Solar silicon rod universal analyzer test equipment and silicon rod detection method

Abstract

The invention belongs to the technical field, and particularly relates to a preparation method. The invention provides solar silicon rod universal analyzer testing equipment. The solar silicon rod universal analyzer testing equipment comprises an operation table; the linear feeding mechanism is arranged on the front side face of the operation table, and a clamp used for clamping a silicon rod is arranged on the linear feeding mechanism; the rotating mechanism is arranged on the upper surface of the operation table, is located under the moving path of the clamp, and is used for receiving and driving the silicon rod to rotate; the rotating mechanism comprises a material carrying table and a motor for driving the material carrying table to rotate; the infrared detector is arranged on the right side face of the operation table, and the detection end of the infrared detector faces the material carrying table of the rotating mechanism; the image acquisition camera is arranged on the left side face of the operation table, and a lens of the image acquisition camera faces the material carrying table of the rotating mechanism; by arranging the precise linear feeding mechanism and the rotating mechanism, the precise and controllable composite motion capability of the silicon rod in the axial direction and the circumferential direction is obtained, and a core motion foundation is provided for all-dimensional automatic detection.

Description

Technical Field

[0001] This invention belongs to the field of battery cell raw material production technology, specifically relating to solar silicon rod testing equipment, and more particularly to a solar silicon rod universal analyzer testing equipment. Background Technology

[0002] Solar silicon rods are the core raw material for manufacturing solar cells, and their quality directly determines the performance of the final product. In the current technology, the inspection of solar silicon rods usually relies on independent inspection stations. For example, a single infrared thermal imager is used to scan a stationary silicon rod, or a fixed-angle industrial camera is used to take pictures of a part of the silicon rod.

[0003] The relevant testing equipment typically includes a fixed support, a simple support platform for placing the silicon rod, and a single testing sensor. Because the support platform lacks precise rotation and movement functions, the position and angle of the silicon rod need to be adjusted manually multiple times during testing to complete the testing of different sides. This operation mode, which relies on manual intervention, not only introduces human error but also leads to low testing efficiency. In addition, due to the lack of an integrated collaborative control structure between the various components of the equipment (such as the sensor and the support platform), the accuracy and repeatability of the entire testing process are difficult to guarantee, and it cannot meet the needs of modern production lines for efficient and high-precision testing.

[0004] Therefore, how to solve the detection error caused by frequent adjustments to the position and angle of the silicon rod is a technical problem that urgently needs to be solved in this field.

[0005] It should be noted that the information disclosed in this background section is only for understanding the background technology of the present application concept, and therefore, the above description is not considered to constitute prior art information. Summary of the Invention

[0006] This disclosure provides at least one solar silicon rod universal analyzer testing device to solve the technical problem of detection errors caused by frequent adjustments to the position and angle of the silicon rod.

[0007] In a first aspect, embodiments of this disclosure provide a solar silicon rod universal analyzer testing device, comprising: an operating table; a linear feed mechanism disposed on the front side of the operating table, the linear feed mechanism being provided with a clamp for clamping the silicon rod; a rotating mechanism disposed on the upper surface of the operating table and located directly below the moving path of the clamp, for receiving and driving the silicon rod to rotate; the rotating mechanism includes a loading platform and a motor for driving the loading platform to rotate; an infrared detector disposed on the right side of the operating table, its detection end facing the loading platform of the rotating mechanism; and an image acquisition camera disposed on the left side of the operating table, its lens facing the loading platform of the rotating mechanism; wherein, the linear feed mechanism first transfers and places the silicon rod on the loading platform, then the motor drives the loading platform to rotate, while the infrared detector and the image acquisition camera synchronously acquire data; the linear feed mechanism re-clamps the silicon rod, moves it along its axial direction by a preset distance, and repeats the above detection steps until the full length of the silicon rod is detected.

[0008] In one alternative embodiment, the surface of the operating table is provided with an anti-slip structure.

[0009] In one alternative embodiment, the anti-slip structure includes a plurality of annular ridges.

[0010] In one optional embodiment, the annular ridge edge is provided with evenly distributed teeth, and the inclination directions between adjacent teeth are opposite.

