Deformation detection device for server bottom plate

Abstract

The embodiment of the invention provides a deformation detection device for a server bottom plate. The deformation detection device comprises an alignment assembly, a detection assembly and an acquisition unit. A plurality of detection points arranged at intervals are defined on the alignment assembly; a plurality of detection points on the alignment assembly cover a to-be-detected area of the bottom plate during detection; the detection assembly elastically abuts against the bottom plate so as to generate a corresponding deformation size according to the deformation state of the bottom plate. The detection assembly can move along the reference surface of the alignment assembly so as to move to different detection points; the reference surface is parallel to the standard surface of the bottom plate during detection; the acquisition unit is electrically connected with the detection assembly and is used for acquiring the deformation size of the detection assembly under the condition that the detection assembly moves to different detection points, the deformation size is used for representing the deformation state of the bottom plate at the corresponding detection point relative to the standard plane, the deformation degree of the server bottom plate can be efficiently detected, and the performance of the server bottom plate is ensured.

Description

Technical Field

[0001] This application relates to the field of server technology, and in particular to a deformation detection device for server base plates. Background Technology

[0002] Deformation of the server backplane is crucial for the realization of server functionality. Industry standards typically require grid-like testing of the backplane to ensure its mechanical performance specifications.

[0003] In related technologies, deformation detection of server baseboards can take the form of manual measurement or automated equipment measurement. Manual measurement usually involves operators installing, reading, and recording measurements point by point, which is tedious, inefficient, and makes it difficult to guarantee measurement consistency. Automated equipment measurement typically uses a laser probe to scan the bottom of the server row by row. Although it can automatically output results, it is not conducive to making specific measurements of deformation problems on the server baseboard, thus affecting the repair and improvement of the server baseboard. Summary of the Invention

[0004] This application provides a deformation detection device for server baseboards, which can efficiently detect deformation of server baseboards and ensure the performance of server baseboards.

[0005] To achieve the above objectives, the embodiments of this application adopt the following technical solutions: In a first aspect, embodiments of this application provide a deformation detection device for a server base plate, comprising: The alignment component defines multiple detection points with interval settings; the multiple detection points on the alignment component cover the detection area of ​​the base plate during detection. The detection component is elastically abutted against the base plate to generate corresponding deformation dimensions according to the deformation state of the base plate; and the detection component can move along the reference surface of the alignment component to move to different detection points; the reference surface is parallel to the standard surface of the base plate during detection; The acquisition unit, electrically connected to the detection component, is used to acquire the deformation dimensions of the detection component when the detection component moves to different detection points. The deformation dimensions are used to characterize the deformation state of the base plate at the corresponding detection point relative to the standard surface.

[0006] According to the deformation detection device provided in this application embodiment, multiple detection points on the alignment component cover the area to be detected on the base plate during detection. The detection component automatically generates the deformation dimensions of multiple detection points through elastic contact, and these dimensions are collected in real time by the acquisition unit, thereby comprehensively reflecting the actual deformation status of the base plate. This measurement process significantly improves detection efficiency and data reliability. Furthermore, the detection component can move along the reference surface of the alignment component, allowing any position on the alignment component to be defined as a detection point. This enables deformation measurement at any position on the server base plate, facilitating the identification of deformation problem points on the server base plate and aiding in subsequent repair and improvement of these deformation problem points.

[0007] In one implementation, the deformation detection device further includes a control unit that stores control information determined based on multiple detection points; the control unit is electrically connected to the detection component; the control unit is used to control the detection component to move to different detection points according to the control information.

[0008] In one implementation, the control unit is also electrically connected to the acquisition unit, and the control unit is also used to record the deformation dimensions of the acquisition unit when the detection component moves to different detection points.

[0009] In this embodiment, through the coordinated linkage of the control unit and the acquisition unit, when the detection component moves to the detection point, the control unit directly records the deformation size of the detection component acquired by the acquisition unit. There is no need to configure an additional structure for the acquisition unit to sense whether the detection component is located at the detection point, which improves the utilization efficiency of system information.

[0010] In one implementation, the deformation detection device further includes multiple triggers, which are located at the detection points of the alignment component, and each trigger corresponds to a detection point. Each trigger is electrically connected to the acquisition unit. The triggers are used to trigger the acquisition unit to acquire the deformation dimensions of the detection component when the detection component moves to the trigger.

[0011] In this embodiment, the physical contact between the trigger and the detection component is used to confirm whether the detection component is located at the detection point, which reduces the control difficulty and ensures the consistency and accuracy of the detection point. Even if the detection component is moved by the alignment component with manual assistance, it will not affect the positioning accuracy of the detection point, thus reducing the cost of using a deformation detection device to perform deformation detection on the server base plate.

[0012] In one implementation, the alignment component includes a substrate and a guide structure stacked together, with the guide structure located on the side of the substrate facing the base plate. The guide structure is provided with a guide groove, and the detection component is inserted into the guide groove so that the detection component can move along the extension direction of the guide groove; The detection component covers multiple detection points along its movement path in the guide groove.

[0013] In this embodiment, the guide groove provides the detection component with a path for moving on the alignment component. When the operator moves the detection component to different detection points, it can be accurately moved to different detection points without complicated positioning skills. When the detection component is driven by a drive mechanism, the guide groove can guide the movement of the detection component.

[0014] In one implementation, the detection component passes through a guide groove to abut against the substrate, so that the detection component and the substrate form surface contact.

[0015] In this embodiment, the position of the detection component in the deformation direction is kept unchanged by using the side surface of the substrate facing the server base plate, eliminating the need for other positioning structures and reducing the impact of the dimensional error of the guide structure on the detection accuracy of the detection component.

[0016] In one implementation, the positioning component is defined with at least one column of detection points spaced apart along a first direction and at least one row of detection points spaced apart along a second direction, wherein the first and second directions intersect. The guide groove passes through at least one column of detection points and at least one row of detection points in sequence, enabling the detection component to move alternately along the first direction and the second direction to cover multiple detection points.

[0017] In one implementation, the alignment component defines detection points distributed on multiple concentric rings, and the guide groove extends in a spiral path from the innermost concentric ring to the outermost concentric ring, enabling the detection component to pass through multiple detection points.

[0018] In this embodiment, the structural design of extending the spiral path of the guide groove can adapt to the physical characteristics of the base plate deformation, reduce the measurement of non-deformation key points, and improve testing efficiency.

[0019] In one implementation, the guide structure further includes a reinforcing member connected between the outer walls of the guide grooves facing each other, so that the relative inner walls of the guide grooves along their own extension direction clamp the detection component.

