Method for controlling heat pump device, device for controlling heat pump device, and heat pump device

Abstract

The invention provides a control method of a heat pump device, a control device of the heat pump device and the heat pump device. The control method relates to the technical field of heat pumps. The control method comprises the steps that the temperature of an evaporator inlet of the heat pump device is obtained based on a preset period; based on the historical temperature of the evaporator inlet of the heat pump device and the current temperature of the evaporator inlet of the heat pump device, the target temperature change rate of the evaporator inlet of the heat pump device is obtained, the interval between the collection moment of the historical temperature and the collection moment of the current temperature is N preset periods, and N is an integer larger than or equal to 2; and controlling the heat pump device to perform defrosting operation based on the target temperature change rate of the evaporator inlet of the heat pump device. According to the control method, by controlling the heat pump device, the defrosting efficiency of the heat pump device can be improved.

Description

Technical Field

[0001] This application relates to the field of heat pump technology, and more specifically, to a control method for a heat pump device, a control device for a heat pump device, and a heat pump device in the field of heat pump technology. Background Technology

[0002] In low-temperature, high-humidity environments, the evaporator surface temperature of a heat pump unit is below the air dew point and remains below 0°C, causing water vapor in the air to condense and freeze into frost on the evaporator fins. Common causes include unsuitable ambient temperature and humidity, insufficient airflow (such as fin blockage), refrigerant abnormalities, or defrosting function failure. Frosting reduces heating efficiency and may damage the equipment. Existing defrosting operations only monitor the evaporator temperature to determine when to defrost, but a single temperature parameter cannot accurately reflect the frosting status of the heat pump unit, resulting in low defrosting efficiency.

[0003] Therefore, how to control heat pump devices to improve defrosting efficiency is an urgent problem to be solved. Summary of the Invention

[0004] This application provides a control method for a heat pump device, a control device for a heat pump device, and a heat pump device. The control method can control the heat pump device to improve the defrosting efficiency of the heat pump device.

[0005] In a first aspect, a control method for a heat pump device is provided, the control method comprising: The temperature of the evaporator inlet of the heat pump device is obtained based on a preset cycle; Based on the historical temperature and the current temperature of the evaporator inlet of the heat pump device, the target temperature change rate of the evaporator inlet of the heat pump device is obtained. The time interval between the acquisition time of the historical temperature and the acquisition time of the current temperature is N preset periods, where N is an integer greater than or equal to 2. Based on the target temperature change rate at the evaporator inlet of the heat pump unit, the heat pump unit is controlled to perform defrosting operation.

[0006] In the above technical solution, the evaporator inlet temperature is collected at a preset cycle, and the target temperature change rate is calculated by combining the historical and current temperatures at intervals of N cycles. Based on the target temperature change rate, the heat pump device is controlled to defrost. This overcomes the limitations of a single temperature threshold judgment, accurately reflects the actual frosting rate of the evaporator, and makes the defrosting triggering time more closely match the actual frosting state. This effectively reduces false defrosting and untimely defrosting, improves the accuracy and adaptability of heat pump defrosting control, and thus improves the defrosting efficiency of the heat pump device.

[0007] In conjunction with the first aspect, in some possible implementations, when N is 2, the target temperature change rate of the evaporator inlet of the heat pump device is obtained based on the historical temperature of the evaporator inlet and the current temperature of the evaporator inlet of the heat pump device, including: The first temperature change rate is obtained based on the current temperature of the evaporator inlet of the heat pump device at the current moment and the first historical temperature corresponding to the current temperature. The second temperature change rate is obtained based on the first temperature of the evaporator inlet of the heat pump device at the current moment and the second historical temperature corresponding to the first temperature at the previous moment. When the first temperature change rate is less than a preset threshold and the second temperature change rate is less than a preset threshold, the target temperature change rate of the evaporator inlet of the heat pump device is determined based on the first temperature change rate and the second temperature change rate.

[0008] In the above technical solution, when N is 2, by calculating two sets of temperature change rates, and only when both sets of change rates are less than a preset threshold, the difference between the two is taken as the target temperature change rate. This not only eliminates abnormal interference caused by temperature fluctuations in a single period of time through dual-set data verification, but also further quantifies the trend of frost change with the difference, making the calculated target temperature change rate more consistent with the actual frost state, avoiding false defrosting judgments caused by random temperature data, and improving the accuracy and reliability of the target temperature change rate.

[0009] In combination with the first aspect and the above implementation methods, in some possible implementations, the control method further includes: Obtain environmental parameters of the current environment in which the heat pump unit is located; Determine the target rate of change threshold based on environmental parameters; Based on the target temperature change rate at the evaporator inlet of the heat pump unit, control the heat pump unit to perform defrosting operations, including: When the target temperature change rate is greater than or equal to the target change rate threshold, the heat pump device is controlled to perform defrosting operation.

[0010] In the above technical solution, by acquiring the environmental parameters of the environment in which the heat pump device is located, and determining the appropriate target rate of change threshold accordingly, and then controlling defrosting by comparing the target temperature change rate with the target rate of change threshold, the defrosting judgment threshold is dynamically adjusted according to the environmental conditions. This avoids the problem of insufficient adaptability of fixed thresholds in different environments, allowing defrosting control to conform to the frost patterns in different temperature and humidity environments, further improving the accuracy of defrosting judgment and adaptability to environmental conditions, meeting the defrosting needs in different environments, and improving defrosting efficiency in different environments.

[0011] In combination with the first aspect and the above implementation methods, in some possible implementations, the control method further includes: Obtain the target mapping relationship, which is used to indicate the mapping relationship between preset environmental parameters and candidate rate of change thresholds; Based on environmental parameters, determine the target rate of change threshold, including: If the target mapping relationship contains candidate change rate thresholds corresponding to environmental parameters, the candidate change rate thresholds are determined as the target change rate thresholds. If the target mapping relationship does not include candidate change rate thresholds corresponding to environmental parameters, control the target operating time of the heat pump device, and determine the target change rate thresholds corresponding to environmental parameters based on the operating results.

[0012] In the above technical solution, the target rate of change threshold is quickly matched by the mapping relationship between preset environmental parameters and candidate rate of change thresholds. At the same time, for cases where there are no corresponding parameters in the mapping relationship, the target rate of change threshold is determined by the target operating time of the unit and the operating results. This can ensure the high efficiency of threshold determination under normal conditions and realize the personalized adaptation of threshold under special or unpreset conditions, so that the determination of the target rate of change threshold covers all operating conditions and improves the comprehensiveness and adaptability of defrosting control.

[0013] Combining the first aspect and the above implementation methods, in some possible implementation methods, the operating results include obtaining a sample temperature sequence at the evaporator inlet of the heat pump device within a target duration based on a preset period; and determining the target rate of change threshold corresponding to the environmental parameters based on the operating results, including: Based on the first sample temperature and the second sample temperature in the sample temperature sequence, a sample temperature change rate sequence is obtained. The sampling time of the first sample temperature and the sampling time of the second sample temperature are N preset periods apart, where N is an integer greater than or equal to 2. Based on the sample temperature change rate sequence, the target change rate threshold corresponding to the environmental parameters is determined.

[0014] In the above technical solution, for environmental parameters that are not preset, the sample temperature change rate sequence is calculated based on the sample temperature sequence collected within the target time period according to the rule of N preset periods, and then the target change rate threshold is determined accordingly. This ensures that the determination of the target change rate threshold is based on real sample data of the temperature change of the heat pump evaporator under the environment, rather than empirical values, thus guaranteeing the objectivity and accuracy of the target change rate threshold under special conditions. This allows it to truly conform to the frosting pattern of the environment and provide a reliable basis for subsequent precise defrosting.

[0015] Combining the first aspect and the above implementation methods, in some possible implementation methods, the target rate of change threshold corresponding to the environmental parameters is determined based on the sample temperature change rate sequence, including: The target difference sequence is obtained based on the difference between each pair of consecutive sample temperature change rates in the sample temperature change rate sequence. The maximum value in the target difference sequence is determined as the target rate of change threshold corresponding to the environmental parameter.