[0011] In one alternative embodiment, the anti-slip structure includes a plurality of dot-shaped protrusions.

[0012] In one alternative embodiment, the top surface of the dotted protrusion is provided with a concave surface, which is adapted to contact the bottom surface of the silicon rod.

[0013] In one alternative embodiment, the surface of the operating table is provided with a vacuum adsorption structure.

[0014] In one alternative implementation, the linear feed mechanism includes a lead screw and nut structure, a gear and rack structure, or a linear motor module.

[0015] In one alternative implementation, the image acquisition camera is a high-resolution CCD industrial camera or a CMOS industrial camera.

[0016] Secondly, this disclosure also provides a silicon rod inspection method, including the following steps: S1: Loading and positioning step: clamping the silicon rod on the fixture of the linear feed mechanism, and transferring the silicon rod to the top of the loading platform by the linear feed mechanism; S2: Placement and fixing step: the linear feed mechanism descends, placing the silicon rod on the loading platform, and fixing the silicon rod by the anti-slip structure and / or vacuum adsorption structure on the loading platform; S3: Rotation and inspection step: starting the drive device of the rotary table mechanism to drive the loading platform and the silicon rod to rotate; during the rotation, infrared data of the silicon rod is collected by the infrared detector, and surface image data of the silicon rod is collected by the image acquisition camera; S4: Data analysis step: processing and analyzing the collected infrared data and surface image data to generate a silicon rod quality inspection report.

[0017] The beneficial effects of this invention are that it provides a solar silicon rod universal analyzer testing device, which achieves precise alignment and stable support between various functional components by setting a high-rigidity operating table as an integrated platform, thereby improving the overall rigidity of the device and the consistency of measurement benchmarks; by setting a precise linear feed mechanism and a rotation mechanism, it obtains the precise and controllable composite motion capability of the silicon rod in the axial and circumferential directions, solving the problem of detection errors caused by frequent adjustments to the position and angle of the silicon rod, and providing a core motion foundation for all-round automated testing.

[0018] Other features and advantages of the invention will be set forth in the following description, and will be apparent in part from the description, or may be learned by practicing the invention. The objects and other advantages of the invention are realized and obtained through the structures particularly pointed out in the description and the drawings.

[0019] To make the above-mentioned objects, features and advantages of the present invention more apparent and understandable, preferred embodiments are described in detail below with reference to the accompanying drawings. Attached Figure Description

[0020] To more clearly illustrate the specific embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the specific embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are some embodiments of the present invention. For those skilled in the art, other drawings can be obtained from these drawings without creative effort.

[0021] Figure 1 A perspective view of a solar silicon rod universal analyzer testing device provided in an embodiment of this disclosure; Figure 2 Note 1: A front view of a solar silicon rod universal analyzer testing device provided in this embodiment of the disclosure; Figure 3 This is a perspective view showing the connection between the rotating mechanism and a portion of the operating table provided in an embodiment of this disclosure.

[0022] In the picture: 1. Operating table; 12. Front and side views; 13. Top surface; 14. Right side view; 15. Left side view; 2. Linear feed mechanism; 3. Rotating mechanism; 31. Motor; 32. Material loading platform; 33. Anti-slip structure; 34. Vacuum adsorption structure; 4. Infrared detector; 5. Image acquisition camera; 6. Silicon rods. Detailed Implementation

[0023] To make the objectives, technical solutions, and advantages of the embodiments of the present invention clearer, the technical solutions of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0024] In this document, when it is mentioned that a first component is located on a second component, this can mean that the first component can be directly formed on the second component, or that a third component can be inserted between the first and second components. Furthermore, in the accompanying drawings, the thickness of the components may be exaggerated or reduced for the purpose of effectively describing the technical content.

[0025] In this document, exemplary embodiments of the present disclosure will be described in more detail with reference to the accompanying drawings. As used herein, expressions such as “at least one of…” modify the entire list of elements when following a list of elements, rather than individual elements in the list. For example, the expression “at least one of a, b, and c” should be understood to include only a, only b, only c, both a and b, both a and c, both b and c, or all of a, b, and c.

