Method, system and device for testing performance of memory alloy wire, electronic equipment and storage medium

Abstract

The invention relates to a method for testing the performance of a memory alloy wire. The method comprises the following steps: establishing a unary linear calibration model correction system; and obtaining performance parameters of the memory alloy wire and judging whether the performance parameters are qualified. The system comprises the memory alloy wire to be tested and a workbench, a sliding rail is fixed to the workbench, a first clamp and a second clamp are fixed to the sliding rail, and the first clamp and the second clamp are provided with limiting grooves; the first clamp and the second clamp are connected with limiting blocks; positive and negative electrodes of the power supply are respectively connected with the two limiting grooves; the second clamp is connected with a balancing weight; and an industrial camera is mounted on the first connecting plate. The invention also relates to a device which comprises a test module, a calibration module, a test module and a judgment module. The invention further relates to electronic equipment and a storage medium. According to the method, system and device for testing the performance of the memory alloy wire, the electronic equipment and the storage medium, the problems that in the memory alloy wire testing process, the memory alloy wire is disjointed with a real product, cost is high, adaptability is poor, and efficiency is low can be solved.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of quality detection, and in particular to a method, system and device for testing the performance of a memory alloy wire, an electronic device and a storage medium. BACKGROUND

[0002] Shape memory alloy wires are widely used in medical devices, precision drives, consumer electronics and other fields due to their shape memory effect and super-elasticity. In actual products, the memory alloy wires are usually connected to peripheral circuits or mechanisms through crimped terminals, welded terminals or bonded terminals. The process of electrical heating, stress and cooling is completed in the assembled state of the "terminal-equipped" wire.

[0003] In order to ensure the quality consistency of the memory alloy wires in the mass production process, the existing technology usually uses special test tools and precision sensors to detect the performance of the memory alloy wires. However, the existing solutions mainly have the following deficiencies:

[0004] First, the test state is inconsistent with the actual product working condition: the existing patents and detection devices mainly test the performance of "bare wires", i.e. the two ends of the wire are clamped by a specially designed clamping structure or a weight system, without considering the influence of terminal crimping, welding and other processes on the local organization and stress state of the wire. In actual products, the terminal crimping area may change the local resistance, stress distribution and deformation mode of the wire. If the test is only for bare wires, there is a risk that the performance measured in the laboratory is inconsistent with the performance in the actual assembly state, which is not conducive to evaluating the true performance of the product-level memory alloy wire. Second, the system cost is high and the environmental adaptability is poor: the existing test system relies heavily on high-precision special sensors such as laser displacement sensors. Such sensors are expensive and require strict installation conditions and environmental stability. They are easily affected by electromagnetic field interference, temperature fluctuations and vibration. In a multi-station production line or a complex electrical environment, the cost of maintaining high-precision measurement is high, and the environmental adaptability of the system is limited. Third, it is difficult to adapt to mass production scenarios, and the test efficiency is low: the mechanical structure of some existing devices is complex, and the clamping, alignment and zero adjustment process has many steps, which relies heavily on the experience of the operator. For production scenarios that require large-scale sampling or full inspection, the above cumbersome operation process will result in long preparation time for each piece and difficult to compress the pace, which is not conducive to popularization and use in the production line.

[0005] Therefore, the existing technology has defects and needs to be improved and developed. SUMMARY

[0006] The present invention provides a method, system, apparatus, electronic device and storage medium for testing the performance of shape memory alloy wires, which solves the problems of the prior art when using special testing tools and precision sensors to test the performance of shape memory alloy wires, such as the test state being out of touch with the actual product working conditions, high system cost and poor environmental adaptability, difficulty in adapting to mass production scenarios and low testing efficiency.

[0007] In a first aspect, the present invention provides a method for testing the properties of shape memory alloy wires, comprising:

[0008] Based on at least 10 known reference lengths captured by an industrial camera in a system for testing the properties of shape memory alloy wires. Images of shape memory alloy wire samples were collected to determine the number of pixels from visual markers to the image reference edge. The visual markers are set at the visible positions of the second clamp;

[0009] Establish a univariate linear calibration model ,in, is the scaling factor of the optical system, with the unit being mm / pixel, used to represent the actual physical size of each pixel; This is the system error compensation value, used to correct systematic errors;

[0010] A system for testing the properties of shape memory alloy wires was used to test the initial length of the wire. The shape memory alloy wire to be tested is subjected to voltage Fu, time milliseconds After the first power-on test, the performance parameters of the shape memory alloy wire under test were obtained;

[0011] Calculate the average value in real time for each performance parameter. and standard deviation And dynamically set the upper limit of statistical quality control to The lower limit for statistical quality control is If each performance parameter is between and If the result is within the acceptable range, the shape memory alloy wire to be tested is determined to be a qualified product; otherwise, the shape memory alloy wire to be tested is determined to be a non-qualified product.

[0012] Furthermore, the establishment of a univariate linear calibration model ,in, is the scaling factor of the optical system, with the unit being mm / pixel, used to represent the actual physical size of each pixel; This is the systematic error compensation value, used to correct systematic errors, including:

[0013] After establishing a univariate linear calibration model, at least three operators each perform three tests to obtain the GR&R index after performing measurement system analysis. If GR&R ≤ 10%, the system for testing the performance of shape memory alloy wire is deemed to be capable enough and the univariate linear calibration model is valid. If GR&R > 10%, after analyzing the sources of variation and improving the system for testing the performance of shape memory alloy wire, the univariate linear calibration model is re-established based on the images captured by the industrial camera until GR&R ≤ 10%.

[0014] Furthermore, the system used for testing the properties of shape memory alloy wires has an initial length of... The shape memory alloy wire to be tested is subjected to voltage Fu, time milliseconds After the initial power-on test, the performance parameters of the shape memory alloy wire under test were obtained, including:

[0015] After the memory alloy wire to be tested, with terminals attached, is installed between the first and second clamps via the limiting groove, an industrial camera is triggered to acquire an initial state image, and the initial state length of the memory alloy wire to be tested is measured based on the initial state image. ;

[0016] The shape memory alloy wire to be tested is subjected to voltage Fu, time The heating process begins within milliseconds. Upon completion of heating, an industrial camera is triggered to capture an image of the shrinkage state, and the shrinkage length of the shape memory alloy wire under test is measured based on this image. ;

[0017] Power is turned off to allow the shape memory alloy wire under test to cool and recover. Once the displacement stabilizes, an industrial camera is triggered to capture an image of the recovered state, and the recovered length of the shape memory alloy wire under test is measured based on the image. ;

[0018] Based on the initial state length Length in contracted state Length of recovery state Calculate the performance parameters of the shape memory alloy wire to be tested, including at least the shrinkage displacement. , restore displacement strain rate ,in , , .

