capacitors (such as 10 50V 100μF capacitors) connected in parallel through a high-voltage semiconductor switch (such as IGBT). The entire matrix is ​​controlled by a main control switch (high-voltage MOSFET) to control the discharge on / off of the matrix. During charging, power is obtained from the smart device under test through the energy storage test interface 21, and the capacitor matrix is ​​charged only to a level slightly higher than the current operating voltage of the device, such as 5.5V. At this time, the energy consumption is extremely low, and there is no need for a large amount of discharge. When a trigger command is received, the control circuit instantly switches the connection mode of the capacitor matrix from parallel charging to series discharging. The 10 50V capacitors connected in series can generate a 500V high-voltage pulse. When the test or destruction work is completed, the series circuit is simply disconnected, and the capacitor matrix will automatically return to the low-voltage parallel state through the built-in bleeder resistor, without the need for a large amount of discharge.

[0048] In some embodiments, the clamp assembly 2 includes a clamping platform 22, a clamping arm 23, and a pushing component 24; the clamping platform 22 is fixedly connected to the high-voltage test host 1, and the energy storage test interface 21 is connected to the clamping platform 22; the clamping arm 23 is fixedly connected to the clamping platform 22, and the clamping arm 23 includes a fixed clamping plate 232 fixedly connected to the clamping platform 22, a movable clamping plate 233 slidably connected to one side of the fixed clamping plate 232, and a limiting plate 234 connected to and perpendicular to the clamping platform 22; the clamping arm 23 is provided with a first linear slide rail 238 (which does not require motor drive and is only for the first...) The sliding block 239 is used for sliding. The movable clamping plate 233 is connected to the first linear slide rail 238 via the first sliding block 239. The end of the first linear slide rail 238 opposite to the fixed clamping plate 232 is provided with a signal unit 240 (such as a weight sensor or pressure sensor). The limiting plate 234 is provided with multiple triggers 235 along its length. After the movable clamping plate 233 moves to a preset position, it triggers the corresponding trigger 235 (such as a trigger sensor). The limiting plate 234 is provided with multiple locking holes 236, and each trigger 235 is respectively located in each locking hole 236. The movable clamping plate 233... A locking pin 237 (such as an electric lock pin) corresponding to a locking hole 236 is provided on a limiting plate 234 that slides along the limiting plate 234. The locking pin 237 is triggered by a trigger 235. A pushing component 24 is provided on one side of the clamping arm 23. When the trigger 235 is triggered, the pushing component 24 pushes the test module 3 to the corresponding electromagnetic radiation emission position. The component includes a second linear slide rail 241, a drive bracket 243, and a telescopic drive rod 244. The second linear slide rail 241 (which does not require motor drive and is only used for the sliding of the second slider 242) is provided on one side of the first linear slide rail 238 and is connected to it. The second linear slide rail 241 is parallel to the second slider 242, and the test module 3 is located on the second slider 242. The end faces of the second slider 242 and the first slider 239 are connected by the first electromagnet 25. The drive bracket 243 is fixed to one end of the second linear slide rail 241 and is located on the side of the fixed clamp 232. The telescopic drive rod 244 is fixed to the drive bracket 243, and the end of the telescopic drive rod 244 is connected to the second slider 242. The drive part, trigger 235 and signal unit 240 of the telescopic drive rod 244 are all electrically connected to the control system.

[0049] In this embodiment, the first linear slide rail 238 and the first slider 239 cooperate to precisely adjust the distance between the movable clamping plate 233 and the fixed clamping plate 232 when clamping the intelligent device under test. When the movable clamping plate 233 moves, it triggers the signal unit 240 at the bottom, sending a signal to the control system to energize the first electromagnet 25. At this time, the first slider 239 and the second slider 242 are fixed, and the two sliders begin to move synchronously until the test module 3 is moved to the tail of the intelligent device under test. The locking pin 237 on the movable clamping plate 233 cooperates with the locking hole 236 of the limiting plate 234, and the trigger 235 is designed with the locking hole 236 built in. After the movable clamping plate 233 is moved to the preset position, the locking pin 237 is engaged in the locking hole 236 under mechanical force, forming a rigid mechanical locking structure. In addition, multiple triggers 235 are set on the limiting plate 234, corresponding to the preset positions of devices of different sizes. When the movable clamping plate 233 slides to the position that matches the size of the device under test, the corresponding trigger 235 can be precisely triggered. After triggering, the control system controls the first electromagnet 25 to de-energize and at the same time controls the telescopic drive rod 244 to start automatically extending and retracting. Since the host has matched the position of the electromagnetic radiator 31 according to the parameters of the smart device under test, the extension and retraction distance of the telescopic drive rod 244 can be controlled according to its position.

