Display equipment test exception processing method and device, storage medium and display equipment
By automating signal channel testing and anomaly handling processes, the problem of low testing efficiency in traditional display devices has been solved, enabling efficient and accurate anomaly detection and analysis.
Patent Information
- Application Number
- CN202411444700.X
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2024-10-16
- Publication Date
- 2026-04-17
AI Technical Summary
Traditional display device testing methods rely on manually switching signal channels and waiting for engineers to analyze anomalies, resulting in low testing efficiency.
By acquiring test setting information, the system automatically switches signal channels and handles exceptions according to the exception handling mode, including pausing the display of exception prompts or storing test data to continue testing, thereby improving test efficiency.
It has achieved an automated display device testing process, reducing manual intervention, improving testing efficiency and accuracy, and meeting users' diverse anomaly handling needs.
Smart Images
Figure CN121880746A_ABST
Abstract
Description
Technical Field
[0001] This invention relates to the field of testing, and in particular to a method, apparatus, storage medium, and display device for handling testing anomalies in display devices. Background Technology
[0002] During the production of display devices, it is necessary to test the display effect of multiple signal channels of the display device. The traditional testing method is for testers to switch the signal channels of the display device one by one and identify the display effect of different signal channels to test for display abnormalities. When an abnormality occurs during testing, the testers need to wait for engineers to analyze and deal with the abnormality, which affects the testing efficiency. Summary of the Invention
[0003] This application provides a method, apparatus, storage medium, and display device for handling display device testing anomalies, which can improve the testing efficiency of display devices.
[0004] In a first aspect, embodiments of this application provide a method for handling display device testing anomalies, comprising the following steps:
[0005] Obtain test setting information; wherein, the test setting information includes channel information of at least one signal channel to be tested, test order, test termination conditions, and exception handling mode; the exception handling mode includes a first exception handling mode and a second exception handling mode;
[0006] Based on the channel information and the test sequence, the signal channels of the display device are switched sequentially to determine whether the display device is displaying abnormally.
[0007] When the display device displays an abnormality and the abnormality handling mode is the first abnormality handling mode, the test is paused and an abnormality prompt message is displayed on the display interface.
[0008] When the display device displays an abnormality and the abnormality handling mode is the second abnormality handling mode, the test data of the abnormal signal channel is stored, and the next signal channel is switched according to the channel information and the test order, and the test on the next signal channel continues until the test termination condition is met.
[0009] Optionally, after displaying the error message on the display interface, the following may also be included:
[0010] In response to the continue test command, continue testing the next signal channel until the test termination conditions are met.
[0011] In this embodiment, after the display interface shows the abnormal prompt information, the user can issue a continue test command to automatically execute the test on the next signal channel until the test termination conditions are met. This embodiment can improve the efficiency of display device test abnormality handling.
[0012] Optionally, the signal channels of the display device are switched sequentially according to the channel information and the test order, including:
[0013] Set a channel quantity identifier; the value of the channel quantity identifier is a first initial value;
[0014] When each signal channel is tested, the value of the channel number indicator is increased by one unit.
[0015] The test ends when the value of the channel number identifier reaches the first target threshold.
[0016] Alternatively, the signal channels of the display device may be switched sequentially according to the channel information and the test sequence, including:
[0017] Set a channel quantity identifier and a test count identifier; the value of the channel quantity identifier is a first initial value, and the value of the test count identifier is a second initial value;
[0018] When each signal channel is tested, the value of the channel number indicator is increased by one unit.
[0019] When the value of the channel number indicator reaches the target threshold, the value of the test count indicator is increased by one unit.
[0020] The test termination condition is that the value of the test count indicator reaches the second target threshold.
[0021] Optionally, when the display device displays an abnormality, it also includes:
[0022] Increment the value of the anomaly count indicator by one unit;
[0023] After the test termination conditions are met, the following are also included:
[0024] The test data interface is displayed on the display interface; the test data interface includes the numerical value of the anomaly count indicator.
[0025] In this embodiment, the user can use a channel number identifier to count the number of detected signal channels and set the end test condition to be when the value of the channel number identifier reaches a first target threshold. The test ends when the end test condition is met, thereby avoiding missed detection of signal channels and improving the accuracy of detection. Alternatively, the user can use a test count identifier to count the number of tests and set the end test condition to be when the value of the test count identifier reaches a second target threshold. The test ends when the end test condition is met. The user can set different end test conditions according to different needs, thereby meeting the user's diverse testing requirements.
