Vibration reduction microstructure-oriented longitudinal vibration reduction and isolation performance integrated test system and test method
By integrating the testing system and using multiple signal excitation methods, the problems of system coupling interference and insufficient scalability in the longitudinal vibration isolation performance testing of microstructures have been solved, realizing high-precision and diversified vibration isolation performance evaluation, which can be adapted to microstructure samples with different configurations and heights.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-12-30
- Publication Date
- 2026-03-13
AI Technical Summary
Existing technologies for testing the longitudinal vibration isolation performance of microstructures suffer from severe system coupling interference, insufficient testing accuracy, and lack of scalability. Traditional test benches are difficult to adapt to diverse microstructure sample configurations and connection methods, affecting testing efficiency and accuracy.
An integrated testing system was designed, comprising a support component, a moving component, a longitudinal excitation component, a testing component, and a data acquisition component. The system achieves precise positioning of samples with different cross-sections and heights through a Z-axis lifting platform and a dedicated adapter plate. Combined with a six-dimensional force sensor and multiple signal excitation methods, the longitudinal vibration reduction and isolation performance is tested.
It enables high-precision and diversified longitudinal vibration reduction and isolation performance testing of microstructure samples, has good adaptability and scalability, can accurately evaluate vibration isolation performance, and the device has a simple structure, is easy to reuse, and is suitable for lightweight and portable requirements.
Smart Images
Figure CN121655822A_ABST
Abstract
Description
Technical Field
[0001] This invention belongs to the field of microstructure vibration testing technology, and relates to an integrated testing system and test method for longitudinal vibration reduction and isolation performance of vibration-damping microstructures. Background Technology
[0002] With the rapid development of modern industry and technology, high-end equipment places increasingly higher demands on vibration control technology. In launch vehicles, aerospace vehicles, high-performance ships, and precision machining equipment, complex vibration environments have become key factors affecting their performance, reliability, and lifespan. Taking launch vehicles as an example, the wide-bandwidth, high-intensity vibrations they experience during flight can easily lead to performance degradation or even failure of onboard precision electronic equipment, directly threatening mission success. Low-frequency vibrations, in particular, are difficult to control due to their high energy and difficulty in attenuation. Among various vibration isolation technologies, active and semi-active control systems, while offering adjustable performance, are limited in use due to their complexity, high cost, and inability to meet lightweight and high reliability requirements. In contrast, passive vibration isolation technology remains the most common application due to its simple structure, lack of external energy requirements, and high reliability. Vibration-damping microstructures, through the design of specific cell structures, can achieve novel physical effects such as negative Poisson's ratio, band gap, and quasi-zero stiffness, providing a new direction for research on high-performance passive vibration isolation technology. The vibration isolation performance of microstructures needs to be verified and quantified through rigorous dynamic excitation tests.
[0003] However, existing technologies still have significant shortcomings in testing the longitudinal vibration isolation performance of microstructures. First, system coupling interference is severe. Traditional test benches often employ a split-load counterweight structure, resulting in a "double-layer vibration isolation system" between the exciter, counterweight, and the microstructure sample. This severely affects the final measurement results and makes it impossible to accurately assess the vibration isolation performance of the microstructure. Second, existing testing systems lack sufficient scalability and adaptability. Especially when microstructure samples have diverse configurations and sizes, traditional bench designs struggle to quickly adapt to samples of different heights and connection methods, greatly limiting testing efficiency and system versatility, and failing to meet diverse research needs. Summary of the Invention
[0004] To address the problems of severe coupling interference, insufficient accuracy, and lack of scalability in current microstructure vibration reduction and isolation performance testing, this invention provides an integrated testing system and method for the longitudinal vibration reduction and isolation performance of vibration-damping microstructures. The testing equipment provided by this invention can perform longitudinal vibration reduction and isolation tests on microstructure samples under sinusoidal and white noise signal excitation, thereby providing richer data support for the analytical or finite element analysis verification of microstructure vibration reduction and isolation performance.