[0019] Furthermore, the average value The calculation formula is: ,in is the value of the performance parameter under the first power-on test, is the value of the performance parameter under the first power-on test, is the value of the performance parameter under the first power-on test.

[0020] Further, the calculation formula of the standard deviation is , wherein is the value of the performance parameter under the first power-on test and . .

[0021] Further, the average value and the standard deviation of each performance parameter are calculated in real time, and the upper limit of the statistical quality control is dynamically set to , and the lower limit of the statistical quality control is ; if each performance parameter is between and , the memory alloy wire to be tested is determined to be a qualified product; otherwise, the memory alloy wire to be tested is determined to be an unqualified product, including:

[0022] According to eight SPC discrimination rules, if any one of the SPC discrimination rules is not met, it is determined that the production process of the memory alloy wire to be tested is abnormal and sends a warning information to improve the production process of the memory alloy wire.

[0023] In the second aspect of the embodiment of the application, a system for testing the performance of a memory alloy wire is provided, which is used to implement the method for testing the performance of a memory alloy wire, and includes a memory alloy wire, and terminals fixed at both ends of the memory alloy wire.

[0024] It also includes a workbench, the workbench is fixed with a sliding rail, the sliding rail is fixed with an insulating first clamp and slidingly connected with an insulating second clamp, the side of the first clamp facing the second clamp and the side of the second clamp facing the first clamp are both provided with a limiting groove, and the shape of the limiting groove is adapted to the shape of the terminal.

[0025] The upper surface of the first clamp is provided with a spring and fixedly connected with an insulating first limiting block, the upper surface of the second clamp is provided with a spring and fixedly connected with an insulating second limiting block, when the spring is in an unextended state, the other end of the first limiting block not connected with the spring covers the limiting groove of the first clamp, and the other end of the second limiting block not connected with the spring covers the limiting groove of the second clamp.

[0026] The positive pole of the power supply is electrically connected to the limiting groove of the first clamp through an electric wire, and the negative pole of the power supply is electrically connected to the limiting groove of the second clamp through an electric wire.

[0027] The first connecting plate is fixed on the workbench, the second connecting plate is fixed on the side of the slide rail away from the first clamp, the pulley is fixed on the second connecting plate, the connecting column is fixed on the second clamp, the connecting rope is fixed on the connecting column, and the counterweight is fixed on the end of the connecting rope in the groove of the pulley.

[0028] The industrial camera is installed on the first connecting plate, and the field of view of the industrial camera covers at least the sliding range of the first clamp and the second clamp on the slide rail.

[0029] In a third aspect, the present application provides a device for testing the performance of a memory alloy wire, comprising:

[0030] The acquisition module is configured to acquire images of at least 10 memory alloy wire samples with known reference lengths captured by an industrial camera in a system for testing the performance of a memory alloy wire, so as to acquire the number of pixels from the visual marker point to the image reference edge. The visual marker point is arranged at the transparent position of the second clamp. The calibration module is configured to establish a linear calibration model.

[0031] The calibration model is a linear calibration model. The calibration model is a linear calibration model. The calibration model is a linear calibration model. The calibration model is a linear calibration model. The calibration model is a linear calibration model.

[0032] The test module is configured to perform a test on a memory alloy wire with an initial length of L0 under a voltage of V and a time of T for N times using a system for testing the performance of a memory alloy wire, and obtain the performance parameters of the memory alloy wire. The test module is configured to perform a test on a memory alloy wire with an initial length of L0 under a voltage of V and a time of T for N times using a system for testing the performance of a memory alloy wire, and obtain the performance parameters of the memory alloy wire. The test module is configured to perform a test on a memory alloy wire with an initial length of L0 under a voltage of V and a time of T for N times using a system for testing the performance of a memory alloy wire, and obtain the performance parameters of the memory alloy wire. The test module is configured to perform a test on a memory alloy wire with an initial length of L0 under a voltage of V and a time of T for N times using a system for testing the performance of a memory alloy wire, and obtain the performance parameters of the memory alloy wire. The test module is configured to perform a test on a memory alloy wire with an initial length of L0 under a voltage of V and a time of T for N times using a system for testing the performance of a memory alloy wire, and obtain the performance parameters of the memory alloy wire. The test module is configured to perform a test on a memory alloy wire with an initial length of L0 under a voltage of V and a time of T for N times using a system for testing the performance of a memory alloy wire, and obtain the performance parameters of the memory alloy wire.

[0033] The test module is configured to perform a test on a memory alloy wire with an initial length of L0 under a voltage of V and a time of T for N times using a system for testing the performance of a memory alloy wire, and obtain the performance parameters of the memory alloy wire. The test module is configured to perform a test on a memory alloy wire with an initial length of L0 under a voltage of V and a time of T for N times using a system for testing the performance of a memory alloy wire, and obtain the performance parameters of the memory alloy wire. The test module is configured to perform a test on a memory alloy wire with an initial length of L0 under a voltage of V and a time of T for N times using a system for testing the performance of a memory alloy wire, and obtain the performance parameters of the memory alloy wire. The test module is configured to perform a test on a memory alloy wire with an initial length of L0 under a voltage of V and a time of T for N times using a system for testing the performance of a memory alloy wire, and obtain the performance parameters of the memory alloy wire. The test module is configured to perform a test on a memory alloy wire with an initial length of L0 under a voltage of V and a time of T for N times using a system for testing the performance of a memory alloy wire, and obtain the performance parameters of the memory alloy wire. The test module is configured to perform a test on a memory alloy wire with an initial length of L0 under a voltage of V and a time of T for N times using a system for testing the performance of a memory alloy wire, and obtain the performance parameters of the memory alloy wire. The test module is configured to perform a test on a memory alloy wire with an initial length of L0 under a voltage of V and a time of T for N times using a system for testing the performance of a memory alloy wire, and obtain the performance parameters of the memory alloy wire. The test module is configured to perform a test on a memory alloy wire with an initial length of L0 under a voltage of V and a time of T for N times using a system for testing the performance of a memory alloy wire, and obtain the performance parameters of the memory alloy wire.