[0050] In some embodiments, two first linear slide rails 238 are arranged in parallel, each connected to a first slider 239. The two movable clamps 233 are connected by a second electromagnet 26. A signal unit 240 is provided at the end of each first linear slide rail 238, and a push component 24 is provided on one side of each first linear slide rail 238. Each signal unit 240 is respectively controlled by the first electromagnet 25, the second electromagnet 26 and the two second linear slide rails 241.

[0051] In this embodiment, two first linear slide rails 238 are provided to accommodate different sizes of the smart devices under test. When a device is large, two sets of clamping structures are aligned and fixed to ensure its clamping stability. In use, the smart device under test is placed on the two first linear slide rails 238, with its head (such as the side of a mobile phone equipped with a camera) against the fixed clamping plate 232, and the display screen facing the slide rail side. Then, the two movable clamping plates 233 are manually pushed simultaneously. At this time, the two signal units 240 simultaneously send signals to the control system to control the second electromagnet 26 and the first electromagnet 25 to attract simultaneously. At this time, the two first sliders 239 and the second slider 242 move synchronously, thereby maintaining the accuracy of clamping and positioning, and ensuring the accuracy of the initial adjustment position of the test module 3. Two sets of electromagnetic radiators 31 are provided to ensure that strong electromagnetic radiation can cover the predetermined position of the device under test. The operating electromagnetic radiator 31 can be determined according to the device parameters detected by the host.

[0052] In some embodiments, the fixture assembly 2 further includes an interface compartment 27 rotatably connected to the high-voltage test host 1 within the test chamber. The interface compartment 27 is cylindrical, and multiple energy storage test interfaces 21 are provided, each corresponding to a different type of equipment interface, and are respectively installed on the outer wall of the interface compartment 27 at intervals along its circumference. A turntable 28 is connected to the bottom of the interface compartment 27, and a detection sensor 29 (such as a contact switch or camera) is provided on the outer wall opposite to the energy storage test interface 21. The upper end of the outer wall of the turntable 28 is open to the airflow. The bearing 14 is connected to the mounting groove 11 of the test chamber. A limiting block 30 is provided at the lower end. A limiting ring 12 is provided on the inner wall of the mounting groove 11. Multiple limiting grooves 13 corresponding to the limiting block 30 are provided in the circumferential direction of the limiting ring 12. Multiple limiting slots 15 are provided on the upper end face of the inner ring of the bearing 14 in the circumferential direction. An electric telescopic rod 16 is fixedly connected to the inner wall of the mounting groove 11. The electric telescopic rod 16 is locked relative to the limiting slots 15. The detection sensor 29 and the electric telescopic rod 16 are both electrically connected to the control system.

[0053] In this embodiment, multiple energy storage test interfaces 21 can correspond to different types of device interfaces such as USB-C, Lightning, Micro-USB, Type-A, and industrial-specific interfaces (such as DB9 and HDMI industrial version). Each interface corresponds to a groove on the interface compartment 27, and the interface is snapped into the groove. Each interface has a certain length of wire reserved in the groove. The wires in each interface are integrated into a bus inside the interface compartment 27. The bus is connected to the high-voltage test host 1, and a part of the bus is fixed inside the interface compartment 27 by a wire winder to accommodate the rotation of the interface compartment 27.

