Composite test method, system and device of LED dot matrix module and storage medium

Abstract

The invention relates to a composite test method, system and device for an LED dot matrix module and a storage medium, and the method comprises the steps: carrying out the composite cycle test of the LED dot matrix module through a composite test box, and collecting the electrical working parameters, optical output parameters and light color parameters of the LED dot matrix module; and extracting change characteristics of the light color parameters in a plurality of continuous cycle periods, judging the change characteristics based on a preset degradation trend condition, and outputting performance degradation information when the change characteristics do not meet the preset degradation trend condition. According to the invention, a complex stress environment faced in actual work can be simulated, and a potential fault mode which is difficult to show in a single stress test is effectively excited.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of LED dot matrix modules, and particularly relates to a composite test method, system and device of an LED dot matrix module and a storage medium. BACKGROUND

[0002] At present, the test method for the LED dot matrix module mainly relies on the sequential loading of a single environmental stress and performance monitoring, and it is difficult to truly simulate the actual working state of the multi-stress coupling under complex working conditions. The limitations of the existing test methods cannot effectively trigger and accurately capture the potential composite failure modes of the LED dot matrix module, such as the fatigue fracture of the solder joint caused by the synergistic effect of temperature cycling and mechanical vibration, and the decay law of the light color parameters of the packaging material under long-term thermal stress, thereby causing the evaluation of the overall reliability of the module, especially the intermittent failure and long-term life, to be not accurate enough, which brings hidden dangers to the quality stability of the terminal product. SUMMARY

[0003] The main purpose of the present application is to provide a composite test method, system and device of an LED dot matrix module, which can simulate the complex stress environment faced by the LED dot matrix module in actual work, and effectively trigger the potential failure modes that are difficult to appear in single stress testing.

[0004] To achieve the above-mentioned purpose, the present application provides a composite test method of an LED dot matrix module, comprising: The composite test box is used to perform composite cycle testing on the LED dot matrix module, and electrical working parameters, optical output parameters and light color parameters of the LED dot matrix module are collected. The change characteristics of the light color parameters in continuous multiple cycle periods are extracted, and the change characteristics are judged based on a preset degradation trend condition. When the change characteristics do not conform to the preset degradation trend condition, performance degradation information is output.

[0005] Further, the composite test box is used to perform composite cycle testing on the LED dot matrix module, and the electrical working parameters, optical output parameters and light color parameters of the LED dot matrix module are collected, comprising: When the cycle testing stage is a high-temperature vibration stage, the box temperature of the composite test box is raised to a first temperature value and frequency spectrum vibration is applied, and first electrical parameters and first optical parameters of the LED dot matrix module are collected; At the end of the high-temperature vibration stage, first light color data of the LED dot matrix module are collected; When the cycle testing stage is a low-temperature static stage, the box temperature of the composite test box is lowered to a second preset value and the frequency spectrum vibration is stopped, and second electrical parameters and second optical parameters of the LED dot matrix module are collected; At the end of the low-temperature static stage, second light color data of the LED dot matrix module is collected, and the first light color data and the second light color data are integrated to obtain the light color parameter; The first electrical parameter and the second electrical parameter are integrated to obtain the electrical working parameter, and the first optical parameter and the second optical parameter are integrated to obtain the optical output parameter.

[0006] Further, the optical output parameter is calculated, and when the light intensity fluctuation exceeds a preset optical reference threshold, and the electrical working parameter meets a preset electrical interference condition, electrical connection abnormal information is generated: Light intensity waveform data in the optical output parameter is extracted, and according to a time length division rule, the light intensity waveform data is divided into a plurality of analysis time periods; In each analysis time period, a plurality of light intensity instantaneous values constituting the light intensity waveform data are read, and a difference between a maximum value and a minimum value of the light intensity instantaneous values is calculated to obtain the light intensity fluctuation; The light intensity fluctuation of each analysis time period is compared with the preset optical reference threshold, and when the light intensity fluctuation exceeds the preset optical reference threshold, the corresponding analysis time period is marked as a light intensity abnormal time period; In the light intensity abnormal time period, it is detected whether a transient voltage spike defined in the preset electrical interference condition appears in a voltage signal in the electrical working parameter; If the transient voltage spike appears, it is determined that the electrical working parameter meets the preset electrical interference condition, and the electrical connection abnormal information is generated.

[0007] Further, the detection of whether the transient voltage spike defined in the preset electrical interference condition appears in the voltage signal in the electrical working parameter in the light intensity abnormal time period includes: A corresponding voltage signal sequence is extracted from the electrical working parameter based on the light intensity abnormal time period, and voltage instantaneous values of each sampling point of the voltage signal sequence are read according to a sampling order in the preset electrical interference condition; Each voltage instantaneous value is compared with a voltage reference value in the preset electrical interference condition to obtain a voltage deviation amount; The voltage deviation amount is matched with a voltage fluctuation threshold in the preset electrical interference condition, and if the voltage deviation amount exceeds the preset voltage fluctuation threshold, the corresponding sampling point is marked as a voltage abnormal point; The number of all voltage abnormal points in the light intensity abnormal time period is counted, and if the number of voltage abnormal points exceeds an abnormal number threshold in the preset electrical interference condition, it is determined that the transient voltage spike appears.

[0008] Further, the extraction of the light color parameter in a plurality of continuous cycle periods, and based on the preset degradation trend condition on the change characteristics are determined, when the change characteristics do not conform to the preset degradation trend condition, output performance degradation information, including: From the light color parameter contains chroma parameter value and light flux parameter value of the change characteristics; Calculate the chroma parameter value and the preset chroma reference value of each cycle of the chroma offset, and the light flux parameter value and the preset light flux reference value of the light flux deviation; Respectively, the chroma offset and the light flux deviation are arranged in a cycle sequence to generate a chroma offset sequence and a light flux deviation sequence; Based on the preset degradation trend condition on the chroma offset sequence and the light flux deviation sequence are determined, when the chroma offset sequence and the light flux deviation sequence are not in line with the preset degradation trend condition, output the performance degradation information.

[0009] Further, the extraction of the light color parameter in a plurality of continuous cycle periods, and based on the preset degradation trend condition on the change characteristics are determined, when the change characteristics do not conform to the preset degradation trend condition, output performance degradation information, including: Based on the cycle period, the chroma offset sequence of the adjacent cycle is extracted, and the chroma offset sequence of the adjacent cycle is calculated for monotonicity to obtain a cycle sequence value; When the cycle sequence value exceeds the preset degradation value, the light flux deviation of the light flux deviation sequence is compared with the preset light flux deviation threshold; If any of the light flux deviation exceeds the preset light flux deviation threshold, the chroma offset sequence and the light flux deviation sequence are determined to be not in line with the preset degradation trend condition, and the performance degradation information is output.

[0010] Further, it also includes, based on the electrical connection abnormal information and the performance degradation information are reported to build, generate composite test analysis report: Traverse the abnormal type identification in the electrical connection abnormal information, and extract the degradation parameter in the performance degradation information; Based on the abnormal type identification and the degradation parameter, the pre-defined report database is filtered to obtain a basic report framework; The electrical connection abnormal information and the performance degradation information are filled into the basic report framework to obtain the composite test analysis report.

[0011] The application further provides a composite test system of an LED dot matrix module, applied to the composite test method of the LED dot matrix module. An acquisition module is configured to perform composite cycle test on the LED dot matrix module by the composite test box, and collect electrical working parameters, optical output parameters and light color parameters of the LED dot matrix module. An analysis module is configured to calculate light intensity fluctuation of the optical output parameters, and generate electrical connection abnormal information when the light intensity fluctuation exceeds a preset optical reference threshold value and the electrical working parameters meet a preset electrical interference condition. An analysis module is configured to extract variation characteristics of the light color parameters in continuous multiple cycle periods, and determine the variation characteristics based on a preset degradation trend condition, and output performance degradation information when the variation characteristics do not conform to the preset degradation trend condition. A construction module is configured to construct a report based on the electrical connection abnormal information and the performance degradation information, and generate a composite test analysis report.