[0034] In a fourth aspect, the present application provides an electronic device, comprising a memory, a processor, and a computer program stored in the memory and capable of running on the processor, wherein the processor executes the computer program to enable the electronic device to implement the method for testing the performance of a memory alloy wire.

[0035] In a fifth aspect, the present application provides a computer readable storage medium for storing a computer program, wherein the computer program, when running on a computer, enables the computer to execute the method for testing the performance of a memory alloy wire.

[0036] Advantages:

[0037] According to the above technical solutions, the present application provides a method, system, device, electronic device and storage medium for testing the performance of a memory alloy wire, which has the following advantages:

[0038] 1. Realize terminal test consistent with product working condition: by setting a limiting groove on the first clamp and the second clamp which is suitable for the shape of the terminal, and using the insulating limiting block and spring structure to press and hold the terminal, the memory alloy wire to be tested is clamped between the clamps in the form of "with terminal". The counterweight and pulley structure provide constant or controllable tension for the wire, so that the stress state of the wire is close to the actual use working condition of the product. This structure enables the test process to directly reflect the comprehensive influence of terminal crimping, welding and other processes on the performance of the wire, so that the test sample is equivalent to the product component, and the displacement, recovery force and cycle life data obtained directly reflect the real performance of the final product, the test result has very high credibility and guiding value, and the consistency between the test result and the actual application is improved.

[0039] 2. Replace high-cost displacement sensors with industrial camera vision measurement: by using an industrial camera to collect images covering the movement range of the first clamp and the second clamp, setting a visual marker point at the transparent position of the second clamp, and establishing a linear calibration model based on at least 10 known reference lengths and the number of pixels in the image, the mapping of pixel size to actual physical length is realized. Instead of relying on expensive sensors such as laser displacement sensors, the displacement measurement is completed by using a general industrial camera, which reduces the hardware cost of the system, and at the same time improves the measurement accuracy and environmental adaptability through visual calibration and error compensation.

[0040] 3. Test structure simplification, high clamping efficiency, and adaptation to mass production rhythm: A simple mechanical structure is formed by a slide rail, a slidable second clamp, and a counterweight. Terminals are directly positioned by a limiting groove, and an insulating limiting block automatically holds the terminals under the action of a spring. An operator only needs to place the terminal wire into the limiting groove and release the limiting block to complete clamping, without the need for complex alignment and adjustment operations. This structure is conducive to shortening the preparation time of a single piece, reducing the dependence on the skills of operators, and is suitable for production line sampling and multi-station layout. In addition, not only can performance data closest to the real state of the product be obtained at extremely low cost and extremely high efficiency, but also through real-time analysis of massive data, a dynamic quality control limit can be established to realize the leap from single judgment to trend prediction, from post-inspection to pre-warning, providing unprecedented data support and decision-making basis for the production quality control and process optimization of core components.

[0041] 4. Introduction of measurement system analysis and statistical process control to build a digital quality control link: After establishing a linear calibration model, at least 3 operators each perform multiple repeated measurements, the measurement system is analyzed, and the GR&R index is obtained. When GR&R≤10%, it is confirmed that the system measurement capability is sufficient. Subsequently, by calculating the average value μ and the standard deviation σ of each performance parameter in n power-on tests, the statistical quality control upper and lower limits of μ±3σ are established, and based on the rules of whether the performance parameters fall within the control limits, whether they are close to ±3σ, or whether they are continuously outside ±2σ, the samples are divided into qualified products, marginal products, and unqualified products, while determining whether there is abnormal fluctuation in the production process and triggering an early warning. Based on single piece judgment, this scheme builds a complete statistical quality control link from measurement system capability verification to process control.

[0042] 5. Stable and intuitive, and simple representation of memory alloy wire: Non-contact measurement has strong anti-interference ability and can obtain rich two-dimensional image information. In addition to core displacement data, it can also: perform process monitoring and fault diagnosis through image analysis: for example, by analyzing whether the motion trajectory of the marker point is straight, to determine whether the clamping is parallel and the movement is stuck; record the test process: saved images or videos can be used as original data archives for subsequent tracing and analysis; and expand more measurement items: in the future, more complex algorithms can be used to analyze the diameter change and surface morphology of the wire from the image at the same time.

[0043] It should be understood that all combinations of the aforementioned concepts and additional concepts described in greater detail below can be seen as part of the subject matter of the present disclosure, as long as such concepts do not contradict each other.

[0044] The foregoing and other aspects, embodiments and features of the present teachings can be better understood from the following description of the present teachings with reference to the drawings. Other aspects and features of the present teachings will become apparent from the following description of the examples and / or will be learned by practice of such examples. It will be understood that the description and specific examples are intended for the purpose of illustration only and not as an exercise of limiting the scope of the present teachings. BRIEF DESCRIPTION OF DRAWINGS

[0045] The accompanying drawings are not necessarily drawn to scale. In the drawings, each identical, or nearly identical, component that is illustrated in various figures is represented with a like numeral. For purposes of clarity, not every component is called out in every drawing. There is no implied relationship or dependency between components that are illustrated in different figures.

[0046] Figure 1 A flow chart of a method for testing performance of a memory alloy wire according to an embodiment of the present application.

[0047] Figure 2 A device structure diagram of a system for testing performance of a memory alloy wire according to an embodiment of the present application.

[0048] Figure 3 A schematic diagram of an electronic device according to an embodiment of the present application. Figure 2 An enlarged view of A in FIG. 1.

[0049] Figure 4 A schematic diagram of an electronic device according to an embodiment of the present application.

[0050] BRIEF DESCRIPTION OF DRAWINGS

[0051] 1, workbench; 2, slide rail; 3, first clamp; 4, second clamp; 5, memory alloy wire to be tested; 6, first limiting block; 7, second limiting block; 8, first connecting plate; 9, second connecting plate; 10, pulley; 11, connecting column; 12, connecting rope; 13, counterweight; 14, industrial camera. DETAILED DESCRIPTION

[0052] In order to make the objects, technical solutions and advantages of the embodiments of the present application clearer, the technical solutions of the embodiments of the present application will be described clearly and completely below with reference to the drawings of the embodiments of the present application. Obviously, the described embodiments are some of the embodiments of the present application but not all the embodiments of the present application. Based on the described embodiments of the present application, all other embodiments obtained by those of ordinary skill in the art without creative effort fall within the scope of the present application. Unless otherwise defined, the technical terms or scientific terms used herein should be understood as their common meanings to those of ordinary skill in the art.