[0020] In this embodiment, the use of reinforcing members can prevent the guide groove from being squeezed by the detection components, thus avoiding structural deformation that could affect the positional accuracy of the detection components and improving the accuracy of the detection points, thereby improving the accuracy of the deformation detection results of the server base plate.

[0021] In one implementation, the acquisition unit includes a data processing circuit and an acquisition circuit; the acquisition circuit is electrically connected to the detection component and the data processing circuit. The acquisition circuit is used to acquire the deformation size of the detection component when the detection component moves to different detection points, and transmit the deformation size to the data processing circuit in the form of an electrical signal; The data processing circuit processes the received electrical signal to obtain the deformation data of the base plate. The base plate deformation data includes: The first data includes information used to characterize whether the deformation of the base plate is acceptable; and / or, The second data contains information used to characterize the detection points, as well as the deformation of the base plate corresponding to the detection points.

[0022] In this embodiment, the deformation dimensions of the detection component are acquired by the acquisition circuit, and the deformation dimensions in the form of electrical signals are processed by the data processing circuit to output base plate deformation data that can be directly used by the operator. The operator can plan the subsequent processes of the server base plate based on the base plate deformation data.

[0023] In one implementation, the deformation detection device further includes an alignment structure, which is disposed on one of the detection points of the alignment component and is used to make the detection point coincide with the center position of the area to be detected in the deformation direction of the detection component.

[0024] In this embodiment, the detection point and the center position of the area to be detected are aligned in the deformation direction, which can make the server base plate and the alignment component fall under the same reference, without having to consider the coordinate difference between the coordinate system of multiple detection points and the coordinate system of each detection position in the server base plate, thus improving detection efficiency.

[0025] In one implementation, the alignment structure includes: The transmitter, located at one of the detection points of the alignment component, is used to emit calibration light rays along the deformation direction toward the server base plate. The calibration light rays are selectively reflected by the server base plate to the alignment component. A sensor is positioned at the center of the area to be detected on the base plate to absorb calibration light when receiving calibration light. A receiver, located on the alignment component, is used to receive reflected calibration light; based on whether the receiver receives the reflected calibration light, it determines whether the center position of the area to be detected coincides with one of the detection points in the deformation direction.

[0026] In this embodiment, by utilizing the cooperation of a transmitter, a sensor, and a receiver, the result of the coincidence of one of the detection points with the center position of the area to be detected in the deformation direction is transformed into a detectable change, thereby solving the problems of low accuracy and low efficiency of manual alignment and improving alignment accuracy and efficiency. Attached Figure Description

[0027] Figure 1 This is a schematic diagram illustrating an application scenario of a deformation detection device for a server base plate provided in an embodiment of this application. Figure 2This is a schematic diagram illustrating the alignment effect between a deformation detection device and a server base plate, as provided in an embodiment of this application. Figure 3a yes Figure 1 The diagram shows the deformation detection device in its application scenario after the guide groove has been removed. Figure 3b yes Figure 3a An enlarged structural diagram of point A in the structure shown; Figure 4a This is a schematic diagram of the simulation results of deformation simulation of the server base plate; Figure 4b yes Figure 4a The simulation results shown correspond to the deformation data of the server base plate. Figure 5 This is a schematic diagram of the alignment component in a deformation detection device provided in an embodiment of this application; Figure 6 This is a schematic diagram of the guide structure in the deformation detection device provided in this application embodiment. Figure 1 ; Figure 7 This is a schematic diagram of the guide structure in the deformation detection device provided in this application embodiment. Figure 2 ; Figure 8 This is a partial structural diagram of the detection component in the deformation detection device provided in this application embodiment.

[0028] Explanation of reference numerals in the attached figures: 100-Deformation detection device; 10-Alignment component; 101-Detection point; 200-Server base plate; 20-Detection component; 30-Acquisition unit; 40-Control unit; 50-Alignment structure; 51-Transmitter; 52-Receiver; 13-Trigger element; 11-Base plate; 12-Guide structure; 121-Guide groove; 123-Panel; 14-Reinforcing element; 21-Detection element; 22-Detection seat; 221-Receiving cavity. Detailed Implementation

[0029] The technical solutions of the embodiments of this application will now be described with reference to the accompanying drawings. To facilitate a clear description of the technical solutions of the embodiments of this application, the use of terms such as "first," "second," etc., in the embodiments of this application is for illustrative purposes and to distinguish the objects being described. There is no particular order between them, nor does it indicate a specific limitation on the number of devices in the embodiments of this application, and they do not constitute any limitation on the embodiments of this application.

[0030] To enable those skilled in the art to better understand the technical solutions in this application, the technical solutions in the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, and not all embodiments. Based on the embodiments in this application, all other embodiments obtained by those of ordinary skill in the art without creative effort should fall within the scope of protection of this application.

[0031] It should be noted that many specific details are set forth in the following description in order to provide a full understanding of this application. However, this application may also be implemented in other ways different from those described herein. Therefore, the scope of protection of this application is not limited to the specific embodiments disclosed below.

[0032] In the description of this application, it should be understood that the terms "upper," "lower," "horizontal," "bottom," "inner," and "outer" (if any) indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. These terms are used only for the convenience of describing this application and for simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on this application. In this application, unless otherwise expressly specified and limited, "upper" or "lower" of the first feature and the second feature may mean that the first and second features are in direct contact, or that the first and second features are in indirect contact through an intermediate medium.

[0033] In this application, unless otherwise expressly specified and limited, the terms "connected," "linked," and "fixed," etc., should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral unit; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components. However, specifying a direct connection indicates that the two entities at the point of connection are not connected through a transitional structure, but are simply linked together to form a whole. For those skilled in the art, the specific meaning of the above terms in this application can be understood according to the specific circumstances.

[0034] In this application, the use of terms such as "first," "second," etc., is for descriptive purposes only and should not be construed as indicating or implying their relative importance or implicitly specifying the number of technical features indicated. Therefore, a feature defined with "first" or "second" may explicitly or implicitly include at least one of those features.

[0035] In the field of server technology, the server backplane, as one of the largest and most critical load-bearing structural components within a server, is used to support the weight of the server's internal electronic components or to mount important server components. These core components may include the motherboard and power supply, among others. Therefore, excessive deformation of the backplane may affect the reliability of the installation or connection of these core components, thereby impacting server performance.

[0036] Therefore, to ensure that the baseplate structure does not affect server performance, deformation detection devices are needed to test the server baseplate after server production. Furthermore, the deformation detection results can be used by operators to determine whether the deformation state of the server baseplate can support the server's normal performance. If the deformation state of the server baseplate cannot support the server's normal performance, structural improvements can be made to the server baseplate. These improvements include, but are not limited to, designing reinforcing structures at locations with severe deformation, i.e., deformation problem points, to reduce the deformation and adjust the deformation state of the server baseplate to support the server's normal performance.