[0012] The application further provides a composite test device of an LED dot matrix module, comprising: A memory is configured to store a program. A processor is configured to execute the program, and realize each step of the composite test method of the LED dot matrix module.

[0013] The application further provides a storage medium storing computer instructions, which are used to make a computer execute the method.

[0014] The composite test method, system, device and storage medium of the LED dot matrix module have the following beneficial effects: The composite stress of combining temperature cycle and mechanical vibration applied to the LED dot matrix module can simulate the actual working state of the LED dot matrix module under complex working conditions, effectively stimulate potential defects difficult to expose in single stress test, and significantly improve the coverage and accuracy of reliability test. The time sequence correlation determination mechanism of light intensity fluctuation and instantaneous peak in voltage signal can accurately identify intermittent connection faults such as solder fatigue caused by the coupling effect of mechanical vibration and thermal stress, realize early diagnosis and early warning of potential faults. The analysis of the variation trend of chroma and luminous flux parameters in continuous test periods can effectively evaluate the performance degradation law of packaging materials under long-term thermal stress. The unified test analysis report generated by comprehensively evaluating the multi-dimensional evaluation results such as electrical connection abnormality and material performance degradation can effectively improve the quality reliability of terminal products. BRIEF DESCRIPTION OF DRAWINGS

[0015] Figure 1 is a composite test method flow chart of an LED dot matrix module provided by the present application; Figure 2 is a composite test system structure diagram of an LED dot matrix module provided by the present application; Figure 3 is a composite test device structure diagram of an LED dot matrix module provided by the present application.

[0016] The purposes, functional features and advantages of the present application will be further described with reference to the accompanying drawings and embodiments. DETAILED DESCRIPTION

[0017] In order to make the purposes, technical solutions and advantages of the present application clearer, the present application will be further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application and do not limit the present application.

[0018] The present application will be further described below with reference to the accompanying drawings and specific embodiments.

[0019] Referring to Figure 1 The present application provides a composite test method of an LED dot matrix module, comprising: Step S10: performing a composite cycle test on the LED dot matrix module through a composite test box, collecting electrical working parameters, optical output parameters and light color parameters of the LED dot matrix module; Step S20: extracting the change characteristics of the light color parameters in continuous multiple cycle periods, and judging the change characteristics based on a preset degradation trend condition, and outputting performance degradation information when the change characteristics do not conform to the preset degradation trend condition.

[0020] Based on the above steps, the detailed step process is as follows: Step S10: The LED dot matrix module is installed in the composite test box, and the control system of the test box executes a preset composite cycle test profile. The test profile typically contains alternating high-temperature vibration stages and low-temperature static stages.

[0021] In the high-temperature vibration phase, the temperature inside the test box is raised to a first temperature value (e.g. 85°C) at a constant rate, while the vibration table applies a random vibration spectrum simulating the actual working conditions. In the low-temperature static phase, the temperature is lowered to a second temperature value (e.g. -20°C) at a controlled rate and remains stable, and the vibration excitation is completely stopped. Throughout the entire cycle test, the LED dot matrix module is always driven at the rated working current. The collection of electrical working parameters is realized through a high-precision data acquisition card, which synchronously records the working voltage waveform and the working current waveform at both ends of the module, with a sampling frequency not less than 1 kHz to ensure that transient changes can be captured.

[0022] The collection of optical output parameters relies on a photoelectric sensor installed directly in front of the module. The sensor continuously measures and records the light intensity signal output by the module in a time sequence synchronized with the collection of electrical parameters. The collection of light color parameters occurs at specific time nodes of each test cycle. At the end of the high-temperature phase and the low-temperature phase, the color analyzer is used to obtain the color coordinate values and the luminous flux values of the module, respectively. All collected parameters are given a unified time stamp and stored in a structured manner according to the test cycle number and the parameter type.

[0023] The continuous light intensity signal stream is divided into multiple consecutive analysis periods according to a fixed time window length (e.g. 1 second). For each analysis period, the algorithm reads all the instantaneous light intensity values within that period and calculates the difference between the maximum and minimum values of these instantaneous values, which is defined as the light intensity fluctuation of that period. The light intensity fluctuation calculated for each analysis period is immediately compared with a preset optical reference threshold value, which is determined based on the statistical characteristics of the light intensity fluctuation of the module in a standard stable state (e.g. multiple of the initial standard deviation).

[0024] If the light intensity fluctuation of a certain period exceeds the optical reference threshold value, that period is marked as a light intensity abnormal period. The diagnostic logic shifts to the synchronous collection of electrical working parameters within this light intensity abnormal period, with a focus on the voltage signal waveform.

[0025] It is checked whether there is an instantaneous voltage spike in the voltage signal within this abnormal period, which has an amplitude exceeding a predetermined percentage (e.g. 5%) of the normal working voltage. This detection process includes calculating the deviation of each voltage sampling point from the average voltage value and counting the number of abnormal points whose deviation exceeds the threshold value. If an instantaneous voltage spike that meets the preset electrical interference conditions (e.g. the number of abnormal points exceeds the set threshold value) is indeed identified within the light intensity abnormal period, it is determined that the light intensity abnormality and the voltage disturbance have a strong temporal correlation, indicating a potential abnormality in the solder joint connection (such as transient conduction failure caused by a loose solder), thereby generating a piece of electrical connection abnormality information with a specific time stamp.

[0026] Step S20: Extract the end-of-test light color parameters of a continuous number of full test cycles (e.g., Nth to N+Mth cycles) from the stored data. For each cycle, calculate the shift of its color coordinate values relative to the initial reference color coordinates of the module, which is quantified using the color difference. Calculate the maintenance rate (percentage) of the luminous flux value of this cycle relative to the initial luminous flux reference.

[0027] For the continuous cycle sequence, generate a sequence of chromaticity shifts and a sequence of luminous flux maintenance rates, which together constitute the "change characteristics" for evaluating the performance degradation. Then, perform linear trend fitting analysis on these two sequences respectively. For example, for the sequence of chromaticity shifts, use the least squares method to fit a straight line, and the slope of the straight line is the trend slope of the chromaticity shift; for the sequence of luminous flux maintenance rates, perform fitting to obtain the trend slope of the luminous flux maintenance. These calculated trend slopes are the core quantitative results of the trend analysis determination.

[0028] Compare these trend slopes with the threshold values defined in the preset degradation trend conditions. The conditions explicitly specify the acceptable range of each trend slope, for example, the chromaticity shift trend slope (absolute value) should be less than the corresponding preset threshold, and the absolute value of the luminous flux maintenance trend slope (considering light decay, negative value) should be less than the corresponding preset threshold. If the calculation result of any trend slope exceeds its corresponding threshold range, it is determined that the change characteristics of the module do not meet the preset degradation trend conditions, indicating that the packaging material (such as phosphor, silica gel) or the chip itself may be undergoing irreversible performance degradation, and the performance degradation information containing specific degradation parameters (such as the trend slope value exceeding the threshold) is output.

[0029] First, traverse and parse the electrical connection abnormal information, extract key elements such as the corresponding timestamp when the abnormality occurs, the test cycle number to which it belongs, the abnormal type identifier (such as "solder connection abnormality"), and the associated light intensity fluctuation and voltage spike characteristic values. At the same time, parse the performance degradation information and extract the involved degradation parameters, such as the specific value of the trend slope exceeding the standard and its corresponding physical quantity (chromaticity or luminous flux).

[0030] Use a predefined report template as the "basic report framework", which includes fixed parts such as test information summary, stress profile description, and parameter-time variation curve graphs. Match and fill the extracted abnormal and degradation information with specific positions in the template, for example, insert the list of electrical connection abnormal events into the abnormal event record chapter, and fill the performance trend graph and determination results into the "long-term reliability analysis" chapter. According to the preset rules (for example, the absolute value of the trend slope in the performance degradation information exceeds a certain stricter threshold), activate additional warning units at the corresponding positions in the report, which are highlighted warning text boxes, specific conclusion ratings, or recommended measures.

