SMB connector appearance detection mechanism

Abstract

The invention relates to the technical field of connector production, in particular to an SMB connector appearance detection mechanism, which comprises a turntable mechanism, an electric measurement mechanism, a first camera shooting detection mechanism and a second camera shooting detection mechanism, and is characterized in that a plurality of detection jigs are arranged on the turntable mechanism and are annularly and uniformly distributed on the turntable mechanism; the electrical testing mechanism comprises a first probe detection station, a second probe detection station and a third probe detection station, and is used for conducting a conductive test on a shell and a terminal of the connector; the first camera shooting detection mechanism comprises a first direction detection station and a first overturning station, the first direction detection station is used for carrying out shooting detection on the first surface of the connector, and the first overturning station is used for grabbing the connector on the detection jig, overturning the connector and then putting the connector back to the detection jig. The device is compact in structure and reasonable in layout, improves the detection precision and efficiency, reduces the operation cost, and guarantees the quality stability of products.

Description

Technical Field

[0001] This invention relates to the field of connector manufacturing technology, and in particular to an SMB connector appearance inspection mechanism. Background Technology

[0002] In existing technologies, the appearance and electrical performance inspection of SMB connectors largely relies on manual visual inspection or semi-automatic equipment at multiple stations. Manual inspection is not only inefficient and labor-intensive, but also susceptible to the subjective experience and visual fatigue of operators, leading to inconsistent inspection standards and high rates of missed or incorrect inspections. This makes it difficult to meet the consistent quality and high-speed production requirements of modern production lines. While traditional multi-station inspection equipment achieves a degree of automation, each inspection unit is often independently set up, requiring connectors to be loaded, unloaded, transferred, and positioned multiple times. This increases the complexity of the mechanism and floor space, and the accumulated errors from multiple positioning operations affect inspection accuracy. Furthermore, the transfer process reduces overall inspection efficiency. In addition, conventional visual inspection solutions typically use multiple cameras to capture images from different angles or use robotic arms to change the product's posture for multi-faceted inspection. This approach either requires complex multi-camera layouts and synchronous control or extends the inspection cycle due to mechanical movement, making it difficult to achieve efficient, comprehensive inspection of all six outer surfaces of the connector without blind spots. Especially when inspecting the four sides of the connector, additional flipping or rotating mechanisms are often required, further increasing equipment costs and control complexity. Therefore, the industry urgently needs an automated testing solution that is highly integrated, comprehensive in its detection capabilities, highly efficient, and stable in its operation, in order to address the shortcomings of existing technologies. Summary of the Invention

[0003] To address the aforementioned issues, this invention features a compact structure and rational layout, demonstrating outstanding benefits in improving detection accuracy and efficiency, reducing operating costs, and ensuring product quality stability. It provides an efficient solution for the automated quality inspection of SMB connectors, representing an SMB connector appearance inspection mechanism.

[0004] The technical solution adopted in this invention is: an SMB connector appearance inspection mechanism, including a turntable mechanism, an electrical testing mechanism, a first camera inspection mechanism, and a second camera inspection mechanism. The turntable mechanism is equipped with multiple inspection fixtures, which are evenly distributed circumferentially on the turntable mechanism. The electrical testing mechanism includes a first probe inspection station, a second probe inspection station, and a third probe inspection station for conducting conductivity tests on the connector's shell and terminals. The first camera inspection mechanism includes a first direction inspection station and a first flipping station. The first direction inspection station is used to photograph and inspect the first side of the connector, and the first flipping station is used to grip the connector on the inspection fixture, flip it, and then place it back into the inspection fixture. The second camera inspection mechanism includes a second direction inspection station, a four-sided inspection station, and a second flipping station. The second direction inspection station is used to photograph and inspect the second side of the connector, the four-sided inspection station is used to inspect the four sides of the connector, and the second flipping station is used to grip the connector on the inspection fixture, flip it, and then place it back into the inspection fixture.

[0005] A further improvement to the above solution is that the turntable mechanism includes a rotary divider, a turntable drive module, a rotating disk, and a disk support frame. The rotary divider is disposed on the surface of the frame, the turntable drive module is disposed inside the frame and is drivenly connected to the rotary divider, the rotating disk is disposed on the rotary divider, and multiple disk support frames are disposed on the frame and are evenly distributed in a circumferential direction on the frame. The top of each disk support frame is provided with a support roller, which is used to abut against the rotating disk for supporting the rotating disk.

[0006] A further improvement to the above solution is that the testing fixture includes a fixture base and a sub-fixture. The fixture base is disposed on a rotating disk, and the sub-fixture is disposed on the fixture base. The sub-fixture is provided with a positioning groove for positioning the connector. The bottom surface of the positioning groove is provided with a through hole, and one end of the through hole passes through the fixture base and the rotating disk in sequence.