[0053] The terms "first", "second", and similar terms used in the specification and claims of the present patent application do not denote any order, quantity, or importance, but are used to distinguish different components. Similarly, the singular forms "a", "an", and "the" do not denote a quantity limitation, but denote the presence of at least one, unless the context clearly indicates otherwise. The terms "comprise", "comprising", and similar terms mean that the elements or objects before "comprise" or "comprising" encompass the features, integers, steps, operations, elements, and / or components listed after "comprise" or "comprising", and do not exclude one or more other features, integers, steps, operations, elements, components, and / or groups thereof. The terms "upper", "lower", "left", "right", and the like are used only to indicate relative positional relationships, which may change accordingly when the absolute positions of the described objects change.

[0054] In order to ensure the quality consistency of memory alloy wires in the mass production process, the prior art usually uses special test tools and precision sensors to detect the performance of the memory alloy wires. However, the existing solutions mainly have the following deficiencies:

[0055] First, the test state is disconnected from the real product working condition: the existing patents and detection devices mainly test the performance of "bare wires", that is, the two ends of the wire are clamped by a specially designed clamping structure or a weight system, without considering the influence of terminal crimping, welding and other processes on the local organization and stress state of the wire. In actual products, the terminal crimping area may change the local resistance, stress distribution and deformation mode of the wire. If the test is only for bare wires, there is a risk that the performance measured in the laboratory is inconsistent with the performance in the actual assembly state, which is not conducive to evaluating the real performance of product-level memory alloy wires. Second, the system cost is high and the environmental adaptability is poor: the existing test systems rely heavily on high-precision special sensors such as laser displacement sensors. Such sensors are expensive, have strict requirements on installation conditions and environmental stability, and are easily affected by factors such as electromagnetic field interference, temperature fluctuations and vibration. In a multi-station production line or a complex electrical environment, the cost of maintaining high-precision measurement is high, and the environmental adaptability of the system is limited. Third, it is difficult to adapt to mass production scenarios, and the test efficiency is low: the mechanical structure of some existing devices is complex, and the clamping, alignment and zero adjustment process has many steps, which relies heavily on the experience of operators. For production scenarios that require large-scale sampling or full inspection, the above cumbersome operation process will result in long preparation time for each piece and difficult to compress the beat, which is not conducive to popularization and use on the production line.

[0056] In view of this, the embodiments of the present application provide a method for testing the performance of memory alloy wires, with reference to Figure 1 , comprising:

[0057] Step S102: capturing images of at least 10 memory alloy wire samples with known reference lengths by the industrial camera 14 in the system for testing the performance of memory alloy wires to acquire the pixel number of the visual marker point to the image reference edge , wherein the visual marker point is arranged at the transparent position of the second clamp 4.

[0058] Step S104: establishing a linear calibration model , wherein, is the scale factor of the optical system, in mm / pixel, representing the actual physical size corresponding to each pixel; is the system error compensation value, used to correct systematic errors.

[0059] Step S106: performing a test on the memory alloy wire 5 with an initial length of by the system for testing the performance of memory alloy wires under a voltage of V, a time of ms, and times of power-on, to obtain the performance parameters of the memory alloy wire 5.

[0060] Step S108: calculating the average value and the standard deviation of each performance parameter in real time, and dynamically setting the upper limit of statistical quality control as and the lower limit of statistical quality control as ; if each performance parameter is between and , the memory alloy wire 5 is determined to be a qualified product; otherwise, the memory alloy wire 5 is determined to be a unqualified product.

[0061] To establish the correspondence between pixels and actual lengths, at least 10 memory alloy wire samples with known reference lengths can be clamped on the workbench 1 in sequence. The length of each sample is measured and recorded by a conventional vernier caliper or measuring tool before clamping. When clamping, the terminals are positioned by the limiting grooves of the first clamp 3 and the second clamp 4, and the industrial camera 14 covers the effective area between the two clamps in the field of view. The visual marker point is arranged at the transparent position of the second clamp 4, which means that on the one hand, it meets the position of moving together with the second clamp 4 and is located within the field of view of the industrial camera 14; on the other hand, it meets the light transmission of the backlight light source. For example, by pasting a high-contrast marker patch on the side of the second clamp 4 close to the weight block 13, the industrial camera 14 can clearly identify the edge of the marker point. For each reference sample, the pixel distance of the visual marker point to the image reference edge is extracted by an image processing algorithm, a plurality of data sets are constructed, and the scale factor and the system error compensation value are obtained by linear fitting, thereby establishing a linear calibration model.

[0062] After calibration, the memory alloy wires 5 to be tested, with terminals, are clamped one by one between the first clamp 3 and the second clamp 4. A stable tensile force is formed using the counterweight 13, and then voltage is applied. and time Each filament was subjected to an electrical test. In each electrical cycle, performance parameters were calculated, and for each performance parameter, the mean and standard deviation were calculated. Then, statistical quality control limits were set, and the quality of the tested filament was determined. Statistical analysis of the electrical test results was conducted. Control limits are used to determine the quality of samples, expanding the test results from single measurements to a comprehensive judgment based on statistical characteristics, thereby improving the ability to characterize the performance stability and dispersion of the tested shape memory alloy wire.

[0063] In some embodiments, a univariate linear calibration model is established. ,in, is the scaling factor of the optical system, with the unit being mm / pixel, used to represent the actual physical size of each pixel; This is the systematic error compensation value, used to correct systematic errors, including:

[0064] After establishing the univariate linear calibration model, at least three operators each perform three tests to obtain the GR&R index after performing measurement system analysis. If GR&R ≤ 10%, the system for testing the performance of shape memory alloy wire is deemed to have sufficient capability, the univariate linear calibration model is valid, and the system for testing the performance of shape memory alloy wire is confirmed to have the measurement capability to meet engineering applications. If GR&R > 10%, after analyzing the source of variation and improving the system for testing the performance of shape memory alloy wire, the univariate linear calibration model is re-established based on the images captured by the industrial camera 14 until GR&R ≤ 10%.