[0031] All filled content is synthesized with the activated warning unit to automatically generate a final composite test analysis report. The report not only presents the original test data, but more importantly provides comprehensive diagnostic conclusions based on multi-parameter correlation analysis and trend determination, directly serving the overall evaluation and decision support for the reliability of the LED dot matrix module.

[0032] The present application provides a composite test method for an LED dot matrix module. By applying a combination of temperature cycling and mechanical vibration to the LED dot matrix module, the actual working state of the LED dot matrix module under complex working conditions can be simulated, potential defects that are difficult to expose in single stress testing can be effectively triggered, and the coverage and accuracy of reliability testing can be significantly improved. By establishing a timing correlation determination mechanism for light intensity fluctuation and instantaneous spikes in voltage signals, intermittent connection failures such as solder joint fatigue caused by the coupling effect of mechanical vibration and thermal stress can be accurately identified, early diagnosis and early warning of potential failures can be achieved. Based on the collaborative analysis of the change trend of chroma and luminous flux parameters in the continuous test period, the performance degradation law of the packaging material under long-term thermal stress can be effectively evaluated. By integrating multi-dimensional evaluation results such as electrical connection abnormalities and material performance degradation, a unified test analysis report is generated, effectively improving the quality and reliability of the terminal product.

[0033] In one embodiment, the LED dot matrix module is subjected to composite cycle testing by a composite test box, and electrical working parameters, optical output parameters, and light color parameters of the LED dot matrix module are collected, including: When the cycle test phase is a high-temperature vibration phase, the test box control unit executes a preset high-temperature vibration profile. The temperature in the box body is stably increased from the initial ambient temperature to a first temperature value at a controlled heating rate, for example, five degrees Celsius per minute, and the value is set according to product specifications and application scenarios, for example, eighty-five degrees Celsius. During the heating process and throughout the holding period after reaching the first temperature value, the vibration sub-unit of the test box is simultaneously started to apply a random vibration power spectral density profile with a frequency range covering ten hertz to two thousand hertz, which simulates the mechanical stress that the product may encounter in the actual working environment, such as transportation vibration or structural transmission vibration in the running environment.

[0034] During this complex stress application, the LED matrix module is supplied with rated operating current by a programmable DC power supply, so that it is in normal operating condition. The electrical parameter acquisition unit is a high sampling rate data acquisition card, which continuously and synchronously monitors and records the voltage signal across the module and the current signal flowing into the module. These time-varying voltage and current waveforms constitute the first electrical parameters. The optical parameter acquisition is realized by a photodetector fixed at a specific distance in front of the module. The photodetector continuously captures the light intensity signal emitted by the module at a sampling rate of no less than one thousand times per second, forming the first optical parameter. At the moment when the high-temperature vibration phase ends, i.e. after the temperature of the box is maintained at the first temperature value for a preset duration (for example, thirty minutes) and before the cooling program starts, a color analyzer probe is moved to a predetermined position in front of the module by a mechanical arm or positioning device, and a rapid measurement is performed to capture the color coordinate value and luminous flux value of the module in the current state. This set of data is recorded as the first light color data.

[0035] After the high-temperature vibration phase ends, the test box control unit immediately switches to the low-temperature static profile. The temperature in the box rapidly decreases at a controlled cooling rate, for example, ten degrees Celsius per minute, from the first temperature value to a second preset temperature value, which is set at minus forty degrees Celsius or lower extreme conditions. At the same time as the cooling starts, the vibration sub-unit is immediately turned off to ensure that the low-temperature phase is a purely static thermal stress environment. When the temperature of the box reaches the second preset value and stabilizes, the low-temperature holding period begins. During this period, the LED matrix module continues to operate at rated current. The electrical parameter acquisition unit continues to monitor and record the voltage and current waveforms of the module at low temperature at a high sampling rate, and these data are marked as the second electrical parameters.

[0036] The optical parameter acquisition unit also continues to work, recording the light intensity output of the module in the low-temperature environment, forming the second optical parameter. At the moment when the low-temperature static phase ends, i.e. after the low-temperature holding reaches a preset duration and before the box is ready to start the next cycle of temperature rise, the color analyzer is again positioned in front of the module to perform a one-time measurement to capture the color coordinate and luminous flux value of the module in the low-temperature steady state. This set of data is recorded as the second light color data. The purpose of this step is to obtain the performance baseline data of the module under the extreme temperature condition of low temperature without mechanical vibration interference. By comparing the parameters collected in the high-temperature vibration phase and the low-temperature static phase, the temperature effect and the vibration effect can be effectively separated, and the influence of temperature cycling on the performance of the module can be evaluated. The first light color data and the second light color data respectively represent the color and luminosity characteristics of the module at the two characteristic temperature points of high temperature and low temperature.

[0037] The two sets of independent first and second light color data obtained at the end of the high-temperature vibration stage and the low-temperature static stage are structured and integrated to form a complete data set for evaluating the color and luminosity stability of the LED dot matrix module in the full temperature range. The integration operation is not a simple data stacking, but a correlation alignment based on strict time stamp and test cycle number. The first light color data collected at the end of each high-temperature vibration stage is paired with the second light color data collected at the end of the low-temperature static stage in the same cycle to form a group. Each pair of data is marked with a unique test cycle identifier. The integration process includes creating a structured data table or array, where each record corresponds to a complete test cycle and contains the first light color data (representing high-temperature state) and the second light color data (representing low-temperature state) obtained in that cycle. For example, a record may contain cycle number N, color coordinate values and luminous flux values in the first light color data corresponding to that cycle, as well as color coordinate values and luminous flux values in the second light color data. The light color parameters are integrated by cycle pairing.

[0038] The integration of electrical operating parameters time-series splices the first electrical parameters (i.e., continuous voltage and current waveform data) recorded in the high-temperature vibration stage with the second electrical parameters recorded in the low-temperature static stage. Since data collection is synchronized and performed at a high sampling rate, it is necessary to ensure that the data streams of the two stages are continuous in time before splicing, i.e., the starting time point of the second electrical parameters immediately follows the ending time point of the first electrical parameters. All voltage and current sampling points are arranged according to a unified high-precision time stamp to form a continuous electrical operating parameter covering the entire composite cycle test process.

[0039] The integration of optical output parameters follows the same principle, splicing the first optical parameters (light intensity waveform) continuously collected in the high-temperature vibration stage with the second optical parameters continuously collected in the low-temperature static stage in time sequence to form a complete optical output parameter. During the integration process, it is verified and ensured that there is no overlap or gap between data blocks, and the time markers of all original data points are preserved.

[0040] This embodiment can accurately separate the effects of temperature and vibration stress on module performance by collecting electrical, optical, and light color parameters in stages under high-temperature vibration and low-temperature static conditions, providing targeted data basis for analyzing different failure modes. By synchronously collecting electrical and optical parameters during the high-temperature vibration stage and collecting light color data at a fixed point at the end of the stage, the transient response and steady-state characteristics under the coupling action of mechanical vibration and thermal stress are effectively captured. By collecting comparative data in the low-temperature static stage, a performance benchmark of the module at extremely low temperature is established. The data from different stress stages are integrated and aligned according to the test period to form a complete data set that fully reflects the dynamic response of the module under the full stress profile.

[0041] In one embodiment, further comprising, calculating an optical intensity fluctuation amount of the optical output parameter, generating the electrical connection abnormality information when the optical intensity fluctuation amount exceeds a preset optical reference threshold value, and the electrical operating parameter is detected to satisfy a preset electrical interference condition: The optical intensity waveform data is represented as a series of optical intensity instantaneous value sampling points arranged in strict time sequence. The sampling interval is determined by the characteristics of the photodetector. According to the time length division rule, an analysis period is constructed. The time length division rule clearly defines the fixed duration of each analysis period, for example, one second or several seconds.