[0016] In the above technical solution, the target difference sequence is obtained by calculating the difference between the temperature change rates of two consecutive samples in the sample temperature change rate sequence, and the maximum value in the target difference sequence is used as the target change rate threshold corresponding to the current environmental parameter. This can accurately capture the maximum fluctuation characteristics of the temperature change rate during the evaporator frosting process under this environment. Using this as a threshold can ensure that the defrosting trigger can respond in a timely manner to the peak of the frosting rate under this environment, avoid the rapid accumulation of frost, and avoid premature defrosting to avoid energy waste, thereby improving the timeliness and accuracy of defrosting triggering.

[0017] In combination with the first aspect and the above implementation methods, in some possible implementations, the control method further includes: The mapping relationship between the maximum value in the target difference sequence and the environmental parameter is stored in the target mapping relationship, and the maximum value in the target difference sequence is used as the candidate rate of change threshold corresponding to the environmental parameter.

[0018] In the above technical solution, the mapping relationship between the maximum value of the target difference sequence determined under the uncalibrated environment and the corresponding environmental parameter is stored in the target mapping relationship. This realizes the dynamic updating and iterative optimization of the target mapping relationship. When the same environmental parameter is encountered in the future, the threshold can be directly matched without repeating the calculation. This can not only improve the efficiency of determining the rate of change threshold under the same working conditions in the future, but also allow the coverage of the mapping relationship to be continuously expanded, and gradually realize efficient and accurate threshold matching for all working conditions.

[0019] In combination with the first aspect and the above implementation methods, in some possible implementations, the control method further includes: Obtain the start-up time of the heat pump unit and the running time of the compressor in the heat pump unit; The temperature of the evaporator inlet of the heat pump unit is obtained based on a preset cycle, including: When the start-up time of the heat pump device is greater than or equal to a first time threshold and the running time of the compressor is greater than or equal to a second time threshold, the temperature of the evaporator inlet of the heat pump device is obtained based on a preset period, wherein the first time threshold is greater than the second time threshold.

[0020] In the above technical solution, by setting dual time thresholds for the start-up time of the heat pump device and the running time of the compressor, and only starting to collect the evaporator inlet temperature when both are met, the first time threshold is greater than the second time threshold. This avoids abnormal temperature data caused by unstable system pressure and load in the early stage of heat pump start-up, and also eliminates temperature fluctuation interference caused by non-continuous compressor operation. This ensures that the collected temperature data is the true data after the heat pump device has been operating stably, ensuring the accuracy of subsequent temperature change rate calculations and avoiding defrosting misjudgments caused by abnormal data in the early stage.

[0021] Combining the first aspect and the above-described implementations, in some possible implementations, the target temperature change rate of the evaporator inlet of the heat pump device is obtained based on the historical temperature of the evaporator inlet and the current temperature of the evaporator inlet of the heat pump device, including: When the current temperature at the evaporator inlet of the heat pump device is less than or equal to a preset temperature threshold, the target temperature change rate of the evaporator inlet of the heat pump device is obtained based on the historical temperature of the evaporator inlet of the heat pump device and the current temperature of the evaporator inlet of the heat pump device.

[0022] In the above technical solution, the target temperature change rate is calculated only when the current temperature at the evaporator inlet is less than or equal to the preset temperature threshold. This accurately defines the effective temperature range for frosting and filters out invalid temperature data in the non-frosting stage when the temperature is higher than the threshold. This avoids misjudging normal temperature fluctuations as frosting, improves the targeting and efficiency of defrosting judgment, and reduces the possibility of false defrosting.

[0023] Secondly, a control device for a heat pump device is provided, the control device comprising: The acquisition module is used to acquire the temperature of the evaporator inlet of the heat pump device based on a preset cycle; The processing module is used to obtain the target temperature change rate of the evaporator inlet of the heat pump device based on the historical temperature and the current temperature of the evaporator inlet of the heat pump device. The time interval between the acquisition time of the historical temperature and the acquisition time of the current temperature is N preset periods, where N is an integer greater than or equal to 2. Based on the target temperature change rate of the evaporator inlet of the heat pump device, the module controls the heat pump device to perform defrosting operation.

[0024] In conjunction with the second aspect, in some possible implementations, when N is 2, the processing module is further configured to obtain a first temperature change rate based on the current temperature of the evaporator inlet of the heat pump device at the current moment and the first historical temperature corresponding to the current temperature; obtain a second temperature change rate based on the first temperature of the evaporator inlet of the heat pump device at the previous moment at the current moment and the second historical temperature corresponding to the first temperature; and determine the target temperature change rate of the evaporator inlet of the heat pump device based on the first temperature change rate and the second temperature change rate when the first temperature change rate is less than a preset threshold and the second temperature change rate is less than a preset threshold.

[0025] In combination with the second aspect and the above implementation methods, in some possible implementation methods, the acquisition module is also used to acquire the environmental parameters of the current environment of the heat pump device; the processing module is also used to determine the target change rate threshold based on the environmental parameters; and when the target temperature change rate is greater than or equal to the target change rate threshold, control the heat pump device to perform defrosting operation.

[0026] In conjunction with the second aspect and the above implementation methods, in some possible implementation methods, the acquisition module is further used to acquire the target mapping relationship, which is used to indicate the mapping relationship between the preset environmental parameters and the candidate rate of change threshold; the processing module is further used to determine the candidate rate of change threshold as the target rate of change threshold if the target mapping relationship contains the candidate rate of change threshold corresponding to the environmental parameters; if the target mapping relationship does not contain the candidate rate of change threshold corresponding to the environmental parameters, control the heat pump device to operate for a target duration, and determine the target rate of change threshold corresponding to the environmental parameters based on the operation results.

[0027] Combining the second aspect and the above implementation methods, in some possible implementation methods, the running results include the acquisition of a sample temperature sequence at the evaporator inlet of the heat pump device within a target duration based on a preset period; the processing module is also used to obtain a sample temperature change rate sequence based on the first sample temperature and the second sample temperature in the sample temperature sequence, wherein the acquisition time of the first sample temperature and the acquisition time of the second sample temperature are N preset periods apart, where N is an integer greater than or equal to 2; and to determine the target change rate threshold corresponding to the environmental parameters based on the sample temperature change rate sequence.

[0028] In combination with the second aspect and the above implementation methods, in some possible implementation methods, the processing module is also used to obtain a target difference sequence based on the difference between each pair of consecutive sample temperature change rates in the sample temperature change rate sequence; and to determine the maximum value in the target difference sequence as the target change rate threshold corresponding to the environmental parameter.

[0029] In combination with the second aspect and the above implementation methods, in some possible implementation methods, the processing module is also used to store the mapping relationship between the maximum value in the target difference sequence and the environmental parameter in the target mapping relationship, and the maximum value in the target difference sequence is used as the candidate rate of change threshold corresponding to the environmental parameter.

[0030] In conjunction with the second aspect and the above implementation methods, in some possible implementation methods, the acquisition module is further used to acquire the start-up time of the heat pump device and the running time of the compressor in the heat pump device; the processing module is further used to acquire the temperature of the evaporator inlet of the heat pump device based on a preset period when the start-up time of the heat pump device is greater than or equal to a first time threshold and the running time of the compressor is greater than or equal to a second time threshold, wherein the first time threshold is greater than the second time threshold.

[0031] In conjunction with the second aspect and the above implementation methods, in some possible implementation methods, the processing module is further configured to obtain the target temperature change rate of the evaporator inlet of the heat pump device based on the historical temperature of the evaporator inlet of the heat pump device and the current temperature of the evaporator inlet of the heat pump device when the current temperature of the evaporator inlet of the heat pump device is less than or equal to a preset temperature threshold.

[0032] Thirdly, a heat pump device is provided, including a memory and a processor. The memory is used to store executable program code, and the processor is used to call and run the executable program code from the memory, causing the heat pump device to perform the methods of the first aspect or any possible implementation thereof.

[0033] Fourthly, a computer program product is provided, comprising: computer program code, which, when run on a computer, causes the computer to perform the methods described in the first aspect or any possible implementation thereof.