[0026] Optionally, determine whether the display device is displaying abnormally, including:
[0027] A test command is generated and sent to the test program interface, which then responds to the test command by calling the test program to detect whether the display device is displaying abnormalities.
[0028] In this embodiment, test instructions are generated and sent to the test program interface, thereby calling the existing test program through the test program interface to detect display abnormalities of the display device. Users do not need to develop additional display device abnormality detection programs, saving development costs and improving the efficiency of display device abnormality detection.
[0029] Optionally, the test settings information may also include the switching time;
[0030] According to the channel information and the test sequence, the signal channels of the display device are switched sequentially, including:
[0031] After the switching time interval, the signal channel of the display device is switched to the next signal channel according to the channel information and the test order.
[0032] In this embodiment of the application, when the display device has a large number of signal channels, the user can reduce the switching time between multiple signal channels by setting the switching time, thereby reducing the test time of multiple signal channels and improving the test efficiency of the display device.
[0033] Optionally, obtaining test setup information includes:
[0034] The test information setting interface is displayed; wherein, the test information setting interface includes a channel information input control for inputting channel information, a test order input control for inputting test order, an end test condition input control for inputting end test conditions, and an exception handling mode selection control for selecting exception handling mode;
[0035] In response to the input operation on the test information setting interface, test setting information is obtained.
[0036] In this embodiment of the application, by displaying the test information setting interface, the user can input the channel information of at least one signal channel to be tested through the channel information input control, input the test order of each signal channel through the test order input control, input the end test condition through the end test condition input control, and select the exception handling mode through the exception handling mode selection control. This makes it simple and convenient to input test setting information, avoids omissions in test setting information, and improves the efficiency of the user's test display device.
[0037] Secondly, embodiments of this application provide a display device testing anomaly handling apparatus, the apparatus comprising:
[0038] The configuration information acquisition module is used to acquire test configuration information; wherein, the test configuration information includes channel information of at least one signal channel to be tested, test order, test termination conditions and exception handling mode; the exception handling mode includes a first exception handling mode and a second exception handling mode.
[0039] The display anomaly determination module is used to sequentially switch the signal channels of the display device according to the channel information and the test sequence to determine whether the display device is displaying an anomaly.
[0040] The first exception handling module is used to pause the test and display an exception prompt message on the display interface when the display device displays an exception and the exception handling mode is the first exception handling mode.
[0041] The second anomaly handling module is used to store the test data of the abnormal signal channel when the display device displays an anomaly and the anomaly handling mode is the second anomaly handling mode, switch to the next signal channel according to the channel information and the test order, and continue to test the next signal channel until the test termination condition is met.
[0042] Thirdly, embodiments of this application provide a computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, implements the steps of the display device test exception handling method as described in any of the preceding claims.
[0043] Fourthly, embodiments of this application provide a display device, including a memory, a processor, and a computer program stored in the memory and executable by the processor;
[0044] When the processor executes the computer program, it implements the steps of the display device test exception handling method as described in any of the above.
[0045] In this embodiment, by acquiring test setting information, each signal channel of the display device is tested sequentially according to the channel information and test order in the test setting information. When a signal channel test is abnormal, the current test abnormality is handled according to the abnormality handling mode in the test setting information. When the abnormality handling mode is the first abnormality handling mode, the test is paused and an abnormality prompt message is displayed on the display interface, so that engineers can analyze and handle the abnormality in a timely manner. When the abnormality handling mode is the second abnormality handling mode, the next signal channel is tested. After the test is completed, the abnormality is analyzed by using the stored test data of the abnormal signal channel, thereby improving test efficiency. In this embodiment, users can set different abnormality handling modes according to their needs, so that abnormalities can be handled according to the abnormality handling mode when test abnormalities occur, meeting various abnormality handling needs of users and improving the testing efficiency of display devices.
[0046] To better understand and implement this invention, the following detailed description is provided in conjunction with the accompanying drawings. Attached Figure Description
[0047] Figure 1 This is a flowchart of a display device test anomaly handling method in one embodiment of the present invention;
[0048] Figure 2 This is a flowchart of step S110 in one embodiment of the present invention;
[0049] Figure 3 This is a schematic diagram of the test information setting interface in one embodiment of the present invention;
[0050] Figure 4 This is a schematic diagram of a display device test anomaly handling device in one embodiment of the present invention;
[0051] Figure 5 This is a schematic diagram of the structure of a display device according to one embodiment of the present invention. Detailed Implementation
[0052] To make the objectives, technical solutions, and advantages of this application clearer, the embodiments of this application will be described in further detail below with reference to the accompanying drawings.