[0007] A further improvement to the above scheme is that the first probe detection station includes a first probe detection bracket, a first upper test module, and a first lower test module. The first upper test module and the first lower test module are arranged opposite to each other. The first upper test module is provided with a first upper test probe group, and the first lower test module is provided with a first lower test probe group. The first upper test probe group and the first lower test probe group are respectively used to perform contact conductivity tests on the connectors on the detection fixture.

[0008] A further improvement to the above scheme is that the second probe detection station includes a second probe detection bracket, a second upper test module, a second upper test probe group, and a first probe detection camera. The second probe detection bracket is mounted on a frame, the second upper test module is mounted on the second probe detection bracket, and the second upper test probe group is mounted on the drive end of the second upper test module. The second upper test module is used to drive the second upper test probe group to move toward the first connector surface of the detection fixture for contact conductivity testing. The detection end of the first probe detection camera faces the second upper test probe group and is used to detect the probe movement position to determine the height of the terminal under test. The second upper test probe group is provided with a first probe groove, and a first probe slider is slidably mounted on the first probe groove. The first probe slider slides along the first probe groove under the action of the first upper test probe group. The first probe detection camera is used to detect the first probe slider, and a first test feature is provided on the first probe slider.

[0009] A further improvement to the above scheme is that the third probe testing station includes a third probe testing bracket, a second lower test module, a second lower test probe group, a test clamping module, and a second probe testing camera. The third probe testing bracket is mounted on a frame, the second lower test module is mounted on the second probe testing bracket, and the second lower test probe group is mounted on the drive end of the second lower test module. The second lower test module is used to drive the second lower test probe group to move toward the second surface of the connector on the testing fixture for contact conductivity testing. The detection end of the second probe testing camera faces the second lower test probe group and is used to detect the probe movement position to determine the height of the terminal under test. The second lower test probe group is provided with a second probe slide groove, and a second probe slider is slidably mounted on the second probe slide groove. The second probe slider slides along the second probe slide groove under the action of the second lower test probe group. The second probe testing camera is used to detect the second probe slider, and a second test feature is provided on the second probe slider. The test clamping module is used to clamp the connector onto the testing fixture during testing.

[0010] A further improvement to the above solution is that the first direction detection station includes a first direction detection bracket, a first direction lifting module, and a first detection camera. A first detection supplementary light is provided below the first detection camera. The first direction detection bracket is mounted on the frame, the first direction lifting module is mounted on the first direction detection bracket, and the first detection camera is mounted on the first direction lifting module. The first direction lifting module is used to drive the first detection camera to move up and down, and the first detection camera is used to photograph and detect the connector on the detection fixture.

[0011] A further improvement to the above solution is that the first flipping station includes a first flipping bracket, a first flipping clamping module, and a first flipping detection camera. The first flipping clamping module includes a first flipping lifting module and a first flipping clamping cylinder. The first flipping lifting module is mounted on the first flipping bracket, and the first flipping clamping cylinder is mounted on the first flipping lifting module. It is used to clamp and flip the connector on the detection fixture and then put it back into the detection fixture. The first flipping detection camera is mounted on the first flipping bracket and is used to detect the connector before and after flipping.

[0012] A further improvement to the above solution is that the second direction detection station includes a second direction detection bracket, a second direction lifting module, and a second detection camera. A second detection supplementary light is provided below the second detection camera. The second direction detection bracket is mounted on the frame, the second direction lifting module is mounted on the second direction detection bracket, and the second detection camera is mounted on the second direction lifting module. The second direction lifting module is used to drive the second detection camera to move up and down, and the second detection camera is used to photograph and detect the connector on the detection fixture.

[0013] A further improvement to the above solution is that the second flipping station includes a second flipping bracket, a second flipping clamping module, and a second flipping detection camera. The second flipping clamping module includes a second flipping lifting module and a second flipping clamping cylinder. The second flipping lifting module is mounted on the second flipping bracket, and the second flipping clamping cylinder is mounted on the second flipping clamping module. It is used to clamp and flip the connector on the detection fixture and then put it back into the detection fixture. The second flipping detection camera is mounted on the second flipping bracket and is used to detect the connector before and after flipping.

[0014] A further improvement to the above solution is that the four-sided inspection station includes a four-sided inspection bracket, a four-sided inspection photomask, a four-sided inspection reflector, and a four-sided inspection camera. The four-sided inspection camera is located at the top of the four-sided inspection bracket, the four-sided inspection photomask is located on the four-sided inspection bracket and below the four-sided inspection camera, the four-sided inspection reflector is located inside the four-sided inspection photomask and around the connector, and the inspection end of the four-sided inspection camera faces the four-sided inspection photomask; the four-sided inspection reflector is arranged at an angle.