[0065] A measurement system analysis step has been added, calculating the GR&R index through repeated measurements by multiple operators to determine if the system has sufficient measurement capabilities. If the GR&R does not meet the requirements, the system is improved, for example, by reducing fixture repeatability errors, stabilizing the counterweight, or standardizing operating habits. Targeted optimizations are made to the fixture structure, operating procedures, or optical configuration. Then, a new calibration model is established, and the GR&R evaluation is repeated until the GR&R meets the set threshold. In some embodiments, the system's capabilities are sufficient, and the effective GR&R index range for the univariate linear calibration model can be expanded to 30%. That is, if GR&R ≤ 30%, the system for testing the performance of shape memory alloy wires is considered to have sufficient capabilities, the univariate linear calibration model is effective, and it is suitable for production conditions with different requirements.

[0066] When GR&R > 10%, the system structure, optical configuration or operating procedures are adjusted by analyzing the sources of variation in operators, equipment, environment, etc., and calibration and GR&R evaluation are performed again.

[0067] In existing quality management systems, measurement system analysis (MSA) and GR&R assessment are widely used in dimensional measurement, performance testing, and other applications to determine whether a measurement system is suitable as a basis for process control. This embodiment introduces the concept of MSA into the performance testing scenario of shape memory alloy wires, which helps improve the reliability of the entire testing system. By introducing MSA, the testing method not only possesses measurement capabilities but also self-monitoring capabilities, ensuring the reliability of the data upon which subsequent statistical analysis is based and helping to avoid erroneous judgments caused by excessive measurement system errors.

[0068] In some embodiments, a system for testing the properties of shape memory alloy wires is used to test the initial length of the wire. The shape memory alloy wire to be tested is subjected to voltage 5 Fu, time milliseconds After the first power-on test, the performance parameters of the shape memory alloy wire 5 under test were obtained, including:

[0069] After the memory alloy wire 5 with terminals is installed between the first clamp 3 and the second clamp 4 through the limiting groove, the industrial camera 14 is triggered to acquire an initial state image and the initial state length of the memory alloy wire 5 is measured based on the initial state image. ;

[0070] The shape memory alloy wire 5 to be tested is subjected to voltage Fu, time The heating process begins within milliseconds. Upon completion of heating, an industrial camera 14 is triggered to capture an image of the shrinkage state. Based on this image, the shrinkage length of the shape memory alloy wire 5 under test is measured. ;

[0071] Power is turned off to allow the shape memory alloy wire 5 under test to cool and recover. Once the displacement stabilizes, the industrial camera 14 is triggered to acquire an image of the recovered state, and the recovered length of the shape memory alloy wire 5 is measured based on the image. ;

[0072] Based on the initial state length Length in contracted state Length of recovery state Calculate the performance parameters of the shape memory alloy wire 5 to be tested. The performance parameters include at least the shrinkage displacement. , restore displacement strain rate ,in , , .

[0073] The test wire with terminals is installed in the limiting groove between the first and second clamps. The terminals are positioned and held by the limiting block and spring. In the initial state, the industrial camera 14 is triggered to acquire images, and calculations are performed using the calibration model. ; then with voltage ,time The wire is electrically heated, and images of its shrinkage state are captured and calculated at the end of the heating process. Power was turned off and the area was allowed to cool down. After the displacement stabilized, images of the recovered state were acquired and calculations were performed. The performance parameters were calculated. By acquiring images in three states and calculating the length, the shrinkage and recovery behavior of shape memory alloy wires during the electric heating and cooling recovery processes can be fully characterized, and quantitative indicators of shrinkage capacity, residual deformation and strain characteristics can be obtained, providing basic data for subsequent statistical analysis.

[0074] In some embodiments, the average value The calculation formula is ,in These are the performance parameter values ​​under the first power-on test, ... For the first The performance parameters under the first power-on test are numerical values. The average value is defined using a standard arithmetic mean formula to ensure the statistical calculation method is clear and easy to implement directly in software or control systems, thereby enhancing the feasibility and reproducibility of the method.

[0075] In some embodiments, standard deviation The calculation formula is ,in For the first The performance parameters under the second power-on test and The method employs the standard statistical method for calculating sample standard deviation, ensuring it conforms to general guidelines for statistical process control. A clearly defined calculation formula helps reduce comprehension bias and improves the consistency and comparability of statistical results.

[0076] In some embodiments, the average value is calculated in real time for each performance parameter. and standard deviation And dynamically set the upper limit of statistical quality control to The lower limit for statistical quality control is If each performance parameter is between and If the test results are within the acceptable range, the shape memory alloy wire 5 is deemed a qualified product; otherwise, the shape memory alloy wire 5 is deemed a defective product, including:

[0077] According to the eight SPC rules, if any one of the SPC rules is not met, it is determined that the production process of the test memory alloy wire 5 is abnormal and a warning information is sent to improve the production process of the test memory alloy wire 5.

[0078] In the production process of the memory alloy wire, in order to monitor the stability of the key performance parameters (such as the initial state length , the shrinkage state length ) in real time, a conventional control chart (such as Xbar-R chart) is used for statistical process control. The center line (CL) of the control chart is set as the target value of the performance parameter (i.e. ), and the upper control limit (UCL) and the lower control limit (LCL) are set as and respectively. The control chart is divided into three regions A, B and C on both sides of the center line, and the width of each region is , specifically: C region ( to ), B region ( to , to ), and A region ( to , to ).

[0079] When one of the following abnormal patterns appears on the control chart, it is determined that the production process of the memory alloy wire is abnormal, and the warning system is automatically triggered to notify the production personnel to take corrective measures in time:

[0080] Pattern 1 (point out of range): any one sample performance parameter data point exceeds the upper control limit (UCL) or the lower control limit (LCL).

[0081] Pattern 2 (chain judgment): 9 consecutive sample performance parameter data points fall on the same side of the center line.

[0082] Pattern 3 (trend judgment): 6 consecutive sample performance parameter data points show an increasing or decreasing trend.

[0083] Pattern 4 (alternating judgment): among 14 consecutive sample performance parameter data points, adjacent points alternate up and down.

[0084] Pattern 5 (deviation judgment): among 8 consecutive sample performance parameter data points, 2 or more points fall on the same side of the center line outside the B region (i.e. the data point is greater than or less than ​This embodiment applies this mode to monitor in particular: when detecting that 2 points of the 8 consecutive data points fall on the same side of the B zone, the system determines that the production process has abnormal fluctuations and sends a warning.

[0085] Mode 6 (aggregated discrimination): of the 5 consecutive sample performance parameter data points, 4 or more points fall on the same side of the C zone of the center line (i.e. data points greater than or less than ).