[0053] It should be understood that the described embodiments are merely some, not all, of the embodiments of this application. All other embodiments obtained by those skilled in the art based on the embodiments of this application without creative effort are within the scope of protection of the embodiments of this application.
[0054] The terminology used in the embodiments of this application is for the purpose of describing particular embodiments only and is not intended to limit the embodiments of this application. The singular forms “a,” “the,” and “the” used in the embodiments of this application and the appended claims are also intended to include the plural forms unless the context clearly indicates otherwise. It should also be understood that the term “and / or” as used herein refers to and includes any or all possible combinations of one or more of the associated listed items.
[0055] In the following description, when referring to the accompanying drawings, unless otherwise indicated, the same numbers in different drawings represent the same or similar elements. The embodiments described in the following exemplary embodiments do not represent all embodiments consistent with this application. Rather, they are merely examples of apparatuses and methods consistent with some aspects of this application as detailed in the appended claims. In the description of this application, it should be understood that the terms "first," "second," "third," etc., are used only to distinguish similar objects and are not necessarily used to describe a specific order or sequence, nor should they be construed as indicating or implying relative importance. Those skilled in the art can understand the specific meaning of the above terms in this application according to the specific circumstances.
[0056] Furthermore, in the description of this application, unless otherwise stated, "several" refers to two or more. "And / or" describes the correspondence between related objects, indicating that three relationships can exist. For example, A and / or B can represent: A alone, A and B simultaneously, or B alone. The character " / " generally indicates that the preceding and following related objects have an "or" relationship.
[0057] The signal channels of a display device refer to the channels through which the display device receives and sends signals. A display device typically includes multiple signal channels for transmitting audio and video signals. These signal channels can be audio and video signal transmission channels of the same format. For example, a display device may include multiple HDMI format signal channels, or it may include signal channels for audio and video signals of different formats such as VGA, HDMI, and DVI. When testing a display device, it is necessary to test whether the switching between the multiple signal channels of the display device is normal and whether the display is normal after the switching.
[0058] Traditional testing methods involve testers switching between the signal channels of the display device one by one and identifying the display effect of each signal channel to test the display device. When an anomaly occurs during testing, the testers need to wait for engineers to analyze and handle the anomaly, which affects testing efficiency.
[0059] Therefore, to address the aforementioned problems, this application provides a method for handling display device testing anomalies. This method acquires test setting information and sequentially tests each signal channel of the display device according to the channel information and test order within the test setting information. When a signal channel test fails, the method handles the current test anomaly according to the anomaly handling mode in the test setting information. When the anomaly handling mode is the first anomaly handling mode, the test is paused and an anomaly prompt is displayed on the display interface, facilitating timely analysis and handling of the anomaly by engineers. When the anomaly handling mode is the second anomaly handling mode, the test continues on the next signal channel. Engineers can analyze the anomaly using the stored test data of the anomaly signal channel, improving testing efficiency. In this application embodiment, users can set different anomaly handling modes according to their needs, thereby handling anomalies according to the anomaly handling mode when a test fails, meeting various anomaly handling needs of users and improving the testing efficiency of display devices.
[0060] Please see Figure 1 The display device test anomaly handling method of this application embodiment includes:
[0061] S110: Obtain test setting information; wherein, the test setting information includes channel information, test order, test termination conditions, and exception handling mode of at least one signal channel to be tested; the exception handling mode includes a first exception handling mode and a second exception handling mode;
[0062] The test setup information is used to set the test content of the display device. In this embodiment, the test content of the display device includes channel information of at least one channel to be tested, test order, test termination conditions, and exception handling mode.
[0063] Channel information is used to identify at least one signal channel to be tested. Channel information may include the name, identifier, and other information of the signal channel.
[0064] The exception handling mode is used to determine how to handle test exceptions. In this embodiment, the exception handling mode includes a first exception handling mode and a second exception handling mode.
[0065] The test termination condition is used to end the test on the display device. When the test termination condition is met, the test on the display device ends. The test termination condition may include the number of signal channels to be tested, the number of tests, or other test conditions. In this embodiment, the test termination condition may be set to all signal channels of the display device have completed the test.
