A PCBA aging test platform
By integrating high-temperature environment and mechanical stress testing into a PCBA aging test platform, the problem of simulating composite stress in existing technologies has been solved, achieving efficient and safe aging testing.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2026-01-19
- Publication Date
- 2026-04-03
AI Technical Summary
Existing PCBA aging test methods cannot effectively simulate mechanical stress, resulting in inconsistent test results and long cycles. It is difficult to simultaneously simulate the real working conditions of multiple stress coupling of heat, electricity and mechanical stress at high temperatures.
A PCBA aging test platform was designed, which integrates high-temperature environment testing, high-temperature continuous pressure testing, and high-temperature bending deformation testing. The platform is automatically executed through staged drive components to simulate the composite stress conditions of PCBA in real use.
It achieves integrated and automated composite aging testing, significantly improving the authenticity and comprehensiveness of the test, shortening the test cycle, and improving test efficiency and safety.
Smart Images

Figure CN121541029B_ABST
Abstract
Description
Technical Field
[0001] This invention relates to the field of testing equipment technology, specifically to a PCBA aging test platform. Background Technology
[0002] As electronic products evolve towards higher density and higher reliability, the performance stability of printed circuit board assemblies (PCBAs) during long-term use is crucial. Aging testing is a key step in assessing PCBA reliability and screening for early failures, as it simulates high temperatures to accelerate the exposure of potential product defects.
[0003] Currently, conventional PCBA aging tests primarily focus on applying single environmental stresses. The most common is high-temperature aging testing, which places the PCBA in a constant-temperature chamber or test platform and conducts long-term power-on tests at continuous high temperatures to examine the electrical performance and lifespan of components and solder joints under thermal load. However, in actual use, PCBAs not only endure thermal stress but also often experience continuous static pressure or intermittent dynamic bending stress due to installation tightening, chassis deformation, or external impacts. These mechanical stresses can lead to faults such as solder joint cracking, circuit breakage, and poor connector contact, which cannot be adequately simulated by high-temperature aging tests.
[0004] In existing technologies, aging tests simulating mechanical stress typically employ the following method: step-by-step independent testing: first, static electrical performance testing is performed in a high-temperature environment, and then the PCBA is moved to another dedicated device (such as a three-point bend or four-point bend testing machine) for bending or pressure testing. This method is cumbersome, has a long testing cycle, and the transfer of PCBA between different devices may introduce damage or contact errors, affecting the consistency of test results. Furthermore, it is difficult to simultaneously simulate the real-world working conditions of multiple stress couplings (thermal, electrical, and mechanical) during aging tests. Summary of the Invention
[0005] To address the shortcomings of existing technologies, this invention provides a PCBA aging test platform, which solves the problems mentioned in the background art.
[0006] To achieve the above objectives, the present invention provides the following technical solution:
[0007] A PCBA aging test platform, comprising:
[0008] Side frames, located on both sides of the circuit board, are used to support the circuit board;
[0009] A force-bearing plate is located directly above the circuit board, and test heads are provided on both sides of the force-bearing plate;
[0010] A pressure plate, located directly below the circuit board, has a stepped drive component below it, which can apply two levels of pressure via a telescopic drive component below it; and
[0011] The retractable component is located on both sides of the staged drive component and is used to connect the staged drive component and the side frame.
[0012] In the two-stage pressure test, the first stage pressure is used to lift the circuit board with the pressure plate until the test head contacts the circuit board with a preset pressure, and after waiting for the required time, the first stage of electrical performance test is performed.
[0013] The second stage of pressure is used to control the staged drive component to drive the inner component to pull the side frame, forming a state where the side frame squeezes the circuit board. The circuit board is squeezed and bent, and after waiting for the required time, it resets. The test head then performs the second stage of electrical performance testing.
[0014] Furthermore, the staged drive component includes:
[0015] A thrust cylinder, which is fixedly connected to the output end of the telescopic drive component;
[0016] The lifting rod has its lower end confined within the thrust cylinder and is fixed with a spring between itself and the lower end of the thrust cylinder. The upper end of the lifting rod is fixed to the pressure plate. When the thrust cylinder moves upward, pressure is applied to the lifting rod through the spring.
[0017] A first limiting plate, the height of which is fixed, and a second limiting plate that mates with the first limiting plate on the lifting rod; and
[0018] The switching body is located on both sides of the thrust cylinder. When the first stage of pressure is applied to the thrust cylinder, the thrust cylinder pushes the lifting rod upward through a spring; when the second stage of pressure is applied to the thrust cylinder, a pulling force is applied to the inward retractor.
