Integrated manual crimping tool for testing power semiconductor module

By designing an integrated manual crimping fixture for power semiconductor module testing that combines a fixed substrate and a rotating beam with an elbow clamp, the problems of laborious operation and stress concentration associated with manual crimping fixtures were solved, achieving an efficient and labor-saving testing process and extending the equipment's lifespan.

CN121679074APending Publication Date: 2026-03-17CHENXIN ELECTRONICS (SUZHOU) CO LTD
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2025-12-17
Publication Date
2026-03-17

AI Technical Summary

Technical Problem

In the current power semiconductor module testing process, manual crimping fixtures are labor-intensive and prone to wear and fatigue due to stress concentration.

Method used

A manual crimping fixture for testing power semiconductor modules was designed. It uses a fixed substrate, a rotating beam, an elbow clamp, and an adjustment component. The combination of the rotating beam and the elbow clamp ensures reliable contact between the semiconductor module and the testing fixture. A floating joint is set at the bottom of the elbow clamp head to avoid stress concentration.

Benefits of technology

It simplifies the operation process, improves testing efficiency, reduces wear on the elbow clamp, extends service life, and allows for easy adjustment of the crimping stroke and height when heating is required.

✦ Generated by Eureka AI based on patent content.

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Abstract

The invention discloses a power semiconductor module test integrated manual crimping tool, and belongs to the technical field of semiconductor module test equipment, the power semiconductor module test integrated manual crimping tool comprises a fixed substrate, the fixed substrate is rotatably provided with a rotating beam, the rotating beam is provided with an elbow clamp, and the elbow clamp is provided with a clamping groove; the top face of the rotating beam is provided with a receding through groove used for allowing the toggle clamp pressing head to penetrate through, and the fixed base plate is provided with a rotating assembly used for controlling the rotating beam to rotate and an adjusting assembly used for adjusting the height of the rotating beam. The method has the advantages of being simple in operation process, high in testing efficiency and capable of saving time and labor.
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Description

Technical Field

[0001] This application relates to the technical field of semiconductor module testing equipment, and in particular to an integrated manual crimping fixture for testing power semiconductor modules. Background Technology

[0002] Power semiconductor modules must undergo 100% static parameter, on-state voltage drop, switching loss, and insulation withstand voltage tests before leaving the factory. When manually testing power semiconductor modules, a crimping fixture must be used to ensure reliable contact between the module's pins and the testing fixture.

[0003] Currently used crimping fixtures include test fixtures and manual crimping fixtures. The test fixture has a slot on its top surface for holding the manual crimping fixture, with elbow clamps on both sides of the slot. The operator must first remove the manual crimping fixture from the slot, then place the semiconductor module under test (DUT) into the slot of the test fixture, and then place the manual crimping fixture back into the slot, making contact with the DUT. The elbow clamps on the test fixture are then used to press the manual crimping fixture firmly. After testing, the operator must release the elbow clamps, remove the manual crimping fixture, and then remove the DUT. During the operation, the operator needs to repeatedly lift the manual crimping fixture, but the manual crimping fixture is heavy and requires considerable effort to operate. Summary of the Invention

[0004] To address the issue of laborious operation of manual crimping fixtures, this application provides an integrated manual crimping fixture for testing power semiconductor modules.

[0005] This application provides an integrated manual crimping fixture for testing power semiconductor modules, employing the following technical solution: A power semiconductor module testing integrated manual crimping fixture includes a fixed base plate, a rotating beam rotatably mounted on the fixed base plate, an elbow clamp mounted on the rotating beam, a clearance slot for the elbow clamp crimping head to pass through the top surface of the rotating beam, and a rotating component for controlling the rotation of the rotating beam and an adjusting component for adjusting the height of the rotating beam on the fixed base plate.

[0006] By adopting the above technical solution, the fixed substrate is fixed to the machine tool, the test fixture is placed on one side of the fixed substrate, the semiconductor module under test is placed on the test fixture, the rotating beam is rotated so that the elbow clamp pressure head is directly above the semiconductor module under test, the elbow clamp is operated so that the elbow clamp pressure head is pressed down, and reliable contact between the semiconductor module under test and the test fixture is achieved. After the operation is completed, the operator only needs to open the elbow clamp and rotate the rotating beam to easily replace the semiconductor module under test and the test fixture. The operation process is simple, the testing efficiency is high, and it saves time and effort.

[0007] Preferably, the bottom end of the pressure head of the elbow clamp is fixed with a floating joint.