[0066] S120: Switch the signal channels of the display device sequentially according to the channel information and the test sequence to determine whether the display device display is abnormal;
[0067] After switching the signal channel to the target signal channel, the display device can be analyzed to determine whether the content displayed is abnormal or the display time is too long. The test program can collect the display interface of the display device after switching to the target signal channel and compare it with the standard display interface to determine whether the display device is abnormal.
[0068] After the current signal channel test is completed, the next target signal channel is determined based on the channel information and test order. The next target signal channel is then tested using the signal channel test program, thereby enabling the testing of each signal channel of the display device.
[0069] S130: When the display device displays an abnormality and the abnormality handling mode is the first abnormality handling mode, the test is paused and an abnormality prompt message is displayed on the display interface;
[0070] The first anomaly mode is used to pause the test when an anomaly occurs. In the first anomaly mode, if an anomaly occurs in the current signal channel test, the test of the display device is paused, and the current display interface shows the display interface of the signal channel with the anomaly. This allows engineers to analyze and handle the anomaly in a timely manner, avoids affecting the detection of the next signal channel of the display device, and improves the accuracy of anomaly handling in display device testing.
[0071] Anomaly alerts the user that an anomaly has occurred in the current signal channel. The content of the anomaly alert can be customized according to user needs; for example, it can include the cause of the anomaly, making it easier for the user to analyze and address the cause, thus improving anomaly handling efficiency.
[0072] S140: When the display device displays an abnormality and the abnormality handling mode is the second abnormality handling mode, the test data of the abnormal signal channel is stored, and the next signal channel is switched according to the channel information and the test order, and the next signal channel is tested until the test end condition is met.
[0073] The second exception mode is used to continue testing when an exception occurs. In the second exception mode, if an exception occurs in the current signal channel test, the next signal channel is determined according to the test sequence and testing continues until the test termination condition is met.
[0074] The test data is the data used during the current signal channel test, which may include logs, system information of the display device, device information, etc.
[0075] During this process, since test data of the abnormal signal channel is stored each time an abnormality occurs, engineers can analyze the test data of all abnormal signal channels that occurred during the test after the test is completed, thereby improving the testing efficiency of the display device.
[0076] In this embodiment, by acquiring test setting information, each signal channel of the display device is tested sequentially according to the channel information and test order in the test setting information. When a signal channel test fails, the current test failure is handled according to the failure handling mode in the test setting information. When the failure handling mode is the first failure handling mode, the test is paused and an failure prompt message is displayed on the display interface, which facilitates engineers to analyze and handle the failure in a timely manner. When the failure handling mode is the second failure handling mode, the test continues to the next signal channel. Engineers can analyze the failure by storing the test data of the current signal channel, thereby improving test efficiency. In this embodiment, users can set different failure handling modes according to their needs, so that when a test fails, the failure can be handled according to the failure handling mode, meeting various failure handling needs of users and improving the testing efficiency of the display device.
[0077] In step S110, the test setting information can be information input by the user, such as... Figure 2 As shown, in one embodiment, obtaining test setup information includes:
[0078] S111: Display the test information setting interface; wherein, the test information setting interface includes a channel information input control for inputting channel information, a test order input control for inputting the test order, and an exception handling mode selection control for selecting the exception handling mode;
[0079] The channel information input control and the test sequence input control can be input boxes or other controls that can be used to input information, while the exception handling mode selection control can be drop-down menus or other controls that allow users to make selections.
[0080] S112: In response to the input operation of the test information setting interface, obtain test setting information.
[0081] Users can enter test settings information in the test information settings interface.
[0082] Please see Figure 3 This is a schematic diagram of a test information setting interface in one embodiment. The test information setting interface includes a channel information input control 101, a test order input control 102, a test end condition input control 103, an exception handling mode selection control 104, and a confirmation control 105.
[0083] Users can input the channel information of at least one signal channel to be tested in the input box of the channel information input control 101, input the test order of the signal channel in the input box of the test order input control 102, and input the end test condition in the input box of the end test condition input control 103. The exception handling mode selection control 104 includes a drop-down menu of a first exception handling mode or a second exception handling mode. Users can select the exception handling mode by triggering the first exception handling mode or the second exception handling mode in the drop-down menu. After completing the input of the test setting information, users can generate the test setting information by triggering the confirmation control 105.