[0005] To achieve the above, the technical solution adopted by the present invention is as follows:
[0006] An integrated testing system for the longitudinal vibration reduction and isolation performance of vibration-damping microstructures is disclosed. The system includes a support component, a moving component, a longitudinal excitation component, a testing component, and a data acquisition component. The moving component and the longitudinal excitation component are located inside the testing system, while the data acquisition component is located outside the support component. The moving component and the testing component enable positional control of the exciter 9 of the longitudinal excitation component and the microstructure sample 14 of the testing component, achieving precise determination of the positions of the exciter 9 and the microstructure sample 14 under different cross-sections and heights and different test conditions. Specifically:
[0007] The support assembly includes a first adapter plate 1, a vibration isolator 2, a second adapter plate 3, corner brackets 4, and an aluminum profile frame 5. In the support assembly, the vibration isolator 2 is fixed to the horizontal platform surface via the first adapter plate 1. The aluminum profile frame 5, after assembly, is reinforced by corner brackets 4 and connected to the vibration isolator 2 via the second adapter plate 3. Corner brackets 4 and matching bolts are used to install the aluminum profile frame 5 at each corner point. The vibration isolator 2 is used to isolate most of the vibrations experienced by the aluminum profile frame 5 during the test caused by the excitation assembly. The corner brackets 4 are used to reinforce the aluminum profile frame 5 to improve the structural frame strength. The aluminum profile frame 5 serves as the base of the entire support assembly, supporting components and maintaining the stability of the platform.
[0008] The movable assembly includes an optical plate 6 for fixation and a Z-axis lifting platform 7 for vertical movement. The top of the Z-axis lifting platform 7 is bolted to the optical plate 6, and its bottom is connected to the excitation assembly via a third adapter plate 8 and bolts. The bottom of the optical plate 6 is bolted to the two uppermost profiles of the aluminum profile frame 5. The Z-axis lifting platform 7 can be raised and lowered vertically using an adjustment knob and locking device. This assembly enables the excitation assembly to move along the Z-axis to accommodate microstructure samples with different cross-sectional dimensions and heights.
[0009] The longitudinal excitation assembly includes a sweep frequency signal generator, a power amplifier, and an exciter 9. The top rod of the exciter 9 has an internal thread that engages with the internal threaded hole on the counterweight 18. The upper surface of the exciter 9 is connected to the Z-axis lifting platform 7 in the moving assembly via a third adapter plate 8. The sweep frequency signal generator is connected to the power amplifier, which in turn is connected to the exciter 9. The load amplitude of the sweep frequency signal generator can be adjusted as needed, and its load output includes sinusoidal signals and white noise signals. The exciter 9 uses longitudinal excitation, enabling stable excitation of microstructure samples at different heights in the vertical direction. The signal generator can generate controllable sinusoidal and white noise excitation signals, and the power amplifier amplifies the signal power to drive the exciter.
[0010] The test assembly includes a counterweight 18, a microstructure sample 14, a first force sensor 12, a second force sensor 16, and their tooling structure. The tooling structure includes a fourth adapter plate 11, a fifth adapter plate 13, a sixth adapter plate 15, and a seventh adapter plate 17. Further, the connection and layout of each part of the test assembly are as follows: the first force sensor 12 is reliably connected to the fourth adapter plate 11 by bolts, and the fourth adapter plate 11 is fixed to the horizontal vibration table by bolts; the fifth adapter plate 13 is reliably connected to the first force sensor 12 by bolts; the second force sensor 16 is reliably connected to the sixth adapter plate 15 by bolts and reliably connected to the counterweight 18 via the seventh adapter plate 17; the microstructure sample 14 is positioned by the grooves in the centers of the fifth adapter plate 13 and the sixth adapter plate 15. The first force sensor 12 and the second force sensor 16 are used to measure the forces in each direction on the upper and lower surfaces of the microstructure sample 14, respectively. The fifth adapter plate 13 and the sixth adapter plate 15 have grooves in their centers to ensure precise alignment of the microstructure sample 14 and prevent vibration misalignment during testing. The counterweight 18 simulates real loads to ensure stable contact during testing. All adapter plates are made of aluminum alloy to prevent resonance during vibration testing, which could affect data acquisition and testing accuracy.