[0034] Fifthly, a computer-readable storage medium is provided that stores computer program code, which, when executed on a computer, causes the computer to perform the methods described in the first aspect or any possible implementation thereof. Attached Figure Description

[0035] Figure 1 This is a system architecture diagram of a heat pump device provided in an embodiment of this application; Figure 2 This is a schematic flowchart of a control method for a heat pump device provided in an embodiment of this application; Figure 3 This is a trend diagram of evaporator inlet temperature variation provided in an embodiment of this application; Figure 4This is a schematic flowchart of another control method for a heat pump device provided in an embodiment of this application; Figure 5 This is a schematic diagram of the structure of a control device for a heat pump device provided in an embodiment of this application; Figure 6 This is a schematic diagram of the structure of a heat pump device provided in an embodiment of this application. Detailed Implementation

[0036] The technical solutions in this application will be clearly and thoroughly described below with reference to the accompanying drawings. In the description of the embodiments of this application, unless otherwise stated, " / " means "or," for example, A / B can mean A or B. "And / or" in the text is merely a description of the relationship between related objects, indicating that three relationships can exist. For example, A and / or B can represent: A existing alone, A and B existing simultaneously, and B existing alone. Furthermore, in the description of the embodiments of this application, "multiple" refers to two or more than two.

[0037] Hereinafter, the terms "first" and "second" are used for descriptive purposes only and should not be construed as implying or suggesting relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature.

[0038] Pool heaters are specialized temperature and humidity control devices designed specifically for swimming pools. Their core functions include constant temperature heating of pool water and dehumidification of the indoor pool space. They can also recover waste heat from the air for pool water heating, significantly improving energy efficiency. In addition, they can also provide indoor ventilation and regulate air temperature and humidity, effectively preventing condensation and mold growth on the walls and floors around the pool. They ensure a comfortable operating temperature for the pool water and maintain a dry indoor environment in the pool area, making them suitable for the environmental control needs of various commercial and residential indoor swimming pools.

[0039] The constant temperature heating function of the swimming pool machine is achieved through the heat pump device configured within it. Figure 1 This is a system architecture diagram of a heat pump device provided in an embodiment of this application. Figure 1 As shown, the heat pump device 100 has core system components including a compressor 101, a condenser 102, a throttling device 103, and an evaporator 104.

[0040] Compressor 101 is used to compress low-temperature, low-pressure gaseous refrigerant into high-temperature, high-pressure gaseous refrigerant, providing the energy basis for subsequent heat release. Common types include scroll and rotary compressors, which are key components for the heating efficiency of heat pumps.

[0041] The condenser 102 can be a heat exchanger or a water tank heat exchange coil, etc. The high-temperature, high-pressure gaseous refrigerant releases heat at the condenser 102, which is transferred to the cold water in the water tank, raising the water temperature. Simultaneously, the refrigerant itself is condensed into a high-pressure liquid. For split-type heat pumps, the condenser is often a coaxial or shell-and-tube heat exchanger, separately arranged from the water storage tank; for integrated heat pumps, the condenser is directly coiled inside the water storage tank, resulting in higher heat exchange efficiency.

[0042] The throttling device 103 may include an expansion valve or a capillary tube, etc., to throttle and reduce pressure, converting the high-pressure liquid refrigerant into a low-temperature, low-pressure gas-liquid mixture, preparing the refrigerant for heat absorption in the evaporator. Among them, the capillary tube has a simple structure and low cost, and is mostly used in small household heat pumps; the electronic expansion valve (EXV) can precisely regulate the refrigerant flow rate, adapting to different operating conditions, and is mostly used in variable frequency heat pumps or commercial heat pumps.

[0043] Evaporator 104, also known as an air-side heat exchanger, allows a low-temperature, low-pressure gas-liquid mixture of refrigerant to absorb heat from the outside air, completely vaporizing into a low-temperature, low-pressure gaseous refrigerant, which then re-enters the compressor to complete the cycle. Evaporators are typically equipped with finned structures to increase the contact area with air and improve heat absorption efficiency.

[0044] When the heat pump unit is in heating mode, the surface temperature of the outdoor heat exchanger is lower than the dew point temperature of the ambient air and below 0°C. At this time, water vapor in the air comes into contact with the low-temperature heat exchanger fins and copper tubes, and will first condense into water, and then quickly freeze into frost. When the outdoor ambient humidity is high and the temperature is in the high humidity and low temperature range of 0~5°C, this water condensation and frost phenomenon will be more obvious. At the same time, the heat exchange efficiency of the heat exchanger will decrease further, causing its surface temperature to drop further, and exacerbating the frosting process.

[0045] To prevent frost buildup in heat pump units from affecting their heating efficiency, it is necessary to control the heat pump unit to perform defrosting operations. In existing technologies, a temperature threshold is typically set; when the temperature of the condenser surface in the heat pump unit is detected to drop below the threshold, the heat pump unit is controlled to activate defrosting mode. However, existing technologies, which trigger defrosting only with a fixed temperature threshold, cannot adapt to the dynamic process and complex operating conditions of condenser frost buildup in heat pumps, easily leading to problems such as false defrosting, untimely defrosting, and frequent defrosting. For example, in high humidity environments, the condenser temperature will drop rapidly to the threshold. If the defrost is triggered only according to the fixed threshold, the frost layer will easily accumulate due to the trigger lag, significantly reducing the heat exchange efficiency. On the other hand, in low humidity and very slow frost conditions, although the temperature drops to the threshold, the frost layer is very thin. Triggering defrost at this time will result in ineffective defrosting, which will not only waste energy and increase unit wear, but also interrupt heating operation and affect the indoor heating effect. At the same time, fluctuations in outdoor ambient temperature and humidity, as well as changes in unit operating load, will cause the frost layer thickness to vary greatly at the same temperature threshold. The fixed threshold cannot accurately match the actual need for the frost layer to reach the required defrost thickness. The defrost timing determined solely by static temperature lacks accuracy.

[0046] In view of the problems existing in the prior art, this application provides a control method for a heat pump device. This control method acquires the temperature at the evaporator inlet of the heat pump device based on a preset period; then, by combining the historical temperature and the current temperature at the evaporator inlet, a target temperature change rate is determined; finally, the heat pump device is controlled to perform a defrosting operation based on the target temperature change rate at the evaporator inlet. By controlling the heat pump device using this method, the problem of low defrosting efficiency caused by relying on a single temperature threshold can be eliminated, thereby improving the defrosting efficiency of the heat pump device.

[0047] The following is combined with Figures 2 to 4 The control method of the heat pump device provided in the embodiments of this application will be described in detail.

[0048] Figure 2 This is a schematic flowchart illustrating a control method for a heat pump device provided in an embodiment of this application. It should be understood that this control method can be applied to a heat pump device; or, to a processor within a heat pump device; or, to a chip within a processor of a heat pump device.

[0049] For example, such as Figure 2 As shown, the control method 200 includes: S201, the temperature of the evaporator inlet of the heat pump device is obtained based on a preset cycle.

[0050] The preset period can be 1 minute, 2 minutes, etc.

[0051] For example, a temperature sensor is installed at the evaporator inlet of the heat pump device. During the operation of the heat pump device, the temperature sensor can detect the temperature of the evaporator inlet in real time, and then acquire the temperature of the evaporator inlet at preset intervals.

[0052] For example, the temperature at the evaporator inlet of a heat pump unit can be represented by T3.

[0053] In one implementation, the start-up time of the heat pump device and the running time of the compressor in the heat pump device are obtained; The process of obtaining the evaporator inlet temperature of a heat pump device based on a preset period may specifically include: When the start-up time of the heat pump device is greater than or equal to a first time threshold and the running time of the compressor is greater than or equal to a second time threshold, the temperature of the evaporator inlet of the heat pump device is obtained based on a preset period, wherein the first time threshold is greater than the second time threshold.

[0054] For example, the startup time of the heat pump device and the runtime of the compressor in the heat pump device after startup are statistically analyzed. When the startup time of the heat pump device is greater than or equal to a first time threshold and the runtime of the compressor is greater than or equal to a second time threshold, the heat pump device is in a stable operating state, and the temperature of the evaporator inlet of the heat pump device can be obtained according to a preset cycle.

[0055] In one implementation, a first duration threshold is determined by taking into account the ambient temperature T4 of the environment in which the heat pump device is currently located.