[0015] The beneficial effects of this invention are: Compared to existing connector appearance inspection methods, this invention achieves efficient, accurate, and fully automated inspection of connector appearance and electrical performance through an integrated multi-station layout and intelligent inspection process. The invention employs a turntable mechanism in conjunction with multiple circumferentially distributed inspection fixtures, enabling continuous and automated inspection. Connectors flow sequentially through each station under turntable drive, effectively avoiding the time wastage and positioning errors caused by frequent loading and unloading in traditional manual or single-station inspections, greatly improving inspection efficiency. This is particularly suitable for the high-speed, continuous operation requirements of large-scale production lines. By setting up an electrical testing mechanism with three probe inspection stations, multi-point conductivity testing of the connector shell and terminals can be completed simultaneously, providing comprehensive and reliable results and effectively eliminating the risk of missed or misjudged inspections. Simultaneously, the first and second camera inspection mechanisms work together, respectively responsible for image acquisition and defect analysis of the first, second, and four sides of the connector. Combined with the automatic flipping function of the first and second flipping stations, it achieves blind-spot-free, full-coverage visual inspection of all six outer surfaces of the connector, significantly improving the detection rate and accuracy of appearance defects. The entire testing process is highly integrated and automated, significantly reducing reliance on manual operation. This not only lowers labor costs but also effectively avoids problems such as inconsistent testing standards and fatigue errors caused by human factors, ensuring the consistency and reliability of test results. This invention features a compact structure and rational layout, demonstrating outstanding benefits in improving testing accuracy and efficiency, reducing operating costs, and ensuring product quality stability, providing an efficient solution for automated quality testing of SMB connectors. Attached Figure Description

[0016] Figure 1 This is a three-dimensional schematic diagram of the SMB connector appearance inspection mechanism of the present invention; Figure 2 for Figure 1 A three-dimensional schematic diagram of the appearance inspection agency for SMB connectors from another perspective; Figure 3 for Figure 1 Front view schematic diagram of the SMB connector appearance inspection mechanism; Figure 4 for Figure 1 A three-dimensional schematic diagram of the turntable mechanism of the SMB connector appearance inspection agency; Figure 5 for Figure 1 A three-dimensional schematic diagram of the electrical testing mechanism of the SMB connector appearance inspection agency; Figure 6 for Figure 5 A three-dimensional schematic diagram of the first probe testing station of the China Electronics Measurement and Control System (CETC). Figure 7 for Figure 5A three-dimensional schematic diagram of the second probe testing station of the China Electronics Measurement and Control System (CETC). Figure 8 for Figure 5 A three-dimensional schematic diagram of the third probe testing station of the China Electronics Measurement and Control System (CETC). Figure 9 for Figure 1 A three-dimensional schematic diagram of the first camera inspection mechanism in the appearance inspection agency for SMB connectors; Figure 10 for Figure 1 A three-dimensional schematic diagram of the second camera inspection mechanism in the appearance inspection agency for SMB connectors; Figure 11 for Figure 10 A three-dimensional schematic diagram of the four inspection cameras of the second camera inspection agency in China.

[0017] Explanation of reference numerals in the attached drawings: 1. Turntable mechanism; 11. Rotary divider; 12. Turntable drive module; 13. Rotating disc; 14. Disc support frame; 14. Support roller; 141. Electrical testing mechanism 2, first probe testing station 21, first probe testing bracket 211, first upper testing module 212, first lower testing module 213, first upper probe group 214, first lower probe group 215, second probe testing station 22, second probe testing bracket 221, second upper testing module 222, second upper probe group 223, first probe slide 2231, first probe slider 2232, first probe testing camera 224, third probe testing station 23, third probe testing bracket 231, second lower testing module 232, second lower probe group 233, second probe slide 2331, second probe slider 2332, test clamping module 234, second probe testing camera 235; First camera inspection mechanism 3, first direction inspection station 31, first direction inspection bracket 311, first direction lifting module 312, first inspection camera 313, first inspection supplementary light 314, first flipping station 32, first flipping bracket 321, first flipping clamping module 322, first flipping lifting module 3221, first flipping clamping cylinder 3222, first flipping inspection camera 323; Second camera inspection mechanism 4, second direction inspection station 41, second direction inspection bracket 411, second direction lifting module 412, second inspection camera 413, second inspection supplementary light 414, four-sided inspection station 42, four-sided inspection bracket 421, four-sided inspection light cover 422, four-sided inspection reflector 423, four-sided inspection camera 424, second flipping station 43, second flipping bracket 431, second flipping clamping module 432, second flipping lifting module 4321, second flipping clamping cylinder 4322, second flipping inspection camera 433; Detection fixture 5, fixture base 51, sub-fixture 52, and positioning groove 521. Detailed Implementation

[0018] To facilitate understanding of the present invention, a more complete description will be given below with reference to the accompanying drawings. Preferred embodiments of the invention are shown in the drawings. However, the invention can be implemented in many different forms and is not limited to the embodiments described herein. Rather, these embodiments are provided to provide a thorough and complete understanding of the disclosure of the invention.

[0019] It should be noted that when a component is said to be "fixed to" another component, it can be directly attached to the other component or there may be an intervening component. When a component is said to be "connected to" another component, it can be directly connected to the other component or there may be an intervening component.