[0037] Here, servers can include, but are not limited to: rack servers, dedicated servers, or storage servers.

[0038] The deformation detection of the server base plate may include, but is not limited to, one or more of the following: sag, flatness, and straightness. For example, if the server base plate 200 is subject to gravity and exhibits bending or denting along the direction of gravity, the bending or denting data of the server base plate 200 can be obtained by detecting the sag (SAG) of the server base plate. Accordingly, this bending or denting data can be used by operators to determine whether the server base plate can support the server to perform normally under the given bending or denting amount, and if the server base plate cannot support the server to perform normally under the given bending or denting amount, the structure of the server base plate can be repaired and improved.

[0039] Figure 1 This is a schematic diagram illustrating an application scenario of a deformation detection device for a server base plate provided in an embodiment of this application.

[0040] Reference Figure 1 As shown in this embodiment, a deformation detection device 100 is provided for deforming a server base plate 200 to obtain deformation data of the server base plate 200. The deformation detection device 100 includes an alignment component 10. The alignment component 10 defines multiple detection points spaced apart; these detection points cover the area to be detected on the base plate 200 during detection. Therefore, deformation detection can be performed on the area to be detected using the multiple detection points of the alignment component 10.

[0041] In some implementations, the distribution of detection points on the alignment component 10 can be configured according to common detection standards in the server field, and this application embodiment does not limit this.

[0042] In some examples, the detection points can be marked on the alignment component 10.

[0043] In some examples, the detection points can be recorded in the operating device using positional relationship parameters between the detection points. Accordingly, when performing deformation detection on the server base plate 200 using the operating device, the operating device can directly determine the detection points according to the positional relationship parameters.

[0044] In some implementations, the area to be tested on the base plate 200 can be determined comprehensively based on the location of key functional components on the base plate 200, the geometric features of the base plate 200, and industry testing standards.

[0045] In some examples, the area to be tested on the baseboard 200 can be set as follows: a motherboard is mounted on the baseboard 200. As a critical component of the server, the reliability of the motherboard's installation is extremely important. Therefore, the area to be tested on the baseboard 200 can be set to at least cover the area where the motherboard is located on the baseboard 200.

[0046] In some examples, the detection area of ​​the base plate 200 can be set as follows: Based on the law of deformation of the base plate 200 caused by gravity, the deformation of the base plate 200 under gravity shows that the deformation is heavier at the center of the base plate 200 and gradually weakens towards the periphery. Therefore, the detection area of ​​the base plate 200 can be set with the center point of the base plate 200 as the center point of the detection area, radiating outwards at a certain distance. This certain distance can be determined based on the theoretical possibility that the base plate deformation data may not be sufficient to support the server's normal performance.

[0047] For example, if the deformation data of the base plate at several intervals in the direction extending outward from the center point within the area to be detected are theoretically x1, x2, x3, and x4, and the deformation degree represented by x1, x2, and x3 cannot support the normal performance of the server; while the deformation degree represented by x4 can support the normal performance of the server, then the center point of the base plate 200 can be taken as the center point of the area to be detected, and the distance from x3 to the center point of the base plate 200 can be used as the radius to determine the area to be detected.

[0048] In some examples, the entire surface of the server baseboard 200 can be used as the area to be detected. This application embodiment does not limit the determination of the area to be detected.

[0049] In this embodiment, the deformation detection device 100 further includes a detection component 20. The detection component 20 elastically abuts against the base plate 200 to generate a corresponding deformation size according to the deformation state of the base plate 200; and the detection component 20 can move along the reference surface α of the alignment component 10 to move to different detection points, wherein the reference surface α is parallel to the standard surface β of the base plate 200 during detection.

[0050] Here, the standard plane β of the base plate 200 can be understood as: the plane in which the base plate 200 lies under ideal conditions. Ideal conditions can refer to the state of the base plate 200 when it is deformed without being subjected to gravity.

[0051] Therefore, when the detection component 20 moves to different detection points, it can elastically abut against different positions of the base plate 200 in the area to be detected, thereby obtaining the deformation dimensions of the detection component 20 at different positions of the base plate 200. Accordingly, the deformation dimensions of the detection component 20 can reflect the deformation state of the base plate 200 at the abutment position of the detection component 20 relative to the standard surface β. Based on this, the deformation state of the base plate 200 in the area to be detected can be determined according to the multiple deformation dimensions of the detection component 20.

[0052] In some embodiments, if the base plate 200 is deformed, different positions on the side surface of the base plate 200 facing the alignment component 10 will be at different positions in the deformation direction T3 of the detection component 20. Therefore, when the detection component 20 abuts against different points on the base plate 200, different deformation sizes will occur depending on the position of that point on the base plate 200 in the deformation direction T3.

[0053] In some embodiments, when the deformation detection of the base plate 200 is a sag detection, the reference surface α can be a horizontal plane, that is, both the reference surface α and the base plate 200 are arranged in the horizontal direction. Correspondingly, the deformation direction T3 is the vertical direction, that is, the direction of gravity. In this case, the reference surface α is perpendicular to the deformation direction T3, so that the detection component 20 is vertically elastically abutted against the server base plate 200 to realize the sag detection of the base plate 200.

[0054] In some embodiments, at the detection point corresponding to the protrusion of the base plate 200 toward the alignment component 10, the detection component 20 can be compressed along the deformation direction T3 at the detection point. Correspondingly, the greater the distance of the protrusion of the base plate 200 toward the alignment component 10, the greater the deformation size of the detection component 20 that can be compressed along the deformation direction T3 at the detection point.

[0055] In some implementations, at a detection point corresponding to the recess on the side of the base plate 200 facing away from the alignment component 10, the detection component 20 can pop out along the deformation direction T3 to abut against the server base plate 200 at the detection point. Correspondingly, the more severe the recess on the side of the base plate 200 facing away from the alignment component 10, the larger the deformation size of the detection component 20 that can pop out along the deformation direction T3 at the detection point.

[0056] In this embodiment, the deformation detection device 100 further includes a data acquisition unit 30. The data acquisition unit 30 is electrically connected to the detection component 20 and is used to acquire the deformation dimensions of the detection component 20 when the detection component 20 moves to different detection points. The deformation dimensions are used to characterize the deformation state of the base plate at the corresponding detection point relative to the standard surface β.

[0057] The deformation state may include the amount by which the base plate 200 protrudes towards the alignment component 10 at the corresponding detection point, the amount by which the base plate 200 is recessed on the side away from the alignment component 10 at the corresponding detection point, and the absence of any recess or protrusion at the corresponding detection point.