[0011] The data acquisition component includes a multi-channel signal acquisition system. The force sensor converts physical signals into analog electrical signals, which are then synchronously sampled and digitized by the acquisition card before being transmitted to the multi-channel signal acquisition system via a data cable. Fourier transforms are performed on the two sets of force signals to obtain their spectra. The decibel force transmissibility is calculated by comparing the output to the input spectral magnitude. A force transmissibility-frequency curve is then plotted, and the longitudinal vibration isolation performance of the microstructure sample is evaluated by identifying resonance peaks and analyzing the frequency band attenuation.
[0012] A test method for an integrated testing system for the longitudinal vibration reduction and isolation performance of vibration-damping microstructures includes the following steps:
[0013] First, use bolts to connect the first adapter plate 1 and the vibration isolator 2, assemble the aluminum profile frame 5 and reinforce it with the corner bracket 4, and fix the aluminum profile frame 5 to the vibration isolator 2 through the second adapter plate 3.
[0014] The second step is to connect the bottom of the third adapter plate 8 to the Z-axis lifting platform 7, and use bolts to connect the top of the vibrator 9 to the third adapter plate 8. Use bolts to connect the optical plate 6 to the top of the Z-axis lifting platform 7, and fix the optical plate 6 to the aluminum profile frame 5, specifically above the two profiles at the top of the aluminum profile frame 5.
[0015] The third step is to use bolts to connect the first force sensor 12 and the fourth adapter plate 11, the second force sensor 16 and the seventh adapter plate 17 respectively, and to use bolts to connect the first force sensor 12 and the fifth adapter plate 13, the second force sensor 16 and the sixth adapter plate 15 respectively.
[0016] Fourth, align the microstructure sample 14 with the grooves of the fifth adapter plate 13 and the sixth adapter plate 15, and use bolts to connect the counterweight 18 to the seventh adapter plate 17. Move the test assembly 10 to the center of the aluminum profile frame 5, and use the knob to adjust the Z-axis lifting platform 7 to a suitable height until the thread on the excitation rod of the vibrator 9 mates with the threaded hole on the upper surface of the counterweight 18. Use bolts to fix the fourth adapter plate 11 to the horizontal platform surface.
[0017] Fifth, connect the first force sensor 12 and the second force sensor 16 to the data acquisition component, connect the sweep frequency signal generator to the power amplifier, and connect the power amplifier to the exciter 9. After all systems have started, select a random vibration signal or sinusoidal signal of a certain frequency and amplitude, turn on the excitation component, and adjust the gain knob to make the exciter 9 output longitudinal excitation;
[0018] Step 6: The input and output dynamic force signals detected by the first force sensor 12 and the second force sensor 16, respectively, are transmitted to the multi-channel signal acquisition system via a data line. Further, the two time-domain signals are subjected to Fourier transform to obtain their spectra. The modulus ratio is calculated and converted to decibel force transmissibility to evaluate the vibration isolation performance. Specifically:
[0019] Fast Fourier Transform (FFT) was performed on the time-domain signals acquired by the two force sensors to obtain the input force spectrum and the output force spectrum, respectively. The force transmissibility in decibels was obtained by calculating the ratio of the magnitude of the output force to that of the input force spectrum and expressing it in decibels. Based on this, a force transmissibility-frequency curve was plotted to identify the resonant frequency and peak transmissibility. Furthermore, the longitudinal vibration reduction and isolation performance of different microstructure samples was evaluated and compared by analyzing the attenuation degree in specific frequency bands.