[0042] Starting from the starting point of the optical intensity waveform data, the continuous data stream is divided into multiple continuous and non-overlapping time segments according to the fixed time length set by the time length division rule. Each segment is an analysis period. This ensures that the optical intensity signal during the entire test period is included in the analysis range without omission, and the data in each period has a unified statistical basis. Each analysis period is assigned a unique identifier, including its start time stamp and end time stamp, to accurately associate with the synchronously collected electrical operating parameters. The multiple analysis periods generated by the division operation provide structured input for the next step of local optical intensity fluctuation calculation in each independent time window with fixed time length.

[0043] For each analysis period, access the data storage area corresponding to the period and read all the optical intensity instantaneous values contained therein. These optical intensity instantaneous values are a set of discrete data points arranged in time sequence, representing the continuous change of the LED dot matrix module light output in the fixed time length. By traversing all the values in the data set, the maximum value (peak value) and the minimum value (valley value) are identified and recorded through a complete scanning process.

[0044] The identified maximum value and minimum value are algebraically subtracted, and the resulting difference is defined as the optical intensity fluctuation amount of the specific analysis period. This fluctuation amount is a scalar value that intuitively reflects the amplitude variation range of the optical intensity signal in that time period. For example, a time period with a large optical intensity fluctuation amount indicates that the light output has significant fluctuations; while a time period with a small fluctuation amount means that the light output is relatively stable. This fluctuation calculation method based on range has the advantages of small calculation amount and fast response, which is suitable for real-time or quasi-real-time abnormality monitoring. After each analysis period is calculated, its corresponding optical intensity fluctuation amount result is stored and associated with the start time stamp and end time stamp of the period.

[0045] The preset optical reference threshold is a key criterion determined by experiment in advance. Its value is set based on the statistical characteristics of the light intensity data collected for a long time under stable working conditions of the LED matrix module in a known good state. The preset optical reference threshold is set as several times of the standard deviation of the initial stable light intensity fluctuation of the module to ensure the reliability of the determination and avoid false positives caused by noise. The light intensity fluctuation values of each analysis period are read in order and compared with the stored preset optical reference threshold one by one. The comparison operation is a simple value size relationship judgment.

[0046] If the light intensity fluctuation calculation result of a certain analysis period is not greater than the preset optical reference threshold, it is considered that the light output in this period is within the normal fluctuation range and does not need special attention. On the contrary, if the light intensity fluctuation value of a certain analysis period is strictly greater than the preset preset optical reference threshold, the abnormal marking operation is triggered. The analysis period is identified as a light intensity abnormal period, and the marking result is stored in association with the metadata of the period (such as the start time stamp, the end time stamp, and the calculated actual fluctuation value). This marking operation is the basis for subsequent cross-parameter correlation diagnosis, which discretizes the continuous test process into a series of event points to be analyzed in depth. All the marked light intensity abnormal periods and their related information constitute an event queue to be processed.

[0047] According to the start and end time stamps of the light intensity abnormal period, the voltage signal waveform data in the same period is accurately extracted from the synchronously collected electrical working parameters. The preset electrical interference condition clearly defines what is a "transient voltage spike", and its typical determination rule is that the deviation amplitude of the transient voltage value relative to the average voltage value in the period exceeds a preset percentage threshold (for example, five percent). The detection process involves point-by-point analysis of the extracted voltage signal subsequence. The algorithm first calculates the average value of the voltage signal in the abnormal period as a reference benchmark, and then traverses each voltage sampling point in the period to calculate its transient deviation from the average value. The transient deviation value of each sampling point is compared with the absolute value threshold calculated according to the reference voltage and the preset percentage in real time. Any voltage sampling point whose transient deviation value exceeds the threshold is recorded as a potential voltage spike event.

[0048] A positive determination is made only when there is at least one transient voltage spike that meets the definition of the preset electrical interference condition in a certain light intensity abnormal period. The determination of the abnormal fluctuation of the light output and the transient disturbance of the power supply voltage is highly coincident in time, and this co-occurrence phenomenon strongly indicates that there is a poor contact problem inside the module, such as a transient high-resistance connection caused by solder fatigue cracks.

[0049] When this condition is met, it is determined that the electrical operating parameter in this event meets the preset electrical interference condition. An electrical connection abnormality information is generated, which is a data record containing key diagnostic metadata, including: the timestamp of the associated light intensity abnormality period, the actual value of the light intensity fluctuation calculated in the period, the specific amplitude of the detected voltage spike and its occurrence time, and the specific preset condition identifier violated.

[0050] The embodiment can realize quantitative evaluation of light intensity stability by dividing continuous light intensity waveform data into fixed-length analysis periods and calculating the light intensity fluctuation of each period. Comparing the light intensity fluctuation of each analysis period with the preset optical reference threshold can effectively identify light intensity abnormality periods that exceed the normal fluctuation range, improving the accuracy of fault detection. In the light intensity abnormality period, it is detected whether there is a transient voltage spike that meets the preset electrical interference condition in the voltage signal. Through the correlation analysis of photoelectric parameters, it can effectively distinguish between real connection abnormalities and single parameter false positives, significantly reducing the probability of false positives. When the light intensity abnormality and voltage spike are associated in time sequence, it is determined that the electrical connection is abnormal and abnormal information is generated, realizing the automatic diagnosis and recording of intermittent connection faults between LED dot matrix modules.

[0051] In one embodiment, based on detecting whether a transient voltage spike defined in the preset electrical interference condition occurs in the voltage signal in the light intensity abnormality period, the electrical operating parameter includes: The light intensity abnormality period is a time interval marked by the previous step, which has a clear start time and end time. The electrical operating parameter is a continuous voltage signal waveform data recorded by a high sampling rate data acquisition card during the entire process of composite testing. These data are stored in the form of time series, and each data point is attached with a high-precision time mark.

[0052] The start time and end time of the light intensity abnormality period are obtained. The database or file system storing the electrical operating parameter is accessed, and all voltage sampling points recorded in the time interval are retrieved according to the timestamp index. These sampling points are arranged in the order of acquisition time, forming a continuous voltage signal sequence segment, which is the voltage signal sequence corresponding to the light intensity abnormality period. The sampling order defined in the preset electrical interference condition refers to the inherent time sequence during data acquisition, that is, the sampling points are read in the order of timestamp from small to large.

[0053] According to this order, each sampling point in the voltage signal sequence is accessed one by one, and its voltage amplitude is read as a voltage instantaneous value into the working memory for subsequent processing. The accuracy of data extraction relies on the strict synchronization of electrical and optical parameter acquisition during the test process, which is ensured by a unified system clock and hardware trigger signals. The set of read voltage instantaneous values fully reflects the instantaneous changes in the supply voltage of the LED dot matrix module during the specific period of abnormal fluctuations in light intensity.

[0054] Each voltage instantaneous value extracted is quantitatively evaluated to identify abnormal points by calculating its deviation from a reference benchmark. The voltage benchmark value is a comparative reference defined by a pre-set electrical interference condition. This voltage benchmark value is dynamically determined or pre-set based on the voltage characteristics of the LED dot matrix module in normal working state. The definition is the arithmetic mean of the voltage signal sequence during the light intensity abnormal period, or the rated working voltage value of the module. Before calculating the voltage deviation, the voltage benchmark value is determined.

[0055] If the voltage benchmark value is the average value of the light intensity abnormal period, the arithmetic mean of all sampling point voltage instantaneous values in the entire voltage signal sequence is calculated as the benchmark for the current calculation. For each voltage instantaneous value in the sequence, a comparison calculation operation is performed. The calculation process is to take the numerical value of the voltage instantaneous value and subtract the determined voltage benchmark value algebraically, and the difference obtained is the voltage deviation of the sampling point. The voltage deviation is a signed scalar value, and its absolute value represents the degree of deviation of the instantaneous voltage from the benchmark voltage, and the sign represents the direction of deviation (higher or lower than the benchmark).