[0054] Specifically, after the control system receives the signal sent by the signal unit 240, it controls the electric telescopic rod 16 to extend out of the limiting slot 15. At this time, the interface compartment 27 can rotate to select the required interface. When the interface compartment 27 rotates to the target interface position, the limiting block 30 will engage with the corresponding limiting tooth groove 13 to form mechanical coarse positioning. At the same time, after the corresponding interface is pulled out, the detection sensor 29 is triggered. After transmitting the signal to the control system, the electric telescopic rod 16 is controlled to insert into the slot to achieve precise positioning of the interface compartment 27. This ensures that the pins of the energy storage test interface 21 and the interface of the device under test are accurately aligned, avoiding poor contact caused by pin misalignment.

[0055] In some embodiments, the test module 3 further includes a mounting bracket 32, a micro-motion platform, a micro-driver 34, a visual recognition unit 35 (such as a camera), and an arc-shaped groove 36 disposed on one side of the second linear slide rail 241; the mounting bracket 32 ​​is fixed to the second slider 242; the micro-motion platform is fixed to the top of the mounting bracket 32 ​​and consists of two vertically arranged micro linear modules 33, one of which is parallel to the second linear slide rail 241; the micro-driver 34 is slidably connected to the micro linear module 33 (such as a motor-driven linear slide rail) disposed above, and the electromagnetic radiator 31 is connected to the top of the micro-driver 34; the visual recognition unit 35 is mounted on the mounting bracket 32 ​​and is used to identify the position of the motherboard of the smart device under test and control the operation of the micro-motion platform and the micro-driver 34; the arc-shaped groove 36 is used to hold the connection between the electromagnetic radiator 31 and the high-voltage test host 1, the end of the connection away from the electromagnetic radiator 31 is fixed in the arc-shaped groove 36, and the remaining part slides along the arc-shaped groove 36.

[0056] In this embodiment, two miniature linear modules 33 and a miniature driver 34 are used to perform fine adjustments in the X-axis, Y-axis, and Z-axis directions (adjustment range 0-5mm), respectively. This allows for precise alignment with minute target areas such as chips, capacitors, and storage units on the motherboard of the smart device under test (some components are only 1-2mm in size). For example, when testing a Snapdragon chip on a mobile phone motherboard, the micro-motion platform can precisely align the radiator's emitter with the core area of ​​the chip, avoiding energy dispersion that could affect the test results. In data destruction scenarios, it can accurately locate the critical pins of the storage chip, ensuring complete breakdown. After the control system sends a telescopic signal to the telescopic drive rod 244, timing begins. After a threshold time, the micro-motion platform and the miniature driver 34 are moved. During this process, the visual recognition unit 35 detects the position of the electromagnetic radiator 31 in real time and feeds it back to the control system. The control system compares the coordinates of the target areas such as chips and storage units with the position of the electromagnetic radiator 31 based on the layout of the motherboard of the smart device under test, thereby further controlling the movement of the micro-motion platform and the micro-driver.

[0057] Specifically, the arc-shaped groove 36 is used to hold the connection between the electromagnetic radiator 31 and the high-voltage test host 1. When the test module 3 (including the electromagnetic radiator 31) moves with the second slider 242 and the micro-motion platform, the connection can slide synchronously along the groove, always maintaining a neat state and preventing pulling or knotting. In addition, the mounting bracket 32 ​​is fixed on the second slider 242, integrating the micro-motion platform, the micro-driver 34, and the vision recognition unit 35 into one unit to form a "modular test unit", avoiding structural loosening caused by the scattered installation of various components. The bracket is made of aviation aluminum alloy, which is lightweight and high-strength, and can withstand repeated adjustment movements of the micro-motion platform and the micro-driver 34.

[0058] It should be noted that all directional indications (such as up, down, left, right, front, back, etc.) in the embodiments of this application are only used to explain the relative positional relationship and movement of each component in a certain specific posture (as shown in the figure). If the specific posture changes, the directional indication will also change accordingly.

[0059] Furthermore, the use of terms such as "first" and "second" in this application is for descriptive purposes only and should not be construed as indicating or implying their relative importance or implicitly specifying the number of technical features indicated. Therefore, a feature defined as "first" or "second" may explicitly or implicitly include at least one of that feature. Additionally, the technical solutions of the various embodiments can be combined with each other, but only on the basis of being achievable by those skilled in the art. When the combination of technical solutions is contradictory or impossible to implement, such a combination of technical solutions should be considered non-existent and not within the scope of protection claimed in this application.