[0086] Mode 7 (hierarchical discrimination): all of the 15 consecutive sample performance parameter data points fall within the C zone on both sides of the center line (i.e. all points are within to ).

[0087] Mode 8 (missing near-center discrimination): the 8 consecutive sample performance parameter data points fall on both sides of the center line, and none of the points fall within the C zone (i.e. all points are outside the range of to ).

[0088] Improved process after warning:

[0089] After receiving a warning of any mode, the production personnel need to suspend or closely monitor the production process, investigate the specific reasons according to the direction prompted by the alarm mode (such as high, low, periodicity, etc.), for example: check the equipment, calibrate the instrument, confirm the raw materials, adjust the process parameters, etc. After eliminating the abnormal reasons, the process is restored to stability, at which time the data needs to be collected again to evaluate the control limit, and the control chart phase is entered for continuous monitoring.

[0090] Through the systematic application of discrimination criteria, full-mode, automated, and intelligent monitoring of the production process of memory alloy wire is realized. It not only can detect obvious out-of-control points, but also can sensitively identify early or hidden signs of process mean shift, trend change, periodic interference, etc., thereby achieving earlier warning and more accurate positioning, greatly improving the prevention ability of process control and the consistency of product quality, and having high industrial practical value.

[0091] Another embodiment of the present application also provides a system for testing the performance of memory alloy wire, for a method for testing the performance of memory alloy wire, with reference to Figures 2-3 , comprising a memory alloy wire 5 to be tested, the two ends of the memory alloy wire 5 to be tested are fixed with terminals, further comprising a workbench 1, the workbench 1 is fixed with a sliding rail 2, the sliding rail 2 is fixed with an insulating first clamp 3 and slidably connected with an insulating second clamp 4, the side of the first clamp 3 facing the second clamp 4 and the side of the second clamp 4 facing the first clamp 3 are both provided with a limiting groove, the shape of the limiting groove is adapted to the shape of the terminal.

[0092] The upper surface of the first clamp 3 is provided with a spring and fixedly connected with an insulating first limiting block 6, and the upper surface of the second clamp 4 is provided with a spring and fixedly connected with an insulating second limiting block 7. When the spring is in an unextended state, the other end of the first limiting block 6 not connected with the spring covers the limiting groove of the first clamp 3, and the other end of the second limiting block 7 not connected with the spring covers the limiting groove of the second clamp 4.

[0093] The positive pole of the power supply is electrically connected with the limiting groove of the first clamp 3 through an electric wire, and the negative pole of the power supply is electrically connected with the limiting groove of the second clamp 4 through an electric wire.

[0094] The workbench 1 is further fixed with a first connecting plate 8, the side of the slide rail 2 away from the first clamp 3 is directly fixed with a second connecting plate 9, the second connecting plate 9 is fixed with a pulley 10, the second clamp 4 is fixed with a connecting column 11, the connecting column 11 is fixed with a connecting rope 12, and the other end of the connecting rope 12 not connected with the connecting column 11 is fixed with a counterweight 13 and placed in the groove of the pulley 10.

[0095] The first connecting plate 8 is provided with an industrial camera 14, and the field of view of the industrial camera 14 covers at least the sliding range of the first clamp 3 and the second clamp 4 on the slide rail 2.

[0096] The workbench 1 is fixed with the slide rail 2, the first clamp 3 is fixed on the slide rail 2, and the second clamp 4 can slide along the slide rail 2. The opposite sides of the two clamps are provided with limiting grooves which are adapted to the shape of the terminal and used for positioning the terminal. The upper surfaces of the first clamp 3 and the second clamp 4 are respectively provided with springs, and the springs are connected with insulating limiting blocks. When the springs are not extended, the limiting blocks cover the limiting grooves and are used for pressing the terminal. The positive and negative poles of the power supply are respectively electrically connected with the two limiting grooves through electric wires, so as to realize the electrification of the terminal wire. One end of the slide rail 2 is fixed through the first connecting plate 8 and the second connecting plate 9, the second connecting plate 9 is provided with the pulley 10, the second clamp 4 is fixed with the connecting column 11, one end of the connecting rope 12 is tied to the connecting column 11, and the other end of the connecting rope 12 is connected with the counterweight 13 after passing through the pulley 10, so as to realize the tensile loading of the wire. The first connecting plate 8 is provided with the industrial camera 14, and the field of view of the industrial camera 14 covers the sliding range of the two clamps on the slide rail 2, so as to facilitate the collection of images of the wire in different states. The system structure can realize the rapid clamping and constant tensile loading of the terminal wire under the premise of ensuring electrical insulation and electrification. The industrial camera 14 and the slide rail 2 are arranged and matched, so as to ensure that the image collection can be performed in the whole movement range. The system provides mechanical and optical basis for the method implementation, so that the linear calibration, three-state imaging and statistical analysis can be completed on a unified platform.

[0097] The workbench 1 serves as a supporting platform, the slide rail 2 is fixed on the workbench 1 along the length direction of the wire, the first clamp 3 is fixed on one end of the slide rail 2 in a bolt or positioning block manner, and the second clamp 4 is slidably connected with the slide rail 2 through a sliding block. The side of the first clamp 3 and the second clamp 4 facing each other is processed with a limiting groove matching the shape of the terminal, so that the terminal can be laterally positioned and rotationally limited after being inserted.

[0098] The spring is mounted on the upper surface of the two clamps, and the other end of the spring is connected with the insulating limiting block, the limiting block covers the limiting groove under the action of the spring tension, and forms the downward pressure on the terminal. When the terminal is inserted into the limiting groove, the clamping can be completed by lifting the limiting block upward, and after the limiting block is released, the spring presses the terminal tightly to prevent the terminal from falling off during the power-on and shrinkage processes. The power supply is electrically connected with the two limiting grooves through the wires, so that the current can form a closed loop through the terminal and the wire.

[0099] The end of the slide rail 2 away from the first clamp 3 is fixed on the workbench 1 through the first connecting plate 8, the first connecting plate 8 is further fixed with the second connecting plate 9, the pulley 10 is mounted on the second connecting plate 9, one end of the connecting rope 12 is tied on the connecting column 11 on the second clamp 4, and the counterweight 13 is fixed after passing through the pulley 10, so that the stretching load on the wire is realized.