[0056] For example, a large positive voltage deviation may indicate a positive voltage spike, and a large negative voltage deviation may indicate a negative voltage drop. After each sampling point is calculated, its corresponding voltage deviation is temporarily stored and associated with the timestamp of the sampling point. This point-by-point calculation of the deviation method can sensitively capture short but amplitude abnormal mutations in the voltage waveform, which may be caused by transient impedance changes due to poor solder joint contact, etc. The sequence of calculated voltage deviations converts the original voltage amplitude information into a feature parameter that more directly reflects the degree of instantaneous abnormality.

[0057] The voltage fluctuation threshold is a key criterion parameter, which is determined based on the statistical distribution characteristics of voltage deviation amount under a large number of normal conditions, for example, set to three times the standard deviation of normal voltage fluctuation. The setting of this voltage fluctuation threshold aims to effectively distinguish normal voltage noise from abnormal voltage spikes. The processing process is carried out for the voltage deviation amount of each voltage sampling point in turn. The matching operation is to numerically compare the absolute value of the voltage deviation amount of each sampling point with the preset voltage fluctuation threshold.

[0058] If the absolute value of the voltage deviation amount of a certain sampling point is not greater than the voltage fluctuation threshold, it is considered that the voltage fluctuation of the sampling point is within the normal range and is not specially processed. On the contrary, if the absolute value of the voltage deviation amount of a certain sampling point is strictly greater than the preset voltage fluctuation threshold, the marking operation is triggered, and the sampling point is identified as a voltage abnormal point. The marking operation involves setting a state flag bit associated with the sampling point or recording it in a special abnormal point list. For example: assuming that the voltage value sequence of 10 sampling points in a certain light intensity abnormal period is [12.01, 12.00, 12.02, 12.50, 12.55, 12.48, 12.01, 12.00, 12.02, 12.01] V. The average value is calculated as 12.16 V as the voltage reference value. The deviation amount of each point is calculated, for example, the deviation of sampling point 4 is +0.34 V. If the standard deviation of normal voltage fluctuation is 0.05 V, the voltage fluctuation threshold is set to 0.15 V. Compare the absolute value of the deviation amount of each point with the threshold, sampling points 2 (|-0.16| > 0.15), 4 (|0.34| > 0.15), 5 (|0.39| > 0.15), 6 (|0.32| > 0.15), 8 (|-0.16| > 0.15) are marked as voltage abnormal points.

[0059] The marked voltage abnormal points not only contain the numerical information of their voltage deviation amount, but also retain their position index or accurate timestamp in the voltage signal sequence, so as to facilitate subsequent positioning and analysis. This step discretizes the continuous voltage signal into a series of abnormal event points that need to be focused on, realizing the conversion from continuous signal to abnormal event set. All marked voltage abnormal points constitute the preliminary evidence set of voltage signal abnormality in the light intensity abnormal period.

[0060] The object of the statistical operation is all voltage abnormal points marked in the same light intensity abnormal period. All sampling points of the voltage signal sequence in the period are traversed, and the sampling points with voltage abnormal point marks are counted to obtain the total number of voltage abnormal points. The abnormal number threshold is defined in the preset electrical interference condition, which is an integer used to set the minimum number of abnormal points for triggering the determination. The setting of this abnormal number threshold considers the sampling rate, the duration of the abnormal event, and the allowed random noise level, for example, it can be set to at least 3 consecutive abnormal points in a 1 millisecond time window. The determination logic is to compare the total number of voltage abnormal points obtained by statistics with the preset abnormal number threshold. If the total number of voltage abnormal points is not greater than the abnormal number threshold, it is considered that the existing abnormal points are isolated or insufficient in number to constitute an effective peak event, and it is determined that no transient voltage peak occurs.

[0061] If the total number of voltage abnormal points is strictly greater than the preset abnormal number threshold, it is determined that a transient voltage peak that meets the definition of the preset electrical interference condition occurs in the light intensity abnormal period. The determination result (occurrence / non-occurrence) will be output as key evidence to the upper-level calling process (i.e. the step in claim 3) for finally generating electrical connection abnormal information. This determination strategy based on number statistics enhances the anti-interference ability, avoids false positives caused by noise interference of a single sampling point, and improves the reliability of diagnosis.

[0062] The embodiment ensures the strict synchronization in time between voltage data analysis and light intensity abnormal event by accurately extracting the corresponding voltage signal sequence based on the light intensity abnormal period. By calculating the deviation of each voltage instantaneous value from the reference value, the voltage amplitude information is converted into a standardized feature parameter reflecting the degree of instantaneous abnormality, realizing the quantitative evaluation of voltage signal abnormality. By matching the voltage deviation with the preset fluctuation threshold and marking the abnormal points, the instantaneous voltage mutation that exceeds the normal fluctuation range can be effectively identified, and the conversion from continuous signal to abnormal event is completed. By counting the number of voltage abnormal points in the light intensity abnormal period and comparing it with the abnormal number threshold, the determination is made according to the aggregation degree of abnormal points to distinguish the real transient voltage peak from random noise interference.

[0063] In one embodiment, the variation characteristics of the light color parameters in a plurality of consecutive cycles are extracted, and the variation characteristics are determined based on a preset degradation trend condition. When the variation characteristics do not meet the preset degradation trend condition, performance degradation information is output, including: From the periodically collected raw light color parameters, a core data set is filtered and organized for long-term performance trend analysis. The light color parameters are a set of parameters measured by a color analyzer at specific end points of each complete test cycle, such as the end of the high-temperature phase and the end of the low-temperature phase, including chromaticity coordinates and luminous flux values. These data are stored according to the sequence number of the test cycle.

[0064] The database storing the light color parameters is accessed, and according to the analysis requirements, the data of a plurality of consecutive test cycles (for example, from cycle number N to cycle number N+K) are selected as the analysis objects. The extraction operation reads the chromaticity parameter values and the luminous flux parameter values recorded in each selected cycle. The chromaticity parameter values represent the characteristics of the light color of the LED dot matrix module, and the luminous flux parameter values represent the total light power.

[0065] The two types of parameter values of each cycle are associated as a data pair. The set of chromaticity and luminous flux parameter value pairs extracted across cycles and indexed by cycle sequence number constitutes a change feature for evaluating performance evolution. This change feature is a structured data set that captures the original trajectory of the key optical performance parameters of the module over time (in terms of cycle number).

[0066] The preset chromaticity reference value and the preset luminous flux reference value are predetermined reference values, usually taken from the average light color parameters measured at the initial stage of the test under standard conditions when the LED dot matrix module is stably working, representing the ideal or initial performance state of the module. For the light color parameters of each test cycle extracted, the calculation process is performed independently. The calculation of the chromaticity offset is performed on the chromaticity parameter values. Since chromaticity is a two-dimensional coordinate, its offset is usually calculated as a color difference, for example, the Euclidean distance between the chromaticity coordinates of the current cycle and the preset reference chromaticity coordinates. This color difference value is a scalar that quantitatively represents the overall deviation of the current color from the initial color. The calculation of the luminous flux deviation is performed on the luminous flux parameter values.

[0067] The calculation is in the form of a relative change rate, i.e., the luminous flux maintenance rate, which is the luminous flux measurement value of the current cycle divided by the preset luminous flux reference value, multiplied by 100%, and the result is expressed as a percentage. This percentage directly reflects the ability of the light output to maintain the initial value, and a decrease in the value indicates that light decay has occurred. A chromaticity offset value and a luminous flux deviation (maintenance rate) value are calculated for each cycle.

[0068] These calculations normalize the absolute measurements of different cycles to a unified comparison benchmark, eliminating the effects of initial individual differences, so that the performance changes between different modules or the same module at different times can be compared. The calculated color shift sequence and luminous flux deviation sequence are characteristic quantities that directly represent the dynamic performance degradation of the module, providing standardized and more comparable input data for sequence construction and trend determination.