[0026] The terminology used herein is for the purpose of describing specific exemplary configurations only and is not intended to be limiting. As used herein, the singular articles “a,” “an,” and “the” may also be intended to include plural forms unless otherwise clearly stated herein. The terms “comprising,” “including,” and “having” are inclusive and thus specify the presence of features, steps, operations, elements, and / or components, but do not preclude the presence or addition of one or more other features, steps, operations, elements, components, and / or combinations thereof. The method steps, processes, and operations described herein should not be construed as requiring them to be performed in the specific order discussed or shown, unless specifically identified as such. Additional or alternative steps may be employed.

[0027] As used herein, the phrases “in one embodiment,” “according to one embodiment,” “in some embodiments,” etc., generally refer to the fact that a particular feature, structure, or characteristic following the phrase can be included in at least one embodiment of this disclosure. Therefore, a particular feature, structure, or characteristic can be included in more than one embodiment of this disclosure, such that these phrases do not necessarily refer to the same embodiment. As used herein, the terms “example,” “exemplary,” etc., are used to “serve as an example, instance, or illustration.” Any implementation, aspect, or design described herein as “example” or “exemplary” is not necessarily to be construed as preferred or superior to other implementations, aspects, or designs. Rather, the use of the terms “example,” “exemplary,” etc., is intended to present concepts in a specific manner.

[0028] Research has revealed the following drawbacks of existing technologies: The specific structure typically includes a fixed support, a simple support platform for placing the silicon rod, and a single detection sensor. Because the support platform lacks precise rotation and movement capabilities, the position and angle of the silicon rod must be manually adjusted multiple times during testing to complete the inspection of different sides. This reliance on manual intervention not only introduces human error but also leads to low testing efficiency. Furthermore, the lack of an integrated, coordinated control structure between the various components (such as the sensor and support platform) makes it difficult to guarantee the accuracy and repeatability of the entire testing process, failing to meet the demands of modern production lines for efficient and high-precision testing.

[0029] Therefore, how to solve the detection error caused by frequent adjustments to the position and angle of the silicon rod is a technical problem that urgently needs to be solved in this field.

[0030] The shortcomings of the above solutions are the result of the inventor's practical experience and careful research. Therefore, the discovery process of the above problems and the solutions proposed in this disclosure should be considered as the inventor's contribution to this disclosure.

[0031] It should be noted that similar labels and letters in the following figures indicate similar items. Therefore, once an item is defined in one figure, it does not need to be further defined and explained in subsequent figures.

[0032] The following detailed description of some embodiments of the present invention is provided in conjunction with the accompanying drawings. Unless otherwise specified, the following embodiments and features can be combined with each other.

[0033] like Figures 1 to 3As shown, some embodiments provide a solar silicon rod universal analyzer testing device, including: an operating table 1; the operating table 1 is the basic support and integrated platform of the entire device, and its core principle is to provide a rigid and stable reference surface for the precise installation and positioning of all other functional components 1. By using high-rigidity materials and aging treatment to eliminate internal stress, the operating table 1 can effectively suppress the vibration caused by the start and stop of the motor 31 and the movement of components during the operation of the device, providing a crucial static accuracy reference for high-precision testing. Its beneficial effects are: improving the overall rigidity and stability of the device, providing a unified and accurate geometric reference system for all testing actions, and fundamentally ensuring the repeatability and accuracy of the test results.

[0034] Linear feed mechanism 2 is located on the side 12 of the operating table 1. The linear feed mechanism 2 is equipped with a clamp for holding the silicon rod 6. The linear feed mechanism 2 is a key component for achieving precise axial displacement of the silicon rod 6. Its principle is to convert the rotational motion of the drive source (such as a servo motor or stepper motor) into precise linear motion. This mechanism is not only responsible for loading and unloading the silicon rod 6, but its core function is to achieve axial stepping of the silicon rod 6 during the inspection process, enabling the inspection to cover its entire length. Located on the side 12 of the operating table 1, this layout ensures that the movement path of the silicon rod 6 is parallel to the upper surface 13 of the operating table 1, guaranteeing the accuracy and consistency of the motion trajectory. Its beneficial effects are: it automates the handling and inspection displacement of the silicon rod 6, achieving high displacement accuracy and good repeatability, thus providing a foundation for the full-length, automated inspection of the silicon rod 6.