[0084] In this embodiment of the application, by displaying the test information setting interface, the user can input the channel information of at least one signal channel to be tested through the channel information input control, input the test order of each signal channel through the test order input control, input the end test condition through the end test condition input control, and select the exception handling mode through the exception handling mode selection control. By using the test information setting interface, the user can easily and conveniently input test setting information, avoid omissions in setting test setting information, and improve the efficiency of the user's test display device.
[0085] In one embodiment, the test setup information may further include a switching time;
[0086] According to the channel information and the test sequence, the signal channels of the display device are switched sequentially, including:
[0087] After the switching time interval, the signal channel of the display device is switched to the next signal channel according to the channel information and the test order.
[0088] The switching time is the interval between switching from the current signal channel to the next signal channel. The switching time can be set according to the user's testing requirements. In this embodiment, the switching time can be set to 5 seconds, switching to the next signal channel every 5 seconds.
[0089] In this embodiment of the application, when the display device has a large number of signal channels, the user can reduce the switching time between multiple signal channels by setting the switching time, thereby reducing the test time of multiple signal channels and improving the test efficiency of the display device.
[0090] When testing a display device, the test ends when all signal channels that need to be tested have been tested.
[0091] When switching signal channels of a display device, the number of channels switched can be counted each time, so that users can know the current channel test progress and end the test of the display device in a timely manner.
[0092] In one embodiment, switching the signal channels of the display device sequentially according to the channel information and the test order includes:
[0093] Set a channel quantity identifier; the value of the channel quantity identifier is a first initial value;
[0094] When each signal channel is tested, the value of the channel number indicator is increased by one unit.
[0095] The test ends when the value of the channel number identifier reaches the first target threshold.
[0096] The channel number identifier is used to determine the number of detected signal channels. The first initial value is the initial value of the channel number identifier; in this embodiment, the first initial value can be zero.
[0097] Before testing the display device, the channel number identifier is initialized to its initial value to avoid abnormal channel number identifier values affecting the display device testing.
[0098] The first target threshold is used to determine the number of signal channels that need to be tested in this test.
[0099] When the number of channels reaches the first target threshold, it is determined that the testing of all signal channels has been completed, and the testing of the display device ends at this point.
[0100] Alternatively, in another embodiment, the test of the display device ends when all the signal channels to be tested in the display device have completed the target number of tests.
[0101] Specifically, the signal channels of the display device are switched sequentially according to the channel information and the test sequence, including:
[0102] Set a channel quantity identifier and a test count identifier; the value of the channel quantity identifier is a first initial value, and the value of the test count identifier is a second initial value;
[0103] When each signal channel is tested, the value of the channel number indicator is increased by one unit.
[0104] When the value of the channel number indicator reaches the target threshold, the value of the test count indicator is increased by one unit.
[0105] The test termination condition is that the value of the test count indicator reaches the second target threshold.
[0106] The test count identifier is used to determine the number of times the test has been performed. The second initial value is the initial value of the test count identifier; in this embodiment, the second initial value can be zero.
[0107] Before testing the display device, the test count indicator is initialized to a second initial value. This avoids missing or over-testing due to abnormal test count indicators, which would affect the testing efficiency and accuracy of the display device.
[0108] The second target threshold is used to determine the number of tests required, which can be set to 1000 in this embodiment.
[0109] In this embodiment, the user can use a channel number identifier to count the number of detected signal channels and set the end test condition to be when the value of the channel number identifier reaches a first target threshold. The test ends when the end test condition is met, thereby avoiding missed detection of signal channels and improving the accuracy of detection. Alternatively, the user can use a test count identifier to count the number of tests and set the end test condition to be when the value of the test count identifier reaches a second target threshold. The test ends when the end test condition is met. The user can set different end test conditions according to different needs, thereby meeting the user's diverse testing requirements.
[0110] In one embodiment, determining whether the display device is displaying abnormally includes:
[0111] A test command is generated and sent to the test program interface, which then responds to the test command by calling the test program to determine whether the display device is displaying abnormally.
[0112] The test program interface is an interface provided by the test program that allows external devices to call the test program. Test commands are used to request the test program to be called through the test program interface. Through this test program interface, the test program can be called to detect display abnormalities on the display device.
[0113] The testing program can be an existing program used to detect whether a display device is displaying abnormalities.
[0114] Specifically, after switching the signal channel once, a test command is sent to the test program interface, thereby calling the test program to determine whether the display device is displaying abnormally.