[0060] Although preferred embodiments of the invention have been described, those skilled in the art, upon learning the basic inventive concept, can make other changes and modifications to these embodiments. Therefore, the appended claims are intended to be interpreted as including both the preferred embodiments and all changes and modifications falling within the scope of the invention.

[0061] Obviously, those skilled in the art can make various modifications and variations to this invention without departing from its spirit and scope. Therefore, if these modifications and variations fall within the scope of the claims of this invention and their equivalents, this invention also intends to include these modifications and variations.

Claims

1. A hardware breakdown device powered by a smart device, characterized in that, include: High voltage test host (1), used to provide the high voltage pulse required for testing; The fixture assembly (2) is installed in the test chamber on the high voltage test host (1) and is used to clamp and position the intelligent device under test. The fixture assembly (2) includes an energy storage test interface (21) that is plugged into the interface of the intelligent device under test. The energy storage test interface (21) is electrically connected to the high voltage test host (1) and is used to communicate with the intelligent device under test and obtain electrical energy from it. The test module (3) is installed on the fixture assembly (2) and electrically connected to the high voltage test host (1). The test module (3) includes an electromagnetic radiator (31). The transmitting end of the electromagnetic radiator (31) is opposite to the motherboard position of the smart device under test, and is used to convert the high voltage pulse into directional strong electromagnetic radiation and emit it to the corresponding motherboard position. The fixture assembly (2) includes: The clamping platform (22) is fixed to the high voltage test host (1), and the energy storage test interface (21) is connected to the clamping platform (22); A clamping arm (23) is fixedly connected to the clamping platform (22). The clamping arm (23) includes a fixed clamping plate (232) fixedly connected to the clamping platform (22), a movable clamping plate (233) slidably connected to one side of the fixed clamping plate (232), and a limiting plate (234) connected to the fixed clamping plate (232) and arranged horizontally with its plate surface perpendicular to the fixed clamping plate (232). The limiting plate (234) is provided with a plurality of triggers (235) along its length direction. After the movable clamping plate (233) moves to a preset position, it triggers the corresponding trigger (235). A pushing component (24) is provided on one side of the clamping arm (23). When the trigger (235) is triggered, the pushing component (24) pushes the test module (3) to the corresponding electromagnetic radiation emission position. The clamping arm (23) is provided with a first linear slide rail (238), the movable clamping plate (233) is connected to the first linear slide rail (238) through a first slider (239), and the end of the first linear slide rail (238) facing away from the fixed clamping plate (232) is provided with a signal unit (240). The pushing assembly (24) includes: The second linear slide rail (241) is located on one side of the first linear slide rail (238) and parallel to it. A second slider (242) is slidably connected on the second linear slide rail (241). The test module (3) is located on the second slider (242). The end faces of the second slider (242) opposite to the first slider (239) are connected by a first electromagnet (25). The drive bracket (243) is fixed to one end of the second linear slide rail (241) and located on the side where the fixed clamp (232) is located; The telescopic drive rod (244) is fixed on the drive bracket (243). The end of the telescopic drive rod (244) is connected to the second slider (242). The drive part of the telescopic drive rod (244), the trigger (235) and the signal unit (240) are all electrically connected to the control system. The test module (3) also includes: Mounting bracket (32) is fixed to the second slider (242); The micro-motion platform is fixed to the top of the mounting bracket (32) and consists of two vertically arranged micro linear modules (33), one of which is parallel to the second linear slide rail (241). The micro actuator (34) is slidably connected to the micro linear module (33) located above it, and the electromagnetic radiator (31) is connected to the top of the micro actuator (34); A visual recognition unit (35) is mounted on the mounting bracket (32) and is used to identify the position of the motherboard of the smart device under test and control the operation of the micro-motion platform and the micro-driver. When the movable clamp (233) moves, the signal unit (240) at the bottom is triggered, and a signal is sent to the control system to control the first electromagnet (25) to be energized. At this time, the first slider (239) and the second slider (242) are fixed, and the two sliders start to move synchronously until the test module (3) is driven to the tail of the smart device under test. When the movable clamp (233) slides to the position that matches the size of the device under test, the corresponding trigger (235) can be accurately triggered. After the trigger is triggered, the control system controls the first electromagnet (25) to be de-energized. At this time, the first slider (239) and the second slider (242) separate, and at the same time, the telescopic drive rod (244) is controlled to start to extend and retract automatically, and the push component pushes the test module (3) to the corresponding electromagnetic radiation emission position.