[0069] The color shift value and luminous flux deviation value calculated in each test cycle are obtained. These values are initially stored in the form of key-value pairs, where the key is the sequence number of the test cycle, and the value is the characteristic quantity corresponding to the cycle. The data is sorted and organized according to the natural increasing order of the test cycle sequence number. For color shift, the color shift values of all cycles are extracted and arranged in strictly increasing order of cycle sequence number to form an ordered numerical list, which is the color shift sequence.

[0070] For luminous flux deviation, the same sorting operation is performed to generate the luminous flux deviation sequence. Each data point in the sequence is explicitly associated with its corresponding test cycle sequence number, implicitly representing the evolution in the time dimension. This arrangement by cycle order converts the performance parameters from independent point measurements to continuous evolution trajectories, allowing the parameter change pattern over time (or stress accumulation) to be clearly presented. The generated sequence is a necessary prerequisite for quantitative trend analysis, allowing subsequent mathematical tools such as linear fitting to be applied to assess the overall change direction and rate of the parameter.

[0071] The long-term reliability of the LED module is evaluated through trend analysis of the structured sequence. The preset degradation trend conditions clearly define the rules and thresholds for judgment, including the acceptable range of color shift trend slope and luminous flux maintenance trend slope. Linear regression analysis is performed on the color shift sequence to calculate the slope of its trend line, obtaining the color shift trend slope. This slope quantifies the average rate of change of color shift with increasing test cycles. Linear regression analysis is performed on the luminous flux deviation sequence to obtain the luminous flux maintenance trend slope, which quantifies the average rate of change of luminous flux maintenance rate with cycle change. The calculated color shift trend slope is compared with the color trend threshold specified in the preset conditions.

[0072] The luminous flux maintenance trend slope is compared with the luminous flux trend threshold specified in the preset conditions. The judgment logic is based on Boolean algebra: only when both the calculated color shift trend slope exceeds its corresponding acceptable threshold range and the calculated luminous flux maintenance trend slope also exceeds its corresponding acceptable threshold range, is it determined that neither meets the preset degradation trend conditions.

[0073] When it is determined that neither of the preset degradation trend conditions is met, performance degradation information is generated and output. The performance degradation information includes specific trend slope values, threshold conditions violated, and detailed information such as relevant test cycle ranges.

[0074] The embodiment can comprehensively reflect the key optical performance evolution of the LED module under complex stress by extracting the chromaticity and luminous flux parameter change characteristics from the light color parameters, and provides a clear analysis object for long-term reliability evaluation. By calculating the chromaticity offset and luminous flux deviation of each cycle, the absolute measurement value is converted into a relative change amount relative to the reference, realizing the quantitative characterization of performance degradation, and eliminating the influence of initial individual differences on the evaluation results. By arranging the chromaticity offset and luminous flux deviation in sequence according to the cycle order to generate a sequence, the discrete test data is converted into a time sequence evolution track, establishing a structured data basis for subsequent trend analysis. Based on the preset degradation trend conditions, the generated sequence is cooperatively determined, and degradation information is output only when both the chromaticity and luminous flux two key parameters show abnormal trends, effectively avoiding false judgments caused by fluctuations in a single parameter, and significantly improving the accuracy and reliability of long-term performance degradation diagnosis.

[0075] In one embodiment, the chromaticity offset sequence and the luminous flux deviation sequence are conditionally determined based on preset degradation trend conditions. When neither of the chromaticity offset sequence and the luminous flux deviation sequence meets the preset degradation trend conditions, performance degradation information is output, including: A data subset within a specific analysis window is extracted from the chromaticity offset sequence. The analysis window is composed of a preset number of consecutive test cycles, for example, the last five adjacent test cycles (cycle N to cycle N+4) are selected. The extraction operation obtains the chromaticity offset values corresponding to these adjacent cycles, forming a short-term chromaticity offset sub-sequence.

[0076] The chromaticity offset sub-sequence is subjected to monotonicity calculation. This calculation aims to quantify the degree of one-way change of the sequence values with the increase of the cycle. A typical monotonicity calculation method is to traverse each pair of adjacent cycles in the sub-sequence (such as cycle N and N+1, N+1 and N+2, and so on), check whether the chromaticity offset value of the latter cycle is greater than or equal to that of the former cycle. The number of adjacent cycle pairs satisfying this condition is calculated, and compared with the total number of possible adjacent pairs, to obtain a proportion or index representing the monotonic increasing characteristics of the sequence, which is the cycle sequence value.

[0077] For example, the analysis window is 6 to 10 cycles, and the extracted chroma shift quantum sequence is [0.5, 0.7, 0.6, 0.8, 0.9]. The adjacent cycle pairs are traversed: cycle 6-7 increasing, cycle 7-8 decreasing, cycle 8-9 increasing, cycle 9-10 increasing. The cycle pairs that meet the increasing condition are 3 pairs, and the total cycle pairs are 4 pairs, so the calculated cycle sequence value (monotonically increasing proportion) is 0.75.

[0078] Another method is to calculate the rank correlation coefficient or other non-parametric statistics of the subsequence to evaluate its monotonicity. The resulting cycle sequence value is a quantitative indicator, and its size reflects the degree of obviousness of the chroma shift quantum maintaining a consistent increasing trend within the analyzed adjacent cycle window. A higher cycle sequence value indicates that the chroma shift presents a stable monotonically increasing trend in the near future, i.e., the chroma continues to deteriorate as the test progresses.

[0079] The cycle sequence value is compared with a preset degradation value. The preset degradation value is an empirical threshold value determined based on a large amount of normal aging data and data analysis of known failure modes, used to determine whether the short-term trend of chroma shift has reached a level that is worthy of attention. If the calculated cycle sequence value is not greater than the preset degradation value, it is determined that the short-term trend of the current chroma shift does not exhibit clear abnormal monotonically deteriorating characteristics, and the process terminates at this branch, without the need for subsequent luminous flux deviation threshold comparison, and without triggering performance degradation determination.

[0080] If the cycle sequence value is strictly greater than the preset degradation value, a positive determination is triggered, indicating that the chroma shift does indeed exhibit a significant monotonically deteriorating trend within the analyzed adjacent cycles. This determination result serves as a signal that the condition is met, starting the subsequent analysis branch, which checks the luminous flux deviation quantum sequence. The analysis object at this time is the complete or luminous flux deviation quantum sequence within the corresponding time period. Each luminous flux deviation quantum value in the sequence (i.e., the luminous flux maintenance rate of each cycle relative to the reference) is compared with another preset luminous flux deviation threshold. This luminous flux deviation threshold defines the acceptable lower limit of the luminous flux maintenance rate. By introducing conditional judgment, a two-level diagnostic logic is constructed: the short-term trend anomaly of the chroma parameter is the threshold condition for starting the detailed inspection of the luminous flux.

[0081] For example, the calculated cycle sequence value is 0.75, and the preset degradation value is 0.6. Since 0.75>0.6, the luminous flux inspection is started. The luminous flux maintenance rate sequence corresponding to the cycles is [98%, 97%, 95%, 96%, 94%], and the preset luminous flux deviation threshold is 96%. After comparison, the maintenance rates of cycle 8 (95%) and cycle 10 (94%) are lower than the threshold. Since both the chroma trend anomaly and the luminous flux absolute value exceeding the threshold meet the conditions, the final performance degradation determination is triggered.

[0082] The final decision is made when and only when the period sequence value exceeds the preset degradation value (indicating that the chromaticity shift shows a significant monotonic deterioration trend in the adjacent period), and at the same time there is at least one light flux deviation value that exceeds (i.e. is lower than) the preset light flux deviation threshold (indicating that the light flux maintenance rate in the corresponding period is lower than the acceptable level). Here, exceeding in the context of light flux maintenance rate specifically means lower than the threshold, because the deterioration of the light flux maintenance rate is manifested as a decrease in the value.