[0115] In this embodiment, test instructions are generated and sent to the test program interface, thereby calling the existing test program through the test program interface to detect display abnormalities of the display device. Users do not need to develop additional display device abnormality detection programs, saving development costs and improving the efficiency of display device abnormality detection.
[0116] In step S130, after the error message is displayed on the display interface, the engineer can promptly handle the current error based on the error message.
[0117] In one embodiment, after the error message is displayed on the screen, the method further includes:
[0118] In response to the continue test command, continue testing the next signal channel until the test termination conditions are met.
[0119] The Continue Test command is an instruction issued by an engineer after resolving an anomaly, to continue testing the signal channels of the display device.
[0120] After receiving the instruction to continue testing, continue testing the next signal channel until the conditions for ending the test are met.
[0121] In this embodiment, after the display interface shows the abnormal prompt information, the user can issue a continue test command to automatically execute the test on the next signal channel until the test termination conditions are met. This embodiment can improve the efficiency of display device test abnormality handling.
[0122] When the display device displays an abnormality and the abnormality handling mode is the first abnormality handling mode, the test data of the abnormal signal channel is stored, so that users can easily analyze the cause of the abnormality by analyzing the test data of the abnormal signal channel after the test is completed.
[0123] Test data for abnormal signal channels can be stored in a target area pre-specified by the user. Test data for different signal channels can be stored in different folders, which can be named according to the name or identifier of the signal channel. This allows the user to quickly obtain the corresponding abnormal signal channel test data from the target area.
[0124] In one embodiment, specifically, when the display device displays an abnormality, the method further includes:
[0125] Increment the value of the anomaly count indicator by one unit;
[0126] Optionally, the exception notification information may include a numerical value indicating the number of exceptions, so that users can know in a timely manner how many exceptions have occurred.
[0127] Optionally, the test data for the abnormal signal channel may also include a numerical value indicating the number of abnormalities, thereby facilitating the user to analyze the abnormal signal channel test data after the test to analyze the cause of the abnormality.
[0128] After the test termination conditions are met, the following are also included:
[0129] The test data interface is displayed on the display interface; the test data interface includes the numerical value of the anomaly count indicator.
[0130] In this embodiment of the application, after the test termination conditions are met, a test data interface is displayed, which includes a value indicating the number of anomalies. This allows the user to understand the number of anomalies that occurred during the test, facilitating the statistical analysis of the number of anomalies and the analysis of the causes of the anomalies.
[0131] like Figure 4 As shown in the figure, this application embodiment also provides a display device test anomaly handling device, the device comprising:
[0132] The setting information acquisition module 210 is used to acquire test setting information; wherein, the test setting information includes channel information, test order, test termination conditions and exception handling mode of at least one signal channel to be tested; the exception handling mode includes a first exception handling mode and a second exception handling mode.
[0133] The display anomaly determination module 220 is used to switch the signal channels of the display device sequentially according to the channel information and the test sequence to determine whether the display device is displaying an anomaly.
[0134] The first exception handling module 230 is used to pause the test and display an exception prompt message on the display interface when the display device displays an exception and the exception handling mode is the first exception handling mode.
[0135] The second anomaly handling module 240 is used to store the test data of the abnormal signal channel when the display device displays an anomaly and the anomaly handling mode is the second anomaly handling mode, switch to the next signal channel according to the channel information and the test order, and continue to test the next signal channel until the test termination condition is met.
[0136] In one embodiment, the first exception handling module 230 further includes:
[0137] The Continue Test unit is used to respond to the Continue Test command and continue testing the next signal channel until the test termination condition is met.
[0138] In one embodiment, the display anomaly determination module 220 includes:
[0139] A channel quantity identifier setting unit is used to set a channel quantity identifier; the value of the channel quantity identifier is a first initial value;
[0140] The channel quantity indicator increment unit is used to increment the value of the channel quantity indicator by one unit each time a test of a signal channel is completed.
[0141] The test ends when the value of the channel number identifier reaches the first target threshold.
[0142] Alternatively, the signal channels of the display device may be switched sequentially according to the channel information and the test sequence, including:
[0143] The test count identifier setting unit is used to set a channel quantity identifier and a test count identifier; the value of the channel quantity identifier is a first initial value, and the value of the test count identifier is a second initial value;
[0144] The channel quantity indicator increment unit is used to increment the value of the channel quantity indicator by one unit each time a test of a signal channel is completed.