[0035] The fixture is the component that directly contacts the silicon rod 6. Its principle is to use mechanical grippers, pneumatic fingers or vacuum suction cups to ensure that the silicon rod 6 is firmly and undamaged during the handling process. The design of the fixture must avoid obstructing or scratching the surface of the silicon rod 6 to be inspected (especially the side surface). Its synergistic effect with the linear feed mechanism 2 is that the linear feed mechanism 2 provides the power and accuracy of the movement, while the fixture realizes the safe and reliable gripping of the workpiece (silicon rod 6). The two work together to complete the automated operation of "gripping-moving-placing".

[0036] The rotating mechanism 3 is located on the upper surface 13 of the operating table 1 and directly below the movement path of the fixture. It is used to receive and drive the silicon rod 6 to rotate. The rotating mechanism 3 is the core component for realizing the circumferential all-round inspection of the silicon rod 6. It is located on the upper surface 13 of the operating table 1 and is precisely aligned in space with the movement path of the linear feed mechanism 2 (directly below). This ensures that the silicon rod 6 can be accurately transferred from the handling state to the rotation inspection state. This layout constitutes the basic workflow of the equipment: upper transfer, lower rotation inspection, clear process and high space utilization. The rotating mechanism 3 and the linear feed mechanism 2 work together to form the core of the inspection station, realizing the seamless conversion of the silicon rod 6 from linear motion to rotational motion.

[0037] The rotating mechanism 3 includes a loading platform 32 and a motor 31 that drives the loading platform 32 to rotate. The loading platform 32 is the component that directly supports the silicon rod 6, and its surface characteristics are crucial. The motor 31 (usually a servo motor or stepper motor) provides power for the rotation. Its principle is that through a precision control system, the rotation angle and speed of the loading platform 32 can be precisely controlled, which is crucial for inspection: a constant rotation speed can ensure that the image captured by the image acquisition camera 5 does not experience motion blur, while precise angular position control facilitates the location of detected defects. The cooperation between the loading platform 32 and the motor 31 provides controllable and stable rotational motion, ensuring the accuracy and repeatability of data during dynamic inspection.

[0038] Infrared detector 4 is set on the right side 14 of the operating table 1, with its detection end facing the material loading platform 32 of the rotating mechanism 3. Infrared detector 4 is used to detect the temperature distribution or internal defects of silicon rod 6. Its principle is based on infrared thermal imaging technology. By receiving the infrared energy radiated from the surface of silicon rod 6, it converts it into a temperature distribution image. Internal defects such as cracks and impurities will change the local heat conduction characteristics, thus appearing as temperature anomalies on the thermal image. It is set on the right side 14 of the operating table 1 and arranged opposite to the image acquisition camera 5. This layout allows the two sensors to simultaneously acquire information about the same area of ​​silicon rod 6 from different modes, thereby realizing non-destructive testing of the internal quality of silicon rod 6. It complements surface visual inspection and provides more comprehensive quality information.

[0039] An image acquisition camera 5 is mounted on the left side 15 of the operating table 1, with its lens facing the material loading platform 32 of the rotating mechanism 3. The image acquisition camera 5 (such as a high-resolution CCD or CMOS industrial camera) is used to detect the surface quality of the silicon rod 6. Its principle is to capture optical images of the surface of the silicon rod 6 through a high-resolution lens and use image processing algorithms to identify surface defects such as scratches, chipping, and contamination. The image acquisition camera 5 can capture microscopic defects on the surface of the silicon rod 6 with high precision and high speed. Combined with the data from the infrared detector 4, the quality of the silicon rod 6 can be comprehensively evaluated.