[0019] The PCBA aging test platform also includes a lifting component for lifting the stressed plate when the second stage of pressure is applied.
[0020] Furthermore, the switching body includes: a slider and a switching cylinder.
[0021] The slider is fixed to the outer surface of the thrust cylinder;
[0022] The switching cylinder is sleeved around the thrust cylinder. The inner wall of the switching cylinder has a vertical groove along the axial direction. The upper end of the vertical groove has a spiral groove. The length of the vertical groove is equal to the axial movement of the lifting rod when the first stage pressure is applied to the thrust cylinder. The switching cylinder rotates when the slider passes through the spiral groove.
[0023] The inner retractor pushes and pulls the side frame by the rotational torque of the switching cylinder.
[0024] Furthermore, the internal receiver includes:
[0025] A rotating disk, concentric with the switching cylinder, has an eccentric connecting rod rotatably mounted on it. A second connecting rod is rotatably mounted at the other end of the first connecting rod, and the other end of the second connecting rod is fixed to a side frame via a mounting base.
[0026] Guide sleeve, the guide sleeve is used to guide the connecting rod 2.
[0027] Furthermore, the internal receiver includes:
[0028] Gear, the gear being fixed to the switching cylinder; and
[0029] The toothed plate has one end fixedly connected to the opposite side frame via an assembly frame, and the toothed plate meshes with the gear.
[0030] Furthermore, the lifting component includes:
[0031] A threaded rod, wherein the threaded rod is threadedly connected to a load-bearing plate; and
[0032] The vertical shaft is located on one side of the side frame. A belt structure is provided between the lower part of the vertical shaft and the switching cylinder, and a belt structure is provided between the upper part of the vertical shaft and the threaded rod.
[0033] Furthermore, the switching entity includes:
[0034] A horizontal arm, fixed to both sides of the thrust cylinder, with a second slider slidably mounted laterally on the horizontal arm; and
[0035] The fixed frame is a fixed structure. The lower part of the fixed frame is provided with a vertical groove two that is adapted to the slider two, and the upper part is provided with an inclined groove that communicates with the vertical groove two.
[0036] The inner component includes a pull rod, one end of which is fixed to the second slider, and the other end is fixed to the side frame through a mounting base.
[0037] Furthermore, the lifting component includes:
[0038] L-shaped rods are installed on both sides of the load-bearing plate;
[0039] A wedge-shaped block, slidably disposed above an L-shaped rod, and an L-shaped connecting frame fixed between the wedge-shaped block and the side frame; and
[0040] Spring 2 is mounted on the upper surface of the force-bearing plate.
[0041] Furthermore, it also includes a liftable upper cover, on which a hot air duct is provided, and a temperature sensor for detecting temperature is provided inside the profile frame.
[0042] Furthermore, the test head is an elastic contact type detection head.
[0043] The present invention has the following beneficial effects:
[0044] (1) The PCBA aging test platform realizes the integration and automation of composite aging test: the platform integrates high temperature environment test, high temperature continuous pressure test and high temperature bending deformation test into one device, and automatically executes them sequentially through staged drive components. This simulates the severe composite stress conditions that PCBA may experience in real use, significantly improves the authenticity and comprehensiveness of aging test, and can more effectively screen out potential defects.
[0045] (2) This PCBA aging test platform improves testing efficiency and operational safety. Through two strokes of a telescopic drive component, it automatically and continuously switches between test modes from pressurized contact to lateral extrusion bending. The entire process requires no manual intervention or disassembly of the circuit board under test, greatly shortening the test cycle and improving testing efficiency. At the same time, since the test process is carried out automatically within a closed or near-closed profile frame, the risk of operators coming into contact with high-temperature components and mechanical moving parts is reduced, making operation safer.
[0046] Of course, any product implementing this invention does not necessarily need to achieve all of the advantages described above at the same time. Attached Figure Description
[0047] Figure 1 This is a perspective view of the present invention;
[0048] Figure 2 For the present invention Figure 1 A diagram showing the parts before the cap is assembled;
[0049] Figure 3 This is a schematic diagram of the internal structure of the profile outer frame in Embodiment 1 of the present invention;
[0050] Figure 4 For the present invention Figure 3 Enlarged view of area A;
[0051] Figure 5 This is a diagram showing the placement of a single circuit board within the profile frame in Embodiment 1 of the present invention;
[0052] Figure 6 For the present invention Figure 5 Exploded view;
[0053] Figure 7 This is a front view of the circuit board placed within the profile frame in Embodiment 1 of the present invention;
[0054] Figure 8 This is a bottom view of the side frame of the present invention;
[0055] Figure 9 For the present invention Figure 6 A magnified view of a portion of the image;
[0056] Figure 10 This is a top view of the inner component in Embodiment 1 of the present invention;
[0057] Figure 11 for Figure 10 A diagram showing the state of the rotating disk after it has rotated.