[0020] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention pertains. The terminology used herein in the description of the invention is for the purpose of describing particular embodiments only and is not intended to be limiting of the invention. Figures 1-11As shown, in one embodiment of the present invention, an SMB connector appearance inspection mechanism is disclosed, including a turntable mechanism 1, an electrical testing mechanism 2, a first camera inspection mechanism 3, and a second camera inspection mechanism 4. The turntable mechanism 1 is provided with a plurality of inspection fixtures 5, which are evenly distributed circumferentially on the turntable mechanism 1. The electrical testing mechanism 2 includes a first probe inspection station 21, a second probe inspection station 22, and a third probe inspection station 23 for conducting conductivity tests on the connector's shell and terminals. The first camera inspection mechanism 3 includes a first direction inspection station 31 and a first flipping station. 32. The first direction detection station 31 is used to photograph and inspect the first side of the connector. The first flipping station 32 is used to pick up the connector on the inspection fixture 5, flip it over, and put it back into the inspection fixture 5. The second camera inspection mechanism 4 includes a second direction detection station 41, a four-sided detection station 42, and a second flipping station 43. The second direction detection station 41 is used to photograph and inspect the second side of the connector. The four-sided detection station 42 is used to inspect the four sides of the connector. The second flipping station 43 is used to pick up the connector on the inspection fixture 5, flip it over, and put it back into the inspection fixture 5. This embodiment achieves efficient, accurate, and fully automatic inspection of the connector's appearance and electrical performance through an integrated multi-station layout and intelligent inspection process. This invention uses a turntable mechanism 1 in conjunction with multiple inspection fixtures 5 evenly distributed in a circumferential direction to achieve continuous and automated inspection process. The connector flows through each station sequentially under the drive of the turntable, effectively avoiding the time waste and positioning errors caused by frequent loading and unloading in traditional manual or single-station inspection, greatly improving inspection efficiency, and is particularly suitable for the high-speed, continuous operation requirements of large-scale production lines. By setting up an electrical testing mechanism 2 with three probe testing stations, multi-point conductivity testing of the connector shell and terminals can be completed in one go. The testing is comprehensive and the results are reliable, effectively eliminating the risk of missed detections or misjudgments. Simultaneously, the first camera inspection mechanism 3 and the second camera inspection mechanism 4 work together to acquire images and analyze defects on the first, second, and four sides of the connector, respectively. Combined with the automatic flipping function of the first flipping station 32 and the second flipping station 43, a blind-spot-free, full-coverage visual inspection of all six outer surfaces of the connector is achieved, significantly improving the detection rate and accuracy of appearance defects. The entire inspection process is highly integrated and automated, greatly reducing reliance on manual operation. This not only lowers labor costs but also effectively avoids problems such as inconsistent inspection standards and fatigue errors caused by human factors, ensuring the consistency and reliability of the inspection results. This embodiment has a compact structure and reasonable layout, demonstrating outstanding beneficial effects in improving inspection accuracy and efficiency, reducing operating costs, and ensuring product quality stability, providing an efficient solution for automated quality inspection of SMB connectors.

[0021] See Figure 4As shown, the turntable mechanism 1 includes a rotary divider 11, a turntable drive module 12, a rotating disk 13, and a disk support frame 14. The rotary divider 11 is disposed on the surface of the frame. The turntable drive module 12 is disposed inside the frame and is drivenly connected to the rotary divider 11. The rotating disk 13 is disposed on the rotary divider 11. Multiple disk support frames 14 are disposed on the frame and are evenly distributed in a circumferential direction on the frame. The top of each disk support frame 14 is provided with a support roller 141, which abuts against the rotating disk 13 to support the rotating disk 13. In this embodiment, the precision drive system, consisting of the rotary divider 11 and the turntable drive module 12, can accurately control the rotary disk 13 to perform intermittent indexing rotation, ensuring that each inspection fixture 5 can accurately stop at each preset inspection station (such as the electrical testing station or the camera station). This provides extremely high positioning repeatability for subsequent electrical performance testing and visual inspection, which is the fundamental prerequisite for achieving high-precision, automated inspection. Multiple circumferentially distributed disk support frames 14, each with a support roller 141 at its top, together form a stable auxiliary support system. This design effectively distributes the huge radial and axial loads from the rotary disk 13, the inspection fixture 5, and the workpiece under test, significantly reducing the load on the core transmission components of the rotary divider 11. This not only effectively prevents the rotary divider 11 from becoming less accurate or damaged due to long-term heavy-duty operation, but also greatly suppresses the vibration and deformation of the turntable during start-up and shutdown, ensuring the positional stability of the turntable during the static inspection phase. This creates extremely stable working conditions for high-resolution visual inspection and high-precision probe contact.