[0040] The linear feed mechanism 2 first transfers the silicon rod 6 and places it on the loading platform 32. Then, the motor 31 drives the loading platform 32 to rotate, and the infrared detector 4 and the image acquisition camera 5 simultaneously collect data. The linear feed mechanism 2 then re-clamps the silicon rod 6, moves it along its axial direction by a preset distance, and repeats the above detection steps until the full length detection of the silicon rod 6 is completed.

[0041] The linear motion of the linear feed mechanism 2 and the rotational motion of the rotary mechanism 3 are precisely coupled in time to form a "slice detection" cycle. Each cycle detects a ring-shaped area of ​​the silicon rod 6. Through axial stepping, all the "slice" data are finally combined to obtain the complete three-dimensional quality information (surface + interior) of the entire silicon rod 6. This realizes fully automatic and unattended detection, upgrades point detection to surface detection, and integrates it into volume detection through axial scanning, which greatly improves the integrity and efficiency of the detection.

[0042] The surface of the operating table 1 is provided with an anti-slip structure 33. The principle of the anti-slip structure 33 is to increase the static friction between the loading platform 32 and the bottom surface of the silicon rod 6. When the silicon rod 6 is placed on the loading platform 32, especially when rotating at high speed, it is necessary to prevent it from sliding or shifting. Sliding will not only cause the detection position to be inaccurate, but may also scratch the surface of the silicon rod 6 or even cause a safety accident. By setting the anti-slip structure 33 on the surface of the loading platform 32, the silicon rod 6 can be stably fixed in most working conditions by relying solely on friction. It is a simple and reliable passive fixing method. The anti-slip structure 33 effectively prevents the silicon rod 6 from slipping during the rotation detection process without adding a complex active mechanism (such as a clamp), ensuring the stability and safety of the detection. The structure is simple and the cost is low.

[0043] The anti-slip structure 33 includes several annular ridges; the design principle of the annular ridges is to match the cylindrical shape of the silicon rod 6. The annular ridges can provide uniform resistance from the circumferential direction. No matter what angle the silicon rod 6 is at during rotation, the ridges can provide a consistent anti-slip effect. This is more suitable for rotational conditions than unidirectional straight lines or grid patterns, thus providing isotropic anti-slip performance. It is particularly suitable for fixing rotating operations and has good stability.

[0044] The annular convex edge is evenly distributed with teeth, and the inclination direction between adjacent teeth is opposite. The teeth can be understood as tiny ratchet structures. When the silicon rod 6 has a tendency to slide in one direction, the teeth with the inclination direction opposite to the sliding tendency will generate greater resistance. The fact that the adjacent teeth have opposite inclination directions means that no matter whether the silicon rod 6 has an occasional tendency to slide clockwise or counterclockwise (relative to the preset rotation direction), it can be effectively suppressed. Its beneficial effect is that it provides a two-way anti-slip guarantee and further enhances the reliability of fixing the silicon rod 6 under complex working conditions (such as start-stop and speed change).

[0045] The anti-slip structure 33 includes several dot-shaped protrusions; it increases friction through discrete protrusions while reducing the contact area with the silicon rod 6. This helps to reduce potential wear or contamination on the bottom surface of the silicon rod 6. The dot-shaped distribution is suitable for various shapes of workpieces, making it more versatile. In this way, it provides effective anti-slip while reducing the contact area and minimizing the impact on the workpiece surface.

[0046] The top surface of the dotted protrusions has a concave surface, which is suitable for contacting the bottom surface of the silicon rod 6. The concave surface design creates a "local envelope" effect, which can form a better line contact or small area surface contact with the cylindrical bottom surface of the silicon rod 6. Compared with planar contact, it can provide better grip. This design is similar to "corrugated" contact, which is more stable. It can increase the stability of the contact, reduce the problem of excessive pressure that may be caused by point contact, and better protect the brittle silicon rod 6.

[0047] The surface of the operating table 1 is provided with a vacuum adsorption structure 34. The vacuum adsorption structure 34 is an active fixing method. Its principle is to generate negative pressure through a vacuum pump or venturi tube, and use atmospheric pressure to firmly press the silicon rod 6 onto the surface of the material carrier 32 through the adsorption holes on the surface of the material carrier 32. This is a very reliable and efficient fixing method, especially suitable for silicon rods 6 with good surface flatness. It can be complementary or replaceable with the anti-slip structure 33. When extremely high rotational stability is required or the silicon rod 6 is heavy, vacuum adsorption is a better choice. The vacuum adsorption structure 34 provides a strong and uniform fixing force, which can completely eliminate slippage and is suitable for detection scenarios with high speed and high precision requirements.