[0100] The industrial camera 14 is mounted on the first connecting plate 8 through a support, and the installation position and the field of view angle are designed to cover at least the whole working stroke of the two clamps on the slide rail 2. The industrial camera 14 is connected with the upper computer, and is used for collecting images and performing visual calibration, length measurement and result storage.

[0101] Another embodiment of the present application also provides a device for testing the performance of a memory alloy wire, comprising:

[0102] The acquisition module is used for acquiring the image of at least 10 memory alloy wire samples with known reference lengths captured by the industrial camera 14 in the system for testing the performance of a memory alloy wire, so as to acquire the pixel number of the visual marking point to the image reference edge , wherein the visual marking point is arranged at the transparent position of the second clamp 4.

[0103] The calibration module is used for establishing a linear calibration model , wherein, is a scale factor of the optical system, and the unit is mm / pixel, which is used for representing the actual physical size corresponding to each pixel; is a system error compensation value, which is used for correcting the systematic error.

[0104] The test module is used for testing the initial state length of The memory alloy wire 5 to be tested is tested by applying a voltage of 0.5V to the memory alloy wire 5 to be tested for a time of 1ms. After the test, the performance parameters of the memory alloy wire 5 to be tested are obtained.

[0105] The judgment module is configured to calculate the average value and the standard deviation of each performance parameter in real time and dynamically set the upper limit of the statistical quality control as and the lower limit of the statistical quality control as If each performance parameter is between and , the memory alloy wire 5 to be tested is determined to be a qualified product; otherwise, the memory alloy wire 5 to be tested is determined to be a unqualified product.

[0106] It should be noted that although several units or sub-units of the apparatus are mentioned in the foregoing detailed description, such division is merely exemplary and not mandatory. In fact, according to the embodiments of the present application, the features and functions of two or more units described above can be embodied in one unit. Conversely, the features and functions of one unit described above can be further divided into units embodied by multiple units.

[0107] Based on the same inventive concept as the method embodiments described above, the present embodiments also provide an electronic device, which includes a memory, a processor, and a computer program stored in the memory and executable on the processor. When the processor executes the computer program, the electronic device implements the control method in the above embodiments.

[0108] In an embodiment, the electronic device can be a server, and in this embodiment, the structure of the electronic device can be as shown in Figure 4 , which includes a memory, a communication module, and one or more processors.

[0109] The memory is configured to store the computer program executed by the processor. The memory can mainly include a program storage area and a data storage area, wherein the program storage area can store an operating system and programs required for running instant messaging functions, etc.; and the data storage area can store various instant messaging information and operation instruction sets, etc.

[0110] ​The memory can be volatile memory (volatile memory), such as random access memory (random access memory, RAM); the memory can also be non-volatile memory (non-volatile memory), such as read-only memory, flash memory, hard disk drive (hard disk drive, HDD) or solid state drive (solid state drive, SSD); or the memory is any other medium capable of carrying or storing a desired computer program in the form of instructions or data structures and capable of being accessed by a computer, but not limited to this. The memory can be a combination of the above memories.

[0111] The processor can include one or more central processing units (central processing units, CPU) or digital processing units, etc. The processor is used to call the computer program stored in the memory to realize the above-mentioned audio data processing method.

[0112] The communication module is used for communication with the terminal device and other servers.

[0113] The specific connection medium between the above-mentioned memory, communication module and processor is not limited in the embodiments of the present application. In the embodiments of the present application, the memory and the processor are connected through a bus Figure 4 , the bus is described by an arrow in Figure 4 , the connection mode between other components is only schematically described, and is not limited. The bus can be divided into an address bus, a data bus, a control bus, etc. For the convenience of description, Figure 4 , only one arrow is described, but only one bus or one type of bus is not described.

[0114] Based on the same inventive concept as the above method embodiments, the embodiments of the present application also provide a computer readable storage medium for storing a computer program, which makes an electronic device realize the control method in the above embodiments when the computer program runs on a computer. The computer readable storage medium can be a readable signal medium or a readable storage medium. The readable storage medium may, for example, but is not limited to, an electrical, magnetic, optical, electromagnetic, infrared, or semiconductor system, device or component, or any combination of the above. More specific examples (non-exhaustive list) of readable storage medium include: electrical connection with one or more conductive wires, portable disk, hard disk, random access memory (RAM), read-only memory (ROM), erasable programmable read-only memory (EPROM or flash memory), optical fiber, portable compact disk read-only memory (CD ROM), optical storage device, magnetic storage device, or any suitable combination of the above.

[0115] Based on the same inventive concept as the above method embodiments, embodiments of the present application also provide a computer program product including a computer program for causing an electronic device to perform the steps of the control method according to various exemplary embodiments of the present application described above in the specification when the program product is run on the electronic device. The program product can take any combination of one or more of a readable medium. These computer program commands can be provided to the processor of a general-purpose computer, a special-purpose computer, an embedded processor, or other programmable data processing devices to produce a machine, so that the commands executed by the processor of the computer or other programmable data processing devices produce a device that implements the functions specified in the flowchart Figure 1 one flow or multiple flows and / or the functions specified in one block or multiple blocks. Figure 1 one flow or multiple flows and / or the functions specified in one block or multiple blocks.

[0116] Although the present application has been disclosed in connection with the preferred embodiments shown, it should be understood that many modifications, substitutions, and changes can be made by those skilled in the art to the preferred embodiments without departing from the spirit and the scope of the present application. Therefore, the present application should not be restricted to the described embodiments.

Claims

1. A method for testing properties of a memory alloy wire, characterized by, Comprise: Based on at least 10 known fiducial lengths of a memory alloy wire sample captured by an industrial camera in a system for testing the performance of a memory alloy wire to gather the number of pixels from a visual marker point to an image fiducial edge wherein the visual marker point is disposed at a transparent location of the second clamp Establishing a one-dimensional linear calibration model wherein, is a scale factor of the optical system, in mm / pixel, used to represent the actual physical size corresponding to each pixel; is a system error compensation value, used to correct systematic errors; The performance parameters of the memory alloy wire to be tested are obtained after the memory alloy wire to be tested in an initial state with a length of is tested by a system for testing the performance of a memory alloy wire, with a voltage V, a time ms, and times of power-on test. calculating the average value of each performance parameter in real time and the standard deviation , dynamically setting the upper limit of statistical quality control as , and the lower limit of statistical quality control as ; if each performance parameter is between and , it is determined that the memory alloy wire to be tested is a qualified product; otherwise, it is determined that the memory alloy wire to be tested is an unqualified product.