[0022] The testing fixture 5 includes a fixture base 51 and a sub-fixture 52. The fixture base 51 is mounted on a rotating disk 13, and the sub-fixture 52 is mounted on the fixture base 51. The sub-fixture 52 has a positioning groove 521 for connector positioning. A through hole is provided on the bottom surface of the positioning groove 521, and one end of the through hole passes through both the fixture base 51 and the rotating disk 13. In this embodiment, a combined structure of the fixture base 51 and the sub-fixture 52 is adopted, enhancing the modularity and maintenance convenience of the fixture system. When different models of connectors need to be tested, only the sub-fixture 52 with the corresponding positioning groove 521 needs to be replaced, without disassembling the entire fixture base 51. This greatly improves the equipment's adaptability to different products and production changeover efficiency, and reduces operating costs. The positioning groove 521 ensures that the connector maintains a precise and consistent positioning posture on the rotating disk during high-speed rotation and intermittent start-stop operation, guaranteeing accurate contact of subsequent electrical testing probes and clear visual inspection images.

[0023] See Figures 5-8As shown, the first probe testing station 21 includes a first probe testing bracket 211, a first upper testing module 212, and a first lower testing module 213. The first upper testing module 212 and the first lower testing module 213 are arranged opposite to each other. The first upper testing module 212 is provided with a first upper testing probe group 214, and the first lower testing module 213 is provided with a first lower testing probe group 215. The first upper testing probe group 214 and the first lower testing probe group 215 are respectively used to perform contact conductivity tests on the connectors on the testing fixture 5. In this embodiment, by setting the first upper testing module 212 and the first lower testing module 213 opposite to each other, and configuring the first upper testing probe group 214 and the first lower testing probe group 215 respectively, this structure can simultaneously perform synchronous contact conductivity tests on the upper and lower sides or inner and outer terminals of the connector. Compared with the traditional single-sided sequential testing, the dual-sided synchronous testing method greatly shortens the testing time of a single station and effectively improves the production cycle and efficiency of the entire testing line. More importantly, this structure ensures the precision and stability of the contact position between the probe and the connector terminal, avoiding product displacement or poor contact that may be caused by pressure applied to one side. This ensures the accuracy and consistency of the test results and provides a reliable data basis for product quality control.

[0024] The second probe testing station 22 includes a second probe testing bracket 221, a second upper testing module 222, a second upper testing probe group 223, and a first probe testing camera 224. The second probe testing bracket 221 is mounted on a frame, the second upper testing module 222 is mounted on the second probe testing bracket 221, and the second upper testing probe group 223 is mounted on the drive end of the second upper testing module 222. The second upper testing module 222 is used to drive the second upper testing probe group 223 to move toward the first connector surface of the testing fixture 5 for contact conductivity testing; the first probe testing... The detection end of the testing camera 224 faces the second upper probe group 223 and is used to detect the movement position of the probes to determine the height of the terminal under test. The second upper probe group 223 is provided with a first probe groove 2231, and a first probe slider 2232 is slidably disposed on the first probe groove 2231. The first probe slider 2232 slides along the first probe groove 2231 under the action of the first upper probe group 214. The first probe detection camera 224 is used to detect the first probe slider 2232, and a first measured feature is provided on the first probe slider 2232. This embodiment realizes in-situ, real-time detection and compensation of the connector terminal height. When the second upper module 222 drives the second upper probe group 223 to press down for contact conductivity testing, the first probe slider 2232 will slide along the first probe groove 2231 due to the contact pressure. By accurately capturing the position change of the first measured feature on the first probe slider 2232, the first probe detection camera 224 can indirectly and accurately measure the actual displacement of the probe, thereby determining the precise height of the terminal under test. It overcomes the risks of unstable probe contact pressure or poor contact caused by connector material tolerances, minor fixture positioning deviations, or terminal flatness issues. Through visual feedback, the system can confirm in real time whether the probe has achieved a preset, stable, and reliable contact state with the terminal, ensuring not only the accuracy of conductivity test data but also preventing product or probe damage caused by overvoltage or undervoltage.

[0025] The third probe testing station 23 includes a third probe testing bracket 231, a second lower test module 232, a second lower test probe group 233, a test clamping module 234, and a second probe testing camera 235. The third probe testing bracket 231 is mounted on a frame, the second lower test module 232 is mounted on the second probe testing bracket 231, and the second lower test probe group 233 is mounted on the drive end of the second lower test module 232. The second lower test module 232 is used to drive the second lower test probe group 233 to move toward the second surface of the connector of the testing fixture 5 for contact conductivity testing. The detection end of the second probe testing camera 235 faces... A second lower probe group 233 is used to detect the movement position of the probes to determine the height of the terminal under test. The second lower probe group 233 is provided with a second probe groove 2331, on which a second probe slider 2332 is slidably mounted. The second probe slider 2332 slides along the second probe groove 2331 under the action of the second lower probe group 233. A second probe detection camera 235 is used to detect the second probe slider 2332, which has a second measured feature. The test clamping module 234 is used to clamp the connector onto the test fixture 5 during testing. This embodiment, by setting the second probe detection camera 235 to monitor the second measured feature on the second probe slider 2332, also achieves accurate in-situ measurement of the height of the terminal on the second side (e.g., the bottom side) of the connector. This ensures stable and reliable contact during electrical testing from the other side of the connector, guaranteeing the consistency and accuracy of the test data from both sides, thus forming a complete bidirectional high-precision testing scheme. The innovation of this embodiment lies in the addition of the test clamping module 234. During testing, this module actively presses the connector firmly onto the testing fixture 5, counteracting the reaction force generated when the second lower test probe group 233 contacts upwards. This prevents the connector from loosening, tilting, or shifting within the fixture's positioning groove 521. This further ensures precise contact between the probes and terminals, avoiding test misjudgments or probe scratches caused by product movement, and significantly improves the stability and anti-interference capability of the entire testing mechanism under high-speed operating conditions.