[0058] According to the deformation detection device 100 provided in this application embodiment: multiple detection points on the alignment component 10 cover the area to be detected on the base plate 200 during detection. The detection component 20 automatically generates the deformation dimensions of multiple detection points through elastic contact, and the data acquisition unit 30 collects the data in real time, thereby comprehensively reflecting the actual deformation status of the base plate 200. This measurement process significantly improves detection efficiency and data reliability. Simultaneously, the detection component 20 can move along the reference surface of the alignment component 10, allowing any position on the alignment component 10 to be defined as a detection point. This enables deformation measurement at any position on the server base plate 200, achieving the effect of identifying deformation problem points on the server base plate 200, which is beneficial for subsequent repair and improvement of deformation problem points. Furthermore, the deformation detection device 200 includes the alignment component 10 and the detection component 20, with a simple structure. Deformation detection of the server base plate 200 can be performed by paralleling, spacing, and aligning the server base plate 200 with the alignment component 10, allowing for flexible and rapid setup of the testing environment. Deformation detection of the server base plate 200 is achieved by physically contacting the detection component 20 with the server base plate 200, reducing dependence on the testing environment and simplifying operation.

[0059] Figure 2 This is a schematic diagram illustrating the alignment effect between a deformation detection device and a server base plate, as provided in an embodiment of this application. Figure 2 In the example shown, the entire surface of the base plate 200 facing the alignment component 10 is taken as the area to be detected, and an example is given in which multiple detection points on the alignment component 10 cover the area to be detected on the base plate 200.

[0060] In some embodiments, multiple detection points on the alignment component 10 cover the area to be detected on the base plate 200 during detection. This can be achieved by moving the alignment component 10 so that multiple detection points cover the area to be detected on the base plate 200, with the reference surface of the alignment component 10 spaced apart from and parallel to the base plate 200. In this way, by moving the detection component 20 to multiple detection points to detect the corresponding detection positions on the base plate 200, the problems of time loss and inconsistency caused by manual point-by-point measurement are solved. The detection positions corresponding to the detection points can be understood as coinciding in the deformation direction T3.

[0061] Figure 3a yes Figure 1 The diagram shows the deformation detection device in its application scenario after the guide groove has been removed. Figure 3b yes Figure 3a A magnified structural diagram of point A in the structure shown. (Refer to...) Figure 3a and Figure 3b As shown, in some embodiments, the deformation detection device 100 further includes an alignment structure 50, which is disposed on one of the detection points 101 of the alignment component 10 and is used to make the detection point 101 coincide with the center position of the area to be detected in the deformation direction T3 of the detection component 20.

[0062] It is readily apparent that when performing deformation detection on the server base plate 200, the center position of the area to be detected is typically used as the detection position. Therefore, aligning detection point 101 with the center position of the area to be detected in the deformation direction T3 ensures that the server base plate 200 and the alignment component 29 lie on the same reference, eliminating the need to consider coordinate differences between the coordinate systems of multiple detection points 101 and the coordinate systems of various detection positions within the server base plate 200, thus improving detection efficiency. In other words, before performing deformation detection on the server base plate 200, aligning a detection point with the center position of the area to be detected in the deformation direction T3 ensures that the deformation detection device 100 and the server base plate 200 are located under a single detection reference. Correspondingly, under this unified detection reference, the detection component 20 automatically generates the deformation dimensions of multiple detection points through elastic contact, improving the efficiency of deformation detection on the server base plate 200.

[0063] In some embodiments, the position of the alignment component 10 along the reference surface α can be adjusted by one or more moving structures such as a lead screw, slide rail, or motor. The moving structure is connected to the alignment component 10, and then the alignment component 10 is adjusted to move along the reference surface α manually or electrically, so that one of the detection points 101 coincides with the center position of the area to be detected. The embodiments of this application do not limit the type and implementation of the moving structure.

[0064] Reference Figure 3bAs shown, in some embodiments, the alignment structure 50 may include a transmitter 51, a receiver 52, and a sensor (not shown). The transmitter 51 is located at one of the detection points of the alignment assembly 10 and is used to emit a calibration light q along the deformation direction T3 towards the server base plate 200. The calibration light q is selectively reflected by the server base plate 200 back to the alignment assembly 10. The sensor is located at the center of the area to be detected in the base plate 200 to absorb the calibration light when it is received. The receiver 52 is located on the alignment assembly 10 and is used to receive the reflected calibration light. Based on whether the receiver receives the reflected calibration light, it is determined whether the center of the area to be detected coincides with one of the detection points in the deformation direction T3.

[0065] In the above scheme, if the detection point and the center position of the area to be detected coincide in the deformation direction T3, the calibration light q emitted by the transmitter 51 will be incident on the sensor. The sensor receives and absorbs the calibration light. Correspondingly, the calibration light emitted to the base plate 200 will not be reflected to the alignment assembly 10, and the receiver 52 on the alignment assembly 10 will not receive the reflected calibration light. Therefore, based on the fact that the receiver 52 did not receive the reflected calibration light, it can be determined that the center position of the area to be detected coincides with one of the detection points in the deformation direction.

[0066] If the center position of the detection point and the area to be detected do not coincide in the deformation direction T3, the calibration light emitted by the transmitter 51 will not be incident on the sensor. The sensor cannot receive and absorb the calibration light. Correspondingly, the calibration light emitted to the base plate 200 will be reflected to the alignment assembly 10, and the receiver 52 on the alignment assembly 10 will receive the reflected calibration light. Therefore, based on the reflected calibration light received by the receiver 52, it can be determined that the center position of the area to be detected does not coincide with one of the detection points in the deformation direction.

[0067] Therefore, by using the transmitter 51, the sensor and the receiver 52 in cooperation, the result of the coincidence of one of the detection points with the center position of the area to be detected in the deformation direction is transformed into a detectable change, thereby solving the problem of low accuracy and low efficiency of manual alignment and improving alignment accuracy and efficiency.

[0068] It should be noted that after the alignment operation is completed, that is, after the center position of the area to be detected coincides with one of the detection points in the deformation direction T3, the sensor is removed from the server base plate 200 to facilitate subsequent detection operations.