[0083] The comparison result of the period sequence value with the preset degradation value is checked to confirm that the chromaticity parameter has shown a clear deterioration trend. The comparison record of each value in the light flux deviation sequence with the preset light flux deviation threshold is checked to confirm whether there is a rule-breaking data point. Both conditions must be met at the same time for the decision to be made. When this composite condition is met, it is determined that the performance change characteristics represented by the chromaticity shift sequence and the light flux deviation sequence do not meet the normal performance envelope defined in the preset degradation trend condition.

[0084] It is indicated that the module shows unacceptable signs of deterioration in both chromaticity stability and light output maintenance capability. Structured performance degradation information is generated and output. This information is a data record containing complete diagnostic metadata, specifically including: the test cycle range that triggered the decision, the calculated period sequence value, the specific value of the light flux deviation that exceeded the threshold and the period in which it occurred, the identifier of the violated preset threshold, and the timestamp. This piece of degradation information is written into the diagnostic log. This decision mechanism requires both chromaticity trend abnormalities and light flux absolute value exceeding to appear at the same time.

[0085] The embodiment can effectively quantify the short-term change trend of the chromaticity parameter by calculating the period sequence value based on the chromaticity shift sequence of the adjacent period, providing a sensitive indicator for identifying early performance degradation. When the period sequence value exceeds the preset degradation value, the light flux deviation is compared with the threshold, establishing the chromaticity trend abnormality as a prerequisite for detailed light flux inspection. This hierarchical decision mechanism improves the relevance of detection. By requiring both chromaticity trend abnormalities and light flux absolute value exceeding to be met at the same time, false positives caused by single parameter fluctuations are effectively avoided, significantly improving the reliability of the decision result.

[0086] In one embodiment, further comprising, based on the electrical connection abnormal information and the performance degradation information, constructing a report, generating a composite test analysis report, including: A list or database storing electrical connection abnormality information is accessed first. The traversal operation accesses each abnormality record in the list sequentially and reads its abnormality type identifier field from each record. The identifier is a predefined code or string that distinguishes different types of abnormality, such as intermittent connection failure of a solder joint. The performance degradation information record is accessed and the key quantitative indicators, i.e. degradation parameters, are extracted from it. These parameters can include the computed color shift trend slope value, luminous flux maintenance trend slope value, and specific luminous flux deviation values that exceed the threshold.

[0087] These numerical parameters are decoupled from their original context and converted into independent data items that can be compared numerically and populated. After the traversal and extraction process, two sets of core data are obtained: one is a list of type identifiers from all electrical connection abnormality events, and the other is a set of detailed degradation parameters from performance degradation events.

[0088] The predefined report database is a repository that stores a variety of report templates or frameworks, each associated with one or more abnormality type identifiers and defining the static content of the report, such as basic sections, fixed text, chart positions, default conclusions, etc. All abnormality type identifiers (or the main abnormality type identifiers selected according to specific rules) are used as query conditions. In the predefined report database, matching is performed to find the most suitable report template corresponding to these abnormality type identifiers. For example, if the detected abnormality type identifier is mainly intermittent connection failure of a solder joint, a report framework focusing on interconnection reliability analysis is matched; if there is also performance degradation information, a comprehensive reliability evaluation report framework is matched.

[0089] The matching process is based on priority rules, such as when there is performance degradation, the framework containing the long-term reliability analysis section is preferred. After a successful match, the definition file of the report framework is loaded from the database, which is the basic report framework. This framework is a structured template that contains the fixed parts of the report, such as the title, test information summary, test condition description, standard data table, chart placeholder, and conclusion paragraph framework preset according to the abnormality type. The basic report framework itself does not contain the specific data of this test, but it specifies the format and organization of data population and final report presentation.

[0090] One or more warning levels are predefined in the basic report framework, which are usually associated with specific numerical ranges of performance degradation parameters, such as dividing the color shift trend slope into "attention", "warning", "serious" three levels, and setting corresponding thresholds for each level.

[0091] The deterioration parameters (e.g. chromaticity shift trend slope value, luminous flux maintenance trend slope value) are compared one by one with the threshold values of each warning level defined in the base report framework. The absolute value of the deterioration parameter is checked to see if it is greater than or equal to the lower threshold of a certain warning level. When the value of a certain deterioration parameter falls within or exceeds the threshold range of a certain warning level, the activation of the additional warning unit corresponding to that level is triggered. The additional warning unit is a specific module or marker embedded in the base report framework, whose content is usually more alarming than the basic content of the framework, such as containing more eye-catching warning icons, bold and red conclusion sentences, additional risk explanation paragraphs or specific maintenance action suggestions. The activation operation is essentially setting an internal flag or sending an instruction to the report generation engine, indicating that the content of this specific additional warning unit must be included and highlighted in the final rendering report at the predetermined position of the report.

[0092] The test result data is fused with the report template to generate a report draft containing actual content. The base report framework is a structured template containing placeholders. The data extracted and traversed in step one is filled into the corresponding positions according to the definition of the framework. The electrical connection abnormality information is filled into the designated chapter in the framework, such as the abnormal event record section. The filling operation includes inserting the timestamp, abnormal type description, related light intensity fluctuation and voltage spike characteristic value of each abnormal record into the predetermined position according to the format specified by the framework (such as list, table entry). The performance deterioration information is filled into chapters such as long-term reliability analysis or performance trend evaluation.

[0093] The filled content includes specific deterioration parameter values, the range of test cycles involved, and brief conclusion statements based on these data. The chart placeholders are replaced by actual data graphs, such as light intensity fluctuation time series graphs, chromaticity shift trend line graphs, etc. The filling process ensures that the data is correctly associated with the context description, and all variable placeholders are replaced with actual values. After filling is completed, a report version containing all specific test data, analysis results and basic descriptive text is generated, which is the "initial report framework".

[0094] Different operations are performed according to whether the additional warning unit is activated or not. If no additional warning unit is activated, the initial report framework itself is considered as the final report version. If one or more additional warning units are activated, integration operation is needed. The integration process involves inserting or applying the specific content of the activated additional warning unit (such as warning text, icons, format requirements) to the predetermined position of the initial report framework. This may include adding a warning box in the report summary section, inserting a specific warning paragraph in the conclusion chapter, or highlighting the title or specific rows of the related data table.

[0095] The integration operation ensures that the warning information is closely combined with the corresponding data analysis and conclusion, and is visually or contentually highlighted enough. The finally generated "composite test analysis report" is a complete document which not only contains all specific test data, analysis process, chart curve, but also integrates the warning information dynamically adjusted according to the severity of the result.

[0096] The embodiment can automatically integrate the scattered diagnosis results generated in the test process by traversing the electrical connection abnormal information and the performance degradation information and extracting key parameters, and provide a complete data basis for generating a structured report. The abnormal type identifier is matched with the pre-defined report database to obtain a basic report framework, the report template is dynamically adapted according to the specific fault mode, the accuracy and pertinence of the report generation are significantly improved. By comparing the degradation parameters and the warning level in the framework to activate the additional warning unit, the report can automatically adjust the warning level and content according to the severity of the performance degradation, and enhance the risk prompt capability of the report. By filling the abnormal information and the degradation information into the basic framework and integrating the warning unit, a composite test analysis report is finally generated, which is clear in structure, comprehensive in content and prominent in key points.

[0097] Referring to Figure 2 The application further provides a composite test system of an LED dot matrix module, applied to the composite test method of the LED dot matrix module. An acquisition module is configured to perform composite cycle test on the LED dot matrix module through the composite test box, and acquire electrical working parameters, optical output parameters and light color parameters of the LED dot matrix module. An analysis module is configured to calculate the light intensity fluctuation of the optical output parameters, and generate electrical connection abnormal information when the light intensity fluctuation exceeds a preset optical reference threshold and the electrical working parameters meet a preset electrical interference condition. An analysis module is configured to calculate the light intensity fluctuation of the optical output parameters, and generate electrical connection abnormal information when the light intensity fluctuation exceeds a preset optical reference threshold and the electrical working parameters meet a preset electrical interference condition. A construction module is configured to construct a report based on the electrical connection abnormal information and the performance degradation information, and generate a composite test analysis report.