[0026] See Figures 9-10As shown, the first direction detection station 31 includes a first direction detection bracket 311, a first direction lifting module 312, and a first detection camera 313. A first detection supplementary light 314 is disposed below the first detection camera 313. The first direction detection bracket 311 is mounted on the frame, the first direction lifting module 312 is mounted on the first direction detection bracket 311, and the first detection camera 313 is mounted on the first direction lifting module 312. The first direction lifting module 312 is used to drive the first detection camera 313 to move up and down, and the first detection camera 313 is used to perform image detection on the connector on the detection fixture 5. In this embodiment, by setting the first direction lifting module 312 to drive the first detection camera 313 to move up and down precisely, this station has a high degree of adaptability. The focal length and shooting angle of the camera can be flexibly adjusted to adapt to different models or different detection requirements of SMB connectors, ensuring that the clearest orthographic projection image with the least distortion can always be obtained, thereby providing high-quality source data for subsequent image analysis algorithms. Meanwhile, the first detection fill light 314 integrated below the camera plays a crucial role in optimizing illumination. It provides a stable, uniform, and shadow-free lighting environment, effectively highlighting the outline, characters, scratches, blemishes, and other appearance features of the connector surface, and greatly overcoming the interference of ambient light changes on imaging effects.

[0027] The first flipping station 32 includes a first flipping bracket 321, a first flipping clamping module 322, and a first flipping detection camera 323. The first flipping clamping module 322 includes a first flipping lifting module 3221 and a first flipping clamping cylinder 3222. The first flipping lifting module 3221 is mounted on the first flipping bracket 321, and the first flipping clamping cylinder 3222 is mounted on the first flipping lifting module 3221. These components are used to clamp and flip the connector on the inspection fixture 5 and then return it to the inspection fixture 5. The first flipping detection camera 323 is mounted on the first flipping bracket 321 and is used to detect the connector before and after flipping. In this embodiment, the precise gripping and 180-degree flipping of the connector is achieved through the coordinated action of the first flipping clamping module 322. The first flipping lifting module 3221 first drives the first flipping clamping cylinder 3222 to descend to a predetermined height, and then the clamping cylinder actuates to firmly clamp the connector. After the lifting module is raised, it performs a flipping action, ultimately placing the connector back into the positioning slot of the inspection fixture 5 in its flipped position. The automated process seamlessly connects the inspection operations of the preceding and following workstations, enabling sequential inspection of the first and second sides (or top and bottom) of the connector. Crucially, the integrated first flip inspection camera 323 provides dual verification. It confirms the initial state of the connector before flipping and provides real-time visual verification after flipping to ensure the connector is correctly gripped, the flipping angle is accurate, and the orientation is correct. This in-situ inspection mechanism effectively eliminates the risk of subsequent inspection misjudgments or equipment collisions caused by flipping failures or misplacement, significantly improving the continuity, intelligence, and operational reliability of the entire inspection process. It is a key guarantee for achieving fully automated, high-yield inspection.

[0028] The second-direction inspection station 41 includes a second-direction inspection bracket 411, a second-direction lifting module 412, and a second inspection camera 413. A second inspection supplementary light 414 is disposed below the second inspection camera 413. The second-direction inspection bracket 411 is mounted on a frame, the second-direction lifting module 412 is mounted on the second-direction inspection bracket 411, and the second inspection camera 413 is mounted on the second-direction lifting module 412. The second-direction lifting module 412 is used to drive the second inspection camera 413 to move up and down, and the second inspection camera 413 is used to perform image inspection on the connector on the inspection fixture 5. In this embodiment, the adjustable focus inspection capability driven by the second-direction lifting module 412 allows it to flexibly adapt to the inspection requirements of products of different specifications. After the connector has completed its rotation at the first rotation station 32, the second inspection camera 413 can acquire images of the product from a preset angle different from that of the first inspection camera 313. The multi-angle imaging strategy effectively overcomes the detection blind spots under a single viewpoint, allowing defects that are obscured or difficult to clearly present under the first viewpoint, such as side wall scratches, end face defects, or poor assembly at specific angles, to be exposed. Simultaneously, the integrated second detection supplementary light 414 provides targeted optimized illumination for this specific viewpoint, ensuring the contrast and clarity of image features.