[0058] Figure 12 This is a cross-sectional view of the switching cylinder in Embodiment 1 of the present invention;
[0059] Figure 13 This is an exploded view of the telescopic drive component, thrust cylinder, and switching cylinder in Embodiment 1 of the present invention;
[0060] Figure 14 This is a schematic diagram of the internal structure of the thrust cylinder of the present invention;
[0061] Figure 15 This is an assembly diagram of the test head of the present invention;
[0062] Figure 16 This is a schematic diagram of the internal component using gears and racks in Embodiment 1 of the present invention;
[0063] Figure 17 This is a schematic diagram of the lifting member, the retracting member, and the staged drive member in Embodiment 2 of the present invention.
[0064] Figure 18 For the present invention Figure 17 Enlarged view of area B.
[0065] In the diagram, 1. Test bench; 2. Upper cover; 3. Bracket; 4. Profile frame; 5. Load-bearing plate; 6. Test head; 7. Lifting component; 71. Belt structure one; 72. Vertical shaft; 73. Belt structure two; 74. Threaded rod; 75. L-shaped connecting frame; 76. L-shaped rod; 77. Wedge block; 78. Spring two; 8. Inner retractor; 81. Rotary disk; 82. Guide sleeve; 83. Connecting rod one; 84. Connecting rod two; 85. Assembly seat; 86. Tooth plate; 87. Assembly frame; 88. Gear; 89. Tie rod; 9. Staged drive component; 91. Lifting rod; 911. Guide head; 92. Thrust cylinder; 93. Spring 1; 94. Limiting plate 1; 95. Limiting plate 2; 96. Switching main body; 961. Switching cylinder; 962. Vertical groove 1; 963. Spiral groove; 964. Slider 1; 9601. Flat arm; 9602. Fixed frame; 9603. Vertical groove 2; 9604. Inclined groove; 9605. Slider 2; 10. Cylinder 1; 11. Cooling fan; 12. Hot air pipe; 14. Upper crossbeam; 15. Pressure plate; 16. Circuit board; 17. Lower crossbeam; 171. Guide rail; 172. Slider 3; 18. Side frame; 181. Slot; 19. Longitudinal beam; 20. Telescopic drive component; 21. Platform. Detailed Implementation
[0066] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.
[0067] In the description of this invention, it should be understood that the terms "opening", "upper", "lower", "thickness", "top", "middle", "length", "inner", "around", etc., which indicate orientation or positional relationship, are only for the convenience of describing this invention and simplifying the description, and do not indicate or imply that the components or elements referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as limiting this invention.
[0068] The following is based on Figures 1-18 This invention describes the PCBA aging test platform provided in an embodiment of the invention.
[0069] Example 1, see Figures 1-3This invention provides a PCBA aging test platform, including a test bench 1, a profile frame 4 on the test bench 1, a test mechanism located inside the profile frame 4, an upper cover 2 located above the profile frame 4, and a cylinder 10 mounted directly above the test bench 1 via a bracket 3. The upper cover 2 is installed at the lower end of the piston rod of the cylinder 10, so that the upper cover 2 can be raised and lowered. When the upper cover 2 rises and detaches from the profile frame 4, it is convenient for the operator to place the PCBA to be tested on the test mechanism. When the upper cover 2 descends, it can create a near-sealed space inside the profile frame 4.
[0070] Preferably, an upper crossbeam 14 and a lower crossbeam 17 are also provided inside the profile frame 4 to support the testing mechanism.
[0071] Preferably, a hot air duct 12 is also installed on the upper cover 2 to provide hot air into the profile frame 4 so that the testing mechanism can test the electrical performance of the PCBA under high temperature, which is the initial test under temperature influence.
[0072] Furthermore, a temperature sensor is also provided inside the profile frame 4 to detect the temperature and obtain the temperature that the PCBA is subjected to in real time.
[0073] In addition, a cooling fan 11 is installed on one side of the profile frame 4 to quickly reduce the temperature of the PCBA when cooling is required.
[0074] To ensure that circuit board 16 can withstand high temperatures and, after initial testing, also exhibit electrical performance after high-temperature pre-loading and high-temperature pre-bending, please refer to [reference needed]. Figures 3-7 The testing mechanism in this embodiment of the invention includes a side frame 18, a force plate 5, a pressure plate 15, a staged drive component 9, and an inner retractor 8.