[0008] By adopting the above technical solution, a floating joint is set at the bottom of the elbow clamp pressure head, which makes the connection part flexible and avoids stress concentration caused by fixed connection. This reduces damage or fatigue caused by stress concentration, effectively reduces the wear of the elbow clamp, and extends its service life.

[0009] Preferably, a heating block is detachably connected to the bottom surface of the floating joint.

[0010] By adopting the above technical solution, when the heating function is required, the heating block and the floating joint are fixedly connected by screws, and the height of the rotating beam is adjusted by the adjustment component so that the pressing stroke and pressing height remain unchanged after the heating block is installed; when the heating function is not required, the heating block is directly removed and the height of the rotating beam is reset, which is simple to operate.

[0011] Preferably, the rotating assembly includes a bearing seat fixed to the top surface of the fixed base plate, a bearing is installed in the bearing seat, a rotating shaft passes through the top surface of the rotating beam, the rotating beam and the rotating shaft are detachably connected, the rotating shaft is fixedly connected to the inner ring of the bearing, and a limiting member for limiting the rotation shaft is provided on the bearing seat.

[0012] By adopting the above technical solution, the rotating shaft relies on bearings to achieve the rotation function, so as to facilitate the movement of the rotating beam and the elbow clamp. Since the bottom surface temperature of the heating block is high, it cannot be placed arbitrarily. Usually, a fixed placement groove is required for the heating block. However, the rotating beam can drive the heating block to rotate, so that the heating block is suspended in the air. There is no need to configure a special placement groove, saving space. Moreover, the operation is effortless and the testing efficiency is high.

[0013] Preferably, the limiting member includes a ball-head plunger, the side of the bearing seat is provided with a mounting through hole for passing through and fixing the ball-head plunger, the bottom surface of the rotating shaft is fixed with a limiting ring, the outer peripheral surface of the limiting ring is provided with a plurality of limiting grooves, and the ball head of the ball-head plunger can be inserted into the limiting groove.

[0014] By adopting the above technical solution, when the rotating beam rotates to the top of the test fixture, the ball head of the ball plunger is inserted into the limiting groove of the limiting ring under the elastic force of the spring, thereby limiting the rotating shaft and making it difficult for the rotating beam to rotate, so as to ensure the reliability of the test.

[0015] Preferably, the adjusting assembly includes an adjusting sleeve that can be fitted onto the outer circumference of the rotating shaft. A fixing ring is fixedly fitted onto the outer circumferential surface of the rotating shaft. The bottom surface of the adjusting sleeve can abut against the top surface of the fixing ring, and the top surface of the adjusting sleeve can abut against the bottom surface of the rotating beam.

[0016] By adopting the above technical solution, when the heating function is required, the rotating beam is first removed, then the adjusting sleeve is fitted onto the outer circumference of the rotating shaft, with the bottom surface of the adjusting sleeve abutting against the top surface of the fixing ring. The rotating beam is then fitted onto the outer circumference of the rotating shaft, and the rotating beam is fixedly connected to the rotating shaft with screws, with the top surface of the adjusting sleeve abutting against the bottom surface of the rotating beam, so that the pressing stroke and pressing height remain unchanged after the heating block is installed. When the heating function is not required, the adjusting sleeve can be removed.

[0017] Preferably, the adjusting assembly includes a fixed sleeve and a movable sleeve. The movable sleeve is sleeved on the outer periphery of the fixed sleeve and is threadedly connected to the fixed sleeve. A positioning ring is fixedly sleeved on the outer periphery of the rotating shaft. The bottom surface of the fixed sleeve can abut against the top surface of the positioning ring, and the top surface of the movable sleeve can abut against the bottom surface of the rotating beam.

[0018] By adopting the above technical solution, the height of the moving sleeve and the fixed sleeve can be adjusted by rotating the moving sleeve, thereby adjusting the pressing stroke and pressing height of the elbow clamp, so as to adapt to heating blocks of different thicknesses and test fixtures of different heights.

[0019] Preferably, the outer peripheral surface of the movable sleeve is provided with a threaded hole, and a screw is inserted into the threaded hole, the end of which can abut against the outer peripheral surface of the fixed sleeve.

[0020] By adopting the above technical solution, after the movable sleeve is rotated to a suitable height, the screw is inserted into the threaded hole, so that the end of the screw abuts against the outer circumferential surface of the fixed sleeve, thereby fixing the movable sleeve and the fixed sleeve.