[0069] Figure 4a This is a schematic diagram of the simulation results of deformation simulation of the server base plate; Figure 4b yes Figure 4a The simulation results shown correspond to the deformation data of the server's base plate. (Refer to...) Figure 4aAs shown, according to Figure 4a The diagram showing the color and deformation degree in the upper left corner indicates that the red and orange areas exhibit stronger deformation, which, in the context of the server base plate 200, includes the central area of ​​the server base plate 200. (Refer to...) Figure 4b The table showing the base plate deformation data shows that the first column of the table marks different positions of the server base plate 200 along the first direction T1, and the last row marks different positions of the server base plate 200 along the second direction T2. ​​The data in the cell determined by the row and column is the base plate deformation data of the server base plate 200 at that position. The larger the value of the base plate deformation data, the more obvious the deformation state of the base plate 200 at that position. It can be seen that the area with more obvious deformation of the server base plate 200 includes the central area of ​​the server base plate 200. Therefore, by aligning a detection point with the center position of the area to be detected in the deformation direction T3, the deformation detection device 100 and the server base plate 200 are placed under a unified detection benchmark. Under this unified detection benchmark, the detection component 20 automatically generates the deformation dimensions of multiple detection points through elastic contact, improving the efficiency of deformation detection of the server base plate 200.

[0070] In some examples, the center of the area to be detected can be determined by simply drawing a line within the area to be detected on the base plate 200.

[0071] In some examples, the center of the area to be detected on the base plate 200 is the geometric center of the server base plate 200. In this case, the center of the area to be detected can be determined by simply drawing a line on the base plate 200.

[0072] In some examples, one of the detection points of the alignment component 10 can be the center detection point of the alignment component 10, thereby simplifying the steps of determining the detection point on the alignment component 10 and improving alignment efficiency.

[0073] Continue to refer to Figure 1 As shown, in some embodiments, the deformation detection device 100 further includes a control unit 40, which stores control information determined based on multiple detection points; the control unit 40 is electrically connected to the detection component 20; the control unit 40 is used to control the detection component 20 to move to different detection points according to the control information.

[0074] In some implementations, the control information can be a pre-stored sequence of absolute coordinates. The absolute coordinates of this sequence correspond one-to-one with multiple detection points. When the control unit 40 controls the detection component 20 to move to different detection points, the control unit 40 calls the absolute coordinate sequence in a preset order and generates corresponding drive commands to control the drive mechanism connected to the detection component 20, thereby positioning the detection component 20 sequentially to each detection point.

[0075] The absolute coordinate sequence can be obtained as follows: a coordinate system is established on the reference surface α of the alignment component 10; the absolute coordinates of each detection point are determined in the coordinate system, and then an absolute coordinate sequence is generated according to certain rules. The absolute coordinate sequence is stored in the control unit 40.

[0076] In some implementations, the absolute coordinate sequence stored in the control unit 40 can be changed according to the detection position of the area to be detected on the server base plate 200, which is beneficial to adapt to the detection requirements of different detection densities.

[0077] In some examples, the drive mechanism can be configured as a linear motor, linear cylinder, or other drive structure. This application does not limit the type of drive structure.

[0078] In other embodiments, the control information can be a set of pre-stored layout parameters. These layout parameters define the relative positional relationships and distribution patterns between multiple detection points. When the control unit 40 controls the detection component 20 to move to different detection points, the control unit 40 calls the layout parameters and obtains a movement path covering all detection points within the detection area according to a built-in path generation rule; then, it generates corresponding drive commands based on the movement path to control the drive structure connected to the detection component (20) to move sequentially to each detection point.

[0079] The layout parameters can be determined as follows: based on the geometric features of multiple detection points arranged in a regular pattern, a set of relative position parameters between the detection points is generated and stored in the control unit 40.

[0080] In some implementations, the layout parameters stored in the control unit 40 can be changed according to the detection position of the area to be detected on the server base plate 200, which is beneficial to adapt to the detection requirements of different detection densities.

[0081] In some examples, layout parameters may include starting point coordinates, directional step spacing, and the number of detection points in the direction. This application embodiment does not limit the specific content of the layout parameters.

[0082] It should be noted that the absolute coordinate sequence and layout parameters mentioned above are only examples of control information, and the implementation of control information in this application embodiment is not limited.

[0083] In some implementations, the control unit 40 may be located on the detection component 20 to shorten the wiring length for the electrical connection between the control unit 40 and the detection component 20.

[0084] In some embodiments, the control unit 40 may be located on the alignment component 10. The alignment component 10 has a larger wiring space, which can improve the wiring flexibility of the electrical connection between the control unit 40 and the detection component 20.

[0085] In some embodiments, the control unit 40 is also electrically connected to the acquisition unit 30. The control unit 40 is also used to record the deformation dimensions of the detection component 20 acquired by the acquisition unit 30 when the detection component 20 moves to different detection points 101. Thus, through the coordinated operation of the control unit 40 and the acquisition unit 30, that is, when the detection component 20 moves to the detection point 101, the control unit 40 directly records the deformation dimensions of the detection component 20 acquired by the acquisition unit 30, without the need for the acquisition unit 30 to have an additional structure for sensing whether the detection component 20 is located at the detection point 101, thereby improving the efficiency of system information utilization.

[0086] In some implementations, the control unit 40 selectively generates a sampling signal based on whether the detection component 20 has reached a certain detection point. The sampling signal is used to drive the sampling unit 30 to detect the deformation size of the component 20 at that detection point.

[0087] In some examples, when the detection component 20 reaches a detection point, the control unit 40 generates a sampling signal and transmits the sampling signal to the sampling unit 30. After receiving the sampling signal, the sampling unit 30 samples the deformation dimension of the detection component 20 at the current detection point in response to the sampling signal.

[0088] Figure 5 This is a schematic diagram of the alignment component in a deformation detection device provided in an embodiment of this application.

[0089] Reference Figure 5 As shown, in some embodiments, the deformation detection device 100 further includes a plurality of triggers 13, which are located at the detection points 101 of the alignment component 10, and each trigger 13 corresponds to a detection point 101; each trigger 13 is electrically connected to the acquisition unit 30; the trigger 13 is used to trigger the acquisition unit 30 to acquire the deformation dimension of the detection component 20 when the detection component 20 moves to the trigger 13.

[0090] In the above scheme, each detection point 101 is equipped with a trigger 13. When the detection component 20 moves to a trigger 13, the trigger 13 will directly or indirectly transmit a signal to the acquisition unit 30. The acquisition unit responds to the signal and acquires the deformation dimension of the detection component 20. Through this design, the physical contact between the trigger 13 and the detection component 20 is used to confirm whether the detection component 20 is located at the detection point 101, reducing the control difficulty and ensuring the consistency and accuracy of the detection point 101. Even if the detection component 20 is moved by the alignment component 10 with manual assistance, the positioning accuracy of the detection point 101 will not be affected, reducing the cost of using the deformation detection device 100 to perform deformation detection on the server base plate 200.

[0091] In some implementations, the position of the trigger 13 can be adjusted accordingly based on the adjustment of the detection point, thereby enabling deformation detection at the required detection position on the server base plate 200, thus identifying the deformation problem point, which is beneficial for repairing and improving the structure of the deformation problem point on the server base plate 200.