[0075] Specifically, multiple sets of side frames 18 are provided, with each pair of side frames 18 capable of supporting one circuit board 16. These two sets of side frames 18 are distributed on both sides of the circuit board 16 to support both sides of the circuit board 16. The force plate 5 is located directly above the circuit board 16, and test heads 6 are provided on both sides of the force plate 5. The pressure plate 15 is located directly below the circuit board 16. A staged drive component 9 is provided below the pressure plate 15. The staged drive component 9 can apply two stages of pressure through the telescopic drive component 20 below it. The retractable component 8 is located on both sides of the staged drive component 9 and is used to connect the staged drive component 9 and the side frame 18.
[0076] Preferably, the inner side of the side frame 18 is provided with a slot 181 for holding the two sides of the circuit board 16.
[0077] The two pressure stages mentioned above, the first stage of pressure is used to lift the circuit board 16 with the pressure plate 15 until the test head 6 contacts the circuit board 16 with a preset pressure, and after waiting for the required time, the first stage of electrical performance test is carried out (the time of the first stage of electrical performance test is after the above initial test).
[0078] The second stage of pressure is used to control the staged drive component 9 to drive the inner retractor 8 to pull the side frame 18, forming a state where the side frame 18 squeezes the circuit board 16. The circuit board 16 is squeezed and bent, and after waiting for the required time, it resets. The test head 6 performs the second stage of electrical performance testing (the time of the second stage of electrical performance testing is after the first stage of electrical performance testing mentioned above).
[0079] Therefore, the PCBA aging test platform provided in this embodiment of the invention can not only test the electrical performance of PCBA under high temperature, but also test the electrical performance after high temperature pre-pressing and high temperature pre-bending through the action of the staged drive component 9 and the inward component 8. Furthermore, the process of switching from high temperature pre-pressing to high temperature pre-bending does not require any extra operations, resulting in high testing efficiency.
[0080] Optionally, the telescopic drive component 20 can be a cylinder, a hydraulic cylinder, or an electric telescopic rod.
[0081] It should be noted that a guide rail 171 is provided on the upper surface of the lower crossbeam 17, and a slider 172 is installed on the lower surface of the side frame 18 to guide the side frame 18 when it moves laterally.
[0082] See Figures 5-14 The aforementioned staged drive component 9 includes a thrust cylinder 92, a lifting rod 91, a limiting plate 94, and a switching body 96.
[0083] The thrust cylinder 92 is fixedly connected to the output end of the telescopic drive 20, so that when the telescopic drive 20 extends, it can push the thrust cylinder 92 upward. The lower end of the lifting rod 91 is limited inside the thrust cylinder 92 by the guide head 911, and a spring 93 is fixed between the lifting rod 91 and the lower end of the thrust cylinder 92. The upper end of the lifting rod 91 is fixedly connected to the pressure plate 15. When the thrust cylinder 92 moves upward, it can apply pressure to the lifting rod 91 through the spring 93. This pressure is divided into two stages. When the first stage of pressure is applied, the lifting rod 91 is pushed upward by the spring 93, so that the lifting rod 91 can make the pressure plate 15 lift the circuit board 16 until the test head 6 contacts the circuit board 16 with a preset pressure. When the second stage of pressure is applied to the thrust cylinder 92, the lifting rod 91 no longer rises. This stage of force is converted into a pulling force applied to the inward retractor 8, which can pull the two side frames 18.
[0084] The aforementioned switching body 96 is located on both sides of the thrust cylinder 92. It is used to switch whether the lifting rod 91 rises or not. This is characterized by the fact that the switching body 96 is used to switch the direction of the force generated by the first stage pressure and the second stage pressure on the staged drive member 9.
[0085] Preferred options, please refer to Figures 12-14 To prevent the lifting rod 91 from continuously rising when the second stage of pressure is applied to the thrust cylinder 92, the height of the limiting plate 94 is kept constant (it is fixed on the switching cylinder 961, which will be described below). The lifting rod 91 is provided with a limiting plate 95 that cooperates with the limiting plate 94. When the first stage of pressure is applied, the lifting rod 91 moves the limiting plate 95 to a position close to the limiting plate 94. When the second stage of pressure is applied, the limiting plate 95 is blocked by the limiting plate 94 and cannot continue to rise. The thrust cylinder 92, which continues to rise under pressure, can continue to compress the spring 93 and ensure that the lifting rod 91 no longer rises, that is, the pressure plate 15 no longer rises, thus avoiding the situation where the pressure plate 15 continues to rise and causes the blocking circuit board 16 to bend.