[0145] The test count increment unit is used to increment the value of the test count identifier by one unit when the value of the channel count identifier reaches the target threshold.
[0146] The test termination condition is that the value of the test count indicator reaches the second target threshold.
[0147] In one embodiment, the module further includes:
[0148] The error count indicator increment module is used to increment the value of the error count indicator by one unit when the display device displays an error.
[0149] A test data display module is used to display a test data interface on the display interface; the test data interface includes the numerical value of the anomaly count identifier.
[0150] In one embodiment, the display anomaly determination module 220 includes:
[0151] The test instruction sending unit is used to generate test instructions and send them to the test program interface, so that the test program interface responds to the test instructions to call the test program to detect whether the display device is abnormal.
[0152] In one embodiment, the test setting information may further include a switching time; the display anomaly determination module 220 includes:
[0153] An automatic switching unit is used to switch the signal channel of the display device to the next signal channel according to the channel information and the test sequence after the switching time interval.
[0154] In one embodiment, the setting information acquisition module 210 includes:
[0155] A test information setting interface display unit is used to display the test information setting interface; wherein, the test information setting interface includes a channel information input control for inputting channel information, a test order input control for inputting test order, an end test condition input control for inputting end test conditions, and an exception handling mode selection control for selecting exception handling mode;
[0156] The test setting information acquisition unit is used to acquire test setting information in response to input operations on the test information setting interface.
[0157] It should be noted that the display device test anomaly handling device provided in the above embodiments is only illustrated by the division of the above functional modules when executing the display device test anomaly handling method. In actual applications, the above functions can be assigned to different functional modules as needed, that is, the internal structure of the device can be divided into different functional modules to complete all or part of the functions described above. In addition, the display device test anomaly handling device provided in the above embodiments and the display device test anomaly handling method in the above embodiments belong to the same concept, and its implementation process is detailed in the method embodiments, which will not be repeated here.
[0158] This application also provides a computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, implements the steps of the display device test anomaly handling method as described in any of the above claims.
[0159] The embodiments of this application may take the form of a computer program product implemented on one or more storage media (including but not limited to disk storage, CD-ROM, optical storage, etc.) containing program code. Computer-readable storage media include permanent and non-permanent, removable and non-removable media, and information storage can be implemented by any method or technology. Information may be computer-readable instructions, data structures, program modules, or other data. Examples of computer storage media include, but are not limited to: phase-change memory (PRAM), static random access memory (SRAM), dynamic random access memory (DRAM), other types of random access memory (RAM), read-only memory (ROM), electrically erasable programmable read-only memory (EEPROM), flash memory or other memory technologies, CD-ROM, digital versatile optical disc (DVD) or other optical storage, magnetic tape, magnetic disk storage or other magnetic storage devices, or any other non-transfer medium that can be used to store information accessible by a computing device.
[0160] like Figure 5As shown, this application embodiment also provides a display device 300, including a memory 310, a processor 320, and a computer program stored in the memory 310 and executable by the processor 320;
[0161] When the processor 320 executes the computer program, it implements the steps of the display device test exception handling method as described in any of the above.
[0162] The memory 310 includes a read-only memory (ROM), a programmable read-only memory (PROM), an erasable programmable read-only memory (EPROM), a one-time programmable read-only memory (OTPROM), an electrically erasable programmable read-only memory (EEPROM), a compact disc read-only memory (CD-ROM) or other optical disc storage, disk storage, magnetic tape storage, or any other computer-readable medium capable of carrying or storing data.
[0163] The processor 320 is the control unit of the display device 300. It connects to various components of the display device 300 via various interfaces and lines. By running or executing programs or modules stored in the memory 310, and by calling data stored in the memory 310, it performs various functions and processes data for the display device 300. For example, when the processor 320 executes a computer program stored in the memory 310, it implements all or part of the steps of the display device test anomaly handling method described in this application embodiment; or it implements all or part of the functions of the display device test anomaly handling device. The processor 320 can be composed of integrated circuits, such as a single packaged integrated circuit, or multiple integrated circuits with the same or different functions, including combinations of one or more central processing units (CPUs), microprocessors, digital processing chips, graphics processors, and various control chips.
[0164] It should also be noted that the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such process, method, article, or apparatus. Unless otherwise specified, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes that element.