[0092] In some embodiments, the trigger 13 can be a micro switch. This micro switch is located at the detection point 101 of the alignment component 10, and its trigger mechanism is exposed to contact the detection component 20. When the detection component 20 presses the trigger mechanism of the micro switch, the internal contact state of the micro switch changes, generating an electrical signal which is sent to the acquisition unit 30, triggering the acquisition unit 30 to acquire the deformation dimension of the detection component 20 at this time.

[0093] In other embodiments, the trigger 13 can be a photoelectric sensor. This photoelectric sensor is located at the detection point 101 of the alignment assembly 10 and includes an infrared emitter and a receiver. When the detection assembly 20 moves to the detection point 101 and blocks the infrared beam of the photoelectric sensor, the receiver signal changes, generating a trigger signal, which is then transmitted to the acquisition unit 30. The acquisition unit 30 is then triggered to acquire the deformation dimension of the detection assembly 20 at this time.

[0094] It should be noted that the photoelectric sensor and the micro switch are only examples of the trigger 13, and the embodiments of this application do not limit the type and implementation of the trigger 13.

[0095] In some embodiments, the trigger 13 can be an elastic structure that protrudes from the alignment component 10. Accordingly, when the detection component 20 moves to the trigger 13, the trigger 13 will retract to be at least flush with the surface of the alignment component 10 to emit the aforementioned trigger signal or electrical signal.

[0096] Continue to refer to Figure 5As shown, in some embodiments, the alignment component 10 includes a substrate 11 and a guide structure 12 stacked together, and the guide structure 12 is located on the side of the substrate 11 facing the base plate 200; the guide structure 12 is provided with a guide groove 121, and the detection component 20 is inserted into the guide groove 121 so that the detection component 20 can move along the extension direction of the guide groove 121; the movement path of the detection component 20 in the guide groove 121 covers multiple detection points 101.

[0097] Here, the reference surface α can be understood as the side surface of the substrate 11 facing the base plate 200. Accordingly, the detection component 20 can move along the side surface of the substrate 11 facing the base plate 200 to different detection points.

[0098] Through the above scheme, the guide groove 121 provides the detection component 20 with its movement path on the alignment component 10. When the operator moves the detection component 20 to different detection points 101, it can be accurately moved to different detection points 101 without complicated positioning skills. When the detection component 20 is driven by the drive mechanism, the guide groove 121 can guide the movement of the detection component 20.

[0099] In some embodiments, the trigger 13 may protrude from the inner wall of the guide groove 121. Accordingly, when the detection component 20 moves to the trigger 13, the trigger 13 will retract to be at least flush with the surface of the alignment component 10 to emit the aforementioned trigger signal or electrical signal.

[0100] In some examples, the trigger 13 may protrude from the inner bottom wall of the guide groove 121 to ensure that the detection assembly 20 can reliably squeeze the trigger 13 to retract.

[0101] In some examples, the trigger 13 may protrude from the inner wall of the guide groove 121 to avoid the trigger 13 protruding from the inner wall of the guide groove 121 from affecting the movement of the detection component 20, thereby improving the smoothness of movement.

[0102] In some embodiments, the guide structure 12 can be fixedly stacked on the substrate 11 by extrusion. The substrate 11 has a mounting groove formed on one side surface where the guide structure 12 is stacked, and the guide structure 12 is at least partially embedded in the mounting groove along the stacking direction of the guide structure 12 and the substrate 11, thus stacking the two structures.

[0103] It is understandable that the stacking direction can be parallel to the deformation direction.

[0104] In some examples, the inner contour dimension of the mounting groove in the stacking direction is slightly smaller than the inner contour dimension of the guide structure 12 in the stacking direction. The guide structure 12 is embedded in the mounting groove by extrusion, thereby fixing the substrate 11 and the guide structure 12.

[0105] In some embodiments, the guide structure 12 can be fixedly stacked on the substrate 11 by welding. The surfaces of the substrate 11 and the guide structure 12 facing each other are coated with a welding agent, and the substrate 11 and the guide structure 12 are fixedly connected by the welding agent.

[0106] To prevent the detection component 20 from wobbling within the guide groove 121 and affecting detection accuracy, in some embodiments, the guide groove 121 and the detection component 20 are slidably connected by a raised-and-groove structure. Specifically, the raised-and-groove structure includes a protrusion and a groove, one of which is located on the outer wall of the detection component 20, and the other is located on the inner wall of the guide groove 121. Through the cooperation of the groove and the protrusion, the position of the detection component 20 in the deformation direction T3 remains unchanged, so that the deformation dimension of the detection component 20 is only affected by the deformation degree of the server base plate 200, thereby improving the accuracy of detecting the deformation degree of the server base plate 200.

[0107] In some embodiments, the raised groove structure also includes a ball bearing, which is embedded between the raised part and the groove to achieve a rolling connection between the guide groove 121 and the detection component 20, thereby reducing the resistance to the movement of the detection component 20.

[0108] In some embodiments, the detection component 20 passes through the guide groove 121 and abuts against the substrate 11, so that the detection component 20 and the substrate 11 form surface contact. Thus, the position of the detection component 20 in the deformation direction T3 is kept constant by utilizing the surface of the substrate 11 facing the server base plate 200, eliminating the need for other positioning structures and reducing the impact of the dimensional error of the guide structure 12 on the detection accuracy of the detection component 20.

[0109] In some embodiments, the opposite two side surfaces of the substrate 11 in the deformation direction T3 are parallel to each other, and the flatness is consistent with the ideal flatness of the server base plate 200, so as to avoid the flatness of the substrate 11 affecting the deformation size of the detection component 20, so that the deformation size of the detection component 20 is only affected by the deformation degree of the server base plate 200, thereby improving the accuracy of deformation degree detection of the server base plate 200.

[0110] In some examples, substrate 11 may be made of materials such as marble to ensure the surface flatness of substrate 11.

[0111] Figure 6 This is a schematic diagram of the guide structure in the deformation detection device provided in this application embodiment. Figure 1 .

[0112] Reference Figure 6As shown, in some embodiments, the guide structure 12 includes multiple sets of parallel and spaced-apart plates 123. Each set of oppositely arranged plates 123 is sequentially connected to form the guide structure, and a guide groove 121 is formed on the side of each set of plates facing each other. In other words, the guide structure 12 is constructed as a fence structure, thereby facilitating the detection component 20 to pass through the guide groove 121 and abut against the substrate 11.