[0021] Preferably, a vertically arranged positioning rod is fixed on the top surface of the positioning ring, and a positioning groove is provided on the bottom surface of the fixing sleeve, so that the positioning rod can be inserted into the positioning groove.

[0022] By adopting the above technical solution, the fixing sleeve is fitted onto the outer circumference of the rotating shaft, and then the positioning groove of the fixing sleeve is aligned with the positioning rod, so that the positioning rod is inserted into the positioning groove, thereby keeping the fixing sleeve and the rotating shaft relatively fixed and reducing the friction between the fixing sleeve and the positioning ring.

[0023] In summary, this application includes at least one of the following beneficial technical effects: The fixed substrate is fixed to the machine tool, the test fixture is placed on one side of the fixed substrate, and the semiconductor module under test is placed on the test fixture. The rotating beam is rotated so that the elbow clamp head is directly above the semiconductor module under test. The elbow clamp is operated so that the elbow clamp head is pressed down to achieve reliable contact between the semiconductor module under test and the test fixture. After the operation is completed, the operator only needs to open the elbow clamp and rotate the rotating beam to easily replace the semiconductor module under test and the test fixture. The operation process is simple, the testing efficiency is high, and it saves time and effort. A floating joint is provided at the bottom of the elbow clamp pressure head, which makes the connection part flexible and avoids stress concentration caused by fixed connection. This reduces damage or fatigue caused by stress concentration, effectively reduces elbow clamp wear, and extends service life. When heating is required, the heating block is fixed to the floating joint with screws, and the height of the rotating beam is adjusted using the adjustment component to keep the pressing stroke and pressing height unchanged after the heating block is installed. When heating is not required, the heating block is removed and the height of the rotating beam is reset. The operation is simple. Attached Figure Description

[0024] Figure 1 This is a schematic diagram of the overall structure of Embodiment 1 of this application.

[0025] Figure 2 This is a schematic diagram of the rotating assembly in Embodiment 1 of this application.

[0026] Figure 3 This is a cross-sectional view of the bearing housing in Embodiment 1 of this application.

[0027] Figure 4 This is a schematic diagram of the structure of the adjustment component in Embodiment 2 of this application.

[0028] Figure 5 This is a cross-sectional view of the fixed sleeve and the movable sleeve in Embodiment 2 of this application.

[0029] Reference numerals: 1. Fixed base plate; 2. Rotating beam; 21. Elbow clamp; 22. Clearance slot; 23. Floating joint; 24. Heating block; 3. Rotating assembly; 31. Bearing seat; 32. Bearing; 33. Rotating shaft; 331. Fixed ring; 34. Mounting through hole; 35. Ball plunger; 36. Limiting ring; 361. Limiting groove; 4. Adjusting assembly; 41. Adjusting sleeve; 42. Fixed sleeve; 421. Positioning groove; 43. Moving sleeve; 431. Threaded hole; 44. Positioning ring; 441. Positioning rod; 45. Screw. Detailed Implementation

[0030] The following is in conjunction with the appendix Figure 1-5 This application will be described in further detail.

[0031] This application discloses an integrated manual crimping fixture for testing power semiconductor modules. Example

[0032] Reference Figure 1 and Figure 2 The integrated manual crimping fixture for power semiconductor module testing includes a fixed base plate 1, which is fixedly connected to the machine tool. A rotating beam 2 is rotatably mounted on the fixed base plate 1, and an elbow clamp 21 is mounted on the rotating beam 2. The top surface of the rotating beam 2 has a clearance groove 22 for the elbow clamp 21's pressing head to pass through. A floating joint 23 is fixed to the bottom end of the elbow clamp 21's pressing head. The floating joint 23 at the bottom of the elbow clamp 21's pressing head provides a certain degree of flexibility in the connection, avoiding stress concentration problems caused by fixed connections, reducing damage or fatigue caused by stress concentration, effectively reducing wear on the elbow clamp 21, and extending its service life. A heating block 24 is detachably connected to the bottom surface of the floating joint 23, and the floating joint 23 and the heating block 24 are fixedly connected by screws.