[0048] The linear feed mechanism 2 includes a lead screw and nut structure, a gear and rack structure, or a linear motor module. The lead screw and nut structure converts the rotational motion of the motor 31 into linear motion via the lead screw and nut pair, offering advantages such as high precision and high rigidity, making it the most commonly used solution. The gear and rack structure also converts rotational motion into linear motion, suitable for applications with longer strokes, but its precision and rigidity are typically slightly lower than those of a ball screw. The linear motor module directly converts electrical energy into linear motion without any intermediate mechanical conversion link. In summary, these various adaptations provide the equipment with a variety of optional precision linear motion solutions, allowing for flexible selection based on different cost, speed, and precision requirements.

[0049] The image acquisition camera 5 is a high-resolution CCD industrial camera or a CMOS industrial camera. Specifically, CCD and CMOS are two mainstream image sensor technologies. CCD usually has the advantages of high sensitivity and low noise, while CMOS has the advantages of low power consumption, high integration, low cost and increasingly faster speed. High resolution is a prerequisite to ensure that micro-defects can be captured. Industrial cameras mean that they are robust, reliable and have standardized interfaces, making them suitable for long-term continuous operation in industrial environments.

[0050] Some embodiments also provide a silicon rod detection method, including the following steps: S1: loading and positioning step: clamping the silicon rod 6 on the fixture of the linear feed mechanism 2, and transferring the silicon rod 6 to the top of the loading platform 32 by the linear feed mechanism 2; S2: Placement and fixing steps: The linear feed mechanism 2 descends, places the silicon rod 6 on the loading platform 32, and fixes the silicon rod 6 by the anti-slip structure 33 and / or vacuum adsorption structure on the loading platform 32. S3: Rotation and Inspection Steps: Start the drive device of the rotary table mechanism to drive the material carrier 32 and silicon rod 6 to rotate; during the rotation, infrared data of silicon rod 6 is collected by infrared detector 4, and surface image data of silicon rod 6 is collected by image acquisition camera 5. S4: Data Analysis Steps: Process and analyze the collected infrared data and surface image data to generate a quality inspection report for silicon rod 6.

[0051] In summary, the present invention: By setting a high-rigidity operating table 1 as an integrated platform, precise alignment and stable support between various functional components are achieved, thereby improving the overall rigidity of the equipment and the consistency of measurement benchmarks. By setting up a precise linear feed mechanism 2 and a rotary mechanism 3, the silicon rod 6 achieves precise and controllable composite motion capability in the axial and circumferential directions, providing a core motion foundation for all-round automated inspection. By setting up symmetrically arranged infrared detectors 4 and high-resolution image acquisition cameras 5, the ability to simultaneously, rapidly, and non-destructively inspect the internal quality and surface defects of silicon rods 6 was obtained, greatly enriching the dimensions of inspection information. By setting the anti-slip structure 33 and / or the vacuum adsorption structure 34, the fixation reliability and safety of the silicon rod 6 during the high-speed rotation detection process are improved, effectively preventing measurement errors and safety risks caused by slippage. By integrating the aforementioned mechanisms and implementing the automated testing method, efficient, high-precision, fully automated, and comprehensive quality testing of solar silicon rods was finally achieved. This significantly improved testing efficiency and accuracy, reduced reliance on manpower and operational difficulty, and met the urgent need for online quality testing in large-scale solar silicon rod production lines.

[0052] In the description of the embodiments of the present invention, unless otherwise explicitly specified and limited, the terms "installation," "connection," and "linking" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral connection; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; and they can refer to the internal connection of two components. Those skilled in the art can understand the specific meaning of the above terms in the present invention based on the specific circumstances.