[0020] The present invention has the following beneficial effects:
[0021] (1) This device has a simple structure and is easy to disassemble, and can be used to study the vibration reduction and isolation performance of microstructure samples under longitudinal excitation.
[0022] (2) The device is equipped with a displacement adjustment component with a Z-axis lifting platform as the core. Combined with a special adapter plate and adjustment knob, it can adapt to microstructure samples with different cross-sectional shapes and heights, and has good height adaptability. The test bench is reusable, eliminating the need to redesign the test device for different samples. This facilitates flexible adjustment and repeated measurement of various test states, thereby improving the test results.
[0023] (3) The present invention uses a six-dimensional force sensor to test the vibration reduction and isolation performance of microstructure samples under longitudinal excitation. It does not rely on mass calculation, directly obtains the core parameters of the force, has clear physical meaning, and the results are intuitive and reliable. As a mature industrial product, the six-dimensional force sensor has a moderate cost and is suitable for testing the vibration reduction performance of microstructures under dynamic loads. It can directly reflect the dynamic response of the system, effectively capture the actual excitation effect, and avoid the interference of mass factors.
[0024] (4) The excitation device in this invention has the function of outputting white noise signals and sinusoidal signals with various amplitudes and frequencies, which facilitates the testing of vibration reduction and isolation performance of microstructure samples under various longitudinal excitations.
[0025] (5) Based on high scalability and high testing accuracy, the present invention can achieve miniaturization, lightweighting and portability of the structure. Attached Figure Description
[0026] Figure 1 This is a schematic diagram of the overall structure of an integrated testing system for longitudinal vibration reduction and isolation performance of vibration-damping microstructures.
[0027] Figure 2 This is the main structural view of the integrated testing system for longitudinal vibration reduction and isolation performance of vibration-damping microstructures;
[0028] Figure 3 This is a side view of the overall structure of the integrated testing system for longitudinal vibration reduction and isolation performance of vibration-damping microstructures;
[0029] Figure 4 This is a schematic diagram of the overall structure of the test components in the integrated test system;
[0030] Figure 5 This is a cross-sectional schematic diagram of the test components in an integrated test system;
[0031] In the diagram: 1 First adapter plate; 2 Vibration isolator; 3 Second adapter plate; 4 Corner code; 5 Aluminum profile frame; 6 Optical plate; 7 Z-axis lifting platform; 8 Third adapter plate; 9 Exciter; 10 Test assembly; 11 Fourth adapter plate; 12 First force sensor; 13 Fifth adapter plate; 14 Microstructure sample to be tested; 15 Sixth adapter plate; 16 Second force sensor; 17 Seventh adapter plate; 18 Counterweight. Detailed Implementation
[0032] To make the objectives, technical solutions, and advantages of this invention clearer, the following description, in conjunction with the accompanying drawings and specific embodiments, provides a more detailed explanation of the integrated testing system and method for longitudinal vibration reduction and isolation performance of vibration-damping microstructures.
[0033] As attached Figure 1The image shown is a spatial view of the overall structure of the integrated testing system for the longitudinal vibration reduction and isolation performance of vibration-damping microstructures.
[0034] As attached Figure 2 The image shown is a front view of the overall structure of the integrated testing system for the longitudinal vibration reduction and isolation performance of vibration-damping microstructures.
[0035] As attached Figure 3 The image shown is a side view of the overall structure of the integrated testing system for the longitudinal vibration reduction and isolation performance of the vibration reduction microstructure.
[0036] The microstructure sample used has a square cross-section with sides of 140 mm and a structural height of 40 mm. It is made of thermoplastic polyurethane elastomer and represents a vibration-damping microstructure. The force sensor has a maximum vertical force range of 500 N, a measurement accuracy of 0.2%FS, and an ultimate overload range of 400%FS. The force sensor has multiple communication interfaces including EtherCat, EtherNet, RS485 / RS232, CAN, and USB, and can be used with multi-channel data acquisition systems such as the NST series data acquisition unit. The Z-axis lifting platform used operates on the principle of a precision-machined lead screw drive, with a maximum vertical stroke of 110 mm.