[0086] Furthermore, to prevent the load-bearing plate 5 from arching upwards when the circuit board 16 is bent, the PCBA aging test platform here also includes a lifting member 7 for lifting the load-bearing plate 5 when the second stage of pressure is applied.
[0087] See Figures 12-14 To achieve the switching function of the aforementioned switching body 96, the switching body 96 is configured with a first structure. The switching body 96 includes a slider 964 and a switching cylinder 961. The slider 964 is fixed to the outer surface of the thrust cylinder 92, and the switching cylinder 961 is sleeved around the thrust cylinder 92. The inner wall of the switching cylinder 961 has a vertical groove 962 along the axial direction, and the upper end of the vertical groove 962 has a spiral groove 963. The length of the vertical groove 962 is equal to the axial movement of the lifting rod 91 when the first stage of pressure is applied to the thrust cylinder 92. The switching cylinder 961 rotates when the slider 964 passes through the spiral groove 963.
[0088] In this implementation scheme, ① when the telescopic drive 20 outputs the first pressure stroke, it pushes the thrust cylinder 92 upward for the first stroke. At this time, the slider 964 slides in the vertical groove 962, and the thrust cylinder 92 can compress the spring 93, causing the lifting rod 91 and the pressure plate 15 to apply pressure to the circuit board 16. When the slider 964 reaches the upper end of the vertical groove 962, the pressure stroke ends, and the test head 6 contacts the circuit board 16 with a preset pressure, waits for the required time, and then the test head 6 begins the first stage of testing. ② When the telescopic drive 20 outputs the second pressure stroke, it pushes the thrust cylinder 92 to move upward for the second stroke. At this time, the slider 964 slides in the spiral groove 963 (at this time, the thrust cylinder 92 continues to compress the spring 93, but due to the action of the limit plate 94 and the limit plate 95, the lifting rod 91 no longer rises), causing the switching cylinder 961 to rotate to the required angle. The aforementioned retractable part 8 pushes and pulls the side frame 18 through the rotational torque of the switching cylinder 961, realizing that the side frame 18 squeezes the circuit board 16 to bend and deform. After bending and deforming, wait for the required time, and then control the telescopic drive 20 to move downward again. This movement stroke is the distance of the first stroke plus the distance of the second stroke, that is, the distance to reset each component to the initial state. At this time, the test head 6 begins to perform the second stage of testing.
[0089] It should be noted that test head 6 is a resilient contact type detection head, such as a spring-loaded contact head or a spring-loaded contact head. (See [reference needed]). Figure 15 It is a spring type. When the circuit board 16 bends and deforms, it pushes the test head 6 upward so that the test head 6 does not block the deformation of the circuit board 16.
[0090] See Figure 7 , Figures 9-11 To enable the retractable component 8 to push and pull the side frame 18 via the rotational torque of the switching cylinder 961, the retractable component 8 includes a rotating disk 81 and a guide sleeve 82, with the rotating disk 81 concentric with the switching cylinder 961. In this embodiment, the rotating disk 81 and the switching cylinder 961 are integrally formed. An eccentric connecting rod 83 is rotatably mounted on the rotating disk 81, and a connecting rod 84 is rotatably mounted at the other end of the connecting rod 83. The other end of the connecting rod 84 is fixed to the side frame 18 via a mounting base 85, and the guide sleeve 82 guides the connecting rod 84.
[0091] It should be noted that the guide sleeve 82 is fixedly installed on the lower crossbeam 17.
[0092] In this embodiment, when the switching cylinder 961 rotates to the required angle, the first connecting rod 83 can pull or push the side frame 18 through the second connecting rod 84.
[0093] This embodiment also provides another structure for the internal component 8, see [link / reference]. Figure 16The inner component 8 includes a gear 88 and a toothed plate 86. The gear 88 is fixed on the switching cylinder 961. One end of the toothed plate 86 is fixed to the opposite side frame 18 through the mounting bracket 87. The toothed plate 86 meshes with the gear 88.
[0094] See Figure 6 and Figure 7 The aforementioned lifting component 7 includes a threaded rod 74 and a vertical shaft 72. The threaded rod 74 is threadedly connected to the force plate 5. The vertical shaft 72 is located on one side of the side frame 18. A belt structure 71 is provided between the lower part of the vertical shaft 72 and the switching cylinder 961, and a belt structure 73 is provided between the upper part of the vertical shaft 72 and the threaded rod 74.