[0056] For example, when the ambient temperature T4 > -10℃, the water vapor content in the air is relatively higher, the frost formation rate on the heat pump condenser surface is fast, and the frost layer is easy to accumulate quickly. If defrosting is only allowed to be triggered after startup for too long, the frost layer will be too thick and affect heat exchange. Therefore, the first time threshold can be determined to be a short time, such as 35 minutes, so that the heat pump device reaches this time after startup, and defrosting can be determined in conjunction with the temperature change rate to ensure timely defrosting. When the ambient temperature T4 < -10℃, it belongs to the low humidity and ultra-low temperature zone, the water vapor content in the air is greatly reduced, the frost formation rate is significantly slower, and the frost layer accumulation period is long. If a short time threshold is still used, the defrosting judgment condition is easily met when the frost layer is extremely thin, resulting in invalid defrosting. Therefore, a long time threshold can be set, such as 100 minutes, to avoid frequent defrosting triggering shortly after the heat pump device starts up, reducing energy waste and heating interruption.

[0057] For example, the value of the second duration threshold can be between 6 minutes and 30 minutes to ensure the stable operation of the compressor. This application embodiment does not specifically limit the setting of the duration threshold.

[0058] In this embodiment, by setting dual time thresholds for the start-up time of the heat pump device and the running time of the compressor, and only starting to collect the evaporator inlet temperature when both are met, the first time threshold is greater than the second time threshold. This avoids abnormal temperature data caused by unstable system pressure and load in the early stage of heat pump start-up, and also eliminates temperature fluctuation interference caused by non-continuous operation of the compressor. This ensures that the collected temperature data is the real data after the heat pump device has been running stably, ensuring the accuracy of subsequent temperature change rate calculation and avoiding defrosting misjudgment caused by abnormal data in the early stage.

[0059] S202, based on the historical temperature of the evaporator inlet of the heat pump device and the current temperature of the evaporator inlet of the heat pump device, obtain the target temperature change rate of the evaporator inlet of the heat pump device. The time interval between the acquisition time of the historical temperature and the acquisition time of the current temperature is N preset periods, where N is an integer greater than or equal to 2.

[0060] For example, during the operation of a heat pump device, the temperatures of multiple evaporator inlets can be acquired, including the current temperature of the evaporator inlet and historical temperatures at acquisition intervals of N preset periods. By combining the current temperature and historical temperatures, the target temperature change rate of the evaporator inlet of the heat pump device can be analyzed.

[0061] For example, when N is 2, if the current temperature is the temperature of the 3rd minute, the corresponding historical temperature is the temperature of the 1st minute; if the current temperature is the temperature of the 4th minute, the corresponding historical temperature is the temperature of the 2nd minute; if the current temperature is the temperature of the 5th minute, the corresponding historical temperature is the temperature of the 3rd minute; and so on.

[0062] For example, when N is 3, if the current temperature is the temperature of the 4th minute, the corresponding historical temperature is the temperature of the 1st minute; if the current temperature is the temperature of the 5th minute, the corresponding historical temperature is the temperature of the 2nd minute; if the current temperature is the temperature of the 6th minute, the corresponding historical temperature is the temperature of the 3rd minute; and so on.

[0063] This application uses an example where N is 2. When N takes other values, the implementation of this application can be adjusted accordingly, and this application will not elaborate on these adjustments.

[0064] In one implementation, when N is 2, the process of obtaining the target temperature change rate of the evaporator inlet of the heat pump device based on the historical temperature of the evaporator inlet and the current temperature of the evaporator inlet of the heat pump device may specifically include: The first temperature change rate is obtained based on the current temperature of the evaporator inlet of the heat pump device at the current moment and the first historical temperature corresponding to the current temperature. The second temperature change rate is obtained based on the first temperature of the evaporator inlet of the heat pump device at the current moment and the second historical temperature corresponding to the first temperature at the previous moment. When the first temperature change rate is less than a preset threshold and the second temperature change rate is less than a preset threshold, the target temperature change rate of the evaporator inlet of the heat pump device is determined based on the first temperature change rate and the second temperature change rate.

[0065] For example, after obtaining the current temperature and historical temperature, a first temperature change rate can be determined based on the current temperature and the corresponding first historical temperature. This first rate represents the temperature change rate of the evaporator inlet over two consecutive preset periods prior to the current moment. The first temperature change rate can be obtained by subtracting the first historical temperature from the current temperature. Simultaneously, a second temperature change rate can be determined based on the first temperature corresponding to the moment before the current moment and the corresponding second historical temperature. This second rate represents the temperature change rate of the evaporator inlet over two consecutive preset periods prior to the moment before the current moment. The second rate of change can be obtained by subtracting the second historical temperature from the first temperature. After calculating the first and second temperature change rates, it is determined whether both are less than a preset threshold. If both are less than the preset threshold, the difference between the first and second temperature change rates is determined as the target temperature change rate of the evaporator inlet of the heat pump device.

[0066] For example, the preset threshold value is 0. When both the first temperature change rate and the second temperature change rate are less than 0, it can be indicated that the temperature at the evaporator inlet is decreasing for two consecutive time periods (the time period includes two preset periods). At this time, the heat pump device is more likely to frost. At the same time, it can avoid the temperature change rate from fluctuating due to the valve assembly, which may cause the temperature to drop first and then rise, thus leading to misjudgment and affecting the defrosting judgment process.

[0067] It should be understood that since the same preset period and N value are used in both data acquisition and calculation processes, the difference between the first and second temperature change rates can be used to determine the target temperature change rate.

[0068] For example, the obtained evaporator inlet temperature includes the second historical temperature at time n-3. The first historical temperature at time n-2 is The first temperature at time n-1 (that is, the time before the current time) is The current temperature at time n (i.e., the current time) is Let's illustrate with an example. Based on the current temperature at time n... and the first historical temperature at time n-2 The first rate of temperature change, a, can be obtained as follows: - According to the first temperature at time n-1, The second historical temperature at time n-3 is The second temperature change rate b can be obtained as follows: - Then, with a < 0 and b < 0, the target temperature change rate c can be obtained as ab.

[0069] For example, Figure 3 This is a trend graph of evaporator inlet temperature variation provided in an embodiment of this application. The horizontal axis represents time t, in minutes (min); the vertical axis represents the evaporator inlet temperature T of the heat pump device, in degrees Celsius (°C). Figure 3 As shown, point A represents the current temperature at the current moment, point B represents the first temperature at the previous moment, point C represents the first historical temperature corresponding to the current temperature, and point D represents the second historical temperature corresponding to the first temperature. By calculating the difference between the temperatures indicated by points A and C, the first temperature change rate 'a' can be obtained. By calculating the difference between the temperatures indicated by points B and D, the second temperature change rate 'b' can be obtained. Then, by subtracting the second temperature change rate from the first temperature change rate, the target temperature change rate can be determined.

[0070] In this embodiment, when N is 2, two sets of temperature change rates are calculated, and the difference between the two is used as the target temperature change rate only when both sets of change rates are less than a preset threshold. This not only eliminates abnormal interference caused by temperature fluctuations in a single time period through dual-set data verification, but also uses the difference to further accurately quantify the trend of frost formation. This makes the calculated target temperature change rate more consistent with the actual frost formation state, avoids false defrosting judgments caused by random temperature data, and improves the accuracy and reliability of the target temperature change rate.

[0071] In one implementation, the target temperature change rate of the evaporator inlet of the heat pump device is obtained based on the historical temperature and the current temperature of the evaporator inlet of the heat pump device, including: When the current temperature at the evaporator inlet of the heat pump device is less than or equal to a preset temperature threshold, the target temperature change rate of the evaporator inlet of the heat pump device is obtained based on the historical temperature of the evaporator inlet of the heat pump device and the current temperature of the evaporator inlet of the heat pump device.

[0072] For example, the preset temperature threshold ranges from -20℃ to -1℃. When the evaporator inlet temperature is higher than the preset temperature threshold, even if the temperature drops, it is mostly due to temperature fluctuations during normal operation of the heat pump. Water vapor in the air will only condense into water rather than form frost. At this time, calculating the rate of temperature change has no practical significance for defrosting. Only when the temperature is less than or equal to the preset temperature threshold, the evaporator surface meets the condition of frosting below 0℃. At this time, the temperature change is directly related to the heat exchange attenuation caused by frost accumulation. The rate of temperature drop at the evaporator inlet is more obvious. Only then can the calculated rate of temperature change truly reflect the speed of frost formation and provide a valid basis for subsequent defrosting determination.