[0113] Reference Figure 6 As shown, in this case, the spaced-apart plates in the guide structure 12 are hollow. To enhance the structural stability of the guide structure 12, in some embodiments, the guide structure 12 also includes a reinforcing member 14. The reinforcing member 14 is connected between the outer walls of the guide grooves 121 facing each other, so that the inner walls of the guide grooves 121 along their own extension direction clamp the detection component 20. In this way, by connecting the outer walls of the guide grooves 121 through the inner and outer connection of the reinforcing member 14, it is possible to avoid the guide grooves 121 being squeezed by the detection component 20 and causing structural deformation that would affect the positional accuracy of the detection component 20, thereby improving the integral shape of the deformation detection device 100 and the consistency of the detection points, and thus improving the accuracy of the deformation detection results of the server base plate 200.

[0114] Continue to refer to Figure 2 As shown, in some embodiments, the alignment component 10 defines at least one column of detection points 101 spaced apart along a first direction T1, and at least one row of detection points 101 spaced apart along a second direction T2, wherein the first direction T1 and the second direction T2 intersect; the guide groove 121 passes through at least one column of detection points 101 and at least one row of detection points 101 in sequence, so that the detection component 20 can move alternately along the first direction T1 and the second direction T2 to cover multiple detection points 101. This optimizes the path of the detection component 20 to each detection point 101 and improves detection efficiency.

[0115] Reference Figure 2 As shown, in some embodiments, the alignment component 10 defines m columns of detection points 101 spaced apart along a first direction T1, and n rows of detection points 101 spaced apart along a second direction T2. ​​In this case, the guide groove 121 can take the detection point 101 in the first row and first column as its initial position, extend along the first direction T1 to the detection point 101 in the first row and m column; then turn to the second direction T1 and extend to the detection point 101 in the second row and m column, and then extend along the first direction T1 to the detection point 101 in the second row and 1 column, and so on, until it passes through all detection points 101.

[0116] In some implementations, the first direction T1 and the second direction T2 are perpendicular, then the detection point 101 is at an angle of m. The array distribution of n.

[0117] Figure 7 This is a schematic diagram of the guide structure in the deformation detection device provided in this application embodiment. Figure 1 .

[0118] Reference Figure 7 As shown, in some embodiments, the alignment component 10 defines detection points 101 distributed on multiple concentric rings. The guide groove 121 extends in a spiral path from the innermost concentric ring to the outermost concentric ring, allowing the detection component to pass through multiple detection points 101. Thus, the detection component 20 moves along the spiral path within the guide groove 121, and at each detection point 101, the deformation dimension of the detection component 20 is acquired by the acquisition unit 30. Based on the physical characteristics of the deformation of the base plate 200, which typically radiates from the center to the edge, the spiral path design of the guide groove 121 adapts to the physical characteristics of the base plate 200 deformation, reducing measurements of non-deformation key points and improving testing efficiency.

[0119] In some examples, multiple concentric rings can be set at equal intervals, thereby simplifying the design and manufacturing of the guide structure 12.

[0120] In some examples, along the direction from the innermost concentric ring to the outermost concentric ring, the distance between adjacent concentric rings closer to the innermost concentric ring is smaller than the distance between adjacent concentric rings farther from the innermost concentric ring, in order to adapt to the deformation law of the base plate 200 under gravity—the deformation is large in the middle and smaller towards the outside.

[0121] In some embodiments, the acquisition unit 30 includes a data processing circuit and an acquisition circuit; the acquisition circuit is electrically connected to the detection component 20 and the data processing circuit; the acquisition circuit is used to acquire the deformation dimensions of the detection component 20 when it moves to different detection points 101, and transmit the deformation dimensions to the data processing circuit in the form of electrical signals. The data processing circuit is used to process the received deformation dimensions in the form of electrical signals to obtain the base plate deformation data. Thus, by acquiring the deformation dimensions through the acquisition circuit and processing the acquired deformation dimensions through the data processing circuit, deformation data that can be directly used by the user is output, allowing the user to plan subsequent processes of the server base plate 200 based on the deformation data.

[0122] In some embodiments, the acquisition circuit can be an integrated capacitive displacement sensor, including a probe, a controller, and an output module. The probe is connected to the detection component 20, and its capacitance value changes based on different deformation dimensions of the detection component 20. Accordingly, the controller generates an analog or digital signal based on this capacitance value and transmits it to the data processing circuit through the output module. The data processing circuit pre-stores first relationship data between the analog or digital signal and the deformation dimensions of the server base plate, as well as the coordinate sequence data of the detection points. Accordingly, the data processing circuit obtains the deformation state data of the corresponding base plate 200 based on the analog or digital signal, and combines the deformation state data with the coordinates of the detection points to obtain the base plate deformation data.

[0123] In other embodiments, the acquisition circuit can be an absolute grating ruler displacement measurement system, including a reading head, a ruler body, and a signal processing unit. The reading head and ruler body are connected to the detection component 20. As the reading head moves along the deformation direction T3 with the detection component 20, it reads the moiré fringe signal formed by the engraved lines on the ruler body based on the photoelectric effect. The signal processing unit converts the moiré fringe signal into a high-resolution digital position signal (electrical signal) and transmits it to the data processing circuit. The data processing circuit pre-stores second relationship data between the digital position signal and the deformation dimension of the server base plate, as well as the coordinate sequence data of the detection point. Accordingly, based on the digital position signal and the second relationship data, the data processing circuit calculates the deformation state data of the server base plate 200 corresponding to the current detection point, and combines this deformation state data with the coordinates of the current detection point to obtain the base plate deformation data.

[0124] In some embodiments, the base plate deformation data further includes first data, which contains information characterizing whether the deformation state of the base plate is qualified. Specifically, the data processing circuit stores standard deformation state data of the server base plate 200, compares the obtained deformation state data of the base plate 200 with the standard deformation state data, and obtains the first data based on the comparison result.

[0125] The data processing circuit compares the obtained deformation state data of the base plate 200 with the standard deformation dimensions. If the comparison results show that the deformation state data of the base plate 200 is less than the standard deformation state data, then the first data is used to characterize that the deformation state of the base plate is qualified. If any deformation state data in the comparison results is less than the standard deformation state data, then the first data is used to characterize that the deformation state of the base plate is unqualified.

[0126] Accordingly, the operators decide on the subsequent processes for the base plate 200 based on the first data. Specifically, if the first data indicates that the deformation state of the base plate is acceptable, then the server base plate 200 is acceptable. If the first data indicates that the deformation state of the base plate is unacceptable, then the server base plate 200 undergoes further structural reinforcement design to adjust its deformation state to be acceptable.

[0127] In some implementations, the deformation data of the base plate includes second data containing information characterizing the detection points and the deformation state of the base plate corresponding to the detection points. This allows operators to quantify the deformation state of the server base plate 200 using the second data, and thus perform structural reinforcement design based on the quantified deformation state.