[0095] In this embodiment, when the switching cylinder 961 rotates to the required angle, it can drive the vertical shaft 72 to rotate through the belt structure 1 71. The rotation of the vertical shaft 72 can drive the threaded rod 74 to rotate through the belt structure 2 73, thereby enabling the threaded rod 74 to raise the force plate 5.
[0096] It should be noted that a longitudinal beam 19 is installed on the lower surface of the upper crossbeam 14, and the upper end of the threaded rod 74 is rotatably installed on the longitudinal beam 19.
[0097] When using it, the steps are as follows:
[0098] Step 1: Loading. First, insert the circuit board 16 into the slot 181 from the front of the profile frame 4 (at this time, the test head 6 has been pressed on the test point due to the elasticity), and control the upper cover 2 to cover the profile frame 4 through the cylinder 10.
[0099] Step 2, Initial Test. Hot air is blown into the outer frame 4 of the profile through the hot air pipe 12 to heat the circuit board 16. After the required heating time, its electrical performance is tested through the test head 6.
[0100] Step 3, First Stage Test. The telescopic drive 20 outputs the first pressure stroke, pushing the thrust cylinder 92 upward for the first stroke. At this time, the slider 964 slides in the vertical groove 962. The thrust cylinder 92 can compress the spring 93, and the lifting rod 91 and pressure plate 15 apply pressure to the circuit board 16. When the slider 964 reaches the upper end of the vertical groove 962, the pressure stroke ends. The test head 6 contacts the circuit board 16 with a preset pressure and waits for the required time. At this time, the test head 6 begins the first stage test.
[0101] Step 4, Second Stage Test. The telescopic drive 20 outputs a second pressure stroke, pushing the thrust cylinder 92 upward for a second stroke. At this time, the slider 964 slides within the spiral groove 963 (at this time, the thrust cylinder 92 continuously compresses the spring 93, but due to the action of the limiting plate 94 and the limiting plate 95, the lifting rod 91 no longer rises), causing the switching cylinder 961 to rotate to the required angle. When the switching cylinder 961 rotates, it will produce the following two actions: First, the inward retraction component 8 controls the two side frames 18 to move closer to each other, so that the side frames 18 squeeze the circuit board 16 and bend and deform; Second, the lifting component 7 controls the force plate 5 to rise. After the circuit board 16 bends and deforms, wait for the required time, and then control the telescopic drive 20 to move downward again. This movement stroke is the distance of the first stroke plus the second stroke, so that all components are reset to the initial state. At this time, the test head 6 begins the second stage test.
[0102] Example 2, see Figure 17 and Figure 18 The difference between this embodiment and Embodiment 1 lies in the switching body 96, the retracting component 8, and the lifting component 7. In this embodiment, the switching body 96 has a second structure. The switching body 96 includes a horizontal arm 9601 and a fixed frame 9602. The horizontal arm 9601 is fixed to both sides of the thrust cylinder 92, and a second slider 9605 is laterally slidably mounted on the horizontal arm 9601. The fixed frame 9602 is a fixed structure, fixed to the lower crossbeam 17. The lower part of the fixed frame 9602 is provided with a vertical groove 9603 adapted to the second slider 9605, and the upper part is provided with an inclined groove 9604 communicating with the vertical groove 9603. The retracting component 8 includes a pull rod 89. One end of the pull rod 89 is fixed to the second slider 9605, and the other end is fixed to the side frame 18 through the mounting base 85.
[0103] It should be noted that in this embodiment, the limiting plate 94 is fixed on the fixed frame 9602.
[0104] ① When the telescopic drive 20 outputs the first pressure stroke, it pushes the thrust cylinder 92 to move upward for the first stroke. The slider 9605 slides in the vertical groove 9603. The thrust cylinder 92 can compress the spring 93 and make the lifting rod 91 and the pressure plate 15 apply pressure to the circuit board 16. When the slider 9605 reaches the upper end of the vertical groove 9603, the pressure stroke ends. The test head 6 contacts the circuit board 16 with a preset pressure and waits for the required time. At this time, the test head 6 begins the first stage of testing. ② When the telescopic drive 20 outputs the second pressure stroke, it pushes the thrust cylinder 92 upward for the second stroke. At this time, the second slider 9605 slides in the inclined groove 9604 (at this time, the thrust cylinder 92 continuously compresses the first spring 93, but due to the action of the first limit plate 94 and the second limit plate 95, the lifting rod 91 no longer rises), and pulls the two second sliders 9605 to slide relative to each other on the flat arm 9601. Then, the two second sliders 9605 can pull the side frame 18 through the pull rod 89, realizing the bending deformation of the circuit board 16 by the side frame 18. After bending deformation, wait for the required time, and then control the telescopic drive 20 to move downward again. This movement stroke is the distance of the first stroke plus the second stroke. Even if all components are reset to the initial state, the test head 6 starts the second stage of testing.