[0073] In this embodiment, the target temperature change rate is calculated only when the current temperature at the evaporator inlet is less than or equal to a preset temperature threshold. This accurately defines the effective temperature range for frosting and filters out invalid temperature data in the non-frosting stage when the temperature is higher than the threshold. This avoids misjudging normal temperature fluctuations as frosting, improves the targeting and efficiency of defrosting determination, and reduces the possibility of false defrosting.

[0074] S203, based on the target temperature change rate at the evaporator inlet of the heat pump unit, controls the heat pump unit to perform defrosting operation.

[0075] For example, after determining the target temperature change rate at the evaporator inlet, it can be determined whether to control the heat pump unit to perform defrosting operation by judging the value of the target temperature change rate.

[0076] Optionally, the specific process of controlling the heat pump device to perform defrost operation may include: first, switching the refrigerant flow direction through a four-way reversing valve to temporarily turn the outdoor frosted heat exchanger into a condenser, using the high-temperature and high-pressure refrigerant discharged from the compressor to release heat and melt the frost layer, while simultaneously turning off the indoor fan, and the water generated during defrosting is discharged through a drip tray and drain pipe. After detecting that the outdoor heat exchanger temperature has risen back to the set value, or after the defrosting operation has reached the preset defrosting time, the original reversing state is switched back, the fan is restarted, and normal constant temperature dehumidification and heating conditions are restored. The entire process is completed automatically and takes into account the core requirements of temperature and humidity control for the pool machine, avoiding the impact of frost layer on heat exchange efficiency and operational stability.

[0077] In one implementation, environmental parameters of the current environment in which the heat pump device is located are obtained; Determine the target rate of change threshold based on environmental parameters; The process of controlling the defrosting operation of a heat pump unit based on the target temperature change rate at the evaporator inlet of the heat pump unit may specifically include: When the target temperature change rate is greater than or equal to the target change rate threshold, the heat pump device is controlled to perform defrosting operation.

[0078] Environmental parameters may include dry-bulb temperature and relative humidity. Dry-bulb temperature refers to the actual air temperature measured directly with a regular thermometer in a dry state; relative humidity refers to the percentage of the actual amount of water vapor in the air (absolute humidity) at a specific temperature to the maximum amount of water vapor the air can hold at that temperature (saturation humidity), and is used to reflect the degree of humidity of the air.

[0079] For example, the frosting condition of a heat pump unit varies depending on the environment in which it operates. Environmental parameters of the current environment in which the heat pump unit operates are collected; then, based on these parameters, a corresponding target rate of change threshold is determined; when the target temperature change rate at the evaporator inlet is detected to be greater than or equal to the target rate of change threshold, it indicates that the defrosting cycle capacity has reached its maximum, and the heat pump unit can then be controlled to perform defrosting operations.

[0080] In this embodiment, by acquiring the environmental parameters of the environment in which the heat pump device is located, and determining the appropriate target rate of change threshold accordingly, and then controlling defrosting based on the comparison between the target temperature rate of change and the target rate of change threshold, the defrosting judgment threshold is dynamically adjusted according to the environmental conditions. This avoids the problem of insufficient adaptability of a fixed threshold in different environments, allowing defrosting control to conform to the frost patterns under different temperatures and humidity conditions, further improving the accuracy of defrosting judgment and adaptability to environmental conditions, meeting the defrosting needs in different environments, and improving defrosting efficiency in different environments.

[0081] In one implementation, a target mapping relationship is obtained, which is used to indicate the mapping relationship between preset environmental parameters and candidate rate of change thresholds; Based on environmental parameters, determine the target rate of change threshold, including: If the target mapping relationship contains candidate change rate thresholds corresponding to environmental parameters, the candidate change rate thresholds are determined as the target change rate thresholds. If the target mapping relationship does not include candidate change rate thresholds corresponding to environmental parameters, control the target operating time of the heat pump device, and determine the target change rate thresholds corresponding to environmental parameters based on the operating results.

[0082] The target duration can be any length between 30 and 60 minutes to achieve a complete operating cycle of the heat pump device.

[0083] For example, a target mapping relationship between preset environmental parameters and candidate rate of change thresholds is pre-stored. After obtaining the environmental parameters of the current environment in which the heat pump device is located, the target mapping relationship is checked to see if it contains the candidate rate of change threshold corresponding to the current environmental parameters. If it exists, the candidate rate of change threshold is determined as the target temperature rate of change threshold; if it does not exist, the heat pump device is controlled to run for a target duration, and then the target rate of change threshold corresponding to the environmental parameters is determined based on the running results within the target duration.

[0084] For example, the target mapping relationship can be represented by a mapping relationship table, as shown in Table 1 below.

[0085] Table 1

[0086] In Table 1, X represents dry-bulb temperature in degrees Celsius (°C); Y represents relative humidity in percentages. to This is used to indicate the preset rate of change thresholds corresponding to different dry-bulb temperature ranges and different relative humidity ranges. Different preset rate of change thresholds correspond to different dry-bulb temperature ranges and relative humidity ranges; after obtaining the dry-bulb temperature and relative humidity of the current environment, the corresponding candidate rate of change thresholds can be determined based on the current environmental parameters.

[0087] It should be noted that the mapping table corresponding to the above target mapping relationship may not have the corresponding candidate change rate threshold data in the initial stage, or the data may not be fully filled. Based on the continuous operation of the heat pump device and the switching of environmental conditions, the mapping table can be supplemented and improved in conjunction with the implementation process described later, so that the mapping table can cover all environmental parameter ranges.

[0088] In this embodiment, the target rate of change threshold is quickly matched by the mapping relationship between preset environmental parameters and candidate rate of change thresholds. At the same time, for cases where there are no corresponding parameters in the mapping relationship, the target rate of change threshold is determined by the target operating time of the unit and the operating results. This can ensure the efficiency of threshold determination under normal conditions and realize personalized adaptation of threshold under special or unpreset conditions, so that the determination of the target rate of change threshold covers all operating conditions and improves the comprehensiveness and adaptability of defrosting control.

[0089] In one implementation, the operating results include a sample temperature sequence at the evaporator inlet of the heat pump device acquired within a target duration based on a preset period; and based on the operating results, a target rate of change threshold for environmental parameters is determined, including: Based on the first sample temperature and the second sample temperature in the sample temperature sequence, a sample temperature change rate sequence is obtained. The sampling time of the first sample temperature and the sampling time of the second sample temperature are N preset periods apart, where N is an integer greater than or equal to 2. Based on the sample temperature change rate sequence, the target change rate threshold corresponding to the environmental parameters is determined.

[0090] For example, during the process of controlling the operation of a heat pump device for a target duration, a sample temperature sequence of the evaporator inlet can be obtained based on a preset period (e.g., 1 minute) within the target duration. This sample temperature sequence includes the sample temperature at each time point corresponding to the preset period. Furthermore, based on the first and second sample temperatures at N preset period intervals in each group of the sample temperature sequence, a sample temperature change rate sequence can be calculated. This sequence includes the sample temperature change rates corresponding to multiple time periods. Finally, based on the sample temperature change rate sequence, the target change rate threshold corresponding to the environmental parameters can be determined.

[0091] For example, if the temperature of the first sample is collected before the temperature of the second sample, the difference between the temperature of the second sample and the temperature of the first sample can be determined as the rate of change of the sample temperature corresponding to this set of data.

[0092] For example, suppose the obtained sample temperature sequence is { , … , The calculated sample temperature change rate sequence can be represented as { , , … , }

[0093] In this embodiment of the application, for environmental parameters that are not preset, the sample temperature change rate sequence is calculated based on the sample temperature sequence collected within the target time period according to the rule of N preset periods, and then the target change rate threshold is determined accordingly. This ensures that the determination of the target change rate threshold is based on the real sample data of the temperature change of the heat pump evaporator under the environment, rather than empirical values, thus guaranteeing the objectivity and accuracy of the target change rate threshold under special conditions. This allows it to truly conform to the frosting pattern of the environment and provide a reliable basis for subsequent precise defrosting.

[0094] In one implementation, the process of determining the target rate of change threshold for environmental parameters based on the sample temperature change rate sequence may specifically include: The target difference sequence is obtained based on the difference between each pair of consecutive sample temperature change rates in the sample temperature change rate sequence. The maximum value in the target difference sequence is determined as the target rate of change threshold corresponding to the environmental parameter.