[0037] Based on the cross-sectional dimensions of the vibration-damping microstructure sample 14, prepare adapter plates with suitable interface dimensions. Check the integrity and compatibility of all adapter plates, excitation components, and other components. Connect the first adapter plate 1 and the vibration isolator 2 using high-strength hexagonal head bolts. Assemble the aluminum profile frame 5, and use sliders and bolts to install angle brackets 4 to reinforce the aluminum profile frame 5. Secure the bottom four corners of the aluminum profile frame 5 to the vibration isolator 2 using the second adapter plate 3.
[0038] Connect the bottom of the third adapter plate 8 to the Z-axis lifting platform 7 using bolts, and connect the top of the vibrator 9 to the third adapter plate 8. Connect the optical plate 6 to the top of the Z-axis lifting platform 7 using bolts, and fix the optical plate 6 above the two profiles on the top of the aluminum profile frame 5.
[0039] As attached Figure 4 The diagram shown is a schematic of the overall structure of the test components in the integrated test system. The first force sensor 12 is connected to the fourth adapter plate 11, the second force sensor 16 is connected to the seventh adapter plate 17, and the first force sensor 12 is connected to the fifth adapter plate 13, the second force sensor 16 is connected to the sixth adapter plate 15, respectively, using bolts.
[0040] As attached Figure 5 The diagram shown is a cross-sectional view of the test components in the integrated test system.
[0041] Align the microstructure sample 14 with the 1mm deep groove in the center of the fifth adapter plate 13 and the sixth adapter plate 15. Connect the 5kg counterweight 18 to the seventh adapter plate 17. Move the test assembly 10 to the center of the aluminum profile frame 5. Use the knob to adjust the Z-axis lifting platform 7 to a suitable height until the thread on the excitation rod of the vibrator 9 mates with the threaded hole on the upper surface of the counterweight 18. Use bolts to fix the fourth adapter plate 11 to the horizontal platform surface.
[0042] Connect the sweep frequency signal generator to the power amplifier, and connect the power amplifier to the exciter 9. Connect the outputs of the first force sensor 12 and the second force sensor 16 to the multi-channel signal acquisition system, setting the sampling frequency to 10 kHz to ensure coverage of the test frequency band. Turn on the power to all systems, and on the panel of the sweep frequency signal generator, determine that the signal type is white noise. Set the specific sweep frequency parameters, including the start frequency, end frequency, and amplitude of the excitation signal. Turn on the excitation assembly and slowly adjust the gain knob on the power amplifier to make the exciter 9 output longitudinal excitation.
[0043] After the data acquisition is completed, a Fast Fourier Transform is performed on the time-domain signals output by the first force sensor 12 and the second force sensor 16 to obtain the input force spectrum F. I (w) and output force spectrum F O (w). Subsequently, by calculating the ratio of the magnitudes of the output force to the input force spectrum, the force transmissibility, expressed in decibels, can be obtained. This force transmissibility curve clearly reflects the vibration transmission characteristics of the microstructure at different frequencies. Finally, based on this force transmissibility-frequency curve, the resonant frequency and peak transmissibility of the system can be accurately identified. The vibration reduction and isolation effect of the sample can be evaluated by analyzing the attenuation degree of the curve in a specific frequency band, and the performance of vibration reduction and isolation can be compared by comparing the transmissibility curves of different samples.
[0044] This embodiment fully demonstrates the process of using the system of the present invention to test the longitudinal vibration reduction and isolation performance of microstructure samples. The system exhibits good data repeatability, effectively separates the dynamic characteristics of the microstructure sample itself, and can obtain accurate vibration transmissibility curves. This system possesses good versatility and reusability, and is suitable for testing microstructure samples with different geometric features, providing a reliable experimental basis for analytical modeling and finite element verification of vibration-reducing microstructures.