[0105] See Figure 17 In this embodiment, a lifting member 7 adapted to the aforementioned switching body 96 and retractable member 8 is also provided. The lifting member 7 includes an L-shaped rod 76, a wedge block 77, and a second spring 78. One end of the second spring 78 is installed on the upper surface of the force plate 5, and the other end is fixedly connected to the upper crossbeam 14. The L-shaped rod 76 is installed on both sides of the force plate 5. An L-shaped connecting frame 75 is fixed between the wedge block 77 and the side frame 18. The wedge block 77 is slidably disposed above the L-shaped rod 76.
[0106] In this embodiment, when the two side frames 18 are not initially close to each other, the position of the wedge block 77 will not change, and it can apply pressure to the force plate 5 with a fixed pressure. In this state, the second spring 78 is in a stretched state. When the two side frames 18 approach each other, the two L-shaped rods 76 drive the two wedge blocks 77 to approach each other, and then their pressure on the force plate 5 decreases. The second spring 78 rebounds upward, driving the force plate 5 to move upward, thereby lifting the force plate 5 upward.
[0107] When using it, the steps are as follows:
[0108] Step 1: Loading. First, insert the circuit board 16 into the slot 181 from the front of the profile frame 4 (at this time, the test head 6 has been pressed on the test point due to the elasticity), and control the upper cover 2 to cover the profile frame 4 through the cylinder 10.
[0109] Step 2, Initial Test. Hot air is blown into the outer frame 4 of the profile through the hot air pipe 12 to heat the circuit board 16. After the required heating time, its electrical performance is tested through the test head 6.
[0110] Step 3, First Stage Test. Pushing the thrust cylinder 92 upwards for the first stroke, slider 9605 slides within vertical groove 9603. The thrust cylinder 92 compresses spring 93, causing the lifting rod 91 and pressure plate 15 to apply pressure to circuit board 16. When slider 9605 reaches the upper end of vertical groove 9603, the pressure stroke ends. Test head 6 contacts circuit board 16 with a preset pressure and waits for the required time. At this point, test head 6 begins the first stage of the test.
[0111] Step 4, Second Stage Test. When the telescopic drive 20 outputs the second pressure stroke, it pushes the thrust cylinder 92 upward for the second stroke. At this time, the second slider 9605 slides in the inclined groove 9604 (at this time, the thrust cylinder 92 continuously compresses the first spring 93, but due to the action of the first limit plate 94 and the second limit plate 95, the lifting rod 91 no longer rises), and pulls the two second sliders 9605 to slide relative to each other on the flat arm 9601. Then, the two second sliders 9605 can pull the side frame 18 through the pull rod 89, realizing the bending deformation of the circuit board 16 by the side frame 18. After bending deformation, wait for the required time, and then control the telescopic drive 20 to move downward again. This movement stroke is the distance of the first stroke plus the distance of the second stroke, that is, the distance to reset each component to the initial state. The test head 6 begins the second stage test.
[0112] It should be noted that, in this document, relational terms such as "first" and "second" are used only to distinguish one entity or operation from another, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Furthermore, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such process, method, article, or apparatus.
[0113] The preferred embodiments of the present invention disclosed above are merely illustrative of the invention. These preferred embodiments do not exhaustively describe all details, nor do they limit the invention to the specific implementations described. Clearly, many modifications and variations can be made based on the content of this specification. This specification selects and specifically describes these embodiments to better explain the principles and practical applications of the invention, thereby enabling those skilled in the art to better understand and utilize the invention. The invention is limited only by the claims and their full scope and equivalents.