[0095] For example, after determining the sample temperature change rate sequence, the difference between each consecutive sample temperature change rate in the sample temperature change rate sequence is calculated to obtain the target difference sequence; then, the maximum value in the target difference sequence can be determined as the target change rate threshold corresponding to the environmental parameter.

[0096] For example, the maximum value in the target difference sequence can also be called the "inflection point". This inflection point can indicate that the frost layer on the surface of the heat pump device's finned heat exchanger is close to its limit. At this time, the cycle capacity of the equipment's defrosting cycle often reaches its maximum value. Therefore, this inflection point is the optimal time for the heat pump device to defrost. Thus, the maximum value in the target difference sequence can be determined as the target rate of change threshold corresponding to the current environmental parameters.

[0097] For example, when the sample temperature change rate sequence is { , , … , When}, the corresponding target difference sequence can be represented as {( )-( (), )-( )...( )-( By comparing the magnitudes of each difference in the target difference sequence, the maximum value in the target difference sequence can be determined, and this maximum value is set as the target rate of change threshold corresponding to the environmental parameter. Furthermore, when the target temperature change rate at the evaporator inlet is detected to be greater than or equal to the target rate of change threshold corresponding to the current environmental parameter, the heat pump unit can be controlled to perform a defrosting operation.

[0098] In this embodiment, a target difference sequence is obtained by calculating the difference between the temperature change rates of two consecutive samples in the sample temperature change rate sequence. The maximum value in the target difference sequence is used as the target change rate threshold corresponding to the current environmental parameter. This can accurately capture the maximum fluctuation characteristics of the temperature change rate during the evaporator frosting process under this environment. Using this as a threshold can ensure that the defrosting trigger can respond in a timely manner to the peak of the frosting rate under this environment, avoid rapid accumulation of frost, and avoid premature defrosting to prevent energy waste, thereby improving the timeliness and accuracy of defrosting triggering.

[0099] In one implementation, the mapping relationship between the maximum value in the target difference sequence and the environmental parameter is stored in the target mapping relationship, and the maximum value in the target difference sequence is used as the candidate rate of change threshold corresponding to the environmental parameter.

[0100] For example, if the initial target mapping relationship does not include the target rate of change threshold corresponding to the environmental parameters of the current environment, the maximum value in the target difference sequence can be determined by controlling the operation time of the heat pump device to the target duration, which is the target rate of change threshold corresponding to the environmental parameters. Then, the maximum value in the target difference sequence can be used as the candidate rate of change threshold corresponding to the environmental parameters, and the mapping relationship between the candidate rate of change threshold and the environmental parameters can be stored in the target mapping relationship for use in subsequent similar environmental conditions.

[0101] In this embodiment, the mapping relationship between the maximum value of the target difference sequence determined under uncalibrated environment and the corresponding environmental parameter is stored in the target mapping relationship. This realizes the dynamic updating and iterative optimization of the target mapping relationship. When the same environmental parameter is encountered in the future, the threshold can be directly matched without repeating the calculation. This can improve the efficiency of determining the rate of change threshold under the same working conditions in the future, and allow the coverage of the mapping relationship to be continuously expanded, gradually realizing efficient and accurate threshold matching for all working conditions.

[0102] In summary, in this embodiment, by collecting the evaporator inlet temperature at a preset cycle, calculating the target temperature change rate by combining the historical and current temperatures at intervals of N cycles, and controlling the heat pump device to defrost based on the target temperature change rate, the limitations of a single temperature threshold determination are overcome. This can accurately reflect the actual frosting rate of the evaporator, making the defrosting trigger timing more closely match the actual frosting state, effectively reducing false defrosting and untimely defrosting problems, improving the accuracy and adaptability of heat pump defrosting control, and thus improving the defrosting efficiency of the heat pump device.

[0103] Figure 4 This is a schematic flowchart illustrating another control method for a heat pump device provided in an embodiment of this application. It should be understood that this control method can be applied to a heat pump device; or, to a processor within a heat pump device; or, to a chip within a processor of a heat pump device.

[0104] For example, such as Figure 4 As shown, the control method 300 includes: S301, obtain the start-up time of the heat pump unit and the running time of the compressor in the heat pump unit.

[0105] Specifically, the heat pump device can refer to the heat pump device in the pool machine, which is used to regulate the water temperature of the pool.

[0106] For example, after the heat pump unit is turned on, the start-up time of the heat pump unit and the running time of the compressor in the heat pump unit are monitored.

[0107] S302, when the start-up time of the heat pump device is greater than or equal to a first time threshold and the running time of the compressor is greater than or equal to a second time threshold, the temperature of the evaporator inlet of the heat pump device is obtained based on a preset cycle, and the environmental parameters of the current environment of the heat pump device are obtained.

[0108] The first duration threshold is greater than the second duration threshold. The first duration threshold can be set to 35 minutes or 100 minutes, etc.; optionally, the setting of the first duration threshold can be determined based on the ambient temperature of the current environment where the heat pump device is located. The value range of the second duration threshold can be from 6 minutes to 30 minutes.

[0109] For example, when the start-up time of the heat pump device is detected to be greater than or equal to a first time threshold and the running time of the compressor is greater than or equal to a second time threshold, the temperature of the evaporator inlet of the heat pump device is acquired at preset intervals (e.g., 1 minute), and the environmental parameters of the current environment of the heat pump device are acquired. The environmental parameters may include dry bulb temperature and relative humidity, etc.

[0110] S303, based on the historical temperature of the evaporator inlet of the heat pump device and the current temperature of the evaporator inlet of the heat pump device, obtain the target temperature change rate of the evaporator inlet of the heat pump device.

[0111] The historical temperature data collection time is N preset periods apart from the current temperature data collection time, where N is an integer greater than or equal to 2.

[0112] For example, after obtaining the temperature at the evaporator inlet, the target rate of change of the evaporator inlet temperature can be determined based on the historical temperature and the current temperature.

[0113] Alternatively, the implementation of S303 can be found in [reference needed]. Figure 2 The relevant description of S202 is not repeated here in the embodiments of this application.

[0114] S304, determine whether there is a target change rate threshold corresponding to the environmental parameter in the target mapping relationship. If yes, proceed to S309; ​​otherwise, proceed to S305.

[0115] For example, after obtaining the environmental parameters of the current environment, it is determined whether there is a target change rate threshold corresponding to the current environmental parameters in the target mapping relationship; the target change rate threshold is used to determine whether the target temperature change rate meets the conditions for performing defrosting operation.

[0116] S305, within the target duration, acquire the sample temperature sequence of the evaporator inlet of the heat pump device based on a preset period.

[0117] For example, if there is no target change rate threshold for environmental parameters in the existing target mapping relationship, the heat pump device is controlled to run for a target duration in advance; and within the target duration, the sample temperature of the evaporator inlet of the heat pump device is obtained based on a preset cycle to obtain the sample temperature sequence within the target duration.

[0118] S306, based on the first sample temperature and the second sample temperature in the sample temperature sequence, obtain the sample temperature change rate sequence.

[0119] The time interval between the acquisition time of the first sample temperature and the acquisition time of the second sample temperature is N preset periods, where N is an integer greater than or equal to 2.

[0120] For example, based on the first and second sample temperatures at N preset intervals in the sample temperature sequence, multiple sample temperature change rates can be calculated, thereby forming a sample temperature change rate sequence.

[0121] S307, based on the difference between each pair of consecutive sample temperature change rates in the sample temperature change rate sequence, the target difference sequence is obtained.

[0122] For example, after obtaining the sample temperature change rate sequence, the difference between each pair of consecutive sample temperature change rates in the sample temperature change rate sequence can be calculated, thereby forming a target difference sequence.

[0123] S308, determine the maximum value in the target difference sequence as the target rate of change threshold corresponding to the environmental parameter.

[0124] For example, after obtaining the target difference sequence, the maximum value in the target difference sequence is determined; then the maximum value is determined as the target rate of change threshold corresponding to the environmental parameters of the current environment.

[0125] For example, the mapping relationship between the maximum value in the target difference sequence and the environmental parameters can be stored in the target mapping relationship to supplement and expand the target mapping relationship.

[0126] S309: When the target temperature change rate is greater than or equal to the target change rate threshold, control the heat pump device to perform defrosting operation.