[0029] The second flipping station 43 includes a second flipping bracket 431, a second flipping clamping module 432, and a second flipping detection camera 433. The second flipping clamping module 432 includes a second flipping lifting module 4321 and a second flipping clamping cylinder 4322. The second flipping lifting module 4321 is mounted on the second flipping bracket 431, and the second flipping clamping cylinder 4322 is mounted on the second flipping clamping module 432. These components are used to clamp and flip the connector on the inspection fixture 5 and then return it to the inspection fixture 5. The second flipping detection camera 433 is mounted on the second flipping bracket 431 and is used to inspect the connector before and after flipping. In this embodiment, after the first flipping station 32 has completed a 180-degree flip, a second precise flipping action is performed. Through the coordinated control of the second flipping lifting module 4321 and the second flipping clamping cylinder 4322, the second flipping clamping module 432 can clamp and flip the connector again from its current position, so that its third inspection surface faces the preset subsequent inspection station. This allows the mechanism to efficiently plan inspection paths for multiple sides of the connector without adding too many workstations, optimizing equipment layout and improving inspection efficiency. The integrated second flip inspection camera 433 continues and enhances the reliability of process control. Before flipping, the current state and posture of the connector are checked to ensure accurate grasping reference, and immediately after flipping, the flipping result and placement posture of the connector are visually confirmed in real time.

[0030] See Figure 11As shown, the perimeter inspection station 42 includes a perimeter inspection bracket 421, a perimeter inspection photomask 422, a perimeter inspection reflector 423, and a perimeter inspection camera 424. The perimeter inspection camera 424 is located at the top of the perimeter inspection bracket 421. The perimeter inspection photomask 422 is located on the perimeter inspection bracket 421 and below the perimeter inspection camera 424. The perimeter inspection reflector 423 is located inside the perimeter inspection photomask 422 and around the connector. The inspection end of the perimeter inspection camera 424 faces the perimeter inspection photomask 422. The perimeter inspection reflector 423 is obliquely arranged. In this embodiment, the obliquely arranged perimeter inspection reflector 423 surrounds the connector, forming a reflective imaging system. When the perimeter inspection camera 424 located at the top takes a picture, the sides of the connector are not directly captured by the camera lens, but are first reflected by their corresponding obliquely arranged reflectors. The reflectors deflect the side images that were originally in the horizontal direction and map them to the vertical direction, allowing the camera to simultaneously acquire the reflected images of all sides of the connector in a single exposure. The surrounding inspection photomask 422 serves to limit the field of view, shield stray ambient light, and provide a uniform illumination environment, ensuring stable image quality. This transforms the side inspection task, which originally required multiple stations or multiple motion steps, into a single, fixed station completed instantaneously via optical means.

[0031] The above embodiments merely illustrate several implementation methods of the present invention, and their descriptions are relatively specific and detailed, but they should not be construed as limiting the scope of the present invention. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of the present invention, and these all fall within the protection scope of the present invention. Therefore, the protection scope of this patent should be determined by the appended claims.

Claims

1. An SMB connector appearance inspection mechanism, characterized in that: The device includes a turntable mechanism, an electrical testing mechanism, a first camera testing mechanism, and a second camera testing mechanism. The turntable mechanism is equipped with multiple testing fixtures, which are evenly distributed in a circumferential direction on the turntable mechanism. The electrical testing mechanism includes a first probe testing station, a second probe testing station, and a third probe testing station for conducting conductivity tests on the connector's housing and terminals. The first camera inspection mechanism includes a first direction inspection station and a first flipping station. The first direction inspection station is used to inspect the first side of the connector by taking pictures. The first flipping station is used to pick up the connector on the inspection fixture, flip it over, and put it back into the inspection fixture. The second camera inspection mechanism includes a second direction inspection station, a four-sided inspection station, and a second flipping station. The second direction inspection station is used to inspect the second side of the connector by taking pictures. The four-sided inspection station is used to inspect the four sides of the connector. The second flipping station is used to pick up the connector on the inspection fixture, flip it over, and put it back into the inspection fixture.

2. The SMB connector appearance inspection mechanism according to claim 1, characterized in that: The turntable mechanism includes a rotary divider, a turntable drive module, a rotating disk, and a disk support frame. The rotary divider is disposed on the surface of the frame, the turntable drive module is disposed inside the frame and is drivenly connected to the rotary divider, the rotating disk is disposed on the rotary divider, and multiple disk support frames are disposed on the frame and are evenly distributed in a circumferential direction on the frame. The top of each disk support frame is provided with a support roller, which is used to abut against the rotating disk for supporting the rotating disk.

3. The SMB connector appearance inspection mechanism according to claim 2, characterized in that: The testing fixture includes a fixture base and a sub-fixture. The fixture base is mounted on a rotating disk, and the sub-fixture is mounted on the fixture base. The sub-fixture has a positioning groove for positioning the connector. The bottom surface of the positioning groove has a through hole, and one end of the through hole passes through the fixture base and the rotating disk in sequence.

