Full-color Micro LED micro-display module packaging detection method, device and equipment
By collecting and analyzing pixel-level thermally induced self-emissive response parameters, abnormal deviation areas in Micro LED micro-display modules are identified, transfer error compensation parameters are generated, and the mass transfer process is optimized. This solves the problems of insufficient efficiency and accuracy in existing detection methods and achieves high-precision packaging.
Patent Information
- Application Number
- CN202511557140.3
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-10-29
- Publication Date
- 2026-01-23
AI Technical Summary
Existing Micro LED microdisplay module inspection methods struggle to identify minute chip displacement errors, foreign object contamination, and vacancies in high-density, multi-pixel full-color modules during mass transfer, resulting in insufficient inspection efficiency and accuracy, which in turn affects packaging quality and production yield.
By collecting pixel-level thermally induced self-luminescence response parameters, instantaneous photoresponse curvature is generated. Multi-time point response trend analysis and thermal disturbance coupling evolution are performed to construct pixel thermal disturbance response maps, identify abnormal deviation areas, calculate and locate inter-pixel response differences, generate transfer error compensation parameters, optimize mass transfer process parameters, and realize dynamic packaging control.
It improves detection accuracy and automation, can quickly identify and compensate for transfer errors, enhances packaging accuracy and reliability, reduces cumulative offset caused by repetitive errors, and ensures high-precision packaging quality.