[0127] For example, after obtaining the target temperature change rate at the evaporator inlet and the target change rate threshold corresponding to the current environmental parameters, it is determined whether the target temperature change rate is greater than or equal to the target change rate threshold. If the target temperature change rate is greater than or equal to the target change rate threshold, the heat pump device is controlled to perform a defrost operation. If the target temperature change rate is less than the target change rate threshold, the target temperature change rate and environmental parameters are continuously monitored to ensure that the heat pump device is controlled to perform defrost in a timely manner when the conditions are met.

[0128] Alternatively, the implementation methods of S306 to S309 can be found in [reference needed]. Figure 2 The relevant description of S203 is not repeated here in the embodiments of this application.

[0129] In summary, in this embodiment, by using dual time thresholds for the heat pump device's start-up time and the compressor's running time, the collected evaporator inlet temperature is ensured to be valid data after the unit has stabilized, avoiding interference from abnormal data under unstable conditions. Simultaneously, by dynamically matching the target change rate threshold with environmental parameters, for environmental parameters without preset matching thresholds, the change rate threshold is determined by collecting sample temperature sequences, calculating sample change rates and difference sequences, and taking the maximum value. Furthermore, it can quickly match conventional environmental thresholds based on target mapping relationships. Finally, defrosting is triggered by comparing the target temperature change rate with the matching threshold. This makes the defrosting temperature data more accurate and the threshold matching more closely aligned with the frost patterns of different environments. It also achieves efficient determination in conventional environments and personalized, precise determination in special environments, effectively improving the accuracy and adaptability of defrosting triggering, reducing problems such as false defrosting and untimely defrosting, and ensuring the stable and efficient operation of the heat pump device.

[0130] The above text combined Figures 1 to 4 The control method of the heat pump device provided in the embodiments of this application is described in detail below; the following will be combined with Figure 5 and Figure 6 The apparatus embodiments of this application are described in detail below. It should be understood that the apparatus in the embodiments of this application can perform the various methods described in the foregoing embodiments of this application, that is, the specific working processes of the various products described below can be referred to the corresponding processes in the foregoing method embodiments.

[0131] Figure 5 This is a schematic diagram of the structure of a control device for a heat pump device provided in an embodiment of this application.

[0132] For example, such as Figure 5 As shown, the control device 400 includes: The acquisition module 401 is used to acquire the temperature of the evaporator inlet of the heat pump device based on a preset cycle; The processing module 402 is used to obtain the target temperature change rate of the evaporator inlet of the heat pump device based on the historical temperature and the current temperature of the evaporator inlet of the heat pump device. The time interval between the acquisition time of the historical temperature and the acquisition time of the current temperature is N preset periods, where N is an integer greater than or equal to 2. Based on the target temperature change rate of the evaporator inlet of the heat pump device, the module controls the heat pump device to perform defrosting operation.

[0133] In one possible implementation, when N is 2, the processing module 402 is further configured to obtain a first temperature change rate based on the current temperature of the evaporator inlet of the heat pump device at the current moment and the first historical temperature corresponding to the current temperature; obtain a second temperature change rate based on the first temperature of the evaporator inlet of the heat pump device at the previous moment and the second historical temperature corresponding to the first temperature; and determine the target temperature change rate of the evaporator inlet of the heat pump device based on the first temperature change rate and the second temperature change rate when the first temperature change rate is less than a preset threshold and the second temperature change rate is less than a preset threshold.

[0134] In one possible implementation, the acquisition module 401 is further configured to acquire environmental parameters of the current environment in which the heat pump device is located; the processing module 402 is further configured to determine a target rate of change threshold based on the environmental parameters; and control the heat pump device to perform a defrosting operation when the target rate of change is greater than or equal to the target rate of change threshold.

[0135] In one possible implementation, the acquisition module 401 is further configured to acquire a target mapping relationship, which indicates the mapping relationship between preset environmental parameters and candidate rate of change thresholds; the processing module 402 is further configured to, if the target mapping relationship contains candidate rate of change thresholds corresponding to environmental parameters, determine the candidate rate of change thresholds as target rate of change thresholds; if the target mapping relationship does not contain candidate rate of change thresholds corresponding to environmental parameters, control the target operating time of the heat pump device, and determine the target rate of change thresholds corresponding to environmental parameters based on the operating results.

[0136] In one possible implementation, the running results include a sample temperature sequence at the evaporator inlet of the heat pump device obtained within a target duration based on a preset period; the processing module 402 is further configured to obtain a sample temperature change rate sequence based on the first sample temperature and the second sample temperature in the sample temperature sequence, wherein the acquisition time of the first sample temperature and the acquisition time of the second sample temperature are N preset periods apart, where N is an integer greater than or equal to 2; and to determine the target change rate threshold corresponding to the environmental parameters based on the sample temperature change rate sequence.

[0137] In one possible implementation, the processing module 402 is further configured to obtain a target difference sequence based on the difference between each pair of consecutive sample temperature change rates in the sample temperature change rate sequence; and to determine the maximum value in the target difference sequence as the target change rate threshold corresponding to the environmental parameter.

[0138] In one possible implementation, the processing module 402 is further configured to store the mapping relationship between the maximum value in the target difference sequence and the environmental parameter in the target mapping relationship, and the maximum value in the target difference sequence is used as the candidate rate of change threshold corresponding to the environmental parameter.

[0139] In one possible implementation, the acquisition module 401 is further configured to acquire the start-up time of the heat pump device and the running time of the compressor in the heat pump device; the processing module 402 is further configured to acquire the temperature of the evaporator inlet of the heat pump device based on a preset period when the start-up time of the heat pump device is greater than or equal to a first time threshold and the running time of the compressor is greater than or equal to a second time threshold, wherein the first time threshold is greater than the second time threshold.

[0140] In one possible implementation, the processing module 402 is further configured to obtain the target temperature change rate of the evaporator inlet of the heat pump device based on the historical temperature of the evaporator inlet of the heat pump device and the current temperature of the evaporator inlet of the heat pump device when the current temperature of the evaporator inlet of the heat pump device is less than or equal to a preset temperature threshold.

[0141] It should be noted that the control device of the aforementioned heat pump unit is embodied in the form of functional units. The term "module" here can be implemented in software and / or hardware, without specific limitations.

[0142] For example, a "module" can be a software program, a hardware circuit, or a combination of both that implements the above functions. The hardware circuit may include an application-specific integrated circuit (ASIC), electronic circuits, a processor (e.g., a shared processor, a proprietary processor, or a group processor) and memory for executing one or more software or firmware programs, integrated logic circuits, and / or other suitable components that support the described functions.

[0143] Therefore, the units of the various examples described in the embodiments of this application can be implemented in electronic hardware, or a combination of computer software and electronic hardware. Whether these functions are implemented in hardware or software depends on the specific application and design constraints of the technical solution. Those skilled in the art can use different methods to implement the described functions for each specific application, but such implementation should not be considered beyond the scope of this application.

[0144] Figure 6 This is a schematic diagram of the structure of a heat pump device provided in an embodiment of this application.

[0145] For example, such as Figure 6 As shown, the heat pump device 100 includes a memory 501 and a processor 502. The memory 501 stores executable program code 503, and the processor 502 is used to call and execute the executable program code 503 to perform a control method for the heat pump device.

[0146] Furthermore, embodiments of this application also protect an apparatus that may include a memory and a processor, wherein the memory stores executable program code, and the processor is used to call and execute the executable program code to perform a control method for a heat pump device provided in embodiments of this application.

[0147] This embodiment can divide the device into functional modules based on the above method example. For example, each module can correspond to a separate function, or two or more functions can be integrated into one processing module. The integrated module can be implemented in hardware. It should be noted that the module division in this embodiment is illustrative and only represents one logical functional division. In actual implementation, there may be other division methods.

[0148] When the functional modules are divided according to their respective functions, the device may also include an acquisition module, a processing module, etc. It should be noted that all relevant content of each step involved in the above method embodiments can be referenced to the functional description of the corresponding functional module, and will not be repeated here.

[0149] It should be understood that the device provided in this embodiment is used to execute the control method of the heat pump device described above, and therefore can achieve the same effect as the above implementation method.

[0150] When using integrated units, the device may include a processing module and a storage module. Specifically, when applied to a heat pump device, the processing module can be used to control and manage the operation of the heat pump device. The storage module can be used to support the heat pump device in executing relevant program code, etc.