[0165] The above are merely embodiments of this application and are not intended to limit the scope of this application. Various modifications and variations can be made to this application by those skilled in the art. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of this application should be included within the scope of the claims of this application.
Claims
1. A method for handling test anomalies in a display device, characterized in that, Includes the following steps: Obtain test setting information; wherein, the test setting information includes channel information of at least one signal channel to be tested, test order, test termination conditions, and exception handling mode; the exception handling mode includes a first exception handling mode and a second exception handling mode; Based on the channel information and the test sequence, the signal channels of the display device are switched sequentially to determine whether the display device is displaying abnormally. When the display device displays an abnormality and the abnormality handling mode is the first abnormality handling mode, the test is paused and an abnormality prompt message is displayed on the display interface. When the display device displays an abnormality and the abnormality handling mode is the second abnormality handling mode, the test data of the abnormal signal channel is stored, and the next signal channel is switched according to the channel information and the test order, and the test on the next signal channel continues until the test termination condition is met.
2. The method for handling display device test anomalies according to claim 1, characterized in that, After displaying the error message on the display interface, it also includes: In response to the continue test command, continue testing the next signal channel until the test termination conditions are met.
3. The method for handling display device test anomalies according to claim 1, characterized in that, According to the channel information and the test sequence, the signal channels of the display device are switched sequentially, including: Set a channel quantity identifier; the value of the channel quantity identifier is a first initial value; When each signal channel is tested, the value of the channel number indicator is increased by one unit. The test ends when the value of the channel number identifier reaches the first target threshold. Alternatively, the signal channels of the display device may be switched sequentially according to the channel information and the test sequence, including: Set a channel quantity identifier and a test count identifier; the value of the channel quantity identifier is a first initial value, and the value of the test count identifier is a second initial value; When each signal channel is tested, the value of the channel number indicator is increased by one unit. When the value of the channel number indicator reaches the target threshold, the value of the test count indicator is increased by one unit. The test termination condition is that the value of the test count indicator reaches the second target threshold.
4. The method for handling display device test anomalies according to claim 1, characterized in that, When the display device displays an abnormality, it also includes: Increment the value of the anomaly count indicator by one unit; After the test termination conditions are met, the following are also included: The test data interface is displayed on the display interface; the test data interface includes the numerical value of the anomaly count indicator.
5. The method for handling display device test anomalies according to claim 1, characterized in that, Determine if the display device is malfunctioning, including: A test command is generated and sent to the test program interface, which then responds to the test command by calling the test program to detect whether the display device is displaying abnormalities.
6. The method for handling display device test anomalies according to claim 1, characterized in that, The test settings information may also include the switching time; According to the channel information and the test sequence, the signal channels of the display device are switched sequentially, including: After the switching time interval, the signal channel of the display device is switched to the next signal channel according to the channel information and the test order.
7. The method for handling display device test anomalies according to claim 1, characterized in that, Obtaining test settings information includes: The test information setting interface is displayed; wherein, the test information setting interface includes a channel information input control for inputting channel information, a test order input control for inputting test order, an end test condition input control for inputting end test conditions, and an exception handling mode selection control for selecting exception handling mode; In response to the input operation on the test information setting interface, test setting information is obtained.
8. A display device testing anomaly handling device, characterized in that, The device includes: The configuration information acquisition module is used to acquire test configuration information; wherein, the test configuration information includes channel information of at least one signal channel to be tested, test order, test termination conditions and exception handling mode; the exception handling mode includes a first exception handling mode and a second exception handling mode. The display anomaly determination module is used to sequentially switch the signal channels of the display device according to the channel information and the test sequence to determine whether the display device is displaying an anomaly. The first exception handling module is used to pause the test and display an exception prompt message on the display interface when the display device displays an exception and the exception handling mode is the first exception handling mode. The second anomaly handling module is used to store the test data of the abnormal signal channel when the display device displays an anomaly and the anomaly handling mode is the second anomaly handling mode, switch to the next signal channel according to the channel information and the test order, and continue to test the next signal channel until the test termination condition is met.
9. A computer-readable storage medium having a computer program stored thereon, characterized in that: When executed by a processor, the computer program implements the steps of the display device test exception handling method as described in any one of claims 1-7.
10. A display device, comprising a memory, a processor, and a computer program stored in the memory and executable by the processor; When the processor executes the computer program, it implements the steps of the display device test anomaly handling method as described in any one of claims 1-7.