2. The method for testing the performance of a memory alloy wire according to claim 1, wherein, The establishing a linear calibration model Wherein, is a scale factor of the optical system, in units of mm / pixel, used to represent the actual physical size corresponding to each pixel; is a system error compensation value, used to correct systematic errors, including: When a unary linear calibration model is established, at least 3 operators each perform 3 tests to obtain GR&R indicators after performing measurement system analysis, if GR&R≤10%, it is determined that the capacity of a system for testing the performance of a memory alloy wire is sufficient, the unary linear calibration model is effective; if GR&R>10%, after analyzing the source of variation and improving the system for testing the performance of a memory alloy wire, the unary linear calibration model is re-established based on the images captured by the industrial camera until GR&R≤10%.

3. The method for testing the performance of a memory alloy wire according to claim 1, wherein, The system used for testing the performance of shape memory alloy wires was applied to the initial state length of... The shape memory alloy wire to be tested is subjected to voltage Fu, time milliseconds After the initial power-on test, the performance parameters of the shape memory alloy wire under test were obtained, including: after the memory alloy wire to be tested with a terminal is installed between the first clamp and the second clamp through the limiting groove, triggering the industrial camera to collect an initial state image and measuring the initial state length of the memory alloy wire to be tested based on the initial state image ; The memory alloy wire to be tested is subjected to electric current heating with a voltage of V and a time of milliseconds, at the end of which an industrial camera is triggered to capture a contraction state image and based on the contraction state image the length of the contraction state of the memory alloy wire to be tested is measured ; stopping energizing to cool and recover the memory alloy wire under test, triggering an industrial camera to collect a recovery state image and measuring the recovery state length of the memory alloy wire under test based on the recovery state image when the displacement is stable ; According to the initial state length , the contracted state length , the recovery state length , the performance parameters of the memory alloy wire to be tested are calculated, and the performance parameters at least include the contraction displacement , the recovery displacement , the strain rate , wherein , , .

4. The method for testing the performance of a memory alloy wire according to claim 1, wherein, The average value The calculation formula is , wherein is the value of the performance parameter under the first power-on test, is the value of the performance parameter under the nth power-on test. is the value of the performance parameter under the nth power-on test.

5. The method for testing the performance of a memory alloy wire according to claim 1, wherein, The standard deviation The calculation formula is ,in For the first The performance parameters under the second power-on test and .

6. The method for testing the performance of a memory alloy wire according to claim 1, wherein, The average value of each performance parameter is calculated in real time and the standard deviation , and the upper limit of statistical quality control is dynamically set as , and the lower limit of statistical quality control is ; if each performance parameter is between and , it is determined that the memory alloy wire to be tested is a qualified product; Otherwise, it is determined that the memory alloy wire to be tested is unqualified, comprising: According to the eight SPC rules, if any one of the SPC rules is not met, it is determined that the production process of the memory alloy wire to be tested is abnormal and sends a warning message to improve the production process of the memory alloy wire.

7. A system for testing the performance of a memory alloy wire, for implementing the method for testing the performance of a memory alloy wire according to any one of claims 1-6, comprising a memory alloy wire, both ends of the memory alloy wire being fixed with terminals, characterized in that, Further comprising a workbench, the workbench being fixed with a sliding rail, the sliding rail being fixed with an insulating first clamp and slidingly connected with an insulating second clamp, the side of the first clamp facing the second clamp and the side of the second clamp facing the first clamp being provided with a limiting groove, the shape of the limiting groove being adapted to the shape of the terminal; The upper surface of the first clamp is provided with a spring and fixedly connected with an insulating first limiting block, the upper surface of the second clamp is provided with a spring and fixedly connected with an insulating second limiting block, when the spring is in an unextended state, the other end of the first limiting block not connected with the spring covers the limiting groove of the first clamp, and the other end of the second limiting block not connected with the spring covers the limiting groove of the second clamp; The positive pole of the power supply is electrically connected to the limiting groove of the first clamp through an electric wire, and the negative pole of the power supply is electrically connected to the limiting groove of the second clamp through an electric wire; The workbench is further fixed with a first connecting plate, the side of the sliding rail away from the first clamp is directly fixed with a second connecting plate, the second connecting plate is fixed with a pulley, the second clamp is fixed with a connecting column, the connecting column is fixed with a connecting rope, the connecting rope is placed in the groove of the pulley and the end of the connecting rope not connected with the connecting column is fixed with a counterweight; The first connecting plate is installed with an industrial camera, the field of view of the industrial camera covers at least the sliding range of the first clamp and the second clamp on the sliding rail.

8. A device for testing the properties of a memory alloy wire, characterized in that Comprise: A capture module for capturing the number of pixels from a visual marker point to an image reference edge based on images of at least 10 known reference lengths of memory alloy wire samples captured by an industrial camera in a system for testing properties of memory alloy wire A capture module for capturing the number of pixels from a visual marker point to an image reference edge based on images of at least 10 known reference lengths of memory alloy wire samples captured by an industrial camera in a system for testing properties of memory alloy wire A capture module for capturing the number of pixels from a visual marker point to an image reference edge based on images of at least 10 known reference lengths of memory alloy wire samples captured by an industrial camera in a system for testing properties of memory alloy wire A calibration module is configured to establish a one-dimensional linear calibration model wherein, is a scale factor of the optical system, in mm / pixel, representing the actual physical size corresponding to each pixel; is a system error compensation value, used to correct systematic errors; The testing module is used to test the properties of shape memory alloy wires with an initial length of... The shape memory alloy wire to be tested is subjected to voltage Fu, time milliseconds After the first power-on test, the performance parameters of the shape memory alloy wire under test were obtained; a judging module, configured to calculate the average value of each performance parameter in real time and the standard deviation , dynamically set the upper limit of statistical quality control as , and the lower limit of statistical quality control as ; if each performance parameter is between and , it is determined that the memory alloy wire to be tested is a qualified product; otherwise, it is determined that the memory alloy wire to be tested is an unqualified product.

9. An electronic device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that, The processor executes the computer program, so that the electronic device implements the method for testing the performance of a memory alloy wire according to any one of claims 1-6.

10. A computer-readable storage medium, characterized in that, The computer readable storage medium is used to store the computer program, when the computer program runs on the computer, so that the computer executes the method for testing the performance of a memory alloy wire according to any one of claims 1-6.

Images