[0151] The processing module may be a processor or a controller, which can implement or execute the various exemplary logic blocks, modules, and circuits described in conjunction with the disclosure of this application. The processor may also be a combination of functions that implement computing capabilities, such as a combination of one or more microprocessors, a combination of digital signal processing (DSP) and a microprocessor, etc., and the storage module may be a memory.

[0152] In addition, the device provided in the embodiments of this application may specifically be a chip, component or module. The chip may include a connected processor and a memory. The memory is used to store instructions. When the processor calls and executes the instructions, the chip can execute a control method for a heat pump device provided in the above embodiments.

[0153] This embodiment also provides a computer-readable storage medium storing computer program code. When the computer program code is run on a computer, the computer executes the above-described related method steps to implement the control method for a heat pump device provided in the above embodiment.

[0154] The computer-readable storage medium may include, but is not limited to, any type of disk, including floppy disks, optical disks, Digital Video Discs (DVDs), Compact Disc Read-Only Memory (CD-ROMs), microdrives, and magneto-optical disks, read-only memory (ROMs), random access memory (RAMs), erasable programmable read-only memory (EPROMs), electrically erasable programmable read-only memory (EEPROMs), dynamic random access memory (DRAMs), video random access memory (VRAMs), flash memory devices, magnetic cards or optical cards, nanosystems (including molecular memory ICs), or any type of medium or device suitable for storing instructions and / or data.

[0155] This embodiment also provides a computer program product that, when run on a computer, causes the computer to perform the aforementioned related steps to implement a control method for a heat pump device provided in the above embodiment.

[0156] In this embodiment, the device, computer-readable storage medium, computer program product, or chip are all used to execute the corresponding methods provided above. Therefore, the beneficial effects they can achieve can be referred to the beneficial effects in the corresponding methods provided above, and will not be repeated here.

[0157] Through the above description of the embodiments, those skilled in the art will understand that, for the sake of convenience and brevity, only the division of the above functional modules is used as an example. In actual applications, the above functions can be assigned to different functional modules as needed, that is, the internal structure of the device can be divided into different functional modules to complete all or part of the functions described above.

[0158] In the embodiments provided in this application, it should be understood that the disclosed apparatus and methods can be implemented in other ways. For example, the apparatus embodiments described above are merely illustrative; for instance, the division of modules or units is only a logical functional division, and in actual implementation, there may be other division methods. For example, multiple units or components may be combined or integrated into another device, or some features may be ignored or not executed. Furthermore, the coupling or direct coupling or communication connection shown or discussed may be through some interfaces; the indirect coupling or communication connection between devices or units may be electrical, mechanical, or other forms.

[0159] The above description is merely a specific embodiment of this application, but the scope of protection of this application is not limited thereto. Any variations or substitutions that can be easily conceived by those skilled in the art within the scope of the technology disclosed in this application should be included within the scope of protection of this application. Therefore, the scope of protection of this application should be determined by the scope of the claims.

Claims

1. A control method for a heat pump device, characterized in that, The control method includes: The temperature of the evaporator inlet of the heat pump device is obtained based on a preset cycle; Based on the historical temperature of the evaporator inlet of the heat pump device and the current temperature of the evaporator inlet of the heat pump device, the target temperature change rate of the evaporator inlet of the heat pump device is obtained. The time interval between the acquisition time of the historical temperature and the acquisition time of the current temperature is N preset periods, where N is an integer greater than or equal to 2. Based on the target temperature change rate at the evaporator inlet of the heat pump device, the heat pump device is controlled to perform a defrosting operation.

2. The control method according to claim 1, characterized in that, When N is 2, the process of obtaining the target temperature change rate of the evaporator inlet of the heat pump device based on the historical temperature of the evaporator inlet and the current temperature of the evaporator inlet of the heat pump device includes: Based on the current temperature of the evaporator inlet of the heat pump device at the current moment and the first historical temperature corresponding to the current temperature, the first temperature change rate is obtained; Based on the first temperature of the evaporator inlet of the heat pump device at the previous time and the second historical temperature corresponding to the first temperature, the second temperature change rate is obtained. When the first temperature change rate is less than a preset threshold and the second temperature change rate is less than the preset threshold, the target temperature change rate of the evaporator inlet of the heat pump device is determined based on the first temperature change rate and the second temperature change rate.

3. The control method according to claim 1, characterized in that, The control method further includes: Obtain the environmental parameters of the current environment in which the heat pump device is located; Based on the aforementioned environmental parameters, determine the target rate of change threshold; The method of controlling the heat pump device to perform defrosting operation based on the target temperature change rate at the evaporator inlet of the heat pump device includes: When the target temperature change rate is greater than or equal to the target change rate threshold, the heat pump device is controlled to perform a defrosting operation.

4. The control method according to claim 3, characterized in that, The control method further includes: Obtain the target mapping relationship, which is used to indicate the mapping relationship between preset environmental parameters and candidate rate of change thresholds; Determining the target rate of change threshold based on the environmental parameters includes: If the target mapping relationship contains a candidate rate of change threshold corresponding to the environmental parameter, the candidate rate of change threshold is determined as the target rate of change threshold; If the target mapping relationship does not include the candidate rate of change threshold corresponding to the environmental parameter, the target operating time of the heat pump device is controlled, and the target rate of change threshold corresponding to the environmental parameter is determined based on the operating results.

5. The control method according to claim 4, characterized in that, The operational results include a sample temperature sequence at the evaporator inlet of the heat pump device obtained within the target duration based on a preset period; determining the target rate of change threshold corresponding to the environmental parameters based on the operational results includes: Based on the first sample temperature and the second sample temperature in the sample temperature sequence, a sample temperature change rate sequence is obtained, wherein the sampling time of the first sample temperature and the sampling time of the second sample temperature are spaced apart by N preset periods, where N is an integer greater than or equal to 2. Based on the sample temperature change rate sequence, the target change rate threshold corresponding to the environmental parameter is determined.

6. The control method according to claim 5, characterized in that, Determining the target rate of change threshold corresponding to the environmental parameter based on the sample temperature change rate sequence includes: Based on the difference between each pair of consecutive sample temperature change rates in the sample temperature change rate sequence, a target difference sequence is obtained; The maximum value in the target difference sequence is determined as the target rate of change threshold corresponding to the environmental parameter.

7. The control method according to claim 6, characterized in that, The control method further includes: The mapping relationship between the maximum value in the target difference sequence and the environmental parameter is stored in the target mapping relationship, and the maximum value in the target difference sequence is used as the candidate rate of change threshold corresponding to the environmental parameter.

8. The control method according to any one of claims 1 to 7, characterized in that, The control method further includes: The startup time of the heat pump device and the operating time of the compressor in the heat pump device are obtained. The method of obtaining the evaporator inlet temperature of the heat pump device based on a preset period includes: When the start-up time of the heat pump device is greater than or equal to a first time threshold and the running time of the compressor is greater than or equal to a second time threshold, the temperature of the evaporator inlet of the heat pump device is obtained based on the preset period, wherein the first time threshold is greater than the second time threshold.

9. The control method according to any one of claims 1 to 7, characterized in that, The method of obtaining the target temperature change rate of the evaporator inlet of the heat pump device based on the historical temperature and the current temperature of the evaporator inlet of the heat pump device includes: When the current temperature at the evaporator inlet of the heat pump device is less than or equal to a preset temperature threshold, the target temperature change rate at the evaporator inlet of the heat pump device is obtained based on the historical temperature at the evaporator inlet of the heat pump device and the current temperature at the evaporator inlet of the heat pump device.

10. A control device for a heat pump unit, characterized in that, The control device includes: The acquisition module is used to acquire the temperature of the evaporator inlet of the heat pump device based on a preset cycle; The processing module is used to obtain the target temperature change rate of the evaporator inlet of the heat pump device based on the historical temperature and the current temperature of the evaporator inlet of the heat pump device, wherein the time interval between the acquisition time of the historical temperature and the acquisition time of the current temperature is N preset periods, where N is an integer greater than or equal to 2; and to control the heat pump device to perform defrosting operation based on the target temperature change rate of the evaporator inlet of the heat pump device.

11. A heat pump device, characterized in that, The heat pump device includes: Memory, used to store executable program code; A processor is configured to call and run the executable program code from the memory, causing the heat pump device to perform the control method as described in any one of claims 1 to 9.

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