[0053] In the description of this invention, it should be noted that the terms "center," "upper," "lower," "left," "right," "vertical," "horizontal," "inner," and "outer," etc., indicating orientation or positional relationships, are based on the orientation or positional relationships shown in the accompanying drawings and are only for the convenience of describing the invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of the invention. Furthermore, terms such as "first," "second," and other numerical terms used herein do not imply order or sequence unless expressly indicated herein. Therefore, without departing from the teachings of the exemplary embodiments, the first element, component, region, layer, or segment discussed above may be referred to as a second element, component, region, layer, or segment.

[0054] Based on the above-described preferred embodiments of the present invention, and through the foregoing description, those skilled in the art can make various changes and modifications without departing from the inventive concept. The technical scope of this invention is not limited to the contents of the specification, but must be determined according to the scope of the claims.

Claims

1. A solar silicon rod universal analyzer testing device, characterized in that, include: Control panel (1); A linear feed mechanism (2) is provided on the front side (12) of the operating table (1), and the linear feed mechanism (2) is provided with a clamp for clamping silicon rods (6); The rotating mechanism (3) is located on the upper surface (13) of the operating table (1) and directly below the movement path of the clamp, and is used to receive and drive the silicon rod (6) to rotate. The rotating mechanism (3) includes a loading platform (32) and a motor (31) that drives the loading platform (32) to rotate. An infrared detector (4) is set on the right side (14) of the operating table (1), with its detection end facing the material platform (32) of the rotating mechanism (3); An image acquisition camera (5) is set on the left side (15) of the operating table (1), with its lens facing the loading platform (32) of the rotating mechanism (3); The linear feed mechanism (2) first transfers the silicon rod (6) and places it on the loading platform (32). Then, the motor (31) drives the loading platform (32) to rotate, and the infrared detector (4) and the image acquisition camera (5) simultaneously collect data. The linear feed mechanism (2) re-clamps the silicon rod (6), moves it along its axis by a preset distance, and repeats the above detection steps until the full length detection of the silicon rod (6) is completed.

2. The testing equipment as described in claim 1, characterized in that, The surface of the operating table (1) is provided with an anti-slip structure (33).

3. The testing equipment as described in claim 2, characterized in that, The anti-slip structure (33) includes several annular ridges.

4. The testing equipment as described in claim 3, characterized in that, The annular convex edge is provided with evenly distributed teeth, and the inclination direction between adjacent teeth is opposite.

5. The testing equipment as described in claim 2, characterized in that, The anti-slip structure (33) includes several dot-shaped protrusions.

6. The testing equipment as described in claim 5, characterized in that, The top surface of the dotted protrusions is provided with a concave surface, which is suitable for contacting the bottom surface of the silicon rod (6).

7. The testing equipment as described in claim 1, characterized in that, The surface of the operating table (1) is provided with a vacuum adsorption structure (34).

8. The testing equipment as described in claim 1, characterized in that, The linear feed mechanism (2) includes a lead screw and nut structure, a gear and rack structure, or a linear motor module.

9. The testing equipment as described in claim 1, characterized in that, The image acquisition camera (5) is a high-resolution CCD industrial camera or a CMOS industrial camera.

10. A method for detecting silicon rods using the testing equipment as described in any one of claims 1-9, characterized in that, Includes the following steps: S1: Loading and positioning steps: clamp the silicon rod (6) on the fixture of the linear feed mechanism (2), and move the silicon rod (6) to the top of the loading platform (32) through the linear feed mechanism (2); S2: Placement and fixing steps: The linear feed mechanism (2) descends to place the silicon rod (6) on the loading platform (32) and fixes the silicon rod (6) by the anti-slip structure (33) and / or vacuum adsorption structure on the loading platform (32); S3: Rotation and detection steps: Start the drive device of the rotary table mechanism to drive the material carrier (32) and the silicon rod (6) to rotate; during the rotation, the infrared data of the silicon rod (6) is collected by the infrared detector (4), and the surface image data of the silicon rod (6) is collected by the image acquisition camera (5); S4: Data analysis steps: Process and analyze the collected infrared data and surface image data to generate a silicon rod (6) quality inspection report.

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