[0098] Referring to Figure 3 The application further provides a composite test device of an LED dot matrix module, comprising: A memory is configured to store a program. A processor is configured to execute the program and realize each step of the composite test method of the LED dot matrix module.

[0099] In this embodiment, the processor and the memory can be connected through a bus or other means. The memory can include a volatile memory, such as a random access memory; the memory can also include a non-volatile memory, such as a read-only memory, a flash memory, a hard disk, or a solid state disk. The processor can be a general-purpose processor, such as a central processing unit, a digital signal processor, an application-specific integrated circuit, or one or more integrated circuits configured to implement embodiments of the present application.

[0100] The present application also provides a storage medium storing computer instructions for causing a computer to execute any of the above methods.

[0101] It should be noted that, for the convenience and brevity of description, the specific working processes of the above-described system and each module can be referred to the corresponding processes in the foregoing method embodiments, which will not be described herein.

[0102] The above only describes the preferred embodiments of the present application, and does not limit the patent scope of the present application, and any equivalent structure or equivalent process transformation, or direct or indirect application in other related technical fields based on the content of the present application specification and drawings, are also included in the patent protection scope of the present application.

Claims

1. A method of composite testing of LED dot matrix modules, characterized by, Comprise: Through the composite test box, the LED dot matrix module is subjected to composite cycle test, and electrical working parameters, optical output parameters and light color parameters of the LED dot matrix module are collected; The change characteristics of the light color parameters in continuous multiple cycle periods are extracted, and the change characteristics are judged based on a preset degradation trend condition. When the change characteristics do not conform to the preset degradation trend condition, performance degradation information is output.

2. The method of claim 1, wherein the method further comprises: The composite cycle test of the LED dot matrix module through the composite test box, and the collection of the electrical working parameters, the optical output parameters and the light color parameters of the LED dot matrix module, comprise: When the cycle test stage is a high-temperature vibration stage, the box temperature of the composite test box is raised to a first temperature value and frequency spectrum vibration is applied, and the first electrical parameters and the first optical parameters of the LED dot matrix module are collected; At the end of the high-temperature vibration stage, the first light color data of the LED dot matrix module is collected; When the cycle test stage is a low-temperature static stage, the box temperature of the composite test box is lowered to a second preset value and the frequency spectrum vibration is stopped, and the second electrical parameters and the second optical parameters of the LED dot matrix module are collected; At the end of the low-temperature static stage, the second light color data of the LED dot matrix module is collected, and the first light color data and the second light color data are integrated to obtain the light color parameters; The first electrical parameters and the second electrical parameters are integrated to obtain the electrical working parameters, and the first optical parameters and the second optical parameters are integrated to obtain the optical output parameters.

3. The method of claim 1, wherein the LED dot matrix module is a 16x16 dot matrix module. Further comprising, calculating the light intensity fluctuation amount of the optical output parameters, when the light intensity fluctuation amount exceeds a preset optical reference threshold, and the electrical working parameters satisfy a preset electrical interference condition, generating electrical connection abnormal information: Extracting light intensity waveform data in the optical output parameters, and constructing a plurality of analysis periods according to time length division rules; In each analysis period, a plurality of light intensity instantaneous values constituting the light intensity waveform data are read, and the difference between the maximum value and the minimum value of the light intensity instantaneous values is calculated to obtain the light intensity fluctuation amount; The light intensity fluctuation amount of each analysis period is compared with the preset optical reference threshold, and when the light intensity fluctuation amount exceeds the preset optical reference threshold, the corresponding analysis period is marked as a light intensity abnormal period; In the light intensity abnormal period, it is detected whether a transient voltage spike defined in the preset electrical interference condition appears in the voltage signal in the electrical working parameters; If the transient voltage spike appears, it is judged that the electrical working parameters satisfy the preset electrical interference condition, and the electrical connection abnormal information is generated.

4. The method of claim 3, wherein the method further comprises: The detection of whether the transient voltage spike defined in the preset electrical interference condition appears in the voltage signal in the electrical working parameters in the light intensity abnormal period comprises: Based on the light intensity abnormal period, a corresponding voltage signal sequence is extracted from the electrical working parameters, and the voltage instantaneous value of each sampling point of the voltage signal sequence is read according to the sampling order in the preset electrical interference condition; Comparing each of the voltage instantaneous value with a voltage reference value in the preset electrical interference condition to obtain a voltage deviation amount; Matching the voltage deviation amount with a voltage fluctuation threshold value in the preset electrical interference condition, if the voltage deviation amount exceeds the preset voltage fluctuation threshold value, marking the corresponding sampling point as a voltage abnormal point; If the number of voltage abnormal points exceeds the abnormal number threshold value in the preset electrical interference condition, it is determined that the transient voltage spike occurs.

5. The method of claim 1, wherein the LED dot matrix module is a 16x16 dot matrix module. The change characteristics of the light color parameters in a plurality of consecutive cycle periods are extracted, and the change characteristics are judged based on a preset degradation trend condition. When the change characteristics do not conform to the preset degradation trend condition, performance degradation information is output, including: The change characteristics including the chroma parameter value and the luminous flux parameter value are extracted from the light color parameters; The chroma offset of the chroma parameter value from a preset chroma reference value and the luminous flux deviation of the luminous flux parameter value from a preset luminous flux reference value are calculated for each cycle period; The chroma offset and the luminous flux deviation are respectively arranged in a cycle sequence to generate a chroma offset sequence and a luminous flux deviation sequence; The chroma offset sequence and the luminous flux deviation sequence are conditionally judged based on the preset degradation trend condition. When the chroma offset sequence and the luminous flux deviation sequence do not conform to the preset degradation trend condition, the performance degradation information is output.

6. The method of claim 5, wherein the LED array module is a 3 x 3 array module. The chroma offset sequence and the luminous flux deviation sequence are conditionally judged based on the preset degradation trend condition. When the chroma offset sequence and the luminous flux deviation sequence do not conform to the preset degradation trend condition, the performance degradation information is output, including: The chroma offset sequence of adjacent cycles is extracted based on the cycle period, and the chroma offset sequence of adjacent cycles is monotonically calculated to obtain a cycle sequence value; When the cycle sequence value exceeds a preset degradation value, the luminous flux deviation of the luminous flux deviation sequence is compared with a preset luminous flux deviation threshold value; If any of the luminous flux deviations exceeds the preset luminous flux deviation threshold value, it is determined that the chroma offset sequence and the luminous flux deviation sequence do not conform to the preset degradation trend condition, and the performance degradation information is output.

7. The method of claim 1, wherein the LED dot matrix module is a 16x16 dot matrix module. Further comprising, based on the electrical connection abnormal information and the performance degradation information, constructing a report to generate a composite test analysis report: Traverse the abnormal type identifier in the electrical connection abnormal information, and extract the degradation parameter in the performance degradation information; Based on the abnormal type identifier and the degradation parameter, a predefined report database is filtered to obtain a basic report framework; The electrical connection abnormal information and the performance degradation information are filled into the basic report framework to obtain the composite test analysis report.

8. A composite testing system of LED dot matrix modules, characterized in that, The composite test method applied to the LED dot matrix module of any one of claims 1-7, comprising: The acquisition module is configured for performing a composite cycle test on the LED dot matrix module by a composite test box, collecting electrical working parameters, optical output parameters and light color parameters of the LED dot matrix module; The analysis module is configured for extracting a change feature of the light color parameters in a plurality of continuous cycle periods, and judging the change feature based on a preset degradation trend condition, and outputting performance degradation information when the change feature does not conform to the preset degradation trend condition.

9. A composite testing device for LED dot matrix modules, characterized by Comprise: A memory for storing a program; A processor for executing the program to realize each step of the composite test method of the LED dot matrix module according to any one of claims 1-7.

10. A storage medium, characterized by Computer instructions are stored for making a computer execute the method according to any one of claims 1 to 7. Computer instructions are stored for making a computer execute the method according to any one of claims 1 to 7.

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