Claims
1. A PCBA aging test platform, characterized in that, include: Side frame (18), the side frame (18) is located on both sides of the circuit board (16) and is used to support the circuit board (16). The force plate (5) is located directly above the circuit board (16), and test heads (6) are provided on both sides of the force plate (5). Pressure plate (15), the pressure plate (15) is located directly below the circuit board (16), and a staged drive (9) is provided below the pressure plate (15). The staged drive (9) can apply two stages of pressure through the telescopic drive (20) below it. as well as The inner retractor (8) is located on both sides of the staged drive (9) and is used to connect the staged drive (9) and the side frame (18). In the two pressure stages, the first pressure stage is used to make the pressure plate (15) lift the circuit board (16) until the test head (6) contacts the circuit board (16) with a preset pressure, and after waiting for the required time, the first stage of electrical performance test is performed. The second stage of pressure is used to control the staged drive component (9) to drive the inner retractor (8) to pull the side frame (18), forming a state where the side frame (18) squeezes the circuit board (16). The circuit board (16) is squeezed and bent, and after waiting for the required time, it resets. The test head (6) performs the second stage of electrical performance testing. The staged drive component (9) includes: The thrust cylinder (92) is fixedly connected to the output end of the telescopic drive component (20); The lifting rod (91) has its lower end confined within the thrust cylinder (92) and is fixed with a spring (93) between itself and the lower end of the thrust cylinder (92). The upper end of the lifting rod (91) is fixed to the pressure plate (15). When the thrust cylinder (92) moves upward, pressure is applied to the lifting rod (91) through the spring (93). Limiting plate one (94), the height of which is limited to a constant state, and the lifting rod (91) is provided with limiting plate two (95) that cooperates with limiting plate one (94); and The switching body (96) is located on both sides of the thrust cylinder (92) and is used to push the lifting rod (91) upward by the spring (93) when the first stage pressure is applied to the thrust cylinder (92); and to apply a pulling force to the inner retractor (8) when the second stage pressure is applied to the thrust cylinder (92). The PCBA aging test platform also includes a lifting component (7) for lifting the stress plate (5) when the second stage pressure is applied. The internal receiver (8) includes: A rotating disk (81) is concentric with a switching cylinder (961). An eccentric connecting rod (83) is rotatably mounted on the rotating disk (81). A connecting rod (84) is rotatably mounted on the other end of the connecting rod (83). The other end of the connecting rod (84) is fixed to the side frame (18) by a mounting base (85). Guide sleeve (82), the guide sleeve (82) is used to guide the second link (84).
2. The PCBA aging test platform according to claim 1, characterized in that, The switching body (96) includes: slider one (964) and switching cylinder (961). The slider (964) is fixed to the outer surface of the thrust cylinder (92); The switching cylinder (961) is sleeved around the thrust cylinder (92). The inner wall of the switching cylinder (961) is provided with a vertical groove (962) along the axial direction. The upper end of the vertical groove (962) is provided with a spiral groove (963). The length of the vertical groove (962) is equal to the axial movement of the lifting rod (91) when the first stage pressure is applied to the thrust cylinder (92). When the slider (964) passes through the spiral groove (963), the switching cylinder (961) rotates. The inner retractor (8) pushes and pulls the side frame (18) by the rotational torque of the switching cylinder (961).
3. The PCBA aging test platform according to claim 2, characterized in that, The internal receiver (8) includes: Gear (88), said gear (88) being fixed to the switching cylinder (961); and The toothed plate (86) has one end fixed to the opposite side frame (18) via the mounting frame (87), and the toothed plate (86) meshes with the gear (88).
4. The PCBA aging test platform according to claim 2, characterized in that, The lifting component (7) includes: Threaded rod (74), said threaded rod (74) being threadedly connected to force plate (5); and The vertical shaft (72) is located on one side of the side frame (18). A belt structure (71) is provided between the lower part of the vertical shaft (72) and the switching cylinder (961), and a belt structure (73) is provided between the upper part of the vertical shaft (72) and the threaded rod (74).
5. The PCBA aging test platform according to claim 1, characterized in that, The switching entity (96) includes: A horizontal arm (9601) is fixed to both sides of the thrust cylinder (92), and a second slider (9605) is laterally slidably mounted on the horizontal arm (9601); and Fixed frame (9602), the fixed frame (9602) is a fixed structure, the lower part of the fixed frame (9602) is provided with a vertical groove (9603) adapted to the slider (9605), and the upper part is provided with an inclined groove (9604) communicating with the vertical groove (9603). The inner retractor (8) includes a pull rod (89), one end of which is fixed on the second slider (9605), and the other end is fixed to the side frame (18) through the mounting base (85).
6. The PCBA aging test platform according to claim 5, characterized in that, The lifting component (7) includes: L-shaped rods (76) are installed on both sides of the load-bearing plate (5); A wedge block (77) is slidably disposed above an L-shaped rod (76), and an L-shaped connecting frame (75) is fixed between the wedge block (77) and the side frame (18); and Spring 2 (78) is mounted on the upper surface of the force plate (5).
7. The PCBA aging test platform according to claim 1, characterized in that, It also includes a liftable upper cover (2), on which a hot air pipe (12) is provided, and a temperature sensor for detecting temperature is provided inside the profile frame (4).
8. The PCBA aging test platform according to claim 1, characterized in that, The test head (6) is an elastic contact type test head.
Citation Information
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