[0033] Reference Figure 2 and Figure 3 A rotating assembly 3 for controlling the rotation of the rotating beam 2 and an adjusting assembly 4 for adjusting the height of the rotating beam 2 are provided on the fixed base plate 1. The rotating assembly 3 includes a bearing seat 31 fixed to the top surface of the fixed base plate 1, and two bearings 32 are installed in the bearing seat 31. A rotating shaft 33 is passed through the top surface of the rotating beam 2, and the rotating beam 2 and the rotating shaft 33 are detachably connected by screws. The rotating shaft 33 is fixedly connected to the inner ring of the bearing 32. Mounting through holes 34 are respectively opened on both sides of the bearing seat 31, and ball plungers 35 are fixedly inserted in the mounting through holes 34. A limiting ring 36 is fixed to the bottom surface of the rotating shaft 33. Four limiting grooves 361 are opened on the outer circumferential surface of the limiting ring 36. The four limiting grooves 361 are equally spaced along the circumference of the limiting ring 36, and the ball head of the ball plunger 35 can be inserted into the limiting groove 361.

[0034] The rotating shaft 33 achieves its rotation function by relying on the bearing 32, so as to move the rotating beam 2 and the elbow clamp 21. Since the bottom surface temperature of the heating block 24 is high, it cannot be placed arbitrarily. Usually, a fixed placement groove is required for the heating block 24. However, the rotating beam 2 can drive the heating block 24 to rotate, so that the heating block 24 is suspended in the air, eliminating the need for a special placement groove, saving space, and making operation effortless and the testing efficiency high. When the rotating beam 2 rotates to the top of the testing fixture, the ball head of the ball plunger 35 is inserted into the limiting groove 361 of the limiting ring 36 under the elastic force of the spring, thereby limiting the rotating shaft 33 and making it difficult for the rotating beam 2 to rotate, so as to ensure the reliability of the test.

[0035] Reference Figure 3 and Figure 4The adjusting component 4 includes an adjusting sleeve 41, which can be sleeved on the outer periphery of the rotating shaft 33. A fixing ring 331 is fixedly sleeved on the outer periphery of the rotating shaft 33. The bottom surface of the adjusting sleeve 41 can abut against the top surface of the fixing ring 331, and the top surface of the adjusting sleeve 41 can abut against the bottom surface of the rotating beam 2.

[0036] When heating is required, the heating block 24 and the floating joint 23 are fixedly connected with screws, and the rotating beam 2 is removed. Then, the adjusting sleeve 41 is fitted onto the outer circumference of the rotating shaft 33, with the bottom surface of the adjusting sleeve 41 abutting against the top surface of the fixing ring 331. The rotating beam 2 is then fitted onto the outer circumference of the rotating shaft 33, and the rotating beam 2 is fixedly connected to the rotating shaft 33 with screws, with the top surface of the adjusting sleeve 41 abutting against the bottom surface of the rotating beam 2. This ensures that the pressing stroke and pressing height remain unchanged after the heating block 24 is installed. When heating is not required, the heating block 24 and the adjusting sleeve 41 can be directly removed, making the operation simple.

[0037] The implementation principle of Embodiment 1 of this application is as follows: the fixed substrate 1 is fixed to the machine tool, the test fixture is placed on one side of the fixed substrate 1, the semiconductor module under test is placed on the test fixture, the rotating beam 2 is rotated so that the floating connector 23 is located directly above the semiconductor module under test, the elbow clamp 21 is operated so that the elbow clamp 21 pressure head is pressed down to achieve reliable contact between the semiconductor module under test and the test fixture. After the operation is completed, the operator only needs to open the elbow clamp 21 and rotate the rotating beam 2 to easily replace the semiconductor module under test and the test fixture. The operation process is simple, the testing efficiency is high, and it saves time and effort. Example

[0038] Reference Figure 4 and Figure 5 The difference between this embodiment and Embodiment 1 is that the adjusting component 4 includes a fixed sleeve 42 and a movable sleeve 43. The movable sleeve 43 is sleeved on the outer periphery of the fixed sleeve 42 and is threadedly connected to the fixed sleeve 42. A threaded hole 431 is provided on the outer peripheral surface of the movable sleeve 43, and a screw 45 passes through the threaded hole 431. The end of the screw 45 can abut against the outer peripheral surface of the fixed sleeve 42.

[0039] Reference Figure 4 and Figure 5 A positioning ring 44 is fixedly fitted onto the outer circumference of the rotating shaft 33. The bottom surface of the fixed sleeve 42 can abut against the top surface of the positioning ring 44, and the top surface of the movable sleeve 43 can abut against the bottom surface of the rotating beam 2. A vertically arranged positioning rod 441 is fixed to the top surface of the positioning ring 44, and a positioning groove 421 is opened on the bottom surface of the fixed sleeve 42, into which the positioning rod 441 can be inserted.