2. The hardware breakdown device powered by a smart device as described in claim 1, characterized in that, The high-voltage test host (1) integrates an energy storage and charging module. The energy storage and charging module is electrically connected to the charging pin of the energy storage test interface. The energy storage and charging module is a charging array composed of multiple medium-voltage capacitors connected in parallel through a high-voltage semiconductor switch.

3. The hardware breakdown device powered by a smart device as described in claim 1, characterized in that, The limiting plate (234) is provided with a plurality of locking holes (236), and each trigger (235) is respectively provided in each locking hole (236). The movable clamp (233) slides along the limiting plate (234) and is provided with a locking pin (237) corresponding to the locking hole (236). The locking pin (237) is triggered in correspondence with the trigger (235).

4. The hardware breakdown device powered by a smart device as described in claim 3, characterized in that, Two first linear slide rails (238) are arranged in parallel, each connected to a first slider (239). The two movable clamps (233) are connected by a second electromagnet (26). A signal unit (240) is provided at the end of each first linear slide rail (238), and a push component (24) is provided on one side of each first linear slide rail (238). Each signal unit (240) controls the first electromagnet (25), the second electromagnet (26), and the two second linear slide rails (241) respectively.

5. The hardware breakdown device powered by a smart device as described in claim 4, characterized in that, The test module (3) also includes an arc-shaped groove (36) located on one side of the second linear slide rail (241). The arc-shaped groove (36) is used to hold the connection between the electromagnetic radiator (31) and the high-voltage test host (1). One end of the connection away from the electromagnetic radiator (31) is fixed in the arc-shaped groove (36), and the remaining part slides along the arc-shaped groove (36).

6. The hardware breakdown device powered by a smart device as described in claim 5, characterized in that, The fixture assembly (2) also includes an interface compartment (27) rotatably connected to the high voltage test host (1) inside the test compartment. The interface compartment (27) is cylindrical. Multiple energy storage test interfaces (21) are provided, each corresponding to a different type of equipment interface, and are installed on the outer wall of the interface compartment (27) at intervals along its circumference.

7. The hardware breakdown device powered by a smart device as described in claim 6, characterized in that, The bottom of the interface compartment (27) is connected to a turntable (28), and a detection sensor (29) is set on the outer wall opposite to the energy storage test interface (21). The upper end of the outer wall of the turntable (28) is connected to the mounting groove (11) of the test compartment through a bearing (14), and a limit block (30) is set at the lower end. A limit ring (12) is provided on the inner wall of the mounting groove (11), and multiple limit grooves (13) corresponding to the limit block (30) are provided in the circumferential direction of the limit ring (12). Multiple limit slots (15) are provided on the upper end face of the inner ring of the bearing (14) along its circumferential direction. An electric telescopic rod (16) is fixed to the inner wall of the mounting groove (11). The electric telescopic rod (16) is connected to the limit block (30). The slot (15) is locked relative to each other. The detection sensor (29) and the electric telescopic rod (16) are both electrically connected to the control system. After the control system receives the signal sent by the signal unit (240), it controls the electric telescopic rod (16) to extend out of the limiting slot (15). At this time, the interface compartment (27) rotates under the control of the turntable. When the interface compartment (27) rotates to the target interface position, the limiting block (30) will be engaged in the corresponding limiting tooth groove (13) to form mechanical coarse positioning. At the same time, after the corresponding interface is pulled out, the detection sensor (29) is triggered. After the signal is transmitted to the control system, the electric telescopic rod (16) is controlled to insert into the slot to achieve precise positioning of the interface compartment (27).

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