Pixel tracking deformation monitoring method based on high-orbit SAR
By correcting radar system errors and ionospheric influence errors in SAR images, and combining orbital parameters and local windowing methods, the problem of insufficient error correction in pixel tracking methods is solved, achieving high-precision surface deformation monitoring and improving the ability to issue early warnings for natural disasters.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-12-31
- Publication Date
- 2026-04-14
AI Technical Summary
Existing pixel tracking methods fail to effectively correct radar system errors and ionospheric influence errors, resulting in insufficient monitoring accuracy.
By compensating for radar system errors and ionospheric influence errors in SAR images of the same observation area at different time periods, coarse and precise registration are performed in conjunction with orbital parameter files. Corresponding points are obtained using the local window method and least squares polynomial fitting is used to correct the offset caused by the orbit, thus obtaining the actual surface deformation.
It improved monitoring accuracy, enhanced the ability to issue early warnings for natural disasters, and reduced disaster losses.
Smart Images

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