4. The SMB connector appearance inspection mechanism according to claim 1, characterized in that: The first probe testing station includes a first probe testing bracket, a first upper test module, and a first lower test module. The first upper test module and the first lower test module are arranged opposite to each other. The first upper test module is provided with a first upper test probe group, and the first lower test module is provided with a first lower test probe group. The first upper test probe group and the first lower test probe group are respectively used to perform contact conductivity tests on the connectors on the testing fixture.

5. The SMB connector appearance inspection mechanism according to claim 4, characterized in that: The second probe detection station includes a second probe detection bracket, a second upper test module, a second upper test probe group, and a first probe detection camera. The second probe detection bracket is mounted on the frame, the second upper test module is mounted on the second probe detection bracket, and the second upper test probe group is mounted on the drive end of the second upper test module. The second upper test module is used to drive the second upper test probe group to move toward the first connector surface of the detection fixture to make contact with the conductivity test. The detection end of the first probe detection camera faces the second upper probe group and is used to detect the movement position of the probe to determine the height of the terminal under test; the second upper probe group is provided with a first probe slide groove, and a first probe slider is slidably disposed on the first probe slide groove. The first probe slider slides along the first probe slide groove under the action of the first upper probe group. The first probe detection camera is used to detect the first probe slider, and a first measured feature is disposed on the first probe slider.

6. The SMB connector appearance inspection mechanism according to claim 5, characterized in that: The third probe testing station includes a third probe testing bracket, a second lower test module, a second lower test probe group, a test clamping module, and a second probe testing camera. The third probe testing bracket is mounted on the frame, the second lower test module is mounted on the second probe testing bracket, and the second lower test probe group is mounted on the drive end of the second lower test module. The second lower test module is used to drive the second lower test probe group to move toward the second surface of the connector of the testing fixture to contact the conductive test. The detection end of the second probe detection camera faces the second lower probe group and is used to detect the probe movement position to determine the height of the terminal under test; the second lower probe group is provided with a second probe slide groove, and a second probe slider is slidably provided on the second probe slide groove. The second probe slider slides along the second probe slide groove under the action of the second lower probe group. The second probe detection camera is used to detect the second probe slider, and a second feature under test is provided on the second probe slider. The test clamping module is used to clamp the connector onto the test fixture during testing.

7. The SMB connector appearance inspection mechanism according to claim 1, characterized in that: The first direction detection station includes a first direction detection bracket, a first direction lifting module, and a first detection camera. A first detection supplement light is provided below the first detection camera. The first direction detection bracket is mounted on the frame, the first direction lifting module is mounted on the first direction detection bracket, and the first detection camera is mounted on the first direction lifting module. The first direction lifting module is used to drive the first detection camera to move up and down, and the first detection camera is used to photograph and detect the connector on the detection fixture.

8. The SMB connector appearance inspection mechanism according to claim 7, characterized in that: The first flipping station includes a first flipping bracket, a first flipping clamping module, and a first flipping detection camera. The first flipping clamping module includes a first flipping lifting module and a first flipping clamping cylinder. The first flipping lifting module is mounted on the first flipping bracket, and the first flipping clamping cylinder is mounted on the first flipping lifting module. It is used to clamp and flip the connector on the detection fixture and then put it back into the detection fixture. The first flipping detection camera is mounted on the first flipping bracket and is used to detect the connector before and after flipping.

9. The SMB connector appearance inspection mechanism according to claim 1, characterized in that: The second direction inspection station includes a second direction inspection bracket, a second direction lifting module, and a second inspection camera. A second inspection supplement light is provided below the second inspection camera. The second direction inspection bracket is mounted on the frame, the second direction lifting module is mounted on the second direction inspection bracket, and the second inspection camera is mounted on the second direction lifting module. The second direction lifting module is used to drive the second inspection camera to move up and down, and the second inspection camera is used to photograph and inspect the connector on the inspection fixture. The second flipping station includes a second flipping bracket, a second flipping clamping module, and a second flipping detection camera. The second flipping clamping module includes a second flipping lifting module and a second flipping clamping cylinder. The second flipping lifting module is mounted on the second flipping bracket, and the second flipping clamping cylinder is mounted on the second flipping clamping module. It is used to clamp and flip the connector on the detection fixture and then put it back into the detection fixture. The second flipping detection camera is mounted on the second flipping bracket and is used to detect the connector before and after flipping.

10. The SMB connector appearance inspection mechanism according to claim 9, characterized in that: The four-sided inspection station includes a four-sided inspection bracket, a four-sided inspection photomask, a four-sided inspection reflector, and a four-sided inspection camera. The four-sided inspection camera is located at the top of the four-sided inspection bracket. The four-sided inspection photomask is located on the four-sided inspection bracket and below the four-sided inspection camera. The four-sided inspection reflector is located inside the four-sided inspection photomask and around the connector. The inspection end of the four-sided inspection camera faces the four-sided inspection photomask. The four-sided inspection reflector is set at an angle.

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