[0040] The implementation principle of Embodiment 2 of this application is as follows: the fixed sleeve 42 is sleeved on the outer periphery of the rotating shaft 33, and the positioning groove 421 of the fixed sleeve 42 is aligned with the positioning rod 441, so that the positioning rod 441 is inserted into the positioning groove 421. The movable sleeve 43 is rotated to a suitable height, and then the screw 45 is inserted into the threaded hole 431, so that the end of the screw 45 abuts against the outer peripheral surface of the fixed sleeve 42, thereby adjusting the pressing stroke and pressing height of the elbow clamp 21 to adapt to heating blocks 24 of different thicknesses and test fixtures of different heights.

[0041] The above are all preferred embodiments of this application, and are not intended to limit the scope of protection of this application. Therefore, all equivalent changes made in accordance with the structure, shape and principle of this application should be covered within the scope of protection of this application.

Claims

1. A power semiconductor module test integrated manual crimping tool characterized by: The utility model provides a kind of elbow clamp, including fixed base plate (1), the rotating beam (2) is rotatably mounted on the fixed base plate (1), the elbow clamp (21) is installed on the rotating beam (2), the top surface of the rotating beam (2) is provided with the accommodation channel (22) for the head of the elbow clamp (21) to pass through, the fixed base plate (1) is provided with the rotating assembly (3) for controlling the rotation of the rotating beam (2) and the adjusting assembly (4) for adjusting the height of the rotating beam (2).

2. The power semiconductor module test integrated manual crimping tool according to claim 1, characterized in that: The head of the elbow clamp (21) is fixed with a floating joint (23).

3. The power semiconductor module test integrated manual crimping tool of claim 2, wherein: The bottom surface of the floating joint (23) is detachably connected with a heating block (24).

4. The power semiconductor module test integrated manual crimping tool of claim 1, wherein: The rotating assembly (3) includes a bearing seat (31) fixed to the top surface of the fixed base plate (1), a bearing (32) installed in the bearing seat (31), a rotating shaft (33) penetrating through the top surface of the rotating beam (2), the rotating beam (2) being detachably connected with the rotating shaft (33), the rotating shaft (33) being fixedly connected with the inner ring of the bearing (32), and a limiting member provided on the bearing seat (31) for limiting the rotating shaft (33).

5. The power semiconductor module test integrated manual crimping tool of claim 4, wherein: The limiting member includes a ball head plunger (35), the side surface of the bearing seat (31) is provided with a mounting through hole (34) for penetrating and fixing the ball head plunger (35), the bottom surface of the rotating shaft (33) is fixed with a limiting ring (36), the outer peripheral surface of the limiting ring (36) is provided with a plurality of limiting grooves (361), and the ball head of the ball head plunger (35) can be inserted into the limiting grooves (361).

6. The power semiconductor module test integrated manual crimping tool of claim 4, wherein: The adjusting assembly (4) includes an adjusting sleeve (41), the adjusting sleeve (41) can be sleeved on the outer periphery of the rotating shaft (33), a fixed ring (331) is sleeved and fixed on the outer peripheral surface of the rotating shaft (33), the bottom surface of the adjusting sleeve (41) can abut against the top surface of the fixed ring (331), and the top surface of the adjusting sleeve (41) can abut against the bottom surface of the rotating beam (2).

7. The power semiconductor module test integrated manual crimping tool of claim 4, wherein: The adjusting assembly (4) includes a fixed sleeve (42) and a moving sleeve (43), the moving sleeve (43) is sleeved on the outer periphery of the fixed sleeve (42), the moving sleeve (43) is threadedly connected with the fixed sleeve (42), a positioning ring (44) is sleeved and fixed on the outer peripheral surface of the rotating shaft (33), the bottom surface of the fixed sleeve (42) can abut against the top surface of the positioning ring (44), and the top surface of the moving sleeve (43) can abut against the bottom surface of the rotating beam (2).

8. The power semiconductor module test integrated manual crimping tool of claim 7, wherein: The outer peripheral surface of the moving sleeve (43) is provided with a threaded hole (431), a screw rod (45) is penetrated through the threaded hole (431), and the end of the screw rod (45) can abut against the outer peripheral surface of the fixed sleeve (42).

9. The power semiconductor module test integrated manual crimping tool of claim 8, wherein: The top surface of the positioning ring (44) is fixed with a vertically arranged positioning rod (441), the bottom surface of the fixed sleeve (42) is provided with a positioning groove (421), and the positioning rod (441) can be inserted into the positioning groove (421).