[0128] In some examples, if the detection points include a first detection point, a second detection point, and a third detection point, and the deformation state data of the base plate 200 corresponding to the first detection point is a1, and the standard deformation state data of the first detection point is a2, then the operator can quantitatively design the reinforcement structure of the first detection point based on the deformation state data a1 and the standard deformation state data a2. For example, the greater the difference between the deformation state data a1 and the standard deformation state data a2 of the first detection point, the higher the mechanical strength of the configured reinforcement structure.

[0129] According to the deformation detection device 100 provided in the embodiments of this application: by introducing a data acquisition circuit and a data processing circuit, the deformation size of the detection component 20 is quantified into second data, so that the operator can use the second data to design a targeted reinforcement structure for the base plate 200.

[0130] In some embodiments, the detection assembly 20 includes a detection element 21 and a detection seat 22. The detection element 21 is elastically abutted against the base plate 200, and the detection element 21 is connected to the detection seat 22. The detection seat 22 is movably connected to the alignment assembly 10 along the reference surface α of the alignment assembly 10. Thus, when the detection seat 22 moves on the alignment assembly 10, it can drive the detection element 21 to move, so as to elastically abut against different positions on the server base plate 200.

[0131] In some examples, the detection component 21 can be a probe pen, which can achieve a movement accuracy of 0.001mm, greatly improving the accuracy of the deformation size, thereby improving the accuracy of the deformation degree of the detected server base plate 200.

[0132] Figure 8 This is a partial structural schematic diagram of the detection component in the deformation detection device provided in this application embodiment, showing the detection seat 22 of the detection component. (Refer to...) Figure 8As shown, in some embodiments, the detection seat 22 is provided with a receiving cavity 221 for receiving the detection element 21. In some examples, the detection element 21 can be interference-fitted into the receiving cavity 221. In other examples, the detection seat 22 further includes a clamping structure disposed on the inner wall of the receiving cavity 221. The clamping structure extends along the inner wall of the receiving cavity 221 into the receiving cavity 221 to clamp and fix the detection element 21 in the receiving cavity 221.

[0133] In some examples, the clamping structure can be constructed as a three-jaw structure or other clamping structure to improve the accuracy of the detection component 21 elastically abutting against the server base plate 200 along the deformation direction T3. The embodiments of this application do not limit the type of clamping structure.

[0134] It should be noted that the above-described technical solution of setting a receiving cavity 221 in the detection seat 22 to connect the detection element 21 and the detection seat 22 is only an example of the connection between the detection element 21 and the detection seat 22. The embodiments of this application do not limit the connection method between the detection element 21 and the detection seat 22.

[0135] The above embodiments are merely specific embodiments of this application and are not intended to limit the scope of protection of this application. Any modifications, equivalent substitutions, improvements, etc., made based on the technical solution of this application should be included within the scope of protection of this application.

Claims

1. A deformation detection device for a server base plate, characterized in that, include: The alignment component defines detection points with multiple interval settings; The plurality of detection points on the alignment component cover the area to be detected on the base plate during detection; The detection component is elastically abutted against the base plate to generate a corresponding deformation size according to the deformation state of the base plate; and the detection component can move along the reference surface of the alignment component to move to different detection points. The reference surface is parallel to the standard surface of the base plate during testing; The acquisition unit is electrically connected to the detection component and is used to acquire the deformation size of the detection component when the detection component moves to different detection points. The deformation size is used to characterize the deformation state of the base plate at the corresponding detection point relative to the standard surface.

2. The deformation detection device according to claim 1, characterized in that, The deformation detection device further includes a control unit, which stores control information determined based on the plurality of detection points; the control unit is electrically connected to the detection component; the control unit is used to control the detection component to move to different detection points according to the control information.

3. The deformation detection device according to claim 2, characterized in that, The control unit is also electrically connected to the acquisition unit, and the control unit is also used to record the deformation dimensions of the detection component acquired by the acquisition unit when the detection component moves to different detection points.

4. The deformation detection device according to claim 1, characterized in that, The deformation detection device further includes multiple triggers, which are located at the detection points of the alignment component and correspond one-to-one with each detection point; each trigger is electrically connected to the acquisition unit; the trigger is used to trigger the acquisition unit to acquire the deformation dimension of the detection component when the detection component moves to the trigger.

5. The deformation detection device according to claim 4, characterized in that, The alignment component includes a substrate and a guide structure stacked together, and the guide structure is located on the side of the substrate facing the base plate; The guiding structure is provided with a guide groove, and the detection component is inserted into the guide groove so that the detection component can move along the extension direction of the guide groove; The detection component covers the plurality of detection points along the movement path of the guide groove.

6. The deformation detection device according to claim 5, characterized in that, The alignment component defines at least one column of detection points spaced apart along a first direction and at least one row of detection points spaced apart along a second direction, wherein the first direction and the second direction intersect. The guide groove passes sequentially through the at least one column of detection points and the at least one row of detection points, enabling the detection component to move alternately along the first direction and the second direction to cover the plurality of detection points.

7. The deformation detection device according to claim 5, characterized in that, The alignment component defines detection points distributed on multiple concentric rings, and the guide groove extends in a spiral path from the innermost concentric ring to the outermost concentric ring, so that the detection component can pass through the multiple detection points.

8. The deformation detection device according to claim 1, characterized in that, The acquisition unit includes a data processing circuit and an acquisition circuit; the acquisition circuit is electrically connected to the detection component and the data processing circuit. The acquisition circuit is used to acquire the deformation size of the detection component when the detection component moves to different detection points, and transmit the deformation size to the data processing circuit in the form of an electrical signal; The data processing circuit is used to process the received electrical signal in the form of deformation dimensions to obtain the base plate deformation data, which includes: First data, the first data includes information for characterizing whether the deformation state of the base plate is qualified; And / or, The second data includes information for characterizing the detection point and the deformation state of the base plate corresponding to the detection point.

9. The deformation detection device according to any one of claims 1 to 8, characterized in that, The deformation detection device further includes an alignment structure, which is disposed on one of the detection points of the alignment component and is used to make the detection point coincide with the center position of the region to be detected in the deformation direction of the detection component.

10. The deformation detection device according to claim 9, characterized in that, The alignment structure includes: A transmitter, located at one of the detection points of the alignment component, is used to emit calibration light rays towards the server base plate along the deformation direction, the calibration light rays being selectively reflected by the server base plate to the alignment component; A sensor is disposed at the center of the area to be detected on the base plate to absorb the calibration light when receiving the calibration light; A receiver, disposed on the alignment component, is used to receive the reflected calibration light; based on whether the receiver receives the reflected calibration light, it is determined whether the center position of the area to be detected coincides with one of the detection points in the deformation direction.

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