[0045] The above embodiments are merely illustrative of the implementation methods of the present invention, but should not be construed as limiting the scope of the present invention. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of the present invention, and these modifications and improvements all fall within the protection scope of the present invention.
Claims
1. An integrated testing system for the longitudinal vibration reduction and isolation performance of vibration-damping microstructures, characterized in that, The longitudinal vibration reduction and isolation performance integrated testing system includes a support component, a moving component, a longitudinal excitation component, a testing component, and a data acquisition component; wherein the moving component and the longitudinal excitation component are located inside the testing system, and the data acquisition component is located outside the support component; the position control of the exciter (9) of the longitudinal excitation component and the microstructure sample (14) of the testing component is achieved through the moving component and the testing component, so as to accurately determine the position of the exciter (9) and the microstructure sample (14) under different cross-sections and heights and under different test conditions; specifically: The support assembly includes a first adapter plate (1), a vibration isolator (2), a second adapter plate (3), and an aluminum profile frame (5); in the support assembly, the vibration isolator (2) is fixed to the horizontal platform through the first adapter plate (1); the aluminum profile frame (5) is connected to the vibration isolator (2) through the second adapter plate (3); The moving assembly includes an optical plate (6) for fixing and a Z-axis lifting platform (7) for moving in the vertical direction; the top of the Z-axis lifting platform (7) is connected to the optical plate (6), and its bottom is connected to the excitation assembly through a third adapter plate (8); The longitudinal vibration assembly includes a sweep frequency signal generator, a power amplifier, and a vibrator (9); the top rod of the vibrator (9) is provided with an internal thread, which meshes with the internal thread hole on the counterweight (18); the upper surface of the vibrator (9) is connected to the Z-axis lifting platform (7) in the moving assembly through a third adapter plate (8); The test components include a counterweight (18), a microstructure sample (14), a first force sensor (12), a second force sensor (16), and their tooling structures, wherein the tooling structures include a fourth adapter plate (11), a fifth adapter plate (13), a sixth adapter plate (15), and a seventh adapter plate (17); The data acquisition components include a multi-channel signal acquisition system; the force sensor converts physical signals into analog electrical signals, which are then synchronously sampled and digitized by the acquisition card, and transmitted to the multi-channel signal acquisition system via a data line to evaluate the longitudinal vibration isolation performance of the microstructure sample.
2. The integrated testing system for longitudinal vibration reduction and isolation performance of vibration-damping microstructures according to claim 1, characterized in that, In the test assembly: the first force sensor (12) is connected to the fourth adapter plate (11), and the fourth adapter plate (11) is fixed on the horizontal vibration table; the fifth adapter plate (13) is connected to the first force sensor (12); the second force sensor (16) is connected to the sixth adapter plate (15), and is connected to the counterweight (18) through the seventh adapter plate (17); the microstructure sample (14) is positioned by the grooves in the center of the fifth adapter plate (13) and the sixth adapter plate (15); wherein, the first force sensor (12) and the second force sensor (16) are used to measure the forces in each direction on the upper and lower surfaces of the microstructure sample (14); the fifth adapter plate (13) and the sixth adapter plate (15) are provided with grooves in the center to achieve accurate alignment of the microstructure sample (14) and prevent vibration misalignment during the test; the counterweight (18) is used to simulate real loads.
3. The integrated testing system for longitudinal vibration reduction and isolation performance of vibration-damping microstructures according to claim 2, characterized in that, All adapter plates are made of aluminum alloy.
4. The integrated testing system for longitudinal vibration reduction and isolation performance of vibration-damping microstructures according to claim 1, characterized in that, In the support assembly, the aluminum profile frame (5) is reinforced by corner brackets 4 after assembly.
5. The integrated testing system for longitudinal vibration reduction and isolation performance of vibration-damping microstructures according to claim 1, characterized in that, In the moving assembly, the bottom of the optical plate (6) is connected to the two profiles on the top layer of the aluminum profile frame (5); the Z-axis lifting platform (7) can be raised and lowered in the vertical direction by adjusting the knob and locking device, so as to realize the movement of the excitation assembly in the Z-axis direction, and cooperate with microstructure samples with different cross-sectional dimensions and different heights.
6. The integrated testing system for longitudinal vibration reduction and isolation performance of vibration-damping microstructures according to claim 1, characterized in that, In the longitudinal excitation assembly, the sweep frequency signal generator is connected to the power amplifier, and the power amplifier is connected to the exciter (9); the load amplitude of the sweep frequency signal generator is adjusted as needed, and its load output forms include sine signals and white noise signals; the excitation mode of the exciter (9) is longitudinal excitation, which can achieve stable excitation of microstructure samples of different heights in the vertical direction; the signal generator generates controllable sine and white noise excitation signals, and the power amplifier amplifies the signal power to drive the exciter to work.
7. A test method for an integrated testing system for longitudinal vibration reduction and isolation performance of vibration-damping microstructures as described in any one of claims 1-6, characterized in that, Includes the following steps: First step, connect the first adapter plate (1) and the vibration isolator (2), assemble the aluminum profile frame (5) and reinforce it with the corner bracket (4), and fix the aluminum profile frame (5) on the vibration isolator (2) through the second adapter plate (3); The second step is to connect the bottom of the third adapter plate (8) to the Z-axis lifting platform (7), connect the top of the vibrator (9) to the third adapter plate (8), connect the optical plate (6) to the top of the Z-axis lifting platform (7), and fix the optical plate (6) on the aluminum profile frame (5). The specific fixing position is above the two profiles at the top of the aluminum profile frame (5). The third step is to connect the first force sensor (12) and the fourth adapter plate (11), the second force sensor (16) and the seventh adapter plate (17) respectively, and connect the first force sensor (12) and the fifth adapter plate (13), the second force sensor (16) and the sixth adapter plate (15) respectively. Fourth step, align the microstructure sample (14) with the grooves of the fifth adapter plate (13) and the sixth adapter plate (15), connect the counterweight (18) and the seventh adapter plate (17); move the test assembly (10) to the center of the aluminum profile frame (5), use the knob to adjust the Z-axis lifting platform (7) to a suitable height, until the thread on the excitation rod of the vibrator (9) matches the threaded hole on the upper surface of the counterweight (18), and fix the fourth adapter plate (11) on the horizontal platform; Fifth step, connect the first force sensor (12) and the second force sensor (16) to the data acquisition component, connect the sweep frequency signal generator to the power amplifier, and connect the power amplifier to the exciter (9); after each system is started, select a random vibration signal or sinusoidal signal of a certain frequency and amplitude, turn on the excitation component, adjust the gain knob, and make the exciter (9) output longitudinal excitation. In the sixth step, the input and output dynamic force signals detected by the first force sensor (12) and the second force sensor (16) are transmitted to the multi-channel signal acquisition system via the data line; the two time-domain signals are subjected to Fourier transform to obtain the spectrum, and the modulus ratio is calculated and converted into decibel force transmission rate to evaluate the vibration isolation performance.
8. The test method for an integrated testing system for longitudinal vibration reduction and isolation performance of vibration-damping microstructures according to claim 7, characterized in that, In the sixth step, the time-domain signals acquired by the two force sensors are subjected to fast Fourier transform to obtain the input force spectrum and the output force spectrum, respectively. The ratio of the magnitude of the output force to the input force spectrum is calculated and expressed in decibels to obtain the force transmissibility in decibels. Based on this, a force transmissibility-frequency curve is plotted to identify the resonant frequency and peak transmissibility. The longitudinal vibration reduction and isolation performance of different microstructure samples is evaluated and compared by analyzing the attenuation degree of specific frequency bands.